TW344144B - Nonvolatile memory device and process for producing the same - Google Patents
Nonvolatile memory device and process for producing the sameInfo
- Publication number
- TW344144B TW344144B TW086112080A TW86112080A TW344144B TW 344144 B TW344144 B TW 344144B TW 086112080 A TW086112080 A TW 086112080A TW 86112080 A TW86112080 A TW 86112080A TW 344144 B TW344144 B TW 344144B
- Authority
- TW
- Taiwan
- Prior art keywords
- semiconductor substrate
- drain terminal
- memory device
- nonvolatile memory
- common source
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 abstract 5
- 239000000758 substrate Substances 0.000 abstract 4
- 238000012544 monitoring process Methods 0.000 abstract 2
- 230000005641 tunneling Effects 0.000 abstract 2
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
Landscapes
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970012209A KR100244268B1 (ko) | 1997-04-02 | 1997-04-02 | 비휘발성 메모리 소자 및 제조 방법 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW344144B true TW344144B (en) | 1998-11-01 |
Family
ID=19501824
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086112080A TW344144B (en) | 1997-04-02 | 1997-08-22 | Nonvolatile memory device and process for producing the same |
Country Status (6)
Country | Link |
---|---|
US (1) | US5998829A (zh) |
JP (1) | JPH10308463A (zh) |
KR (1) | KR100244268B1 (zh) |
CN (1) | CN1103122C (zh) |
DE (1) | DE19747589C2 (zh) |
TW (1) | TW344144B (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3264241B2 (ja) | 1998-02-10 | 2002-03-11 | 日本電気株式会社 | 半導体装置の製造方法 |
JP4036552B2 (ja) * | 1998-12-17 | 2008-01-23 | 富士通株式会社 | 不揮発性半導体記憶装置 |
US6324097B1 (en) * | 1999-08-26 | 2001-11-27 | Mosel Vitelic Inc. | Single poly non-volatile memory structure and its fabricating method |
TW484228B (en) * | 1999-08-31 | 2002-04-21 | Toshiba Corp | Non-volatile semiconductor memory device and the manufacturing method thereof |
KR100426488B1 (ko) * | 2001-12-29 | 2004-04-14 | 주식회사 하이닉스반도체 | 플래시 메모리 셀과 그 제조 방법 및 프로그램/소거/독출방법 |
JP4189549B2 (ja) * | 2002-11-29 | 2008-12-03 | 独立行政法人科学技術振興機構 | 情報記憶素子及びその製造方法並びにメモリアレイ |
US6958939B2 (en) * | 2003-09-15 | 2005-10-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Flash memory cell having multi-program channels |
DE102006051743A1 (de) * | 2006-11-02 | 2008-05-08 | Austriamicrosystems Ag | EEPROM-Zelle mit verbessertem Kopplungsverhältnis |
US8006032B2 (en) * | 2007-08-22 | 2011-08-23 | Globalfoundries Inc. | Optimal solution to control data channels |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2635410B1 (fr) * | 1988-08-11 | 1991-08-02 | Sgs Thomson Microelectronics | Memoire de type eprom a haute densite d'integration avec une organisation en damier et un facteur de couplage ameliore et procede de fabrication |
JPH0484464A (ja) * | 1990-07-27 | 1992-03-17 | Nec Corp | Mos型半導体素子 |
JPH0745730A (ja) * | 1993-02-19 | 1995-02-14 | Sgs Thomson Microelettronica Spa | 2レベルのポリシリコンeepromメモリ・セル並びにそのプログラミング方法及び製造方法、集積されたeeprom記憶回路、eepromメモリ・セル及びそのプログラミング方法 |
KR0135047B1 (ko) * | 1994-06-30 | 1998-04-20 | 문정환 | 반도체 읽기 전용 기억 장치의 코딩 방법 |
US5633518A (en) * | 1995-07-28 | 1997-05-27 | Zycad Corporation | Nonvolatile reprogrammable interconnect cell with FN tunneling and programming method thereof |
-
1997
- 1997-04-02 KR KR1019970012209A patent/KR100244268B1/ko not_active IP Right Cessation
- 1997-08-22 TW TW086112080A patent/TW344144B/zh not_active IP Right Cessation
- 1997-10-28 DE DE19747589A patent/DE19747589C2/de not_active Expired - Fee Related
- 1997-12-05 US US08/985,679 patent/US5998829A/en not_active Expired - Lifetime
- 1997-12-23 CN CN97125903A patent/CN1103122C/zh not_active Expired - Fee Related
-
1998
- 1998-03-27 JP JP10081214A patent/JPH10308463A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
KR100244268B1 (ko) | 2000-02-01 |
KR19980075846A (ko) | 1998-11-16 |
JPH10308463A (ja) | 1998-11-17 |
CN1195197A (zh) | 1998-10-07 |
US5998829A (en) | 1999-12-07 |
DE19747589C2 (de) | 2000-11-30 |
CN1103122C (zh) | 2003-03-12 |
DE19747589A1 (de) | 1998-10-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW343391B (en) | Nonvolatile semiconductor memory and methods for manufacturing and using the same | |
GB1525681A (en) | Memory device | |
KR20030032050A (ko) | 연속 비트 라인 컨덕터들에 의해 접촉된 불연속 소스 및드레인 확산부들을 가지는 비휘발성 메모리 셀 어레이 및그 형성 방법 | |
US6104057A (en) | Electrically alterable non-volatile semiconductor memory device | |
US5354703A (en) | EEPROM cell array with tight erase distribution | |
TW344144B (en) | Nonvolatile memory device and process for producing the same | |
US5864501A (en) | Test pattern structure for endurance test of a flash memory device | |
TW349276B (en) | Method of producing nonvolatile memory device | |
US6204530B1 (en) | Flash-type nonvolatile semiconductor memory devices for preventing overerasure | |
KR100241523B1 (ko) | 플래쉬 메모리 소자 및 이를 이용한 프로그램, 소거 및 독출방법 | |
US5147816A (en) | Method of making nonvolatile memory array having cells with two tunelling windows | |
US5134449A (en) | Nonvolatile memory cell with field-plate switch | |
US5032533A (en) | Method of making a nonvolatile memory cell with field-plate switch | |
US5103273A (en) | Nonvolatile memory array having cells with two tunnelling windows | |
US20090273019A1 (en) | Memory device transistors | |
EP0369676A3 (en) | Semi-conductor non-volatile memory | |
EP1310994A4 (en) | NON-VOLATILE MEMORY COMPONENT AND METHOD FOR THE PRODUCTION THEREOF | |
US5859455A (en) | Non-volatile semiconductor memory cell with control gate and floating gate and select gate located above the channel | |
TW344139B (en) | Process for producing nonvolatile memory device | |
KR100189997B1 (ko) | 불휘발성 메모리 장치 | |
KR100224713B1 (ko) | 플래쉬 메모리 장치 | |
KR0183855B1 (ko) | 플래쉬 메모리 장치 및 그 제조방법 | |
KR100317492B1 (ko) | 플래쉬 메모리 소자의 코드저장 셀 | |
KR0151050B1 (ko) | 불휘발성 메모리 장치 및 그 제조방법 | |
EP1014448A3 (en) | Nonvolatile semiconductor memory device and method of manufacturing the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |