TW333607B - Scale for sensing moving object and apparatus for sensing moving object using the scale - Google Patents

Scale for sensing moving object and apparatus for sensing moving object using the scale

Info

Publication number
TW333607B
TW333607B TW086109567A TW86109567A TW333607B TW 333607 B TW333607 B TW 333607B TW 086109567 A TW086109567 A TW 086109567A TW 86109567 A TW86109567 A TW 86109567A TW 333607 B TW333607 B TW 333607B
Authority
TW
Taiwan
Prior art keywords
scale
moving object
sensing moving
sensing
indexes
Prior art date
Application number
TW086109567A
Other languages
English (en)
Inventor
Kei Kiyono
Original Assignee
Jung Kyu Lee
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jung Kyu Lee filed Critical Jung Kyu Lee
Application granted granted Critical
Publication of TW333607B publication Critical patent/TW333607B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/28—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with deflection of beams of light, e.g. for direct optical indication

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Optical Transform (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
TW086109567A 1996-07-29 1997-07-08 Scale for sensing moving object and apparatus for sensing moving object using the scale TW333607B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8199115A JP2960013B2 (ja) 1996-07-29 1996-07-29 移動物体の検出用目盛及びこれを用いた移動物体の検出装置

Publications (1)

Publication Number Publication Date
TW333607B true TW333607B (en) 1998-06-11

Family

ID=16402389

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086109567A TW333607B (en) 1996-07-29 1997-07-08 Scale for sensing moving object and apparatus for sensing moving object using the scale

Country Status (7)

Country Link
US (1) US6262802B1 (zh)
JP (1) JP2960013B2 (zh)
CN (2) CN1221780C (zh)
DE (1) DE19731854B4 (zh)
FR (1) FR2752296B1 (zh)
GB (1) GB2315861B (zh)
TW (1) TW333607B (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI417511B (zh) * 2008-10-29 2013-12-01 Sumitomo Heavy Industries Linear measurement method and linear measuring device
TWI417512B (zh) * 2008-10-29 2013-12-01 Sumitomo Heavy Industries Linear measurement method and linear measuring device
TWI453811B (zh) * 2007-03-06 2014-09-21 Shinetsu Handotai Kk Cutting method and wire saw device

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GB9924331D0 (en) * 1999-10-15 1999-12-15 Renishaw Plc Scale reading apparatus
US6781694B2 (en) * 2002-07-16 2004-08-24 Mitutoyo Corporation Two-dimensional scale structures and method usable in an absolute position transducer
DE10313038B4 (de) * 2003-03-24 2005-02-17 Klingelnberg Gmbh Vorrichtung zur Erfassung der Lage eines Tastelements in einem Mehrkoordinatenmessgerät
GB0311177D0 (en) * 2003-05-15 2003-06-18 Qinetiq Ltd Non contact human-computer interface
JP2005268608A (ja) * 2004-03-19 2005-09-29 Sumitomo Heavy Ind Ltd ステージ装置
WO2005106385A1 (ja) * 2004-04-27 2005-11-10 Sumitomo Heavy Industries, Ltd. 検出装置及びステージ装置
JP2006010645A (ja) * 2004-06-29 2006-01-12 Tohoku Univ 検出装置及びステージ装置
JP2005315649A (ja) * 2004-04-27 2005-11-10 Sumitomo Heavy Ind Ltd 検出装置及びステージ装置
JP2006064455A (ja) * 2004-08-25 2006-03-09 Isamu Ko 基準格子製造方法及び基準格子製造装置
GB0509727D0 (en) * 2005-05-13 2005-06-22 Renishaw Plc Method and apparatus for scale manufacture
JP4779117B2 (ja) * 2006-05-15 2011-09-28 国立大学法人東北大学 Ｘｙｚ軸変位測定装置
JP5055594B2 (ja) * 2007-03-13 2012-10-24 エスアイアイ・ナノテクノロジー株式会社 荷電粒子ビーム装置における試料移設方法及び荷電粒子ビーム装置
JP5259545B2 (ja) * 2009-10-13 2013-08-07 株式会社東海理化電機製作所 回転検出装置
JP5858673B2 (ja) * 2011-07-28 2016-02-10 キヤノン株式会社 位置計測装置、光学部品の製造方法、及び型の製造方法
CN102430779B (zh) * 2011-09-22 2013-06-26 西北工业大学 一种测量自由曲面任意点处法向矢量的装置及其测量方法
CN103234496B (zh) * 2013-03-28 2015-09-30 中国计量学院 一种三坐标测量机二维平台误差的高精度校正方法
CN104019779B (zh) * 2014-06-18 2016-09-21 清华大学 曲面法矢测量精度的优化方法
DE102014109687B4 (de) * 2014-07-10 2020-03-19 Carl Zeiss Microscopy Gmbh Positionsbestimmung eines Objekts im Strahlengang einer optischen Vorrichtung
DE102015107517B3 (de) 2015-05-13 2016-06-23 Carl Zeiss Ag Vorrichtung und Verfahren zur Bildaufnahme mit erhöhter Schärfentiefe
US9891428B2 (en) * 2015-12-07 2018-02-13 Metal Industries Research & Development Centre Optical measurement system, measurement method for errors of rotating platform, and two dimensional sine wave annulus grating
DE102016116311A1 (de) 2016-05-02 2017-11-02 Carl Zeiss Microscopy Gmbh Winkelselektive Beleuchtung
CN106597854B (zh) * 2016-12-28 2021-08-24 爱德森（厦门）电子有限公司 一种物体姿态自适应调整伺服控制装置及方法
US10712286B1 (en) * 2019-04-23 2020-07-14 The Boeing Company Systems and methods for non-destructive evaluation of a structure

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US3055263A (en) * 1958-06-14 1962-09-25 Askania Werke Ag Optical apparatus for determining the position of an object
DE1296396B (de) * 1965-07-24 1969-05-29 Leitz Ernst Gmbh Optisches Mehrzweckmessgeraet
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GB1412638A (en) 1972-09-12 1975-11-05 Atomic Energy Authority Uk Measuring the linear displacement of a movable member
US3791742A (en) * 1973-03-06 1974-02-12 Jenoptik Jena Gmbh Coordinate position measuring by imaging a movable grating onto a parallel reference grating
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JP2554465B2 (ja) * 1985-08-09 1996-11-13 株式会社 エスジー アブソリユ−ト位置検出装置
GB8616240D0 (en) 1986-07-03 1986-08-13 Renishaw Plc Opto-electronic scale reading apparatus
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JPH02232520A (ja) * 1989-03-07 1990-09-14 Ricoh Co Ltd 位置検出装置
AT394445B (de) * 1990-10-05 1992-03-25 Rsf Elektronik Gmbh Verfahren und vorrichtung zur laengen- und winkelmessung
US5149980A (en) * 1991-11-01 1992-09-22 Hewlett-Packard Company Substrate advance measurement system using cross-correlation of light sensor array signals
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FR2724723B1 (fr) 1994-09-16 1998-09-11 Moving Magnet Tech Capteur incremental de vitesse et/ou de position.
US5744799A (en) * 1996-05-20 1998-04-28 Ohara; Tetsuo Apparatus for and method of real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI453811B (zh) * 2007-03-06 2014-09-21 Shinetsu Handotai Kk Cutting method and wire saw device
TWI417511B (zh) * 2008-10-29 2013-12-01 Sumitomo Heavy Industries Linear measurement method and linear measuring device
TWI417512B (zh) * 2008-10-29 2013-12-01 Sumitomo Heavy Industries Linear measurement method and linear measuring device

Also Published As

Publication number Publication date
JPH1038549A (ja) 1998-02-13
FR2752296A1 (fr) 1998-02-13
US6262802B1 (en) 2001-07-17
GB2315861B (en) 2001-03-07
JP2960013B2 (ja) 1999-10-06
CN1221780C (zh) 2005-10-05
CN1142411C (zh) 2004-03-17
CN1495407A (zh) 2004-05-12
DE19731854A1 (de) 1998-02-05
GB9715927D0 (en) 1997-10-01
GB2315861A (en) 1998-02-11
CN1172246A (zh) 1998-02-04
FR2752296B1 (fr) 2004-06-18
DE19731854B4 (de) 2006-01-12

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees