TW331036B - Integrated circuit functionality security - Google Patents

Integrated circuit functionality security

Info

Publication number
TW331036B
TW331036B TW086105907A TW86105907A TW331036B TW 331036 B TW331036 B TW 331036B TW 086105907 A TW086105907 A TW 086105907A TW 86105907 A TW86105907 A TW 86105907A TW 331036 B TW331036 B TW 331036B
Authority
TW
Taiwan
Prior art keywords
circuit
integrated circuit
substrate
circuit functionality
functionality
Prior art date
Application number
TW086105907A
Other languages
English (en)
Inventor
K Cole Richard
P Yakura James
Original Assignee
Symbios Logic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Symbios Logic Inc filed Critical Symbios Logic Inc
Application granted granted Critical
Publication of TW331036B publication Critical patent/TW331036B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/57—Protection from inspection, reverse engineering or tampering
    • H01L23/576—Protection from inspection, reverse engineering or tampering using active circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
    • G06F21/86—Secure or tamper-resistant housings
    • G06F21/87—Secure or tamper-resistant housings by means of encapsulation, e.g. for integrated circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/901—MOSFET substrate bias
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/906—Dram with capacitor electrodes used for accessing, e.g. bit line is capacitor plate
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/908—Dram configuration with transistors and capacitors of pairs of cells along a straight line between adjacent bit lines

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Security & Cryptography (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
TW086105907A 1996-03-28 1997-05-03 Integrated circuit functionality security TW331036B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/623,470 US5861652A (en) 1996-03-28 1996-03-28 Method and apparatus for protecting functions imbedded within an integrated circuit from reverse engineering

Publications (1)

Publication Number Publication Date
TW331036B true TW331036B (en) 1998-05-01

Family

ID=24498198

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086105907A TW331036B (en) 1996-03-28 1997-05-03 Integrated circuit functionality security

Country Status (6)

Country Link
US (1) US5861652A (zh)
EP (1) EP0892988B1 (zh)
AU (1) AU2301997A (zh)
DE (1) DE69706043T2 (zh)
TW (1) TW331036B (zh)
WO (1) WO1997036326A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8564073B1 (en) 2006-09-28 2013-10-22 Hrl Laboratories, Llc Programmable connection and isolation of active regions in an integrated circuit using ambiguous features to confuse a reverse engineer

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DE19639033C1 (de) * 1996-09-23 1997-08-07 Siemens Ag Analysierschutz für einen Halbleiterchip
JP3515012B2 (ja) * 1999-04-23 2004-04-05 シャープ株式会社 半導体装置およびその製造方法
US6414884B1 (en) * 2000-02-04 2002-07-02 Lucent Technologies Inc. Method and apparatus for securing electronic circuits
JP3553457B2 (ja) * 2000-03-31 2004-08-11 シャープ株式会社 半導体装置およびその製造方法
EP1182702B1 (de) * 2000-08-21 2007-01-03 Infineon Technologies AG Vorrichtung zum Schutz einer integrierten Schaltung
DE10058078C1 (de) * 2000-11-23 2002-04-11 Infineon Technologies Ag Integrierte Schaltungsanordnung mit Analysierschutz und Verfahren zur Herstellung der Anordnung
DE10065339B4 (de) * 2000-12-27 2004-04-15 Infineon Technologies Ag Kapazitiver Sensor als Schutzvorrichtung gegen Angriffe auf einen Sicherheitschip
DE10109220A1 (de) * 2001-02-26 2002-09-12 Infineon Technologies Ag Integrierte Schaltung mit einer Stützkapazität
DE10119782C1 (de) * 2001-04-23 2002-10-17 Infineon Technologies Ag Verfahren zum Schutz eines IC vor Auslesen sicherheitsrelevanter Daten (Reverse-Engineering)
DE10120520A1 (de) * 2001-04-26 2002-11-14 Infineon Technologies Ag Halbleiterbauelement und Herstellungsverfahren
DE10155802B4 (de) * 2001-11-14 2006-03-02 Infineon Technologies Ag Halbleiterchip mit FIB-Schutz
WO2003046986A2 (en) * 2001-11-28 2003-06-05 Koninklijke Philips Electronics N.V. Semiconductor device, and means for checking the authenticity
DE10345240A1 (de) * 2003-09-29 2005-05-04 Infineon Technologies Ag Integrierte Schaltung mit Strahlungssensoranordnung
JP4462903B2 (ja) * 2003-11-18 2010-05-12 パナソニック株式会社 半導体ウェハ
EP1721231B1 (en) * 2004-02-24 2009-12-23 Nxp B.V. Method and apparatus for protecting an integrated circuit using an intrusion detection by Monte Carlo analysis
CN100370597C (zh) * 2004-07-09 2008-02-20 北京大学 信息安全集成电路可测性与安全性设计方法
DE102007051788A1 (de) * 2007-10-30 2009-05-14 Giesecke & Devrient Gmbh Halbleiterchip mit einer Schutzschicht und Verfahren zum Betrieb eines Halbleiterchip
US8172140B2 (en) * 2008-07-29 2012-05-08 International Business Machines Corporation Doped implant monitoring for microchip tamper detection
US8214657B2 (en) * 2008-07-29 2012-07-03 International Business Machines Corporation Resistance sensing for defeating microchip exploitation
US8332659B2 (en) * 2008-07-29 2012-12-11 International Business Machines Corporation Signal quality monitoring to defeat microchip exploitation
US9003559B2 (en) * 2008-07-29 2015-04-07 International Business Machines Corporation Continuity check monitoring for microchip exploitation detection
US7952478B2 (en) * 2008-07-29 2011-05-31 International Business Machines Corporation Capacitance-based microchip exploitation detection
US11139256B2 (en) 2019-08-21 2021-10-05 Micron Technology, Inc. Tamper-resistant integrated circuits, and related methods
US11621234B2 (en) * 2020-03-27 2023-04-04 Semiconductor Components Industries, Llc Chip tampering detector

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JPS543480A (en) * 1977-06-09 1979-01-11 Fujitsu Ltd Manufacture of semiconductor device
US4251688A (en) * 1979-01-15 1981-02-17 Ana Maria Furner Audio-digital processing system for demultiplexing stereophonic/quadriphonic input audio signals into 4-to-72 output audio signals
JPS58135665A (ja) * 1982-02-08 1983-08-12 Nippon Telegr & Teleph Corp <Ntt> 半導体記憶セル
EP0098417A3 (en) * 1982-06-15 1986-12-30 Kabushiki Kaisha Toshiba Semiconductor memory device
JPS61127159A (ja) * 1984-11-26 1986-06-14 Nippon Texas Instr Kk スタテイツク形記憶素子
US4593384A (en) * 1984-12-21 1986-06-03 Ncr Corporation Security device for the secure storage of sensitive data
JPS61187362A (ja) * 1985-02-15 1986-08-21 Nec Corp 半導体集積回路装置
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JP2545527B2 (ja) * 1987-01-23 1996-10-23 沖電気工業株式会社 半導体装置
FR2617979B1 (fr) * 1987-07-10 1989-11-10 Thomson Semiconducteurs Dispositif de detection de la depassivation d'un circuit integre
US4766516A (en) * 1987-09-24 1988-08-23 Hughes Aircraft Company Method and apparatus for securing integrated circuits from unauthorized copying and use
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8564073B1 (en) 2006-09-28 2013-10-22 Hrl Laboratories, Llc Programmable connection and isolation of active regions in an integrated circuit using ambiguous features to confuse a reverse engineer

Also Published As

Publication number Publication date
EP0892988B1 (en) 2001-08-08
WO1997036326A1 (en) 1997-10-02
EP0892988A1 (en) 1999-01-27
DE69706043T2 (de) 2001-12-06
AU2301997A (en) 1997-10-17
DE69706043D1 (de) 2001-09-13
US5861652A (en) 1999-01-19

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees