TW328182B - Integrated circuit device - Google Patents

Integrated circuit device

Info

Publication number
TW328182B
TW328182B TW085109102A TW85109102A TW328182B TW 328182 B TW328182 B TW 328182B TW 085109102 A TW085109102 A TW 085109102A TW 85109102 A TW85109102 A TW 85109102A TW 328182 B TW328182 B TW 328182B
Authority
TW
Taiwan
Prior art keywords
signal
mode signal
burn
auto
generating
Prior art date
Application number
TW085109102A
Other languages
English (en)
Inventor
Toshio Watanabe
Original Assignee
Sharp Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Kk filed Critical Sharp Kk
Application granted granted Critical
Publication of TW328182B publication Critical patent/TW328182B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW085109102A 1995-12-28 1996-07-25 Integrated circuit device TW328182B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34307695A JP3670067B2 (ja) 1995-12-28 1995-12-28 集積回路装置

Publications (1)

Publication Number Publication Date
TW328182B true TW328182B (en) 1998-03-11

Family

ID=18358761

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085109102A TW328182B (en) 1995-12-28 1996-07-25 Integrated circuit device

Country Status (4)

Country Link
US (1) US5818286A (zh)
JP (1) JP3670067B2 (zh)
KR (1) KR100215184B1 (zh)
TW (1) TW328182B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100496784B1 (ko) * 1997-06-24 2005-09-14 삼성전자주식회사 반도체메모리장치의mrs
US5912571A (en) * 1997-10-09 1999-06-15 Mosel Vitelic Corporation Using the internal supply voltage ramp rate to prevent premature enabling of a device during power-up
KR100791075B1 (ko) * 2006-11-15 2008-01-03 삼성전자주식회사 파워 업 리셋 회로 및 이를 구비한 반도체 장치
US8415993B1 (en) 2011-10-26 2013-04-09 Sand 9, Inc. Power-on reset circuit and method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04218938A (ja) * 1990-12-19 1992-08-10 Sharp Corp 集積回路装置
KR950004858B1 (ko) * 1992-03-17 1995-05-15 삼성전자 주식회사 내부전원전압 발생회로

Also Published As

Publication number Publication date
JPH09184870A (ja) 1997-07-15
KR970053279A (ko) 1997-07-31
US5818286A (en) 1998-10-06
JP3670067B2 (ja) 2005-07-13
KR100215184B1 (ko) 1999-08-16

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