TW287235B - - Google Patents
Info
- Publication number
- TW287235B TW287235B TW084106645A TW84106645A TW287235B TW 287235 B TW287235 B TW 287235B TW 084106645 A TW084106645 A TW 084106645A TW 84106645 A TW84106645 A TW 84106645A TW 287235 B TW287235 B TW 287235B
- Authority
- TW
- Taiwan
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67271—Sorting devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6171911A JPH0815373A (ja) | 1994-06-30 | 1994-06-30 | Ｉｃハンドラ用デバイス搬送装置 |
| JP7090376A JPH08262102A (ja) | 1995-03-23 | 1995-03-23 | Ｉｃテスタ用ハンドラにおけるデバイス再検査方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW287235B true TW287235B (US07576128-20090818-C00048.png) | 1996-10-01 |
Family
ID=26431865
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW084106645A TW287235B (US07576128-20090818-C00048.png) | 1994-06-30 | 1995-06-28 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5772387A (US07576128-20090818-C00048.png) |
| KR (1) | KR100200378B1 (US07576128-20090818-C00048.png) |
| DE (1) | DE19523969C2 (US07576128-20090818-C00048.png) |
| TW (1) | TW287235B (US07576128-20090818-C00048.png) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI424171B (zh) * | 2011-06-23 | 2014-01-21 | Hon Tech Inc | Electronic component testing classifier |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6070731A (en) * | 1994-09-22 | 2000-06-06 | Advantest Corporation | IC receiving tray storage device and mounting apparatus for the same |
| KR0143334B1 (ko) * | 1995-04-17 | 1998-08-17 | 정문술 | 반도체 소자검사기의 고객트레이 이송장치 |
| US6066822A (en) | 1995-07-28 | 2000-05-23 | Advantest Corporation | Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus |
| WO1997017619A1 (fr) * | 1995-11-06 | 1997-05-15 | Advantest Corporation | Transporteur, changeur de position et dispositif de prelevement pour circuits integres |
| JP3417528B2 (ja) * | 1996-04-05 | 2003-06-16 | 株式会社アドバンテスト | Ｉｃ試験装置 |
| TW358162B (en) * | 1996-06-04 | 1999-05-11 | Advantest Corp | Semiconductor device testing apparatus |
| JPH10163385A (ja) * | 1996-12-02 | 1998-06-19 | Mitsubishi Electric Corp | Ｉｃ着脱装置及びその着脱ヘッド |
| JP4020337B2 (ja) * | 1997-02-07 | 2007-12-12 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
| TW379285B (en) * | 1997-07-02 | 2000-01-11 | Advantest Corp | Testing device for semiconductor components and the testing trays used in the testing apparatus |
| DE19733062C2 (de) * | 1997-07-31 | 2002-04-18 | Rasco Ag Fuer Automatisierungs | Zuführeinrichtung in IC-Handhabungsgeräten, welche elektronische Bauelemente, insbesondere integrierte Schaltungen (IC), aus mindestens einer vorgelagerten IC-Führung aufnimmt und mindestens zwei nachgelagerten IC-Führungen zuführt |
| US6593761B1 (en) * | 1997-11-28 | 2003-07-15 | Kabushiki Kaisha Toshiba | Test handler for semiconductor device |
| JP3809008B2 (ja) * | 1998-03-27 | 2006-08-16 | 株式会社アドバンテスト | カストマトレイストッカ |
| DE19827458C2 (de) * | 1998-06-19 | 2001-10-11 | Helmuth Heigl | Vereinzelungsvorrichtung für Bauelemente |
| US6092966A (en) * | 1998-07-22 | 2000-07-25 | Highway Equipment Company | Multi-purpose dump unit for vehicles |
| KR100306301B1 (ko) * | 1998-11-17 | 2001-10-20 | 정문술 | 모듈아이씨핸들러에서고객트레이내의모듈아이씨픽킹방법및그장치 |
| DE19921243C2 (de) * | 1999-05-07 | 2002-12-05 | Infineon Technologies Ag | Anlage zur Bearbeitung von Wafern |
| US6264415B1 (en) * | 1999-09-30 | 2001-07-24 | Advanced Micro Devices, Inc. | Mechanism for accurately transferring a predetermined number of integrated circuit packages from tube to tube |
| US6371715B1 (en) * | 2000-07-03 | 2002-04-16 | Advanced Micro Devices, Inc. | Automated tube to tube transfer of a predetermined number of IC packages for various types of IC packages |
| US6449531B1 (en) * | 2000-08-25 | 2002-09-10 | Advanced Micro Devices, Inc. | System for batching integrated circuits in trays |
| DE10128665A1 (de) * | 2001-06-15 | 2003-01-02 | Infineon Technologies Ag | Verfahren und Vorrichtung zur Bearbeitung von Waferlosen in der Halbleiterfertigung |
| KR100395925B1 (ko) * | 2001-08-01 | 2003-08-27 | 삼성전자주식회사 | 테스트 핸들러의 반도체 디바이스 로딩장치 |
| US6719518B2 (en) * | 2001-10-15 | 2004-04-13 | Anadigics, Inc. | Portable tube holder apparatus |
| US6771060B1 (en) * | 2001-10-22 | 2004-08-03 | Electroglas, Inc. | Testing circuits on substrates |
| US6781394B1 (en) * | 2001-10-22 | 2004-08-24 | Electroglas, Inc. | Testing circuits on substrate |
| US6861859B1 (en) | 2001-10-22 | 2005-03-01 | Electroglas, Inc. | Testing circuits on substrates |
| KR100517074B1 (ko) * | 2003-06-05 | 2005-09-26 | 삼성전자주식회사 | 트레이 트랜스퍼 유닛 및 그를 포함하는 자동 테스트 핸들러 |
| US7362090B2 (en) * | 2005-03-30 | 2008-04-22 | Intel Corporation | Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same |
| TWI275814B (en) * | 2005-07-22 | 2007-03-11 | King Yuan Electronics Co Ltd | Electronic component testing apparatus |
| US7501809B2 (en) * | 2005-09-22 | 2009-03-10 | King Yuan Electronics Co., Ltd. | Electronic component handling and testing apparatus and method for electronic component handling and testing |
| TWI472778B (zh) * | 2013-08-30 | 2015-02-11 | Chroma Ate Inc | System - level IC test machine automatic retest method and the test machine |
| CN111942841B (zh) * | 2020-08-19 | 2021-11-30 | 宁波三韩合金材料有限公司 | 一种料盘自动上料系统及使用方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0382264B1 (en) * | 1984-06-29 | 1994-06-15 | Advantest Corporation | IC test equipment |
| SU1283043A1 (ru) * | 1985-06-18 | 1987-01-15 | Предприятие П/Я Р-6707 | Загрузочно-разгрузочное устройство |
| JPH06102487B2 (ja) * | 1985-07-31 | 1994-12-14 | 松下電器産業株式会社 | 部品供給装置 |
| DE3539965A1 (de) * | 1985-11-11 | 1987-05-14 | Ueberreiter Ekkehard | Vorrichtung zum pruefen und sortieren von elektronischen bauelementen |
| JP2710850B2 (ja) * | 1989-03-27 | 1998-02-10 | キヤノン株式会社 | ワーク把持装置、ワーク及びその収納ケース |
| DE3912590A1 (de) * | 1989-04-17 | 1990-10-18 | Willberg Hans Heinrich | Geraet zum beladen und/oder entladen von elektronischen bauelementen, insbesondere ic's, auf oder von traegern |
| DE4015315A1 (de) * | 1989-11-29 | 1991-06-06 | Georg Sillner | Verfahren sowie vorrichtung zum einbringen von bauelementen, insbesondere elektrischen bauelementen, bevorzugt chips in vertiefungen eines gurtes |
| KR950001245Y1 (ko) * | 1991-09-13 | 1995-02-24 | 금성일렉트론 주식회사 | 핸들러의 디바이스 자동 송출장치 |
| US5330043A (en) * | 1993-05-25 | 1994-07-19 | Delta Design, Inc. | Transfer apparatus and method for testing facility |
| US5588797A (en) * | 1994-07-18 | 1996-12-31 | Advantek, Inc. | IC tray handling apparatus and method |
-
1995
- 1995-06-28 TW TW084106645A patent/TW287235B/zh active
- 1995-06-30 US US08/497,223 patent/US5772387A/en not_active Expired - Fee Related
- 1995-06-30 DE DE19523969A patent/DE19523969C2/de not_active Expired - Fee Related
- 1995-06-30 KR KR1019950018531A patent/KR100200378B1/ko not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI424171B (zh) * | 2011-06-23 | 2014-01-21 | Hon Tech Inc | Electronic component testing classifier |
Also Published As
| Publication number | Publication date |
|---|---|
| US5772387A (en) | 1998-06-30 |
| DE19523969C2 (de) | 2000-10-26 |
| KR960001773A (ko) | 1996-01-25 |
| DE19523969A1 (de) | 1996-01-04 |
| KR100200378B1 (ko) | 1999-06-15 |
