TW267246B - - Google Patents

Info

Publication number
TW267246B
TW267246B TW083111629A TW83111629A TW267246B TW 267246 B TW267246 B TW 267246B TW 083111629 A TW083111629 A TW 083111629A TW 83111629 A TW83111629 A TW 83111629A TW 267246 B TW267246 B TW 267246B
Authority
TW
Taiwan
Application number
TW083111629A
Original Assignee
Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronics Nv filed Critical Philips Electronics Nv
Application granted granted Critical
Publication of TW267246B publication Critical patent/TW267246B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW083111629A 1993-12-16 1994-12-13 TW267246B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP93203546 1993-12-16
EP94200505 1994-02-28

Publications (1)

Publication Number Publication Date
TW267246B true TW267246B (zh) 1996-01-01

Family

ID=26134094

Family Applications (1)

Application Number Title Priority Date Filing Date
TW083111629A TW267246B (zh) 1993-12-16 1994-12-13

Country Status (6)

Country Link
US (1) US5625300A (zh)
EP (1) EP0685073A1 (zh)
JP (1) JPH08507868A (zh)
KR (1) KR100358609B1 (zh)
TW (1) TW267246B (zh)
WO (1) WO1995016923A1 (zh)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0161736B1 (ko) * 1995-06-30 1999-02-01 김주용 접합 리키지 전류 측정방법
TW280869B (en) * 1995-07-17 1996-07-11 Philips Electronics Nv IDDQ-testing of bias generator circuit
DE19610065A1 (de) * 1996-03-14 1997-09-18 Siemens Ag Verfahren zur Abschätzung der Lebensdauer eines Leistungshalbleiter-Bauelements
US6023186A (en) * 1996-04-30 2000-02-08 Kabushiki Kaisha Toshiba CMOS integrated circuit device and inspection method thereof
JPH09292438A (ja) * 1996-04-30 1997-11-11 Toshiba Corp Ｃｍｏｓ集積回路装置、その検査方法及び検査装置
US5742177A (en) * 1996-09-27 1998-04-21 Intel Corporation Method for testing a semiconductor device by measuring quiescent currents (IDDQ) at two different temperatures
KR20010015630A (ko) * 1997-09-30 2001-02-26 칼 하인쯔 호르닝어 결함있는 전자 장치 식별 시스템
DE19902031A1 (de) * 1999-01-20 2000-07-27 Bosch Gmbh Robert Steuergerät zur Steuerung sicherheitskritischer Anwendungen
EP1085333B1 (en) 1999-09-14 2005-07-13 STMicroelectronics S.r.l. Method for determining iddq
US6459293B1 (en) * 2000-09-29 2002-10-01 Intel Corporation Multiple parameter testing with improved sensitivity
DE60320314T2 (de) * 2003-02-20 2009-06-25 International Business Machines Corp. Testverfahren für integrierte schaltungen mit verwendung modifikation von well-spannungen
US7018800B2 (en) * 2003-08-07 2006-03-28 Rosemount Inc. Process device with quiescent current diagnostics
US7486098B2 (en) 2005-06-16 2009-02-03 International Business Machines Corporation Integrated circuit testing method using well bias modification
KR100843650B1 (ko) * 2005-06-28 2008-07-04 인터내셔널 비지네스 머신즈 코포레이션 웰 바이어스 수정을 사용하는 집적 회로 테스트 방법
JP5057430B2 (ja) * 2006-12-18 2012-10-24 ルネサスエレクトロニクス株式会社 半導体集積回路とその製造方法
WO2015042049A1 (en) * 2013-09-17 2015-03-26 Wave Semiconductor, Inc. Multi-threshold circuitry based on silicon-on-insulator technology
CN106960802B (zh) * 2016-01-11 2019-10-15 北大方正集团有限公司 一种半导体静态电流的测试器件及测试方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4542340A (en) * 1982-12-30 1985-09-17 Ibm Corporation Testing method and structure for leakage current characterization in the manufacture of dynamic RAM cells
US4835458A (en) * 1987-11-09 1989-05-30 Intel Corporation Signature analysis technique for defect characterization of CMOS static RAM cell failures
US5025344A (en) * 1988-11-30 1991-06-18 Carnegie Mellon University Built-in current testing of integrated circuits
NL8900050A (nl) * 1989-01-10 1990-08-01 Philips Nv Inrichting voor het meten van een ruststroom van een geintegreerde monolitische digitale schakeling, geintegreerde monolitische digitale schakeling voorzien van een dergelijke inrichting en testapparaat voorzien van een dergelijke inrichting.
US5332973A (en) * 1992-05-01 1994-07-26 The University Of Manitoba Built-in fault testing of integrated circuits
US5325054A (en) * 1992-07-07 1994-06-28 Texas Instruments Incorporated Method and system for screening reliability of semiconductor circuits
US5392293A (en) * 1993-02-26 1995-02-21 At&T Corp. Built-in current sensor for IDDQ testing

Also Published As

Publication number Publication date
WO1995016923A1 (en) 1995-06-22
JPH08507868A (ja) 1996-08-20
US5625300A (en) 1997-04-29
EP0685073A1 (en) 1995-12-06
KR100358609B1 (ko) 2003-01-14
KR960701372A (ko) 1996-02-24

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