TW202449210A - 化學氣相沉積法用成膜助劑、化學氣相沉積法用塗布液、金屬氧化物膜及金屬氧化物膜的成膜方法 - Google Patents
化學氣相沉積法用成膜助劑、化學氣相沉積法用塗布液、金屬氧化物膜及金屬氧化物膜的成膜方法 Download PDFInfo
- Publication number
- TW202449210A TW202449210A TW113101963A TW113101963A TW202449210A TW 202449210 A TW202449210 A TW 202449210A TW 113101963 A TW113101963 A TW 113101963A TW 113101963 A TW113101963 A TW 113101963A TW 202449210 A TW202449210 A TW 202449210A
- Authority
- TW
- Taiwan
- Prior art keywords
- film
- vapor deposition
- chemical vapor
- metal oxide
- forming
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
- C23C16/45536—Use of plasma, radiation or electromagnetic fields
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4486—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by producing an aerosol and subsequent evaporation of the droplets or particles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6938—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Plasma & Fusion (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023-008576 | 2023-01-24 | ||
| JP2023008576 | 2023-01-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW202449210A true TW202449210A (zh) | 2024-12-16 |
Family
ID=91970563
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW113101963A TW202449210A (zh) | 2023-01-24 | 2024-01-18 | 化學氣相沉積法用成膜助劑、化學氣相沉積法用塗布液、金屬氧化物膜及金屬氧化物膜的成膜方法 |
Country Status (6)
| Country | Link |
|---|---|
| EP (1) | EP4656769A1 (https=) |
| JP (1) | JPWO2024157871A1 (https=) |
| KR (1) | KR20250137562A (https=) |
| CN (1) | CN119677894A (https=) |
| TW (1) | TW202449210A (https=) |
| WO (1) | WO2024157871A1 (https=) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011027425A1 (ja) | 2009-09-02 | 2011-03-10 | 東芝三菱電機産業システム株式会社 | 金属酸化膜の成膜方法、金属酸化膜および金属酸化膜の成膜装置 |
| WO2017145915A1 (ja) * | 2016-02-25 | 2017-08-31 | 株式会社豊田中央研究所 | 金属酸化物膜およびその製造方法 |
| JP2018140914A (ja) * | 2017-02-28 | 2018-09-13 | 国立大学法人 熊本大学 | 積層構造体及び発光ダイオード |
| JP7126107B2 (ja) | 2017-02-28 | 2022-08-26 | 株式会社Flosfia | 成膜方法 |
| JP7064723B2 (ja) | 2017-03-31 | 2022-05-11 | 株式会社Flosfia | 成膜方法 |
-
2024
- 2024-01-18 JP JP2024573009A patent/JPWO2024157871A1/ja active Pending
- 2024-01-18 KR KR1020257009292A patent/KR20250137562A/ko active Pending
- 2024-01-18 WO PCT/JP2024/001261 patent/WO2024157871A1/ja not_active Ceased
- 2024-01-18 TW TW113101963A patent/TW202449210A/zh unknown
- 2024-01-18 EP EP24747200.4A patent/EP4656769A1/en active Pending
- 2024-01-18 CN CN202480003739.XA patent/CN119677894A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| KR20250137562A (ko) | 2025-09-18 |
| JPWO2024157871A1 (https=) | 2024-08-02 |
| CN119677894A (zh) | 2025-03-21 |
| WO2024157871A1 (ja) | 2024-08-02 |
| EP4656769A1 (en) | 2025-12-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7615250B2 (en) | Organoaluminum precursor compounds | |
| TWI636988B (zh) | 有機胺基矽烷化合物於原子層沉積及電漿強化原子層沉積中來形成一含矽膜的用途 | |
| JP5290488B2 (ja) | 酸化物、ケイ酸塩及びリン酸塩の気相成長 | |
| US8946096B2 (en) | Group IV-B organometallic compound, and method for preparing same | |
| US6326505B1 (en) | Methods, complexes, and system for forming metal-containing films | |
| US20080081127A1 (en) | Organometallic compounds, processes for the preparation thereof and methods of use thereof | |
| TW201319077A (zh) | 鹵化有機胺基矽烷前驅物及含有此前驅物的膜的沉積方法 | |
| JP2001504159A (ja) | 白金の化学蒸着のための白金ソース組成物 | |
| WO2000008230A1 (en) | Copper precursor composition and process for manufacture of microelectronic device structures | |
| TW200938653A (en) | Solution based lanthanum precursors for atomic layer deposition | |
| JP5255029B2 (ja) | 金属含有フィルムの現像用のアミノエーテル含有液体組成物 | |
| WO2007041089A2 (en) | Organometallic compounds and methods of use thereof | |
| US7547796B2 (en) | Organometallic compounds, processes for the preparation thereof and methods of use thereof | |
| US20090200524A1 (en) | Organometallic compounds, processes for the preparation thereof and methods of use thereof | |
| US20110206864A1 (en) | Organometallic compounds, processes for the preparation thereof and methods of use thereof | |
| KR20090033263A (ko) | 입체 장애 아미드를 갖는 유기금속 화합물 | |
| WO2006088686A2 (en) | Organoaluminum precursor compounds | |
| TW202449210A (zh) | 化學氣相沉積法用成膜助劑、化學氣相沉積法用塗布液、金屬氧化物膜及金屬氧化物膜的成膜方法 | |
| JP7153094B2 (ja) | 化合物及びリチウム含有膜の製造方法 | |
| KR101150551B1 (ko) | 8족 (ⅷ) 메탈로센 전구체를 사용한 증착 방법 | |
| JP2007526250A (ja) | 核形成密度が高い有機金属化合物 | |
| CN100543178C (zh) | 使用8族(ⅷ)金属茂前体的沉积方法 | |
| TWI917454B (zh) | 熱穩定的釕前體組合物和形成含釕膜的方法 | |
| TW202535892A (zh) | 用於原子層沉積(ald)應用之第13族金屬化合物 | |
| JP4100546B2 (ja) | Cvd用液体原料及びcvd装置 |