TW202440270A - 研磨方法、研磨裝置、及電腦可讀取記錄媒體 - Google Patents

研磨方法、研磨裝置、及電腦可讀取記錄媒體 Download PDF

Info

Publication number
TW202440270A
TW202440270A TW112149903A TW112149903A TW202440270A TW 202440270 A TW202440270 A TW 202440270A TW 112149903 A TW112149903 A TW 112149903A TW 112149903 A TW112149903 A TW 112149903A TW 202440270 A TW202440270 A TW 202440270A
Authority
TW
Taiwan
Prior art keywords
polishing
measured
data point
substrate
measurement
Prior art date
Application number
TW112149903A
Other languages
English (en)
Chinese (zh)
Inventor
佐鳥博俊
Original Assignee
日商荏原製作所股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商荏原製作所股份有限公司 filed Critical 日商荏原製作所股份有限公司
Publication of TW202440270A publication Critical patent/TW202440270A/zh

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/003Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving acoustic means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/005Control means for lapping machines or devices
    • B24B37/013Devices or means for detecting lapping completion
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/02Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
    • B24B49/04Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent involving measurement of the workpiece at the place of grinding during grinding operation
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/10Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving electrical means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/10Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving electrical means
    • B24B49/105Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving electrical means using eddy currents
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/12Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/14Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the temperature during grinding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Acoustics & Sound (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
TW112149903A 2022-12-26 2023-12-21 研磨方法、研磨裝置、及電腦可讀取記錄媒體 TW202440270A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022-208734 2022-12-26
JP2022208734A JP2024092647A (ja) 2022-12-26 2022-12-26 研磨方法、研磨装置、およびコンピュータ読み取り可能な記録媒体

Publications (1)

Publication Number Publication Date
TW202440270A true TW202440270A (zh) 2024-10-16

Family

ID=91717295

Family Applications (1)

Application Number Title Priority Date Filing Date
TW112149903A TW202440270A (zh) 2022-12-26 2023-12-21 研磨方法、研磨裝置、及電腦可讀取記錄媒體

Country Status (6)

Country Link
EP (1) EP4644043A1 (enExample)
JP (1) JP2024092647A (enExample)
KR (1) KR20250132481A (enExample)
CN (1) CN120500399A (enExample)
TW (1) TW202440270A (enExample)
WO (1) WO2024142632A1 (enExample)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5340795B2 (ja) 2009-04-27 2013-11-13 株式会社荏原製作所 研磨方法及び研磨装置
JP2021028099A (ja) * 2019-08-09 2021-02-25 株式会社荏原製作所 終点検知装置、終点検知方法
JP2021194748A (ja) * 2020-06-17 2021-12-27 株式会社荏原製作所 研磨装置及びプログラム
JP7783104B2 (ja) * 2021-04-28 2025-12-09 株式会社荏原製作所 研磨装置および研磨方法

Also Published As

Publication number Publication date
KR20250132481A (ko) 2025-09-04
EP4644043A1 (en) 2025-11-05
WO2024142632A1 (ja) 2024-07-04
CN120500399A (zh) 2025-08-15
JP2024092647A (ja) 2024-07-08

Similar Documents

Publication Publication Date Title
TWI846048B (zh) 用於拋光基板的方法及拋光系統
JP6033751B2 (ja) 研磨方法
JP2004531077A (ja) 研磨パッドをコンディショニングする構造および方法
JP2020518131A (ja) モニタリング用のニューラルネットワークを用いた研磨装置
TWI881169B (zh) 研磨裝置、及研磨墊之交換時期之決定方法
CN110044249B (zh) 一种膜厚测量方法、系统及化学机械抛光装置
KR20130094676A (ko) Cmp 그루브 깊이 및 컨디셔닝 디스크 모니터링
JP2023517450A (ja) 隣接する導電層のスタックの研磨中のプロファイル制御
JP6509766B2 (ja) 半導体製造装置および半導体装置の製造方法
JP3303963B2 (ja) ウェーハの厚み加工量測定装置
TW202440270A (zh) 研磨方法、研磨裝置、及電腦可讀取記錄媒體
JP2009076922A (ja) 連続的半径測定によるウェハ縁の特徴付け
JP3853106B2 (ja) ポリッシング装置及び方法
TWI806898B (zh) 用於晶圓上準確的感測器位置判定的振動校正
CN110549240B (zh) 一种终点检测方法和化学机械抛光装置
TW202335788A (zh) 研磨終點檢測方法、研磨終點檢測系統、研磨裝置、及電腦可讀取之記錄媒體
JP2004106123A (ja) 研磨方法、cmp装置及び膜厚測定装置
JP2023159949A (ja) 研磨終点検出のためのパラメータ調整方法および研磨終点検出システム
JP7504713B2 (ja) 半導体製造装置及び半導体製造方法
JP3324235B2 (ja) 加工物の研磨方法及びその研磨装置並びにそれを用いた半導体基板
JPH11104955A (ja) 研磨終点検出方法、研磨方法及び研磨装置
JP2009028805A (ja) 研磨装置
TW202436028A (zh) 研磨裝置、資訊處理裝置及程式
US6254454B1 (en) Reference thickness endpoint techniques for polishing operations
JP2025004437A (ja) 研磨方法、研磨装置、およびコンピュータに該研磨方法を実行させるためのプログラム