TW202417867A - Test handler for electronic component - Google Patents

Abstract

The present invention relates to a test handler for electronic component. Specifically, according to an embodiment of the present invention, the test handler comprises: a stacker part capable of storing a customer tray on which a plurality of electronic components are loaded; a hand part capable of supporting and transferring the plurality of electronic components placed on the customer tray in a hand part transfer area; a spacing adjustment shuttle for transferring the plurality of electronic components of the hand part from one side to the other side along a predetermined path within a shuttle transfer area, wherein the spacing between the plurality of electronic components on one side is different from the spacing between the plurality of electronic components on the other side; a gripper for gripping and transferring the plurality of electronic components from the other side of the spacing adjustment shuttle within a gripper transfer area; a test tray on which the plurality of electronic components transferred by the gripper can be placed; and a pressing module capable of pressing the plurality of electronic components placed on the test tray toward the test tray, wherein one side of the shuttle transfer area overlaps the hand part transfer area, and the other side of the shuttle transfer area overlaps the gripper transfer area.

Description

Electronic component testing sorting machine

Invention Field

The present invention relates to a test handler for electronic components (TEST HANDLER FOR ELECTRONIC COMPONENT).

Invention Background

A test handler is a device that tests electronic components such as semiconductor devices that have been manufactured through a specified manufacturing process and classifies the electronic components into grades based on the test results. This test handler tests electronic components such as semiconductor devices by electrically connecting them to a tester.

On the other hand, in order to electrically connect a plurality of electronic components to a tester, it is necessary to arrange the plurality of electronic components corresponding to the connection portion of the tester. Therefore, it is possible to test the plurality of electronic components after loading them in a test tray having a prescribed arrangement before connecting the electronic components to the tester. However, the plurality of electronic components manufactured by a prescribed manufacturing process are supplied by being loaded on a customer tray, and in order to test them, it is necessary to extract the plurality of electronic components from the customer tray and transfer them to the test tray.

However, when a plurality of electronic components are transferred from the user tray to the test tray at the same time, a problem occurs. Specifically, the spacing between the pockets for placing the electronic components of the plurality of test trays is made corresponding to the tester, and the spacing between the pockets of these test trays may be different from the spacing between the pockets for placing the plurality of electronic components in the user tray. Therefore, the plurality of electronic components cannot be directly transferred from the user tray to the test tray, and before the plurality of electronic components are transferred to the test tray, the spacing of the plurality of electronic components needs to be adjusted corresponding to the spacing between the pockets of the test tray.

Therefore, there is a need for a device that can connect a plurality of electronic components to a tester by extracting a plurality of electronic components from a user tray and transferring the plurality of electronic components to a test tray after adjusting the spacing between the plurality of electronic components to correspond to the spacing between the recesses of the test tray.

Summary of the invention

In view of the above background, the present invention provides an electronic component test handler, which can extract a plurality of electronic components from a user tray, adjust the plurality of electronic components to correspond to the intervals between the notches of the test tray, and then transfer the electronic components to the test tray.

In addition, a sorting machine for testing electronic components is provided, which can increase the logistics circulation speed and improve the efficiency of the sorting machine by adjusting the distance between the notches during transfer.

In addition, a sorting machine for testing electronic components is provided, which can easily combine and separate the recess and the recess support body to correspond to electronic components of various sizes.

According to one aspect of the present invention, there is provided a sorting machine for testing electronic components, which includes: a stacker part for storing a user tray loaded with a plurality of electronic components; a hand for supporting and transferring the plurality of electronic components placed in the user tray in a hand transfer area; and a spacing adjustment shuttle configured to transfer the plurality of electronic components from the hand from one side to the other side along a prescribed path in the shuttle transfer area, wherein the spacing between the plurality of electronic components in the one side is different from the spacing between the plurality of electronic components in the other side. The invention relates to a method for adjusting the spacing between sub-components; a clamper that can be used to hold and transfer multiple electronic components from the other side of the spacing adjustment shuttle in the clamper transfer area; a test tray in which the multiple electronic components transferred by the clamper can be placed; and a press module that can be used to press the multiple electronic components placed in the test tray toward the test tray, the one side of the shuttle transfer area overlaps with the hand transfer area, and the other side of the shuttle transfer area overlaps with the clamper transfer area.

In addition, a sorting machine for testing electronic components is provided, wherein the specified path within the shuttle transfer area includes an approach path from one side to the other side while the multiple electronic components are transferred along a direction parallel to the imaginary plane, and the spacing adjustment shuttle transfers the multiple electronic components in a state where the multiple electronic components are placed along a direction parallel to the imaginary plane.

In addition, a sorting machine for testing electronic components is provided, wherein the hand and the clamper can be configured so that the hand transfer area and the clamper transfer area do not overlap each other.

In addition, a sorting machine for testing electronic components is provided, which also includes a plurality of notch units, in which a plurality of electronic components can be placed, and the plurality of notch units include a plurality of first notch units and a plurality of second notch units, and the spacing adjustment shuttle includes: a first cam portion, the first cam portion having a plurality of three-dimensional guide paths, and the plurality of three-dimensional guide paths are used to adjust the spacing between the first notch units; and a second cam portion, the second cam portion having a plurality of three-dimensional guide paths, and the plurality of three-dimensional guide paths are used to adjust the spacing between the second notch units, wherein the first cam portion and the plurality of first notch units are structures that move together along the prescribed path, and the second cam portion and the plurality of second notch units are structures that move together along the prescribed path.

In addition, a sorting machine for testing electronic components is provided, wherein the spacing adjustment shuttle, the plurality of notch units include: a notch for providing a space for placing the electronic components; a notch support for detachably supporting the notch; and a cam follower, the cam follower is engaged with the guide path, at least a portion of the plurality of guide paths has a bend between one end and the other end, the distance between the one ends of the plurality of guide paths has a first spacing, the first spacing is equal to the spacing in the user tray. The spacing between the electronic components is the same, the distance between the other ends of the plurality of guide paths has a second spacing, which is the same as the spacing between the electronic components in the test tray and is larger than the first spacing, the distance between the curved portions of the plurality of guide paths has a third spacing, which is larger than the first spacing and smaller than the second spacing, and when the cam follower is engaged with the other end of the guide path, the notch support body selectively releases support for the notch.

In addition, a sorting machine for testing electronic components is provided, which also includes a plurality of notch units, in which a plurality of electronic components can be placed, the plurality of notch units include notches, the notches include hooks and notch frames, the hooks are used to provide space for placing electronic components and selectively fix the electronic components; the notch frame is used to support the hooks, the spacing adjustment shuttle includes a free adjuster, and the free adjuster is used to move forward and backward relative to the notch frame to release the fixation of the electronic components by the plurality of hooks.

In addition, a sorting machine for testing electronic components is provided, wherein the spacing adjustment shuttle includes: a lifting module for lifting the plurality of notch units and the first cam portion; and a moving module for causing the plurality of notch units, the first cam portion, and the second cam portion to move back and forth in a direction different from the direction in which the notch units, the first cam portion, and the second cam portion are lifted and lowered by the lifting module, wherein the moving module causes the second cam portion to move in one direction and the first cam portion to move in a direction opposite to the one direction when the first cam portion is lowered by the lifting module, and the lifting module causes the first cam portion to rise when the first cam portion and the second cam portion are moved in opposite directions by the moving module.

According to the embodiment of the present invention, it is possible to extract a plurality of electronic components from a user tray, adjust the electronic components to the intervals between the notches of the test tray, and then transfer the electronic components to the test tray.

In addition, by adjusting the distance between the notches during transfer, the logistics circulation speed can be increased and the efficiency of the sorting machine can be improved.

Furthermore, the recess and the recess support can be easily combined and separated to correspond to electronic components of various sizes.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Hereinafter, specific embodiments for embodying the concept of the present invention will be described in detail with reference to the accompanying drawings.

At the same time, in the process of explaining the present invention, if it is determined that the specific description of the relevant known structure or function makes the main purpose of the present invention unclear, the detailed description thereof will be omitted.

Moreover, when a structural element is "connected", "supported" or "combined" with other structural elements, it can be understood as being directly connected, supported or combined with other structural elements, or it can be understood as the presence of other structural elements in between.

The terms used in this specification are only used to describe specific embodiments and are not intended to limit the present invention. As long as there is no special indication in the context, the singular expression includes the plural expression.

In addition, terms including ordinal numbers such as first and second can be used to describe various structural elements, but the corresponding constituent elements are not limited by these terms. The purpose of using these terms is only to distinguish one structural element from other structural elements.

The term “include” used in the specification means specifying characteristics, regions, integers, steps, actions, elements and/or components, but does not exclude the existence of other or additional characteristics, regions, integers, steps, actions, elements, components and/or groups.

Moreover, it is obvious that in this specification, the expressions of the upper side, the lower side, the front side, etc. are described based on the attached drawings, and different expressions may be performed if the directions of the corresponding objects are changed. On the other hand, the upper and lower directions in this specification may be the z-axis directions of FIG. 1 . That is, the upper side direction may be the +z-axis direction, and the lower side direction may be the -z-axis direction. Moreover, the front-back direction may be the x-axis direction of FIG. 1 . That is, the rear side direction may be the +x-axis direction, and the front side direction may be the -x-direction. Moreover, the left-right direction may be the y-axis direction of FIG. 1 , that is, the right side direction may be the +y-axis direction, and the left side direction may be the -y-axis direction.

Hereinafter, the specific structure of the electronic component testing sorting machine 1 according to the first embodiment of the present invention will be described with reference to the accompanying drawings.

1, an electronic component test sorting machine 1 according to an embodiment of the present invention can transfer electronic components loaded on a user tray T so as to contact a tester (not shown). In addition, electronic components tested by the tester can be transferred and loaded on the user tray T. The electronic component test sorting machine (1) may include a support body 100, a stacker part 200, a hand 300, a spacing adjustment shuttle 400, a notch unit 500, a clamp 600, a test tray 700, and a press module 800.

The support body 100 can support the stacker part 200 and the hand 300, and can provide a space for loading and transferring the user tray T. In addition, the support body 100 can be formed with an opening 110 so that the user tray loaded with electronic components is exposed to the hand 300. When the user tray T loaded with electronic components is located inside the opening 110, the hand 300 can transfer the electronic components from the user tray T to the spacing adjustment shuttle 400. On the other hand, the support body 100 can further include a lifter (not shown) for transferring the user tray T from the stacker part 200 to the inside of the opening 110.

The stacker unit 200 can store a user tray T loaded with electronic components. The stacker unit 200 can be supported by the support body 100. In addition, the user tray T loaded on the stacker unit 200 can be transferred to the opening 110 of the support body 100 by the lifter, or can be transferred from the opening 110 to the stacker unit 200 again.

2 , the hand 300 can support a plurality of electronic components loaded on the user tray T, and transfer the electronic components to the spacing adjustment shuttle 400. The hand 300 can transfer a plurality of electronic components at the same time. The hand 300 can transfer a plurality of electronic components within a specified area. In addition, the hand 300 can be supported and moved by a transfer rail (not shown), and can support a plurality of electronic components from the user tray T on the upper side of the opening portion 110. The area where the hand 300 transfers the electronic components can be defined as a hand transfer area. The hand transfer area overlaps with the shuttle transfer area on one side (e.g., the front side) of the spacing adjustment shuttle 400, but may not overlap with the clamper transfer area described later. The hand 300 transfers the supported electronic component to the spacing adjustment shuttle 400, thereby placing the supported electronic component in a pocket 510 described later of the spacing adjustment shuttle 400. A plurality of hands 300 may be provided, and the plurality of hands 300 may include a first hand 301 and a second hand 302.

The first hand 301 and the second hand 302 can transfer the electronic components from the user tray T to the spacing adjustment shuttle 400. The first hand 301 and the second hand 302 can transfer a plurality of electronic components to the spacing adjustment shuttle 400, and the first hand 301 and the second hand 302 can transfer the electronic components to the spacing adjustment shuttle 400 alternately. For example, while the first hand 301 transfers the electronic components to the first cam portion 411 described later, the second hand 302 can support the electronic components from the user tray T and prepare to transfer the electronic components to the spacing adjustment shuttle 400. In addition, when the positions of the first cam portion 411 described later and the second cam portion 412 described later are interchanged, the second hand 302 can transfer the electronic components to the second cam portion 412. While the second hand 302 is transferring the electronic component, the first hand 301 supports the electronic component and prepares to transfer the electronic component to the spacing adjustment shuttle 400 .

On the other hand, the hand 300 may include a hand body 310 and a picking module 320 .

The hand body 310 can support a plurality of pick-up modules 320. The hand body 310 is supported on a transfer rail so as to move back and forth between the upper area of the opening 110 and the upper area of the notch 510 of the spacing adjustment shuttle 400.

The pick-up module 320 can support electronic components. The pick-up module 320 can be supported by the hand body 310 so as to be raised and lowered relative to the hand body 310. That is, the pick-up module 320 can support electronic components by being lowered relative to the hand body 310, and can be raised relative to the hand body 310 when supporting electronic components. In addition, a plurality of pick-up modules 320 can be provided, and the plurality of pick-up modules 320 can be supported by the hand body 310 and spaced apart from each other at a prescribed distance in one direction. The distance between the plurality of pick-up modules 320 can be the same as the distance between the electronic components placed on the user tray T. Therefore, the plurality of pick-up modules 320 can support and transfer the plurality of electronic components from the user tray T without adjusting the spacing therebetween. The spacing between the electronic components placed in the user tray T and the spacing between the plurality of pick-up modules 320 can be the first spacing a.

In addition, for the plurality of pick-up modules 320, eight pick-up modules 320 may be provided as an example. However, this is only an example, and any number of pick-up modules 320 may be provided, and therefore the spirit of the present invention is not limited thereto. In addition, the plurality of pick-up modules 320 may support a plurality of electronic components simultaneously or individually. As a more detailed example, the plurality of pick-up modules 320 may support a plurality of electronic components simultaneously, or a portion of the plurality of pick-up modules 320 may first support a portion of the plurality of electronic components, and then another portion of the pick-up modules 320 may support another portion of the electronic components.

On the other hand, among the pick-up modules 320, all or part of the plurality of pick-up modules 320 may be used according to the size of the electronic component to be supported. For example, when the size of the electronic component to be supported is small, all of the eight pick-up modules 320 may be used to support the eight electronic components, respectively. As another example, when the size of the electronic component to be supported is larger than the spacing between the plurality of pick-up modules 320, four of the eight pick-up modules 320 may be used. That is, the first pick-up module 320, the third pick-up module 320, the fifth pick-up module 320, and the seventh pick-up module 320 can support four electronic components respectively, and the second pick-up module 320, the fourth pick-up module 320, the sixth pick-up module 320, and the eighth pick-up module 320 may not support electronic components. Among them, the first to eighth pick-up modules 320 are the first to eighth pick-up modules 320 named in the order of the eight pick-up modules 320 supported on the hand body 310 in sequence from the outermost side. However, even when the eight pick-up modules 320 support four large-sized electronic components, all eight pick-up modules 320 can support four electronic components. As another example, when the size of the electronic component to be supported increases further, the number of unused pick-up modules 320 may be two or more. In other words, only the first pick-up module 320, the fourth pick-up module 320, and the seventh pick-up module 320 may support three electronic components, respectively. In this way, the pick-up module 320 may use only any number of pick-up modules 320 from a plurality of pick-up modules 320 according to the size of the electronic component to be supported.

In addition, the method of the pick-up module 320 supporting the electronic component can have various known technologies. For example, the pick-up module 320 can directly hold the electronic component. As another example, the pick-up module 320 can support the electronic component by adsorption of vacuum pressure. However, this is only an example and does not limit the spirit of the present invention.

The pick-up module 320 can be replaced with another pick-up module 320 according to the length of the supported electronic component. The pick-up module 320 may include: a coupling portion 321, which provides a portion of the pick-up module 320 coupled with the hand body 310; and a picker 322, which provides a portion that supports the electronic component.

The coupling portion 321 may be selectively coupled to the hand body 310. When it is necessary to alternately pick up the modules 320, these coupling portions 321 may be separated from the hand body 310. In addition, the coupling portion 321 may support one or more pickers 322. For example, when supporting an electronic component having a short length, a coupling portion 321 having one picker 322 may be coupled to the hand body 310. As another example, when supporting an electronic component having a long length, a coupling portion 321 having two or more pickers 322 may be coupled to the hand body 310. Therefore, the pick-up module 320 can be replaced with other pick-up modules 320 by installing the coupling portion 321 having a required number of pickers 322 into the hand body 310 according to the length of the supported electronic component.

3a and 4, the spacing adjustment shuttle 400 can transfer the electronic components from one side (e.g., the front side) to the other side (e.g., the rear side) along a prescribed path. The prescribed path provided in the spacing adjustment shuttle 400 may include an approach path that approaches from one side to the other side within the shuttle transfer area during the transfer of the plurality of electronic components along a direction parallel to the imaginary plane. In addition, the spacing adjustment shuttle 400 can transfer the plurality of electronic components in a state where the plurality of electronic components are placed along a direction parallel to the imaginary plane. For example, the approach path may be a path for transferring the plurality of electronic components along a direction parallel to a horizontal plane, and when the imaginary plane is a horizontal plane, the electronic components may be transferred while being placed parallel to the horizontal plane (lying).

In addition, the area where the spacing adjustment shuttle 400 transfers electronic components can be defined as a shuttle transfer area.

The spacing shuttle 400 can adjust the spacing between the plurality of electronic components transferred by the hand 300. The spacing between the electronic components placed in the spacing shuttle 400 in one side can be different from the spacing between the electronic components placed in the spacing shuttle 400 in the other side. For example, the spacing between the electronic components placed in the spacing shuttle 400 can become wider as the electronic components are transferred from one side (front side) to the other side (rear side).

The spacing adjustment shuttle 400 can move the notch unit 500 in which the electronic components are placed back and forth, and can adjust the spacing between the plurality of electronic parts by adjusting the spacing between the plurality of notch units 500. The spacing adjustment shuttle 400 can adjust the spacing between the plurality of notch units 500 corresponding to the spacing between the plurality of pick-up modules 320 supporting the electronic components. Therefore, the pick-up module 320 can transfer the plurality of electronic components from the user tray T and place them in the plurality of notches 510 without adjusting the spacing between them. Among them, the spacing between the plurality of notch units 500 adjusted corresponding to the spacing between the plurality of pick-up modules 320 can be a first spacing a. In addition, the first spacing a can be the same as the spacing between the plurality of electronic components in the left-right direction in the user tray (T).

In addition, the spacing adjustment shuttle 400 may adjust the spacing between the plurality of notch units 500 corresponding to the plurality of grooves formed in the test tray 700 described later on which the electronic components may be placed. In addition, the spacing adjustment shuttle 400 may adjust the spacing between the plurality of notch units 500 corresponding to the spacing between the plurality of holding units 620 supporting the electronic components in the side of the clamp 600. The spacing between the plurality of grooves formed in the test tray 700 and the spacing between the plurality of holding units 620 may be the second spacing b. Furthermore, the spacing adjustment shuttle 400 may adjust the spacing between the plurality of notch units 500 to the second spacing b. The spacing adjustment shuttle 400 may include a cam module 410 , a base 420 , a lifting module 430 , and a transfer module 440 .

The cam module 410 can adjust the spacing between the multiple electronic components transferred by the hand 300. The cam module 410 rotates around a predetermined axis so that the recess unit 500 in which the multiple electronic components are placed moves in a straight line. For example, the cam module 410 rotates in one direction so that the multiple recess units 500 move in a straight line in one direction; the cam module 410 rotates in another direction so that the multiple recess units 500 move in a straight line in another direction. Moreover, the cam module 410 can be transferred from a predetermined position to another position through one or more of the lifting module 430 and the transfer module 440, and the spacing between the multiple recess units 500 can be adjusted during the transfer. The cam module 410 can be transferred from the hand transfer area to the clamp transfer area through the transfer module 440. In addition, when the cam module 410 is located at the front side (hand transfer area), the spacing between the plurality of notch units 500 is adjusted to a first spacing a, and when the cam module 410 is located at the rear side (clamp transfer area), the spacing between the plurality of notch units 500 is adjusted to a second spacing. These cam modules 410 may include a first cam portion 411 and a second cam portion 412.

The first cam portion 411 adjusts the spacing between the plurality of first notch units 501 described later. Among the plurality of notch units 500, the notch unit 500 transferred by the first cam portion 411 is defined as the first notch unit 501. The first cam portion 411 can make the first notch unit 501 slide on the first substrate 424 described later. The first cam portion 411 can have a three-dimensional guide path 413, and the three-dimensional guide path 413 is used to adjust the spacing between the plurality of first notch units 501.

In addition, the second cam portion 412 adjusts the spacing between the plurality of second notch units 502 described later. Among the plurality of notch units 500, the notch 510 transferred by the second cam portion 412 is defined as the second notch unit 502. The second cam portion 412 can make the second notch unit 502 slide on the second base 425 described later. The second cam portion 412 can have a three-dimensional guide path 413, and the three-dimensional guide path 413 is used to adjust the spacing between the plurality of second notch units 502.

The first cam portion 411 can be raised or lowered by the lifting module 430, and can be moved in the front-rear direction by the transfer module 440. In addition, the second cam portion 412 can be moved in the front-rear direction by the transfer module 440. The first cam portion 411 and the second cam portion 412 can move in opposite directions. That is, when the first cam portion 411 moves forward, the second cam portion 412 moves backward, and when the first cam portion 411 moves backward, the second cam portion 412 moves forward.

The first cam portion 411 and the second cam portion 412 may be moved along a prescribed path by the lifting module 430 and the transfer module 440. The prescribed path may include a first cam portion path and a second cam portion path. The first cam portion path is a path in which the electronic components of the spacing adjustment shuttle 400 move from one side to the other side through the first cam portion 411 and the first base 424, and the second cam path is a path in which the electronic components of the spacing adjustment shuttle 400 move from one side to the other side through the second cam portion 412 and the second base 425.

Hereinafter, referring to FIG. 5 , the first cam portion path will be described in further detail.

First, the first cam portion 411 is located on the hand 300 side, and the electronic components can be placed in the first notch unit 501. When the second cam portion 412 is located on the clamp 600 side, the plurality of first notch units 501 connected to the first cam portion 411 can be adjusted to a first spacing a corresponding to the spacing of the plurality of pickup modules 320 through the first cam portion 411. Moreover, the plurality of second notch units 502 connected to the second cam portion 412 can be adjusted to a second spacing b corresponding to the spacing of the plurality of gripping units 620 through the second cam portion 412. At this time, the plurality of electronic components can be placed in the plurality of first notch units 501 through the hand 300, and the plurality of electronic components placed in the plurality of second notch units 502 can be transferred through the clamp. Therefore, the first notch unit 501 is in a state where an electronic component is placed, and the second notch unit 502 is in an empty state because no electronic component is placed therein (refer to FIG. 5 a ).

Thereafter, the first cam portion 411 descends relative to the second cam portion 412 (see FIG. 5b ).

When the first cam portion 411 descends, the first cam portion 411 can move backward, and the second cam portion 412 can move forward. At this time, the first cam portion 411 adjusts the spacing between the plurality of first notch units 501 to the second spacing b during the movement backward, and the second cam portion 412 adjusts the spacing between the plurality of second notch units 502 to the first spacing a during the movement forward (see 5c).

When the first cam portion 411 moves rearward, the first cam portion 411 rises relative to the second cam portion 412 (see FIG. 5 d ).

When the first cam portion 411 rises, the clamp 600 can hold the plurality of electronic components placed in the plurality of first recess units 501 and transfer them to the test tray 700 , and the hand 300 can transfer the electronic components from the user tray T to the plurality of second recess units 502 .

Hereinafter, referring to FIG. 6 , the second cam portion path will be described in further detail.

First, the plurality of first notch units 501 may be in a state where the intervals between them are adjusted to the second interval b, and the inside of the notch 510 may be in an empty state. In addition, the plurality of second notch units 502 may be in a state where the intervals between them are adjusted to the first interval a, and the inside of the notch 510 may be in a state where electronic components are placed (see FIG. 6 a).

Thereafter, the first cam portion 411 descends relative to the second cam portion 412 (see FIG. 6b ).

When the first cam portion 411 descends, the second cam portion 412 can move backward, and the first cam portion 411 can move forward. At this time, the first cam portion 411 adjusts the spacing between the plurality of first notch units 501 to the first spacing a during the forward movement, and the second cam portion 412 adjusts the spacing between the plurality of second notch units 502 to the second spacing b during the backward movement (see 6c).

If the second cam portion 412 moves rearward, the first cam portion 411 rises (see FIG. 6d ).

When the first cam portion 411 rises, the hand 300 can place the plurality of electronic components in the plurality of first notch units 501 , and the clamp 600 can hold the plurality of electronic components placed in the plurality of second notch units 502 and transfer them to the test tray 700 .

In this way, the first cam portion 411, the second cam portion 412, the hand 300, and the clamp 600 repeatedly perform a series of processes, thereby transferring a plurality of electronic components from the user tray T to the test tray 700. In addition, the first cam portion 411, the second cam portion 412, the hand 300, and the clamp 600 repeatedly perform a process opposite to the process described above, thereby transferring the tested electronic components from the test tray 700 to the user tray T.

In addition, referring to FIG. 7 , a guide path 413 may be formed in the cam module 410, wherein the guide path 413 is used to guide the relative movement of the notch unit 500 to the cam module 410. That is, although the cam module 410 and the notch unit 500 move together along a prescribed path, the cam module 410 and the notch unit 500 can move relative to each other. In addition, a plurality of guide paths 413 may be provided to guide the movement of the plurality of notch units 500. The guide path 413 may extend in a three-dimensional space. The guide path 413 may be formed to extend along the circumferential direction of the first cam portion 411 and the second cam portion 412, and bend toward the axial direction of the first cam 411 and the second cam 412 (e.g., the left-right direction of FIG. 7 ). In addition, the guide path 413 may have a curved portion 413a between one end and the other end. The curved portion 413a may be a portion of the guide path 413 that changes the curved direction of the guide path 413. In addition, a plurality of guide paths 413 may be formed in the cam module 410 so as to be spaced apart from each other in the axial direction. On the other hand, a cam follower 521b of a notch support body 520 described later may be inserted into the guide path 413. In this way, since the cam module 410 rotates in a state where the cam follower 521 is inserted into the guide path 413, the notch unit 500 may be moved in one direction according to the rotation of the cam module 410. The circumferential direction of the cam module 410 refers to the circumferential direction of the cam module 410 , and the axial direction of the cam module 410 refers to the predetermined axial direction of the cam module 410 rotating.

On the other hand, the distance between one end of the plurality of guide paths 413 may have a first spacing a. Therefore, when the cam module 410 rotates in one direction so that the cam follower 521b of the notch unit 500 is located at one end of the guide path 413, the distance between the plurality of notch units 500 may be adjusted to the first spacing a.

In addition, the spacing between the other ends of the plurality of guide paths 413 may have a second spacing b that is longer than the first spacing a. Therefore, when the cam module 410 rotates in the other direction so that the cam follower 521b of the notch unit 500 is located at the other end of the guide path 413, the spacing between the plurality of notch units 500 may be adjusted to the second spacing b. In addition, when the cam follower 521b is engaged with the other end of the guide path 413, the notch support body 520 may selectively release the support for the notch 510.

In addition, the distance between the curved portions 413a of the plurality of guide paths 413 may have a third distance c that is longer than the first distance a and shorter than the second distance b. Therefore, when the cam module 410 is rotated at a predetermined angle so that the cam follower 521b of the notch unit 500 is located at the curved portion 413a of the guide path 413, the distance between the plurality of notch units 500 may be adjusted to the third distance c.

In this way, the cam module 410 can adjust the interval between the plurality of notch units 500 to any one of the first interval a, the second interval b and the third interval c by rotating.

3a and 4 again, the base portion 420 can support the cam module 410 and provide a sliding portion for the notch unit 500. The base portion 420 can include a base plate 421, a free adjuster 422, and a pressurizing portion 423.

The base plate 421 can support the cam module 410, the free adjuster 422, the pressurizing portion 423, and the notch unit 500. In addition, the base plate 421 can have a track (not shown) for the notch unit 500 to slide. In this way, the plurality of notch units 500 can slide along the base plate 421 by the rotation of the cam module 410.

3b and 3c, the free adjuster 422 may be configured to be able to move toward or away from the substrate 421. For example, the free adjuster 422 may be raised and lowered relative to the substrate 421. In addition, the free adjuster 422 presses the pressing component 522 of the notch unit 500 described later, thereby being able to switch the holding component 513 described later to an open state. That is, when the free adjuster 422 rises and presses the pressing component 522, the pressing component 522 rises so that the open link 524 connected to the pressing component 522 presses the holding component 513, thereby releasing the fixing of the electronic component by the holding component 513. The free adjuster 422 can pressurize one side of the holding part 513 by pressing the component 522 and opening the link 524, and when the one side of the holding part 513 is pressed, the other side of the holding part 513 can rotate a specified angle, thereby releasing the fixation of the electronic component. The open state of the holding part 513 refers to a state in which the electronic component is not located on the upper side of the placing part 511a in order to place the electronic component in the placing part 511a of the recess 510 or detach from the placing part 511a, wherein the placing part 511a will be described later. For example, when one of the hand 300 and the clamp 600 places the electronic component in the notch unit 500, the free adjuster 422 may press the pressing part 522, thereby switching the holding part 513 to the open state.

In addition, when the electronic component is placed in the notch unit 500 so that the free adjuster 422 descends, the holding part 513 is in a closed state, so that the electronic component can be fixed to the notch 510. The closed state of the holding part 513 refers to a state in which a part of the holding part 513 is located on the upper side of the placement portion 511a of the notch 510 in order to prevent the electronic component placed in the notch 510 from escaping from the notch 510, wherein the placement portion 511a will be described later. In this way, the holding part 513 can be switched to an open state or a closed state by lifting and lowering the free adjuster 422 relative to the substrate 421. On the other hand, as an example, the shape of the free adjuster 422 can be composed of a plurality of long plates or strips, and the plurality of strips can be lifted and lowered by a single cylinder. As another example, the free adjuster 422 can be a "mouth"-shaped quadrangular frame formed by a plurality of bars as a whole, and can be raised and lowered by a cylinder. In this way, no matter where the notch unit 500 is located in the free adjuster 422, as long as the shape of the free adjuster 422 can open or close the holding part 513 as described above, its shape can be changed. The rise or fall of the free adjuster 422 can be driven by a lifting cylinder (not shown).

On the other hand, the free adjuster 422 may include a first pressing portion 422a, a second pressing portion 422b and an interface portion 422c.

The first pressing portion 422a and the second pressing portion 422b can be lifted and lowered toward the recess 510 to press the pressing member 522 of the recess 510. The first pressing portion 422a and the second pressing portion 422b can be lifted and lowered at the same time, and can press the pressing member 522 together. In addition, the first pressing portion 422a and the second pressing portion 422b can be connected through the interface portion 422c, and the first pressing portion 422a, the second pressing portion 422b and the interface portion 422c can be formed in one piece. However, the spirit of the present invention is not limited to this, and the first pressing portion 422a and the second pressing portion 422b can be separately provided, or can be provided to press the pressing member 522 by lifting and lowering separately.

The pressurizing part 423 may pressurize the lever 523 of the notch unit 500, wherein the lever 523 is described later. In addition, when the lever 523 is located at the upper side of the pressurizing part 423, the pressurizing part 423 may rise toward the lever 523 so that the lever 523 is located between the pressurizing part 423. In this way, the pressurizing part 423 may pressurize the lever 523 by rising toward the lever 523, thereby separating the notch 510 and the notch support body 520. The pressurizing part 423 may rise by a roller lifting cylinder (not shown). For example, the pressurizing part 423 may be a roller. Although the pressurizing portion 423 is represented by a roller in this specification, this is merely an example, and the roller in this specification may be replaced by other known structures capable of pressurizing the lever 523.

In addition, a plurality of pressurizing parts 423 may be provided, and the plurality of pressurizing parts 423 may be provided at intervals in the substrate 421. The plurality of pressurizing parts 423 may be provided to correspond to the position when the intervals between the plurality of notch units 500 are adjusted to the second interval b. For example, when the plurality of notch units 500 are adjusted to the second interval b, the notch units 500 may be located on the upper side of the pressurizing part 423. At this time, the pressurizing part 423 may rise and press the lever 523 to separate the notch 510 and the notch support 520. In this way, since the notch unit 500 can be separated into the notch 510 and the notch support 520 by the pressurizing portion 423 when the notch unit 500 is at the maximum distance b from each other, the notch 510 can be changed to any size from a small notch 510 to a large notch 510.

On the other hand, the base portion 420 may include a plurality of bases, and the plurality of bases may include a first base 424 and a second base 425. Each of the first base 424 and the second base 425 may include a base plate 421, a free adjuster 422, and a pressurizing portion 423. The first base 424 supports the first cam portion 411 so that the first cam portion 411 can move relative to the first base 424, and a plurality of first notch units 501 are provided with sliding portions. The second base 425 supports the second cam portion 412 so that the second cam portion 412 can move relative to the second base 425, and a plurality of second notch units 502 are provided with sliding portions.

The lifting module 430 may raise or lower the first cam portion 411 and the first base 424 relative to the second cam portion 412 and the second base 425. The lifting module 430 may be connected to the first base 424. In addition, when the first cam portion 411 and the first base 424, and the second cam portion 412 and the second base 425 are moved in opposite directions to each other through the transfer module 440, the lifting module 430 may lift the first cam portion 411 and the first base 424.

The transfer module 440 can move the cam module 410 and the base 420 in the front-rear direction. When the first cam portion 411 and the first base 424 are lowered, the transfer module 440 moves the second cam portion 412 and the second base 425 in one direction and moves the first cam portion 411 and the first base 424 in another direction.

Referring to Fig. 8a, a portion for placing electronic components may be provided in the notch unit 500. In addition, the notch unit 500 can move along a prescribed path together with the cam module 410. The notch unit 500 may be provided in multiple numbers, and may include multiple first notch units 501 and second notch units 502. The multiple first notch units 501 are structures that can move along a prescribed path together with the first cam portion 411, and the multiple second notch units 502 are structures that can move along a prescribed path together with the second cam portion 412. In addition, the multiple first notch units 501 are structures that can slide on the first substrate 424, and the multiple second notch units 502 are structures that can slide on the second substrate 425.

In addition, the plurality of notch units 500 can slide on the base 420, and the intervals between the plurality of notch units 500 can be adjusted by the cam module 410. The notch unit 500 may include a notch 510 and a notch support 520.

Referring to Fig. 9a, Fig. 9b and Fig. 10, a space for placing an electronic component may be provided in the recess 510. The recess 510 may be selectively coupled to the recess support 520 and replaced according to the size of the electronic component to be tested. Therefore, by separating the recess 510 from the recess support 520 for replacement, electronic components of various sizes may be placed in the recess 510. In addition, corresponding to the replacement of the recess 510, the recess support 520 may be replaced with a recess support 520 of other sizes. Therefore, even if the recess support 520 is replaced with another recess support 520 corresponding to the size of the recess 510, as long as the size of the cam follower 521b described later can be maintained, it may be selectively coupled to the cam module 410.

The recess 510 may include a recess frame 511 , a coupling protrusion 512 , holding modules 513 , 514 , 515 , a holding component 513 , a first holding component support 514 , and a second holding component support 515 .

The recessed frame 511 can be in contact with electronic components, and includes a placement portion 511a, a frame wall portion 511b, and a frame body 511c, wherein the placement portion 511a is a portion for placing electronic components, the frame wall portion 511b and the frame body 511c protrude from the placement portion 511a, and prevent the electronic components from escaping from the placement portion 511a.

The placement portion 511a is provided with a portion for placing at least a portion of the electronic component. That is, a portion of the substrate of the electronic component without a chip attached thereto can be placed in the placement portion 511a. The placement portion 511a can be formed by protruding from the frame wall portion 511b. In addition, the placement portion 511a is formed by protruding from the placement substrate surface 511c-2, so that the chip portion of the electronic component placed on the placement portion 511a is spaced a specified distance from the placement substrate surface 511c-2. Therefore, when the electronic component is placed on the placement portion 511a, a specified space is formed between the electronic component and the placement substrate surface 511c-2, and the placement substrate surface 511c-2 can be prevented from causing damage to the chip portion of the electronic component. For example, in the case of a PCB (Printed Circuit Board) substrate, a plurality of chips with different heights, lengths, and widths can be carried on a flat substrate. The plurality of chips may be easily damaged by external impact and may be damaged by contact with other carriers during substrate transfer. Therefore, when the substrate is transferred in a horizontal state, it is necessary to transfer the chips without contacting the carrier.

The frame wall portion 511b is formed to protrude from the frame body 511c, and can prevent the electronic components placed on the placement portion 511a from escaping from the placement portion 511a. That is, the frame wall portion 511b can form the placement portion 511a and a step to prevent the electronic components from escaping from the placement portion 511a. In addition, the frame wall portion 511b is supported by the frame body 511c at a position closer to the outside than the placement portion 511a from the center of the frame body 511c in order to form the step. The frame wall portion 511b can be provided with a plurality of frame wall portions 511b, and the plurality of frame wall portions 511b are arranged at intervals along the length direction of the frame body 511c to form an insertion space S into which the clamp 600 can be inserted. For example, the insertion space S can be provided between the first wall portion 511b-1 and the second wall portion 511b-2. A plurality of frame wall portions 511b may be formed in the frame body 511c so as to avoid interference with the gripping portion 622 of the clamp 600. That is, the frame wall portions 511b may be formed in the frame body 511c corresponding to portions of the electronic component that are not gripped by the gripping portion 622.

The frame wall portion 511b may include a first wall portion 511b-1, a second wall portion 511b-2, a third wall portion 511b-3, a fourth wall portion 511b-4, a fifth wall portion 511b-5, and a sixth wall portion 511b-6.

The first wall portion 511b-1, the second wall portion 511b-2 and the third wall portion 511b-3 can be arranged on one side based on the first center line C1, wherein the first center line C1 passes through the center of the frame body 511c and extends along the width direction of the frame body 511c. In addition, the fourth wall portion 511b-4, the fifth wall portion 511b-5 and the sixth wall portion 511b-6 can be arranged on the other side based on the first center line C1. The width direction can be the y-axis direction of FIG. 14, and the length direction can be the x-axis direction of FIG. 14.

In addition, the first wall 511b-1, the second wall 511b-2, the third wall 511b-3, the fourth wall 511b-4, the fifth wall 511b-5 and the sixth wall 511b-6 can be arranged on both sides with the second center line C2 as the reference, wherein the second center line C2 passes through the center of the frame body 511c and extends along the length direction of the frame body 511c. For example, the first wall 511b-1, the second wall 511b-2, the third wall 511b-3, the fourth wall 511b-4, the fifth wall 511b-5 and the sixth wall 511b-6 can support the frame body 511c so as to be symmetrical with each other with the second center line C2 as the reference.

The first wall 511b-1, the second wall 511b-2, the third wall 511b-3, the fourth wall 511b-4, the fifth wall 511b-5 and the sixth wall 511b-6 can support the frame body 511c so as to be spaced apart from each other at a predetermined distance in the length direction. For example, in order to form a space for the holding portion 622 to hold the electronic component, the sum of the lengths of the first wall 511b-1, the second wall 511b-2 and the third wall 511b-3 along the second center line C2 direction may be less than the sum of the lengths of the fourth wall 511b-4, the fifth wall 511b-5 and the sixth wall 511b-6 along the second center line C2 direction. In order to hold the electronic components, the holding portion 622 described later can be inserted into the space between the first wall portion 511b-1 and the second wall portion 511b-2 and the space between the third wall portion 511b-3 and the fourth wall portion 511b-4. In this way, the holding portion 622 is not interfered by the notch frame 511 when holding and transferring the electronic components through the space between the first wall portion 511b-1 and the second wall portion 511b-2 and the space between the third wall portion 511b-3 and the fourth wall portion 511b-4.

In addition, the frame wall portion 511b may be formed with an inclined portion 511e and a vertical portion 511f. The inclined portion 511e may guide the movement of the electronic component so that the electronic component can be placed in the placement portion 511a. For example, the inclined portion 511e may be formed to extend in a direction deviating from the extension direction of the frame wall portion 511b. That is, the frame wall portion 511b may be formed to be inclined at a specified angle relative to the direction protruding from the frame body 511c. Therefore, even if a part of the electronic component is placed on the inclined portion 511e, the electronic component can slide and be placed in the placement portion 511a through the inclined portion 511e with a specified inclination.

The vertical portion 511f may be formed in a portion of the frame wall portion 511b adjacent to the placement portion 511a. The vertical portion 511f may extend in a direction protruding from the placement portion 511a so that the placement portion 511a and the frame wall portion 511b form a step. For example, the vertical portion 511f may be formed to be perpendicular to the placement portion 511a. In addition, a portion of the electronic component placed in the placement portion 511a that is not in contact with the placement portion 511a may be supported by the vertical portion 511f. Therefore, the electronic component placed in the placement portion 511a may be prevented from detaching by the vertical portion 511f.

The frame body 511c can support the frame wall portion 511b. In addition, a recess 511c-1 and a placement base surface 511c-2 can be formed in the frame body 511c, wherein the clamp 600 passing through the insertion space S can be inserted into the recess 511c-1 and the placement base surface 511c-2.

A plurality of recesses 511c-1 may be provided, and the plurality of recesses 511c-1 may be formed to be more recessed than the inner end of the placement portion 511a in the width direction of the frame body 511c. The inner end of the placement portion 511a refers to an end of the placement portion 511a that is closer to the center side of the frame body 511c in the width direction of the frame body 511c. In addition, the recess 511c-1 is formed in the frame body 511c corresponding to the insertion space, and the recess 511c-1 is provided in the inner side of the frame body 511c in the width direction than the insertion space. In this way, since a plurality of recesses 511c-1 are provided on the inner side of the insertion space in the width direction of the frame body 511c, the clamp 600 can pass through the insertion space S and be inserted into the recesses 511c-1 to hold the electronic components.

The placement base surface 511c-2 may be formed on one surface of the frame body 511c. For example, the placement base surface 511c-2 may be a portion of the upper surface of the frame body 511c. The placement base surface 511c-2 may have a placement portion 511a protruding therein. In addition, when electronic components are placed in the placement portion 511a, the placement base surface 511c-2 may be opposite to the electronic components and spaced from the electronic components so that a specified space is formed between the electronic components and the placement base surface 511c-2. In this way, since a specified space is formed between the placement base surface 511c-2 and the electronic components placed in the placement portion 511a, the electronic components may not contact the placement base surface 511c-2 and will not be damaged by the placement base surface 511c-2.

In addition, an anti-reverse insertion groove 511d is formed in the notch frame 511, and the anti-reverse insertion groove 511d is used to prevent the notch 510 from being reversely coupled with the notch support body 520. The anti-reverse insertion protrusion 521a described later can be inserted into the anti-reverse insertion groove 511d. In addition, the anti-reverse insertion groove 511d can be introduced from the lower part of the notch frame 511, and the anti-reverse insertion groove 511d can be formed only on one side of the notch 510. For example, the anti-reverse insertion groove 511d can be formed on only one side based on an axis in the notch frame 511 that passes through the center of the notch frame 511 and extends in the length direction. In addition, the anti-reverse insertion groove 511d can be formed asymmetrically with respect to at least one of the length direction in the notch frame 511 and the axis perpendicular to the length direction. Therefore, when the notch 510 is located on the notch support body 520 so that the reverse insertion prevention groove 511d corresponds to the reverse insertion prevention protrusion 521a, the notch 510 can be coupled to the notch support body 520. However, when the notch 510 is rotated in the opposite direction so that the reverse insertion prevention groove 511d and the reverse insertion prevention protrusion 521a are located in opposite directions, the notch 510 and the notch support body 520 cannot be coupled due to interference between the reverse insertion prevention protrusion 521a and the notch frame 511.

The coupling protrusion 512 can be inserted into the coupling groove 524a of the notch support body 520 described later, so that the notch 510 is coupled with the notch support body 520. The coupling protrusion 512 can be formed to protrude from the notch frame 511 and can have a shape corresponding to the coupling groove 524a. The coupling protrusion 512 is formed with a step protruding from the outer peripheral surface of the coupling protrusion 512.

The holding modules 513, 514, 515 can be installed in or removed from the notch frame 511. When the holding modules 513, 514, 515 are installed in the notch frame 511, the electronic components can be fixed to the notch frame 511. There can be multiple holding modules 513, 514, 515. In addition, the holding modules 513, 514, 515 can be separated from the notch frame 511 and combined with other notch frames 511, wherein the other notch frames 511 can be placed with electronic components of different sizes from the electronic components placed in the notch frame 511. The holding modules 513, 514, 515 can include a holding component 513 and a holding component support body 514, 515.

The holding member 513 can selectively fix the electronic component placed in the notch frame 511 to the notch frame 511, and can be configured to rotate in order to fix the electronic component to the notch frame 511 or release the fixation from the notch frame 511. The holding member 513 can prevent the electronic component placed in the placement portion 511a from escaping from the placement portion 511a. For example, the holding member 513 can have a shape such as a hook or a handle. However, this is only an example, and it can be changed to various structures that can fix the electronic component to the notch frame 511.

One or more holding components 513 may be provided and supported by the first holding component support body 514 and the second holding component support body 515. In addition, when the holding components 514 and 515 are coupled to the recess frame 511, the relative position of one or more holding components 513 to the recess frame 511 may be fixed. For example, one or more holding components 513 may be arranged on at least one side of the width direction of the recess frame 511. For another example, one or more holding components 513 may be arranged on at least one side of the length direction of the recess frame 511. For another example, one or more holding components 513 may be arranged on at least one side of the width direction and the length direction of the recess frame 511. In this way, any number of holding parts 513 can be provided, and can be arranged on at least one side of one or more directions relative to the width direction and the length direction of the bag frame 511.

In addition, a plurality of holding components 513 may be provided, and the widths of the plurality of holding components 513 may be different from each other. The plurality of holding components 513 may be arranged in the frame body 511c so as to have different spacings in the length direction and the width direction. In addition, the holding component 513 may be provided between a plurality of wall portions where no insertion space S is formed. For example, when the insertion space S is provided between the first wall portion 511b-11 and the second wall portion 511b-2, the holding component 513 may be provided between the second wall portion 511b-2 and the third wall portion 511b-3. In this way, since the holding component 513 is provided between the wall portions at different positions from the insertion space S, the holding component 513 is not interfered when the clamp 600 holds the electronic component.

In addition, as described above, the holding part 513 can be switched between an open state and a closed state by the free adjuster 422. For example, when the free adjuster 422 rises and presses the pressing part 522, the pressurized pressing part 522 presses one side of the holding part 513, thereby switching the closed state to an open state. When the holding part 513 is switched to an open state, the holding part 513 can be rotated at a specified angle relative to the first holding part support body 514 and the second holding part support body 515, so that the other side of the holding part 513 is not located on the upper side of the placement portion 511a. Therefore, when the holding part 513 is in an open state, electronic components can be placed in the placement portion 511a, and the electronic components placed in the placement portion 511a can be transferred.

In addition, if the free adjuster 422 is lowered when the holding part 513 is in the open state, the holding part 513 can be switched to the closed state. For example, when the free adjuster 422 is lowered so that the pressing part 522 is in its original position, the holding part 513 can be rotated at a predetermined angle relative to the first holding part support body 514 and the second holding part support body 515, so that at least a part of the holding part 513 is located on the upper side of the placement part 511a. Therefore, when the holding part 513 is in the closed state, the electronic component placed in the placement part 511a may not be separated from the placement part 511a.

The holding part 513 can be in a closed state when an electronic component is placed in the recess 510 or when there is no electronic component in the recess 510. In addition, if it is necessary to adjust the distance between the plurality of recess units 500 so that the hand 300 or the clamp 600 can place the electronic component in the recess 510, or if it is necessary to transfer the electronic component placed in the recess 510, the holding part 513 can be switched to an open state.

Referring to FIG. 9b again, the first holding component support 514 and the second holding component support 515 can be selectively coupled to the notch frame 511 and can support the holding component 513. In addition, a hole through which the holding component 513 can pass can be formed in the first holding component support 514 and the second holding component support 515. On the other hand, the notch frame 511 can be replaced with other notch frames 511 of different sizes to facilitate the placement of electronic components of different sizes. At this time, the first holding component support 514 and the second holding component support 515 can be separated from the existing notch frame 511 and installed in other notch frames 511. Although the present specification states that the holding component supports 514 and 515 include a first holding component support 514 and a second holding component support 515, this is only an example, and three or more holding component supports may be used. Therefore, the holding component support installed in the notch frame 511 may be arranged between the first holding component 514 and the second holding component 515, so that the holding component 513 is arranged at the edge of the notch frame 511 in the width direction.

On the other hand, the holding component supports 514 and 515 can be configured so that one or more holding components 513 can be arranged in at least one side of at least one of the length direction and the width direction relative to the recess frame 511, and the holding component supports 514 and 515 can be installed in the recess frame 511. That is, the number of holding components 513 and the position of the holding components 513 fixed in the recess frame 511 are determined by the holding component supports 514 and 515. For example, any number of holding components 513 can be supported in the holding component supports 514 and 515, and the user can choose to install the holding component supports 514 and 515 with the required number of holding components 513 in the recess frame 511. In addition, the holding member supports 514 and 515 can be switched and installed in the notch frame 511 according to the size of the notch frame 511. As a more detailed example, when the length of the notch frame 511 is longer, the holding member supports 514 and 515 configured with a plurality of holding members 513 along the length direction can be installed in the notch frame 511. The notch support 520 can support the notch 510 and can be selectively combined with the notch 510. That is, the notch support 520 can support the notch 510 in a detachable manner. The notch support 520 can be supported by the base 420 and can slide along the base 420. In addition, a plurality of notch supports 520 may be provided, and the spacing between the plurality of notch supports 520 may be adjusted by the cam module 410. On the other hand, although the notch supports 520 are described as being separated from the notch 510 in order to replace the notch 510, the notch supports 520 may be directly replaced with a notch support of a different size. The notch supports 520 may include a support body 521, a pressing member 522, a lever 523, and an open link 524.

The support body main body 521 can support the recess 510. The support body main body 521 can be provided with an anti-reverse insertion protrusion 521a, which can prevent the recess 510 and the recess support body 520 from being combined in the reverse direction. The anti-reverse insertion protrusion 521a can be inserted into the anti-reverse insertion groove 511d. In addition, the anti-reverse insertion protrusion 521a can be formed protruding from the upper part of the support body main body 521, and can be formed only on one side of the support body main body 521. For example, the anti-reverse insertion protrusion 521a can be formed on only one side of the support body main body 521 based on an axis passing through the center of the support body main body 521 and extending in the length direction. In addition, the reverse insertion prevention protrusion 521a may be formed asymmetrically with respect to at least one of the longitudinal axis and the axis perpendicular to the longitudinal axis of the support body main body 521. When the notch 510 is located on the upper side of the notch support body 520 so that the reverse insertion prevention protrusion 521a corresponds to the reverse insertion prevention groove 511d, the notch 510 and the notch support body 520 can be combined. However, when the notch support body 520 is rotated in the opposite direction so that the reverse insertion prevention protrusion 521a and the reverse insertion prevention groove 511d are located in opposite directions, the notch 510 and the notch support body 520 cannot be combined due to the interference between the reverse insertion prevention protrusion 521a and the notch 510.

On the other hand, although it is described in the present specification that the reverse insertion prevention groove 511d is formed in the notch frame 511 and the reverse insertion prevention protrusion 521a is formed in the notch support body 520, this is only an example, and the protrusion may be formed in the notch frame 511, and the protrusion may be formed in the notch support body 520. Therefore, the reverse insertion prevention groove 511d and the reverse insertion prevention protrusion 521a may be configured so that when the notch 510 and the notch support body 520 are combined with each other in a prescribed direction, the reverse insertion prevention groove 511d and the reverse insertion prevention protrusion 521a are engaged with each other, and when the notch 510 and the notch support body 520 are arranged in a direction opposite to the prescribed direction, the reverse insertion prevention groove 511d and the reverse insertion prevention protrusion 521a are not engaged with each other.

In addition, a cam follower 521b capable of engaging with the guide path 413 of the cam module 410 may be formed in the support body main body 521. The cam follower 521b may be inserted into the guide path 413 and slide along the guide path 413 when the cam module 410 rotates. In this way, the notch support body 520 can move on the base 420 by the cam follower 521b moving along the guide path 413 according to the rotation of the cam module 410. In addition, since the cam follower 521b engages with the guide path 413 and moves, the notch support body 520 can move relative to the cam module in the axial direction. On the other hand, the cam follower 521b may be formed to protrude from the support body main body 521. That is, the cam follower 521b may protrude from a surface of the support body main body 521 facing the cam module 410 so as to engage with the guide path 413.

The pressing component 522 may be a structure that is movable in one direction by being pressurized by the free adjuster 422. The pressing component 522 is pressurized by the free adjuster 422 and rises, thereby switching the holding component 513 to an open state. The pressing component 522 may be formed to be able to pass through the support body main body 521, and a part of the pressing component 522 may be in contact with the free adjuster 422 on one side of the support body main body 521. Therefore, the pressing component 522 may be pressurized by the free adjuster 422 on one side of the support body main body 521. In addition, the pressing component 522 may be moved to its original position by components such as a spring. For example, when the pressing member 522 that was pressurized by the free adjuster 422 that has risen is no longer pressurized due to the free adjuster 422 falling, the pressing member 522 moves to its original position under the restoring force of the elastic member.

8b, the lever 523 can prevent the notch 510 from being separated from the notch support body 520. The lever 523 selectively supports the notch 510 by opening and closing. That is, when the lever 523 is closed, the notch support body 520 supported by the notch 510 can be maintained, and when the lever 523 is opened, the notch support body 520 supported by the notch 510 can be released. The lever 523 may include a clamping portion 523a, a stopper 523b, and a rotation axis 523c supported by the support body main body 521.

The clamping portion 523a is pressurized by the pressurizing portion 423 so that it can rotate in one direction relative to the rotation axis 523c. When the clamping portion 523a is pressurized by the pressurizing portion 423, it can rotate in one direction so that the stopper 523b cannot interfere with the coupling protrusion 512. At this time, the coupling between the notch 510 and the notch support body 520 can be released. When the pressurizing portion 423 is released from the clamping portion 523a, the clamping portion 523a can be in its original position and can rotate to its original position under the action of the restoring force of the elastic member 523d.

The stopper 523b can prevent the notch 510 and the notch support body 520 from being separated. When the clamping portion 523a is not pressurized, the stopper 523b is caught by the coupling protrusion 512, thereby maintaining the coupling between the notch 510 and the notch support body 520. In addition, when the clamping portion 523a is pressurized, the stopper 523b can move according to the rotation of the clamping portion 523a, thereby being spaced apart from the coupling protrusion 512 at a prescribed distance. In addition, the stopper 523b can be supported by the clamping portion 523a.

The elastic member 523d can provide a restoring force to the clamping portion 523a. That is, when the clamping portion 523a rotated in one direction is released from the pressure by the pressure member 423, the elastic member 523d can return to its original position by the restoring force. The elastic member 523d can be supported by the support body 521. For example, the elastic member 523d can be a torsion spring.

When the coupling protrusion 512 of the notch 510 is inserted into the coupling groove 524a, the lever 523 is caught by the step portion of the coupling protrusion 512, thereby preventing the notch 510 from being separated from the coupling protrusion 512. The coupling between the notch 510 and the notch support 520 can be maintained by the lever 523.

In addition, the lever 523 may be pressurized by the pressurizing portion 423 so that the notch 510 and the notch support body 520 are separated. For example, when the lever 523 is pressurized by the pressurizing portion 423, the coupling protrusion 512 of the notch 510 may be separated from the coupling groove 524a of the notch support body 520, and since the coupling protrusion 512 is separated from the coupling groove 524a, the notch 510 may be separated from the notch support body 520. Therefore, when the notch 510 needs to be replaced, the lever 523 is moved to the position where the pressurizing portion 423 presses, and the pressurizing portion 423 is raised so that the lever 523 is located between the pressurizing portions 423, so that the notch 510 can be replaced from the notch support 520. The support body main body 521 may have the lever 523.

The open link 524 may be pressurized by the pressing member 522 and may pressurize the holding member 513. In addition, the open link 524 may move with the movement of the pressing member 522. For example, when the free adjuster 422 rises and presses the pressing member 522, the open link 524 may rise through the rising pressing member 522 to pressurize the holding member 513. As another example, when the free adjuster 422 descends and causes the pressing member 522 to move to the original position, the open link 524 may move to the original position with the pressing member 522. The open link 524 may be connected to the pressing member 522. However, as an example, the open link 524 may be formed integrally with the pressing member 522. In addition, when the pressing member 522 descends, the opening link 524 can be supported by the supporting body main body 521. On the other hand, a coupling groove 524a into which the coupling protrusion 512 of the recess 510 can be inserted can be formed in the opening link 524. Since the coupling protrusion 512 is inserted into the supporting body main body 521 through the coupling groove 524a, the recess 510 can be coupled to the supporting body main body 521.

The clamp 600 can clamp a plurality of electronic components whose intervals are adjusted by the interval adjustment shuttle 400 and place them in the test tray 700. The clamp 600 can clamp a plurality of electronic components and transfer them to the test tray 700. In addition, the intervals between the plurality of electronic components can be maintained while the clamp 600 transfers the plurality of electronic components. The clamp 600 can vertically place the electronic components in the test tray 700 by rotating the electronic components placed in the recess 510. That is, since the clamp 600 is in a horizontal position, the electronic components placed in the recess 510 can be rotated and placed in the test tray 700 in an upright position. The lying state of the electronic component refers to the state in which the electronic component is lying, that is, the surface with the largest area in the peripheral surface of the electronic component corresponds to the placement portion 511a of the recess 510. In addition, the standing state of the electronic component refers to the state in which the electronic component is upright, that is, the surface with the narrowest area in the peripheral surface of the electronic component is in contact with the test tray 700. For example, the standing state can be a state in which the lying electronic component is rotated 90°. The clamp 600 may include a clamp body 610, a holding unit 620, and a rotating unit 630.

11 , the clamp body 610 may support the holding unit 620 and the rotating unit 630. In addition, the clamp body 610 may be rotated by the rotating unit 630.

The holding unit 620 can hold the electronic components. A plurality of the holding units 620 can be provided to hold the plurality of electronic components, and the plurality of holding units 620 can be supported on the clamp body 610. In addition, the holding unit 620 can be rotated according to the clamp body 610 rotated by the rotating unit 630. The holding unit 620 can face the front side when holding the plurality of electronic components whose spacings have been adjusted by the spacing adjustment shuttle 400. In addition, when the holding unit 620 holds the plurality of electronic components and is located on the upper side of the test tray 700, the holding unit 620 can be rotated by the rotating unit 630 to face the lower side. The holding unit 620 can be driven by a motor, and the motor can be, for example, a torque motor capable of controlling torque. When the holding unit 620 holds an electronic component, the torque motor can adjust the torque value required to drive the holding unit 620 to prevent damage to the electronic component. Therefore, the holding unit 620 can accurately adjust the distance between the first holding body 622a and the second holding body 622b by using the torque motor, so that all electronic components with different widths due to assembly tolerance can be held. The holding unit 620 may include a clamping portion 621, a holding portion 622, and a pulley portion 623.

12 , the clamping portion 621 may support the gripping portion 622 and may be moved via the pulley portion 623. The clamping portion 621 may include a first clamp 621a and a second clamp 621b.

The first clamp 621a and the second clamp 621b may be supported on the belt 623c to face each other. In addition, at least a portion of the first clamp 621a and the second clamp 621b may be formed to be bent toward the outside of the belt 623c. That is, one end of the first clamp 621a is supported on the lower end of the belt 623c, and the other end of the first clamp 621a supported by the first holding body 622a is bent to face one side of the driving roller (for example, the right side of FIG. 12). In addition, one end of the second clamp 621b is supported on the upper end of the belt 623c, and the other end of the second clamp 621b supported by the second holding body 622b is bent to face one side of the driven roller (for example, the left side of FIG. 12). In this way, since at least a portion of the first clamp 621a and the second clamp 621b are formed to be bent toward the outside of the belt 623c, the distance between the first holding body 622a supported by the first clamp 621a and the second holding body 622b supported by the second clamp 621b can be greater than the distance between the driving roller 623a and the driven roller 623b. That is, when the first clamp 621a and the second clamp 621b are spaced apart from each other by the maximum distance, the distance between one end of the first clamp 621a and one end of the second clamp 621b may be greater than the width of the pulley portion 623 (the distance from a point wound around the driving roller 623a to a point wound around the driven roller 623b in the belt 623c). Therefore, the holding unit 620 can hold an electronic component larger than the width of the pulley portion 623 (see FIG. 12a).

On the other hand, the first clamper 621a and the second clamper 621b are supported by the pulley portion 623 to be spaced apart from each other, and can move toward or away from each other through the pulley portion 623. The first clamper 621a is supported at the lower end of the pulley portion 623 and can move between the driving roller 623a and the driven roller 623b. In addition, the second clamper 621b is supported at the upper end of the pulley portion 623 and can move between the driving roller 623a and the driven roller 623b. In this way, since the first clamper 621a moves at the lower end of the pulley portion 623 and the second clamper 621b moves at the upper end of the pulley portion 623, even if the first clamper 621a and the second clamper 621b are close to each other, no interference occurs between them.

When the first clamp 621a and the second clamp 621b hold the electronic component, the holding portion 622 can move in a direction approaching each other to hold the electronic component. In addition, when one end of the first clamp 621a and one end of the second clamp 621b approach each other within a specified distance, the other end of the first clamp 621a and the other end of the second clamp 621b can be configured to cross each other. That is, when one end of the first clamp 621a and the second clamp 621b moves more than a specified distance in a direction approaching each other, the other ends of the first clamp 621a and the second clamp 621b connected to the pulley portion 623 may cross each other. For example, when the first clamp 621a and the second clamp 621b are observed in one direction (for example, the +x axis direction in FIG. 14), the first clamp 621a and the second clamp 621b can be moved to overlap each other partially. At this time, while one end connected to the gripping portion 622 of the first clamp 621 and the gripping portion 622 of the second clamp 621b approaches a prescribed distance or less until the small electronic component is gripped, the other end connected to the pulley portion 623 of the first clamp 621a and the pulley portion 623 of the second clamp 621b can cross each other without interference. Therefore, since the first clamper 621a and the second clamper 621b do not interfere with each other even if they approach each other within a predetermined distance, the holding portion 622 moves to hold the small electronic component.

Thus, by bending the gripping portion 622 and the supported end toward the outside of the pulley portion 623, the first clamp 621a and the second clamp 621b are spaced at a predetermined distance or more from each other, so that electronic components larger than the width of the pulley portion 623 can be gripped. In addition, since the first clamp 621a and the second clamp 621b supported by the pulley portion 623 move crosswise with each other, the other ends of the first clamp 621a and the second clamp 621b are close to each other at a predetermined distance or less, so that electronic components of smaller size can be gripped. Therefore, the gripping unit 620 is configured to have a minimum size, thereby preventing the device from being too large and having the effect of being able to grip various electronic components from small electronic components to large electronic components.

The holding portion 622 can hold the electronic component. In addition, the holding portion 622 can be configured to hold at least a portion of the edge of the electronic component that does not contact the notch 510 when the electronic component is placed in the notch 510. The holding portion 622 can include a first holding body 622a and a second holding body 622b.

The first holding body 622a can be supported by the first clamp 621a and can move along the first clamp 621a. In addition, the second holding body 622b can be supported by the second clamp 621b and can move along the second clamp 621b. The first holding body 622a and the second holding body 622b can be arranged to face each other and can be supported by the first clamp 621a and the second clamp 621b, and the surfaces facing each other contact the electronic component and hold the electronic component. The first holding body 622a and the second holding body 622b can hold the electronic component by moving in a direction close to each other, and can release the holding of the electronic component by moving in a direction away from each other. For example, when an electronic component is placed in the recess 510, the first holding body 622a and the second holding body 622b can move from both sides of the width direction of the recess 510 toward the center of the electronic component and hold the electronic component. In this way, the first holding body 622a and the second holding body 622b hold the edges of the electronic component on both sides of the width direction of the recess 510, thereby supporting the electronic component without damaging the chip of the electronic component. In addition, when the interval distance between the first holding body 622a and the second holding body 622b is the farthest, the distance between the first holding body 622a and the second holding body 622b can be greater than the distance between the driving roller 623a and the driven roller (623b). On the other hand, the first holding body 622a and the second holding body 622b can be close to each other according to the size of the electronic component.

The pulley part 623 can support the first clamp 621a and the second clamp 621b, and can move the first clamp 621a and the second clamp 621b. When holding the electronic component, the pulley part 623 can move the first clamp 621a and the second clamp 621b in a direction close to each other, and when releasing the holding of the electronic component, the pulley part 623 can move the first clamp 621a and the second clamp 621b in a direction away from each other. For example, the pulley part 623 can use known means such as a pulley. The pulley part 623 may include a driving roller 623a, a driven roller 623b and a belt 623c.

The driving roller 623a can rotate the belt 623c by rotating. The driving roller 623a can be driven by a motor (not shown). In addition, the driving roller 623a can be supported by the clamp body 610.

The driven roller 623b may rotate due to the friction of the belt 623c rotated by the driving roller 623a. The driven roller 623b may support a part of the belt 623c. In addition, the driven roller 623b may be supported by the clamp body 610.

The belt 623c can rotate the driving roller 623a and the driven roller 623b to move the clamping part 621. For example, when the belt 623c moves in a clockwise direction through the driving roller 623a and the driven roller 623b, the first clamp 621a and the second clamp 621b can move in a direction close to each other. In addition, when the belt 623c moves in a counterclockwise direction, the first clamp 621a and the second clamp 621b can move in a direction away from each other. The belt 623c can be wound around the driving roller 623a and the driven roller 623b. In addition, the first clamper 621 and the second clamper 621b in the straight line portion between the driving roller 623a and the driven roller 623b in the belt 623c can be supported to move in opposite directions to each other. For example, in the belt 623c, the upper end between the driving roller 623a and the driven roller 623b can support the second clamper 621b, and the lower end between the driving roller 623a and the driven roller 623b can support the first clamper 621a.

13 , the rotating unit 630 can rotate the clamp body 610 and the holding unit 620. For example, the rotating unit 630 can be rotated so that the holding unit 620 faces the lower side (see FIG. 13 a), and further, when holding a plurality of electronic components whose spacings have been adjusted by the spacing adjustment shuttle 400, the rotating unit 630 can be rotated so that the holding unit 620 faces the front side (see FIG. 13 b). When the holding unit 620 holds a plurality of electronic components and is located on the upper side of the test tray 700, the rotating unit 630 can be rotated again so that the holding unit 620 faces the lower side (see FIG. 13 a). In this way, since the rotating unit 630 rotates the holding unit 620 holding the horizontal electronic component, the electronic component can be placed in the test tray 700 in a vertical state. On the other hand, the rotating unit 630 can be driven by a rotating cylinder (not shown). For example, if the rotating unit 630 can be driven by the rotating cylinder to move back and forth between two points, and can be rotated so that when the rotating unit 630 rotates from one point to another point, the holding unit 620 moves from one side to the other side.

On the other hand, the clamper 600 may further include a transmission unit (not shown), wherein the transmission unit is used to lift or lower or move the clamper body 610, the holding unit 620, and the rotating unit 630 forward and backward. The area where the electronic components are transferred by the clamper 600 can be defined as a clamper transfer area. Although the clamper transfer area overlaps with the shuttle transfer area on the other side (for example, the rear side) of the spacing adjustment shuttle 400, it may not overlap with the hand transfer area. Through the transmission unit, the clamper body 610, the holding unit 620, and the rotating unit 630 can move forward and backward, up and down, and can transfer the electronic components from the notch unit 500 to the test tray 700.

Next, the process of transferring the electronic components from the notch unit 500 to the test tray 700 by the clamper 600 will be described in more detail.

The holding unit 620 may be located on the upper side of the test tray 700. At this time, as shown in FIG. 13a, the holding unit 620 may be in a state of being perpendicular to the ground and may face the side of the test tray 700 (e.g., the lower side of FIG. 1). Thereafter, as shown in FIG. 13b, the rotating unit 630 may rotate the holding unit 620 to a state of being horizontal to the ground, and at this time, the holding unit 620 may face the side of the notch unit 500 (e.g., the front side of FIG. 1).

Thereafter, the holding unit 620 can be moved to the side of the notch unit 500 by the transmission unit, and descend to hold the electronic component placed in the notch 510. The descending holding unit 620 can hold the electronic component placed in the notch 510 in a lying state and then ascend. When the holding unit 620 ascends relative to the notch 510, the rotating unit 630 can rotate the holding unit 620 to a state perpendicular to the ground. When the holding unit 620 is rotated to a state perpendicular to the ground, the electronic component can be in a standing state.

In addition, the holding unit 620 can be moved to the side of the test tray 700 through the conveying unit, and can be lowered toward the test tray 700. At this time, the holding unit 620 releases the holding of the electronic component so that the electronic component is placed in a vertical shape in the groove of the test tray 700. After placing the electronic component in the test tray 700, the holding unit 620 can rise to the upper side of the test tray 700.

In this way, the clamper 600 can transfer a plurality of electronic components from the notch unit 500 to the test tray 700 by repeatedly performing the above process. That is, during the period when the clamper 600 holds the electronic component placed in the first notch unit 501 and transfers it to the test tray 700, the hand 300 can place the electronic component in the second notch unit 502. Thereafter, when the first notch unit 501 and the second notch unit 502 are changed in position by the spacing adjustment shuttle 400, the clamper 600 can transfer the electronic component placed in the second notch unit 502 to the test tray 700, and the hand 300 can place the electronic component in the first notch unit 501. In this way, the clamper 600 can be configured to repeatedly transfer the electronic components placed in the first recess unit 501 and the second recess unit 502 that move back and forth between the hand transfer area and the clamper transfer area to the test tray 700, thereby increasing the speed of testing the electronic components.

On the other hand, by repeatedly performing the above process, the tested electronic components can be transferred from the test tray 700 to the notch unit 500. The clamp 600 can place the tested electronic components from the test tray 700 into the first notch unit 501. At this time, the electronic components placed in the second notch unit 502 can be transferred to the user tray T by the hand 300. In addition, when the first notch unit 501 and the second notch unit 502 are changed in position by the spacing adjustment shuttle 400, the clamp 600 transfers the tested electronic components in the test tray 700 to the second notch 502, and the electronic components placed in the first notch unit 501 can be transferred to the user tray T by the hand 300. In this way, the clamp 600 can be configured to repeatedly transfer the tested electronic components from the test tray 700 to the first notch unit 501 and the second notch unit 502 that move back and forth between the hand transfer area and the clamp transfer area, so that the tested electronic components can be quickly recovered.

In addition, the clamp 600 can simultaneously recover the tested electronic components and transfer the electronic components to be tested. For example, the clamp 600 can transfer the tested electronic components from the test tray 700 to the first notch unit 501, and the hand 300 can place the electronic components to be tested in the second notch unit 502. At this time, the tested electronic components are placed in the first notch unit 501, and the electronic components to be tested are placed in the second notch unit 502. Afterwards, when the positions of the first notch unit 501 and the second notch unit 502 are changed, the clamp 600 can place the electronic components placed on the second notch unit 502 in the empty space of the test tray 700. At this time, the hand 300 can transfer the electronic component placed in the first notch unit 501 to the user tray T. In addition, the clamp 600 can hold another electronic component that has been tested and transfer it to the second notch unit 502, and the hand 300 can clamp another electronic component to be tested and transfer it to the first notch unit 501. In this way, the clamp 600 and the hand 300 alternately transfer the electronic components that have been tested and the electronic components to be tested, so that the electronic components that have been tested in the test tray 700 can be quickly replaced with the electronic components to be tested.

The test tray 700 may be provided with a space in which electronic components to be tested may be placed. The test tray 700 may receive electronic components from the clamp 600. In addition, a groove in which the electronic components may be placed may be formed in the test tray 700. A plurality of grooves may be formed, and the electronic components transferred to the test tray 700 through the clamp 600 may be placed in a plurality of grooves in a vertical form (upright form). On the other hand, when the electronic components are placed in the test tray 700, the electronic components may be pressurized toward the tester through the press module 800.

The press module 800 can press the test tray 700 on which a plurality of electronic components are placed toward the tester. That is, the press module 800 can press the plurality of electronic components to the tester to make the electronic components contact the tester.

On the other hand, the electronic component testing sorting machine 1 may further include a sensing unit (not shown). The sensing unit may sense whether the electronic component is correctly placed in the user tray T or the recess 510. For example, the electronic component may display a barcode, and the sensing unit may sense whether the electronic component is placed in the user tray T or the recess 510 by identifying the barcode of the electronic component. As a more detailed example, if the barcode of the electronic component sensed by the sensing unit is tilted at a specified angle, it may be an electronic component that is rotated and placed, and if the barcode of the electronic component sensed by the sensing unit is shorter, it may be an electronic component that is spaced from the placement surface of the user tray T or the recess 510. The sensing unit may be provided in one or more of the support body 100 or the hand 300. In addition, when the sensing portion senses that the electronic component is not correctly placed in the user tray T or the recess 510, a device such as a vibrator can be used to adjust the position of the electronic component. In this way, the sensing portion senses whether the electronic component is correctly placed in the user tray T or the recess 510, so that the electronic component can be accurately contacted with the tester, and the reliability of testing the electronic component can be improved.

In addition, the electronic component test sorting machine 1 may further include a control unit (not shown). The control unit may control the hand 300, the spacing adjustment shuttle 400, the clamp 600, and the driving of the press module 800. In addition, the control unit may control the cam module 410 of the spacing adjustment shuttle 400 to adjust the spacing between the plurality of notch units 500. In addition, the control unit may control the clamp 600 to hold the plurality of electronic components and transfer the plurality of electronic components to the test tray 700. In addition, the lifting module 430 and the transfer module 440 may be controlled to move the cam module 410, and the lifting cylinder may be controlled to lift the free adjuster 422 and the pressurizing unit 423. The control unit can be implemented by a computing device including a microprocessor, a detection device such as a sensor, and a memory, and the implementation method is obvious to a technician in this field, so its detailed description will be omitted.

Next, the operation and effect of the electronic component testing sorting machine 1 having the above-mentioned structure will be described.

The user can bring the electronic components into contact with the tester and conduct the test by using the electronic component testing sorter 1. First, the user tray T loaded in the stacking section 200 can be transferred and placed in the opening section 111 of the support body 100. On the other hand, in FIG. 1 of the present specification, the user tray T is shown as being arranged with one user tray T in each of a plurality of areas, but this is only an example, and in practice, a plurality of user trays T may be arranged in a plurality of areas. Therefore, in the same manner as the driving method of the existing storage sorter, the highest user tray T among the stacked plurality of user trays T can be transferred to the opening section 111 of the support body 100 by means of a transformer module (not shown) and a lifter.

Thereafter, the hand 300 can hold a plurality of electronic components from the user tray T and place them in the plurality of notch units 500. The spacing adjustment shuttle 400 can adjust the plurality of notch units 500 to have a specified interval. In addition, after the spacing between the plurality of notch units 500 is adjusted, the clamp 600 can hold a plurality of electronic components. After the holding unit 620 holds a plurality of electronic components, the rotating unit 630 can rotate the holding unit 620 and the electronic components. In this way, after the electronic components are erected from a horizontal state to a vertical state, the clamp 600 can place the plurality of electronic components in the test tray 700. After a plurality of electronic components are placed on the test tray 700, the press module 800 can pressurize the test tray 700 toward the tester, so that the tester can test the electronic components.

As described above, the electronic component test handler 1 according to the embodiment of the present invention has the effect of being able to easily transfer a plurality of electronic components from the user tray T to the test tray 700.

In addition, since the intervals between multiple electronic components are accurately controlled, the electronic components can contact the tester at precise intervals, thereby having the effect of improving test reliability.

From the above discussion, it will be understood that the present invention can be embodied in various forms, including but not limited to the following: Example 1. A sorting machine for testing electronic components, characterized in that it includes: A stacker part, used to store a user pallet loaded with multiple electronic components; A hand, used to support and transfer multiple electronic components placed in the user pallet in the hand transfer area; A spacing adjustment shuttle, configured to transfer multiple electronic components from the hand from one side to the other side along a specified path in the shuttle transfer area, wherein the spacing between the multiple electronic components in the one side is different from the spacing between the multiple electronic components in the other side; A clamper capable of holding and transferring a plurality of electronic components from the other side of the spacing adjustment shuttle in the clamper transfer area; A test tray capable of placing a plurality of electronic components transferred by the clamper in the test tray; and A press module capable of pressing the plurality of electronic components placed in the test tray toward the test tray, wherein the one side of the shuttle transfer area overlaps with the hand transfer area, and the other side of the shuttle transfer area overlaps with the clamper transfer area. Embodiment 2. The electronic component testing sorting machine as described in Embodiment 1, wherein the prescribed path in the shuttle transfer area includes: An approach path, during the period of transferring the plurality of electronic components in a direction parallel to the imaginary plane, from the one side to the other side, The spacing adjustment shuttle transfers the plurality of electronic components in a state where the plurality of electronic components are placed in a direction parallel to the imaginary plane. Embodiment 3. The electronic component testing sorting machine as described in Embodiment 1, wherein the hand and the clamp can be configured so that the hand transfer area and the clamp transfer area do not overlap each other. Embodiment 4. The electronic component testing sorting machine as described in Embodiment 1 further comprises: A plurality of notch units, wherein a plurality of electronic components can be placed in the plurality of notch units, The plurality of notch units comprise: A plurality of first notch units and a plurality of second notch units, The spacing adjustment shuttle comprises: A first cam portion, wherein the first cam portion has a plurality of three-dimensional guide paths, wherein the plurality of three-dimensional guide paths are used to adjust the spacing between the first notch units; and A second cam portion, wherein the second cam portion has a plurality of three-dimensional guide paths, wherein the plurality of three-dimensional guide paths are used to adjust the spacing between the second notch units, Wherein the first cam portion and the plurality of first notch units are structures that move together along the prescribed path, The second cam portion and the plurality of second notch units are structures that move together along the specified path. Embodiment 5. The electronic component test sorting machine as described in Embodiment 4, wherein the plurality of notch units include: a notch for providing a space for placing the electronic component; a notch support for detachably supporting the notch; and a cam follower, the cam follower being engaged with the guide path, wherein at least a portion of the plurality of guide paths has a bend between one end and the other end, the distance between the one ends of the plurality of guide paths has a first spacing, the first spacing being the same as the spacing between the electronic components in the user tray, the distance between the other ends of the plurality of guide paths has a second spacing, the second spacing being the same as the spacing between the electronic components in the test tray and being greater than the first spacing, The distance between the curved portions of the plurality of guide paths has a third spacing, the third spacing is greater than the first spacing and less than the second spacing, When the cam follower is engaged with the other end of the guide path, the notch support body selectively releases support for the notch. Embodiment 6. The electronic component testing sorting machine as described in Embodiment 1 further comprises: A plurality of notch units, in which a plurality of electronic components can be placed, The plurality of notch units comprise: A notch, wherein the notch comprises a hook and a notch frame, wherein the hook is used to provide a space for placing the electronic component and selectively fix the electronic component; the notch frame is used to support the hook, The spacing adjustment shuttle comprises: A free adjuster, wherein the free adjuster is used to move forward and backward relative to the notch frame to release the fixation of the plurality of hooks on the electronic component. Embodiment 7. The electronic component testing sorting machine as described in Embodiment 4, wherein the spacing adjustment shuttle comprises: A lifting module for lifting and lowering the plurality of notch units and the first cam portion; and A moving module for reciprocating the plurality of notch units, the first cam portion, and the second cam portion in a direction different from the direction in which the notch units, the first cam portion, and the second cam portion are lifted and lowered by the lifting and lowering module, When the first cam portion is lowered by the lifting and lowering module, the moving module moves the second cam portion in one direction and moves the first cam portion in a direction opposite to the one direction, When the first cam portion and the second cam portion are moved in opposite directions by the moving module, the lifting and lowering module raises the first cam portion.

The above examples of the present invention are explained by specific embodiments, but these are only examples, the present invention is not limited thereto, and should be interpreted as having the broadest scope based on the basic ideas disclosed in this specification. A person skilled in the art can realize a pattern of a shape not shown in the figure by combining/replacing the disclosed embodiments, but this does not deviate from the scope of the present invention. In addition, a person skilled in the art can easily change or modify the disclosed embodiments based on this specification, and obviously, such changes or modifications also belong to the scope of the present invention.

1: Sorting machine 100: Support body 110: Opening part 111: Opening part 200: Stacker part 300: Hand 301: First hand 302: Second hand 310: Hand body 320: Pickup module 321: Joint part 322: Pickup device 400: Spacing adjustment shuttle 410: Cam module 411: First cam part 412: Second cam part 413: Guide path 413a: Bending part 420: Base part 421: Substrate 422: Free adjuster 422a: First pressing part 422b: Second pressing part 422c: Interface part 423: Pressing part 424: first base 425: second base 430: lifting module 440: module 500: notch unit 501: first notch unit 502: second notch unit 510: notch 511: notch frame 511a: placement portion 511b: frame wall portion 511b-1: first wall portion 511b-2: second wall portion 511b-3: third wall portion 511b-4: fourth wall portion 511b-5: fifth wall portion 511b-6: sixth wall portion 511c: frame body 511c-1: recessed portion 511c-2: base surface 511d: reverse insertion prevention groove 511e: inclined portion 511f: vertical portion 512: coupling protrusion 513: Holding module 514: First holding member support body 515: Second holding member support body 520: Notch support body 521: Cam follower 521a: Anti-reverse insertion protrusion 521b: Cam follower 522: Pressing member 523: Lever 523a: Clamping part 523b: Stopper 523c: Rotating shaft 523d: Elastic member 524: Linking rod 524a: Engagement groove 600: Clamp 610: Clamp body 620: Holding unit 621: Clamping part 621a: First clamp 621b: Second clamp 622: Grip 622a: First grip 622b: Second grip 623: Pulley 623a: Driving roller 623b: Driven roller 623c: Belt 630: Rotating unit 700: Test tray 800: Press module a: First spacing b: Second spacing c: Third spacing C1: First centerline C2: Second centerline S: Space T: User tray

FIG1 is a perspective view of a sorting machine for testing electronic components according to an embodiment of the present disclosure; FIG2 is a perspective view of the hand of FIG1; FIG3a is a perspective view of the spacing adjustment shuttle and the notch unit of FIG1; FIG3b is a cross-sectional view cut along the A-A' line of FIG3a; FIG3c is a decomposed perspective view of FIG3; FIG4 is a top view of FIG3a; FIG5 is a schematic diagram of the state of adjusting the spacing of the notch unit through the spacing adjustment shuttle of FIG3a; FIG6 is a schematic diagram of the state of adjusting the spacing of the notch unit through the spacing adjustment shuttle of FIG3a; FIG7 is a top view of the cam module of FIG3a; FIG8a is a perspective view of the notch unit of FIG1; FIG8b is a cross-sectional view cut along the BB' line of FIG8a; Figure 9a is an exploded three-dimensional diagram of the notch unit of Figure 8a; Figure 9b is a schematic diagram of the holding module of Figure 8a combined with other notch frames; Figure 10 is a bottom-up three-dimensional diagram of Figure 9a; Figure 11 is a front view of the clamp of Figure 1; Figure 12 is a three-dimensional diagram of the holding unit of Figure 11; Figure 13 is a three-dimensional diagram of the clamp of Figure 11 in a rotating state; Figure 14 is a three-dimensional diagram of the clamp of Figure 1 holding an electronic component placed on the notch unit.

1: Sorting machine

100: Support body

110: Opening

200: Stacker Department

300: Hands

301: First Hand

302: Second hand

400: Spacing adjustment shuttle

500: Notch unit

600: Clamp

700: Test tray

800: Press module

T: User tray

Claims (3)

A test sorting machine for electronic components, comprising: a test tray in which electronic components are placed in a vertical state, a recess configured to place the electronic components in a horizontal state perpendicular to the vertical state; and a clamp configured to hold or release the electronic components placed in the recess, wherein the clamp includes: a holding unit configured to hold the electronic components; and a rotating unit for rotating the holding unit, and wherein the rotating unit is configured to be rotatable in one direction when the holding unit holds the electronic components, so as to convert the electronic components from either the horizontal state or the vertical state to the other. A test sorting machine as described in claim 1, wherein the holding unit includes: A pulley portion including a belt that can rotate in one direction; A first clamp and a second clamp, which are supported on the belt and can move in opposite directions when the belt rotates in the one direction, wherein one end of the first clamp is supported on the belt and the other end of the first clamp is bent to face the one direction, wherein one end of the second clamp is supported on the belt and the other end of the second clamp is bent to face the other direction, wherein when the other end of the first clamp and the other end of the second clamp approach each other at a specified distance or less by the rotation of the belt, the one end of the first clamp and the one end of the second clamp move crosswise with each other. The test sorting machine as described in claim 1, wherein: the notch contacts and supports a portion of the edge of the electronic component to place the electronic component in the lying state, and when the electronic component is placed in the notch, the holding unit holds at least a portion of the edge of the electronic component that is not in contact with the notch.