TW202416604A - Pressing mechanism, testing apparatus, and processing machine - Google Patents

Pressing mechanism, testing apparatus, and processing machine Download PDF

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TW202416604A
TW202416604A TW111137314A TW111137314A TW202416604A TW 202416604 A TW202416604 A TW 202416604A TW 111137314 A TW111137314 A TW 111137314A TW 111137314 A TW111137314 A TW 111137314A TW 202416604 A TW202416604 A TW 202416604A
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Taiwan
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pressure
bonding
chamber
cavity
component
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TW111137314A
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Chinese (zh)
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TWI822371B (en
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張銘德
洪志欣
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鴻勁精密股份有限公司
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Priority to TW111137314A priority Critical patent/TWI822371B/en
Priority claimed from TW111137314A external-priority patent/TWI822371B/en
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Publication of TWI822371B publication Critical patent/TWI822371B/en
Publication of TW202416604A publication Critical patent/TW202416604A/en

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Abstract

The pressing mechanism includes a pressing member and a pressure-detecting unit. The supporter of the pressing member has a cavity therein, and the cavity is injected with fluid via the fluid pipe. The pressing member is driven to move along a pressing axis by the pressure of the fluid in the cavity. The pressure-detecting unit has a detecting portion on the supporter wherein the detecting portion communicates the cavity so that the fluid pressure in the cavity can be detected by the detecting portion and compared with the determined pressure. Thus, the pressing member is ensured to press the electronic component under the predetermined pressure.

Description

接合機構、測試裝置及作業機Joining mechanism, testing device and operating machine

本發明提供一種可即時檢知接合器之實際流體壓力,而確保接合具以預設下壓力壓接電子元件之接合機構。The present invention provides a bonding mechanism which can detect the actual fluid pressure of the bonding tool in real time and ensure that the bonding tool presses the electronic component with a preset lower pressure.

在現今,測試裝置以測試機構之測試器測試電子元件,而淘汰出不良品;然為確保電子元件之錫球確實接觸測試器的探針,測試裝置於測試機構之上方配置接合機構,以供壓接電子元件執行測試作業,因此,接合機構之下壓力的過與不足均會影響電子元件測試品質。Nowadays, test equipment uses testers on test mechanisms to test electronic components and eliminate defective products. However, in order to ensure that the solder balls of electronic components actually contact the probes of the testers, the test equipment is equipped with a bonding mechanism on top of the test mechanism to crimp the electronic components to perform the test operation. Therefore, excessive or insufficient pressure under the bonding mechanism will affect the quality of electronic component testing.

請參閱圖1,測試機構設有複數個具探針之測試器11A、11B,以供容置及測試電子元件12A、12B,接合機構於移動臂13裝配複數個接合器14A 、14B,各接合器14A、14B設有腔室141A、141B及配置其內之膜片142A、142B ,複數個腔室141A、141B連通複數個氣體輸送管路143A、143B,各氣體輸送管路143A、143B之一端輸入氣體至腔室141A、141B,另一端共同連接一流體控制器144,流體控制器144連接氣體供應源(圖未示出),又各腔室141A、141B之膜片142A、142B分別連接有接合具145A、145B,以接合器14A為例,接合器14A以腔室141A的流體壓力經膜片142A而驅動接合具145A作Z方向位移以下壓力壓接測試器11A之電子元件12A執行測試作業。 Please refer to Figure 1. The testing mechanism is provided with a plurality of testers 11A and 11B with probes for accommodating and testing electronic components 12A and 12B. The bonding mechanism is provided with a plurality of bonding devices 14A and 14B on the moving arm 13. Each bonding device 14A and 14B is provided with a chamber 141A and 141B and a diaphragm 142A and 142B arranged therein. , multiple chambers 141A, 141B are connected to multiple gas delivery pipelines 143A, 143B. One end of each gas delivery pipeline 143A, 143B inputs gas to the chamber 141A, 141B, and the other end is commonly connected to a fluid controller 144. The fluid controller 144 is connected to a gas supply source (not shown). The diaphragms 142A, 142B of each chamber 141A, 141B are respectively connected to connectors 145A, 145B. Taking connector 14A as an example, connector 14A drives connector 145A to move in the Z direction through diaphragm 142A with the fluid pressure of chamber 141A to press the electronic component 12A of tester 11A with pressure to perform testing.

惟,由於流體控制器144以二氣體輸送管路143A、143B分別輸送氣體至接合器14A、14B之腔室141A、141B,即便流體控制器144初始輸出之氣體流量為預設值,但於流體控制器144至腔室141A、141B的氣體輸送過程中,易因折管或管體破孔漏氣等因素而發生氣體損失之情況,以致無法確保腔室141A、141B內之實際流體壓力是否符合預設流體壓力,進而無法確保接合具145A、145B是否以預設下壓力壓接電子元件,不足的下壓力將使電子元件之接點無法作有效性接觸測試器之探針,以致影響測試品質。However, since the fluid controller 144 uses two gas delivery pipelines 143A and 143B to deliver gas to the chambers 141A and 141B of the connectors 14A and 14B respectively, even if the gas flow rate initially output by the fluid controller 144 is the preset value, gas loss may easily occur during the gas delivery process from the fluid controller 144 to the chambers 141A and 141B due to factors such as tube breakage or tube rupture and gas leakage, making it impossible to ensure whether the actual fluid pressure in the chambers 141A and 141B meets the preset fluid pressure, and further, it is impossible to ensure whether the connectors 145A and 145B are pressed against the electronic components with the preset downward pressure. Insufficient downward pressure will make it impossible for the contacts of the electronic components to effectively contact the probes of the tester, thereby affecting the test quality.

再者,接合機構以單一流體控制器144連接複數個接合器14A、14B之複數個氣體輸送管路143A、143B,並無法得知何者氣體輸送管路發生異常,不僅無法確保電子元件之測試良率,若逐一檢查複數個氣體輸送管路,亦增加作業不便;若將整個接合機構更換,則勢必增加機構成本。Furthermore, the bonding mechanism uses a single fluid controller 144 to connect multiple gas delivery pipelines 143A, 143B of multiple connectors 14A, 14B, and it is impossible to know which gas delivery pipeline has an abnormality. Not only can the test yield of electronic components not be ensured, but if multiple gas delivery pipelines are checked one by one, the operation inconvenience is increased. If the entire bonding mechanism is replaced, the cost of the mechanism is bound to increase.

本發明之目的一,提供一種接合機構,包含至少一接合器及至少一腔壓偵測單元,至少一接合器設有載座及接合具,載座內部之腔室連通一可輸入流體之流體輸送管路,利用腔室之流體壓力能夠驅動接合具沿壓接軸向位移而壓接電子元件;腔壓偵測單元於載座設有至少一相通腔室的檢壓部,檢壓部可供壓力感測器相通於腔室,於接合具未壓接或已壓接電子元件時,壓力感測器經由檢壓部即時檢知腔室內之實際流體壓力,而可迅速排除異常,以確保接合具之下壓力為預設下壓力,進而提高測試品質。The first object of the present invention is to provide a bonding mechanism, including at least one bonder and at least one cavity pressure detection unit. The at least one bonder is provided with a carrier and a bonder. The cavity inside the carrier is connected to a fluid delivery pipeline that can input fluid. The fluid pressure in the cavity can drive the bonder to move along the axial direction of the bonding to bond the electronic component. The cavity pressure detection unit is provided with at least one pressure detection part that communicates with the cavity on the carrier. The pressure detection part can allow a pressure sensor to communicate with the cavity. When the bonder is not bonded or has been bonded to the electronic component, the pressure sensor can instantly detect the actual fluid pressure in the cavity through the pressure detection part, and can quickly eliminate the abnormality to ensure that the lower pressure of the bonder is the preset lower pressure, thereby improving the test quality.

本發明之目的二,提供一種接合機構,其腔壓偵測單元於每一個接合器之載座設有相通腔室的檢壓部,以供對應配置之壓力感測器獨立檢知腔室的實際流體壓力,以利工作人員迅速得知何者接合器發生異常,而可單獨更換異常之流體輸送管路,毋需更換整個接合器,不僅確保電子元件測試良率及提高作業便利性,並有效節省機構成本。The second object of the present invention is to provide a bonding mechanism, wherein a cavity pressure detection unit is provided with a pressure detection portion communicating with the cavity on the carrier of each bonder, so that a correspondingly configured pressure sensor can independently detect the actual fluid pressure of the cavity, so that the staff can quickly know which bonder is abnormal and replace the abnormal fluid delivery pipeline alone without replacing the entire bonder, which not only ensures the test yield of electronic components and improves the convenience of operation, but also effectively saves the cost of the mechanism.

本發明之目的三,提供一種測試裝置,包含至少一測試機構及至少一接合機構,至少一測試機構設有至少一測試器,以供測試電子元件;至少一本發明接合機構包含接合器及腔壓偵測單元,接合器以下壓力供壓接電子元件,腔壓偵測單元以供檢知接合器之實際流體壓力,而可確保接合器之下壓力。The third object of the present invention is to provide a testing device, comprising at least one testing mechanism and at least one bonding mechanism, wherein at least one testing mechanism is provided with at least one tester for testing electronic components; at least one bonding mechanism of the present invention comprises a coupler and a cavity pressure detection unit, the lower pressure of the coupler is used to press-connect the electronic components, and the cavity pressure detection unit is used to detect the actual fluid pressure of the coupler, thereby ensuring the lower pressure of the coupler.

本發明之目的四,提供一種作業機,包含機台、供料裝置、收料裝置、測試裝置、輸送裝置及中央控制裝置,供料裝置配置於機台,並設有至少一供料器,以供容置至少一待測電子元件;收料裝置配置於機台,並設有至少一收料器,以供容置至少一已測電子元件;測試裝置配置於機台,並設有至少一測試機構及至少一接合機構,以供壓測電子元件,並可即時檢知實際流體壓力,而確保下壓力;輸送裝置配置於機台,並設有至少一輸送器,以供輸送電子元件;中央控制裝置以控制及整合各裝置作動而執行自動化作業。The fourth object of the present invention is to provide an operating machine, including a machine, a feeding device, a receiving device, a testing device, a conveying device and a central control device. The feeding device is arranged on the machine and is provided with at least one feeder for accommodating at least one electronic component to be tested; the receiving device is arranged on the machine and is provided with at least one receiver for accommodating at least one tested electronic component; the testing device is arranged on the machine and is provided with at least one testing mechanism and at least one bonding mechanism for pressure testing the electronic component, and can detect the actual fluid pressure in real time to ensure the downward pressure; the conveying device is arranged on the machine and is provided with at least one conveyor for conveying the electronic component; the central control device controls and integrates the actions of each device to perform automated operations.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable you to have a further understanding of the present invention, a preferred embodiment is given below with accompanying drawings:

請參閱圖2,本發明接合機構包含至少一接合器及至少一腔壓偵測單元。Please refer to FIG. 2 , the coupling mechanism of the present invention includes at least one coupling device and at least one cavity pressure detection unit.

至少一接合器包含載座及至少一接合具,載座之內部設有至少一腔室,腔室連通至少一流體輸送管路,以供輸入流體(例如氣體);更進一步,載座設有至少一具腔室之第一部件211;依作業需求,腔室可為上開口式或下開口式設計,不受限於本實施例;於本實施例,載座包含第一部件211及第二部件212,第一部件211設有下開口式之腔室2111,並設有可輸送流體之輸送流道2112,輸送流道2112之一端連通腔室2111,另一端連通一流體輸送管路22,流體輸送管路22連通一流體供應源(圖未示出),經由輸送流道2112將可為氣體之流體輸入第一部件211之腔室2111。At least one adapter includes a carrier and at least one adapter, and at least one chamber is provided inside the carrier, and the chamber is connected to at least one fluid delivery pipeline for inputting fluid (such as gas); further, the carrier is provided with at least one first component 211 with a chamber; according to the operation requirements, the chamber can be designed as an upper opening type or a lower opening type, which is not limited to the present embodiment; in the present embodiment, the carrier includes a first component 211 and a second component 212, and the first component 211 is provided with a lower opening type chamber 2111, and is provided with a delivery channel 2112 for transporting fluid, one end of the delivery channel 2112 is connected to the chamber 2111, and the other end is connected to a fluid delivery pipeline 22, and the fluid delivery pipeline 22 is connected to a fluid supply source (not shown in the figure), and the fluid, which can be a gas, is input into the chamber 2111 of the first component 211 through the delivery channel 2112.

承上述,接合機構設有流體控制器23,以供連通至少一流體輸送管路22;於本實施例,流體控制器23連通一流體供應源(圖未示出),並可控制複數個流體輸送管路22之流體的流量多寡。As mentioned above, the coupling mechanism is provided with a fluid controller 23 for connecting at least one fluid delivery pipeline 22 ; in this embodiment, the fluid controller 23 is connected to a fluid supply source (not shown) and can control the flow rate of the fluid in a plurality of fluid delivery pipelines 22 .

第二部件212裝配於第一部件211之下方,並於頂面向下凹設一容室2121,以及於底面向下凸設一壓接部2122,壓接部2122由底面向上開設一貫通至容室2121之穿孔2123,容室2121與穿孔2123間設有一階級面2124。The second component 212 is assembled below the first component 211, and has a chamber 2121 recessed downwardly on the top surface, and a crimping portion 2122 protruding downwardly on the bottom surface. The crimping portion 2122 has a through hole 2123 extending upward from the bottom surface to the chamber 2121, and a stepped surface 2124 is provided between the chamber 2121 and the through hole 2123.

至少一接合具裝配於載座,而可由載座之腔室2111內的流體壓力能夠驅動沿壓接軸向A位移而以下壓力壓接電子元件;更進一步,至少一接合具設有至少一接合部件,以供壓接電子元件。At least one bonding tool is assembled on the carrier, and can be driven by the fluid pressure in the chamber 2111 of the carrier to move along the pressing axis A to press the electronic component under pressure; further, at least one bonding tool is provided with at least one bonding component for pressing the electronic component.

依作業需求,載座可供裝配一接合具,而以單一下壓力直接壓接電子元件,或者載座可供配置複數個疊置之接合具,而以疊層增壓之下壓力令位於最下方之接合具壓接電子元件;因此,不受限於本實施例。According to the operation requirements, the carrier can be equipped with a bonding tool to directly press the electronic components with a single downward pressure, or the carrier can be configured with multiple stacked bonding tools to press the electronic components with the stacked pressure. Therefore, it is not limited to this embodiment.

依作業需求,接合具可設有至少一拾取部,以供取放電子元件。According to the operation requirements, the bonding tool may be provided with at least one picking portion for picking up and placing electronic components.

於本實施例,至少一接合具包含第一接合具241及第二接合具242 ,第一接合具241配置於第一部件211之腔室2111,並以頂面接觸腔室2111內之氣體,而供可為氣體壓力之流體壓力能夠驅動第一接合具241沿壓接軸向A位移 ,第二接合具242配置於第二部件212之容室2121,並跨置於第二部件212之階級面2124,第二接合具242之頂面疊接於第一接合具241之底面,第二接合具242並朝下凸設有接合部件2421,接合部件2421穿置於第二部件212之穿孔2123,並設有一連接抽氣管路(圖未示出)之拾取部2422,以供取放電子元件,進而相互疊接之第一接合具241及第二接合具242能夠同步沿壓接軸向A位移,令第二接合具242能夠取放電子元件,並以下壓力壓接電子元件,且能夠沿壓接軸向A作浮動位移。 In this embodiment, at least one bonding tool includes a first bonding tool 241 and a second bonding tool 242. The first bonding tool 241 is disposed in the chamber 2111 of the first component 211, and contacts the gas in the chamber 2111 with the top surface, and the fluid pressure that can be the gas pressure can drive the first bonding tool 241 to move along the pressing axis A. The second jointer 242 is arranged in the chamber 2121 of the second component 212 and straddles the step surface 2124 of the second component 212. The top surface of the second jointer 242 overlaps the bottom surface of the first jointer 241. The second jointer 242 is provided with a joint component 2421 protruding downward. The joint component 2421 is inserted into the through hole 2123 of the second component 212 and is provided with a pick-up portion 2422 connected to an exhaust pipe (not shown) for taking and placing electronic components. The first jointer 241 and the second jointer 242 overlapped with each other can be synchronously displaced along the pressing axis A, so that the second jointer 242 can take and place electronic components, press the electronic components with pressure, and can float along the pressing axis A.

依不同型式電子元件(如凸塊型式電子元件或平面型式電子元件)之作業需求,第二接合具242之接合部件2421可位於第二部件212之穿孔2123內部,或者凸伸出穿孔2123,均可壓接電子元件。According to the operation requirements of different types of electronic components (such as bump-type electronic components or planar electronic components), the bonding component 2421 of the second bonding tool 242 can be located inside the through hole 2123 of the second component 212, or protrude from the through hole 2123, and both can press-connect the electronic components.

腔壓偵測單元於載座設有至少一相通腔室的檢壓部,以供壓力感測器經由檢壓部即時感測腔室內之實際流體壓力是否符合預設流體壓力,以確保接合具之下壓力;更進一步,檢壓部可為一相通腔室之容置孔,以供容置壓力感測器,並使壓力感測器之感測部件相對於腔室,或者檢壓部為一相通腔室之通孔,通孔之一端相通腔室,另一端相通位於載座外部之壓力感測器,壓力感測器之感測部件相對於腔室。The cavity pressure detection unit is provided with at least one pressure-detecting portion communicating with the cavity on the carrier, so that the pressure sensor can sense through the pressure-detecting portion whether the actual fluid pressure in the cavity meets the preset fluid pressure in real time to ensure the pressure under the joint; further, the pressure-detecting portion can be a receiving hole communicating with the cavity to accommodate the pressure sensor, and make the sensing component of the pressure sensor relative to the cavity, or the pressure-detecting portion is a through hole communicating with the cavity, one end of the through hole communicates with the cavity, and the other end communicates with the pressure sensor located outside the carrier, and the sensing component of the pressure sensor is relative to the cavity.

依作業需求,檢壓部與壓力感測器之間可增設有檢壓管路,以供腔室之流體流入檢壓管路,使壓力感測器感測腔室之實際流體壓力。According to the operation requirements, a pressure testing pipeline can be added between the pressure testing part and the pressure sensor to allow the fluid in the chamber to flow into the pressure testing pipeline so that the pressure sensor can sense the actual fluid pressure in the chamber.

於本實施例,腔壓偵測單元包含檢壓部及壓力感測器,檢壓部設於載座之第一部件211,且為通孔2113,通孔2113之一端相通至腔室2111,另一端相通至第一部件211之外部;壓力感測器25具有感測部件251,並以支撐架252裝配於第一部件211之側面,且令感測部件251相對於通孔2113,於第二接合具242呈未壓接狀態或已壓接狀態時,以供偵測由腔室2111流入於通孔2113之流體壓力,而可檢知腔室2111之實際流體壓力是否符合預設流體壓力。In this embodiment, the cavity pressure detection unit includes a pressure detection part and a pressure sensor. The pressure detection part is arranged on the first component 211 of the carrier and is a through hole 2113. One end of the through hole 2113 is connected to the chamber 2111, and the other end is connected to the outside of the first component 211. The pressure sensor 25 has a sensing part 251 and is assembled on the side of the first component 211 with a support frame 252, and the sensing part 251 is relative to the through hole 2113. When the second coupling device 242 is in an unpressed state or a pressurized state, it is used to detect the pressure of the fluid flowing from the chamber 2111 into the through hole 2113, and whether the actual fluid pressure of the chamber 2111 meets the preset fluid pressure can be detected.

承上述,載座可為固定式配置或可移動式配置,例如載座可裝配於一固定架,例如載座可裝配於移動臂,並由移動臂帶動作至少一方向位移;於本實施例,載座於第一部件211之頂面設置轉接塊213,利用轉接塊213裝配於移動臂26,而可由移動臂26帶動接合器及腔壓偵測單元同步位移作動。Based on the above, the carrier can be fixedly configured or movable, for example, the carrier can be mounted on a fixed frame, for example, the carrier can be mounted on a moving arm, and can be driven by the moving arm to move in at least one direction; in this embodiment, the carrier is provided with a transfer block 213 on the top surface of the first component 211, and the transfer block 213 is used to be mounted on the moving arm 26, and the moving arm 26 can drive the connector and the cavity pressure detection unit to move synchronously.

承上述,接合具可配置至少一溫控件(圖未示出),以供溫控電子元件;更進一步,溫控件可為加熱件或致冷晶片等。Based on the above, the bonding tool can be equipped with at least one temperature control unit (not shown) to control the temperature of the electronic components; further, the temperature control unit can be a heating element or a cooling chip, etc.

請參閱圖3、4、5,一種測試裝置20包含至少一測試機構及至少一本發明之接合機構,測試機構設有至少一測試器,以供測試電子元件;於本實施例,測試機構設有複數個測試器,各測試器設有電性連接之電路板271及測試座272,測試座272具有探針,以供承置及測試電子元件;本發明之接合機構於移動臂26配置複數個具有第二接合具242之接合器及複數個具有壓力感測器25之腔壓偵測單元,複數個接合器之流體輸送管路22連接於同一個流體控制器23 ,並以複數個拾取部2422吸附待測之電子元件,移動臂26帶動複數個接合器及複數個腔壓偵測單元同步位移至測試機構之上方,令複數個第二接合具242及待測電子元件相對於複數個測試座272。 Please refer to Figures 3, 4, and 5. A test device 20 includes at least one test mechanism and at least one bonding mechanism of the present invention. The test mechanism is provided with at least one tester for testing electronic components. In this embodiment, the test mechanism is provided with a plurality of testers, each of which is provided with an electrically connected circuit board 271 and a test socket 272. The test socket 272 has a probe for holding and testing electronic components. The bonding mechanism of the present invention is provided with a plurality of adapters with a second bonding tool 242 and a plurality of cavity pressure detection units with a pressure sensor 25 on the moving arm 26. The fluid delivery pipelines 22 of the plurality of adapters are connected to the same fluid controller 23. , and use multiple pick-up parts 2422 to absorb the electronic components to be tested, and the moving arm 26 drives multiple adapters and multiple cavity pressure detection units to synchronously move to the top of the test mechanism, so that the multiple second adapters 242 and the electronic components to be tested are relative to the multiple test seats 272.

接合機構之一流體控制器23控制氣體經由複數個流體輸送管路22分別流入複數個接合器之輸送流道2112,各輸送流道2112將氣體輸入載座之第一部件211的腔室2111,由於流體輸送管路22及輸送流道2112於輸送氣體之過程中可能發生破管洩氣或管道損失等情況,為使工作人員可即時檢知接合器之腔室2111的實際流體壓力是否符合預設流體壓力,而可確保第二接合具242以預設下壓力壓接電子元件;當載座之輸送流道2112將氣體輸送至腔室2111,且第二接合具242呈未壓接狀態時,腔壓偵測單元利用腔室2111內之部分氣體流入於通孔2113,使壓力感測器25之感測部件251經由第一部件211之通孔2113而可感測腔室2111內之實際流體壓力,並將感測資料傳輸至一處理器(圖未示出),由處理器判斷腔室2111之實際流體壓力是否符合預設流體壓力;然在每一個接合器配置有獨立之壓力感測器25的設計下,處理器可依據每一個壓力感測器25所傳輸的感測資料,而迅速得知何者接合器之腔室2111的實際流體壓力異常,並顯示異常訊號,進而即時通知工作人員停機檢查或調整氣體量,以迅速排除異常 ,而確保每一個接合器之第一接合器241及第二接合器242以預設下壓力壓接電子元件。 A fluid controller 23 of the bonding mechanism controls the gas to flow into the delivery channels 2112 of the plurality of adapters through the plurality of fluid delivery pipelines 22. Each delivery channel 2112 delivers the gas into the chamber 2111 of the first component 211 of the carrier. Since the fluid delivery pipeline 22 and the delivery channel 2112 may break or leak gas or lose the pipeline during the process of delivering the gas, in order to enable the staff to immediately detect whether the actual fluid pressure of the chamber 2111 of the adapter meets the preset fluid pressure, it can ensure that the second adapter 242 presses the electronic component with the preset pressure. When the delivery channel 2112 of the carrier delivers the gas to the chamber 2111 and the second adapter 242 is in an unpressed state, the cavity pressure detection unit By using part of the gas in the chamber 2111 to flow into the through hole 2113, the sensing component 251 of the pressure sensor 25 can sense the actual fluid pressure in the chamber 2111 through the through hole 2113 of the first component 211, and transmit the sensing data to a processor (not shown), which determines whether the actual fluid pressure in the chamber 2111 meets the preset fluid pressure; however, in the design that each adapter is equipped with an independent pressure sensor 25, the processor can quickly know which adapter's chamber 2111 has abnormal actual fluid pressure based on the sensing data transmitted by each pressure sensor 25, and display an abnormal signal, thereby immediately notifying the staff to stop the machine for inspection or adjust the gas volume to quickly eliminate the abnormality. , and ensure that the first connector 241 and the second connector 242 of each connector press the electronic component with a preset lower pressure.

於接合器之腔室2111的實際流體壓力符合預設流體壓力,移動臂26帶動第一部件211、第二部件212、第一接合具241、第二接合具242、壓力感測器25及待測電子元件同步作Z方向位移,將待測電子元件置入測試座272,並利用腔室2111之流體壓力推動第一接合具241,第一接合具241頂推帶動第二接合具242沿壓接軸向A作Z方向向下位移,令第二接合具242之接合部件2421以預設下壓力壓接測試座272之電子元件,電子元件承受測試座272之探針的反作用力頂推而沿壓接軸向A作向上浮動位移,並頂推帶動第二接合具242及第一接合具241同步作Z方向向上浮動位移,使電子元件之接點確實接觸測試座272之探針 ,達到提高測試品質之實用效益。 When the actual fluid pressure in the chamber 2111 of the connector meets the preset fluid pressure, the moving arm 26 drives the first component 211, the second component 212, the first connector 241, the second connector 242, the pressure sensor 25 and the electronic component to be tested to move synchronously in the Z direction, and the electronic component to be tested is placed in the test seat 272. The fluid pressure in the chamber 2111 is used to push the first connector 241, and the first connector 241 pushes the second connector. 242 moves downward in the Z direction along the press-fit axis A, so that the joint part 2421 of the second jointer 242 presses the electronic component of the test seat 272 with a preset downward pressure. The electronic component is pushed by the reaction force of the probe of the test seat 272 and moves upward along the press-fit axis A, and the second jointer 242 and the first jointer 241 are pushed upward in the Z direction synchronously, so that the contact of the electronic component is in contact with the probe of the test seat 272 , achieving the practical benefit of improving the test quality.

依作業需求,本發明接合機構之其他實施例,載座之第一部件可設有上開口式之腔室,腔室之內部配置有膜片,以供連接至少一接合具,另於腔室之上方蓋置一封板,封板可為獨立面板或移動臂之面板,並設有至少一輸送流道,輸送流道之一端連通腔室,另一端連通流體輸送管路,以供輸送流體至腔室,使膜片帶動接合具沿壓接軸向位移而壓接電子元件;腔壓偵測單元於第一部件之腔室內壁面設有為容置孔之檢壓部,以供置入壓力感測器,令壓力感測器之感測部件相對於腔室,使壓力感測器經由檢壓部而可即時感測腔室內之實際流體壓力是否符合預設流體壓力,以確保接合具之下壓力,進而提高測試品質。According to the work requirements, in other embodiments of the bonding mechanism of the present invention, the first component of the carrier can be provided with a chamber with an upper opening, and a diaphragm is arranged inside the chamber for connecting at least one bonding tool. In addition, a sealing plate is arranged on the upper part of the chamber, and the sealing plate can be an independent panel or a panel of the moving arm, and is provided with at least one conveying channel, one end of the conveying channel is connected to the chamber, and the other end is connected to the fluid conveying pipeline for conveying fluid to the chamber, so that The diaphragm drives the jointer to move along the axial direction of the press-fitting to press-fit the electronic component; the cavity pressure detection unit is provided with a pressure detection portion as a receiving hole on the inner wall surface of the cavity of the first component for inserting the pressure sensor, so that the sensing component of the pressure sensor is relative to the cavity, so that the pressure sensor can instantly sense whether the actual fluid pressure in the cavity meets the preset fluid pressure through the pressure detection portion, so as to ensure the pressure under the jointer, thereby improving the test quality.

請參閱圖2~6,本發明接合機構應用於電子元件作業機,作業機包含機台30、供料裝置40、收料裝置50、測試裝置20、輸送裝置60及中央控制裝置(圖未示出);供料裝置40裝配於機台30,並設有至少一供料器,以容納至少一待測之電子元件;收料裝置50裝配於機台30,並設有至少一收料器,以容納至少一已測之電子元件;測試裝置20配置於機台30,並設有至少一測試機構及至少一本發明之接合機構,測試機構設有至少一測試器,以供測試電子元件,本發明之接合機構包含至少一接合器及至少一腔壓偵測單元,以供壓接電子元件及檢知接合器之實際流體壓力,於本實施例,測試器設有電性連接之電路板271及測試座272,測試座272具有探針,以供測試電子元件;載座之第一部件211的腔室2111具有氣體,利用氣體之流體壓力驅動第一接合具241及第二接合具242沿壓接軸向A位移,令第二接合具242之接合部件2421壓接測試座272之電子元件執行測試作業,腔壓偵測單元以壓力感測器25之感測部件251相對於通孔2113,而可偵測由腔室2111流入於通孔2113之流體壓力,以檢知腔室2111之實際流體壓力是否符合預設流體壓力;輸送裝置60裝配於機台30,並設有至少一輸送器,以輸送電子元件,於本實施例,輸送裝置60之第一輸送器61於供料裝置40取出待測之電子元件,並移載至第二輸送器62,第二輸送器62載送待測電子元件至測試裝置之測試座272的側方,而供接合機構之拾取部2422取出待測電子元件,並移入測試座272執行測試作業,以及將已測電子元件移載至第三輸送器63載出,第四輸送器64於第三輸送器63取出已測電子元件,並依據測試結果而輸送至收料裝置50之收料器作分類收置;中央控制裝置(圖未示出)用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。Please refer to Figures 2 to 6. The bonding mechanism of the present invention is applied to an electronic component processing machine, which includes a machine 30, a feeding device 40, a receiving device 50, a testing device 20, a conveying device 60 and a central control device (not shown); the feeding device 40 is mounted on the machine 30 and is provided with at least one feeder to accommodate at least one electronic component to be tested; the receiving device 50 is mounted on the machine 30 and is provided with at least one receiving device to accommodate at least one electronic component that has been tested; the testing device 20 is disposed on the machine 30 and is provided with at least one testing mechanism and at least one bonding mechanism of the present invention, and the testing device 20 is disposed on the machine 30 and is provided with at least one testing mechanism and at least one bonding mechanism of the present invention. The test mechanism is provided with at least one tester for testing electronic components. The bonding mechanism of the present invention includes at least one bonder and at least one cavity pressure detection unit for pressing the electronic components and detecting the actual fluid pressure of the bonder. In this embodiment, the tester is provided with an electrically connected circuit board 271 and a test seat 272. The test seat 272 has a probe for testing the electronic components. The chamber 2111 of the first component 211 of the carrier has gas. The fluid pressure of the gas is used to drive the first bonding tool 241 and the second bonding tool 242 to move along the pressing axis A, so that the bonding of the second bonding tool 242 The component 2421 is pressed against the electronic component of the test seat 272 to perform the test operation. The cavity pressure detection unit uses the sensing component 251 of the pressure sensor 25 relative to the through hole 2113 to detect the pressure of the fluid flowing from the chamber 2111 into the through hole 2113 to detect whether the actual fluid pressure of the chamber 2111 meets the preset fluid pressure. The conveying device 60 is assembled on the machine 30 and is provided with at least one conveyor to convey the electronic component. In this embodiment, the first conveyor 61 of the conveying device 60 takes out the electronic component to be tested from the feeding device 40 and transfers it to the second conveyor 62. The second conveyor 62 carries the electronic component to be tested to the side of the test socket 272 of the test device, and the pick-up portion 2422 of the bonding mechanism takes out the electronic component to be tested and moves it into the test socket 272 to perform the test operation, and transfers the tested electronic component to the third conveyor 63 for unloading. The fourth conveyor 64 takes out the tested electronic component from the third conveyor 63 and transports it to the receiver of the receiving device 50 for classification and storage according to the test results. The central control device (not shown) is used to control and integrate the actions of each device to perform automated operations and achieve the practical benefit of improving the operating efficiency.

[習知] 11A、11B:測試器 12A、12B:電子元件 13:移動臂 14A、14B:接合器 141A、141B:腔室 142A、142B:膜片 143A、143B:氣體輸送管路 144:流體控制器 145A、145B:接合具 [本發明] 20:測試裝置 211:第一部件 2111:腔室 2112:輸送流道 2113:通孔 212:第二部件 213:轉接塊 2121:容室 2122:壓接部 2123:穿孔 2124:階級面 22:流體輸送管路 23:流體控制器 241:第一接合具 242:第二接合具 2421:接合部件 2422:拾取部 25:壓力感測器 251:感測部件 252:支撐架 26:移動臂 271:電路板 272:測試座 A:壓接軸向 30:機台 40:供料裝置 50:收料裝置 60:輸送裝置 61:第一輸送器 62:第二輸送器 63:第三輸送器 64:第四輸送器 [Knowledge] 11A, 11B: Tester 12A, 12B: Electronic component 13: Moving arm 14A, 14B: Adapter 141A, 141B: Chamber 142A, 142B: Diaphragm 143A, 143B: Gas delivery pipeline 144: Fluid controller 145A, 145B: Adapter [Present invention] 20: Test device 211: First component 2111: Chamber 2112: Delivery channel 2113: Through hole 212: Second component 213: Adapter block 2121: Receptacle 2122: Pressing part 2123: Perforation 2124: Step surface 22: Fluid delivery pipeline 23: Fluid controller 241: First jointer 242: Second jointer 2421: Jointing component 2422: Pickup unit 25: Pressure sensor 251: Sensing component 252: Support frame 26: Moving arm 271: Circuit board 272: Test seat A: Press-fit axial direction 30: Machine 40: Feeding device 50: Receiving device 60: Conveying device 61: First conveyor 62: Second conveyor 63: Third conveyor 64: Fourth conveyor

圖1:習知測試裝置之示意圖。 圖2:本發明接合機構之示意圖。 圖3:本發明接合機構應用於測試裝置之示意圖。 圖4:本發明測試裝置之使用示意圖。 圖5:本發明接合機構之使用示意圖。 圖6:本發明測試裝置應用於作業機之示意圖。 Figure 1: Schematic diagram of a known test device. Figure 2: Schematic diagram of the joint mechanism of the present invention. Figure 3: Schematic diagram of the joint mechanism of the present invention applied to a test device. Figure 4: Schematic diagram of the use of the test device of the present invention. Figure 5: Schematic diagram of the use of the joint mechanism of the present invention. Figure 6: Schematic diagram of the test device of the present invention applied to a working machine.

20:測試裝置 20:Testing equipment

211:第一部件 211: First part

2111:腔室 2111: Chamber

2112:輸送流道 2112:Transport channel

2113:通孔 2113:Through hole

22:流體輸送管路 22: Fluid delivery pipeline

23:流體控制器 23: Fluid controller

241:第一接合具 241: First jointer

242:第二接合具 242: Second jointer

25:壓力感測器 25: Pressure sensor

26:移動臂 26: Mobile arm

272:測試座 272: Test seat

Claims (10)

一種接合機構,包含: 至少一接合器:設有載座及至少一接合具,該載座之內部設有至少一腔室,該 腔室連通可輸入流體之流體輸送管路,該腔室之實際流體壓力能夠驅動該接合具沿壓接軸向位移而以下壓力壓接電子元件; 至少一腔壓偵測單元:於該載座設有至少一相通該腔室的檢壓部,以供壓力感 測器經由該檢壓部即時感測該腔室內之該實際流體壓力是否符合預設流體壓力,以確保該接合具之該下壓力。 A bonding mechanism includes: At least one bonding device: provided with a carrier and at least one bonding tool, the carrier is provided with at least one chamber inside, the chamber is connected to a fluid delivery pipeline for inputting fluid, the actual fluid pressure of the chamber can drive the bonding tool to displace along the axial direction of the bonding and press the electronic component with the lower pressure; At least one cavity pressure detection unit: at least one pressure detection part connected to the cavity is provided on the carrier, so that the pressure sensor can sense whether the actual fluid pressure in the cavity meets the preset fluid pressure through the pressure detection part in real time to ensure the lower pressure of the bonding tool. 如請求項1所述之接合機構,其該載座設有至少一具該腔室之第一部件,以供裝配至少一該接合具。In the bonding mechanism as described in claim 1, the carrier is provided with at least one first component having the chamber for assembling at least one bonding tool. 如請求項2所述之接合機構,其該載座設有該第一部件及第二部件,該第一部件具有該腔室,該腔室連通該流體輸送管路,該第二部件裝配於該第一部件之下方,並於內部設有容室,至少一該接合具包含第一接合具及第二接合具,該第一接合具配置於該腔室,並由該實際流體壓力能夠驅動沿該壓接軸向位移,該第二接合具配置該容室,並疊接於該第一接合具之下方,以供壓接電子元件。The bonding mechanism as described in claim 2, wherein the carrier is provided with the first component and the second component, the first component has the chamber, the chamber is connected to the fluid delivery pipeline, the second component is assembled below the first component and has a containing chamber inside, at least one bonding tool includes a first bonding tool and a second bonding tool, the first bonding tool is arranged in the chamber, and can be driven by the actual fluid pressure to move along the axial direction of the crimping, the second bonding tool is arranged in the containing chamber, and is overlapped below the first bonding tool for crimping electronic components. 如請求項1所述之接合機構,其該載座之該腔室配置膜片,該膜片連結該接合具。In the bonding mechanism as described in claim 1, the chamber of the carrier is equipped with a diaphragm, and the diaphragm is connected to the bonding tool. 如請求項1所述之接合機構,其該腔壓偵測單元之該檢壓部為一相通該腔室之通孔,該通孔之一端相通該腔室,另一端相通位於該載座外部之該壓力感測器。In the coupling mechanism described in claim 1, the pressure detection portion of the cavity pressure detection unit is a through hole connected to the cavity, one end of the through hole is connected to the cavity, and the other end is connected to the pressure sensor located outside the carrier. 如請求項5所述之接合機構,其該檢壓部與該壓力感測器之間設有檢壓管路。In the coupling mechanism described in claim 5, a pressure-testing pipeline is provided between the pressure-testing portion and the pressure sensor. 如請求項1所述之接合機構,其該腔壓偵測單元之該檢壓部為 一相通該腔室之容置孔,以供容置該壓力感測器。 As described in claim 1, the pressure detection portion of the cavity pressure detection unit is a receiving hole connected to the cavity for accommodating the pressure sensor. 如請求項1所述之接合機構,更包含流體控制器,以供連通至少一該流體輸送管路。The coupling mechanism as described in claim 1 further includes a fluid controller for connecting at least one of the fluid delivery pipelines. 一種測試裝置,包含: 至少一測試機構:設有至少一測試器,以供測試電子元件; 至少一如請求項1至8中任一項所述之接合機構:以供接合器以下壓力壓接該測 試器之電子元件,並檢知該接合器之實際流體壓力,而確保該接合器之該下壓力。 A testing device, comprising: At least one testing mechanism: provided with at least one tester for testing electronic components; At least one bonding mechanism as described in any one of claims 1 to 8: for a bonding device to press the electronic component of the tester with a lower pressure, and to detect the actual fluid pressure of the bonding device to ensure the lower pressure of the bonding device. 一種作業機,包含: 機台; 供料裝置:配置於該機台,並設有至少一供料器,以供容置至少一待測電子元 件; 收料裝置:配置於該機台,並設有至少一收料器,以供容置至少一已測電子元 件; 至少一如請求項9所述之測試裝置:配置於該機台; 輸送裝置:配置於該機台,並設有至少一輸送器,以供輸送電子元件; 中央控制裝置:以控制及整合各裝置作動而執行自動化作業。 A work machine, comprising: a machine; a feeding device: arranged on the machine and provided with at least one feeder for accommodating at least one electronic component to be tested; a receiving device: arranged on the machine and provided with at least one receiver for accommodating at least one tested electronic component; at least one test device as described in claim 9: arranged on the machine; a conveying device: arranged on the machine and provided with at least one conveyor for conveying electronic components; a central control device: for controlling and integrating the actions of various devices to perform automated operations.
TW111137314A 2022-09-30 2022-09-30 Pressing mechanism, testing apparatus, and processing machine TWI822371B (en)

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US5894161A (en) * 1997-02-24 1999-04-13 Micron Technology, Inc. Interconnect with pressure sensing mechanism for testing semiconductor wafers
MY152599A (en) * 2007-02-14 2014-10-31 Eles Semiconductor Equipment S P A Test of electronic devices at package level using test boards without sockets
TWI649567B (en) * 2016-09-29 2019-02-01 日商精工愛普生股份有限公司 Electronic component transfer device and electronic component inspection device
CN110553778A (en) * 2019-10-10 2019-12-10 上海骥翀氢能科技有限公司 Fuel cell test equipment
TW202146900A (en) * 2020-06-08 2021-12-16 鴻勁精密股份有限公司 Pressing mechanism, operating apparatus, and operating equipment having the same

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