TW202314811A - 基板處理裝置及基板處理方法 - Google Patents
基板處理裝置及基板處理方法 Download PDFInfo
- Publication number
- TW202314811A TW202314811A TW111128057A TW111128057A TW202314811A TW 202314811 A TW202314811 A TW 202314811A TW 111128057 A TW111128057 A TW 111128057A TW 111128057 A TW111128057 A TW 111128057A TW 202314811 A TW202314811 A TW 202314811A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- wafer
- dust collecting
- collecting part
- substrate processing
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 76
- 238000003672 processing method Methods 0.000 title claims description 6
- 239000000428 dust Substances 0.000 claims abstract description 124
- 230000001678 irradiating effect Effects 0.000 claims abstract description 18
- 238000000034 method Methods 0.000 claims abstract description 12
- 230000002093 peripheral effect Effects 0.000 claims description 66
- 239000012080 ambient air Substances 0.000 claims description 8
- 230000003434 inspiratory effect Effects 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 201
- 239000003570 air Substances 0.000 description 42
- 230000004048 modification Effects 0.000 description 11
- 238000012986 modification Methods 0.000 description 11
- 238000004140 cleaning Methods 0.000 description 8
- 239000002245 particle Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 239000012528 membrane Substances 0.000 description 4
- 238000011282 treatment Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000000779 smoke Substances 0.000 description 3
- 238000011109 contamination Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000002407 reforming Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B15/00—Preventing escape of dirt or fumes from the area where they are produced; Collecting or removing dirt or fumes from that area
- B08B15/04—Preventing escape of dirt or fumes from the area where they are produced; Collecting or removing dirt or fumes from that area from a small area, e.g. a tool
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/16—Removal of by-products, e.g. particles or vapours produced during treatment of a workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Optics & Photonics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Laser Beam Processing (AREA)
- Cleaning In General (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021130306 | 2021-08-06 | ||
JP2021-130306 | 2021-08-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW202314811A true TW202314811A (zh) | 2023-04-01 |
Family
ID=85154472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW111128057A TW202314811A (zh) | 2021-08-06 | 2022-07-27 | 基板處理裝置及基板處理方法 |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR20240035619A (ja) |
CN (1) | CN117729985A (ja) |
TW (1) | TW202314811A (ja) |
WO (1) | WO2023013469A1 (ja) |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61182894A (ja) * | 1985-02-07 | 1986-08-15 | Hitachi Ltd | アルミナ基板のレ−ザスクライブ法 |
US5132510A (en) * | 1990-09-04 | 1992-07-21 | Trumpf, Inc. | Laser machine assembly for flow of workpieces therethrough and method of using same |
JP3441244B2 (ja) * | 1995-06-08 | 2003-08-25 | 株式会社アマダ | 熱切断加工機のワークテーブル |
JP2000343269A (ja) * | 1999-06-07 | 2000-12-12 | Hitachi Via Mechanics Ltd | レーザー加工機 |
JP2001347433A (ja) * | 2000-06-07 | 2001-12-18 | Hitachi Ltd | 吸着システム |
JP4993886B2 (ja) | 2005-09-07 | 2012-08-08 | 株式会社ディスコ | レーザー加工装置 |
JP2010120038A (ja) * | 2008-11-18 | 2010-06-03 | Sugino Mach Ltd | レーザー加工装置及びレーザー加工方法 |
JP7210001B2 (ja) * | 2018-10-05 | 2023-01-23 | 株式会社アフレアー | 気体供給吸引装置およびレーザ処理装置 |
-
2022
- 2022-07-26 WO PCT/JP2022/028737 patent/WO2023013469A1/ja active Application Filing
- 2022-07-26 CN CN202280053192.5A patent/CN117729985A/zh active Pending
- 2022-07-26 KR KR1020247006513A patent/KR20240035619A/ko unknown
- 2022-07-27 TW TW111128057A patent/TW202314811A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2023013469A1 (ja) | 2023-02-09 |
KR20240035619A (ko) | 2024-03-15 |
CN117729985A (zh) | 2024-03-19 |
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