TW202133980A - Processing sequence determination device, laser processing device and laser processing method capable of shortening a processing time while maintaining a stable pulse energy - Google Patents

Processing sequence determination device, laser processing device and laser processing method capable of shortening a processing time while maintaining a stable pulse energy Download PDF

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TW202133980A
TW202133980A TW110108507A TW110108507A TW202133980A TW 202133980 A TW202133980 A TW 202133980A TW 110108507 A TW110108507 A TW 110108507A TW 110108507 A TW110108507 A TW 110108507A TW 202133980 A TW202133980 A TW 202133980A
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processing sequence
processed
processing
laser beam
points
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TWI759130B (en
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奧平恭之
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日商住友重機械工業股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08Devices involving relative movement between laser beam and workpiece
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/062Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
    • B23K26/0622Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam by shaping pulses
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/064Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
    • B23K26/0643Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms comprising mirrors
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/064Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
    • B23K26/0648Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms comprising lenses
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/70Auxiliary operations or equipment
    • B23K26/702Auxiliary equipment

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Laser Beam Processing (AREA)
  • Numerical Control (AREA)

Abstract

The subject of the present invention is to provide a processing sequence determination device that can maintain the stabilization of pulse energy and shorten the processing time. The solution of the present invention is that the processing sequence determination device determines the processing sequence of a plurality of processed points to be processed by incident pulse laser beam. At this time, according to the position information of the plurality of processed points, the temporary processing sequence is determined under the condition that the sum of the travel distances between the two consecutive processed points in the processing sequence becomes the shortest. Then, the longest distance that can be moved during the period when the incident position of the pulse laser beam is changed from the output of one laser pulse to the output of the next laser pulse is defined as the longest movable distance. The decimal point of the quotient obtained by dividing each travel distance between the processed points by the longest movable distance is rounded to an integer. The temporary processing sequence is corrected as the actual processing sequence in such a way that the value obtained by the integerized sum of the travel distances between all processed points becomes smaller. The present invention also provides a laser processing device comprising a laser optical system having a function of moving the incident position of the pulse laser beam toward the substrate by scanning and outputting the pulse laser beam; and a control device for controlling the laser optical system so that the pulse laser beam is incident on the substrate and the incident position is moved, wherein the control device includes the above-described processing sequence determination device. According to the actual processing sequence determined by the processing sequence determination device, the pulse laser beam is incident on the processed point of the substrate.

Description

加工順序決定裝置,雷射加工裝置及雷射加工方法Processing sequence determining device, laser processing device and laser processing method

本發明係有關一種在依序射入脈衝雷射光束來進行加工之雷射加工方法中決定加工順序的加工順序決定裝置,以該加工順序進行雷射加工的雷射加工裝置及雷射加工方法。The present invention relates to a processing sequence determining device for determining the processing sequence in a laser processing method in which pulsed laser beams are sequentially injected for processing, and a laser processing device and laser processing method for performing laser processing in the processing sequence .

已知有一種雷射加工裝置,其利用光束掃描器移動脈衝雷射光束的入射位置來進行鑽孔等加工。當利用雷射振盪器進行脈衝振盪時,脈衝能量根據脈衝的重複頻率而變化。為了使複數個被加工點中的加工條件相同,以一定的重複頻率進行脈衝振盪。Known is a laser processing device that uses a beam scanner to move the incident position of a pulsed laser beam to perform drilling and other processing. When a laser oscillator is used for pulse oscillation, the pulse energy changes according to the repetition frequency of the pulse. In order to make the processing conditions of multiple processed points the same, pulse oscillation is performed at a certain repetition frequency.

然而,當從結束了脈衝雷射光束射入的被加工點至接著射入的被加工點為止的距離遠時,基於光束掃描器的光束入射位置的移動有時趕不上與重複頻率對應之下一雷射脈衝的輸出。在該種情況下,控制傳播光學系統,使得雷射脈衝不射入到加工對象物上,並且執行對加工無用的虛擬雷射振盪(例如,參閱專利文獻1)。 [先前技術文獻]However, when the distance from the point to be processed where the pulse laser beam has been injected to the point to be processed next is far, the movement of the beam incident position by the beam scanner may not keep up with the repetition frequency. Laser pulse output. In this case, the propagation optical system is controlled so that the laser pulse does not impinge on the object to be processed, and virtual laser oscillation that is useless for processing is performed (for example, refer to Patent Document 1). [Prior Technical Literature]

[專利文獻1] 日本專利第4873578號[Patent Document 1] Japanese Patent No. 4873578

[發明所欲解決之問題][The problem to be solved by the invention]

當執行虛擬雷射振盪時,緊接在虛擬雷射振盪之前和之後的兩個脈衝振盪之間的間隔擴展至兩個週期量的間隔。若光束掃描器的光束入射位置的移動時間比兩個週期量短,則在進行下一個雷射振盪之前會發生不必要的等待時間。隨著該等待時間的累積,導致一個加工對象物的加工時間變長。又,若為了縮短加工時間而根據光束移動時間改變脈衝的重複頻率,則導致脈衝能量變得不穩定。When the virtual laser oscillation is performed, the interval between two pulse oscillations immediately before and after the virtual laser oscillation is extended to an interval of two cycles. If the movement time of the beam incident position of the beam scanner is shorter than two cycles, unnecessary waiting time will occur before the next laser oscillation. As this waiting time accumulates, the processing time of one object to be processed becomes longer. In addition, if the pulse repetition frequency is changed in accordance with the beam movement time in order to shorten the processing time, the pulse energy will become unstable.

本發明的目的為提供一種能夠維持脈衝能量的穩定化並且能夠實現加工時間的縮短化之加工順序決定裝置,雷射加工裝置及雷射加工方法。 [解決問題之技術手段]The object of the present invention is to provide a processing sequence determining device, a laser processing device, and a laser processing method that can maintain the pulse energy stabilization and can shorten the processing time. [Technical means to solve the problem]

依本發明的一觀點,提供一種加工順序決定裝置,其係藉由射入脈衝雷射光束來決定要加工的複數個被加工點的加工順序之加工順序決定裝置,其中, 根據前述複數個被加工點的位置資訊,在加工順序連續的兩個被加工點之間的移動距離之合計成為最短之條件下,決定臨時加工順序, 在將脈衝雷射光束的入射位置從一雷射脈衝的輸出到下一雷射脈衝的輸出的期間能夠移動的最長距離定義為可移動最長距離時, 將前述被加工點之間的移動距離的每一個除以前述可移動最長距離所得到之商的小數點捨去取整數, 以使對所有前述被加工點之間的移動距離合計被整數化之值所得到之值變小之方式修正前述臨時加工順序而作為實際加工順序。According to an aspect of the present invention, a processing sequence determining device is provided, which is a processing sequence determining device that determines the processing sequence of a plurality of processed points to be processed by injecting a pulsed laser beam, wherein, According to the position information of the plurality of processed points mentioned above, the temporary processing sequence is determined under the condition that the sum of the moving distances between the two continuous processing points becomes the shortest. When the longest distance that the pulsed laser beam can move from the output of one laser pulse to the output of the next laser pulse is defined as the longest moveable distance, The decimal point of the quotient obtained by dividing each of the moving distances between the points to be processed by the longest movable distance mentioned above is rounded to an integer, The temporary processing sequence is corrected so as to reduce the value obtained by the sum of the moving distances between all the processing points to be integerized, and the processing sequence is used as the actual processing sequence.

依本發明的另一觀點,提供一種雷射加工裝置,其係具有: 雷射光學系統,係具有藉由掃描並輸出脈衝雷射光束,使脈衝雷射光束的入射位置向基板移動之功能;及 控制裝置,係控制前述雷射光學系統,將脈衝雷射光束射入基板,並且使入射位置移動, 前述控制裝置具備上述之加工順序決定裝置,並根據前述加工順序決定裝置所決定的前述實際加工順序,使脈衝雷射光束射入於基板的被加工點上。According to another aspect of the present invention, a laser processing device is provided, which has: The laser optical system has the function of moving the incident position of the pulsed laser beam to the substrate by scanning and outputting the pulsed laser beam; and The control device controls the aforementioned laser optical system to inject the pulsed laser beam into the substrate and move the incident position, The control device is provided with the processing sequence determining device described above, and according to the actual processing sequence determined by the processing sequence determining device, the pulse laser beam is incident on the processed point of the substrate.

依本發明的又一觀點,提供一種雷射加工方法,其中, 根據在基板上分布之複數個被加工點的位置資訊,在加工順序連續的兩個被加工點之間的移動距離之合計成為最短之條件下,決定臨時加工順序, 在將脈衝雷射光束的入射位置從一雷射脈衝的輸出到下一雷射脈衝的輸出的期間能夠移動的最長距離定義為可移動最長距離時, 將前述移動距離的每一個除以前述可移動最小距離所得到之商的小數點捨去取整數, 以使對所有前述移動距離合計被整數化之值所得到之值變小之方式修正前述臨時加工順序而作為實際加工順序, 以前述實際加工順序,在前述複數個被加工點射入脈衝雷射光束來進行加工。 [發明之效果]According to another aspect of the present invention, a laser processing method is provided, wherein: According to the position information of the multiple processed points distributed on the substrate, the temporary processing sequence is determined under the condition that the total moving distance between the two processed points in the processing sequence becomes the shortest. When the longest distance that the pulsed laser beam can move from the output of one laser pulse to the output of the next laser pulse is defined as the longest moveable distance, The decimal point of the quotient obtained by dividing each of the aforementioned moving distances by the aforementioned minimum movable distance is rounded to an integer, Correct the aforementioned temporary processing sequence as the actual processing sequence so that the value obtained by the sum of all the aforementioned moving distances being integerized becomes smaller. In the foregoing actual processing sequence, a pulsed laser beam is injected into the plurality of processed points to perform processing. [Effects of Invention]

當被加工點之間的移動距離比可移動最長距離長時,在移動中將會執行虛擬雷射振盪。對所有被加工點之間的移動距離進行合計所得到之值與進行虛擬雷射振盪的次數相等。該進行合計所得到之值為將被加工點之間的移動距離的每一個除以可移動最長距離所得到之商的小數點捨去取整數之值。若減小該合計值,則虛擬雷射振盪的次數減少,能夠縮短加工時間。藉由在被加工點之間的移動距離大於可移動最長距離的位置進行虛擬雷射振盪,能夠維持脈衝能量的穩定性。When the moving distance between the processed points is longer than the longest distance that can be moved, virtual laser oscillation will be performed during the movement. The value obtained by adding up the moving distances between all processed points is equal to the number of virtual laser oscillations. The value obtained by this totalization is the value obtained by dividing each of the moving distances between the processed points by the longest movable distance and rounding off the decimal point of the quotient. If the total value is reduced, the number of virtual laser oscillations is reduced, and the processing time can be shortened. By performing virtual laser oscillation at a position where the moving distance between the processed points is greater than the longest distance that can be moved, the stability of the pulse energy can be maintained.

參閱圖1~圖6,對根據實施例之雷射加工裝置進行說明。 圖1係基於實施例之雷射加工裝置的概略圖。基於實施例之雷射加工裝置係包括雷射光學系統10、保持並移動基板40的移動機構30、控制雷射光學系統10及移動機構30的控制裝置20以及加工順序決定裝置25。1 to 6, the laser processing device according to the embodiment will be described. Fig. 1 is a schematic diagram of a laser processing apparatus based on the embodiment. The laser processing device based on the embodiment includes a laser optical system 10, a moving mechanism 30 that holds and moves the substrate 40, a control device 20 that controls the laser optical system 10 and the moving mechanism 30, and a processing sequence determining device 25.

以下,將對雷射光學系統10的構造進行說明。雷射振盪器11根據來自控制裝置20的指令輸出脈衝雷射光束。從雷射振盪器11輸出之脈衝雷射光束通過導光光學系統12及孔徑13射入至聲光元件(AOD)14。導光光学系統12例如包括擴束器等。聲光元件14根據來自控制裝置20的指令將所射入之脈衝雷射光束轉向第1路徑15A,第2路徑15B及朝向光束阻尼器19的路徑中的任一個路徑中。Hereinafter, the structure of the laser optical system 10 will be described. The laser oscillator 11 outputs a pulsed laser beam according to an instruction from the control device 20. The pulsed laser beam output from the laser oscillator 11 enters the acousto-optic element (AOD) 14 through the light guiding optical system 12 and the aperture 13. The light guiding optical system 12 includes, for example, a beam expander and the like. The acousto-optic element 14 steers the incident pulsed laser beam to any one of the first path 15A, the second path 15B, and the path toward the beam damper 19 according to an instruction from the control device 20.

轉向第1路徑15A的脈衝雷射光束通過光束掃描器16A及聚光透鏡17A射入作為加工對象物的基板40上。轉向第2路徑15B的脈衝雷射光束被折返鏡18反射,並通過光束掃描器16B及聚光透鏡17B射入作為加工對象物的另一基板40上。兩個基板40例如為印刷配線基板。The pulsed laser beam turned to the first path 15A passes through the beam scanner 16A and the condenser lens 17A and enters the substrate 40 as the object to be processed. The pulsed laser beam turned to the second path 15B is reflected by the folding mirror 18, and is incident on another substrate 40 as the object to be processed through the beam scanner 16B and the condenser lens 17B. The two substrates 40 are, for example, printed wiring substrates.

藉由脈衝雷射光束分別射入兩個基板40上進行鑽孔。事先決定在基板40的表面上應形成孔的複數個被加工點的位置。加工順序決定裝置25決定複數個被加工點的加工順序。A pulsed laser beam is incident on the two substrates 40 to drill holes. The positions of the plurality of processed points where holes should be formed on the surface of the substrate 40 are determined in advance. The processing order determining device 25 determines the processing order of a plurality of points to be processed.

作為光束掃描器16A、16B,例如使用包括一對擺動反射鏡的加爾瓦諾掃描儀。光束掃描器16A、16B根據來自控制裝置20的指令掃描雷射光束,並且分別在兩個基板40的表面上移動脈衝雷射光束的入射位置。作為聚光透鏡17A、17B,例如使用fθ透鏡。As the beam scanners 16A and 16B, for example, a Galvano scanner including a pair of swinging mirrors is used. The beam scanners 16A, 16B scan the laser beams according to instructions from the control device 20, and move the incident positions of the pulsed laser beams on the surfaces of the two substrates 40, respectively. As the condenser lenses 17A and 17B, for example, fθ lenses are used.

兩個基板40被移動機構30的可動工作台31的水平支撐面支撐。移動機構30根據來自控制裝置20的指令使兩個基板40在與支撐面平行的二維方向上移動。The two substrates 40 are supported by the horizontal supporting surface of the movable table 31 of the moving mechanism 30. The moving mechanism 30 moves the two substrates 40 in a two-dimensional direction parallel to the supporting surface in accordance with an instruction from the control device 20.

圖2A係表示在基板40的表面上定義的複數個被加工點41之分布的一例的圖。在基板40的表面上定義有複數個被加工點41。在圖2A中,用圓形記號表示被加工點41,但是實際上,在基板40的表面上未標有任何標記,而在控制裝置20中儲存有定義複數個工作點41的位置之位置資料。在圖2A中僅表示複數個被加工點41中的一部分。在被移動機構30(圖1)支撐的兩個基板40上定義的複數個被加工點41的分布相同。基板40的外形例如為長方形。在基板40的四個角上分別設置有對準標記42。FIG. 2A is a diagram showing an example of the distribution of a plurality of processed points 41 defined on the surface of the substrate 40. A plurality of processed points 41 are defined on the surface of the substrate 40. In FIG. 2A, the processed point 41 is represented by a circular mark, but in fact, there is no mark on the surface of the substrate 40, and the control device 20 stores position data defining the positions of a plurality of working points 41 . In FIG. 2A, only a part of the plurality of processed points 41 is shown. The distribution of the plurality of processed points 41 defined on the two substrates 40 supported by the moving mechanism 30 (FIG. 1) is the same. The outer shape of the substrate 40 is, for example, a rectangle. Alignment marks 42 are respectively provided on the four corners of the substrate 40.

在基板40的表面上定義有複數個掃描區域45。每一個掃描區域45的形狀為正方形,並且其大小大致等於藉由使每一個光束掃描器16A、16B(圖1)進行動作並掃描脈衝雷射光束以能夠使脈衝雷射光束射入的範圍的大小。以基板40上的所有被加工點41包括在任意掃描區域45之方式配置有複數個掃描區域45。複數個掃描區域45有部分重疊的情況,並且亦有在未分布被加工點41的區域未配置掃描區域45的情況。A plurality of scanning areas 45 are defined on the surface of the substrate 40. The shape of each scanning area 45 is square, and its size is approximately equal to the range that can be injected by the pulse laser beam by operating each beam scanner 16A, 16B (Figure 1) and scanning the pulse laser beam. size. A plurality of scanning areas 45 are arranged in such a way that all the processed points 41 on the substrate 40 are included in any scanning area 45. A plurality of scanning areas 45 may partially overlap, and there are cases where the scanning area 45 is not arranged in an area where the processed points 41 are not distributed.

藉由使一個掃描區域45向聚光透鏡17A、17B(圖1)中之一的正下方移動,並且使脈衝雷射光束依序射入該掃描區域45中的複數個被加工點41上,而進行該掃描區域45的加工。當一個掃描區域45的加工結束時,使移動機構30(圖1)進行動作而使接著要加工的掃描區域45向聚光透鏡17A、17B中之一的正下方移動。在圖2A中,用箭頭示出掃描區域45的加工順序。By moving a scanning area 45 directly below one of the condenser lenses 17A, 17B (FIG. 1), and making the pulsed laser beam incident on a plurality of processed points 41 in the scanning area 45 in sequence, The scanning area 45 is processed. When the processing of one scanning area 45 is completed, the moving mechanism 30 (FIG. 1) is operated to move the scanning area 45 to be processed next to just below one of the condenser lenses 17A and 17B. In FIG. 2A, the processing sequence of the scanning area 45 is shown by arrows.

圖2B係表示複數個被加工點41的加工順序的一例的圖。對複數個被加工點41的加工順序標有編號。藉由使光束掃描器16A、16B(圖1)進行動作並且使脈衝雷射光束按編號的順序射入複數個被加工點41上,而對一個掃描區域45進行加工。在圖2B中,用箭頭表示複數個被加工點41的加工順序。複數個被加工點41的加工順序藉由加工順序決定裝置25決定。在本說明書中,將從一個被工作點41至賦予下一個編號的被加工點41為止的直線路徑的長度簡稱為“被工作點之間的移動距離”。FIG. 2B is a diagram showing an example of the processing sequence of a plurality of to-be-processed points 41. The processing sequence of a plurality of processed points 41 is marked with a number. By operating the beam scanners 16A and 16B (FIG. 1) and making the pulse laser beam incident on a plurality of processed points 41 in the order of the numbers, one scanning area 45 is processed. In FIG. 2B, the processing sequence of a plurality of processed points 41 is indicated by arrows. The processing sequence of the plurality of processed points 41 is determined by the processing sequence determining device 25. In this specification, the length of the linear path from one work point 41 to the work point 41 assigned the next number is simply referred to as the "movement distance between work points".

圖3係表示來自雷射振盪器11(圖1)的脈衝雷射光束的輸出與光束掃描器16A、16B(圖1)的動作期間之時間關係的時序圖。在此,“光束掃描器16A、16B的動作期間”係指從使脈衝雷射光束射入之位置的移動開始至移動結束為止的時間。3 is a timing chart showing the time relationship between the output of the pulsed laser beam from the laser oscillator 11 (FIG. 1) and the operation period of the beam scanners 16A and 16B (FIG. 1). Here, the "operation period of the beam scanners 16A and 16B" refers to the time from the start of the movement of the position where the pulsed laser beam is incident to the end of the movement.

從雷射振盪器11輸出之脈衝雷射光束的脈衝的重複頻率是一定。在雷射脈衝下降之後,控制裝置20使光束掃描器16A、16B進行動作以使脈衝雷射光束的入射位置移動。在此,“脈衝雷射光束”係指藉由基於誘導發射之光增幅而脈衝輻射之光束,“雷射脈衝”係指脈衝雷射光束的每一個脈衝。當入射位置稳定為來自控制裝置20的指令位置時,光束掃描器16A、16B向控制裝置20通知移動結束。光束掃描器16A、16B的動作時間(從入射位置的移動開始至移動結束為止的時間)取決於被加工點之間的移動距離。因此,光束掃描器16A、16B的動作時間具有在一定範圍內擴展的分布。The pulse repetition frequency of the pulsed laser beam output from the laser oscillator 11 is constant. After the laser pulse falls, the control device 20 operates the beam scanners 16A and 16B to move the incident position of the pulsed laser beam. Here, "pulsed laser beam" refers to a beam irradiated by pulses based on light amplification based on induced emission, and "laser pulse" refers to each pulse of a pulsed laser beam. When the incident position stabilizes at the commanded position from the control device 20, the beam scanners 16A and 16B notify the control device 20 that the movement is completed. The operation time of the beam scanners 16A and 16B (the time from the start of the movement of the incident position to the end of the movement) depends on the movement distance between the points to be processed. Therefore, the operating time of the beam scanners 16A and 16B has a distribution that spreads within a certain range.

若將脈衝雷射光束的脈衝的重複頻率設定為與光束掃描器16A、16B的動作時間的最大值對應,則導致在多數被加工點41上,從脈衝雷射光束的入射位置的移動結束至雷射脈衝的射入為止的等待時間變長。其結果,導致加工時間變長。If the pulse repetition frequency of the pulsed laser beam is set to correspond to the maximum value of the operating time of the beam scanners 16A and 16B, it will result in the movement from the incident position of the pulsed laser beam to the end of the movement of the pulsed laser beam on most points 41 to be processed. The waiting time until the laser pulse is injected becomes longer. As a result, the processing time becomes longer.

若將脈衝雷射光束的脈衝的重複頻率設定為與光束掃描器16A、16B的動作時間的偏差的中間值對應,則發生在輸出雷射脈衝之時點光束掃描器16A、16B的動作未結束之情況。當在輸出雷射脈衝之時點光束掃描器16A、16B的動作未結束之情況下,控制裝置20控制聲光元件14(圖1)而將雷射脈衝轉向光束阻尼器19(圖1)。因此,在光束掃描器16A、16B的動作未結束之狀態下,雷射脈衝不會射入基板40。在本說明書中,將轉向光束阻尼器19的雷射脈衝稱為無效脈衝LPd。為了與無效脈衝LPd進行區別,將射入基板40上的雷射脈衝稱為有效脈衝PDe。在圖3中,對有效脈衝Pde標出相對較深的陰影線,而對無效脈衝LPd標出相對較淺的陰影線。If the pulse repetition frequency of the pulsed laser beam is set to correspond to the intermediate value of the deviation of the operating time of the beam scanners 16A, 16B, it will occur when the laser pulses are output that the operation of the spot beam scanners 16A, 16B has not ended. Condition. When the action of the spot beam scanners 16A, 16B is not finished when the laser pulse is output, the control device 20 controls the acousto-optic element 14 (FIG. 1) to turn the laser pulse to the beam damper 19 (FIG. 1). Therefore, in a state where the operation of the beam scanners 16A and 16B is not completed, the laser pulses will not enter the substrate 40. In this specification, the laser pulse turned to the beam damper 19 is referred to as an invalid pulse LPd. In order to distinguish it from the invalid pulse LPd, the laser pulse incident on the substrate 40 is referred to as an effective pulse PDe. In FIG. 3, the effective pulse Pde is marked with a relatively darker hatching, and the ineffective pulse LPd is marked with a relatively lighter hatching.

為了縮短加工時間,縮短從光束掃描器16A、16B的動作結束至雷射脈衝的輸出為止的等待時間Tw,並且減少無效脈衝LPd的個數為較佳。In order to shorten the processing time, it is preferable to shorten the waiting time Tw from the end of the operation of the beam scanners 16A and 16B to the output of the laser pulse, and to reduce the number of invalid pulses LPd.

圖4係表示由基於本實施例之加工順序決定裝置25決定加工順序,並且由控制裝置20控制雷射加工的順序的流程圖。4 is a flowchart showing the processing sequence determined by the processing sequence determining device 25 based on the present embodiment, and the laser processing sequence is controlled by the control device 20.

首先,加工順序決定裝置25根據複數個被加工點41的位置資訊來決定複數個掃描區域45的配置(步驟S1)。此時,以所有被加工點41中的每一個包括在至少一個掃描區域45中並且以掃描區域45的個數成為最小之方式,配置複數個掃描區域45。將位於複數個掃描區域45重疊之區域中的被加工點41分配於複數個掃描區域45中之一的掃描區域45。First, the processing order determining device 25 determines the arrangement of the plurality of scanning areas 45 based on the position information of the plurality of processed points 41 (step S1). At this time, a plurality of scanning areas 45 are arranged so that each of all the processed points 41 is included in at least one scanning area 45 and the number of scanning areas 45 becomes the smallest. The processed point 41 located in the area where the plurality of scan areas 45 overlap is allocated to the scan area 45 of one of the plurality of scan areas 45.

接著,加工順序決定裝置25以使可動工作台31(圖1)的移動距離成為最小之方式,決定複數個掃描區域45的訪查順序(步驟S2)。在決定掃描區域45的訪查順序時,例如,能夠適用於解決巡迴推銷員問題用的各種算法。Next, the processing order determining device 25 determines the visiting order of the plurality of scanning areas 45 so as to minimize the moving distance of the movable table 31 (FIG. 1) (step S2). When determining the order of visits in the scanning area 45, for example, various algorithms for solving the problem of traveling salesmen can be applied.

在決定了掃描區域45的訪查順序之後,藉由對每一個掃描區域45執行步驟S3、S4及S5來決定屬於掃描區域45的複數個被加工點41的加工順序。After determining the visit order of the scan area 45, the processing order of the plurality of processed points 41 belonging to the scan area 45 is determined by executing steps S3, S4, and S5 for each scan area 45.

首先,根據複數個被加工點41的位置資訊,在加工順序連續的兩個被加工點41之間的移動距離之合計成為最短之條件下,決定臨時加工順序(步驟S3)。 以下,對決定臨時加工順序之方法進行說明。First, based on the position information of a plurality of to-be-processed points 41, the temporary processing order is determined under the condition that the sum of the moving distances between the two to-be-processed points 41 that are consecutive in the processing order becomes the shortest (step S3). Hereinafter, the method of determining the temporary processing order will be described.

在以任意一個被加工點41為起點且在分別通過一次所有被加工點41中的每一個並返回起點之循環路徑的長度成為最短之條件下,決定最短之循環路徑。在決定最短之循環路徑時,例如,能夠使用於解決巡迴推銷員問題用的已知算法。作為所適用之算法,例如可舉出最近鄰法、多段法、2選定法、3選定法、Lin-Kernighan法(LK法)、ITERATRD-LK法、CHAINED-LK法、ITERATED-3選定法、CHAINED-3選定法等。在此,“最短之循環路徑”並非指通過對所有組合進行評價而獲得之最佳解,例如可以為能夠使用局部搜索算法等、在某種程度上獲得接近最佳解的解之算法所獲得之循環路徑。Under the condition that any one to-be-processed point 41 is taken as the starting point and the length of the cycle path that passes through each of all the to-be-processed points 41 once and returns to the starting point becomes the shortest condition, the shortest cycle path is determined. When determining the shortest cycle path, for example, a known algorithm used to solve the itinerant salesman problem can be used. As the applicable algorithm, for example, the nearest neighbor method, multi-stage method, 2-selection method, 3-selection method, Lin-Kernighan method (LK method), ITERATRD-LK method, CHAINED-LK method, ITERATED-3 selection method, CHAINED-3 selection method, etc. Here, the "shortest cycle path" does not mean the best solution obtained by evaluating all combinations, for example, it can be obtained by an algorithm that can use a local search algorithm to obtain a solution close to the optimal solution to some extent The cycle path.

切斷循環路徑的所有被加工點之間的路徑中的移動距離最長的路徑,將被切斷之路徑的兩端的被加工點41中之一者設為起點,將另一者設為終點。將從起點的被加工點41沿著循環路徑朝向終點時所通過的被加工點41的順序設為臨時加工順序。The path with the longest movement distance among the paths between all the processed points of the cut cycle path, one of the processed points 41 at both ends of the cut path is set as the starting point, and the other is set as the end point. The order in which the processed point 41 passes from the starting point 41 to the end point along the cycle path is set as the temporary processing order.

接著,根據臨時加工順序中的被加工點之間的移動距離之分布來決定脈衝雷射光束的脈衝的重複頻率(步驟S4)。參閱圖5A,對脈衝雷射光束的脈衝的重複頻率之決定方法進行說明。Next, the repetition frequency of the pulse of the pulsed laser beam is determined according to the distribution of the movement distance between the processed points in the temporary processing sequence (step S4). Referring to FIG. 5A, the method for determining the pulse repetition frequency of the pulsed laser beam will be described.

圖5A係表示被加工點之間的移動距離之分布的一例的直方圖。橫軸表示被加工點之間的移動距離,縱軸表示頻數。長度為L1以上且小於L2的移動距離的頻數最多。隨著移動距離從L1以上且小於L2的範圍向變長之方向和變短之方向遠離,頻數減少 控制裝置20根據與移動距離的最頻值相對應的範圍來決定脈衝的重複頻率。例如,以在雷射振盪的一個週期期間入射位置能夠移動的最大長度等於與最頻値相對應之範圍的最大值亦即長度L2之方式,決定脈衝的重複頻率。FIG. 5A is a histogram showing an example of the distribution of the movement distance between the points to be processed. The horizontal axis represents the movement distance between the processed points, and the vertical axis represents the frequency. The movement distance with a length of L1 or more and less than L2 has the most frequency. As the moving distance moves away from the range greater than L1 and less than L2 to the direction of lengthening and the direction of shortening, the frequency decreases . The control device 20 determines the pulse repetition frequency based on the range corresponding to the mode value of the moving distance. For example, the maximum length of the incident position that can be moved during one cycle of the laser oscillation is equal to the maximum value of the range corresponding to the maximum frequency, that is, the length L2, to determine the pulse repetition frequency.

在決定脈衝的重複頻率之後,以使無效脈衝LPd的個數成為最少之方式修正臨時加工順序,而決定實際加工順序(步驟S5)。After the pulse repetition frequency is determined, the temporary processing sequence is corrected to minimize the number of invalid pulses LPd, and the actual processing sequence is determined (step S5).

以下,對無效脈衝LPd的個數之求出方法進行說明。將在脈衝雷射光束的入射位置從一個雷射脈衝的輸出到下一個雷射脈衝的輸出的期間能夠移動的最長距離設為“可移動最長距離”。對被加工點之間的移動距離的每一個除以可移動最大距離所得到之商的小數點捨去取整數之值與在該被加工點之間移動時輸出之無效脈衝LPd的個數相等。將被加工點之間的移動距離的每一個除以可移動最長距離所得到之商的小數點捨去取整數。對所有被加工點之間的移動距離合計被整數化之值所得到之值與無效脈衝LPd的總數相等。Hereinafter, the method of obtaining the number of invalid pulses LPd will be described. The longest distance that can be moved from the output of one laser pulse to the output of the next laser pulse at the incident position of the pulsed laser beam is set as the "longest movable distance". The decimal point of the quotient obtained by dividing the moving distance between the processed points by the maximum movable distance is rounded to the integer value and the number of invalid pulses LPd output when moving between the processed points is equal . The decimal point of the quotient obtained by dividing each movement distance between the processed points by the longest movable distance is rounded to an integer. The sum of the moving distances between all processed points is integerized and the value obtained is equal to the total number of invalid pulses LPd.

以下,對修正臨時加工順序之方法進行說明。作為第1評價函數,使用被加工點之間的移動距離之合計愈短評價值愈變小之評價函數。作為第2評價函數,使用對所有移動距離進行合計所得到之值愈小評價值愈變小之評價函數,該進行合計所得到之值為將被加工點之間的移動距離的每一個除以可移動最長距離所得到之商的小數點捨去取整數之值。關於對臨時加工順序中的順序進行了修正的加工順序,算出第1評價函數及第2評價函數的評價值的權重平均值。以該評價值的權重平均值變小之方式,反覆對加工順序進行變更的順序,並且在評價值的權重平均值收斂到最小值之後,採用此時的加工順序作為實際加工順序。求出權重平均值時的加權可以在加權不同之條件下進行各種評估實驗,並根據其結果來決定。Hereinafter, the method of correcting the temporary processing sequence will be described. As the first evaluation function, an evaluation function is used in which the shorter the total of the movement distances between the points to be processed, the smaller the evaluation value becomes. As the second evaluation function, an evaluation function is used in which the value obtained by adding up all the moving distances becomes smaller as the value becomes smaller, and the value obtained by this totaling is divided by each of the moving distances between the points to be processed The decimal point of the quotient obtained by the longest movement can be rounded to the integer value. Regarding the processing sequence in which the sequence in the temporary processing sequence is corrected, the weighted average value of the evaluation values of the first evaluation function and the second evaluation function is calculated. The order of changing the processing order is repeated in such a way that the weighted average value of the evaluation value becomes smaller, and after the weighted average value of the evaluation value converges to the minimum value, the processing order at this time is adopted as the actual processing order. The weighting when calculating the weight average value can be carried out various evaluation experiments under different weighting conditions, and determined according to the results.

圖5B係表示對實際加工順序的移動路徑求出的被加工點之間的移動距離的頻數的直方圖。在圖5B中,用虛線表示針對臨時加工順序的移動距離求出的被加工點之間的移動距離的頻數。比移動距離的最頻值更長的移動距離的頻數與臨時加工順序中的頻數相比變少。藉此,無效脈衝LPd的個數變少。FIG. 5B is a histogram showing the frequency of the movement distance between the points to be processed obtained for the movement path of the actual processing sequence. In FIG. 5B, the frequency of the movement distance between the points to be processed calculated for the movement distance of the temporary processing sequence is indicated by a broken line. The frequency of the moving distance longer than the mode value of the moving distance is smaller than the frequency in the temporary machining sequence. This reduces the number of invalid pulses LPd.

與在實際加工順序時比移動距離的最頻值更長的移動距離的頻數變少情況對應地產生移動距離變長的部分。移動距離變長的部分的產生反映在直方圖上,並且最頻值的頻數增加。此外,在移動距離為最頻值以下的範圍內,相對短的移動距離的頻數減少,並且相對長的移動距離的頻數增加。即使移動距離在最頻值以下的範圍內變長,如果該移動距離為可移動最大距離以下,則無效脈衝LPd的個數也不會增加。因此,實際加工順序中的從起點至終點的移動路徑比臨時加工順序中的移動路徑長,但是無效脈衝LPd的個數變少。Corresponding to the decrease in the frequency of the movement distance longer than the mode value of the movement distance in the actual processing sequence, the portion where the movement distance becomes longer occurs. The occurrence of the part where the moving distance becomes longer is reflected on the histogram, and the frequency of the most frequent value increases. In addition, in the range where the moving distance is below the mode value, the frequency of the relatively short moving distance decreases, and the frequency of the relatively long moving distance increases. Even if the moving distance becomes longer in the range below the mode value, if the moving distance is below the maximum movable distance, the number of invalid pulses LPd will not increase. Therefore, the movement path from the start point to the end point in the actual processing sequence is longer than the movement path in the temporary processing sequence, but the number of invalid pulses LPd is reduced.

在決定了實際加工順序之後,在將脈衝的重複頻率設為一定的條件下,根據實際加工順序移動脈衝雷射光束的入射位置來對基板40進行雷射加工(步驟S6)。此時,脈衝雷射光束的脈衝的重複頻率設定為由移動距離的最頻值決定之值。After the actual processing sequence is determined, the pulse repetition frequency is set to a certain condition, and the incident position of the pulsed laser beam is moved according to the actual processing sequence to perform laser processing on the substrate 40 (step S6). At this time, the pulse repetition frequency of the pulsed laser beam is set to a value determined by the mode value of the moving distance.

接著,參閱圖6,對臨時加工順序的移動路徑及將其修正之實際加工順序的移動路徑的一例進行說明。Next, referring to FIG. 6, an example of the movement path of the temporary processing sequence and the movement path of the actual processing sequence to be corrected will be described.

圖6係表示在臨時加工順序及實際加工順序中的部分被加工點的加工順序的模式圖。在臨時加工順序中,例如,被加工點以A、B、C...I、J、K的順序加工。該加工順序是以如下方式確定的一例:不僅包括圖6所示的六個被加工點41,亦包括其他所有被加工點41在內,整體上移動距離成為最短。FIG. 6 is a schematic diagram showing the processing sequence of the partial processed points in the temporary processing sequence and the actual processing sequence. In the temporary processing sequence, for example, the processed points are processed in the order of A, B, C...I, J, and K. This processing sequence is an example determined in the following manner: Not only the six processed points 41 shown in FIG. 6 but also all other processed points 41 are included, the overall moving distance becomes the shortest.

由於從被加工點A至B為止和從被加工點I至J為止的移動距離比可移動最長距離短,因此在該移動期間不輸出無效脈衝LPd。由於從被加工點B至C為止和從被加工點J至K為止的移動距離比可移動最長距離長,因此在該移動期間輸出無效脈衝LPd。用實心黑色圓點記號表示輸出無效脈衝LPd之時點的脈衝雷射光束的入射位置X、Y。Since the movement distance from the processed point A to B and from the processed point I to J is shorter than the longest movable distance, the invalid pulse LPd is not output during this movement. Since the movement distance from the processed point B to C and from the processed point J to K is longer than the longest movable distance, the invalid pulse LPd is output during this movement. The solid black dots indicate the incident positions X and Y of the pulsed laser beam at the time when the invalid pulse LPd is output.

在實際加工順序中,臨時加工順序中的移動路徑ABC被修正為移動路徑AJC,並且臨時加工順序中的移動路徑IJK被修正為移動路徑IBK。實際加工順序中的移動路徑AJC與移動路徑IBK的總長度比臨時加工順序中的移動路徑ABC與移動路徑IJK的總長度長。從被加工點A到J為止、被加工點J至C為止及被加工點B至K為止的移動距離比可移動最長距離短。從被加工點I至B為止的移動距離比可移動最長距離長。因此,在該移動期間,輸出無效脈衝LPd。用實心黑色圓點記號示出輸出無效脈衝LPd之時間點的入射位置Z。In the actual processing sequence, the movement path ABC in the temporary processing sequence is corrected to the movement path AJC, and the movement path IJK in the temporary processing sequence is corrected to the movement path IBK. The total length of the moving path AJC and the moving path IBK in the actual processing sequence is longer than the total length of the moving path ABC and the moving path IJK in the temporary processing sequence. The movement distance from the processed point A to J, the processed point J to C, and the processed point B to K is shorter than the longest movable distance. The moving distance from the processed point I to B is longer than the longest distance that can be moved. Therefore, during this movement, an invalid pulse LPd is output. The incident position Z at the time point when the invalid pulse LPd is output is shown with a solid black dot mark.

在圖6所示的一例中,相對於在臨時加工順序時無效脈衝LPd的個數為2,在實際加工順序時,無效脈衝LPd的個數為1。如此,在實際加工順序中,與臨時加工順序相比入射位置的移動路徑的總長度變長,但是無效脈衝LPd的個數減少。In the example shown in FIG. 6, the number of invalid pulses LPd is 2 in the provisional processing sequence, and the number of invalid pulses LPd is 1 in the actual processing sequence. In this way, in the actual processing sequence, the total length of the movement path of the incident position is longer than that of the temporary processing sequence, but the number of invalid pulses LPd is reduced.

接著,對上述實施例的優異效果進行說明。 在上述實施例中,與以在使脈衝雷射光束的入射位置的移動路徑的長度成為最小的條件下決定的臨時加工順序進行加工時之無效脈衝的個數相比,能夠減少無效脈衝的個數。一個掃描區域45中的加工時間等於射入被加工點41上的雷射脈衝的個數與無效脈衝的個數之合計乘以雷射脈衝的重複週期所得到之值。由於射入被加工點41上的雷射脈衝的個數不變,因此隨著無效脈衝的個數變少,掃描區域45中的加工時間變短。Next, the excellent effects of the above-mentioned embodiment will be described. In the above-mentioned embodiment, the number of invalid pulses can be reduced compared with the number of invalid pulses when processing is performed in a temporary processing sequence determined under the condition that the length of the movement path of the incident position of the pulsed laser beam is minimized. number. The processing time in a scanning area 45 is equal to the value obtained by multiplying the sum of the number of laser pulses incident on the processed point 41 and the number of invalid pulses by the repetition period of the laser pulse. Since the number of laser pulses incident on the processed point 41 does not change, as the number of invalid pulses decreases, the processing time in the scanning area 45 becomes shorter.

在上述實施例中,由於能夠減少無效脈衝的個數,藉此能夠實現加工時間的縮短化。又,在上述實施例中,由於將脈衝雷射光束的脈衝的重複頻率設為一定而進行加工,因此能夠降低每一個雷射脈衝的脈衝能量的偏差,其結果,能夠提高加工品質。In the above-mentioned embodiment, since the number of invalid pulses can be reduced, the processing time can be shortened thereby. In addition, in the above-mentioned embodiment, since the pulse repetition frequency of the pulsed laser beam is set to be constant for processing, the variation of pulse energy per laser pulse can be reduced, and as a result, the processing quality can be improved.

接著,對上述實施例的變形例進行說明。 在上述實施例中,根據被加工點之間的移動距離的最頻值(圖5A)而決定脈衝的重複頻率,但是亦可以藉由其他方法來決定脈衝的重複頻率。例如,亦可以根據被加工點之間的移動距離的平均值、中位值等來決定脈衝的重複頻率。此外,亦可以根據雷射振盪器11(圖1)的特性等來決定脈衝的重複頻率。Next, a modification of the above-mentioned embodiment will be described. In the above embodiment, the pulse repetition frequency is determined according to the mode of the movement distance between the processed points (FIG. 5A), but the pulse repetition frequency can also be determined by other methods. For example, the pulse repetition frequency can also be determined based on the average value, median value, etc. of the movement distance between the processed points. In addition, the pulse repetition frequency can also be determined based on the characteristics of the laser oscillator 11 (FIG. 1).

又,在上述實施例中,當進行雷射加工時(圖4中的步驟S6),將脈衝的重複頻率設為一定,但是亦可以在保持脈衝能量的充分均勻性之範圍下,改變脈衝的重複頻率。在該情況下,根據改變脈衝的重複頻率的範圍內的最高頻率來決定可移動最長距離即可。Furthermore, in the above-mentioned embodiment, when performing laser processing (step S6 in FIG. 4), the pulse repetition frequency is set to be constant, but it is also possible to change the pulse repetition frequency while maintaining sufficient uniformity of pulse energy. repeat frequency. In this case, the longest movable distance may be determined based on the highest frequency in the range of changing the pulse repetition frequency.

在上述實施例中,在圖1中分別表示控制裝置20和加工順序決定裝置25,但是亦可以將加工順序決定裝置25之功能併入控制裝置20中。In the above embodiment, the control device 20 and the processing sequence determining device 25 are shown in FIG. 1 respectively, but the functions of the processing sequence determining device 25 may also be incorporated into the control device 20.

上述實施例僅為例示,本發明並不限定於上述實施例。例如,能夠進行各種變更、改良、組合等,對於本領域技術人員而言是顯而易見。The above-mentioned embodiments are only examples, and the present invention is not limited to the above-mentioned embodiments. For example, it is obvious to those skilled in the art that various changes, improvements, combinations, etc. can be made.

10:雷射光學系統 11:雷射振盪器 12:導光光學系統 13:孔徑 14:聲光元件 15A:第1路徑 15B:第2路徑 16A,16B:光束掃描器 17A,17B:聚光透鏡 18:折返鏡 19:光束阻尼器 20:控制裝置 25:加工順序決定裝置 30:移動機構 31:可動工作台 40:基板 41:被加工點 42:對準標記 45:掃描區域10: Laser optical system 11: Laser oscillator 12: Light guide optical system 13: Aperture 14: Acousto-optic components 15A: 1st path 15B: 2nd path 16A, 16B: beam scanner 17A, 17B: Condenser lens 18: Folding mirror 19: beam damper 20: control device 25: Processing sequence determining device 30: mobile agency 31: Movable table 40: substrate 41: processed point 42: Alignment mark 45: Scanning area

[圖1]係基於實施例之雷射加工裝置的概略圖。 [圖2]中,圖2A係表示在基板的表面上定義的複數個被加工點之分布的一例的圖,圖2B係表示複數個被加工點的加工順序的一例的圖。 [圖3]係表示來自雷射振盪器的脈衝雷射光束的輸出與光束掃描器的動作期間之間的時間關係的時序圖。 [圖4]係表示由基於本實施例之加工順序決定裝置決定加工順序,並且由控制裝置控制雷射加工的順序的流程圖。 [圖5]中,圖5A係表示被加工點之間的移動距離之分布的一例的直方圖,圖5B係表示對實際加工順序的移動路徑的被加工點之間的移動距離的頻數的直方圖。 [圖6]係表示在臨時加工順序及實際加工順序中被加工點的加工順序的模式圖。[Fig. 1] is a schematic diagram of a laser processing apparatus based on an embodiment. In [FIG. 2], FIG. 2A is a diagram showing an example of a distribution of a plurality of processed points defined on the surface of a substrate, and FIG. 2B is a diagram showing an example of a processing sequence of a plurality of processed points. Fig. 3 is a timing chart showing the time relationship between the output of the pulsed laser beam from the laser oscillator and the operation period of the beam scanner. [Fig. 4] is a flowchart showing the processing sequence is determined by the processing sequence determining device based on this embodiment, and the laser processing sequence is controlled by the control device. In [FIG. 5], FIG. 5A is a histogram showing an example of the distribution of the movement distance between the processed points, and FIG. 5B is a histogram showing the frequency of the movement distance between the processed points on the movement path of the actual processing sequence picture. [Fig. 6] is a schematic diagram showing the processing sequence of the point to be processed in the temporary processing sequence and the actual processing sequence.

Claims (6)

一種加工順序決定裝置,係藉由射入脈衝雷射光束來決定要加工的複數個被加工點的加工順序的加工順序決定裝置,其特徵為: 根據前述複數個被加工點的位置資訊,在加工順序連續的兩個被加工點之間的移動距離之合計成為最短之條件下,決定臨時加工順序, 在將脈衝雷射光束的入射位置從一雷射脈衝的輸出到下一雷射脈衝的輸出的期間能夠移動的最長距離定義為可移動最長距離時, 將前述被加工點之間的移動距離的每一個除以前述可移動最長距離所得到之商的小數點捨去取整數, 以使對所有前述被加工點之間的移動距離合計被整數化之值所得到之值變小之方式修正前述臨時加工順序而作為實際加工順序。A processing sequence determining device is a processing sequence determining device that determines the processing sequence of a plurality of processed points to be processed by injecting a pulsed laser beam, which is characterized by: According to the position information of the plurality of processed points mentioned above, the temporary processing sequence is determined under the condition that the sum of the moving distances between the two continuous processing points becomes the shortest. When the longest distance that the pulsed laser beam can move from the output of one laser pulse to the output of the next laser pulse is defined as the longest moveable distance, The decimal point of the quotient obtained by dividing each of the moving distances between the points to be processed by the longest movable distance mentioned above is rounded to an integer, The temporary processing sequence is corrected so as to reduce the value obtained by the sum of the moving distances between all the processing points to be integerized, and the processing sequence is used as the actual processing sequence. 如請求項1記載之加工順序決定裝置,其中 進一步根據前述臨時加工順序中的前述被加工點之間的移動距離之分布而決定前述可移動最長距離。Such as the processing sequence determination device described in claim 1, where The longest movable distance is determined according to the distribution of the movement distance between the processed points in the temporary processing sequence. 如請求項1或請求項2記載之加工順序決定裝置,其中 將前述移動距離之合計長度愈短評價值愈變小之評價函數設為第1評價函數, 將對所有前述移動距離合計前述被整數化之值所得到之值愈小評價值愈變小之評價函數設為第2評價函數, 修正前述臨時加工順序而求出前述實際加工順序時,變更加工順序以使前述第1評價函數與前述第2評價函數的評價值的權重平均值變小。Such as the processing sequence determination device described in claim 1 or claim 2, where Let the evaluation function in which the total length of the aforementioned travel distances become shorter as the evaluation value becomes smaller as the first evaluation function, The second evaluation function is set as the evaluation function in which the value obtained by adding up the aforementioned integerized values to all the aforementioned movement distances becomes smaller and the evaluation value becomes smaller. When the provisional processing sequence is corrected to obtain the actual processing sequence, the processing sequence is changed so that the weighted average value of the evaluation values of the first evaluation function and the second evaluation function becomes smaller. 一種雷射加工裝置,係具有: 雷射光學系統,係具有藉由掃描並輸出脈衝雷射光束,使脈衝雷射光束的入射位置向基板移動之功能;及 控制裝置,係控制前述雷射光學系統,使脈衝雷射光束射入基板,並且使入射位置移動, 前述控制裝置具備請求項1至請求項3之任一項記載之加工順序決定裝置,並根據前述加工順序決定裝置所決定的前述實際加工順序,使脈衝雷射光束射入基板的被加工點上。A laser processing device with: The laser optical system has the function of moving the incident position of the pulsed laser beam to the substrate by scanning and outputting the pulsed laser beam; and The control device controls the aforementioned laser optical system so that the pulsed laser beam is incident on the substrate and the incident position is moved, The aforementioned control device is equipped with the processing sequence determination device described in any one of claim 1 to claim 3, and according to the actual processing sequence determined by the processing sequence determination device, the pulse laser beam is incident on the processed point of the substrate . 一種雷射加工方法,其特徵為: 根據在基板上分布之複數個被加工點的位置資訊,在加工順序連續的兩個被加工點之間的移動距離之合計成為最短之條件下,決定臨時加工順序, 在將脈衝雷射光束的入射位置從一雷射脈衝的輸出到下一雷射脈衝的輸出的期間能夠移動的最長距離定義為可移動最長距離時, 將前述移動距離的每一個除以前述可移動最長距離所得到之商的小數點捨去取整數, 以使對所有前述移動距離合計被整數化之值所得到之值變小之方式修正前述臨時加工順序而作為實際加工順序, 以前述實際加工順序,在前述複數個被加工點射入脈衝雷射光束來進行加工。A laser processing method, which is characterized by: According to the position information of the multiple processed points distributed on the substrate, the temporary processing sequence is determined under the condition that the total moving distance between the two processed points in the processing sequence becomes the shortest. When the longest distance that the pulsed laser beam can move from the output of one laser pulse to the output of the next laser pulse is defined as the longest moveable distance, The decimal point of the quotient obtained by dividing each of the aforementioned movement distances by the aforementioned longest movement distance is rounded to an integer, Correct the aforementioned temporary processing sequence as the actual processing sequence so that the value obtained by the sum of all the aforementioned moving distances being integerized becomes smaller. In the foregoing actual processing sequence, a pulsed laser beam is injected into the plurality of processed points to perform processing. 如請求項5記載之雷射加工方法,其中 進一步根據前述臨時加工順序中的前述被加工點之間的移動距離之分布而決定前述可移動最長距離。Such as the laser processing method described in claim 5, where The longest movable distance is determined according to the distribution of the movement distance between the processed points in the temporary processing sequence.
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