TW202126719A - Resin composition, cured product, sealing film, and sealing structure - Google Patents

Resin composition, cured product, sealing film, and sealing structure Download PDF

Info

Publication number
TW202126719A
TW202126719A TW109141513A TW109141513A TW202126719A TW 202126719 A TW202126719 A TW 202126719A TW 109141513 A TW109141513 A TW 109141513A TW 109141513 A TW109141513 A TW 109141513A TW 202126719 A TW202126719 A TW 202126719A
Authority
TW
Taiwan
Prior art keywords
mass
resin composition
epoxy resin
inorganic filler
sealing
Prior art date
Application number
TW109141513A
Other languages
Chinese (zh)
Other versions
TWI825365B (en
Inventor
渡瀨裕介
藤本大輔
野村豐
荻原弘邦
金子知世
鳥羽正也
鈴木雅彥
Original Assignee
日商昭和電工材料股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商昭和電工材料股份有限公司 filed Critical 日商昭和電工材料股份有限公司
Publication of TW202126719A publication Critical patent/TW202126719A/en
Application granted granted Critical
Publication of TWI825365B publication Critical patent/TWI825365B/en

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/40Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
    • C08G59/42Polycarboxylic acids; Anhydrides, halides or low molecular weight esters thereof
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18Manufacture of films or sheets
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/18Oxygen-containing compounds, e.g. metal carbonyls
    • C08K3/20Oxides; Hydroxides
    • C08K3/22Oxides; Hydroxides of metals
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/0008Organic ingredients according to more than one of the "one dot" groups of C08K5/01 - C08K5/59
    • C08K5/0025Crosslinking or vulcanising agents; including accelerators
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/16Nitrogen-containing compounds
    • C08K5/34Heterocyclic compounds having nitrogen in the ring
    • C08K5/3442Heterocyclic compounds having nitrogen in the ring having two nitrogen atoms in the ring
    • C08K5/3445Five-membered rings
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L61/00Compositions of condensation polymers of aldehydes or ketones; Compositions of derivatives of such polymers
    • C08L61/04Condensation polymers of aldehydes or ketones with phenols only
    • C08L61/06Condensation polymers of aldehydes or ketones with phenols only of aldehydes with phenols
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • H01L23/295Organic, e.g. plastic containing a filler
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/18Oxygen-containing compounds, e.g. metal carbonyls
    • C08K3/20Oxides; Hydroxides
    • C08K3/22Oxides; Hydroxides of metals
    • C08K2003/2227Oxides; Hydroxides of metals of aluminium
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/005Additives being defined by their particle size in general

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Compositions Of Macromolecular Compounds (AREA)

Abstract

Provided is a resin composition containing a thermosetting component and an inorganic filler, wherein the inorganic filler includes aluminum oxide, and the content of the inorganic filler is at least 72 mass%, the total mass of the resin composition (excluding the mass of a solvent) serving as a reference.

Description

樹脂組成物、硬化物、密封用薄膜及密封結構體 Resin composition, cured product, sealing film, and sealing structure

本發明是有關一種樹脂組成物、硬化物、密封用薄膜及密封結構體。 The invention relates to a resin composition, a cured product, a sealing film, and a sealing structure.

隨著電子機器的輕薄短小化,電子零件裝置(半導體裝置等)的小型化及薄型化正在進展。正在盛行使用與半導體元件(矽晶片等半導體晶片)幾乎相同大小的半導體裝置之形態、或在半導體裝置上堆積半導體裝置之構裝形態(堆疊式封裝(package on package,PoP)),預料今後電子零件裝置的小型化及薄型化會更進一步進展。 As electronic equipment becomes lighter, thinner, shorter and smaller, the miniaturization and thinning of electronic parts and devices (semiconductor devices, etc.) is progressing. The form of semiconductor devices that are almost the same size as semiconductor elements (semiconductor wafers such as silicon wafers) or the form of packaging semiconductor devices on the semiconductor device (package on package (PoP)) is popular, and electronics are expected in the future. The miniaturization and thinning of parts and devices will further advance.

若半導體元件的微細化逐漸進展而端子數逐漸增加,則難以於半導體元件上設置全部外部連接端子(外部連接用的端子)。例如:當勉強設置外部連接端子時,端子間之間距會變狹窄,並且端子高度會降低,而難以確保構裝半導體裝置後的連接可靠性。於是,為了實現電子零件裝置的小型化及薄型化,已提出許多新的構裝方式。 If the miniaturization of semiconductor elements gradually progresses and the number of terminals gradually increases, it is difficult to provide all external connection terminals (terminals for external connection) on the semiconductor element. For example, when the external connection terminals are reluctantly installed, the distance between the terminals will become narrow and the height of the terminals will decrease, making it difficult to ensure the connection reliability after the semiconductor device is assembled. Therefore, in order to achieve miniaturization and thinning of electronic component devices, many new packaging methods have been proposed.

例如,已提出一種構裝方法,其能夠在將對半導體晶圓進行單片化而製得之半導體元件以具有適度間隔之方式進行重新配置後,使用固形或液狀的樹脂(密封樹脂)來將半導體元件密封,並於用以在半導體元件的外側將半導體元件密封之密封部分上設置外部連接端子;及,提出一種半導體裝置,其是使用該構裝方法來製作(例如參照下述專利文獻1~3)。 For example, a packaging method has been proposed, which can use solid or liquid resin (sealing resin) after re-arranging semiconductor elements obtained by singulating semiconductor wafers with appropriate intervals. The semiconductor element is sealed, and external connection terminals are provided on the sealing portion for sealing the semiconductor element on the outside of the semiconductor element; and, a semiconductor device is proposed, which is manufactured using this assembly method (for example, refer to Patent Document 1 below) ~3).

[先前技術文獻] [Prior Technical Literature]

(專利文獻) (Patent Document)

專利文獻1:日本專利第3616615公報 Patent Document 1: Japanese Patent No. 3616615

專利文獻2:日本特開2001-244372號公報 Patent Document 2: Japanese Patent Application Publication No. 2001-244372

專利文獻3:日本特開2001-127095號公報 Patent Document 3: Japanese Patent Application Publication No. 2001-127095

然而,當用以將被密封體密封之密封部(密封樹脂的硬化物)的導熱率低時,散熱性會不良。因此,低導熱率會成為裝置劣化進行、裝置起火等之原因。此時,可以考慮使被密封體上之密封部的厚度(密封厚度)薄膜化來提高散熱性。然而,像例如堆疊式封裝(PoP)這樣的封裝體形態,有將通常是分別構裝之中央處理器(CPU)與記憶體堆疊即能夠縮小構裝面積之優點,另一方面,因裝置整體的厚度增加,因此容易有散熱性會降低之疑 慮。因此,在藉由使密封部的厚度薄膜化來提高散熱性上有極限。 However, when the thermal conductivity of the sealing portion (cured material of the sealing resin) for sealing the sealed body is low, the heat dissipation performance will be poor. Therefore, low thermal conductivity may cause deterioration of the device and fire of the device. In this case, it is conceivable to make the thickness of the sealing portion (seal thickness) on the sealed body thinner to improve heat dissipation. However, a package form such as a package-on-package (PoP) has the advantage of stacking the central processing unit (CPU) and memory, which are usually packaged separately, to reduce the package area. On the other hand, due to the overall device The thickness increases, so it is easy to suspect that the heat dissipation will be reduced consider. Therefore, there is a limit in improving the heat dissipation performance by reducing the thickness of the sealing portion.

本發明是鑒於上述問題而研創,目的在於提供一種樹脂組成物及其硬化物,該樹脂組成物能夠獲得具有優異導熱率的硬化物。此外,本發明之目的在於提供一種密封用薄膜及密封結構體,該等是使用前述樹脂組成物而得。 The present invention was developed in view of the above-mentioned problems, and its object is to provide a resin composition and a cured product thereof, which can obtain a cured product having excellent thermal conductivity. In addition, an object of the present invention is to provide a sealing film and a sealing structure obtained by using the aforementioned resin composition.

習知的密封用樹脂組成物(薄膜狀環氧樹脂組成物等)的硬化物的導熱率為1.2W/m‧K左右。針對此點,本發明人發現使用一種樹脂組成物即能夠獲得具有優異導熱率的硬化物,遂完成本發明,該樹脂組成物含有熱硬化性成分及特定量的無機填充材料,該無機填充材料包含氧化鋁。 The thermal conductivity of the cured product of the conventional sealing resin composition (film-like epoxy resin composition, etc.) is about 1.2W/m·K. In response to this point, the inventor found that a cured product with excellent thermal conductivity can be obtained by using a resin composition, and completed the present invention. The resin composition contains a thermosetting component and a specific amount of inorganic filler. Contains alumina.

本發明之樹脂組成物含有熱硬化性成分及無機填充材料,並且,無機填充材料包含氧化鋁,且以排除溶劑的質量後之樹脂組成物的總質量作為基準計,無機填充材料的含量為72質量%以上。 The resin composition of the present invention contains a thermosetting component and an inorganic filler, and the inorganic filler contains alumina, and based on the total mass of the resin composition after excluding the solvent, the content of the inorganic filler is 72 Above mass%.

若藉由本發明之樹脂組成物,則能夠獲得一種具有優異導熱率的硬化物,例如,能夠獲得一種硬化物,其具有超過2.5W/m‧K的導熱率(較佳為2.7W/m‧K以上的導熱率)。只要能夠提高密封用樹脂組成物的硬化物的導熱率,則能夠提高電子零件裝置(半導體裝置等)的散熱性,而能夠抑制裝置劣化的進行、裝置起 火等,該電子零件裝置具備包含該樹脂組成物的硬化物之密封部。特別是,若藉由本發明之樹脂組成物,則能夠以經增加厚度之封裝體形態(PoP等)來提高成為欲解決的問題也就是散熱性。若藉由本發明之樹脂組成物,則能夠一面確保樹脂組成物的填埋性,一面獲得具有優異導熱率的硬化物。 With the resin composition of the present invention, a cured product with excellent thermal conductivity can be obtained. For example, a cured product can be obtained with a thermal conductivity exceeding 2.5W/m‧K (preferably 2.7W/m‧ Thermal conductivity above K). As long as the thermal conductivity of the cured product of the sealing resin composition can be improved, the heat dissipation of the electronic component device (semiconductor device, etc.) can be improved, and the progress of device degradation and device performance can be suppressed. For example, the electronic component device is provided with a sealing part containing a cured product of the resin composition. In particular, with the resin composition of the present invention, it is possible to improve heat dissipation, which is a problem to be solved, in a package form (PoP etc.) with increased thickness. According to the resin composition of the present invention, it is possible to obtain a cured product having excellent thermal conductivity while ensuring the filling property of the resin composition.

前述熱硬化性成分可包含熱硬化性樹脂。前述熱硬化性樹脂較佳是包含環氧樹脂。 The aforementioned thermosetting component may include a thermosetting resin. The aforementioned thermosetting resin preferably contains an epoxy resin.

前述熱硬化性成分可進一步包含硬化劑。前述硬化劑較佳是包含酚樹脂。 The aforementioned thermosetting component may further include a curing agent. The aforementioned hardener preferably contains a phenol resin.

前述熱硬化性成分可進一步包含硬化促進劑。前述硬化促進劑較佳是包含咪唑化合物。 The aforementioned thermosetting component may further include a hardening accelerator. The aforementioned hardening accelerator preferably contains an imidazole compound.

前述環氧樹脂包含在25℃時為液狀的環氧樹脂,且以排除溶劑的質量後之樹脂組成物的總質量作為基準計,在25℃時為液狀的環氧樹脂的含量,較佳是5質量%以上,更佳是7質量%以上。 The aforementioned epoxy resin includes an epoxy resin that is liquid at 25°C, and the content of the epoxy resin that is liquid at 25°C is based on the total mass of the resin composition after excluding the mass of the solvent. Preferably it is 5 mass% or more, and more preferably it is 7 mass% or more.

以排除溶劑的質量後之樹脂組成物的總質量作為基準計,前述無機填充材料的含量,較佳是93質量%以下,更佳是85質量%以下。 Based on the total mass of the resin composition excluding the mass of the solvent, the content of the aforementioned inorganic filler is preferably 93% by mass or less, more preferably 85% by mass or less.

前述無機填充材料的平均粒徑,較佳是0.01~25μm,更佳是0.01~10μm。 The average particle size of the aforementioned inorganic filler is preferably 0.01 to 25 μm, more preferably 0.01 to 10 μm.

前述無機填充材料中的氧化鋁的含量,較佳是50質量%以上。 The content of alumina in the aforementioned inorganic filler is preferably 50% by mass or more.

本發明之樹脂組成物可進一步含有溶劑。 The resin composition of the present invention may further contain a solvent.

本發明的硬化物為本發明的樹脂組成物的硬化物。 The cured product of the present invention is a cured product of the resin composition of the present invention.

然而,通常,半導體元件等電子零件之密封(封裝方法中的密封步驟),經常是在製造半導體裝置等電子零件裝置過程中的最後才進行。此時,構裝方法是對將電子零件密封而製得之密封結構體(密封成形物),實施形成線路及外部連接端子之步驟,該線路是用以配置外部連接端子。 However, generally, the sealing of electronic parts such as semiconductor elements (the sealing step in the packaging method) is often performed at the end of the process of manufacturing electronic parts such as semiconductor devices. At this time, the assembling method is to implement a step of forming a circuit and an external connection terminal on a sealed structure (sealed molded article) made by sealing the electronic component, and the circuit is used to arrange the external connection terminal.

習知的構裝方法,有時是將複數個電子零件(半導體元件等)密封來獲得密封結構體後再將該密封結構體切割來獲得複數個電子零件裝置(半導體裝置等)。此時,要進行重新配置的電子零件越多,則能夠以一次步驟來製作的電子零件裝置會越增加。於是,正在進行使密封結構體變大之研究。目前有下述傾向,例如:為了將半導體製造裝置用於形成線路,而將密封結構體成形為晶圓形狀,並進行晶圓形狀的大直徑化。並且,為了能夠進行更大尺寸化且能夠使用較半導體製造裝置更便宜的印刷線路板製造裝置等,而正在研究密封結構體的面板化。 In the conventional assembly method, a plurality of electronic components (semiconductor elements, etc.) are sometimes sealed to obtain a sealed structure, and then the sealed structure is cut to obtain a plurality of electronic component devices (semiconductor devices, etc.). At this time, the more electronic components to be reconfigured, the more electronic component devices that can be manufactured in one step. Therefore, research is underway to make the sealing structure larger. At present, there is a tendency that, for example, in order to use a semiconductor manufacturing device for wiring formation, a sealing structure is formed into a wafer shape, and the diameter of the wafer shape is increased. In addition, in order to be able to increase the size and use a printed wiring board manufacturing apparatus that is cheaper than a semiconductor manufacturing apparatus, etc., research is being conducted on panelization of the sealed structure.

將電子零件密封時,有時是使用塑模成形,其是以模具來對固形或液狀的樹脂密封材料進行成形。有時是使用例如轉注成形,其是使丸(pellet)狀的樹脂密封材料熔融,並使樹脂流入模具內來密封。然而,轉注成形由於是使熔融的樹脂流入來進行成形,故當欲將 大面積密封時,有產生未填充部之可能性。於是,近年來,正開始使用壓縮成形,其是預先將樹脂密封材料供給至模具或被密封體後再進行成形。壓縮成形由於是將樹脂密封材料直接供給至模具或被密封體,故有即使是將大面積密封仍不容易產生未填充部之優點。 When electronic parts are sealed, a mold is sometimes used for molding, which uses a mold to mold a solid or liquid resin sealing material. For example, transfer molding is sometimes used, which melts a pellet-shaped resin sealing material and causes the resin to flow into a mold for sealing. However, in transfer molding, molten resin is poured into the molding process. Therefore, it is necessary to When sealing a large area, there is a possibility of unfilled parts. Therefore, in recent years, compression molding has begun to be used in which a resin sealing material is supplied to a mold or a sealed body before molding. Since compression molding is to supply the resin sealing material directly to the mold or the sealed body, it has the advantage that even if a large area is sealed, an unfilled part is not easily generated.

壓縮成形與轉注成形同樣是使用固形或液狀的樹脂密封材料。然而,當被密封體大型化時,液狀的樹脂密封材料有時會發生液體流動等而難以均勻供給至被密封體上。此外,由於必須將樹脂均勻供給至被密封體上,故固形的樹脂密封材料有時不是使用習知的丸狀的樹脂,而是使用顆粒或粉體的樹脂密封材料。然而,顆粒或粉體的樹脂密封材料難以將樹脂密封材料均勻供給至模具或被密封體上,並且,由於為顆粒或粉體,故樹脂密封材料會成為起塵源,而有會污染裝置或無塵室之疑慮。 Compression molding and transfer molding use solid or liquid resin sealing materials. However, when the body to be sealed increases in size, the liquid resin sealing material may cause liquid flow or the like, and it may be difficult to uniformly supply the body to be sealed. In addition, since the resin must be uniformly supplied to the body to be sealed, a solid resin sealing material may not be a conventional pellet-shaped resin, but a pellet or powder resin sealing material may be used. However, particle or powder resin sealing material is difficult to uniformly supply the resin sealing material to the mold or the to-be-sealed body, and because it is particles or powder, the resin sealing material can become a source of dust, which may contaminate the device or Doubts about clean rooms.

此外,塑模成形由於是在模具內對樹脂進行成形,故使密封結構體大型化時,必須使模具大型化。然而,使模具大型化時因要求高模具精度,因此技術面上的難易度會提高,並且模具的製造成本會大幅增加。 In addition, since the mold molding is to mold the resin in the mold, it is necessary to increase the size of the mold when increasing the size of the sealing structure. However, when the mold is enlarged, high mold accuracy is required, so the technical difficulty will increase, and the manufacturing cost of the mold will increase significantly.

相對地,本發明之樹脂組成物可製作成用以將被密封體密封之密封用薄膜,而為薄膜狀。本發明之密封用薄膜包含本發明的樹脂組成物。此時,能夠將樹脂均勻供給至被密封體上並減少起塵。此外,能夠獲得一種填埋能力,其不僅能夠藉由塑模成形來密封,且亦 能夠藉由無需模具(高壓力用之模具等)之成形方法(積層、加壓等)來密封。 On the other hand, the resin composition of the present invention can be made into a film for sealing for sealing a body to be sealed, and is in the form of a film. The sealing film of the present invention contains the resin composition of the present invention. In this case, the resin can be uniformly supplied to the sealed body and dust generation can be reduced. In addition, a landfill capability can be obtained, which can not only be sealed by plastic molding, but also It can be sealed by a molding method (laminating, pressurizing, etc.) that does not require a mold (a mold for high pressure, etc.).

本發明之密封用薄膜中,溶劑的含量以0.2~1.5質量%為佳。溶劑(有機溶劑等)的含量越多,則對將被密封體(例如半導體元件等電子零件)填埋很重要的薄膜狀的樹脂組成物的最低熔融黏度會越降低。我們認為其原因應為:溶劑會提高薄膜狀的樹脂組成物的流動性。此外,適度量的溶劑會對薄膜狀的樹脂組成物賦予黏性,而容易防止從薄膜狀的支撐體剝離、薄膜狀的樹脂組成物本身破裂等。在溶劑的含量為0.2~1.5質量%時,此等效果容易在不產生其它不良情形之情形下發揮到最大。 In the sealing film of the present invention, the content of the solvent is preferably 0.2 to 1.5% by mass. The higher the content of the solvent (organic solvent, etc.), the lower the minimum melt viscosity of the film-like resin composition that is important for filling the sealed body (for example, electronic parts such as semiconductor elements). We believe that the reason should be that the solvent improves the fluidity of the film-like resin composition. In addition, an appropriate amount of solvent imparts viscosity to the film-like resin composition, and it is easy to prevent peeling from the film-like support and the film-like resin composition itself from cracking. When the content of the solvent is 0.2~1.5% by mass, these effects are likely to be maximized without causing other undesirable situations.

本發明的密封用薄膜的厚度以20~250μm為佳。 The thickness of the sealing film of the present invention is preferably 20 to 250 μm.

本發明的密封結構體,具備被密封體與密封部,該密封部將該被密封體密封,並且,前述密封部包含本發明的樹脂組成物的硬化物。前述被密封體可為電子零件。 The sealing structure of the present invention includes a body to be sealed and a sealing part that seals the body to be sealed, and the sealing part includes a cured product of the resin composition of the present invention. The aforementioned body to be sealed may be an electronic component.

根據本發明,能夠提供一種樹脂組成物及其硬化物,該樹脂組成物能夠獲得具有優異導熱率的硬化物。此外,根據本發明,能夠提供一種密封用薄膜及密封結構體,該等是使用前述樹脂組成物而得。 According to the present invention, it is possible to provide a resin composition and a cured product thereof, which can obtain a cured product having excellent thermal conductivity. In addition, according to the present invention, it is possible to provide a sealing film and a sealing structure obtained by using the aforementioned resin composition.

1:支撐體 1: Support

2:密封用薄膜 2: Film for sealing

2a:硬化物 2a: Hardened object

10:附有支撐體之密封用薄膜 10: Sealing film with supporting body

20:半導體元件 20: Semiconductor components

30:基板 30: substrate

40:暫時固定材料 40: Temporarily fix the material

50:不銹鋼板 50: stainless steel plate

60:7.3mm見方矽晶片 60: 7.3mm square silicon wafer

70:3mm見方矽晶片 70: 3mm square silicon chip

第1圖是用以說明密封結構體的製造方法的一實施形態的概略剖面圖。 Fig. 1 is a schematic cross-sectional view for explaining one embodiment of a method of manufacturing a sealing structure.

第2圖是顯示用於在實施例中評估填埋性之矽晶片的配置例的圖。 FIG. 2 is a diagram showing an example of the arrangement of silicon wafers used in the evaluation of the buried properties in the embodiment.

本說明書中,使用「~」來表示的數值範圍,是表示包含「~」前後所記載的數值來分別作為最小值及最大值之範圍。在本說明書中分階段記載的數值範圍中,某個階段的數值範圍的上限值或下限值,可置換為其它階段的數值範圍的上限值或下限值。在本說明書中所記載的數值範圍中,該數值範圍的上限值或下限值,亦可置換為實施例中所揭示之值。所謂「A或B」,只要包含A及B中之任一方即可,亦可包含A及B雙方。本說明書中所例示之材料,只要未特別說明,即可單獨使用1種,亦可併用2種以上。本說明書中,組成物中的各成分的含量,當組成物中存在複數種相當於各成分的物質時,只要未特別說明,即是意指組成物中存在的該複數種物質的合計量。 In this manual, the numerical range represented by "~" means the range that includes the numerical values before and after "~" as the minimum and maximum values, respectively. In the numerical ranges described in stages in this specification, the upper limit or lower limit of the numerical range of a certain stage can be replaced with the upper limit or lower limit of the numerical range of another stage. In the numerical range described in this specification, the upper limit or lower limit of the numerical range may be replaced with the value disclosed in the examples. The so-called "A or B", as long as it includes any one of A and B, and may include both A and B. The materials exemplified in this specification may be used alone, or two or more of them may be used in combination, unless otherwise specified. In this specification, the content of each component in the composition means the total amount of the plurality of substances present in the composition when there are multiple substances corresponding to each component in the composition, unless otherwise specified.

「液狀環氧樹脂」是在25℃時為液狀的環氧樹脂。所謂「在25℃時為液狀」,是指使用E型黏度計來測得之在25℃時的黏度為400Pa‧s以下。 "Liquid epoxy resin" is an epoxy resin that is liquid at 25°C. The so-called "liquid at 25°C" means that the viscosity at 25°C measured with an E-type viscometer is below 400 Pa‧s.

以下說明本發明的一實施形態。 Hereinafter, an embodiment of the present invention will be described.

<樹脂組成物和硬化物> <Resin composition and hardened material>

本實施形態的樹脂組成物,含有熱硬化性成分及無機填充材料。熱硬化性成分,可舉例如:(A)熱硬化性樹脂(排除相當於硬化劑之化合物)、(B)硬化劑、(C)硬化促進劑等。熱硬化性成分可在不包含硬化劑及/或硬化促進劑之情形下包含熱硬化性樹脂。本實施形態的樹脂組成物除了熱硬化性成分以外,亦含有(D)無機填充材料,(D)無機填充材料包含氧化鋁。本實施形態的樹脂組成物可為清漆狀,亦可為薄膜狀(密封用薄膜)。本實施形態的硬化物為本實施形態的樹脂組成物的硬化物。 The resin composition of this embodiment contains a thermosetting component and an inorganic filler. Examples of thermosetting components include (A) thermosetting resins (excluding compounds equivalent to curing agents), (B) curing agents, (C) curing accelerators, and the like. The thermosetting component may contain a thermosetting resin without containing a curing agent and/or a curing accelerator. In addition to the thermosetting component, the resin composition of this embodiment also contains (D) an inorganic filler, and (D) the inorganic filler contains alumina. The resin composition of this embodiment may be in the form of a varnish or in the form of a film (film for sealing). The cured product of this embodiment is a cured product of the resin composition of this embodiment.

(熱硬化性成分) (Thermosetting component)

[(A)成分:熱硬化性樹脂] [Component (A): Thermosetting resin]

作為熱硬化性樹脂,可舉例如:環氧樹脂、苯氧樹脂、氰酸酯樹脂、熱硬化性聚醯亞胺、三聚氰胺樹脂、尿素樹脂、不飽和聚酯、醇酸樹脂、聚胺酯(polyurethane)等。從容易獲得具有優異導熱率的硬化物之觀點來看,作為熱硬化性樹脂,以環氧樹脂為佳。作為環氧樹脂,能夠使用從由在25℃時為液狀的環氧樹脂及在25℃時不為液狀的環氧樹脂所組成之群組中選出的至少一種。 Examples of thermosetting resins include epoxy resins, phenoxy resins, cyanate ester resins, thermosetting polyimides, melamine resins, urea resins, unsaturated polyesters, alkyd resins, and polyurethanes. Wait. From the standpoint of easily obtaining a cured product with excellent thermal conductivity, as the thermosetting resin, epoxy resin is preferred. As the epoxy resin, at least one selected from the group consisting of an epoxy resin that is liquid at 25°C and an epoxy resin that is not liquid at 25°C can be used.

環氧樹脂,只要是在一分子中具有2個以上的縮水甘油基之樹脂,則能夠無特別限制地使用。作為環氧樹脂,可舉例如:雙酚A型環氧樹脂、雙酚AP型環 氧樹脂、雙酚AF型環氧樹脂、雙酚B型環氧樹脂、雙酚BP型環氧樹脂、雙酚C型環氧樹脂、雙酚E型環氧樹脂、雙酚F型環氧樹脂、雙酚G型環氧樹脂、雙酚M型環氧樹脂、雙酚S型環氧樹脂(己二醇雙酚S二縮水甘油基醚等)、雙酚P型環氧樹脂、雙酚PH型環氧樹脂、雙酚TMC型環氧樹脂、雙酚Z型環氧樹脂、酚類酚醛清漆型環氧樹脂(鄰甲酚酚醛清漆型環氧樹脂等)、聯苯型環氧樹脂、萘型環氧樹脂、雙環戊二烯型環氧樹脂、聯二甲苯酚型環氧樹脂(聯二甲苯酚二縮水甘油基醚等)、氫化雙酚A型環氧樹脂(氫化雙酚A縮水甘油基醚等)、此等樹脂之二元酸改質二縮水甘油基醚型環氧樹脂、脂肪族環氧樹脂等。環氧樹脂可單獨使用1種,亦可併用2種以上。 The epoxy resin can be used without particular limitation as long as it is a resin having two or more glycidyl groups in one molecule. As the epoxy resin, for example, bisphenol A type epoxy resin, bisphenol AP type ring Oxygen resin, bisphenol AF type epoxy resin, bisphenol B type epoxy resin, bisphenol BP type epoxy resin, bisphenol C type epoxy resin, bisphenol E type epoxy resin, bisphenol F type epoxy resin , Bisphenol G type epoxy resin, bisphenol M type epoxy resin, bisphenol S type epoxy resin (hexylene glycol bisphenol S diglycidyl ether, etc.), bisphenol P type epoxy resin, bisphenol PH Type epoxy resin, bisphenol TMC type epoxy resin, bisphenol Z type epoxy resin, phenol novolak type epoxy resin (o-cresol novolak type epoxy resin, etc.), biphenyl type epoxy resin, naphthalene Type epoxy resin, dicyclopentadiene type epoxy resin, dixylenol type epoxy resin (dixylenol diglycidyl ether, etc.), hydrogenated bisphenol A type epoxy resin (hydrogenated bisphenol A glycidyl Diglycidyl ether type epoxy resin, aliphatic epoxy resin, etc. The epoxy resin may be used individually by 1 type, and may use 2 or more types together.

作為液狀環氧樹脂,可舉例如:雙酚A型之縮水甘油基醚、雙酚AD型之縮水甘油基醚、雙酚S型之縮水甘油基醚、雙酚F型之縮水甘油基醚、氫化雙酚A型之縮水甘油基醚、環氧乙烷加成物雙酚A型之縮水甘油基醚、環氧丙烷加成物雙酚A型之縮水甘油基醚、萘樹脂之縮水甘油基醚、三官能型或四官能型之縮水甘油胺等。 Examples of liquid epoxy resins include: bisphenol A type glycidyl ether, bisphenol AD type glycidyl ether, bisphenol S type glycidyl ether, and bisphenol F type glycidyl ether , Hydrogenated bisphenol A type glycidyl ether, ethylene oxide adduct bisphenol A type glycidyl ether, propylene oxide adduct bisphenol A type glycidyl ether, naphthalene resin glycidyl ether Base ether, trifunctional or tetrafunctional glycidylamine, etc.

作為市售之環氧樹脂,可舉例如:DIC股份有限公司製之「EXA-4700(商品名,以下相同)」(四官能萘型環氧樹脂)、「EPICLON HP-4032」及「EXA-4750」(含萘骨架多官能固形環氧樹脂)、日本 化藥股份有限公司製之「NC-7000」(含萘骨架多官能固形環氧樹脂)等萘型環氧樹脂;日本化藥股份有限公司製之「EPPN-502H」(參酚環氧樹脂)等酚類與具有酚性羥基之芳香族醛類之縮合物之環氧化物(參酚型環氧樹脂);DIC股份有限公司製之「EPICLON HP-7200H」(含雙環戊二烯骨架多官能固形環氧樹脂)等雙環戊二烯芳烷基型環氧樹脂;日本化藥股份有限公司製之「NC-3000H」(含聯苯骨架多官能固形環氧樹脂)等聯苯芳烷基型環氧樹脂;DIC股份有限公司製之「EPICLON N-660」、「EPICLON N-690」、「EPICLON N-740」(苯酚酚醛清漆型環氧樹脂)及「N500P-1」(鄰甲酚酚醛清漆型環氧樹脂)、日本化藥股份有限公司製之「EOCN-104S」等酚醛清漆型環氧樹脂;日產化學工業股份有限公司製之「TEPIC」等參(2,3-環氧基丙基)異氰脲酸酯;DIC股份有限公司製之「EPICLON 860」、「EPICLON 900-IM」、「EPICLON EXA-4816」及「EPICLON EXA-4822」、Asahi CIBA股份有限公司製之「ARALDITE AER280」、東都化成股份有限公司(新日鐵住金化學股份有限公司)製之「Epotohto YD-134」、「YD-8125」及「YDF8170」、Japan Epoxy Resins股份有限公司(三菱化學股份有限公司)製之「jER834」、「jER872」、「jER807」、「jER815」、「jER825」、「jER827」、 「jER828」、「jER1001」、「jER1004」、「jER1007」及「jER1009」、住友化學股份有限公司製之「ELA-134」、DOW Chemical公司製之「DER-330」、「DER-301」及「DER-361」等雙酚A型環氧樹脂;Japan Epoxy Resins股份有限公司(三菱化學股份有限公司)製之「jER806」等雙酚F型環氧樹脂;Nagase ChemteX股份有限公司製之「Denacol DLC301」等脂肪族環氧樹脂等。此等環氧樹脂可單獨使用1種,亦可併用2種以上。 Examples of commercially available epoxy resins include "EXA-4700 (trade name, the same hereinafter)" (tetrafunctional naphthalene type epoxy resin) manufactured by DIC Co., Ltd., "EPICLON HP-4032" and "EXA- 4750'' (multifunctional solid epoxy resin containing naphthalene skeleton), Japan Naphthalene type epoxy resins such as "NC-7000" (multifunctional solid epoxy resin containing naphthalene skeleton) manufactured by Kayaku Pharmaceutical Co., Ltd.; "EPPN-502H" (ginsengphenol epoxy resin) manufactured by Nippon Kayaku Co., Ltd. The epoxide of the condensate of other phenols and aromatic aldehydes with phenolic hydroxyl groups (phenol epoxy resin); "EPICLON HP-7200H" manufactured by DIC Co., Ltd. (containing dicyclopentadiene skeleton multifunctional Solid epoxy resin) and other dicyclopentadiene aralkyl type epoxy resin; Nippon Kayaku Co., Ltd. "NC-3000H" (multifunctional solid epoxy resin containing biphenyl skeleton) and other biphenyl aralkyl type epoxy resin Epoxy resin; "EPICLON N-660", "EPICLON N-690", "EPICLON N-740" (phenol novolak type epoxy resin) and "N500P-1" (ortho-cresol phenolic resin) manufactured by DIC Co., Ltd. Varnish-type epoxy resin), novolac-type epoxy resin such as "EOCN-104S" manufactured by Nippon Kayaku Co., Ltd.; "TEPIC" and other ginseng (2,3-epoxypropane Base) isocyanurate; "EPICLON 860", "EPICLON 900-IM", "EPICLON EXA-4816" and "EPICLON EXA-4822" manufactured by DIC Co., Ltd., "ARALDITE AER280" manufactured by Asahi CIBA Co., Ltd. "Epotohto YD-134", "YD-8125" and "YDF8170" manufactured by Totoh Chemical Co., Ltd. (Nippon Steel & Sumikin Chemical Co., Ltd.), manufactured by Japan Epoxy Resins Co., Ltd. (Mitsubishi Chemical Co., Ltd.) "JER834", "jER872", "jER807", "jER815", "jER825", "jER827", "JER828", "jER1001", "jER1004", "jER1007" and "jER1009", "ELA-134" manufactured by Sumitomo Chemical Co., Ltd., "DER-330", "DER-301" manufactured by DOW Chemical, and Bisphenol A type epoxy resin such as "DER-361"; Bisphenol F type epoxy resin such as "jER806" manufactured by Japan Epoxy Resins Co., Ltd. (Mitsubishi Chemical Co., Ltd.); "Denacol" manufactured by Nagase ChemteX Co., Ltd. Aliphatic epoxy resins such as DLC301". These epoxy resins may be used individually by 1 type, and may use 2 or more types together.

從容易獲得優異流動性之觀點來看,以排除溶劑的質量後之樹脂組成物的總質量作為基準計,熱硬化性樹脂的含量,較佳是1質量%以上,更佳是3質量%以上,進一步較佳是4質量%以上,特佳是4質量%以上,極佳是5質量%以上,非常佳是10質量%以上,再進一步更佳是15質量%以上。從容易抑制薄膜表面發生破裂及龜裂之觀點來看,以排除溶劑的質量後之樹脂組成物的總質量作為基準計,熱硬化性樹脂的含量,較佳是30質量%以下,更佳是25質量%以下,進一步較佳是20質量%以下。 From the viewpoint of easy to obtain excellent fluidity, the content of the thermosetting resin is preferably 1% by mass or more, more preferably 3% by mass or more based on the total mass of the resin composition after excluding the mass of the solvent , Further preferably 4% by mass or more, particularly preferably 4% by mass or more, very preferably 5% by mass or more, very preferably 10% by mass or more, and still more preferably 15% by mass or more. From the viewpoint of easily suppressing cracks and cracks on the film surface, the content of the thermosetting resin is preferably 30% by mass or less, more preferably, based on the total mass of the resin composition after excluding the mass of the solvent 25% by mass or less, more preferably 20% by mass or less.

當樹脂組成物為含有環氧樹脂之環氧樹脂組成物時,從容易獲得具有優異導熱率的硬化物之觀點來看,以熱硬化性樹脂的總質量作為基準計,環氧樹脂的含量,較佳是50質量%以上,更佳是80質量%以上,進 一步較佳是90質量%以上。以熱硬化性樹脂的總質量作為基準計,環氧樹脂的含量亦可為100質量%。 When the resin composition is an epoxy resin composition containing epoxy resin, from the viewpoint of easily obtaining a cured product with excellent thermal conductivity, the content of the epoxy resin is based on the total mass of the thermosetting resin. It is preferably 50% by mass or more, more preferably 80% by mass or more, and One step is preferably 90% by mass or more. Based on the total mass of the thermosetting resin, the content of the epoxy resin may be 100% by mass.

從容易抑制薄膜表面發生破裂及龜裂之觀點來看,以排除溶劑的質量後之樹脂組成物的總質量作為基準計,液狀環氧樹脂的含量,較佳是0.5質量%以上,更佳是1質量%以上,以3質量%以上更佳,以5質量%以上特佳,以7質量%以上極佳,以9質量%以上非常佳。從容易抑制薄膜之黏性過高之觀點及容易抑制熔邊之觀點來看,以排除溶劑的質量後之樹脂組成物的總質量作為基準計,液狀環氧樹脂的含量,較佳是20質量%以下,更佳是15質量%以下,進一步較佳是13質量%以下。 From the viewpoint of easily suppressing the occurrence of cracks and cracks on the film surface, the content of the liquid epoxy resin is preferably 0.5% by mass or more based on the total mass of the resin composition after excluding the mass of the solvent, and more preferably It is 1 mass% or more, more preferably 3 mass% or more, particularly preferably 5 mass% or more, extremely preferably 7 mass% or more, and very preferably 9 mass% or more. From the viewpoint of easily suppressing the excessively high viscosity of the film and the viewpoint of easily suppressing the fusion edge, the content of the liquid epoxy resin is preferably 20 based on the total mass of the resin composition after excluding the mass of the solvent. % By mass or less, more preferably 15% by mass or less, and still more preferably 13% by mass or less.

從容易抑制薄膜表面發生破裂及龜裂之觀點來看,以熱硬化性樹脂的總質量作為基準計,液狀環氧樹脂的含量,較佳是20質量%以上,更佳是30質量%以上,進一步較佳是50質量%以上。從容易抑制薄膜的黏性過高之觀點及容易抑制熔邊之觀點來看,以熱硬化性樹脂的總質量作為基準計,液狀環氧樹脂的含量,較佳是95質量%以下,更佳是90質量%以下,進一步較佳是80質量%以下。以熱硬化性樹脂的總質量作為基準計,液狀環氧樹脂的含量亦可為100質量%。 From the viewpoint of easily suppressing cracks and cracks on the film surface, the content of the liquid epoxy resin based on the total mass of the thermosetting resin is preferably 20% by mass or more, more preferably 30% by mass or more , More preferably 50% by mass or more. From the viewpoint of easily suppressing the excessively high viscosity of the film and the viewpoint of easily suppressing the fusion edge, the content of the liquid epoxy resin is preferably 95% by mass or less based on the total mass of the thermosetting resin, and more It is preferably 90% by mass or less, and more preferably 80% by mass or less. Based on the total mass of the thermosetting resin, the content of the liquid epoxy resin may be 100% by mass.

當樹脂組成物含有(A)成分(環氧樹脂等)、(B)成分、(C)成分及(D)成分時,從容易抑制薄膜表面發生破裂及龜裂之觀點來看,以(A)~(D)成分的總質 量作為基準計,液狀環氧樹脂的含量,較佳是0.5質量%以上,更佳是1質量%以上,進一步較佳是3質量%以上,特佳是5質量%以上,極佳是7質量%以上,非常佳是9質量%以上。從容易抑制薄膜的黏性過高之觀點及容易抑制熔邊之觀點來看,以(A)~(D)成分的總質量作為基準計,液狀環氧樹脂的含量,較佳是20質量%以下,更佳是15質量%以下,進一步較佳是13質量%以下。 When the resin composition contains (A) component (epoxy resin, etc.), (B) component, (C) component and (D) component, from the viewpoint of easily suppressing cracks and cracks on the film surface, (A) )~(D) Total quality of ingredients As a reference, the content of the liquid epoxy resin is preferably 0.5% by mass or more, more preferably 1% by mass or more, still more preferably 3% by mass or more, particularly preferably 5% by mass or more, and extremely preferably 7 Mass% or more, very preferably 9 mass% or more. From the viewpoint of easily suppressing the excessively high viscosity of the film and the viewpoint of easily suppressing the fusion edge, the content of the liquid epoxy resin is preferably 20 mass based on the total mass of the components (A) to (D) % Or less, more preferably 15% by mass or less, still more preferably 13% by mass or less.

[(B)成分:硬化劑] [(B) Ingredient: Hardener]

作為硬化劑,並無特別限定,可舉例如酚系硬化劑(酚樹脂等)、酸酐系硬化劑、活性酯系硬化劑、氰酸酯系硬化劑等。當(A)成分包含環氧樹脂時,(B)硬化劑只要為在1分子中具有2個以上會與縮水甘油基進行反應的官能基之化合物,則能夠無特別限制地使用。這樣的硬化劑可舉例如:酚樹脂、酸酐等。從容易獲得具有優異導熱率的硬化物之觀點來看,作為硬化劑,較佳是酚樹脂。硬化劑可單獨使用1種,亦可併用2種以上。 The curing agent is not particularly limited, and examples thereof include phenolic curing agents (phenol resins, etc.), acid anhydride curing agents, active ester curing agents, cyanate ester curing agents, and the like. When the (A) component contains an epoxy resin, the (B) curing agent can be used without particular limitation as long as it is a compound having two or more functional groups that react with glycidyl groups in one molecule. Examples of such hardeners include phenol resins and acid anhydrides. From the viewpoint of easily obtaining a cured product having excellent thermal conductivity, the curing agent is preferably a phenol resin. The curing agent may be used singly, or two or more of them may be used in combination.

作為酚樹脂,只要為在1分子中具有2個以上酚性羥基之樹脂,則無特別限制,能夠使用習知的酚樹脂。酚樹脂可舉例如:以酸性觸媒來使苯酚類及/或萘酚類與醛類進行縮合或共縮合而得之樹脂、聯苯骨架型酚樹脂、對二甲苯改質酚樹脂、間苯二甲基-對苯二甲基改質酚樹脂、三聚氰胺改質酚樹脂、萜烯改質酚樹脂、雙環戊二烯改質酚樹脂、環戊二烯改質酚樹脂、多環芳香 環改質酚樹脂、苯二甲基改質萘酚樹脂等。作為酚類,可舉例如:苯酚、甲酚、二甲酚、間苯二酚、兒茶酚、雙酚A、雙酚F等。作為萘酚類,可舉例如:α-萘酚、β-萘酚、二羥基萘等。作為醛類,可舉例如:甲醛、乙醛、丙醛、苯甲醛、柳醛等。 The phenol resin is not particularly limited as long as it has two or more phenolic hydroxyl groups in one molecule, and conventional phenol resins can be used. Examples of phenol resins include: resins obtained by condensation or co-condensation of phenols and/or naphthols and aldehydes using acidic catalysts, biphenyl skeleton type phenol resins, p-xylene modified phenol resins, and m-benzene Dimethyl-p-xylylene modified phenol resin, melamine modified phenol resin, terpene modified phenol resin, dicyclopentadiene modified phenol resin, cyclopentadiene modified phenol resin, polycyclic aromatic Cyclo-modified phenol resin, xylylene-modified naphthol resin, etc. Examples of phenols include phenol, cresol, xylenol, resorcinol, catechol, bisphenol A, and bisphenol F. Examples of naphthols include α-naphthol, β-naphthol, dihydroxynaphthalene, and the like. Examples of aldehydes include formaldehyde, acetaldehyde, propionaldehyde, benzaldehyde, and salicaldehyde.

作為市售之酚樹脂,可舉例如:DIC股份有限公司製之「PHENOLITE LF2882」、「PHENOLITE LF2822」、「PHENOLITE TD-2090」、「PHENOLITE TD-2149」、「PHENOLITE VH-4150」及「PHENOLITE VH4170」、三井化學股份有限公司製之「XLC-LL」及「XLC-4L」、新日鐵住金化學股份有限公司製之「SN-100」、「SN-300」、「SN-395」及「SN-400」、AIR WATER股份有限公司製之「SK Resin HE910」、旭有機材工業股份有限公司製之「PAPS-PN2」(分子量分布聚集型酚醛清漆樹脂)、群榮化學工業股份有限公司製之「ELP40」等。 Examples of commercially available phenol resins include "PHENOLITE LF2882", "PHENOLITE LF2822", "PHENOLITE TD-2090", "PHENOLITE TD-2149", "PHENOLITE VH-4150" and "PHENOLITE manufactured by DIC Co., Ltd. VH4170", "XLC-LL" and "XLC-4L" manufactured by Mitsui Chemicals Co., Ltd., "SN-100", "SN-300", "SN-395" manufactured by Nippon Steel & Sumikin Chemical Co., Ltd. and "SN-400", "SK Resin HE910" made by Air Water Co., Ltd., "PAPS-PN2" (molecular weight distribution aggregation type novolak resin) made by Asahi Organic Materials Industry Co., Ltd., Qunrong Chemical Industry Co., Ltd. "ELP40" and so on.

從熱硬化性樹脂的硬化性優異之觀點來看,以排除溶劑的質量後之樹脂組成物的總質量作為基準計,硬化劑的含量,較佳是1~20質量%,更佳是2~15質量%,進一步較佳是3~10質量%。 From the viewpoint of excellent curability of the thermosetting resin, based on the total mass of the resin composition after excluding the mass of the solvent, the content of the hardener is preferably 1-20% by mass, more preferably 2~ 15% by mass, more preferably 3-10% by mass.

作為環氧樹脂與硬化劑(酚樹脂等)之調配比例,環氧樹脂的縮水甘油基的當量(環氧當量)與硬化劑中的會與縮水甘油基進行反應的官能基(酚性羥基等)的 當量(酚性羥基當量等)之比例(環氧樹脂的縮水甘油基的當量/硬化劑中的會與縮水甘油基進行反應的官能基),較佳是0.7~2.0,更佳是0.8~1.8,進一步較佳是0.9~1.7。當前述比例為0.7以上或2.0以下時,不容易殘留未反應的環氧樹脂及/或未反應的硬化劑,而容易獲得期望的硬化物特性。 As the mixing ratio of epoxy resin and hardener (phenol resin, etc.), the equivalent of glycidyl group (epoxy equivalent) of epoxy resin and the functional group (phenolic hydroxyl group, etc.) that can react with glycidyl group in the hardener )of The ratio of equivalent (phenolic hydroxyl equivalent, etc.) (equivalent of glycidyl group of epoxy resin/functional group that can react with glycidyl group in hardener), preferably 0.7~2.0, more preferably 0.8~1.8 , Further preferably 0.9 to 1.7. When the aforementioned ratio is 0.7 or more or 2.0 or less, unreacted epoxy resin and/or unreacted hardener are not likely to remain, and desired properties of the cured product are easily obtained.

[(C)成分:硬化促進劑] [Component (C): Hardening accelerator]

作為硬化促進劑,能夠無特別限制地使用,較佳是從由胺系的硬化促進劑及磷系的硬化促進劑所組成之群組中選出的至少一種。特別是從容易獲得具有優異導熱率的硬化物之觀點、衍生物豐富之觀點以及容易獲得期望的活性溫度之觀點來看,作為硬化促進劑,較佳是胺系的硬化促進劑,更佳是從由咪唑化合物、脂肪族胺及脂環式胺所組成之群組中選出的至少一種,進一步較佳是咪唑化合物。作為咪唑化合物,可舉例如:2-苯基-4-甲基咪唑、1-苯甲基-2-甲基咪唑等。硬化促進劑可單獨使用1種,亦可併用2種以上。作為硬化促進劑之市售物,可舉例如:四國化成工業股份有限公司製之「2P4MZ」及「1B2MZ」等。 As the hardening accelerator, it can be used without particular limitation, and it is preferably at least one selected from the group consisting of an amine-based hardening accelerator and a phosphorus-based hardening accelerator. In particular, from the standpoint of easily obtaining a cured product with excellent thermal conductivity, the standpoint of abundant derivatives, and the standpoint of easily obtaining the desired active temperature, the curing accelerator is preferably an amine-based curing accelerator, and more preferably At least one selected from the group consisting of imidazole compounds, aliphatic amines and alicyclic amines, and more preferably imidazole compounds. As an imidazole compound, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, etc. are mentioned, for example. A hardening accelerator may be used individually by 1 type, and may use 2 or more types together. Examples of commercially available hardening accelerators include "2P4MZ" and "1B2MZ" manufactured by Shikoku Chemical Industry Co., Ltd.

以熱硬化性樹脂(環氧樹脂等)和硬化劑(酚樹脂等)的合計量作為基準計,硬化促進劑的含量較佳是在下述範圍內。從容易獲得充分的硬化促進效果之觀點來看,硬化促進劑的含量,較佳是0.01質量%以上,更佳是0.1質量%以上,進一步較佳是0.3質量%以上。從在 製造密封用薄膜時之步驟(例如塗佈及乾燥)中或密封用薄膜保管中硬化不容易進行而容易防止密封用薄膜發生破裂及隨著熔融黏度上升而發生成形不良之觀點來看,硬化促進劑的含量,較佳是5質量%以下,更佳是3質量%以下,進一步較佳是1.5質量%以下。從此等觀點來看,硬化促進劑的含量,較佳是0.01~5質量%,更佳是0.1~3質量%,進一步較佳是0.3~1.5質量%。 Based on the total amount of the thermosetting resin (epoxy resin, etc.) and curing agent (phenol resin, etc.), the content of the curing accelerator is preferably within the following range. From the viewpoint of easily obtaining a sufficient hardening accelerating effect, the content of the hardening accelerator is preferably 0.01% by mass or more, more preferably 0.1% by mass or more, and still more preferably 0.3% by mass or more. From in It is not easy to harden during the steps (such as coating and drying) of the sealing film or during storage of the sealing film, and it is easy to prevent the sealing film from cracking and forming defects as the melt viscosity rises. From the viewpoint of promoting hardening The content of the agent is preferably 5% by mass or less, more preferably 3% by mass or less, and still more preferably 1.5% by mass or less. From these viewpoints, the content of the hardening accelerator is preferably 0.01 to 5% by mass, more preferably 0.1 to 3% by mass, and still more preferably 0.3 to 1.5% by mass.

((D)成分:無機填充材料) (Component (D): Inorganic filler)

無機填充材料包含氧化鋁(氧化鋁粒子等)。包含氧化鋁之無機填充材料的市售物,可舉例如:住友化學股份有限公司製之「AA-1.5」、Denka股份有限公司製之「DAW20」等。 The inorganic filler contains alumina (alumina particles, etc.). Commercial products of inorganic fillers containing alumina include, for example, "AA-1.5" manufactured by Sumitomo Chemical Co., Ltd., "DAW20" manufactured by Denka Co., Ltd., and the like.

無機填充材料可包含氧化鋁(氧化鋁粒子等)以外之構成材料。換言之,本實施形態的樹脂組成物可含有一種粒子,其包含氧化鋁與氧化鋁以外之構成材料,亦可含有一種粒子,其包含氧化鋁與氧化鋁以外之成分。 The inorganic filler may include constituent materials other than alumina (alumina particles, etc.). In other words, the resin composition of the present embodiment may contain a kind of particles including alumina and constituent materials other than alumina, or may include a kind of particles including alumina and components other than alumina.

從更優異地提高導熱率的效果之觀點來看,以無機填充材料的總質量作為基準計,無機填充材料中的氧化鋁的含量,較佳是50質量%以上,更佳是70質量%以上,進一步較佳是80質量%以上,特佳是90質量%以上。以無機填充材料的總質量作為基準計,氧化鋁的含量亦可為100質量%。 From the viewpoint of the effect of improving the thermal conductivity more excellently, based on the total mass of the inorganic filler, the content of alumina in the inorganic filler is preferably 50% by mass or more, more preferably 70% by mass or more , More preferably 80% by mass or more, particularly preferably 90% by mass or more. Based on the total mass of the inorganic filler material, the content of alumina may also be 100% by mass.

作為氧化鋁以外之構成材料,能夠使用習知的無機填充材料中所含之構成材料,不限定於特定物。作為氧化鋁以外之構成材料,可舉例如:硫酸鋇、鈦酸鋇、氧化矽、滑石、黏土、碳酸鎂、碳酸鈣、氧化鋁、氮化矽、氮化鋁等。作為包含氧化矽之無機填充材料,可舉例如:非晶形氧化矽、結晶性氧化矽、熔融氧化矽、球狀氧化矽等。從容易藉由表面改質等來獲得提高樹脂中的分散性的效果及抑制在清漆中沉積的效果之觀點、以及因具有相對較小的熱膨脹率因此容易獲得期望的硬化物特性之觀點來看,作為氧化鋁以外之構成材料,較佳是氧化矽。作為包含氧化矽之無機填充材料之市售物,可舉例如:Admatechs股份有限公司製之「SC2500-SXJ」、「SC5500-SXE」及「SC2050-KC」等。氧化鋁以外之構成材料可單獨使用1種,亦可併用2種以上。 As constituent materials other than alumina, constituent materials contained in conventional inorganic fillers can be used, and are not limited to specific ones. Examples of constituent materials other than alumina include barium sulfate, barium titanate, silica, talc, clay, magnesium carbonate, calcium carbonate, alumina, silicon nitride, aluminum nitride, and the like. Examples of the inorganic filler containing silicon oxide include amorphous silicon oxide, crystalline silicon oxide, fused silica, spherical silicon oxide, and the like. From the viewpoint that it is easy to obtain the effect of improving the dispersibility in the resin and the effect of suppressing the deposition in the varnish by surface modification, etc., and the viewpoint that the desired cured product characteristics are easily obtained because of the relatively small thermal expansion rate. As a constituent material other than alumina, silicon oxide is preferred. Examples of commercially available inorganic fillers containing silicon oxide include "SC2500-SXJ", "SC5500-SXE" and "SC2050-KC" manufactured by Admatechs Co., Ltd. Constituent materials other than alumina may be used singly, or two or more of them may be used in combination.

無機填充材料可經進行表面改質。表面改質之手法無特別限定。從處理較簡便、官能基的種類豐富、容易賦予期望的特性之觀點來看,較佳是使用矽烷耦合劑來進行表面改質。 The inorganic filler material can undergo surface modification. The method of surface modification is not particularly limited. From the viewpoints of simple handling, abundant types of functional groups, and easy imparting of desired characteristics, it is preferable to use a silane coupling agent for surface modification.

作為矽烷耦合劑,可舉例如:烷基矽烷、烷氧基矽烷、乙烯基矽烷、環氧基矽烷、胺基矽烷、丙烯醯基矽烷、甲基丙烯醯基矽烷、巰基矽烷、硫醚矽烷、異氰酸基矽烷、硫矽烷、苯乙烯基矽烷、烷基氯矽烷等。 As the silane coupling agent, for example, alkyl silane, alkoxy silane, vinyl silane, epoxy silane, amino silane, acryl silane, methacryl silane, mercapto silane, thioether silane, Isocyanatosilane, thiosilane, styrylsilane, alkylchlorosilane, etc.

作為矽烷耦合劑之具體例,可舉例如:甲基三甲氧基矽烷、二甲基二甲氧基矽烷、三甲基甲氧基矽烷、甲基三乙氧基矽烷、甲基三苯氧基矽烷、乙基三甲氧基矽烷、正丙基三甲氧基矽烷、二異丙基二甲氧基矽烷、異丁基三甲氧基矽烷、二異丁基二甲氧基矽烷、異丁基三乙氧基矽烷、正己基三甲氧基矽烷、正己基三乙氧基矽烷、環己基甲基二甲氧基矽烷、正辛基三乙氧基矽烷、正十二烷基甲氧基矽烷、苯基三甲氧基矽烷、二苯基二甲氧基矽烷、三苯基矽烷醇、甲基三氯矽烷、二甲基二氯矽烷、三甲基氯矽烷、正辛基二甲基氯矽烷、四乙氧基矽烷、3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-(2-胺基乙基)胺基丙基三甲氧基矽烷、3-(2-胺基乙基)胺基丙基甲基二甲氧基矽烷、3-苯基胺基丙基三甲氧基矽烷、3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基甲基二甲氧基矽烷、3-縮水甘油氧基丙基三乙氧基矽烷、3-縮水甘油氧基丙基甲基二乙氧基矽烷、雙(3-(三乙氧基矽烷基)丙基)二硫醚、雙(3-(三乙氧基矽烷基)丙基)四硫醚、乙烯基三乙醯氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷、乙烯基三異丙氧基矽烷、烯丙基三甲氧基矽烷、二烯丙基二甲基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基甲基二甲氧基矽烷、3-巰基丙基三甲氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、3-巰基丙基三乙氧基矽烷、N-(1,3-二甲基丁醯基)-3-胺 基丙基三乙氧基矽烷、胺基矽烷(苯基胺基矽烷等)等。矽烷耦合劑可單獨使用1種,亦可併用2種以上。 Specific examples of the silane coupling agent include, for example, methyltrimethoxysilane, dimethyldimethoxysilane, trimethylmethoxysilane, methyltriethoxysilane, and methyltriphenoxy. Silane, Ethyl Trimethoxy Silane, n-Propyl Trimethoxy Silane, Diisopropyl Dimethoxy Silane, Isobutyl Trimethoxy Silane, Diisobutyl Dimethoxy Silane, Isobutyl Triethyl Oxysilane, n-hexyltrimethoxysilane, n-hexyltriethoxysilane, cyclohexylmethyldimethoxysilane, n-octyltriethoxysilane, n-dodecylmethoxysilane, phenyl Trimethoxysilane, diphenyldimethoxysilane, triphenylsilanol, methyltrichlorosilane, dimethyldichlorosilane, trimethylchlorosilane, n-octyldimethylchlorosilane, tetraethyl Oxysilane, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-(2-aminoethyl)aminopropyltrimethoxysilane, 3-(2 -Aminoethyl)aminopropylmethyldimethoxysilane, 3-phenylaminopropyltrimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxysilane Propylmethyldimethoxysilane, 3-glycidoxypropyltriethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, bis(3-(triethoxysilane) Yl)propyl)disulfide, bis(3-(triethoxysilyl)propyl)tetrasulfide, vinyl triacetoxysilane, vinyl trimethoxysilane, vinyl triethoxy Silane, vinyl triisopropoxy silane, allyl trimethoxy silane, diallyl dimethyl silane, 3-methacryloxy propyl trimethoxy silane, 3-methacryloxy silane Propylmethyldimethoxysilane, 3-mercaptopropyltrimethoxysilane, 3-mercaptopropylmethyldimethoxysilane, 3-mercaptopropyltriethoxysilane, N-(1, 3-Dimethylbutyryl)-3-amine Propyl propyl triethoxy silane, amino silane (phenyl amino silane, etc.), etc. The silane coupling agent may be used singly, or two or more of them may be used in combination.

從容易抑制無機填充材料凝集而容易使無機填充材料分散之觀點來看,無機填充材料的平均粒徑,較佳是0.01μm以上,更佳是0.1μm以上,進一步較佳是0.3μm以上,特佳是0.5μm以上。從容易抑制無機填充材料在清漆中沉積而容易製作均質的密封用薄膜之觀點來看,無機填充材料的平均粒徑,較佳是25μm以下,更佳是10μm以下,進一步較佳是5μm以下。從此等觀點來看,無機填充材料的平均粒徑,較佳是0.01~25μm,更佳是0.01~10μm,進一步較佳是0.1~10μm,特佳是0.3~5μm,極佳是0.5~5μm。無機填充材料的平均粒徑可為10~18μm。 From the viewpoint of easily inhibiting aggregation of the inorganic filler and easily dispersing the inorganic filler, the average particle diameter of the inorganic filler is preferably 0.01 μm or more, more preferably 0.1 μm or more, and even more preferably 0.3 μm or more. Preferably, it is 0.5 μm or more. From the viewpoint of easily suppressing the deposition of the inorganic filler in the varnish and easily producing a homogeneous sealing film, the average particle size of the inorganic filler is preferably 25 μm or less, more preferably 10 μm or less, and still more preferably 5 μm or less. From these viewpoints, the average particle size of the inorganic filler is preferably 0.01 to 25 μm, more preferably 0.01 to 10 μm, further preferably 0.1 to 10 μm, particularly preferably 0.3 to 5 μm, and extremely preferably 0.5 to 5 μm. The average particle size of the inorganic filler can be 10-18 μm.

從樹脂組成物的流動性優異之觀點來看,較佳是組合使用具有相互不同的平均粒徑之複數種無機填充材料。無機填充材料之組合中,較佳是最大的平均粒徑為15~25μm。較佳是組合使用:平均粒徑為15~25μm的無機填充材料、平均粒徑為0.5~2.5μm的無機填充材料、及平均粒徑為0.1~1.0μm的無機填充材料。 From the viewpoint of excellent fluidity of the resin composition, it is preferable to use a combination of plural kinds of inorganic fillers having mutually different average particle diameters. In the combination of inorganic fillers, the maximum average particle size is preferably 15-25 μm. Preferably, it is used in combination: an inorganic filler with an average particle size of 15-25 μm, an inorganic filler with an average particle size of 0.5-2.5 μm, and an inorganic filler with an average particle size of 0.1-1.0 μm.

所謂「平均粒徑」,是指在將粒子的總體積設為100%來求出由粒徑所得到的累積度數分布曲線時相當於體積50%之點的粒徑,能夠以使用雷射繞射散射法之粒度分布測定裝置等來進行測定。所組合之各無機 填充材料的平均粒徑,能夠從混合時之各無機填充材料的平均粒徑確認,並且能夠藉由測定粒度分布來確認。 The so-called "average particle size" refers to the particle size at the point equivalent to 50% of the volume when the total volume of the particles is set to 100% to obtain the cumulative power distribution curve obtained from the particle size. The particle size distribution measuring device of the radiation scattering method is used for measurement. The combined inorganic The average particle diameter of the filler can be confirmed from the average particle diameter of each inorganic filler at the time of mixing, and can be confirmed by measuring the particle size distribution.

從提高導熱率之觀點、及容易抑制因與被密封體間之熱膨脹率的差值而造成密封結構體(例如半導體裝置等電子零件裝置)的翹曲變大之觀點來看,以排除溶劑的質量後之樹脂組成物的總質量作為基準計,無機填充材料的含量(包含氧化鋁之無機填充材料與不含氧化鋁之無機填充材料的合計量)為72質量%以上。從更加提高導熱率之觀點、及更容易抑制密封結構體之翹曲變大之觀點來看,以排除溶劑的質量後之樹脂組成物的總質量作為基準計,無機填充材料的含量,較佳是72.5質量%以上,更佳是73質量%以上。從容易抑制在製作密封用薄膜時的乾燥步驟中密封用薄膜發生破裂之觀點、及抑制因密封用薄膜的熔融黏度上升而流動性降低而容易將被密封體(電子零件等)充分密封之觀點來看,以排除溶劑的質量後之樹脂組成物的總質量作為基準計,無機填充材料的含量,較佳是93質量%以下,更佳是90質量%以下,進一步較佳是85質量%以下,特佳是84.5質量%以下,極佳是81質量%以下,非常佳是80質量%以下。從此等觀點來看,以排除溶劑的質量後之樹脂組成物的總質量作為基準計,無機填充材料的含量,較佳是72~93質量%,更佳是72~90質量%,進一步較佳是72~85質量%,特佳是72~84.5質量%,極佳是72.5~81質量%,非常佳是73~80質量%。 From the viewpoint of improving the thermal conductivity and easily suppressing the warpage of the sealed structure (such as electronic components such as semiconductor devices) due to the difference in the thermal expansion coefficient between the sealed body and the sealed body, the solvent is eliminated The total mass of the resin composition after mass is used as a reference, and the content of the inorganic filler (the total amount of the inorganic filler containing alumina and the inorganic filler not containing alumina) is 72% by mass or more. From the viewpoint of increasing the thermal conductivity and the viewpoint that it is easier to suppress the warpage of the sealing structure, the content of the inorganic filler is preferably based on the total mass of the resin composition after excluding the mass of the solvent It is 72.5 mass% or more, more preferably 73 mass% or more. From the viewpoint that it is easy to suppress the cracking of the sealing film during the drying step when the sealing film is made, and the viewpoint that the melt viscosity of the sealing film increases and the fluidity is reduced, and the sealed body (electronic parts, etc.) is easily sealed. In terms of the total mass of the resin composition after excluding the mass of the solvent, the content of the inorganic filler is preferably 93% by mass or less, more preferably 90% by mass or less, and still more preferably 85% by mass or less , Particularly preferably 84.5 mass% or less, extremely preferably 81 mass% or less, and very preferably 80 mass% or less. From these viewpoints, based on the total mass of the resin composition after excluding the mass of the solvent, the content of the inorganic filler is preferably 72 to 93% by mass, more preferably 72 to 90% by mass, and still more preferably It is 72 to 85% by mass, particularly preferably 72 to 84.5% by mass, extremely preferably 72.5 to 81% by mass, and very preferably 73 to 80% by mass.

以排除溶劑的質量後之樹脂組成物的總質量作為基準計,包含氧化鋁之無機填充材料(氧化鋁粒子等)的含量,較佳是在下述範圍內。從更加提高導熱率之觀點來看,包含氧化鋁之無機填充材料的含量,較佳是50質量%以上,更佳是60質量%以上,進一步較佳是70質量%以上。從容易確保充分的填埋性之觀點來看,包含氧化鋁之無機填充材料的含量,較佳是85質量%以下,更佳是80質量%以下,進一步較佳是75質量%以下。 Based on the total mass of the resin composition excluding the mass of the solvent, the content of the inorganic filler (alumina particles, etc.) containing alumina is preferably within the following range. From the viewpoint of further improving the thermal conductivity, the content of the inorganic filler containing alumina is preferably 50% by mass or more, more preferably 60% by mass or more, and still more preferably 70% by mass or more. From the viewpoint of easily ensuring sufficient landfill properties, the content of the inorganic filler containing alumina is preferably 85% by mass or less, more preferably 80% by mass or less, and still more preferably 75% by mass or less.

((E)成分:溶劑) ((E) component: solvent)

本實施形態的樹脂組成物可含有(E)溶劑,亦可不含(E)溶劑。溶劑能夠使用習知有機溶劑。作為有機溶劑,較佳是一種溶劑,其能夠使無機填充材料以外之成分溶解,可舉例如:脂肪族烴類、芳香族烴類、萜烯類、鹵素類、酯類、酮類、醇類、醛類等。溶劑可單獨使用1種,亦可併用2種以上。 The resin composition of this embodiment may contain (E) solvent, and may not contain (E) solvent. As the solvent, conventional organic solvents can be used. The organic solvent is preferably a solvent that can dissolve components other than the inorganic filler, for example: aliphatic hydrocarbons, aromatic hydrocarbons, terpenes, halogens, esters, ketones, alcohols , Aldehydes, etc. A solvent may be used individually by 1 type, and may use 2 or more types together.

從環境負荷小之觀點、以及容易使熱硬化性樹脂(環氧樹脂等)及硬化劑(酚樹脂等)溶解之觀點來看,作為溶劑,較佳是從由酯類、酮類及醇類所組成之群組中選的至少一種。其中,從特別容易使熱硬化性樹脂(環氧樹脂等)及硬化劑(酚樹脂等)溶解之觀點來看,以酮類為佳。從在室溫(25℃)揮發較少且乾燥時容易去除之觀點來看,作為溶劑,較佳是從由丙酮、甲基乙基酮及甲基異丁基酮所組成之群組中選出的至少一種。 From the viewpoint of low environmental load and easy dissolution of thermosetting resin (epoxy resin, etc.) and hardener (phenol resin, etc.), the solvent is preferably from esters, ketones, and alcohols. At least one selected from the group. Among them, ketones are preferred from the viewpoint that it is particularly easy to dissolve thermosetting resins (epoxy resins, etc.) and hardeners (phenol resins, etc.). From the viewpoint of less volatilization at room temperature (25°C) and easy removal during drying, the solvent is preferably selected from the group consisting of acetone, methyl ethyl ketone and methyl isobutyl ketone At least one of.

((F)成分:彈性體) ((F) component: elastomer)

本實施形態的樹脂組成物可因應需要來含有(F)彈性體(可撓劑)。從分散性及溶解性優異之觀點來看,彈性體較佳是使用從由聚丁二烯粒子、苯乙烯丁二烯粒子、丙烯酸系彈性體、矽氧粉末、矽氧油及矽氧彈性體所組成之群組中選出之至少一種。彈性體可單獨使用1種,亦可併用2種以上。 The resin composition of this embodiment may contain (F) elastomer (flexible agent) as needed. From the viewpoint of excellent dispersibility and solubility, elastomers are preferably used from polybutadiene particles, styrene butadiene particles, acrylic elastomers, silicone powders, silicone oils, and silicone elastomers. At least one selected from the group consisting of. Elastomer may be used individually by 1 type, and may use 2 or more types together.

當彈性體為粒子狀時,彈性體的平均粒徑無特別限制。在內埋式晶圓級球柵陣列(Embedded Wafer-Level Ball Grid Array,eWLB)用途中,必須將半導體元件間填埋,因此,當將密封用薄膜用於eWLB用途中時,彈性體的平均粒徑,較佳是50μm以下。從彈性體的分散性優異之觀點來看,彈性體的平均粒徑,較佳是0.1μm以上。 When the elastomer is in the form of particles, the average particle diameter of the elastomer is not particularly limited. In Embedded Wafer-Level Ball Grid Array (eWLB) applications, it is necessary to fill between semiconductor elements. Therefore, when sealing films are used in eWLB applications, the average elastomer The particle size is preferably 50 μm or less. From the viewpoint of excellent dispersion of the elastomer, the average particle diameter of the elastomer is preferably 0.1 μm or more.

作為彈性體之市售物,可舉例如:Nagase ChemteX股份有限公司製之「HTR280」等。此外,市售之彈性體成分中,亦有並非彈性體單體而是預先分散在液狀樹脂(例如液狀環氧樹脂)中之彈性體,該彈性體不會產生問題而亦能夠使用。這樣的市售物,可舉例如:kaneka股份有限公司製之「MX-136」及「MX-965」等。 Examples of commercially available elastomers include "HTR280" manufactured by Nagase ChemteX Co., Ltd. and the like. In addition, some commercially available elastomer components are not elastomer monomers but elastomers dispersed in a liquid resin (for example, liquid epoxy resin) in advance, and the elastomer can be used without problems. Examples of such commercially available products include "MX-136" and "MX-965" manufactured by Kaneka Co., Ltd.

(其它成分) (Other ingredients)

本實施形態的樹脂組成物能夠進一步含有其它添加劑。作為這樣的添加劑之具體例,可舉例如:顏料、染料、脫模劑、抗氧化劑、表面張力調整劑等。 The resin composition of this embodiment can further contain other additives. Specific examples of such additives include, for example, pigments, dyes, mold release agents, antioxidants, surface tension regulators, and the like.

<密封用薄膜> <Film for sealing>

本實施形態的密封用薄膜包含本實施形態的樹脂組成物。本實施形態的密封用薄膜可為下述態樣:將本實施形態的樹脂組成物成形為薄膜狀而得,而由本實施形態的樹脂組成物所構成。本實施形態的密封用薄膜能夠用於例如:將半導體元件密封、填埋已配置於印刷線路板上之電子零件等。 The sealing film of this embodiment contains the resin composition of this embodiment. The sealing film of the present embodiment may be a form in which the resin composition of the present embodiment is formed into a film, and the film is composed of the resin composition of the present embodiment. The sealing film of this embodiment can be used, for example, for sealing semiconductor elements, filling electronic parts that have been placed on printed wiring boards, and the like.

從容易抑制塗佈時的面內的厚度不均之觀點來看,密封用薄膜的厚度(膜厚),較佳是20μm以上,更佳是30μm以上,進一步較佳是50μm以上,特佳是100μm以上。從塗佈時在深度方向容易獲得一定的乾燥性之觀點來看,密封用薄膜的厚度,較佳是250μm以下,更佳是200μm以下,進一步較佳是150μm以下。從此等觀點來看,密封用薄膜的厚度,較佳是20~250μm,更佳是30~250μm,進一步較佳是50~200μm,特佳是100~150μm。此外,亦能夠將密封用薄膜積層複數片來製作厚度超過250μm的密封用薄膜。 From the standpoint of easily suppressing the unevenness of the in-plane thickness during coating, the thickness (film thickness) of the sealing film is preferably 20 μm or more, more preferably 30 μm or more, still more preferably 50 μm or more, and particularly preferably Above 100μm. From the viewpoint of easily obtaining a certain degree of dryness in the depth direction during coating, the thickness of the sealing film is preferably 250 μm or less, more preferably 200 μm or less, and still more preferably 150 μm or less. From these viewpoints, the thickness of the sealing film is preferably 20 to 250 μm, more preferably 30 to 250 μm, still more preferably 50 to 200 μm, and particularly preferably 100 to 150 μm. In addition, a plurality of sheets of the sealing film can be laminated to produce a sealing film having a thickness of more than 250 μm.

相對於排除溶劑的質量後之密封用薄膜的總質量,密封用薄膜中的無機填充材料(包含氧化鋁之無機填充材料與不含氧化鋁之無機填充材料的合計量)的含 量,較佳是在下述範圍內。從更加提高導熱率之觀點及容易抑制密封結構體的翹曲變大之觀點來看,無機填充材料的含量,較佳是72質量%以上,更佳是72.5質量%以上,進一步較佳是73質量%以上。從抑制因密封用薄膜的熔融黏度上升而流動性降低而容易將被密封體(電子零件等)充分密封之觀點來看,較佳是93質量%以下,更佳是90質量%以下,進一步較佳是85質量%以下,特佳是84.5質量%以下,極佳是81質量%以下,非常佳是80質量%以下。從此等觀點來看,無機填充材料的含量,較佳是72~93質量%,更佳是72~90質量%,進一步較佳是72~85質量%,特佳是72~84.5質量%,極佳是72.5~81質量%,非常佳是73~80質量%。 Relative to the total mass of the sealing film after excluding the solvent, the content of the inorganic filler (the total amount of the inorganic filler containing alumina and the inorganic filler not containing alumina) in the sealing film The amount is preferably within the following range. From the viewpoint of further improving the thermal conductivity and easily suppressing the increase in the warpage of the sealing structure, the content of the inorganic filler is preferably 72% by mass or more, more preferably 72.5% by mass or more, and still more preferably 73 Above mass%. From the standpoint of preventing the fluidity reduction due to the increase in the melt viscosity of the sealing film and the ease of sealing the object to be sealed (electronic parts, etc.) easily, it is preferably 93% by mass or less, more preferably 90% by mass or less, and furthermore It is preferably 85% by mass or less, particularly preferably 84.5% by mass or less, very preferably 81% by mass or less, and very preferably 80% by mass or less. From these viewpoints, the content of the inorganic filler is preferably 72 to 93% by mass, more preferably 72 to 90% by mass, still more preferably 72 to 85% by mass, particularly preferably 72 to 84.5% by mass. It is preferably 72.5 to 81% by mass, and very preferably 73 to 80% by mass.

相對於密封用薄膜的總質量(包含溶劑的質量),密封用薄膜中所含的溶劑(有機溶劑等)的含量,較佳是在下述範圍內。從容易抑制密封用薄膜變脆而發生密封用薄膜破裂等不良情形且容易抑制最低熔融黏度升高而降低填埋性之觀點來看,溶劑的含量,較佳是0.2質量%以上,更佳是0.3質量%以上,進一步較佳是0.5質量%以上,特佳是0.6質量%以上,極佳是0.7質量%以上。從容易抑制密封用薄膜的黏著性過強而使處理性降低的不良情形且容易抑制在對密封用薄膜進行熱硬化時隨著溶劑(有機溶劑等)揮發而起泡等不良情形之觀點來看,溶劑的含量,較佳是1.5質量%以下,更佳是1質量%以下。從此等觀點來看,溶劑的含量,較佳是0.2 ~1.5質量%,更佳是0.3~1質量%,進一步較佳是0.5~1質量%,特佳是0.6~1質量%,極佳是0.7~1質量%。 The content of the solvent (organic solvent, etc.) contained in the sealing film relative to the total mass of the sealing film (including the mass of the solvent) is preferably within the following range. From the viewpoint that it is easy to prevent the sealing film from becoming brittle and cause problems such as cracking of the sealing film, and it is easy to suppress the increase in the minimum melt viscosity and reduce the landfillability, the content of the solvent is preferably 0.2% by mass or more, and more preferably 0.3% by mass or more, more preferably 0.5% by mass or more, particularly preferably 0.6% by mass or more, and extremely preferably 0.7% by mass or more. From the viewpoint of easily suppressing the disadvantages of excessively strong adhesiveness of the sealing film and reducing the handling properties, and easily suppressing the disadvantages such as blistering due to the volatilization of the solvent (organic solvent, etc.) when the sealing film is heat-cured The content of the solvent is preferably 1.5% by mass or less, more preferably 1% by mass or less. From these viewpoints, the content of the solvent is preferably 0.2 ~1.5% by mass, more preferably 0.3 to 1% by mass, still more preferably 0.5 to 1% by mass, particularly preferably 0.6 to 1% by mass, and extremely preferably 0.7 to 1% by mass.

本實施形態的密封用薄膜,具體而言,能夠以下述方式製作。 The sealing film of this embodiment can be produced specifically as follows.

首先,將本實施形態的樹脂組成物的構成成分((A)熱硬化性樹脂、(B)硬化劑、(C)硬化促進劑、(D)無機填充材料、(E)溶劑等)混合,而製作清漆(清漆狀樹脂組成物)。混合方法無特別限定,能夠使用研磨機、混合機、攪拌翼。溶劑(有機溶劑等)能夠為了下述目的而使用:使密封用薄膜的材料亦即樹脂組成物的構成成分溶解及分散而調製清漆、或輔助調製清漆。能夠在塗佈後的乾燥步驟中去除大部分的溶劑。 First, the components ((A) thermosetting resin, (B) curing agent, (C) curing accelerator, (D) inorganic filler, (E) solvent, etc.) of the resin composition of this embodiment are mixed, Then, a varnish (varnish-like resin composition) is produced. The mixing method is not particularly limited, and a grinder, mixer, and stirring blade can be used. The solvent (organic solvent, etc.) can be used for the purpose of dissolving and dispersing the constituent components of the resin composition that is the material of the sealing film to prepare a varnish or assisting in preparing the varnish. It is possible to remove most of the solvent in the drying step after coating.

將以上述方式製得之清漆塗佈於支撐體(薄膜狀的支撐體等)後,藉由噴吹熱風等來加熱乾燥,即能夠製作密封用薄膜。塗佈方法無特別限定,能夠使用例如:缺角輪(comma)塗佈器、棒塗佈器、吻合式(kiss)塗佈器、輥塗佈器、凹版塗佈器、模具塗佈器等塗佈裝置。 After the varnish prepared in the above manner is applied to a support (a film-like support, etc.), it is heated and dried by blowing hot air or the like to produce a sealing film. The coating method is not particularly limited. For example, a comma coater, a bar coater, a kiss coater, a roll coater, a gravure coater, a die coater, etc. can be used. Coating device.

作為薄膜狀的支撐體,能夠使用:高分子薄膜、金屬箔等。高分子薄膜,可舉例如:聚乙烯薄膜、聚丙烯薄膜等聚烯烴薄膜;聚氯乙烯薄膜等乙烯系薄膜;聚對苯二甲酸乙二酯等聚酯薄膜;聚碳酸酯薄膜; 乙醯纖維素薄膜;四氟乙烯薄膜等。金屬箔,可舉例如:銅箔、鋁箔等。 As a film-like support, a polymer film, metal foil, etc. can be used. Examples of polymer films include polyolefin films such as polyethylene films and polypropylene films; vinyl films such as polyvinyl chloride films; polyester films such as polyethylene terephthalate; polycarbonate films; Acetyl cellulose film; tetrafluoroethylene film, etc. Examples of metal foils include copper foil and aluminum foil.

支撐體的厚度並無特別限定,從操作性及乾燥性優異之觀點來看,較佳是2~200μm。當支撐體的厚度為2μm以上時,容易抑制塗佈時支撐體斷裂之不良情形、支撐體因清漆的重量而彎曲之不良情形等。當支撐體的厚度為200μm以下時,在乾燥步驟中,當從塗佈面和背面這兩面噴吹熱風時,容易抑制妨礙清漆中之溶劑乾燥之不良情形。 The thickness of the support is not particularly limited, but from the viewpoint of excellent handling and drying properties, it is preferably 2 to 200 μm. When the thickness of the support is 2 μm or more, it is easy to suppress the inconvenience of breaking of the support during coating, the inconvenience of bending of the support due to the weight of the varnish, and the like. When the thickness of the support is 200 μm or less, in the drying step, when hot air is blown from both the coating surface and the back surface, it is easy to suppress the disadvantage of preventing the solvent in the varnish from drying.

在已形成於支撐體上之密封用薄膜上,可為了保護密封用薄膜之目的而配置保護層。形成保護層,即能夠提高處理性,而能夠避免當進行捲繞時密封用薄膜黏貼在支撐體的背面之不良情形。 A protective layer can be arranged on the sealing film formed on the support for the purpose of protecting the sealing film. The formation of the protective layer can improve the handling, and can avoid the inconvenience that the sealing film sticks to the back surface of the support during winding.

作為保護層,能夠使用:高分子薄膜、金屬箔等。作為高分子薄膜,可例示如:聚乙烯薄膜、聚丙烯薄膜等聚烯烴薄膜;聚氯乙烯薄膜等乙烯系薄膜;聚對苯二甲酸乙二酯等聚酯薄膜;聚碳酸酯薄膜;乙醯纖維素薄膜;四氟乙烯薄膜等。作為金屬箔,可例示如:銅箔、鋁箔等。 As the protective layer, a polymer film, metal foil, etc. can be used. Examples of polymer films include polyolefin films such as polyethylene films and polypropylene films; vinyl films such as polyvinyl chloride films; polyester films such as polyethylene terephthalate; polycarbonate films; Cellulose film; tetrafluoroethylene film, etc. As metal foil, copper foil, aluminum foil, etc. can be illustrated, for example.

以上述方式製得之密封用薄膜,能夠藉由下述步驟來獲得密封用薄膜的硬化物並藉此製造密封用結構體(例如半導體裝置等電子零件裝置):配置成使被密封體(被填埋對象)朝向密封用薄膜的狀態之步驟;將密封用薄膜加熱使其熔融並施加壓力而將被密封體填埋之 步驟;及,藉由加熱來使具有填埋能力的密封用薄膜熱硬化之步驟。 The sealing film prepared in the above manner can obtain a cured product of the sealing film by the following steps, and thereby manufacture a sealing structure (for example, an electronic component device such as a semiconductor device): Landfill target) Step toward the state of the sealing film; heat the sealing film to melt and apply pressure to fill the sealed body Step; and, the step of thermally hardening the sealing film with landfill capability by heating.

<密封結構體> <Sealing structure>

本實施形態的密封結構體,具備被密封體與密封部,該密封部將該被密封體密封,並且,密封部包含本實施形態的樹脂組成物的硬化物(本實施形態的密封用薄膜中所含的樹脂組成物的硬化物等)。密封結構體可舉例如電子零件裝置等。電子零件裝置具備電子零件及密封部,該密封部將該電子零件密封,並且,密封部包含本實施形態的樹脂組成物的硬化物。作為電子零件,可舉例如:半導體元件;半導體晶圓;積體電路;半導體元件;表面聲波(SAW)濾波器等濾波器;偵測器等被動元件等。電子零件裝置可為下述:具備半導體元件或半導體晶圓來作為電子零件之半導體裝置;印刷線路板等。本實施形態的密封結構體可具備複數個被密封體。複數個被密封體可相互為同一種類,亦可相互為不同種類。 The sealing structure of this embodiment includes a body to be sealed and a sealing part that seals the body to be sealed, and the sealing part contains a cured product of the resin composition of this embodiment (in the sealing film of this embodiment) Cured products of the contained resin composition, etc.). Examples of the sealing structure include electronic component devices. The electronic component device includes an electronic component and a sealing portion that seals the electronic component, and the sealing portion includes a cured product of the resin composition of the present embodiment. Examples of electronic components include semiconductor elements; semiconductor wafers; integrated circuits; semiconductor elements; filters such as surface acoustic wave (SAW) filters; passive components such as detectors. The electronic component device may be the following: a semiconductor device equipped with a semiconductor element or a semiconductor wafer as an electronic component; a printed circuit board, etc. The sealing structure of this embodiment may include a plurality of to-be-sealed bodies. The plurality of sealed bodies may be of the same type or different types.

其次,說明使用本實施形態的密封用薄膜之電子零件裝置的製造方法。此處,說明電子零件為半導體元件之情形。第1圖是用以說明電子零件裝置亦即半導體裝置的製造方法來作為密封結構體的製造方法的一實施形態的概略剖面圖。本實施形態的製造方法具備下述步驟:將複數個半導體元件20作為被密封體(被填埋對象)排列並配置於具有暫時固定材料40之基板30上之步驟(第1圖(a));使附有支撐體之密封用薄膜10(具備 支撐體1和設置於支撐體1上的密封用薄膜2)與半導體元件20相對向,然後在加熱下將密封用薄膜2按壓(積層)在半導體元件20上,藉此將半導體元件20填埋至密封用薄膜2中之步驟(第1圖(b));及,使填埋有半導體元件20之密封用薄膜2硬化而獲得硬化物2a之步驟(第1圖(c))。本實施形態中,藉由積層法來將半導體元件20藉由密封用薄膜2來密封後,對密封用薄膜2進行熱硬化,而獲得一種密封結構體(電子零件裝置),其具備已填埋在硬化物2a中之半導體元件20,但亦可藉由壓縮成形來獲得密封結構體。 Next, the manufacturing method of the electronic component device using the sealing film of this embodiment is demonstrated. Here, the case where the electronic part is a semiconductor element is explained. FIG. 1 is a schematic cross-sectional view for explaining a method of manufacturing an electronic component device, that is, a semiconductor device, as an embodiment of a method of manufacturing a sealed structure. The manufacturing method of this embodiment includes the following steps: a step of arranging and arranging a plurality of semiconductor elements 20 as sealed objects (to be filled) on a substrate 30 having a temporary fixing material 40 (Figure 1(a)) ; Make the sealing film with support body 10 (with The support 1 and the sealing film 2 provided on the support 1 are opposed to the semiconductor element 20, and then the sealing film 2 is pressed (laminated) on the semiconductor element 20 under heating, thereby embedding the semiconductor element 20 The step to the sealing film 2 (Fig. 1(b)); and the step of curing the sealing film 2 in which the semiconductor element 20 is embedded to obtain a cured product 2a (Fig. 1(c)). In this embodiment, after the semiconductor element 20 is sealed with the sealing film 2 by the build-up method, the sealing film 2 is thermally cured to obtain a sealed structure (electronic component device), which has a landfill The semiconductor element 20 in the hardened product 2a, but it is also possible to obtain a sealed structure by compression molding.

作為用於積層法之積層機,並無特別限定,可舉例如:輥式、氣球式等之積層機。從填埋性之觀點來看,積層機可為能夠進行真空加壓的氣球式。 The layering machine used in the layering method is not particularly limited, and examples thereof include roll-type and balloon-type layering machines. From the viewpoint of landfillability, the stacker may be a balloon type capable of vacuum pressurization.

積層,通常是在支撐體的軟化點以下進行。積層溫度較佳是在密封用薄膜的最低熔融黏度附近。積層時的壓力是因要填埋的被密封體(例如半導體元件等電子零件)的尺寸、密集度等而異。積層時的壓力,例如:可為0.2~1.5MPa之範圍,亦可為0.3~1.0MPa之範圍。積層時間並無特別限定,可為20~600秒,亦可為30~300秒,亦可為40~120秒。 Laminating is usually performed below the softening point of the support. The lamination temperature is preferably near the lowest melt viscosity of the sealing film. The pressure at the time of lamination varies depending on the size and density of the sealed object (for example, electronic components such as semiconductor elements) to be filled. The pressure during stacking, for example, can be in the range of 0.2 to 1.5 MPa, or in the range of 0.3 to 1.0 MPa. The stacking time is not particularly limited, and it can be 20 to 600 seconds, 30 to 300 seconds, or 40 to 120 seconds.

密封用薄膜的硬化,能夠例如:在大氣壓力下或惰性氣體中進行。硬化溫度(加熱溫度)並無特別限定,可為80~280℃,亦可為100~240℃,亦可為120~200℃。若硬化溫度為80℃以上,則密封用薄膜 的硬化會充分進行,而能夠抑制不良情況發生。當硬化溫度為280℃以下時,有能夠抑制對其它材料產生熱損傷之傾向。硬化時間(加熱時間)並無特別限定,可為30~600分鐘,亦可為45~300分鐘,亦可為60~240分鐘。當硬化時間在此等範圍內時,密封用薄膜的硬化會充分進行,而能夠獲得更良好的生產效率。此外,硬化條件可組合複數種條件。 The curing of the sealing film can be performed, for example, under atmospheric pressure or in an inert gas. The curing temperature (heating temperature) is not particularly limited, and may be 80 to 280°C, 100 to 240°C, or 120 to 200°C. If the curing temperature is 80°C or higher, the sealing film The hardening will proceed sufficiently, and the occurrence of defects can be suppressed. When the curing temperature is below 280°C, there is a tendency to suppress thermal damage to other materials. The hardening time (heating time) is not particularly limited, and it can be 30 to 600 minutes, 45 to 300 minutes, or 60 to 240 minutes. When the curing time is within these ranges, the curing of the sealing film will proceed sufficiently, and better production efficiency can be obtained. In addition, the hardening conditions can be combined with a plurality of conditions.

以上說明本發明之較佳實施形態,但本發明並不一定限定於上述實施形態,亦可在不脫離本發明之要旨之範圍內適當進行變更。 The preferred embodiments of the present invention have been described above, but the present invention is not necessarily limited to the above-mentioned embodiments, and can be appropriately modified within the scope not departing from the gist of the present invention.

[實施例] [Example]

以下列舉實施例來更具體說明本發明,但本發明並不受此等實施例任何限定。 Examples are listed below to more specifically illustrate the present invention, but the present invention is not limited in any way by these examples.

使用下述成分,來作為用以獲得密封用薄膜(薄膜狀環氧樹脂組成物)之清漆狀環氧樹脂組成物(清漆)的成分。 The following components are used as components for obtaining a varnish-like epoxy resin composition (varnish) for the sealing film (film-like epoxy resin composition).

(A)成分:熱硬化性樹脂(環氧樹脂) (A) Component: Thermosetting resin (epoxy resin)

A1:雙酚F型環氧樹脂(三菱化學股份有限公司製,商品名jER806,環氧當量160g/eq,在25℃顯示液狀的環氧樹脂) A1: Bisphenol F type epoxy resin (manufactured by Mitsubishi Chemical Corporation, trade name jER806, epoxy equivalent 160g/eq, epoxy resin showing liquid state at 25°C)

A2:含萘骨架多官能固形環氧樹脂(DIC股份有限公司製,商品名EXA-4700,環氧當量182g/eq,在25℃不顯示液狀的環氧樹脂) A2: Multifunctional solid epoxy resin containing naphthalene skeleton (manufactured by DIC Co., Ltd., trade name EXA-4700, epoxy equivalent 182g/eq, epoxy resin that does not show liquid at 25°C)

A3:含聚丁二烯彈性體粒子之雙酚F型環氧樹脂(kaneka股份有限公司製,商品名MX-136,液狀環氧樹脂的含量75質量%,彈性體粒子的含量25質量%,環氧當量226g/eq,彈性體粒子的平均粒徑0.1μm,包含在25℃顯示液狀的環氧樹脂的成分) A3: Bisphenol F type epoxy resin containing polybutadiene elastomer particles (manufactured by Kaneka Co., Ltd., trade name MX-136, the content of liquid epoxy resin is 75% by mass, and the content of elastomer particles is 25% by mass , Epoxy equivalent 226g/eq, the average particle size of the elastomer particles is 0.1μm, and contains the epoxy resin component that shows liquid at 25°C)

A4:含矽氧彈性體粒子之環氧樹脂(雙酚F型液狀環氧樹脂及雙酚A型液狀環氧樹脂之混合物,kaneka股份有限公司製,商品名MX-965,液狀環氧樹脂的含量75質量%,彈性體粒子的含量25質量%,包含在25℃顯示液狀的環氧樹脂的成分) A4: Epoxy resin containing silicone elastomer particles (a mixture of bisphenol F type liquid epoxy resin and bisphenol A type liquid epoxy resin, manufactured by Kaneka Co., Ltd., trade name MX-965, liquid ring The content of the oxygen resin is 75% by mass, and the content of the elastomer particles is 25% by mass, including the epoxy resin that is liquid at 25°C)

A5:鄰甲酚酚醛清漆型環氧樹脂(DIC股份有限公司製,商品名N500P-1,環氧當量201g/eq,在25℃不顯示液狀的環氧樹脂) A5: o-cresol novolac epoxy resin (manufactured by DIC Co., Ltd., trade name N500P-1, epoxy equivalent of 201 g/eq, epoxy resin that does not show liquid at 25°C)

A6:含柔軟性骨架之雙酚A型環氧樹脂(DIC股份有限公司製,商品名EPICLON EXA-4816,環氧當量403g/eq,在25℃顯示液狀的環氧樹脂) A6: Bisphenol A epoxy resin containing a flexible skeleton (manufactured by DIC Co., Ltd., trade name EPICLON EXA-4816, epoxy equivalent 403g/eq, liquid epoxy resin at 25°C)

(B)成分:硬化劑(酚樹脂) (B)Component: Hardener (phenol resin)

B1:苯酚酚醛清漆樹脂(旭有機材工業股份有限公司製,商品名PAPS-PN2,酚性羥基當量104g/eq,在25℃不顯示液狀的酚樹脂) B1: Phenolic novolac resin (manufactured by Asahi Organic Materials Co., Ltd., trade name PAPS-PN2, phenolic hydroxyl equivalent 104g/eq, phenol resin that does not show liquid at 25°C)

B2:烷基苯酚酚醛清漆樹脂(群榮化學工業股份有限公司製,商品名ELP40,酚性羥基當量140g/eq) B2: Alkylphenol novolac resin (manufactured by Qunrong Chemical Industry Co., Ltd., trade name ELP40, phenolic hydroxyl equivalent 140g/eq)

(C)成分:硬化促進劑 (C) Ingredient: Hardening accelerator

C1:2-苯基-4-甲基咪唑(四國化成工業股份有限公司製,商品名2P4MZ) C1: 2-Phenyl-4-methylimidazole (manufactured by Shikoku Chemical Industry Co., Ltd., trade name 2P4MZ)

C2:1-苯甲基-2-甲基咪唑(四國化成工業股份有限公司製,1B2MZ) C2: 1-Benzyl-2-methylimidazole (manufactured by Shikoku Chemical Industry Co., Ltd., 1B2MZ)

(D)成分:無機填充材料 (D)Component: Inorganic filler

D1:氧化鋁粒子(住友化學股份有限公司製,商品名AA-1.5,平均粒徑1.5μm) D1: Alumina particles (manufactured by Sumitomo Chemical Co., Ltd., trade name AA-1.5, average particle size 1.5μm)

D2:氧化鋁粒子(Denka股份有限公司製,商品名DAW20,平均粒徑20μm) D2: Alumina particles (manufactured by Denka Co., Ltd., trade name DAW20, average particle size 20μm)

D3:氧化矽粒子(Admatechs股份有限公司製,商品名SC2500-SXJ,苯胺基矽烷處理,平均粒徑0.5μm) D3: Silica particles (manufactured by Admatechs Co., Ltd., trade name SC2500-SXJ, aniline silane treatment, average particle size 0.5μm)

D4:氧化矽粒子(Admatechs股份有限公司製,商品名SC5500-SXE,苯胺基矽烷處理,平均粒徑1.6μm) D4: Silicon oxide particles (manufactured by Admatechs Co., Ltd., trade name SC5500-SXE, aniline silane treatment, average particle size 1.6μm)

D5:氧化矽漿液(Admatechs股份有限公司製,商品名SC2050-KC,矽氧寡聚物處理,平均粒徑0.5μm,甲基異丁基酮溶劑稀釋(氧化矽填料的含量70質量%)) D5: Silica slurry (manufactured by Admatechs Co., Ltd., trade name SC2050-KC, treated with silicone oligomer, average particle size 0.5μm, diluted with methyl isobutyl ketone solvent (content of silica filler 70% by mass))

(E)成分:溶劑 (E) Ingredient: Solvent

E1:甲基乙基酮 E1: Methyl ethyl ketone

(F)成分:彈性體 (F)Component: Elastomer

F1:高分子彈性體(Nagase ChemteX股份有限公司製,商品名HTR280,環氧改質線狀彈性體) F1: Polymer elastomer (manufactured by Nagase ChemteX Co., Ltd., trade name HTR280, epoxy modified linear elastomer)

<密封用薄膜之製作> <Production of sealing film>

(實施例1) (Example 1)

在10L的聚乙烯容器中加入172g有機溶劑E1。在前述容器中加入542g無機填充材料D1後,使用攪拌翼來使無機填充材料D1分散,而獲得分散液。在此分散液中加入48g熱硬化性樹脂A1、12g熱硬化性樹脂A2、38g硬化劑B1並攪拌。確認硬化劑B1溶解後,加入0.8g硬化促進劑C1,並進一步攪拌1小時,而獲得混合液。以耐綸製# 200篩(開口75μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來在下述條件下將此清漆狀環氧樹脂組成物塗佈於下述薄膜狀的支撐體上,而在支撐體上製作薄膜厚度為100μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Add 172g of organic solvent E1 into a 10L polyethylene container. After adding 542 g of the inorganic filler D1 to the aforementioned container, a stirring blade was used to disperse the inorganic filler D1 to obtain a dispersion liquid. To this dispersion, 48 g of thermosetting resin A1, 12 g of thermosetting resin A2, and 38 g of curing agent B1 were added and stirred. After confirming that the curing agent B1 was dissolved, 0.8 g of the curing accelerator C1 was added, and the mixture was further stirred for 1 hour to obtain a mixed solution. This mixed liquid was filtered with a nylon #200 mesh (opening 75 μm), and the filtrate was collected to prepare a varnish-like epoxy resin composition. Use a coater to coat this varnish-like epoxy resin composition on the following film-like support under the following conditions, and produce a sealing film (film-like epoxy resin) with a film thickness of 100 μm on the support. Composition).

‧塗佈頭樣式:缺角輪塗佈器 ‧Coating head style: missing angle wheel coater

‧塗佈及乾燥速度:1m/分鐘 ‧Coating and drying speed: 1m/min

‧乾燥條件(溫度/爐長):110℃/3.3m、130℃/3.3m、140℃/3.3m ‧Drying conditions (temperature/furnace length): 110℃/3.3m, 130℃/3.3m, 140℃/3.3m

‧薄膜狀的支撐體:38μm後的聚對苯二甲酸乙二酯薄膜 ‧Film-like support: Polyethylene terephthalate film after 38μm

藉由於密封用薄膜中之與支撐體相反側配置保護層(12μm厚的聚對苯二甲酸乙二酯薄膜),來保護密封用薄膜之表面。再者,下述各評估中,是將支撐體及保護層剝離後再進行評估。下述實施例及比較例亦相同。 The surface of the sealing film is protected by arranging a protective layer (12μm thick polyethylene terephthalate film) on the side opposite to the support in the sealing film. In addition, in each of the following evaluations, the evaluation is performed after peeling the support and the protective layer. The following examples and comparative examples are also the same.

(實施例2) (Example 2)

在10L的聚乙烯容器中加入141g有機溶劑E1。在前述容器中加入493g無機填充材料D1後,使用攪拌翼來使無機填充材料D1分散,而獲得分散液。在此分散液中加入88g熱硬化性樹脂A1、22g熱硬化性樹脂A2、38g硬化劑B1並攪拌。確認硬化劑B1溶解後,加入1.4g硬化促進劑C1,並進一步攪拌1小時,而獲得混合液。以耐綸製# 200篩(開口75μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來與實施例1同樣地將此清漆狀環氧樹脂組成物塗佈於薄膜狀的支撐體上,而製作薄膜厚度為100μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Put 141g of organic solvent E1 into a 10L polyethylene container. After adding 493 g of the inorganic filler D1 to the aforementioned container, a stirring blade was used to disperse the inorganic filler D1 to obtain a dispersion liquid. To this dispersion, 88 g of thermosetting resin A1, 22 g of thermosetting resin A2, and 38 g of hardener B1 were added and stirred. After confirming that the curing agent B1 was dissolved, 1.4 g of the curing accelerator C1 was added, and the mixture was further stirred for 1 hour to obtain a mixed liquid. This mixed liquid was filtered with a nylon #200 mesh (opening 75 μm), and the filtrate was collected to prepare a varnish-like epoxy resin composition. Using a coater, this varnish-like epoxy resin composition was applied to a film-like support in the same manner as in Example 1 to produce a sealing film (film-like epoxy resin composition) with a film thickness of 100 μm.

(實施例3) (Example 3)

在10L的聚乙烯容器中加入114g有機溶劑E1。在前述容器中加入401g無機填充材料D1後,使用攪拌翼來使無機填充材料D1分散,而獲得分散液。在此分散液中加入48g熱硬化性樹脂A1、12g熱硬化性樹脂A2、38g硬化劑B1並攪拌。確認硬化劑B1溶解後,加入0.8g硬化促進劑C1,並進一步攪拌1小時,而獲得混合液。以耐綸製# 200篩(開口75μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來與實施例1同樣地將此清漆狀環氧樹脂組成物塗佈於薄膜狀的支撐體上,而製作薄膜厚度為100μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Put 114g of organic solvent E1 into a 10L polyethylene container. After adding 401 g of the inorganic filler D1 to the aforementioned container, a stirring blade was used to disperse the inorganic filler D1 to obtain a dispersion liquid. To this dispersion, 48 g of thermosetting resin A1, 12 g of thermosetting resin A2, and 38 g of curing agent B1 were added and stirred. After confirming that the curing agent B1 was dissolved, 0.8 g of the curing accelerator C1 was added, and the mixture was further stirred for 1 hour to obtain a mixed solution. This mixed liquid was filtered with a nylon #200 mesh (opening 75 μm), and the filtrate was collected to prepare a varnish-like epoxy resin composition. Using a coater, this varnish-like epoxy resin composition was applied to a film-like support in the same manner as in Example 1 to produce a sealing film (film-like epoxy resin composition) with a film thickness of 100 μm.

(實施例4) (Example 4)

在10L的聚乙烯容器中加入149g有機溶劑E1。在前述容器中加入423g無機填充材料D1後,加入104g無機填充材料D3,並使用攪拌翼來使無機填充材料D1及D3分散,而獲得分散液。在此分散液中加入48g熱硬化性樹脂A1、12g熱硬化性樹脂A2、38g硬化劑B1並攪拌。確認硬化劑B1溶解後,加入0.8g硬化促進劑C1,並進一步攪拌1小時,而獲得混合液。以耐綸製# 200篩(開口75μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來與實施例1同樣地將此清漆狀環氧樹脂組成物塗佈於薄膜狀的支撐體上,而製作薄膜厚度為100μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Add 149g of organic solvent E1 into a 10L polyethylene container. After adding 423 g of the inorganic filler D1 to the aforementioned container, 104 g of the inorganic filler D3 was added, and a stirring blade was used to disperse the inorganic filler D1 and D3 to obtain a dispersion. To this dispersion, 48 g of thermosetting resin A1, 12 g of thermosetting resin A2, and 38 g of curing agent B1 were added and stirred. After confirming that the curing agent B1 was dissolved, 0.8 g of the curing accelerator C1 was added, and the mixture was further stirred for 1 hour to obtain a mixed solution. This mixed liquid was filtered with a nylon #200 mesh (opening 75 μm), and the filtrate was collected to prepare a varnish-like epoxy resin composition. Using a coater, this varnish-like epoxy resin composition was applied to a film-like support in the same manner as in Example 1 to produce a sealing film (film-like epoxy resin composition) with a film thickness of 100 μm.

(比較例1) (Comparative example 1)

在10L的聚乙烯容器中加入96g有機溶劑E1。在前述容器中加入328g無機填充材料D1後,使用攪拌翼來使無機填充材料D1分散,而獲得分散液。在此分散液中加入144g熱硬化性樹脂A1、36g熱硬化性樹脂A2、114g硬化劑B1並攪拌。確認硬化劑B1溶解後,加入2.3g硬化促進劑C1,並進一步攪拌1小時,而獲得混合液。以耐綸製# 200篩(開口75μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來與實施例1同樣地將此清漆狀環氧樹脂組 成物塗佈於薄膜狀的支撐體上,而製作薄膜厚度為100μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Add 96 g of organic solvent E1 into a 10L polyethylene container. After adding 328 g of the inorganic filler D1 to the aforementioned container, a stirring blade was used to disperse the inorganic filler D1 to obtain a dispersion liquid. To this dispersion, 144 g of thermosetting resin A1, 36 g of thermosetting resin A2, and 114 g of hardener B1 were added and stirred. After confirming that the hardening agent B1 was dissolved, 2.3 g of the hardening accelerator C1 was added, and the mixture was further stirred for 1 hour to obtain a mixed liquid. This mixed liquid was filtered with a nylon #200 mesh (opening 75 μm), and the filtrate was collected to prepare a varnish-like epoxy resin composition. Use a coater to set this varnish-like epoxy resin in the same manner as in Example 1. The finished product was coated on a film-shaped support to produce a sealing film (film-shaped epoxy resin composition) with a film thickness of 100 μm.

(比較例2) (Comparative example 2)

在10L的聚乙烯容器中加入4629g有機溶劑E1。在前述容器中加入6622g無機填充材料D3後,使用攪拌翼來使無機填充材料D3分散,而獲得分散液。在此分散液中加入680g熱硬化性樹脂A1、240g熱硬化性樹脂A2、202g熱硬化性樹脂A3、78g熱硬化性樹脂A4、711g硬化劑B1並攪拌。確認硬化劑B1溶解後,加入15g硬化促進劑C1,並進一步攪拌1小時,而獲得混合液。以耐綸製# 200篩(開口75μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來與實施例1同樣地將此清漆狀環氧樹脂組成物塗佈於薄膜狀的支撐體上,而製作薄膜厚度為100μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Add 4629g of organic solvent E1 into a 10L polyethylene container. After adding 6622 g of the inorganic filler D3 to the aforementioned container, a stirring blade was used to disperse the inorganic filler D3 to obtain a dispersion liquid. To this dispersion, 680 g of thermosetting resin A1, 240 g of thermosetting resin A2, 202 g of thermosetting resin A3, 78 g of thermosetting resin A4, and 711 g of hardener B1 were added and stirred. After confirming that the curing agent B1 is dissolved, 15 g of the curing accelerator C1 is added, and the mixture is further stirred for 1 hour to obtain a mixed liquid. This mixed liquid was filtered with a nylon #200 mesh (opening 75 μm), and the filtrate was collected to prepare a varnish-like epoxy resin composition. Using a coater, this varnish-like epoxy resin composition was applied to a film-like support in the same manner as in Example 1 to produce a sealing film (film-like epoxy resin composition) with a film thickness of 100 μm.

(比較例3) (Comparative example 3)

除了將比較例1之塗佈及乾燥速度從1m/分鐘變更為0.5m/分鐘以外,其餘與比較例1同樣地進行,而製作薄膜厚度為100μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Except that the coating and drying speed of Comparative Example 1 was changed from 1m/min to 0.5m/min, the rest was carried out in the same manner as Comparative Example 1 to produce a sealing film (film-like epoxy resin composition) with a film thickness of 100μm ).

(實施例5) (Example 5)

在10L的聚乙烯容器中加入83g有機溶劑E1。在前述容器中加入151g無機填充材料D5,並加入660g無機填充材料D2及53g無機填充材料D4後,使用攪拌 翼來使無機填充材料D2、D4及D5分散,而獲得分散液。無機填充材料D2、D4及D5的平均粒徑為16μm。在此分散液中加入34g熱硬化性樹脂A5、11g熱硬化性樹脂A6、28g硬化劑B2並攪拌。確認硬化劑B2溶解後,加入7g彈性體F1、0.5g硬化促進劑C2,並進一步攪拌1小時,而獲得混合液。以耐綸製# 150篩(開口106μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來與實施例1同樣地將此清漆狀環氧樹脂組成物塗佈於薄膜狀的支撐體上,而製作薄膜厚度為125μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Put 83 g of organic solvent E1 in a 10L polyethylene container. Put 151g of inorganic filler D5 into the aforementioned container, and add 660g of inorganic filler D2 and 53g of inorganic filler D4, then use stirring The wings disperse the inorganic fillers D2, D4, and D5 to obtain a dispersion liquid. The average particle size of the inorganic fillers D2, D4, and D5 is 16 μm. To this dispersion, 34 g of thermosetting resin A5, 11 g of thermosetting resin A6, and 28 g of hardener B2 were added and stirred. After confirming the dissolution of the hardener B2, 7 g of the elastomer F1 and 0.5 g of the hardening accelerator C2 were added, and the mixture was further stirred for 1 hour to obtain a mixed solution. This mixed liquid was filtered with #150 mesh (opening 106 μm) made by nylon, and the filtrate was collected to prepare a varnish-like epoxy resin composition. Using a coater, this varnish-like epoxy resin composition was applied to a film-like support in the same manner as in Example 1 to produce a sealing film (film-like epoxy resin composition) having a film thickness of 125 μm.

(實施例6) (Example 6)

在10L的聚乙烯容器中加入83g有機溶劑E1。在前述容器中加入98g無機填充材料D5後,加入430g無機填充材料D2及34g無機填充材料D4,並使用攪拌翼來使無機填充材料D2、D4及D5分散,而獲得分散液。無機填充材料D2、D4及D5的平均粒徑為18μm。在此分散液中加入21g熱硬化性樹脂A5、7g熱硬化性樹脂A6、17g硬化劑B2並攪拌。確認硬化劑B2溶解後,加入8g彈性體F1、0.14g硬化促進劑C1,並進一步攪拌1小時,而獲得混合液。以耐綸製# 150篩(開口106μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來與實施例1同樣地將此清漆狀環氧樹脂組成物塗佈於薄膜狀的支撐體上, 而製作薄膜厚度為125μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Put 83 g of organic solvent E1 in a 10L polyethylene container. After adding 98 g of the inorganic filler D5 to the aforementioned container, 430 g of the inorganic filler D2 and 34 g of the inorganic filler D4 were added, and a stirring blade was used to disperse the inorganic filler D2, D4, and D5 to obtain a dispersion. The average particle size of the inorganic fillers D2, D4, and D5 is 18 μm. 21 g of thermosetting resin A5, 7 g of thermosetting resin A6, and 17 g of hardener B2 were added to this dispersion and stirred. After confirming that the curing agent B2 was dissolved, 8 g of the elastomer F1 and 0.14 g of the curing accelerator C1 were added, and the mixture was further stirred for 1 hour to obtain a mixed solution. This mixed liquid was filtered with #150 mesh (opening 106 μm) made by nylon, and the filtrate was collected to prepare a varnish-like epoxy resin composition. Using a coater, this varnish-like epoxy resin composition was applied to a film-like support in the same manner as in Example 1. Then, a sealing film (film-like epoxy resin composition) having a film thickness of 125 μm was produced.

(實施例7) (Example 7)

在10L的聚乙烯容器中加入83g有機溶劑E1。在前述容器中加入68.6g無機填充材料D3後,加入463g無機填充材料D2及34.3g無機填充材料D4,並使用攪拌翼來使無機填充材料D2、D3及D4分散,而獲得分散液。無機填充材料D2、D3及D4的平均粒徑為18μm。在此分散液中加入18.3g熱硬化性樹脂A5、4.6g熱硬化性樹脂A6、14.4g硬化劑B2並攪拌。確認硬化劑B2溶解後,加入5.6g彈性體F1、0.11g硬化促進劑C1,並進一步攪拌1小時,而獲得混合液。以耐綸製# 150篩(開口106μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來與實施例1同樣地將此清漆狀環氧樹脂組成物塗佈於薄膜狀的支撐體上,而製作薄膜厚度為125μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Put 83 g of organic solvent E1 in a 10L polyethylene container. After adding 68.6 g of the inorganic filler D3 to the aforementioned container, 463 g of the inorganic filler D2 and 34.3 g of the inorganic filler D4 were added, and the inorganic filler D2, D3, and D4 were dispersed using a stirring blade to obtain a dispersion liquid. The average particle size of the inorganic fillers D2, D3, and D4 is 18 μm. To this dispersion, 18.3 g of thermosetting resin A5, 4.6 g of thermosetting resin A6, and 14.4 g of hardener B2 were added and stirred. After confirming that the curing agent B2 was dissolved, 5.6 g of the elastomer F1 and 0.11 g of the curing accelerator C1 were added, and the mixture was further stirred for 1 hour to obtain a mixed solution. This mixed liquid was filtered with #150 mesh (opening 106 μm) made by nylon, and the filtrate was collected to prepare a varnish-like epoxy resin composition. Using a coater, this varnish-like epoxy resin composition was applied to a film-like support in the same manner as in Example 1 to produce a sealing film (film-like epoxy resin composition) having a film thickness of 125 μm.

(實施例8) (Example 8)

在10L的聚乙烯容器中加入83g有機溶劑E1。在前述容器中加入68.6g無機填充材料D3後,加入463g無機填充材料D2及34.3g無機填充材料D4,並使用攪拌翼來使無機填充材料D2、D3及D4分散,而獲得分散液。無機填充材料D2、D3及D4的平均粒徑為18μm。在此分散液中加入17.9g熱硬化性樹脂A5、4.5 g熱硬化性樹脂A6、14g硬化劑B2並攪拌。確認硬化劑B2溶解後,加入6.4g彈性體F1、0.11g硬化促進劑C1,並進一步攪拌1小時,而獲得混合液。以耐綸製# 150篩(開口106μm)來將此混合液過濾,並收集濾液,而製作清漆狀環氧樹脂組成物。使用塗佈機來與實施例1同樣地將此清漆狀環氧樹脂組成物塗佈於薄膜狀的支撐體上,而製作薄膜厚度為125μm的密封用薄膜(薄膜狀環氧樹脂組成物)。 Put 83 g of organic solvent E1 in a 10L polyethylene container. After adding 68.6 g of the inorganic filler D3 to the aforementioned container, 463 g of the inorganic filler D2 and 34.3 g of the inorganic filler D4 were added, and the inorganic filler D2, D3, and D4 were dispersed using a stirring blade to obtain a dispersion liquid. The average particle size of the inorganic fillers D2, D3, and D4 is 18 μm. Add 17.9g of thermosetting resin A5, 4.5 to this dispersion g thermosetting resin A6, 14 g hardener B2 and stirring. After confirming that the curing agent B2 was dissolved, 6.4 g of the elastomer F1 and 0.11 g of the curing accelerator C1 were added, and the mixture was further stirred for 1 hour to obtain a mixed solution. This mixed liquid was filtered with #150 mesh (opening 106 μm) made by nylon, and the filtrate was collected to prepare a varnish-like epoxy resin composition. Using a coater, this varnish-like epoxy resin composition was applied to a film-like support in the same manner as in Example 1 to produce a sealing film (film-like epoxy resin composition) having a film thickness of 125 μm.

<評估> <evaluation>

(1)密封用薄膜的硬化物的導熱率A (1) Thermal conductivity A of the cured product of the sealing film

在下述條件下,以銅箔來對實施例1~8及比較例1~3的密封用薄膜(厚度100μm或125μm)的雙面進行積層,而獲得雙面附有銅箔之密封用薄膜。 Under the following conditions, the two sides of the sealing films (thickness 100 μm or 125 μm) of Examples 1 to 8 and Comparative Examples 1 to 3 were laminated with copper foil to obtain a sealing film with copper foil on both sides.

‧積層裝置:名機製作所股份有限公司製之真空加壓積層機,商品名「MVLP-500」 ‧Laminator: Vacuum pressurized laminator manufactured by Meiki Mfg. Co., Ltd., trade name "MVLP-500"

‧積層溫度:90℃ ‧Laminating temperature: 90℃

‧積層壓力:0.5MPa ‧Building pressure: 0.5MPa

‧真空抽吸時間:30秒 ‧Vacuum suction time: 30 seconds

‧積層時間:40秒 ‧Layer time: 40 seconds

在下述條件下,使所得到的雙面附有銅箔之密封用薄膜硬化,而製作附有銅箔之環氧樹脂硬化物。 Under the following conditions, the obtained double-sided copper foil-attached sealing film was cured to produce a copper foil-attached epoxy resin cured product.

‧烘箱:ESPEC股份有限公司製,商品名「SAFETY OVEN SPH-201」 ‧Oven: manufactured by ESPEC Co., Ltd., trade name "SAFETY OVEN SPH-201"

‧烘箱溫度:140℃ ‧Oven temperature: 140℃

‧加熱時間:120分鐘 ‧Heating time: 120 minutes

藉由蝕刻來將所製作的附有銅箔之環氧樹脂硬化物的銅箔去除,而獲得環氧樹脂硬化物(密封用薄膜的硬化物)。將所得到的環氧樹脂硬化物切割成1cm見方,並使用下述裝置來測定熱擴散率。 The produced copper foil with a copper foil hardened epoxy resin is removed by etching to obtain a hardened epoxy resin (hardened film for sealing). The obtained cured epoxy resin was cut into 1 cm square, and the thermal diffusivity was measured using the following apparatus.

‧熱擴散率測定裝置:NETZSCH公司製之商品名「LFA447」(Xenon Flash Analyzer) ‧Thermal diffusivity measuring device: "LFA447" (Xenon Flash Analyzer) manufactured by NETZSCH

此外,使用下述比重計來測定所得到的環氧樹脂硬化物之比重。 In addition, the specific gravity of the obtained cured epoxy resin was measured using the following hydrometer.

‧比重計:ALFA MIRAGE公司製之商品名「SD200L」 ‧Hydrometer: The product name "SD200L" manufactured by ALFA MIRAGE

此外,藉由下述條件之示差掃描熱量測定,來求出所得到的環氧樹脂硬化物的比熱。 In addition, the specific heat of the cured epoxy resin obtained was determined by differential scanning calorimetry under the following conditions.

‧示差掃描熱量測定裝置:TA Instruments Japan公司製之商品名「Q-200」 ‧Differential scanning calorimetry device: product name "Q-200" manufactured by TA Instruments Japan

‧測試條件:25℃,10分鐘(一定)→25~60℃(10℃/min)→60℃,10分鐘(一定) ‧Test conditions: 25°C, 10 minutes (constant) → 25~60°C (10°C/min) → 60°C, 10 minutes (constant)

使用所得到的熱擴散率、比重及比熱,藉由下述式(1)來求出導熱率。 Using the obtained thermal diffusivity, specific gravity, and specific heat, the thermal conductivity is determined by the following formula (1).

導熱率=熱擴散率×比重×比熱‧‧‧(1) Thermal conductivity = thermal diffusivity × specific gravity × specific heat‧‧‧(1)

然後,依據下述評估基準來評估導熱率。實施例1~4之結果是如表1所示。再者,實施例5~8的導熱率與實施例1~4同等(評估:A),例如:實施例5的導熱率為2.73W/m‧K。 Then, the thermal conductivity is evaluated based on the following evaluation criteria. The results of Examples 1 to 4 are shown in Table 1. Furthermore, the thermal conductivity of Examples 5 to 8 is the same as that of Examples 1 to 4 (evaluation: A). For example, the thermal conductivity of Example 5 is 2.73 W/m·K.

「A」:導熱率>2.5W/m‧K "A": Thermal conductivity>2.5W/m‧K

「B」:導熱率≦2.5W/m‧K "B": Thermal conductivity≦2.5W/m‧K

(2)密封用薄膜的硬化物的導熱率B (2) Thermal conductivity B of the cured product of the sealing film

將實施例5~8之密封用薄膜(厚度125μm)分別重疊4片,並使用手壓裝置來在下述條件下製作厚度500μm的積層薄膜。 The sealing films (125 μm in thickness) of Examples 5 to 8 were stacked on 4 sheets each, and a hand-pressing device was used to produce a laminated film with a thickness of 500 μm under the following conditions.

‧手壓裝置:井元製作所股份有限公司製之商品名「BIG HEART」 ‧Hand pressure device: Brand name "BIG HEART" manufactured by Imoto Manufacturing Co., Ltd.

‧手壓成型溫度:140℃ ‧Hand pressure molding temperature: 140℃

‧手壓成形時間:30分鐘 ‧Hand pressure forming time: 30 minutes

‧成形載重:20kN ‧Forming load: 20kN

在下述條件下來使所得到的厚度500μm的積層薄膜硬化,而製作環氧樹脂硬化物(密封用薄膜的硬化物)。 The obtained laminated film having a thickness of 500 μm was cured under the following conditions to produce an epoxy resin cured product (cured product of the sealing film).

‧烘箱溫度:140℃ ‧Oven temperature: 140℃

‧加熱時間:90分鐘 ‧Heating time: 90 minutes

將所得到的環氧樹脂硬化物切割成1cm見方,並使用熱阻率測定器,藉由溫度傾斜法來測定環氧樹脂硬化物的導熱率。然後,依據下述評估基準來評估導熱率。結果是如表2所示。 The obtained cured epoxy resin was cut into 1 cm square, and the thermal conductivity of the cured epoxy resin was measured by the temperature gradient method using a thermal resistivity measuring device. Then, the thermal conductivity is evaluated based on the following evaluation criteria. The results are shown in Table 2.

「A」:導熱率>2.5W/m‧K "A": Thermal conductivity>2.5W/m‧K

「B」:導熱率≦2.5W/m‧K "B": Thermal conductivity≦2.5W/m‧K

(3)密封用薄膜的溶劑含量 (3) Solvent content of sealing film

將所得到的密封用薄膜切割成5cm見方的樣品,並將此樣品加入經預先測定質量的鋁杯中後,測定裝有樣品之鋁杯的質量。然後,在裝在鋁杯中之狀態下直接使用180℃的烘箱將樣品加熱10分鐘後,在室溫(25℃)放置10分鐘。然後,再次測定裝有樣品之鋁杯的質量。然後,從裝有樣品之鋁杯的質量之測定值(加熱前及加熱後)減去另外測定之鋁杯的質量,而分別求出加熱前及加熱後之密封用薄膜的質量。然後,將從加熱前之密封用薄膜的質量減去加熱後之密封用薄膜的質量而得之值,除以加熱前之密封用薄膜的質量,而獲得其比例作為溶劑含量。結果是如表1及2所示。 The obtained sealing film was cut into a sample of 5 cm square, and the sample was added to an aluminum cup whose mass was measured in advance, and then the mass of the aluminum cup containing the sample was measured. Then, directly use the oven at 180°C to heat the sample for 10 minutes while it is placed in an aluminum cup, and then place it at room temperature (25°C) for 10 minutes. Then, the mass of the aluminum cup containing the sample was measured again. Then, subtract the separately measured mass of the aluminum cup from the measured value of the mass of the aluminum cup containing the sample (before heating and after heating) to obtain the mass of the sealing film before and after heating, respectively. Then, the value obtained by subtracting the mass of the sealing film after heating from the mass of the sealing film before heating is divided by the mass of the sealing film before heating to obtain the ratio as the solvent content. The results are shown in Tables 1 and 2.

(4)填埋性 (4) Landfill

厚度100μm或125μm的密封用薄膜分別重疊4片,而獲得厚度400μm或500μm的積層薄膜。以下述順序,使用積層薄膜,來製作8英吋尺寸的eWLB封裝體。第2圖是表示本測定中之矽晶片之配置圖。首先,如第2圖所示,於不銹鋼板50上配置厚度350μm的矽晶片(7.3mm見方矽晶片60及3mm見方矽晶片70)。然後,將積層薄膜切割成直徑20cm的圓狀後,載置於前述矽晶片上。然後,使用壓縮成形裝置(APIC YAMADA股份有限公司製,商品名:WCM-300),來在下述條件下獲得密封體(密封結構體)。 Four sealing films each having a thickness of 100 μm or 125 μm are stacked to obtain a laminated film having a thickness of 400 μm or 500 μm. In the following procedure, an 8-inch-size eWLB package was produced using the laminated film. Figure 2 is a diagram showing the layout of the silicon wafer in this measurement. First, as shown in FIG. 2, a silicon wafer (a 7.3 mm square silicon wafer 60 and a 3 mm square silicon wafer 70) with a thickness of 350 μm is placed on the stainless steel plate 50. Then, the laminated film was cut into a circle with a diameter of 20 cm, and then placed on the aforementioned silicon wafer. Then, a compression molding apparatus (manufactured by APIC YAMADA Co., Ltd., trade name: WCM-300) was used to obtain a sealed body (sealed structure) under the following conditions.

‧壓縮成形溫度:140℃ ‧Compression molding temperature: 140℃

‧壓縮成形壓力:25MPa ‧Compression molding pressure: 25MPa

‧壓縮成形時間:10分鐘 ‧Compression molding time: 10 minutes

然後,藉由在下述條件下將所製作之密封體加熱來使其硬化,而製作硬化物。藉此,獲得eWLB封裝體。 Then, the produced sealing body was heated and hardened under the following conditions to produce a hardened product. In this way, an eWLB package is obtained.

‧烘箱:ESPEC股份有限公司製,商品名「SAFETY OVEN SPH-201」 ‧Oven: manufactured by ESPEC Co., Ltd., trade name "SAFETY OVEN SPH-201"

‧烘箱溫度:140℃ ‧Oven temperature: 140℃

‧加熱時間:120分鐘 ‧Heating time: 120 minutes

依據下述評估基準來評估所製作的硬化物的填埋性。結果是如表1及表2所示。 According to the following evaluation criteria, the landfillability of the hardened material produced is evaluated. The results are shown in Table 1 and Table 2.

「A」:能夠在無孔洞的情形下填埋,而表面平滑。 "A": It can be filled without holes, and the surface is smooth.

「B」:能夠觀察到一部分孔洞,而表面平滑。 "B": Some holes can be observed, and the surface is smooth.

「C」:能夠觀察到孔洞,而表面平滑不良。 "C": Holes can be observed, but the surface is not smooth.

[表1]

Figure 109141513-A0202-12-0044-1
[Table 1]
Figure 109141513-A0202-12-0044-1

[表2]

Figure 109141513-A0202-12-0045-2
[Table 2]
Figure 109141513-A0202-12-0045-2

<評估結果> <Evaluation Results>

由表1及表2所示可知,一種樹脂組成物,其含有熱硬化性成分及無機填充材料,其中,無機填充材料包含氧化鋁,且以排除溶劑的質量後之樹脂組成物的總質量作為基準計,無機填充材料的含量為72質量%以上,此時,硬化物的導熱率能夠獲得優異的效果。由表1所示之實施例4可知,即使無機填充材料包含氧化矽,硬化物的導熱率仍能夠獲得優異的效果。 As shown in Table 1 and Table 2, it can be seen that a resin composition contains a thermosetting component and an inorganic filler, where the inorganic filler contains alumina, and the total mass of the resin composition after excluding the solvent is taken as By reference, the content of the inorganic filler is 72% by mass or more. In this case, the thermal conductivity of the hardened product can achieve an excellent effect. From Example 4 shown in Table 1, it can be seen that even if the inorganic filler contains silicon oxide, the thermal conductivity of the cured product can still achieve excellent effects.

由上述結果可知,一種樹脂組成物,其含有熱硬化性成分及無機填充材料,其中,無機填充材料包含氧化鋁,且以排除溶劑的質量後之樹脂組成物的總質 量作為基準計,無機填充材料的含量為72質量%以上,此時,硬化物的導熱率能夠獲得優異的效果,且填埋性優異。 From the above results, it can be seen that a resin composition contains a thermosetting component and an inorganic filler, wherein the inorganic filler contains alumina, and the total mass of the resin composition is based on the mass excluding the solvent. As a reference, the content of the inorganic filler is 72% by mass or more. In this case, the thermal conductivity of the cured product can achieve excellent effects, and the filling property is excellent.

1:支撐體 1: Support

2:密封用薄膜 2: Film for sealing

2a:硬化物 2a: Hardened object

10:附有支撐體之密封用薄膜 10: Sealing film with supporting body

20:半導體元件 20: Semiconductor components

30:基板 30: substrate

40:暫時固定材料 40: Temporarily fix the material

Claims (16)

一種樹脂組成物,其含有熱硬化性成分及無機填充材料,並且, A resin composition containing a thermosetting component and an inorganic filler, and, 前述熱硬化性成分進一步包含:環氧樹脂、硬化劑、以及硬化促進劑, The aforementioned thermosetting component further includes epoxy resin, hardener, and hardening accelerator, 前述無機填充材料包含氧化鋁,且進一步含有氧化矽, The aforementioned inorganic filler material contains alumina, and further contains silicon oxide, 且以排除溶劑的質量後之前述樹脂組成物的總質量作為基準計,前述無機填充材料的含量為72質量%以上, And based on the total mass of the resin composition after excluding the mass of the solvent, the content of the inorganic filler is 72% by mass or more, 前述無機填充材料中的氧化鋁的含量為70質量%以上。 The content of alumina in the aforementioned inorganic filler is 70% by mass or more. 如請求項1所述之樹脂組成物,其中,前述硬化劑包含酚樹脂。 The resin composition according to claim 1, wherein the curing agent contains a phenol resin. 如請求項1所述之樹脂組成物,其中,前述硬化促進劑為咪唑化合物。 The resin composition according to claim 1, wherein the hardening accelerator is an imidazole compound. 如請求項1或2所述之樹脂組成物,其中,前述環氧樹脂包含在25℃時為液狀的環氧樹脂,且以排除溶劑的質量後之前述樹脂組成物的總質量作為基準計,在25℃時為液狀的環氧樹脂的含量為5質量%以上。 The resin composition according to claim 1 or 2, wherein the epoxy resin includes an epoxy resin that is liquid at 25°C, and the total mass of the resin composition after excluding the solvent is calculated as a reference The content of the epoxy resin that is liquid at 25°C is 5% by mass or more. 如請求項1或2所述之樹脂組成物,其中, 前述環氧樹脂包含在25℃時為液狀的環氧樹脂,且以排除溶劑的質量後之前述樹脂組成物的總質量作為基準計,在25℃時為液狀的環氧樹脂的含量為7質量%以上。 The resin composition according to claim 1 or 2, wherein The epoxy resin includes an epoxy resin that is liquid at 25°C, and the content of the epoxy resin that is liquid at 25°C is based on the total mass of the resin composition after excluding the mass of the solvent. 7 mass% or more. 如請求項1所述之樹脂組成物,其中,以排除溶劑的質量後之前述樹脂組成物的總質量作為基準計,前述無機填充材料的含量為93質量%以下。 The resin composition according to claim 1, wherein the content of the inorganic filler is 93% by mass or less based on the total mass of the resin composition after excluding the mass of the solvent. 如請求項1所述之樹脂組成物,其中,以排除溶劑的質量後之前述樹脂組成物的總質量作為基準計,前述無機填充材料的含量為85質量%以下。 The resin composition according to claim 1, wherein the content of the inorganic filler is 85% by mass or less based on the total mass of the resin composition after excluding the mass of the solvent. 如請求項1所述之樹脂組成物,其中,前述無機填充材料的平均粒徑為0.01~25μm。 The resin composition according to claim 1, wherein the average particle diameter of the inorganic filler is 0.01 to 25 μm. 如請求項1所述之樹脂組成物,其中,前述無機填充材料的平均粒徑為0.01~10μm。 The resin composition according to claim 1, wherein the average particle diameter of the inorganic filler is 0.01 to 10 μm. 如請求項1所述之樹脂組成物,其中,進一步含有溶劑。 The resin composition according to claim 1, which further contains a solvent. 一種硬化物,其為請求項1至10中任一項所述之樹脂組成物的硬化物。 A cured product which is a cured product of the resin composition according to any one of claims 1 to 10. 一種密封用薄膜,其包含請求項1至10中任一項所述之樹脂組成物。 A film for sealing comprising the resin composition according to any one of claims 1 to 10. 如請求項12所述之密封用薄膜,其中,溶劑的含量為0.2~1.5質量%。 The sealing film according to claim 12, wherein the content of the solvent is 0.2 to 1.5% by mass. 如請求項12或13所述之密封用薄膜,其厚度為20~250μm。 The sealing film described in claim 12 or 13 has a thickness of 20 to 250 μm. 一種密封結構體,其具備被密封體與密封部,該密封部將該被密封體密封,並且, A sealed structure including a body to be sealed and a sealing part, the sealing part sealing the body to be sealed, and, 前述密封部包含請求項1至10中任一項所述之樹脂組成物的硬化物。 The aforementioned sealing portion includes a cured product of the resin composition according to any one of claims 1 to 10. 如請求項15所述之密封結構體,其中,前述被密封體為電子零件。 The sealed structure according to claim 15, wherein the sealed body is an electronic component.
TW109141513A 2015-09-02 2016-09-02 Resin compositions, hardened materials, sealing films and sealing structures TWI825365B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015-172851 2015-09-02
JP2015172851 2015-09-02

Publications (2)

Publication Number Publication Date
TW202126719A true TW202126719A (en) 2021-07-16
TWI825365B TWI825365B (en) 2023-12-11

Family

ID=58187629

Family Applications (2)

Application Number Title Priority Date Filing Date
TW105128364A TWI714625B (en) 2015-09-02 2016-09-02 Resin composition, cured product, sealing film and sealing structure
TW109141513A TWI825365B (en) 2015-09-02 2016-09-02 Resin compositions, hardened materials, sealing films and sealing structures

Family Applications Before (1)

Application Number Title Priority Date Filing Date
TW105128364A TWI714625B (en) 2015-09-02 2016-09-02 Resin composition, cured product, sealing film and sealing structure

Country Status (5)

Country Link
JP (3) JP6763391B2 (en)
KR (1) KR102486893B1 (en)
CN (1) CN107924886A (en)
TW (2) TWI714625B (en)
WO (1) WO2017038941A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019017283A1 (en) 2017-07-21 2019-01-24 株式会社村田製作所 Electronic component
JP7400473B2 (en) * 2017-12-28 2023-12-19 株式会社レゾナック Epoxy resin compositions for sealing ball grid array packages, cured epoxy resins, and electronic component devices
WO2020065872A1 (en) * 2018-09-27 2020-04-02 日立化成株式会社 Resin composition for encapsulation, electronic component device and method for manufacturing electronic component device
JP2022107395A (en) * 2021-01-08 2022-07-21 昭和電工マテリアルズ株式会社 Thermosetting resin composition and electronic component device
CN114437511A (en) * 2021-12-31 2022-05-06 江苏科化新材料科技有限公司 Epoxy resin composition and application thereof, epoxy resin molding material and preparation method and application thereof

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56166729A (en) 1980-05-06 1981-12-22 Mitsubishi Electric Corp Automatic speed aligning device
JP2001127095A (en) 1999-10-29 2001-05-11 Shinko Electric Ind Co Ltd Semiconductor device and its manufacturing method
JP2001244372A (en) 2000-03-01 2001-09-07 Seiko Epson Corp Semiconductor device and its manufacturing method
JP3995421B2 (en) * 2001-01-19 2007-10-24 株式会社ルネサステクノロジ Epoxy resin composition for semiconductor encapsulation and semiconductor device using the same
JP2005200533A (en) 2004-01-15 2005-07-28 Kyocera Chemical Corp Epoxy resin composition for sealing semiconductor and resin-sealed semiconductor device
JP2006028264A (en) 2004-07-13 2006-02-02 Hitachi Chem Co Ltd Epoxy resin molding material for encapsulation and electronic component device
JP2008274083A (en) 2007-04-27 2008-11-13 Shin Etsu Chem Co Ltd Liquid epoxy resin composition and semiconductor device
JP2010229269A (en) 2009-03-26 2010-10-14 Panasonic Electric Works Co Ltd Heat-conductive epoxy resin sheet material
JP5308409B2 (en) * 2010-07-27 2013-10-09 パナソニック株式会社 Method for producing sheet-shaped epoxy resin composition material for electronic component sealing and electronic component
JP5799532B2 (en) 2011-03-10 2015-10-28 住友ベークライト株式会社 Semiconductor sealing resin composition, semiconductor device, and method for manufacturing semiconductor device
JP2013006893A (en) 2011-06-22 2013-01-10 Hitachi Chemical Co Ltd High thermal conductivity resin composition, high thermal conductivity cured product, adhesive film, sealing film, and semiconductor device using them
JP5983085B2 (en) 2012-06-25 2016-08-31 住友ベークライト株式会社 Epoxy resin composition and electronic component device
JP6171280B2 (en) * 2012-07-31 2017-08-02 味の素株式会社 Manufacturing method of semiconductor device
JP2015106698A (en) * 2013-12-02 2015-06-08 味の素株式会社 Method for manufacturing semiconductor device
WO2015098838A1 (en) * 2013-12-26 2015-07-02 日東電工株式会社 Method for producing semiconductor device, and thermosetting resin sheet
JP2015126124A (en) * 2013-12-26 2015-07-06 日東電工株式会社 Semiconductor package manufacturing method
WO2015098842A1 (en) * 2013-12-26 2015-07-02 日東電工株式会社 Method for manufacturing semiconductor device
JP6584752B2 (en) 2014-06-12 2019-10-02 日東電工株式会社 Resin sheet for sealing

Also Published As

Publication number Publication date
JP6763391B2 (en) 2020-09-30
JP2020200478A (en) 2020-12-17
TWI825365B (en) 2023-12-11
WO2017038941A1 (en) 2017-03-09
KR20180048674A (en) 2018-05-10
TW201718692A (en) 2017-06-01
CN107924886A (en) 2018-04-17
KR102486893B1 (en) 2023-01-09
JP2022136188A (en) 2022-09-15
JP7115520B2 (en) 2022-08-09
TWI714625B (en) 2021-01-01
JPWO2017038941A1 (en) 2018-06-14

Similar Documents

Publication Publication Date Title
JP6341277B2 (en) Film-like epoxy resin composition, method for producing film-like epoxy resin composition, and method for producing semiconductor device
JP7115520B2 (en) Sealing film and sealing structure
JP6749887B2 (en) Sealing film and electronic component device using the same
WO2016125350A1 (en) Epoxy resin composition, film-like epoxy resin composition, cured product, and electronic device
JP6705501B2 (en) Manufacturing method of sealing structure
JP7099453B2 (en) Encapsulating film, encapsulation structure and method for manufacturing encapsulation structure
JP6717005B2 (en) Resin composition, cured product, resin film, sealing material and sealing structure
JP7124819B2 (en) Sealing film, sealing structure, and method for producing sealing structure
TWI733014B (en) Manufacturing method of sealing film, electronic part device, and electronic part device
JP7070559B2 (en) Encapsulating film and encapsulation structure, and methods for manufacturing these
JP7354666B2 (en) Sealing film, sealing structure, and method for manufacturing the sealing structure
JP6544427B2 (en) Thermosetting resin composition, cured product, resin sheet, sealing structure and method for producing the same, electronic component device and method for producing the same
JP2018064054A (en) Encapsulation material, and manufacturing method of encapsulation structure