TW202125680A - Test tray and handler for testing electronic component - Google Patents

Abstract

The present invention relates to a test tray used for a test of an electronic component, and to a handler for an electronic component test. According to the test tray and the handler for an electronic component test of the present invention, the test tray is provided with a separate movable loading frame in which electronic components are loaded to move an electronic component step by step in a test section, and a step support device is configured for moving the loading frame in the handler. According to the present invention, when the electronic component to be tested is changed to have a high specification or the increased size thereof, the tester can be reused while minimizing the reduction of the processing capacity, thereby reducing the burden of waste of resources or costs.

Description

Test tray and sorting machine for electronic component testing

The present invention relates to a test tray used in testing of electronic components and a sorting machine for testing electronic components that moves the corresponding test trays and supports the testing of electronic components.

Electronic components such as semiconductor components produced are classified into good and defective products after being tested by a testing machine, and only good products are shipped.

The electrical connection between the testing machine and the electronic components is realized by a sorting machine for testing electronic components (hereinafter referred to as "sorting machine").

Generally, the sorting machine is manufactured in various forms according to the various types of electronic components to be tested. Such sorting machine can be roughly divided into whether to use a test tray.

Some sorting machines have a structure in which the electronic components are directly electrically connected to the testing machine in a state where the electronic components are gripped (refer to Korean Laid-open Patent No. 10-2002-0028480). However, other types of sorting machines have a structure in which the electronic components are electrically connected to the testing machine in a state where the electronic components are loaded on the test tray (refer to Korean Patent No. 10-0801927). Since the number of electronic components that can be tested at one time in the former is small, it is necessary to manufacture a sorting machine using test trays like the latter in terms of increasing the processing capacity. The present invention relates to the latter sorting machine using test trays.

Recently, in order to advance the performance of electronic components and focus on the development of integration technology, the number of terminals that need to be in contact with the tester is increasing rapidly. In addition, for semiconductor components, multiple semiconductor components are required to achieve the required performance. The combination is a product, so its size increase will happen frequently. In this case, the capacity of the test machine must be increased.

For example, if the number of terminals of an electronic component increases, the limited number of electronic components in the tester cannot test the same number of electronic components at one time. If the size of the electronic component changes, the electrical connection position between the electronic component and the tester Change too. Therefore, it is necessary to replace the test machine with a high-spec test machine or plan to increase the capacity through improvement. However, in reality, not only huge costs will be incurred, but also high-end technology is required. In addition, it is accompanied by replacing the sorting machine that meets the high-standard testing machine or increasing the capacity of the sorting machine. In this way, even if the specifications of electronic components are advanced, it is necessary to use existing testers due to various practical difficulties such as cost burdens. Based on this, the following examples can be considered.

First, it is possible to reduce the number of electronic components to be tested at one time. In this case, it is necessary to improve the interface panel (the part that is electrically connected to the electronic components) of the test machine, replace the test tray used in the sorting machine with a test tray that can load a smaller amount of material, and replace or improve the corresponding Various structures such as the connection structure of the test tray. Of course, in the case of adopting such a method, a substantial increase in processing speed and its accompanying costs must be accepted.

Second, when the size of the electronic component to be tested becomes larger, a method of increasing the overall size of the tray can also be considered. However, in this case, the existing sorting machine cannot be used due to the change in the size of the pallet. Therefore, it is necessary to replace the expensive sorting machine with a cost burden.

Thirdly, instead of the above-mentioned first method or second method, as described above with reference to Korean Granted Patent No. 10-0801927, it has the following technology (hereinafter referred to as "prior art"): In the test interval in the test chamber, the test tray is moved at predetermined intervals, and then the electronic components are sequentially electrically connected to the test machine through two stages. If this method is used, the existing testing machine and sorting machine can all be reused by adopting a minimal configuration change, and it is only necessary to accept a reduction in the processing speed that is minimized.

Next, the above three methods will be explained in more detail.

It can be seen that the above three methods are methods of moving the test tray in stages in the test section with the electronic components loaded on the test tray. It can be seen that what is important here is the phased movement of the electronic components loaded on the test tray. That is, the step-by-step movement of the test tray is only an additional flow for the step-by-step movement of the electronic components. Therefore, the prior art can only be used when the moving direction of the test tray in the test section is consistent with the phased moving direction of the electronic component.

Therefore, if during the cyclic movement of the test tray, the moving direction of the test tray in the test section does not match the phased moving direction of the electronic component used for the phased test (the direction perpendicular to the moving direction of the test tray), Then the existing technology cannot be applied. Moreover, in this case, the first method or the second method above must still be adopted, which means that the aforementioned cost burden or a substantial reduction in processing speed must still be borne. Of course, since the phased movement direction of the electronic component is determined according to the structure of the tester, if the owner of the sorting machine will change the test in a way that the movement direction of the test tray is consistent with the phased movement direction of the electronic component The specification of the machine solves the difficulty, but it is difficult to expect the owner to change the expensive test machine, which is much more expensive than the sorting machine. That is, from the perspective of the owner, the testing machine is very expensive, so it is more desirable to use it continuously rather than replacing it. Therefore, it is necessary to replace or improve a sorting machine that is relatively cheaper than the testing machine. Therefore, it is more realistic to adjust the sorting machine in consideration of the direction and arrangement of the sockets of the existing testing machine or the new type of testing machine.

The object of the present invention is to provide a technique that can be used when an electronic component is moved in a stepwise direction in the same direction as the moving direction of the test tray or in a vertical direction in a test area.

The test tray of the sorting machine for testing electronic components according to the present invention includes: an outer profile frame, which determines the outer profile size of the test tray; The applied moving force moves and enables a plurality of electronic components to be loaded with a predetermined interval.

The test tray of the sorting machine for testing electronic components further includes: a fixer arranged on the outer frame to fix the loading frame in at least two positions to prevent the loading frame from moving arbitrarily, and can The fixed state of the loading frame is released by the operation of the sorting machine, wherein the interval between the at least two positions is the interval between mutually adjacent electronic components loaded on the loading frame.

The loading frame includes a fixing component having at least two fixing grooves for fixing the position of the loading frame, and the fixing device includes a fixing rod having a fixing protrusion, and the fixing protrusion is selectively inserted into the mounting frame. The at least two fixing grooves are capable of fixing the position of the loading frame in at least two positions; and an elastic member that applies elastic force so that the fixing protrusions remain selectively inserted into the at least two fixing grooves In the state, the interval between the adjacent fixing grooves is the interval between the adjacent electronic components loaded on the loading frame.

In the test interval, the moving direction of the loading frame is a direction perpendicular to the moving direction of the outer frame.

The sorting machine for testing electronic components according to the present invention includes: a loading device for loading electronic components to be tested on a test tray at a loading position; and a connecting device for electrically connecting the electronic components loaded on the test tray to the testing machine The test tray is the test tray that arrives at the test position after the loading of the electronic components is completed by the loading device; the unloading device is the unloading position after the completion of the test of the electronic components that are electrically connected to the testing machine through the connecting device The test tray unloads the electronic components that have been tested; and a step-by-step support device that supports the electronic components loaded on the test tray to pass through at least two rounds of stages and are sequentially electrically connected to the testing machine through the connecting device, and the sub- The step support device includes: a step-by-step mover that moves the loading frame of the test tray through at least two rounds relative to the outer frame and sequentially moves, so that the electronic components loaded on the test tray can pass through the connection The device is connected to the testing machine in stages, and the test tray is the test tray as described in claim 1.

The step-by-step support device further includes: a manipulator for manipulating a fixer for fixing the position of the loading frame provided on the test tray, so that the loading frame is in a state capable of moving relative to the outer frame of the test tray .

A long long hole is formed in the loading frame along a direction perpendicular to the moving direction of the loading frame, and the step mover includes: a moving pin for inserting or detaching from the long hole; and a rotation source for making the The moving pin rotates; and a rotating shaft is provided with the moving pin and is rotated by means of the operation of the rotation source, thereby finally rotating the moving pin, the rotation center of the moving pin and the rotation of the rotating shaft The center is separated by a predetermined interval, so that if the moving pin rotates while being inserted into the long hole, the loading frame can move linearly.

The sorting machine for testing electronic components further includes a restoration device for restoring the loading frame to its original position after the loading frame is moved by the step support device.

The restoration device is provided between the loading position and the unloading position so as to move the loading frame of the test tray on the way from the unloading position to the loading position to the original position.

In the test interval, the moving direction of the loading frame is a direction perpendicular to the moving direction of the outer frame.

According to the present invention, it is possible to manufacture a sorting machine corresponding to the phased movement direction of the electronic components in the test section in accordance with the specifications of the testing machine, and in particular, it is possible to manufacture the electronic components in the test section in a direction perpendicular to the direction of movement of the test tray. Sorting machine that moves in stages. According to this, even if the electronic components to be tested are of high specifications or large in size, it is possible to realize the recycling of expensive resources such as test machines, so that the reduction in processing capacity can be minimized, and resource waste or cost burden can be reduced at the same time.

The preferred embodiments according to the present invention will be described with reference to the accompanying drawings. For the sake of brevity of the description, the description of the repeated or substantially the same configuration is omitted or condensed as much as possible. ＜Description of the test tray＞

FIG. 1 is a perspective view of a test tray 100 according to the present invention, and FIG. 2 is an exploded perspective view of the test tray 100 of FIG. 1.

As shown in FIGS. 1 and 2, the test tray 100 includes an outer frame 110, a loading frame 120 and a pair of holders 130.

The outer frame 110 determines the outer size of the test tray 100. In addition, a loading frame 120 and a fixture 130 are provided on the outer frame 110. Such an outer frame 110 is equipped with four guides GE for guiding the movement of the loading frame 120 and supporting the loading frame 120.

Two of the four guides GE each constitute a pair, and are equipped in a convex form that protrudes long in the moving direction of the loading frame 120.

The loading frame 120 is movably disposed on the outer frame 110 so as to move by means of the moving force applied by the sorting machine. Such a loading frame 120 has a plurality of loaders 121 so that a plurality of electronic components D can be loaded with a predetermined interval.

The loader 121 includes a pair of loading elements LE1 and LE2 for supporting both ends of the electronic component D. Such loading elements LE1 and LE2 can be opened by an opener provided in the sorting machine, so that the sorting machine can load or take out the electronic component D, and when closed, the electronic component D can be kept in a state in which the electronic component D is placed in the loading frame 120. Such a loader 121 and its opening and closing technology are described in detail in Korean Patent Publication No. 10-2011-0136312 (the loader is named a socket in this patent document), and therefore, detailed descriptions thereof are omitted.

In addition, the loading frame 120 has guide holes GH corresponding to the four guides GE described above, a pair of fixing members 122 for fixing the position of the loading frame 120, and a transmission member 123.

The guide GE of the outer frame 110 is inserted into the guide hole GH. Therefore, the loading frame 120 is supported on the outer frame 110, and the loading frame 120 can stably move along the length direction of the guide GE.

The fixing member 122 is equipped to restrain and fix the position of the loading frame 120. Two fixing grooves FG are formed in the fixing member 122 in the front-rear direction, and the interval between the two fixing grooves FG is the same as the interval between the adjacent electronic components D mounted on the loading frame 120.

The transmission member 123 is equipped to receive the moving force of the sorting machine, so that the loading frame 120 can be moved by the moving force from the sorting machine. The moving force of the rotational force state is converted into the long hole LH of the linear moving force. In this regard, a description will be added in the later operating instructions.

The holder 130 is equipped to fix the position of the loading frame 120 in a state where the movement is completed in each stage. In this embodiment, the loading frame 120 can be fixed at the position of the original loading frame 120 and the moving position of the loading frame 120 after one step. To this end, as shown in the partial view of FIG. 3, the holder 130 includes a fixing rod 131 and an elastic member 132.

The fixing rod 131 is inserted into the fixing groove FG above, and has a fixing protrusion 131a capable of restraining and fixing the position of the loading frame 120 at the current position, and its end is hinged so that it can move up and down.

The elastic member 132 is equipped as a spring in order to apply an elastic force in a direction in which the fixing protrusion 131a is kept inserted into the fixing groove FG. The elastic member 132 is provided on the side of the fixing protrusion 131 a, and the operating force for operating the fixing rod 131 is applied to the opposite side of the elastic member 132. Therefore, as shown in FIG. 4, if the operating force F is applied downward to the portion on the opposite side where the elastic member 132 is located, the fixing protrusion 131a rises and disengages from the fixing groove FG, and the fixing of the loading frame 120 is released. In addition, if the fixing of the loading frame 120 is released in this way, the loading frame 120 can move relative to the outer frame 110.

In addition, as shown in the schematic plan view of FIG. 5, in the test tray 100, for example, the electronic component D may be loaded with 2 rows, and each row has 16 electronic components D. That is, in the test tray 100 according to the present embodiment, a total of 32 electronic components D can be loaded in a 2×16 row and column form.

If the test tray 100 as described above is applied, 32 electronic components D can be tested at a time by the test machine.

However, due to the increase in the number of electronic components D to be tested today and other reasons, in the case that the number of tests that can be tested by the test machine at one time is reduced, the test can be carried out in two stages. For example, if the test tray 100 reaches the test position, in the state of FIG. 5, 16 electronic components D located in the odd-numbered column first pass the first stage of testing. Next, after the loading frame 120 moves forward as shown in FIG. 6, the remaining 16 electronic components D located in the even-numbered columns pass the second stage of testing. At this time, the movement interval of the loading frame 120 is the same as the interval of the electronic components D adjacent to each other. ＜Schematic description of the sorting machine＞

FIG. 7 is a conceptual plan view of a sorting machine 200 (hereinafter, simply referred to as "sorting machine") for testing electronic components according to an embodiment of the present invention.

As shown in FIG. 7, the sorting machine 200 according to the present invention includes a loading device 210, a heat treatment chamber (Soak chamber) 220, a test chamber 230, a connecting device 240, two rail devices 250, a deheating chamber 260, and an unloading device. Device 270, two step-by-step support devices 280, and restoration device 290.

The loading device 210 loads the electronic component D to be tested from the customer tray CT1 to the test tray 100 at the loading position LP.

The heat treatment chamber 220 pre-heats or pre-cools the electronic components D loaded in the test tray 100 accommodated.

The test chamber 230 is equipped so that the electronic component D loaded in the contained test tray 100 is tested under the required temperature condition.

The connecting device 240 electrically connects the electronic components D loaded in the two test trays TT at the test positions TP1 and TP2 to the testing machine.

The rail device 250 supports the outer frame 110 of the test tray 100 at the test positions TP1 and TP2 and guides the movement thereof.

The above-mentioned connecting device 240 and track device 250 will be listed in the following sections for more detailed description.

The heat-relieving chamber 260 restores the electronic component D loaded on the test tray 100 to be close to the normal temperature.

The unloading device 270 unloads the electronic components D loaded on the test tray 100 from the deheating chamber 260 to the unloading position UP from the test tray 100, sorts them according to the test level, and then loads them to the empty customer tray CT2.

The step support device 280 supports the electronic components D loaded in the test tray 100 contained in the test chamber 230 to be electrically connected to the testing machine through the connection device 240 in two rounds. The step-by-step support device 280 will be divided into categories and described in more detail below.

The restoration device 290 restores the test tray 100 changed by the step support device 280 to its original state.

In addition, the test tray 100 can be circulated along the closed circulation path C connected to the loading position LP through the loading position LP, the test positions TP1, TP2, the unloading position UP, and the waiting position WP by a plurality of transfer devices not shown. move.

When the test tray 100 is located at the loading position LP, the electronic component D to be tested is loaded on the test tray 100 through the loading device 210.

When the test tray 100 is located at the test positions TP1 and TP2, the electronic component D loaded on the test tray 100 is electrically connected to the testing machine through the connecting device 240, so that the electronic component D can be tested by the testing machine.

At the unloading position UP, the electronic component D that has been tested is unloaded from the test tray 100 by the unloading device 270.

At the waiting position WP, the next empty test tray 100 waits before moving to the loading position LP, until the previous test tray 100 performing the loading operation at the current loading position LP completes the loading operation and moves to the heat treatment chamber 220 until. In order to make full use of the time corresponding to the waiting state of the test tray 100 at the waiting position WP on the way from the unloading position UP to the loading position LP, preferably, the above-mentioned restoring device 290 is equipped in the unloading position. Waiting position WP between UP and loading position LP.

For reference, although the sorting machine 200 having a structure in which the electronic components D loaded on two test trays 100 are tested at a time in order to expand the processing capacity is shown in the conceptual diagram of FIG. 7, it can be simplified according to the embodiment. In order to test the structure of only the electronic component D mounted on one test tray 100 at a time. ＜Description of the specific part of the sorting machine＞

FIG. 8 is a perspective view of a characteristic part extracted from the sorting machine 200 of FIG. 7.

Referring to FIG. 8, the connecting device 240, the track device 250, and the step support device 280 are organically arranged as a module.

Hereinafter, the main configuration will be extracted from FIG. 8 for description. However, as described above, the present embodiment has a structure in which the electronic components D loaded on the two test trays 100 are tested together at one time. Therefore, it is considered that the configuration is repeated. Therefore, for the sake of simplicity of explanation, only the excerpts are included except when necessary. Take one side of the structure for description. 1. Connecting device 240

FIG. 9 is a perspective view of the connecting device 240 that electrically connects the electronic component D loaded on the test tray 100 to the tester.

As shown in FIG. 9, the connecting device 240 includes a pressure driving source 241, a lifting plate 242 and two pressure plates 243.

The pressurized driving source 241 generates a driving force for raising and lowering the elevating plate 242. Such a pressurized driving source 241 needs to realize the multi-stage lifting of the lifting plate 242, so a servo motor may be better considered.

The lifting plate 242 is lifted and lowered in accordance with the operation of the pressurizing drive source 241.

The pressure plates 243 are equipped with a total of two so as to correspond to one test tray 100, respectively. Such a pressure plate 243 is coupled to the lifting plate 242 by four coupling rods B1, and is raised and lowered along with the lifting of the lifting plate 242. Through the lifting, the electronic component D loaded on the test tray 100 is opposed to the socket side of the tester. Pressurize or depressurize. For this reason, it is preferable that the pressing plate 243 has the same number of pushers P as the number of electronic components D loaded on the test tray 100. However, since the present invention is characterized by a staged test of the electronic component D loaded on the test tray 100, in FIG. 8, in order to illustrate the staged test, it is shown that the pressure plate 243 is only loaded on the test tray 100. There are a total of 32 electronic components D in 2 rows and 16 columns, which is half of the number, that is, a total of 16 pushers P in 2 rows and 8 columns. Here, the interval between the pushers P is twice the interval between the adjacent electronic components D loaded on the test tray 100. Of course, if the specifications of the testing machine can be supported, the pressure plate 243 will be equipped with a total of 32 pushers P in 2 rows and 16 columns. In this case, the pushers P and the electronic components D are configured as a one-to-one Corresponding. 2. Track device 250

FIG. 10 is a perspective view of a rail device 250 that supports and guides the movement of the test tray 100 at the test positions TP1 and TP2.

The rail device 250 includes a rail lifting source 251, a lifting frame 252, and a pair of guide rails 253a, 253b.

The rail raising and lowering source 251 generates power for raising and lowering the pair of guide rails 253 a and 253 b, and is provided on the raising and lowering plate 242. Therefore, the rail device 250 is also raised and lowered along with the raising and lowering of the lifting plate 242.

The lifting frame 252 is lifted and lowered in accordance with the operation of the rail lifting source 251.

A pair of guide rails 253a and 253b are provided symmetrically to each other to guide the movement of the test tray 100 or support the test tray 100 located at the test positions TP1 and TP2.

Of course, the elevating frame 252 and the pair of guide rails 253a, 253b are coupled to each other by the coupling bar B2, so that the elevating of the elevating frame 252 is linked with the elevating of the pair of guide rails 253a, 253b.

For reference, since the rail lifting source 251 is provided on the lifting plate 242, the rail device 250 is also lifted and lowered along with the lifting plate 242. However, since the rail lifting source 251 operates independently of the pressurizing drive source 241, the rail device 250 The guide rails 253a and 253b can be raised and lowered independently of the pressure plate 243 of the connecting device 240, so that the guide rails 253a and 253b can be raised and lowered relative to the pressure plate 243. 3. Step-by-step support device

FIG. 11 is a partial view of a step-by-step support device 280 for supporting a step-by-step test of the electronic component D loaded on the test tray 100.

As shown in FIG. 11, the step support device 280 includes a step mover 281 and a manipulator 282.

As shown in FIG. 12, the step mover 281 includes a moving pin 281a, a rotating source 281b, a rotating shaft 281c, and a lifting source 281d.

The moving pin 281a is equipped to be capable of being raised and lowered, and is inserted into or removed from the long hole LH of the transmission member 123 equipped in the test tray 100.

The rotation source 281b provides power for rotating the moving pin.

A lifting source 281d and a moving pin 281a are provided at the lower end of the rotating shaft 281c, and the rotating shaft 281c is rotated by the operation of the rotating source 281b. Therefore, if the rotation shaft 281c is rotated by the operation of the rotation source 281b, the moving pin 281a finally provided at the lower end thereof will also rotate.

The lifting source 281d is provided at the lower end of the rotating shaft 281c, and provides power for lifting the moving pin 281a. That is, when the lift source 281d is operated, the moving pin 281a moves up and down, and the moving pin 281a is inserted into or separated from the long hole LH.

Here, the rotation center O1 of the moving pin 281a and the rotation center O2 of the rotation shaft 281c are separated by a predetermined interval. That is, the moving pin 281a and the rotation center O2 of the rotating shaft 281c are deflected at a predetermined interval. Therefore, when the moving pin 281a rotates while being inserted into the long hole LH of the transmission member 123, as shown to (a) and (b) with reference to FIG. 13, the loading frame 120 will move linearly. Therefore, the transmission member 123 also functions as a conversion member that converts rotational force into linear force.

The manipulator 282 has a function of manipulating the fixer 130 for restraining and fixing the position of the loading frame 120 to release its fixed state. To this end, as shown in FIG. 14, the manipulator 282 includes a pair of manipulation drive sources 282a, an elevating member 282b, and a pair of manipulation pins 282c.

The pair of steering drive sources 282a provide power for raising and lowering the elevating member 282b.

The elevating member 282b is raised and lowered in accordance with the operation of the manipulation driving source 282a.

The pair of manipulation pins 282c are provided so as to protrude downward, and are coupled to the elevating member 282b to move up and down together with the elevating member 282b.

FIG. 15(a) shows the current state where the holder 130 fixes the loading frame 120, and FIG. 15(b) shows that the lifting member 282b and the manipulation pin 282c descend and manipulate the holder with the operation of the manipulation driving source 282a 130 status. That is, Fig. 15(a) is a state where the fixing protrusion 131a of the holder 130 is inserted into the fixing groove FG of the fixing member 122, and Fig. 15(b) is the lowering of the manipulation pin 282c and pressing the other side of the fixing rod 131 downward Thereby, the fixer 130 releases the fixed state of the loading frame 120. The test on the electronic component D was performed in the state of FIG. 15(a), and the movement of the loading frame 120 was performed in the state of FIG. 15(b). ＜Description of the operation of the main parts＞ 1. Equipped with a high-spec test machine

When equipped with a high-standard testing machine, 64 electronic components D loaded on two test trays 100 can be tested together at one time. However, for the sake of simplicity of description, the description is based only on the 32 electronic components D loaded on one test tray 100.

In this case, the pressure plate 243 is equipped with a total of 32 pushers P in 2 rows and 16 columns, so that each pusher P can all correspond to the electronic components D loaded on the test tray 100 one-to-one.

When the test tray 100 comes to the test positions TP1, TP2 and is supported by the guide rails 253a, 253b, the guide rails 253a, 253b rise, so that the pusher P of the pressure plate 243 and the electronic component D loaded on the test tray 100 are first matched . Next, the pressure plate 243 is lowered, so that the electronic component D loaded on the test tray 100 is connected to the test machine. 2. When equipped with a low-spec test machine

When a low-spec tester is equipped, it is impossible to test all the 32 electronic components D loaded on one test tray 100 at a time. Therefore, it is necessary to perform a staged test twice. At this time, the pressing plate 243 is equipped with two rows and eight columns of pushers P. Of course, the interval between adjacent pushers P is twice the interval between adjacent electronic components D loaded on the test tray 100.

First, when the test tray 100 arrives at the test positions TP1 and TP2 in the state of (a) in FIG. 13, the guide rails 253a and 253b rise. Therefore, the electronic component D located in the odd-numbered column is matched to the pusher P. Then, after the pressure plate 243 is lowered to realize the electrical connection between the electronic components D in the odd-numbered rows and the tester, the first stage of the test is performed.

If the test of the first stage is completed, first the pressure plate 243 is raised by a predetermined interval, and the guide rails 253a and 253b are lowered. Next, the manipulator 282 operates to release the fixed state of the loading frame 120 realized by the fixer 130, and the step mover 281 operates to move the loading frame 120, thereby converting the test tray 100 to the state of FIG. 13(b) . Of course, when the test tray 100 is converted to the state of FIG. 13( b ), the manipulation pin 282 c rises, and the loading frame 120 is fixed by the holder 130.

If the guide rails 253a and 253b rise in the state of (b) in FIG. 13, the 16 pushers P and the 16 electronic components D located in the even-numbered columns are mutually equipped. Then, after the pressure plate 243 is lowered to realize the electrical connection between the even-numbered column of the electronic component D and the tester, the second stage of the test is performed.

Referring again to FIG. 7, on the circulation path C, the test tray 100 passing through the test positions TP1 and TP2 moves in a direction from the left to the right. However, it can be seen that the moving direction of the loading frame 120 and the electronic component D loaded on the loading frame 120 realized by the step-by-step support device 280 for the step-by-step test of the present embodiment is the movement from the back to the front. That is, in this embodiment, for the staged test of the electronic component D, the electronic component D is moved perpendicular to the movement path of the test tray 100. ＜Additional explanation of the restoration of the original device＞

The restoring device 290 restores the loading frame 120 of the test tray 100 to the waiting position WP in the state changed to the state of FIG. 13(b) by the step support device 280 to its original state, that is, FIG. 13(a) status. For this reason, the restoring device 290 has the same configuration as the step support device 280, and therefore the detailed description thereof is omitted. ＜References＞ 1. Regarding the moving direction of the loading frame 120

The present invention is derived for the purpose of application when the moving direction of the test tray 100 is perpendicular to the moving direction of the electronic component D used for the staged test. For the above embodiments, it is similarly implemented as an electronic component D is a form of moving in a direction perpendicular to the moving direction of the test tray 100.

However, according to the embodiment, the present invention can also be sufficiently applied to the case where the moving direction of the test tray 100 and the moving direction of the electronic component D are the same. This can be achieved simply by changing the arrangement of the long hole LH and the moving pin 281a. 2. Regarding the number of stages

Although it is assumed in the above embodiment that the electronic component D loaded on the test tray 100 is tested in two stages, it can also be implemented as passing through the length of the elongated hole LH, the moving pin 281a, and the rotating shaft 281c. The interval between the two and the rotation and stop of the moving pin 281a in three or more stages causes the electronic component D loaded on the test tray 100 to undergo the test in three or more stages. 3. About restoration

In this specification, a separate restoring device 290 is provided to restore the state of the test tray 100 to the original state.

However, according to the embodiment, if the second stage of the test is completed, the step-by-step support device 280 can be controlled to restore the test tray 100 to its original state. In this case, the configuration of a separate restoration device can be omitted.

In addition, through the procedural control of the loading device 210 and the unloading device 270, it is possible to consider omitting a separate restoration process to implement loading and unloading operations corresponding to the current state of the test tray 100 (the current position of the loading frame). .

However, the method of restoring to the original state by the step-by-step support device 280 is performed at the test positions TP1 and TP2. Therefore, the test machine cannot be used flexibly during the time of restoring to the original state, and the method of omitting a separate restoration process through procedural control requires complicated Algorithm development and complex control.

Therefore, as described in the above embodiment, it can be best considered to equip with a separate restoring device 290 for restoring the test tray 100 waiting at the waiting position WP to its original state. That is, as described in this embodiment, a separate restoring device 290 is provided at the waiting position WP, so that the operation of restoring the test tray 100 to its original state does not limit the processing capacity of the sorting machine 200 or the testing machine, and its control can also be simple accomplish.

As mentioned above, although the present invention has been specifically described based on the embodiments with reference to the drawings, the above-mentioned embodiments only illustrate the preferred embodiments of the present invention, and therefore should not be construed as limiting the present invention to the above-mentioned embodiments. The scope of rights of the present invention should be understood in accordance with the scope of the patent application and its equivalent scope.

100: test tray 110: Outer frame 120: loading frame 122: fixed parts FG: fixed groove 123: Passing parts LH: Long hole 130: Fixer 131: fixed rod 131a: fixed protrusion 132: Elastic parts 200: Sorting machine for electronic component testing 210: loading device 240: Connecting device 270: Uninstall device 280: Step-by-step support device 281: Step Mover 281a: moving pin 281b: Rotation source 281c: Rotation axis 282: Manipulator 290: Restoration Device

Fig. 1 is a perspective view of a test tray according to an embodiment of the present invention.

Fig. 2 is an exploded perspective view of the test tray of Fig. 1.

Fig. 3 is a partial view of a fixture provided on the test tray of Fig. 1.

Fig. 4 is a reference diagram for explaining the operating state of the holder of Fig. 3.

5 and 6 are reference diagrams for explaining the state change of the test tray in FIG. 1.

Fig. 7 is a conceptual plan view of a sorting machine for testing electronic components according to an embodiment of the present invention.

Fig. 8 is a perspective view of a characteristic part extracted from the sorting machine of Fig. 7.

Fig. 9 is a perspective view of the connecting device taken from the sorting machine of Fig. 7.

Fig. 10 is a perspective view of the rail device taken from the sorting machine of Fig. 7.

Fig. 11 is a perspective view of the step support device taken from the sorting machine of Fig. 7.

Fig. 12 is a perspective view of the step mover taken from the sorting machine of Fig. 7;

Fig. 13 is a reference diagram for explaining the operation of the step shifter of Fig. 12.

Fig. 14 is a perspective view of the manipulator removed from the sorting machine of Fig. 7.

Fig. 15 is a reference diagram for explaining the operation of the manipulator of Fig. 14.

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100: test tray

240: Connecting device

250: Orbital device

280: Step-by-step support device

281: Step Mover

282: Manipulator

Claims (10)

A test tray of a sorting machine for testing electronic components, comprising: The outer profile frame, which determines the outer profile size of the test tray; the loading frame, which is movably arranged on the outer profile frame, so that it can be placed on the outer profile frame by means of the moving force exerted by the sorting machine A plurality of electronic components can be loaded in the loading frame with a predetermined interval; and a fixer is provided on the outer frame to fix the loading frame in at least two positions to prevent The loading frame can move arbitrarily, wherein the fixing device can release the fixed state of the loading frame by operating the sorting machine, wherein the loading frame includes a fixing part, and the fixing part is used to fix the loading frame s position. The test tray of the sorting machine for testing electronic components according to claim 1, wherein the interval between the at least two positions is the interval between mutually adjacent electronic components loaded on the loading frame. The test tray of the sorting machine for testing electronic components according to claim 1, wherein The fixing member includes at least two fixing grooves, and the fixing device includes: a fixing rod having a fixing protrusion, and the fixing protrusion is selectively inserted into the at least two fixing grooves to enable the position of the loading frame Fixed in at least two positions; and an elastic member that applies elastic force so that the fixing protrusion is selectively inserted into the at least two fixing grooves, and the interval between the adjacent fixing grooves is loaded The interval between adjacent electronic components of the loading frame. The test tray of the sorting machine for testing electronic components according to claim 1, wherein In the test interval, the moving direction of the loading frame relative to the outer frame is a direction perpendicular to the moving direction of the outer frame. A sorting machine for testing electronic components, including: The loading device loads the electronic components to be tested on the test tray at the loading position; the connecting device electrically connects the electronic components loaded on the test tray to the testing machine, and the test tray is used to complete the electronic components through the loading device. After the component is loaded to the test tray at the test position; an unloading device, from the electronic component electrically connected to the testing machine through the connecting device after the test is completed to the test tray at the unloading position, unloads the electronic component that has been tested; and A step support device that supports the electronic components loaded on the test tray to pass through at least two rounds of stages to be sequentially electrically connected to the testing machine through the connection device. The step support device includes: a step mover to make the test The loading frame of the tray moves sequentially through at least two stages relative to the outer frame, so that the electronic components loaded on the test tray can be connected to the testing machine in stages through the connecting device, and the test tray is The test tray as described in claim 1. The sorting machine for testing electronic components according to claim 5, wherein The step-by-step support device further includes: a manipulator for manipulating a fixer for fixing the position of the loading frame provided on the test tray, so that the loading frame is in a state capable of moving relative to the outer frame of the test tray . The sorting machine for testing electronic components according to claim 6, wherein A long long hole is formed in the loading frame along a direction perpendicular to the moving direction of the loading frame, and the step mover includes: a moving pin for inserting or detaching from the long hole; and a rotation source for making the The moving pin rotates; and a rotating shaft is provided with the moving pin and is rotated by means of the operation of the rotation source, thereby finally rotating the moving pin, the rotation center of the moving pin and the rotation of the rotating shaft The center is separated by a predetermined interval, so that if the moving pin rotates while being inserted into the long hole, the loading frame can move linearly. The sorting machine for testing electronic components according to claim 5, which further includes: A restoration device for restoring the loading frame to its original position after the loading frame is moved by the step support device. The sorting machine for testing electronic components according to claim 8, wherein The restoration device is provided between the loading position and the unloading position so as to move the loading frame of the test tray on the way from the unloading position to the loading position to the original position. The sorting machine for testing electronic components according to claim 5, wherein In the test interval, the moving direction of the loading frame relative to the outer frame is a direction perpendicular to the moving direction of the outer frame.

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