TW201939009A - 粒子檢測感測器 - Google Patents

粒子檢測感測器 Download PDF

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Publication number
TW201939009A
TW201939009A TW108104745A TW108104745A TW201939009A TW 201939009 A TW201939009 A TW 201939009A TW 108104745 A TW108104745 A TW 108104745A TW 108104745 A TW108104745 A TW 108104745A TW 201939009 A TW201939009 A TW 201939009A
Authority
TW
Taiwan
Prior art keywords
particles
particle
light
mass concentration
detection sensor
Prior art date
Application number
TW108104745A
Other languages
English (en)
Chinese (zh)
Inventor
永谷吉祥
中川貴司
安池則之
Original Assignee
日商松下知識產權經營股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商松下知識產權經營股份有限公司 filed Critical 日商松下知識產權經營股份有限公司
Publication of TW201939009A publication Critical patent/TW201939009A/zh

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06Investigating concentration of particle suspensions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW108104745A 2018-02-27 2019-02-13 粒子檢測感測器 TW201939009A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018-033439 2018-02-27
JP2018033439 2018-02-27

Publications (1)

Publication Number Publication Date
TW201939009A true TW201939009A (zh) 2019-10-01

Family

ID=67808827

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108104745A TW201939009A (zh) 2018-02-27 2019-02-13 粒子檢測感測器

Country Status (5)

Country Link
JP (1) JP6883770B2 (fr)
KR (1) KR102321560B1 (fr)
CN (1) CN111630365B (fr)
TW (1) TW201939009A (fr)
WO (1) WO2019167485A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI735191B (zh) * 2020-03-27 2021-08-01 國立陽明交通大學 光達除霧系統與方法
TWI739528B (zh) * 2020-07-24 2021-09-11 熱映光電股份有限公司 氣體檢測裝置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10935480B1 (en) 2018-09-26 2021-03-02 Airviz Inc. Optical-particle sensor head
DE112019007992T5 (de) * 2019-12-23 2022-10-27 Robert Bosch Gesellschaft mit beschränkter Haftung Überwachungseinrichtung für ein gasförmiges Fluid und Verfahren zum Überwachen von Eigenschaften eines gasförmigen Fluids

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JPH0718788B2 (ja) * 1988-11-08 1995-03-06 富士電機株式会社 光学的微粒子測定装置
JPH0785052B2 (ja) * 1990-11-17 1995-09-13 株式会社堀場製作所 粒度分布解析方法
JP3672158B2 (ja) * 1997-03-10 2005-07-13 富士電機システムズ株式会社 濁度の測定方法および装置
US6191853B1 (en) * 1998-09-29 2001-02-20 Horiba, Ltd. Apparatus for measuring particle size distribution and method for analyzing particle size distribution
JP3645760B2 (ja) * 1998-10-30 2005-05-11 株式会社堀場製作所 粒子径分布解析方法
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JP2001337028A (ja) * 2000-05-30 2001-12-07 Nikkiso Co Ltd 粒度分布測定方法および装置
JP5104643B2 (ja) * 2008-08-19 2012-12-19 株式会社島津製作所 粒子径測定装置及び粒子径測定方法
JP5212224B2 (ja) * 2009-03-31 2013-06-19 トヨタ自動車株式会社 粒径分布モデル作成方法、当該粒径分布モデル作成方法を用いた燃料電池触媒の劣化予測方法、及び当該燃料電池触媒の劣化予測方法を用いた燃料電池の制御方法
KR100962541B1 (ko) * 2010-02-11 2010-06-14 한은정 액중 미립자 측정기의 교정 방법
JP5950319B2 (ja) * 2010-06-15 2016-07-13 新日本空調株式会社 パーティクル濃度測定装置
US8854621B1 (en) * 2012-08-29 2014-10-07 University Of South Florida Systems and methods for determining nanoparticle dimensions
JP2015072135A (ja) * 2013-10-01 2015-04-16 東邦チタニウム株式会社 粒度分布測定方法
CN106164643B (zh) * 2014-04-08 2019-07-12 三菱电机株式会社 浮游粒子检测装置
CN203929579U (zh) * 2014-04-11 2014-11-05 苏州宏瑞净化科技有限公司 一种双通道大流量尘埃粒子传感器
JP6233711B2 (ja) 2014-04-25 2017-11-22 パナソニックIpマネジメント株式会社 粒子測定装置
JP2015210188A (ja) * 2014-04-25 2015-11-24 パナソニックIpマネジメント株式会社 粒子測定装置
EP3214429B1 (fr) * 2014-10-31 2021-03-03 Panasonic Intellectual Property Management Co., Ltd. Capteur de détection de particules
EP4215900A1 (fr) * 2015-09-23 2023-07-26 Malvern Panalytical Limited Caractérisation de particules
JP6738993B2 (ja) * 2016-04-06 2020-08-12 パナソニックIpマネジメント株式会社 微粒子検知装置
CN106018223A (zh) * 2016-05-24 2016-10-12 深圳市蜂联科技有限公司 一种分段最优标定提高空气质量检测设备测量精度的方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI735191B (zh) * 2020-03-27 2021-08-01 國立陽明交通大學 光達除霧系統與方法
TWI739528B (zh) * 2020-07-24 2021-09-11 熱映光電股份有限公司 氣體檢測裝置

Also Published As

Publication number Publication date
KR20200099588A (ko) 2020-08-24
CN111630365B (zh) 2023-02-24
KR102321560B1 (ko) 2021-11-03
JP6883770B2 (ja) 2021-06-09
CN111630365A (zh) 2020-09-04
JPWO2019167485A1 (ja) 2020-12-03
WO2019167485A1 (fr) 2019-09-06

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