TW201921098A - Producing method of mask integrated frame - Google Patents
Producing method of mask integrated frame Download PDFInfo
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- TW201921098A TW201921098A TW107132284A TW107132284A TW201921098A TW 201921098 A TW201921098 A TW 201921098A TW 107132284 A TW107132284 A TW 107132284A TW 107132284 A TW107132284 A TW 107132284A TW 201921098 A TW201921098 A TW 201921098A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B37/00—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
- B32B37/12—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by using adhesives
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
- C09J11/02—Non-macromolecular additives
- C09J11/04—Non-macromolecular additives inorganic
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/10—Moulds; Masks; Masterforms
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Abstract
Description
發明領域
本發明是有關於一種框架一體型遮罩的製造方法,更詳而言之,關於一種框架與遮罩構成一體而防止遮罩之變形並準確地進行對準(alignment),且防止有機物接著劑所致遮罩之變形、汙染等的框架一體型遮罩的製造方法。FIELD OF THE INVENTION The present invention relates to a method for manufacturing a frame-integrated mask. More specifically, the present invention relates to a frame and a mask that are integrated to prevent deformation of the mask and accurately align it, and prevent organic matter. A method for manufacturing a frame-integrated mask such as deformation and contamination of a mask caused by an adhesive.
背景技術
最近在薄板製造中進行有關電鑄鍍敷(Electroforming)方法之研究。電鑄鍍敷方法係將正極體、負極體浸漬於電解液中,並施加電源而使金屬薄板電附著於負極體之表面上,因此,是一種可以製造極薄板並期待量產的方法。2. Description of the Related Art Recently, research on an electroforming plating method has been performed in sheet manufacturing. The electroforming plating method is a method in which a positive electrode body and a negative electrode body are immersed in an electrolytic solution and a metal sheet is electrically adhered to the surface of the negative electrode body by applying a power source. Therefore, it is possible to produce an extremely thin plate and expect mass production.
另一方面,作為在OLED製造步驟中形成像素之技術,主要是運用FMM(精密金屬遮罩,Fine Metal Mask)方法,其係使薄膜之金屬遮罩(陰影遮罩,Shadow Mask)與基板密接,並將有機物蒸鍍於所期望位置。On the other hand, as a technology for forming pixels in the OLED manufacturing process, the FMM (Fine Metal Mask) method is mainly used, which is to make the metal mask (Shadow Mask) of the film tightly contact the substrate And vapor deposition of organic matter at a desired position.
於既有的OLED製造步驟中,在以棒狀、板狀等製造出遮罩後,使遮罩焊接固定在OLED像素蒸鍍框架而使用。為了大面積OLED之製造,可使複數個遮罩固定在OLED像素蒸鍍框架,然而,會有無法良好地進行遮罩彼此之排列的問題。又,於焊接固定在框架的過程中,由於遮罩膜之厚度過薄且屬於大面積,因此,會有遮罩因負載而下垂或扭曲的問題。In the existing OLED manufacturing steps, after the mask is manufactured in a rod shape, a plate shape, or the like, the mask is welded and fixed to the OLED pixel evaporation frame for use. For the manufacture of large-area OLEDs, a plurality of masks can be fixed to the OLED pixel vapor deposition frame. However, there is a problem that the masks cannot be properly aligned with each other. In addition, during the process of welding and fixing the frame, the thickness of the mask film is too thin and belongs to a large area, so there is a problem that the mask sags or twists due to the load.
於超高畫質之OLED製造步驟中,數μm之微細排列之誤差亦牽涉到像素蒸鍍的失敗,因此,實際情況是必須開發能防止遮罩下垂或扭曲等變形並準確地進行排列的技術、將遮罩固定在框架的技術等。In the ultra-high-quality OLED manufacturing steps, the error of the minute arrangement of several μm also involves the failure of pixel evaporation. Therefore, the actual situation is to develop a technology that can prevent deformation such as sagging or distortion of the mask and accurately arrange it. , Techniques for fixing masks to frames, etc.
發明概要
發明欲解決之課題
本發明是用以解決如前述習知技術的各種問題所研究而成,其目的在提供一種遮罩與框架構成一體型構造的框架一體型遮罩的製造方法。SUMMARY OF THE INVENTION Problems to be Solved by the Invention The present invention has been made in order to solve various problems of the aforementioned conventional technologies, and an object thereof is to provide a method for manufacturing a frame-integrated mask having a structure in which a mask and a frame form an integrated structure.
又,本發明之目的在提供一種藉由將遮罩與框架一體地形成而準確地進行遮罩之排列,並提升像素蒸鍍之穩定性的框架一體型遮罩的製造方法。Another object of the present invention is to provide a method of manufacturing a frame-integrated mask that accurately arranges the masks by integrally forming the mask and the frame and improves the stability of pixel evaporation.
又,本發明之目的在提供一種只要藉由鍍敷步驟便可製造具有圖案之遮罩的框架一體型遮罩的製造方法。Another object of the present invention is to provide a method for manufacturing a frame-integrated mask capable of manufacturing a mask having a pattern by a plating step.
用以解決課題之手段
本發明之前述目的可藉由下述框架一體型遮罩的製造方法來達成:其係一體地形成遮罩與支持遮罩的框架,並包含有以下步驟:(a)步驟,其藉由電鑄鍍敷,於已於一面上形成業經圖案化的絕緣部的導電性基板上形成鍍敷膜;(b)步驟,其於框架上部之至少一部分形成含有金屬的接著部,並將鍍敷膜之框體中至少一部分對應於接著部;(c)步驟,其對接著部施加預定溫度、預定壓力中至少任一者;及(d)步驟,其解除預定溫度、預定壓力中至少任一者之施加,並將鍍敷膜與框架接著。Means for Solving the Problems The foregoing object of the present invention can be achieved by a method for manufacturing a frame-integrated mask, which integrally forms a mask and a frame supporting the mask, and includes the following steps: (a) A step of forming a plating film on a conductive substrate having patterned insulating portions formed on one side by electroforming plating; and (b) a step of forming a metal-containing bonding portion on at least a portion of an upper portion of the frame And at least a part of the frame of the plating film corresponds to the bonding portion; (c) step, which applies at least any one of a predetermined temperature and a predetermined pressure to the bonding portion; and (d) step, which releases the predetermined temperature and the predetermined pressure At least any one of the pressure is applied, and the plating film is attached to the frame.
接著部可含有至少2種金屬之合金。The bonding portion may contain an alloy of at least two metals.
於(c)步驟中,接著部之至少一部分可自固相(solid phase)變成液相(liquid phase),且於(d)步驟中,接著部之液相再度變成固相,並接著鍍敷膜與框架。In step (c), at least a portion of the bonding portion may be changed from a solid phase to a liquid phase, and in step (d), the liquid phase of the bonding portion is changed to a solid phase again, and then plating is performed. Membrane and frame.
接著部可含有:第1金屬,其選自於In、Bi、Sn、Au中任一者;及第2金屬,其選自於In、Bi、Sn、Ag、Cu、Zn、Bi、Sb、Ge中任一者,且與第1金屬不同。The bonding part may contain: a first metal selected from any of In, Bi, Sn, and Au; and a second metal selected from In, Bi, Sn, Ag, Cu, Zn, Bi, Sb, Any of Ge is different from the first metal.
接著部更可含有第3金屬,該第3金屬選自於Bi、Sn、Ag、Cu、Cd中任一者,且與第1金屬及第2金屬不同。The bonding portion may further include a third metal selected from any one of Bi, Sn, Ag, Cu, and Cd, and different from the first metal and the second metal.
接著部更可含有第4金屬,該第4金屬選自於Cu、Sb中任一者,且與第1金屬、第2金屬及第3金屬不同。The bonding portion may further include a fourth metal selected from any one of Cu and Sb, and different from the first metal, the second metal, and the third metal.
(c)步驟可於惰性氣體環境下進行。Step (c) can be performed under an inert gas environment.
導電性基板可為經摻雜之單晶矽材質。The conductive substrate may be a doped single crystal silicon material.
絕緣部可為光阻材料、氧化矽、氮化矽之材質中任一者。The insulating portion may be any one of a photoresist material, silicon oxide, and silicon nitride.
框架可具有包圍鍍敷膜的形狀。The frame may have a shape surrounding the plating film.
於(d)步驟中,鍍敷膜可於外側承受拉伸力之狀態下接著於框架上部。In step (d), the plated film can be adhered to the upper part of the frame while being subjected to a tensile force on the outside.
於(a)步驟中,可於絕緣部上防止鍍敷膜之形成,且鍍敷膜具有圖案。In step (a), the formation of a plating film on the insulating portion can be prevented, and the plating film has a pattern.
(a)步驟以後更可進行將鍍敷膜熱處理的步驟。After the step (a), a step of heat-treating the plating film may be performed.
熱處理可於300℃~800℃下進行。The heat treatment can be performed at 300 ° C to 800 ° C.
發明效果
若藉由依前述而構成的本發明,則遮罩與框架可構成一體型構造。ADVANTAGE OF THE INVENTION According to this invention comprised as mentioned above, a mask and a frame can be set as an integrated structure.
又,若藉由本發明,則可準確地進行遮罩之排列,並提升像素蒸鍍之穩定性。In addition, according to the present invention, it is possible to accurately arrange the masks and improve the stability of pixel evaporation.
又,若藉由本發明,則只要藉由鍍敷步驟便可製造具有圖案之遮罩。In addition, according to the present invention, a mask having a pattern can be produced only by a plating step.
又,若藉由本發明,則可提升遮罩與框架之接著力。Moreover, according to the present invention, the adhesion between the mask and the frame can be improved.
用以實施發明之形態
後述本發明之詳細說明乃參照以圖式來例示可實施本發明之特定實施形態之附圖。為了讓該發明所屬技術領域中具有通常知識者可充分地實施本發明,詳細說明該等實施形態。應理解本發明之各種實施形態雖互為不同,但無須相互排他。舉例言之,在此所記載的特定形狀、構造及特性與一實施形態有關,可於未脫離本發明精神及範圍下作成其他實施形態具體實現。又,應理解各自所揭示實施形態內的個別構成要素之位置或配置,可於未脫離本發明精神及範圍下加以變更。故,後述詳細說明並非採取限定之意,只要能適切地說明,本發明之範圍係與和該請求項主張者均等的所有範圍一同僅受限於添附之請求項。圖式中類似的參照符號是在各種方面具有相同或類似之機能,長度、面積及厚度等與其形態方便上有時亦會誇張表現。Forms for Carrying Out the Invention The detailed description of the present invention described later is made with reference to the drawings which illustrate specific embodiments in which the present invention can be implemented. In order that those skilled in the art to which this invention pertains can fully implement this invention, these embodiments will be described in detail. It should be understood that although the various embodiments of the present invention are different from each other, they need not be mutually exclusive. For example, the specific shape, structure, and characteristics described herein are related to one embodiment, and other embodiments can be specifically implemented without departing from the spirit and scope of the present invention. In addition, it should be understood that the position or arrangement of individual constituent elements in the respective disclosed embodiments can be changed without departing from the spirit and scope of the present invention. Therefore, the detailed description described below is not intended to be limiting. As long as it can be properly explained, the scope of the present invention is limited to the appended claims together with all the scopes equal to the claimants of the claims. Similar reference symbols in the drawings have the same or similar functions in various aspects, and the length, area, and thickness may sometimes be exaggerated in terms of their convenience.
以下,為了讓該發明所屬技術領域中具有通常知識者可輕易地實施本發明,參照附圖詳細說明有關本發明之較佳實施形態。In the following, in order that a person having ordinary knowledge in the technical field to which the present invention belongs can easily implement the present invention, a preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings.
圖1是顯示使用FMM100的OLED像素蒸鍍裝置200之示意圖。圖2是顯示遮罩之示意圖。FIG. 1 is a schematic diagram showing an OLED pixel evaporation apparatus 200 using FMM100. FIG. 2 is a schematic diagram showing a mask.
參照圖1,一般而言,OLED像素蒸鍍裝置200包含有:磁板300,其收納磁鐵310,並配設有冷卻水管線350;及蒸鍍源供給部500,其自磁板300之下部供給有機物源600。Referring to FIG. 1, in general, the OLED pixel evaporation device 200 includes: a magnetic plate 300 that houses a magnet 310 and is provided with a cooling water line 350; and a evaporation source supply unit 500 that is located below the magnetic plate 300 Supply organic matter source 600.
於磁板300與蒸鍍源供給部500之間,可夾雜蒸鍍有機物源600的玻璃等對象基板900。依像素別蒸鍍有機物源600的FMM100與對象基板900密接,或是配置成非常靠近。磁鐵310會產生磁場,藉由磁場所致引力,FMM100可與對象基板900密接。Between the magnetic plate 300 and the vapor deposition source supply unit 500, an object substrate 900 such as glass of the vapor deposition organic substance source 600 may be interposed. The FMM 100 in which the organic material source 600 is vapor-deposited for each pixel is in close contact with the target substrate 900 or is disposed in close proximity. The magnet 310 generates a magnetic field, and the FMM 100 can be in close contact with the target substrate 900 due to the gravity caused by the magnetic field.
棒型(Stick-Type)遮罩(參照圖2(a))、板型(Plate-Type)遮罩(參照圖2(b))與對象基板900密接前必須對準。一個遮罩或複數個遮罩可與框架800結合。框架800固設於OLED像素蒸鍍裝置200內,遮罩可經由另外的附著、焊接步驟與框架800結合。Stick-Type masks (see Fig. 2 (a)) and plate-type masks (see Fig. 2 (b)) must be aligned with the target substrate 900 before they are in close contact with each other. One mask or a plurality of masks may be combined with the frame 800. The frame 800 is fixed in the OLED pixel evaporation device 200, and the mask can be combined with the frame 800 through another attaching and welding steps.
蒸鍍源供給部500往返左右路徑,並供給有機物源600,自蒸鍍源供給部500供給的有機物源600可通過業已形成於FMM遮罩100的圖案(PP),蒸鍍於對象基板900之一側。通過FMM遮罩100之圖案所蒸鍍的有機物源600具有作為OLED之像素700的作用。The evaporation source supply unit 500 reciprocates to the left and right paths and supplies the organic matter source 600. The organic matter source 600 supplied from the evaporation source supply unit 500 can be deposited on the target substrate 900 by a pattern (PP) that has been formed on the FMM mask 100. One side. The organic material source 600 vapor-deposited through the pattern of the FMM mask 100 has a function as a pixel 700 of the OLED.
為了防止陰影效應(Shadow Effect)所致像素700之不均勻蒸鍍,FMM遮罩100之圖案(PP)可傾斜形成(S)(或形成為錐形狀(S))。沿著傾斜面朝對角線方向通過圖案(PP)的有機物源600亦可有助於像素700之形成,因此,像素700可全體以均勻之厚度蒸鍍。In order to prevent uneven evaporation of the pixels 700 caused by the Shadow Effect, the pattern (PP) of the FMM mask 100 may be formed obliquely (S) (or formed into a cone shape (S)). The organic material source 600 passing the pattern (PP) along the inclined surface in a diagonal direction can also contribute to the formation of the pixels 700. Therefore, the pixels 700 can be vapor-deposited as a whole.
圖2(a)所示遮罩100a為棒型遮罩,可使棒兩側焊接固定在OLED像素蒸鍍框架800而使用。圖2(b)所示遮罩100b為板型遮罩,可於大面積之像素形成步驟中使用,並使板之框體焊接固定在OLED像素蒸鍍框架800而使用。圖2(c)為圖2(a)及圖2(b)之A-A’放大側截面圖。The mask 100a shown in FIG. 2 (a) is a stick-type mask, and both sides of the stick can be welded and fixed to the OLED pixel evaporation frame 800 for use. The mask 100b shown in FIG. 2 (b) is a plate type mask, which can be used in a large area pixel formation step, and the frame of the plate is welded and fixed to the OLED pixel evaporation frame 800 for use. Fig. 2 (c) is an enlarged A-A 'side sectional view of Figs. 2 (a) and 2 (b).
於遮罩100:100a、100:100b之本體(Body)可形成複數個顯示器圖案(DP)。顯示器圖案(DP)為對應於一個智慧型手機等之顯示器的圖案。若將顯示器圖案(DP)放大,則可確認對應於R、G、B的複數個像素圖案(PP)。像素圖案(PP)可具有側部傾斜的形狀、錐形(Taper)狀(參照圖2(c))。各種像素圖案(PP)群聚而構成一個顯示器圖案(DP),複數個顯示器圖案(DP)可形成於遮罩100:100a、100:100b。A plurality of display patterns (DP) can be formed on the bodies of the masks 100: 100a and 100: 100b. The display pattern (DP) is a pattern corresponding to a display of a smartphone or the like. When the display pattern (DP) is enlarged, a plurality of pixel patterns (PP) corresponding to R, G, and B can be confirmed. The pixel pattern (PP) may have a shape in which the side portion is inclined and a tapered shape (see FIG. 2 (c)). Various pixel patterns (PP) are grouped to form a display pattern (DP), and a plurality of display patterns (DP) may be formed on the mask 100: 100a, 100: 100b.
即,於本說明書中,顯示器圖案(DP)並非表示一個圖案的概念,應理解成對應於一個顯示器的複數個像素圖案(PP)群聚的概念。以下,將像素圖案(PP)與遮罩圖案(PP)混用。That is, in this specification, the display pattern (DP) does not represent a concept of one pattern, and it should be understood as a concept of a plurality of pixel patterns (PP) corresponding to one display. Hereinafter, a pixel pattern (PP) and a mask pattern (PP) are mixed.
圖1及圖2所示遮罩100於將複數個遮罩分別焊接固定在框架800的過程中,若產生遮罩間之排列誤差,並產生特定遮罩下垂或扭曲等變形,則會引發全體遮罩之排列誤差。When the mask 100 shown in FIG. 1 and FIG. 2 is welded and fixed to the frame 800 respectively, if an alignment error between the masks occurs, and a specific mask sags or distorts, it will cause the whole Mask alignment error.
故,本發明之特徵在於:於已將遮罩形成於母板上的狀態下接著於框架,並構成遮罩與框架呈一體型,藉此,防止遮罩之變形並準確地進行排列。Therefore, the present invention is characterized in that the mask is attached to the frame in a state where the mask has been formed, and the mask and the frame are integrated, thereby preventing deformation of the mask and accurately arranging the mask.
圖3是顯示本發明一實施形態的框架一體型遮罩10之示意圖。圖3(a)為框架一體型遮罩10之立體圖,圖3(b)為圖3(a)之B-B’放大側截面圖。FIG. 3 is a schematic diagram showing a frame-integrated mask 10 according to an embodiment of the present invention. Fig. 3 (a) is a perspective view of the frame-integrated mask 10, and Fig. 3 (b) is an enlarged side sectional view taken along the line B-B 'of Fig. 3 (a).
參照圖3,框架一體型遮罩10包含有遮罩20及框架30。遮罩20可包含:含有複數個顯示器圖案(DP)及像素圖案(PP)之部分的鍍敷膜20a;以及框體部分的鍍敷膜20b。Referring to FIG. 3, the frame-integrated mask 10 includes a mask 20 and a frame 30. The mask 20 may include: a plating film 20a including a portion of a plurality of display patterns (DP) and a pixel pattern (PP); and a plating film 20b of a frame portion.
鍍敷膜20a、20b與框架30可具有相同材質,並將接著部(EM)作為中介體而相互一體地連結。於圖3中,為了方便說明,應明白接著部(EM)之厚度及寬度會稍微誇張來顯示,實際上夾雜有接著部(EM)的部分可為幾乎未突出而連結遮罩20與框架30的部分。鍍敷膜20雖然依照所形成位置而以不同符號之方式記載為20a、20b,但實際上是電鑄鍍敷步驟中電附著鍍敷的鍍敷膜20(20a、20b)(參照圖4)之各部分,且為電鑄鍍敷步驟中同時形成的構造。The plating films 20a and 20b and the frame 30 may be made of the same material, and the bonding portions (EM) may be integrally connected to each other as an intermediary. In FIG. 3, for the convenience of explanation, it should be understood that the thickness and width of the bonding portion (EM) are slightly exaggerated for display. In fact, the portion mixed with the bonding portion (EM) may be hardly protruded to connect the mask 20 and the frame 30. part. Although the plating film 20 is described as 20a and 20b with different symbols according to the formed position, it is actually a plating film 20 (20a, 20b) that is electroplated in the electroforming plating step (see FIG. 4). Each part is a structure formed simultaneously in the electroforming plating step.
於遮罩20可形成遮罩圖案(PP)。遮罩圖案(PP)宜具有大致錐形狀:具有寬度自上部朝下部逐漸變寬或是逐漸變窄的形狀,由於遮罩20的上面與對象基板900(參照圖6)密接,因此,遮罩圖案(PP)更宜為寬度自上部朝下部逐漸變寬的形狀。A mask pattern (PP) may be formed on the mask 20. The mask pattern (PP) should have a generally tapered shape: a shape that gradually widens or narrows from the upper part to the lower part. The upper surface of the mask 20 is in close contact with the target substrate 900 (see FIG. 6). The pattern (PP) is more preferably a shape whose width gradually increases from the upper part to the lower part.
圖案寬度可形成為數~數十μm之尺寸,較為理想的是小於30μm之尺寸。遮罩圖案(PP)可藉由利用絕緣部45防止鍍敷膜20之生成而形成。具體的形成過程透過圖4如後述。遮罩圖案(PP)與圖2中前述像素圖案(PP)/顯示器圖案(DP)之構造相同。The pattern width can be formed to a size of several to several tens of μm, and a size smaller than 30 μm is more preferable. The mask pattern (PP) can be formed by preventing the generation of the plating film 20 with the insulating portion 45. The specific formation process will be described later with reference to FIG. 4. The mask pattern (PP) has the same structure as the aforementioned pixel pattern (PP) / display pattern (DP) in FIG. 2.
為了能將遮罩20繃緊支持而不會下垂或扭曲,框架30宜具有包圍遮罩20之框體的形狀。圖3中顯示四角形之框架30,亦可為屬於閉鎖形態的圓形、多角形等形態。框架30之材質宜為與遮罩20相同的不變鋼、超恆範鋼等。In order to support the mask 20 tightly without sagging or twisting, the frame 30 preferably has a shape surrounding the frame of the mask 20. The quadrangular frame 30 shown in FIG. 3 may also be in the form of a circle, a polygon, or the like that belongs to a closed form. The material of the frame 30 is preferably the same invariant steel, ultra-constant Fan steel, etc. as the mask 20.
如前述,本發明之框架一體型遮罩10由於遮罩20與框架30一體地連結,因此,單單藉由僅將框架30朝OLED像素蒸鍍裝置200移動、設置的過程,便可進行遮罩排列。As described above, the frame-integrated mask 10 of the present invention is integrally connected to the frame 20 and the frame 30. Therefore, the mask can be carried out only by moving and setting the frame 30 toward the OLED pixel evaporation device 200. arrangement.
圖4及圖5為示意圖,其顯示製造本發明一實施形態的圖3之框架一體型遮罩100的過程。4 and 5 are schematic views showing a process of manufacturing the frame-integrated mask 100 of FIG. 3 according to an embodiment of the present invention.
參照圖4(a),為了進行電鑄鍍敷,準備導電性基材41。含有導電性基材41的母板(mother plate)40於電鑄鍍敷中運用作為負極體(cathode)。4 (a), a conductive substrate 41 is prepared for electroforming plating. A mother plate 40 containing a conductive substrate 41 is used as a cathode in electroforming plating.
作為導電性材質,於金屬之情形時,有時亦會於表面生成金屬氧化物,且於金屬製造過程中流入雜質,於多晶矽基材之情形時,則存在有夾雜物或晶界(Grain Boundary),於導電性高分子基材之情形時,含有雜質的可能性高,強度、耐酸性等脆弱。將像是金屬氧化物、雜質、夾雜物、晶界般妨礙母板40(或基材41)之表面均勻地形成電場的要素稱作「缺陷」(Defect)。由於缺陷,前述材質之負極體無法施加均勻之電場,鍍敷膜之一部分可能不均勻地形成。As a conductive material, in the case of a metal, a metal oxide may be generated on the surface, and impurities may flow during the metal manufacturing process. In the case of a polycrystalline silicon substrate, there are inclusions or grain boundaries (Grain Boundary). ), In the case of a conductive polymer substrate, the possibility of containing impurities is high, and the strength and resistance to acid are weak. Elements that prevent uniform formation of an electric field on the surface of the mother substrate 40 (or the substrate 41), such as metal oxides, impurities, inclusions, and grain boundaries, are called "defects." Due to the defect, the negative electrode body of the foregoing material cannot apply a uniform electric field, and a part of the plating film may be formed unevenly.
在具體實現UHD級以上的超高畫質像素時,鍍敷膜及鍍敷膜圖案(PP)之不均勻可能會對像素之形成帶來不良影響。FMM、陰影遮罩之圖案寬度可能形成為數~數十μm之尺寸,較為理想的是小於30μm之尺寸,因此,即便連數μm尺寸之缺陷,亦為在遮罩之圖案尺寸中佔據大幅比重之尺寸。When specifically realizing ultra-high-quality pixels above UHD level, the unevenness of the plating film and the plating film pattern (PP) may adversely affect the formation of the pixels. The pattern width of FMM and shadow mask may be formed to a size of several to several tens of μm, and a size smaller than 30 μm is more desirable. Therefore, even the defects of several μm size occupy a large proportion of the pattern size of the mask. size.
又,為了除去在前述材質之負極體之缺陷,進行用以除去金屬氧化物、雜質等的追加步驟,於該過程中有時亦會引發蝕刻到負極體材料等另外其他的缺陷。In addition, in order to remove defects of the negative electrode body of the foregoing material, additional steps for removing metal oxides, impurities, and the like are performed, and other defects such as etching to the negative electrode body material may be caused in the process.
故,本發明可使用單晶矽材質之基材41。為了具有導電性,基材41會進行1019 cm-3 以上的高濃度摻雜。摻雜可於基材41之全體進行,亦可僅於基材41之表面部分進行。Therefore, the substrate 41 made of single crystal silicon can be used in the present invention. In order to have conductivity, the substrate 41 is doped at a high concentration of 10 19 cm -3 or more. The doping may be performed on the entire substrate 41 or may be performed only on the surface portion of the substrate 41.
於經摻雜之單晶矽之情形時,由於沒有缺陷,因此,具有電鑄鍍敷時可於表面全部形成均勻之電場而生成均勻鍍敷膜20之優點。透過均勻之鍍敷膜20而製造的框架一體型遮罩10(或FMM)可進一步地改善OLED像素之畫質水平。又,由於無須進行除去、消除缺陷的追加步驟,因此,可削減步驟成本,並具有生產性提升之優點。In the case of doped single crystal silicon, since there are no defects, there is an advantage that a uniform electric field can be formed on the entire surface during electroforming plating to generate a uniform plating film 20. The frame-integrated mask 10 (or FMM) manufactured through the uniform plating film 20 can further improve the picture quality level of the OLED pixels. In addition, since there is no need to perform additional steps for removing and eliminating defects, the cost of the steps can be reduced and the productivity can be improved.
又,藉由使用矽材質之基材41,具有能視需要僅在將基材41之表面氧化(Oxidation)、氮化(Nitridation)的過程中便形成絕緣部45之優點。絕緣部45具有防止鍍敷膜20之電附著的作用,可於鍍敷膜20形成圖案(PP)。In addition, the use of the substrate 41 made of silicon has the advantage that the insulating portion 45 can be formed only in the process of oxidizing and nitriding the surface of the substrate 41 as needed. The insulating portion 45 has a function of preventing electrical adhesion of the plating film 20 and can form a pattern (PP) on the plating film 20.
其次,參照圖4(b),於基材41之至少一面上可形成絕緣部45。絕緣部45形成為具有圖案,且宜具有錐形狀之圖案。絕緣部45是以導電性基材41為基底的氧化矽、氮化矽等,亦可使用光阻材料。使用光阻材料而形成錐形狀之圖案時,可使用多重曝光方法、每個區域使曝光強度不同的方法等。藉此,可製造母板40。Next, referring to FIG. 4 (b), an insulating portion 45 may be formed on at least one surface of the substrate 41. The insulating portion 45 is formed to have a pattern, and preferably has a pattern having a tapered shape. The insulating portion 45 is made of silicon oxide, silicon nitride, or the like based on the conductive substrate 41, and a photoresist material may be used. When a cone-shaped pattern is formed using a photoresist material, a multiple exposure method, a method of making the exposure intensity different for each region, and the like can be used. Thereby, the mother board 40 can be manufactured.
其次,參照圖4(c),準備與母板40(或負極體40)相對向的正極體(未圖示)。正極體(未圖示)浸漬於鍍敷液(未圖示)中,母板40則是全部或一部分浸漬於鍍敷液(未圖示)中。藉由於母板40(或負極體40)與相對向的正極體間所形成電場,可於母板40之表面電附著、生成鍍敷膜20(20a、20b)。不過,僅於導電性基材41露出之表面46生成鍍敷膜20,於絕緣部45之表面則未生成鍍敷膜20,因此,可於鍍敷膜20上形成圖案(PP)(參照圖3(b))。Next, referring to FIG. 4 (c), a positive electrode body (not shown) facing the mother plate 40 (or the negative electrode body 40) is prepared. The positive electrode body (not shown) is immersed in a plating solution (not shown), and the mother board 40 is entirely or partially immersed in a plating solution (not shown). Due to the electric field formed between the mother substrate 40 (or the negative electrode body 40) and the opposite positive electrode body, it is possible to electrically adhere to the surface of the mother substrate 40 to generate a plating film 20 (20a, 20b). However, the plating film 20 is formed only on the exposed surface 46 of the conductive substrate 41, and the plating film 20 is not formed on the surface of the insulating portion 45. Therefore, a pattern (PP) can be formed on the plating film 20 (see FIG. 3 (b)).
鍍敷液為電解液,可成為構成遮罩20的鍍敷膜20之材料。作為一實施形態,當製造屬於鐵鎳合金的不變鋼(Invar)薄板作為鍍敷膜20時,可使用含有Ni離子之溶液及含有Fe離子之溶液的混合液作為鍍敷液。作為其他實施形態,當製造屬於鐵鎳鈷合金的超恆範鋼(Super Invar)薄板作為鍍敷膜20時,亦可使用含有Ni離子之溶液、含有Fe離子之溶液及含有Co離子之溶液的混合液作為鍍敷液。不變鋼薄板、超恆範鋼薄板於OLED之製造中運用作為FMM、陰影遮罩(Shadow Mask)。又,不變鋼薄板之熱膨脹係數大約1.0×10-6 /℃,超恆範鋼薄板之熱膨脹係數大約1.0×10-7 /℃左右而非常低,因此,遮罩之圖案形狀因熱能而變形之虞小,主要運用在高解析度OLED製造中。除此之外,亦可無限制地使用相對於所期望鍍敷膜20的鍍敷液,於本說明書中,假想製造不變鋼薄板20作為主要例子來說明。The plating solution is an electrolytic solution and can be a material of the plating film 20 constituting the mask 20. As an embodiment, when manufacturing an Invar sheet of iron-nickel alloy as the plating film 20, a mixed solution containing a solution containing Ni ions and a solution containing Fe ions can be used as the plating solution. As another embodiment, when manufacturing a Super Invar sheet of iron-nickel-cobalt alloy as the plating film 20, a solution containing a Ni ion, a solution containing a Fe ion, and a solution containing a Co ion The mixed solution was used as a plating solution. Invariable steel sheet and ultra-constant steel sheet are used as FMM and Shadow Mask in the manufacture of OLED. In addition, the thermal expansion coefficient of the invariant steel sheet is about 1.0 × 10 -6 / ℃, and the thermal expansion coefficient of the ultra-constant steel sheet is about 1.0 × 10 -7 / ℃, which is very low. Therefore, the shape of the pattern of the mask is deformed by thermal energy The worry is small and it is mainly used in high-resolution OLED manufacturing. In addition, a plating solution for the desired plating film 20 can also be used without limitation. In this specification, a hypothetical production of a constant steel sheet 20 will be described as a main example.
由於一邊自基材41之表面電附著鍍敷膜20一邊增厚,因此,宜將鍍敷膜20形成至超過絕緣部45之上端之前。即,相較於絕緣部45之厚度,鍍敷膜20之厚度更小。由於鍍敷膜20填滿、電附著於絕緣部45之圖案空間,因此,可生成為具有與絕緣部45之圖案逆相的錐形狀。Since the plating film 20 is thickened while being electrically adhered from the surface of the base material 41, it is preferable to form the plating film 20 beyond the upper end of the insulating portion 45. That is, the thickness of the plating film 20 is smaller than the thickness of the insulating portion 45. Since the plating film 20 is filled and electrically adhered to the pattern space of the insulating portion 45, it can be formed into a tapered shape having a phase opposite to that of the pattern of the insulating portion 45.
另一方面,在形成鍍敷膜20後,可對鍍敷膜20進行熱處理。熱處理可於300℃~800℃之溫度下進行。一般而言,相較於藉由壓延所生成不變鋼薄板,藉由電鑄鍍敷所生成不變鋼薄板的熱膨脹係數高。依此,藉由對不變鋼薄板進行熱處理,可降低熱膨脹係數,然而,於該熱處理過程中不變鋼薄板可能會產生若干變形。故,若於母板40(或基材41)與遮罩20接著的狀態下進行熱處理,則形成於母板40之絕緣部45所佔空間部分的遮罩圖案(PP)之形態可保持一定,具有可防止熱處理所致微細變形之優點。又,自鍍敷膜20分離母板40(或基材41)後,即便對具有遮罩圖案(PP)的遮罩20進行熱處理,亦具有降低不變鋼薄板之熱膨脹係數的效果。On the other hand, after the plating film 20 is formed, the plating film 20 may be heat-treated. The heat treatment can be performed at a temperature of 300 ° C to 800 ° C. Generally speaking, the thermal expansion coefficient of an invariant steel sheet produced by electroforming plating is higher than that of an invariant steel sheet produced by rolling. Accordingly, the thermal expansion coefficient of the invariant steel sheet can be reduced by heat treatment of the invariant steel sheet. However, the invariant steel sheet may have some deformation during the heat treatment. Therefore, if the heat treatment is performed in a state where the mother board 40 (or the substrate 41) and the mask 20 are bonded, the shape of the mask pattern (PP) formed in the space occupied by the insulating portion 45 of the mother board 40 can be maintained constant. , Has the advantage of preventing fine deformation caused by heat treatment. In addition, after the mother plate 40 (or the substrate 41) is separated from the plating film 20, even if the mask 20 having a mask pattern (PP) is heat-treated, it has the effect of reducing the thermal expansion coefficient of the constant steel sheet.
其次,參照圖5(a),將母板40(或負極體40)舉起至鍍敷液(未圖示)外。又,將圖4(c)之構造物翻轉而配置於框架30之上部。反之,亦可將框架30翻轉而配置於圖4(c)之構造物。框架30可具有包圍鍍敷膜20的形狀。5 (a), the mother substrate 40 (or the negative electrode body 40) is lifted out of the plating solution (not shown). In addition, the structure shown in FIG. 4 (c) is inverted and arranged on the upper portion of the frame 30. Conversely, the frame 30 may be inverted and arranged on the structure of FIG. 4 (c). The frame 30 may have a shape surrounding the plating film 20.
於鍍敷膜20接觸的框架30之上部可形成接著部(EA)。藉由於接著部(EA)施加預定溫度、壓力,鍍敷膜20與框架30接著,因此,可使鍍敷膜20之框體中至少一部分對應於接著部(EA)。An adhesive portion (EA) may be formed on an upper portion of the frame 30 that the plating film 20 contacts. By applying a predetermined temperature and pressure to the bonding portion (EA), the plating film 20 and the frame 30 are bonded, so that at least a part of the frame of the plating film 20 can correspond to the bonding portion (EA).
接著部(EA)可含有金屬,並具有膜、線、束狀等各種形狀。接著部(EA)具有大約10~30μm之薄薄的厚度,因此,即便夾雜於鍍敷膜20與框架30間,對高低差亦幾乎不會造成影響。The bonding portion (EA) may contain a metal, and has various shapes such as a film, a wire, and a bundle. The bonding portion (EA) has a thin thickness of about 10 to 30 μm. Therefore, even if it is interposed between the plating film 20 and the frame 30, the difference in height is hardly affected.
更詳而言之,接著部(EA)可含有至少2種金屬之合金。接著部(EA)為金屬材質,且於表面未進行其他有機接著劑等的處理,因此,於圖5(a)之狀態下,接著部(EA)接著鍍敷膜20與框架30的接著力多少會不足。故,鍍敷膜20與框架30可將接著部(EA)作為中介體,為了使對應不會偏離而施加預定負載,並臨時相互地固定。又,亦可使用限制機構(未圖示),使鍍敷膜20與框架30之位置臨時固定。More specifically, the bonding portion (EA) may contain an alloy of at least two metals. The bonding portion (EA) is made of a metal material, and no other organic adhesive is processed on the surface. Therefore, in the state shown in FIG. 5 (a), the bonding portion (EA) bonds the plating film 20 and the frame 30. How much will be insufficient. Therefore, the plating film 20 and the frame 30 may use the bonding portion (EA) as an intermediary, and a predetermined load may be applied so as not to deviate from the correspondence, and temporarily fixed to each other. In addition, a restriction mechanism (not shown) may be used to temporarily fix the positions of the plating film 20 and the frame 30.
接著部(EA)可具有至少2種金屬之合金形態,並具有共熔點(eutectic point)。即,接著部(EA)含有至少2個固相,於特定溫度/壓力之共熔點中,2個金屬固相皆可構成液相。又,若脫離共熔點,則可再度構成2個金屬固相。藉此,透過固相→液相→固相之相變化,可進行作為接著劑的作用。The adhesion part (EA) may have an alloy form of at least two metals and have an eutectic point. That is, the adhering portion (EA) contains at least two solid phases, and in the eutectic point of a specific temperature / pressure, both metal solid phases can constitute a liquid phase. When the eutectic point is removed, two metal solid phases can be formed again. Thereby, the role as an adhesive can be performed by the phase change of solid phase → liquid phase → solid phase.
接著部(EA)可具有2種金屬之合金形態。此時,可包含有:第1金屬,其選自於In、Bi、Sn、Au中任一者;及第2金屬,其選自於In、Bi、Sn、Ag、Cu、Zn、Bi、Sb、Ge中任一者,且與第1金屬不同。The adhesion part (EA) may have an alloy form of two metals. In this case, the first metal may be selected from any of In, Bi, Sn, and Au; and the second metal may be selected from In, Bi, Sn, Ag, Cu, Zn, Bi, Either Sb or Ge is different from the first metal.
又,接著部(EA)可具有3種金屬之合金形態。此時,可包含有:第1金屬,其選自於In、Bi、Sn、Au中任一者;第2金屬,其選自於In、Bi、Sn、Ag、Cu、Zn、Bi、Sb、Ge中任一者,且與第1金屬不同;及第3金屬,其選自於Bi、Sn、Ag、Cu、Cd中任一者,且與第1金屬及第2金屬不同。The bonding portion (EA) may have an alloy form of three metals. At this time, it may include: a first metal selected from any of In, Bi, Sn, and Au; and a second metal selected from In, Bi, Sn, Ag, Cu, Zn, Bi, and Sb And Ge are different from the first metal; and the third metal is selected from any one of Bi, Sn, Ag, Cu, and Cd, and is different from the first metal and the second metal.
又,接著部(EA)可具有4種金屬之合金形態。此時,可包含有:第1金屬,其選自於In、Bi、Sn、Au中任一者;第2金屬,其選自於In、Bi、Sn、Ag、Cu、Zn、Bi、Sb、Ge中任一者,且與第1金屬不同;第3金屬,其選自於Bi、Sn、Ag、Cu、Cd中任一者,且與第1金屬及第2金屬不同;及第4金屬,其選自於Cu、Sb中任一者,且與第1金屬、第2金屬及第3金屬不同。The bonding portion (EA) may have an alloy form of four metals. At this time, it may include: a first metal selected from any of In, Bi, Sn, and Au; and a second metal selected from In, Bi, Sn, Ag, Cu, Zn, Bi, and Sb And Ge, and different from the first metal; the third metal, which is selected from any one of Bi, Sn, Ag, Cu, and Cd, and is different from the first metal and the second metal; and the fourth metal The metal is selected from any one of Cu and Sb, and is different from the first metal, the second metal, and the third metal.
下述表1例示可構成接著部(EA)的物質。
[表1]
[Table 1]
其次,參照圖5(b),可對接著部(EA)施加預定溫度/壓力(HP)。可施加接著部(EA)之金屬用以自固相變成液相的溫度、壓力。前述表1中例示共熔點之溫度,因此,可依照構成接著部(EA)的金屬,選擇適當的溫度、壓力。Next, referring to FIG. 5 (b), a predetermined temperature / pressure (HP) may be applied to the bonding portion (EA). The temperature and pressure at which the metal of the bonding portion (EA) can be applied to change from the solid phase to the liquid phase can be applied. The eutectic temperature is exemplified in Table 1 above. Therefore, an appropriate temperature and pressure can be selected in accordance with the metal constituting the bonding portion (EA).
另一方面,為了以不會產生空孔(void)之方式施加預定壓力,並防止共熔體氧化,可使用供給抗氧化氣體/環境(惰性氣體(inert gas)、真空等)的另外之裝置(未圖示)。於預定溫度、壓力的施加下,接著部(EA)之金屬以固相溶解並變成液相。On the other hand, in order to apply a predetermined pressure in such a manner that voids are not generated, and to prevent oxidation of the eutectic melt, another device for supplying an antioxidant gas / environment (inert gas, vacuum, etc.) may be used. (Not shown). Under the application of a predetermined temperature and pressure, the metal of the adjoining portion (EA) is dissolved in a solid phase and becomes a liquid phase.
其次,參照圖5(c),若解除預定溫度/壓力(HP)的施加,則液相之接著部(EA)可再度變成固相之接著部(EM),並接著遮罩20與框架30。即,可具有作為接著遮罩20與框架30的固體共熔接著部(EM)之機能。Next, referring to FIG. 5 (c), if the application of the predetermined temperature / pressure (HP) is cancelled, the bonding portion (EA) in the liquid phase can be changed to the bonding portion (EM) in the solid phase again, and then the mask 20 and the frame 30 are bonded. . That is, it may have a function as a solid eutectic bonding portion (EM) for bonding the mask 20 and the frame 30.
含有金屬的接著部(EM)(或共熔接著部(EM))與一般的有機接著劑不同,完全不含揮發性有機物。故,在將框架一體型遮罩設置於OLED像素蒸鍍裝置200而進行像素蒸鍍步驟時,可防止有機接著劑之揮發性有機物質與步驟氣體反應而對OLED之像素造成不良影響。又,可防止有機接著劑本身所含有機物質等的逸出氣體汙染OLED像素蒸鍍裝置200之空間,或是作為雜質而蒸鍍於OLED像素的不良影響。The metal-containing adhesive part (EM) (or eutectic adhesive part (EM)) is different from general organic adhesives and contains no volatile organic compounds at all. Therefore, when the frame-integrated mask is disposed in the OLED pixel evaporation device 200 and the pixel evaporation step is performed, it is possible to prevent the volatile organic substance of the organic adhesive from reacting with the step gas to adversely affect the pixels of the OLED. In addition, it is possible to prevent the adverse effects of contaminating the space of the OLED pixel vapor deposition device 200 with the escaped gas such as organic substances contained in the organic adhesive itself, or vapor deposition on the OLED pixel as an impurity.
又,接著部(EM)是在接著遮罩20與框架30的狀態下以金屬固相殘留,因此,無法藉由OLED有機物洗淨液洗淨而可具有耐蝕性。藉此,即便將框架一體型遮罩10反覆使用在OLED像素步驟,接著部(EM)亦可保持接著機能。In addition, since the bonding portion (EM) remains as a solid metal phase in a state where the mask 20 and the frame 30 are bonded, it cannot be washed with the OLED organic cleaning solution and can have corrosion resistance. Thereby, even if the frame-integrated mask 10 is repeatedly used in the OLED pixel step, the bonding function (EM) can be maintained.
又,接著部(EM)含有2種以上的金屬,因此,相較於有機接著劑,與屬於相同金屬材質的遮罩20、框架30可具有高接著性而連結。即,於屬於不變鋼等金屬材質的遮罩20/框架30間,在表面的結合力高。又,由於為金屬材質,因此,具有熱所致損傷或熱變形率(熱膨脹係數)低之優點。In addition, since the bonding portion (EM) contains two or more metals, the bonding portion (EM) can be connected to the mask 20 and the frame 30 which are made of the same metal material as compared with the organic bonding agent, and have high bonding properties. That is, between the mask 20 and the frame 30, which are made of a metallic material such as invariable steel, the bonding force on the surface is high. Moreover, since it is a metallic material, it has the advantage of being damaged by heat or having a low thermal deformation rate (coefficient of thermal expansion).
若將前述事項全部綜合來看,則本發明之接著部(EM)相較於有機接著劑具有優異之步驟穩定性,且於遮罩20、框架30間顯示牢固地接著二個構造的效果。藉此,可遠遠地提升框架一體型遮罩10之排列可靠性。If all the foregoing matters are taken into consideration, the bonding portion (EM) of the present invention has superior step stability compared to the organic bonding agent, and exhibits the effect of firmly bonding the two structures between the mask 20 and the frame 30. Thereby, the arrangement reliability of the frame-integrated mask 10 can be greatly improved.
另一方面,於圖5(c)步驟中,接著部(EM)自液相變成固相並接著鍍敷膜20與框架30時,鍍敷膜20可於框架30方向或外側方向承受拉伸力之狀態下接著。相較於液相,固相之體積小亦可有助於拉伸力的作用。鍍敷膜20可於外側方向施加拉伸力,並保持繃緊而朝框架30側拉伸的狀態,因此,具有即便因溫度變化等,遮罩圖案(PP)之排列亦不會紊亂之優點。On the other hand, in the step (c) of FIG. 5, when the bonding part (EM) is changed from the liquid phase to the solid phase and then the plating film 20 and the frame 30 are adhered, the plating film 20 can be stretched in the direction of the frame 30 or outside. The state of force continues. Compared with the liquid phase, the small volume of the solid phase can also contribute to the effect of tensile force. The plating film 20 can apply a tensile force in the outer direction and keep it stretched and stretched toward the frame 30 side. Therefore, the arrangement of the mask pattern (PP) is not disturbed even if the temperature changes, etc. .
其次,參照圖5(d),可除去絕緣部45。僅除去光阻材料、氧化矽、氮化矽等絕緣部45且不會對剩餘構造帶來影響的公知技術可以無限制地使用。另一方面,當絕緣部45藉由氧化矽、氮化矽與導電性基板41一體地構成時,可省略除去該等的步驟,藉由將導電性基板41自鍍敷膜20分離,可同時除去絕緣部45。5 (d), the insulating portion 45 can be removed. A known technique that removes only the insulating portion 45 such as a photoresist material, silicon oxide, and silicon nitride without affecting the remaining structure can be used without limitation. On the other hand, when the insulating portion 45 is formed integrally with the conductive substrate 41 by silicon oxide, silicon nitride, and the like, the steps of removing these steps can be omitted, and the conductive substrate 41 can be separated from the plating film 20 at the same time. The insulation portion 45 is removed.
導電性基板41可朝遮罩20及框架30之上部方向分離。若導電性基板41被分離,則會顯現透過接著部(EM)接著於框架30的遮罩20之形態。The conductive substrate 41 can be separated toward the upper portion of the cover 20 and the frame 30. When the conductive substrate 41 is separated, a form of the mask 20 that is passed through the bonding portion (EM) to the frame 30 appears.
圖6是顯示應用圖3之框架一體型遮罩10的OLED像素蒸鍍裝置200之示意圖。FIG. 6 is a schematic diagram showing an OLED pixel evaporation device 200 to which the frame-integrated mask 10 of FIG. 3 is applied.
參照圖6,使框架一體型遮罩10與對象基板900密接,單單藉由僅將框架30部分固定在OLED像素蒸鍍裝置200之內部,便完成遮罩10之排列。遮罩20之鍍敷膜20(20a、20b)透過接著部(EM)與框架30一體地連結,其框體繃緊而受到支持,因此,可防止遮罩20因負載而下垂或扭曲等變形。藉此,可準確地進行像素蒸鍍所必須的框架一體型遮罩10之排列。Referring to FIG. 6, the frame-integrated mask 10 is in close contact with the target substrate 900, and the arrangement of the masks 10 is completed by merely fixing the frame 30 part inside the OLED pixel evaporation device 200. The plating film 20 (20a, 20b) of the mask 20 is integrally connected to the frame 30 through the bonding portion (EM), and the frame is tightly supported, so that the mask 20 can be prevented from sagging or twisting due to load. . Thereby, the arrangement of the frame-integrated masks 10 necessary for the pixel evaporation can be accurately performed.
如前述,本發明列舉較佳實施形態而圖示說明,惟並不限於前述實施形態,在未脫離本發明精神之範圍內,該發明所屬技術領域中具有通常知識者可進行各種變形與變更。應理解此種變形例及變更例屬於本發明與添附申請專利範圍之範圍內。As described above, the present invention is illustrated and illustrated by the preferred embodiments, but it is not limited to the foregoing embodiments, and various modifications and changes can be made by those with ordinary knowledge in the technical field to which the invention belongs without departing from the spirit of the invention. It should be understood that such modifications and alterations fall within the scope of the present invention and the appended patent applications.
產業上之可利用性
本發明可應用在框架一體型遮罩的製造方法相關的領域中。INDUSTRIAL APPLICABILITY The present invention is applicable to a field related to a method for manufacturing a frame-integrated mask.
10‧‧‧框架一體型遮罩10‧‧‧Frame Integrated Mask
20‧‧‧遮罩、鍍敷膜 20‧‧‧Mask, plating film
20a、20b‧‧‧鍍敷膜 20a, 20b‧‧‧plating film
30‧‧‧框架 30‧‧‧Frame
40‧‧‧母板 40‧‧‧Motherboard
41‧‧‧導電性基材 41‧‧‧ conductive substrate
45‧‧‧絕緣部 45‧‧‧Insulation Department
46‧‧‧表面 46‧‧‧ surface
100‧‧‧遮罩、陰影遮罩、FMM 100‧‧‧Mask, Shadow Mask, FMM
100a‧‧‧棒型遮罩 100a‧‧‧ stick mask
100b‧‧‧板型遮罩 100b‧‧‧plate mask
200‧‧‧OLED像素蒸鍍裝置 200‧‧‧OLED pixel evaporation device
300‧‧‧磁板 300‧‧‧ Magnetic plate
310‧‧‧磁鐵 310‧‧‧Magnet
350‧‧‧冷卻水管線 350‧‧‧ cooling water pipeline
500‧‧‧蒸鍍源供給部 500‧‧‧Evaporation source supply department
600‧‧‧有機物源 600‧‧‧ Organic Source
700‧‧‧像素 700‧‧‧ pixels
800‧‧‧OLED像素蒸鍍框架 800‧‧‧OLED pixel evaporation frame
900‧‧‧對象基板 900‧‧‧Target substrate
DP‧‧‧顯示器圖案 DP‧‧‧Display Pattern
EA、EM‧‧‧接著部 EA, EM‧‧‧ follow-up
HP‧‧‧施加溫度/壓力 HP‧‧‧Applied temperature / pressure
PP‧‧‧像素圖案、遮罩圖案、鍍敷膜圖案 PP‧‧‧Pixel pattern, mask pattern, plating film pattern
S‧‧‧錐形狀 S‧‧‧ cone shape
圖1是顯示使用FMM的OLED像素蒸鍍裝置之示意圖。FIG. 1 is a schematic diagram showing an OLED pixel evaporation device using FMM.
圖2是顯示遮罩之示意圖。FIG. 2 is a schematic diagram showing a mask.
圖3是顯示本發明一實施形態的框架一體型遮罩之示意圖。FIG. 3 is a schematic view showing a frame-integrated mask according to an embodiment of the present invention.
圖4及圖5為示意圖,其顯示製造本發明一實施形態的圖3之框架一體型遮罩的過程。4 and 5 are schematic views showing a process of manufacturing the frame-integrated mask of FIG. 3 according to an embodiment of the present invention.
圖6是顯示應用圖3之框架一體型遮罩的OLED像素蒸鍍裝置之示意圖。FIG. 6 is a schematic diagram showing an OLED pixel vapor deposition device using the frame-integrated mask of FIG. 3.
Claims (14)
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KR1020170119805A KR20190031849A (en) | 2017-09-18 | 2017-09-18 | Producing method of mask integrated frame |
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TW107132284A TW201921098A (en) | 2017-09-18 | 2018-09-13 | Producing method of mask integrated frame |
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KR (1) | KR20190031849A (en) |
CN (1) | CN111406127A (en) |
TW (1) | TW201921098A (en) |
WO (1) | WO2019054716A1 (en) |
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JP2001254169A (en) * | 2000-03-13 | 2001-09-18 | Optonix Seimitsu:Kk | Metal mask for vapor deposition, and its manufacturing method |
JP2005105328A (en) * | 2003-09-30 | 2005-04-21 | Canon Inc | Method for manufacturing mask structure, mask structure and vapor deposition apparatus |
JP2006152396A (en) * | 2004-11-30 | 2006-06-15 | Sony Corp | Method for manufacturing metal mask, mask of artwork master for electroforming and artwork master |
JP2010222687A (en) * | 2009-03-25 | 2010-10-07 | Seiko Epson Corp | Mask for film formation |
KR20120069396A (en) * | 2010-12-20 | 2012-06-28 | 삼성모바일디스플레이주식회사 | Mask frame assembly for deposition, manufacturing method of the same, and manufacturing method of organic light emitting display device thereused |
KR102126699B1 (en) * | 2013-05-30 | 2020-06-26 | 삼성디스플레이 주식회사 | Method of manufacturing mask |
KR101569191B1 (en) * | 2013-10-25 | 2015-11-16 | (주)유우일렉트로닉스 | Wafer Level Packaging Device |
KR102586048B1 (en) * | 2016-01-12 | 2023-10-10 | 삼성디스플레이 주식회사 | Mask assembly, manufacturing method for the same, manufacturing apparatus for a display apparatus having the same |
-
2017
- 2017-09-18 KR KR1020170119805A patent/KR20190031849A/en not_active Application Discontinuation
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2018
- 2018-09-11 CN CN201880058364.1A patent/CN111406127A/en not_active Withdrawn
- 2018-09-11 WO PCT/KR2018/010587 patent/WO2019054716A1/en active Application Filing
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