TW201829273A - Turret handler and testing method thereof - Google Patents

Abstract

A turret handler is provided, which is adapted to test an electronic device. The electronic device includes a device body and a plurality of leads. The turret handler includes a nozzle, a stage, a test block and an abutting unit. The nozzle is adapted to hold the device body and move the electronic device. The test block is disposed on the stage. The nozzle moves the electronic device to the test block to be tested. The test block includes a coupling unit and an initiative portion. The coupling unit includes a coupling portion, a pressing portion and an elastic structure. The elastic structure is connected ot the pressing portion. The initiative portion is connected to the elastic structure. In an access state, a reaction force is applied to the initiative portion. In a test state, the reaction force is released.

Description

 Turret test equipment and turret test method thereof  

The present invention relates to a turret type test apparatus, and more particularly to a turret type test apparatus capable of maintaining the yield of electronic components.

Turret test equipment is generally used for testing non-pin type wafers. When the lead type wafer is tested with a turret type test equipment, the suction pressure of the nozzle is transmitted to the test socket via the pin due to the rigidity of the lead. It is limited, so it is easy to be deformed by force, which causes the standoff of the lead to decrease, resulting in a decrease in the yield of the wafer after the test. However, due to the high efficiency and space saving advantages of the turret type test equipment, how to apply the turret type test equipment to detect the lead type wafer has become an important issue.

The present invention is directed to a turret type test apparatus for solving the problems of the prior art, and is suitable for testing an electronic component including an element body and a plurality of pins. The turret type testing device comprises a nozzle, a working base, a test seat and an abutting unit. The nozzle is adapted to adsorb the component body to move the electronic component. The test stand is disposed on the work base, and the nozzle moves the electronic component to the test stand to perform a test procedure, including a coupling unit and an active part. The coupling unit includes a coupling portion, a crimping leg portion and an elastic structure, and the elastic structure connects the crimping leg portion. The active portion connects the elastic structure. In a pick-and-place state, the abutting unit applies a reaction force to the active portion. In a test state, the abutting unit is separated from the test seat, whereby the reaction force received by the active portion is released. Wherein, in a pick-and-place state, the active portion receives the reaction force, and the active portion pushes the elastic structure to maintain the crimping leg portion in a first orientation to allow the electronic component to be taken and placed in a test state. The reaction force received by the active portion is released, and the active portion releases the elastic structure to move the crimping foot to a second orientation to crimp the pins and the coupling portion, thereby The electronic component is tested through the coupling.

The invention also provides a turret type test method comprising the following steps. First, the aforementioned turret type test apparatus is provided, wherein the turret type test apparatus further includes a component input unit and a component output unit. Then, the electronic component is sucked and lifted from the component input unit by the nozzle. Then, the nozzle is placed in the test stand for testing. Then, after the electronic component is lifted from the test socket by the nozzle, the electronic component is transferred and placed on the component output unit. Wherein, in the pick-and-place state and the test state, the nozzle continuously adsorbs the electronic component.

According to the turret type test apparatus of the embodiment of the present invention, the electronic component includes the component body and the plurality of pins, and the nozzle only adsorbs the component body, and the nozzle passes through the component body of the electronic component to push the component placement portion. The thrust does not pass completely through the pins, but is mainly transmitted directly to the component placement portion via the bottom of the component body of the electronic component. Therefore, the pin is not deformed by the force, and a good standoff value can be maintained, that is, the electronic component yield after the detection is improved. In addition, during the detection process, since the nozzle continuously adsorbs the electronic component, the pick-and-place time can be saved and the test efficiency can be improved.

1‧‧‧ nozzle

2‧‧‧Working abutments

3‧‧‧ test seat

31‧‧‧ coupling unit

311‧‧‧ coupling

312‧‧‧ Crimp foot

313‧‧‧Flexible structure

32‧‧‧Active Department

33‧‧‧Component placement

34‧‧‧ base

35‧‧‧Flex recovery unit

4‧‧‧Abutment unit

41‧‧‧ access opening

5‧‧‧Elastic displacement unit

E‧‧‧Electronic components

E1‧‧‧ pin

T‧‧‧ turret test equipment

D1‧‧‧normal spacing

S1, S2, S3, S4‧‧‧ steps

Fig. 1 is a view showing a turret type test apparatus of an embodiment of the present invention.

Figure 2 shows the detailed structure of the test stand.

Figure 3A shows a partial cross-sectional view of the test socket.

Figure 3B shows the pin being pinched by the crimp foot.

4A to 4C are diagrams showing the testing process of the turret type test apparatus of the embodiment of the present invention.

Fig. 5 is a view showing a turret type test method of an embodiment of the present invention.

Referring to Fig. 1, there is shown a turret type test apparatus T according to an embodiment of the present invention, which is suitable for testing an electronic component E comprising a plurality of pins E1 and an element body E2. The turret type test apparatus T includes a nozzle 1, a work base 2, a test seat 3, and an abutment unit 4. Referring to Figures 1, 2, and 3A, the nozzle 1 adsorbs only the element body E2 to move the electronic component E. The test stand 3 is disposed on the work base 2 and includes a coupling unit 31 and an active portion 32. The coupling unit 31 includes a coupling portion 311 , a crimping leg portion 312 , and an elastic structure 313 . The elastic structure 313 is connected to the crimping leg portion 312 . The active portion 32 connects the elastic structure 31.

Referring to FIG. 3B, when the electronic component E is tested, the pin E1 is placed over the coupling portion 311 and can be pressed by the crimping leg portion 312 for detection.

Referring to Figures 4A-4C, there is shown the use of the turret type test apparatus T of the embodiment of the present invention. In this embodiment, the relative position between the abutment unit 4 and the work base 2 is fixed. In an embodiment, the abutting unit 4 is a cover, and the test seat 3 is disposed in the abutting unit 4, the abutting unit 4 is fixedly connected to the working base 2, and a pick-and-place opening 41 is formed. On the top surface of the abutting unit 4, the nozzle 1 and the electronic component E enter and exit the abutting unit 4 through the access opening 41.

Referring to Figures 4A-4C, the test stand 3 is free to move between a first position (as shown in Figures 4A and 4C) and a second position (as shown in Figure 4B). In an embodiment, the turret test apparatus T further includes an elastic displacement unit 5 disposed between the work base 2 and the test seat 3, and the elastic displacement unit 5 is adapted to The test seat 3 is pushed back from the second position to the first position and continues to provide thrust to the test seat 3 in the first position. When the test seat 3 is in the first position, based on the thrust applied by the elastic displacement unit 5 to the test seat 3, the abutting unit 4 applies a reaction force to the active portion 32; when the test seat 3 is in the In the second position, the abutment unit 4 is separated from the test seat 3.

Referring to Figures 4A and 4B, in one embodiment, the test socket 3 includes a component placement portion 33. As described above, the electronic component E includes the component body E2 and the plurality of pins E1, and the nozzle 1 is urged through the component body E2 to press the component placement portion 33. When the nozzle 1 and the component body E2 push the component placement portion 33, the test socket 3 is pushed from the first position (Fig. 4A) to the second position (Fig. 4B). The abutting unit 4 is separated from the test seat 3. The reaction force received by the active portion 32 is released, and the active portion 32 releases the elastic structure 313 to rotate the crimping leg portion 312 to the second orientation for crimping. The pins E1 and the coupling portion 311.

Referring to FIG. 4C, when the nozzle 1 and the electronic component E are to be lifted off the test stand 3, the test seat 3 is pushed by the elastic displacement unit 5, and is pushed from the second position (FIG. 4B). Up to the first position (FIG. 4C), the abutting unit 4 applies the reaction force to the active portion 32, and the active portion 32 pushes the elastic structure 313 to return the crimping leg portion 312 to the first position. One direction is separated from the pins E1. Thereby, the electronic component E can be freely taken out.

Referring to FIG. 4A, in a pick-and-place state, the active portion 32 receives the reaction force, and the active portion 32 pushes the elastic structure 313 such that the crimping leg portion 312 is in a first orientation. In this state, the crimping leg portion 312 is separated from the coupling portion 311, so that the nozzle 1 can take the electronic component E between the crimping leg portion 312 and the coupling portion 311. Referring to FIG. 4B, in a test state, the reaction force received by the active portion 32 is released, and the active portion 32 releases the elastic structure 313, so that the crimping leg portion 312 is rotated to a second orientation to be pressed. The pins E1 and the coupling portion 311 are connected. Thereby, the electronic component E is positioned and coupled. Referring to FIG. 4A, in the pick-and-place state, the abutting unit 4 applies the reaction force to the main portion 32. Referring to FIG. 4B, in the test state, the abutment unit 4 is separated from the test seat 3, whereby the reaction force received by the active portion 32 is released.

In an embodiment, a normal spacing d1 exists between the upper surface of the coupling portion 311 and the upper surface of the component placement portion 33, and the normal spacing d1 is equal to the height of the pins E1 of the electronic component E. Value (standoff). When the turret type test apparatus of the embodiment of the present invention is used, when the nozzle 1 is pushed through the component body E2 of the electronic component E to push the component placement portion 33, the thrust does not completely pass through the lead E1, but mainly directly via the electronic device. The bottom of the element body E2 of the component E is transmitted to the component placement portion 33. Therefore, the lead E1 is not deformed by the force, and a good standoff value can be maintained, that is, the electronic component yield after the detection is improved.

Referring to FIGS. 4A, 4B, and 4C, in an embodiment, the test seat 3 further includes a base portion 34 and a spring recovery unit 35. The spring recovery unit 35 is disposed between the base portion 34 and the active portion 32. The elastic recovery unit 35 provides an elastic restoring force to the active portion 32. The coupling portion 311 and the elastic structure 313 are both connected to the base portion 34.

Referring to Figure 5, the present invention also provides a turret type test method comprising the following steps. First, the aforementioned turret type test apparatus is provided, wherein the turret type test apparatus further includes a component input unit (for example, a tray) and a component output unit (S1). Next, the electronic component (S2) is vacuum-adsorbed from the component input unit by the nozzle. Then, the electronic component is placed in the test stand with the nozzle for testing (S3). Next, after the electronic component is lifted from the test stand by the nozzle, the electronic component is transferred and placed in the component output unit (S4). Wherein, in the pick-and-place state and the test state, the nozzle continuously adsorbs the electronic component. In particular, in an embodiment, the step of adsorbing the electronic component from the component input unit to the step of placing the electronic component between the component output unit, the nozzle maintains a vacuum and continuously adsorbs the electronic component . By applying the invention, in the detection process, since the nozzle continuously adsorbs the electronic component, the process of re-entering the vacuum state is eliminated, thereby saving the pick-and-place time and improving the test efficiency.

While the present invention has been described above in terms of the preferred embodiments thereof, it is not intended to limit the invention, and may be modified and modified without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

Claims (10)

 A turret type testing device is suitable for testing an electronic component, the electronic component comprising a component body and a plurality of pins, comprising: a nozzle adapted to adsorb the component body to move the electronic component; a test stand is disposed on the work base, the nozzle moves the electronic component to the test stand to perform a test procedure, including: a coupling unit, including a coupling portion, a crimping leg portion, and a An elastic structure connecting the crimping leg; and an active portion connecting the elastic structure; and an abutting unit, in a pick-and-place state, the abutting unit applies a reaction force to the active portion, In a test state, the abutting unit is separated from the test seat, whereby the reaction force received by the active portion is released, wherein, in a pick-and-place state, the active portion receives the reaction force, and the active portion pushes Squeezing the elastic structure to maintain the crimping leg in a first orientation to permit access to the electronic component. In a test state, the reaction force received by the active portion is released, and the active portion is released. Resilient structure, so that the crimp legs to move to a second orientation the leads and crimp the coupling portion, whereby the electronic component tested via the coupling portion.    The turret type test apparatus of claim 1, wherein the relative position between the abutting unit and the working base is fixed, and the test seat moves between a first position and a second position. When the test seat is in the first position, the abutting unit applies the reaction force to the active portion, and when the test seat is in the second position, the abutting unit is separated from the test seat.    The turret type test apparatus of claim 2, further comprising an elastic displacement unit disposed between the work base and the test seat, the elastic displacement unit being adapted to test the test The seat is pushed back from the second position to the first position.    The turret-type testing device of claim 3, wherein the abutting unit is a cover, the test seat is disposed in the abutting unit, and the abutting unit is fixedly connected to the working base .    The turret type test apparatus of claim 4, wherein the abutting unit has a pick-and-place opening, and the nozzle and the electronic component enter and exit the abutting unit through the pick-and-place opening.    The turret type test apparatus of claim 3, wherein the test stand includes a component placement portion, the test socket is from the nozzle when the nozzle and the electronic component push the component placement portion The first position is pushed to the second position, at which time the abutting unit is separated from the test seat, the reaction force received by the active portion is released, and the active portion releases the elastic structure, so that the crimping foot is Rotating to the second orientation to crimp the pins and the coupling portion.    The turret type test apparatus of claim 6, wherein the test seat is pushed by the elastic displacement unit from the second position when the nozzle and the electronic component are to be lifted off the test stand Up to the first position, the abutting unit applies the reaction force to the active portion, and the active portion pushes the elastic structure to return the crimping leg to the first orientation to be separated from the pins.    The turret type test apparatus of claim 6, wherein a normal spacing between the upper surface of the coupling portion and the upper surface of the component placement portion is equal to the electronic component. The standoff value of the pin.    A turret type test method, comprising: providing the turret type test apparatus according to claim 1, wherein the turret type test apparatus further comprises a component input unit and a component output unit; Lifting and lifting the electronic component from the component input unit; placing the electronic component in the test socket with the nozzle for testing; after the nozzle sends the electronic component from the test socket, the electronic component is transferred and placed In the component output unit, the nozzle continues to adsorb the electronic component in the pick-and-place state and the test state.    The turret type test method of claim 9, wherein the step of adsorbing the electronic component from the component input unit to the step of placing the electronic component between the component output unit, the nozzle Continue to adsorb the electronic component.