TW201827375A - Device and method for producing glass substrate - Google Patents

Device and method for producing glass substrate Download PDF

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Publication number
TW201827375A
TW201827375A TW106143085A TW106143085A TW201827375A TW 201827375 A TW201827375 A TW 201827375A TW 106143085 A TW106143085 A TW 106143085A TW 106143085 A TW106143085 A TW 106143085A TW 201827375 A TW201827375 A TW 201827375A
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Taiwan
Prior art keywords
gas
path
processing gas
supply path
processing
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TW106143085A
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Chinese (zh)
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TWI751242B (en
Inventor
山本好晴
弘樹
大野和宏
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日商日本電氣硝子股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/0237Materials
    • H01L21/02422Non-crystalline insulating materials, e.g. glass, polymers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/02Details
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/10Apparatus or processes specially adapted to the manufacture of electroluminescent light sources

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Organic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Surface Treatment Of Glass (AREA)
  • Chemical Vapour Deposition (AREA)
  • Electroluminescent Light Sources (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Liquid Crystal (AREA)

Abstract

A glass substrate production device 10 according to the present invention is provided with a surface treatment unit 11 for supplying a treatment gas Ga onto one main surface of a plate-like glass, which serves as a glass substrate, to perform a specific surface treatment. The surface treatment unit 11 is provided with: a treatment gas generation unit 16; a gas supply passage 17 through which the treatment gas Ga is supplied onto one main surface of the plate-like glass; a detoxification unit 18 for subjecting the treatment gas Ga to a detoxification treatment; a gas exhaust passage 19 through which the treatment gas Ga supplied onto the one main surface is introduced into the detoxification unit 18; and a harmless gas inlet passage 20 through which a harmless gas Gb is introduced into the gas supply passage 17. Either one of the harmless gas Gb and the treatment gas Ga can be introduced into the downstream side of the gas supply passage 17 relative to a junction P1 of the harmless gas inlet passage 20 and the gas supply passage 17.

Description

玻璃基板之製造裝置及製造方法Device and method for manufacturing glass substrate

[0001] 本發明係關於玻璃基板之製造裝置及製造方法,特別是關於用來對成為玻璃基板之板狀玻璃的表面,實施藉由處理氣體之表面處理的技術。[0001] The present invention relates to a manufacturing apparatus and a manufacturing method for a glass substrate, and more particularly, to a technology for performing a surface treatment with a processing gas on the surface of a plate-shaped glass that becomes a glass substrate.

[0002] 如習知,關於近年的圖像顯示裝置,液晶顯示器(LCD)、電漿顯示器(PDP)、場發射顯示器(FED)、有機EL顯示器(OLED)等所代表之平板顯示器(以下僅稱為FPD)為主流。關於這些FPD,由於促進輕量化,故,關於使用於FPD的玻璃基板,亦對於薄板化的要求提高。   [0003] 前述玻璃基板係藉由下述的方式獲得,亦即,將例如藉由各種下拉法所代表之板狀玻璃的成形方法成形為帶狀的板狀玻璃(帶狀板玻璃)裁斷成預定的尺寸,再將裁斷的板狀玻璃之寬度方向(與帶狀板玻璃的主表面平行且與長度方向正交之方向。之後相同)的兩端部進一步裁斷後,因應需要,對各裁斷面實施研磨加工等所獲得。   [0004] 又,當製造這種玻璃基板時,會有其製造過程中之靜電的帶電造成問題的情況。亦即,絕緣體之玻璃具有非常容易帶電之性質,在玻璃基板的製造製程,例如當將玻璃基板載置於載置台而實施預定的加工時,會有因玻璃基板與載置台之接觸剝離造成玻璃基板帶電之情況(會有將此稱為剝離帶電之情況)。若具有導電性的物體接近帶電的玻璃基板的話,會產生放電,造成此放電會導致形成於玻璃基板的主表面上之各種元件、構成電子電路的電極線等破損、玻璃基板本身破損之虞(會有將此稱為絕緣破壞或靜電破壞之情況)。又,帶電後的玻璃基板容易貼附於載置台,會有因將其強力剝離的話導致玻璃基板破損之虞。這些會成為顯示不良之原因,應要極力避免之情事。   [0005] 作為用來迴避前述情事之手段,例如可考量對玻璃基板的背面(與載置台的載置面接觸之側的主表面)供給預定的處理氣體,對背面實施表面處理,藉此將背面粗糙化之方法。由於會有玻璃基板與載置台之接觸面積越大,剝離時的帶電量越增大之傾向,故,期待藉由將與載置台的載置面接觸之玻璃基板的背面粗糙化,可使玻璃基板與載置台之接觸面積減少,能夠謀求剝離時的帶電抑制。又,有鑑於玻璃基板的背面越平滑,容易貼附於如載置面這樣的平滑面,如上述般,藉由將玻璃基板的背面粗糙化而例如將該背面的表面粗糙度作成較載置面的表面粗糙度大,使得玻璃基板不易貼附於載置面。藉此,可期待能夠防止剝離時的玻璃基板之破損。   [0006] 在此,作為如前述可進行表面處理之結構,例如在下述專利文獻1記載有一種表面處理裝置,其具備有:在已將玻璃基板載置之狀態下朝預定的方向搬運之搬運手段;將含有氟化氫氣體的處理氣體朝搬運路徑上的玻璃基板之背面供給,且將供給後的處理氣體排出至排氣系統之噴射器。在此,在噴射器,與氟化氫氣體源連接之第一狹縫設在玻璃基板的搬運方向預定位置,並且與載體氣體源連接之第二狹縫設在第一狹縫之前述搬運方向兩側的預定位置。又,與排氣系統連接的第三狹縫是設在第二狹縫之更靠近前述搬運方向兩側的預定位置。 [先前技術文獻] [專利文獻]   [0007] [專利文獻1] 日本特開2014-80331號公報[0002] As is known, with regard to image display devices in recent years, flat panel displays represented by liquid crystal displays (LCD), plasma displays (PDP), field emission displays (FED), organic EL displays (OLED), etc. (hereinafter only (Referred to as FPD) is the mainstream. With regard to these FPDs, since weight reduction is promoted, the glass substrates used for FPDs have also been required to be thinner. [0003] The aforementioned glass substrate is obtained by cutting, for example, a sheet-shaped glass (ribbon-shaped glass) formed into a band shape by a sheet glass forming method represented by various down-draw methods, for example. A predetermined size is further cut at both ends of the width direction of the cut sheet glass (a direction parallel to the main surface of the sheet glass sheet and orthogonal to the length direction. The same applies thereafter). The surface is obtained by polishing. [0004] Furthermore, when such a glass substrate is manufactured, there may be a problem that static electricity is charged during the manufacturing process. That is, the glass of the insulator is very easy to be charged. In the manufacturing process of the glass substrate, for example, when the glass substrate is placed on a mounting table and a predetermined process is performed, the glass may be caused by the contact and peeling of the glass substrate and the mounting table. The substrate is charged (this may be referred to as peeling charging). If a conductive object approaches a charged glass substrate, a discharge will occur, causing this discharge to cause damage to various elements formed on the main surface of the glass substrate, electrode wires constituting electronic circuits, and the glass substrate itself. (This may be called insulation damage or static electricity damage). In addition, the charged glass substrate is easily attached to the mounting table, and there is a risk that the glass substrate may be damaged if the glass substrate is strongly peeled off. These will be the cause of poor display and should be avoided as much as possible. [0005] As a means for avoiding the foregoing, for example, a predetermined processing gas may be supplied to the back surface of the glass substrate (the main surface on the side in contact with the mounting surface of the mounting table), and the back surface may be subjected to a surface treatment to thereby Method for roughening the back. As the contact area between the glass substrate and the mounting table becomes larger, the charge amount at the time of peeling tends to increase. Therefore, it is expected that the surface of the glass substrate that is in contact with the mounting surface of the mounting table may be roughened to make the glass more rough. The contact area between the substrate and the mounting table is reduced, and it is possible to suppress charging during peeling. In addition, since the rear surface of the glass substrate is smoother, it is easier to attach it to a smooth surface such as a mounting surface. As described above, the rear surface of the glass substrate is roughened, for example, to make the surface roughness of the rear surface relatively smooth. The surface has a large surface roughness, which makes it difficult to attach the glass substrate to the mounting surface. Accordingly, it is expected that the glass substrate can be prevented from being damaged during peeling. [0006] Here, as a structure capable of performing surface treatment as described above, for example, a surface treatment device described in the following Patent Document 1 includes a conveyance that conveys in a predetermined direction in a state where a glass substrate is placed. Means: The processing gas containing hydrogen fluoride gas is supplied to the back surface of the glass substrate on the conveyance path, and the supplied processing gas is discharged to an ejector of the exhaust system. Here, in the ejector, the first slit connected to the hydrogen fluoride gas source is provided at a predetermined position in the carrying direction of the glass substrate, and the second slit connected to the carrier gas source is provided on both sides of the first slit in the carrying direction. Predetermined location. In addition, the third slit connected to the exhaust system is provided at a predetermined position of the second slit closer to both sides of the carrying direction. [Prior Art Document] [Patent Document] [0007] [Patent Document 1] Japanese Patent Laid-Open No. 2014-80331

[發明所欲解決之課題]   [0008] 在這種表面處理裝置運轉的期間,如在專利文獻1所記載,形成有氟化氫氣體的流動(供給系統及排氣系統),亦即,將以氟化氫氣體源所生成的氟化氫氣體經由第一狹縫(亦即供氣口)連續地供給至玻璃基板,再將供給後的氟化氫氣體經由配置於第一狹縫的周圍之第三狹縫(所謂的排氣口)朝排氣系統排出。然而,在因某種事情造成表面處理裝置停止而要進行維修之情況,在進行表面處理裝置的分解前,首先,產生需要進行將對人體有害的氟化氫氣體從前述供氣系統及排氣系統排除。   [0009] 但,如在專利文獻1所記載,當採取將氟化氫氣體源與第一狹縫經由預定的供氣系統連接的構造之情況,就算停止藉由氟化氫氣體源之氟化氫氣體源的生成及供給,在前述供氣系統中亦會殘存有氟化氫氣體。因此,直到將殘存於此供氣系統的氟化氫氣體完全排出為止,需要龐大的時間,造成為了進行維修之等待時間增加。因此,會有導致生產性大幅降低之虞。   [0010] 有鑑於以上的情事,在本發明,其欲解決之技術課題係在於能夠安全且短時間實施使用處理氣體朝板狀玻璃進行表面處理之表面處理裝置的維修。 [用以解決課題之手段]   [0011] 藉由本發明之玻璃基板之製造裝置可解決前述課題。亦即,此製造裝置係具備有表面處理裝置,該表面處理裝置為對成為玻璃基板的板狀玻璃之其中一方的主表面供給處理氣體,用來實施預定的表面處理,其特徵為,表面處理裝置係具備有:生成處理氣體之處理氣體生成裝置;將處理氣體供給至其中一方的主表面之供氣路徑;對處理氣體實施除害處理之除害裝置;及將已被供給至其中一方的主表面之處理氣體導入至除害裝置的排氣路徑,可對供氣路徑導入無害氣體之無害氣體導入路徑是與供氣路徑匯集。再者,在此所稱的[無害氣體]係指除去一般對人體有害之被一般認定的種類之氣體(包含大氣污染法所規定的有害物質之氣體、有害氣體)之氣體,即使直接或與大氣混合之狀態下與人體接觸或吸入,實質上也無害之氣體。   [0012] 如此,在本發明,藉由使將無害氣體導入至供氣路徑之無害氣體導入路徑匯集於供氣路徑,在較無害氣體導入路徑與供氣路徑之匯集位置更靠近供氣路徑之下游側,可導入無害氣體與處理氣體中的其中一方。若依據此結構,因可僅將無害氣體導入至供氣路徑,所以,能以無害氣體置換至少殘存於供氣路徑的處理氣體。因此,作業者能安全地分解表面處理裝置而進行維修。又,藉由採用無害氣體導入路徑匯集於供氣路徑之形態,不需通過處理氣體生成裝置而可將無害氣體導入至供氣路徑。在使其通過處理氣體生成裝置這樣的精密機器之情況,會有無害氣體的流量等受到限制之虞,但,若為不需通過處理氣體生成裝置即可導入無害氣體的話,則可較自由地設定其導入條件(無害氣體的流量、壓力、溫度等)。因此,例如藉由將流量設定成較多,能夠在短時間進行藉由無害氣體之處理氣體的置換。   [0013] 又,本發明之玻璃基板之製造裝置,亦可還具備有:可開閉無害氣體導入路徑之第一開閉閥;及在較匯集位置更靠近供氣路徑的上游側,可開閉供氣路徑之第二開閉閥。或亦可還具有三向閥,該三向閥是設在匯集位置,可切換供氣路徑中從匯集位置的上游側朝向下游側之處理氣體的流動、和從無害氣體導入路徑朝向匯集位置的下游側之無害氣體的流動。   [0014] 如此,作成設有第一開閉閥與第二開閉閥,可在較匯集位置更靠近供氣路徑的下游側簡單地導入無害氣體與處理氣體中的其中一方。又,作成在匯集位置設有前述三向閥,可在較匯集位置更靠近供氣路徑的下游側更簡單地導入無害氣體或處理氣體。   [0015] 又,本發明之玻璃基板之製造裝置,亦可還具備有:處理氣體分歧路徑,其在較匯集位置更靠近供氣路徑的上游側分歧而將處理氣體導入至排氣路徑。又,在例如於供氣路徑設有第二開閉閥之情況,亦可進一步具備第三開閉閥,其用來開閉處理氣體分歧路徑。   [0016] 如上述般,藉由設置處理氣體分歧路徑,對處理氣體分歧路徑可導入處理氣體(在具備有第二開閉閥的情況,進一步具備有前述第三開閉閥),能夠在將處理氣體置換成無害氣體的期間,將在處理氣體生成裝置所生成的處理氣體通過處理氣體分歧路徑而持續輸送至排氣路徑。因此,在置換處理的期間,能夠迴避因在處理氣體生成裝置的內部或供氣路徑中處理氣體生成裝置與匯集位置之間處理氣體被封住所引起的缺失之產生,可安全地進行置換作業。   [0017] 又,在具備有第三開閉閥之情況,本發明之玻璃基板之製造裝置,亦可還具備有:配設於較處理氣體分歧路徑匯集於排氣路徑的位置更靠近排氣路徑的上游側,進行排氣路徑的開閉之第四開閉閥。   [0018] 如此,藉由在較處理氣體分歧路徑匯集於排氣路徑之位置更靠近排氣路徑的上游側設置開閉閥(第四開閉閥),能夠作成供氣路徑中較第二開閉閥更下游側之區域和板狀玻璃之處理空間(曝露於處理氣體中之空間)係與處理氣體的流路(處理氣體分歧路徑及排氣路徑中較第四開閉閥更下游側之區域)完全地切離的狀態。因此,例如當形成為在打開了第四開閉閥的狀態下進行藉由無害氣體之處理氣體的置換,前述供氣路徑與板狀玻璃的處理空間被無害氣體完全地充滿的狀態之時間點,藉由關閉第四開閉閥,不需要使處理氣體生成裝置停止,除了處理氣體分歧路徑與排氣路徑的一部分下游側,能夠安全地分解表面處理裝置並進行維修。   [0019] 又,本發明之玻璃基板之製造裝置,亦可為無害氣體係清淨乾空氣。   [0020] 作為無害氣體,若為實質上對人體無害的氣體的話,則可使用任意的氣體,但綜合考量對板狀玻璃之影響、成本面等之情況,清淨乾燥氣體為佳。   [0021] 又,藉由本發明之玻璃基板之製造方法可解決前述課題。亦即,此製造方法係具備有:對成為玻璃基板的板狀玻璃之表面供給處理氣體,實施預定的表面處理之表面處理製程;及在使表面處理製程停止的期間,進行用來實施表面處理的裝置之維修的維修製程之方法,其特徵為:在表面處理製程,將在處理氣體生成裝置所生成的處理氣體經由供氣路徑供給至表面,並且將已被供給至表面的處理氣體經由排氣路徑導入至除害裝置後,對處理氣體實施除害處理,並且在維修製程,藉由關閉供氣路徑並且在較關閉了供氣路徑之位置更靠近供氣路徑的下游側,對供氣路徑導入無害氣體,將通過供氣路徑之處理氣體置換成無害氣體。   [0022] 如此,在本發明之玻璃基板之製造方法,在維修製程中,藉由關閉供氣路徑並且在較關閉了供氣路徑的位置更靠近供氣路徑的下游側對供氣路徑導入無害氣體,將通過供氣路徑的處理氣體置換成無害氣體,因此,與本發明之玻璃基板之製造裝置同樣地,可對供氣路徑僅導入無害氣體。藉此,能以無害氣體置換至少殘存於供氣路徑的處理氣體,因此,作業者可安全地分解表面處理裝置。又,藉由在較關閉了供氣路徑的位置更靠近供氣路徑的下游側導入無害氣體,不需通過處理氣體生成裝置而可將無害氣體導入至供氣路徑。因此,可較自由地設定無害氣體導入至供氣路徑之導入條件(無害氣體的流量、壓力、溫度等),例如藉由將流量設定成較多,能夠在短時間進行藉由無害氣體之處理氣體的置換。   [0023] 又,本發明之玻璃基板之製造方法,亦可為在維修製程中,在較關閉了供氣路徑的位置更靠近供氣路徑的上游側,從供氣路徑分歧而可朝排氣路徑導入處理氣體。   [0024] 如此,藉由在較關閉了供氣路徑的位置更靠近供氣路徑的上游側,從供氣路徑分歧而可朝排氣路徑導入處理氣體,即使在關閉了供氣路徑之狀態,在將處理氣體置換成無害氣體的期間,亦可將在處理氣體生成裝置所生成的處理氣體持續輸送至排氣路徑。因此,在置換處理的期間,能夠迴避因在處理氣體生成裝置的內部或供氣路徑中處理氣體生成裝置與關閉供氣路徑的位置之間處理氣體被封住所引起的缺失之產生,可安全地進行置換作業。   [0025] 又,在此情況,本發明之玻璃基板之製造方法,亦可為在維修製程中,將通過供氣路徑的處理氣體置換成無害氣體後,停止朝供氣路徑導入無害氣體,並且在較從供氣路徑分歧而將處理氣體導入至排氣路徑的位置更靠近排氣路徑的上游側,關閉排氣路徑。   [0026] 如此,藉由進行各流路的開閉動作,能夠作成供氣路徑中較關閉了供氣路徑的位置更下游側之區域和板狀玻璃之處理空間(曝露於處理氣體中之空間)係與處理氣體的流路(從供氣路徑起之處理氣體的分歧路徑及排氣路徑中,較關閉了排氣路徑更下游側之區域)完全地切離的狀態。因此,例如當形成為在打開了排氣路徑的狀態下進行藉由無害氣體之處理氣體的置換,前述供氣路徑與板狀玻璃的處理空間被無害氣體完全地充滿的狀態之時間點,藉由關閉排氣路徑,不需要使處理氣體生成及供給暫時停止,除了處理氣體的前述流路,能夠安全地分解表面處理裝置並進行維修。   [0027] 又,在此情況,本發明之玻璃基板之製造方法,亦可為還具備有表面處理的重啟準備製程,其是將供氣路徑打開而朝供氣路徑導入處理氣體,並且關閉從供氣路徑分歧之流路,且打開排氣路徑,藉此將無害氣體置換成處理氣體。   [0028] 在關閉了供氣路徑的狀態下,可持續將處理氣體導入至排氣路徑的話,則至少在置換作業的期間,不需要使處理氣體的生成暫時停止。因此,在例如維修等的作業結束後,如上述般,利用在停止了無害氣體的導入之狀態下,打開供氣路徑,並且關閉處理氣體的分歧路,且打開排氣路徑,藉此將無害氣體置換成處理氣體,使得能夠在短時間再次以處理氣體將供氣路徑及排氣路徑充滿。因此,能夠省略重啟處理氣體的生成至處理氣體的生成狀態穩定為止之時間,在進行維修後,能夠迅速地重啟表面處理。   [0029] 又,本發明之玻璃基板之製造方法,亦可為在維修製程,停止藉由處理氣體生成裝置之處理氣體的生成,並且停止朝處理氣體生成裝置供給成為處理氣體的原料之氣體,並持續進行處理氣體所含有的載體氣體朝處理氣體生成裝置之供給。   [0030] 在使用包含有氟化氫氣體之氣體作為處理氣體的情況,作為用來生成此氟化氫氣體的裝置,會有採用能夠產生電漿反應之處理氣體生成裝置的情況。在此情況,在處理氣體生成裝置,一般被供給成為氟化氫氣體的原料之四氟化碳氣體等的氣體(原料氣體)、水及氟化氫氣體所含之氮氣等的載體氣體。因此,在維修製程,藉由停止酸性氣體的供給,並接著朝處理氣體生成裝置供給載體氣體,不僅供氣路徑,亦能以無害的氣體(載體氣體)置換處理氣體產生裝置的內部之處理氣體。因此,當表面處理裝置之用來進行表面處理的運轉停止時,可防止處理氣體生成裝置的內部持續曝露於處理氣體所引起之劣化,能夠長期間使用處理氣體生成裝置。又,藉由以載體氣體置換處理氣體生成裝置的內部之處理氣體,能夠從處理氣體生成裝置的內部完全地排除處理氣體。藉此,即使在需要進行處理氣體生成裝置的更換之情況,也能從供氣路徑安全地取下處理氣體生成裝置。 [發明效果]   [0031] 如以上所述,若依據本發明,能夠安全且短時間實施使用處理氣體朝板狀玻璃進行表面處理之表面處理裝置的維修。[Problems to be Solved by the Invention] 0008 [0008] During the operation of such a surface treatment device, as described in Patent Document 1, a flow of hydrogen fluoride gas (supply system and exhaust system) is formed, that is, hydrogen fluoride is used. The hydrogen fluoride gas generated by the gas source is continuously supplied to the glass substrate through the first slit (that is, the gas supply port), and the supplied hydrogen fluoride gas is then passed through a third slit (a so-called Exhaust port) to the exhaust system. However, in the case where the surface treatment device is stopped due to a certain thing and maintenance is required, before the surface treatment device is decomposed, first, it is necessary to remove the hydrogen fluoride gas which is harmful to the human body from the aforementioned gas supply system and exhaust system. . [0009] However, as described in Patent Document 1, when a structure in which a hydrogen fluoride gas source and a first slit are connected through a predetermined gas supply system is adopted, even if the generation and the generation of the hydrogen fluoride gas source by the hydrogen fluoride gas source are stopped, Supply, hydrogen fluoride gas will remain in the aforementioned gas supply system. Therefore, until the hydrogen fluoride gas remaining in the gas supply system is completely discharged, a large amount of time is required, and the waiting time for maintenance is increased. Therefore, there is a possibility that the productivity may be significantly reduced. [0010] In view of the foregoing, in the present invention, a technical problem to be solved is to perform maintenance of a surface treatment device that can safely and shortly perform surface treatment on a sheet glass using a treatment gas. [Means to Solve the Problems] [0011] The aforementioned problems can be solved by the glass substrate manufacturing apparatus of the present invention. That is, this manufacturing apparatus is provided with a surface treatment device for supplying a processing gas to one of the main surfaces of the plate-shaped glass which is a glass substrate for performing a predetermined surface treatment, and is characterized in that the surface treatment The device is provided with: a processing gas generating device for generating a processing gas; a gas supply path for supplying the processing gas to one of the main surfaces; a harmful gas removing device for performing a harmful gas treatment process on the processing gas; The processing gas on the main surface is introduced into the exhaust path of the harm removal device. The harmless gas introduction path that can introduce harmless gas into the gas supply path is integrated with the gas supply path. In addition, the term "innocuous gas" as used herein refers to a gas that excludes generally recognized types of gases that are generally harmful to the human body (gases containing harmful substances specified in the Air Pollution Law, and harmful gases), even if directly or in combination with It is substantially harmless when contacted or inhaled with the human body in the state of mixed air. [0012] Thus, in the present invention, by integrating the harmless gas introduction path that introduces the harmless gas into the gas supply path into the gas supply path, it is closer to the gas supply path than the collection position of the harmless gas introduction path and the gas supply path. On the downstream side, one of harmless gas and process gas can be introduced. According to this configuration, since only the harmless gas can be introduced into the gas supply path, the processing gas remaining at least in the gas supply path can be replaced with the harmless gas. Therefore, the operator can safely disassemble and repair the surface treatment apparatus. In addition, by adopting a form in which the harmless gas introduction path is integrated in the gas supply path, the harmless gas can be introduced into the gas supply path without using a processing gas generating device. When passing it through a precision machine such as a process gas generating device, the flow rate of the harmless gas may be restricted. However, if the harmless gas can be introduced without passing through the process gas generating device, it can be more freely. Set the introduction conditions (flow rate, pressure, temperature, etc. of the harmless gas). Therefore, for example, by setting the flow rate to be large, the process gas can be replaced with a harmless gas in a short time. [0013] The glass substrate manufacturing apparatus of the present invention may further include: a first on-off valve capable of opening and closing a harmless gas introduction path; and an opening and closing gas supply closer to an upstream side of the air supply path than a collection position. The second on-off valve of the path. Alternatively, the valve may be provided with a three-way valve. The three-way valve is provided at the collection position, and can switch the flow of the processing gas from the upstream side to the downstream side of the collection position in the gas supply path, and from the harmless gas introduction path to the collection position. Flow of harmless gas on the downstream side. [0014] In this way, the first on-off valve and the second on-off valve are provided so that one of the harmless gas and the processing gas can be simply introduced on the downstream side closer to the gas supply path than the collection position. In addition, the three-way valve is provided at the collecting position, so that it is easier to introduce harmless gas or processing gas on the downstream side closer to the gas supply path than the collecting position. [0015] In addition, the glass substrate manufacturing apparatus of the present invention may further include a processing gas branch path that branches at an upstream side closer to the gas supply path than the collection position to introduce the processing gas into the exhaust path. In addition, for example, when a second on-off valve is provided in the gas supply path, a third on-off valve may be further provided for opening and closing the processing gas branch path. [0016] As described above, by providing a process gas branch path, a process gas can be introduced into the process gas branch path (if a second on-off valve is provided, and the third on-off valve is further provided), the process gas can be switched on. During the replacement with the harmless gas, the processing gas generated in the processing gas generating device is continuously transported to the exhaust path through the processing gas branch path. Therefore, during the replacement process, it is possible to avoid the occurrence of a defect caused by the sealing of the processing gas between the processing gas generation device and the collection location in the processing gas generation device or in the gas supply path, and the replacement operation can be performed safely. [0017] In the case where the third on-off valve is provided, the glass substrate manufacturing apparatus of the present invention may further include: it is disposed closer to the exhaust path than a position where the processing gas branch path is collected in the exhaust path. On the upstream side, a fourth on-off valve that opens and closes the exhaust path. [0018] In this way, by providing an on-off valve (a fourth on-off valve) closer to the upstream side of the exhaust path than the position where the processing gas divergence path is collected in the exhaust path, it is possible to make the air supply path more advanced than the second on-off valve. The area on the downstream side and the processing space (the space exposed to the processing gas) of the plate glass are completely connected to the flow path of the processing gas (the processing gas branch path and the exhaust path on the downstream side of the fourth on-off valve). Cut off state. Therefore, for example, when the fourth on-off valve is opened to replace the processing gas with a harmless gas, the gas supply path and the processing space of the sheet glass are completely filled with the harmless gas. By closing the fourth on-off valve, it is not necessary to stop the processing gas generation device, and the surface processing device can be safely disassembled and repaired except for a part of the downstream side of the processing gas branch path and the exhaust path. [0019] Moreover, the glass substrate manufacturing apparatus of the present invention can also clean dry air for a harmless gas system. [0020] As the harmless gas, any gas can be used as long as it is substantially harmless to the human body, but it is better to clean the dry gas in consideration of the influence on the sheet glass and the cost. [0021] The aforementioned problems can be solved by the method for manufacturing a glass substrate of the present invention. That is, this manufacturing method includes a surface treatment process in which a processing gas is supplied to the surface of the plate-like glass that becomes a glass substrate to perform a predetermined surface treatment, and a surface treatment is performed while the surface treatment process is stopped. The method for maintaining and repairing the device is characterized in that in the surface treatment process, the processing gas generated by the processing gas generating device is supplied to the surface through a gas supply path, and the processing gas that has been supplied to the surface is discharged through the surface After the gas path is introduced into the detoxification device, the detoxification treatment is performed on the processing gas. During the maintenance process, the gas supply path is closed by closing the gas supply path and closer to the downstream side of the gas supply path than the position where the gas supply path is closed. Harmless gas is introduced into the path, and the processing gas passing through the gas supply path is replaced with harmless gas. [0022] Thus, in the manufacturing method of the glass substrate of the present invention, in the maintenance process, the gas supply path is closed by closing the gas supply path and being closer to the downstream side of the gas supply path than the position where the gas supply path is closed. The gas replaces the processing gas passing through the gas supply path with a harmless gas. Therefore, as with the glass substrate manufacturing apparatus of the present invention, only the harmless gas can be introduced into the gas supply path. Thereby, at least the processing gas remaining in the gas supply path can be replaced with a harmless gas, and therefore, the operator can safely disassemble the surface processing apparatus. In addition, by introducing the harmless gas closer to the downstream side of the gas supply path than the position where the gas supply path is closed, the harmless gas can be introduced into the gas supply path without passing through the processing gas generating device. Therefore, the introduction conditions (innocent gas flow rate, pressure, temperature, etc.) for introducing the innocuous gas into the gas supply path can be set freely. For example, by setting the flow rate to be large, the treatment by the innocuous gas can be performed in a short time. Gas replacement. [0023] In addition, in the manufacturing method of the glass substrate of the present invention, during the maintenance process, the gas supply path may be closer to the upstream side of the air supply path than the position where the air supply path is closed, and the air supply path may be diverted from the air supply path to the exhaust side. The path introduces a process gas. [0024] In this way, by being closer to the upstream side of the air supply path than the position where the air supply path is closed, the process gas can be diverted from the air supply path to the exhaust path, even when the air supply path is closed, While the processing gas is being replaced with a harmless gas, the processing gas generated in the processing gas generating device may be continuously delivered to the exhaust path. Therefore, during the replacement process, it is possible to avoid the occurrence of a defect caused by the sealing of the processing gas between the inside of the processing gas generation device or the processing gas generation device and the position where the gas supply path is closed, and it is safe to do so. Perform replacement work. [0025] In this case, the manufacturing method of the glass substrate of the present invention may also be configured to stop introducing the harmless gas into the gas supply path after replacing the processing gas passing through the gas supply path with the harmless gas in the maintenance process, and The exhaust path is closed closer to the upstream side of the exhaust path than the position where the process gas is diverted from the air supply path to the exhaust path. [0026] In this way, by opening and closing each flow path, it is possible to create a region on the gas supply path further downstream than the position where the gas supply path is closed, and a processing space (space exposed to the processing gas) of the sheet glass. It is in a state of being completely cut off from the flow path of the processing gas (the branch path of the processing gas from the gas supply path and the exhaust path, a region further downstream than the exhaust path is closed). Therefore, for example, when the replacement of the processing gas with the harmless gas is performed in a state where the exhaust path is opened, the point at which the aforementioned gas supply path and the processing space of the sheet glass are completely filled with the harmless gas is borrowed. By closing the exhaust path, it is not necessary to temporarily stop the generation and supply of the process gas, and in addition to the aforementioned flow path of the process gas, the surface treatment apparatus can be safely disassembled and repaired. [0027] In this case, the manufacturing method of the glass substrate of the present invention may also include a restart preparation process that further includes a surface treatment, which opens the gas supply path and introduces a processing gas toward the gas supply path, and closes the The flow path of the gas supply path is divergent, and the exhaust path is opened, thereby replacing the harmless gas with the processing gas. [0028] If the process gas is continuously introduced into the exhaust path in a state where the gas supply path is closed, it is not necessary to temporarily stop the generation of the process gas during at least the replacement operation. Therefore, as described above, after the completion of work such as maintenance, the supply path is opened while the introduction of harmless gas is stopped, the branch path of the process gas is closed, and the exhaust path is opened, thereby harmless The replacement of the gas with the processing gas makes it possible to fill the gas supply path and the exhaust path with the processing gas again in a short time. Therefore, it is possible to omit the time until the generation of the processing gas is restarted until the generation state of the processing gas is stable, and the surface treatment can be restarted quickly after the maintenance is performed. [0029] In addition, the method for manufacturing a glass substrate of the present invention may be to stop the generation of the processing gas by the processing gas generating device during the maintenance process, and stop supplying the processing gas generating device with a gas that becomes the raw material of the processing gas. The carrier gas contained in the process gas is continuously supplied to the process gas generating device. [0030] When a gas containing hydrogen fluoride gas is used as a processing gas, as a device for generating this hydrogen fluoride gas, a processing gas generating device capable of generating a plasma reaction may be used. In this case, in the processing gas generating device, a gas (raw gas) such as carbon tetrafluoride gas, which is a raw material of hydrogen fluoride gas, and a carrier gas such as nitrogen contained in water and hydrogen fluoride gas are generally supplied. Therefore, in the maintenance process, by stopping the supply of the acid gas and then supplying the carrier gas to the processing gas generating device, not only the gas path, but also the harmless gas (carrier gas) can be used to replace the processing gas inside the processing gas generating device. . Therefore, when the operation of the surface treatment device for performing surface treatment is stopped, the inside of the processing gas generating device can be prevented from being degraded due to continuous exposure to the processing gas, and the processing gas generating device can be used for a long period of time. In addition, by replacing the processing gas inside the processing gas generating device with a carrier gas, the processing gas can be completely excluded from the inside of the processing gas generating device. Thereby, even when it is necessary to replace the processing gas generating device, the processing gas generating device can be safely removed from the gas supply path. [Inventive Effect] [0031] As described above, according to the present invention, it is possible to perform maintenance of a surface treatment apparatus that performs a surface treatment on a sheet glass using a treatment gas safely and in a short time.

[0033] [本發明的第一實施形態]   以下,參照圖1至圖4說明關於本發明的第一實施形態。再者,在本實施形態,作為板狀玻璃,以對成形為帶狀板玻璃裁切成預定的尺寸之玻璃基板的背面實施表面處理的情況為例進行說明。   [0034] 圖1係顯示本發明的第一實施形態之玻璃基板之製造裝置10。此製造裝置10係具備有:對玻璃基板P的一方的主表面Pa(圖1中的下表面)實施預定的表面處理之表面處理裝置11;及用來收容表面處理裝置11之處理槽12。   [0035] 其中,表面處理裝置11係為對玻璃基板P的一方的主表面Pa供給處理氣體Ga並實施預定的表面處理之裝置,具備有:供成為處理對象之玻璃基板P插通的插通路徑13;開口於插通路徑13之供氣口14;在與供氣口14不同的位置,開口於插通路徑13之排氣口15;生成處理氣體Ga之處理氣體生成裝置16;將處理氣體生成裝置16與供氣口14相連之供氣路徑17;對處理氣體Ga實施除害處理之除害裝置18;將排氣口15與除害裝置18相連之排氣路徑19;及將無害氣體Gb導入至供氣路徑17之無害氣體導入路徑20。在本實施形態、表面處理裝置11,除了前述要件外,還具備有:從供氣路徑17分歧而將處理氣體Ga導入至排氣路徑19之處理氣體分歧路徑21。又,在無害氣體導入路徑20的上游側,配設有壓縮機等的無害氣體導入裝置22,能夠操作無害氣體Gb之供給及停止。   [0036] 在無害氣體導入路徑20,配設有用來開閉無害氣體導入路徑20之第一開閉閥23。藉此,能夠切換無害氣體Gb朝供氣路徑17之導入及停止。   [0037] 又,在供氣路徑17中較無害氣體導入路徑20的匯集位置P1更上游側,配設有用來開閉供氣路徑17之第二開閉閥24。藉此,能夠切換處理氣體Ga朝供氣路徑17之導入及停止。   [0038] 又,處理氣體分歧路徑21係在較供氣路徑17之配設有第二開閉閥24的位置更上游側,從供氣路徑17分歧而與排氣路徑19相連。藉此,不需通過第二開閉閥24,可將在處理氣體生成裝置16所生成的處理氣體Ga迂迴導入至排氣路徑19及位於其下游側之除害裝置18。   [0039] 在本實施形態,於此處理氣體分歧路徑21,配設有用來開閉處理氣體分歧路徑21之第三開閉閥25。藉此,能夠切換處理氣體Ga朝排氣路徑19之導入及停止。   [0040] 處理氣體Ga的種類、組成,在能夠對玻璃基板P進行預定的表面處理(例如藉由腐蝕之粗糙化)的情況可為任意,例如能夠使用含有氟化氫氣體等的酸性氣體者。在此情況,在處理氣體生成裝置16,導入成為處理氣體Ga的原料之氣體(原料氣體)Fa的四氟化碳氣體、同樣成為原料之流體Fc的水及作為載體氣體Fb之氮氣(參照圖1)。又,藉由在處理氣體生成裝置16內部產生電漿反應,可生成含有氟化氫氣體與載體氣體Fb之處理氣體Ga。   [0041] 無害氣體Gb的種類、組成,如上述般,在對人體實質上無害的情況可為任意,例如從清淨度、成本面等的觀點來看,可理想地使用清淨乾空氣。當然,不限於清淨乾空氣,亦可使用例如以氮氣、氬氣等的惰性氣體為首之清淨乾空氣以外的實施處理的空氣(乾空氣),亦可直接使用未處理的空氣(外氣)。   [0042] 其次,主要依據圖2至圖4,一併說明使用上述結構的表面處理裝置11所進行之表面處理及維修的順序以及本發明之作用效果。   [0043] 亦即,本實施形態之玻璃基板之製造方法係如圖2所示,具備有:表面處理製程S1及維修製程S2。其中,在表面處理製程S1,將處理氣體Ga供給至作為板狀玻璃之玻璃基板P,對該玻璃基板P實施預定的表面處理,並且形成將已供給的處理氣體Ga進行除害後予以排氣的氣體之流動,在維修製程S2,關閉供氣路徑17(參照圖1),在較關閉了供氣路徑17之位置(在圖1中配設有第二開閉閥24之位置)更下游側,對供氣路徑17導入無害氣體Gb,藉此形成將處理氣體Ga置換成無害氣體Gb之氣體的流動。以下,詳細地說明各製程。   [0044] (S1)表面處理製程   在此製程S1,如圖3所示,關閉第一開閉閥23且打開第二開閉閥24,並且關閉第三開閉閥25。藉此,在處理氣體生成裝置16所生成的處理氣體Ga導入至供氣路徑17,且自位於供氣路徑17的下游端之供氣口14釋出。若圖1所示的玻璃基板P(在圖3中,省略)被插入至供氣口14面對之插通路徑13的話,自供氣口14所釋出的處理氣體Ga被供給至玻璃基板P的一方的主表面Pa(面對於供氣口14之下表面),對一方的主表面Pa實施預定的表面處理。供給至玻璃基板之處理氣體Ga係經由在與供氣口14不同的位置面對於插通路徑13之排氣口15(在本實施形態為二個),吸入至排氣路徑19,並導入到位於排氣路徑19的下游側之除害裝置18。已被導入的處理氣體Ga藉由除害裝置18進行除害,在除去了有害物質之狀態下排出至除害裝置18的外部。   [0045] 另外,因無害氣體導入路徑20被第一開閉閥23關閉,所以,在如圖3所示的狀態,不會有無害氣體Gb混入到供氣路徑17而對表面處理產生影響之虞。又,也不會有處理氣體Ga通過無害氣體導入路徑20而漏出至外部之虞。   [0046] 又,因處理氣體分歧路徑21被第三開閉閥25關閉,所以,在如圖3所示的狀態,不會有本來應導入至供氣路徑17之處理氣體Ga的流量減少而對表面處理產生影響之虞。   [0047] (S2)維修製程   如上述般,在使表面處理裝置11運轉的期間,對玻璃基板P實施預定的表面處理。另外,在某種理由,產生需要停止進行表面處理而分解表面處理裝置11之需求的情況,藉由下述的處理(動作),進行表面處理裝置11的維修。亦即,當開始進行維修時,從運轉時的狀態,如圖4所示,首先,關閉第二開閉閥24,並且打開第三開閉閥25。然後,再打開第一開閉閥23。藉此,朝供氣路徑17之中至少較第二開閉閥24更下游側之處理氣體Ga的供給被停止,並且在較匯集位置P1更下游側,對供氣路徑17新導入無害氣體Gb。因此,流通於供氣路徑17、插通路徑13及排氣路徑19之處理氣體Ga係以被無害氣體Gb擠出的形態排出至除害裝置18,藉此,除了處理氣體分歧路徑21內以外的表面處理裝置11中之處理氣體Ga被無害氣體Gb置換。因此,作業者能安全地分解表面處理裝置11而進行狀態確認、保養等的維修。又,如上述般,藉由設置無害氣體導入路徑20,不需通過處理氣體生成裝置16,可將無害氣體Gb導入至供氣路徑17,所以,能夠較自由地設定無害氣體Gb的導入條件(流量、壓力、溫度等)。因此,例如藉由將流量設定成較多,能夠在短時間進行藉由無害氣體Gb之處理氣體Ga的置換。   [0048] 又,藉由打開第三開閉閥25,形成為可對在供氣路徑17之較第二開閉閥24更上游側分歧的處理氣體分歧路徑21供給處理氣體Ga之狀態。因此,例如在持續進行藉由處理氣體生成裝置16之處理氣體Ga的生成及供給之情況,如圖4所示,處理氣體Ga會通過處理氣體分歧路徑21,朝排氣路徑19進一步朝除害裝置18導入。因此,在前述的置換處理的期間,能夠迴避因在處理氣體生成裝置16的內部或供氣路徑17中處理氣體生成裝置16與第二開閉閥24之間,處理氣體Ga被封住所引起的缺失之產生,可安全地進行置換作業。   [0049] 以上,說明了本發明的第一實施形態之玻璃基板之製造裝置10及製造方法,但,這些製造裝置10及製造方法當然在本發明的範圍內可採用任意的形態。   [0050] [本發明的第二實施形態]   圖5係第二實施形態之製造裝置30的流路結構圖,圖6係顯示使用此製造裝置30之製造方法(表面處理及維修)的順序之流程圖。如圖5所示,此製造裝置30係具備有流路結構與第一實施形態不同之表面處理裝置31,具體而言,在排氣路徑19中較處理氣體分歧路徑21的匯集位置P2更上游側,配設有用來開閉排氣路徑19之第四開閉閥26。再者,除此以外的結構是與第一實施形態之製造裝置10(表面處理裝置11)相同,因此在此省略詳細說明。   [0051] 又,本實施形態之玻璃基板之製造方法係如圖6所示,具備有:表面處理製程S1及維修製程S2。其中,維修製程S2之詳細內容是與第一實施形態之製造方法不同。亦即,本實施形態之維修製程S2係具有:在關閉供氣路徑17並打開排氣路徑19之狀態下,藉由在較第二開閉閥24更下游側,對供氣路徑17導入無害氣體Gb,將處理氣體Ga置換成無害氣體Gb之無害氣體導入步驟S21;及在停止進行無害氣體Gb之供給後,藉由在較處理氣體分歧路徑21的匯集位置P2更上游側關閉排氣路徑19,將處理氣體Ga的流路與無害氣體Gb的流路完全地分割之流路分割步驟S22。以下,以各步驟的詳細內容為中心進行說明。   [0052] (S1)表面處理製程   在此製程,如圖7所示,作成關閉第一開閉閥23且打開第二開閉閥24,並且關閉第三開閉閥25,且打開第四開閉閥26之狀態。藉此,在處理氣體生成裝置16所生成的處理氣體Ga導入至供氣路徑17,且自位於供氣路徑17的下游端之供氣口14釋出。若圖1所示的玻璃基板P(在圖7中,省略)被插入至供氣口14面對之插通路徑13的話,自供氣口14所釋出的處理氣體Ga被供給至玻璃基板P的一方的主表面Pa(面對於供氣口14之下表面),對一方的主表面Pa實施預定的表面處理。又,因作成將設在排氣路徑19上之第四開閉閥26打開的狀態,所以,供給至玻璃基板P之處理氣體Ga係經由在與供氣口14不同的位置面對於插通路徑13之排氣口15(在本實施形態為二個),吸入至排氣路徑19,並導入到位於排氣路徑19的下游側之除害裝置18。已被導入的處理氣體Ga藉由除害裝置18進行除害,在除去了有害物質之狀態下排出至除害裝置18的外部。   [0053] 另外,因無害氣體導入路徑20被第一開閉閥23關閉,所以,在如圖7所示的狀態,不會有無害氣體Gb混入到供氣路徑17而對表面處理產生影響之虞。又,也不會有處理氣體Ga通過無害氣體導入路徑20而漏出至外部之虞。   [0054] 又,因處理氣體分歧路徑21被第三開閉閥25關閉,所以,在如圖7所示的狀態,不會有本來應導入至供氣路徑17之處理氣體Ga的流量減少而對表面處理產生影響之虞。   [0055] (S2)維修製程 (S21)無害氣體導入步驟   又,在本實施形態,在某種理由,產生需要停止進行表面處理而進行表面處理裝置31的維修之需求的情況,進行下述的處理(動作)。亦即,在以無害氣體Gb置換處理氣體Ga之步驟,如圖8所示,首先,關閉第二開閉閥24,並且打開第三開閉閥25。然後,再打開第一開閉閥23。作成第四開閉閥26打開之狀態。藉此,朝供氣路徑17之中至少較第二開閉閥24更下游側之處理氣體Ga的供給被停止,並且在較匯集位置P1更下游側,新導入無害氣體Gb。因此,流通於供氣路徑17、插通路徑13及排氣路徑19之處理氣體Ga係以被無害氣體Gb擠出的形態排出至除害裝置18,藉此,除了處理氣體分歧路徑21內以外的表面處理裝置11中之處理氣體Ga被無害氣體Gb置換。因此,作業者能安全地分解表面處理裝置11而進行維修。   [0056] 又,藉由打開第三開閉閥25,形成為可對在供氣路徑17之較第二開閉閥24更上游側分歧的處理氣體分歧路徑21供給處理氣體Ga之狀態。因此,例如在持續進行藉由處理氣體生成裝置16之處理氣體Ga的生成及供給之情況,如圖8所示,處理氣體Ga會通過處理氣體分歧路徑21,朝排氣路徑19進一步朝除害裝置18導入。因此,不需要停止藉由處理氣體生成裝置16之處理氣體Ga的生成及供給,即可進行前述置換作業。   [0057] (S22)流路分割步驟   在步驟S21,對供氣路徑17導入無害氣體Gb,以無害氣體Gb將供氣路徑17與插通路徑13及排氣路徑19內進行置換後,再實施此步驟。亦即,如圖9所示,關閉第一開閉閥23並停止無害氣體Gb朝供氣路徑17之供給,並且關閉第四開閉閥26而在排氣路徑19中較處理氣體分歧路徑21的匯集位置P2更上游側封住排氣路徑19之流動。第二開閉閥24為已關閉的狀態,且第三開閉閥25為打開的狀態。藉此,供氣路徑17中較第二開閉閥24更下游側之區域、和成為玻璃基板的處理空間之插通路徑13及排氣路徑19中較第四開閉閥26更上游側之區域是形成為與處理氣體分歧路徑21及排氣路徑19中較第四開閉閥26更下游側之區域完全地切離的狀態。換言之,表面處理裝置31的流路是形成為被分割成僅無害氣體Gb存在的空間與僅處理氣體Ga存在的空間之狀態。例如在採取如圖4所示的流路結構之情況,無害氣體Gb的流量或流體壓大幅度地設定成較處理氣體Ga的流量或流體壓大的話,可防止處理氣體Ga從處理氣體分歧路徑21的匯集位置P2朝排氣路徑19的上游側逆流之事態,但在無法完全地遮斷之狀態,即使稍許的量,也無法完全地排除處理氣體Ga朝供氣路徑17側流入之可能性。相對於此,若依據本實施形態之製造裝置30的話,在前述供氣路徑17與玻璃基板的處理空間(插通路徑13)形成為被無害氣體Gb完全地充滿的狀態之時間點,藉由關閉第四開閉閥26,即使在持續進行處理氣體Ga的生成及供給的狀態下進行無害氣體Gb的置換之情況,也能夠完全地排除作業者接觸到處理氣體Ga之可能性,能夠安全地分解表面處理裝置31而進行確認作業、維修等。   [0058] [本發明的第三實施形態]   其次,主要依據圖10,說明本發明的第三實施形態。再者,在本實施形態,所使用之製造裝置係設為如圖5所示的製造裝置30。   [0059] 亦即,本實施形態之玻璃基板之製造方法係如圖10所示,具備有:表面處理製程S1、維修製程S2及表面處理之重啟準備製程S3。表面處理製程S1與維修製程S2係與第二實施形態相同,因此在下述的說明中,僅詳細說明表面處理之重啟準備製程S3。   [0060] (S3)表面處理之重啟準備製程   在此製程S3,從之前的維修製程S2時之狀態(如圖9所示的狀態),首先,打開第二開閉閥24,並且打開第四開閉閥26,且關閉第三開閉閥25。第一開閉閥23作成關閉之狀態。在此期間,不需停止藉由處理氣體生成裝置16之處理氣體Ga的生成及供給,可持續進行(均參照圖7)。藉此,立即如圖7所示,處理氣體Ga被導入至供氣路徑17,流通於供氣路徑17之無害氣體Gb被處理氣體Ga置換,因此,能夠在短時間內再次以處理氣體Ga充滿供氣路徑17及排氣路徑19。因此,能夠省略例如在從暫時停止處理氣體生成裝置16的狀態再次啟動的情況可能產生之[從再次重啟處理氣體Ga的生成到處理氣體Ga的生成狀態穩定為止]之等待時間,在進行維修後,可立即重啟進行表面處理。   [0061] [本發明的第四實施形態]   其次,主要依據圖11及12,說明本發明的第四實施形態。再者,在本實施形態,所使用之製造裝置係設為如圖5所示的製造裝置30。   [0062] 又,本實施形態之玻璃基板之製造方法係如圖11所示,具備有:表面處理製程S1及維修製程S2。其中,維修製程S2之詳細內容是與第一至第三實施形態之製造方法不同。亦即,本實施形態之維修製程S2,係具有載體氣體導入步驟S23,該載體氣體導入步驟是停止藉由處理氣體生成裝置16之處理氣體Ga的生成,並且停止朝處理氣體生成裝置16供給成為處理氣體Ga的原料之氣體(圖1等所示的原料氣體Fa),並朝處理氣體生成裝置16持續供給處理氣體Ga所含有之載體氣體Fb。關於表面處理製程S1,因與第二實施形態及第三實施形態相同,所以,在下述的說明,依據圖12,詳細地說明包含載體氣體導入步驟S23之維修製程S2。   [0063] (S2)維修製程 (S23)載體氣體導入步驟   在此維修製程S2,與第二實施形態同樣地,首先,關閉第二開閉閥24,並且打開第三開閉閥25。然後,再打開第一開閉閥23。第四開閉閥26作成打開之狀態。藉此,朝供氣路徑17之中至少較第二開閉閥24更下游側之處理氣體Ga的供給被停止,並且在較匯集位置P1更下游側,對供氣路徑17新導入無害氣體Gb。因此,流通於供氣路徑17、插通路徑13及排氣路徑19之處理氣體Ga係以被無害氣體Gb擠出的形態排出至除害裝置18,藉此,除了處理氣體分歧路徑21內以外的表面處理裝置11中之處理氣體Ga被無害氣體Gb置換。因此,作業者能安全地分解表面處理裝置11而進行維修。   [0064] 又,此時,如圖12所示,停止藉由處理氣體生成裝置16之處理氣體Ga的生成,並且停止朝處理氣體生成裝置16供給成為處理氣體Ga的原料之四氟化碳氣體的原料氣體Fa(參照圖1),且持續朝處理氣體生成裝置16供給處理氣體Ga所含有的載體氣體Fb。藉此,載體氣體Fb通過處理氣體生成裝置16的內部、供氣路徑17中較第二開閉閥24更上游側的區域、及處理氣體分歧路徑21,導入至排氣路徑19。因此,直到剛才還存在於處理氣體生成裝置16的內部之處理氣體Ga被置換成載體氣體Fb。載體氣體Fb,一般為氮氣等的惰性氣體,至少在與空氣混合的狀態下,對人體實質上無害之氣體。因此,當表面處理裝置31之運轉停止時(維修製程S2時),可防止處理氣體生成裝置16的內部持續曝露於處理氣體Ga所引起之劣化,能夠長期間使用處理氣體生成裝置16。又,藉由以載體氣體Fb置換處理氣體生成裝置16的內部之處理氣體Ga,能夠從處理氣體生成裝置16的內部完全地排除處理氣體Ga。如前述般,由於載體氣體Fb比起處理氣體Ga,為非常安全的氣體,故,即使在需要進行處理氣體生成裝置16的更換之情況,也能從供氣路徑17安全地取下處理氣體生成裝置16。   [0065] 再者,在以上的說明,以在無害氣體導入路徑20上配設有第一開閉閥23,在供氣路徑17上配設有與第一開閉閥23不同之第二開閉閥24的情況為例進行了說明,但不限於此形態。只要在較無害氣體導入路徑20與供氣路徑17之匯集位置P1更靠近供氣路徑17的下游側,可導入無害氣體Gb與處理氣體Ga中的其中一方的情況,則可採取其他形態。   [0066] [本發明的第五實施形態]   圖13係顯示其一例(本發明的第五實施形態)之玻璃基板製造裝置40。此製造裝置40係在無害氣體導入路徑20與供氣路徑17之匯集位置P1,配設有進行流路的切換之三向閥41,取代圖1所示的第一開閉閥23及第二開閉閥24。此三向閥41係可擇一切換成:供氣路徑17中從匯集位置P1的上游側導入之處理氣體Ga通過匯集位置P1後朝向供氣路徑17的下游側之氣流、和從無害氣體導入路徑20導入之無害氣體Gb通過匯集位置P1後朝向供氣路徑17的下游側之氣流。因此,即使在將處理氣體Ga與無害氣體Gb一同供給之情況,在供氣路徑17之較匯集位置P1更下游側,始終僅將處理氣體Ga與無害氣體Gb中的其中一方導入並防止另一方導入。   [0067] 若依據此結構,如上述般,在供氣路徑17之較匯集位置P1更下游側,一定是僅將處理氣體Ga與無害氣體Gb中的其中一方導入,所以,可確實地防止兩種氣體Ga、Gb中不需要的氣體混入之事態產生,可使製造裝置40的可靠性進一步提升。   [0068] 又,在以上的說明,以在供氣路徑17上配設有第二開閉閥24,在處理氣體分歧路徑21上配設有與第二開閉閥24不同之第三開閉閥25的情況為例進行了說明,但不限於此形態。只要在可將處理氣體Ga導入至處理氣體分歧路徑21與供氣路徑17之較處理氣體分歧路徑21分歧的位置更下游側中的其中一方導入之情況,則亦可採用其他形態。   [0069] [本發明的第六實施形態]   圖14係顯示其一例(本發明的第六實施形態)之玻璃基板製造裝置50。此製造裝置50係在處理氣體分歧路徑21從供氣路徑17分歧之分歧位置P3,配設有進行流路的切換之三向閥51,取代圖1所示的第二開閉閥24及第三開閉閥25。此三向閥51係可擇一地切換成:從供氣路徑17中分歧位置P3的上游側導入之處理氣體Ga通過分歧位置P3而直接朝向供氣路徑17的下游側之氣流、和前述處理氣體Ga經由分歧位置P3而朝向處理氣體分歧路徑21之氣流。因此,即使在從處理氣體生成裝置16供給處理氣體Ga之情況,可始終僅將處理氣體Ga導入至較供氣路徑17的分歧位置P3更下游側與處理氣體分歧路徑21中的其中一方,並防止朝另一方導入。這是因為在持續生成供給處理氣體Ga之情況(第一至第三實施形態之情況),處理氣體Ga始終僅導入至供氣路徑17與處理氣體分歧路徑21中的其中一方即可。因此,藉由在分歧位置P3設置三向閥51,操作三向閥51,當進行表面處理製程S1時,將供氣路徑17側打開,當進行維修製程S2時,將處理氣體分歧路徑21側打開,使得既可抑制設備成本,又可安全地進行維修。   [0070] 又,在以上的說明,以對從帶狀板玻璃切出的玻璃基板P的一方的主表面Pa實施預定的表面處理之情況為例進行了說明,但,當然亦可將本發明適用於帶狀板玻璃的其中一方的主表面。亦即,雖未圖示,在僅對成形為帶狀並朝寬度方向裁斷後,將其長度方向一端或兩端捲取之玻璃薄膜的表面背面中的一方的面實施表面處理之情況,亦可理想地實施藉由前述結構之表面處理。又,對於前述各種的板玻璃,不限於一方的主表面Pa,對於另一方的主表面(在圖1中的上側的主表面Pb)實施表面處理時,亦可適用本發明。[First Embodiment of the Present Invention] Hereinafter, a first embodiment of the present invention will be described with reference to FIGS. 1 to 4. In addition, in this embodiment, as a plate glass, the case where the surface treatment of the back surface of the glass substrate cut | disconnected to the predetermined | prescribed shape formed into the strip | belt-shaped plate glass is demonstrated as an example is demonstrated. [0034] FIG. 1 shows a manufacturing apparatus 10 for a glass substrate according to a first embodiment of the present invention. This manufacturing apparatus 10 includes a surface treatment apparatus 11 that performs a predetermined surface treatment on one of the main surfaces Pa (the lower surface in FIG. 1) of the glass substrate P, and a processing tank 12 that houses the surface treatment apparatus 11. [0035] Among them, the surface processing device 11 is a device that supplies a processing gas Ga to one of the main surfaces Pa of the glass substrate P and performs a predetermined surface treatment, and includes a plug-in for the glass substrate P to be processed. Path 13; opening to the gas supply port 14 of the insertion path 13; opening to the exhaust port 15 of the insertion path 13 at a position different from the gas supply port 14; a processing gas generating device 16 for generating a processing gas Ga; A gas supply path 17 that connects the gas generating device 16 to the gas supply port 14; a harm removal device 18 that performs a detoxification process on the processing gas Ga; an exhaust gas path 19 that connects the exhaust port 15 to the harm removal device 18; and will be harmless The gas Gb is introduced into the harmless gas introduction path 20 of the gas supply path 17. In this embodiment, in addition to the above-mentioned requirements, the surface processing apparatus 11 includes a processing gas branching path 21 that branches from the gas supply path 17 and introduces the processing gas Ga to the exhaust path 19. In addition, on the upstream side of the harmless gas introduction path 20, a harmless gas introduction device 22 such as a compressor is arranged, and the supply and stop of the harmless gas Gb can be operated. [0036] The harmless gas introduction path 20 is provided with a first on-off valve 23 for opening and closing the harmless gas introduction path 20. This makes it possible to switch the introduction and stop of the harmless gas Gb to the gas supply path 17. [0037] A second on-off valve 24 for opening and closing the gas supply path 17 is provided on the gas supply path 17 on the upstream side from the collection position P1 of the harmless gas introduction path 20. Thereby, the introduction and stop of the processing gas Ga to the gas supply path 17 can be switched. [0038] The processing gas branching path 21 is further upstream than the position where the second on-off valve 24 is provided in the gas supply path 17, and branches from the gas supply path 17 to be connected to the exhaust path 19. Thereby, the processing gas Ga generated in the processing gas generation device 16 can be bypassed to the exhaust path 19 and the harm removal device 18 located on the downstream side without passing through the second on-off valve 24. [0039] In this embodiment, here, the processing gas branch path 21 is provided with a third on-off valve 25 for opening and closing the processing gas branch path 21. Thereby, the introduction and stop of the processing gas Ga to the exhaust path 19 can be switched. [0040] The type and composition of the processing gas Ga may be arbitrary as long as a predetermined surface treatment (for example, roughening by corrosion) can be performed on the glass substrate P, and for example, an acid gas containing hydrogen fluoride gas or the like can be used. In this case, the processing gas generating device 16 introduces a tetrafluorocarbon gas that is a gas (raw gas) Fa that is a raw material of the processing gas Ga, water that is also a raw material fluid Fc, and nitrogen that is a carrier gas Fb (see FIG. 1). Further, by generating a plasma reaction inside the processing gas generating device 16, a processing gas Ga containing a hydrogen fluoride gas and a carrier gas Fb can be generated. [0041] As described above, the kind and composition of the harmless gas Gb may be substantially harmless to the human body as described above. For example, clean dry air is preferably used from the viewpoints of cleanliness and cost. Of course, it is not limited to clean dry air, and air other than clean dry air, such as nitrogen and argon, may be used as the treated air (dry air), or untreated air (outside air) may be used directly. [0042] Next, the sequence of surface treatment and maintenance performed by using the surface treatment device 11 having the above-mentioned structure and the function and effect of the present invention will be described based on FIGS. 2 to 4. [0043] That is, as shown in FIG. 2, the method for manufacturing a glass substrate according to this embodiment includes a surface treatment process S1 and a maintenance process S2. Among them, in the surface treatment process S1, a processing gas Ga is supplied to a glass substrate P as a sheet glass, a predetermined surface treatment is performed on the glass substrate P, and the supplied processing gas Ga is degassed and exhausted. In the maintenance process S2, the gas flow path is closed, and the gas supply path 17 is closed (refer to FIG. 1), which is further downstream than the position where the gas supply path 17 is closed (the position where the second on-off valve 24 is provided in FIG. 1). The harmless gas Gb is introduced into the gas supply path 17, thereby forming a flow of a gas in which the processing gas Ga is replaced with the harmless gas Gb. Hereinafter, each process will be described in detail. [0044] (S1) Surface treatment process In this process S1, as shown in FIG. 3, the first on-off valve 23 is closed, the second on-off valve 24 is opened, and the third on-off valve 25 is closed. Thereby, the processing gas Ga generated by the processing gas generating device 16 is introduced into the gas supply path 17 and is released from the gas supply port 14 located at the downstream end of the gas supply path 17. If the glass substrate P (omitted in FIG. 3) shown in FIG. 1 is inserted into the insertion path 13 facing the gas supply port 14, the processing gas Ga released from the gas supply port 14 is supplied to the glass substrate P. One of the main surfaces Pa (surface facing the lower surface of the air supply port 14) is subjected to a predetermined surface treatment. The processing gas Ga supplied to the glass substrate is sucked into the exhaust path 19 through the exhaust port 15 (two in this embodiment) for the insertion path 13 at a position different from the air supply port 14 and is introduced into A detoxification device 18 located on the downstream side of the exhaust path 19. The introduced treatment gas Ga is detoxified by the detoxification device 18, and is discharged to the outside of the detoxification device 18 with the harmful substances removed. [0045] In addition, since the harmless gas introduction path 20 is closed by the first on-off valve 23, in the state shown in FIG. 3, there is no risk that the harmless gas Gb will enter the gas supply path 17 and affect the surface treatment. . In addition, there is no possibility that the processing gas Ga leaks to the outside through the harmless gas introduction path 20. [0046] The processing gas branch path 21 is closed by the third on-off valve 25. Therefore, in the state shown in FIG. 3, the flow rate of the processing gas Ga that should be introduced into the gas supply path 17 does not decrease, and it is correct. There is a risk that the surface treatment will have an impact. [0047] (S2) Maintenance Process As described above, the glass substrate P is subjected to a predetermined surface treatment while the surface treatment device 11 is being operated. In addition, for some reason, there is a case where it is necessary to stop the surface treatment and disassemble the surface treatment device 11, and the surface treatment device 11 is maintained by the following processing (operation). That is, when maintenance is started, as shown in FIG. 4, when the maintenance is started, first, the second on-off valve 24 is closed, and the third on-off valve 25 is opened. Then, the first on-off valve 23 is opened again. As a result, the supply of the processing gas Ga to at least the downstream side of the second on-off valve 24 among the gas supply paths 17 is stopped, and the harmless gas Gb is newly introduced into the gas supply path 17 further downstream than the collection position P1. Therefore, the processing gas Ga flowing through the gas supply path 17, the insertion path 13, and the exhaust path 19 is discharged to the detoxification device 18 in the form of being squeezed out by the harmless gas Gb, thereby excluding the processing gas branch path 21 The processing gas Ga in the surface processing apparatus 11 is replaced with a harmless gas Gb. Therefore, the operator can safely disassemble the surface treatment apparatus 11 and perform maintenance such as status confirmation and maintenance. Further, as described above, by providing the harmless gas introduction path 20, the harmless gas Gb can be introduced into the gas supply path 17 without passing through the processing gas generating device 16, so that the introduction conditions of the harmless gas Gb can be set more freely ( Flow, pressure, temperature, etc.). Therefore, for example, by setting the flow rate to be large, replacement of the processing gas Ga by the harmless gas Gb can be performed in a short time. [0048] The third on-off valve 25 is opened to form a state in which the processing gas Ga can be supplied to the processing gas branch path 21 branched on the upstream side of the gas supply path 17 than the second on-off valve 24. Therefore, for example, in the case where the generation and supply of the processing gas Ga by the processing gas generating device 16 is continuously performed, as shown in FIG. 4, the processing gas Ga passes through the processing gas branch path 21 and further exhausts toward the exhaust path 19. Device 18 is introduced. Therefore, during the replacement process described above, it is possible to avoid a defect caused by the sealing of the processing gas Ga inside the processing gas generating device 16 or in the gas supply path 17 between the processing gas generating device 16 and the second on-off valve 24. The result is a safe replacement operation. [0049] In the above, the glass substrate manufacturing apparatus 10 and manufacturing method according to the first embodiment of the present invention have been described. However, these manufacturing apparatuses 10 and manufacturing methods may of course take any form within the scope of the present invention. [Second Embodiment of the Present Invention] FIG. 5 is a flow path structure diagram of a manufacturing apparatus 30 of a second embodiment, and FIG. 6 is a flowchart showing a sequence of a manufacturing method (surface treatment and maintenance) using the manufacturing apparatus 30. flow chart. As shown in FIG. 5, this manufacturing device 30 is provided with a surface treatment device 31 having a flow path structure different from that of the first embodiment. Specifically, the exhaust path 19 is further upstream than the collection position P2 of the process gas branch path 21. A fourth on-off valve 26 for opening and closing the exhaust path 19 is provided on the side. The other configurations are the same as those of the manufacturing apparatus 10 (surface treatment apparatus 11) of the first embodiment, and therefore detailed descriptions are omitted here. [0051] In addition, as shown in FIG. 6, the method for manufacturing a glass substrate according to this embodiment includes a surface treatment process S1 and a maintenance process S2. The details of the maintenance process S2 are different from the manufacturing method of the first embodiment. That is, the maintenance process S2 of the present embodiment includes: in a state in which the air supply path 17 is closed and the exhaust path 19 is opened, harmless gas is introduced into the air supply path 17 further downstream than the second on-off valve 24. Gb, the harmless gas introduction step S21 in which the processing gas Ga is replaced with the harmless gas Gb; and after the supply of the harmless gas Gb is stopped, the exhaust path 19 is closed further upstream than the collection position P2 of the process gas branch path 21 Step S22 of dividing the flow path of the processing gas Ga and the flow path of the harmless gas Gb completely. The following description focuses on the details of each step. [0052] (S1) In this process, as shown in FIG. 7, the first on-off valve 23 is closed and the second on-off valve 24 is opened, the third on-off valve 25 is closed, and the fourth on-off valve 26 is opened. status. Thereby, the processing gas Ga generated by the processing gas generating device 16 is introduced into the gas supply path 17 and is released from the gas supply port 14 located at the downstream end of the gas supply path 17. If the glass substrate P (omitted in FIG. 7) shown in FIG. 1 is inserted into the insertion path 13 facing the gas supply port 14, the processing gas Ga released from the gas supply port 14 is supplied to the glass substrate P. One of the main surfaces Pa (surface facing the lower surface of the air supply port 14) is subjected to a predetermined surface treatment. In addition, since the fourth on-off valve 26 provided in the exhaust path 19 is opened, the processing gas Ga supplied to the glass substrate P is passed through the insertion path 13 through a surface different from the gas supply port 14. The exhaust ports 15 (two in this embodiment) are sucked into the exhaust path 19 and are introduced into the harm removal device 18 located on the downstream side of the exhaust path 19. The introduced treatment gas Ga is detoxified by the detoxification device 18, and is discharged to the outside of the detoxification device 18 with the harmful substances removed. [0053] In addition, since the harmless gas introduction path 20 is closed by the first on-off valve 23, in the state shown in FIG. 7, there is no risk that the harmless gas Gb will enter the gas supply path 17 and affect the surface treatment. . In addition, there is no possibility that the processing gas Ga leaks to the outside through the harmless gas introduction path 20. [0054] In addition, since the processing gas branch path 21 is closed by the third on-off valve 25, in the state shown in FIG. There is a risk that the surface treatment will have an impact. [0052] (S2) Maintenance process (S21) Non-hazardous gas introduction step. In this embodiment, for some reason, it is necessary to stop the surface treatment and perform the maintenance of the surface treatment device 31. The following is performed. Processing (action). That is, in the step of replacing the processing gas Ga with the harmless gas Gb, as shown in FIG. 8, first, the second on-off valve 24 is closed, and the third on-off valve 25 is opened. Then, the first on-off valve 23 is opened again. The fourth on-off valve 26 is opened. Thereby, the supply of the processing gas Ga to at least the downstream side from the second on-off valve 24 in the gas supply path 17 is stopped, and the harmless gas Gb is newly introduced to the downstream side from the collection position P1. Therefore, the processing gas Ga flowing through the gas supply path 17, the insertion path 13, and the exhaust path 19 is discharged to the detoxification device 18 in the form of being squeezed out by the harmless gas Gb, thereby excluding the processing gas branch path 21 The processing gas Ga in the surface processing apparatus 11 is replaced with a harmless gas Gb. Therefore, the operator can safely disassemble the surface treatment device 11 and perform maintenance. [0056] Furthermore, by opening the third on-off valve 25, a state in which the processing gas Ga can be supplied to the processing gas branch path 21 branched on the upstream side of the gas supply path 17 than the second on-off valve 24 is formed. Therefore, for example, in the case where the generation and supply of the processing gas Ga by the processing gas generation device 16 are continuously performed, as shown in FIG. 8, the processing gas Ga passes through the processing gas branch path 21 and further exhausts toward the exhaust path 19. Device 18 is introduced. Therefore, the replacement operation can be performed without stopping the generation and supply of the processing gas Ga by the processing gas generating device 16. [0057] (S22) Flow path division step In step S21, the harmless gas Gb is introduced into the gas supply path 17, and the gas supply path 17 and the insertion path 13 and the exhaust path 19 are replaced with the harmless gas Gb, and then implemented. This step. That is, as shown in FIG. 9, the first on-off valve 23 is closed and the supply of the innocuous gas Gb to the gas supply path 17 is stopped, and the fourth on-off valve 26 is closed to collect the branched path 21 in the exhaust path 19 more than the processing gas branch path 21. The position P2 seals the flow of the exhaust path 19 further upstream. The second on-off valve 24 is in a closed state, and the third on-off valve 25 is in an opened state. As a result, the region of the air supply path 17 further downstream than the second on-off valve 24, and the region of the insertion path 13 and the exhaust path 19 serving as the processing space for the glass substrate are more upstream than the fourth on-off valve 26. It is in a state of being completely cut off from the process gas branching path 21 and the exhaust path 19 in a region further downstream than the fourth on-off valve 26. In other words, the flow path of the surface processing apparatus 31 is formed in a state divided into a space where only the harmless gas Gb exists and a space where only the processing gas Ga exists. For example, when a flow path structure as shown in FIG. 4 is adopted, if the flow rate or fluid pressure of the harmless gas Gb is set to be larger than the flow rate or fluid pressure of the processing gas Ga, the processing gas Ga can be prevented from diverging from the processing gas. The gathering position P2 of 21 is flowing backward toward the upstream side of the exhaust path 19, but in a state where it cannot be completely shut off, even a slight amount cannot completely rule out the possibility that the processing gas Ga flows into the supply path 17 side . On the other hand, if the manufacturing apparatus 30 according to this embodiment is used, at the time point when the processing space (the insertion path 13) of the gas supply path 17 and the glass substrate is completely filled with the harmless gas Gb, The fourth on-off valve 26 is closed, and even if the harmless gas Gb is replaced while the generation and supply of the processing gas Ga is continuously performed, the possibility of the operator contacting the processing gas Ga can be completely eliminated, and the gas can be safely decomposed. The surface treatment device 31 performs confirmation work, maintenance, and the like. [0058] [Third embodiment of the present invention] Next, a third embodiment of the present invention will be described mainly with reference to FIG. 10. In addition, in this embodiment, the manufacturing apparatus used is the manufacturing apparatus 30 shown in FIG. [0059] That is, as shown in FIG. 10, the method for manufacturing a glass substrate according to this embodiment includes a surface treatment process S1, a maintenance process S2, and a restart preparation process S3 for surface treatment. The surface treatment process S1 and the maintenance process S2 are the same as those in the second embodiment. Therefore, in the following description, only the restart preparation process S3 for the surface treatment will be described in detail. (S3) Restart preparation process for surface treatment In this process S3, from the state at the time of the previous maintenance process S2 (the state shown in FIG. 9), first, the second on-off valve 24 is opened, and the fourth on-off valve is opened. The valve 26 closes the third on-off valve 25. The first on-off valve 23 is closed. During this period, it is not necessary to stop the generation and supply of the processing gas Ga by the processing gas generation device 16, and it can be continued (see FIG. 7 for all). Thereby, as shown in FIG. 7, the processing gas Ga is introduced into the gas supply path 17, and the harmless gas Gb flowing through the gas supply path 17 is replaced by the processing gas Ga. Therefore, the processing gas Ga can be filled again in a short time. Air supply path 17 and exhaust path 19. Therefore, it is possible to omit the waiting time [from restarting the generation of the processing gas Ga to a stable state of the generation of the processing gas Ga] when the process is restarted from a state where the processing gas generating device 16 is temporarily stopped, and after maintenance, , You can restart the surface treatment immediately. [0061] [Fourth embodiment of the present invention] Next, a fourth embodiment of the present invention will be described mainly with reference to FIGS. 11 and 12. In addition, in this embodiment, the manufacturing apparatus used is the manufacturing apparatus 30 shown in FIG. [0062] As shown in FIG. 11, the method for manufacturing a glass substrate according to this embodiment includes a surface treatment process S1 and a maintenance process S2. The details of the maintenance process S2 are different from the manufacturing methods of the first to third embodiments. That is, the maintenance process S2 of this embodiment includes a carrier gas introduction step S23, which stops the generation of the processing gas Ga by the processing gas generation device 16 and stops supplying the processing gas to the processing gas generation device 16 as The source gas (the source gas Fa shown in FIG. 1 and the like) of the processing gas Ga is continuously supplied to the processing gas generating device 16 with the carrier gas Fb contained in the processing gas Ga. Since the surface treatment process S1 is the same as the second embodiment and the third embodiment, the maintenance process S2 including the carrier gas introduction step S23 will be described in detail in the following description with reference to FIG. 12. [0063] (S2) Maintenance process (S23) Carrier gas introduction step In this maintenance process S2, as in the second embodiment, first, the second on-off valve 24 is closed, and the third on-off valve 25 is opened. Then, the first on-off valve 23 is opened again. The fourth on-off valve 26 is opened. As a result, the supply of the processing gas Ga to at least the downstream side of the second on-off valve 24 among the gas supply paths 17 is stopped, and the harmless gas Gb is newly introduced into the gas supply path 17 further downstream than the collection position P1. Therefore, the processing gas Ga flowing through the gas supply path 17, the insertion path 13, and the exhaust path 19 is discharged to the detoxification device 18 in the form of being squeezed out by the harmless gas Gb, thereby excluding the processing gas branch path 21 The processing gas Ga in the surface processing apparatus 11 is replaced with a harmless gas Gb. Therefore, the operator can safely disassemble the surface treatment device 11 and perform maintenance. [0064] At this time, as shown in FIG. 12, the generation of the processing gas Ga by the processing gas generating device 16 is stopped, and the supply of the carbon tetrafluoride gas serving as the raw material of the processing gas Ga to the processing gas generating device 16 is stopped. The source gas Fa (see FIG. 1) is continuously supplied with the carrier gas Fb contained in the processing gas Ga to the processing gas generating device 16. As a result, the carrier gas Fb is introduced into the exhaust path 19 through the interior of the process gas generating device 16, a region upstream of the second on-off valve 24 in the gas supply path 17, and the process gas branch path 21. Therefore, the processing gas Ga that was still present inside the processing gas generation device 16 until now is replaced with the carrier gas Fb. The carrier gas Fb is generally an inert gas such as nitrogen, and at least in a state of being mixed with air, the carrier gas Fb is substantially harmless to the human body. Therefore, when the operation of the surface processing apparatus 31 is stopped (in the maintenance process S2), the inside of the processing gas generating apparatus 16 can be prevented from being deteriorated due to continuous exposure to the processing gas Ga, and the processing gas generating apparatus 16 can be used for a long period of time. In addition, by replacing the processing gas Ga inside the processing gas generating device 16 with the carrier gas Fb, the processing gas Ga can be completely excluded from the inside of the processing gas generating device 16. As described above, the carrier gas Fb is a very safe gas compared to the process gas Ga. Therefore, even when the process gas generating device 16 needs to be replaced, the process gas can be safely removed from the gas supply path 17 to generate the process gas.装置 16。 Device 16. [0065] Furthermore, in the above description, the first on-off valve 23 is disposed on the harmless gas introduction path 20, and the second on-off valve 24 different from the first on-off valve 23 is disposed on the gas supply path 17. The case has been described as an example, but it is not limited to this form. As long as one of the harmless gas Gb and the processing gas Ga can be introduced closer to the downstream side of the gas supply path 17 than the integration position P1 of the harmless gas introduction path 20 and the gas supply path 17, other forms may be adopted. [0066] [Fifth embodiment of the present invention] FIG. 13 shows a glass substrate manufacturing apparatus 40 as an example (a fifth embodiment of the present invention). This manufacturing device 40 is located at the collection position P1 of the harmless gas introduction path 20 and the gas supply path 17, and is provided with a three-way valve 41 for switching the flow path, instead of the first on-off valve 23 and the second on-off valve shown in FIG. Valve 24. The three-way valve 41 can be selectively switched to: the gas flow from the upstream side of the collection position P1 in the gas supply path 17 to the gas flow toward the downstream side of the gas supply path 17 after passing through the collection position P1, and the introduction of harmless gas The harmless gas Gb introduced in the path 20 passes through the collection position P1 and flows toward the downstream side of the gas supply path 17. Therefore, even when the processing gas Ga and the innocuous gas Gb are supplied together, only one of the processing gas Ga and the innocuous gas Gb is always introduced into the gas supply path 17 further downstream than the collection position P1 and the other is prevented. Import. [0067] According to this structure, as described above, only one of the processing gas Ga and the innocuous gas Gb must be introduced on the gas supply path 17 further downstream than the collection position P1. Therefore, the two can be reliably prevented. The occurrence of unwanted gas mixed in the gases Ga and Gb can further improve the reliability of the manufacturing device 40. [0068] In the above description, the second on-off valve 24 is disposed on the gas supply path 17 and the third on-off valve 25 different from the second on-off valve 24 is disposed on the process gas branch path 21. The case is described as an example, but it is not limited to this form. As long as the processing gas Ga can be introduced into one of the processing gas branching path 21 and the gas supply path 17 at a position further downstream than the processing gas branching path 21, another form may be adopted. [0069] [Sixth embodiment of the present invention] FIG. 14 shows a glass substrate manufacturing apparatus 50 as an example (sixth embodiment of the present invention). This manufacturing apparatus 50 is provided at a branch position P3 at which the process gas branch path 21 branches from the gas supply path 17 and is provided with a three-way valve 51 for switching the flow path, instead of the second on-off valve 24 and the third shown in FIG. 1. Opening and closing valve 25. This three-way valve 51 is optionally switched to a gas flow directly from the upstream side of the branch position P3 in the gas supply path 17 toward the downstream side of the gas supply path 17 through the branch position P3, and the aforementioned processing. The gas Ga flows toward the processing gas branch path 21 through the branch position P3. Therefore, even when the processing gas Ga is supplied from the processing gas generation device 16, the processing gas Ga can always be introduced to only one of the downstream side of the branch position P3 of the gas supply path 17 and the processing gas branch path 21, and Prevent importing to the other party. This is because when the process gas Ga is continuously generated (in the case of the first to third embodiments), the process gas Ga may always be introduced into only one of the gas supply path 17 and the process gas branch path 21. Therefore, by setting the three-way valve 51 at the branch position P3 and operating the three-way valve 51, when the surface treatment process S1 is performed, the gas supply path 17 side is opened, and when the maintenance process S2 is performed, the processing gas branch path 21 side is opened. Opening makes it possible to both suppress equipment costs and perform maintenance safely. [0070] In the above description, the case where a predetermined surface treatment is performed on one main surface Pa of the glass substrate P cut out from the strip-shaped plate glass has been described as an example. However, the present invention may of course be applied to the present invention. It is suitable for one of the main surfaces of the strip plate glass. That is, although not shown, when only one of the front and back surfaces of the glass film rolled up at one or both ends in the length direction after being formed into a strip shape and cut in the width direction is subjected to surface treatment, The surface treatment by the aforementioned structure can be desirably performed. In addition, the present invention can also be applied to surface treatment of the various types of plate glass, not limited to one main surface Pa, and the other main surface (the main surface Pb on the upper side in FIG. 1).

[0071][0071]

10‧‧‧玻璃基板之製造裝置10‧‧‧ Glass substrate manufacturing equipment

11‧‧‧表面處理裝置11‧‧‧Surface treatment device

12‧‧‧處理槽12‧‧‧ treatment tank

13‧‧‧插通路徑13‧‧‧plug-in path

14‧‧‧供氣口14‧‧‧air supply port

15‧‧‧排氣口15‧‧‧ exhaust port

16‧‧‧處理氣體生成裝置16‧‧‧Processing gas generating device

17‧‧‧供氣路徑17‧‧‧Gas supply path

18‧‧‧除害裝置18‧‧‧ Harm Removal Device

19‧‧‧排氣路徑19‧‧‧Exhaust path

20‧‧‧無害氣體導入路徑20‧‧‧ Harmless gas introduction path

21‧‧‧處理氣體分歧路徑21‧‧‧ Handling gas divergence paths

22‧‧‧無害氣體導入裝置22‧‧‧ Harmless gas introduction device

23‧‧‧第一開閉閥23‧‧‧The first on-off valve

24‧‧‧第二開閉閥24‧‧‧Second on-off valve

25‧‧‧第三開閉閥25‧‧‧The third opening and closing valve

26‧‧‧第四開閉閥26‧‧‧Fourth on-off valve

Ga‧‧‧處理氣體Ga‧‧‧Processing gas

Gb‧‧‧無害氣體Gb‧‧‧ Harmless gas

P‧‧‧玻璃基板P‧‧‧ glass substrate

Pa‧‧‧一方的主表面The main surface of Pa‧‧‧ side

[0032]   圖1係顯示本發明的第一實施形態之表面處理裝置的流路構成圖。   圖2係顯示使用圖1所示的表面處理裝置之表面處理及維修的順序之流程圖。   圖3係用來說明使用圖1所示的表面處理裝置之表面處理及維修的順序之流路構成圖。   圖4係用來說明使用圖1所示的表面處理裝置之表面處理及維修的順序之流路構成圖。   圖5係顯示本發明的第二實施形態之表面處理裝置的流路構成圖。   圖6係顯示使用圖5所示的表面處理裝置之表面處理及維修的順序之流程圖。   圖7係用來說明使用圖5所示的表面處理裝置之表面處理及維修的順序之流路構成圖。   圖8係用來說明使用圖5所示的表面處理裝置之表面處理及維修的順序之流路構成圖。   圖9係用來說明使用圖5所示的表面處理裝置之表面處理及維修的順序之流路構成圖。   圖10係顯示本發明的第三實施形態之表面處理及維修的順序之流程圖。   圖11係顯示本發明的第四實施形態之表面處理及維修的順序之流程圖。   圖12係用來說明使用圖11所示的表面處理裝置之表面處理及維修的順序之流路構成圖。   圖13係顯示本發明的第五實施形態之表面處理裝置的流路構成圖。   圖14係顯示本發明的第六實施形態之表面處理裝置的流路構成圖。[0032] FIG. 1 is a flow path configuration diagram showing a surface treatment apparatus according to a first embodiment of the present invention. FIG. 2 is a flowchart showing a procedure of surface treatment and maintenance using the surface treatment apparatus shown in FIG. 1. FIG. 3 is a flow path configuration diagram for explaining a sequence of surface treatment and maintenance using the surface treatment apparatus shown in FIG. 1. FIG. 4 is a flow path configuration diagram for explaining a sequence of surface treatment and maintenance using the surface treatment apparatus shown in FIG. 1. FIG. 5 is a flow path configuration diagram of a surface treatment apparatus according to a second embodiment of the present invention. FIG. 6 is a flowchart showing a procedure of surface treatment and maintenance using the surface treatment apparatus shown in FIG. 5. FIG. 7 is a flow path configuration diagram for explaining a surface treatment and maintenance procedure using the surface treatment apparatus shown in FIG. 5. FIG. 8 is a flow path configuration diagram for explaining a surface treatment and maintenance procedure using the surface treatment apparatus shown in FIG. 5. FIG. 9 is a flow path configuration diagram for explaining a surface treatment and maintenance procedure using the surface treatment apparatus shown in FIG. 5. FIG. 10 is a flowchart showing the procedure of surface treatment and maintenance of the third embodiment of the present invention. FIG. 11 is a flowchart showing the procedure of surface treatment and maintenance of the fourth embodiment of the present invention. FIG. 12 is a flow path configuration diagram for explaining a surface treatment and maintenance procedure using the surface treatment apparatus shown in FIG. 11. FIG. 13 is a flow path configuration diagram of a surface treatment apparatus according to a fifth embodiment of the present invention. FIG. 14 is a flow path configuration diagram of a surface treatment apparatus according to a sixth embodiment of the present invention.

Claims (12)

一種玻璃基板之製造裝置,係具備有對成為玻璃基板之板狀玻璃的表面供給處理氣體,實施預定的表面處理的表面處理裝置之玻璃基板之製造裝置,其特徵為:   前述表面處理裝置係具備有:用來生成前述處理氣體之處理氣體生成裝置;將前述處理氣體供給至前述表面之供氣路徑;對前述處理氣體實施除害處理之除害裝置;及將已被供給到前述表面之前述處理氣體導入至前述除害裝置之排氣路徑,   可將無害氣體導入到前述供氣路徑的無害氣體導入路徑是匯集於前述供氣路徑。A glass substrate manufacturing apparatus is a glass substrate manufacturing apparatus provided with a surface processing apparatus that supplies a processing gas to the surface of a plate-shaped glass that becomes a glass substrate and performs a predetermined surface treatment, characterized in that: the aforementioned surface processing apparatus is provided with There are: a processing gas generating device for generating the aforementioned processing gas; a gas supply path for supplying the aforementioned processing gas to the aforementioned surface; an anti-hazard device for performing the aforementioned harm-removing treatment on the aforementioned processing gas; and the aforementioned The process gas is introduced into the exhaust path of the aforesaid detoxification device, and the harmless gas introduction path capable of introducing a harmless gas into the aforesaid gas supply path is collected in the aforesaid gas supply path. 如申請專利範圍第1項之玻璃基板之製造裝置,其中,還具備有:可開閉前述無害氣體導入路徑之第一開閉閥;及在較前述匯集位置更靠近前述供氣路徑的上游側,可開閉前述供氣路徑之第二開閉閥。For example, the device for manufacturing a glass substrate according to item 1 of the patent application scope further includes: a first on-off valve capable of opening and closing the harmless gas introduction path; and an upstream side of the gas supply path closer to the collection position than A second on-off valve for opening and closing the aforementioned air supply path. 如申請專利範圍第1項之玻璃基板之製造裝置,其中,還具有三向閥,該三向閥是設在前述匯集位置,可切換前述供氣路徑中從前述匯集位置的上游側朝向下游側之前述處理氣體的流動、和從前述無害氣體導入路徑朝向前述匯集位置的下游側之前述無害氣體的流動。For example, the device for manufacturing a glass substrate according to item 1 of the scope of the patent application further includes a three-way valve which is provided at the aforementioned collecting position and can switch the supply path from the upstream side to the downstream side of the aforementioned collecting position. The flow of the processing gas and the flow of the harmless gas from the harmless gas introduction path toward the downstream side of the collecting position. 如申請專利範圍第1至3項中任一項之玻璃基板之製造裝置,其中,還具備處理氣體分歧路徑,該處理氣體分歧路徑係在較前述匯集位置更靠近前述供氣路徑的上游側分歧而可對前述排氣路徑導入前述處理氣體。For example, the manufacturing apparatus for a glass substrate according to any one of claims 1 to 3 may further include a processing gas branching path which is branched closer to the upstream side of the gas supply path than the collecting position. Alternatively, the processing gas may be introduced into the exhaust path. 如申請專利範圍第4項之玻璃基板之製造裝置,其中,還具備有:開閉前述處理氣體分歧路徑之第三開閉閥。For example, the device for manufacturing a glass substrate according to item 4 of the patent application scope further includes a third on-off valve for opening and closing the branch path of the processing gas. 如申請專利範圍第4項之玻璃基板之製造裝置,其中,還具備有:配設於較前述處理氣體分歧路徑匯集於前述排氣路徑的位置更靠近前述排氣路徑的上游側,進行前述排氣路徑的開閉之第四開閉閥。For example, the device for manufacturing a glass substrate according to item 4 of the scope of patent application, further comprising: a device disposed at a position closer to an upstream side of the exhaust path than a position where the processing gas branch path is collected in the exhaust path, and performing the exhaust The fourth on-off valve for opening and closing the air path. 如申請專利範圍第1至3項中任一項之玻璃基板之製造裝置,其中,前述無害氣體係為清淨乾燥氣體。For example, the device for manufacturing a glass substrate according to any one of claims 1 to 3, wherein the harmless gas system is a clean and dry gas. 一種玻璃基板之製造方法,係具備有對成為玻璃基板之板狀玻璃的表面供給處理氣體,實施預定的表面處理的表面處理製程;及在停止進行表面處理製程的期間,進行用來實施前述表面處理的裝置之維修的維修製程之玻璃基板之製造方法,其特徵為:   在前述表面處理製程中,將在處理氣體生成裝置所生成的前述處理氣體經由供氣路徑供給至前述表面,並且將已被供給到前述表面的前述處理氣體經由排氣路徑導入至除害裝置,對前述處理氣體實施除害處理,   在前述維修製程中,藉由關閉前述供氣路徑並且朝較關閉了前述供氣路徑的位置更靠近前述供氣路徑的下游側導入無害氣體,將通過前述供氣路徑的前述處理氣體置換成前述無害氣體。A method for manufacturing a glass substrate is provided with a surface treatment process for supplying a treatment gas to a surface of a plate-shaped glass that becomes a glass substrate to perform a predetermined surface treatment; and performing the aforementioned surface while the surface treatment process is stopped. The manufacturing method of the glass substrate for the maintenance process of the processing device is characterized in that: In the surface processing process, the processing gas generated by the processing gas generating device is supplied to the surface through a gas supply path, and The processing gas supplied to the surface is introduced into the detoxification device through an exhaust path, and the decontamination treatment is performed on the processing gas. In the maintenance process, the gas supply path is closed and the gas supply path is closed relatively. The harmless gas is introduced closer to the downstream side of the gas supply path, and the processing gas passing through the gas supply path is replaced with the harmless gas. 如申請專利範圍第8項之玻璃基板之製造方法,其中,在前述維修製程中,在較關閉了前述供氣路徑的位置更靠近前述供氣路徑的上游側,從前述供氣路徑分歧而可朝前述排氣路徑導入前述處理氣體。For example, in the method for manufacturing a glass substrate according to item 8 of the scope of patent application, in the maintenance process, the gas supply path is closer to the upstream side of the gas supply path than the position where the gas supply path is closed. The processing gas is introduced into the exhaust path. 如申請專利範圍第9項之玻璃基板之製造方法,其中,在前述維修製程中,將通過前述供氣路徑的前述處理氣體置換成前述無害氣體後,停止朝前述供氣路徑導入前述無害氣體,並且在較從前述供氣路徑分歧而將前述處理氣體導入至前述排氣路徑的位置更靠近前述排氣路徑的上游側,關閉前述排氣路徑。For example, in the method for manufacturing a glass substrate according to item 9 of the scope of patent application, in the maintenance process, after replacing the processing gas passing through the gas supply path with the harmless gas, stopping introducing the harmless gas into the gas supply path Further, the exhaust path is closed closer to the upstream side of the exhaust path than the position where the processing gas is introduced into the exhaust path from the branch from the air supply path. 如申請專利範圍第10項之玻璃基板之製造方法,其中,還具備有表面處理的重啟準備製程,其是將前述供氣路徑打開而朝前述供氣路徑導入前述處理氣體,並且關閉從前述供氣路徑分歧之流路,且打開前述排氣路徑,藉此將前述無害氣體置換成前述處理氣體。For example, the method for manufacturing a glass substrate according to item 10 of the application, further comprising a restart preparation process for surface treatment, which opens the aforementioned gas supply path and introduces the aforementioned processing gas toward the aforementioned gas supply path, and closes the supply from the aforementioned gas supply path. The gas path has a branched flow path, and the exhaust path is opened, thereby replacing the harmless gas with the processing gas. 如申請專利範圍第9項之玻璃基板之製造方法,其中,在前述維修製程中,停止藉由前述處理氣體生成裝置之前述處理氣體的生成,並且,   並且,停止朝前述處理氣體生成裝置供給成為前述處理氣體的原料之氣體,並持續進行前述處理氣體所含有的載體氣體朝前述處理氣體生成裝置之供給。For example, in the method for manufacturing a glass substrate according to item 9 of the scope of patent application, in the maintenance process, the generation of the processing gas by the processing gas generating device is stopped, and the supply of the processing gas to the processing gas generating device is stopped. The raw material gas of the processing gas is continuously supplied with the carrier gas contained in the processing gas to the processing gas generating device.
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