TW201805118A - Chemical-mechanical polishing trimmer capable of adjusting protruded height of polishing bit by adjusting protruded height of polishing bit to provide height compensation and maintain trimmer performance - Google Patents

Chemical-mechanical polishing trimmer capable of adjusting protruded height of polishing bit by adjusting protruded height of polishing bit to provide height compensation and maintain trimmer performance Download PDF

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TW201805118A
TW201805118A TW105125283A TW105125283A TW201805118A TW 201805118 A TW201805118 A TW 201805118A TW 105125283 A TW105125283 A TW 105125283A TW 105125283 A TW105125283 A TW 105125283A TW 201805118 A TW201805118 A TW 201805118A
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mechanical polishing
item
patent application
chemical mechanical
height
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TW105125283A
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TWI590914B (en
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周瑞麟
巫豐印
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中國砂輪企業股份有限公司
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Abstract

A chemical-mechanical polishing trimmer capable of adjusting protruded height of polishing bit comprises a base, a plurality of polishing units, a plurality of cushioning units, and a plurality of adjusting units. The base has an upper surface, and a plurality of receiving grooves penetrating through the upper surface. The polishing unit is received in the receiving groove and comprises a polishing bit. The polishing bit includes a tip protruded from an opening and an expanding portion extended from the tip to a carrying column. The cushioning unit is received in the receiving groove and includes an elastic stopping member disposed at the opening. The elastic stopping member has a hollow portion, wherein the inner diameter of the hollow portion is between the tip and the expanding portion. The adjusting unit is received in the receiving groove and includes a screw, which is screwed with the threaded wall and may carry the carrying column to adjust the height of the tip protruded from the opening.

Description

一種可調整研磨顆粒突出高度之化學機械研磨修整器Chemical mechanical polishing dresser capable of adjusting protruding height of abrasive particles

本發明為有關一種化學機械研磨修整器,尤指一種可調整研磨顆粒突出高度之化學機械研磨修整器。The invention relates to a chemical mechanical polishing dresser, in particular to a chemical mechanical polishing dresser capable of adjusting the protruding height of abrasive particles.

於半導體晶圓製造過程之中,係廣泛使用化學機械研磨(Chemical mechanical polish,簡稱CMP)製程對晶圓進行研磨,令晶圓表面達平坦化。常見的化學機械研磨製程為使用一具有複數研磨顆粒的研磨墊(或拋光墊)對一晶圓表面進行研磨,且該些研磨顆粒係經過高度調整,使該研磨墊的修整精密度提高。During the semiconductor wafer manufacturing process, a chemical mechanical polish (CMP) process is widely used to polish the wafer to flatten the surface of the wafer. A common chemical mechanical polishing process is to use a polishing pad (or polishing pad) with a plurality of polishing particles to polish a wafer surface, and the polishing particles are adjusted in height to improve the precision of the polishing pad.

如中華民國發明專利公告第562719號,提出一種能個別調整一磨粒的修整盤,將每一顆獨立的磨粒分別以焊材焊在一根金屬桿的桿頂端面上。如果在桿頂端面上預設一凹槽,還可將該磨粒依其晶形以特定的方向固定後焊牢。由於該磨粒乃焊在金屬桿上,所以金屬盤並不需要加熱,因此其加工精度可以保持。這時將焊好的金屬桿分別插入金屬盤的特定位置銷孔內就可控制磨粒的分佈。For example, the Republic of China Invention Patent Publication No. 562719 proposes a dressing disc capable of individually adjusting an abrasive grain, and welding each independent abrasive grain to the top end surface of a metal rod with a welding material. If a groove is preset on the top surface of the rod, the abrasive grain can also be fixed in a specific direction according to its crystal shape and then welded firmly. Because the abrasive particles are welded to the metal rod, the metal disc does not need to be heated, so its machining accuracy can be maintained. At this time, the distribution of the abrasive particles can be controlled by inserting the welded metal rods into the pin holes of the specific positions of the metal discs, respectively.

另可參中華民國發明專利公開第201532734號,提出一種高性能化學機械研磨修整器,包括一基板、一結合層以及複數個研磨顆粒,該結合層係設置於該基板上,該些研磨顆粒係藉由該結合層以直接固定於該基板上,或者,每一研磨顆粒係設置於一金屬固定座上,且該基板具有複數個凹槽或複數個貫穿孔,使該金屬固定座容置於該些凹槽或該些貫穿孔中,且該金屬固定座藉由該結合層以固定於該基板上,其中,該研磨顆粒係經由一表面加工處理,使該研磨顆粒具有特定之切削刃角、晶形結構、尖端高度、及尖端方向性,或者,該研磨顆粒係未經加工處理之研磨顆粒。See also the Republic of China Invention Patent Publication No. 201532734, which proposes a high-performance chemical mechanical polishing dresser, which includes a substrate, a bonding layer, and a plurality of polishing particles. The bonding layer is directly fixed on the substrate, or each abrasive particle is disposed on a metal fixing seat, and the substrate has a plurality of grooves or a plurality of through holes, so that the metal fixing seat is accommodated in The grooves or the through holes, and the metal fixing seat is fixed on the substrate by the bonding layer, wherein the abrasive particles are processed by a surface processing so that the abrasive particles have a specific cutting edge angle , Crystal structure, tip height, and tip directivity, or the abrasive particles are unprocessed abrasive particles.

此外,本案申請人所提出申請的中華民國發明專利申請第104117686號,提出一種化學機械研磨修整器,包含一基板以及複數研磨單元,該基板具有一水平頂面,該些研磨單元設於該基板之該水平頂面,包含一研磨單元基板、一研磨層以及一結合層,該研磨單元基板具有相對的一上表面和一下表面,該研磨層形成於該上表面並具有複數研磨尖端,該結合層形成於該下表面與該基板之間並於面向該下表面之一面形成一斜面。其中該些研磨單元更包含一墊設件,該墊設件設於該基板之該水平頂面並墊設於該下表面之一側,且該結合層形成於該下表面、該墊設件與該水平頂面之間並於面向該下表面之一面形成該斜面。In addition, the Republic of China Invention Patent Application No. 104117686 filed by the applicant of this case proposes a chemical mechanical polishing dresser, which includes a substrate and a plurality of polishing units. The substrate has a horizontal top surface, and the polishing units are disposed on the substrate. The horizontal top surface includes a polishing unit substrate, a polishing layer, and a bonding layer. The polishing unit substrate has an upper surface and a lower surface opposite to each other. The polishing layer is formed on the upper surface and has a plurality of polishing tips. The layer is formed between the lower surface and the substrate and forms an inclined surface on a surface facing the lower surface. The grinding units further include a pad, the pad is provided on the horizontal top surface of the substrate and is placed on one side of the lower surface, and the bonding layer is formed on the lower surface and the pad. The inclined surface is formed between the horizontal top surface and a surface facing the lower surface.

又可參中華民國發明專利公告第I228066號,提出一種研磨布用修整器,是在可旋轉的金屬台的表面形成有修整面之研磨布用修整器,其特徵為:在上述修整面,朝其周方向並排設置有複數個磨石顆粒群,在上述金屬台,設置有能調節全部或一部分的磨石顆粒群中以多數個磨石顆粒的前端所分別形成的基準面之上述修整面的高低差之調節機構。上述調節機構係由位在表面固著有磨石顆粒群,可上下滑動自如地嵌入到上述金屬台的表面所開口之凹部之基台、及設置在該基台的背面,螺合在從上述金屬台之凹部的底面貫穿到該金屬台的背面側之螺絲孔之調節用螺絲、及利用該調節用螺絲來調節固著在上述基台的磨石顆粒群之基準面的高度位置。See also the Republic of China Invention Patent Publication No. I228066, which proposes a dresser for polishing cloth, which is a dresser for polishing cloth with a dressing surface formed on the surface of a rotatable metal table, which is characterized in that: A plurality of grindstone particle groups are arranged side by side in the circumferential direction. The metal table is provided with the above-mentioned trimmed surface that can adjust a reference surface formed by the front ends of a plurality of grindstone particles among all or a part of the grindstone particle groups. Height adjustment mechanism. The above-mentioned adjusting mechanism is composed of a base on which a grindstone particle group is fixed on the surface, and can be slid up and down to be embedded in a recessed portion opened on the surface of the metal table, and is arranged on the back of the base, and is screwed on from the above The bottom surface of the recessed portion of the metal table penetrates the adjustment screw for the screw hole on the back side of the metal table, and the height position of the reference surface of the grindstone particle group fixed to the base table is adjusted by the adjustment screw.

於以上先前技術之中,中華民國發明專利公告第562719號係先將每一顆獨立的磨粒分別以焊材焊在一根金屬桿的桿頂端面上,再將該金屬桿插入該金屬盤的孔內,並將金屬盤反扣在該平板上以用於調整該磨粒的頂點高度,待頂點高度調整完畢後,再透過黏結材料將該金屬桿黏固於該金屬盤上,然固定後的該磨粒即無法再次進行高度調整;中華民國公開第201532734號則將該些研磨顆粒或者將載有該研磨顆粒的該金屬固定座藉由該結合層直接固定於該基板上,此作法與前一個先前技術類似,固定後無法再對高度進行調整;而中華民國專利申請第104117686號係先透過該墊設件來調整該研磨尖端的高度,調整完畢後再於該基板的該水平頂面與該研磨單元基板的該下表面之間形成該結合層,用於將該研磨單元牢固於該基板上,此案也同樣有前述固定後無法再對高度進行調整的問題。In the above prior art, the Republic of China Invention Patent Publication No. 562719 first welded each independent abrasive grain to the top end surface of a metal rod with a welding material, and then inserted the metal rod into the metal disc. Inside the hole, and buckle the metal plate on the plate to adjust the height of the apex of the abrasive grains. After the height of the apex is adjusted, the metal rod is fixed to the metal plate through the bonding material and then fixed. The subsequent abrasive particles cannot be adjusted again in height; the Republic of China Publication No. 201532734 fixes the abrasive particles or the metal fixing seat carrying the abrasive particles directly on the substrate through the bonding layer. Similar to the previous prior art, the height cannot be adjusted after being fixed; however, the Republic of China Patent Application No. 104117686 adjusts the height of the grinding tip through the pad first, and then adjusts the horizontal top of the substrate after adjustment. The bonding layer is formed between the surface and the lower surface of the polishing unit substrate, and is used to firmly fix the polishing unit to the substrate. In this case, the height cannot be adjusted after the fixing. Line adjustment of the question.

另中華民國發明專利公告第I228066雖揭示可透過旋轉該調節用螺絲而調整該磨石顆粒群的該高度差,然該調節機構部分外露於該金屬台外,因此於研磨過程中易使該磨石顆粒群或該調節機構從該金屬台上脫落,造成修整穩定性不佳的問題,且該調節機構係直接設置於該金屬台上,並無任何緩衝機構來緩衝研磨時所造成的衝擊力,易於研磨過程中造成該金屬台、該調節機構或該磨石顆粒群的毀損,另外,當要更換該些磨石顆粒群時,需連同該調節機構一併更換,使耗材成本相對提高。In addition, although the Republic of China Invention Patent Bulletin No. I228066 discloses that the height difference of the grindstone particle group can be adjusted by rotating the adjustment screw, the adjustment mechanism is partially exposed outside the metal table, so it is easy to make the grinding during the grinding process. The stone particles or the adjustment mechanism fall off the metal table, causing a problem of poor trimming stability. The adjustment mechanism is directly installed on the metal table, and there is no buffer mechanism to buffer the impact caused by the grinding. It is easy to cause damage to the metal table, the adjustment mechanism or the grindstone particle group during the grinding process. In addition, when the grindstone particle group is to be replaced, it needs to be replaced together with the adjustment mechanism, so that the cost of consumables is relatively increased.

綜上可知,傳統的化學機械研磨修整器,對於調整研磨顆粒突出高度之技術,仍有待改進。To sum up, the traditional chemical mechanical polishing dresser still needs to be improved in the technology of adjusting the protruding height of the abrasive particles.

本發明的主要目的,在於解決習知化學機械研磨修整器對於研磨顆粒突出高度調整技術有待改進的問題。The main purpose of the present invention is to solve the problem that the conventional chemical mechanical polishing dresser needs to be improved in terms of adjusting the protruding height of the abrasive particles.

為達上述目的,本發明提供一種可調整研磨顆粒突出高度之化學機械研磨修整器,包括一基座、複數個研磨單元、複數個緩衝單元以及複數個調整單元,該基座具有一上表面以及複數個貫穿於該上表面的容置槽,該容置槽分別具有一鄰近該上表面的開口以及一遠離該上表面的螺紋壁,該研磨單元容置於該容置槽,包括一承載柱以及一設置於該承載柱上的研磨顆粒,該研磨顆粒具有一突出該開口的尖端以及一自該尖端朝該承載柱延伸的擴大部,該緩衝單元容置於該容置槽,包括一設置於該開口的彈性擋止件,該彈性擋止件具有一中空,該中空的內徑介於該尖端和該擴大部之間,該調整單元容置於該容置槽,包括一和該螺紋壁螺合並承載該承載柱以調整該尖端突出至遠離該開口的一突出高度的螺絲件。To achieve the above object, the present invention provides a chemical mechanical polishing dresser capable of adjusting the protruding height of abrasive particles, which includes a base, a plurality of grinding units, a plurality of buffer units, and a plurality of adjusting units. The base has an upper surface and A plurality of accommodating grooves penetrating through the upper surface, the accommodating grooves respectively having an opening adjacent to the upper surface and a threaded wall away from the upper surface; the grinding unit is accommodated in the accommodating groove, including a bearing post And an abrasive particle disposed on the bearing column, the abrasive particle having a tip protruding from the opening and an enlarged portion extending from the tip toward the bearing column, the buffer unit being accommodated in the accommodation slot, including a setting An elastic stopper at the opening, the elastic stopper has a hollow, the hollow inner diameter is between the tip and the enlarged portion, and the adjustment unit is accommodated in the accommodation slot, including one and the thread The wall screw incorporates a screw member carrying the bearing post to adjust the tip protruding to a protruding height away from the opening.

於一實施例中,該彈性擋止件為一橡膠O形環。In one embodiment, the elastic stopper is a rubber O-ring.

於一實施例中,該緩衝單元更包括一設置於該承載柱與該調整單元之間的彈性緩衝件。In an embodiment, the buffer unit further includes an elastic buffer member disposed between the bearing post and the adjustment unit.

於一實施例中,該彈性緩衝件為一矽膠墊。In one embodiment, the elastic buffer is a silicon pad.

於一實施例中,該基座更包括複數個擋止壁,該擋止壁凸設於該容置槽的該開口處且具有一小於該容置槽的一第一內徑的第二內徑。In an embodiment, the base further includes a plurality of stop walls protruding from the opening of the receiving groove and having a second inner diameter smaller than a first inner diameter of the receiving groove. path.

於一實施例中,該基座的材質擇自於不鏽鋼、金屬材料、塑膠材料及陶瓷材料所組成之群組。In one embodiment, the material of the base is selected from the group consisting of stainless steel, metal materials, plastic materials and ceramic materials.

於一實施例中,該承載柱的材質擇自於不鏽鋼、金屬材料、塑膠材料及陶瓷材料所組成之群組。In one embodiment, the material of the supporting post is selected from the group consisting of stainless steel, metal material, plastic material and ceramic material.

於一實施例中,該研磨單元更包括一形成於該承載柱與該研磨顆粒之間且將該研磨顆粒固定於該承載柱上的結合層。In an embodiment, the grinding unit further includes a bonding layer formed between the bearing column and the grinding particles and fixing the grinding particles on the bearing column.

於一實施例中,該結合層的組成擇自於陶瓷材料、硬焊材料、電鍍材料、金屬材料及高分子材料所組成之群組。In one embodiment, the composition of the bonding layer is selected from the group consisting of a ceramic material, a brazing material, a plating material, a metal material, and a polymer material.

於一實施例中,該突出高度為介於10μm至500μm之間。In one embodiment, the protruding height is between 10 μm and 500 μm.

於一實施例中,該調整單元遠離該承載柱的一端具有一卡槽,該卡槽的形狀擇自於六角狀、一字狀及十字狀所組成之群組。In one embodiment, the end of the adjusting unit remote from the bearing post has a latching slot, and the shape of the latching slot is selected from a group consisting of a hexagonal shape, a straight shape, and a cross shape.

於一實施例中,該承載柱設置於該容置槽內,且該研磨顆粒受該彈性擋止件的阻擋而部分突出於該容置槽外。In one embodiment, the bearing post is disposed in the receiving groove, and the abrasive particles are partially blocked by the elastic stopper and protrude outside the receiving groove.

於一實施例中,該突出高度小於該研磨顆粒的一高度。In one embodiment, the protruding height is less than a height of the abrasive particles.

綜上所述,本發明相較於習知技藝可達到之功效在於,本發明係利用該調整單元來調整該研磨顆粒的該尖端突出於該開口的該突出高度,於使用過程中,當部分或特定的該研磨顆粒群磨耗到一定程度,可藉由該調整單元調整該突出高度,以提供高度補償,維持修整器的效能;其次,縱使在生產完成後、使用過程中或是依據不同的應用需求,皆可彈性地調整該突出高度,且因設置有該彈性擋止件,該研磨單元以及該調整單元係受該彈性擋止件的阻擋,當於修整過程中,該研磨單元以及該調整單元將不易脫落,使修整時的穩定性提高;另因設置該緩衝單元於該容置槽中,當該研磨顆粒接觸待修整工件時,可以提供緩衝效果以降低損壞率。又,由於該研磨單元與該調整單元係以獨立方式設置,故當特定的該研磨單元磨耗或損壞時,只要單獨更換該研磨單元即可,大幅降低成本。To sum up, the effect of the present invention compared to the conventional technique is that the present invention uses the adjusting unit to adjust the protruding height of the tip of the abrasive particle protruding from the opening. During use, when the part is Or the specific abrasive particle group wears to a certain degree, the protruding height can be adjusted by the adjustment unit to provide height compensation and maintain the performance of the dresser; secondly, even after production is completed, during use, or according to different According to application requirements, the protruding height can be adjusted elastically, and because the elastic stopper is provided, the grinding unit and the adjustment unit are blocked by the elastic stopper. During the trimming process, the grinding unit and the The adjustment unit will not fall off easily, which will improve the stability during trimming. In addition, the buffer unit is provided in the accommodating groove. When the abrasive particles contact the workpiece to be trimmed, a cushioning effect can be provided to reduce the damage rate. In addition, since the grinding unit and the adjustment unit are provided in an independent manner, when a particular grinding unit is worn or damaged, it is only necessary to replace the grinding unit separately, thereby greatly reducing costs.

有關本發明的詳細說明及技術內容,現就配合圖式說明如下:The detailed description and technical contents of the present invention are described below with reference to the drawings:

請搭配參閱『圖1』至『圖3』所示,分別為本發明一實施例中該化學機械研磨修整器俯視示意圖、『圖1』的A-A方向剖面示意圖以及本發明一實施例的結構分解示意圖,本發明為一種可調整研磨顆粒突出高度之化學機械研磨修整器,包括一基座10、複數個研磨單元20、複數個緩衝單元30以及複數個調整單元40,該基座10具有一上表面101、複數個容置槽102以及複數個擋止壁103,該容置槽102貫穿於該上表面101且具有一第一內徑,分別包括一鄰近該上表面101的開口1021以及一遠離該上表面101的螺紋壁1022,該擋止壁103凸設於該容置槽102的該開口1021處且具有一小於該第一內徑的第二內徑,於本發明之一實施例中,該基座10的材質為不鏽鋼、金屬材料、塑膠材料、陶瓷材料或上述組合。Please refer to "Figure 1" to "Figure 3" for a top view of the chemical mechanical polishing dresser in an embodiment of the present invention, a cross-sectional view in the AA direction of "Figure 1", and a structural decomposition of an embodiment of the present invention. The present invention is a chemical mechanical polishing dresser capable of adjusting the protruding height of abrasive particles. The chemical mechanical polishing dresser includes a base 10, a plurality of grinding units 20, a plurality of buffer units 30, and a plurality of adjusting units 40. The base 10 has a top Surface 101, a plurality of receiving grooves 102, and a plurality of blocking walls 103. The receiving grooves 102 penetrate through the upper surface 101 and have a first inner diameter, respectively including an opening 1021 adjacent to the upper surface 101 and a distance The threaded wall 1022 of the upper surface 101 and the blocking wall 103 are protruded at the opening 1021 of the receiving groove 102 and have a second inner diameter smaller than the first inner diameter. In one embodiment of the present invention, The material of the base 10 is stainless steel, metal material, plastic material, ceramic material, or a combination thereof.

該研磨單元20容置於該容置槽102,分別包括一承載柱21以及一設置於該承載柱21上的研磨顆粒22,該研磨顆粒22具有一突出該開口1021的尖端221以及一自該尖端221朝該承載柱21延伸的擴大部222,該研磨顆粒22可選用人造鑽石、天然鑽石、多晶鑽石或立方氮化硼。於本發明一實施例中,該承載柱21的材質可為不鏽鋼、金屬材料、塑膠材料、陶瓷材料或上述組合。於本實施例中,該研磨單元20更包括一結合層23,形成於該承載柱21與該研磨顆粒22之間且將該研磨顆粒22固定於該承載柱21上,該結合層23的材料可為陶瓷材料、硬焊材料、電鍍材料、金屬材料或高分子材料,其中,該硬焊材料可為鐵、鈷、鎳、鉻、錳、矽、鋁、硼、碳之金屬或合金,於一實施例中,該硬焊材料可採用Nicrobraz LM之合金,其成分為7 wt.%的Cr,3.1 wt.%的B,4.5 wt.%的Si,3.0 wt.%的Fe,0.06 wt%的C,其餘為Ni;該高分子材料可為環氧樹脂、聚脂樹脂、聚丙烯酸樹脂或酚醛樹脂。於本發明中,該基座10以及該承載柱21較佳地為不鏽鋼材料,但本發明並不以此為限,使用者可依需求而變化。The grinding unit 20 is received in the accommodating groove 102, and includes a bearing post 21 and an abrasive particle 22 disposed on the bearing post 21. The grinding particle 22 has a tip 221 protruding from the opening 1021 and an opening 221. The enlarged portion 222 of the tip 221 extending toward the bearing post 21. The abrasive particles 22 may be artificial diamond, natural diamond, polycrystalline diamond, or cubic boron nitride. In an embodiment of the present invention, the material of the supporting post 21 may be stainless steel, metal material, plastic material, ceramic material, or a combination thereof. In this embodiment, the grinding unit 20 further includes a bonding layer 23 formed between the bearing column 21 and the grinding particles 22 and fixing the grinding particle 22 on the bearing column 21. The material of the binding layer 23 It can be ceramic material, brazing material, electroplating material, metal material or polymer material. Among them, the brazing material can be metal or alloy of iron, cobalt, nickel, chromium, manganese, silicon, aluminum, boron, and carbon. In an embodiment, the brazing material may be an alloy of Nicrobraz LM, and its composition is 7 wt.% Cr, 3.1 wt.% B, 4.5 wt.% Si, 3.0 wt.% Fe, 0.06 wt% C, the rest is Ni; the polymer material may be epoxy resin, polyester resin, polyacrylic resin or phenolic resin. In the present invention, the base 10 and the supporting column 21 are preferably made of stainless steel, but the present invention is not limited thereto, and users can change according to requirements.

該緩衝單元30容置於該容置槽102,包括一設置於該開口1021的彈性擋止件31,該彈性擋止件31具有一中空,該中空的內徑介於該尖端221和該擴大部222之間。於本實施例中,該研磨單元20的該研磨顆粒22穿設於該彈性擋止件31的該中空,以使該彈性擋止件31受該擋止壁103壓制而固定於該承載柱21和該擋止壁103之間。有關該彈性擋止件31的設置方式,本發明並不以前述為限,舉例來說,於另一實施例中,可於該容置槽102靠近該開口1021的位置設置一凹槽,使該彈性擋止件31的一外環部固設於該凹槽內;於另一實施例中,可透過一黏著劑將該彈性擋止件31的該外環部黏合於該容置槽102靠近該開口1021的位置。此外,於本實施例中,該緩衝單元30更包括一彈性緩衝件32,設置於該承載柱21與該調整單元40之間,其中該彈性擋止件31可為一橡膠O形環(O-ring),該彈性緩衝件32可為一矽膠墊。The buffer unit 30 is accommodated in the accommodation groove 102 and includes an elastic stopper 31 provided in the opening 1021. The elastic stopper 31 has a hollow, and the hollow inner diameter is between the tip 221 and the expansion. Department 222. In this embodiment, the abrasive particles 22 of the grinding unit 20 pass through the hollow of the elastic stopper 31, so that the elastic stopper 31 is pressed by the stopper wall 103 and fixed to the bearing post 21. And the stop wall 103. Regarding the manner of setting the elastic stopper 31, the present invention is not limited to the foregoing. For example, in another embodiment, a groove may be provided at a position of the receiving groove 102 near the opening 1021, so that An outer ring portion of the elastic stopper 31 is fixed in the groove. In another embodiment, the outer ring portion of the elastic stopper 31 can be adhered to the receiving groove 102 through an adhesive. Close to the opening 1021. In addition, in the present embodiment, the buffer unit 30 further includes an elastic buffer member 32 disposed between the bearing post 21 and the adjustment unit 40. The elastic stopper 31 may be a rubber O-ring (O -ring), the elastic cushioning member 32 may be a silicon pad.

該調整單元40容置於該容置槽102的底部,包括一螺絲件41,該螺絲件41和該螺紋壁1022螺合並承載該承載柱21以調整該尖端221突出至遠離該上表面101的一突出高度,其中該突出高度為介於10μm至500μm之間,該突出高度小於該研磨顆粒22的一高度。於本實施例中,該螺絲件41遠離該承載柱21的一端具有一卡槽,該卡槽的形狀可為六角狀、一字狀或十字狀,藉此使用者可利用工具插入該卡槽而轉動該螺絲件41。The adjusting unit 40 is accommodated in the bottom of the accommodating slot 102 and includes a screw member 41. The screw member 41 and the threaded wall 1022 are screwed together to carry the bearing column 21 to adjust the tip 221 to protrude away from the upper surface 101. A protruding height, wherein the protruding height is between 10 μm and 500 μm, and the protruding height is smaller than a height of the abrasive particles 22. In this embodiment, one end of the screw member 41 away from the bearing post 21 has a slot, and the shape of the slot can be hexagonal, straight or cross-shaped, so that the user can insert the slot with a tool. And turn the screw member 41.

請搭配參閱『圖4』及『圖5』所示,分別為本發明一實施例中該研磨顆粒具有該第一突出高度的示意圖以及本發明一實施例中該研磨顆粒具有該第二突出高度的示意圖,在組裝完成後,可將該螺絲件41往該開口1021的方向移動,推動該承載柱21向上,使該研磨顆粒22的該尖端221穿過該彈性擋止件31,其中,該研磨顆粒22將受該彈性擋止件31的阻擋而部分突出一第一突出高度h1於該容置槽102外,如『圖4』所示;欲再調整該突出高度時,讓該螺絲件41往該開口1021的方向進一步移動,使該彈性擋止件31和該彈性緩衝件32的厚度壓縮,而令該尖端221於該上表面101突出一第二突出高度h2,如『圖5』所示。於實際應用,可由一荷重控制來決定每一個該研磨顆粒22的該尖端221於該上表面101所突出的該突出高度,例如控制該調整單元40的鎖合磅數。Please refer to FIG. 4 and FIG. 5 for a schematic diagram of the abrasive particles having the first protruding height in an embodiment of the present invention and the abrasive particles having the second protruding height in an embodiment of the present invention. After the assembly is completed, the screw member 41 can be moved in the direction of the opening 1021 to push the bearing column 21 upward, so that the tip 221 of the abrasive particle 22 passes through the elastic stopper 31. The abrasive particles 22 will be partially blocked by the elastic stopper 31 and partially protrude by a first protruding height h1 outside the accommodation groove 102, as shown in FIG. 4; when the protruding height is to be adjusted, the screw member 41 further moves in the direction of the opening 1021, so that the thickness of the elastic stopper 31 and the elastic buffer 32 is compressed, and the tip 221 protrudes from the upper surface 101 by a second protruding height h2, as shown in FIG. 5 As shown. For practical applications, a load control can be used to determine the protruding height of the tip 221 of each of the abrasive particles 22 on the upper surface 101, such as controlling the locking pounds of the adjusting unit 40.

請搭配參閱『圖6』及『圖7』所示,分別為本發明一實施例中該研磨顆粒磨耗後的示意圖以及本發明一實施例中補償磨耗後該研磨顆粒高度的示意圖,於研磨過程中該些研磨顆粒22會有磨耗的產生,以『圖4』之實施例作為基礎,部分的該研磨顆粒22的該尖端221於該上表面101所突出的該第一突出高度h1被磨耗至一第三突出高度h3,該第三突出高度h3小於該第一突出高度h1,如『圖6』所示。此時修整效率將因該些研磨顆粒22具有突出高度差異而受影響,藉由控制該螺絲件41以調整該尖端221的該突出高度,使磨耗較多的該些研磨顆粒22的該尖端221的該第三突出高度h3再次調整至該第一突出高度h1,如『圖7』所示。Please refer to "Figure 6" and "Figure 7" for a schematic view of the abrasive particles after abrasion in one embodiment of the present invention and a schematic diagram of the abrasive particle height after compensation for abrasion in an embodiment of the present invention during the grinding process. The abrasive particles 22 will have abrasion. Based on the embodiment of FIG. 4, part of the first protruding height h1 of the tip 221 of the abrasive particles 22 on the upper surface 101 is abraded to A third protruding height h3. The third protruding height h3 is smaller than the first protruding height h1, as shown in FIG. 6. At this time, the dressing efficiency will be affected by the protruding height difference of the abrasive particles 22. By controlling the screw 41 to adjust the protruding height of the tip 221, the tip 221 of the abrasive particles 22 with more abrasion is adjusted. The third protruding height h3 is adjusted to the first protruding height h1 again, as shown in FIG. 7.

綜上所述,由於該調整單元可調整該研磨顆粒的該尖端突出於該開口的該突出高度,於使用過程中,當部分或特定的該研磨顆粒群磨耗到一定程度,可藉由該調整單元調整該突出高度,以提供高度補償,維持修整器的功能;且縱使在生產完成後、使用過程中或是依據不同的應用需求,皆可彈性地調整該突出高度,且因設置有該彈性擋止件,該研磨單元以及該調整單元係受該彈性擋止件的阻擋,當於修整過程中,該研磨單元以及該調整單元將不易脫落,使修整時的穩定性提高,另因設置該緩衝單元於該容置槽中,當該研磨顆粒接觸待修整工件時,可以提供緩衝效果以降低損壞率,且該緩衝單元使該研磨單元穩固地保持在該容置槽內,可防止該研磨單元研磨時產生一自轉效應而脫落,另一方面,該緩衝單元更提供該調整單元對該研磨單元推進時的緩衝效果,以使該研磨單元具有微調的功效。又,由於該研磨單元與該調整單元係以獨立方式設置,故當特定的該研磨單元磨耗或損率時,只要單獨更換該研磨單元即可,大幅降低耗材成本。In summary, since the adjusting unit can adjust the protruding height of the tip of the abrasive particles protruding from the opening, during the use, when part or a specific group of the abrasive particles is worn to a certain degree, the adjustment can be performed by the adjustment. The unit adjusts the protruding height to provide height compensation and maintain the function of the dresser; and even after the production is completed, during use, or according to different application requirements, the protruding height can be flexibly adjusted, and because of the flexibility provided The stopper, the grinding unit and the adjustment unit are blocked by the elastic stopper. During the trimming process, the grinding unit and the adjustment unit will not easily fall off, which will improve the stability during trimming. The buffer unit is in the accommodating groove. When the abrasive particles contact the workpiece to be trimmed, a buffering effect can be provided to reduce the damage rate. The buffer unit keeps the grinding unit firmly in the accommodating groove to prevent the grinding. When the unit is grinding, a rotation effect is generated to fall off. On the other hand, the buffer unit further provides a buffer when the adjustment unit advances the grinding unit. Fruit, so that the polishing unit has a trimming effect. In addition, since the grinding unit and the adjustment unit are provided in an independent manner, when the specific grinding unit is worn or damaged, as long as the grinding unit is replaced, the cost of consumables can be greatly reduced.

以上已將本發明做一詳細說明,惟以上所述者,僅爲本發明的一較佳實施例而已,當不能限定本發明實施的範圍。即凡依本發明申請範圍所作的均等變化與修飾等,皆應仍屬本發明的專利涵蓋範圍內。The present invention has been described in detail above, but the above is only a preferred embodiment of the present invention, and the scope of implementation of the present invention cannot be limited. That is, all equivalent changes and modifications made in accordance with the scope of the application of the present invention should still fall within the scope of the patent of the present invention.

10‧‧‧基座
101‧‧‧上表面
102‧‧‧容置槽
103‧‧‧擋止壁
1021‧‧‧開口
1022‧‧‧螺紋壁
20‧‧‧研磨單元
21‧‧‧承載柱
22‧‧‧研磨顆粒
221‧‧‧尖端
222‧‧‧擴大部
23‧‧‧結合層
30‧‧‧緩衝單元
31‧‧‧彈性擋止件
32‧‧‧彈性緩衝件
40‧‧‧調整單元
41‧‧‧螺絲件
h1‧‧‧第一突出高度
h2‧‧‧第二突出高度
h3‧‧‧第三突出高度
10‧‧‧ base
101‧‧‧ top surface
102‧‧‧Receiving slot
103‧‧‧stop wall
1021‧‧‧ opening
1022‧‧‧Threaded wall
20‧‧‧grinding unit
21‧‧‧bearing column
22‧‧‧ abrasive particles
221‧‧‧ Tip
222‧‧‧Expansion Department
23‧‧‧Combination layer
30‧‧‧ buffer unit
31‧‧‧ elastic stop
32‧‧‧ Elastic buffer
40‧‧‧ adjustment unit
41‧‧‧Screw
h1‧‧‧ the first protruding height
h2‧‧‧Second protruding height
h3‧‧‧ Third protruding height

『圖1』,為本發明一實施例中,該化學機械研磨修整器俯視示意圖。 『圖2』,為『圖1』的A-A方向剖面示意圖。 『圖3』,為本發明一實施例的結構分解示意圖。 『圖4』,為本發明一實施例中,該研磨顆粒具有該第一突出高度的示意圖。 『圖5』,為本發明一實施例中,該研磨顆粒具有該第二突出高度的示意圖。 『圖6』,為本發明一實施例中,該研磨顆粒磨耗後的示意圖。 『圖7』,為本發明一實施例中,補償磨耗後該研磨顆粒高度的示意圖。[Figure 1] A schematic plan view of the chemical mechanical polishing dresser in an embodiment of the present invention. [Figure 2] is a schematic cross-sectional view in the direction A-A of [Figure 1]. [Figure 3] is a structural exploded view of an embodiment of the present invention. [Fig. 4] is a schematic diagram of the abrasive particles having the first protruding height in an embodiment of the present invention. [Figure 5] is a schematic diagram of the abrasive particles having the second protruding height in an embodiment of the present invention. [Fig. 6] is a schematic diagram of the abrasive particles after abrasion in an embodiment of the present invention. [Fig. 7] is a schematic diagram of the height of the abrasive particles after compensating for wear in an embodiment of the present invention.

10‧‧‧基座 10‧‧‧ base

101‧‧‧上表面 101‧‧‧ top surface

102‧‧‧容置槽 102‧‧‧Receiving slot

103‧‧‧擋止壁 103‧‧‧stop wall

1021‧‧‧開口 1021‧‧‧ opening

1022‧‧‧螺紋壁 1022‧‧‧Threaded wall

20‧‧‧研磨單元 20‧‧‧grinding unit

21‧‧‧承載柱 21‧‧‧bearing column

22‧‧‧研磨顆粒 22‧‧‧ abrasive particles

221‧‧‧尖端 221‧‧‧ Tip

222‧‧‧擴大部 222‧‧‧Expansion Department

23‧‧‧結合層 23‧‧‧Combination layer

30‧‧‧緩衝單元 30‧‧‧ buffer unit

31‧‧‧彈性擋止件 31‧‧‧ elastic stop

32‧‧‧彈性緩衝件 32‧‧‧ Elastic buffer

40‧‧‧調整單元 40‧‧‧ adjustment unit

41‧‧‧螺絲件 41‧‧‧Screw

Claims (13)

一種可調整研磨顆粒突出高度之化學機械研磨修整器,包括: 一基座,該基座具有一上表面以及複數個貫穿於該上表面的容置槽,該容置槽分別具有一鄰近該上表面的開口以及一遠離該上表面的螺紋壁; 複數個研磨單元,容置於該容置槽,該研磨單元分別包括一承載柱以及一設置於該承載柱上的研磨顆粒,該研磨顆粒具有一突出該開口的尖端以及一自該尖端朝該承載柱延伸的擴大部; 複數個緩衝單元,容置於該容置槽,該緩衝單元包括一設置於該開口的彈性擋止件,該彈性擋止件具有一中空,該中空的內徑介於該尖端和該擴大部之間;以及 複數個調整單元,容置於該容置槽,該調整單元包括一和該螺紋壁螺合並承載該承載柱以調整該尖端突出至遠離該開口的一突出高度的螺絲件。A chemical mechanical polishing dresser capable of adjusting the protruding height of abrasive particles, comprising: a base, the base having an upper surface and a plurality of receiving grooves penetrating through the upper surface, the receiving grooves each having an adjacent surface adjacent to the upper surface; A surface opening and a threaded wall away from the upper surface; a plurality of grinding units are housed in the accommodating groove, and the grinding units each include a bearing post and an abrasive particle disposed on the bearing post, the grinding particles having A tip protruding from the opening and an enlarged portion extending from the tip toward the load-bearing post; a plurality of buffer units are accommodated in the accommodating groove, and the buffer unit includes an elastic stopper provided on the opening, and the elasticity The stopper has a hollow, and the hollow inner diameter is between the tip and the enlarged portion; and a plurality of adjusting units are accommodated in the accommodating grooves. The adjusting unit includes a screw thread and the threaded wall to carry the screw. The post is carried to adjust a screw member protruding from the tip to a protruding height away from the opening. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該彈性擋止件為一橡膠O形環。The chemical-mechanical abrasive dresser according to item 1 of the patent application scope, wherein the elastic stopper is a rubber O-ring. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該緩衝單元更包括一設置於該承載柱與該調整單元之間的彈性緩衝件。The chemical mechanical polishing dresser according to item 1 of the scope of the patent application, wherein the buffer unit further includes an elastic buffer member disposed between the bearing column and the adjustment unit. 如申請專利範圍第3項所述之化學機械研磨修整器,其中該彈性緩衝件為一矽膠墊。The chemical-mechanical abrasive dresser according to item 3 of the patent application scope, wherein the elastic buffer is a silicon pad. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該基座更包括複數個擋止壁,該擋止壁凸設於該容置槽的該開口處且具有一小於該容置槽的一第一內徑的第二內徑。According to the chemical mechanical polishing and dressing device described in item 1 of the scope of patent application, wherein the base further includes a plurality of blocking walls, the blocking walls are convexly disposed at the opening of the receiving groove and have a size smaller than the receiving space. A second inner diameter of a first inner diameter of the groove. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該基座的材質擇自於不鏽鋼、金屬材料、塑膠材料及陶瓷材料所組成之群組。According to the chemical mechanical polishing and dressing device described in item 1 of the scope of patent application, the material of the base is selected from the group consisting of stainless steel, metal materials, plastic materials and ceramic materials. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該承載柱的材質擇自於不鏽鋼、金屬材料、塑膠材料及陶瓷材料所組成之群組。According to the chemical mechanical polishing and dressing device described in item 1 of the scope of the patent application, the material of the bearing column is selected from the group consisting of stainless steel, metal material, plastic material and ceramic material. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該研磨單元更包括一形成於該承載柱與該研磨顆粒之間且將該研磨顆粒固定於該承載柱上的結合層。The chemical mechanical polishing dresser according to item 1 of the patent application scope, wherein the polishing unit further includes a bonding layer formed between the bearing column and the grinding particles and fixing the grinding particles on the bearing column. 如申請專利範圍第8項所述之化學機械研磨修整器,其中該結合層的組成擇自於陶瓷材料、硬焊材料、電鍍材料、金屬材料及高分子材料所組成之群組。According to the chemical mechanical polishing and dressing device described in item 8 of the scope of patent application, the composition of the bonding layer is selected from the group consisting of ceramic materials, brazing materials, electroplating materials, metal materials, and polymer materials. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該突出高度為介於10μm至500μm之間。The chemical mechanical polishing dresser according to item 1 of the patent application range, wherein the protruding height is between 10 μm and 500 μm. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該調整單元遠離該承載柱的一端具有一卡槽,該卡槽的形狀擇自於六角狀、一字狀及十字狀所組成之群組。The chemical mechanical polishing dresser according to item 1 of the scope of patent application, wherein the end of the adjusting unit far from the bearing column has a card slot, and the shape of the card slot is selected from hexagonal, straight and cross shapes. Group. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該承載柱設置於該容置槽內,且該研磨顆粒受該彈性擋止件的阻擋而部分突出於該容置槽外。The chemical mechanical polishing dresser according to item 1 of the scope of the patent application, wherein the bearing column is disposed in the receiving groove, and the abrasive particles are partially protruded outside the receiving groove by being blocked by the elastic stopper. 如申請專利範圍第1項所述之化學機械研磨修整器,其中該突出高度小於該研磨顆粒的一高度。The chemical mechanical polishing dresser according to item 1 of the patent application scope, wherein the protruding height is less than a height of the abrasive particles.
TW105125283A 2016-08-09 2016-08-09 A chemical mechanical polishing dresser to adjust the height of the abrasive particles TWI590914B (en)

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