TW201803787A - 電子零件搬送裝置及電子零件檢查裝置 - Google Patents
電子零件搬送裝置及電子零件檢查裝置 Download PDFInfo
- Publication number
- TW201803787A TW201803787A TW106124856A TW106124856A TW201803787A TW 201803787 A TW201803787 A TW 201803787A TW 106124856 A TW106124856 A TW 106124856A TW 106124856 A TW106124856 A TW 106124856A TW 201803787 A TW201803787 A TW 201803787A
- Authority
- TW
- Taiwan
- Prior art keywords
- electronic component
- image
- section
- model image
- brightness
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 claims abstract description 50
- 238000007689 inspection Methods 0.000 claims description 95
- 238000012546 transfer Methods 0.000 claims description 62
- 238000012545 processing Methods 0.000 claims description 17
- 230000007246 mechanism Effects 0.000 description 23
- 238000011084 recovery Methods 0.000 description 21
- 238000000034 method Methods 0.000 description 20
- 230000008569 process Effects 0.000 description 19
- 238000004064 recycling Methods 0.000 description 16
- 238000005259 measurement Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 6
- 230000006870 function Effects 0.000 description 6
- 239000001301 oxygen Substances 0.000 description 6
- 229910052760 oxygen Inorganic materials 0.000 description 6
- 238000001816 cooling Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 239000000523 sample Substances 0.000 description 4
- 238000012937 correction Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 208000032544 Cicatrix Diseases 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 231100000241 scar Toxicity 0.000 description 2
- 230000037387 scars Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000007723 transport mechanism Effects 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
- B65G47/74—Feeding, transfer, or discharging devices of particular kinds or types
- B65G47/90—Devices for picking-up and depositing articles or materials
- B65G47/91—Devices for picking-up and depositing articles or materials incorporating pneumatic, e.g. suction, grippers
- B65G47/912—Devices for picking-up and depositing articles or materials incorporating pneumatic, e.g. suction, grippers provided with drive systems with rectilinear movements only
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016148118A JP6759809B2 (ja) | 2016-07-28 | 2016-07-28 | 電子部品搬送装置及び電子部品検査装置 |
| JP??2016-148118 | 2016-07-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201803787A true TW201803787A (zh) | 2018-02-01 |
Family
ID=61081820
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW106124856A TW201803787A (zh) | 2016-07-28 | 2017-07-25 | 電子零件搬送裝置及電子零件檢查裝置 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP6759809B2 (enExample) |
| CN (1) | CN107661867B (enExample) |
| TW (1) | TW201803787A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113820576B (zh) * | 2020-06-17 | 2023-11-14 | Tcl科技集团股份有限公司 | 测试发光二极管器件的方法及装置 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62274379A (ja) * | 1986-05-22 | 1987-11-28 | Kubota Ltd | 果実認識用の画像処理装置 |
| JP3528184B2 (ja) * | 1991-10-31 | 2004-05-17 | ソニー株式会社 | 画像信号の輝度補正装置及び輝度補正方法 |
| JP4111613B2 (ja) * | 1998-12-16 | 2008-07-02 | 富士通株式会社 | 半導体検査方法及び装置 |
| JP2001125535A (ja) * | 1999-10-29 | 2001-05-11 | Fujitsu General Ltd | 画質補正回路 |
| JP2001067478A (ja) * | 1999-08-30 | 2001-03-16 | Oki Electric Ind Co Ltd | 実装部品の検査装置および実装部品の検査方法 |
| JP5196731B2 (ja) * | 2006-04-20 | 2013-05-15 | キヤノン株式会社 | 画像処理装置及び画像処理方法 |
| JP2010060810A (ja) * | 2008-09-03 | 2010-03-18 | Samsung Digital Imaging Co Ltd | 撮像装置及び撮像方法 |
| JP5861462B2 (ja) * | 2012-01-17 | 2016-02-16 | オムロン株式会社 | はんだ検査のための検査基準登録方法およびその方法を用いた基板検査装置 |
| JP6061488B2 (ja) * | 2012-04-26 | 2017-01-18 | キヤノン株式会社 | 画像処理装置及び画像処理方法 |
| JP6083140B2 (ja) * | 2012-07-20 | 2017-02-22 | セイコーエプソン株式会社 | 電子部品搬送装置および電子部品検査装置 |
| CN103458194B (zh) * | 2013-08-28 | 2017-02-22 | 中国科学院深圳先进技术研究院 | 分析数码影像曝光程度的方法、装置和一种数字成像系统 |
| CN104994306B (zh) * | 2015-06-29 | 2019-05-03 | 厦门美图之家科技有限公司 | 一种基于脸部亮度自动调整曝光度的摄像方法和摄像装置 |
| JP6140255B2 (ja) * | 2015-11-13 | 2017-05-31 | 株式会社キーエンス | 画像処理装置及び画像処理方法 |
-
2016
- 2016-07-28 JP JP2016148118A patent/JP6759809B2/ja active Active
-
2017
- 2017-07-25 TW TW106124856A patent/TW201803787A/zh unknown
- 2017-07-27 CN CN201710626908.7A patent/CN107661867B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP6759809B2 (ja) | 2020-09-23 |
| CN107661867B (zh) | 2020-04-14 |
| JP2018018304A (ja) | 2018-02-01 |
| CN107661867A (zh) | 2018-02-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6425755B2 (ja) | 基板の異物質検査方法 | |
| TWI699318B (zh) | 電子零件搬送裝置及電子零件檢查裝置 | |
| JP2018159705A (ja) | 自動光学検査システム及びその操作方法 | |
| US9140546B2 (en) | Apparatus and method for three dimensional inspection of wafer saw marks | |
| CN101924053A (zh) | 检测晶片的系统和方法 | |
| TW502111B (en) | Inspection method for foreign matters inside through hole | |
| TW201712325A (zh) | 電子零件搬送裝置及電子零件檢查裝置 | |
| TW201432252A (zh) | 基板之缺陷檢查方法、基板之缺陷檢查裝置、程式及電腦記憶媒體 | |
| CN111725095A (zh) | 电子零件输送装置及电子零件检查装置 | |
| TWI668793B (zh) | 電子零件搬送裝置及電子零件檢查裝置 | |
| KR20150068884A (ko) | 반도체 검사 방법, 반도체 검사 장치 및 반도체 제조 방법 | |
| TW201932793A (zh) | 電子零件搬送裝置及電子零件檢查裝置 | |
| JP2017015483A (ja) | 電子部品搬送装置および電子部品検査装置 | |
| JP6759809B2 (ja) | 電子部品搬送装置及び電子部品検査装置 | |
| JP2017015482A (ja) | 電子部品搬送装置および電子部品検査装置 | |
| TW201730550A (zh) | 檢查裝置 | |
| TW202012947A (zh) | 電子零件搬送裝置及電子零件檢查裝置 | |
| CN211927720U (zh) | 一种基于机器视觉的冲压件缺陷检测装置 | |
| JP2017015479A (ja) | 電子部品搬送装置および電子部品検査装置 | |
| JP2020118632A (ja) | 電子部品搬送装置の教示方法、電子部品搬送装置の教示プログラム、電子部品搬送装置、および電子部品検査装置 | |
| CN114332017A (zh) | 晶圆控片检测方法及装置 | |
| TWI684015B (zh) | 電子零件搬送裝置及電子零件檢查裝置 | |
| JP2006177760A (ja) | X線検査装置、x線検査方法およびx線検査プログラム | |
| JP5947168B2 (ja) | 外観検査装置、外観検査装置の制御方法およびプログラム | |
| JP2017015481A (ja) | 電子部品搬送装置および電子部品検査装置 |