TW201741675A - Bidirectional conductive pin, bidirectional conductive pattern module, and method of manufacturing the same - Google Patents

Bidirectional conductive pin, bidirectional conductive pattern module, and method of manufacturing the same Download PDF

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TW201741675A
TW201741675A TW105136363A TW105136363A TW201741675A TW 201741675 A TW201741675 A TW 201741675A TW 105136363 A TW105136363 A TW 105136363A TW 105136363 A TW105136363 A TW 105136363A TW 201741675 A TW201741675 A TW 201741675A
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model
contact member
upper contact
lower contact
conductive
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TW105136363A
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TWI635283B (en
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文海中
李恩妵
李志炯
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一諾環球股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The present invention relates to a bidirectional conductive pin, a bidirectional conductive pattern module, and a method of manufacturing the same. The bidirectional conductive pin includes: an upper contact part formed by spirally winding a conductive thin plate about a vertical axis, and elastically supporting a terminal of a semiconductor device; a lower contact part formed by spirally winding a conductive thin plate about a vertical axis and elastically supporting a terminal of an inspection circuit substrate; and at least one connection part electrically connecting the upper contact part and the lower contact part. Accordingly, the bidirectional conductive pin may be obtained by pattering the conductive thin plate, forming the upper contact part and the lower contact part respectively having the spiral shape by winding the patterned thin plate, and winding the connection part in a circumferential direction to have a twisted form.

Description

雙向導電觸針、雙向導電模型模組及其製造方法Bidirectional conductive contact pin, bidirectional conductive model module and manufacturing method thereof

本發明有關一種雙向導電觸針。更具體地,本發明有關一雙向導電觸針、一雙向導電模型(Pattern)模組及其製造方法,其能夠利用彈簧針(Pogo-pin)來彌補習知半導體測試插座的弱點。The invention relates to a bidirectional conductive stylus. More specifically, the present invention relates to a bidirectional conductive stylus, a bidirectional conductive pattern module, and a method of fabricating the same that can utilize a Pogo-pin to compensate for weaknesses of conventional semiconductor test sockets.

本申請案主張2016年6月2日申請的第10-2016-0066293號韓國專利申請案與2016年10月18日申請的第10-2016-0134778號韓國專利申請案的優先權,其整個內容在此併入本文供參考。The present application claims the priority of Korean Patent Application No. 10-2016-0066293, filed on Jun. 2, 2016, and the Korean Patent Application No. 10-2016-0134778, filed on This is incorporated herein by reference.

在製造半導體裝置後,執行檢驗程序以判斷半導體裝置的電性能。當半導體測試插座(或接觸器或連接器)插入半導體裝置與檢驗電路基板間以於其間電連接時,執行半導體裝置的檢驗程序。當製造半導體裝置時,除了半導體裝置的最終電性能測試之外,半導體測試插座亦用於預燒(Burn-in)測試。After the semiconductor device is fabricated, an inspection process is performed to determine the electrical performance of the semiconductor device. When a semiconductor test socket (or contactor or connector) is inserted between the semiconductor device and the inspection circuit substrate for electrical connection therebetween, the inspection procedure of the semiconductor device is performed. When manufacturing a semiconductor device, in addition to the final electrical performance test of the semiconductor device, the semiconductor test socket is also used for a burn-in test.

隨著積體半導體技術的發展,半導體裝置變得愈小,因此半導體裝置的端子亦變得愈小,換句話說,半導體裝置中導線的尺寸與間隔變得愈小。因此,測試插座的導電模型間的間隔亦減小尺寸。With the development of integrated semiconductor technology, the semiconductor device becomes smaller, and therefore the terminal of the semiconductor device becomes smaller, in other words, the size and interval of the wires in the semiconductor device become smaller. Therefore, the spacing between the conductive models of the test socket is also reduced in size.

不過,對於利用彈簧針的習知半導體測試插座以開發能夠處理積體半導體裝置的半導體測試插座存在限制。圖1至圖3為顯示在第10-2011-0065047號韓國專利申請公開案中揭露利用彈簧針之習知半導體測試插座的實例之圖式。However, there are limitations to developing semiconductor test sockets that utilize spring pins to develop semiconductor test sockets that can process integrated semiconductor devices. FIG. 1 to FIG. 3 are diagrams showing an example of a conventional semiconductor test socket using a spring pin disclosed in Korean Patent Application Publication No. 10-2011-0065.

請即參考圖1至圖3,習知半導體測試插座(100)包括一殼體(110),其中一通孔(111)在垂直方向形成,並在對應於半導體裝置(130)的端子(131)的位置處,且一彈簧針(120)設置在通孔(111)內部,並電連接半導體裝置(130)的端子(131)與測試裝置(130)的觸墊(141)。Referring to FIG. 1 to FIG. 3, the conventional semiconductor test socket (100) includes a casing (110) in which a through hole (111) is formed in a vertical direction and corresponds to a terminal (131) of the semiconductor device (130). The position of the spring pin (120) is disposed inside the through hole (111) and electrically connects the terminal (131) of the semiconductor device (130) with the contact pad (141) of the test device (130).

彈簧針(120)構成包括:一筒體(124),其具有圓柱狀並當作觸針體使用;一觸尖部(123),其形成在筒體(124)的下部;一彈簧(122),其設置在筒體(124)內部,並連接該觸尖部(123)且能夠伸張與收縮;及一觸針(121),其連接彈簧(122)的相對側,該彈簧連接該觸尖部(123),且當接觸半導體裝置(130)的端子(131)時便垂直移動。The pogo pin (120) is configured to include a barrel (124) having a cylindrical shape and used as a stylus body; a tip portion (123) formed at a lower portion of the barrel (124); a spring (122) ), disposed inside the barrel (124) and connected to the tip portion (123) and capable of stretching and contracting; and a stylus (121) connected to the opposite side of the spring (122), the spring connecting the contact The tip (123) moves vertically when it contacts the terminal (131) of the semiconductor device (130).

在此,彈簧(122)通過收縮與伸張來吸收施加於觸針(121)與觸尖部(123)的機械衝擊,並電連接半導體裝置(130)的端子(131)與測試裝置(140)的觸墊(141),使得執行半導體裝置(130)的電測試。Here, the spring (122) absorbs mechanical shock applied to the stylus (121) and the tip portion (123) by contraction and extension, and electrically connects the terminal (131) of the semiconductor device (130) with the test device (140). The contact pads (141) enable electrical testing of the semiconductor device (130).

利用前述彈簧針的習知半導體測試插座使用一彈簧保持垂直方向的彈性。不過,彈簧設置在筒體內部,且筒體插入孔中。因此,製造此測試插座的製程變得複雜,且複雜製程亦增加製造成本。A conventional semiconductor test socket using the aforementioned spring pin uses a spring to maintain elasticity in the vertical direction. However, the spring is disposed inside the cylinder and the barrel is inserted into the hole. Therefore, the process of manufacturing this test socket becomes complicated, and the complicated process also increases the manufacturing cost.

此外,存在限制實體實施在垂直方向具有彈性的電氣建構的精密間距。此外,習知的半導體測試插座已達限制應用於最近開發的積體半導體裝置。In addition, there is a precise spacing that limits the physical implementation of the electrical construction that is resilient in the vertical direction. In addition, conventional semiconductor test sockets have been limited to use in recently developed integrated semiconductor devices.

為了克服利用彈簧針的習知半導體測試插座的限制,建議一種利用壓敏導電橡膠(PCR,Pressure Sensitive Conductive Rubber)插座的半導體測試插座,其中一穿孔模型是在垂直方向形成在矽膠體,該矽膠體是利用一彈性材料製成,且該穿孔模型填充導電粉末以形成一導電模型。In order to overcome the limitation of the conventional semiconductor test socket using the pogo pin, a semiconductor test socket using a Pressure Sensitive Conductive Rubber (PCR) socket is proposed, wherein a perforation model is formed in the vertical direction in the colloidal gel. The body is made of an elastic material, and the perforated model is filled with a conductive powder to form a conductive model.

不過,利用PCR插座的半導體測試插座亦有限制,其在於利用PCR插座的半導體測試插座中填充的導電粉末會分解,並降低產品壽命。However, semiconductor test sockets using PCR sockets are also limited in that the conductive powder filled in the semiconductor test socket using the PCR socket decomposes and reduces product life.

因此,需要能夠實施精密間距及解決高度限制或習知測試插座問題的半導體測試插座。Therefore, there is a need for semiconductor test sockets that are capable of implementing precise spacing and addressing height limitations or conventional test socket problems.

因此,本發明考慮在相關技術中出現的前述問題,且本發明是要提出一雙向導電觸針、一雙向導電模型模組及其製造方法,其能夠構利用彈簧針與PCR插座來彌補習知半導體測試插座的弱點。Therefore, the present invention contemplates the aforementioned problems occurring in the related art, and the present invention is to propose a bidirectional conductive stylus, a bidirectional conductive model module, and a manufacturing method thereof, which can utilize a pogo pin and a PCR socket to make up for the conventional knowledge. The weakness of semiconductor test sockets.

為了實現該目的,在一態樣,本發明提供一種雙向導電觸針,該雙向導電觸針包括:一上接觸部件,其當從頂部至底部方向接觸一半導體裝置的端子時,透過在垂直軸周圍螺旋捲繞一導電薄板、及彈性支撐該半導體裝置的該端子形成;一下接觸部件,其當從底部至頂部方向接觸一檢驗電路基板的端子時,透過在垂直軸周圍螺旋捲繞一導電薄板、及彈性支撐該檢驗電路基板的該端子形成;及至少一連接部件,其電連接該上接觸部件與該下接觸部件。In order to achieve the object, in one aspect, the present invention provides a bidirectional conductive stylus comprising: an upper contact member that transmits through a vertical axis when contacting a terminal of a semiconductor device from a top to a bottom direction Surrounding a spirally wound conductive sheet and the terminal for elastically supporting the semiconductor device; a lower contact member that spirally winds a conductive thin plate around the vertical axis when contacting a terminal of the test circuit substrate from the bottom to the top direction And the terminal for elastically supporting the inspection circuit substrate; and at least one connecting member electrically connecting the upper contact member and the lower contact member.

在本說明書中,該上接觸部件、該下接觸部件、與該連接部件可透過在垂直軸周圍螺旋捲繞一基座模型同時形成,且該基座模型可透過模型化一導電薄板形成。In the present specification, the upper contact member, the lower contact member, and the connecting member are formed by spirally winding a susceptor model around a vertical axis, and the pedestal model is formed by modeling a conductive sheet.

此外,該雙向導電觸針可更包括:一觸針體,其是利用一彈性絕緣材料製成,並設置在該上接觸部件與該下接觸部件間,且該連接部設置在該觸針體內部。In addition, the bidirectional conductive stylus may further include: a stylus body, which is made of an elastic insulating material and disposed between the upper contact member and the lower contact member, and the connecting portion is disposed in the stylus body unit.

此外,該雙向導電觸針可更包括:至少一內支撐部件,其從該上接觸部件延伸向該下接觸部件,使得該內支撐部件的下端與該下接觸部件隔開一預定距離。Furthermore, the bidirectional conductive stylus may further comprise: at least one inner support member extending from the upper contact member toward the lower contact member such that a lower end of the inner support member is spaced apart from the lower contact member by a predetermined distance.

此外,該上接觸部件在徑向向外成階梯狀,藉使該上接觸部件的徑向內部相對於其徑向外部向上伸出。Furthermore, the upper contact member is stepped radially outwards, whereby the radially inner portion of the upper contact member projects upwardly relative to its radially outer portion.

此外,該下接觸部件在徑向向外成階梯狀,藉使該下接觸部件的徑向內部相對於其徑向外部向下伸出。Furthermore, the lower contact member is stepped radially outwards, whereby the radially inner portion of the lower contact member projects downwardly relative to its radially outer portion.

此外,該連接部件構成在水平方向具有一預定寬度,並設置在該上接觸部件與該下接觸部件間,以在垂直方向支撐該上接觸部件與該下接觸部件。Further, the connecting member is formed to have a predetermined width in the horizontal direction and is disposed between the upper contact member and the lower contact member to support the upper contact member and the lower contact member in the vertical direction.

在另一態樣,本發明提供一種雙向導電模型模組,該模型模組包括:一絕緣體;複數個導電觸針,其設置在該絕緣體內部,使得該導電觸針在水平方向彼此隔開,且該導電觸針的上部件與下部件分別暴露在該絕緣體的上表面與下表面的外側,其中該等導電觸針之每一者包括:一上接觸部件,其當從頂部至底部方向接觸一半導體裝置的端子時,透過在垂直軸周圍螺旋捲繞一導電薄板、及彈性支撐該半導體裝置的該端子形成;一下接觸部件,其當從底部至頂部方向接觸一檢驗電路基板的端子時,透過在垂直軸周圍螺旋捲繞一導電薄板、及彈性支撐該檢驗電路基板的該端子形成;及至少一連接部件,其電連接該上接觸部件與該下接觸部件。In another aspect, the present invention provides a bidirectional conductive model module, the model module includes: an insulator; a plurality of conductive stylus pins disposed inside the insulator such that the conductive stylus are spaced apart from each other in a horizontal direction, And the upper part and the lower part of the conductive contact pin are respectively exposed on the outer side of the upper surface and the lower surface of the insulator, wherein each of the conductive contact pins comprises: an upper contact part, which contacts from the top to the bottom direction a terminal of a semiconductor device formed by spirally winding a conductive thin plate around a vertical axis and elastically supporting the terminal of the semiconductor device; and a lower contact member that contacts a terminal of the test circuit substrate from the bottom to the top direction, Formed by spirally winding a conductive sheet around the vertical axis and elastically supporting the terminal of the test circuit substrate; and at least one connecting member electrically connecting the upper contact member and the lower contact member.

在本說明書中,該導電觸針的該上接觸部件、該下接觸部件、與該連接部件可透過在垂直軸周圍螺旋捲繞一基座模型同時形成,且該基座模型可透過模型化一導電薄板形成。In the present specification, the upper contact member, the lower contact member, and the connecting member of the conductive contact pin are formed by spirally winding a susceptor model around a vertical axis, and the pedestal model can be modeled through A conductive thin plate is formed.

此外,該雙向導電模型模組可更包括:至少一內支撐部件,其從該上接觸部件延伸向該下接觸部件,使得該內支撐部件的下端與該下接觸部件隔開一預定距離。In addition, the two-way conductive model module may further include: at least one inner support member extending from the upper contact member toward the lower contact member such that a lower end of the inner support member is spaced apart from the lower contact member by a predetermined distance.

此外,該上接觸部件在徑向向外成階梯狀,藉使該上接觸部件的徑向內部相對於其徑向外部向上伸出。Furthermore, the upper contact member is stepped radially outwards, whereby the radially inner portion of the upper contact member projects upwardly relative to its radially outer portion.

此外,該下接觸部件在徑向向外成階梯狀,藉使該下接觸部件的徑向內部相對於其徑向外部向下伸出。Furthermore, the lower contact member is stepped radially outwards, whereby the radially inner portion of the lower contact member projects downwardly relative to its radially outer portion.

此外,該連接部件構成在水平方向具有一預定寬度,並設置在該上接觸部件與該下接觸部間,以在垂直方向支撐該上接觸部件與該下接觸部件。Further, the connecting member is formed to have a predetermined width in the horizontal direction and is disposed between the upper contact member and the lower contact portion to support the upper contact member and the lower contact member in the vertical direction.

在另一態樣,本發明提供一種製造雙向導電模型模組的方法,該方法包括:(a)透過模型化一導電薄板形成一基座模型,該基座模型包括:複數個上接觸模型,其在水平方向彼此隔開;複數個下接觸模型,其在水平方向彼此隔開,且在垂直方向隔開複數個上接觸模型;及至少一連接模型,其連接該等上接觸模型之每一者與彼此面對的該等下接觸模型之相關一者;(b)化學鍍該基座模型;(c)在垂直軸周圍捲繞該化學鍍基座模型,藉使分別形成具有螺旋狀的複數個上接觸部件與複數個下接觸部件;及一連接部件,其連接該等上接觸部件之每一者與該等彼此面對的下接觸部件之相關一者。In another aspect, the present invention provides a method of fabricating a bidirectional conductive model module, the method comprising: (a) forming a pedestal model by modeling a conductive sheet, the pedestal model comprising: a plurality of upper contact models, Separating from each other in a horizontal direction; a plurality of lower contact models spaced apart from each other in a horizontal direction and spaced apart from the plurality of upper contact models in a vertical direction; and at least one connected model connecting each of the upper contact models Corresponding to one of the lower contact models facing each other; (b) electroless plating the susceptor model; (c) winding the electroless plated pedestal model around the vertical axis, so that they are respectively formed into a spiral shape a plurality of upper contact members and a plurality of lower contact members; and a connection member connecting one of the upper contact members and the lower contact members facing each other.

在本說明書中,該方法可更包括:(d)形成一絕緣體,其是利用一彈性絕緣材料製成,其中該連接部件設置在該絕緣體內部,使得該等上接觸部件的上表面與該等下接觸部件的下表面分別向上與向下暴露。In the present specification, the method may further include: (d) forming an insulator made of an elastic insulating material, wherein the connecting member is disposed inside the insulator such that upper surfaces of the upper contact members and the like The lower surfaces of the lower contact members are exposed upward and downward, respectively.

此外,在形成該基座模型中,該連接模型能以對角模型形成,其可對角連接該等上接觸模型之每一者與彼此面對的該等下接觸模型之相關一者。Moreover, in forming the pedestal model, the joint model can be formed in a diagonal model that diagonally connects each of the upper contact models to one of the lower contact models that face each other.

此外,在捲繞該基座模型中,該等上接觸模型之每一者與彼此面對的該等下接觸模型之相關一者捲繞在相同垂直軸周圍,因此一上接觸部件與一下接觸部件可在彼此面對位置處形成。Further, in winding the susceptor model, each of the upper contact models is wound around the same vertical axis with respect to one of the lower contact models facing each other, so that an upper contact member is in contact with the lower contact The components may be formed at positions facing each other.

此外,該方法可更包括:形成至少一內支撐模型,其當透過模型化該導電薄板形成該基座模型時,從該等上接觸模型伸出向該等下接觸模型;及形成一內支撐部件,其當捲繞該基座模型時,透過捲繞該內支撐模型,從該等上接觸部件之每一者延伸向該等下接觸部件之相關一者。In addition, the method may further include: forming at least one inner support model that protrudes from the upper contact model toward the lower contact model when forming the susceptor model by modeling the conductive thin plate; and forming an inner support member When the susceptor model is wound, it is extended from each of the upper contact members to a relevant one of the lower contact members by winding the inner support model.

此外,該等上接觸模型在水平方向或在垂直方向成階梯狀,因此該等上接觸部件之每一者可在徑向向外成階梯狀,藉使該上接觸部件的徑向內部相對於其徑向外部向上伸出。Furthermore, the upper contact models are stepped in the horizontal direction or in the vertical direction, so that each of the upper contact members can be stepped radially outward, whereby the radially inner portion of the upper contact member is relative to Its radially outer portion projects upward.

此外,該等下接觸模型在水平方向或在垂直方向成階梯狀,因此該等下接觸部件之每一者可在徑向向外成階梯狀,藉使該上接觸部件的徑向內部相對於其徑向外部向下伸出。Furthermore, the lower contact models are stepped in the horizontal direction or in the vertical direction, so that each of the lower contact members can be stepped radially outward, whereby the radially inner portion of the upper contact member is opposed to Its radially outer portion projects downward.

此外,該連接部件構成在水平方向具有一預定寬度,並設置在該等上接觸部件之每一者與該等下接觸部件之相關一者間,以在垂直方向支撐該上接觸部件與該下接觸部件。Further, the connecting member is formed to have a predetermined width in the horizontal direction, and is disposed between each of the upper contact members and the associated one of the lower contact members to support the upper contact member and the lower portion in the vertical direction Contact parts.

在仍然另一態樣,本發明提供一種製造雙向導電觸針的方法,該方法包括:根據製造該雙向導電模型模組的方法以製造一雙向導電模型模組;及透過在垂直方向切割該雙向導電模型模組的絕緣體以形成複數個雙向導電觸針,藉使該等雙向導電觸針之每一者的一上接觸部件、一下接觸部件、與一連接部件彼此連接。In still another aspect, the present invention provides a method of fabricating a bidirectional conductive stylus, the method comprising: fabricating a bidirectional conductive model module according to a method of fabricating the bidirectional conductive model module; and cutting the bidirectional direction in a vertical direction The insulator of the conductive model module is formed to form a plurality of bidirectional conductive contact pins, such that an upper contact member, a lower contact member, and a connecting member of each of the bidirectional conductive contact pins are connected to each other.

根據利用前述建構構成的本發明,該雙向導電觸針是透過以下方式獲得:模型化該導電薄板;利用諸如模製成型製程之方法,透過捲繞該模型化薄板,分別形成具有該螺旋狀的該上接觸部件與該下接觸部件;及在圓周方向捲繞該連接部件以具有歪曲狀。因此,該雙向導電觸針在垂直方向具有彈性。According to the invention constructed using the foregoing construction, the bidirectional conductive stylus is obtained by modeling the conductive thin plate; forming the spiral shape by winding the patterned thin plate by a method such as a molding process The upper contact member and the lower contact member; and the connecting member is wound in a circumferential direction to have a curved shape. Therefore, the bidirectional conductive stylus has elasticity in the vertical direction.

此外,當具有螺旋狀的該上接觸部件接觸一半導體裝置的端子時,例如,一球體,該球體從該螺旋狀的內部至其外部順序接觸該上接觸部件。因此,可獲得穩定接觸,且當脫離球體時,穩定復原該上接觸部件。Further, when the upper contact member having a spiral shape contacts a terminal of a semiconductor device, for example, a ball which sequentially contacts the upper contact member from the inside of the spiral to the outside thereof. Therefore, stable contact can be obtained, and when the ball is detached from the sphere, the upper contact member is stably restored.

此外,由於透過利用一蝕刻製程、一貼印(Stamping)方法、或一模製成型製程等等使該金屬薄板模型化成圓柱狀,使得簡化製程,且因此亦降低其製造成本。In addition, since the metal thin plate is modeled into a cylindrical shape by using an etching process, a stamping method, a molding process, or the like, the process is simplified, and thus the manufacturing cost thereof is also reduced.

此外,可製造其中透過在深度方向製造及配置該等雙向導電模型模組以在水平與深度方向形成複數個導電模型之半導體測試插座。In addition, a semiconductor test socket in which a plurality of conductive models are formed in the horizontal and depth directions by manufacturing and arranging the two-way conductive model modules in the depth direction can be fabricated.

在以下的說明書中,將參考附圖詳細描述本發明的較佳具體實施例。In the following description, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

圖4a至4c為說明根據本發明之一具體實施例之形成雙向導電觸針的原理之圖式。請即參考圖4a至4c,根據本發明的雙向導電觸針(10)包括一上接觸部件(11)、一下接觸部件(12)、與一連接部件(13)。此外,雙向導電觸針(10)可更包括一觸針體(14)。4a through 4c are diagrams illustrating the principle of forming a bidirectional conductive stylus in accordance with an embodiment of the present invention. 4a to 4c, the bidirectional conductive contact pin (10) according to the present invention includes an upper contact member (11), a lower contact member (12), and a connecting member (13). In addition, the bidirectional conductive contact pin (10) may further include a stylus body (14).

根據圖4a所示的本發明之雙向導電觸針(10)是利用一基座模型(100a)製造,其透過模型化一導電薄板(例如,一金屬薄板)形成。如圖4a所示,基座模型(100a)包括一上接觸模型(11a);一下接觸模型(12a);及至少一連接模型(13a),其連接該上接觸模型(11a)與該下接觸模型(12a)。The bidirectional conductive contact pin (10) of the present invention as shown in Figure 4a is fabricated using a susceptor model (100a) formed by modeling a conductive sheet (e.g., a sheet of metal). As shown in FIG. 4a, the susceptor model (100a) includes an upper contact model (11a); a lower contact model (12a); and at least one connection model (13a) connecting the upper contact model (11a) to the lower contact. Model (12a).

當基座模型(100a)的上接觸模型(11a)與下接觸模型(12a)捲繞在垂直軸周圍兩次以上而分別形成如圖4c所示的螺旋狀時,則形成根據本發明之雙向導電觸針(10)的上接觸部件(11)與下接觸部件(12)。When the upper contact model (11a) and the lower contact model (12a) of the susceptor model (100a) are wound twice or more around the vertical axis to form a spiral shape as shown in FIG. 4c, respectively, the two-way according to the present invention is formed. The upper contact member (11) and the lower contact member (12) of the conductive contact pin (10).

在本說明書中,如圖4a所示,在本發明中,連接模型(13a)是採取一對角線模型形成,其對角連接彼此面對的上接觸模型(11a)與下接觸模型(12a)。然後,上接觸模型(11a)與下接觸模型(12a)螺旋捲繞在垂直軸周圍,且連接模型(13a)亦螺旋捲繞上接觸模型(11a)與下接觸模型(12a)。因此,連接部件(13a)形成一歪曲狀,如圖4b所示。In the present specification, as shown in FIG. 4a, in the present invention, the connection model (13a) is formed by adopting a pair of diagonal lines, which diagonally connect the upper contact model (11a) and the lower contact model (12a) facing each other. ). Then, the upper contact model (11a) and the lower contact model (12a) are spirally wound around the vertical axis, and the connection model (13a) also spirally winds the upper contact model (11a) and the lower contact model (12a). Therefore, the connecting member (13a) is formed in a meander shape as shown in Fig. 4b.

當半導體裝置的端子(例如,一球體)從頂部至底部方向接觸具有螺旋狀的上接觸部件(11)時,如圖4c所示,將先接觸上接觸部件(11)的螺旋狀部分(①),且上接觸部件(11)向下移。球體透過順序接觸螺旋狀部分(②、③)以彈性接觸上接觸部件(11)。當脫離球體時,則復原上接觸部件(11)。換句話說,當球體從頂部至底部方向接觸時,上接觸部件(11)彈性支撐球體。When the terminal (for example, a ball) of the semiconductor device contacts the spiral upper contact member (11) from the top to the bottom direction, as shown in FIG. 4c, the spiral portion of the upper contact member (11) will be contacted first (1). ), and the upper contact member (11) moves downward. The spheres are in contact with the spiral portions (2, 3) in order to elastically contact the upper contact members (11). When the ball is disengaged, the upper contact member (11) is restored. In other words, the upper contact member (11) elastically supports the ball when the ball contacts from the top to the bottom.

同樣的,當檢驗電路基板的端子從底部至頂部方向接觸具有螺旋狀的下接觸部件(12)時,端子從徑向內部至徑向外部以順序接觸下接觸部件(12)。因此,當端子從底部至頂部方向接觸時,下接觸部件(12)則彈性支撐檢驗電路基板的端子。Also, when the terminal of the test circuit substrate contacts the spiral lower contact member (12) from the bottom to the top direction, the terminal sequentially contacts the lower contact member (12) from the radially inner portion to the radially outer portion. Therefore, when the terminal is contacted from the bottom to the top direction, the lower contact member (12) elastically supports the terminal of the inspection circuit substrate.

因此,一導電線路是透過連接部件(13)來電連接上接觸部件(11)與下接觸部件(12)形成。因此,雙向導電觸針(10)可用於檢驗半導體裝置。Therefore, a conductive line is formed by electrically connecting the upper contact member (11) and the lower contact member (12) through the connecting member (13). Therefore, the bidirectional conductive contact pin (10) can be used to inspect the semiconductor device.

在本說明書中,觸針體(14)設置在上接觸部件(11)與下接觸部件(12)間,其連接部件(13)是設置在觸針體內部。觸針體(14)在垂直方向支撐上接觸部件(11)與下接觸部件(12)。在本說明書中,在本具體實施例,觸針體(14)是利用一彈性絕緣材料製成,例如,矽膠。In the present specification, the stylus body (14) is disposed between the upper contact member (11) and the lower contact member (12), and the connecting member (13) is disposed inside the stylus body. The stylus body (14) supports the upper contact member (11) and the lower contact member (12) in the vertical direction. In the present specification, in the present embodiment, the stylus body (14) is made of an elastic insulating material such as silicone.

在以下的本說明書中,請即參考圖5a至5c、6a和6b,將詳細描述製造根據本發明之雙向導電模型模組(100)與雙向導電觸針(10)的方法。In the following description, referring to Figures 5a to 5c, 6a and 6b, a method of manufacturing the bidirectional conductive model module (100) and the bidirectional conductive contact pin (10) according to the present invention will be described in detail.

請即參考圖5a至5c、6a和6b,首先,一金屬薄板是經配置及模型化以形成一基座模型(100a),如圖5a所示。在本說明書中,金屬薄板可利用導電材料製成,不過,薄板可透過執行稍後將描述的模型化製程而具有導電性,因此其不必使用具有導電材料的薄板。在本說明書中,金屬薄板可利用銅或銅合金製成,諸如鈹銅合金(beryllium copper,BeCu)。在本說明書中,本發明使用一蝕刻方法或一貼印方法,當作模型化金屬薄板的方法。Referring now to Figures 5a through 5c, 6a and 6b, first, a sheet of metal is configured and modeled to form a pedestal model (100a), as shown in Figure 5a. In the present specification, the metal thin plate can be made of a conductive material, but the thin plate can be made conductive by performing a modeling process which will be described later, so that it is not necessary to use a thin plate having a conductive material. In the present specification, the metal thin plate may be made of copper or a copper alloy such as beryllium copper (BeCu). In the present specification, the present invention uses an etching method or a printing method as a method of modeling a metal sheet.

請即參考圖5a,透過模型化一金屬薄板形成的一基座模型(100a)包括複數個上接觸模型(11a);複數個下接觸模型(12a);及一連接模型(13a),其連接該等上接觸模型(11a)之每一者、與彼此面對的該等下接觸模型(12a)之相關一者。在本說明書中,一單組顯示在圖4a,其係形成一雙向導電觸針(10),且由上接觸模型(11a)、下接觸模型(12a)、與連接模型(13a)構成。圖5a所示具體實施例的連接模型(13a)具有向水平方向彎曲的弧形狀。Referring to FIG. 5a, a susceptor model (100a) formed by modeling a thin metal plate includes a plurality of upper contact models (11a); a plurality of lower contact models (12a); and a connection model (13a) connected. Each of the upper contact models (11a) is associated with one of the lower contact models (12a) facing each other. In the present specification, a single group is shown in Fig. 4a, which forms a bidirectional conductive contact pin (10) and is composed of an upper contact model (11a), a lower contact model (12a), and a connection model (13a). The connection model (13a) of the embodiment shown in Fig. 5a has an arc shape curved in the horizontal direction.

複數個上接觸模型(11a)在水平方向彼此隔開形成。複數個下接觸模型(12a)在水平方向彼此隔開形成,且在垂直方向隔開複數個上接觸模型(11a)。A plurality of upper contact models (11a) are formed spaced apart from each other in the horizontal direction. A plurality of lower contact models (12a) are formed spaced apart from each other in the horizontal direction, and a plurality of upper contact models (11a) are spaced apart in the vertical direction.

在本說明書中,基座模型(100a)可包括:一上支撐模型(121),其連接上接觸模型(11a)與上連接模型(123)之每一者;及一下支撐模型(122),其連接下接觸模型(12a)與下連接模型(124)之每一者,使得可同時執行利用上接觸模型(11a)、下接觸模型(12a)、與連接模型(13a)的稍後製程。In the present specification, the pedestal model (100a) may include: an upper support model (121) connecting each of the upper contact model (11a) and the upper connection model (123); and a lower support model (122), It connects each of the lower contact model (12a) and the lower connection model (124) so that a later process using the upper contact model (11a), the lower contact model (12a), and the connected model (13a) can be simultaneously performed.

當完成前述的基座模型(100a)時,在基座模型(100a)進行化學鍍製程(Plating process)以改善導電性。在本發明中,在基座模型(100a)依序進行鍍鎳與鍍金。When the aforementioned susceptor model (100a) is completed, an electroplating process is performed on the susceptor model (100a) to improve conductivity. In the present invention, nickel plating and gold plating are sequentially performed on the susceptor model (100a).

在完成化學鍍製程後,如圖4c所示,基座模型(100a)捲繞在垂直軸周圍,使得該等上接觸模型(11a)之每一者與該等下接觸模型(12a)之每一者捲繞成螺旋狀。如圖5b所示,形成上接觸部件(11)、下接觸部件(12)、與連接部件(13)之每一者。在本說明書中,當螺旋捲繞上接觸模型(11a)與下接觸模型(12a)時,連接模型(13a)亦螺旋捲繞,因此使連接部件(13)形成歪曲狀。After the electroless plating process is completed, as shown in FIG. 4c, the susceptor model (100a) is wound around the vertical axis such that each of the upper contact models (11a) and each of the lower contact models (12a) One is wound into a spiral. As shown in Fig. 5b, each of the upper contact member (11), the lower contact member (12), and the connecting member (13) is formed. In the present specification, when the contact model (11a) and the lower contact model (12a) are spirally wound, the joint model (13a) is also spirally wound, thereby causing the connecting member (13) to be warped.

在本說明書中,彼此面對的該等上接觸模型(11a)與下接觸模型(12a)之相關一者是捲繞在相同垂直軸周圍,因此形成分別彼此面對的上接觸部件(11)與下接觸部件(12)。In the present specification, one of the upper contact models (11a) and the lower contact model (12a) facing each other is wound around the same vertical axis, thus forming upper contact members (11) facing each other, respectively. With the lower contact part (12).

如前述,當形成上接觸部件(11)、下接觸部件(12)、與連接部件(13)時,如圖5c所示,一絕緣體(110)形成在上接觸部件(11)與下接觸部件(12)間,使得該等上接觸部件(11)的每個上表面與該等下接觸部件(12)的每個下表面分別向上與向下暴露。在圖5c所示的實例,絕緣體(110)形成包括在其內部的連接部件(13),並覆蓋該等上接觸部件(11)的一部分下部件與該等下接觸部件(12)的一部分上部件。As described above, when the upper contact member (11), the lower contact member (12), and the connecting member (13) are formed, as shown in Fig. 5c, an insulator (110) is formed on the upper contact member (11) and the lower contact member. (12), such that each of the upper surfaces of the upper contact members (11) and each of the lower surfaces of the lower contact members (12) are exposed upward and downward, respectively. In the example shown in Figure 5c, the insulator (110) forms a connecting member (13) included therein and covers a portion of the lower member of the upper contact member (11) and a portion of the lower contact member (12) component.

在一具體實施例中,圖5b所示的基座模型(100a)是以模製成型設置,且液態矽膠注入模製成型中。絕緣體(110)是透過固化液態矽膠形成。因此,上接觸部件(11)的上表面與下接觸部件(12)的下表面暴露在絕緣體(110)的外部,且上接觸部件(11)、下接觸部件(12)的相對另一表面與連接部件(13)設置在絕緣體(110)內部。In a specific embodiment, the susceptor model (100a) shown in Figure 5b is in a molded configuration and is in a liquid silicone injection molding. The insulator (110) is formed by solidifying liquid silicone. Therefore, the upper surface of the upper contact member (11) and the lower surface of the lower contact member (12) are exposed to the outside of the insulator (110), and the opposite surface of the upper contact member (11) and the lower contact member (12) The connecting member (13) is disposed inside the insulator (110).

當透過利用前述製程以獲得絕緣體(110)時,透過利用一雷射切割方法,沿著圖5c所示的境界線(C1、C2)來切割上連接模型(123)與下連接模型(124),並獲得一雙向導電模型模組(100),如圖6a所示。When the insulator (110) is obtained by using the foregoing process, the upper connection model (123) and the lower connection model (124) are cut along the boundary line (C1, C2) shown in FIG. 5c by using a laser cutting method. And obtain a bidirectional conductive model module (100), as shown in Figure 6a.

請即參考圖6a,在雙向導電模型模組(100)中,在絕緣體(110)內部形成複數個雙向導電觸針(10),其中雙向導電觸針(10)在水平方向是彼此隔開。在本說明書中,複數個雙向導電觸針(10)之每一者形成包括一上接觸部件(11)、一下接觸部件(12)、與一連接部件(13)。此外,複數個雙向導電觸針(10)之每一者在垂直方向形成一雙向導電線。Referring to FIG. 6a, in the bidirectional conductive model module (100), a plurality of bidirectional conductive contact pins (10) are formed inside the insulator (110), wherein the bidirectional conductive contact pins (10) are spaced apart from each other in the horizontal direction. In the present specification, each of the plurality of bidirectional conductive contact pins (10) is formed to include an upper contact member (11), a lower contact member (12), and a connecting member (13). In addition, each of the plurality of bidirectional conductive contact pins (10) forms a bidirectional conductive line in a vertical direction.

此外,當在深度方向配置複數個雙向導電模型模組(100)時,可構成在水平與深度方向具有複數個導電模型的半導體測試插座。Further, when a plurality of bidirectional conductive model modules (100) are arranged in the depth direction, a semiconductor test socket having a plurality of conductive models in the horizontal and depth directions can be constructed.

此外,當透過利用一雷射切割方法沿著圖6a所示境界線(C3)來切割雙向導電模型模組(100)時,可獲得單個雙向導電觸針(10),如圖6b所示。殘留在上接觸部件(11)與下接觸部件(12)間的絕緣體(110)變成觸針體(14)。單個雙向導電觸針(10)可替代習知的彈簧針。Further, when the bidirectional conductive model module (100) is cut along the boundary line (C3) shown in Fig. 6a by a laser cutting method, a single bidirectional conductive stylus (10) can be obtained, as shown in Fig. 6b. The insulator (110) remaining between the upper contact member (11) and the lower contact member (12) becomes a stylus body (14). A single bidirectional conductive stylus (10) can be substituted for conventional pogo pins.

圖7a、7b、8a、8b、9、10a至10d、11a和11b為顯示根據本發明之基座模型(100a)的各種實例之圖式。根據本發明之技術概念的範疇如前所述,且圖7a、7b、8a、8b、9、10a至10d、11a和11b所示基座模型的各種實例、及其他修飾實例是在本發明的精神內。換句話說,除了本發明所示的實例以外,熟諳此技者可容易根據本發明的精神內的各修飾實例來製造一基座模型(100a)。Figures 7a, 7b, 8a, 8b, 9, 10a to 10d, 11a and 11b are diagrams showing various examples of a susceptor model (100a) in accordance with the present invention. The scope of the technical concept according to the present invention is as described above, and various examples of the susceptor model shown in FIGS. 7a, 7b, 8a, 8b, 9, 10a to 10d, 11a, and 11b, and other modified examples are in the present invention. Within the spirit. In other words, in addition to the examples shown in the present invention, a skilled person can easily fabricate a susceptor model (100a) in accordance with various modified examples within the spirit of the present invention.

在一具體實施例,圖10a至10d顯示根據上接觸模型(11a)與下接觸模型(12a)的形狀來改變的上接觸部件(11)與下接觸部件(12)的實例形狀。此外,在圖11a所示的實例中,當內支撐模型(15a)形成從上接觸模型(11a)延伸至下接觸模型(12a)時,則內支撐部件(15)形成在絕緣體(110)或觸針體(14)內部,如圖11b所示。在本說明書中,當形成其間模型化一導電薄板的基座模型(100a)時,內支撐模型(15a)可透過模型化一金屬薄板形成。In a specific embodiment, FIGS. 10a to 10d show example shapes of the upper contact member (11) and the lower contact member (12) which are changed according to the shapes of the upper contact model (11a) and the lower contact model (12a). Further, in the example shown in FIG. 11a, when the inner support model (15a) is formed to extend from the upper contact model (11a) to the lower contact model (12a), the inner support member (15) is formed in the insulator (110) or Inside the stylus body (14), as shown in Figure 11b. In the present specification, when forming a susceptor model (100a) in which a conductive sheet is modeled, the inner support model (15a) can be formed by modeling a metal sheet.

在以下的說明書中,將參考圖12a和12b描述根據本發明之另一具體實施例的雙向導電觸針(10')。In the following description, a bidirectional conductive contact pin (10') according to another embodiment of the present invention will be described with reference to Figs. 12a and 12b.

請即參考圖12a和12b,根據本發明之雙向導電觸針(10')包括一上接觸部件(11')、一下接觸部件(12')、與一連接部件(13')。此外,如前述具體實施例,雙向導電觸針(10')可包括一內支撐部件(15')與一觸針體(14)。Referring to Figures 12a and 12b, the bidirectional conductive stylus (10') according to the present invention includes an upper contact member (11'), a lower contact member (12'), and a connecting member (13'). Moreover, as in the previous embodiment, the bidirectional conductive stylus (10') can include an inner support member (15') and a stylus body (14).

在本說明書中,在圖12a和12b所示的具體實施例中,如圖12a所示,上接觸模型(11a')在水平方向成階梯狀。因此,當上接觸模型(11a')螺旋捲繞在垂直軸周圍形成上接觸部件(11')時,上接觸部件(11')的徑向內部會相對於其徑向外部向上伸出,如圖12b所示。換句話說,上接觸部件(11')在徑向向外成階梯狀。In the present specification, in the specific embodiment shown in Figs. 12a and 12b, as shown in Fig. 12a, the upper contact model (11a') is stepped in the horizontal direction. Therefore, when the upper contact mold (11a') is spirally wound around the vertical shaft to form the upper contact member (11'), the radially inner portion of the upper contact member (11') projects upward with respect to its radially outer portion, such as Figure 12b shows. In other words, the upper contact member (11') is stepped radially outward.

因此,當一半導體裝置的端子接觸上接觸部件(11')的上表面時,端子會先接觸該上接觸部件(11')的徑向內部,藉使上接觸部件(11')向下移。端子能夠透過另外接觸上接觸部件(11')的徑向外部以彈性及穩定接觸該上接觸部件(11')。Therefore, when the terminal of a semiconductor device contacts the upper surface of the upper contact member (11'), the terminal first contacts the radially inner portion of the upper contact member (11'), whereby the upper contact member (11') moves downward. . The terminal is capable of elastically and stably contacting the upper contact member (11') by additionally contacting the radially outer portion of the upper contact member (11').

在圖12a和12b所示的具體實施例中,上接觸模型(11a')是在水平方向成階梯狀。不過,在圖10b、10c和10d所示的具體實施例中,上接觸模型(11a')是在垂直方向成階梯狀,並可形成上接觸部件(11'),其中一徑向內部相對於一徑向外部向上伸出。In the particular embodiment illustrated in Figures 12a and 12b, the upper contact model (11a') is stepped in the horizontal direction. However, in the specific embodiment shown in Figures 10b, 10c and 10d, the upper contact model (11a') is stepped in the vertical direction and can form an upper contact member (11'), wherein a radially inner portion is opposite to A radially outer portion projects upward.

同樣的,如圖12a所示,下接觸模型(12a')在水平方向成階梯狀。因此,當下接觸部件(12')透過在垂直方向螺旋捲繞該下接觸模型形成,以形成該下接觸部件(12')時,形成下接觸部件(12'),其中下接觸部件(12')的徑向內部相對於其徑向外部向下伸出。換句話說,如圖12b所示,下接觸部件(12')在徑向向外成階梯狀。Similarly, as shown in Fig. 12a, the lower contact model (12a') is stepped in the horizontal direction. Therefore, when the lower contact member (12') is formed by spirally winding the lower contact mold in the vertical direction to form the lower contact member (12'), the lower contact member (12') is formed, wherein the lower contact member (12') The radially inner portion projects downward with respect to its radially outer portion. In other words, as shown in Fig. 12b, the lower contact member (12') is stepped radially outward.

因此,當一檢驗電路基板的端子接觸下接觸部件(12')的下表面時,端子會先接觸下接觸部件(12')的徑向內部,且下接觸部件(12')向上移。端子能夠透過另外接觸下接觸部件(12')的徑向外部以彈性及穩定接觸下接觸部件(12')。Therefore, when the terminal of the inspection circuit substrate contacts the lower surface of the lower contact member (12'), the terminal first contacts the radially inner portion of the lower contact member (12'), and the lower contact member (12') moves upward. The terminal is capable of elastically and stably contacting the lower contact member (12') by additionally contacting the radially outer portion of the lower contact member (12').

在圖12a和12b所示的具體實施例中,下接觸模型(12a')在水平方向成階梯狀。不過,在圖10b、10c和10d所示的具體實施例中,下接觸模型(12a')在垂直方向成階梯狀,且下接觸部件(12'),其中下接觸部件(12')的徑向內部是相對於其徑向外部向下伸出。In the particular embodiment illustrated in Figures 12a and 12b, the lower contact model (12a') is stepped in the horizontal direction. However, in the specific embodiment shown in Figures 10b, 10c and 10d, the lower contact model (12a') is stepped in the vertical direction and the lower contact member (12'), wherein the diameter of the lower contact member (12') The inside is extended downward with respect to its radially outer portion.

在以下的說明書中,將參考圖13a和13b描述根據本發明之另一具體實施例的雙向導電觸針(10¢¢)。In the following description, a bidirectional conductive contact pin (10A) according to another embodiment of the present invention will be described with reference to Figs. 13a and 13b.

請即參考圖13a和13b,根據本發明的雙向導電觸針(10¢¢)包括一上接觸部件(11¢¢)、一下接觸部件(12¢¢)、與一連接部件(13¢¢)。圖13a和13b所示的具體實施例不包括一內支撐部件(15')。Referring to Figures 13a and 13b, the bidirectional conductive contact pin (10A) according to the present invention comprises an upper contact member (11¢¢), a lower contact member (12¢¢), and a connecting member (13¢¢). . The embodiment shown in Figures 13a and 13b does not include an inner support member (15').

此外,在圖13a和13b所示的具體實施例中,雙向導電觸針(10¢¢)不包括一觸針體(14)。連接部件(13¢¢)設置在上接觸部件(11¢¢)與下接觸部件(12)間,以支撐上接觸部件(11¢¢)與下接觸部件(12¢¢)。在圖13a和13b所示的具體實施例中,一連接模型(13a¢¢)在水平方向形成具有一預定寬度,如圖13a所示,且當一上接觸模型(11a¢¢)與一下接觸模型(12a¢¢)螺旋捲繞在垂直軸周圍時,亦捲繞連接模型(13a')。在本說明書中,連接部件(13¢¢)是由連接模型(13a¢¢)形成一圓柱狀,如圖13b所示,且在垂直方向支撐上接觸部件(11¢¢)與下接觸部件(12¢¢)。Moreover, in the particular embodiment illustrated in Figures 13a and 13b, the bidirectional conductive stylus (10A) does not include a stylus body (14). A connecting member (13¢¢) is disposed between the upper contact member (11¢¢) and the lower contact member (12) to support the upper contact member (11¢¢) and the lower contact member (12¢¢). In the embodiment shown in Figures 13a and 13b, a connection model (13a) is formed in the horizontal direction to have a predetermined width, as shown in Figure 13a, and when an upper contact model (11a) is in contact with When the model (12a¢¢) is spirally wound around the vertical axis, the connection model (13a') is also wound. In the present specification, the connecting member (13¢¢) is formed in a cylindrical shape by the connection model (13a¢¢) as shown in FIG. 13b, and supports the upper contact member (11¢¢) and the lower contact member in the vertical direction ( 12¢¢).

在本說明書中,連接模型(13a¢¢)的水平寬度可為能夠形成圓柱狀或形成一部分圓柱狀的寬度。In the present specification, the horizontal width of the connection model (13a¢¢) may be a width capable of forming a cylindrical shape or forming a part of a cylindrical shape.

儘管為了示意之目的已說明本發明的較佳具體實施例,不過熟諳此技者應明白,可進行各種修飾、添加與替換,不致悖離如文後申請專利範圍所述本發明的範疇與精神。因此,示範性具體實施例只是說明而不是限制。本發明的範疇如文後「申請專利範圍」的內容所述,而不是如「詳細說明」的內容所述,且申請專利範圍的含義、範疇與等同專利項的所有變更或修飾都應包括在本發明的範疇內。Although the preferred embodiment of the present invention has been described for the purpose of illustration, it is understood that the various modifications, additions and substitutions may be made without departing from the scope and spirit of the invention. . Accordingly, the exemplary embodiments are merely illustrative and not limiting. The scope of the present invention is as described in the following "the scope of the patent application", and is not described in the "detailed description", and all changes or modifications of the meaning, scope and equivalent patents of the scope of the patent application should be included in Within the scope of the invention.

①‧‧‧螺旋狀部分
②‧‧‧螺旋狀部分
③‧‧‧螺旋狀部分
10‧‧‧雙向導電觸針
10¢‧‧‧雙向導電觸針
10¢¢‧‧‧雙向導電觸針
11‧‧‧上接觸部件
11¢‧‧‧上接觸部件
11¢¢‧‧‧上接觸部件
11a‧‧‧上接觸模型
11a¢‧‧‧上接觸模型
11a¢¢‧‧‧上接觸模型
12‧‧‧下接觸部件
12¢‧‧‧下接觸部件
12¢¢‧‧‧下接觸部件
12a‧‧‧下接觸模型
12a¢‧‧‧下接觸模型
12a¢¢‧‧‧下接觸模型
13‧‧‧連接部件
13¢‧‧‧連接部件
13¢¢‧‧‧連接部件
13a‧‧‧連接模型
13a¢‧‧‧連接模型
13a¢¢‧‧‧連接模型
14‧‧‧觸針體
15‧‧‧內支撐部件
15¢‧‧‧內支撐部件
15a‧‧‧內支撐模型
100‧‧‧雙向導電模型模組
100a‧‧‧基座模型
110‧‧‧絕緣體
111‧‧‧通孔
120‧‧‧彈簧針
121‧‧‧上支撐模型
122‧‧‧下支撐模型
123‧‧‧上連接模型
124‧‧‧下連接模型
130‧‧‧半導體裝置
131‧‧‧端子
140‧‧‧測試裝置
141‧‧‧觸墊
C1‧‧‧境界線
C2‧‧‧境界線
C3‧‧‧境界線
1‧‧‧Spiral part 2‧‧‧ helical part 3‧‧‧ helical part
10‧‧‧Two-way conductive stylus
10¢‧‧‧Two-way conductive stylus
10¢¢‧‧‧Two-way conductive stylus
11‧‧‧Upper contact parts
11¢‧‧‧Upper contact parts
11¢¢‧‧‧Upper contact parts
11a‧‧‧Contact model
11a¢‧‧‧Contact Model
11a¢¢‧‧‧Contact Model
12‧‧‧ Lower contact parts
12¢‧‧‧Contact parts
12¢¢‧‧‧Contact parts
12a‧‧‧ contact model
12a¢‧‧‧ contact model
12a¢¢‧‧‧ contact model
13‧‧‧Connecting parts
13¢‧‧‧Connecting parts
13¢¢‧‧‧Connecting parts
13a‧‧‧Connection model
13a¢‧‧‧connection model
13a¢¢‧‧‧connection model
14‧‧‧ stylus body
15‧‧‧ Inner support parts
15¢‧‧‧ Inner support parts
15a‧‧‧ internal support model
100‧‧‧Two-way conductive model module
100a‧‧‧Base model
110‧‧‧Insulator
111‧‧‧through hole
120‧‧ ‧ spring needle
121‧‧‧Upper support model
122‧‧‧lower support model
123‧‧‧Uplink model
124‧‧‧Connected model
130‧‧‧Semiconductor device
131‧‧‧terminal
140‧‧‧Testing device
141‧‧‧Touch pads
C1‧‧ ‧ boundary line
C2‧‧‧ boundary line
C3‧‧ ‧ boundary line

本發明的前述及其他目的、特徵與其他優點可從下面連同附圖的詳細描述變得更清楚瞭解,其中: 圖1至圖3為顯示利用彈簧針的習知半導體測試插座之圖式; 圖4a、4b和4c為說明根據本發明之一具體實施例之形成雙向導電觸針的原理之圖式; 圖5a至5c、6a和6b為說明根據本發明之製造雙向導電觸針與雙向導電模型模組的方法之圖式。 圖7a、7b、8a、8b、9、10a至10d、11a和11b為顯示根據本發明之基座模型的各種實例之圖式;及 圖12a、12b、13a和13b為顯示根據本發明之另一具體實施例之雙向導電觸針的實例之圖式。The above and other objects, features, and other advantages of the present invention will become more apparent from 4a, 4b, and 4c are diagrams illustrating the principle of forming a bidirectional conductive stylus in accordance with an embodiment of the present invention; Figures 5a through 5c, 6a and 6b illustrate the fabrication of a bidirectional conductive stylus and a bidirectional conductive model in accordance with the present invention. A diagram of the method of the module. Figures 7a, 7b, 8a, 8b, 9, 10a to 10d, 11a and 11b are diagrams showing various examples of a susceptor model in accordance with the present invention; and Figures 12a, 12b, 13a and 13b are diagrams showing another embodiment in accordance with the present invention. A diagram of an example of a bidirectional conductive stylus of a particular embodiment.

①‧‧‧螺旋狀部分 1‧‧‧Spiral part

②‧‧‧螺旋狀部分 2‧‧‧Spiral part

③‧‧‧螺旋狀部分 3‧‧‧ spiral part

10‧‧‧雙向導電觸針 10‧‧‧Two-way conductive stylus

11‧‧‧上接觸部件 11‧‧‧Upper contact parts

11a‧‧‧上接觸模型 11a‧‧‧Contact model

12‧‧‧下接觸部件 12‧‧‧ Lower contact parts

12a‧‧‧下接觸模型 12a‧‧‧ contact model

13‧‧‧連接部件 13‧‧‧Connecting parts

13a‧‧‧連接模型 13a‧‧‧Connection model

14‧‧‧觸針體 14‧‧‧ stylus body

100a‧‧‧基座模型 100a‧‧‧Base model

Claims (22)

一種雙向導電觸針,包括: 一上接觸部件,其透過在垂直軸周圍螺旋捲繞一導電薄板形成,且當從頂部至底部方向接觸一半導體裝置的端子時,彈性支撐該半導體裝置的該端子; 一下接觸部件,其透過在垂直軸周圍螺旋捲繞一導電薄板形成,且當從底部至頂部方向接觸一檢驗電路基板的端子時,彈性支撐該檢驗電路基板的該端子;及 至少一連接部件,其電連接該上接觸部件與該下接觸部件。A bidirectional conductive contact pin comprising: an upper contact member formed by spirally winding a conductive thin plate around a vertical axis, and elastically supporting the terminal of the semiconductor device when contacting a terminal of a semiconductor device from a top to bottom direction a contact member formed by spirally winding a conductive thin plate around a vertical axis, and elastically supporting the terminal of the test circuit substrate when contacting a terminal of the test circuit substrate from the bottom to the top direction; and at least one connecting member It electrically connects the upper contact member and the lower contact member. 如請求項1所述之雙向導電觸針,其中該上接觸部件、該下接觸部件、與該連接部是透過在垂直軸螺旋捲繞一基座模型同時形成,且該基座模型是透過模型化一導電薄板形成。The bidirectional conductive stylus according to claim 1, wherein the upper contact member, the lower contact member, and the connecting portion are formed by spirally winding a susceptor model on a vertical axis, and the pedestal model is a transmission model A conductive sheet is formed. 如請求項1所述之雙向導電觸針,其更包括:一觸針體,其是利用一彈性絕緣材料製成,並設置在該上​​接觸部件與該下接觸部件間,且該連接部件設置在該觸針體內部。The bidirectional conductive stylus according to claim 1, further comprising: a stylus body made of an elastic insulating material and disposed between the upper contact member and the lower contact member, and the connection The component is disposed inside the stylus body. 如請求項1所述之雙向導電觸針,其更包括:至少一內支撐部件,其從該上接觸部件延伸向該下接觸部件,使得該內支撐部件的下端與該下接觸部件隔開一預定距離。The bidirectional conductive contact pin of claim 1, further comprising: at least one inner support member extending from the upper contact member toward the lower contact member such that a lower end of the inner support member is spaced apart from the lower contact member Scheduled distance. 如請求項1所述之雙向導電觸針,其中該上接觸部件在徑向向外成階梯狀,藉使該上接觸部件的徑向內部相對於其徑向外部向上伸出。The bidirectional conductive stylus of claim 1 wherein the upper contact member is stepped radially outwardly such that the radially inner portion of the upper contact member projects upwardly relative to a radially outer portion thereof. 如請求項1所述之雙向導電觸針,其中該下接觸部件在徑向向外成階梯狀,藉使該下接觸部件的徑向內部相對於其徑向外部向下伸出。The bidirectional conductive stylus of claim 1, wherein the lower contact member is stepped radially outwardly such that the radially inner portion of the lower contact member projects downwardly relative to a radially outer portion thereof. 如請求項1所述之雙向導電觸針,其中該連接部件構成在水平方向具有一預定寬度,並設置在該上​​接觸部件與該下接觸部件間,以在垂直方向支撐該上接觸部件與該下接觸部件。A bidirectional conductive contact pin according to claim 1, wherein the connecting member is formed to have a predetermined width in a horizontal direction and is disposed between the upper contact member and the lower contact member to support the upper contact member in a vertical direction. With the lower contact member. 一種雙向導電模型模組,包括: 一絕緣體; 複數個導電觸針,其設置在該絕緣體內部,使得該等導電觸針在水平方向彼此隔開,且該等導電觸針的上部件與下部件分別暴露在該絕緣體的上表面與下表面的外側,其中該等導電觸針之每一者包括: 一上接觸部件,其透過在垂直軸周圍螺旋捲繞一導電薄板形成,且當從頂部至底部方向接觸一半導體裝置的端子時,彈性支撐該半導體裝置的該端子; 一下接觸部件,其透過在垂直軸周圍螺旋捲繞一導電薄板形成,且當從底部至頂部方向接觸一檢驗電路基板的端子時,彈性支撐該檢驗電路基板的該端子;及 至少一連接部件,其電連接該上接觸部件與該下接觸部件。A bidirectional conductive model module comprising: an insulator; a plurality of conductive contact pins disposed inside the insulator such that the conductive contacts are spaced apart from each other in a horizontal direction, and upper and lower members of the conductive contact pins Exposed to the outer side of the upper surface and the lower surface of the insulator, respectively, wherein each of the conductive contact pins comprises: an upper contact member formed by spirally winding a conductive sheet around the vertical axis, and from the top to When the bottom direction contacts the terminal of a semiconductor device, the terminal of the semiconductor device is elastically supported; the lower contact member is formed by spirally winding a conductive thin plate around the vertical axis, and contacts a test circuit substrate from the bottom to the top direction. The terminal elastically supports the terminal of the inspection circuit substrate; and at least one connecting member electrically connecting the upper contact member and the lower contact member. 如請求項8所述之雙向導電模型模組,其中該導電觸針的該上接觸部件、該下接觸部件、與該連接部件透過在垂直軸周圍螺旋捲繞一基座模型同時形成,且該基座模型是透過模型化一導電薄板形成。The bidirectional conductive model module of claim 8, wherein the upper contact part of the conductive contact pin, the lower contact part, and the connecting part are formed by spirally winding a susceptor model around a vertical axis, and the The pedestal model is formed by modeling a conductive sheet. 如請求項8所述之雙向導電模型模組,其更包括:至少一內支撐部件,其從該上接觸部件延伸向該下接觸部件,使得該內支撐部件的下端與該下接觸部件隔開一預定距離。The bidirectional conductive model module of claim 8, further comprising: at least one inner support member extending from the upper contact member to the lower contact member such that a lower end of the inner support member is spaced apart from the lower contact member a predetermined distance. 如請求項8所述之雙向導電模型模組,該上接觸部件在徑向向外成階梯狀,藉使該上接觸部件的徑向內部相對於其徑向外部向上伸出。The bidirectional conductive model module of claim 8 wherein the upper contact member is stepped radially outwardly such that the radially inner portion of the upper contact member projects upwardly relative to a radially outer portion thereof. 如請求項8所述之雙向導電模型模組,該下接觸部件在徑向向外成階梯狀,藉使該下接觸部件的徑向內部相對於其徑向外部向下伸出。The bidirectional conductive model module of claim 8 wherein the lower contact member is stepped radially outwardly such that the radially inner portion of the lower contact member projects downwardly relative to a radially outer portion thereof. 如請求項8所述之雙向導電模型模組,其中該連接部件構成在水平方向具有一預定寬度,並設置在該上​​接觸部件與該下接觸部件間,以在垂直方向支撐該上接觸部件與該下接觸部件。The bidirectional conductive model module of claim 8, wherein the connecting member is formed to have a predetermined width in a horizontal direction and is disposed between the upper contact member and the lower contact member to support the upper contact in a vertical direction. The component and the lower contact component. 一種製造雙向導電模型模組的方法,該方法包括: (a)透過模型化一導電薄板形成一基座模型,該基座模型包括:複數個上接觸模型,其在水平方向彼此隔開;複數個下接觸模型,其在水平方向彼此隔開,且在垂直方向從該等複數個上接觸模型隔開;及至少一連接模型,其連接該等上接觸模型之每一者與彼此面對的該等下接觸模型之相關一者; (b)化學鍍該基座模型; (c)在垂直軸周圍捲繞該化學鍍基座模型,藉使分別形成具有螺旋狀的複數個上接觸部件與複數個下接觸部件;及形成一連接部件,以連接該等上接觸部件之每一者與該等彼此面對的下接觸部件之相關一者。A method of manufacturing a bidirectional conductive model module, the method comprising: (a) forming a pedestal model by modeling a conductive sheet, the pedestal model comprising: a plurality of upper contact models spaced apart from each other in a horizontal direction; Lower contact models that are spaced apart from each other in a horizontal direction and are spaced apart from the plurality of upper contact models in a vertical direction; and at least one connected model that connects each of the upper contact models to face each other (b) electroless plating the susceptor model; (c) winding the electroless plating pedestal model around the vertical axis, whereby a plurality of upper contact members having a spiral shape are respectively formed a plurality of lower contact members; and a connecting member for connecting one of the upper contact members to the one of the lower contact members facing each other. 如請求項14所述之方法,其更包括: (d)形成一絕緣體,其是利用一彈性絕緣材料製成,其中該連接部件設置在該絕緣體內部,使得該等上接觸部件的上表面與該等下接觸部件的下表面分別向上與向下暴露。The method of claim 14, further comprising: (d) forming an insulator made of an elastic insulating material, wherein the connecting member is disposed inside the insulator such that upper surfaces of the upper contact members are The lower surfaces of the lower contact members are exposed upward and downward, respectively. 如請求項14所述之方法,其中在形成該基座模型中,該連接模型是以對角線模型形成,其對角連接該等上接觸模型之每一者與彼此面對的該等下接觸模型之相關一者。The method of claim 14, wherein in forming the pedestal model, the connection model is formed by a diagonal model that diagonally connects each of the upper contact models to each other facing each other Contact one of the models. 如請求項14所述之方法,其中在捲繞該基座模型中,該等上接觸模型之每一者與彼此面對的該等下接觸模型之相關一者捲繞在相同垂直軸周圍,因此一上接觸部件與一下接觸部件是在彼此面對的位置處形成。The method of claim 14, wherein in winding the susceptor model, each of the upper contact models is wound around a same vertical axis with respect to one of the lower contact models facing each other, Therefore, an upper contact member and a lower contact member are formed at positions facing each other. 如請求項14所述之方法,其更包括: 當透過模型化該導電薄板形成該基座模型時,形成至少一內支撐模型,其從該等上接觸模型伸出向該等下接觸模型;及 當捲繞該基座模型時,透過捲繞該內支撐模型以形成一內支撐部件,其從該等上接觸部件之每一者延伸向該等下接觸部件之相關一者。The method of claim 14, further comprising: forming at least one inner support model extending from the upper contact model to the lower contact model when the susceptor model is formed by modeling the conductive sheet; and When the susceptor model is wound, the inner support mold is wound to form an inner support member that extends from each of the upper contact members to a relevant one of the lower contact members. 如請求項14所述之方法,其中該等上接觸模型在水平方向或在垂直方向成階梯狀,因此該等上接觸部件之每一者在徑向向外成階梯狀,藉使該上接觸部件的徑向內部相對於其徑向外部向上伸出。The method of claim 14, wherein the upper contact models are stepped in a horizontal direction or in a vertical direction, such that each of the upper contact members is stepped radially outward, such that the upper contact The radially inner portion of the component projects upwardly relative to its radially outer portion. 如請求項14所述之方法,其中該等下接觸模型在水平方向或在垂直方向成階梯狀,因此該等下接觸部件之每一者在徑向向外成階梯狀,藉使該上接觸部件的徑向內部相對於其徑向外部向下伸出。The method of claim 14, wherein the lower contact models are stepped in a horizontal direction or in a vertical direction, such that each of the lower contact members is stepped radially outward, such that the upper contact The radially inner portion of the component projects downwardly relative to its radially outer portion. 如請求項14所述之方法,其中該連接部件構成在水平方向具有一預定寬度,並設置在該等上接觸部件之每一者與該等下接觸部件之相關一者間,以在垂直方向支撐該上接觸部件與該下接觸部件。The method of claim 14, wherein the connecting member is formed to have a predetermined width in a horizontal direction and is disposed between each of the upper contact members and the associated one of the lower contact members to be in a vertical direction. The upper contact member and the lower contact member are supported. 一種製造雙向導電觸針的方法,該方法包括: 依請求項14至21中任一項所述之方法製造一雙向導電模型模組;及 透過在垂直方向切割該雙向導電模型模組的絕緣體以形成複數個雙向導電觸針,藉使彼此連接該等雙向導電觸針之每一者的一上接觸部件、一下接觸部件、與一連接部件。A method of manufacturing a bidirectional conductive stylus, the method comprising: manufacturing a bidirectional conductive model module according to the method of any one of claims 14 to 21; and severing the insulator of the bidirectional conductive model module in a vertical direction A plurality of bidirectional conductive contacts are formed by connecting an upper contact member, a lower contact member, and a connecting member of each of the bidirectional conductive contacts.
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