TW201739586A - 處理系統 - Google Patents

處理系統 Download PDF

Info

Publication number
TW201739586A
TW201739586A TW106110761A TW106110761A TW201739586A TW 201739586 A TW201739586 A TW 201739586A TW 106110761 A TW106110761 A TW 106110761A TW 106110761 A TW106110761 A TW 106110761A TW 201739586 A TW201739586 A TW 201739586A
Authority
TW
Taiwan
Prior art keywords
inspection
liquid crystal
crystal panel
processing
conveyor
Prior art date
Application number
TW106110761A
Other languages
English (en)
Chinese (zh)
Inventor
Kazuyoshi Yasukawa
Yukihisa Kobayashi
Masayoshi Kobayashi
Original Assignee
Nidec Sankyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Sankyo Corp filed Critical Nidec Sankyo Corp
Publication of TW201739586A publication Critical patent/TW201739586A/zh

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Biochemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Optics & Photonics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Power Engineering (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
TW106110761A 2016-04-26 2017-03-30 處理系統 TW201739586A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016088133A JP2017198499A (ja) 2016-04-26 2016-04-26 処理システム
PCT/JP2017/009136 WO2017187802A1 (ja) 2016-04-26 2017-03-08 処理システム

Publications (1)

Publication Number Publication Date
TW201739586A true TW201739586A (zh) 2017-11-16

Family

ID=60160339

Family Applications (1)

Application Number Title Priority Date Filing Date
TW106110761A TW201739586A (zh) 2016-04-26 2017-03-30 處理系統

Country Status (4)

Country Link
JP (1) JP2017198499A (ja)
CN (1) CN209356519U (ja)
TW (1) TW201739586A (ja)
WO (1) WO2017187802A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112083588A (zh) * 2019-06-14 2020-12-15 日本电产三协株式会社 检查系统

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7219106B2 (ja) * 2019-02-12 2023-02-07 日本電産サンキョー株式会社 基板搬送システムおよび基板搬送システムの制御方法
JP2020167256A (ja) * 2019-03-29 2020-10-08 日本電産サンキョー株式会社 パネル搬送装置およびパネル搬送システム
JP2020164282A (ja) * 2019-03-29 2020-10-08 日本電産サンキョー株式会社 パネル搬送システム
JP2022131673A (ja) * 2021-02-26 2022-09-07 日本電産サンキョー株式会社 処理システム

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6147647A (ja) * 1984-08-13 1986-03-08 Hitachi Ltd ボンダ
JP2002005942A (ja) * 2000-06-23 2002-01-09 Teruaki Ito 検体処理ユニット及び検体処理システム
CA2417541A1 (en) * 2002-01-25 2003-07-25 Hansjoerg Werner Haas Modular robotic system for sample processing
JP2006058083A (ja) * 2004-08-18 2006-03-02 Pioneer Electronic Corp 表示パネル検査装置及び検査方法
KR100740010B1 (ko) * 2005-11-18 2007-07-16 주식회사 파이컴 디스플레이 패널의 검사 시스템
JP2008241512A (ja) * 2007-03-28 2008-10-09 Matsushita Electric Ind Co Ltd ワークの処理システム
KR20120015172A (ko) * 2010-08-11 2012-02-21 엘지디스플레이 주식회사 표시장치의 검사장치 및 그의 검사방법

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112083588A (zh) * 2019-06-14 2020-12-15 日本电产三协株式会社 检查系统
CN112083588B (zh) * 2019-06-14 2023-07-14 日本电产三协株式会社 检查系统

Also Published As

Publication number Publication date
JP2017198499A (ja) 2017-11-02
WO2017187802A1 (ja) 2017-11-02
CN209356519U (zh) 2019-09-06

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