TW201728906A - Probe fastening and conducting structure of electronic component inspection device easily detach terminal lug and do not hinder connection of lead wire from rotation regulation of the fastening portion - Google Patents

Abstract

The invention provides a probe fastening and conducting method and structure of electronic component inspection device comprising steps of: providing a probe seat driven to perform upward and downward displacement; providing a probe disposed on the probe seat and comprising a needle portion and a fastening portion provided for screwing the needle portion; providing a lead wire to enable one end of the lead wire to connect the probe while another end is connected with and transmits signals to the inspection instrument; fastening and positioning the probe, allowing a screw propping member to firstly pass through a through hole of the probe seat and to further screw through an insertion block having a screw propping hole with inner screw thread and, at the front end, finally passing through a propping hole of the probe seat to abut against periphery edge of the fastening portion of the probe, thereby locking and fastening the probe.

Description

Probe fixed guiding method and structure of electronic component detecting device

The present invention relates to a probe fixing and guiding method and structure, and more particularly to a probe fixing guiding method and mechanism for detecting an electrical characteristic (such as a resistance value) of an electronic component (for example, a passive component). .

According to the general electronic components, because of their different physical characteristics, they often need to be packaged or classified through the procedures of detection and classification. In the detection, the carrier is intermittently rotated on the detection seat, and the circumference of the carrier is arranged in a ring. The groove causes the electronic component input groove to be intermittently rotated and conveyed, and a detecting device is arranged under the detecting seat, so that the probe in the detecting device passes through the detecting seat and protrudes to the bottom of the groove, and the cymbal is intermittently rotated and transported. The electronic components in the groove corresponding to the positioning of the probe can be detected; such a detecting device is prone to contact wear between the electronic component and the electronic component due to long-term detection of the probe, and therefore the adjustment of the probe height of the probe must be frequently performed; The probe is usually screwed into the fixing portion of a fixing seat, and the relative rotation of the fixing portion is adjusted to make the probe linearly move up or down.

However, since the general probe must be connected to the detecting device by wire, the wire is usually soldered to the fixing portion made of the metal (usually a copper material) to conduct the probe to the same metal conductive material, so the fixing portion is being made. When the rotation is adjusted, the welded portion of the wire is easily broken off. In addition, since the fixing portion is screwed into the fixing hole of the internal thread of the fixed seat by the screw, the fixing seat is usually a non-conductive material such as acrylic or electric. Wood, each time the fixing part is adjusted, the screwing piece is required to be loosened and screwed to the fixing part, and the internal thread of the fixing seat is easily damaged under long-term operation.

Accordingly, it is an object of the present invention to provide a probe fixed guiding method for an electronic component detecting device that makes a probe screw setting position of a probe holder more stable.

Another object of the present invention is to provide a probe fixing and guiding structure for an electronic component detecting device in which the probe screw setting position of the probe holder is made more stable.

A still further object of the present invention is to provide a configuration of a probe fixed guiding method for performing the electronic component detecting device according to any one of claims 1 to 5.

A probe fixing and guiding method for an electronic component detecting device according to the present invention includes: providing a probe holder to be driven to be moved up and down; and providing a probe disposed on the probe holder, including a needle portion and a fixing portion for screwing the needle portion; a wire is provided to connect one end of the wire to the probe, and the other end is connected to and transmits a signal to the detecting instrument; and the solid setting position of the probe is a screw The abutting member first passes through a through hole of the probe base, and then passes through a screw-shaped screw hole with an internal thread, and then the front end passes through the probe base to abut the hole to abut the periphery of the fixing portion of the probe, so that the probe is obtained. Lock the fixed position.

According to another object of the present invention, a probe fixed guiding structure of an electronic component detecting device includes: a probe holder that can be driven to perform upper and lower displacement, and the probe holder is provided with a groove; and a probe is disposed at the probe The probe base includes a needle portion and a fixing portion for screwing the needle portion; a wire having one end connected to the probe and the other end connecting and transmitting the signal to the detecting instrument; and an insert disposed on the probe In the recess of the seat, the insert is provided with a threaded hole with an internal thread; a screwing member is threaded through the screw to abut the hole and abuts the periphery of the fixing portion of the probe.

A probe fixing and guiding structure of an electronic component detecting device according to still another aspect of the present invention, comprising a probe fixing and guiding method for performing the electronic component detecting device according to any one of claims 1 to 5 structure.

The probe fixing and guiding method and structure of the electronic component detecting device of the embodiment of the invention can be easily taken from the groove by the insert which provides the internal thread for the screw screw, and the screw is fixed to the fixing portion of the probe The internal thread of the screw of the peripheral screw is disposed on the metal insert outside the probe base, and the probe base is not affected by the damage of the internal thread, and the screw for fixing the insert is screwed. That is, it is not necessary to frequently screw in and out, so that the probe can obtain a stable locking; and since the wire is nested at the lower end of the fixing portion of each probe screwing needle portion, not only the terminal sleeve is easily removed and removed, The rotation adjustment of the fixing portion after the removal of the terminal sleeve also prevents the connection of the wires.

Referring to FIG. 1 and FIG. 2, the probe fixing and guiding method and the structural embodiment of the electronic component detecting device of the present invention can be illustrated as the device shown in the figure, including: a rack 1 on which the electromagnetic mechanism 11 is disposed. The probe base 12 can be driven up and down, and the probe base 12 is provided with a plurality of probes 13; the mount 1 is simultaneously fixed with a probe holder 14, and each probe 13 extends through the upper end of the probe holder 14. The pedestal 141 is for detecting the electronic component; the lower end of the probe holder 14 is provided with a pivot seat 15 between the probe base 12 and the probe holder 14 for pivoting the probes 13 for Guide and support the elongated probe 13; the frame 1 is provided with a fixing frame 16 on which a number of terminal blocks 161 corresponding to the number of the probes 13 are provided, and the terminal blocks 161 are used for connecting and transmitting signals to the detecting instrument; The seat 12 is provided with a plurality of pivot holes 121 arranged in a square matrix. The probes 13 each include a needle portion 131 and a fixing portion 132. The needle portion 131 is screwed on the upper end of the fixing portion 132, and each fixing portion 132 is pivoted. a pivot hole 121 on each corresponding probe base 12; a recessed joint is also provided on one side of the probe base 12 The one end of the cantilever 111 driven by the electromagnetic mechanism 11 is fixed at one end, and the other end of the cantilever 111 is pivotally disposed on the frame 1. The two ends are supported by an elastic member 112, and the electromagnetic attraction and release of the electromagnetic mechanism 11 are matched. The elastic element 112 is compressed and restored, so that the cantilever 111 interlocks the probe base 12 and the probe 13 to reciprocate up and down.

Referring to Figures 2 and 3, the plurality of pivot holes 121 are arranged in a square matrix on the probe base 12. In the present embodiment, four probes 13 are used, and each probe 13 is arranged at four corners of the matrix, and each of the two probes 13 Each of the square matrices has a long side, and two outer sides corresponding to two straight sides parallel to the square matrix are respectively disposed at a distance from each of the straight sides and parallel to the straight sides, and each of the lengths is longer than the straight a groove 123 having a width between the two probes in the side, the bottom of the groove 123 is a blind bottom, and the top is an open shape, and the inner side walls of the two parallel long sides of each groove 123 are respectively provided with two through holes. And the through hole 124 of the two pivot holes 121 at the straight side of the corresponding square matrix, and the through hole 125 penetrating the outer side of the probe base 12 at the same time, and at the bottom of the groove 123, there is also a spacing to the probe Two fixing holes 126 extending through the bottom surface of the seat 12; the recesses 127 of the two metal materials are disposed at intervals of the grooves 123. The metal material is preferably copper, and each of the inserts 127 is horizontally disposed and penetrates back and forth. Corresponding to the hole 124 and the screw hole 128 of the through hole 125 respectively, the screw hole 128 is provided with an internal thread, and each thread The fixing block 127 is also provided with a fixing hole 129 which is vertically disposed and corresponding to the fixing hole 126. The fixing hole 129 is provided with an internal thread; the screwing hole 128 horizontally disposed on the block 127 and the fixing hole vertically disposed 129 are spaced apart from each other without being staggered; each of the probes 13 is provided with a terminal sleeve 162 at a lower end of the fixing portion 132 of the needle portion 131. The terminal sleeve 162 is connected to each corresponding terminal block 161 by a wire 163 for connection. And pass the signal to the test instrument.

Referring to FIGS. 3 and 4, the insert 127 is screwed from the fixing hole 126 at the bottom of the probe base 12 to the fixing hole 129 of the insert block 127 in the recess 123 by a screw 171 formed by a screw, so that the insert 127 is screwed. Positioned in the recess 123 of the probe base 12; the probe base 12 is threaded through the through hole 125 by a screw-free member 172 formed by a headless screw, and the screw insert 127 is horizontally disposed and penetrated back and forth and has The screw threading hole 128 of the internal thread passes through the abutting hole 124 to the periphery of the fixing portion 132 of the probe 13, so that the fixing portion 132 obtains the locking position.

The probe fixing guiding method and the structure of the electronic component detecting device of the embodiment of the present invention can be easily taken from the groove 123 by the inserting block 127 which provides the internal thread for the screw 171 to be screwed, and the screw is abutted against the probe. The internal thread of the screw 172 of the periphery of the fixing portion 132 of the fixing portion 132 is screwed on the metal insert 127 outside the probe base 12, and the probe base 12 is not affected by the damage of the internal thread, and is matched for fixing. The screw 171 of the insert 127 does not need to be screwed in and out frequently after screwing, so that the probe 13 can be stably locked; and since the wire 163 is nested in each of the probes 13 by the terminal sleeve 162 The lower end of the fixing portion 132 of the needle portion 131 not only allows the terminal sleeve 162 to be easily removed and removed, but also adjusts the rotation of the fixing portion 132 after the removal of the terminal sleeve 162 without obstructing the connection of the wires 163.

In another embodiment of the present invention, referring to FIGS. 5 and 6, a wire 164 can be connected to the wire end of the wire 163, so that the metal buckle 164 is clamped between the screw 171 and the bottom of the probe base 12. The metal clasp 164 can be electrically connected to the fixing portion 132 of the needle portion 131 of the probe 13 via the screw 171, the insert 127, and the screw 172; this manner can be used when the fixing portion 132 is rotated and fine-tuned. The cleat 164 does not need to be removed at all, making the operation easier.

The above is only the preferred embodiment of the present invention, and the scope of the invention is not limited thereto, that is, the simple equivalent changes and modifications made by the scope of the invention and the description of the invention are All remain within the scope of the invention patent.

1‧‧‧Rack
11‧‧‧Electromagnetic mechanism
111‧‧‧Swing arm
112‧‧‧Flexible components
12‧‧‧ probe holder
121‧‧‧ pivot hole
122‧‧‧Connected Department
123‧‧‧ Groove
124‧‧‧With holes
125‧‧‧through hole
126‧‧‧Block
127‧‧‧Spiral hole
128‧‧‧Spiral hole
129‧‧‧Fixed holes
13‧‧‧ probe
131‧‧‧needle
132‧‧‧ Fixed Department
14‧‧‧Probe rack
141‧‧‧ drill stand
15‧‧‧Side
16‧‧‧ Fixing frame
161‧‧‧ terminal block
162‧‧‧Terminal sleeve
163‧‧‧Wire
164‧‧‧Metal clasps
171‧‧‧Spiral firmware
172‧‧‧Spiral parts

1 is a schematic view showing the configuration of a detecting device in an embodiment of the present invention. 2 is a perspective exploded view of a probe fixed guiding structure according to an embodiment of the present invention. 3 is a schematic cross-sectional view (1) of a probe fixed guiding structure in an embodiment of the present invention. 4 is a schematic cross-sectional view (2) of a probe fixed guiding structure in an embodiment of the present invention. FIG. 5 is a schematic structural diagram of a detecting apparatus of another probe guiding embodiment in the embodiment of the present invention. 6 is a schematic cross-sectional view showing another schematic embodiment of a probe guiding embodiment in the embodiment of the present invention.

12‧‧‧ probe holder

121‧‧‧ pivot hole

122‧‧‧Connected Department

123‧‧‧ Groove

124‧‧‧With holes

125‧‧‧through hole

127‧‧‧Spiral hole

128‧‧‧Spiral hole

129‧‧‧Fixed holes

13‧‧‧ probe

131‧‧‧needle

132‧‧‧ Fixed Department

161‧‧‧ terminal block

162‧‧‧Terminal sleeve

163‧‧‧Wire

Claims (10)

A probe fixed guiding method for an electronic component detecting device, comprising: providing a probe holder to be driven to be moved up and down; providing a probe disposed on the probe base, including a needle portion and a fixing portion for providing a needle portion; a wire is provided to connect one end of the wire to the probe, and the other end is connected to and transmits a signal to the detecting instrument; and the fixed position of the probe is first worn by a screw member A probe through the through hole, and then through a plug with a threaded screw hole, and then the front end of the probe through the hole of the probe seat against the periphery of the fixed portion of the probe, so that the probe obtains the lock position. The probe fixing and guiding method of the electronic component detecting device according to the first aspect of the invention, wherein the screwing member is threaded through the screw with the internal thread of the insert, and the front end passes through the probe holder. After the hole, it reaches the periphery of the fixing portion of the probe. The probe fixing and guiding method of the electronic component detecting device according to claim 1, wherein one end of the wire and the probe connecting portion are nested at a lower end of the fixing portion by a terminal sleeve. The probe fixed guiding method of the electronic component detecting device according to claim 1, wherein the insert is screwed to the probe base by a screw. The probe fixing and guiding method of the electronic component detecting device according to claim 4, wherein a connecting portion of the wire and the probe is sandwiched between the screw and the probe holder by a metal clip, so that The metal clasp can be electrically connected to the fixing portion of the probe screwing portion via the screw, the insert, and the screw abutting member. A probe fixed guiding structure of an electronic component detecting device comprises: a probe holder that can be driven to move up and down, and a probe holder provided with a groove; a probe disposed on the probe holder, including a pin portion and a fixing portion for screwing the needle portion; a wire having one end connected to the probe and the other end connecting and transmitting the signal to the detecting instrument; and an insert disposed in the groove of the probe holder The insert block is provided with a threaded hole with an internal thread; a screwing member is threaded through the screw to abut the hole and abuts against the periphery of the fixing portion of the probe. The probe fixed guiding structure of the electronic component detecting device according to claim 6, wherein the insert is set in a groove of the probe holder by a screw. The probe fixed guiding structure of the electronic component detecting device according to claim 6, wherein one end of the wire connected to the probe is provided with a terminal sleeve, and the terminal sleeve is nested at a lower end of the fixing portion of the probe. The probe fixing and guiding structure of the electronic component detecting device of claim 7, wherein one end of the wire connected to the probe is provided with a metal clasp, and the metal clasp is sandwiched between the screw and the probe holder. A probe fixed guiding structure of an electronic component detecting device, comprising a configuration of a probe fixing guiding method for performing the electronic component detecting device according to any one of claims 1 to 5.