TWM478824U - Signal adapting line of probe detector - Google Patents

Signal adapting line of probe detector Download PDF

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Publication number
TWM478824U
TWM478824U TW103200819U TW103200819U TWM478824U TW M478824 U TWM478824 U TW M478824U TW 103200819 U TW103200819 U TW 103200819U TW 103200819 U TW103200819 U TW 103200819U TW M478824 U TWM478824 U TW M478824U
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Taiwan
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probe
detecting
signal
positioning
signal patch
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TW103200819U
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Chinese (zh)
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Xian-Ming Shen
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Noyn Electronics Corp
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Priority to TW103200819U priority Critical patent/TWM478824U/en
Publication of TWM478824U publication Critical patent/TWM478824U/en

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Description

探針式檢測裝置之訊號轉接線Signal type patching device for probe type detection device

本創作係為一種應用在探針式檢測裝置的訊號轉接線,尤指一種具備彈性伸縮且能直接插置固定於檢測台的訊號轉接線。The present invention is a signal patch cord used in a probe type detecting device, and particularly a signal patch cord which is elastically stretchable and can be directly inserted and fixed to a detecting station.

一般印刷電路板、半導體封裝元件、晶圓等產品製成後,需透過專用的探針式檢測裝置予以檢測,藉此確認產品的良率和阻抗,維持產品品質。探針式檢測裝置主要是利用緊密排列的細密探針與產品內電路板上的導電電路分別接觸後,透過一電腦機台測得每一探針所傳遞的電氣特性,藉以判讀電路板上電路的電氣特性是否符合規範。After the products such as printed circuit boards, semiconductor package components, and wafers are manufactured, they are tested by a dedicated probe type detector to confirm the yield and impedance of the product and maintain product quality. The probe type detecting device mainly uses the closely arranged fine probes to respectively contact the conductive circuits on the circuit board of the product, and then measures the electrical characteristics transmitted by each probe through a computer machine, thereby interpreting the circuit on the circuit board. Whether the electrical characteristics are in compliance with the specifications.

由於現今的可攜式電子產品例如智慧型手機,在強調容易攜帶的同時,其功能也日益強大,使得該等可攜式電子產品的電路板不但面積大幅減少,其電路布局亦往往細密地必須使用放大鏡才能逐一檢視;如此一來,也造成了探針式檢測裝置在製造上的困難。Since today's portable electronic products, such as smart phones, emphasize the ease of carrying and their functions are becoming more and more powerful, the circuit boards of these portable electronic products are not only greatly reduced in area, but also the circuit layout is often finely required. The magnifying glass can be used to examine one by one; thus, it also causes difficulty in manufacturing the probe type detecting device.

習知探針式檢測裝置如第一圖所示,係包含一具有細密檢測探針101之治具102、一設置在治具102下方具有檢測孔103的檢測台104、複數根設置在檢測孔103內以供檢測探針101壓觸連接的伸縮端子105、複數根分別與伸縮端子105電氣連接之訊號轉接線106,以及一可供各訊號轉接線106連接並且能夠傳輸信號至電腦以供檢測分析之轉接盤107。As shown in the first figure, the conventional probe type detecting device includes a jig 102 having a fine detecting probe 101, a detecting station 104 having a detecting hole 103 disposed under the jig 102, and a plurality of detecting holes arranged in the detecting hole. In the 103, a telescopic terminal 105 for detecting connection of the detecting probe 101, a plurality of signal transponders 106 electrically connected to the telescopic terminal 105, and a signal to be connected to each of the signal transponders 106 and capable of transmitting signals to the computer are used. The adapter disk 107 for detection analysis.

上述構造中,治具102上的細密檢測探針101頂部檢測端位置,必須依照待檢測電路板108上的電路布局加以設置,而檢測台104上的伸縮端子105須逐一埋置在檢測孔103內,又必須逐一連接訊號轉接線106,在加工面積有限的情形下,組裝施工相當困難。因此,本案申請人曾經設 計出一種具有浮板的檢測治具(公告第TW M446334號),讓各檢測探針101以傾斜向外的方式向下凸伸到治具102的下方,使位於治具102下方的檢測台104面積比較不容易受到待檢測電路板108的面積大小所限制,也可以讓檢測台104在排置伸縮端子105及訊號轉接線106時,比較容易施工。In the above configuration, the position of the top detecting end of the fine detecting probe 101 on the jig 102 must be set according to the circuit layout on the circuit board 108 to be inspected, and the telescopic terminals 105 on the detecting table 104 must be embedded one by one in the detecting hole 103. In addition, it is necessary to connect the signal patch cords 106 one by one. In the case where the processing area is limited, assembly and construction are quite difficult. Therefore, the applicant of this case has A detecting fixture having a floating plate (No. TW M446334) is counted, and each detecting probe 101 is protruded downwardly to the lower side of the jig 102 so that the detecting station located below the jig 102 The area of the 104 is less likely to be limited by the size of the circuit board 108 to be inspected, and the test station 104 can be easily constructed when the telescopic terminal 105 and the signal patch cord 106 are arranged.

上述先前技術經本案申請人實施後,發現伸縮端子105及訊號轉接線106在安裝時,仍有可改進的空間;其中之一是伸縮端子105埋置在檢測台104的檢測孔103內,而各檢測探針101係以傾斜角度排置,在檢測探針101底端壓入檢測孔103頂部與伸縮端子105壓觸時,即如第二圖所示,其檢測探針101底部傾斜的位置容易受到檢測孔103孔徑頂部周圍所限制,若壓觸行程若稍多,便如第三圖所示造成檢測探針101底端偏斜,尤其是在多次重複測試使用下,可能會有接觸不良的疑慮。After the above-mentioned prior art is implemented by the applicant, it is found that there is still room for improvement in the installation of the telescopic terminal 105 and the signal patch cord 106; one of them is that the telescopic terminal 105 is embedded in the detecting hole 103 of the detecting station 104, Each of the detecting probes 101 is arranged at an oblique angle. When the bottom end of the detecting probe 101 is pressed against the top of the detecting hole 103 and pressed against the telescopic terminal 105, as shown in the second figure, the detecting probe 101 is tilted at the bottom. The position is easily restricted by the periphery of the aperture of the detecting hole 103. If the pressing stroke is slightly more, the bottom end of the detecting probe 101 is deflected as shown in the third figure, especially in the case of repeated test, there may be Disadvantages of contact.

另一個先前技術可以改進的結構,是伸縮端子105與訊號轉接線106是採取分離組裝的設計,如第四圖所示,該訊號轉接線106必須先在端部設置一可以由下而上插入固定於檢測孔103內的定位套筒109,而伸縮端子105必須先置入一外徑略小於定位套筒109並且設置有彈簧110的空心柱111後,再將伸縮端子105以及設置有彈簧110的空心柱111,一起由上而下嵌入定位套筒109內,如此一來,組裝時就必須在每一個檢測孔103分成前後兩次組裝,即先將訊號轉接線106之定位套筒109嵌入檢測孔103後,然後再將空心柱111嵌入定位套筒109中,相當耗時費工,製造成本亦相對昂貴。Another structure that can be improved in the prior art is that the telescopic terminal 105 and the signal patch cord 106 are designed to be separated and assembled. As shown in the fourth figure, the signal patch cord 106 must be disposed at the end first. The positioning sleeve 109 fixed in the detecting hole 103 is inserted, and the telescopic terminal 105 must first be inserted into a hollow column 111 having an outer diameter slightly smaller than the positioning sleeve 109 and provided with the spring 110, and then the telescopic terminal 105 is provided with The hollow columns 111 of the springs 110 are inserted into the positioning sleeve 109 from top to bottom. Therefore, it is necessary to assemble the detection holes 103 twice before and after the assembly, that is, the positioning sleeve of the signal extension cable 106 first. After the cartridge 109 is inserted into the detecting hole 103, the hollow post 111 is then inserted into the positioning sleeve 109, which is time consuming and labor intensive, and the manufacturing cost is relatively expensive.

有鑑於此,本創作人乃累積多年相關領域的研究以及實務經驗,特創作出一種訊號轉接線,以解決習知檢測台之檢測孔、訊號轉接線、伸縮端子三者之間組裝複雜、耗時費工的缺失。In view of this, the creator has accumulated many years of research and practical experience in related fields, and specially created a signal patch cord to solve the complicated assembly between the detection hole, the signal patch cord and the telescopic terminal of the conventional inspection station. The lack of time and labor.

本創作之目的在於提供一種應用在探針式檢測裝置上的訊號轉接線,該訊號轉接線其中一端與轉接盤電連接,另一端為能直接插置在檢測台上的伸縮探針,且伸縮探針能夠供檢測探針壓觸電連接以傳輸訊號,克服習知技術必須分次地逐一將伸縮端子及訊號轉接線安裝在檢測台 上的缺點。The purpose of the present invention is to provide a signal patch cable for use in a probe type detecting device, one end of which is electrically connected to the adapter disk, and the other end is a telescopic probe that can be directly inserted into the detecting platform. And the telescopic probe can be used for detecting the probe to be electrically connected to transmit the signal. To overcome the conventional technology, the telescopic terminal and the signal extension cable must be installed on the detection platform one by one. The shortcomings.

為達成上述目的,本創作為一種探針式檢測裝置之訊號轉接線,所述檢測裝置包含一具有細密檢測探針之治具、一設置在治具下方的檢測台、複數根定位在檢測台供檢測探針壓觸連接的細密訊號轉接線,以及一可供各訊號轉接線電連接並且能夠傳輸信號至電腦以供檢測分析之轉接盤,其中,所述檢測台上具有細密排列之固定孔,每一固定孔可供一訊號轉接線設置,其特徵在於:各訊號轉接線其中一端具有一能直接插置在固定孔中的伸縮探針,該伸縮探針包含一固定插置在固定孔中的定位套筒、一設置在定位套筒內的彈簧、以及一設置在定位套筒中受彈簧彈性頂持恆常凸出定位套筒的頂針,所述頂針頂面為壓觸端,該壓觸端凸伸於檢測台頂部端面上,供檢測探針壓觸連接以傳輸訊號。In order to achieve the above object, the present invention is a signal transponder of a probe type detecting device, the detecting device comprising a jig having a fine detecting probe, a detecting table disposed under the jig, and a plurality of root positioning in detecting a fine signal patch cord for detecting the pressure contact of the probe, and an adapter disc for electrically connecting the signal patch cords and capable of transmitting signals to the computer for detection and analysis, wherein the test bench has fineness Arranging the fixing holes, each fixing hole is provided for a signal patch cable, wherein each of the signal patch wires has a telescopic probe that can be directly inserted into the fixing hole, and the telescopic probe includes a telescopic probe a positioning sleeve fixedly inserted in the fixing hole, a spring disposed in the positioning sleeve, and a thimble disposed in the positioning sleeve by the spring elastically holding the constant protruding positioning sleeve, the top surface of the thimble For the pressure contact end, the pressure contact end protrudes from the top end surface of the inspection platform for the detection probe to be pressure-contacted to transmit a signal.

藉由上述構造,訊號轉接線之伸縮探針具備彈性伸縮而且能直接插置固定於檢測台之固定孔中,可以克服習知技術必須分次地逐一將伸縮端子及訊號轉接線安裝於固定孔之缺點,提升檢測台的組裝速度。With the above configuration, the telescopic probe of the signal patch cable is elastically stretched and can be directly inserted and fixed in the fixing hole of the detecting table, and the telescopic terminal and the signal patching cable must be installed one by one in the prior art. The disadvantage of fixing holes improves the assembly speed of the test bench.

再者,伸縮探針之壓觸端凸伸於檢測台頂部端面上,使檢測探針以傾斜角度排置時,檢測探針底部傾斜的位置不會受到檢測孔孔徑頂部周圍的限制,改善習知檢測探針壓觸行程稍多便會使底端偏斜、接觸不良的缺點。Furthermore, when the pressure contact end of the telescopic probe protrudes from the top end surface of the inspection platform, when the detection probe is arranged at an oblique angle, the position at which the bottom of the probe is tilted is not restricted by the periphery of the aperture of the detection hole, and improvement is improved. It is known that the detection probe has a slight pressure contact stroke, which may cause the bottom end to be skewed and the contact to be poor.

以下進一步說明各元件之實施方式:實施時,伸縮探針之壓觸端為略為下凹的凹面,以提供檢測探針壓觸時的定位效果。Embodiments of the various elements are further described below: when implemented, the pressure-contact end of the telescoping probe is a slightly concave concave surface to provide a positioning effect when the probe is pressed.

實施時,所述訊號轉接線另一端通過導線設置有一插針以插接於轉接盤;該轉接盤上設置有細密排列的定位穿孔,各定位穿孔內分別設置有一呈中空狀且內徑略大於插針以供插針插入定位的轉接端子;使檢測裝置之檢測探針測得的訊號經訊號轉接線之伸縮探針、導線、插針、轉接盤上的轉接端子傳輸至電腦供作業人員判讀。In the implementation, the other end of the signal patch cord is provided with a pin through the wire to be inserted into the adapter disc; the adapter disc is provided with finely arranged positioning perforations, and each of the positioning perforations is respectively provided with a hollow shape and inner The diameter is slightly larger than the pin for inserting the pin into the positioning adapter terminal; the signal measured by the detecting probe of the detecting device is transmitted through the telescopic probe of the signal patch cable, the wire, the pin, and the adapter terminal on the adapter disk Transfer to the computer for the operator to interpret.

實施時,所述插針呈彎折狀而插入轉接端子後,藉由其彎折所產生的彈性而定位,使插針不易從轉接端子中鬆脫。In practice, after the pin is bent and inserted into the adapter terminal, the pin is positioned by the elasticity generated by the bending, so that the pin is not easily loosened from the adapter terminal.

實施時,所述轉接盤上細密排列的定位穿孔呈矩陣排列,該轉接盤約為100X100mm,穿孔數量約4000~4200個。In implementation, the finely arranged positioning perforations on the adapter disc are arranged in a matrix, the adapter disc is about 100×100 mm, and the number of perforations is about 4000-4200.

相較於習知技術,本創作具有以下優點:Compared with the prior art, this creation has the following advantages:

1.本創作在訊號轉接線的其中一端設置能直接固定於檢測台之固定孔中的伸縮探針,可以克服習知技術必須分次地逐一將伸縮端子及訊號轉接線安裝於固定孔之缺點,提升檢測台的組裝速度。1. This design is provided with a telescopic probe that can be directly fixed in the fixing hole of the detecting table at one end of the signal patching cable, which can overcome the conventional technique and must install the telescopic terminal and the signal patching wire in the fixing hole one by one. The shortcomings increase the assembly speed of the test bench.

2.伸縮探針之壓觸端凸伸於檢測台頂部端面上,使檢測探針底部傾斜的位置不會受到檢測孔孔徑頂部周圍的限制,改善習知檢測探針壓觸行程稍多便會使底端偏斜、接觸不良的缺點。2. The pressure contact end of the telescopic probe protrudes from the top end surface of the test bench, so that the position of the bottom of the detection probe is not restricted by the periphery of the top of the aperture of the detection hole, and the conventional detection probe has a slight pressure contact stroke. The disadvantage of skewing the bottom end and poor contact.

以下依據本創作之技術手段,列舉出適於本創作之實施方式,並配合圖式說明如後:In the following, according to the technical means of the creation, the implementation method suitable for the creation is listed, and the description is as follows:

1‧‧‧檢測探針1‧‧‧Detection probe

2‧‧‧治具2‧‧‧ fixture

3‧‧‧檢測台3‧‧‧Testing station

4‧‧‧訊號轉接線4‧‧‧Signal patch cord

5‧‧‧轉接盤5‧‧‧Transfer tray

10‧‧‧固定孔10‧‧‧Fixed holes

20‧‧‧伸縮探針20‧‧‧ Telescopic probe

21‧‧‧定位套筒21‧‧‧ Positioning sleeve

22‧‧‧彈簧22‧‧‧ Spring

23‧‧‧頂針23‧‧‧ thimble

231‧‧‧壓觸端231‧‧‧pressure end

30‧‧‧導線30‧‧‧Wire

40‧‧‧插針40‧‧‧pins

50‧‧‧定位穿孔50‧‧‧ Positioning perforation

60‧‧‧轉接端子60‧‧‧Transfer terminal

第一圖:習知探針式檢測裝置結構示意圖。First figure: Schematic diagram of a conventional probe type detecting device.

第二圖:習知檢測探針與伸縮端子壓觸時作動示意圖。Figure 2: Schematic diagram of the operation of the conventional detection probe and the telescopic terminal when it is pressed.

第三圖:習知檢測探針底端壓觸時底端偏斜示意圖。Figure 3: Schematic diagram of the deflection of the bottom end when the bottom end of the probe is pressed.

第四圖:習知檢測台、伸縮端子與訊號轉接線三者間的組裝示意圖。Figure 4: Schematic diagram of the assembly between the conventional test bench, telescopic terminal and signal patch cable.

第五圖:本創作之探針式檢測裝置結構示意圖。Fig. 5 is a schematic view showing the structure of the probe detecting device of the present invention.

第六圖:本創作之訊號轉接線兩端分別與檢測台、轉接盤組裝結構示意圖。Figure 6: Schematic diagram of the assembly structure of the test signal and adapter board at both ends of the signal extension cable of this creation.

第七圖:本創作之檢測探針與伸縮探針壓觸時作動示意圖。Figure 7: Schematic diagram of the actuation of the detection probe and the telescopic probe of this creation.

第八圖:本創作之檢測探針壓觸行程稍多的作動示意圖。Figure 8: Schematic diagram of the actuation of the probe probe with a slightly larger stroke.

第九圖:本創作之轉接盤立體外觀示意圖。The ninth picture: a schematic view of the three-dimensional appearance of the adapter disk of the present creation.

如第五、第六圖所示,本創作為一種探針式檢測裝置之訊號轉接線,所述檢測裝置包含一具有細密檢測探針1之治具2、一設置在治具2下方的檢測台3、複數根定位在檢測台3供檢測探針1壓觸連接的細密訊號轉接線4,以及一可供各訊號轉接線4電連接並且能夠傳輸信號至電腦以 供檢測分析之轉接盤5,其中,所述檢測台3上具有細密排列之固定孔10,每一固定孔10可供一訊號轉接線4設置。As shown in the fifth and sixth figures, the present invention is a signal patch cable of a probe type detecting device, and the detecting device comprises a jig 2 having a fine detecting probe 1 and a set under the jig 2 The detecting station 3 and the plurality of fine signal patch cords 4 positioned on the detecting station 3 for the detecting probe 1 to be pressed and connected, and one for each signal patch cord 4 to be electrically connected and capable of transmitting signals to the computer The adapter plate 5 for detecting and analyzing, wherein the detecting table 3 has finely arranged fixing holes 10, and each fixing hole 10 is provided for a signal patch cable 4.

各訊號轉接線4其中一端具有一能直接插置在固定孔10中的伸縮探針20,該伸縮探針20包含一固定插置在固定孔10中的定位套筒21、一設置在定位套筒21內的彈簧22、以及一設置在定位套筒21中受彈簧22彈性頂持恆常凸出定位套筒21的頂針23,所述頂針23頂面為壓觸端231,該壓觸端231凸伸於檢測台3頂部端面上,供檢測探針1壓觸連接以傳輸訊號。One end of each signal patch cord 4 has a telescopic probe 20 that can be directly inserted into the fixing hole 10, and the telescopic probe 20 includes a positioning sleeve 21 fixedly inserted in the fixing hole 10, and is disposed at the positioning. a spring 22 in the sleeve 21, and a thimble 23 disposed in the positioning sleeve 21 by the spring 22 to elastically hold the positioning sleeve 21, the top surface of the thimble 23 is a pressure contact end 231, the pressure contact The end 231 protrudes from the top end surface of the detecting table 3 for the detecting probe 1 to be pressure-contacted to transmit a signal.

因訊號轉接線4之伸縮探針20具備彈性伸縮而且能直接插置固定於檢測台3之固定孔10中,便可以克服習知技術必須分次地逐一將伸縮端子及訊號轉接線安裝於固定孔之缺點,有效提升檢測台的組裝速度。Since the telescopic probe 20 of the signal patch cord 4 is elastically stretched and can be directly inserted and fixed in the fixing hole 10 of the detecting table 3, it can overcome the conventional technique that the telescopic terminal and the signal patching terminal must be installed one by one. The shortcomings of the fixing holes effectively increase the assembly speed of the inspection table.

如第七圖所示,伸縮探針20之壓觸端231凸伸於檢測台3頂部端面上,使檢測探針1以傾斜角度排置時,檢測探針1底部傾斜的位置不會受到檢測孔孔徑頂部周圍的限制;或如第八圖所示,在檢測探針1壓觸的行程稍多時,也不會讓底端偏斜,維持良好的壓觸品質。As shown in the seventh figure, the pressing end 231 of the telescopic probe 20 protrudes from the top end surface of the detecting table 3, so that when the detecting probe 1 is arranged at an oblique angle, the position at which the bottom of the detecting probe 1 is tilted is not detected. The limitation around the top of the aperture aperture; or as shown in the eighth figure, when the stroke of the detection probe 1 is slightly pressed, the bottom end is not deflected, and good pressure contact quality is maintained.

此外,實施時可如圖所示,伸縮探針20之壓觸端231為略為下凹的凹面,以提供檢測探針1壓觸時的定位效果。In addition, as shown in the figure, the press-contact end 231 of the telescopic probe 20 is a slightly concave concave surface to provide a positioning effect when the detecting probe 1 is pressed.

如第六圖所示,所述訊號轉接線4另一端通過導線30設置有一插針40以插接於轉接盤5;該轉接盤5上設置有細密排列的定位穿孔50,各定位穿孔50內分別設置有一呈中空狀且內徑略大於插針40以供插針40插入定位的轉接端子60;使檢測裝置之檢測探針1測得的訊號經訊號轉接線4之伸縮探針20、導線30、插針40、轉接盤5上的轉接端子60傳輸至電腦供作業人員判讀。As shown in the sixth figure, the other end of the signal patch cord 4 is provided with a pin 40 through the wire 30 for plugging into the interposer 5; the interposer 5 is provided with finely arranged positioning perforations 50, each positioning Each of the through holes 50 is provided with a transition piece 60 which is hollow and has an inner diameter slightly larger than the pin 40 for inserting and positioning the pin 40; the signal measured by the detecting probe 1 of the detecting device is expanded and contracted by the signal patch cable 4 The probe 20, the wire 30, the pin 40, and the adapter terminal 60 on the adapter disk 5 are transmitted to a computer for interpretation by the operator.

實施時,所述插針40呈彎折狀而插入轉接端子60後,藉由其彎折所產生的彈性而定位,使插針40不易從轉接端子60中鬆脫。In the implementation, the pin 40 is bent and inserted into the adapter terminal 60, and is positioned by the elasticity generated by the bending, so that the pin 40 is not easily loosened from the adapter terminal 60.

如第九圖所示,所述轉接盤5上細密排列的定位穿孔50呈矩陣排列,該轉接盤5約為100X100mm,穿孔數量約4000~4200個。As shown in the ninth figure, the positioning perforations 50 arranged finely on the interposer 5 are arranged in a matrix. The interposer 5 is about 100×100 mm, and the number of perforations is about 4000-4200.

惟,以上之實施說明及圖式所示,係舉例說明本創作之較佳實施例者,並非以此侷限本創作。是以,舉凡與本創作之構造、裝置、特 徵等近似或相雷同者,均應屬本創作之創設目的及申請專利範圍之內。However, the above description of the embodiments and the drawings are illustrative of the preferred embodiments of the present invention and are not intended to limit the present invention. Therefore, the structure, device, and special The approximation or similarity of the levy shall be within the creation purpose of the creation and the scope of the patent application.

3‧‧‧檢測台3‧‧‧Testing station

4‧‧‧訊號轉接線4‧‧‧Signal patch cord

5‧‧‧轉接盤5‧‧‧Transfer tray

10‧‧‧固定孔10‧‧‧Fixed holes

20‧‧‧伸縮探針20‧‧‧ Telescopic probe

21‧‧‧定位套筒21‧‧‧ Positioning sleeve

22‧‧‧彈簧22‧‧‧ Spring

23‧‧‧頂針23‧‧‧ thimble

231‧‧‧壓觸端231‧‧‧pressure end

30‧‧‧導線30‧‧‧Wire

40‧‧‧插針40‧‧‧pins

50‧‧‧定位穿孔50‧‧‧ Positioning perforation

60‧‧‧轉接端子60‧‧‧Transfer terminal

Claims (5)

一種探針式檢測裝置之訊號轉接線,所述檢測裝置包含一具有細密檢測探針之治具、一設置在治具下方的檢測台、複數根定位在檢測台供檢測探針壓觸連接的細密訊號轉接線,以及一可供各訊號轉接線電連接並且能夠傳輸信號至電腦以供檢測分析之轉接盤,其中,所述檢測台上具有細密排列之固定孔,每一固定孔可供一訊號轉接線設置,其特徵在於:各訊號轉接線其中一端具有一能直接插置在固定孔中的伸縮探針,該伸縮探針包含一固定插置在固定孔中的定位套筒、一設置在定位套筒內的彈簧、以及一設置在定位套筒中受彈簧彈性頂持恆常凸出定位套筒的頂針,所述頂針頂面為壓觸端,該壓觸端凸伸於檢測台頂部端面上,供檢測探針壓觸連接以傳輸訊號。A signal conversion cable of a probe type detecting device, the detecting device comprises a jig having a fine detecting probe, a detecting table disposed under the jig, and a plurality of roots positioned on the detecting table for detecting probe pressure contact a fine signal patch cord, and an adapter disc that can be electrically connected to each of the signal patch cords and capable of transmitting signals to the computer for detection and analysis, wherein the inspection table has finely arranged fixing holes, each fixed The hole is provided for a signal patch cable, wherein each of the signal patch wires has a telescopic probe that can be directly inserted into the fixing hole, and the telescopic probe includes a fixed insertion hole in the fixing hole. a positioning sleeve, a spring disposed in the positioning sleeve, and a thimble disposed in the positioning sleeve by the spring elastically holding the constant protruding positioning sleeve, the top surface of the thimble being a pressure contact end, the pressure contact The end protrudes from the top end surface of the inspection table for the detection probe to press-contact to transmit the signal. 如申請專利範圍第1項所述探針式檢測裝置之訊號轉接線,其中,伸縮探針之壓觸端為略為下凹的凹面,提供檢測探針壓觸時的定位效果。The signal patch cable of the probe type detecting device according to claim 1, wherein the pressing end of the telescopic probe is a slightly concave concave surface, and provides a positioning effect when the detecting probe is pressed. 如申請專利範圍第1或2項中所述探針式檢測裝置之訊號轉接線,其中,訊號轉接線另一端通過導線設置有一插針以插接於轉接盤;該轉接盤上設置有細密排列的定位穿孔,各定位穿孔內分別設置有一呈中空狀且內徑略大於插針以供插針插入定位的轉接端子。The signal patch cable of the probe type detecting device described in claim 1 or 2, wherein the other end of the signal patch cord is provided with a pin through the wire to be inserted into the adapter disk; The positioning perforations are arranged in a fine arrangement, and each of the positioning perforations is respectively provided with a transition terminal which is hollow and has an inner diameter slightly larger than the pin for inserting and positioning the pin. 如申請專利範圍第3項所述探針式檢測裝置之訊號轉接線,其中,所述插針呈彎折狀而插入轉接端子後,藉由其彎折所產生的彈性而定位。The signal patch cord of the probe type detecting device according to claim 3, wherein the pin is bent and inserted into the adapter terminal, and is positioned by the elasticity generated by the bending. 如申請專利範圍第3項所述探針式檢測裝置之訊號轉接線,其中,所述轉接盤上細密排列的定位穿孔呈矩陣排列。The signal patch cord of the probe type detecting device according to claim 3, wherein the finely arranged positioning through holes on the adapter disc are arranged in a matrix.
TW103200819U 2014-01-15 2014-01-15 Signal adapting line of probe detector TWM478824U (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101878560A (en) * 2007-11-30 2010-11-03 Ed企业股份公司 Antenna arrangement and method
TWI574014B (en) * 2015-04-22 2017-03-11 旺矽科技股份有限公司 Probe structure and probe card
TWI645625B (en) * 2017-05-26 2018-12-21 中國探針股份有限公司 High frequency electronic connector

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101878560A (en) * 2007-11-30 2010-11-03 Ed企业股份公司 Antenna arrangement and method
TWI574014B (en) * 2015-04-22 2017-03-11 旺矽科技股份有限公司 Probe structure and probe card
TWI645625B (en) * 2017-05-26 2018-12-21 中國探針股份有限公司 High frequency electronic connector

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