JP2019056653A - Inspection jig and inspection device - Google Patents

Abstract

To allow for quickly inspecting chip parts while preventing damage to chip parts.SOLUTION: An inspection jig comprises a part holding member 2 having a part holder (groove 20) for replaceably holding a chip part 10 to be inspected, contact terminals 3 arranged in a manner that allows tips thereof to touch electrodes of the chip part 10 held by the part holder, a terminal support member 4 for supporting the contact terminals 3, and coupling members 5a, 5b configured to contactably couple the part holding member 2 and the terminal support member 4.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an inspection jig used when inspecting a chip component, and an inspection apparatus including the inspection jig.

  Conventionally, a one-side terminal provided with two contact terminals that are individually brought into contact with one of the electrodes of a pair of electrodes provided under a positional relationship in which chip parts as measurement target samples face each other on the lower surface side In order to make the base, the other side terminal block provided with two contact terminals to be in contact with the other electrode side separately, and the one side terminal block and the other side terminal block corresponding to the lower surface size of the chip component A base that freely supports mutual contact and separation and fixing of the position thereof, wherein one electrode of a chip component is provided on each contact terminal of the one-side terminal block, and one of the other-side terminal blocks is provided on the base. There is known a four-terminal measuring chip component jig in which a pressing member for placing the chip component by placing the other electrode of the chip component in contact with each contact terminal is provided (for example, see Patent Document 1).

JP 2008-26260 A

  According to the above-described technique, the one side terminal block provided with two contact terminals and the other side terminal block provided with two contact terminals are mutually connected and separated so as to correspond to the size of the chip component. And its fixed position can be freely supported on the base side, so measurement by the four-terminal measurement method is possible while making the electrical characteristics of the small chip components of the bottom electrode type well correspond to the size of the chip. is there.

  However, in the inspection jig described above, when holding the chip component between the one-side terminal block and the other-side terminal block, the grind screw that fixes the position of the one-side terminal block to the base side, and the other In the state where the side terminal block is fixed to the base side and the loosening screw is loosened, for example, the one side terminal block is advanced into the space part of the one side support piece part and the inside of the space part of the other side support piece part After the other side terminal block is advanced, it is necessary to stop the one side terminal block and the other side terminal block and fix the position of the chip component by tightening the kneading screws. For this reason, it takes a long time to set the chip component on the terminal block and perform the inspection.

  The objective of this invention is providing the inspection jig | tool provided with the inspection jig | tool which can perform the test | inspection of a chip component in a short time, and the inspection jig | tool.

  In the inspection jig according to the present invention, the tip end portion contacts the component holding member provided with the component holding portion for holding the chip component to be inspected in a removable manner, and the electrode of the chip component held by the component holding portion. The contact terminal is provided, a terminal support member that supports the contact terminal, and a connecting member that connects the component holding member and the terminal support member so as to be able to contact and separate.

  According to this configuration, the tip of the contact terminal is moved to the chip component by applying a pressing force in a direction in which the user holds the chip component on the component holding unit in a direction in which the terminal support member and the component holding member approach each other. Since the part can be inspected by contacting the electrode, this inspection can be performed in a short time.

  It is preferable that the component holding portion is constituted by a groove portion extending from one end portion side of the component holding member toward the arrangement position of the contact terminal.

  According to this configuration, after the user carries the chip component into the groove portion from one end side of the component holding member, the contact terminal is moved by tilting the inspection jig and sliding the chip component along the groove portion. Since the chip component can be easily set at the arranged component inspection position, the chip component can be inspected easily and quickly.

  Moreover, it is preferable that the terminal supporting member is provided with a terminal urging member that urges the tip of the contact terminal in a direction in which the tip of the contact terminal comes into contact with the electrode of the chip component.

  According to this configuration, the tip end portion of the contact terminal can be brought into contact with the electrode with an appropriate pressing force when the chip component is inspected. In addition, even when the user presses the terminal support member and the component holding member so as to approach each other excessively, the tip of the contact terminal bites into the electrode of the chip component by compressing and deforming the terminal biasing member. Can be suppressed.

  Moreover, it is preferable to further include a biasing member that biases the terminal support member in a direction in which the terminal support member is separated from the component holding member.

  According to this configuration, when the inspection of the chip component is completed, the terminal support member and the component holding member can be automatically returned to the initial positions by the urging member. Can be shortened.

  In addition, a pair of first contact terminals are disposed on the first surface side of the component holding member, and a pair of second contact terminals are disposed on the second surface side of the component holding member. The support member may include a first terminal support member that supports the first contact terminal and a second terminal support member that supports the second contact terminal.

  According to this configuration, one of the first contact terminal and the second contact terminal is used as a contact terminal for voltage measurement, and the other of the first contact terminal and the second contact terminal is used as a contact terminal for supplying current. Thus, it is possible to perform an inspection for a four-terminal measurement method with high measurement accuracy.

  The component holding member includes a first component holding plate in which the component holding portion is formed, and a second component holding plate disposed on the second surface side of the first component holding plate. The first component holding plate is formed with the first terminal insertion hole through which the tip of the first contact terminal is inserted, and the tip of the second contact terminal is inserted into the second component holding plate. It is preferable that a second terminal insertion hole is formed.

  According to this configuration, the chip component is held between the first component holding plate and the second component holding plate, and the first terminal insertion hole and the second terminal insertion hole are connected to the first contact terminal and the second component. By being used as a guide hole for the contact terminal, the first contact terminal and the second contact terminal are properly brought into contact with the electrode of the chip component while being properly positioned. Moreover, when a user makes a 1st contact terminal and a 2nd contact terminal contact | abut to the electrode of a chip component, it can reduce effectively a possibility that it may bend to a 1st contact terminal and a 2nd contact terminal.

  The first component holding plate has a protruding portion protruding outward from one end of the second component holding plate, and the component holding portion is formed in a range including the protruding portion, It is preferable that the second surface side of the component inspection position provided in the component holding part is covered with the second component holding plate.

  According to this configuration, the second surface side of the component inspection position provided in the component holding portion is covered with the first component holding plate, so that the chip component disposed at the component inspection position is effectively held. . And since the 2nd surface side of the component holding part provided in the protrusion part is an open state, a user can carry in a chip | tip component easily in the component holding part located in a protrusion part.

  An inspection apparatus according to the present invention electrically connects the above-described inspection jig, an inspection apparatus main body that performs an inspection process of a chip component based on an electric signal transmitted from the contact terminal, and the contact terminal and the inspection apparatus main body. And a conductive member to be connected to each other.

  According to this configuration, it is possible to easily inspect chip components in a short time, and by replacing the inspection apparatus main body connected to the inspection jig through the conductive member with a different model, The inspection jig can be versatile.

  According to the inspection jig having such a configuration and the inspection apparatus including the inspection jig, it is possible to inspect the chip parts in a short time.

It is a side view showing composition of an inspection device which has an inspection jig concerning a first embodiment of the present invention. It is a perspective view which shows the whole structure of an inspection jig. It is a top view which shows the specific structure of a 1st component holding plate. FIG. 4 is a sectional view taken along line IV-IV in FIG. 3 showing a specific configuration of the inspection jig. It is a perspective view which shows schematic structure of the chip component used as a test object. It is an enlarged plan view which shows the specific structure of a groove part. It is sectional drawing which shows the test | inspection state of the chip component by the test | inspection jig | tool shown in FIG. It is a top view which shows the modification of a groove part. It is a top view which shows the modification of the arrangement state of a contact terminal. It is a top view which shows the modification of the chip component used as a test object. It is a top view which shows the example of a test | inspection of the chip components from which a magnitude | size differs. It is sectional drawing which shows the structure of the inspection jig which concerns on 2nd embodiment of this invention. It is sectional drawing which shows the test | inspection state of the chip component by the test | inspection jig | tool shown in FIG.

Embodiments according to the present invention will be described below with reference to the drawings. In addition, the structure which attached | subjected the same code | symbol in each figure shows that it is the same structure, The description is abbreviate | omitted.
(First embodiment)

  FIG. 1 is a side view showing the configuration of an inspection apparatus 7 having an inspection jig 1 according to the first embodiment of the present invention, FIG. 2 is a perspective view showing the overall configuration of the inspection jig 1, and FIG. FIG. 4 is a cross-sectional view taken along the line IV-IV in FIG. 3 showing the specific configuration of the inspection jig 1, and FIG. 5 shows the chip component 10 to be inspected. FIG. 6 is a perspective view showing a schematic configuration, FIG. 6 is an enlarged plan view showing a specific configuration of the groove portion 20, and FIG. 7 is a cross-sectional view showing an inspection state of the chip component 10 by the inspection jig 1 shown in FIG. 1, 4 and 7, the surface of the member located on the lower side of the figure is referred to as the first surface side, and the surface of the member located on the upper side of the drawing is referred to as the second surface side.

  As shown in FIG. 5, a chip component 10 to be inspected includes a chip capacitor body and chip having a chip component body 11 made of a dielectric and a pair of electrodes 12 and 12 provided at both ends in the length direction. It consists of a resistor or a chip inductor.

  As shown in FIG. 1, the inspection jig 1 includes a pair of first contact terminals 31 whose tip portions are arranged so as to be in contact with the first surface side of the electrodes 12 and 12, and tip portions of the electrodes 12 and 12. It has the contact terminal 3 which consists of a pair of 2nd contact terminal 32 arrange | positioned so that a contact is possible on the 2nd surface side. The first contact terminal 31 and the second contact terminal 32 are connected to the inspection apparatus body 70 via a conductive member 71 made of a wire cable or the like, so that one is used as a voltage measurement contact terminal and the other is Are used as contact terminals for supplying current.

  The inspection apparatus main body 70 causes a measurement current to flow between the electrodes 12 and 12 of the chip component 10 via the conductive member 71 and the inspection jig 1 and is generated between the electrodes 12 and 12 of the chip component 10 accordingly. It has a function to detect voltage. The inspection apparatus main body 70 performs the pass / fail judgment of the chip component 10 by comparing the detection voltage, the resistance value between the electrodes 12 and 12 obtained from the detection voltage, and the like with a preset reference value. It is configured as follows.

  The inspection jig 1 includes a component holding member 2 on which a component holding portion that holds a chip component 10 to be inspected in a removable manner, a terminal support member 4 that supports a contact terminal 3, a component holding member 2, and a terminal. It has the connection member 5 which connects the support member 4 so that contact / separation is possible.

  The component holding member 2 has a first component holding plate 21 disposed on the first surface side and a second component holding plate 22 disposed on the second surface side of the component holding member 2. . On the second surface side of the first component holding plate 21, as shown in FIGS. 4 and 6, the groove width corresponding to the width dimension W of the chip component 10 and the groove depth corresponding to the vertical dimension H of the chip component 10. The groove part 20 having the above is formed, and the groove part 20 constitutes a holding part (component holding part) for the chip component 10.

  The first component holding plate 21 has a protruding portion 23 that protrudes outward by a predetermined length S from one end portion (the right end portion in FIG. 4) of the second component holding plate 22, and includes the protruding portion 23. A groove 20 is formed in the range. That is, the groove portion 20 is formed so as to extend from one end portion side of the first component holding plate 21 toward the component inspection position where the contact terminal 3 is disposed. Accordingly, the second surface side of the groove portion 20 formed in the protruding portion 23 is opened, and the second surface side of the component inspection position is covered with the second component holding plate 22.

  Further, as shown in FIG. 6, outwardly extending cutout portions 24 and 24 that serve as carry-in guide portions for the chip component 10 with respect to the groove portion 20 are formed at one end portion of the first component holding plate 21. After the user carries the chip part 10 into the groove part 20 from the notches 24 and 24, the chip part 10 is self-weighted to the innermost part inspection position along the groove part 20 by, for example, tilting the inspection jig 1. It is comprised so that it may slide-displace with.

  A pair of concave holes 27 are formed in the innermost portion of the groove portion 20. The concave holes 27 are provided in order to cut off the corner radius of the groove 20 using a drill or the like. As a result, when the chip component 10 is transferred to the component inspection position, the chip component 10 can be transferred to the innermost portion of the groove 20 without being obstructed by the corner radius.

  As shown in FIG. 7, the first contact terminal 31 and the second contact terminal 32 have a rod-shaped terminal body 30 made of a conductive member and a flange 33 provided at the base end portion thereof. On the first surface side of the component holding member 2, a pair of first contact terminals 31, 31 are arranged at a distance corresponding to the installation interval of the electrodes 12, 12 of the chip component 10. A pair of second contact terminals 32, 32 are arranged on the second surface side of the component holding member 2 at a distance corresponding to the installation interval of the electrodes 12, 12.

  As shown in FIGS. 6 and 7, the first component holding plate 21 has a pair of first terminal insertion holes 25, 25 through which the tip ends of the first contact terminals 31, 31 are inserted. It is formed on the surface side. Further, the second component holding plate 22 is formed with second terminal insertion holes 26, 26 including a pair of through holes through which the tip ends of the second contact terminals 32, 32 are inserted.

  As shown in FIG. 1, the terminal support member 4 includes a first terminal support member 41 that supports the first contact terminals 31, 31 disposed on the first surface side of the component holding member 2, and the component holding member 2. And a second terminal support member 42 that supports the second contact terminals 32 and 32 disposed on the second surface side.

  The first terminal support member 41 includes an inner support plate 41 a disposed on the second surface side and an outer support plate 41 b disposed on the first surface side of the first terminal support member 41. . The inner support plate 41a and the outer support plate 41b are integrally connected by a connecting bolt or the like.

  A base plate 6 having a plurality of support columns 60 is disposed on the first surface side (the lower side in FIG. 1) of the outer support plate 41b. The first terminal support member 41 is supported by the base plate 6 by fixing the outer support plate 41 b to the upper end portion of the support column 60.

  As shown in FIG. 4, a pair of support holes 43, 43 that slidably support the terminal body 30 of the first contact terminal 31 are formed on the second surface side of the inner support plate 41 a. On the other hand, on the first surface side of the inner support plate 41a, a pair of accommodation holes 44, 44 for slidably housing the flange portion 33 of the first contact terminal 31 are formed. Further, a compression coil spring or the like that biases the tip of the first contact terminal 31 in a direction to contact the electrode 12 of the chip component 10 between the flange 33 of the first contact terminal 31 and the outer support plate 41b. A terminal urging member 45 is provided.

  The outer support plate 41b has a function of restricting the first contact terminal 31 and the terminal urging member 45 from dropping from the inner support plate 41a by being installed so as to cover the first surface side of the inner support plate 41a. Have. The outer support plate 41 b is formed with an insertion portion 73 for a conductive member 71 that electrically connects the contact terminal 3 and the inspection apparatus main body 70.

  On the other hand, the second terminal support member 42 includes an inner support plate 42a disposed on the first surface side (the lower side in FIG. 4) and the second surface side of the second terminal support member 42 (the upper side in FIG. 4). ) And the cover plate 42c covering the upper surface of the outer support plate 42b. The inner support plate 42a, the outer support plate 42b, and the cover plate 42c are integrally connected by a connecting bolt or the like.

  Similarly to the inner support plate 41a of the first terminal support member 41, the inner support plate 42a has a pair of support holes 46 and 46 that slidably support the terminal body 30 of the second contact terminal 32, and a second contact. A pair of housing holes 47 and 47 are formed for slidably housing the flange portion 33 of the terminal 32.

  Further, between the flange 33 of the second contact terminal 32 and the outer support plate 42b, a compression coil spring or the like that urges the tip of the second contact terminal 32 in a direction to contact the electrode 12 of the chip component 10 or the like. A terminal biasing member 45 is disposed. Further, an insertion portion 74 for a conductive member 71 that electrically connects the contact terminal 3 and the inspection apparatus main body 70 is formed on the outer support plate 42b.

  As shown in FIG. 4, the connection member 5 includes a first connection member 5 a that connects the first component holding plate 21 and the first terminal support member 41 so as to be able to contact and separate, a second component holding plate 22, and a second terminal. And a second connecting member 5b for connecting the support member 42 so as to be able to contact and separate. The 1st connection member 5a and the 2nd connection member 5b have the same structure except the point arrange | positioned symmetrically up and down. For this reason, the structure of the 1st connection member 5a is demonstrated below, and the description is abbreviate | omitted about the structure of the 2nd connection member 5b.

  The first connecting member 5 a includes a connecting bar 50 that connects the first component holding plate 21 and the first terminal support member 41, a flange plate 51 that is fixed to one end of the first holding member 21 by a mounting bolt, and the like. A flange plate 52 fixed to the end portion by a mounting bolt or the like, and an urging member 53 made of a compression coil spring or the like that urges the first component holding plate 21 in a direction separating the first component holding plate 21 from the first terminal support member 41. ing.

  The outer support plate 41b of the first terminal support member 41 is formed with a holding hole 54 that slidably holds the flange plate 51 on the first surface side (the lower side in FIG. 4). A support hole 55 that slidably supports the connecting bar 50 is formed on the second surface side (the upper side in FIG. 4) of the outer support plate 41b. The diameter of the support hole 55 is larger than the outer diameter of the connecting bar 50 and smaller than the diameters of the biasing member 53 and the flange plate 51. A through hole 56 having a diameter larger than the diameter of the biasing member 53 is formed in the inner support plate 41 a of the first terminal support member 41.

  Further, the first component holding plate 21 is formed with a holding hole 57 for slidably holding the flange plate 52 on the second surface side (the upper side in FIG. 4) of the first component holding plate 21 and is connected to the first component holding plate 21. A support hole 58 for slidably supporting the bar 50 is formed on the first surface side (the lower side in FIG. 4) of the first component holding plate 21. The diameter of the support hole 58 is larger than the outer diameter of the connecting bar 50 and smaller than the diameters of the urging member 53 and the flange plate 52.

  The connecting bar 50 is installed so as to pass through the support hole 55 and the through hole 56 of the first terminal support member 41 and the support hole 58 of the first component holding plate 21. The flange plate 51 is disposed in the holding hole 54 of the first terminal support member 41 and is fixed to one end portion of the connection bar 50. Further, the flange plate 52 is disposed in the holding hole 57 of the first component holding plate 21 and is fixed to the other end of the connecting bar 50. Thereby, the 1st component holding plate 21 and the 1st terminal support member 41 are connected via the 1st connection member 5a so that contact / separation is possible.

  The urging member 53 is externally fitted to the connecting bar 50 and is disposed between the outer support plate 41 b of the first terminal support member 41 and the first component holding plate 21, so that the first terminal support member 41 and the first component holding plate 21 are biased in a direction in which they are separated from each other.

  In a normal state, that is, in an initial state before the user applies an external force in a direction in which the first terminal support member 41 and the first component holding plate 21 are approached, the first component holding plate is set according to the biasing force of the biasing member 53. 21 and the inner support plate 41a are separated by a predetermined distance. Further, the first terminal support member 41 and the first component holding plate 21 are connected to each other by the flange plate 51 and the flange plate 52 coming into contact with the bottoms of the holding hole 54 and the holding hole 57.

  In the initial state, the tip ends of the first contact terminal 31 and the second contact terminal 32 are in the first terminal insertion hole 25 of the first component holding plate 21 and the second terminal insertion hole 26 of the second component holding plate 22. It is arranged so as to face the electrode 12 of the chip component 10 in a state of being inserted into the chip component 10.

  As shown in FIGS. 3 and 4, a plurality of pieces (four in the illustrated example) are provided on the second surface side, that is, the upper surface side facing the second component holding plate 22, at the corner portion of the first component holding plate 21. The connecting pin 28 of the book is projectingly provided. Further, an insertion hole 29 into which the tip of the connecting pin 28 is inserted is formed on the first surface side of the second component holding plate 22, that is, on the lower surface side of the second component holding plate 22 facing the first component holding plate 21. Is formed.

  Then, when the distal end portion of the connecting pin 28 is inserted into the insertion hole 29, the first component holding plate 21 and the second component holding plate 22 are restricted from being displaced relative to each other in the horizontal direction. It is connected so that separation is possible. In this way, the component holding member 2 including the first component holding plate 21 and the second component holding plate 22, the first terminal support member 41 having the inner support plate 41a and the outer support plate 41b, the inner support plate 42a and the outer side. The inspection jig 1 in which the second terminal support member 42 having the support plate 42b is integrally connected via the connecting member 5 or the like is configured.

  When inspecting the chip component 10 using the inspection jig 1 having the above-described configuration, the user can connect the chip component with the inspection apparatus body 70 and the inspection jig 1 connected via the conductive member 71. 10 is carried along the notches 24 and 24 into the groove 20. Next, when the user tilts the inspection jig 1, the chip component 10 is slid to the component inspection position according to its own weight, and is set at the component inspection position. Note that after the user places the chip component 10 on the groove 20, the chip component 10 may be pushed into the component inspection position using a bar or the like.

  Then, with the base plate 6 of the inspection jig 1 placed on a desk or the like, the user presses the cover plate 42c of the second terminal support member 42 downward as indicated by an arrow Y in FIG. The urging member 53 is compressed according to the pressing force, so that the second terminal support member 42 approaches the second component holding plate 22 and the first component holding plate 21 is moved to the first terminal support member 41. Relative displacement to approach. The pressing force may be applied in a direction in which the first terminal support member 41 and the second terminal support member 42 are approached while the user holds the inspection jig 1 from above and below.

  As described above, when the first terminal support member 41 is relatively displaced so as to approach the first component holding plate 21, the tip end portion of the first contact terminal 31 is moved to the first terminal insertion hole 25 as shown in FIG. 7. And contact with the first surface of the electrode 12 of the chip component 10 to be inspected. Further, when the second terminal support member 42 is relatively displaced so as to approach the second component holding plate 22, the tip end portion of the second contact terminal 32 descends along the second terminal insertion hole 26, and the chip component 10. It contacts the second surface side of the electrode 12.

  After the tips of the pair of first contact terminals 31 and the pair of second contact terminals 32 are brought into contact with the electrodes 12 of the chip component 10, when the user further presses the cover plate 42 c downward, the terminal biasing member 45 is moved. Compressed and deformed. Accordingly, the tip portions of the first contact terminal 31 and the second contact terminal 32 are prevented from biting into the electrode 12 of the chip component 10, and the first contact terminal 31 and the second contact point of the electrode 12 of the chip component 10 are suppressed. The contact terminal 32 is brought into pressure contact with an appropriate pressing force.

  In the above state, for example, a measurement current is supplied between the electrodes 12 and 12 of the chip component 10 from the pair of first contact terminals 31 via the conductive member 71. Further, the voltage generated between the electrodes 12 and 12 of the chip component 10 in response to the measurement current is output from the pair of second contact terminals 32 to the inspection apparatus main body 70 via the conductive member 71, so that the chip component is output. Ten pass / fail judgments can be executed.

  As described above, the tip end portion contacts the component holding member 2 provided with the groove portion (component holding portion) 20 for holding the chip component 10 to be inspected in a removable manner and the electrode 12 of the chip component 10 held in the groove portion 20. Inspection treatment provided with a contact terminal 3, a terminal support member 4 for supporting the contact terminal 3, and a connecting member 5 for connecting the component holding member 2 and the terminal support member 4 so as to be able to contact and separate. The tool 1 has an advantage that the chip component 10 can be inspected in a short time compared to the background art.

  In other words, in the above-described embodiment, the component holding portion including the groove portion 20 having the groove width corresponding to the width dimension W of the chip component 10 and the groove depth corresponding to the vertical dimension H of the chip component 10 is the component holding member 2. Since it is formed so as to extend toward the component inspection position where the contact terminal 3 is disposed from one end portion side, the user carries the chip component 10 into the groove portion 20 from one end portion side of the component holding member 2. The chip component 10 can be easily set at the component inspection position where the contact terminals 3 are disposed by, for example, inclining the inspection jig 1 and slidingly displacing the chip component 10 along the groove 20.

  Then, when the user applies a pressing force in a direction in which the terminal support member 4 and the component holding member 2 connected by the connecting member 5 are approached, the tip of the contact terminal 3 is brought into contact with the electrode 12 of the chip component 10. Since the above inspection can be performed in contact with each other, the chip component 10 can be inspected easily and quickly. Moreover, since the contact force of the contact terminal 3 with respect to the electrode 12 of the chip component 10 can be appropriately adjusted by adjusting the pressing force by the user, there is an advantage that damage to the chip component 10 can be effectively suppressed. is there.

  When the terminal urging member 45 formed of a compression coil spring or the like is provided on the terminal support member 4 as described above to urge the contact terminal 3 toward the chip component 10, the chip component At the time of inspection 10, the tip of the contact terminal 3 can be brought into contact with the electrode 12 with an appropriate pressure contact force. In addition, when the user applies a pressing force so that the terminal support member 4 and the component holding member 2 are excessively approached, the terminal urging member 45 is compressed and deformed, whereby the electrode 12 of the chip component 10 is compressed. It can suppress that the front-end | tip part of the contact terminal 3 bites into. As a result, there is an advantage that the risk of component damage can be effectively reduced.

  Note that the urging member 53 that urges the terminal support member 4 in the direction of separating from the component holding member 2 is omitted, and the terminal support member 4 and the component holding member 2 are moved closer to or away from each other by a manual operation of the user. It is also possible to configure. However, with this configuration, every time the chip component 10 is put in and out, the user has to operate the terminal support member 4 so as to be separated from the component holding member 2, and this operation is complicated.

  On the other hand, when the inspection jig 1 is provided with the urging member 53 that urges the terminal support member 4 in the direction away from the component holding member 2 as described above, the chip component 10 is inspected. When the operation is completed, the terminal support member 4 and the component holding member 2 can be automatically returned to the initial positions according to the urging force of the urging member 53. For this reason, the chip component 10 can be easily taken in and out, and the time required for the inspection can be further shortened. The urging member 53 does not necessarily have to be fitted around the connecting bar 50, and the urging member can be disposed at an appropriate position between the terminal support member 4 and the component holding member 2.

  In the first embodiment described above, the pair of first contact terminals 31, 31 are disposed on the first surface side of the component holding member 2, and the pair of second contacts are disposed on the second surface side of the component holding member 2. A first terminal support member 41 for arranging the terminals 32 and 32 and supporting the first contact terminals 31 and 31 and a second terminal support member 42 for supporting the second contact terminals 32 and 32 are provided. According to this configuration, one of the first contact terminals 31, 31 and the second contact terminals 32, 32 is used as a contact terminal for voltage measurement, and the first contact terminals 31, 31 and the second contact terminals 32, By using the other of 32 as a contact terminal for supplying current, an inspection for a four-terminal measurement method with high measurement accuracy can be performed.

  Furthermore, it has a first component holding plate 21 in which the component holding portion comprising the groove portion 20 is formed as described above, and a second component holding plate 22 installed so as to cover the second surface side of the groove portion 20, In addition, according to the configuration in which the first terminal insertion hole 25 is formed in the first component holding plate 21 and the second terminal insertion hole 26 is formed in the second component holding plate 22, the chip component 10 is replaced with the first component holding plate. By being disposed between 21 and the second component holding plate 22, it can be stably held.

  Then, by using the first terminal insertion hole 25 and the second terminal insertion hole 26 as guide holes for the first contact terminal 31 and the second contact terminal 32, the first contact terminal 31 and the second contact terminal 32 are respectively used. It can be properly positioned and brought into contact with the electrode 12 of the chip component 10. Further, when the first contact terminal 31 and the second contact terminal 32 are brought into contact with the electrode 12 of the chip component 10, the possibility that the first contact terminal 31 and the second contact terminal 32 may be bent is reduced. There is also an advantage that it can be effectively protected.

  Further, the first component holding plate 21 is provided with a protruding portion 23 protruding outward from one end portion of the second component holding plate 22, and the groove portion 20 is formed in a range including the protruding portion 23. According to the above-described embodiment in which the second surface side of the component inspection position provided in 20 is covered by the second component holding plate 22, the chip component 10 disposed at the component inspection position is held by the first component. The plate 21 can be effectively protected. And since the 2nd surface side of the groove part 20 provided in the protrusion part 23 is made into the open state, the user can carry in the chip | tip component 10 in the groove part 20 located in the protrusion part 23 easily.

  The configuration of the contact terminal 3 is not limited to the first embodiment described above, and various modifications can be made. For example, a biasing member that has a plunger made of a conductor and a cylindrical body that is slidably supported by the plunger and that biases the plunger tip in a direction that protrudes out of the cylindrical body is cylindrical. You may use the contact terminal arrange | positioned in the body. In addition, the conductive member 71 is connected to the proximal end portion of the cylindrical body made of a conductor, the distal end portion of the cylindrical body is disposed so as to be in contact with the electrode 12 of the chip component 10, and a part of the cylindrical body It is also possible to use a contact terminal configured to cause the spiral spring portion formed in the above to function as an urging member.

  In the first embodiment described above, the component holding member 2 is provided with a component holding portion including the groove portion 20 having a groove width corresponding to the width dimension W of the chip component 10, and the chip component 10 is disposed along the groove portion 20. Although the example configured to carry in in the length direction has been described, the shape and size of the component holding portion are not limited to this, and various changes can be made.

  FIG. 8 is a plan view showing a modification of the groove 20a, FIG. 9 is a plan view showing a modification of the arrangement state of the contact terminals, and FIG. 10 is a plan view showing a modification of the chip component to be inspected. FIG. 11 is a plan view showing an inspection example of chip parts having different sizes.

  In the modification shown in FIG. 8, the chip component 10 is configured to be conveyed in the width direction along the groove portion 20 a having a groove width corresponding to the entire length L of the chip component 10. The first contact terminals 31 and 31 and the second contact terminals 32 and 32 are arranged so as to face each other in the width direction of the groove 20a, so that the electrodes 12 and 12 of the chip component 10 can be contacted. Has been.

  In addition, arrangement | positioning, the number, etc. of the 1st contact terminal 31 and the 2nd contact terminal 32 are not restricted to the above-mentioned 1st embodiment, A various change is possible. For example, the inspection by the two-terminal measurement method may be performed using only one of the first contact terminal 31 and the second contact terminal 32.

  Further, as shown in FIG. 9, four contact terminals 3a to 3d are arranged on the first surface side of the component holding member 2, and the contact terminals 3a and 3c are used as voltage measurement contact terminals. Further, by using the remaining contact terminals 3b and 3d as contact terminals for supplying current, an inspection for a four-terminal measurement method with high measurement accuracy may be performed. Needless to say, four contact terminals 3 a to 3 d may be disposed on the second surface side of the component holding member 2.

  In this way, when the four contact terminals 3a to 3d are arranged on either the first surface side or the second surface side of the component holding member 2, as shown in FIG. The chip component 10a in which the electrodes 13 and 13 are formed only on one surface side of the chip component body 11 can also be measured by the four-terminal measurement method.

  Further, four contact terminals 3a to 3d are arranged on both the first surface side and the second surface side of the component holding member 2, respectively, and these are connected to the inspection apparatus main body by the conductive member 71, respectively. May be. For example, if the contact terminals 3a and 3b are arranged to be in contact with one of the electrodes 12 and 12, and the contact terminals 3c and 3d are arranged to be in contact with the other of the electrodes 12 and 12, the contact terminal 3a , 3b or any one of the contact terminals 3c, 3d can be inspected of the chip component 10 by bringing the other one into contact with the electrode 12 even when the other cannot be brought into contact with the electrode 12. .

  Further, when the four contact terminals 3 a to 3 d are arranged on both the first surface side and the second surface side of the component holding member 2, the electrode 13 is formed only on one surface side of the chip component body 11. , 13 when inspecting the chip component 10a, among the four contact terminals 3a to 3d disposed on either the first surface side or the second surface side of the component holding member 2, Measurement by the four-terminal measurement method can be performed by bringing the two electrodes into contact with one of the electrodes 12 and 12 and the other two electrodes in contact with the other of the electrodes 12 and 12. In this case, the four contact terminals 3a to 3d can be brought into contact with the electrodes 13 and 13 regardless of whether the electrodes 13 and 13 of the chip component 10a are located on either the first surface side or the second surface side. it can. As a result, when the user attaches the chip component 10a to the inspection jig 1, it is not necessary to consider the orientation of the chip component 10a, and the convenience for the user is improved.

  Further, the inspection apparatus 7 according to the present invention includes an inspection jig 1 having the above-described configuration, an inspection apparatus body 70 that performs an inspection process on the chip component 10 based on an electrical signal transmitted from the contact terminal 3, and a contact terminal. 3 and the inspection device body 70 are electrically connected to each other, so that the chip component 10 can be easily inspected in a short time and the chip component 10 can be damaged. Can be reduced.

  Then, by replacing the inspection apparatus main body 70 connected to the inspection jig 1 via the conductive member 71 with a different model, the inspection jig 1 according to the present invention is applied to an inspection apparatus having various functions. There is an advantage that the inspection jig 1 can have versatility.

  In order to give the inspection jig 1 more excellent versatility, a plurality of types of component holding members 2 formed in different shapes and sizes corresponding to various chip components 10 are previously provided. It is desirable to configure so that one of them is selected and can be attached to and detached from the inspection jig 1. For example, in the state where the first component holding plate 21 and the second component holding plate 22 constituting the component holding member 2 are separated, the second component holding plate 22 is replaced with one having the groove portions 20 having different groove widths. It is possible to inspect chip components 10 having different width dimensions.

  Further, as shown in FIG. 11, a plurality (four in the illustrated example) of contact terminals 3 </ b> A to 3 </ b> D along the groove 20 on one or both of the first surface side and the second surface of the component holding member 2. Are arranged at predetermined intervals, and a pair of contact terminals arranged at a distance corresponding to the installation interval of the electrodes 12, 12 provided on the chip component 10 are selected and connected to the inspection apparatus main body 70. May be.

For example, when inspecting the small chip component 10A, the contact terminal 3A and the contact terminal 3B having a small separation distance are selected and connected to the inspection apparatus main body 70 by the conductive members 71A and 71B. Further, when inspecting the large chip component 10D, the contact terminal 3A and the contact terminal 3D having a large separation distance are selected and connected to the inspection apparatus main body 70 by the conductive members 71A and 71D. As a result, it is possible to inspect various chip components 10 </ b> A, 10 </ b> D, and the like having different width dimensions only by changing the conductive member 71 connected to the inspection apparatus main body 70.
(Second embodiment)

  12 is a cross-sectional view showing a configuration of an inspection jig 1A according to the second embodiment of the present invention, and FIG. 13 is a cross-sectional view showing an inspection state of a chip component by the inspection jig 1A shown in FIG. .

  In the inspection jig 1 </ b> A according to the second embodiment, the contact terminal 34 </ b> A made of a wire probe formed of a tungsten wire or the like having appropriate conductivity and elasticity has a first terminal support member 41 and a second terminal support member 42. Are each supported. Further, the first component holding plate 21 and the second component holding plate 22 are respectively formed with a first terminal insertion hole 25A and a second terminal insertion hole 26A through which the tip of the contact terminal 34A is inserted. Further, conductive members 71 are connected to the base end portions of the respective contact terminals 34A.

  The connecting bar 50A of the connecting member 5A that connects the component holding member 2 and the terminal support member 4 so as to be able to contact and separate is connected to the inner support plate 41a of the first terminal support member 41 and the inner support plate 42a of the second terminal support member 42. Each is supported so as to be slidable along the formed through-hole 56A. Further, the flange plate 51A provided at the base end portion of the connection bar 50A is respectively inserted into the holding holes 54A formed in the outer support plate 41b of the first terminal support member 41 and the outer support plate 42a of the second terminal support member 42. It is slidably held. Furthermore, the tip of the connecting bar 50A is fixed to the first surface side of the first component holding plate 21 and the second surface side of the second component holding plate 22 via fixing bolts 59A.

  The urging members 53A for urging the component holding member 2 in the direction of separating from the terminal support member 4 are respectively held by the inner support plate 41a of the first terminal support member 41 and the inner support plate 42a of the second terminal support member 42. A cylindrical body 531, a push bar 532 slidably supported by the cylindrical body 531, and a flange portion 533 provided at the base end of the push bar 532 are attached to the distal end side of the push bar 532. And a biasing spring 534 for biasing.

  In an initial state before the user operates the terminal support member 4 and the component holding member 2 to approach each other, the distal end portion of the push rod 532 protrudes outside the cylindrical body 531 according to the urging force of the urging spring 534. ing. Then, the terminal support member 4 and the component holding member 2 are held apart by pressing the tip of the push rod 532 against the component holding member 2. Specifically, when the first component holding plate 21 is pressed upward by the lower push rod 532 in FIG. 12, the inner support plate 41a of the first terminal support member 41 and the first component holding plate A predetermined gap is formed between the two. Further, when the second component holding plate 22 is pressed downward by the upper push bar 532 in FIG. 12, the inner support plate 42 a of the second terminal support member 42 and the second component holding plate 22 are interposed. A predetermined gap is formed.

  In the initial state, the flange plate 51 </ b> A of the lower connecting member 5 </ b> A is in contact with the first surface side of the first terminal support member 41, so that the inner support plate of the first terminal support member 41. The gap between 41a and the first component holding plate 21 is regulated to be a constant value. Further, when the flange plate 51A of the upper connecting member 5A is in contact with the second surface side of the second terminal support member 42, the inner support plate 42a of the second terminal support member 42 and the second component The gap with the holding plate 22 is regulated to be a constant value.

  When the user pushes the chip component 10 in the direction in which the terminal support member 4 and the component holding member 2 are approached in a state where the chip component 10 is set at the component inspection position of the component holding member 2, the biasing force of the biasing spring 534 is resisted. Then, the distal end portion of the push rod 532 is pushed into the cylindrical body 531, and the connecting bar 50A is slid to the proximal end side along the through hole 56A.

  As a result, the second terminal support member 42 approaches the second component holding plate 22 and the first component holding plate 21 is relatively displaced so as to approach the first terminal support member 41, as shown in FIG. In addition, the tip of each contact terminal 34 </ b> A slides and displaces along the first terminal insertion hole 25 </ b> A and the second terminal insertion hole 26 </ b> A and contacts the electrode 12 of the chip component 10.

  As shown in the second embodiment, when the contact terminal 34A made of a wire probe having appropriate elasticity is used, the contact terminal 34A is elastically deformed in accordance with the pressure acting when the chip component 10 is inspected. Can do. Therefore, as shown in the first embodiment, the electrode of the chip component 10 is provided without providing the terminal urging member 45 that urges the tip of the contact terminal 3 in the direction in which the tip of the contact terminal 3 abuts the electrode 12 of the chip component 10. 12, the contact terminal 34A is brought into pressure contact with a predetermined pressing force, whereby the chip component 10 can be properly inspected.

  In the second embodiment, the connecting member 5 </ b> A that connects the component holding member 2 and the terminal support member 4 so as to be able to come into contact with and separate from each other, and the biasing member that biases the component holding member 2 in the direction of separating from the terminal support member 4. Since 53A is provided separately, the component holding member 2 can be properly biased by the biasing member 53A in a state where the component holding member 2 and the terminal support member 4 are accurately positioned by the connecting member 5A. is there.

DESCRIPTION OF SYMBOLS 1,1A Inspection jig 2 Component holding member 3,3a-3d, 3A-3D Contact terminal 4 Terminal support member 5,5A Connection member 6 Base plate 7 Inspection apparatus 10 Chip component 11 Chip component main body 12 Electrode 20 Groove part 21 First component Holding plate 22 Second component holding plate 23 Projection portion 24, 24 Notch portion 25, 25A First terminal insertion hole 26, 26A Second terminal insertion hole 27 Concave hole 28 Connecting pin 29 Insertion hole 30 Terminal body 31 First contact terminal 32 second contact terminal 33 collar 34A contact terminal 41 first terminal support member 41a inner support plate 41b outer support plate 42 second terminal support member 42a inner support plate 42b outer support plate 42c cover plate 43 support hole 44 receiving hole 45 terminal Energizing member 46 Support hole 47 Accommodation hole 50, 50A Connection bar 51, 51A, 52 Flange plate 53, 3A biasing member 54,54A holding hole 55 supporting holes 56,56A through hole 57 holding hole 58 supporting hole 59A fixing bolt 60 struts 70 testing device body 71 conductive member 531 cylindrical body 532 push rod 533 flange

Claims (8)

A component holding member provided with a component holding unit for holding a chip component to be inspected in a removable manner;
A contact terminal disposed such that a tip portion can come into contact with an electrode of the chip component held by the component holding portion;
A terminal support member for supporting the contact terminal;
An inspection jig comprising: a connecting member that connects the component holding member and the terminal support member so as to be able to contact and separate.   The inspection jig according to claim 1, wherein the component holding portion is configured by a groove portion extending from one end portion side of the component holding member toward a position where the contact terminal is disposed.   The inspection jig according to claim 1, wherein the terminal support member is provided with a terminal urging member that urges the tip of the contact terminal in a direction in which the tip of the contact terminal abuts against an electrode of the chip component.   The inspection jig according to any one of claims 1 to 3, further comprising a biasing member that biases the terminal support member in a direction in which the terminal support member is separated from the component holding member. A pair of first contact terminals are disposed on the first surface side of the component holding member, and a pair of second contact terminals are disposed on the second surface side of the component holding member,
The terminal support member includes a first terminal support member that supports the first contact terminal and a second terminal support member that supports the second contact terminal. The inspection jig described in 1. The component holding member includes a first component holding plate on which the component holding portion is formed, and a second component holding plate disposed on the second surface side of the first component holding plate,
In the first component holding plate, the first terminal insertion hole through which the tip of the first contact terminal is inserted is formed,
The inspection jig according to claim 5, wherein a second terminal insertion hole through which the tip of the second contact terminal is inserted is formed in the second component holding plate. The first component holding plate has a protruding portion protruding outward from one end of the second component holding plate,
The component holding portion is formed in a range including the protruding portion,
The inspection jig according to claim 6, wherein the second surface side of the component inspection position provided in the component holding portion is covered with the second component holding plate. The inspection jig according to any one of claims 1 to 7,
An inspection apparatus main body for inspecting chip parts based on an electrical signal transmitted from the contact terminal;
An inspection apparatus comprising: a conductive member that electrically connects the contact terminal and the inspection apparatus main body.

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