CN215180488U - Chip resistor test fixture - Google Patents

Abstract

The application discloses chip resistor test fixture, it includes: a base (1) comprising a carrying surface (10) for carrying a chip resistor (6); a first slider (30) which is slidably coupled to the base (1) and is provided with a first test pin (21) for testing the chip resistor (6); a first elastic member (220) for driving the first test pin (21) to abut against the first electrode (60) of the chip resistor (6); the second sliding block (40) is in sliding fit with the base (1) and is provided with a second test needle (31) for testing the chip resistor (6); and a second elastic member (221) for driving the second test pin (21) to abut against the second electrode (61) of the chip resistor (6). The chip resistor test fixture is simple in structure, convenient to operate, capable of guaranteeing the reliability of contact, beneficial to reliable testing and capable of obtaining accurate test results.

Description

Chip resistor test fixture

Technical Field

The application relates to the technical field of resistance testing, especially, relate to a chip resistor test fixture.

Background

At present, a four-wire method is generally used for measuring the resistance value, the four-wire method is used for splitting a current loading wire and a voltage testing wire to form a four-measuring-pin type test, the influence of contact resistance and wire resistance can be well avoided, and the four-wire type test has the advantages of high sensitivity and accurate measurement.

When measuring resistance value among the prior art, often adopt test fixture to assist and measure, current test fixture can only test the chip resistor of specific size usually, can't test the chip resistor of different specifications and sizes to its structure is complicated, and the operation is inconvenient, needs to improve.

In addition, the small-package chip resistor is small in size and affected by the size of the test pin, so that it is difficult to test the small-package chip resistor with the next four test pins at the same time. And the small resistance resistor needs the loading of great electric current, under the prerequisite of guaranteeing that electric current and voltage test needle are not contact each other, on the one hand: when the current is loaded, if the test needle is too small, the overcurrent is limited to a certain extent, and on the other hand: if the test pin is too large, the voltage test pin may contact the current test pin, and the resistance test result may be disturbed. In addition, because of the four-pin test, when a product with small resistance is tested, the current distribution problem of the product may exist, and the voltage sampling point value is deviated.

SUMMERY OF THE UTILITY MODEL

To the weak point that exists in the above-mentioned technique, this application provides a chip resistor test fixture, and its simple structure can conveniently test chip resistor.

In order to solve the technical problem, the technical scheme adopted by the application is as follows: a chip resistor test fixture comprises:

the base comprises a bearing surface for bearing the chip resistor;

the first sliding block is in sliding fit with the base and is provided with a first testing needle for testing the chip resistor;

a first elastic member for driving the first test pin to abut against the first electrode of the chip resistor;

the second sliding block is matched and connected on the base in a sliding mode and is provided with a second testing needle used for testing the chip resistor; and

and the second elastic piece is used for driving the second test needle to abut against the second electrode of the chip resistor.

Furthermore, a first sliding groove is formed in the base, the first sliding block is connected in the first sliding groove in a matching mode, and the first elastic piece is arranged in the first sliding groove.

Further, the first sliding groove is communicated with the first outer side face of the base.

Further, the chip resistor test fixture further comprises a first fixing plate connected to the first outer side face, and two ends of the first elastic piece are respectively abutted to the first fixing plate and the first sliding block.

Further, first spout includes spacing slot part and communicates spacing slot part with the direction slot part of loading surface, first slider including match in spacing portion in the spacing slot part with match in the direction slot part guide part.

Further, the first slider further comprises a plate portion connected to the guide portion, and the bottom surface of the plate portion is attached to the bearing surface.

Further, the chip resistor test fixture further comprises:

the third sliding block is matched and connected on the base in a sliding mode and is provided with a first fixing piece;

the third elastic piece is used for driving the first fixing piece to be abutted against the first side face of the chip resistor;

the fourth sliding block is matched and connected on the base in a sliding mode and is provided with a second fixing piece; and

and the fourth elastic piece is used for driving the second fixing piece to be abutted against the second side face of the chip resistor.

Further, the first test needle and the second test needle are arranged coaxially; the first fixing piece and the second fixing piece are arranged coaxially.

Further, the position of the first test needle on the first slide block is adjustable; the position of the first fixing piece on the third sliding block is adjustable.

Furthermore, the first sliding block and the third sliding block are respectively provided with a mounting hole and an adjusting hole communicated with the mounting holes, the test needle or the fixing piece is mounted in the mounting holes of the respective sliding blocks, and a bolt for fixing the test needle or the fixing piece is screwed in the adjusting holes.

Compared with the prior art, the application has the beneficial effects that:

1. the chip resistor testing jig has the advantages that the elastic piece drives the sliding block, so that the testing needle on the sliding block is kept in contact with the electrode of the chip resistor, the structure is simple, the operation is convenient, the contact reliability can be guaranteed, the testing can be reliably carried out, and an accurate testing result can be obtained;

2. the chip resistor testing jig further comprises fixing pieces which are used for clamping two sides of the chip resistor through the elastic pieces, so that the chip resistor can be better positioned, the problem of poor test caused by displacement of the chip resistor is solved, the chip resistor testing jig can adapt to the chip resistors with different sizes, and the universality of the chip resistor testing jig is improved;

3. in this application, the test needle including be located the voltage test body at center, the cladding in voltage test external insulating layer and cladding in the outside current loading layer of insulating layer for voltage test body and current loading layer are integrated on a test needle, very big reduction the volume of test needle, can be better carry out the four-wire method to small-size chip resistor and test, are favorable to obtaining more accurate test result.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts. Wherein:

fig. 1 is a schematic structural diagram of a chip resistance test fixture according to the present application.

Fig. 2 is a schematic structural diagram of a base in the present application.

Fig. 3 is a schematic structural diagram of a chip resistor in the present application.

Fig. 4 is a schematic view of the slide block in the present application fitted in the slide groove.

Fig. 5 is a top view of the chip resistance test fixture of the present application.

Fig. 6 is a schematic diagram of the chip resistance testing fixture of the present application when the base is not shown.

Fig. 7 is a schematic view of the structure of the test pin in the present application.

Fig. 8 is a front view of a test pin in the present application.

Fig. 9 is a cross-sectional view of the front end portion of the test pin in the present application.

Figure 10 is a schematic view of the construction of the fastener of the present application.

Fig. 11 is a schematic view of the test pin and slider connection of the present application.

Detailed Description

In order to make the aforementioned objects, features and advantages of the present application more comprehensible, embodiments accompanying the present application are described in detail below with reference to the accompanying drawings. It is to be understood that the specific embodiments described herein are merely illustrative of the application and are not limiting of the application. It should be further noted that, for the convenience of description, only some of the structures related to the present application are shown in the drawings, not all of the structures. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

The terms "comprising" and "having," as well as any variations thereof, in this application are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

As shown in fig. 1, a chip resistor testing fixture according to a preferred embodiment of the present invention includes a base 1, where the base 1 is a mounting carrier for other components and is made of an insulating material, and preferably, made of a high temperature resistant insulating material, so as to prevent the test result from being affected, and improve durability and service life.

As shown in fig. 2, the base 1 is provided with a carrying surface 10 for placing the chip resistor 6, and the chip resistor 6 is tested on the carrying surface 10, in this embodiment, the carrying surface 10 is the upper surface of the base 1.

With further reference to fig. 3, two electrodes, namely a first electrode 60 and a second electrode 61, are disposed at two ends of the chip resistor 6, and the chip resistor 6 further includes two side surfaces, namely a first side surface 62 and a second side surface 63, between the two electrodes.

Four sliding grooves are formed in the bearing surface of the base 1, and are arranged in a cross shape and respectively include a first sliding groove 11a, a second sliding groove 11b, a third sliding groove 11c and a fourth sliding groove 11 d. The four sliding grooves extend towards the center of the carrying surface 10, but do not intersect with each other, so as to leave a space for placing the chip resistor 6.

A sliding block and an elastic piece for driving the sliding block to move towards the chip resistor 6 at the center of the bearing surface 10 are matched and connected in the four sliding grooves in a sliding mode. Specifically, the four sliders are a first slider 20 fitted in the first slide groove 11a, a second slider 30 fitted in the second slide groove 11b, a third slider 40 fitted in the third slide groove 11c, and a fourth slider 50 fitted in the fourth slide groove 11d, respectively.

The structures of the four sliding grooves and the structures of the four sliding blocks are not necessarily the same, and the sliding blocks only need to slide along the sliding grooves and cannot be separated from the sliding grooves. In this embodiment, the four sliding grooves are designed in the same structure, and correspondingly, the structures of the four sliding blocks are also the same.

Specifically, as shown in fig. 4, in the present embodiment, the sliding groove includes a limiting groove portion 110 and a guide groove portion 111 communicating the limiting groove portion 110 and the bearing surface 10. The slider includes a stopper 200 fitted in the stopper groove 110, a guide 201 fitted in the guide groove 111, and a plate 202 connected to an upper end of the guide 201.

The width of the limiting groove 110 is greater than that of the guiding groove 111, that is, the width of the limiting portion 200 is greater than that of the guiding groove 111, so that the slider does not get away from the sliding slot upwards, and can only slide along the sliding slot. In the present embodiment, the cross-sectional shapes of the stopper groove portion 110 and the stopper portion 200 are both circular, but in other embodiments, they may be provided in other shapes.

The width of the plate portion 202 is larger than that of the guide portion 201, and the bottom surface 202a thereof is in contact with the bearing surface 10, so that the positional accuracy of the slider can be improved.

In order to facilitate the loading of the slider into the chute, the chute is arranged to communicate with the outer side of the base 1, and specifically, as shown in fig. 2 and 5, the base 1 includes four outer sides, namely a first outer side 1a, a second outer side 1b, a third outer side 1c and a fourth outer side 1d, which surround the bearing surface 10 and form a rectangle with each other, wherein the first outer side 1a and the second outer side 1b are parallel, and the third outer side 1c and the fourth outer side 1d are parallel. The first sliding groove 11a communicates with the first outer side surface 1a, the second sliding groove 11b communicates with the second outer side surface 1b, the third sliding groove 11c communicates with the third outer side surface 1c, and the fourth sliding groove 11d communicates with the fourth outer side surface 1 d. Like this, the slider can be followed the spout and be located the opening part of lateral surface and pack into, and it is more convenient to install.

In order to prevent the sliding block from separating from the sliding groove from the outer side surface, a fixing plate is detachably connected to each outer side surface of the base 1 through a bolt, and an opening of the sliding groove located on the outer side surface is sealed through the fixing plate. Specifically, the four fixing plates are a first fixing plate 230 connected to the first outer side surface 1a, a second fixing plate 231 connected to the second outer side surface 1b, a third fixing plate 232 connected to the third outer side surface 1c, and a fourth fixing plate 233 connected to the fourth outer side surface 1d, respectively. The base 1 may also be provided with a plurality of notches 12 (see fig. 1) to save material and reduce the weight of the base 1.

As mentioned above, the number of the elastic members is four, and the elastic members are disposed in the sliding grooves. The elastic element is in a compression state, and two ends of the elastic element are respectively propped against the fixed plate and the corresponding sliding block, so that the force for driving the sliding block to move towards the chip resistor 6 is exerted. The four elastic members are a first elastic member 220 installed in the first chute 11a, a second elastic member 221 installed in the second chute 11b, a third elastic member 222 installed in the third chute 11c, and a fourth elastic member 223 installed in the fourth chute 11d, respectively.

In a preferred embodiment, the elastic member is a spring.

As shown in fig. 5 and 6, the first slider 20 and the second slider 30 are respectively provided with a first testing needle 21 and a second testing needle 31, the first testing needle 21 and the second testing needle 31 are coaxially arranged and are respectively used for abutting against a first electrode 60 and a second electrode 61 of the chip resistor 6, and preferably, the first sliding chute 11a and the second sliding chute 11b are also coaxially arranged to improve the stress. First test needle 21 and second test needle 31 receive the effect of the elastic component elasticity that corresponds, can keep in contact with two electrodes of chip resistor 6 automatically to test chip resistor 6.

The first testing pin 21 and the second testing pin 31 have the same structure, and as shown in fig. 7, each of them includes a voltage testing body 210 located at the center, an insulating layer 211 covering the voltage testing body 210, and a current loading layer 212 covering the insulating layer 211. The voltage testing body 210 and the current loading layer 212 are made of metal materials, preferably copper, the insulating layer 211 is used for separating the voltage testing body 210 and the current loading layer 212 and preventing interference between the voltage testing body 210 and the current loading layer 212, and preferably, the insulating layer 211 is made of high-temperature-resistant insulating paint.

The first testing pin 21 and the second testing pin 31 are electrically connected to the testing instrument, specifically, the current loading layer 212 is connected to the current output terminal of the testing instrument through a wire, and the voltage testing body 210 is connected to the voltage testing terminal of the testing instrument for voltage reading, so that the testing instrument can test the chip resistor 6.

In order to make the voltage testing body 210 and the current loading layer 212 of the testing needle fully contact with the electrodes, a first cut groove 213 is formed at the bottom of the front end of the testing needle, as shown in fig. 7 and 8, the first cut groove 213 includes a horizontal cut surface 214 and a vertical cut surface 215, and preferably, the horizontal cut surface 214 is tangent to the outer surface of the voltage testing body 210. By providing the first incision groove 213, the voltage tester 210 is closer to the carrying surface 10, so that the voltage tester 210 can be fully contacted with the electrode 60. Further, the horizontal section 214 preferably fits against the bearing surface 10 to prevent the testing pin from rotating in the first mounting hole 203, thereby enhancing the positioning effect and testing accuracy.

The front end of the insulating layer 211 is flush with the front end surface 21a of the testing probe 21 or recessed into the front end surface 21a, so that the front ends of the voltage testing body 210 and the current loading layer 212 are flush with the front end of the insulating layer 211 or protrude more than the front end of the insulating layer 211, and the first testing probe 21 and the second testing probe 31 can better contact with the electrodes, and obviously, the contact effect is better when the front ends of the voltage testing body 210 and the current loading layer 212 protrude.

Because the voltage testing body 210 generally has no load or a smaller load, and the sectional area thereof can be smaller, the voltage testing body 210 is arranged at the center position, and when the voltage testing body 210 is positioned at the center, the testing value of each position of the product is more accurate; the current loading layer 212 needs to load current, the load of the current loading layer is large, the current loading layer is arranged at a position close to the outside, the sectional area of the current loading layer can be increased, the conductivity of the current loading layer is enhanced, interference is reduced, and the accuracy of testing is improved.

The voltage test body 210 and the current loading layer 212 of the test needle are arranged in a coaxial manner, the original four test needles (two current loading needles and two voltage test needles) can be integrated into two, the volume of the test needle is greatly reduced, the current loading needle and the voltage test needle can be ensured not to be contacted with each other and not to interfere with each other through the isolation of the insulating layer, the resistance value test of the chip resistor can be carried out more conveniently and flexibly, and the problem that the sampling voltage is inaccurate due to the current distribution problem generated by the too far distance between the conventional current loading needle and the voltage test needle is avoided; in addition, the coaxial test pin is more flexible than a four-pin test pin, the four-pin test pin may have the problem that the current or voltage test pin cannot contact the product during product test, but the coaxial test pin does not occur, and the coaxial test pin is simpler and more controllable to implement on automatic equipment.

In order to position the chip resistor 6 on the carrying surface 10, the chip resistor testing fixture further includes a first fixing member 41 disposed on the third slider 40 and a second fixing member 51 disposed on the fourth slider 50. The first fixing member 41 and the second fixing member 51 are coaxially arranged and can respectively abut against the first side surface 62 and the second side surface 63 of the chip resistor 6 under the action of the elastic force of the elastic member, so that the chip resistor 6 is fixed on the bearing surface 10. Preferably, the third slider 40 and the fourth slider 50 are also coaxially arranged to make the force balance.

In this way, the chip resistor 6 can be automatically centered on the carrying surface 10. Moreover, the distance between the two fixing pieces can be changed correspondingly along with the different sizes of the chip resistors 6, so that the chip resistors 6 with different specifications can be positioned.

The front end of the fixing piece can also be provided with a second slot 411, so that the contact area of the fixing piece and the chip resistor 6 is larger and more sufficient, and the positioning effect is better.

In order to prevent the fixing piece from influencing the test result of the chip resistor 6, the fixing piece is made of high-temperature-resistant insulating materials.

In order to prevent the fixing member from damaging the surface of the chip resistor 6, a cushion layer made of soft material such as rubber may be disposed at the end of the fixing member contacting the chip resistor 6.

In a preferred embodiment, the position of the test needle on the slide and the position of the holder on the slide are adjustable. Specifically, each slider is provided with a mounting hole 203, and a test pin or a fixture is connected to the mounting hole 203. The top of the sliding block 20 is provided with an adjusting hole 204 communicated with the first mounting hole 203, the adjusting hole 204 is internally threaded with a bolt, and the current position of the test needle or the fixing piece can be fixed by tightly abutting against the test needle or the fixing piece through the bolt. The sliding block and the bolt are made of insulating materials so as to avoid influencing a test result.

By adjusting the position of the testing needle on the sliding block, the contact force between the testing needle and the chip resistor 6 can be better adjusted, the problems of crushing the chip resistor 6 or poor contact and the like are prevented, and the reliability of the test is ensured; in addition, the contact force between the fixing piece and the chip resistor can be adjusted, the positioning reliability is improved, and the chip resistor 6 is prevented from being damaged by the fixing piece in a squeezing mode.

When the chip resistor testing jig is used, the slider is pulled to compress the elastic piece, then the chip resistor 6 to be tested is placed on the bearing surface 10 close to the center, after the slider is released, the fixing piece and the testing needle automatically push the chip resistor 6 to move to the center and keep the connection with the chip resistor 6, and then a testing instrument can be started to test the chip resistor conveniently; after the test is finished, the slide block is pulled open, and the chip resistor 6 is taken out.

The application discloses chip resistor test fixture includes following advantage at least:

1. the chip resistor testing jig has the advantages that the elastic piece drives the sliding block, so that the testing needle on the sliding block is kept in contact with the electrode of the chip resistor, the structure is simple, the operation is convenient, the contact reliability can be guaranteed, the testing can be reliably carried out, and an accurate testing result can be obtained;

2. the chip resistor testing jig further comprises fixing pieces which are used for clamping two sides of the chip resistor through the elastic pieces, so that the chip resistor can be better positioned, the problem of poor test caused by displacement of the chip resistor is solved, the chip resistor testing jig can adapt to the chip resistors with different sizes, and the universality of the chip resistor testing jig is improved;

3. in this application, the test needle including be located the voltage test body at center, the cladding in voltage test external insulating layer and cladding in the outside current loading layer of insulating layer for voltage test body and current loading layer are integrated on a test needle, very big reduction the volume of test needle, can be better carry out the four-wire method to small-size chip resistor and test, are favorable to obtaining more accurate test result.

The above description is only for the purpose of illustrating embodiments of the present invention and is not intended to limit the scope of the present invention, and all modifications, equivalents, and equivalent structures or equivalent processes that can be used directly or indirectly in other related fields of technology shall be encompassed by the present invention.

Claims (10)

1. The utility model provides a chip resistor test fixture which characterized in that, it includes:

a base (1) comprising a carrying surface (10) for carrying a chip resistor (6);

a first slider (20) which is slidably coupled to the base (1) and is provided with a first test pin (21) for testing the chip resistor (6);

a first elastic member (220) for driving the first test pin (21) to abut against the first electrode (60) of the chip resistor (6);

the second sliding block (30) is connected to the base (1) in a sliding mode and is provided with a second testing needle (31) used for testing the chip resistor (6); and

and a second elastic member (221) for driving the second test pin (31) to abut against the second electrode (61) of the chip resistor (6).

2. The chip resistor testing jig according to claim 1, wherein the base (1) is provided with a first sliding groove (11a), the first slider (20) is coupled in the first sliding groove (11a), and the first elastic member (220) is disposed in the first sliding groove (11 a).

3. The chip resistance testing jig according to claim 2, wherein the first sliding groove (11a) communicates with the first outer side surface (1a) of the base (1).

4. The chip resistor test fixture according to claim 3, further comprising a first fixing plate (230) connected to the first outer side surface (1a), wherein two ends of the first elastic member (220) are respectively abutted against the first fixing plate (230) and the first slider (20).

5. The chip resistance testing jig according to claim 2, wherein the first sliding groove (11a) comprises a limiting groove portion (110) and a guiding groove portion (111) communicating the limiting groove portion (110) and the carrying surface (10), and the first slider (20) comprises a limiting portion (200) fitted in the limiting groove portion (110) and a guiding portion (201) fitted in the guiding groove portion (111).

6. The chip resistance testing jig according to claim 5, wherein the first slider (20) further comprises a plate portion (202) connected to the guide portion (201), and a bottom surface of the plate portion (202) is attached to the carrying surface (10).

7. The chip resistance test fixture according to any one of claims 1 to 6, further comprising:

a third slider (40) which is slidably coupled to the base (1) and is provided with a first fixing member (41);

a third elastic member (222) for driving the first fixed member (41) to abut against the first side surface (62) of the chip resistor (6);

a fourth slider (50) which is slidably coupled to the base (1) and is provided with a second fixing member (51); and

and a fourth elastic member (223) for driving the second fixing member (51) to abut against the second side surface (63) of the chip resistor (6).

8. The chip resistance test fixture according to claim 7, wherein the first test needle (21) and the second test needle (31) are coaxially arranged; the first fixing piece (41) and the second fixing piece (51) are coaxially arranged.

9. The chip resistance test fixture according to claim 7, wherein the position of the first test pin (21) on the first slider (20) is adjustable; the position of the first fixing part (41) on the third slide block (40) is adjustable.

10. The chip resistor testing jig according to claim 9, wherein the first slider (20) and the third slider (40) are respectively provided with a mounting hole (203) and an adjusting hole (204) communicated with the mounting hole (203), the testing pin or the fixing member is mounted in the mounting hole (203) of each slider, and a bolt for fixing the testing pin or the fixing member is screwed in the adjusting hole (204).

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