TWM555106U - Jig for circuit board testing - Google Patents
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- TWM555106U TWM555106U TW106214836U TW106214836U TWM555106U TW M555106 U TWM555106 U TW M555106U TW 106214836 U TW106214836 U TW 106214836U TW 106214836 U TW106214836 U TW 106214836U TW M555106 U TWM555106 U TW M555106U
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Abstract
一種電路板檢測用治具,包含測試裝置承載座、固定組件以及扣合機構。固定組件具有電路板固定空間,且測試裝置承載座可移動地設置於固定組件而具有相對接近電路板固定空間的測試位置與相對遠離電路板固定空間的脫離位置。扣合機構設置於測試裝置承載座與固定組件,且扣合機構可使測試裝置承載座保持於測試位置。A fixture for detecting a circuit board, comprising a test device carrier, a fixing component and a fastening mechanism. The fixing assembly has a circuit board fixing space, and the test device carrier is movably disposed on the fixing component to have a test position relatively close to the circuit board fixing space and a disengaged position relatively far from the circuit board fixing space. The fastening mechanism is disposed on the test device carrier and the fixing component, and the fastening mechanism can maintain the test device carrier in the test position.
Description
本新型係關於一種治具,特別是一種電路板檢測用治具。The present invention relates to a jig, and more particularly to a jig for detecting a circuit board.
印刷電路板(PCB)為各類電子產品當中極為重要之電子器件,其一般是透過電子印刷術於基板上形成複數由金屬導體製成之導線,以作為電路板上各零件間電路連接之用。在通訊系統、伺服器系統或測試系統等技術領域中,也會搭載一個或多個電路板作為此系統中的系統單板使用。Printed circuit boards (PCBs) are extremely important electronic devices in various electronic products. They are generally used to form a plurality of wires made of metal conductors on a substrate by electronic printing to serve as circuit connections between the various components on the circuit board. . In the technical fields of communication systems, server systems, or test systems, one or more boards are also used as system boards in this system.
為確認加工後之電路板是否有瑕疵或短路等情況,在電路板製造完成後,需利用測試裝置對其進行電性檢測。一般而言,電性檢測之方式係將採用專用的電性測試裝置,並將待檢測電路板上的探針與測試裝置中測試電路板(功能測試板)上的量測接觸點電性連接,方能進行電性檢測。於檢測前,會先將待檢測之電路板固定在一個特定位置,接著再將測試裝置下壓以與待檢測電路板的探針緊密接觸。In order to confirm whether the circuit board after processing is defective or short-circuited, after the board is manufactured, it is electrically tested by a test device. In general, the electrical detection method will use a dedicated electrical test device, and electrically connect the probe on the circuit board to be tested with the measurement contact point on the test circuit board (function test board) in the test device. In order to carry out electrical testing. Before the test, the circuit board to be tested is fixed at a specific position, and then the test device is pressed down to be in close contact with the probe of the circuit board to be inspected.
然而,前述電性檢測有量測結果不精確之問題,原因在於測試電路板可能會傾斜或偏移而導致其量測接觸點與部分的待檢測電路板之探針沒有良好的電性接觸。因此,有必要解決因為量測接觸點與探針缺乏良好電性接觸而導致電性檢測結果不精確的問題。However, the aforementioned electrical detection has the problem of inaccurate measurement results because the test circuit board may be tilted or offset such that its measurement contact point does not have good electrical contact with a portion of the probe of the circuit board to be inspected. Therefore, it is necessary to solve the problem that the electrical detection result is inaccurate due to the lack of good electrical contact between the measurement contact point and the probe.
鑒於以上的問題,本新型揭露一種電路板檢測用治具,有助於準確、簡單、快速的將待測電路板上的探針電性連接至測試裝置的量測接觸點。In view of the above problems, the present invention discloses a jig for detecting a circuit board, which helps to accurately, simply and quickly electrically connect the probe on the circuit board to be tested to the measuring contact point of the test device.
本發明揭露的電路板檢測用治具包含一測試裝置承載座、一固定組件以及至少一扣合機構。固定組件具有一電路板固定空間,且測試裝置承載座可移動地設置於固定組件而具有相對接近電路板固定空間的一測試位置與相對遠離電路板固定空間的一脫離位置。扣合機構設置於測試裝置承載座與固定組件,且扣合機構可使測試裝置承載座保持於測試位置。The jig for detecting a circuit board disclosed in the present invention comprises a test device carrier, a fixing component and at least one fastening mechanism. The fixing component has a circuit board fixing space, and the testing device carrier is movably disposed on the fixing component to have a test position relatively close to the circuit board fixing space and a disengagement position relatively far from the circuit board fixing space. The fastening mechanism is disposed on the test device carrier and the fixing component, and the fastening mechanism can maintain the test device carrier in the test position.
本發明另揭露的電路板檢測用治具包含一測試裝置承載座、一固定組件以及二扣合機構。測試裝置承載座包含一承載件以及設置於承載件的一第一連接件與一第二連接件。固定組件包含一第一固定件以及一第二固定件。一第一固定件包含一第一內側部、一第一外側部以及一第一彈性件。第一內側部相對於第一外側部,且第一連接件可移動地設置於第一內側部與第一外側部之間。第一彈性件設置於第一連接件與第一內側部之間或是第一連接件與第一外側部之間。第二固定件包含一第二內側部、一第二外側部以及一第二彈性件。第二內側部相對於第二外側部,且第二連接件可移動地設置於第二內側部與第二外側部之間。第二彈性件設置於第二連接件與第二內側部之間或是第二連接件與第二外側部之間。扣合機構包含一掛勾以及對應於掛勾的一搭扣件。二掛勾設置於測試裝置承載座的承載件,且二搭扣件分別設置於第一外側部與第二外側部。The jig for detecting a circuit board according to another aspect of the present invention comprises a test device carrier, a fixing component and a second fastening mechanism. The test device carrier includes a carrier and a first connector and a second connector disposed on the carrier. The fixing component comprises a first fixing component and a second fixing component. A first fixing member includes a first inner portion, a first outer portion and a first elastic member. The first inner portion is opposite to the first outer portion, and the first connecting member is movably disposed between the first inner portion and the first outer portion. The first elastic member is disposed between the first connecting member and the first inner portion or between the first connecting member and the first outer portion. The second fixing member comprises a second inner portion, a second outer portion and a second elastic member. The second inner portion is opposite to the second outer portion, and the second connecting member is movably disposed between the second inner portion and the second outer portion. The second elastic member is disposed between the second connecting member and the second inner portion or between the second connecting member and the second outer portion. The fastening mechanism includes a hook and a fastener corresponding to the hook. The two hooks are disposed on the carrier of the test device carrier, and the two fasteners are respectively disposed on the first outer portion and the second outer portion.
根據本新型所揭露的電路板檢測用治具,測試裝置承載座可移動地設置於固定組件而具有相對接近電路板固定空間的測試位置與相對遠離電路板固定空間的脫離位置,並且當扣合機構扣合時可使測試裝置承載座保持於測試位置。藉此,有助於準確、簡單、快速地將待測電路板上的探針電性連接至測試裝置的量測接觸點並保持緊密接觸,進而達到測試的目的。According to the jig for detecting a circuit board disclosed in the present invention, the test device carrier is movably disposed on the fixing component and has a test position relatively close to the fixed space of the circuit board and a disengaged position relatively far from the fixed space of the circuit board, and when being fastened The test device carrier can be held in the test position when the mechanism is engaged. Thereby, it is helpful to accurately, simply and quickly connect the probe on the circuit board to be tested to the measuring contact point of the testing device and maintain close contact, thereby achieving the purpose of testing.
以上之關於本揭露內容之說明及以下之實施方式之說明係用以示範與解釋本新型之精神與原理,並且提供本新型之專利申請範圍更進一步之解釋。The above description of the disclosure and the following description of the embodiments are intended to illustrate and explain the spirit and principles of the present invention, and to provide further explanation of the scope of the patent application of the present invention.
以下在實施方式中詳細敘述本新型之詳細特徵以及優點,其內容足以使任何熟習相關技藝者瞭解本新型之技術內容並據以實施,且根據本說明書所揭露之內容、申請專利範圍及圖式,任何熟習相關技藝者可輕易地理解本新型相關之目的及優點。以下之實施例進一步詳細說明本新型之觀點,但非以任何觀點限制本新型之範疇。The detailed features and advantages of the present invention are described in detail in the following detailed description of the embodiments of the present invention. Any related art and related art can easily understand the related purposes and advantages of the present invention. The following examples further illustrate the aspects of the present invention in detail, but do not limit the scope of the present invention in any way.
請參照圖1至圖3。圖1為根據本新型一實施例之電路板檢測用治具的立體示意圖。圖2為圖1之電路板檢測用治具的分解示意圖。圖3為圖1之電路板檢測用治具的側視示意圖。在本實施例中,電路板檢測用治具1包含一測試裝置承載座10、一固定組件20以及二扣合機構30。Please refer to FIG. 1 to FIG. 3. 1 is a perspective view of a jig for detecting a circuit board according to an embodiment of the present invention. 2 is an exploded perspective view of the jig for detecting a circuit board of FIG. 1. 3 is a side elevational view of the jig for detecting a circuit board of FIG. 1. In the present embodiment, the jig for detecting the circuit board 1 includes a test device holder 10, a fixing assembly 20, and two fastening mechanisms 30.
測試裝置承載座10包含一承載件110以及二連接件120。承載件110具有相對的一頂面111以及一底面112。頂面111可承載用以檢測電路板的測試裝置(例如檢測電性功能是否正常的測試電路板)。二連接件120分別設置於底面112的相對二側並朝遠離底面112之方向延伸。本實施例的二個連接件120皆設置於承載件110的底面112,但本新型並不以此為限。在其他實施例中,連接件可設置於承載件的側面或頂面並且延伸至承載件的底面。The test device carrier 10 includes a carrier 110 and two connectors 120. The carrier 110 has a top surface 111 and a bottom surface 112 opposite to each other. The top surface 111 can carry a test device for detecting a circuit board (for example, a test circuit board that detects whether the electrical function is normal). The two connecting members 120 are respectively disposed on opposite sides of the bottom surface 112 and extend away from the bottom surface 112. The two connecting members 120 of the embodiment are disposed on the bottom surface 112 of the carrier 110, but the present invention is not limited thereto. In other embodiments, the connector may be disposed on a side or top surface of the carrier and extending to a bottom surface of the carrier.
固定組件20包含二固定件210,並且每個固定件210分別包含一內側部211、一外側部212、多個結合桿213以及多個彈性件214。在本實施例中,二固定件210為獨立的兩個元件,但本新型並不以此為限。在其他實施例中,二固定件可透過內側部或外側部彼此相互連接,而使固定組件成為一件式。The fixing assembly 20 includes two fixing members 210 , and each fixing member 210 includes an inner portion 211 , an outer portion 212 , a plurality of coupling rods 213 , and a plurality of elastic members 214 . In this embodiment, the two fixing members 210 are two independent components, but the present invention is not limited thereto. In other embodiments, the two fixing members are connected to each other through the inner side portion or the outer side portion, and the fixing assembly is made into one piece.
內側部211與外側部212相對,並且二個內側部211之間的距離D1小於二個外側部212之間的距離D2。測試裝置承載座10的每個連接件120分別具有多個滑槽121,且每個固定件210的內側部211與外側部212分別具有多個穿孔215。滑槽121與穿孔215的數量均對應到結合桿213的數量,然而滑槽121、結合桿213、彈性件214與穿孔215的數量均非用以限制本新型。The inner portion 211 is opposed to the outer portion 212, and the distance D1 between the two inner portions 211 is smaller than the distance D2 between the two outer portions 212. Each of the connecting members 120 of the test device carrier 10 has a plurality of sliding slots 121, and the inner side portion 211 and the outer side portion 212 of each fixing member 210 respectively have a plurality of through holes 215. The number of the chute 121 and the through hole 215 corresponds to the number of the coupling rods 213. However, the number of the sliding groove 121, the coupling rod 213, the elastic member 214 and the through hole 215 are not limited to the present invention.
結合桿213例如但不限於是螺絲,其相對二端分別穿設固定件210之內側部211與外側部212的穿孔215而固定於固定件210。此外,每個結合桿213更分別貫穿與其相對應的其中一個滑槽121,而藉由結合桿213與滑槽121之組裝以將連接件120裝設於固定件210,並同時給予測試裝置承載座10在圖3的垂直方向上有適當的可移動性,藉此測試裝置承載座10的二個連接件120分別可移動地設置於此二個固定件210各自的內側部211與外側部212之間。然而,前述結合桿213與滑槽121之組裝並非用以限制本新型。在其他實施例中,可於固定件的內側部與外側部分別形成滑軌,並且將承載座的連接件設置於滑軌。The coupling rod 213 is fixed to the fixing member 210 by, for example, but not limited to, a screw, and a through hole 215 of the inner portion 211 and the outer portion 212 of the fixing member 210 is respectively disposed at opposite ends. In addition, each of the coupling rods 213 is respectively inserted through one of the corresponding sliding slots 121, and is assembled by the coupling rod 213 and the sliding slot 121 to mount the connecting member 120 to the fixing member 210, and simultaneously carried to the testing device. The seat 10 has appropriate movability in the vertical direction of FIG. 3, whereby the two connecting members 120 of the test device carrier 10 are movably disposed on the inner side portion 211 and the outer side portion 212 of the two fixing members 210, respectively. between. However, the assembly of the aforementioned coupling rod 213 and the chute 121 is not intended to limit the present invention. In other embodiments, the slide rails may be respectively formed on the inner side portion and the outer side portion of the fixing member, and the connecting members of the carrier seat are disposed on the slide rails.
彈性件214例如但不限於是壓縮彈簧,其設置於連接件120與內側部211之間。在本實施例中,這些彈性件214係進一步地分別套設於這些結合桿213,但彈性件214套設於結合桿213之配置並非用以限制本新型。此外,本實施例的彈性件214係為設置於連接件120與內側部211之間的壓縮彈簧,但本新型亦不以此為限。在其他實施例中,彈性件可以是設置於連接件與外側部之間的拉伸彈簧。The elastic member 214 is, for example but not limited to, a compression spring that is disposed between the connecting member 120 and the inner side portion 211. In the present embodiment, the elastic members 214 are further sleeved on the coupling rods 213, but the arrangement of the elastic members 214 on the coupling rods 213 is not intended to limit the present invention. In addition, the elastic member 214 of the present embodiment is a compression spring disposed between the connecting member 120 and the inner portion 211, but the present invention is not limited thereto. In other embodiments, the resilient member can be a tension spring disposed between the connector and the outer portion.
此外,固定組件20還具有一電路板固定空間220。詳細來說,電路板固定空間220係形成於固定組件20之二個固定件210的二個內側部211之間。電路板固定空間220的功能將於後續描述。In addition, the fixing assembly 20 also has a circuit board fixing space 220. In detail, the circuit board fixing space 220 is formed between the two inner side portions 211 of the two fixing members 210 of the fixing assembly 20. The function of the board fixing space 220 will be described later.
二扣合機構30皆設置於測試裝置承載座10與固定組件20。詳細來說,每個扣合機構30分別包含一掛勾310以及對應於此掛勾310的一搭扣件320。二個掛勾310分別設置於測試裝置承載座10之承載件110的相對二側,並且二個搭扣件320分別設置於固定組件20之二個固定件210各自的外側部212。扣合機構30的功能將於後續描述。The two fastening mechanisms 30 are disposed on the test device carrier 10 and the fixing assembly 20 . In detail, each of the fastening mechanisms 30 includes a hook 310 and a fastener 320 corresponding to the hook 310. The two hooks 310 are respectively disposed on opposite sides of the carrier 110 of the test device carrier 10 , and the two fasteners 320 are respectively disposed on the outer portions 212 of the two fixing members 210 of the fixing component 20 . The function of the fastening mechanism 30 will be described later.
以下說明電路板檢測用治具1連同測試裝置2一起固定於一待檢測電路板3的方法。請併參照圖3至圖6。圖4和圖5為將搭載有測試裝置之圖1的電路板檢測用治具設置於一待檢測電路板的示意圖。圖6為將圖5之測試裝置的一測試部與待檢測電路板相接觸的示意圖。如圖3和圖4所示,電路板檢測用治具1之測試裝置承載座10的承載件110上方搭載有一測試裝置2。測試裝置2的一測試部21對應於承載件110的一開口113,以使測試部21上的多個量測接觸點能面對電路板固定空間220。Next, a method of fixing the jig 1 for board detection together with the test device 2 to a board to be inspected 3 will be described. Please refer to FIG. 3 to FIG. 6 together. 4 and 5 are schematic views showing the jig for detecting a circuit board of FIG. 1 on which a test device is mounted, on a circuit board to be inspected. Figure 6 is a schematic view showing a test portion of the test apparatus of Figure 5 in contact with a circuit board to be inspected. As shown in FIGS. 3 and 4, a test device 2 is mounted above the carrier 110 of the test device carrier 10 of the jig detecting fixture 1. A test portion 21 of the test device 2 corresponds to an opening 113 of the carrier 110 such that a plurality of measurement contact points on the test portion 21 can face the circuit board fixing space 220.
如圖4所示,係先拉動二個固定件210以增加電路板固定空間220之寬度至大於待檢測電路板3之檢測座31的寬度。於拉動固定組件20之固定件210時,固定件210之內側部211會壓縮彈性件214而使彈性件214儲存彈性位能。接著,移動電路板檢測用治具1至一預設固定位置,以使檢測座31的一部分能容置於電路板固定空間220中。接著如圖5所示,釋放二個固定件210,以令彈性件214釋放彈性位能而帶動固定件210復位,進而使圖4中電路板固定空間220之寬度縮減。由於固定件210未被拉動時的電路板固定空間220寬度小於檢測座31的寬度,故能確保二個固定件210能緊密夾持檢測座31的相對二側,進而讓電路板檢測用治具1能穩固於檢測座31上。在本實施例中,二個固定件210各自的多個彈性件214可分別提供一預壓方向P上的預壓力給二個固定件210各自的內側部211以維持電路板固定空間220之寬度,藉此有助於確保電路板檢測用治具1的二個固定件210能穩固且緊密地夾持檢測座31,以防止電路板檢測用治具1不慎脫落。As shown in FIG. 4, the two fixing members 210 are first pulled to increase the width of the circuit board fixing space 220 to be larger than the width of the detecting block 31 of the circuit board 3 to be inspected. When the fixing member 210 of the fixing assembly 20 is pulled, the inner portion 211 of the fixing member 210 compresses the elastic member 214 to store the elastic member 214 to store the elastic potential energy. Next, the jig 1 for moving the circuit board is detected to a predetermined fixed position so that a part of the detecting seat 31 can be accommodated in the circuit board fixing space 220. Next, as shown in FIG. 5, the two fixing members 210 are released to release the elastic position energy of the elastic member 214 to drive the fixing member 210 to be reset, thereby reducing the width of the circuit board fixing space 220 in FIG. Since the width of the circuit board fixing space 220 when the fixing member 210 is not pulled is smaller than the width of the detecting seat 31, it can be ensured that the two fixing members 210 can tightly clamp the opposite sides of the detecting seat 31, thereby allowing the circuit board to detect the fixture. 1 can be stabilized on the detection seat 31. In this embodiment, the plurality of elastic members 214 of the two fixing members 210 respectively provide a pre-pressure in a pre-pressing direction P to the inner side portions 211 of the two fixing members 210 to maintain the width of the circuit board fixing space 220. Thereby, it is helpful to ensure that the two fixing members 210 of the jig detecting jig 1 can firmly and tightly hold the detecting seat 31 to prevent the jig detecting jig 1 from being accidentally detached.
如圖5所示,當電路板檢測用治具1固定於待檢測電路板3的檢測座31並且扣合機構30尚未扣合時,測試裝置承載座10係位於相對遠離電路板固定空間220(即相對遠離檢測座31)的一脫離位置。於脫離位置時,檢測座31上的多個探針32與測試裝置2之測試部21的多個量測接觸點相分離。在其他實施例的測試裝置承載座於脫離位置時,探針與量測接觸點可以輕微接觸但尚不能實現兩者之間的電性連接。As shown in FIG. 5, when the jig for detecting the circuit board 1 is fixed to the detecting seat 31 of the circuit board 3 to be inspected and the fastening mechanism 30 has not been engaged, the test device carrier 10 is located relatively far from the circuit board fixing space 220 ( That is, a disengaged position relatively far from the detecting seat 31). In the disengaged position, the plurality of probes 32 on the test block 31 are separated from the plurality of measurement contact points of the test portion 21 of the test device 2. When the test device of the other embodiment is in the disengaged position, the probe and the measurement contact point may be in slight contact but the electrical connection between the two may not be achieved.
如圖5和圖6所示,係將扣合機構30的搭扣件320勾扣住對應的掛勾310,並且推動搭扣件320的扳動部321以使其樞轉扣合,進而連動測試裝置承載座10向下移動至相對靠近電路板固定空間220的一測試位置。於測試位置時,這些探針32分別與測試部21的多個量測接觸點緊密接觸而彼此之間電性連接,藉此能進行後續的電性檢測程序。As shown in FIG. 5 and FIG. 6 , the fasteners 320 of the fastening mechanism 30 are hooked to the corresponding hooks 310 , and the pulling portion 321 of the fasteners 320 is pushed to be pivotally fastened and interlocked. The test device carrier 10 is moved down to a test position relatively close to the circuit board mounting space 220. In the test position, the probes 32 are electrically connected to each other in close contact with the plurality of measurement contact points of the test portion 21, thereby enabling subsequent electrical detection procedures.
另外,本實施例可在承載件110與二個固定件210之間夾設橡膠墊或是彈簧等彈性體(未繪示),以令扣合機構30解除其扣合狀態時,測試裝置承載座10能藉由此彈性體復位至前述的脫離位置。In addition, in this embodiment, a rubber pad or an elastic body (not shown) such as a spring may be interposed between the carrier member 110 and the two fixing members 210, so that the fastening device 30 releases the buckled state, and the test device carries The seat 10 can be reset by the elastic body to the aforementioned disengaged position.
如圖5和圖6所示,為了於能使測試裝置2之測試部21與待檢測電路板3的探針32之間有良好對位,本實施例的測試裝置承載座10更包含設置於承載件110之底面112的二電路板定位柱130,並且待檢測電路板3之檢測座31具有分別對應二電路板定位柱130的二定位孔33。電路板定位柱130與定位孔33的數量並非用以限制本新型。As shown in FIG. 5 and FIG. 6, in order to enable a good alignment between the test portion 21 of the test device 2 and the probe 32 of the circuit board 3 to be inspected, the test device carrier 10 of the present embodiment further includes The two circuit boards of the bottom surface 112 of the carrier 110 are positioned on the column 130, and the detecting block 31 of the circuit board 3 to be inspected has two positioning holes 33 corresponding to the two circuit board positioning posts 130, respectively. The number of the board positioning posts 130 and the positioning holes 33 is not intended to limit the present invention.
此外,如圖2所示,本實施例的二個固定件210於內側部211分別具有一電路板匹配槽211a。當要將電路板檢測用治具1固定於待檢測電路板3的檢測座31時,電路板匹配槽211a有助於輔助固定件210與檢測座31定位,以避免電路板檢測用治具1的裝設方向偏移。In addition, as shown in FIG. 2, the two fixing members 210 of the embodiment respectively have a circuit board matching groove 211a on the inner side portion 211. When the jig 1 for detecting the board is to be fixed to the detecting seat 31 of the circuit board 3 to be inspected, the matching pad 211a of the circuit board helps the auxiliary fixing member 210 and the detecting seat 31 to be positioned to avoid the jig for detecting the circuit board 1 The mounting direction is offset.
再者,本實施例的二個扣合機構30分別位於固定組件20的相對二側,藉此當扣合機構30扣合以帶動進測試裝置承載座10下移時,能確保測試裝置承載座10的受力較為平均,進而防止測試裝置承載座10之承載件110傾斜而過度抵壓探針32。Furthermore, the two fastening mechanisms 30 of the present embodiment are respectively located on opposite sides of the fixing assembly 20, thereby ensuring the test device carrier when the fastening mechanism 30 is engaged to drive the test device carrier 10 to move downward. The force applied to 10 is relatively even, thereby preventing the carrier 110 of the test device carrier 10 from tilting and over-pressing the probe 32.
綜上所述,本新型所揭露的電路板檢測用治具中,測試裝置承載座可移動地設置於固定組件而具有相對接近電路板固定空間的測試位置與相對遠離電路板固定空間的脫離位置,並且當扣合機構扣合時可使測試裝置承載座保持於測試位置。藉此,有助於準確、簡單、快速地將待測電路板上的探針電性連接至測試裝置的量測接觸點並保持緊密接觸。In summary, in the jig for detecting a circuit board disclosed in the present invention, the test device carrier is movably disposed on the fixing component and has a test position relatively close to the fixed space of the circuit board and a disengaged position relatively far from the fixed space of the circuit board. And the test device carrier can be held in the test position when the fastening mechanism is engaged. Thereby, it is helpful to accurately, simply and quickly connect the probe on the circuit board to be tested to the measuring contact point of the testing device and maintain close contact.
此外,測試裝置承載座的電路板定位柱有助於引導搭載於承載座之測試裝置與待檢測電路板對位,以確保每個探針於承載座被下壓至測試位置時都能夠接觸到對與其相對應的量測接觸點。In addition, the circuit board positioning post of the test device carrier helps to guide the test device mounted on the carrier to be aligned with the circuit board to be inspected to ensure that each probe can be accessed when the carrier is pressed down to the test position. A measurement contact point corresponding thereto.
雖然本新型以前述之實施例揭露如上,然而這些實施例並非用以限定本新型。在不脫離本新型之精神和範圍內,所為之更動與潤飾,均屬本新型之專利保護範圍。關於本新型所界定之保護範圍請參考所附之申請專利範圍。Although the present invention has been disclosed above in the foregoing embodiments, these embodiments are not intended to limit the present invention. The changes and refinements of the present invention are within the scope of the patent protection of the present invention without departing from the spirit and scope of the present invention. Please refer to the attached patent application for the scope of protection defined by this new model.
1‧‧‧電路板檢測用治具
2‧‧‧測試裝置
21‧‧‧測試部
3‧‧‧待檢測電路板
31‧‧‧檢測座
32‧‧‧探針
33‧‧‧定位孔
10‧‧‧測試裝置承載座
110‧‧‧承載件
111‧‧‧頂面
112‧‧‧底面
113‧‧‧開口
120‧‧‧連接件
121‧‧‧滑槽
130‧‧‧電路板定位柱
20‧‧‧固定組件
210‧‧‧固定件
211‧‧‧內側部
211a‧‧‧電路板匹配槽
212‧‧‧外側部
213‧‧‧結合桿
214‧‧‧彈性件
215‧‧‧穿孔
220‧‧‧電路板固定空間
30‧‧‧扣合機構
310‧‧‧掛勾
320‧‧‧搭扣件
321‧‧‧扳動部
D1、D2‧‧‧距離
P‧‧‧預壓方向1‧‧‧Card for board inspection
2‧‧‧Testing device
21‧‧‧Test Department
3‧‧‧When the board to be tested
31‧‧‧Detector
32‧‧‧ probe
33‧‧‧Positioning holes
10‧‧‧Testing device carrier
110‧‧‧Carrier
111‧‧‧ top surface
112‧‧‧ bottom
113‧‧‧ openings
120‧‧‧Connecting parts
121‧‧‧Chute
130‧‧‧Board positioning column
20‧‧‧Fixed components
210‧‧‧Fixed parts
211‧‧‧ inside part
211a‧‧‧Board matching slot
212‧‧‧Outside
213‧‧‧ Bonding rod
214‧‧‧Flexible parts
215‧‧‧Perforation
220‧‧‧Board fixed space
30‧‧‧Withholding mechanism
310‧‧‧hook
320‧‧‧Snap fasteners
321‧‧‧Turning Department
D1, D2‧‧‧ distance
P‧‧‧Preload direction
圖1為根據本新型一實施例之電路板檢測用治具的立體示意圖。 圖2為圖1之電路板檢測用治具的分解示意圖。 圖3為圖1之電路板檢測用治具的側視示意圖。 圖4和圖5為將搭載有測試裝置之圖1的電路板檢測用治具設置於一待檢測電路板的示意圖。 圖6為將圖5之測試裝置的一測試部與待檢測電路板相接觸的示意圖。1 is a perspective view of a jig for detecting a circuit board according to an embodiment of the present invention. 2 is an exploded perspective view of the jig for detecting a circuit board of FIG. 1. 3 is a side elevational view of the jig for detecting a circuit board of FIG. 1. 4 and 5 are schematic views showing the jig for detecting a circuit board of FIG. 1 on which a test device is mounted, on a circuit board to be inspected. Figure 6 is a schematic view showing a test portion of the test apparatus of Figure 5 in contact with a circuit board to be inspected.
1‧‧‧電路板檢測用治具 1‧‧‧Card for board inspection
2‧‧‧測試裝置 2‧‧‧Testing device
21‧‧‧測試部 21‧‧‧Test Department
3‧‧‧待檢測電路板 3‧‧‧When the board to be tested
31‧‧‧檢測座 31‧‧‧Detector
32‧‧‧探針 32‧‧‧ probe
33‧‧‧定位孔 33‧‧‧Positioning holes
110‧‧‧承載件 110‧‧‧Carrier
111‧‧‧頂面 111‧‧‧ top surface
112‧‧‧底面 112‧‧‧ bottom
113‧‧‧開口 113‧‧‧ openings
130‧‧‧電路板定位柱 130‧‧‧Board positioning column
210‧‧‧固定件 210‧‧‧Fixed parts
211‧‧‧內側部 211‧‧‧ inside part
212‧‧‧外側部 212‧‧‧Outside
213‧‧‧結合桿 213‧‧‧ Bonding rod
214‧‧‧彈性件 214‧‧‧Flexible parts
310‧‧‧掛勾 310‧‧‧hook
320‧‧‧搭扣件 320‧‧‧Snap fasteners
321‧‧‧扳動部 321‧‧‧Turning Department
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW106214836U TWM555106U (en) | 2017-10-06 | 2017-10-06 | Jig for circuit board testing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW106214836U TWM555106U (en) | 2017-10-06 | 2017-10-06 | Jig for circuit board testing |
Publications (1)
Publication Number | Publication Date |
---|---|
TWM555106U true TWM555106U (en) | 2018-02-01 |
Family
ID=62015828
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106214836U TWM555106U (en) | 2017-10-06 | 2017-10-06 | Jig for circuit board testing |
Country Status (1)
Country | Link |
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TW (1) | TWM555106U (en) |
-
2017
- 2017-10-06 TW TW106214836U patent/TWM555106U/en unknown
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