TW201632443A - Detaching method and detaching apparatus - Google Patents

Detaching method and detaching apparatus Download PDF

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Publication number
TW201632443A
TW201632443A TW104143605A TW104143605A TW201632443A TW 201632443 A TW201632443 A TW 201632443A TW 104143605 A TW104143605 A TW 104143605A TW 104143605 A TW104143605 A TW 104143605A TW 201632443 A TW201632443 A TW 201632443A
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Taiwan
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peeling
plate
shaped body
abutting member
adsorption
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TW104143605A
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Chinese (zh)
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TWI605999B (en
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上野美佳
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思可林集團股份有限公司
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Publication of TWI605999B publication Critical patent/TWI605999B/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B38/00Ancillary operations in connection with laminating processes
    • B32B38/10Removing layers, or parts of layers, mechanically or chemically

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Folding Of Thin Sheet-Like Materials, Special Discharging Devices, And Others (AREA)
  • Sheets, Magazines, And Separation Thereof (AREA)

Abstract

A holding mechanism 30 of the present invention maintains the adhered body WK by holding the first plate-like body BL, and makes an abutment member 340 abutted against the second plate-like body SB. A plurality of detaching mechanisms 51~5N, which are movably linked with the f abutment member 340 along the detaching direction and arranged along the detaching direction parallel to the main surface of the adhered body WK, make the two plate bodies detach by sequentially holding the second plate-like body SB and making the second plate-like body SB move away from the first plate-like body BL. With regard to the movement start timing, it is determined by executing the movement of abutment member 340 in advance, and actually measuring the position information representing the position of the abutment member 340 in motion and the timing of the abutment member 340 passing through the opposing position of the detaching mechanisms 51~5N.

Description

剝離方法及剝離裝置 Stripping method and stripping device

本發明涉及一種使直接或隔著薄層相互密接之兩片板狀體剝離之剝離方法及剝離裝置。 The present invention relates to a peeling method and a peeling apparatus for peeling two sheet-like bodies which are directly or in close contact with each other via a thin layer.

作為於玻璃基板或半導體基板等板狀體上形成特定之圖案或薄膜之技術,有將擔載於其他板狀體之圖案或薄膜(以下,稱為「圖案等」)轉印至基板之技術。於此技術中,必須於使兩片板狀體密接而將圖案等自其中一片轉印至另一片之後,不損壞圖案等即可將兩片板狀體剝離。 As a technique for forming a specific pattern or film on a plate-like body such as a glass substrate or a semiconductor substrate, there is a technique of transferring a pattern or a film (hereinafter referred to as a "pattern" or the like) carried on another plate-like body to a substrate. . In this technique, it is necessary to peel the two sheet-like bodies after the two sheets are adhered to each other and the pattern or the like is transferred from one sheet to the other without damaging the pattern or the like.

作為用以實現該目的而可利用之技術,有例如專利文獻1(日本專利特開2014-189350號公報)中記載之技術。於此技術中,包含相互密接之第一板狀體及第二板狀體之密接體藉由將第一板狀體吸附保持於載台而保持為水平姿勢。而且,排列於第二板狀體側之多個剝離機構依次抵接於第二板狀體,且一面保持第二板狀體一面朝自第一板狀體離開之方向移動,由此第一板狀體與第二板狀體之間之剝離向特定之剝離方向前進。此時,以如下方式管理,即,抵接構件一面抵接於第二板狀體之表面一面朝剝離方向移動,由此以固定之速度進行剝離。 For example, the technique described in the patent document 1 (Japanese Patent Laid-Open Publication No. 2014-189350) is incorporated. In this technique, the close-fitting body including the first plate-shaped body and the second plate-shaped body which are in close contact with each other is held in a horizontal posture by adsorbing and holding the first plate-shaped body on the stage. Further, the plurality of peeling mechanisms arranged on the second plate-like body side sequentially abut against the second plate-shaped body, and move while moving away from the first plate-shaped body while holding the second plate-shaped body, thereby The peeling between the one plate-shaped body and the second plate-shaped body advances in a specific peeling direction. At this time, it is managed that the contact member moves toward the peeling direction while abutting against the surface of the second plate-shaped body, thereby peeling off at a fixed speed.

於板狀體之尺寸大型化、或於兩片板狀體之間擔載有薄膜之情 形時,存在對應於其密接力之不同等而增減所設置之剝離機構之數量或間隔。另外,為藉由剝離機構與抵接構件之協調動作而良好地控制剝離之前進,較佳為於抵接構件通過之後至剝離機構抵接於第二板狀體之表面並進行保持為止之時間儘可能短。為能夠實現該些,必須一面防止剝離機構與抵接構件之干涉,一面使剝離機構相對於抵接構件通過後之第二板狀體表面迅速地抵接。因此,要求根據剝離機構之配置而適當且簡單地設定與抵接構件協作之各剝離機構之動作時序。 The size of the plate is increased, or the film is carried between the two plates. In the case of the shape, there is a difference or a decrease in the number or interval of the peeling mechanisms provided corresponding to the difference in the adhesive force. Further, in order to control the peeling advance well by the coordinated operation of the peeling mechanism and the contact member, it is preferable that the time until the peeling mechanism abuts against the surface of the second plate-shaped body and is held after the contact member passes As short as possible. In order to achieve this, it is necessary to prevent the peeling mechanism from rapidly abutting against the surface of the second plate-shaped body after the abutting member passes, while preventing the interference between the peeling mechanism and the abutting member. Therefore, it is required to appropriately and simply set the operation timing of each peeling mechanism that cooperates with the abutting member in accordance with the arrangement of the peeling mechanism.

在上述背景技術中,剝離機構之設置數量較少,且其等之間隔亦較大。因此,相對較容易使動作時序最佳化。例如,可使用預先藉由教學作業而使裝置學習抵接構件之位置與剝離機構之移動時序之對應關係之方法。然而,若剝離機構之設置數量變大,則調整作業將會變得非常繁雜。 In the above background art, the number of the peeling mechanisms is small, and the intervals thereof are also large. Therefore, it is relatively easy to optimize the operation timing. For example, a method in which the device learns the correspondence relationship between the position of the abutting member and the movement timing of the peeling mechanism by the teaching operation in advance can be used. However, if the number of sets of the peeling mechanism becomes large, the adjustment work becomes very complicated.

本發明係鑒在上述課題而完成者,其目的在於提供一種技術,於使相互密接之兩片板狀體剝離之剝離方法及剝離裝置中,可根據剝離機構之配置而使各個剝離機構之動作簡單地最佳化。 The present invention has been made in view of the above problems, and an object of the present invention is to provide a technique for separating the two sheet-like members that are in close contact with each other, and in the peeling device, the peeling mechanism can be operated according to the arrangement of the peeling mechanism. Simply optimized.

為達成上述目的,本發明之剝離方法之一態樣係使第一板狀體與第二板狀體直接或隔著薄層密接而成之密接體剝離之剝離方法,其包含:配置步驟,其藉由使保持機構保持上述第一板狀體而保持上述密接體,且各具有部分性地抵接在上述第二板狀體而保持上述第二板狀體之功能之多個剝離機構,沿與上述第二板狀體之表面平行之剝離方向、且在上述第二板狀體之表面與上述剝離機構之間隔開間隙而排列;以及剝離步驟,抵接構件一面抵接在上述第二板狀體之表面一面於與上述剝離機構之間隙空間向上述剝離方向移動,上述剝離機構之各者於沿上述剝離方向依次向上述第二板狀體移動且抵接在上述抵接構件通過後之上述第二板狀體之表面之後,一面保持上述第二板狀體 一面沿對於上述第一板狀體離開方向移動而使上述第二板狀體自上述第一板狀體離開;且上述剝離機構各者之移動時序係根據預先使上述抵接構件向上述剝離方向移動而取得之上述抵接構件通過與上述剝離機構之對向位置之時序、與表示上述抵接構件之上述剝離方向上之位置之位置資訊之對應關係而設定。 In order to achieve the above object, the aspect of the peeling method of the present invention is a peeling method in which the first plate-shaped body and the second plate-shaped body are directly or evenly separated by a thin layer, and the peeling method comprises: a disposing step, The holding body holds the contact body by holding the first plate-shaped body, and each of the plurality of peeling mechanisms that partially abuts the second plate-shaped body and maintains the function of the second plate-shaped body Arranging a gap between the surface of the second plate-shaped body and the peeling mechanism along a peeling direction parallel to a surface of the second plate-shaped body; and a peeling step, the abutting member abuts against the second The surface of the plate-shaped body moves in the peeling direction on the gap space with the peeling mechanism, and each of the peeling mechanisms sequentially moves toward the second plate-shaped body in the peeling direction and abuts against the passing of the abutting member. After the surface of the second plate-shaped body, the second plate-shaped body is held while The second plate-shaped body is separated from the first plate-shaped body while moving in the direction away from the first plate-shaped body; and the movement timing of each of the peeling mechanisms is based on the abutting member in the peeling direction in advance. The abutting member obtained by the movement is set by a correspondence relationship between the timing of the opposing position of the peeling mechanism and the positional information indicating the position of the abutting member in the peeling direction.

另外,為達成上述目的,本發明之剝離裝置之一態樣包含:保持機構,其藉由保持上述第一板狀體而保持第一板狀體與第二板狀體直接或隔著薄層相互密接而成之密接體;抵接構件,其一面抵接於藉由上述保持機構保持之上述密接體之上述第二板狀體之表面,一面沿與上述第二板狀體之表面平行之剝離方向移動;多個剝離機構,沿上述剝離方向排列,各者具有部分性地抵接在上述第二板狀體而保持上述第二板狀體之功能,並且能夠於抵接在上述第二板狀體之表面之抵接位置、與自上述第二板狀體之表面離開而設置有用以供上述抵接構件通過之間隙之待機位置之間移動;以及控制機構,其控制上述剝離機構及上述抵接構件之移動而執行剝離動作;在上述剝離動作中,上述抵接構件一面抵接在上述第二板狀體之表面一面於與上述剝離機構之間隙空間向上述剝離方向移動,上述剝離機構之各者於沿上述剝離方向依次向上述第二板狀體移動且抵接在上述抵接構件通過後之上述第二板狀體之表面之後,一面保持上述第二板狀體一面沿對於上述第一板狀體離開方向移動而使上述第二板狀體自上述第一板狀體離開,上述剝離機構各者之移動時序係根據預先使上述抵接構件沿上述剝離方向移動而取得之上述抵接構件通過與上述剝離機構之對向位置之時序、與表示上述抵接構件之上述剝離方向上之位置之位置資訊之對應關係而設定。 Further, in order to achieve the above object, an aspect of the peeling device of the present invention includes: a holding mechanism that holds the first plate-shaped body and the second plate-shaped body directly or through a thin layer by holding the first plate-shaped body a contact body that is in close contact with each other; the abutting member abuts against the surface of the second plate-shaped body of the adhesion body held by the holding mechanism, and is parallel to the surface of the second plate-shaped body Moving in the peeling direction; a plurality of peeling mechanisms are arranged in the peeling direction, and each of them has a function of partially contacting the second plate-shaped body to hold the second plate-shaped body, and is capable of abutting against the second plate a contact position between the surface of the plate-like body and a standby position away from the surface of the second plate-shaped body to provide a gap for the passage of the abutting member; and a control mechanism for controlling the peeling mechanism and a peeling operation is performed by the movement of the abutting member; and in the peeling operation, the abutting member abuts against the surface of the second plate-shaped body and faces the gap space with the peeling mechanism The peeling direction moves, and each of the peeling mechanisms sequentially moves toward the second plate-shaped body in the peeling direction and abuts against the surface of the second plate-shaped body after the abutting member passes The second plate-shaped body moves away from the first plate-shaped body to separate the second plate-shaped body from the first plate-shaped body, and the movement timing of each of the peeling mechanisms is based on the abutting member along the advance The abutting member obtained by the movement in the peeling direction is set by a correspondence relationship between the timing of the opposing position of the peeling mechanism and the positional information indicating the position of the abutting member in the peeling direction.

於如此般構成之發明中,根據抵接構件於移動時實際上通過與剝離機構之對向位置之時序和抵接構件之位置之對應關係,設定與抵 接構件協作而使剝離前進之剝離機構各者之移動時序。即,於掌握抵接構件實際上通過與剝離機構之對向位置之時序和表示抵接構件之位置之位置資訊之對應關係之後,決定剝離機構之動作。因此,無論剝離機構如何配置,均可於與其配置對應之時序使各剝離機構動作。由此,可避免於抵接構件通過之前剝離機構接近第二板狀體而使抵接構件與剝離機構碰撞,或利用剝離機構對第二板狀體之保持過慢而無法良好地進行剝離之問題,從而能夠使各剝離機構之動作最佳化。 In the invention of such a configuration, according to the correspondence between the timing of the opposing position of the abutting member and the position of the abutting member when the abutting member is moved, the setting is determined. The movement timing of each of the peeling mechanisms in which the joining members cooperate to advance the peeling. That is, the operation of the peeling mechanism is determined after grasping the correspondence between the timing at which the abutting member actually passes the opposing position with the peeling mechanism and the position information indicating the position of the abutting member. Therefore, regardless of how the peeling mechanism is disposed, each peeling mechanism can be operated at a timing corresponding to the arrangement thereof. Therefore, it is possible to prevent the abutting member from colliding with the peeling mechanism before the abutting member passes the peeling mechanism, or the second plate-shaped body is too slow to be peeled off by the peeling mechanism. The problem is that the action of each peeling mechanism can be optimized.

如上所述,根據本發明,能夠使各剝離機構之移動時序對應於剝離機構之實際配置,從而可避免抵接構件與剝離機構之干涉,並且可簡單地使各個剝離機構之動作最佳化。 As described above, according to the present invention, the movement timing of each peeling mechanism can be made to correspond to the actual arrangement of the peeling mechanism, and the interference between the abutting member and the peeling mechanism can be avoided, and the operation of each peeling mechanism can be easily optimized.

1‧‧‧剝離裝置 1‧‧‧ peeling device

3‧‧‧載台區塊 3‧‧‧Loading block

5‧‧‧上部吸附區塊 5‧‧‧Upper adsorption block

5i‧‧‧吸附單元 5i‧‧‧Adsorption unit

5i1‧‧‧樑構件 5i1‧‧‧beam components

5i2‧‧‧柱構件 5i2‧‧‧column components

5i3‧‧‧柱構件 5i3‧‧‧column components

5i4‧‧‧板構件 5i4‧‧‧ board components

5i5‧‧‧升降機構 5i5‧‧‧ Lifting mechanism

5i6‧‧‧墊支持構件 5i6‧‧‧pad support member

5i7‧‧‧吸附墊 5i7‧‧‧Adsorption pad

5i4(i=1、2、...、N)‧‧‧板構件 5i4 (i = 1, 2, ..., N) ‧ ‧ board components

5i6(i=1、2、…、N)‧‧‧墊保持構件 5i6 (i = 1, 2, ..., N) ‧ ‧ pad holding member

5i6y‧‧‧(+Y)側端面 5i6y‧‧‧(+Y) side end face

5i7(i=1、2、…、N)‧‧‧吸附墊 5i7 (i = 1, 2, ..., N) ‧ ‧ adsorption pad

5N‧‧‧吸附單元(剝離機構) 5N‧‧‧Adsorption unit (peeling mechanism)

11‧‧‧主框架 11‧‧‧Main frame

30‧‧‧載台(保持機構) 30‧‧‧Moving station (holding mechanism)

31‧‧‧水平載台部 31‧‧‧ horizontal stage

32‧‧‧錐形載台部 32‧‧‧Conical stage

33‧‧‧初始剝離單元 33‧‧‧Initial stripping unit

34‧‧‧輥單元 34‧‧‧roll unit

50‧‧‧支持框架 50‧‧‧Support framework

51‧‧‧吸附單元(剝離機構) 51‧‧‧Adsorption unit (peeling mechanism)

52‧‧‧吸附單元(剝離機構) 52‧‧‧Adsorption unit (peeling mechanism)

53‧‧‧吸附單元(剝離機構) 53‧‧‧Adsorption unit (peeling mechanism)

54‧‧‧吸附單元 54‧‧‧Adsorption unit

70‧‧‧控制單元 70‧‧‧Control unit

310‧‧‧(水平載台部之)上表面 310‧‧‧ (horizontal stage)

311‧‧‧槽 311‧‧‧ slot

312‧‧‧槽 312‧‧‧ slot

320‧‧‧(錐形載台部之)上表面 320‧‧‧ (of the cone stage) upper surface

331‧‧‧按壓構件 331‧‧‧ Pressing members

332‧‧‧支持臂 332‧‧‧Support arm

333‧‧‧導軌 333‧‧‧rail

334‧‧‧柱構件 334‧‧‧column components

335‧‧‧升降機構 335‧‧‧ Lifting mechanism

336‧‧‧基座部 336‧‧‧Base section

337‧‧‧位置調整機構 337‧‧‧Location adjustment agency

340‧‧‧剝離輥(抵接構件) 340‧‧‧ peeling roller (abutment member)

341‧‧‧滑塊 341‧‧‧ Slider

342‧‧‧滑塊 342‧‧‧ Slider

343‧‧‧下部角形件 343‧‧‧lower angled pieces

344‧‧‧升降機構 344‧‧‧ Lifting mechanism

345‧‧‧上部角形件 345‧‧‧Upper angled pieces

346‧‧‧支承輥 346‧‧‧Support roll

347‧‧‧攝像部(檢測機構、攝像機構) 347‧‧‧Photography department (detection mechanism, camera organization)

351‧‧‧導軌 351‧‧‧rail

352‧‧‧導軌 352‧‧‧rail

353‧‧‧馬達(脈衝馬達) 353‧‧‧Motor (pulse motor)

354‧‧‧滾珠螺桿機構 354‧‧‧Rolling screw mechanism

517‧‧‧吸附墊 517‧‧‧Adsorption pad

527‧‧‧吸附墊 527‧‧‧Adsorption pad

537‧‧‧吸附墊 537‧‧‧Adsorption pad

547‧‧‧吸附墊 547‧‧‧Adsorption pad

557‧‧‧吸附墊 557‧‧‧Adsorption pad

701‧‧‧CPU 701‧‧‧CPU

702‧‧‧馬達控制部 702‧‧‧Motor Control Department

703‧‧‧閥控制部 703‧‧‧Valve Control Department

704‧‧‧負壓供給部 704‧‧‧Negative Pressure Supply Department

705‧‧‧UI部 705‧‧‧UI Department

706‧‧‧圖像處理部 706‧‧‧Image Processing Department

BL‧‧‧敷層(第一板狀體) BL‧‧‧layer (first plate)

c1‧‧‧脈衝計數值 C1‧‧‧pulse count value

c2‧‧‧脈衝計數值 C2‧‧‧ pulse count value

c3‧‧‧脈衝計數值 C3‧‧‧ pulse count value

c4‧‧‧脈衝計數值 C4‧‧‧ pulse count value

c5‧‧‧脈衝計數值 C5‧‧‧pulse count value

E‧‧‧脊線部 E‧‧‧ ridge line

IM‧‧‧圖像 IM‧‧‧ image

Ls‧‧‧基準線 Ls‧‧ baseline

SB‧‧‧基板(第二板狀體) SB‧‧‧ substrate (second plate)

WK‧‧‧工件(密接體) WK‧‧‧ workpiece (closed body)

V3‧‧‧閥群 V3‧‧‧ valve group

V5‧‧‧閥群 V5‧‧‧ valve group

S101~S109‧‧‧步驟 S101~S109‧‧‧Steps

θ‧‧‧角 Θ‧‧‧ corner

α‧‧‧角 ‧‧‧‧角

β‧‧‧角 ‧‧‧‧角

+X‧‧‧方向 +X‧‧‧ directions

-X‧‧‧方向 -X‧‧‧ directions

+Y‧‧‧方向 +Y‧‧ Direction

-Y‧‧‧方向 -Y‧‧ Direction

+Z‧‧‧方向 +Z‧‧‧ directions

-Z‧‧‧方向 -Z‧‧‧ directions

圖1係表示本發明之剝離裝置之一實施形態之立體圖。 Fig. 1 is a perspective view showing an embodiment of a peeling device of the present invention.

圖2係表示該剝離裝置之主要構成之立體圖。 Fig. 2 is a perspective view showing the main configuration of the peeling device.

圖3係表示初始剝離單元之構造及各部之位置關係之側視圖。 Fig. 3 is a side view showing the structure of the initial peeling unit and the positional relationship of the respective parts.

圖4係表示該剝離裝置之電性構成之框圖。 Fig. 4 is a block diagram showing the electrical configuration of the peeling device.

圖5A、圖5B、圖5C、圖5D係表示剝離動作之過程中之各部之動作之圖。 5A, 5B, 5C, and 5D are views showing the operation of each unit in the process of the peeling operation.

圖6A、圖6B、圖6C係表示吸附單元之配設圖案不同之例之圖。 6A, 6B, and 6C are views showing examples in which the arrangement patterns of the adsorption units are different.

圖7A、圖7B係表示輥單元與吸附單元之位置關係之圖。 7A and 7B are views showing the positional relationship between the roller unit and the adsorption unit.

圖8A、圖8B、圖8C係表示利用攝像部拍攝吸附單元之態樣之圖。 8A, 8B, and 8C are views showing a state in which an adsorption unit is imaged by an imaging unit.

圖9係表示吸附單元之移動時序之設定方法之流程圖。 Fig. 9 is a flow chart showing a method of setting the movement timing of the adsorption unit.

圖10A、圖10B係說明吸附單元之移動時序之原理之圖。 10A and 10B are views for explaining the principle of the movement timing of the adsorption unit.

圖1係表示本發明之剝離裝置之一實施形態之立體圖。為統一地 表示各圖中之方向,如圖1右下所示設定XYZ正交座標軸。此處,XY平面表示水平面。另外,Z軸表示鉛垂軸,更詳細而言,(-Z)方向表示鉛垂朝下方向。 Fig. 1 is a perspective view showing an embodiment of a peeling device of the present invention. Uniformly Indicates the direction in each figure, and sets the XYZ orthogonal coordinate axis as shown in the lower right of Figure 1. Here, the XY plane represents a horizontal plane. Further, the Z axis represents a vertical axis, and more specifically, the (-Z) direction indicates a vertical direction.

該剝離裝置1係用以使以主面彼此相互密接之狀態搬入之兩片板狀體剝離之裝置。例如於玻璃基板或半導體基板等基板之表面形成特定圖案之圖案形成製程之一部分中使用。更具體而言,於該圖案形成製程中,於作為暫時擔載應轉印於被轉印體即基板之圖案之擔載體之敷層表面,均勻地塗佈圖案形成材料(塗佈步驟)。繼而,藉由將根據圖案形狀而進行了表面加工之版抵壓於敷層上之塗佈層而使塗佈層圖案化(圖案化步驟)。如此般使形成有圖案之敷層與基板密接(轉印步驟),由此將圖案最終自敷層轉印至基板。 This peeling device 1 is a device for peeling off two plate-like bodies carried in a state in which the main surfaces are in close contact with each other. For example, it is used in one part of a pattern forming process for forming a specific pattern on the surface of a substrate such as a glass substrate or a semiconductor substrate. More specifically, in the pattern forming process, the pattern forming material is uniformly applied to the surface of the cladding layer which is temporarily carried on the carrier to be transferred onto the substrate of the substrate to be transferred, (coating step). Then, the coating layer is patterned by patterning the surface-processed plate according to the pattern shape against the coating layer (patterning step). The patterned coating layer is adhered to the substrate in this manner (transfer step), whereby the pattern is finally transferred from the cladding layer to the substrate.

此時,為使圖案化步驟中密接之版與敷層之間、或轉印步驟中密接之基板與敷層之間離開,可適當地應用本裝置。當然,既可用於該些兩者,亦可於除此之外之用途中使用。例如,亦可應用於將擔載於擔載體上之薄膜轉印至基板時之剝離製程。除此之外,可將本裝置應用於使直接或隔著薄膜等薄層密接之兩片板狀體剝離之所有製程。 At this time, in order to separate the substrate and the coating which are in close contact between the plate and the coating in the patterning step or in the transfer step, the apparatus can be suitably applied. Of course, it can be used for both of them, and can also be used for other purposes. For example, it can also be applied to a peeling process when a film supported on a carrier is transferred to a substrate. In addition to this, the apparatus can be applied to all processes in which two sheet-like bodies which are directly or in contact with each other through a thin layer such as a film are peeled off.

該剝離裝置1具有於安裝於框體之主框架11上分別固定有載台區塊3及上部吸附區塊5之構造。圖1中為表示裝置之內部構造而省略框體之圖示。另外,除該些各區塊之外,該剝離裝置1包含下述之控制單元70(圖4)。 The peeling device 1 has a structure in which the stage block 3 and the upper adsorption block 5 are fixed to the main frame 11 attached to the frame. Fig. 1 is a view showing the internal structure of the device and omitting the frame. Further, in addition to the respective blocks, the peeling device 1 includes the following control unit 70 (Fig. 4).

載台區塊3具有用以載置版與敷層、或基板與敷層密接而成之密接體(以下,稱為「工件」)之載台30。載台30包含上表面為大致水平之平面之水平載台部31、及上表面為相對於水平面具有數度(例如2度左右)之斜率之平面之錐形載台部32。於載台30之錐形載台部32側即(-Y)側之端部附近設置有初始剝離單元33。另外,以橫跨水平載台部31之方式設置有輥單元34。 The stage block 3 has a stage 30 for placing a plate and a coating, or a bonded body (hereinafter referred to as a "workpiece") in which the substrate and the coating are in close contact with each other. The stage 30 includes a horizontal stage portion 31 whose upper surface is a substantially horizontal plane, and a tapered stage portion 32 whose upper surface is a plane having a slope of several degrees (for example, about 2 degrees) with respect to a horizontal plane. An initial peeling unit 33 is provided in the vicinity of the end portion on the (-Y) side of the tapered stage portion 32 of the stage 30. Further, the roller unit 34 is provided so as to straddle the horizontal stage portion 31.

另一方面,上部吸附區塊5包含自主框架11立設並且以覆蓋載台區塊3之上部之方式設置之支持框架50。於支持框架50安裝有N組(N為自然數)之吸附單元51、52、53、…、5N。該些吸附單元51~5N依次排列於(+Y)方向。以下,於需要區別各吸附單元之情形時,將於(+Y)方向數起第i個(i為自然數)吸附單元5i稱為「第i吸附單元」。 On the other hand, the upper adsorption block 5 includes a support frame 50 in which the autonomous frame 11 is erected and disposed to cover the upper portion of the stage block 3. N groups (N is a natural number) of adsorption units 51, 52, 53, ..., 5N are mounted on the support frame 50. The adsorption units 51 to 5N are sequentially arranged in the (+Y) direction. Hereinafter, when it is necessary to distinguish each adsorption unit, the i-th (i is a natural number) adsorption unit 5i will be referred to as an "i-th adsorption unit" in the (+Y) direction.

圖2係表示該剝離裝置之主要構成之立體圖。更具體而言,圖2表示剝離裝置1之各構成中之載台30、輥單元34及第i吸附單元5i之構造。載台30包含上表面310為大致水平面之水平載台部31、及上表面320為相對於水平面傾斜數度之錐形面之錐形載台部32。水平載台部31之上表面310具有較載置之工件之平面尺寸稍大之平面尺寸。 Fig. 2 is a perspective view showing the main configuration of the peeling device. More specifically, FIG. 2 shows the structure of the stage 30, the roller unit 34, and the i-th adsorption unit 5i in each configuration of the peeling device 1. The stage 30 includes a horizontal stage portion 31 whose upper surface 310 is substantially horizontal, and a tapered stage portion 32 whose upper surface 320 is a tapered surface that is inclined by a few degrees with respect to the horizontal plane. The upper surface 310 of the horizontal stage portion 31 has a planar size slightly larger than the planar size of the workpiece to be placed.

錐形載台部32與水平載台部31之(-Y)側端部密接而設置。其上表面320於與水平載台部31接觸之部分位於與水平載台部31之上表面310相同之高度(Z方向位置)。另一方面,伴隨自水平載台部31向(-Y)方向遠離,上表面320朝下方即(-Z)方向後退。因此,於載台30整體,水平載台部31之上表面310之水平面與錐形載台部32之上表面320之錐形面連續,且其等連接之脊線部E成為於X方向延伸之直線狀。 The tapered stage portion 32 is provided in close contact with the (-Y) side end portion of the horizontal stage portion 31. The portion of the upper surface 320 that is in contact with the horizontal stage portion 31 is located at the same height (Z-direction position) as the upper surface 310 of the horizontal stage portion 31. On the other hand, as the horizontal stage portion 31 moves away from the (-Y) direction, the upper surface 320 retreats downward (i.e., the (-Z) direction. Therefore, in the entire stage 30, the horizontal surface of the upper surface 310 of the horizontal stage portion 31 is continuous with the tapered surface of the upper surface 320 of the tapered stage portion 32, and the ridge line portion E of the connection is extended in the X direction. Straight line.

另外,於水平載台部31之上表面310刻設有格子狀之槽。更具體而言,於水平載台部31之上表面310之中央部設置有格子狀之槽311。另外,以包圍形成有槽311之區域之方式、且以成為將矩形中之錐形載台部32側之1邊除去之形狀之方式,於水平載台部31之上表面310周緣部設置有槽312。該些槽311、312係經由控制閥而與下述之負壓供給部704(圖4)連接,且具有作為吸附槽之功能,即藉由被供給負壓而吸附保持載台30上所載置之工件。2種槽311、312於載台上並未相連,另外,經由相互獨立之控制閥而與負壓供給部704連接。因此,除使用兩種槽進行吸附之外,亦可僅使用一種槽進行吸附。 Further, a lattice-shaped groove is formed in the upper surface 310 of the horizontal stage portion 31. More specifically, a lattice-shaped groove 311 is provided at a central portion of the upper surface 310 of the horizontal stage portion 31. In addition, the peripheral portion of the upper surface 310 of the horizontal stage portion 31 is provided so as to surround the region in which the groove 311 is formed and the shape of the side of the tapered stage portion 32 in the rectangular shape is removed. Slot 312. The grooves 311 and 312 are connected to the negative pressure supply unit 704 (FIG. 4) described below via a control valve, and have a function as an adsorption tank, that is, the adsorption holding cylinder 30 is carried by being supplied with a negative pressure. Set the workpiece. The two types of grooves 311 and 312 are not connected to the stage, and are connected to the negative pressure supply unit 704 via independent control valves. Therefore, in addition to the adsorption using two types of tanks, it is also possible to use only one type of tank for adsorption.

以橫跨如此般構成之載台30之方式設置有輥單元34。具體而 言,沿水平載台部31之X方向兩端部,於Y方向延伸設置有一對導軌351、352,該些導軌351、352固定於主框架11。而且,相對於導軌351、352而滑動自如地安裝有輥單元34。 A roller unit 34 is provided across the stage 30 thus constructed. Specifically In the X-direction end portions of the horizontal stage portion 31, a pair of guide rails 351 and 352 are extended in the Y direction, and the guide rails 351 and 352 are fixed to the main frame 11. Further, the roller unit 34 is slidably attached to the guide rails 351 and 352.

輥單元34包含分別與導軌351、352滑動自如地卡合之滑塊341、342。以連結該些滑塊341、342之方式設置有橫跨載台30之上部且於X方向延伸設置之下部角形件343。在下部角形件343,經由升降機構344而升降自如地安裝有上部角形件345。而且,以X方向為軸方向之圓柱狀之剝離輥340旋轉自如地安裝在上部角形件345。 The roller unit 34 includes sliders 341 and 342 that are slidably engaged with the guide rails 351 and 352, respectively. A lower corner piece 343 is provided across the upper portion of the stage 30 and extending in the X direction so as to connect the sliders 341 and 342. In the lower corner piece 343, an upper angled piece 345 is attached to the lower and lower angled piece 344 by a lifting mechanism 344. Further, a cylindrical peeling roller 340 having an X-direction in the axial direction is rotatably attached to the upper gusset 345.

若上部角形件345藉由升降機構344而向下方即(-Z)方向下降,則剝離輥340之下表面抵接於載置於載台30之工件之上表面。另一方面,在上部角形件345藉由升降機構344而定位於上方即(+Z)方向之位置之狀態下,剝離輥340成為向上方離開工件之上表面之狀態。在上部角形件345,旋轉自如地安裝有用以抑制剝離輥340彎曲之支承輥346,並且適當設置有用以防止上部角形件345自身彎曲之肋。剝離輥340及支承輥346不具有驅動源,其等自由旋轉。 When the upper gusset 345 is lowered downward (-Z) by the elevating mechanism 344, the lower surface of the peeling roller 340 abuts against the upper surface of the workpiece placed on the stage 30. On the other hand, in a state in which the upper gusset 345 is positioned above the (+Z) direction by the elevating mechanism 344, the peeling roller 340 is separated from the upper surface of the workpiece. In the upper gusset 345, a support roller 346 for suppressing the bending of the peeling roller 340 is rotatably mounted, and a rib useful for preventing the upper horn 345 from bending itself is appropriately provided. The peeling roller 340 and the backup roller 346 do not have a driving source, and the like is free to rotate.

輥單元34可藉由安裝於主框架11之馬達353而於Y方向移動。更具體而言,下部角形件343連結於作為將馬達353之旋轉運動轉換為直線運動之轉換機構之例如滾珠螺桿機構354。若馬達353旋轉,則下部角形件343沿導軌351、352於Y方向移動,由此輥單元34於Y方向移動。伴隨輥單元34之移動之剝離輥340之可動範圍於(-Y)方向設為至水平載台部31之(-Y)側端部之附近位置為止,於(+Y)方向上設為至水平載台部31之(+Y)側端部之附近位置為止。 The roller unit 34 is movable in the Y direction by the motor 353 attached to the main frame 11. More specifically, the lower corner piece 343 is coupled to, for example, a ball screw mechanism 354 as a conversion mechanism that converts the rotational motion of the motor 353 into a linear motion. When the motor 353 rotates, the lower corner piece 343 moves in the Y direction along the guide rails 351, 352, whereby the roller unit 34 moves in the Y direction. The movable range of the peeling roller 340 accompanying the movement of the roller unit 34 is set to the position near the (-Y) side end of the horizontal stage portion 31 in the (-Y) direction, and is set in the (+Y) direction to The position near the (+Y) side end of the horizontal stage portion 31 is set.

進而,於輥單元34安裝有攝像部347。攝像部347係具有攝像功能之例如CCD相機(charge-coupled device camera,電荷耦合器件相機),使攝像方向朝上而安裝在上部角形件345。詳情將在下文敍述,攝像部347伴隨輥單元34之移動而與剝離輥340一同沿Y方向移動,拍 攝排列於輥單元34上方之吸附單元51等。 Further, an imaging unit 347 is attached to the roller unit 34. The imaging unit 347 is, for example, a CCD camera (charge-coupled device camera) having an imaging function, and is attached to the upper horn 345 with the imaging direction facing upward. As will be described later in detail, the imaging unit 347 moves in the Y direction together with the peeling roller 340 in association with the movement of the roller unit 34. The adsorption unit 51 and the like arranged above the roller unit 34 are taken.

其次,對第i吸附單元5i(i=1、2、…、N)之構成進行說明。此外,第一至第N吸附單元51~5N均具有相同構造。第i吸附單元5i具有於X方向延伸設置且固定於支持框架50之樑構件5i1。於樑構件5i1,於X方向上相互錯開位置而安裝有向鉛垂下方即(-Z)方向延伸之一對柱構件5i2、5i3。於柱構件5i2、5i3,經由圖中被遮擋之導軌而升降自如地安裝有板構件5i4。板構件5i4藉由包含馬達及轉換機構(例如滾珠螺桿機構)之升降機構5i5而升降驅動。 Next, the configuration of the i-th adsorption unit 5i (i = 1, 2, ..., N) will be described. Further, the first to N-th adsorption units 51 to 5N have the same configuration. The i-th adsorption unit 5i has a beam member 5i1 extending in the X direction and fixed to the support frame 50. The pair of column members 5i2 and 5i3 are attached to the beam member 5i1 so as to be displaced from each other in the (-Z) direction. The plate members 5i2 and 5i3 are attached to the column members 5i2 and 5i3 so as to be lifted and lowered by the guide rails that are blocked in the drawing. The plate member 5i4 is driven up and down by an elevating mechanism 5i5 including a motor and a switching mechanism (for example, a ball screw mechanism).

於板構件5i4之下部安裝有於X方向延伸之方棒狀之墊支持構件5i6。於墊支持構件5i6之下表面,於X方向上等間隔地排列有多個吸附墊5i7。圖2中表示使第i吸附單元5i向較實際位置更上方移動之狀態,於藉由升降機構5i5而使板構件5i4向下方移動時,吸附墊5i7可下降至與水平載台部31之上表面310極其接近之位置為止。於載台30上載置有工件之狀態下,吸附墊5i7抵接於工件之上表面。對各吸附墊5i7賦予來自下述之負壓供給部704之負壓而吸附保持工件之上表面。 A square rod-shaped pad supporting member 5i6 extending in the X direction is attached to the lower portion of the plate member 5i4. On the lower surface of the pad supporting member 5i6, a plurality of adsorption pads 5i7 are arranged at equal intervals in the X direction. 2 shows a state in which the i-th adsorption unit 5i is moved upwards from the actual position. When the plate member 5i4 is moved downward by the elevating mechanism 5i5, the adsorption pad 5i7 can be lowered onto the horizontal stage portion 31. The surface 310 is extremely close to the position. In a state in which the workpiece is placed on the stage 30, the adsorption pad 5i7 abuts against the upper surface of the workpiece. Each of the adsorption pads 5i7 is given a negative pressure from the negative pressure supply portion 704 described below to adsorb and hold the upper surface of the workpiece.

圖3係表示初始剝離單元之構造及各部之位置關係之側視圖。首先,一面參照圖1及圖3一面說明初始剝離單元33之構造。初始剝離單元33具有於錐形載台部32之上方且於X方向延伸設置之棒狀之按壓構件331,按壓構件331藉由支持臂332支持。支持臂332經由於鉛垂方向延伸設置之導軌333而升降自如地安裝於柱構件334。藉由升降機構335之作動,支持臂332相對於柱構件334上下移動。柱構件334藉由安裝於主框架11之基座部336支持,柱構件334之Y方向位置可藉由位置調整機構337而於基座部336上於特定之範圍內調整。 Fig. 3 is a side view showing the structure of the initial peeling unit and the positional relationship of the respective parts. First, the structure of the initial peeling unit 33 will be described with reference to Figs. 1 and 3 . The initial peeling unit 33 has a rod-shaped pressing member 331 extending above the tapered stage portion 32 and extending in the X direction, and the pressing member 331 is supported by the support arm 332. The support arm 332 is attached to the column member 334 so as to be movable up and down via a guide rail 333 extending in the vertical direction. The support arm 332 moves up and down relative to the column member 334 by the action of the lifting mechanism 335. The column member 334 is supported by the base portion 336 attached to the main frame 11, and the position of the column member 334 in the Y direction can be adjusted on the base portion 336 by a position adjustment mechanism 337 within a specific range.

將剝離對象物即工件WK載置於由水平載台部31及錐形載台部32構成之載台30。上述之圖案化步驟中之工件係將版與敷層隔著圖案形成材料之薄膜密接而成之密接體。另一方面,轉印步驟中之工件係將 基板與敷層隔著經圖案化之圖案密接而成之密接體。以下,對將轉印步驟中之基板SB與敷層BL之密接體作為工件WK之情形時之剝離裝置1之剝離動作進行說明。於將由版與敷層構成之密接體作為工件之情形時亦可藉由相同之方法進行剝離。 The workpiece WK, which is a peeling target, is placed on the stage 30 composed of the horizontal stage portion 31 and the tapered stage portion 32. The workpiece in the above-described patterning step is a close-contact body in which a plate and a coating layer are adhered to each other via a film of a pattern forming material. On the other hand, the workpiece in the transfer step will The substrate and the cladding are adhered to each other via a patterned pattern. Hereinafter, the peeling operation of the peeling device 1 in the case where the bonded body of the substrate SB and the cladding layer BL in the transfer step is used as the workpiece WK will be described. When the dense body composed of the plate and the cladding layer is used as the workpiece, the peeling can be performed by the same method.

於工件WK中,敷層BL具有較基板SB更大之平面尺寸。基板SB密接於敷層BL之大致中央部。工件WK係使敷層BL在下且使基板SB在上而載置於載台30。此時,如圖3所示,以使工件WK中基板SB之(-Y)側端部成為水平載台部31與錐形載台部32之分界之脊線部E之大致上方,更詳細而言為較脊線部E稍靠(-Y)側之位置之方式將工件WK載置於載台30。因此,於(-Y)方向上較基板SB更外側之敷層BL以於錐形載台部32上伸出之方式配置,從而於敷層BL之下表面與錐形載台部32之上表面320之間產生間隙。敷層BL之下表面與錐形載台部32之上表面320所成之角θ為與錐形載台部32之錐角相同之數度(本實施形態中為2度)左右。 In the workpiece WK, the cladding layer BL has a larger planar size than the substrate SB. The substrate SB is in close contact with the substantially central portion of the cladding layer BL. The workpiece WK is placed on the stage 30 with the cladding layer BL on the bottom and the substrate SB on the top. At this time, as shown in FIG. 3, the (-Y) side end portion of the substrate SB in the workpiece WK is substantially above the ridge line portion E of the boundary between the horizontal stage portion 31 and the tapered stage portion 32, and is more detailed. In other words, the workpiece WK is placed on the stage 30 so that the ridge portion E is slightly closer to the (-Y) side. Therefore, the cladding layer BL on the outer side of the substrate SB in the (-Y) direction is disposed so as to protrude from the tapered stage portion 32 so as to be above the lower surface of the cladding layer BL and the tapered stage portion 32. A gap is created between the surfaces 320. The angle θ between the lower surface of the cladding layer BL and the upper surface 320 of the tapered stage portion 32 is about the same as the taper angle of the tapered stage portion 32 (2 degrees in the present embodiment).

於水平載台部31設置有吸附槽311、312,吸附保持敷層BL之下表面。其中,吸附槽311吸附與基板SB之下部接觸之敷層BL之下表面,另一方面,吸附槽312吸附較基板SB更外側之敷層BL之下表面。吸附槽311、312可相互獨立地接通、斷開吸附,且可一同使用2種吸附槽311、312而強力地吸附敷層BL。另一方面,藉由僅使用外側之吸附槽312進行吸附,不對有效地形成有圖案之敷層BL之中央部進行吸附,而可防止由吸附所致之敷層BL之彎曲所引起之圖案損傷。如此,藉由獨立地控制對中央部之吸附槽311與對周緣部之吸附槽312之負壓供給,可根據目的而切換敷層BL之吸附保持之態樣。 The horizontal stage portion 31 is provided with adsorption grooves 311 and 312 for adsorbing and holding the lower surface of the cladding layer BL. The adsorption groove 311 adsorbs the lower surface of the cladding layer BL which is in contact with the lower portion of the substrate SB, and on the other hand, the adsorption groove 312 adsorbs the lower surface of the cladding layer BL which is outside the substrate SB. The adsorption grooves 311 and 312 can be independently turned on and off, and the two types of adsorption grooves 311 and 312 can be used together to strongly adsorb the coating layer BL. On the other hand, by using only the outer adsorption groove 312 for adsorption, the central portion of the coating layer BL on which the pattern is effectively formed is not adsorbed, and pattern damage caused by the bending of the coating layer BL due to adsorption can be prevented. . By independently controlling the supply of the negative pressure to the adsorption groove 311 at the center portion and the adsorption groove 312 at the peripheral portion, the adsorption and retention of the coating layer BL can be switched depending on the purpose.

如此般於吸附保持於載台30之工件WK之上方,配置有第一至第N吸附單元51~5N、及輥單元34之剝離輥340。如上所述,於第i吸附單元5i之下部,於X方向排列設置有多個吸附墊5i7。更詳細而言,吸 附墊5i7係由例如橡膠或矽樹脂等具有柔軟性及彈性之材料形成,且具有下表面抵接於工件WK之上表面(更具體而言為基板SB之上表面)而吸附工件之功能。以下,藉由對設置於各吸附單元51、52、…、5N之吸附墊分別標註符號517、527、…、5N7而相互區別。 The first to Nth adsorption units 51 to 5N and the separation roller 340 of the roller unit 34 are disposed above the workpiece WK adsorbed and held by the stage 30 in this manner. As described above, a plurality of adsorption pads 5i7 are arranged in the X direction in the lower portion of the i-th adsorption unit 5i. In more detail, suck The attachment pad 5i7 is formed of a material having flexibility and elasticity such as rubber or silicone resin, and has a function that the lower surface abuts against the upper surface of the workpiece WK (more specifically, the upper surface of the substrate SB) to adsorb the workpiece. Hereinafter, the adsorption pads provided in the respective adsorption units 51, 52, ..., 5N are distinguished from each other by the reference numerals 517, 527, ..., 5N7.

第一吸附單元51設置於水平載台部31之(-Y)側端部之上方,於下降時吸附基板SB之(-Y)側端部之上表面。另一方面,第N吸附單元5N設置於被載置於載台30上之基板SB之(+Y)側端部之上方,於下降時吸附基板SB之(+Y)側端部之上表面。於該等之間適當地分散配置第二吸附單元52至第(N-1)吸附單元5(N-1),例如可使吸附墊517~5N7於Y方向上成為大致等間隔。此外,如下所述,吸附墊517~5N7之間隔亦可根據需要而設為不均等。於該些吸附單元51~5N之間,能夠相互獨立地執行朝上下方向之移動及吸附之接通及斷開。 The first adsorption unit 51 is disposed above the (-Y)-side end of the horizontal stage portion 31, and adsorbs the upper surface of the (-Y)-side end portion of the substrate SB when descending. On the other hand, the Nth adsorption unit 5N is disposed above the (+Y) side end portion of the substrate SB placed on the stage 30, and adsorbs the upper surface of the (+Y) side end portion of the substrate SB when descending. . The second adsorption unit 52 to the (N-1) adsorption unit 5 (N-1) are appropriately dispersed and disposed between these, and for example, the adsorption pads 517 to 5N7 can be formed at substantially equal intervals in the Y direction. Further, as described below, the interval between the adsorption pads 517 to 5N7 may be set to be uneven as needed. Between the adsorption units 51 to 5N, the movement in the vertical direction and the on and off of the adsorption can be performed independently of each other.

剝離輥340於上下方向移動而相對於基板SB接近、離開移動,並且藉由於Y方向移動而沿基板SB水平移動。於剝離輥340下降之狀態下,抵接於基板SB之上表面而一面滾動一面水平移動。移動至最靠(-Y)側時之剝離輥340之位置為第一吸附單元51之吸附墊517之最靠近(+Y)側之位置。為能夠實現向上述接近位置之配置,關於第一吸附單元51,將與圖2所示之第i吸附單元5i相同構造之吸附單元如圖1所示與其他第二至第N吸附單元52~5N朝向相反方向而安裝於支持框架50。 The peeling roller 340 moves in the up and down direction to move toward and away from the substrate SB, and horizontally moves along the substrate SB by moving in the Y direction. In a state where the peeling roller 340 is lowered, it abuts on the upper surface of the substrate SB and horizontally moves while rolling. The position of the peeling roller 340 when moving to the most (-Y) side is the position closest to the (+Y) side of the adsorption pad 517 of the first adsorption unit 51. In order to realize the arrangement to the above-mentioned close position, the adsorption unit having the same structure as the ith adsorption unit 5i shown in FIG. 2 is as shown in FIG. 1 and the other second to N-th adsorption units 52 to the first adsorption unit 51. The 5N is mounted to the support frame 50 in the opposite direction.

初始剝離單元33係以使按壓構件331位於向錐形載台部32上方突出之敷層BL之上方之方式調整其Y方向位置。而且,藉由支持臂332下降而按壓構件331之下端下降從而按壓敷層BL之上表面。此時,為使按壓構件331不會傷及敷層BL而使按壓構件331之前端由彈性構件形成。 The initial peeling unit 33 adjusts the Y-direction position such that the pressing member 331 is positioned above the coating layer BL that protrudes above the tapered stage portion 32. Further, the lower end of the pressing member 331 is lowered by the support arm 332 to be lowered to press the upper surface of the coating layer BL. At this time, in order to prevent the pressing member 331 from injuring the coating layer BL, the front end of the pressing member 331 is formed of an elastic member.

圖4係表示該剝離裝置之電性構成之框圖。裝置各部藉由控制單元70控制。控制單元70包含CPU(Central Processing Unit,中央處理單 元)701、馬達控制部702、閥控制部703、負壓供給部704、使用者介面(UI,User Interface)部705、及圖像處理部706。CPU701控制裝置整體之動作。馬達控制部702控制設置於各部之馬達類。閥控制部703控制設置於各部之閥類。負壓供給部704產生供給至各部之負壓。UI部705具有受理來自使用者之操作輸入或將裝置之狀態報告給使用者之功能。圖像處理部706根據圖像信號而執行特定之圖像處理。此外,於能夠利用工廠用電等自外部供給之負壓之情形時,控制單元70亦可不包含負壓供給部。 Fig. 4 is a block diagram showing the electrical configuration of the peeling device. The various parts of the device are controlled by a control unit 70. The control unit 70 includes a CPU (Central Processing Unit) A unit 701, a motor control unit 702, a valve control unit 703, a negative pressure supply unit 704, a user interface (UI, User Interface) unit 705, and an image processing unit 706. The CPU 701 controls the overall operation of the device. The motor control unit 702 controls motors provided in the respective units. The valve control unit 703 controls the valves provided in the respective units. The negative pressure supply unit 704 generates a negative pressure supplied to each unit. The UI unit 705 has a function of accepting an operation input from a user or reporting the status of the device to the user. The image processing unit 706 performs specific image processing in accordance with the image signal. Further, the control unit 70 may not include the negative pressure supply portion when the negative pressure supplied from the outside such as the factory power can be utilized.

馬達控制部702驅動控制設置於載台區塊3之馬達353及升降機構335、344、以及分別設置在上部吸附區塊5之各吸附單元51~5N之升降機構515~5N5等馬達群。閥控制部703控制設置於自負壓供給部704連結至設置於水平載台部31之吸附槽311、312之配管路徑上而用以對該些吸附槽個別地供給特定負壓之閥群V3、及設置於自負壓供給部704連結至各吸附墊517~5N7之配管路徑上而用以對各吸附墊517~5N供給特定負壓之閥群V5等。 The motor control unit 702 drives and controls the motor group 353 and the elevating mechanisms 335 and 344 provided in the stage block 3, and the motor groups such as the elevating mechanisms 515 to 5N5 provided in the respective adsorption units 51 to 5N of the upper adsorption block 5. The valve control unit 703 controls the valve group V3 that is connected to the piping path provided in the adsorption grooves 311 and 312 of the horizontal stage unit 31 from the negative pressure supply unit 704 to individually supply a specific negative pressure to the adsorption grooves. And a valve group V5 or the like for supplying a specific negative pressure to each of the adsorption pads 517 to 5N by the negative pressure supply unit 704 connected to the pipe paths of the adsorption pads 517 to 5N7.

圖像處理部706接收自攝像部347輸出之圖像信號而執行特定之圖像處理。詳情將在下文敍述,圖像處理部706自藉由攝像部347所拍攝之圖像檢測出第i吸附單元之像。 The image processing unit 706 receives the image signal output from the imaging unit 347 and performs specific image processing. The details will be described later, and the image processing unit 706 detects the image of the i-th adsorption unit from the image captured by the imaging unit 347.

其次,對如上所述般構成之剝離裝置1之動作進行說明。藉由該剝離裝置1執行之剝離動作與上述專利文獻1(日本專利特開2014-189350號公報)中記載之剝離裝置之剝離動作基本相同。因此,省略對該剝離裝置1之剝離動作之詳細說明,此處,簡單地說明剝離動作中之各部之動作。 Next, the operation of the peeling device 1 configured as described above will be described. The peeling operation performed by the peeling device 1 is basically the same as the peeling operation of the peeling device described in the above-mentioned Patent Document 1 (Japanese Laid-Open Patent Publication No. 2014-189350). Therefore, the detailed description of the peeling operation of the peeling device 1 will be omitted. Here, the operation of each part in the peeling operation will be briefly described.

當自外部將剝離對象物即工件WK搬入至該剝離裝置1並載置於載台30之特定位置時,裝置各部被定位於圖3所示之初始狀態。於初始狀態下,工件WK藉由吸附槽311、312之其中一個或兩個吸附保 持。另外,初始剝離單元33之按壓構件331、輥單元34之剝離輥340、第一至第N吸附單元51~5N之吸附墊517~5N7均自工件WK離開。各吸附單元5i以不與沿Y方向移行之輥單元34干涉之方式,於吸附墊5i7與基板SB之間隔開充分之間隙而配置。另外,剝離輥340處於在較第一吸附單元51之吸附墊517稍靠(+Y)側之位置自工件WK離開之狀態。自此種初始狀態執行剝離動作。 When the workpiece WK, which is the object to be peeled off, is carried into the peeling device 1 from the outside and placed on a specific position of the stage 30, the respective parts of the apparatus are positioned in the initial state shown in FIG. In the initial state, the workpiece WK is adsorbed by one or both of the adsorption grooves 311, 312. hold. Further, the pressing member 331 of the initial peeling unit 33, the peeling roller 340 of the roller unit 34, and the adsorption pads 517 to 5N7 of the first to Nth adsorption units 51 to 5N are all separated from the workpiece WK. Each of the adsorption units 5i is disposed with a sufficient gap between the adsorption pad 5i7 and the substrate SB so as not to interfere with the roller unit 34 that moves in the Y direction. Further, the peeling roller 340 is in a state of being separated from the workpiece WK at a position slightly closer to the (+Y) side than the adsorption pad 517 of the first adsorption unit 51. The peeling action is performed from such an initial state.

圖5A~圖5D係表示剝離動作之過程中之各部之動作之圖。首先,第一吸附單元51下降,吸附墊517抵接於基板SB之(-Y)側端部上表面而藉由負壓吸附保持基板SB。另外,剝離輥340下降而抵接於基板SB之上表面。如圖5A所示,按壓構件331自該狀態下降而下壓敷層BL之端部。敷層BL之端部於錐形載台部32之上方突出,從而於其下表面與錐形載台32之上表面320之間具有間隙。因此,藉由按壓構件331將敷層BL之端部向下方按壓,而使敷層BL之端部沿錐形載台部32之錐形面向下方彎曲。其結果,藉由第一吸附單元51吸附保持之基板SB之端部與敷層BL之間離開而開始剝離。 5A to 5D are views showing the operation of each part in the process of the peeling operation. First, the first adsorption unit 51 is lowered, and the adsorption pad 517 abuts against the upper surface of the (-Y) side end portion of the substrate SB to hold the substrate SB by vacuum suction. Further, the peeling roller 340 is lowered to abut against the upper surface of the substrate SB. As shown in FIG. 5A, the pressing member 331 descends from this state and presses the end portion of the blanket layer BL. The end of the cladding layer BL protrudes above the tapered stage portion 32 so as to have a gap between the lower surface thereof and the upper surface 320 of the tapered stage 32. Therefore, the end portion of the coating layer BL is pressed downward by the pressing member 331, and the end portion of the coating layer BL is bent downward along the tapered surface of the tapered stage portion 32. As a result, peeling is started by the end portion of the substrate SB adsorbed and held by the first adsorption unit 51 and the coating layer BL are separated.

繼而,如圖5B所示,第一吸附單元51開始上升,並且剝離輥340抵接於基板SB表面而一面滾動一面朝(+Y)方向移動。由此,基板SB與敷層BL之剝離朝(+Y)方向進行。因使剝離輥340抵接,故不會超出剝離輥340抵接於基板SB之區域而進行剝離。藉由使剝離輥340一面抵接於基板SB一面以固定速度向(+Y)方向移動,可將剝離之前進速度維持為固定。 Then, as shown in FIG. 5B, the first adsorption unit 51 starts to rise, and the peeling roller 340 abuts on the surface of the substrate SB while moving while moving in the (+Y) direction. Thereby, the peeling of the substrate SB and the cladding layer BL proceeds in the (+Y) direction. Since the peeling roller 340 abuts, peeling does not occur beyond the area where the peeling roller 340 abuts on the substrate SB. By moving the peeling roller 340 to the (+Y) direction at a fixed speed while abutting against the substrate SB, the peeling advance speed can be maintained constant.

以下,將基板SB與敷層BL已剝離之剝離區域、與尚未剝離之未剝離區域之分界線稱為「剝離分界線」。剝離輥340係於X方向延伸之輥構件,其一面抵接於基板SB一面朝(+Y)方向移動。因此,剝離分界線維持為沿輥延伸設置方向即X方向之一直線狀,而且以固定速度向(+Y)方向進行。由此,可切實地防止因剝離之前進速度之變動產生 之應力集中所導致之圖案損傷。 Hereinafter, the boundary between the peeling region where the substrate SB and the cladding layer BL have been peeled off and the unpeeled region where the cladding layer BL has not been peeled off is referred to as a "peeling boundary line". The peeling roller 340 is a roller member that extends in the X direction, and one surface abuts against the substrate SB and moves in the (+Y) direction. Therefore, the peeling boundary line is maintained linearly in the direction in which the roll is extended, that is, in the X direction, and is performed in the (+Y) direction at a constant speed. Thereby, it is possible to reliably prevent the occurrence of the change in the advance speed due to the peeling. Pattern damage caused by stress concentration.

吸附單元52、53、…相對於剝離輥340通過之後之基板SB依次下降,抵接於自敷層BL剛剝離後之基板SB並保持該基板SB。具體而言,如圖5B所示,第二吸附單元52當剝離輥340通過其正下方位置時開始下降並向基板SB前進。當吸附墊527抵接於基板SB之上表面時,藉由自負壓供給部704供給之負壓,而開始利用第二吸附單元52吸附保持基板SB。 The adsorption unit 52, 53, ... sequentially descends the substrate SB after passing through the peeling roller 340, and abuts against the substrate SB immediately after the self-coating layer BL is peeled off and holds the substrate SB. Specifically, as shown in FIG. 5B, the second adsorption unit 52 starts to descend and advance toward the substrate SB when the peeling roller 340 passes the position directly below it. When the adsorption pad 527 abuts against the upper surface of the substrate SB, the substrate SB is adsorbed and held by the second adsorption unit 52 by the negative pressure supplied from the negative pressure supply portion 704.

如圖5C所示,第二吸附單元52當開始基板SB之吸附保持時轉變為上升。此後,基板SB藉由第一吸附單元51與第二吸附單元52保持。由此,可更切實地保持自敷層BL之剝離前進之基板SB,從而可防止基板SB朝下彎曲而與敷層BL再接觸,或自吸附墊517脫落之問題。另外,藉由適當地保持剝離分界線附近之基板SB與敷層BL之角度,亦可取得使剝離良好地前進之效果。 As shown in FIG. 5C, the second adsorption unit 52 shifts to rise when the adsorption holding of the substrate SB is started. Thereafter, the substrate SB is held by the first adsorption unit 51 and the second adsorption unit 52. Thereby, the substrate SB from which the self-coating layer BL is peeled off can be more reliably maintained, and the substrate SB can be prevented from being bent downward to be in contact with the cladding layer BL or from the adsorption pad 517. Further, by appropriately maintaining the angle between the substrate SB and the cladding layer BL in the vicinity of the peeling boundary, it is possible to obtain an effect of facilitating the peeling.

其他吸附單元53、54、…、5N亦同樣地當剝離輥340通過該吸附單元之下方時開始下降,於吸附墊抵接於基板SB之時間點開始吸附保持並上升,由此將基板SB向上方提拉。各吸附單元在上升至自載台30起特定高度為止之時間點停止。 Similarly, the other adsorption units 53, 54, ..., 5N start to descend when the peeling roller 340 passes under the adsorption unit, and start to adsorb and hold up when the adsorption pad abuts against the substrate SB, thereby lifting the substrate SB upward. Party Tila. Each of the adsorption units is stopped at a point in time until it rises to a specific height from the stage 30.

剝離前進方向之最下游側即最靠(+Y)側之吸附單元5N保持基板SB並上升至特定位置為止,由此,如圖5D所示,基板SB與敷層BL完全分離而完成剝離。剝離輥340及按壓構件331退避至均自基板SB、敷層BL離開之位置,從而可將相互分離之基板SB與敷層BL搬出,如此完成剝離動作。 The most downstream (+Y) side adsorption unit 5N in the peeling advance direction holds the substrate SB and rises to a specific position. Thus, as shown in FIG. 5D, the substrate SB and the cladding layer BL are completely separated to complete the peeling. The peeling roller 340 and the pressing member 331 are retracted to a position away from the substrate SB and the cladding layer BL, so that the separated substrate SB and the cladding layer BL can be carried out, and the peeling operation is completed.

於如上所述之剝離動作中,關於吸附單元之配設數量及其配置,存在較佳為根據基板SB之種類或厚度、及形成於與敷層BL之間之圖案或薄膜之種類而變更之情形。 In the peeling operation as described above, the number of the adsorption units to be disposed and the arrangement thereof are preferably changed depending on the type or thickness of the substrate SB and the type of the pattern or film formed between the coating layer BL and the coating layer BL. situation.

圖6A~圖6C係表示吸附單元之配設圖案不同之例之圖。例如, 於因擔載於基板SB與敷層BL之間之圖案之材料或形狀而使兩者間之密接力相對較弱之情形時,如圖6A所示,較佳為將剝離後之基板SB與敷層BL所成之角α保持為相對較小之值而進行剝離。於此種目的下,剝離所需之提拉力亦較小,故於Y方向上將吸附單元以較大之間隔配置即可。 6A to 6C are views showing examples in which the arrangement patterns of the adsorption units are different. E.g, In the case where the adhesion between the substrate SB and the cladding layer BL is relatively weak, as shown in FIG. 6A, the substrate SB after the separation is preferably The angle α formed by the coating layer BL is kept at a relatively small value to be peeled off. For such a purpose, the pulling force required for peeling is also small, so that the adsorbing units can be disposed at a large interval in the Y direction.

另一方面,例如於基板SB與敷層BL之密接力相對較強之情形時,如圖6B所示,較佳為將剝離後之基板SB與敷層BL所成之角β維持為更大之值而進行剝離。另外,必須使提拉基板SB之力更大。因此,必須使Y方向上之吸附單元間之間隔更小,從而需要根據情形而使吸附單元之配設數量增加。 On the other hand, for example, when the adhesion between the substrate SB and the cladding layer BL is relatively strong, as shown in FIG. 6B, it is preferable to maintain the angle β formed by the substrate SB after the peeling and the cladding layer BL to be larger. Peel off at the value. In addition, the force of pulling the substrate SB must be made larger. Therefore, it is necessary to make the interval between the adsorption units in the Y direction smaller, so that it is necessary to increase the number of the adsorption units according to the situation.

另外,例如於基板SB之剛性較高而難以彎曲之情形時,必須一面減小基板SB與敷層BL所成之角,一面以相對較強之提拉力提拉基板SB。於此情形時,亦需要使吸附單元之數量增加。例如,為對應此種情形,如圖6C所示,亦考慮於基板SB之端部附近接近配置吸附單元等使吸附單元之間隔不均等。 Further, for example, when the rigidity of the substrate SB is high and it is difficult to bend, it is necessary to reduce the angle formed by the substrate SB and the cladding layer BL while pulling the substrate SB with a relatively high pulling force. In this case, it is also necessary to increase the number of adsorption units. For example, in order to cope with such a situation, as shown in FIG. 6C, it is also considered that the vicinity of the end portion of the substrate SB is close to the arrangement of the adsorption unit or the like, and the interval between the adsorption units is not uniform.

如此,關於吸附單元之配設數量及其等之配置,若可根據目的而變更,則裝置之利用範圍擴大且方便。然而,為能夠實現此而會產生如下之問題。 As described above, the number of the adsorption units to be disposed and the like can be changed according to the purpose, and the utilization range of the apparatus is expanded and convenient. However, in order to be able to achieve this, the following problems arise.

圖7A及圖7B係表示輥單元與吸附單元之位置關係之圖。如圖7A所示,於剝離動作中輥單元34向(+Y)方向以固定速度移行。另一方面,吸附單元5i藉由使在下部設置有吸附墊5i7之板構件5i4沿Z方向升降而進行基板SB之保持及提拉。因此,若不適當地設定該些構件之移動時序,則存在兩者干涉而接觸之虞。 7A and 7B are views showing the positional relationship between the roller unit and the adsorption unit. As shown in FIG. 7A, the roller unit 34 moves at a fixed speed in the (+Y) direction in the peeling operation. On the other hand, the adsorption unit 5i holds and lifts the substrate SB by raising and lowering the plate member 5i4 provided with the adsorption pad 5i7 at the lower portion in the Z direction. Therefore, if the movement timing of the members is improperly set, there is a possibility that the two interfere with each other.

如圖7B所示,原則上若於輥單元34通過正下方位置之後板構件5i4開始下降則不會產生干涉。然而,為將基板SB與敷層BL所成之角α維持於固定而使剝離穩定地進行,較理想為儘可能快地藉由吸附墊 5i7保持剝離輥340通過後之基板SB。即,較佳為吸附墊5i7開始下降時之墊支持構件5i6之(+Y)側端面5i6y與剝離輥340抵接於基板SB之位置之Y方向上之間隔W儘可能小,較理想為使該間隔W為0。 As shown in Fig. 7B, in principle, if the plate member 5i4 starts to descend after the roller unit 34 passes the position directly below, no interference occurs. However, in order to maintain the angle α formed by the substrate SB and the cladding layer BL, the peeling is stably performed, and it is preferable to use the adsorption pad as quickly as possible. 5i7 holds the substrate SB after the peeling roller 340 passes. In other words, it is preferable that the interval W in the Y direction of the (+Y) side end surface 5i6y of the pad supporting member 5i6 and the position where the peeling roller 340 abuts on the substrate SB when the suction pad 5i7 starts to fall is as small as possible, and it is preferable to make it This interval W is zero.

以往,用以實現此種動作之各部之移動時序例如係藉由操作人員進行使裝置將週期性輸出之時序信號與各部之移動時序建立關聯而加以記憶之教學作業來設定。然而,如上所述,於吸附單元之配設個數較多之情形時或配置成為不均等之情形時教學作業亦變得繁雜,若甚至包含與安裝位置之偏移對應之微調整,則作業步驟數將變得龐大。 Conventionally, the movement timing of each unit for realizing such an operation is set, for example, by an operator performing a teaching operation in which the apparatus associates the timing signal periodically output with the movement timing of each unit and memorizes it. However, as described above, the teaching operation becomes complicated when the number of the adsorption units is large or when the arrangement is uneven, and even if the fine adjustment corresponding to the offset of the mounting position is included, the operation is performed. The number of steps will become huge.

因此,本實施形態之剝離裝置1具有如下功能,即,檢測輥單元34移行時之輥單元34與各吸附單元5i之位置關係,且根據該結果而決定各吸附單元5i之移動時序。具體而言,以如下方式構成,即於輥單元34設置有攝像部347(圖2),攝像部347伴隨輥單元34之移動而與剝離輥340一體地移動。而且,輥單元34通過吸附單元5i之下方,攝像部347拍攝位於上方之吸附單元5i,由此藉由圖像處理而掌握自輥單元34觀察到之各吸附單元5i之位置。根據其結果,設定以輥單元34之移行時序為基準之各吸附單元5i之移動時序。 Therefore, the peeling apparatus 1 of the present embodiment has a function of detecting the positional relationship between the roller unit 34 and each of the adsorption units 5i when the roller unit 34 is moved, and determines the movement timing of each adsorption unit 5i based on the result. Specifically, the roller unit 34 is provided with an imaging unit 347 ( FIG. 2 ), and the imaging unit 347 moves integrally with the separation roller 340 in association with the movement of the roller unit 34 . Further, the roller unit 34 passes under the adsorption unit 5i, and the imaging unit 347 photographs the adsorption unit 5i located above, whereby the position of each adsorption unit 5i observed from the roller unit 34 is grasped by image processing. Based on the result, the movement timing of each adsorption unit 5i based on the shift timing of the roller unit 34 is set.

圖8A~圖8C係表示利用攝像部拍攝吸附單元之態樣之圖。如圖8A所示,攝像部347於剝離輥340之大致正上方位置,以使攝像方向朝上之方式固定在上部角形件345。因此,於輥單元34位於吸附單元5i之正下方位置時藉由攝像部347拍攝之圖像IM如圖8B所示包含該吸附單元5i之一部分例如墊支持構件5i6之像。換言之,可知於藉由攝像部347拍攝之圖像IM中包含吸附單元5i之像時,輥單元34位於該吸附單元5i之正下方位置。由此可掌握輥單元34於其移行中通過各吸附單元5i之正下方位置之時序。 8A to 8C are views showing a state in which an adsorption unit is photographed by an imaging unit. As shown in FIG. 8A, the imaging unit 347 is fixed to the upper gusset 345 at a position substantially directly above the peeling roller 340 so that the imaging direction is upward. Therefore, the image IM captured by the imaging unit 347 when the roller unit 34 is located directly below the adsorption unit 5i includes an image of a portion of the adsorption unit 5i such as the pad supporting member 5i6 as shown in FIG. 8B. In other words, it is understood that when the image of the adsorption unit 5i is included in the image IM captured by the imaging unit 347, the roller unit 34 is located directly below the adsorption unit 5i. Thereby, the timing at which the roller unit 34 passes the position directly under the respective adsorption units 5i during the movement thereof can be grasped.

自攝像部347輸出之圖像信號藉由圖像處理部706解析。圖像處 理部706自圖像IM檢測出吸附單元5i中有與輥單元34產生干涉之虞之部位,即位於輥單元34之移行方向之最下游側之部位。其原因在於,藉由預先掌握此種部位通過輥上部之時序,而可確實地避免輥單元34與吸附單元5i之干涉。本實施形態中,將墊支持構件5i6之(+Y)側端面5i6y作為該部位而檢測。 The image signal output from the imaging unit 347 is analyzed by the image processing unit 706. Image The control unit 706 detects, from the image IM, a portion of the adsorption unit 5i that interferes with the roller unit 34, that is, a portion located on the most downstream side of the traveling direction of the roller unit 34. This is because the interference of the roller unit 34 and the adsorption unit 5i can be surely prevented by grasping the timing of passing the portion through the upper portion of the roller in advance. In the present embodiment, the (+Y) side end surface 5i6y of the pad supporting member 5i6 is detected as the portion.

如圖8C所示,於圖像IM內設定有基準線Ls。基準線Ls相當於圖7B所示之間隔W、即墊支持構件5i6之(+Y)側端面5i6y與剝離輥340抵接於基板SB之位置之間之間隔為0時之圖像IM中之墊支持構件端面5i6y之位置。因此,於圖像IM中墊支持構件端面5i6y之位置與基準線Ls一致時,可使間隔W成為0。利用以上情形,可對各吸附單元5i規定於伴隨輥單元34之移行而間隔W成為0之時序吸附墊5i7開始下降之移動時序。 As shown in FIG. 8C, a reference line Ls is set in the image IM. The reference line Ls corresponds to the interval W shown in FIG. 7B, that is, in the image IM when the interval between the (+Y) side end surface 5i6y of the pad supporting member 5i6 and the position where the peeling roller 340 abuts on the substrate SB is 0. The position of the pad support member end face 5i6y. Therefore, when the position of the pad supporting member end face 5i6y in the image IM coincides with the reference line Ls, the interval W can be made zero. In the above case, each of the adsorption units 5i can be defined as a movement timing at which the adsorption pad 5i7 starts to descend with the interval W being zero accompanying the movement of the roller unit 34.

更具體而言,可利用伴隨裝置之運轉而週期性地產生之信號,而將藉由攝像部347拍攝各吸附單元5i之時序與移行之輥單元34之位置建立關聯。於使輥單元34移行之馬達353例如係步進馬達般之脈衝馬達時,可使用為驅動該馬達353而自馬達控制部702輸出之驅動脈衝數作為表示輥單元34之位置之資訊。馬達之旋轉量與驅動脈衝數成正比例,故自驅動開始起之驅動脈衝之計數值成為指示輥單元34之當前位置之位置資訊。因此,若將指示輥單元34之位置之資訊、與拍攝檢測出吸附單元5i之圖像IM之時序建立關聯,則可個別地掌握輥單元34通過各吸附單元5i之正下方位置之時序。 More specifically, the timing at which the respective adsorption units 5i are imaged by the imaging unit 347 can be correlated with the position of the roller unit 34 that has moved, by using signals generated periodically with the operation of the apparatus. When the motor 353 that moves the roller unit 34 is, for example, a stepping motor-like pulse motor, the number of driving pulses output from the motor control unit 702 for driving the motor 353 can be used as information indicating the position of the roller unit 34. Since the amount of rotation of the motor is proportional to the number of driving pulses, the count value of the driving pulse from the start of driving becomes the positional information indicating the current position of the roller unit 34. Therefore, when the information on the position of the index roller unit 34 is correlated with the timing at which the image IM of the adsorption unit 5i is photographed is detected, the timing at which the roller unit 34 passes the position directly below the adsorption unit 5i can be individually grasped.

如此,只要知道輥單元34之位置及通過時序,則可設定不與輥單元34干涉、且用於在輥通過後不拖延地保持基板SB所需之各吸附單元5i之移動時序。作為位置資訊,可使用指示輥單元34之位置之各種資訊。除此處例示之馬達驅動脈衝數以外,可使用如自開始驅動起之時間測定值、或控制時脈之計數值般伴隨輥單元34之移動而定期性 地產生之信號之測定值等。另外,亦可自來自具有檢測輥單元之位置之功能之檢測機構之輸出信號、例如定位傳感器或線性編碼器之輸出信號、以及來自監控相機之圖像信號等而取得位置資訊。 As described above, by knowing the position and the passage timing of the roller unit 34, it is possible to set the movement timing of each adsorption unit 5i which is not required to interfere with the roller unit 34 and which is required to hold the substrate SB without delay after the roller passes. As the position information, various information indicating the position of the roller unit 34 can be used. In addition to the number of motor drive pulses exemplified herein, periodicity such as the time measurement value from the start of driving or the count value of the control clock may be used in association with the movement of the roller unit 34. The measured value of the signal generated by the ground, and the like. Alternatively, the position information may be obtained from an output signal from a detecting mechanism having a function of detecting the position of the roller unit, for example, an output signal of a positioning sensor or a linear encoder, and an image signal from a monitoring camera.

此外,各吸附單元5i之基本之動作序列為:(1)板構件5i4向基板SB下降;(2)當吸附墊5i7抵接於基板SB且吸附保持基板SB時,停止下降;以及(3)板構件5i4上升至特定位置為止;該序列本身並不會根據吸附單元之配設數量或配設位置而改變。上述(1)之開始時序會根據吸附單元之配設數量或配設位置而變更。 In addition, the basic sequence of operations of each adsorption unit 5i is: (1) the plate member 5i4 descends toward the substrate SB; (2) when the adsorption pad 5i7 abuts against the substrate SB and adsorbs and holds the substrate SB, stops falling; and (3) The plate member 5i4 is raised to a specific position; the sequence itself is not changed depending on the number of the adsorption units or the arrangement position. The start timing of the above (1) is changed depending on the number of placements or the arrangement positions of the adsorption units.

本實施形態中,各吸附單元5i之板構件5i4開始下降之時序係藉由馬達353之驅動脈衝計數值而規定。即,對賦予給驅動輥單元34之馬達353之驅動脈衝數進行計數,並於自驅動開始起之計數值達到規定值時吸附單元5i之板構件5i4開始下降。該規定值係針對各吸附單元5i而個別地設定,而且一面使輥單元34實際移行一面根據攝像部347所取得之圖像而自動地設定。因此,操作人員之作業負擔大幅減輕,另外,與吸附單元5i之數量或配置無關,可於相同製程中設定各吸附單元5i之移動時序。 In the present embodiment, the timing at which the plate member 5i4 of each adsorption unit 5i starts to descend is defined by the drive pulse count value of the motor 353. That is, the number of drive pulses of the motor 353 given to the drive roller unit 34 is counted, and when the count value from the start of the drive reaches a predetermined value, the plate member 5i4 of the adsorption unit 5i starts to descend. This predetermined value is individually set for each adsorption unit 5i, and is automatically set based on the image acquired by the imaging unit 347, while the roller unit 34 is actually moving. Therefore, the operator's work load is greatly reduced, and the movement timing of each adsorption unit 5i can be set in the same process regardless of the number or arrangement of the adsorption units 5i.

圖9係表示吸附單元之移動時序之設定方法之流程圖。另外,圖10A及圖10B係說明其原理之圖。基於該原理之移動時序之設定處理係藉由CPU701執行預先記憶之控制程序而使裝置各部進行特定之動作來執行。 Fig. 9 is a flow chart showing a method of setting the movement timing of the adsorption unit. 10A and 10B are diagrams illustrating the principle thereof. The setting processing of the movement timing based on this principle is executed by the CPU 701 executing a control program stored in advance to cause each unit of the apparatus to perform a specific operation.

於該處理中,首先裝置各部被設定為初始狀態(步驟S101)。此時之初始狀態係與上述剝離動作之初始狀態不同之狀態。如圖10A所示,於該處理中之初始狀態下,工件並未載置於載台30。另外,各吸 附單元5i之板構件5i4定位於自載台30向上方離開之位置,從而成為即便輥單元34移行亦不會產生干涉之狀態。 In this processing, first, each part of the apparatus is set to the initial state (step S101). The initial state at this time is a state different from the initial state of the above-described peeling operation. As shown in FIG. 10A, the workpiece is not placed on the stage 30 in the initial state in the process. In addition, each suck The plate member 5i4 of the attachment unit 5i is positioned at a position that is separated upward from the stage 30, and is in a state in which interference does not occur even if the roller unit 34 moves.

另外,輥單元34如圖中虛線所示,於Z方向上定位於不使剝離輥340與載台30接觸之位置,另一方面,於Y方向上,定位於較於輥移行方向即(+Y)方向上位於最上游側之第一吸附單元51之吸附墊517更上游側即(-Y)側。 Further, the roller unit 34 is positioned in the Z direction at a position where the peeling roller 340 is not in contact with the stage 30, as shown by a broken line in the drawing, and is positioned in the Y direction in the Y direction, that is, (+ The adsorption pad 517 of the first adsorption unit 51 located on the most upstream side in the Y) direction is on the upstream side, that is, the (-Y) side.

自如上所述之初始狀態開始利用攝像部347之拍攝及利用圖像處理部706之圖像處理(步驟S102)。藉由圖像處理部706執行之圖像處理係對所拍攝之圖像IM進行解析而檢測墊支持構件端面5i6y之處理。例如可使用周知之邊緣檢測處理,自圖像IM檢測出相當於墊支持構件端面5i6y之邊緣。 The imaging by the imaging unit 347 and the image processing by the image processing unit 706 are started from the initial state as described above (step S102). The image processing performed by the image processing unit 706 analyzes the captured image IM to detect the processing of the pad supporting member end face 5i6y. For example, a well-known edge detection process can be used to detect an edge corresponding to the end face 5i6y of the pad supporting member from the image IM.

繼而,藉由對馬達353賦予驅動脈衝而使輥單元34開始向(+Y)方向移行,開始脈衝數之計數(步驟S103、S104)。由此,一面持續進行脈衝計數、攝像部347之拍攝及圖像處理部706之解析,一面輥單元34向(+Y)方向移行。 Then, by applying a drive pulse to the motor 353, the roller unit 34 starts moving in the (+Y) direction, and counting of the number of pulses is started (steps S103, S104). Thereby, while the pulse counting, the imaging of the imaging unit 347, and the analysis by the image processing unit 706 are continued, the roller unit 34 moves in the (+Y) direction.

當自藉由攝像部347隨時拍攝之圖像IM檢測出相當於墊支持構件端面5i6y之邊緣(步驟S105中YES(是))時,儲存此時之脈衝計數值(步驟S106)。若未檢測出邊緣,則跳過步驟S106。 When the edge corresponding to the end surface 5i6y of the pad supporting member is detected from the image IM photographed by the imaging unit 347 at any time (YES in step S105), the pulse count value at this time is stored (step S106). If the edge is not detected, step S106 is skipped.

此外,應求出之脈衝計數值係墊支持構件端面5i6y與基準線Ls一致時之值。然而,可存在如下情形,即,根據吸附單元5i之配置及攝像部347擷取圖像之時序,如圖10B所示,於圖像IM中檢測出之墊支持構件端面5i6y之位置與基準線Ls不一致。於此種情形時,自圖像IM計算出Y方向上之墊支持構件端面5i6y與基準線Ls之位置之差量△y。由於每1脈衝之輥單元34之移動量為已知,故能夠根據該值與差量△y而計算出墊支持構件端面5i6y到達基準線Ls時之脈衝計數值。於步驟S106中,記憶如此般計算出之脈衝計數值。 Further, the pulse count value to be obtained is a value when the end surface 5i6y of the pad supporting member coincides with the reference line Ls. However, there may be a case where the position of the pad supporting member end face 5i6y and the reference line detected in the image IM are as shown in FIG. 10B according to the arrangement of the adsorption unit 5i and the timing at which the imaging unit 347 captures an image. Ls is inconsistent. In this case, the difference Δy between the position of the pad supporting member end face 5i6y and the reference line Ls in the Y direction is calculated from the image IM. Since the amount of movement of the roller unit 34 per pulse is known, the pulse count value when the pad supporting member end face 5i6y reaches the reference line Ls can be calculated from the value and the difference Δy. In step S106, the pulse count value thus calculated is memorized.

直至輥單元34於其可動範圍到達最(+Y)側之結束位置為止(步驟S107中YES),持續輥單元34之移行及圖像IM之邊緣檢測。由此,針對所有吸附單元51、52、53、54、55,…之各者,求出輥單元34通過該吸附單元5i之正下方位置時之脈衝計數值c1、c2、c3、c4、c5,…。如圖所示,於吸附單元5i之配置不均等時,所測定之脈衝計數值亦變得不規律。 Until the roller unit 34 reaches the end position on the most (+Y) side of its movable range (YES in step S107), the movement of the roller unit 34 and the edge detection of the image IM are continued. Thus, for each of the adsorption units 51, 52, 53, 54, 55, ..., the pulse count values c1, c2, c3, c4, and c5 when the roller unit 34 passes the position directly below the adsorption unit 5i are obtained. ,... As shown in the figure, when the arrangement of the adsorption unit 5i is not uniform, the measured pulse count value also becomes irregular.

若輥單元34到達結束位置,則停止輥單元34之移動及攝像部347之拍攝(步驟S108)。繼而,根據記憶之與各吸附單元51、52、…對應之脈衝計數值c1、c2、…,而決定各吸附單元51、52、…之動作時序(步驟S109)。具體而言,針對每一吸附單元5i,決定與該吸附單元5i之板構件5i4應開始下降時對應之脈衝計數值之規定值。 When the roller unit 34 reaches the end position, the movement of the roller unit 34 and the imaging of the imaging unit 347 are stopped (step S108). Then, the operation timing of each of the adsorption units 51, 52, ... is determined based on the pulse count values c1, c2, ... corresponding to the respective adsorption units 51, 52, ... (step S109). Specifically, for each of the adsorption units 5i, a predetermined value of the pulse count value corresponding to when the plate member 5i4 of the adsorption unit 5i starts to descend is determined.

一般而言,於自輥單元34開始移行起算之脈衝計數值成為事先記憶之計數值c1、c2、…時各吸附單元51、52、…開始動作即可。但係,於自板構件5i4開始下降至與輥單元34產生干涉為止存在1脈衝量以上之時間差之情形時,亦可將與此對應之計數值作為補償值加上。另外,亦可於脈衝產生之時序與板構件5i4開始下降之時序之間賦予適當之時間差。如此般決定各吸附單元5i之動作時序。 In general, the respective adsorption units 51, 52, ... may start to operate when the pulse count value from the start of the movement of the roller unit 34 is the count values c1, c2, ... stored in advance. However, when there is a time difference of one pulse or more from the start of the falling of the plate member 5i4 to the interference with the roller unit 34, the count value corresponding thereto may be added as a compensation value. Further, an appropriate time difference can be given between the timing at which the pulse is generated and the timing at which the plate member 5i4 starts to fall. The operation timing of each adsorption unit 5i is determined in this manner.

於以後執行之剝離動作中,對使輥單元34移行之驅動脈衝進行計數,且每次於計數值成為以上所要求之規定值時各吸附單元51、52、…依次作動,從而板構件5i4開始下降。由此,吸附墊5i7可相對於剝離輥340通過且自敷層BL剛離開後之基板SB抵接而保持基板SB。 In the peeling operation performed later, the drive pulse for moving the roller unit 34 is counted, and each of the adsorption units 51, 52, ... is sequentially operated each time the count value becomes the above-mentioned predetermined value, so that the plate member 5i4 starts. decline. Thereby, the adsorption pad 5i7 can pass through the substrate SB immediately after leaving the peeling roller 340 and just after leaving the coating layer BL, and hold the substrate SB.

如以上般,本實施形態係一種使相互密接而形成工件WK之敷層BL與基板SB剝離之剝離裝置1。該剝離裝置1中,載台30吸附保持敷層BL。而且,於Y方向排列多個之吸附單元5i依次抵接於基板SB而保持其,且向自敷層BL離開之方向移動。由此,於與敷層BL之間之剝 離自基板SB之一端向另一端前進。此時,剝離輥340一面抵接於基板SB一面沿剝離之前進方向以固定速度移行。由此,可使剝離朝一方向且以固定速度前進,從而可一面防止圖案等損壞一面使剝離良好地前進。 As described above, the present embodiment is a peeling device 1 in which the cladding layer BL which is in close contact with each other to form the workpiece WK and the substrate SB are peeled off. In the peeling device 1, the stage 30 adsorbs and holds the coating layer BL. Further, the plurality of adsorption units 5i arranged in the Y direction are sequentially brought into contact with the substrate SB to be held, and moved in a direction away from the self-coating layer BL. Thereby, peeling between the layer and the coating layer BL Advancing from one end of the substrate SB to the other end. At this time, the peeling roller 340 abuts on the substrate SB while moving at a constant speed in the forward direction of peeling. Thereby, the peeling can be advanced in one direction and at a constant speed, and the peeling can be favorably advanced while preventing the damage of the pattern or the like.

要求吸附單元5i於剝離輥340移行時不與該剝離輥340干涉,而且於剝離輥340通過後迅速地保持基板SB。本實施形態中,剝離輥340實際移行並於此過程中攝像部347拍攝各吸附單元5i,且自其圖像掌握自剝離輥340觀察到之各吸附單元5i之位置。繼而,根據該結果,與剝離輥340之位置資訊建立關聯而決定各吸附單元5i作動之時序。因此,與吸附單元5i之數量或配置無關,可使用相同製程使各吸附單元5i之移動時序最佳化。其結果,可較大地減輕執行調整作業之操作人員之負擔,另外,可預防因人為失誤所致之故障。 The adsorption unit 5i is required not to interfere with the peeling roller 340 when the peeling roller 340 moves, and to quickly hold the substrate SB after the peeling roller 340 passes. In the present embodiment, the peeling roller 340 actually moves, and in this process, the image pickup unit 347 photographs each of the adsorption units 5i, and grasps the position of each of the adsorption units 5i observed from the peeling roller 340 from the image. Then, based on the result, the timing of the operation of each adsorption unit 5i is determined in association with the position information of the peeling roller 340. Therefore, regardless of the number or configuration of the adsorption unit 5i, the same process can be used to optimize the movement timing of each adsorption unit 5i. As a result, the burden on the operator who performs the adjustment work can be greatly reduced, and the malfunction due to human error can be prevented.

此外,本發明並不限定在上述之實施形態,能夠於不脫離其宗旨之範圍進行除上述情形以外之各種變更。例如,在上述實施形態中,為將輥單元34之移行與各吸附單元5i之位置建立關聯,而使用具有攝像功能之例如包含CCD相機之攝像部347。然而,作為檢測吸附單元5i之位置之機構,並不限定於此種具有攝像功能之機構。 The present invention is not limited to the above-described embodiments, and various modifications may be made without departing from the scope of the invention. For example, in the above embodiment, in order to associate the movement of the roller unit 34 with the position of each adsorption unit 5i, an imaging unit 347 including a CCD camera having an imaging function is used. However, the mechanism for detecting the position of the adsorption unit 5i is not limited to such a mechanism having an imaging function.

例如,亦可於輥單元34及各吸附單元5i之其中一者設置照明器,且於另一者設置受光器,自受光器接收來自照明器之光之時序而檢測吸附單元5i之位置。另外,亦可為如下構成,即,使用光斷續器,於輥單元34通過吸附單元5i之正下方位置時將光遮斷(或解除遮斷)。另外,並不限於利用此種光學方法之檢測,例如亦可為使用有微動開關之機械檢測方法、或使用有磁傳感器之電磁檢測方法。 For example, an illuminator may be provided in one of the roller unit 34 and each of the adsorption units 5i, and a photodetector may be provided in the other, and the position of the adsorption unit 5i may be detected from the timing at which the light is received from the illuminator. Further, a configuration may be adopted in which the photointerrupter is used to block (or unblock) the light when the roller unit 34 passes the position directly below the adsorption unit 5i. Further, it is not limited to the detection by such an optical method, and may be, for example, a mechanical detection method using a micro switch or an electromagnetic detection method using a magnetic sensor.

另外,例如,在上述實施形態之移動時序設定處理中,自較第一吸附單元51更靠(-Y)側之位置開始輥單元34之移行。其原因在於,與其他吸附單元同樣地,關於第一吸附單元51之位置,亦係與輥單元 34之驅動脈衝數建立關聯而記憶。然而,第一吸附單元51保持基板SB之(-Y)側端部,其位置不會影響吸附單元之配設數量或配置。因此,亦可為如下構成,即第一吸附單元51之位置作為已知,且藉由輥單元34之移行而掌握第二吸附單元52以後之各吸附單元之位置。此時,可將輥單元34之移行開始位置於Y方向上設為第一吸附單元51與第二吸附單元52之間之位置,例如與圖3所示之剝離動作之初始位置相同。 Further, for example, in the movement timing setting process of the above-described embodiment, the movement of the roller unit 34 is started from the position closer to the (-Y) side than the first adsorption unit 51. The reason for this is that, similarly to the other adsorption units, the position of the first adsorption unit 51 is also related to the roller unit. The number of driving pulses of 34 is correlated and memorized. However, the first adsorption unit 51 holds the (-Y)-side end portion of the substrate SB, and its position does not affect the number or arrangement of the adsorption units. Therefore, the position of the first adsorption unit 51 may be known, and the position of each adsorption unit after the second adsorption unit 52 may be grasped by the movement of the roller unit 34. At this time, the transition start position of the roller unit 34 can be set to the position between the first adsorption unit 51 and the second adsorption unit 52 in the Y direction, for example, the same as the initial position of the peeling operation shown in FIG.

另外,例如,在上述實施形態中,於輥單元34之上部角形件345安裝有攝像部347,但如上所述,攝像部347係於剝離動作之前用以決定各吸附單元5i之移動時序而使用,於剝離動作中並不具有特別之功能。因此,作為使攝像部相對於輥單元可裝卸之構成,亦可於決定各吸附單元5i之移動時序之後自輥單元卸除攝像部。例如於工廠出貨後不會變更吸附單元5i之數量或配置之製品中,亦可為於在調整後卸除攝像部之狀態下將裝置出貨之態樣。此外,為了監控剝離動作中之各部之動作,亦可利用攝像部。 Further, for example, in the above-described embodiment, the imaging unit 347 is attached to the upper corner piece 345 of the roller unit 34. However, as described above, the imaging unit 347 is used to determine the movement timing of each adsorption unit 5i before the peeling operation. It does not have a special function in the peeling action. Therefore, as a configuration in which the imaging unit is detachable from the roller unit, the imaging unit can be removed from the roller unit after the movement timing of each adsorption unit 5i is determined. For example, in the case where the number of the adsorption unit 5i or the configured product is not changed after the factory shipment, the device may be shipped in a state where the image pickup unit is removed after the adjustment. Further, in order to monitor the operation of each part in the peeling operation, the imaging unit may be used.

另外,例如,在上述實施形態中,於載台30設置有格子狀之吸附槽311、312而吸附保持敷層BL,但吸附槽之形狀並不限定於此。例如亦可設置環狀之吸附槽,另外,亦可適當配置供給負壓之吸附孔而吸附敷層。 Further, for example, in the above-described embodiment, the carrier 30 is provided with the lattice-shaped adsorption grooves 311 and 312 to adsorb and hold the coating layer BL. However, the shape of the adsorption groove is not limited thereto. For example, an annular adsorption tank may be provided, and an adsorption hole for supplying a negative pressure may be appropriately disposed to adsorb the coating.

另外,在上述實施形態中,以將剝離後之基板SB之姿勢維持為接近平面之狀態之方式控制各吸附單元51~5N之上升而降低施加至基板SB之應力,但基板SB之提拉之態樣並不限定於此。例如,亦能以使剝離後之基板成為大致水平之方式使各吸附單元於固定高度停止,或者將基板保持為以特定之曲率彎曲之姿勢。該些能夠藉由控制各吸附單元之上升之態樣而自由地設定。 Further, in the above-described embodiment, the pressure applied to the substrate SB is lowered by controlling the rise of each of the adsorption units 51 to 5N so that the posture of the substrate SB after peeling is maintained close to the plane, but the pulling of the substrate SB is performed. The aspect is not limited to this. For example, each of the adsorption units may be stopped at a fixed height such that the substrate after peeling is substantially horizontal, or the substrate may be held in a posture that is curved with a specific curvature. These can be freely set by controlling the rise of each adsorption unit.

另外,在上述實施形態中,藉由真空吸附而保持基板及敷層, 但保持之態樣並不限定於此。例如亦可藉由靜電或磁吸附力而吸附保持。尤其關於首先保持基板SB之第一吸附單元51,亦可與吸附無關而藉由機械地夾持基板周緣部而保持基板。 Further, in the above embodiment, the substrate and the cladding are held by vacuum adsorption. However, the aspect of maintaining is not limited to this. For example, it can also be adsorbed and held by electrostatic or magnetic attraction. In particular, the first adsorption unit 51 that holds the substrate SB first can hold the substrate by mechanically sandwiching the peripheral edge portion of the substrate regardless of the adsorption.

另外,在上述實施形態中,使敷層BL突出而保持於錐形載台部32,藉由按壓構件331使敷層BL彎曲而形成剝離之契機。然而,如此操作並非為必要條件,例如亦可僅藉由第一吸附單元51之提拉而使剝離開始。於此情形時,無需於載台設置錐形部。 Further, in the above-described embodiment, the coating layer BL is protruded and held by the tapered stage portion 32, and the coating layer 331 is bent by the pressing member 331 to form a peeling action. However, such an operation is not a necessary condition, and for example, peeling may be started only by pulling by the first adsorption unit 51. In this case, it is not necessary to provide a tapered portion on the stage.

如以上所說明,於本實施形態中,敷層BL及基板SB分別相當於本發明之「第一板狀體」及「第二板狀體」,該些隔著圖案等一體化而成之工件WK相當於本發明之「密接體」。另外,本實施形態中,(+Y)方向相當於本發明之「剝離方向」。 As described above, in the present embodiment, the cladding layer BL and the substrate SB correspond to the "first plate-shaped body" and the "second plate-shaped body" of the present invention, respectively, and these are integrated by a pattern or the like. The workpiece WK corresponds to the "closed body" of the present invention. Further, in the present embodiment, the (+Y) direction corresponds to the "peeling direction" of the present invention.

另外,在上述實施形態中,載台30係作為本發明之「保持機構」發揮功能。另外,多個吸附單元5i分別作為本發明之「剝離機構」發揮功能。更具體而言,吸附單元5i中之包含板構件5i4及吸附墊5i7之可動部相當於「剝離機構」。另外,剝離輥340係作為本發明之「抵接構件」發揮功能。繼而,對驅動輥單元34之馬達353賦予之驅動脈衝數相當於本發明之「位置資訊」。另外,在上述實施形態中,攝像部347係作為本發明之「檢測機構」及「攝像機構」發揮功能。 Further, in the above embodiment, the stage 30 functions as the "holding means" of the present invention. Further, each of the plurality of adsorption units 5i functions as a "peeling mechanism" of the present invention. More specifically, the movable portion including the plate member 5i4 and the adsorption pad 5i7 in the adsorption unit 5i corresponds to a "peeling mechanism". Further, the peeling roller 340 functions as the "contact member" of the present invention. Then, the number of drive pulses given to the motor 353 of the drive roller unit 34 corresponds to the "position information" of the present invention. Further, in the above embodiment, the imaging unit 347 functions as the "detection mechanism" and the "imaging mechanism" of the present invention.

以上,如例示具體之實施形態而說明般,本發明例如亦可為如下構成,即,設置有與抵接構件一體地沿剝離方向移動且檢測剝離機構之檢測機構,且根據檢測機構之檢測結果與位置資訊之對應關係而設定剝離機構各者之移動時序。如此藉由與抵接構件一體地移動之檢測機構檢測剝離機構,由此可切合實際而準確地掌握抵接構件之移動與剝離機構之位置。 As described above, the present invention may be configured such that a detection mechanism that moves integrally with the contact member in the peeling direction and detects the peeling mechanism is provided, and the detection result is based on the detection mechanism. The movement timing of each of the peeling mechanisms is set in correspondence with the position information. By detecting the peeling mechanism by the detecting means that moves integrally with the abutting member, the position of the moving and peeling mechanism of the abutting member can be accurately and accurately grasped.

於此情形時,例如,檢測機構亦可為如下構成,即,具有拍攝剝離機構之攝像功能,且根據拍攝之圖像而檢測抵接構件通過與剝離 機構之對向位置之時序。於如此之構成中,藉由檢測出以圖像形式所拍攝到之剝離機構而防止誤檢測其他構件。 In this case, for example, the detecting means may be configured to have an imaging function of the photographing and peeling mechanism, and detect the passage and peeling of the abutting member based on the photographed image. The timing of the opposite position of the organization. In such a configuration, the detachment of the other member is prevented by detecting the peeling mechanism photographed in the form of an image.

另外,例如,至於移動時序之設定,亦可於相對於並未保持密接體之保持機構而排列有剝離機構之狀態下,抵接構件沿剝離方向移動,且根據檢測機構檢測出剝離機構之結果而進行設定。於本發明之剝離機構之移動時序之設定中,無需將密接體保持於保持機構。 Further, for example, as for the setting of the movement timing, the contact member may be moved in the peeling direction in a state in which the peeling mechanism is arranged with respect to the holding mechanism that does not hold the contact body, and the peeling mechanism is detected based on the detecting mechanism. And set it up. In the setting of the movement timing of the peeling mechanism of the present invention, it is not necessary to hold the closet to the holding mechanism.

另外,例如,作為位置資訊,可使用藉由測定伴隨抵接構件之移動而定期性地產生之信號所獲得之各種資訊。於裝置內產生各種定期性之信號,利用其測定值而能夠適當地指示抵接構件之位置。例如,能夠將使抵接構件沿剝離方向移動之脈衝馬達之驅動脈衝數用作位置資訊。抵接構件之移動量與對驅動其之脈衝馬達賦予之驅動脈衝數成正比例,故利用驅動脈衝數之測定值而能夠以較高之精度表示抵接構件之位置。 Further, for example, as the position information, various kinds of information obtained by measuring a signal periodically generated in association with the movement of the abutting member can be used. Various periodic signals are generated in the device, and the position of the abutting member can be appropriately indicated by the measured value. For example, the number of driving pulses of the pulse motor that moves the abutting member in the peeling direction can be used as the position information. Since the amount of movement of the abutting member is proportional to the number of driving pulses given to the pulse motor that drives the same, the position of the abutting member can be expressed with high accuracy by using the measured value of the number of driving pulses.

另外,例如,保持機構以使第二板狀體為上側之水平姿勢保持密接體,剝離機構亦可排列於密接體之上方。於此種態樣中,藉由於將第一板狀體保持為水平姿勢之狀態下將第二板狀體向上方提拉而使剝離前進。此係可將第一板狀以最穩定之姿勢予以保持之態樣,可防止於使第二板狀體離開時第一板狀體追隨第二板狀體而剝離失敗。 Further, for example, the holding mechanism holds the adhesion body in a horizontal posture in which the second plate-shaped body is on the upper side, and the peeling mechanism may be arranged above the adhesion body. In such an aspect, the peeling advances by pulling the second plate-shaped body upward while holding the first plate-like body in a horizontal posture. This allows the first plate shape to be maintained in the most stable posture, and prevents the first plate-shaped body from following the second plate-shaped body when the second plate-shaped body is separated, and the peeling failure is prevented.

[產業上之可利用性] [Industrial availability]

本發明除可應用於使兩片板狀體密接而使圖案等轉印之圖案形成處理中之剝離製程之外,並不限於伴隨有此種圖案轉印之製程,可適當應用於將直接或隔著薄層相互密接之兩片板狀體良好地剝離之各種目的。 The present invention can be applied not only to a peeling process in a pattern forming process in which a two-plate-like body is adhered to a pattern or the like, but is not limited to a process accompanied by such pattern transfer, and can be suitably applied to direct or Various purposes of good peeling of the two plate-like bodies that are in close contact with each other through a thin layer.

5N‧‧‧吸附單元(剝離機構) 5N‧‧‧Adsorption unit (peeling mechanism)

30‧‧‧載台(保持機構) 30‧‧‧Moving station (holding mechanism)

31‧‧‧水平載台部 31‧‧‧ horizontal stage

32‧‧‧錐形載台部 32‧‧‧Conical stage

51‧‧‧吸附單元(剝離機構) 51‧‧‧Adsorption unit (peeling mechanism)

52‧‧‧吸附單元(剝離機構) 52‧‧‧Adsorption unit (peeling mechanism)

53‧‧‧吸附單元(剝離機構) 53‧‧‧Adsorption unit (peeling mechanism)

54‧‧‧吸附單元 54‧‧‧Adsorption unit

310‧‧‧(水平載台部之)上表面 310‧‧‧ (horizontal stage)

320‧‧‧(錐形載台部之)上表面 320‧‧‧ (of the cone stage) upper surface

331‧‧‧按壓構件 331‧‧‧ Pressing members

340‧‧‧剝離輥(抵接構件) 340‧‧‧ peeling roller (abutment member)

BL‧‧‧敷層(第一板狀體) BL‧‧‧layer (first plate)

SB‧‧‧基板(第二板狀體) SB‧‧‧ substrate (second plate)

WK‧‧‧工件(密接體) WK‧‧‧ workpiece (closed body)

+X‧‧‧方向 +X‧‧‧ directions

+Y‧‧‧方向 +Y‧‧ Direction

+Z‧‧‧方向 +Z‧‧‧ directions

Claims (12)

一種剝離方法,係使第一板狀體與第二板狀體直接或隔著薄層密接而成之密接體剝離,且包含:配置步驟,其藉由使保持機構保持上述第一板狀體而保持上述密接體,使各具有部分性地抵接在上述第二板狀體而保持上述第二板狀體之功能之多個剝離機構,沿與上述第二板狀體之表面平行之剝離方向、且在上述第二板狀體之表面與上述剝離機構之間隔開間隙而排列;以及剝離步驟,其係抵接構件一面抵接在上述第二板狀體之表面一面於與上述剝離機構之間隙空間沿上述剝離方向移動,上述剝離機構之各者於沿上述剝離方向依次向上述第二板狀體移動且抵接在上述抵接構件通過後之上述第二板狀體之表面之後,一面保持上述第二板狀體一面沿對於上述第一板狀體離開方向移動而使上述第二板狀體自上述第一板狀體離開;且上述剝離機構各者之移動時序係根據預先使上述抵接構件沿上述剝離方向移動而取得之上述抵接構件通過與上述剝離機構之對向位置之時序、與表示上述抵接構件之上述剝離方向上之位置的位置資訊之對應關係而設定。 A peeling method for peeling off a first plate-shaped body and a second plate-shaped body directly or via a thin layer, and comprising: a disposing step of holding the first plate-shaped body by a holding mechanism And the plurality of peeling mechanisms each having a function of partially contacting the second plate-shaped body and holding the second plate-shaped body are held along the surface of the second plate-shaped body. a direction in which the surface of the second plate-shaped body is spaced apart from the peeling mechanism, and a peeling step, wherein the abutting member abuts against the surface of the second plate-shaped body and the peeling mechanism The gap space moves in the peeling direction, and each of the peeling mechanisms sequentially moves toward the second plate-shaped body in the peeling direction and abuts against the surface of the second plate-shaped body after the abutting member passes. Moving the second plate-shaped body away from the first plate-shaped body while moving the first plate-shaped body while moving away from the first plate-shaped body; and moving the timing of each of the peeling mechanisms Correspondence between the timing of the opposing position of the abutting member obtained by moving the abutting member in the peeling direction in advance and the position information indicating the position of the abutting member in the peeling direction And set. 如請求項1之剝離方法,其中設置有與上述抵接構件一體地沿上述剝離方向移動且檢測上述剝離機構之檢測機構,根據上述檢測機構之檢測結果與上述位置資訊之對應關係而設定上述剝離機構各者之移動時序。 The peeling method of claim 1, wherein a detecting means that moves in the peeling direction integrally with the abutting member and detects the peeling mechanism is provided, and the peeling is set based on a correspondence relationship between the detection result of the detecting means and the position information. The movement timing of each organization. 如請求項2之剝離方法,其中上述檢測機構具有拍攝上述剝離機構之攝像功能,根據所拍攝之圖像而檢測上述抵接構件通過與上述剝離機構之對向位置之時序。 The peeling method of claim 2, wherein the detecting means has an image capturing function for capturing the peeling mechanism, and detects a timing at which the abutting member passes the opposing position with the peeling mechanism based on the captured image. 如請求項2之剝離方法,其中於相對於並未保持上述密接體之上述保持機構而排列有上述剝離機構之狀態下,上述抵接構件沿上述剝離方向移動,上述檢測機構檢測上述剝離機構。 The peeling method of claim 2, wherein the abutting member moves in the peeling direction in a state in which the peeling mechanism is arranged with respect to the holding mechanism that does not hold the contact body, and the detecting means detects the peeling mechanism. 如請求項1至4中任一項之剝離方法,其中上述位置資訊係藉由測定伴隨上述抵接構件之移動而定期性地產生之信號所取得之資訊。 The stripping method according to any one of claims 1 to 4, wherein the position information is information obtained by measuring a signal periodically generated accompanying movement of the abutting member. 如請求項5之剝離方法,其中上述位置資訊係使上述抵接構件沿上述剝離方向移動之脈衝馬達之驅動脈衝數。 The peeling method of claim 5, wherein the position information is a number of driving pulses of the pulse motor that moves the abutting member in the peeling direction. 如請求項1至4中任一項之剝離方法,其中於上述配置步驟中,上述保持機構係以使上述第二板狀體位於上側之水平姿勢而保持上述密接體,上述剝離機構排列於上述密接體之上方。 The peeling method according to any one of claims 1 to 4, wherein, in the disposing step, the holding mechanism holds the close-contact body in a horizontal posture in which the second plate-shaped body is located on an upper side, and the peeling mechanism is arranged in the above Above the dense body. 一種剝離裝置,其包含:保持機構,其藉由保持上述第一板狀體而保持第一板狀體與第二板狀體直接或隔著薄層相互密接而成之密接體;抵接構件,其一面抵接於藉由上述保持機構保持之上述密接體之上述第二板狀體之表面,一面沿與上述第二板狀體之表面平行之剝離方向移動;多個剝離機構,其沿上述剝離方向排列,各者具有部分性地抵接在上述第二板狀體而保持上述第二板狀體之功能,並且能夠於抵接在上述第二板狀體之表面之抵接位置、與自上述第二板狀體之表面離開且設置有用以供上述抵接構件通過之間隙之待機位置之間移動;以及控制機構,其控制上述剝離機構及上述抵接構件之移動而執行剝離動作;且在上述剝離動作中,上述抵接構件一面抵接在上述第二板狀體之表面一面於與上 述剝離機構之間隙空間沿上述剝離方向移動,上述剝離機構之各者於沿上述剝離方向依次向上述第二板狀體移動且抵接在上述抵接構件通過後之上述第二板狀體之表面之後,一面保持上述第二板狀體一面沿對於上述第一板狀體離開方向移動而使上述第二板狀體自上述第一板狀體離開,上述剝離機構各者之移動時序係根據預先使上述抵接構件沿上述剝離方向移動而取得之上述抵接構件通過與上述剝離機構之對向位置之時序、與表示上述抵接構件之上述剝離方向上之位置的位置資訊之對應關係而設定。 A peeling device comprising: a holding mechanism that holds a first plate-shaped body and a second plate-shaped body in close contact with each other directly or via a thin layer by holding the first plate-shaped body; the abutting member One surface abuts against the surface of the second plate-shaped body of the adhesion body held by the holding mechanism, and moves along a peeling direction parallel to the surface of the second plate-shaped body; a plurality of peeling mechanisms are along The peeling direction is arranged, and each of them has a function of partially contacting the second plate-shaped body and holding the second plate-shaped body, and is capable of abutting on a contact position of the surface of the second plate-shaped body, Moving between a standby position away from the surface of the second plate-shaped body and provided with a gap for the passage of the abutting member; and a control mechanism that controls the movement of the peeling mechanism and the abutting member to perform a peeling action And in the peeling operation, the abutting member abuts on the surface of the second plate-shaped body The gap space of the peeling mechanism moves in the peeling direction, and each of the peeling mechanisms sequentially moves toward the second plate-shaped body in the peeling direction and abuts against the second plate-shaped body after the abutting member passes After the surface, while moving the second plate-shaped body in the direction away from the first plate-shaped body, the second plate-shaped body is separated from the first plate-shaped body, and the movement timing of each of the peeling mechanisms is based on The relationship between the timing of the opposing position of the abutting member obtained by moving the abutting member in the peeling direction and the positional information indicating the position of the abutting member in the peeling direction is set up. 如請求項8之剝離裝置,其包含一面與上述抵接構件一體地移動一面檢測上述剝離機構之檢測機構,上述控制機構係根據上述檢測機構之檢測結果與上述位置資訊之對應關係而設定上述剝離機構各者之移動時序。 The peeling device according to claim 8, comprising a detecting means for detecting the peeling mechanism while moving integrally with the abutting member, wherein the control means sets the peeling based on a correspondence relationship between a detection result of the detecting means and the position information. The movement timing of each organization. 如請求項9之剝離裝置,其中上述檢測機構係拍攝上述剝離機構之攝像機構。 The peeling device of claim 9, wherein the detecting mechanism is an image capturing mechanism that photographs the peeling mechanism. 如請求項8至10中任一項之剝離裝置,其包含使上述抵接構件沿上述剝離方向移動之脈衝馬達,上述位置資訊係上述脈衝馬達之驅動脈衝數。 The peeling device according to any one of claims 8 to 10, comprising a pulse motor for moving the abutting member in the peeling direction, wherein the position information is a number of driving pulses of the pulse motor. 如請求項8至10中任一項之剝離裝置,其中上述保持機構係以使上述第二板狀體位於上側之水平姿勢而保持上述密接體,上述剝離機構排列於上述密接體之上方。 The peeling device according to any one of claims 8 to 10, wherein the holding means holds the adherend in a horizontal posture in which the second plate-like body is positioned on the upper side, and the peeling mechanism is arranged above the close-contact body.
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