TWI528105B - Detaching apparatus and detaching method - Google Patents

Detaching apparatus and detaching method Download PDF

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Publication number
TWI528105B
TWI528105B TW104102401A TW104102401A TWI528105B TW I528105 B TWI528105 B TW I528105B TW 104102401 A TW104102401 A TW 104102401A TW 104102401 A TW104102401 A TW 104102401A TW I528105 B TWI528105 B TW I528105B
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Taiwan
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adsorption
peeling
unit
plate
shaped body
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TW104102401A
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Chinese (zh)
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TW201535043A (en
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上野博之
川越理史
柳田隆明
正司和大
增市幹雄
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斯克林集團公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H41/00Machines for separating superposed webs

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Description

剝離裝置及剝離方法 Peeling device and peeling method

本發明係關於一種使彼此密接之2片板狀體剝離而離開之剝離裝置及剝離方法者。 The present invention relates to a peeling device and a peeling method in which two sheet-like bodies that are in close contact with each other are separated and separated.

作為於玻璃基板或半導體基板等板狀體上形成特定之圖案或薄膜之技術,有將載持於其他板狀體之圖案或薄膜(以下,稱為「圖案等」)轉印至基板者。於該技術中,需要於使2片板狀體密接而將圖案等自一者轉印至另一者後,不使圖案等損壞而剝離2片板狀體。 As a technique for forming a specific pattern or film on a plate-like body such as a glass substrate or a semiconductor substrate, a pattern or a film (hereinafter referred to as a "pattern or the like") carried on another plate-like body is transferred to the substrate. In this technique, it is necessary to peel two sheets of the plate-like body and to transfer the pattern or the like from one to the other, and then peel off the two plate-shaped bodies without damaging the pattern or the like.

作為為了實現該目的而可利用之技術,例如於日本專利特開2008-287949號公報中,記載有用以剝離介隔有機層而彼此密接之元件形成用基板與轉印用基板之裝置。該技術係藉由基板保持部而將經貼合之2片基板保持為水平姿勢,使上下基板各自以真空吸附之狀態向離開方向移動。上下基板係分別藉由分散配置之複數個吸附墊而吸附保持。 For example, Japanese Laid-Open Patent Publication No. 2008-287949 discloses an apparatus for peeling a substrate for forming an element and a substrate for transfer which are in close contact with each other. In this technique, the two bonded substrates are held in a horizontal posture by the substrate holding portion, and the upper and lower substrates are moved in the direction of vacuum suction. The upper and lower substrates are respectively adsorbed and held by a plurality of adsorption pads arranged in a dispersed manner.

該日本專利特開2008-287949號公報中所記載之裝置係於基板之長度方向按照特定之間隔配置以行狀設置有複數個吸附墊之吸附頭。而且,使所有吸附頭向基板之上表面移動,於所有吸附墊與基板之上表面接觸之狀態下對各吸附墊進行抽真空而以複數個吸附墊吸附上側 之基板。此後,藉由使剝離推進方向之最上游側之吸附頭自基板保持部離開而剝離基板之一部分,進而使自最上游側為第2個、第3個、第4個、及第5個之吸附頭按照該順序自基板保持部離開而進行基板剝離。因此,存在如下情形:不僅發生最初之基板剝離、即因最上游側之吸附頭之移動引起之基板剝離,而且於使其後之吸附頭自基板保持部離開而進行基板剝離時,亦於吸附部位發生局部性之基板間之剝離等、無法於適當之管理下推進剝離。特別是,第2個、第3個、第4個吸附頭之吸附墊抵接至形成有圖案等之區域之情形較多,存在較強之剝離力集中性地作用於該區域而使圖案等損壞之虞。 The apparatus described in Japanese Laid-Open Patent Publication No. 2008-287949 is an adsorption head in which a plurality of adsorption pads are arranged in a row at a predetermined interval in the longitudinal direction of the substrate. Moreover, all the adsorption heads are moved toward the upper surface of the substrate, and the adsorption pads are evacuated in a state where all the adsorption pads are in contact with the upper surface of the substrate, and the upper side is adsorbed by the plurality of adsorption pads. The substrate. Thereafter, the adsorption head of the most upstream side in the peeling advance direction is separated from the substrate holding portion to peel off one of the substrates, and further, the second, third, fourth, and fifth from the most upstream side. The adsorption head is separated from the substrate holding portion in this order to perform substrate peeling. Therefore, there is a case where not only the first substrate peeling, that is, the substrate peeling due to the movement of the adsorption head on the most upstream side occurs, but also when the subsequent adsorption head is separated from the substrate holding portion and the substrate is peeled off, the adsorption is also performed. The local part of the substrate is peeled off between the substrates, and the peeling cannot be promoted under appropriate management. In particular, the adsorption pads of the second, third, and fourth adsorption heads are often in contact with a region in which a pattern or the like is formed, and a strong peeling force is concentrated on the region to cause a pattern or the like. Damage.

本發明係鑒於上述課題而完成者,目的在於提供一種可使彼此密接之2片板狀體良好且穩定地剝離而離開之技術。 The present invention has been made in view of the above problems, and it is an object of the invention to provide a technique in which two sheet-like bodies that are in close contact with each other can be peeled off and separated stably and stably.

本發明之一態樣係一種剝離裝置,其特徵在於其係使彼此密接之第1板狀體與第2板狀體剝離者,且包括:保持器件,其保持第1板狀體;上游側剝離器件,其具有吸附保持第2板狀體之表面中之與密接於第1板狀體之面為相反側的反密接面之一部分之上游側吸附部,一面於上游側吸附部吸附第2板狀體,一面使上游側吸附部自保持器件離開而使藉由上游側吸附部吸附之第2板狀體之被吸附部位自第1板狀體剝離,從而向剝離推進方向推進第2板狀體之剝離;下游側剝離器件,其具有於剝離推進方向上之被吸附部位之下游側面向第2板狀體之反密接面而設置之下游側吸附部,於使下游側吸附部移動至第2板狀體中之藉由上游側剝離器件而剝離之剝離部位並吸附剝離部位之反密接面後,使下游側吸附部按照吸附第2板狀體之狀態自保持器件離開而向剝離推進方向推進第2板狀體之剝離;監控器件,其監控下游側吸附部相對於第2板狀體之反密接面之相對位置;及控制器件,其基於藉由監控器件而獲得之與相對位置相關之位置資訊,對利用下 游側吸附部進行之第2板狀體之吸附開始進行控制。 An aspect of the present invention is a peeling apparatus characterized in that a first plate-shaped body and a second plate-shaped body which are in close contact with each other are provided, and includes: a holding device that holds the first plate-shaped body; and an upstream side The peeling device has an upstream side adsorption portion that is a portion of the surface of the second plate-shaped body that is opposite to the surface of the second plate-shaped body that is in contact with the surface of the first plate-shaped body, and adsorbs the second adsorption portion on the upstream side adsorption portion. In the plate-like body, the upstream adsorption portion is separated from the holding device, and the adsorbed portion of the second plate-shaped body adsorbed by the upstream adsorption portion is peeled off from the first plate-shaped body, and the second plate is advanced in the peeling and pushing direction. The downstream side peeling device has a downstream side adsorption portion provided on the downstream side surface of the adsorbed portion in the peeling advance direction toward the back surface of the second plate-shaped body, and moves the downstream side adsorption portion to In the second plate-shaped body, the peeling portion peeled off by the upstream side peeling device and the back-adhesive surface of the peeling portion are adsorbed, and then the downstream side adsorbing portion is separated from the holding device in the state of adsorbing the second plate-shaped body, and is pushed toward the peeling. Directional advancement 2 stripping of the plate body; monitoring device for monitoring the relative position of the downstream side adsorption portion with respect to the opposite surface of the second plate body; and control device based on the position relative to the relative position obtained by the monitoring device Information, under the use The adsorption of the second plate-shaped body by the side adsorption unit is started.

又,本發明之另一態樣係一種剝離方法,其特徵在於其係使彼此密接之第1板狀體與第2板狀體剝離者,且包括如下步驟:保持步驟,其係藉由保持器件保持第1板狀體;第1剝離步驟,其係藉由上游側吸附部吸附第2板狀體之表面中之與密接於第1板狀體之面為相反側的反密接面之一部分、即吸附第2板狀體,並且使上游側吸附部自保持器件離開而使藉由上游側吸附部吸附之第2板狀體之被吸附部位自第1板狀體剝離,從而向剝離推進方向推進第2板狀體之剝離;移動步驟,其係使下游側吸附部於剝離推進方向上之被吸附部位之下游側,向第2板狀體中之因上游側吸附部自保持器件之離開而剝離之剝離部位之反密接面移動;監控步驟,其係於向剝離部位之反密接面移動中,監控下游側吸附部相對於第2板狀體之反密接面之相對位置;調整步驟,其係基於與相對位置相關之位置資訊,調整開始利用下游側吸附部進行之第2板狀體之吸附之時序;及第2剝離步驟,其係與利用下游側吸附部進行之第2板狀體之吸附開始同時或於吸附開始後,按照於下游側吸附部吸附有剝離部位之反密接面之狀態使下游側吸附部自保持器件離開而向剝離推進方向推進第2板狀體之剝離。 Moreover, another aspect of the present invention is a peeling method characterized in that the first plate-shaped body and the second plate-shaped body which are in close contact with each other are separated, and the method includes the following steps: maintaining the step by holding The first sheet-like body is held by the device, and the first peeling step is performed by adsorbing a portion of the surface of the second plate-shaped body opposite to the surface of the second plate-shaped body opposite to the surface of the first plate-shaped body by the upstream side adsorption portion. In other words, the second plate-shaped body is adsorbed, and the upstream adsorption portion is separated from the holding device, and the adsorbed portion of the second plate-shaped body adsorbed by the upstream adsorption portion is peeled off from the first plate-shaped body, thereby promoting the peeling. The step of advancing the peeling of the second plate-shaped body; and the moving step of the downstream side adsorption portion in the peeling-propelling direction on the downstream side of the adsorbed portion, and the upstream-side adsorption portion self-holding device in the second plate-shaped body The anti-adhesion surface of the peeling portion that is separated and peeled off is moved; the monitoring step is performed to move the anti-adhesion surface of the peeling portion, and monitor the relative position of the downstream side adsorption portion with respect to the anti-adhesion surface of the second plate-shaped body; Based on relative position Corresponding position information, the timing of the adsorption of the second plate-shaped body by the downstream side adsorption unit is adjusted, and the second peeling step is started simultaneously with the adsorption of the second plate-shaped body by the downstream side adsorption unit or After the adsorption is started, the downstream adsorption portion is separated from the holding device in a state in which the downstream side adsorption portion adsorbs the anti-adhesion surface of the separation portion, and the second plate-shaped body is peeled off in the peeling direction.

如上所述般構成之發明係使第2板狀體之一部分(被吸附部位)自第1板狀體剝離而向剝離推進方向推進第2板狀體之剝離。此處,隨著吸附有上述被吸附部位之上游側吸附部遠離保持器件而推進第2板狀體之剝離,但隨著上游側吸附部自保持器件之離開而上游側剝離器件之移動變得難以反映至剝離之推進。因此,本發明係於在剝離推進方向上之下游側藉由下游側剝離器件之下游側吸附部而吸附剝離部位後,使該下游側吸附部自保持器件離開而繼續推進向剝離推進方向之剝離。又,僅藉由利用上游側剝離器件進行之保持係無法抑制剝離部位之撓曲,但可藉由下游側剝離器件之下游側吸附部保持剝離部位而 控制第2板狀體之姿勢。如上所述,根據本發明,可使彼此密接之第1板狀體與第2板狀體良好地剝離,從而可發揮良好之剝離性能。 In the above-described configuration, one of the second plate-shaped members (adsorbed portion) is peeled off from the first plate-shaped body, and the second plate-shaped body is peeled off in the peeling direction. Here, as the upstream adsorption portion on which the adsorption site is adsorbed is moved away from the holding device, the second plate-shaped body is peeled off. However, as the upstream adsorption portion is separated from the holding device, the movement of the upstream separation device becomes It is difficult to reflect the progress of the stripping. Therefore, in the present invention, after the peeling portion is adsorbed by the downstream side adsorption portion of the downstream side peeling device on the downstream side in the peeling advancement direction, the downstream side adsorption portion is separated from the holding device, and the peeling in the peeling advancement direction is continued. . Moreover, the retention by the upstream side peeling device cannot suppress the deflection of the peeling portion, but the peeling portion can be held by the downstream side adsorption portion of the downstream side peeling device. Controls the posture of the second plate-shaped body. As described above, according to the present invention, the first plate-shaped body and the second plate-shaped body which are in close contact with each other can be favorably peeled off, and good peeling performance can be exhibited.

又,剝離部位之翹曲形狀並非固定,因第1板狀體與第2板狀體之密接力或第2板狀體之剛性等而發生變化。即,即便上游側吸附部自保持部之離開距離相同,例如於密接力相對較高之情形時,剝離推進亦變得相對較少,且翹曲變得較小。因此,下游側吸附部係於與剝離部位抵接之前需要相對較長地移動。與此相對,於密接力相對較低之情形時,與上述情形相反地,於與剝離部位抵接之前之下游側吸附部之移動距離變短。如上所述,於採用藉由下游側吸附部吸附因上游側吸附部之移動而自第1板狀體剝離之第2板狀體之剝離部位的構成之情形時,控制利用下游側吸附部進行之第2板狀體之反密接面之吸附開始時序變重要。關於該方面,本發明係監控下游側吸附部相對於第2板狀體之反密接面之相對位置,基於與該相對位置相關之位置資訊而對利用下游側吸附部進行之第2板狀體之吸附開始進行控制。因此,可與第1板狀體與第2板狀體之密接力或第2板狀體之剛性之差異無關,而下游側吸附部始終於適當之時序吸附第2板狀體而穩定地進行剝離處理。 Further, the warpage shape of the peeling portion is not fixed, and the adhesion between the first plate-shaped body and the second plate-shaped body or the rigidity of the second plate-shaped body changes. In other words, even if the distance between the upstream side adsorption portions and the holding portion is the same, for example, when the adhesion force is relatively high, the peeling advancement becomes relatively small, and the warpage becomes small. Therefore, the downstream side adsorption portion needs to move relatively long before coming into contact with the peeling portion. On the other hand, when the adhesion is relatively low, contrary to the above, the moving distance of the downstream adsorption portion before the contact with the peeling portion is shortened. As described above, when the downstream side adsorption unit adsorbs the peeling portion of the second plate-shaped body that has been peeled off from the first plate-shaped body by the movement of the upstream adsorption portion, the control is performed by the downstream adsorption unit. The adsorption start timing of the anti-bonding surface of the second plate-shaped body becomes important. In this aspect, the present invention monitors the relative position of the downstream side adsorption portion with respect to the opposite surface of the second plate-shaped body, and the second plate-shaped body by the downstream side adsorption portion based on the positional information on the relative position. The adsorption starts to be controlled. Therefore, regardless of the difference between the adhesion between the first plate-shaped body and the second plate-shaped body or the rigidity of the second plate-shaped body, the downstream adsorption portion can always stably adsorb the second plate-shaped body at an appropriate timing. Stripping treatment.

根據本發明,於下游側吸附部始終於適當之時序吸附藉由上游側剝離器件而剝離之第2板狀體之剝離部位後,使第2板狀體自保持器件離開而推進第2板狀體之剝離,藉此可穩定且良好地推進剝離。 According to the present invention, the second plate-shaped body is separated from the holding member by the peeling portion of the second plate-shaped body which is peeled off by the upstream side peeling device at an appropriate timing, and the second plate-shaped body is advanced to the second plate shape. The peeling of the body can thereby promote the peeling stably and favorably.

1‧‧‧剝離裝置 1‧‧‧ peeling device

3‧‧‧平台塊 3‧‧‧ platform block

5‧‧‧上部吸附塊 5‧‧‧Upper adsorption block

11‧‧‧主框架 11‧‧‧Main frame

30‧‧‧平台(保持器件) 30‧‧‧ Platform (holding device)

31‧‧‧水平平台部 31‧‧‧Horizontal Platform Division

32‧‧‧錐形平台部 32‧‧‧Conical Platform Division

33‧‧‧初始剝離單元 33‧‧‧Initial stripping unit

34‧‧‧輥單元 34‧‧‧roll unit

50‧‧‧支持框架 50‧‧‧Support framework

51‧‧‧吸附單元(上游側剝離器件) 51‧‧‧Adsorption unit (upstream side stripping device)

52‧‧‧吸附單元(上游側剝離器件) 52‧‧‧Adsorption unit (upstream side stripping device)

53‧‧‧吸附單元(下游側剝離器件) 53‧‧‧Adsorption unit (downstream side stripping device)

54‧‧‧吸附單元(下游側剝離器件) 54‧‧‧Adsorption unit (downstream side stripping device)

70‧‧‧控制單元(控制器件) 70‧‧‧Control unit (control device)

310‧‧‧(水平平台部31之)上表面 310‧‧‧ (top of horizontal platform section 31) upper surface

311‧‧‧吸附槽 311‧‧‧Adsorption tank

312‧‧‧吸附槽 312‧‧‧Adsorption tank

320‧‧‧(錐形平台部32之)上表面 320‧‧‧ (of the tapered platform portion 32) upper surface

331‧‧‧推壓構件 331‧‧‧ Pushing members

332‧‧‧支持臂 332‧‧‧Support arm

333‧‧‧導軌 333‧‧‧rail

334‧‧‧柱構件 334‧‧‧column components

335‧‧‧升降機構 335‧‧‧ Lifting mechanism

336‧‧‧基底部 336‧‧‧ base

337‧‧‧調整機構 337‧‧‧Adjustment agency

340‧‧‧剝離輥 340‧‧‧ peeling roller

341、342‧‧‧滑塊 341, 342‧‧‧ slider

343‧‧‧下部角 343‧‧‧lower corner

344‧‧‧升降機構 344‧‧‧ Lifting mechanism

345‧‧‧上部角 345‧‧‧ upper corner

346‧‧‧支承輥 346‧‧‧Support roll

351、352‧‧‧導軌 351, 352‧ ‧ rail

353‧‧‧馬達 353‧‧‧Motor

354‧‧‧滾珠螺桿機構 354‧‧‧Rolling screw mechanism

517‧‧‧吸附墊 517‧‧‧Adsorption pad

518‧‧‧負壓供給部 518‧‧‧Negative Pressure Supply Department

521‧‧‧樑構件 521‧‧‧beam components

522、523‧‧‧柱構件 522, 523‧‧‧ column components

524‧‧‧板構件 524‧‧‧Board components

525‧‧‧升降機構 525‧‧‧ Lifting mechanism

526‧‧‧墊支持構件 526‧‧‧pad support members

527‧‧‧吸附墊 527‧‧‧Adsorption pad

527‧‧‧吸附墊 527‧‧‧Adsorption pad

527a~527y‧‧‧吸附墊 527a~527y‧‧‧Adsorption pad

527A‧‧‧吸附部位 527A‧‧‧Adsorption site

527B‧‧‧波紋管部位 527B‧‧‧ bellows

527z1‧‧‧吸附墊 527z1‧‧‧Adsorption pad

527z2‧‧‧吸附墊 527z2‧‧‧Adsorption pad

528‧‧‧負壓供給部 528‧‧‧Negative Pressure Supply Department

529‧‧‧連結構件 529‧‧‧Connected components

530‧‧‧雷射位移計(監控器件、距離測量部) 530‧‧‧Laser Displacement Meter (Monitoring Device, Distance Measurement Department)

537‧‧‧吸附墊 537‧‧‧Adsorption pad

537‧‧‧吸附墊 537‧‧‧Adsorption pad

537z1‧‧‧吸附墊 537z1‧‧‧Adsorption pad

537z2‧‧‧吸附墊 537z2‧‧‧Adsorption pad

538‧‧‧負壓供給部 538‧‧‧Negative Pressure Supply Department

547‧‧‧吸附墊 547‧‧‧Adsorption pad

547‧‧‧吸附墊 547‧‧‧Adsorption pad

547z1‧‧‧吸附墊 547z1‧‧‧Adsorption pad

547z2‧‧‧吸附墊 547z2‧‧‧Adsorption pad

548‧‧‧負壓供給部 548‧‧‧Negative pressure supply department

701‧‧‧CPU(控制器件) 701‧‧‧CPU (control device)

702‧‧‧馬達控制部 702‧‧‧Motor Control Department

703‧‧‧閥控制部 703‧‧‧Valve Control Department

704‧‧‧負壓產生部 704‧‧‧ Negative Pressure Generation Department

705‧‧‧使用者介面(UI)部 705‧‧‧User Interface (UI) Department

5181‧‧‧歧管 5181‧‧‧Management

5182‧‧‧歧管 5182‧‧‧Management

5183‧‧‧歧管 5183‧‧‧Management

5184‧‧‧壓力計 5184‧‧‧ pressure gauge

5281‧‧‧歧管 5281‧‧‧Management

5282‧‧‧歧管 5282‧‧‧Management

5283‧‧‧歧管 5283‧‧‧Management

5284‧‧‧歧管 5284‧‧‧Management

5285‧‧‧壓力計 5285‧‧‧ pressure gauge

5286‧‧‧壓力計(監控器件、壓力測量部) 5286‧‧‧ Pressure gauge (monitoring device, pressure measurement department)

BL‧‧‧包覆層 BL‧‧‧ coating

E‧‧‧脊線部 E‧‧‧ ridge line

PR‧‧‧剝離部位 PR‧‧‧ peeling site

SB‧‧‧基板 SB‧‧‧ substrate

SR‧‧‧被吸附部位 SR‧‧‧Adsorbed parts

V3‧‧‧閥群 V3‧‧‧ valve group

V51‧‧‧控制閥(上游側切換部) V51‧‧‧ control valve (upstream side switching unit)

V52‧‧‧控制閥(下游側切換部) V52‧‧‧Control valve (downstream side switching unit)

V521‧‧‧控制閥(第1切換部) V521‧‧‧Control valve (1st switching part)

V522‧‧‧控制閥(第2切換部) V522‧‧‧Control valve (2nd switching part)

WK‧‧‧工件 WK‧‧‧ workpiece

X‧‧‧方向 X‧‧‧ direction

Y‧‧‧剝離推進方向 Y‧‧‧ peeling direction

Z‧‧‧方向 Z‧‧‧ direction

θ‧‧‧包覆層BL之下表面與錐形平台部32之上表面320所成之角 θ‧‧‧An angle formed by the lower surface of the cladding layer BL and the upper surface 320 of the tapered platform portion 32

圖1係表示本發明之剝離裝置之第1實施形態之立體圖。 Fig. 1 is a perspective view showing a first embodiment of the peeling device of the present invention.

圖2係表示該剝離裝置之主要構成之立體圖。 Fig. 2 is a perspective view showing the main configuration of the peeling device.

圖3係表示初始剝離單元之構造及各部之位置關係之側視圖。 Fig. 3 is a side view showing the structure of the initial peeling unit and the positional relationship of the respective parts.

圖4係表示該剝離裝置之電性構成之方塊圖。 Fig. 4 is a block diagram showing the electrical configuration of the peeling device.

圖5A~圖5C係模式性地表示吸附單元之構成之圖。 5A to 5C are diagrams schematically showing the configuration of an adsorption unit.

圖6係模式性地表示處理中之各階段之各部之位置關係與負壓供給部的負壓供給狀態之圖。 Fig. 6 is a view schematically showing the positional relationship of each unit in each stage of the process and the negative pressure supply state of the negative pressure supply unit.

圖7係模式性地表示處理中之各階段之各部之位置關係與負壓供給部的負壓供給狀態之圖。 Fig. 7 is a view schematically showing the positional relationship of each unit in each stage of the process and the negative pressure supply state of the negative pressure supply unit.

圖8係模式性地表示處理中之各階段之各部之位置關係與負壓供給部的負壓供給狀態之圖。 Fig. 8 is a view schematically showing the positional relationship of each unit in each stage of the process and the negative pressure supply state of the negative pressure supply unit.

圖9係模式性地表示處理中之各階段之各部之位置關係與負壓供給部的負壓供給狀態之圖。 Fig. 9 is a view schematically showing the positional relationship of each unit in each stage of the process and the negative pressure supply state of the negative pressure supply unit.

圖10係模式性地表示處理中之各階段之各部之位置關係與負壓供給部的負壓供給狀態之圖。 Fig. 10 is a view schematically showing the positional relationship of each unit in each stage of the process and the negative pressure supply state of the negative pressure supply unit.

圖11A~圖11C係僅模式性地表示處理中之各階段之各部之位置關係的圖。 11A to 11C are diagrams schematically showing only the positional relationship of each unit in each stage of the process.

圖12A~圖12D係表示本發明之剝離裝置之第2實施形態之圖。 12A to 12D are views showing a second embodiment of the peeling device of the present invention.

圖13A~圖13D係表示本發明之剝離裝置之第3實施形態之圖。 13A to 13D are views showing a third embodiment of the peeling device of the present invention.

圖14係模式性地表示第3實施形態中之處理中之各階段之各部的位置關係與負壓供給部之負壓供給狀態之圖。 Fig. 14 is a view schematically showing the positional relationship of each unit in each stage of the process in the third embodiment and the negative pressure supply state of the negative pressure supply unit.

圖15係模式性地表示第3實施形態中之處理中之各階段之各部的位置關係與負壓供給部之負壓供給狀態之圖。 Fig. 15 is a view schematically showing the positional relationship of each unit in each stage of the processing in the third embodiment and the negative pressure supply state of the negative pressure supply unit.

A.第1實施形態 A. First embodiment

圖1係表示本發明之剝離裝置之第1實施形態之立體圖。為了統一地表示各圖之方向,如圖1之右下所示設定XYZ正交座標軸。此處,XY平面表示水平面,Z軸表示鉛垂軸。更詳細而言,(+Z)方向表示鉛垂向上之方向。 Fig. 1 is a perspective view showing a first embodiment of the peeling device of the present invention. In order to uniformly represent the directions of the respective figures, the XYZ orthogonal coordinate axes are set as shown in the lower right of FIG. Here, the XY plane represents a horizontal plane, and the Z axis represents a vertical axis. In more detail, the (+Z) direction indicates the direction of the vertical direction.

該剝離裝置1係用以剝離以主表面間彼此密接之狀態搬入之2片 板狀體之裝置。例如,使用於在玻璃基板或半導體基板等基板之表面形成特定之圖案之圖案形成製程之一部分。更具體而言,該圖案形成製程係於作為暫時載持應轉印至被轉印體即基板之圖案之載持體之包覆層表面均勻地塗佈圖案形成材料(塗佈步驟),將根據圖案形狀而經表面加工之版抵壓至包覆層上之塗佈層,藉此將塗佈層圖案化(圖案化步驟),使以此方式形成有圖案之包覆層密接至基板(轉印步驟),藉此將圖案自包覆層最終轉印至基板。 The peeling device 1 is for peeling off two sheets that are carried in a state in which the main surfaces are in close contact with each other. Plate-like device. For example, it is used for forming a part of a pattern forming process of a specific pattern on the surface of a substrate such as a glass substrate or a semiconductor substrate. More specifically, the pattern forming process is performed by uniformly applying a pattern forming material to a surface of a coating layer that temporarily transports a carrier to be transferred to a pattern of a substrate to be transferred, (coating step), The surface-processed plate is pressed against the coating layer on the coating layer according to the shape of the pattern, thereby patterning the coating layer (patterning step), and the coating layer formed with the pattern in this manner is adhered to the substrate ( Transfer step) whereby the pattern is ultimately transferred from the cladding to the substrate.

此時,為了實現使於圖案化步驟中密接之版與包覆層之間、或於轉印步驟中密接之基板與包覆層之間離開之目的,可較佳地應用本裝置。當然,可使用於該等兩者,亦可使用於除此之外之用途。例如,亦可應用於將載持於載持體之薄膜轉印至基板時之剝離製程。 In this case, the apparatus can be preferably applied for the purpose of separating between the substrate and the cladding layer which are in contact with each other in the patterning step, or between the substrate and the cladding layer which are in close contact with each other in the transfer step. Of course, it can be used for both of them, and can also be used for other purposes. For example, it can also be applied to a peeling process when a film carried on a carrier is transferred to a substrate.

該剝離裝置1具有於安裝於殼體之主框架11上分別固定有平台塊3及上部吸附塊5之構造。於圖1中,為了表示裝置之內部構造,省略殼體之圖示。又,除該等各塊外,該剝離裝置1具備下文將述之控制單元70(圖4)。 The peeling device 1 has a structure in which a platform block 3 and an upper adsorption block 5 are fixed to a main frame 11 attached to a casing. In Fig. 1, in order to show the internal structure of the device, the illustration of the housing is omitted. Further, in addition to the blocks, the peeling device 1 includes a control unit 70 (FIG. 4) which will be described later.

平台塊3具有用以載置版或基板與包覆層密接而成之密接體(以下,稱為「工件」)之平台30,平台30包括:水平平台部31,其上表面大致呈水平之平面;及錐形平台部32,其呈上表面相對於水平面具有數度(例如2度左右)之傾斜度之平面。於平台30之錐形平台部32側、即(-Y)側之端部附近設置有初始剝離單元33。又,以橫跨水平平台部31之方式設置輥單元34。 The platform block 3 has a platform 30 for mounting a plate or a substrate and a cover layer (hereinafter referred to as a "workpiece"). The platform 30 includes a horizontal platform portion 31, and the upper surface thereof is substantially horizontal. And a tapered platform portion 32 having a plane having an inclination of the upper surface with respect to the horizontal plane by a few degrees (for example, about 2 degrees). An initial peeling unit 33 is provided on the tapered platform portion 32 side of the stage 30, that is, in the vicinity of the end portion on the (-Y) side. Further, the roller unit 34 is provided so as to straddle the horizontal platform portion 31.

另一方面,上部吸附塊5包括:支持框架50,其自主框架11豎立設置,並且以覆蓋平台塊3之上部之方式設置;及第1吸附單元51、第2吸附單元52、第3吸附單元53及第4吸附單元54,其等安裝於該支持框架50。該等吸附單元51~54係依次排列於(+Y)方向。 On the other hand, the upper adsorption block 5 includes a support frame 50, the autonomous frame 11 is erected, and is disposed to cover the upper portion of the platform block 3; and the first adsorption unit 51, the second adsorption unit 52, and the third adsorption unit 53 and a fourth adsorption unit 54, which are attached to the support frame 50. The adsorption units 51 to 54 are sequentially arranged in the (+Y) direction.

圖2係表示該剝離裝置之主要構成之立體圖。更具體而言,圖2 係表示剝離裝置1之各構成中之平台30、輥單元34及第2吸附單元52之構造。平台30包括:水平平台部31,其上表面310大致呈水平面;及錐形平台部32,其上表面320呈錐形面。水平平台部31之上表面310具有稍微大於載置之工件之平面尺寸之平面尺寸。 Fig. 2 is a perspective view showing the main configuration of the peeling device. More specifically, Figure 2 The structure of the stage 30, the roller unit 34, and the second adsorption unit 52 in each configuration of the peeling device 1 is shown. The platform 30 includes a horizontal platform portion 31 having an upper surface 310 that is substantially horizontal; and a tapered platform portion 32 having an upper surface 320 that is tapered. The upper surface 310 of the horizontal platform portion 31 has a planar size that is slightly larger than the planar size of the workpiece being placed.

錐形平台部32係密接設置於水平平台部31之(-Y)側端部,其平坦之上表面320係與水平平台部31相接觸之部分位於與水平平台部31之上表面310相同之高度(Z方向位置),另一方面,隨著自水平平台部31向(-Y)方向遠離而向下方、即(-Z)方向後退。因此,平台30整體係水平平台部31之上表面310之水平面與錐形平台部32之上表面320之錐形面連續,其等連接之脊線部E係呈於X方向上延伸之直線狀。 The tapered platform portion 32 is closely attached to the (-Y)-side end portion of the horizontal platform portion 31, and the portion of the flat upper surface 320 that is in contact with the horizontal platform portion 31 is located in the same manner as the upper surface 310 of the horizontal platform portion 31. The height (Z-direction position), on the other hand, retreats downward, that is, in the (-Z) direction, as moving away from the horizontal platform portion 31 in the (-Y) direction. Therefore, the platform 30 as a whole is continuous with the horizontal surface of the upper surface 310 of the horizontal platform portion 31 and the tapered surface of the upper surface 320 of the tapered platform portion 32, and the connected ridge portion E is linearly extending in the X direction. .

又,於水平平台部31之上表面310刻設有格子狀之槽。更具體而言,於水平平台部31之上表面310之中央部設置格子狀之槽311,並且以包圍形成有該槽311之區域之方式,且以成為矩形中之除錐形平台部32側之1邊以外之概略字型之方式,於水平平台部31之上表面310之周緣部設置槽312。該等槽311、312係經由控制閥而連接於下文將述之負壓產生部704(圖4),具有作為藉由供給負壓而對載置於平台30之工件予以吸附保持之吸附槽之功能。2種槽311、312係不於平台上連接,又,經由彼此獨立之控制閥而連接於負壓產生部704,因此除可實現使用兩個槽之吸附外,亦可實現僅使用一個槽之吸附。如上所述,本實施形態中,平台30作為本發明之「保持器件」而發揮功能。 Further, a lattice-shaped groove is formed in the upper surface 310 of the horizontal platform portion 31. More specifically, a lattice-shaped groove 311 is provided in a central portion of the upper surface 310 of the horizontal platform portion 31, and surrounds the region in which the groove 311 is formed, and is formed in a rectangular shape except for the tapered platform portion 32 side. Outline beyond one side In the manner of a font, a groove 312 is provided in a peripheral portion of the upper surface 310 of the horizontal platform portion 31. The grooves 311 and 312 are connected to a negative pressure generating portion 704 (FIG. 4) to be described later via a control valve, and have a suction groove for adsorbing and holding the workpiece placed on the stage 30 by supplying a negative pressure. Features. The two types of grooves 311 and 312 are not connected to the platform, and are connected to the negative pressure generating unit 704 via independent control valves. Therefore, in addition to the adsorption using the two grooves, only one groove can be used. Adsorption. As described above, in the present embodiment, the platform 30 functions as the "holding device" of the present invention.

以橫跨如上所述般構成之平台30之方式,設置輥單元34。具體而言,沿水平平台部31之X方向兩端部而1對導軌351、352延伸設置於Y方向,該等導軌351、352係固定於主框架11。而且,以相對於導軌351、352而滑動自如之方式安裝有輥單元34。 The roller unit 34 is provided in such a manner as to span the platform 30 constructed as described above. Specifically, the pair of guide rails 351 and 352 are extended in the Y direction along both end portions of the horizontal platform portion 31 in the X direction, and the guide rails 351 and 352 are fixed to the main frame 11 . Further, the roller unit 34 is attached slidably with respect to the guide rails 351 and 352.

輥單元34包括分別與導軌351、352滑動自如地卡合之滑塊341、342,以將該等滑塊341、342連接之方式,設置有橫跨平台30之上部 而延伸設置於X方向之下部角343。於下部角343,在兩側經由一對適當之升降機構344而升降自如地安裝有上部角345。而且,相對於上部角345,而旋轉自如地安裝延伸設置於X方向之圓柱狀之剝離輥340。 The roller unit 34 includes sliders 341 and 342 that are slidably engaged with the guide rails 351 and 352, respectively, and is connected to the upper portion of the platform 30 in such a manner as to connect the sliders 341 and 342. The extension is set at a lower angle 343 in the X direction. At the lower corner 343, the upper corner 345 is lifted and lowered on both sides via a pair of appropriate lifting mechanisms 344. Further, a cylindrical peeling roller 340 extending in the X direction is rotatably attached to the upper corner 345.

若上部角345藉由升降機構344而向下方、即(-Z)方向下降,則剝離輥340之下表面抵接於載置於平台30之工件之上表面。另一方面,於上部角345藉由升降機構344而定位於上方、即(+Z)方向之位置之狀態下,剝離輥340成為自工件之上表面向上方離開之狀態。於上部角345,旋轉自如地安裝用以抑制剝離輥340之撓曲之支承輥346,並且適當地設置用以防止上部角345本身之撓曲之肋。剝離輥340及支承輥346不具有驅動源,而該等係自由旋轉。 When the upper corner 345 is lowered downward by the elevating mechanism 344, that is, in the (-Z) direction, the lower surface of the peeling roller 340 abuts against the upper surface of the workpiece placed on the stage 30. On the other hand, in a state in which the upper corner 345 is positioned at the upper position, that is, the position in the (+Z) direction by the elevating mechanism 344, the peeling roller 340 is separated from the upper surface of the workpiece. At the upper corner 345, a support roller 346 for suppressing the deflection of the peeling roller 340 is rotatably mounted, and a rib for preventing the deflection of the upper corner 345 itself is appropriately provided. The peeling roller 340 and the backup roller 346 do not have a driving source, and these are free to rotate.

輥單元34係可藉由安裝於主框架11之馬達353而於Y方向移動。更具體而言,下部角343連結於作為將馬達353之旋轉運動轉換成直線運動之轉換機構之例如滾珠螺桿機構354,若馬達353旋轉,則下部角343沿著導軌351、352而於Y方向移動,藉此輥單元34於Y方向移動。伴隨輥單元34之移動之剝離輥340之可動範圍係於(-Y)方向設為至水平平台部31之(-Y)側端部之附近為止,於(+Y)方向設為較水平平台部31之(+Y)側端部更外側、即進而向(+Y)側推進之位置為止。 The roller unit 34 is movable in the Y direction by the motor 353 attached to the main frame 11. More specifically, the lower corner 343 is coupled to, for example, a ball screw mechanism 354 that is a conversion mechanism that converts the rotational motion of the motor 353 into a linear motion. When the motor 353 rotates, the lower corner 343 is along the guide rails 351 and 352 in the Y direction. Moving, whereby the roller unit 34 moves in the Y direction. The movable range of the peeling roller 340 accompanying the movement of the roller unit 34 is set to the vicinity of the (-Y) side end of the horizontal platform portion 31 in the (-Y) direction, and is set to the horizontal platform in the (+Y) direction. The (+Y) side end portion of the portion 31 is further outward, that is, further advanced toward the (+Y) side.

其次,對第2吸附單元52之構成進行說明。再者,第1至第4吸附單元51~54係均具有相同之構造,此處代表性地對第2吸附單元52之構造進行說明。第2吸附單元52具有延伸設置於X方向並固定於支持框架50之樑構件521,且鉛垂向下、即向(-Z)方向延伸之1對柱構件522、523於X方向使彼此位置不同而安裝於該樑構件521。於柱構件522、523,經由在圖中隱藏之導軌而升降自如地安裝有板構件524,板構件524係藉由包含馬達及轉換機構(例如滾珠螺桿機構)之升降機構525而升降驅動。 Next, the configuration of the second adsorption unit 52 will be described. In addition, each of the first to fourth adsorption units 51 to 54 has the same structure, and the structure of the second adsorption unit 52 will be representatively described. The second adsorption unit 52 has a beam member 521 extending in the X direction and fixed to the support frame 50, and the pair of column members 522 and 523 extending vertically downward, that is, in the (-Z) direction are positioned in the X direction. It is attached to the beam member 521 differently. The column members 522 and 523 are attached to the plate member 524 so as to be lifted and lowered by a guide rail hidden in the drawing. The plate member 524 is driven up and down by a lifting mechanism 525 including a motor and a switching mechanism (for example, a ball screw mechanism).

於板構件524之下部安裝有於X方向延伸之棒狀之墊支持構件 526,於該墊支持構件526之下表面在X方向等間隔地排列有複數個吸附墊527。於圖2中,表示有使第2吸附單元52移動至較實際之位置更上方之狀態,但於板構件524藉由升降機構525而向下方移動時,吸附墊527可下降至極其接近水平平台部31之上表面310之位置為止,於在平台30載置有工件之狀態下,抵接於該工件之上表面。經由下文將述之負壓供給部528(圖5A、5C)對各吸附墊527賦予來自負壓產生部704(圖4)之負壓而吸附保持工件之上表面。 A rod-shaped pad supporting member extending in the X direction is attached to the lower portion of the plate member 524 526, a plurality of adsorption pads 527 are arranged at equal intervals in the X direction on the lower surface of the pad supporting member 526. 2 shows a state in which the second adsorption unit 52 is moved to a position higher than the actual position. However, when the plate member 524 is moved downward by the elevating mechanism 525, the adsorption pad 527 can be lowered to an extremely close to the horizontal platform. The position of the upper surface 310 of the portion 31 is in contact with the upper surface of the workpiece in a state where the workpiece is placed on the stage 30. Each of the adsorption pads 527 is given a negative pressure from the negative pressure generating portion 704 (FIG. 4) via the negative pressure supply portion 528 (FIGS. 5A, 5C) which will be described later, and the upper surface of the workpiece is adsorbed and held.

圖3係表示初始剝離單元之構造及各部之位置關係之側視圖。首先,一面參照圖1及圖3,一面對初始剝離單元33之構造進行說明。初始剝離單元33具有於錐形平台部32之上方延伸設置於X方向之棒狀之推壓構件331,推壓構件331係由支持臂332支持。支持臂332係經由延伸設置於鉛垂方向之導軌333而升降自如地安裝於柱構件334,藉由升降機構335之作動而支持臂332相對於柱構件334進行上下移動。柱構件334係由安裝於主框架11之基底部336而支持,但基底部336上之柱構件334之Y方向位置可藉由位置調整機構337而於特定之範圍內調整。 Fig. 3 is a side view showing the structure of the initial peeling unit and the positional relationship of the respective parts. First, the structure of the initial peeling unit 33 will be described with reference to Figs. 1 and 3 . The initial peeling unit 33 has a rod-shaped pressing member 331 extending in the X direction above the tapered platform portion 32, and the pressing member 331 is supported by the support arm 332. The support arm 332 is attached to the column member 334 so as to be movable up and down via a guide rail 333 extending in the vertical direction, and the support arm 332 is moved up and down with respect to the column member 334 by the action of the elevating mechanism 335. The column member 334 is supported by the base portion 336 attached to the main frame 11, but the position of the column member 334 on the base portion 336 in the Y direction can be adjusted within a specific range by the position adjustment mechanism 337.

相對於由水平平台部31及錐形平台部32構成之平台30,載置作為剝離對象物之工件WK。上述圖案化步驟中之工件係版與包覆層介隔圖案形成材料之薄膜而密接之密接體。另一方面,轉印步驟中之工件係基板與包覆層介隔經圖案化之圖案而密接之密接體。以下,對將轉印步驟中之基板SB與包覆層BL之密接體設為工件WK之情形時的剝離裝置1之剝離動作進行說明,但於將版與包覆層之密接體作為工件之情形時,亦可藉由相同之方法而進行剝離。 The workpiece WK as a object to be peeled off is placed on the stage 30 composed of the horizontal land portion 31 and the tapered land portion 32. In the above-mentioned patterning step, the workpiece-based plate and the coating layer are in close contact with each other by the film of the pattern forming material. On the other hand, in the transfer step, the workpiece-based substrate and the cladding layer are in close contact with each other via the patterned pattern. In the following, the peeling operation of the peeling device 1 when the bonded body of the substrate SB and the coating layer BL in the transfer step is the workpiece WK will be described. However, the bonded body of the plate and the coating layer is used as the workpiece. In the case, the peeling can also be carried out by the same method.

就工件WK而言,設為包覆層BL具有大於基板SB之平面尺寸者。基板SB係密接於包覆層BL之大致中央部。工件WK係將包覆層BL設為下方,將基板SB設為上方而載置於平台30。此時,如圖3所 示,工件WK以如下方式載置於平台30:工件WK中之基板SB之(-Y)側端部成為水平平台部31與錐形平台部32之交界之脊線部E之大致上方,更詳細而言,成為較脊線部E略微向(-Y)側偏移之位置。因此,於(-Y)方向上較基板SB更外側之包覆層BL係以向錐形平台部32之上方凸出之方式配置,包覆層BL之下表面與錐形平台部32之上表面320之間產生間隙。包覆層BL之下表面與錐形平台部32之上表面320所成之角θ係與錐形平台部32之錐形角相同之數度(於該實施形態中為2度)左右。 In the case of the workpiece WK, it is assumed that the cladding layer BL has a larger planar size than the substrate SB. The substrate SB is in close contact with a substantially central portion of the cladding layer BL. The workpiece WK is placed below the cladding layer BL, and the substrate SB is placed above the substrate 30. At this point, as shown in Figure 3. The workpiece WK is placed on the platform 30 in such a manner that the (-Y) side end portion of the substrate SB in the workpiece WK is substantially above the ridge line portion E at the boundary between the horizontal platform portion 31 and the tapered platform portion 32, and Specifically, it is a position slightly shifted toward the (-Y) side of the ridge portion E. Therefore, the cladding layer BL on the outer side of the substrate SB in the (-Y) direction is disposed to protrude above the tapered land portion 32, and the lower surface of the cladding layer BL and the tapered land portion 32 are above. A gap is created between the surfaces 320. The angle θ between the lower surface of the cladding layer BL and the upper surface 320 of the tapered land portion 32 is about the same as the taper angle of the tapered land portion 32 (2 degrees in this embodiment).

於水平平台部31設置有吸附槽311、312,吸附保持包覆層BL之下表面。其中,吸附槽311係吸附與基板SB之下部碰觸之包覆層BL之下表面,另一方面,吸附槽312係吸附較基板SB更外側之包覆層BL之下表面。吸附槽311、312可彼此獨立地打開‧關閉吸附,從而可一併使用2種吸附槽311、312而強力地吸附包覆層BL。另一方面,藉由設為僅使用外側之吸附槽312進行吸附,不對有效地形成有圖案之包覆層BL之中央部進行吸附,可防止由於因吸附引起之包覆層BL之撓曲而引起之圖案之損傷。如上所述,藉由獨立地控制向中央部之吸附槽311與周緣部之吸附槽312之負壓供給,可根據目的而切換包覆層BL之吸附保持之態樣。 The horizontal platform portion 31 is provided with adsorption grooves 311 and 312 for adsorbing and holding the lower surface of the cladding layer BL. The adsorption groove 311 adsorbs the lower surface of the cladding layer BL that is in contact with the lower portion of the substrate SB. On the other hand, the adsorption groove 312 adsorbs the lower surface of the cladding layer BL outside the substrate SB. The adsorption grooves 311 and 312 can be opened independently of each other. ‧ The adsorption is closed, so that the two types of adsorption grooves 311 and 312 can be used together to strongly adsorb the coating layer BL. On the other hand, by using only the outer adsorption groove 312 for adsorption, the central portion of the coating layer BL in which the pattern is effectively formed is not adsorbed, and the deflection of the coating layer BL due to adsorption can be prevented. Damage caused by the pattern. As described above, by independently controlling the supply of the negative pressure to the adsorption grooves 311 at the center portion and the adsorption grooves 312 at the peripheral portion, the adsorption and holding of the coating layer BL can be switched depending on the purpose.

於以此方式吸附保持於平台30之工件WK之上方,配置第1至第4吸附單元51~54、及輥單元34之剝離輥340。如上所述,於第2吸附單元52之下部,在X方向上並列設置有複數個吸附墊527。更詳細而言,吸附墊527具有:吸附部位527A,其由例如橡膠或矽樹脂等具有柔軟性及彈性之材料一體地形成,且下表面抵接於工件WK之上表面(更具體而言為基板SB之上表面)而吸附該工件WK;及波紋管部位527B,其具有向上下方向(Z方向)之伸縮性。設置於其他吸附單元51、53及54之吸附墊亦為相同之構造,但以下藉由對設置於該等各吸 附單元51、53及54之吸附墊分別標示符號517、537及547而區分彼此。 The first to fourth adsorption units 51 to 54 and the separation roller 340 of the roller unit 34 are disposed above the workpiece WK held by the stage 30 in this manner. As described above, a plurality of adsorption pads 527 are arranged in parallel in the X direction in the lower portion of the second adsorption unit 52. More specifically, the adsorption pad 527 has an adsorption site 527A integrally formed of a material having flexibility and elasticity such as rubber or enamel resin, and the lower surface abuts on the upper surface of the workpiece WK (more specifically, The workpiece WK is adsorbed on the upper surface of the substrate SB; and the bellows portion 527B has a stretchability in the up-down direction (Z direction). The adsorption pads disposed on the other adsorption units 51, 53 and 54 are also of the same construction, but the following are provided by the suction The adsorption pads of the units 51, 53 and 54 are denoted by reference numerals 517, 537 and 547, respectively, to distinguish each other.

第1吸附單元51係設置於水平平台部31之(-Y)側端部之上方,於下降時,吸附基板SB之(-Y)側端部之上表面。另一方面,第4吸附單元54係設置於載置於平台30之基板SB之(+Y)側端部之上方,於下降時,吸附基板SB之(+Y)側端部之上表面。第2吸附單元52及第3吸附單元53係適當地分散配置於該等之間,例如吸附墊517~547可設為於Y方向大致成為等間隔。可於該等吸附單元51~54之間彼此獨立地執行向上下方向之移動及吸附之打開‧關閉。再者,之後對用以於各吸附單元51~54中控制負壓供給之構成及動作進行詳述。 The first adsorption unit 51 is provided above the (-Y) side end portion of the horizontal platform portion 31, and adsorbs the upper surface of the (-Y) side end portion of the substrate SB when descending. On the other hand, the fourth adsorption unit 54 is disposed above the (+Y) side end portion of the substrate SB placed on the stage 30, and adsorbs the upper surface of the (+Y) side end portion of the substrate SB when descending. The second adsorption unit 52 and the third adsorption unit 53 are appropriately dispersed and disposed therebetween. For example, the adsorption pads 517 to 547 may be substantially equally spaced in the Y direction. The movement in the up and down direction and the opening and closing of the adsorption can be performed independently of each other between the adsorption units 51 to 54. Further, the configuration and operation for controlling the supply of the negative pressure in each of the adsorption units 51 to 54 will be described in detail later.

剝離輥340係向上下方向移動而相對於基板SB進行接近‧離開移動,並且藉由在Y方向移動而沿基板SB水平移動。於剝離輥340下降之狀態下,一面抵接於基板SB之上表面而轉動,一面進行水平移動。移動至最(-Y)側時之剝離輥340之位置係第1吸附單元51之最接近吸附墊517之(+Y)側之位置。為了可實現向此種接近位置之配置,對於第1吸附單元51而言係與圖2所示之第2吸附單元52相同構造者,如圖1所示般與其他第2至第4吸附單元52~54呈相反朝向而安裝於支持框架50。 The peeling roller 340 is moved in the up-down direction to move away from the substrate SB, and moves horizontally along the substrate SB by moving in the Y direction. In a state in which the peeling roller 340 is lowered, it is horizontally moved while abutting against the upper surface of the substrate SB and rotating. The position of the peeling roller 340 when moving to the most (-Y) side is the position of the first adsorption unit 51 closest to the (+Y) side of the adsorption pad 517. In order to realize the arrangement to such an approach position, the first adsorption unit 51 is the same as the second adsorption unit 52 shown in FIG. 2, and as shown in FIG. 1 and other second to fourth adsorption units. 52 to 54 are mounted in the support frame 50 in opposite directions.

初始剝離單元33係以如下方式調整其Y方向位置:推壓構件331位於突出於錐形平台部32之上方之包覆層BL之上方。而且,藉由支持臂332下降,推壓構件331之下端下降而推壓包覆層BL之上表面。此時,推壓構件331之前端由彈性構件形成,使得推壓構件331不會劃傷包覆層BL。 The initial peeling unit 33 adjusts its Y-direction position in such a manner that the pressing member 331 is positioned above the cladding layer BL that protrudes above the tapered land portion 32. Further, by the lowering of the support arm 332, the lower end of the pressing member 331 is lowered to push the upper surface of the cladding layer BL. At this time, the front end of the pressing member 331 is formed of an elastic member so that the pressing member 331 does not scratch the coating layer BL.

圖4係表示該剝離裝置之電性構成之方塊圖。裝置各部係藉由相當於本發明之「控制器件」之一例之控制單元70而控制。控制單元70包括:CPU(Central Processing Unit,中央處理單元)701,其管理裝置 整體之動作;馬達控制部702,其控制設置於各部之馬達類;閥控制部703,其控制設置於各部之閥類;負壓產生部704,其產生供給至各部之負壓;及使用者介面(UI)部705,其用以接收來自使用者之操作輸入、或將裝置之狀態報告給使用者。再者,於可利用工廠輸電管線等自外部供給之負壓之情形時,控制單元70亦可不包括負壓產生部。 Fig. 4 is a block diagram showing the electrical configuration of the peeling device. Each unit of the apparatus is controlled by a control unit 70 corresponding to an example of the "control device" of the present invention. The control unit 70 includes a CPU (Central Processing Unit) 701, which manages the device The overall operation; the motor control unit 702 controls the motors provided in the respective units; the valve control unit 703 controls the valves provided in the respective units; the negative pressure generating unit 704 generates the negative pressure supplied to the respective units; and the user A interface (UI) portion 705 for receiving an operation input from a user or reporting the status of the device to the user. Furthermore, the control unit 70 may not include the negative pressure generating portion when the negative pressure supplied from the outside such as the factory power transmission line can be utilized.

馬達控制部702係驅動控制設置於平台塊3之馬達353、及分別設置於升降機構335、344、上部吸附塊5之各吸附單元51~54之升降機構525等之馬達群。閥控制部703係控制閥群V3及閥群V51、V521、V522等,該閥群V3係設置於自負壓產生部704與設置於水平平台部31之吸附槽311、312連接之配管路徑上而用以對該等吸附槽個別地供給特定之負壓,該等閥群V51、V521、V522係設置於自負壓產生部704與各吸附墊517~547連接之負壓供給部而用以對各吸附墊517~547供給特定之負壓。 The motor control unit 702 drives and controls the motor group 353 provided in the platform block 3, and the motor group provided in the elevating mechanisms 335 and 344 and the elevating mechanism 525 of each of the adsorption units 51 to 54 of the upper adsorption block 5, respectively. The valve control unit 703 controls the valve group V3 and the valve groups V51, V521, V522 and the like, and the valve group V3 is provided on the piping path connecting the negative pressure generating unit 704 and the adsorption grooves 311 and 312 provided in the horizontal platform unit 31. The valve groups V51, V521, and V522 are provided in the negative pressure supply unit connected to the adsorption pads 517 to 547 from the negative pressure generating unit 704, and are used to individually supply a specific negative pressure to the adsorption tanks. A specific negative pressure is supplied to each of the adsorption pads 517 to 547.

圖5A~圖5C係模式性地表示吸附單元之構成之圖。本實施形態中,吸附單元51~54中之任一者均具有25個吸附墊。而且,於吸附單元51~54分別設置有負壓供給部518、528、538、548,可切換向吸附墊之負壓供給及供給停止。於本實施形態中,吸附單元51係如下之機構,即,於如下所述般推進剝離之方向、即剝離推進方向(+Y)上位於最上游側,吸附版或基板之上游側端部並最初自包覆層BL開始剝離,其他吸附單元52~54之各者係吸附藉由該吸附單元之上游側吸附單元剝離之剝離部位而進一步推進剝離之機構。如上所述,吸附單元之功能不同,因此本實施形態係藉由吸附單元51、及吸附單元52~54而使負壓供給部之構成存在差異。 5A to 5C are diagrams schematically showing the configuration of an adsorption unit. In the present embodiment, each of the adsorption units 51 to 54 has 25 adsorption pads. Further, negative suction supply units 518, 528, 538, and 548 are provided in the adsorption units 51 to 54, respectively, and the supply of the negative pressure to the adsorption pad and the supply stop can be switched. In the present embodiment, the adsorption unit 51 is a mechanism that advances the peeling direction, that is, the direction in which the peeling is advanced (+Y) is located on the most upstream side, and the upstream end of the adsorption plate or the substrate is First, the coating layer BL is peeled off, and each of the other adsorption units 52 to 54 adsorbs a peeling portion peeled off by the upstream adsorption unit of the adsorption unit to further promote the peeling. As described above, since the functions of the adsorption unit are different, in the present embodiment, the configuration of the negative pressure supply unit differs by the adsorption unit 51 and the adsorption units 52 to 54.

吸附單元51係25個吸附墊517排列於X方向,如圖5B所示,自(-X)方向側向(+X)方向側分為8個吸附墊、9個吸附墊、8個吸附墊之3個吸附墊群組,經由負壓供給部518而連接於負壓產生部704。該負壓供 給部518具有3個歧管5181~5183,歧管5181係與構成(-X)側之吸附墊群組之8個吸附墊517連接,歧管5182係與構成中央之吸附墊群組之9個吸附墊517連接,進而歧管5183係與構成(+X)側之吸附墊群組之8個吸附墊517連接。再者,對於吸附墊517之個數、群組之區分態樣等係任意。 The adsorption unit 51 has 25 adsorption pads 517 arranged in the X direction, as shown in FIG. 5B, and is divided into 8 adsorption pads, 9 adsorption pads, and 8 adsorption pads from the (-X) direction side (+X) direction side. The three adsorption pad groups are connected to the negative pressure generating portion 704 via the negative pressure supply portion 518. The negative pressure supply The donor portion 518 has three manifolds 5181 to 5183, and the manifold 5181 is connected to eight adsorption pads 517 constituting the adsorption pad group on the (-X) side, and the manifold 5182 is connected to the group of adsorption pads constituting the center. The adsorption pads 517 are connected, and the manifold 5183 is connected to the eight adsorption pads 517 constituting the adsorption pad group on the (+X) side. Further, the number of the adsorption pads 517, the grouping of the groups, and the like are arbitrary.

各歧管5181~5183係經由控制閥V51而連接於負壓產生部704。 因此,若根據來自控制單元70之閥控制部703之打開指令而控制閥V51打開,則經由歧管5181~5183而對吸附墊517賦予負壓。相反地,根據來自閥控制部703之關閉指令而控制閥V51關閉,藉此向吸附墊517之負壓供給停止。如上所述,本實施形態係控制閥V51作為切換向吸附墊517之負壓供給、及負壓供給停止之切換部而發揮功能,相當於本發明之「上游側切換部」之一例。而且,藉由控制閥V51而可同時對所有吸附墊517供給負壓,又,可同時停止負壓供給。再者,圖5B中之符號5184係測量各吸附墊517內之壓力之壓力計。 Each of the manifolds 5181 to 5183 is connected to the negative pressure generating portion 704 via a control valve V51. Therefore, when the control valve V51 is opened in response to the opening command from the valve control unit 703 of the control unit 70, the suction pad 517 is given a negative pressure via the manifolds 5181 to 5183. Conversely, the control valve V51 is closed in accordance with the closing command from the valve control unit 703, whereby the supply of the negative pressure to the adsorption pad 517 is stopped. As described above, in the present embodiment, the control valve V51 functions as a switching unit that switches the supply of the negative pressure to the adsorption pad 517 and the supply of the negative pressure, and corresponds to an example of the "upstream switching unit" of the present invention. Further, by controlling the valve V51, all of the adsorption pads 517 can be simultaneously supplied with a negative pressure, and at the same time, the negative pressure supply can be stopped at the same time. Further, reference numeral 5184 in Fig. 5B is a pressure gauge for measuring the pressure in each adsorption pad 517.

吸附單元52~54與吸附單元51相同地,亦具有排列於X方向之25個吸附墊,可分別藉由負壓供給部528、538、548而獨立地切換向吸附墊之負壓供給及負壓供給停止。該等負壓供給部528、538、548具有相同之構成。因此,以下對負壓供給部528之構成進行說明,對剩餘之負壓供給部538、548標示相同符號而省略構成之說明。 Similarly to the adsorption unit 51, the adsorption units 52 to 54 also have 25 adsorption pads arranged in the X direction, and the negative pressure supply and the negative pressure supply to the adsorption pad can be independently switched by the negative pressure supply units 528, 538, and 548, respectively. The pressure supply stops. The negative pressure supply units 528, 538, and 548 have the same configuration. Therefore, the configuration of the negative pressure supply unit 528 will be described below, and the remaining negative pressure supply units 538 and 548 are denoted by the same reference numerals, and the description thereof will be omitted.

於吸附單元52中,25個吸附墊527係排列於X方向。再者,於相互區分地說明25個吸附墊527之情形時,本說明書係將自最(-X)側排列至(+X)側之吸附墊527分別稱為吸附墊527a~527y,於其他情形時,簡稱為「吸附墊527」。 In the adsorption unit 52, 25 adsorption pads 527 are arranged in the X direction. Furthermore, in the case where the 25 adsorption pads 527 are described separately from each other, the present specification refers to the adsorption pads 527 arranged from the most (-X) side to the (+X) side, respectively, as adsorption pads 527a to 527y, respectively. In the case of the case, it is simply referred to as "adsorption pad 527".

該等之吸附墊527係自(-X)方向側向(+X)方向側分為1個吸附墊、7個吸附墊、4個吸附墊、1個吸附墊、4個吸附墊、7個吸附墊、1個吸 附墊之7個吸附墊群組,自(-X)側為第N個(N=1、2、3、4、5、6、7)之吸附墊群組係分別以如下方式構成。即,以如下構成區分:第1個吸附墊群組:吸附墊527a;第2個吸附墊群組:吸附墊527b~527h;第3個吸附墊群組:吸附墊527i~527l;第4個吸附墊群組:吸附墊527m;第5個吸附墊群組:吸附墊527n~527q;第6個吸附墊群組:吸附墊527r~527x;第7個吸附墊群組:吸附墊527y。 The adsorption pad 527 is divided into one adsorption pad, seven adsorption pads, four adsorption pads, one adsorption pad, four adsorption pads, and seven adsorption holes from the (-X) direction side (+X) direction side. Adsorption pad, 1 suction The seven adsorption pad groups attached to the pad, and the N-th (N=1, 2, 3, 4, 5, 6, and 7) adsorption pad groups from the (-X) side are respectively configured as follows. That is, the following composition is distinguished: the first adsorption pad group: adsorption pad 527a; the second adsorption pad group: adsorption pad 527b to 527h; the third adsorption pad group: adsorption pad 527i to 527l; the fourth Adsorption pad group: adsorption pad 527m; 5th adsorption pad group: adsorption pad 527n~527q; 6th adsorption pad group: adsorption pad 527r~527x; 7th adsorption pad group: adsorption pad 527y.

該等吸附墊群組中之第2個、第3個、第5個及第6個吸附墊群組係如上所述般包含複數個吸附墊527。因此,與此對應而負壓供給部528具有4個歧管5281~5284。該等歧管5281~5284中之歧管5281係與構成第2個吸附墊群組之吸附墊527b~527h連接,歧管5282係與構成第3個吸附墊群組之吸附墊527i~527l連接,歧管5283係與構成第5個吸附墊群組之吸附墊527n~527q連接,歧管5284係與構成第6個吸附墊群組之吸附墊527r~527x連接。 The second, third, fifth, and sixth adsorption pad groups in the group of adsorption pads comprise a plurality of adsorption pads 527 as described above. Therefore, the negative pressure supply unit 528 has four manifolds 5281 to 5284 corresponding thereto. The manifolds 5281 of the manifolds 5281 to 5284 are connected to the adsorption pads 527b to 527h constituting the second adsorption pad group, and the manifold 5282 is connected to the adsorption pads 527i to 527l constituting the third adsorption pad group. The manifold 5283 is connected to the adsorption pads 527n to 527q constituting the fifth adsorption pad group, and the manifold 5284 is connected to the adsorption pads 527r to 527x constituting the sixth adsorption pad group.

各歧管5281~5284係經由控制閥V521而連接於負壓產生部704。 因此,若根據來自控制單元70之閥控制部703之打開指令而控制閥V521打開,則經由歧管5281~5284而對吸附墊527b~527h、527i~527l、527n~527q、527r~527x賦予負壓。相反地,根據來自閥控制部703之關閉指令而控制閥V521關閉,藉此向吸附墊527b~527h、527i~527l、527n~527q、527r~527x之負壓供給停止。如上所述,本實施形態係控制閥V521作為切換向吸附墊527b~527h、527i~527l、527n~527q、527r~527x之負壓供給、及負壓供給停止之切換部而發揮功能,可同時對吸附墊527b~527h、527i~527l、527n~527q、527r~527x供給負壓,又,可同時停止負壓供給。再者,該圖 中之符號5285係測量各吸附墊527b~527h、527i~527l、527n~527q、527r~527x之壓力之壓力計。 Each of the manifolds 5281 to 5284 is connected to the negative pressure generating portion 704 via a control valve V521. Therefore, when the control valve V521 is opened according to the opening command from the valve control unit 703 of the control unit 70, the adsorption pads 527b to 527h, 527i to 527l, 527n to 527q, and 527r to 527x are given negative via the manifolds 5281 to 5284. Pressure. On the contrary, the control valve V521 is closed in response to the closing command from the valve control unit 703, whereby the supply of the negative pressure to the adsorption pads 527b to 527h, 527i to 527l, 527n to 527q, and 527r to 527x is stopped. As described above, in the present embodiment, the control valve V521 functions as a switching unit that switches between the negative pressure supply to the adsorption pads 527b to 527h, 527i to 527l, 527n to 527q, and 527r to 527x, and the negative pressure supply stop. Negative pressure is supplied to the adsorption pads 527b to 527h, 527i to 527l, 527n to 527q, and 527r to 527x, and the negative pressure supply can be stopped at the same time. Again, the picture The symbol 5285 is a pressure gauge for measuring the pressure of each of the adsorption pads 527b~527h, 527i~527l, 527n~527q, and 527r~527x.

另一方面,剩餘之吸附墊群組係均包含單一吸附墊527a、527m、527y,因此不設置歧管,而吸附墊527a、527m、527y經由控制閥V522連接於負壓產生部704。因此,若根據來自控制單元70之閥控制部703之打開指令而控制閥V522打開,則對吸附墊527a、527m、527x賦予負壓。相反地,根據來自閥控制部703之關閉指令而控制閥V522關閉,藉此向吸附墊527a、527m、527x之負壓供給停止。如上所述,本實施形態中,控制閥V522作為切換向吸附墊527a、527m、527x之負壓供給、及負壓供給停止之切換部而發揮功能,可同時對吸附墊527a、527m、527x供給負壓,又,可同時停止負壓供給。再者,該圖中之符號5286係測量各吸附墊527a、527m、527x之壓力之壓力計,相當於本發明之「監控器件」及「壓力測量部」之一例。 On the other hand, since the remaining adsorption pad groups each include a single adsorption pad 527a, 527m, and 527y, the manifold is not provided, and the adsorption pads 527a, 527m, and 527y are connected to the negative pressure generating portion 704 via the control valve V522. Therefore, when the control valve V522 is opened in response to an opening command from the valve control unit 703 of the control unit 70, a negative pressure is applied to the adsorption pads 527a, 527m, and 527x. On the contrary, the control valve V522 is closed in accordance with the closing command from the valve control unit 703, whereby the supply of the negative pressure to the adsorption pads 527a, 527m, and 527x is stopped. As described above, in the present embodiment, the control valve V522 functions as a switching unit that switches the supply of the negative pressure to the adsorption pads 527a, 527m, and 527x and the supply of the negative pressure, and simultaneously supplies the adsorption pads 527a, 527m, and 527x. Negative pressure, in turn, can stop the supply of negative pressure at the same time. Further, reference numeral 5286 in the drawing is a pressure gauge for measuring the pressure of each of the adsorption pads 527a, 527m, and 527x, and corresponds to an example of the "monitoring device" and the "pressure measuring portion" of the present invention.

其次,一面參照圖6至圖11A、圖11B以及圖11C,一面對如上所述般構成之剝離裝置之動作進行說明。圖6至圖10係模式性地表示處理中之各階段之各部之位置關係與負壓供給部之負壓供給狀態之圖。 又,圖11A至圖11C係僅模式性地表示處理中之各階段之各部之位置關係的圖。該剝離處理係藉由執行CPU701預先記憶之處理程式而控制各部完成。再者,此處對如上所述般將基板SB與包覆層BL之密接體作為工件WK之情形時之剝離裝置1的剝離動作進行說明。 Next, an operation of the peeling apparatus configured as described above will be described with reference to Figs. 6 to 11A, 11B, and 11C. 6 to 10 are diagrams schematically showing the positional relationship of each unit in each stage of the process and the negative pressure supply state of the negative pressure supply unit. 11A to 11C are diagrams schematically showing only the positional relationship of each unit in each stage of the process. This stripping process is performed by executing the processing program previously stored by the CPU 701 to control the completion of each unit. In the case where the adherend of the substrate SB and the cladding layer BL is used as the workpiece WK as described above, the peeling operation of the peeling device 1 will be described.

首先,若藉由操作員或外部之搬送機器人等而向平台30上之上述位置載入工件WK、即執行保持步驟,則裝置初始化而裝置各部設定為特定之初始狀態。於初始狀態下,工件WK係藉由吸附槽311、312中之一者或兩者而吸附保持,從而初始剝離單元33之推壓構件331、輥單元34之剝離輥340、第1至第4吸附單元51~54之吸附墊517~547係均自工件WK離開,不對任一吸附墊517~547供給負壓。又, 剝離輥340係於其可動範圍內,處於最靠近(-Y)側之位置。 First, when the workpiece WK is loaded to the position on the stage 30 by the operator or the external transfer robot or the like, that is, the holding step is performed, the apparatus is initialized and the respective units are set to a specific initial state. In the initial state, the workpiece WK is adsorbed and held by one or both of the adsorption grooves 311, 312, so that the pressing member 331 of the initial peeling unit 33, the peeling roller 340 of the roller unit 34, and the first to fourth The adsorption pads 517 to 547 of the adsorption units 51 to 54 are all separated from the workpiece WK, and no negative pressure is supplied to any of the adsorption pads 517 to 547. also, The peeling roller 340 is in the movable range and is located closest to the (-Y) side.

如圖6所示,使第1吸附單元51及剝離輥340自該狀態下降。於該移動中,控制閥V51係維持停止負壓供給之狀態。而且,若僅下降移動根據工件WK之厚度而預先設定之距離,則如圖7所示,第1吸附單元51之吸附墊517係分別抵接至工件WK之上表面。於是,根據來自閥控制部703之指令打開控制閥V51而自負壓產生部704經由歧管5181~5183對第1吸附單元51之吸附墊517賦予負壓。藉此,藉由吸附墊517吸附保持基板SB之上表面、即與密接於包覆層BL之面為相反側之反密接面之(-Y)側端部。如上所述般藉由吸附墊517而吸附之部位相當於本發明之「被吸附部位」之一例。又,剝離輥340係於其(+Y)側鄰接位置抵接於基板SB之上表面。再者,圖7中之欄(a)之影線係表示吸附墊受到負壓供給者,又,於圖7中之欄(b)中標示於推壓構件331之附近之向下箭頭係意味著於自圖中所示之狀態繼續之步驟中,推壓構件331向該箭頭方向移動。對於該等方面,於以下之圖中亦相同。 As shown in Fig. 6, the first adsorption unit 51 and the peeling roller 340 are lowered from this state. During this movement, the control valve V51 maintains the state in which the supply of the negative pressure is stopped. Further, if only the distance set in advance by the thickness of the workpiece WK is lowered, as shown in FIG. 7, the adsorption pads 517 of the first adsorption unit 51 are respectively brought into contact with the upper surface of the workpiece WK. Then, the control valve V51 is opened by the command from the valve control unit 703, and the negative pressure is applied from the negative pressure generating unit 704 to the adsorption pad 517 of the first adsorption unit 51 via the manifolds 5181 to 5183. Thereby, the (-Y) side end portion of the upper surface of the substrate SB, that is, the opposite side of the opposite surface to the surface of the cladding layer BL is adsorbed and held by the adsorption pad 517. The portion adsorbed by the adsorption pad 517 as described above corresponds to an example of the "adsorbed portion" of the present invention. Further, the peeling roller 340 abuts on the upper surface of the substrate SB at the (+Y) side adjacent position. Further, the hatching of the column (a) in Fig. 7 indicates that the adsorption pad is subjected to the negative pressure supply, and the downward arrow indicated in the vicinity of the pressing member 331 in the column (b) of Fig. 7 means In the step of continuing from the state shown in the figure, the pressing member 331 is moved in the direction of the arrow. For these aspects, the same is true in the following figures.

此處,剝離輥340抵接之抵接區域係設為較有效地轉印圖案而作為裝置發揮功能之有效區域更外側、即自有效區域靠近(-Y)側之位置。因此,有效區域之內部不受第1吸附單元51之吸附、剝離輥340之推壓中之任一者。 Here, the contact area where the peeling roller 340 abuts is a position where the effective area of the device is more effectively transferred, and the effective area which functions as a device is further outside, that is, the position closer to the (-Y) side from the effective area. Therefore, the inside of the effective region is not affected by the adsorption by the first adsorption unit 51 or the pressing of the peeling roller 340.

其次,使初始剝離單元33作動,使推壓構件331下降而推壓包覆層BL端部。包覆層BL之端部係突出於錐形平台部32之上方,於該包覆層BL之下表面與錐形平台部32之上表面320之間存在間隙。因此,推壓構件331向下方推壓包覆層BL之端部,藉此包覆層BL之端部沿著錐形平台部32之錐形面而向下方彎曲。其結果,藉由第1吸附單元51而吸附保持之基板SB之端部與包覆層BL之間離開而開始剝離。推壓構件331係形成為於X方向延伸之棒狀,而且其X方向長度設定為較包覆層BL更長。因此,推壓構件331抵接於包覆層BL之抵接區域係自包 覆層BL之(-X)側端部至(+X)側端部為止延伸成直線狀。藉此,可使包覆層BL彎曲成柱面狀,從而可將基板SB與包覆層BL已剝離之剝離區域、與仍未剝離之未剝離區域之交界線(以下,稱為「剝離交界線」)設為直線狀。 Next, the initial peeling unit 33 is actuated to lower the pressing member 331 and press the end portion of the coating layer BL. The end of the cladding layer BL protrudes above the tapered land portion 32, and there is a gap between the lower surface of the cladding layer BL and the upper surface 320 of the tapered land portion 32. Therefore, the pressing member 331 pushes the end portion of the coating layer BL downward, whereby the end portion of the coating layer BL is bent downward along the tapered surface of the tapered land portion 32. As a result, the end portion of the substrate SB adsorbed and held by the first adsorption unit 51 is separated from the coating layer BL to start peeling. The pressing member 331 is formed in a rod shape extending in the X direction, and its length in the X direction is set to be longer than the coating layer BL. Therefore, the abutting region of the pressing member 331 abutting on the covering layer BL is self-contained. The (-X) side end portion of the cladding layer BL extends linearly from the (+X) side end portion. Thereby, the coating layer BL can be bent into a cylindrical shape, and the boundary between the peeled region where the substrate SB and the coating layer BL have been peeled off and the unpeeled region which has not been peeled off can be formed (hereinafter referred to as "peeling junction" Line") is set to be linear.

自該狀態開始第1吸附單元51之上升,並且與此同步而使剝離輥340向(+Y)方向移動。具體而言,於因第1吸附單元51之上升而向(+Y)方向移動之剝離交界線到達剝離輥340之正下方之時序,開始剝離輥340之移動。藉此,抵接區域向(+Y)方向移動。此後,第1吸附單元51以固定速度向上方、即(+Z)方向移動,又,剝離輥340以固定速度向(+Y)方向移動。 From this state, the first adsorption unit 51 is raised, and in synchronization with this, the peeling roller 340 is moved in the (+Y) direction. Specifically, the movement of the peeling roller 340 is started at the timing when the peeling boundary line moving in the (+Y) direction by the rise of the first adsorption unit 51 reaches the immediately below the peeling roller 340. Thereby, the abutment area moves in the (+Y) direction. Thereafter, the first adsorption unit 51 moves upward at a fixed speed, that is, in the (+Z) direction, and the peeling roller 340 moves in the (+Y) direction at a fixed speed.

又,如圖8所示,保持基板SB之端部之第1吸附單元51上升,藉此提拉藉由吸附墊517吸附之基板SB之被吸附部位SR而與包覆層BL之剝離朝向(+Y)方向推進,但由於抵接剝離輥340,故不存在超過剝離輥340之抵接區域而推進剝離之情形。一面使剝離輥340抵接於基板SB,一面以固定速度向(+Y)方向移動,藉此可固定地維持剝離之推進速度。即,剝離交界線成為沿著輥延伸設置方向即X方向之一直線,而且以固定速度向(+Y)方向推進。藉此,可確實地防止由於剝離之推進速度之變動引起之應力集中而引起的圖案之損傷。 Further, as shown in FIG. 8, the first adsorption unit 51 holding the end portion of the substrate SB is raised, thereby pulling away the peeling direction of the coated portion BL by the adsorbed portion SR of the substrate SB adsorbed by the adsorption pad 517 ( The +Y) direction is advanced, but since the peeling roller 340 is abutted, there is no case where the contact area of the peeling roller 340 is exceeded and the peeling is promoted. The peeling roller 340 is moved in the (+Y) direction at a fixed speed while abutting against the substrate SB, whereby the peeling advance speed can be fixedly maintained. In other words, the peeling boundary line is a straight line along the direction in which the roller extends, that is, the X direction, and is advanced in the (+Y) direction at a constant speed. Thereby, it is possible to surely prevent the damage of the pattern due to the stress concentration caused by the variation in the pushing speed of the peeling.

進而,等待剝離輥340通過第2吸附位置。第2吸附位置係基板SB上表面中之第2吸附單元52之正下方位置,且係接受該第2吸附單元52之吸附之位置。而且,若剝離輥340通過第2吸附位置,則如圖9所示般開始第2吸附單元52之下降。即,於剝離推進之剝離推進方向(+Y)上位於較第2吸附單元52更靠上游側之第1吸附單元51上升,藉此吸附墊527向自包覆層BL剝離之剝離部位(基板SB中之位於第1吸附單元51與剝離輥340之間之部分)PR移動(移動步驟)。 Further, the peeling roller 340 is waited for the second adsorption position. The second adsorption position is a position immediately below the second adsorption unit 52 on the upper surface of the substrate SB, and is a position at which the adsorption of the second adsorption unit 52 is received. When the peeling roller 340 passes through the second adsorption position, the lowering of the second adsorption unit 52 is started as shown in FIG. In other words, in the peeling advancement direction (+Y) of the peeling advancement, the first adsorption unit 51 that is located on the upstream side of the second adsorption unit 52 rises, and the adsorption pad 527 is peeled off from the coating layer BL (substrate). The portion of the SB located between the first adsorption unit 51 and the peeling roller 340) moves (moving step).

又,伴隨第2吸附單元52之下降,根據來自閥控制部703之指令 僅打開控制閥V522而自負壓產生部704對3個吸附墊527a、527m、527y供給負壓。再者,向除該等3個吸附墊527a、527m、527y以外之22個吸附墊527b~527l、527n~527x之負壓供給係仍處於停止狀態。 即,第2吸附單元52係一面於X方向上之(-X)側、中央及(+X)側進行抽吸一面下降。於由具有伸縮性之彈性構件構成之吸附墊527之下表面抵接於基板SB之剝離部位PR的時間點,捕捉吸附基板SB,並且藉由壓力計5286測量之壓力值大幅改變。因此,藉由監控自壓力計5286輸出之壓力值、即藉由執行監控步驟,而可準確地偵測第2吸附單元52下降至吸附墊527可吸附剝離部位PR之位置為止。 Further, in accordance with the instruction from the valve control unit 703, the second adsorption unit 52 is lowered. Only the control valve V522 is opened, and the negative pressure generating unit 704 supplies a negative pressure to the three adsorption pads 527a, 527m, and 527y. Further, the negative pressure supply system of the 22 adsorption pads 527b to 527l and 527n to 527x other than the three adsorption pads 527a, 527m, and 527y is still in a stopped state. In other words, the second adsorption unit 52 is lowered while sucking on the (-X) side, the center, and the (+X) side in the X direction. At the time point when the lower surface of the adsorption pad 527 composed of the elastic member having elasticity is abutted against the peeling portion PR of the substrate SB, the adsorption substrate SB is caught, and the pressure value measured by the pressure gauge 5286 is largely changed. Therefore, by monitoring the pressure value output from the pressure gauge 5286, that is, by performing the monitoring step, it is possible to accurately detect that the second adsorption unit 52 is lowered until the adsorption pad 527 can adsorb the position of the peeling portion PR.

此處,僅藉由吸附墊527而吸附基板SB之剝離部位PR,因此亦能夠以於第2吸附單元52之下降中對所有吸附墊527供給負壓之方式構成。然而,於至與基板SB抵接為止之期間,存在如下可能性:吸附墊527抽吸大氣,對負壓產生部704施加極大之負載,並且自負壓產生部704對第1吸附單元51賦予之負壓之值發生變動,利用吸附墊517進行之基板SB之保持偏移。與此相對,為了偵測吸附墊527向剝離部位PR之抵接而大幅限制於第2吸附單元52之下降中賦予負壓之吸附墊527之個數,藉此可大幅減少上述問題之產生,並且準確地進行上述抵接偵測。考慮該方面而於本實施形態中,3個吸附墊527a、527m、527y不僅如上所述般僅發揮吸附基板SB之功能,而且兼具確認基板SB向剝離部位PR之抵接之功能,作為所謂之抵接確認兼用吸附部而發揮功能。另一方面,其他吸附墊527b~527l、527n~527x係作為專門用以吸附保持剝離部位PR之保持專用吸附部而發揮功能。再者,本實施形態中,作為抵接確認用而使用3個吸附墊527a、527m、527y,但用作抵接確認兼用吸附部之吸附墊之個數或配設位置為任意而並不限定於此,但就抑制負壓值之變動之觀點而言,較理想的是設定為至少較保持專用吸附部少之個數。 Here, since only the peeling site PR of the substrate SB is adsorbed by the adsorption pad 527, it is also possible to provide a negative pressure to all the adsorption pads 527 during the lowering of the second adsorption unit 52. However, during the period of the contact with the substrate SB, there is a possibility that the adsorption pad 527 sucks the atmosphere, applies a large load to the negative pressure generating portion 704, and the negative pressure generating portion 704 gives the first adsorption unit 51. The value of the negative pressure changes, and the substrate SB held by the adsorption pad 517 is kept offset. On the other hand, in order to detect the contact of the adsorption pad 527 with the peeling portion PR, the number of the adsorption pads 527 to which the negative pressure is applied during the lowering of the second adsorption unit 52 is largely limited, whereby the above problem can be greatly reduced. And the above abutment detection is performed accurately. In view of this, in the present embodiment, the three adsorption pads 527a, 527m, and 527y not only function as the adsorption substrate SB but also function to confirm the contact of the substrate SB with the separation portion PR. The abutment confirms that the adsorption unit functions as a separate unit. On the other hand, the other adsorption pads 527b to 527l and 527n to 527x function as a dedicated adsorption portion for holding and holding the peeling portion PR. In the present embodiment, the three adsorption pads 527a, 527m, and 527y are used as the contact confirmation. However, the number or arrangement position of the adsorption pads used as the contact confirmation and adsorption unit is arbitrary and is not limited. However, from the viewpoint of suppressing the variation of the negative pressure value, it is preferable to set it to at least a smaller number than the dedicated adsorption portion.

若藉由壓力值之監測而偵測吸附墊527抵接於基板SB之剝離部位PR,則如圖10所示,根據來自閥控制部703之指令打開控制閥V521而亦自負壓產生部704對剩餘之22個之吸附墊527b~527l、527n~527x供給負壓。藉此,藉由全部25個吸附墊527吸附保持基板SB之剝離部位PR。再者,亦可為如下之態樣:於使所有吸附墊527下降至特定位置為止後,使提拉之基板SB待機。無論為哪種情形時,均可藉由使吸附墊527具有柔軟性而防止吸附之失敗。關於該方面係於之後之實施形態中亦相同。 When the suction pad 527 is detected to be in contact with the peeling portion PR of the substrate SB by the monitoring of the pressure value, as shown in FIG. 10, the control valve V521 is opened in accordance with an instruction from the valve control unit 703, and the negative pressure generating portion 704 is also applied. Negative pressure is supplied to the remaining 22 adsorption pads 527b to 527l and 527n to 527x. Thereby, the peeling site PR of the holding substrate SB is sucked by all of the 25 adsorption pads 527. Further, it is also possible to wait for the substrate SB to be pulled up after all the adsorption pads 527 have been lowered to a specific position. In either case, the failure of adsorption can be prevented by making the adsorption pad 527 flexible. This aspect is also the same in the following embodiments.

於開始基板SB之吸附後,將第2吸附單元52之移動變換為上升。藉此,剝離之推進速度仍然藉由剝離輥340而控制,並且用以剝離之基板SB之提拉之主體係自第1吸附單元51承接至第2吸附單元52。又,剝離後之基板SB係自僅利用第1吸附單元51之保持切換至利用第1吸附單元51與第2吸附單元52之保持,從而保持部位增加。再者,如圖11A所示,於各吸附單元51~54上升時,以剝離後之基板SB之姿勢大致成為平面之方式,維持各吸附單元51~54間之Z方向上之相對位置。 After the adsorption of the substrate SB is started, the movement of the second adsorption unit 52 is changed to increase. Thereby, the advancement speed of the peeling is still controlled by the peeling roller 340, and the main system for pulling up the peeled substrate SB is taken from the first adsorption unit 51 to the second adsorption unit 52. Moreover, the substrate SB after peeling is switched from being held by the first adsorption unit 51 to being held by the first adsorption unit 51 and the second adsorption unit 52, and the holding portion is increased. Further, as shown in FIG. 11A, when the respective adsorption units 51 to 54 are raised, the relative position in the Z direction between the respective adsorption units 51 to 54 is maintained so that the posture of the substrate SB after peeling is substantially flat.

繼而,於剝離輥340通過第3吸附單元53正下方之第3吸附位置之時間點,開始第3吸附單元53之下降,用以剝離之基板SB之提拉之主體自第2吸附單元52向第3吸附單元53移行。該第3吸附單元53之下降、吸附保持及基板提拉係與第2吸附單元之該等下降、吸附保持及基板提拉相同地進行。進而,於剝離輥340通過第4吸附位置後,第4吸附單元54下降,提拉基板SB。此時,亦執行與第2吸附單元52之下降、吸附保持及基板提拉相同之動作。 Then, when the peeling roller 340 passes through the third adsorption position immediately below the third adsorption unit 53, the third adsorption unit 53 is lowered, and the main body of the substrate SB for peeling is pulled from the second adsorption unit 52. The third adsorption unit 53 moves. The lowering, the adsorption holding, and the substrate pulling system of the third adsorption unit 53 are performed in the same manner as the lowering of the second adsorption unit, the adsorption holding, and the substrate pulling. Further, after the peeling roller 340 passes through the fourth adsorption position, the fourth adsorption unit 54 is lowered to pull up the substrate SB. At this time, the same operation as the lowering, the adsorption holding, and the substrate pulling of the second adsorption unit 52 is also performed.

以此方式,藉由第4吸附單元54而提拉基板SB,藉此如圖11B所示,自包覆層BL拉離基板SB之整體。因此,於使第4吸附單元54上升後,使剝離輥340移動至較平台30更靠(+Y)側為止而使該移動停止。 接著,如圖11C所示,於使各吸附單元51~54全部上升至相同之高度為止後停止。又,使初始剝離單元33之推壓構件331自包覆層BL離開,而移動至較包覆層BL之上表面更上方且較包覆層BL之(-Y)側端部更靠(-Y)側之退避位置為止。此後,解除利用吸附槽之包覆層BL之吸附保持,從而向裝置外搬出經分離之基板SB及包覆層BL,藉此剝離處理完成。 In this manner, the substrate SB is pulled by the fourth adsorption unit 54, whereby the entire substrate SB is pulled from the cladding layer BL as shown in FIG. 11B. Therefore, after the fourth adsorption unit 54 is raised, the separation roller 340 is moved to the (+Y) side of the platform 30 to stop the movement. Next, as shown in FIG. 11C, the adsorption units 51 to 54 are all raised to the same height and then stopped. Further, the pressing member 331 of the initial peeling unit 33 is moved away from the cladding layer BL, and moved to a position higher than the upper surface of the cladding layer BL and closer to the (-Y) side end portion of the cladding layer BL (- Y) The back position of the side. Thereafter, the adsorption holding of the coating layer BL by the adsorption tank is released, and the separated substrate SB and the coating layer BL are carried out outside the apparatus, whereby the peeling process is completed.

將各吸附單元51~54之高度設為相同之原因在於,藉由平行地保持剝離後之基板SB與包覆層BL,而使藉由外部機器人或操作員而插入之交送用手之存取、與包覆層BL及基板SB向該交送用手之交接變得容易。 The reason why the heights of the respective adsorption units 51 to 54 are the same is that the substrate SB and the cladding layer BL after the separation are held in parallel, so that the insertion by the external robot or the operator is carried out by hand. It is easy to take and transfer the cladding layer BL and the substrate SB to the hand.

如上所述,根據本實施形態,伴隨基板SB向剝離推進方向(於本實施形態中為+Y方向)之剝離推進而藉由下游側吸附墊保持基板SB之剝離部位PR,從而進一步推進剝離。例如,於在一面藉由第1吸附單元51之吸附墊517保持基板SB之(-Y)側端部一面推進剝離之期間,藉由位於吸附墊517之下游側之第2吸附單元52之吸附墊527保持基板SB之剝離部位PR後,進一步推進剝離。於此種剝離階段中,第1吸附單元51及吸附墊517係分別作為本發明之「上游側剝離器件」及「上游側吸附部」而發揮功能,並且第2吸附單元52及吸附墊527係分別作為本發明之「下游側剝離器件」及「下游側吸附部」而發揮功能。 As described above, according to the present embodiment, the peeling progress of the substrate SB in the peeling advancement direction (the +Y direction in the present embodiment) is carried out, and the peeling portion PR of the substrate SB is held by the downstream suction pad to further promote the peeling. For example, during the period in which the (-Y) side end portion of the substrate SB is held by the adsorption pad 517 of the first adsorption unit 51 while being peeled off, the second adsorption unit 52 located on the downstream side of the adsorption pad 517 is adsorbed. After the pad 527 holds the peeling portion PR of the substrate SB, the peeling is further promoted. In the peeling stage, the first adsorption unit 51 and the adsorption pad 517 function as the "upstream side separation device" and the "upstream side adsorption unit" of the present invention, respectively, and the second adsorption unit 52 and the adsorption pad 527 are used. Each of the functions is a "downstream side peeling device" and a "downstream side adsorption unit" of the present invention.

又,繼上述剝離之後,於在一面藉由第2吸附單元52之吸附墊527而保持基板SB之被吸附部位SR(參照圖11A)一面推進剝離之期間,藉由位於吸附墊527之下游側之第3吸附單元53之吸附墊537保持基板SB之剝離部位PR後,進一步推進剝離。於此種剝離階段中,第2吸附單元52及吸附墊527係分別作為本發明之「上游側剝離器件」及「上游側吸附部」而發揮功能,並且第3吸附單元53及吸附墊537係分別作為本發明之「下游側剝離器件」及「下游側吸附部」而發揮功 能。 In addition, after the peeling is performed on the adsorbed portion SR (see FIG. 11A) of the substrate SB by the adsorption pad 527 of the second adsorption unit 52, the peeling is performed on the downstream side of the adsorption pad 527. After the adsorption pad 537 of the third adsorption unit 53 holds the peeling portion PR of the substrate SB, the peeling is further promoted. In the peeling stage, the second adsorption unit 52 and the adsorption pad 527 function as the "upstream side separation device" and the "upstream side adsorption unit" of the present invention, respectively, and the third adsorption unit 53 and the adsorption pad 537 are used. Each of the "downstream side peeling device" and the "downstream side adsorption unit" of the present invention performs work. can.

又,繼上述剝離之後,於在一面藉由第3吸附單元53之吸附墊537而保持基板SB之被吸附部位SR(參照圖11B)一面推進剝離之期間,藉由位於吸附墊537之下游側之第4吸附單元54之吸附墊547而保持基板SB之剝離部位PR後,進一步推進剝離。於此種剝離階段中,第3吸附單元53及吸附墊537係分別作為本發明之「上游側剝離器件」及「上游側吸附部」而發揮功能,並且第4吸附單元54及吸附墊547係分別作為本發明之「下游側剝離器件」及「下游側吸附部」而發揮功能。 In addition, after the peeling is performed on the adsorbed portion SR (see FIG. 11B) of the substrate SB by the adsorption pad 537 of the third adsorption unit 53, the peeling is performed on the downstream side of the adsorption pad 537. After the adsorption pad 547 of the fourth adsorption unit 54 holds the peeling portion PR of the substrate SB, the peeling is further promoted. In the peeling stage, the third adsorption unit 53 and the adsorption pad 537 function as the "upstream side separation device" and the "upstream side adsorption unit" of the present invention, respectively, and the fourth adsorption unit 54 and the adsorption pad 547 are used. Each of the functions is a "downstream side peeling device" and a "downstream side adsorption unit" of the present invention.

如上所述,伴隨剝離之推進而依次改變基板SB之保持部位,藉此可確實地實現基板SB之保持,並且容易地維持剝離後之基板SB之姿勢。而且,可如上所述般一面賦予穩定之剝離力一面推進剝離,因此亦防止圖案之損傷。又,根據基板SB之尺寸而配置吸附單元,藉此亦可靈活地對應於基板SB之大型化。 As described above, the holding portion of the substrate SB is sequentially changed in accordance with the advancement of the peeling, whereby the holding of the substrate SB can be surely achieved, and the posture of the substrate SB after peeling can be easily maintained. Further, since the peeling can be promoted while imparting a stable peeling force as described above, the pattern is also prevented from being damaged. Further, by arranging the adsorption unit in accordance with the size of the substrate SB, it is also possible to flexibly correspond to the enlargement of the substrate SB.

又,上述剝離部位PR係已自包覆層BL剝離之區域,於剝離之推進中重新吸附基板SB之第2至第4吸附單元52~54係與剝離部位PR抵接,故不存在因該情形時之吸附而劃傷轉印於基板SB之圖案之情形。 Further, the peeling portion PR is a region which has been peeled off from the coating layer BL, and the second to fourth adsorption units 52 to 54 which re-adsorb the substrate SB during the peeling progress are in contact with the peeling portion PR, so there is no such In the case of the case, the pattern transferred to the substrate SB is scratched by adsorption.

又,使延伸設置於與剝離推進方向Y正交之X方向之剝離輥340抵接於基板SB,從而一面使剝離輥340以固定速度向剝離之推進方向移動,一面提拉基板SB。因此,可將剝離之推進速度保持為固定而良好地剝離基板SB與包覆層BL之間。 In addition, the peeling roller 340 extending in the X direction orthogonal to the peeling advance direction Y is brought into contact with the substrate SB, and the peeling roller 340 is moved at a fixed speed in the direction in which the peeling is pushed, and the substrate SB is pulled. Therefore, the peeling advancement speed can be kept constant and the between the substrate SB and the cladding layer BL can be peeled off favorably.

進而,第2至第4吸附單元52~54係藉由壓力計監控作為抵接確認兼用吸附部而發揮功能之吸附墊內之壓力,將表示壓力值之信號作為表示吸附墊相對於基板SB之反密接面之相對位置之位置資訊而輸出至控制單元70。而且,控制單元70係於基於吸附單元之下降中之壓 力值之變化而偵測該吸附墊向基板SB之抵接時,開始向作為保持專用吸附部而發揮功能之吸附墊之負壓供給。因此,獲得以下之作用效果。 Further, the second to fourth adsorption units 52 to 54 monitor the pressure in the adsorption pad functioning as the contact confirmation confirmation adsorption unit by the pressure gauge, and the signal indicating the pressure value is used as the adsorption pad relative to the substrate SB. The position information of the relative position of the anti-closed surface is output to the control unit 70. Moreover, the control unit 70 is based on the pressure in the drop based on the adsorption unit When the change in the force value is detected and the contact of the adsorption pad against the substrate SB is detected, the supply of the negative pressure to the adsorption pad functioning as the dedicated adsorption portion is started. Therefore, the following effects are obtained.

如上所述,於在藉由作為上游側吸附部而發揮功能之吸附墊保持基板SB之一部分(被吸附部位SR)之狀態下,使該吸附墊自水平平台部31向(+Z)方向移動而推進剝離之情形時,無法避免基板SB之翹曲。 而且,翹曲量係根據基板SB與包覆層BL之密接力或基板SB之剛性等而不同。因此,作為下游側吸附部而發揮功能之吸附墊與基板SB之剝離部位PR抵接之Z方向上的位置不固定,而根據密接力等條件發生變位。因此,本實施形態中,如上所述般監測吸附單元之下降中之壓力值、即執行監控步驟,基於壓力值之變化而準確地偵測吸附墊向剝離部位PR之抵接。而且,將該抵接偵測作為觸發器而開始對保持專用之吸附墊之負壓供給(調整步驟)。其結果,相當於下游側吸附部之吸附墊可始終於適當之時序吸附基板SB之剝離部位而穩定地進行剝離處理。而且,由於將使用於壓力監控之吸附墊限制為少數(於本實施形態中為25個中之3個),故可防止已吸附基板SB之吸附墊內之壓力大幅降低,從而可穩定地進行剝離處理。 As described above, the adsorption pad is moved from the horizontal land portion 31 to the (+Z) direction in a state in which one portion (the adsorbed portion SR) of the substrate SB is held by the adsorption pad functioning as the upstream adsorption portion. When the peeling is advanced, the warpage of the substrate SB cannot be avoided. Further, the amount of warpage differs depending on the adhesion between the substrate SB and the cladding layer BL, the rigidity of the substrate SB, and the like. Therefore, the position in the Z direction in which the adsorption pad functioning as the downstream side adsorption portion abuts on the separation portion PR of the substrate SB is not fixed, and is displaced according to conditions such as the adhesion force. Therefore, in the present embodiment, as described above, the pressure value in the lowering of the adsorption unit, that is, the monitoring step is monitored, and the abutment of the adsorption pad to the peeling portion PR is accurately detected based on the change in the pressure value. Then, the abutment detection is used as a trigger to start supply of negative pressure to the adsorption pad dedicated for holding (adjustment step). As a result, the adsorption pad corresponding to the downstream side adsorption unit can stably perform the peeling treatment by adsorbing the peeled portion of the substrate SB at an appropriate timing. Further, since the adsorption pad used for pressure monitoring is limited to a few (three of the 25 in the present embodiment), the pressure in the adsorption pad of the adsorbed substrate SB can be prevented from being greatly lowered, so that the adsorption can be stably performed. Stripping treatment.

B.第2實施形態 B. Second embodiment

圖12A至圖12D係表示本發明之剝離裝置之第2實施形態之圖。該第2實施形態與第1實施形態存在較大差異之方面係作為抵接確認兼用吸附部而發揮功能之吸附墊設置於作為保持專用吸附部而發揮功能之吸附墊的下游側之方面,其他構成係基本上與第1實施形態相同。因此,以下以差異點為中心進行說明,對相同之構成標示相同之符號而省略說明。 12A to 12D are views showing a second embodiment of the peeling device of the present invention. In the second embodiment, the adsorption pad that functions as the contact confirmation and the adsorption unit is provided on the downstream side of the adsorption pad that functions as the retention-only adsorption unit, and the other is different from the first embodiment. The configuration is basically the same as that of the first embodiment. In the following description, the same reference numerals will be given to the same components, and the description thereof will be omitted.

第2實施形態之吸附單元52~54之各者係與吸附單元51相同地,不僅25個吸附墊作為保持專用吸附部而排列於X方向,而且2個吸附 墊設置為抵接確認兼用吸附部。又,吸附單元52~54係可分別獨立地切換藉由負壓供給部528、538、548而向吸附墊之負壓供給及負壓供給停止。該等負壓供給部528、538、548具有相同之構成。因此,以下對負壓供給部528之構成進行說明,對剩餘之負壓供給部538、548標示相同符號而省略構成說明。 In the same manner as the adsorption unit 51, each of the adsorption units 52 to 54 of the second embodiment has not only 25 adsorption pads arranged in the X direction as the retention-only adsorption portion but also two adsorptions. The pad is set to abut the confirmation and use the adsorption portion. Further, the adsorption units 52 to 54 can independently switch the supply of the negative pressure to the suction pad and the supply of the negative pressure by the negative pressure supply units 528, 538, and 548, respectively. The negative pressure supply units 528, 538, and 548 have the same configuration. Therefore, the configuration of the negative pressure supply unit 528 will be described below, and the remaining negative pressure supply units 538 and 548 are denoted by the same reference numerals, and the description of the configuration will be omitted.

吸附單元52具有排列於X方向之25個保持專用之吸附墊527、及於上述吸附墊行之下游側配置於(-X)側及(+X)側之2個抵接確認兼用之吸附墊527z1、527z2。該等吸附墊中之位於上游側之25個保持專用吸附墊527係與吸附單元51之吸附墊517相同地,自(-X)方向側向(+X)方向側分為8個吸附墊、9個吸附墊、8個吸附墊之3個吸附墊群組。 又,負壓供給部528具有3個歧管5281~5283,歧管5281係與構成(+X)側之吸附墊群組之8個吸附墊527連接,歧管5182係與構成中央之吸附墊群組之9個吸附墊527連接,進而歧管5283係與構成(-X)側之吸附墊群組之8個吸附墊527連接。 The adsorption unit 52 has 25 adsorption pads 527 which are arranged in the X direction and two adsorption pads which are disposed on the (-X) side and the (+X) side on the downstream side of the adsorption pad row. 527z1, 527z2. The 25 holding dedicated adsorption pads 527 on the upstream side of the adsorption pads are the same as the adsorption pads 517 of the adsorption unit 51, and are divided into 8 adsorption pads from the (X) direction side (+X) direction side. 9 adsorption pad groups and 3 adsorption pad groups of 8 adsorption pads. Further, the negative pressure supply unit 528 has three manifolds 5281 to 5283, and the manifold 5281 is connected to eight adsorption pads 527 constituting the adsorption pad group on the (+X) side, and the manifold 5182 is connected to the adsorption pad constituting the center. The nine adsorption pads 527 of the group are connected, and the manifold 5283 is connected to the eight adsorption pads 527 constituting the adsorption pad group on the (-X) side.

各歧管5281~5283係經由控制閥V521而連接於負壓產生部704。 因此,若根據來自控制單元70之閥控制部703之打開指令而控制閥V521打開,則經由歧管5281~5283而對保持專用吸附墊527賦予負壓。相反地,根據來自閥控制部703之關閉指令而控制閥V521關閉,藉此對保持專用吸附墊527之負壓供給停止。如上所述,本實施形態中,控制閥V521作為切換對吸附墊527之負壓供給、及負壓供給停止之第1切換部而發揮功能,可同時對保持專用吸附墊527供給負壓,又,可同時停止負壓供給。 Each of the manifolds 5281 to 5283 is connected to the negative pressure generating unit 704 via a control valve V521. Therefore, when the control valve V521 is opened in response to an opening command from the valve control unit 703 of the control unit 70, a negative pressure is applied to the holding dedicated suction pad 527 via the manifolds 5281 to 5283. Conversely, the control valve V521 is closed in accordance with the closing command from the valve control unit 703, whereby the supply of the negative pressure holding the dedicated suction pad 527 is stopped. As described above, in the present embodiment, the control valve V521 functions as a first switching unit that switches the supply of the negative pressure to the adsorption pad 527 and the supply of the negative pressure, and can supply the negative pressure to the holding dedicated adsorption pad 527 at the same time. , can stop the negative pressure supply at the same time.

又,抵接確認用吸附墊527z1、527z2係藉由連結構件529而分別與(+X)側保持專用吸附墊527及(-X)側保持專用吸附墊527連結,與吸附墊527一體地向Z方向移動自如。再者,第2實施形態中,於下游側設置有2個抵接確認用吸附墊527z1、527z2,抵接確認用吸附墊之個 數為任意而並不限定於「2」,但就抑制負壓變動之觀點而言,較佳為設定為少於保持專用吸附墊之個數之個數。 In addition, the contact-recognition adsorption pads 527z1 and 527z2 are connected to the (+X)-side holding dedicated adsorption pad 527 and the (-X)-side holding dedicated adsorption pad 527 by the connection member 529, and are integrally formed with the adsorption pad 527. The Z direction moves freely. In addition, in the second embodiment, two contact-adjusting adsorption pads 527z1 and 527z2 are provided on the downstream side, and one of the suction-adjusting adsorption pads is provided. The number is arbitrary and is not limited to "2". However, from the viewpoint of suppressing the variation of the negative pressure, it is preferably set to be smaller than the number of the dedicated adsorption pads.

又,負壓供給部528係除上述控制閥V521以外具有控制閥V522,抵接確認用吸附墊527z1、527z2經由控制閥V522而連接於負壓產生部704。因此,若根據來自控制單元70之閥控制部703之打開指令而控制閥V522打開,則對抵接確認用吸附墊527z1、527z2賦予負壓。相反地,根據來自閥控制部703之關閉指令而控制閥V522關閉,藉此對抵接確認用吸附墊527z1、527z2之負壓供給停止。如上所述,本實施形態中,控制閥V522作為切換對吸附墊527z1、527z2之負壓供給、及負壓供給停止之第2切換部而發揮功能,可同時對抵接確認用吸附墊527z1、527z2供給負壓,又,可同時停止負壓供給。 Further, the negative pressure supply unit 528 includes a control valve V522 in addition to the control valve V521, and the contact confirmation adsorption pads 527z1 and 527z2 are connected to the negative pressure generation unit 704 via the control valve V522. Therefore, when the control valve V522 is opened in response to an opening command from the valve control unit 703 of the control unit 70, a negative pressure is applied to the contact confirmation suction pads 527z1 and 527z2. On the other hand, the control valve V522 is closed in response to the closing command from the valve control unit 703, whereby the supply of the negative pressure of the contact confirmation suction pads 527z1 and 527z2 is stopped. As described above, in the present embodiment, the control valve V522 functions as a second switching unit that switches the supply of the negative pressure to the adsorption pads 527z1 and 527z2 and the supply of the negative pressure, and can simultaneously contact the contact adsorption pad 527z1. The 527z2 supplies a negative pressure, and at the same time, the negative pressure supply can be stopped at the same time.

於如上所述般構成之第2實施形態中,與第1實施形態相同地,亦於藉由吸附墊517吸附保持基板SB之上表面,並且使剝離輥340於其(+Y)側鄰接位置抵接於基板SB之上表面,進而使推壓構件331下降而推壓包覆層BL端部後,開始第1吸附單元51之上升,並且與此同步而使剝離輥340向(+Y)方向移動。藉此,保持基板SB之(-Y)側端部(被吸附部SR)之第1吸附單元51上升,藉此提拉基板SB之(-Y)側端部而與包覆層BL之剝離向(+Y)方向推進。 In the second embodiment, which is configured as described above, in the same manner as in the first embodiment, the upper surface of the substrate SB is adsorbed and held by the adsorption pad 517, and the peeling roller 340 is adjacent to the (+Y) side. After the pressing member 331 is lowered and the pressing member 331 is lowered, the first adsorption unit 51 is raised, and the peeling roller 340 is turned (+Y) in synchronization with this. Move in direction. Thereby, the first adsorption unit 51 that holds the (-Y)-side end portion (the adsorbed portion SR) of the substrate SB is raised, thereby pulling off the (-Y)-side end portion of the substrate SB and peeling off from the coating layer BL. Advance in the direction of (+Y).

而且,若剝離輥340通過第2吸附位置,則伴隨第2吸附單元52之下降,根據來自閥控制部703之指令僅打開控制閥V522而自負壓產生部704對抵接確認用吸附墊527z1、527z2供給負壓。再者,對保持專用吸附墊527之負壓供給仍處於停止狀態。 When the peeling roller 340 passes through the second adsorption position, the second adsorption unit 52 is lowered, and only the control valve V522 is opened in response to a command from the valve control unit 703, and the negative pressure generating unit 704 abuts the contact confirmation suction pad 527z1. 527z2 supplies negative pressure. Furthermore, the supply of the negative pressure to the dedicated adsorption pad 527 is still in a stopped state.

而且,若藉由在第2吸附單元52之下降中藉由壓力計5286而測量之抵接確認用吸附墊527z1、527z2內之壓力值的監測(監控步驟),偵測吸附墊527z1、527z2抵接於基板SB之剝離部位,則亦根據來自閥控制部703之指令打開控制閥V521而自負壓產生部704對保持專用吸附 墊527供給負壓(調整步驟)。藉此,藉由所有吸附墊527、527z1、527z2而吸附保持基板SB之剝離部位。 Further, when the pressure value in the adsorption detecting pads 527z1 and 527z2 is measured by the pressure gauge 5286 in the lowering of the second adsorption unit 52, the monitoring of the pressure values in the adsorption pads 527z1 and 527z2 (monitoring step) is detected, and the adsorption pads 527z1 and 527z2 are detected. When the peeling portion of the substrate SB is attached, the control valve V521 is opened in accordance with an instruction from the valve control unit 703, and the negative pressure generating portion 704 is held by the negative pressure generating portion 704. The pad 527 supplies a negative pressure (adjustment step). Thereby, the peeling portion of the substrate SB is adsorbed and held by all of the adsorption pads 527, 527z1, and 527z2.

於開始利用保持專用吸附墊527進行之基板SB之吸附後,將第2吸附單元52之移動變換為上升。藉此,剝離之推進速度仍然藉由剝離輥340而控制,並且用以剝離之基板SB之提拉之主體係自第1吸附單元51承接至第2吸附單元52。又,剝離後之基板SB係自僅利用第1吸附單元51之保持切換至利用第1吸附單元51與第2吸附單元52之保持,從而保持部位增加。再者,於各吸附單元51~54上升時,以剝離後之基板SB之姿勢大致成為平面之方式,維持各吸附單元51~54間之Z方向上之相對位置。 After the adsorption of the substrate SB by the dedicated adsorption pad 527 is started, the movement of the second adsorption unit 52 is changed to increase. Thereby, the advancement speed of the peeling is still controlled by the peeling roller 340, and the main system for pulling up the peeled substrate SB is taken from the first adsorption unit 51 to the second adsorption unit 52. Moreover, the substrate SB after peeling is switched from being held by the first adsorption unit 51 to being held by the first adsorption unit 51 and the second adsorption unit 52, and the holding portion is increased. In addition, when each of the adsorption units 51 to 54 is raised, the relative position in the Z direction between the adsorption units 51 to 54 is maintained so that the posture of the substrate SB after peeling is substantially flat.

繼而,於剝離輥340通過第3吸附單元53正下方之第3吸附位置之時間點,開始第3吸附單元53之下降,用以剝離之基板SB之提拉之主體自第2吸附單元52向第3吸附單元53移行。該第3吸附單元53之下降、吸附保持及基板提拉係與第2吸附單元之該等下降、吸附保持及基板提拉相同地進行。進而,於剝離輥340通過第4吸附位置後,第4吸附單元54下降,提拉基板SB。此時,亦執行與第2吸附單元52之下降、吸附保持及基板提拉相同之動作。 Then, when the peeling roller 340 passes through the third adsorption position immediately below the third adsorption unit 53, the third adsorption unit 53 is lowered, and the main body of the substrate SB for peeling is pulled from the second adsorption unit 52. The third adsorption unit 53 moves. The lowering, the adsorption holding, and the substrate pulling system of the third adsorption unit 53 are performed in the same manner as the lowering of the second adsorption unit, the adsorption holding, and the substrate pulling. Further, after the peeling roller 340 passes through the fourth adsorption position, the fourth adsorption unit 54 is lowered to pull up the substrate SB. At this time, the same operation as the lowering, the adsorption holding, and the substrate pulling of the second adsorption unit 52 is also performed.

以此方式,藉由第4吸附單元54而提拉基板SB,藉此基板SB之整體自包覆層BL拉離。此後,與第1實施形態相同地,向裝置外搬出經分離之基板SB及包覆層BL,藉此剝離處理完成。 In this way, the substrate SB is pulled up by the fourth adsorption unit 54, whereby the entire substrate SB is pulled away from the cladding layer BL. Thereafter, in the same manner as in the first embodiment, the separated substrate SB and the cladding layer BL are carried out outside the apparatus, whereby the peeling process is completed.

如上所述,第2實施形態中,例如於在一面藉由吸附墊517而保持基板SB一面推進剝離之期間,藉由包含抵接確認用吸附墊527z1、527z2設置於第2吸附單元52之吸附墊527保持基板SB之剝離部位後,進一步推進剝離。於該剝離階段,吸附墊517、527係分別作為本發明之「上游側吸附部」及「下游側吸附部」而發揮功能。又,繼上述剝離之後,於在一面藉由吸附墊527而保持基板SB一面推進剝離之期 間,藉由位於吸附墊527之下游側之吸附墊537(包含吸附墊537z1、537z2)保持基板SB之剝離部位後,進一步推進剝離。於該剝離階段,吸附墊527係作為本發明之「上游側吸附部」而發揮功能,吸附墊537係作為本發明之「下游側吸附部」而發揮功能。進而,繼上述剝離之後,於在一面藉由吸附墊537而保持基板SB一面推進剝離之期間,藉由位於吸附墊537之下游側之吸附墊547(包含吸附墊547z1、547z2)保持基板SB之剝離部位後,進一步推進剝離。於該剝離階段,吸附墊537係作為本發明之「上游側吸附部」而發揮功能,吸附墊547係作為本發明之「下游側吸附部」而發揮功能。因此,第2實施形態係發揮與第1實施形態相同之作用效果。 As described above, in the second embodiment, for example, during the period in which the substrate SB is held while being held by the adsorption pad 517, the adsorption is provided in the second adsorption unit 52 by the adsorption-recognition adsorption pads 527z1 and 527z2. After the pad 527 holds the peeled portion of the substrate SB, the peeling is further promoted. In the peeling stage, the adsorption pads 517 and 527 function as the "upstream side adsorption unit" and the "downstream side adsorption unit" of the present invention, respectively. Further, after the peeling, the substrate SB is held while being held by the adsorption pad 527, and the peeling is advanced. In the meantime, the peeling portion of the substrate SB is held by the adsorption pad 537 (including the adsorption pads 537z1 and 537z2) on the downstream side of the adsorption pad 527, and the peeling is further promoted. In the peeling stage, the adsorption pad 527 functions as the "upstream adsorption portion" of the present invention, and the adsorption pad 537 functions as the "downstream adsorption portion" of the present invention. Further, after the peeling is continued, the substrate SB is held by the adsorption pad 547 (including the adsorption pads 547z1 and 547z2) on the downstream side of the adsorption pad 537 while the substrate SB is being held while being held by the adsorption pad 537. After the peeling site, the peeling is further advanced. In the peeling stage, the adsorption pad 537 functions as the "upstream adsorption portion" of the present invention, and the adsorption pad 547 functions as the "downstream adsorption portion" of the present invention. Therefore, the second embodiment exhibits the same operational effects as those of the first embodiment.

C.第3實施形態 C. Third embodiment

圖13A至圖13D係表示本發明之剝離裝置之第3實施形態之圖。該第3實施形態與第1實施形態或第2實施形態存在較大差異之方面在於,表示吸附墊相對於基板SB之反密接面之剝離部位PR(圖14、圖15)之相對位置之位置資訊之獲取態樣。即,上述第1實施形態及第2實施形態中,監控作為抵接確認兼用吸附部而發揮功能之吸附墊內之壓力,將表示壓力值之信號作為表示吸附墊相對於基板SB之反密接面之相對位置之位置資訊而輸出至控制單元70。與此相對,第3實施形態之剝離裝置中,藉由雷射位移計監控吸附墊與基板SB之剝離部位PR之距離,將表示所測量到之距離之信號作為上述位置資訊而輸出至控制單元70。以下,一面參照圖13,一面對第3實施形態之剝離裝置之特徵性之構成進行說明,對與第1實施形態相同之構成標示相同之符號而省略說明。 13A to 13D are views showing a third embodiment of the peeling device of the present invention. The third embodiment differs greatly from the first embodiment or the second embodiment in that the position of the opposite position of the peeling portion PR (Figs. 14 and 15) of the suction pad with respect to the back surface of the substrate SB is shown. Information acquisition. In other words, in the first embodiment and the second embodiment, the pressure in the adsorption pad functioning as the contact-recognition-use adsorption unit is monitored, and the signal indicating the pressure value is used as the anti-adhesion surface of the adsorption pad with respect to the substrate SB. The position information of the relative position is output to the control unit 70. On the other hand, in the peeling apparatus of the third embodiment, the distance between the adsorption pad and the peeling portion PR of the substrate SB is monitored by the laser displacement meter, and a signal indicating the measured distance is output as the position information to the control unit. 70. In the following, the characteristic configuration of the peeling device of the third embodiment will be described with reference to FIG. 13 and the same components as those of the first embodiment will be denoted by the same reference numerals and will not be described.

於第3實施形態中,吸附單元51係與第1實施形態及第2實施形態之該吸附單元51相同。另一方面,吸附單元52~54之各者係與吸附單元51相同地,不僅25個吸附墊排列於X方向,而且設置有1台雷射位 移計530。又,吸附單元52~54可分別藉由負壓供給部528、538、548而獨立地切換對吸附墊之負壓供給及負壓供給停止。該等負壓供給部528、538、548具有相同之構成。因此,以下對負壓供給部528之構成進行說明,對剩餘之負壓供給部538、548標示相同符號而省略構成之說明。 In the third embodiment, the adsorption unit 51 is the same as the adsorption unit 51 of the first embodiment and the second embodiment. On the other hand, each of the adsorption units 52 to 54 is the same as the adsorption unit 51, and not only 25 adsorption pads are arranged in the X direction, but also one laser position is provided. Shift 530. Further, the adsorption units 52 to 54 can independently switch the supply of the negative pressure to the suction pad and the supply of the negative pressure by the negative pressure supply units 528, 538, and 548, respectively. The negative pressure supply units 528, 538, and 548 have the same configuration. Therefore, the configuration of the negative pressure supply unit 528 will be described below, and the remaining negative pressure supply units 538 and 548 are denoted by the same reference numerals, and the description thereof will be omitted.

吸附單元52具有排列於X方向之25個保持專用之吸附墊527、及配置於上述吸附墊行之下游側之雷射位移計530。25個吸附墊527係作為上述吸附專用吸附部而發揮功能者,與吸附單元51之吸附墊517相同地,自(-X)方向側向(+X)方向側分為8個吸附墊、9個吸附墊、8個吸附墊之3個吸附墊群組。又,負壓供給部528具有3個歧管5281~5283,歧管5281係與構成(-X)側之吸附墊群組之8個吸附墊527連接,歧管5182係與構成中央之吸附墊群組之9個吸附墊527連接,進而歧管5283係與構成(+X)側之吸附墊群組之8個吸附墊527連接。 The adsorption unit 52 has 25 adsorption-only adsorption pads 527 arranged in the X direction and a laser displacement meter 530 disposed on the downstream side of the adsorption pad row. The 25 adsorption pads 527 function as the adsorption-only adsorption unit. Similarly to the adsorption pad 517 of the adsorption unit 51, the three adsorption pad groups are divided into eight adsorption pads, nine adsorption pads, and eight adsorption pads from the (-X) direction side (+X) direction side. . Further, the negative pressure supply unit 528 has three manifolds 5281 to 5283, and the manifold 5281 is connected to eight adsorption pads 527 constituting the adsorption pad group on the (-X) side, and the manifold 5182 is connected to the adsorption pad constituting the center. The nine adsorption pads 527 of the group are connected, and the manifold 5283 is connected to the eight adsorption pads 527 constituting the adsorption pad group on the (+X) side.

各歧管5281~5283係經由控制閥V52而連接於負壓產生部704。 因此,若根據來自控制單元70之閥控制部703之打開指令而控制閥V52打開,則經由歧管5281~5283而對所有吸附墊527賦予負壓。相反地,根據來自閥控制部703之關閉指令而控制閥V52關閉,藉此對所有吸附墊527之負壓供給停止。如上所述,本實施形態係控制閥V52作為切換對吸附墊527之負壓供給、及負壓供給停止之切換部而發揮功能,可同時對吸附墊527供給負壓,又,可同時停止負壓供給。 Each of the manifolds 5281 to 5283 is connected to the negative pressure generating unit 704 via a control valve V52. Therefore, when the control valve V52 is opened in response to the opening command from the valve control unit 703 of the control unit 70, a negative pressure is applied to all of the adsorption pads 527 via the manifolds 5281 to 5283. Conversely, the control valve V52 is closed in accordance with the closing command from the valve control unit 703, whereby the supply of the negative pressure to all of the adsorption pads 527 is stopped. As described above, in the present embodiment, the control valve V52 functions as a switching unit that switches the supply of the negative pressure to the adsorption pad 527 and the supply of the negative pressure, and can simultaneously supply the negative pressure to the adsorption pad 527, and can simultaneously stop the negative pressure. Pressure supply.

雷射位移計530係藉由連結構件529而與25個吸附墊中之位於X方向上之中央部之吸附墊527連結,可與吸附墊527一體地向Z方向移動。因此,雷射位移計530係測量吸附墊527與基板SB之剝離部位PR之距離,將與該距離相關之信號作為位置資訊而輸出至控制單元70。如上所述,雷射位移計530係相當於本發明之「監控器件」及「距離 測量部」之一例,但雷射位移計530之個數及配設位置為任意而並不限定於此。又,只要為可測量上述距離者,則亦可使用除雷射位移計以外之距離測量部,例如亦可自平台30之(+X)側或者(-X)側總括地拍攝吸附墊527及基板SB,根據該圖像而求出上述距離。 The laser displacement meter 530 is coupled to the adsorption pad 527 at the central portion of the 25 adsorption pads in the X direction by the connection member 529, and is movable integrally with the adsorption pad 527 in the Z direction. Therefore, the laser displacement meter 530 measures the distance between the adsorption pad 527 and the peeling portion PR of the substrate SB, and outputs a signal related to the distance to the control unit 70 as position information. As described above, the laser displacement meter 530 is equivalent to the "monitoring device" and "distance" of the present invention. As an example of the measuring unit, the number and arrangement position of the laser displacement meter 530 are arbitrary, and are not limited thereto. Further, as long as the distance can be measured, a distance measuring unit other than the laser displacement meter can be used. For example, the adsorption pad 527 can be collectively photographed from the (+X) side or the (-X) side of the stage 30. The substrate SB obtains the above distance from the image.

其次,一面參照圖14及圖15,一面對如上所述般構成之第3實施形態之剝離裝置之動作進行說明。圖14及圖15係模式性地表示第3實施形態中之處理中之各階段之各部的位置關係與負壓供給部之負壓供給狀態之圖。於如上所述般構成之第3實施形態中,與第1實施形態相同地,亦於將基板SB之(-Y)側端部作為被吸附部位SR而藉由吸附墊517吸附保持,並且使剝離輥340於其(+Y)側鄰接位置抵接於基板SB之上表面,進而使推壓構件331下降而推壓包覆層BL端部後,開始第1吸附單元51之上升,並且與此同步而使剝離輥340向(+Y)方向移動。 藉此,保持基板SB之(-Y)側端部(被吸附部位SR)之第1吸附單元51上升,藉此提拉基板SB而與包覆層BL之剝離向(+Y)方向推進。 Next, an operation of the peeling apparatus of the third embodiment configured as described above will be described with reference to Figs. 14 and 15 . FIG. 14 and FIG. 15 are diagrams schematically showing the positional relationship of each unit in each stage of the process in the third embodiment and the negative pressure supply state of the negative pressure supply unit. In the third embodiment, which is configured as described above, in the same manner as in the first embodiment, the (-Y) side end portion of the substrate SB is adsorbed and held by the adsorption pad 517 as the adsorbed portion SR, and The peeling roller 340 abuts on the upper surface of the substrate SB at the adjacent position on the (+Y) side, and further lowers the pressing member 331 to press the end portion of the coating layer BL, and then starts the rise of the first adsorption unit 51, and This synchronization causes the peeling roller 340 to move in the (+Y) direction. Thereby, the first adsorption unit 51 that holds the (-Y) side end portion (the adsorbed portion SR) of the substrate SB is raised, whereby the substrate SB is pulled and the peeling of the coating layer BL is advanced in the (+Y) direction.

而且,如圖14所示,若剝離輥340通過第2吸附位置,則伴隨第2吸附單元52之下降,開始藉由雷射位移計530而測量之距離(吸附墊527與基板SB之剝離部位PR之距離)之監控。再者,於該階段,對所有吸附墊527之負壓供給係仍處於停止狀態。 Further, as shown in FIG. 14, when the peeling roller 340 passes through the second adsorption position, the distance measured by the laser displacement meter 530 is started as the second adsorption unit 52 is lowered (the peeling portion of the adsorption pad 527 and the substrate SB) Monitoring of the distance of PR). Furthermore, at this stage, the negative pressure supply system for all of the adsorption pads 527 is still in a stopped state.

而且,若於第2吸附單元52之下降中偵測到上述距離達到閾值以下而吸附墊527抵接於基板SB之剝離部位PR,則如圖15所示,根據來自閥控制部703之指令打開控制閥V52而亦自負壓產生部704對保持專用吸附墊527供給負壓。藉此,藉由所有吸附墊527吸附保持基板SB之剝離部位PR。 Further, when the distance from the second adsorption unit 52 is detected to be lower than the threshold value and the adsorption pad 527 abuts on the peeling portion PR of the substrate SB, as shown in FIG. 15, it is opened in accordance with an instruction from the valve control unit 703. The control valve V52 is also supplied with a negative pressure from the holding dedicated suction pad 527 from the negative pressure generating portion 704. Thereby, the peeling site PR of the substrate SB is adsorbed by all the adsorption pads 527.

於開始利用吸附墊527進行之基板SB之吸附後,將第2吸附單元52之移動變換為上升。然後,與第1實施形態相同地,於剝離輥340通過第3吸附單元53正下方之第3吸附位置之時間點,開始第3吸附單元 53之下降,用以剝離之基板SB之提拉之主體自第2吸附單元52向第3吸附單元53移行。該第3吸附單元53之下降、吸附保持及基板提拉係與第2吸附單元之該等下降、吸附保持及基板提拉相同地進行。進而,於剝離輥340通過第4吸附位置後,第4吸附單元54下降,提拉基板SB。此時,亦執行與第2吸附單元52之下降、吸附保持及基板提拉相同之動作。 After the adsorption of the substrate SB by the adsorption pad 527 is started, the movement of the second adsorption unit 52 is changed to increase. Then, in the same manner as in the first embodiment, the third adsorption unit is started at the time when the peeling roller 340 passes through the third adsorption position immediately below the third adsorption unit 53. When the 53 is lowered, the main body of the lifted substrate SB is moved from the second adsorption unit 52 to the third adsorption unit 53. The lowering, the adsorption holding, and the substrate pulling system of the third adsorption unit 53 are performed in the same manner as the lowering of the second adsorption unit, the adsorption holding, and the substrate pulling. Further, after the peeling roller 340 passes through the fourth adsorption position, the fourth adsorption unit 54 is lowered to pull up the substrate SB. At this time, the same operation as the lowering, the adsorption holding, and the substrate pulling of the second adsorption unit 52 is also performed.

藉由第4吸附單元54而提拉基板SB,藉此基板SB之整體自包覆層BL拉離。此後,與第1實施形態相同地,向裝置外搬出經分離之基板SB及包覆層BL,藉此剝離處理完成。 The substrate SB is pulled up by the fourth adsorption unit 54, whereby the entire substrate SB is pulled away from the cladding layer BL. Thereafter, in the same manner as in the first embodiment, the separated substrate SB and the cladding layer BL are carried out outside the apparatus, whereby the peeling process is completed.

如上所述,第3實施形態中,例如於在一面藉由吸附墊517而保持基板SB一面推進剝離之期間,藉由設置於第2吸附單元52之吸附墊527保持基板SB之剝離部位後,進一步推進剝離。於該剝離階段,吸附墊517、527係分別作為本發明之「上游側吸附部」及「下游側吸附部」而發揮功能。又,繼上述剝離之後,於在一面藉由吸附墊527而保持基板SB一面推進剝離之期間,藉由位於吸附墊527之下游側之吸附墊537而保持基板SB之剝離部位後,進一步推進剝離。於該剝離階段,吸附墊527係作為本發明之「上游側吸附部」而發揮功能,吸附墊537係作為本發明之「下游側吸附部」而發揮功能。進而,繼上述剝離之後,於在一面藉由吸附墊537而保持基板SB一面推進剝離之期間,藉由位於吸附墊537之下游側之吸附墊547而保持基板SB之剝離部位後,進一步推進剝離。於該剝離階段,吸附墊537係作為本發明之「上游側吸附部」而發揮功能,吸附墊547係作為本發明之「下游側吸附部」而發揮功能。因此,第3實施形態係發揮與第1實施形態相同之作用效果。 As described above, in the third embodiment, for example, while the substrate SB is held while being held by the adsorption pad 517, the peeling portion of the substrate SB is held by the adsorption pad 527 provided in the second adsorption unit 52. Further promote the divestiture. In the peeling stage, the adsorption pads 517 and 527 function as the "upstream side adsorption unit" and the "downstream side adsorption unit" of the present invention, respectively. In addition, after the peeling is continued while the substrate SB is held by the adsorption pad 527, the peeling portion of the substrate SB is held by the adsorption pad 537 located on the downstream side of the adsorption pad 527, and the peeling is further promoted. . In the peeling stage, the adsorption pad 527 functions as the "upstream adsorption portion" of the present invention, and the adsorption pad 537 functions as the "downstream adsorption portion" of the present invention. Further, after the peeling is continued while the substrate SB is held by the adsorption pad 537, the peeling portion of the substrate SB is held by the adsorption pad 547 located on the downstream side of the adsorption pad 537, and the peeling is further promoted. . In the peeling stage, the adsorption pad 537 functions as the "upstream adsorption portion" of the present invention, and the adsorption pad 547 functions as the "downstream adsorption portion" of the present invention. Therefore, the third embodiment exhibits the same operational effects as those of the first embodiment.

又,第3實施形態中,基於藉由雷射位移計530而測量到之距離,調整對吸附墊527、537、547之負壓供給之開始時序(調整步 驟)。因此,可避免吸附墊未抵接於基板SB之反密接面之狀態下之負壓供給,有效地抑制自負壓產生部704賦予至各吸附單元之負壓之值發生變動。 Further, in the third embodiment, the start timing of the supply of the negative pressure to the adsorption pads 527, 537, and 547 is adjusted based on the distance measured by the laser displacement meter 530 (adjustment step) Step). Therefore, the supply of the negative pressure in a state where the adsorption pad is not in contact with the anti-adhesion surface of the substrate SB can be avoided, and the value of the negative pressure applied to each adsorption unit by the negative pressure generating portion 704 can be effectively suppressed from fluctuating.

進而,上述第1實施形態至第3實施形態中,包覆層BL及基板SB分別相當於本發明之「第1板狀體」及「第2板狀體」之一例。 Further, in the first to third embodiments, the cladding layer BL and the substrate SB correspond to an example of the "first plate-shaped body" and the "second plate-shaped body" of the present invention, respectively.

D.其他 D. Other

再者,本發明並不限定於上述實施形態,只要不脫離其主旨,則可除上述者外進行各種變更。例如,上述實施形態係於平台30設置格子狀之吸附槽311、312而吸附保持包覆層BL,但吸附槽之形狀並不限定於此。例如,亦可設置環狀之吸附槽,又,亦可適當地配置供給負壓之吸附孔而吸附包覆層。 It is to be noted that the present invention is not limited to the above-described embodiments, and various modifications may be made in addition to the above without departing from the spirit and scope of the invention. For example, in the above embodiment, the grid 30 is provided with the lattice-shaped adsorption grooves 311 and 312, and the coating layer BL is adsorbed and held. However, the shape of the adsorption groove is not limited thereto. For example, an annular adsorption tank may be provided, and the adsorption hole for supplying a negative pressure may be appropriately disposed to adsorb the coating layer.

又,上述實施形態係藉由真空吸附而保持基板及包覆層,但保持之態樣並不限定於此。例如,亦可為藉由靜電或磁性吸附力而進行吸附保持者。特別是,對於保持基板之有效區域外之第1剝離器件,亦可藉由機械性地握持基板周緣部而保持,而不藉由吸附來保持。 Further, in the above embodiment, the substrate and the cladding layer are held by vacuum suction, but the aspect of the substrate is not limited thereto. For example, it is also possible to perform adsorption holding by electrostatic or magnetic adsorption. In particular, the first peeling device that holds the outside of the effective region of the substrate can be held by mechanically holding the peripheral edge portion of the substrate without being held by adsorption.

又,上述實施形態中,以將剝離後之基板SB之姿勢維持成接近平面之狀態之方式,控制各吸附單元51~54之上升而減少施加至基板SB之應力(stress),但基板SB之提拉之態樣並不限定於此。例如,亦可設為以剝離後之基板大致成為水平之方式使各吸附單元以固定高度停止、或者基板保持為如具有特定之曲率而彎曲之姿勢。該等係可藉由控制各吸附單元之上升之態樣而自由地設定。 Further, in the above-described embodiment, the rise of each of the adsorption units 51 to 54 is controlled to reduce the stress applied to the substrate SB so that the posture of the substrate SB after peeling is maintained close to the plane, but the substrate SB is The aspect of pulling is not limited to this. For example, the adsorption unit may be stopped at a fixed height such that the substrate after peeling is substantially horizontal, or the substrate may be held in a posture that is bent as having a specific curvature. These lines can be freely set by controlling the ascending state of each adsorption unit.

又,上述實施形態中,於基板SB之上部配置4個吸附單元而依次吸附基板SB,但吸附單元之數量為任意,而並不限定於此。若基板為大型,則使吸附單元變多即可,若為小型,則使吸附單元變少即可。 Further, in the above-described embodiment, four adsorption units are disposed on the upper portion of the substrate SB to sequentially adsorb the substrate SB. However, the number of adsorption units is arbitrary, and is not limited thereto. If the substrate is large, the number of adsorption units may be increased, and if it is small, the adsorption unit may be reduced.

又,上述實施形態中,使包覆層BL突出於錐形平台部32而保 持,藉由推壓構件331使包覆層BL彎曲而製作剝離之槽口,但如上所述之情形並非係必需之必要條件,例如亦可設為僅藉由第1吸附單元之提拉而開始剝離。於該情形時,無需於平台設置錐形。 Further, in the above embodiment, the cladding layer BL is protruded from the tapered land portion 32 to protect The pressing layer 338 is bent by the pressing member 331 to form a peeling notch. However, the above-described situation is not a necessary condition, and for example, it may be set only by the pulling of the first adsorption unit. Start peeling off. In this case, there is no need to set the taper on the platform.

本發明係可應用於使2片板狀體密接而轉印圖案等之圖案形成處理之剝離製程,除此之外,可相對於良好地剝離彼此密接之2片板狀體之各種目的而較佳地應用,而不限定於伴隨此種圖案轉印者。 The present invention can be applied to a peeling process in which two sheet-like bodies are closely adhered to a pattern forming process such as a transfer pattern, and the like, in addition to the various purposes of peeling off two plate-like bodies that are in close contact with each other, Good application, not limited to those who accompany such a pattern transfer.

30‧‧‧平台 30‧‧‧ platform

31‧‧‧水平平台部 31‧‧‧Horizontal Platform Division

32‧‧‧錐形平台部 32‧‧‧Conical Platform Division

51‧‧‧吸附單元 51‧‧‧Adsorption unit

52‧‧‧吸附單元 52‧‧‧Adsorption unit

53‧‧‧吸附單元 53‧‧‧Adsorption unit

54‧‧‧吸附單元 54‧‧‧Adsorption unit

310‧‧‧(水平平台部31之)上表面 310‧‧‧ (top of horizontal platform section 31) upper surface

320‧‧‧(錐形平台部32之)上表面 320‧‧‧ (of the tapered platform portion 32) upper surface

331‧‧‧推壓構件 331‧‧‧ Pushing members

340‧‧‧剝離輥 340‧‧‧ peeling roller

517‧‧‧吸附墊 517‧‧‧Adsorption pad

518‧‧‧負壓供給部 518‧‧‧Negative Pressure Supply Department

527‧‧‧吸附墊 527‧‧‧Adsorption pad

527a~527y‧‧‧吸附墊 527a~527y‧‧‧Adsorption pad

528‧‧‧負壓供給部 528‧‧‧Negative Pressure Supply Department

704‧‧‧負壓產生部 704‧‧‧ Negative Pressure Generation Department

5181‧‧‧歧管 5181‧‧‧Management

5182‧‧‧歧管 5182‧‧‧Management

5183‧‧‧歧管 5183‧‧‧Management

5184‧‧‧壓力計 5184‧‧‧ pressure gauge

5281‧‧‧歧管 5281‧‧‧Management

5282‧‧‧歧管 5282‧‧‧Management

5283‧‧‧歧管 5283‧‧‧Management

5284‧‧‧歧管 5284‧‧‧Management

5285‧‧‧壓力計 5285‧‧‧ pressure gauge

5286‧‧‧壓力計 5286‧‧‧ pressure gauge

BL‧‧‧包覆層 BL‧‧‧ coating

PR‧‧‧剝離部位 PR‧‧‧ peeling site

SB‧‧‧基板 SB‧‧‧ substrate

SR‧‧‧被吸附部位 SR‧‧‧Adsorbed parts

V51‧‧‧控制閥 V51‧‧‧ control valve

V521‧‧‧控制閥 V521‧‧‧ control valve

V522‧‧‧控制閥 V522‧‧‧Control valve

WK‧‧‧工件 WK‧‧‧ workpiece

X‧‧‧方向 X‧‧‧ direction

Y‧‧‧剝離推進方向 Y‧‧‧ peeling direction

Z‧‧‧方向 Z‧‧‧ direction

Claims (12)

一種剝離裝置,其係剝離彼此密接之第1板狀體與第2板狀體者,其特徵在於包括:保持器件,其保持上述第1板狀體;上游側剝離器件,其具有吸附保持上述第2板狀體之表面中之與密接於上述第1板狀體之面為相反側的反密接面之一部分之上游側吸附部,一面藉由上述上游側吸附部吸附上述第2板狀體,一面使上述上游側吸附部自上述保持器件離開而自上述第1板狀體剝離藉由上述上游側吸附部吸附之上述第2板狀體之被吸附部位,從而向剝離推進方向推進上述第2板狀體之剝離;下游側剝離器件,其具有於上述剝離推進方向上之上述被吸附部位之下游側,面向上述第2板狀體之上述反密接面設置之下游側吸附部,於使上述下游側吸附部向上述第2板狀體中之藉由上述上游側剝離器件剝離之剝離部位移動而吸附上述剝離部位之上述反密接面後,使上述下游側吸附部按照吸附有上述第2板狀體之狀態自上述保持器件離開而向上述剝離推進方向推進上述第2板狀體之剝離;監控器件,其監控上述下游側吸附部相對於上述第2板狀體之上述反密接面之相對位置;及控制器件,其基於藉由上述監控器件而獲得之與上述相對位置相關之位置資訊,對利用上述下游側吸附部進行之上述第2板狀體之吸附開始進行控制。 A peeling device for peeling off a first plate-shaped body and a second plate-shaped body that are in close contact with each other, comprising: a holding device that holds the first plate-shaped body; and an upstream side peeling device that has adsorption holding An upstream side adsorption portion of a portion of the surface of the second plate-shaped body that is in contact with the surface of the first plate-shaped body opposite to the first plate-shaped body, and the second plate-shaped body is adsorbed by the upstream adsorption portion When the upstream side adsorption unit is separated from the holding device, the adsorbed portion of the second plate-shaped body adsorbed by the upstream side adsorption unit is peeled off from the first plate-shaped body, and the first step is advanced in the peeling advancement direction. (2) peeling of the plate-shaped body; the downstream side peeling device having the downstream side of the adsorbed portion in the peeling advancing direction, and the downstream side adsorbing portion provided facing the anti-adhesion surface of the second plate-shaped body The downstream side adsorption unit moves the peeling portion peeled off by the upstream side peeling member in the second plate-shaped body to adsorb the back-contact surface of the peeling portion, and then causes the downstream side The attachment portion is separated from the holding member in a state in which the second plate-like body is adsorbed, and the peeling of the second plate-shaped body is advanced in the peeling advancement direction; and the monitoring device monitors the downstream side adsorption portion with respect to the second plate And a control device for the second plate-shaped body by the downstream side adsorption unit based on the position information related to the relative position obtained by the monitoring device Adsorption begins to be controlled. 如請求項1之剝離裝置,其中上述下游側剝離器件具有:第1吸附部及第2吸附部,其等作為上述下游側吸附部而發揮功能;第1切換部,其切換對上述第 1吸附部之負壓供給及負壓供給停止;及第2切換部,其切換對上述第2吸附部之負壓供給及負壓供給停止;且於上述第1吸附部及上述第2吸附部一體地接近上述剝離部位之期間,藉由上述第1切換部而停止對上述第1吸附部之負壓供給,另一方面,藉由上述第2切換部而對上述第2吸附部供給負壓,上述監控器件具有測量上述第2吸附部之壓力之壓力測量部,將藉由上述壓力測量部而測量到之壓力值作為上述位置資訊而輸出,上述控制器件係以如下方式控制上述第1切換部,即,根據上述第1吸附部及上述第2吸附部向上述剝離部位之移動中之上述壓力值之變化而開始對上述第1吸附部之負壓之供給。 The peeling device according to claim 1, wherein the downstream side peeling device has a first adsorption unit and a second adsorption unit, and functions as the downstream side adsorption unit; and the first switching unit switches to the first (1) the negative pressure supply and the negative pressure supply stop of the adsorption unit; and the second switching unit switches the supply of the negative pressure and the supply of the negative pressure to the second adsorption unit; and the first adsorption unit and the second adsorption unit During the period in which the peeling portion is integrally formed, the negative pressure supply to the first adsorption unit is stopped by the first switching unit, and the second pressure is supplied to the second adsorption unit by the second switching unit. The monitoring device includes a pressure measuring unit that measures the pressure of the second adsorption unit, and outputs a pressure value measured by the pressure measuring unit as the position information, and the control device controls the first switching as follows. In other words, the supply of the negative pressure to the first adsorption unit is started based on the change in the pressure value during the movement of the first adsorption unit and the second adsorption unit to the separation portion. 如請求項2之剝離裝置,其中上述第1吸附部及上述第2吸附部係排列於與上述剝離推進方向正交之上述第2板狀體之寬度方向。 The peeling device according to claim 2, wherein the first adsorption portion and the second adsorption portion are arranged in a width direction of the second plate-shaped body orthogonal to the peeling advancement direction. 如請求項3之剝離裝置,其中上述複數個下游側吸附部中之位於上述寬度方向之兩端及中央部之上述下游側吸附部為上述第2吸附部,剩餘之上述下游側吸附部為上述第1吸附部。 The peeling device according to claim 3, wherein the downstream side adsorption portion of the plurality of downstream side adsorption portions located at both ends and the central portion in the width direction is the second adsorption portion, and the remaining downstream adsorption portion is the The first adsorption unit. 如請求項2之剝離裝置,其中上述第2吸附部係配置於上述剝離推進方向上之上述第1吸附部之下游側。 The peeling device according to claim 2, wherein the second adsorption unit is disposed on a downstream side of the first adsorption unit in the peeling advancement direction. 如請求項5之剝離裝置,其中上述下游側剝離器件係作為上述下游側吸附部而具有排列於與上述剝離推進方向正交之上述第2板狀體之寬度方向之複數個上述第1吸附部、及個數少於上述第1吸附部之上述第2吸附部。 The peeling device according to claim 5, wherein the downstream side peeling device has a plurality of the first adsorption portions arranged in a width direction of the second plate-shaped body orthogonal to the peeling advance direction as the downstream side adsorption portion And the number of the second adsorption portions smaller than the first adsorption unit. 如請求項1之剝離裝置,其中 上述下游側剝離器件具有切換對上述下游側吸附部之負壓供給及負壓供給停止之下游側切換部,於上述下游側吸附部接近上述剝離部位之期間,停止對上述下游側吸附部之負壓供給,上述監控器件具有距離測量部,該距離測量部係測量上述下游側吸附部向上述剝離部位之移動中之上述第2板狀體之上述反密接面與上述下游側吸附部之距離而作為上述位置資訊,上述控制器件係以如下方式控制上述下游側切換部,即,於上述距離成為閾值之時間點,開始對上述下游側吸附部之負壓之供給。 The stripping device of claim 1, wherein The downstream side peeling device has a downstream side switching unit that switches the negative pressure supply and the negative pressure supply stop of the downstream side adsorption unit, and stops the negative side adsorption unit while the downstream side adsorption unit approaches the peeling portion. In the pressure supply, the monitoring device includes a distance measuring unit that measures a distance between the back-contact surface of the second plate-shaped body and the downstream-side adsorption portion in the movement of the downstream-side adsorption portion toward the peeling portion. As the position information, the control device controls the downstream side switching unit to start supply of the negative pressure to the downstream side adsorption unit at a time point when the distance becomes a threshold value. 如請求項7之剝離裝置,其中上述距離測量部係一面與上述下游側吸附部一體地移動一面測量上述距離之位移計。 The peeling device according to claim 7, wherein the distance measuring unit moves the gauge to measure the distance while moving integrally with the downstream side adsorption unit. 如請求項1至8中任一項之剝離裝置,其中上述被吸附部位係上述第2板狀體之上述反密接面中之上述剝離推進方向上之上述第2板狀體的上游端部,上述上游側剝離器件具有切換對上述上游側吸附部之負壓供給及負壓供給停止之上游側切換部,上述上游側切換部係於上述上游側吸附部向上述被吸附部位移動之期間,停止對上述上游側吸附部之負壓供給,若上述上游側吸附部抵接於上述被吸附部位,則開始對上述上游側吸附部之負壓供給。 The peeling device according to any one of claims 1 to 8, wherein the adsorbed portion is an upstream end portion of the second plate-shaped body in the peeling advancing direction of the anti-adhesion surface of the second plate-shaped body, The upstream side peeling device has an upstream side switching unit that switches the negative pressure supply and the negative pressure supply stop of the upstream side adsorption unit, and the upstream side switching unit stops while the upstream side adsorption unit moves to the adsorbed portion. When the upstream side adsorption unit abuts against the adsorbed portion, the negative pressure supply to the upstream side adsorption unit starts the supply of the negative pressure to the upstream side adsorption unit. 一種剝離方法,其係剝離彼此密接之第1板狀體與第2板狀體者,其特徵在於包括如下步驟:保持步驟,其係藉由保持器件而保持上述第1板狀體;第1剝離步驟,其係藉由上游側吸附部吸附上述第2板狀體之表面中之與密接於上述第1板狀體之面為相反側之反密接面之一 部分、即吸附上述第2板狀體,並且使上述上游側吸附部自上述保持器件離開而使藉由上述上游側吸附部吸附之上述第2板狀體之被吸附部位自上述第1板狀體剝離,從而向剝離推進方向推進上述第2板狀體之剝離;移動步驟,其係使下游側吸附部於上述剝離推進方向上之上述被吸附部位之下游側,向上述第2板狀體中之因上述上游側吸附部自上述保持器件之離開而剝離之剝離部位的上述反密接面移動;監控步驟,其係於上述剝離部位向上述反密接面移動中,監控上述下游側吸附部相對於上述第2板狀體之上述反密接面之相對位置;調整步驟,其係基於與上述相對位置相關之位置資訊,調整開始利用上述下游側吸附部進行之上述第2板狀體之吸附之時序;及第2剝離步驟,其係與利用上述下游側吸附部進行之上述第2板狀體之吸附開始同時或於吸附開始後,按照藉由上述下游側吸附部而吸附上述剝離部位之上述反密接面之狀態使上述下游側吸附部自上述保持器件離開而向上述剝離推進方向推進上述第2板狀體之剝離。 A peeling method for peeling off the first plate-shaped body and the second plate-shaped body which are in close contact with each other, comprising the step of holding the first plate-shaped body by holding the device; a peeling step of adsorbing one of the surfaces of the second plate-shaped body on the opposite side of the surface of the second plate-shaped body that is in contact with the first plate-shaped body by the upstream side adsorption portion a portion in which the second plate-shaped body is adsorbed, and the upstream adsorption portion is separated from the holding device, and the adsorbed portion of the second plate-shaped body adsorbed by the upstream adsorption portion is formed from the first plate shape. The body is peeled off to advance the peeling of the second plate-shaped body in the peeling advancement direction, and the moving step is such that the downstream side adsorbing portion is on the downstream side of the adsorbed portion in the peeling advancing direction to the second plate-shaped body The movement of the anti-adhesion surface of the peeling portion where the upstream side adsorption portion is separated from the holding device, and the monitoring step of monitoring the downstream side adsorption portion relative to the peeling portion moving toward the anti-adhesion surface a relative position of the anti-adhesive surface of the second plate-shaped body; and an adjustment step of adjusting the adsorption of the second plate-shaped body by the downstream side adsorption unit based on position information related to the relative position And a second peeling step of pressing the adsorption of the second plate-shaped body by the downstream side adsorption unit simultaneously or after the start of adsorption The downstream portion by suction to attract the anti-adhesion state of the release surface portion of the downstream side of the adsorption section so that the holding means away from said propelling direction of the release promoting the release of the second plate-like member. 如請求項10之剝離方法,其中作為上述下游側吸附部,設置有第1吸附部及第2吸附部,上述移動步驟係停止對上述第1吸附部之負壓供給,另一方面,對上述第2吸附部供給負壓,上述監控步驟係測量上述第2吸附部之壓力並將壓力值作為上述位置資訊而輸出,上述調整步驟係根據上述第1吸附部及上述第2吸附部向上述 剝離部位之移動中之上述壓力值之變化而開始對上述第1吸附部之負壓之供給。 The peeling method of claim 10, wherein the downstream side adsorption unit is provided with a first adsorption unit and a second adsorption unit, and the moving step stops supply of negative pressure to the first adsorption unit, and The second adsorption unit supplies a negative pressure, and the monitoring step measures the pressure of the second adsorption unit and outputs the pressure value as the position information, and the adjustment step is performed by the first adsorption unit and the second adsorption unit. The supply of the negative pressure to the first adsorption unit is started by the change in the pressure value during the movement of the peeling portion. 如請求項10之剝離方法,其中上述移動步驟係停止對上述下游側吸附部之負壓供給,上述監控步驟係測量上述第2板狀體之上述反密接面與上述下游側吸附部之距離而作為上述位置資訊,上述調整步驟係於上述距離成為閾值以下之時間點,開始對上述下游側吸附部之負壓之供給。 The peeling method of claim 10, wherein the moving step stops the supply of the negative pressure to the downstream side adsorption portion, and the monitoring step measures the distance between the reverse-bonding surface of the second plate-shaped body and the downstream-side adsorption portion. As the position information, the adjustment step is to start supply of the negative pressure to the downstream adsorption unit at a time point when the distance is equal to or less than the threshold.
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