TWI593617B - Detaching apparatus - Google Patents
Detaching apparatus Download PDFInfo
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- TWI593617B TWI593617B TW102145973A TW102145973A TWI593617B TW I593617 B TWI593617 B TW I593617B TW 102145973 A TW102145973 A TW 102145973A TW 102145973 A TW102145973 A TW 102145973A TW I593617 B TWI593617 B TW I593617B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- Condensed Matter Physics & Semiconductors (AREA)
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- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
本發明係關於一種使彼此密接之2片板狀體剝離離開之剝離裝置者。 The present invention relates to a peeling device for peeling off two sheet-like bodies that are in close contact with each other.
作為於玻璃基板或半導體基板等板狀體上形成特定之圖案或薄膜之技術,有將載持於其他板狀體上之圖案或薄膜(以下,稱為「圖案等」)轉印至基板者。於該技術中,需要於使2片板狀體密接而將圖案等自一者轉印至另一者後,不使圖案等損壞而剝離2片板狀體。 As a technique for forming a specific pattern or film on a plate-like body such as a glass substrate or a semiconductor substrate, a pattern or a film (hereinafter referred to as a "pattern" or the like) carried on another plate-like body is transferred to the substrate. . In this technique, it is necessary to peel two sheets of the plate-like body and to transfer the pattern or the like from one to the other, and then peel off the two plate-shaped bodies without damaging the pattern or the like.
作為為了實現該目的而可利用之技術,例如於日本專利特開2008-287949號公報中,記載有用以剝離介隔有機層而彼此密接之元件形成用基板與轉印用基板之裝置。該技術係將貼合之2片基板保持為水平姿勢,使上下基板分別以真空吸附之狀態向離開方向移動。上下基板係分別藉由分散配置之複數個吸附墊而吸附保持。 For example, Japanese Laid-Open Patent Publication No. 2008-287949 discloses an apparatus for peeling a substrate for forming an element and a substrate for transfer which are in close contact with each other. In this technique, the two substrates to be bonded are held in a horizontal posture, and the upper and lower substrates are moved in the direction of vacuum suction. The upper and lower substrates are respectively adsorbed and held by a plurality of adsorption pads arranged in a dispersed manner.
此種轉印技術係可應用於各種器件製造製程,但伴隨形成圖案等之材料之多樣化或圖案之微細化、基板之大型化等而於剝離製程中需要更緻密之進行管理。即,為了防止因局部性之應力集中引起之圖案等之損壞,需要適當地管理剝離之進行。然而,為了可響應此種要求,於上述先前技術中殘留有應改善之如下之問題。 Such a transfer technique can be applied to various device manufacturing processes, but it is required to be more compactly managed in the peeling process in accordance with the diversification of materials such as patterns, the miniaturization of the pattern, and the enlargement of the substrate. That is, in order to prevent damage of a pattern or the like due to local stress concentration, it is necessary to appropriately manage the progress of peeling. However, in order to respond to such a request, the following problems which should be improved remain in the above prior art.
第1,上述先前技術係上下基板分別藉由吸附墊而局部性地吸附,故存在於該吸附部位局部性地產生基板間之剝離等、無法於適當之管理下進行剝離之情形。特別是,於在形成有圖案等之區域,使吸附墊抵接於基板時,存在較強之剝離力集中性地作用於該區域而使圖案等損壞之虞。 First, in the above-described prior art, the upper and lower substrates are locally adsorbed by the adsorption pad. Therefore, there is a case where peeling between the substrates occurs locally at the adsorption site, and peeling cannot be performed under appropriate management. In particular, when the adsorption pad is brought into contact with the substrate in a region where a pattern or the like is formed, a strong peeling force acts on the region in a concentrated manner to damage the pattern or the like.
第2,於此種剝離裝置中,2片板狀體密接而成之密接體被搬入至裝置而該等2片板狀體彼此剝離。此時,如上所述,向圖案等之局部性之應力集中係導致圖案等之損壞,因此要求用以不產生此種應力而自外部接收密接體之裝置構成上之考慮。然而,上述先前技術係未對該方面進行考慮。 Secondly, in such a peeling device, the two-piece plate-like body in which the two plate-like bodies are closely adhered is carried into the apparatus, and the two plate-shaped bodies are peeled off from each other. At this time, as described above, the local stress concentration to the pattern or the like causes damage to the pattern or the like. Therefore, it is required to construct the device for receiving the adhesion body from the outside without generating such stress. However, the prior art described above does not consider this aspect.
本發明係鑒於上述課題而完成者,目的在於提供一種於使彼此密接之2片板狀體剝離離開之剝離裝置中,可良好地進行剝離,並且良好地進行板狀體密接而成之密接體之搬入之技術。 The present invention has been made in view of the above-described problems, and it is an object of the present invention to provide an adhesive body in which a sheet-like body is adhered to a peeling device in which two sheet-like members that are in close contact with each other are peeled off, and the sheet-like body is adhered well. The technology of moving in.
本發明之一之態樣係一種剝離裝置,其係剝離第1板狀體、與具有小於第1板狀體之平面尺寸且介隔薄膜或圖案而密接於第1板狀體之第2板狀體者,為了達成上述目的,其包括:保持平台,其上表面成為大於第1板狀體之形成有薄膜或圖案之有效區域之平面尺寸且水平的保持面,使第1板狀體之面中之與密接於第2板狀體之一面為相反側的另一面抵接於保持面而保持第1板狀體;剝離器件,其保持第2板狀體,使第2板狀體相對於保持於保持平台之第1板狀體而相對地向自第1板狀體離開之方向移動;支持構件,其上端突出於較保持面更上方,上端局部性地抵接於第1板狀體之另一面而將第1板狀體支持成自保持面離開之狀態;及升降器件,其於支持構件之上端突出於較保持面更上方之上部位置、與上端位於保持面之高度以下之下部位置之間,變更支持構件對於保持面之相對高度方向位置;且支持構件係抵 接於第1板狀體之另一面中之與於一面側密接第2板狀體之區域對應之區域內且較有效區域更外側。 An aspect of the present invention is a peeling apparatus which peels off a first plate-like body and a second plate which has a planar size smaller than that of the first plate-shaped body and which is in close contact with the first plate-shaped body by a film or pattern. In order to achieve the above object, the object includes: a holding platform having an upper surface which is larger than a plane size of the effective area of the first plate-like body in which the film or the pattern is formed, and a horizontal holding surface, so that the first plate-shaped body The other surface of the surface that is in contact with one surface opposite to the surface of the second plate-shaped body abuts on the holding surface to hold the first plate-shaped body, and the peeling device holds the second plate-shaped body so that the second plate-shaped body faces the second plate-shaped body. The first plate-shaped body held by the holding platform is relatively moved away from the first plate-shaped body; the support member has an upper end projecting above the holding surface, and the upper end partially abutting against the first plate shape. The other side of the body supports the first plate-shaped body to be separated from the holding surface; and the lifting device protrudes above the upper surface of the holding surface from the upper end of the supporting member, and the upper end is located below the height of the holding surface Change support member between the lower positions The relative position of the height direction of the surface; and a support member system contact The other surface of the first plate-shaped body is located in a region corresponding to a region in which the second plate-like body is in close contact with one side, and is more outward than the effective region.
如此構成之發明係以使第1板狀體抵接於保持平台之保持面之狀態進行與第2板狀體之剝離,故可以將第1板狀體保持為平面姿勢之狀態進行剝離。因此,可避免對形成於第1板狀體與第2板狀體之間之圖案或薄膜(以下,稱為「圖案等」)局部性地引起應力集中而防止因應力集中引起之圖案等之損壞。 In the invention, the first plate-shaped body is separated from the second plate-like body in a state in which the first plate-shaped body is in contact with the holding surface of the holding platform. Therefore, the first plate-shaped body can be peeled off while being held in a planar posture. Therefore, it is possible to prevent a pattern or a film (hereinafter referred to as a "pattern or the like") formed between the first plate-shaped body and the second plate-shaped body from locally causing stress concentration to prevent a pattern due to stress concentration or the like. damage.
又,於搬入第1板狀體與第2板狀體之密接體時,支持構件擔負該情形之主要之作用。即,支持構件可於自保持面突出於上方之上部位置,將第1板狀體以自保持面離開之狀態支持,因此可接收自外部搬入之密接體。而且,支持構件向較保持面更下方之下部位置後退,藉此自支持構件向保持平台交付密接體。如上所述,支持構件具有接收自外部搬入之密接體而載置至保持平台之功能。 Further, when the dense body of the first plate-shaped body and the second plate-shaped body is carried in, the supporting member plays a major role in this case. In other words, the support member can be supported by the self-retaining surface at the upper upper portion, and the first plate-shaped body can be supported in a state of being separated from the holding surface. Therefore, the support member can be received from the outside. Moreover, the support member retreats to a position lower than the lower surface of the holding surface, whereby the adhesion body is delivered from the support member to the holding platform. As described above, the support member has a function of receiving the adhering body that has been carried in from the outside and placing it on the holding platform.
此時,若支持構件於相當於有效區域內之區域,抵接於第1板狀體,則於該抵接部位,對圖案等作用較大之按壓力。又,若於較第1板狀體與第2板狀體密接之區域更外側,抵接於第1板狀體,則需要由第1板狀體支撐密接體之自身重量之全部,若第1板狀體之剛性較低,則存在彎曲之情形。於本發明中,支持構件係於較第1板狀體與第2板狀體密接且形成有有效之圖案等之有效區域更外側,支持第1板狀體,因此不會產生此種問題。 At this time, when the supporting member abuts against the first plate-like body in a region corresponding to the effective region, a large pressing force is applied to the pattern or the like at the abutting portion. Further, when the first plate-shaped body is in contact with the first plate-shaped body and the first plate-shaped body is in contact with the first plate-shaped body, the first plate-shaped body needs to support the entire weight of the close-contact body. 1 When the rigidity of the plate-shaped body is low, there is a case of bending. In the present invention, the support member is supported on the outer side of the effective region in which the first plate-shaped body and the second plate-like body are in close contact with each other and an effective pattern or the like is formed, and the first plate-shaped body is supported. Therefore, such a problem does not occur.
如此,根據本發明,可良好地剝離彼此密接之2片板狀體,並且對於自外部搬入之密接體之接收,亦可不對圖案等賦予損傷而良好地進行。 As described above, according to the present invention, it is possible to favorably peel off the two plate-like bodies that are in close contact with each other, and it is possible to satisfactorily perform the reception of the densely-attached body by externally without impairing the pattern or the like.
於本發明中,亦可為如下之構成:例如,保持面具有大於第2板狀體之平面尺寸,並且於較保持面中之與載置於保持面之第1板狀體之有效區域對應的區域更外側且與第2板狀體對應之區域之內側設置 開口,於支持構件處於上部位置時,上端通過開口而突出於保持面之上方。 In the present invention, the holding surface may have a larger planar surface size than the second plate-shaped body, and corresponds to an effective area of the first plate-shaped body placed on the holding surface in the holding surface. The area is located on the outer side of the area corresponding to the second plate-shaped body. The opening protrudes above the holding surface through the opening when the supporting member is in the upper position.
此種構成係可使於第1板狀體中之一面側密接第2板狀體之區域之整體抵接於保持面而保持,從而可更有效地防止於剝離第2板狀體時,對第1板狀體施加局部性之應力。又,可藉由通過開口而升降之支持構件,於有效區域之外側確實地支持接收密接體,並且可將密接體確實地載置至保持面。 In such a configuration, the entire area of the first plate-shaped body in which the second plate-shaped body is in close contact with the holding surface can be held by the one of the first plate-shaped bodies, and the second plate-shaped body can be more effectively prevented from being peeled off. The first plate-shaped body exerts a local stress. Further, the receiving member that is lifted and lowered by the opening can surely support the receiving contact body on the outer side of the effective region, and the adhering body can be surely placed on the holding surface.
於該情形時,亦可為如下之構成:例如,分別設置複數個支持構件及開口,複數個支持構件係一體地對於保持面相對地升降。以此方式,例如可一面保持與保持面平行之狀態,一面使密接體升降,因此可穩定地進行密接體自外部之接收及向保持面之載置。 In this case, for example, a plurality of support members and openings may be provided, and the plurality of support members may integrally move up and down with respect to the holding surface. In this manner, for example, the adherend can be lifted and lowered while maintaining the state parallel to the holding surface. Therefore, the receiving body can be stably received from the outside and placed on the holding surface.
又,例如,亦可為包括輔助支持構件之構成,該輔助支持構件係於保持面中之與有效區域對應之區域,設置與支持構件所設置之開口不同之第2開口,並且自該第2開口突出於較保持面更上方而支持第1板狀體。於有效區域內,使構件抵接於與第2板狀體之剝離前之第1板狀體係如上所述般成為圖案等之損壞之原因,故不佳。然而,根據圖案等之種類而亦存在相對於此種應力之耐性較高者,於此種情形時,輔助性地支持有效區域內係於密接體之確實之保持之方面有效。 Further, for example, it may be configured to include an auxiliary support member that is provided in a region corresponding to the effective region in the holding surface, and is provided with a second opening different from the opening provided in the support member, and from the second The opening protrudes above the holding surface to support the first plate-shaped body. In the effective region, the first plate-like system before the peeling of the member from the second plate-like body is caused to be damaged by a pattern or the like as described above, which is not preferable. However, depending on the type of pattern or the like, there is also a high resistance to such stress. In such a case, it is effective to support the effective region in the effective retention of the adherend.
又,自第2板狀體剝離後之單體之第1板狀體係剛性低於密接體,從而存在僅藉由有效區域外之保持係因自身重量引起之撓曲變大。於此種情形時,在有效區域內輔助性地支持第1板狀體之情形較為有效,且由於係剝離後,因此亦不存在對圖案等造成不良影響之情形。 Further, since the first plate-like system of the monomer after peeling off from the second plate-shaped body is less rigid than the dense body, the deflection of the holding system outside the effective region alone due to its own weight becomes large. In such a case, it is effective to support the first plate-like body in the effective region, and since it is peeled off, there is no adverse effect on the pattern or the like.
又,例如,亦可為更包括空隙形成構件之構成,該空隙形成構件係使保持於保持平台之第1板狀體之周緣部向上方位移而於第1板狀體與保持面之間產生空隙。於自保持平台搬出第1板狀體之情形時, 可於自保持面提昇第1板狀體時利用支持構件。然而,第1板狀體係成為因大氣壓而壓抵於保持面之狀態,因此存在無法僅簡單地藉由利用支持構件壓抵而提昇第1板狀體之情形。藉由空隙形成構件使第1板狀體之周緣部向上方位移而向第1板狀體與保持面之間導入外部空氣,藉此可解除大氣壓之壓抵而容易地使第1板狀體自保持面離開。即,其係用以實現容易地搬出剝離後之第1板狀體之構成。 Further, for example, a configuration may be further included in which the gap forming member is formed such that the peripheral edge portion of the first plate-shaped body held by the holding platform is displaced upward and is generated between the first plate-shaped body and the holding surface. Void. When the first plate-shaped body is carried out from the holding platform, The support member can be used when the first plate-shaped body is lifted from the holding surface. However, since the first plate-like system is in a state of being pressed against the holding surface by the atmospheric pressure, there is a case where the first plate-shaped body cannot be lifted by simply pressing against the support member. The peripheral member of the first plate-shaped body is displaced upward by the gap forming member, and the outside air is introduced between the first plate-shaped body and the holding surface, whereby the first plate-shaped body can be easily released by releasing the pressure of the atmospheric pressure. Leave away from the holding surface. That is, it is used to realize the configuration in which the first plate-shaped body after peeling is easily carried out.
又,例如,亦可為如下之構成:保持平台具有於上表面具有保持面之水平平台部、及成為上表面連接於保持面並且朝向遠離保持面之方向具有向下梯度之傾斜面之傾斜平台部,且更包括按壓構件,該按壓構件係以使第1板狀體中之較上述有效區域更外側之周緣部突出於傾斜面之上方之狀態,保持第1板狀體,另一方面,按壓突出於傾斜面之上方之第1板狀體之周緣部而使其向下方彎曲,藉此於第1板狀體與第2板狀體之間開始剝離,水平平台部與傾斜平台部可於水平方向離開,至少1個支持構件自因離開而產生之水平平台部與傾斜平台部之間隙而對於保持面相對升降。 Further, for example, the holding platform may have a horizontal platform portion having a holding surface on the upper surface, and a tilting platform having an upper surface connected to the holding surface and having an inclined surface having a downward gradient in a direction away from the holding surface. And a pressing member that holds the first plate-shaped body while the peripheral edge portion of the first plate-shaped body that is more outward than the effective region protrudes above the inclined surface, and further includes The peripheral edge portion of the first plate-shaped body that protrudes above the inclined surface is pressed and bent downward, whereby peeling starts between the first plate-shaped body and the second plate-shaped body, and the horizontal platform portion and the inclined platform portion are Leaving in the horizontal direction, at least one of the supporting members is relatively raised and lowered with respect to the holding surface from the gap between the horizontal platform portion and the inclined platform portion due to the separation.
於保持平台之一部分設置此種傾斜面,使突出於該傾斜面之第1板狀體沿著傾斜面彎曲,藉此可於適當之管理下開始剝離。藉此,可良好地進行剝離。於該情形時,若於保持面與傾斜面之交界附近,設置用以插通支持構件之開口,則第1板狀體與第2板狀體密接之未剝離區域、與已剝離之剝離區域之交界線即剝離交界線之形狀散亂,從而無法以固定速度進行剝離。於可使水平平台部與傾斜平台部離開,藉由支持構件而支持第1板狀體(或密接體)時,兩平台部離開而使支持構件自該間隙突出,從而於剝離時,使支持構件退避而使水平平台部與傾斜平台部密接,藉此可避免此種問題而良好地進行剝離。 Such an inclined surface is provided in one of the holding platforms, and the first plate-shaped body protruding from the inclined surface is bent along the inclined surface, whereby peeling can be started under appropriate management. Thereby, peeling can be performed favorably. In this case, when an opening for inserting the support member is provided in the vicinity of the boundary between the holding surface and the inclined surface, the uncoated region in which the first plate-shaped body is in close contact with the second plate-shaped body and the peeled-off region are peeled off. The boundary line, that is, the shape of the peeling boundary line is scattered, so that peeling cannot be performed at a fixed speed. When the horizontal plate portion and the inclined platform portion are separated from each other, and the first plate-shaped body (or the adhesion body) is supported by the support member, the two platform portions are separated to cause the support member to protrude from the gap, thereby supporting the separation. When the member is retracted and the horizontal platform portion is in close contact with the inclined platform portion, the problem can be avoided and the peeling can be performed satisfactorily.
本發明係以如下狀態進行剝離:第1板狀體與第2板狀體密接, 且支持構件於較形成有有效之圖案等之有效區域更外側支持第1板狀體,而且使第1板狀體抵接於保持平台之保持面。因此,可良好地剝離彼此密接之2片板狀體,並且對於自外部搬入之密接體之接收,亦可不對圖案等賦予損傷而良好地進行。 In the present invention, the first plate-shaped body is in close contact with the second plate-shaped body, and the first plate-shaped body is in close contact with each other. Further, the supporting member supports the first plate-like body on the outer side of the effective region in which the effective pattern or the like is formed, and the first plate-shaped body is brought into contact with the holding surface of the holding platform. Therefore, the two plate-like bodies that are in close contact with each other can be favorably peeled off, and the receiving of the bonded body that has been carried in from the outside can be favorably performed without impairing the pattern or the like.
1‧‧‧剝離裝置 1‧‧‧ peeling device
3‧‧‧平台塊 3‧‧‧ platform block
5‧‧‧上部吸附塊 5‧‧‧Upper adsorption block
11‧‧‧主框架 11‧‧‧Main frame
30‧‧‧平台(保持平台) 30‧‧‧ Platform (maintaining platform)
31‧‧‧水平平台部(保持平台) 31‧‧‧Horizontal Platform Division (maintaining platform)
32‧‧‧傾斜平台部(保持平台) 32‧‧‧ tilting platform (maintaining platform)
33‧‧‧初始剝離單元 33‧‧‧Initial stripping unit
34‧‧‧輥單元 34‧‧‧roll unit
36‧‧‧主升降機 36‧‧‧Main lift
37‧‧‧子升降機 37‧‧‧Sub-lift
38‧‧‧邊緣升降機 38‧‧‧Edge lifts
50‧‧‧支持框架 50‧‧‧Support framework
70‧‧‧控制單元 70‧‧‧Control unit
51~54‧‧‧吸附單元(剝離器件) 51~54‧‧‧Adsorption unit (peeling device)
310‧‧‧(水平平台部31之)上表面(保持面) 310‧‧‧ (horizontal platform part 31) upper surface (holding surface)
311‧‧‧吸附槽 311‧‧‧Adsorption tank
312‧‧‧吸附槽 312‧‧‧Adsorption tank
313‧‧‧第1開口 313‧‧‧1st opening
314‧‧‧第2開口 314‧‧‧2nd opening
315‧‧‧第3開口 315‧‧‧3rd opening
316‧‧‧切口部 316‧‧‧cut section
320‧‧‧上表面 320‧‧‧ upper surface
321‧‧‧導軌 321‧‧‧rail
322‧‧‧滑塊 322‧‧‧ Slider
323‧‧‧移動機構 323‧‧‧Mobile agencies
331‧‧‧按壓構件 331‧‧‧ Pressing members
332‧‧‧支持臂 332‧‧‧Support arm
333‧‧‧導軌 333‧‧‧rail
334‧‧‧柱構件 334‧‧‧column components
335‧‧‧升降機構 335‧‧‧ Lifting mechanism
336‧‧‧基底部 336‧‧‧ base
337‧‧‧位置調整機構 337‧‧‧Location adjustment agency
340‧‧‧剝離輥 340‧‧‧ peeling roller
341‧‧‧滑塊 341‧‧‧ Slider
342‧‧‧滑塊 342‧‧‧ Slider
343‧‧‧下部角 343‧‧‧lower corner
344‧‧‧升降機構 344‧‧‧ Lifting mechanism
345‧‧‧上部角 345‧‧‧ upper corner
346‧‧‧支承輥 346‧‧‧Support roll
351‧‧‧導軌 351‧‧‧rail
352‧‧‧導軌 352‧‧‧rail
353‧‧‧馬達 353‧‧‧Motor
354‧‧‧滾珠螺桿機構 354‧‧‧Rolling screw mechanism
361‧‧‧升降銷(支持構件) 361‧‧‧ Lifting pin (supporting member)
361a‧‧‧上表面 361a‧‧‧ upper surface
362‧‧‧吸附墊 362‧‧‧Adsorption pad
363‧‧‧負壓供給路徑 363‧‧‧Negative pressure supply path
365‧‧‧升降機構(升降器件) 365‧‧‧ Lifting mechanism (lifting device)
371‧‧‧升降銷(輔助支持構件) 371‧‧‧ Lifting pin (auxiliary support member)
375‧‧‧升降機構 375‧‧‧ Lifting mechanism
381‧‧‧振盪臂(空隙形成構件) 381‧‧‧Oscillation arm (void forming member)
381a‧‧‧各振盪臂381之上端 381a‧‧‧ upper end of each oscillating arm 381
382‧‧‧支持框架 382‧‧‧Support framework
383‧‧‧驅動桿 383‧‧‧ drive rod
384‧‧‧移動機構 384‧‧‧Mobile agencies
517‧‧‧吸附墊 517‧‧‧Adsorption pad
521‧‧‧梁構件 521‧‧‧beam components
522‧‧‧柱構件 522‧‧‧column components
523‧‧‧柱構件 523‧‧‧column components
524‧‧‧板構件 524‧‧‧Board components
525‧‧‧升降機構 525‧‧‧ Lifting mechanism
526‧‧‧墊支持構件 526‧‧‧pad support members
527‧‧‧吸附墊 527‧‧‧Adsorption pad
527a‧‧‧吸附部 527a‧‧‧Adsorption Department
527b‧‧‧波紋管部 527b‧‧‧ Bellows Department
537‧‧‧吸附墊 537‧‧‧Adsorption pad
547‧‧‧吸附墊 547‧‧‧Adsorption pad
701‧‧‧CPU 701‧‧‧CPU
702‧‧‧馬達控制部 702‧‧‧Motor Control Department
703‧‧‧閥控制部 703‧‧‧Valve Control Department
704‧‧‧負壓供給部 704‧‧‧Negative Pressure Supply Department
705‧‧‧使用者介面(UI)部 705‧‧‧User Interface (UI) Department
A-A'‧‧‧切斷面 A-A'‧‧‧ cut face
AR‧‧‧有效區域 AR‧‧‧Active area
B-B'‧‧‧切斷面 B-B'‧‧‧ cut face
C-C'‧‧‧切斷面 C-C'‧‧‧ cut face
BH‧‧‧包覆層用手 BH‧‧ ‧ coating with hand
BL‧‧‧包覆層(第1板狀體) BL‧‧‧Cladding (1st plate)
E‧‧‧脊線部 E‧‧‧ ridge line
R1‧‧‧藉由吸附槽311吸附包覆層BL之區域 R1‧‧‧ adsorbing the area of the coating layer BL by the adsorption tank 311
R2‧‧‧藉由吸附槽312而吸附包覆層BL之區域 R2‧‧‧ adsorbing the area of the cladding layer BL by the adsorption tank 312
R3‧‧‧藉由第1吸附單元51而吸附基板SB之區域 R3‧‧‧Adsorption of the substrate SB by the first adsorption unit 51
R4‧‧‧剝離輥340抵接於基板SB之區域 R4‧‧‧ peeling roller 340 abuts the area of the substrate SB
R5‧‧‧抵接區域 R5‧‧‧Abutment area
R6‧‧‧升降銷361之上表面361a抵接之包覆層BL之下表面區域 R6‧‧‧ The lower surface area of the cladding layer BL that the upper surface 361a of the lift pin 361 abuts
R7‧‧‧邊緣升降機38之振盪臂381之上端抵接之包覆層BL之下表面區域 The lower surface area of the cladding layer BL abutting the upper end of the oscillating arm 381 of the R7‧‧‧ edge lifter 38
R8‧‧‧升降銷371抵接之包覆層BL之下表面區域 R8‧‧‧ Lifting pin 371 abuts the surface area under the coating layer BL
S101~S115‧‧‧步驟 S101~S115‧‧‧Steps
SB‧‧‧基板(第2板狀體) SB‧‧‧ substrate (2nd plate)
TR‧‧‧可抵接區域 TR‧‧‧able area
V3‧‧‧閥群 V3‧‧‧ valve group
V5‧‧‧閥群 V5‧‧‧ valve group
WH‧‧‧工件用手 WH‧‧‧ workpiece with hand
WK‧‧‧工件 WK‧‧‧ workpiece
-X‧‧‧方向 -X‧‧‧ directions
+X‧‧‧方向 +X‧‧‧ directions
-Y‧‧‧方向 -Y‧‧ Direction
+Y‧‧‧方向 +Y‧‧ Direction
-Z‧‧‧方向 -Z‧‧‧ directions
+Z‧‧‧方向 +Z‧‧‧ directions
θ‧‧‧包覆層BL之下表面與傾斜平台部32之上表面320所成之角 θ‧‧‧An angle formed by the lower surface of the cladding layer BL and the upper surface 320 of the inclined platform portion 32
α‧‧‧已剝離之部分之基板SB與包覆層BL所成之角 α‧‧‧The angle between the peeled portion of the substrate SB and the cladding layer BL
β‧‧‧剝離交界線附近之基板SB與包覆層BL所成之角 The angle between the substrate SB and the cladding layer BL near the β ‧ ‧ strip boundary
圖1係表示本發明之剝離裝置之一實施形態之立體圖。 Fig. 1 is a perspective view showing an embodiment of a peeling device of the present invention.
圖2係表示該剝離裝置之主要構成之立體圖。 Fig. 2 is a perspective view showing the main configuration of the peeling device.
圖3係表示初始剝離單元之構造及各部之位置關係之側視圖。 Fig. 3 is a side view showing the structure of the initial peeling unit and the positional relationship of the respective parts.
圖4(a)、(b)係表示平台之更詳細之構成之立體圖。 4(a) and 4(b) are perspective views showing a more detailed configuration of the platform.
圖5係表示圖6(a)至圖8(b)之平台剖面圖之剖面之方向的平台俯視圖。 Fig. 5 is a plan view showing the direction of the cross section of the cross-sectional view of the platform of Figs. 6(a) to 8(b).
圖6(a)、(b)係表示主升降機(lifter)之配置之平台剖面圖。 6(a) and 6(b) are cross-sectional views showing the arrangement of a main lifter.
圖7(a)~(c)係表示子升降機之配置之平台剖面圖。 7(a) to (c) are cross-sectional views of the platform showing the arrangement of the sub-lifts.
圖8(a)、(b)係表示邊緣升降機之配置之平台剖面圖。 8(a) and 8(b) are cross-sectional views showing the arrangement of the edge lifter.
圖9係表示平台與載置於該平台之工件之位置關係之圖。 Figure 9 is a diagram showing the positional relationship between the platform and the workpiece placed on the platform.
圖10係表示該剝離裝置之電性構成之方塊圖。 Fig. 10 is a block diagram showing the electrical configuration of the peeling device.
圖11係表示剝離處理之流程圖。 Fig. 11 is a flow chart showing the peeling process.
圖12(a)~(d)係表示處理中之各階段之各部之位置關係的第1圖。 12(a) to 12(d) are first diagrams showing the positional relationship of each unit in each stage of the process.
圖13(a)~(d)係表示處理中之各階段之各部之位置關係的第2圖。 13(a) to (d) are second diagrams showing the positional relationship of each unit in each stage of the process.
圖14(a)~(d)係表示處理中之各階段之各部之位置關係的第3圖。 14(a) to 14(d) are diagrams 3 showing the positional relationship of each unit in each stage of the process.
圖15(a)~(d)係表示處理中之各階段之各部之位置關係的第4圖。 15(a) to 15(d) are diagrams 4 showing the positional relationship of each unit in each stage of the process.
圖16(a)、(b)係用以說明本實施形態之剝離處理之優點之圖。 16(a) and 16(b) are views for explaining the advantages of the peeling process of the embodiment.
圖1係表示本發明之剝離裝置之一實施形態之立體圖。為了統一地表示以下之各圖之方向,如圖1之右下般設定XYZ正交座標軸。此處,XY平面表示水平面,Z軸表示鉛垂軸。更詳細而言,(+Z)方向表 示鉛垂向上之方向。 Fig. 1 is a perspective view showing an embodiment of a peeling device of the present invention. In order to uniformly represent the directions of the following figures, the XYZ orthogonal coordinate axes are set as shown in the lower right of FIG. Here, the XY plane represents a horizontal plane, and the Z axis represents a vertical axis. In more detail, the (+Z) direction table Shows the direction of the vertical direction.
該剝離裝置1係用以剝離以主面彼此密接之狀態搬入之2片板狀體之裝置。例如,使用於在玻璃基板或半導體基板等基板之表面形成特定之圖案之圖案形成製程的一部分。更具體而言,該圖案形成製程係於作為暫時載持應轉印之圖案之載持體之包覆層表面均勻地塗佈圖案形成材料(塗佈步驟),將根據圖案形狀而經表面加工之版抵壓至包覆層上之塗佈層,藉此將塗佈層圖案化(圖案化步驟)。接著,使以此方式形成有圖案之包覆層密接至被轉印體即基板(轉印步驟),藉此將圖案自包覆層最終轉印至基板。 This peeling device 1 is a device for peeling off two sheet-like bodies carried in a state in which the main surfaces are in close contact with each other. For example, it is used for forming a part of a pattern forming process of a specific pattern on the surface of a substrate such as a glass substrate or a semiconductor substrate. More specifically, the pattern forming process is uniformly applied to the surface of the cladding layer as a carrier for temporarily carrying the pattern to be transferred (coating step), and the surface is processed according to the shape of the pattern. The plate is pressed against the coating layer on the coating layer, thereby patterning the coating layer (patterning step). Next, the coating layer in which the pattern is formed in this manner is adhered to the substrate to be transferred (the transfer step), whereby the pattern is finally transferred from the cladding layer to the substrate.
此時,為了實現使於圖案化步驟中密接之版與包覆層之間、或於轉印步驟中密接之基板與包覆層之間離開之目的,可較佳地應用本裝置。當然,可使用於該等兩者,亦可使用於除此之外之用途。例如,亦可應用於將載持於載持體之薄膜轉印至基板時之剝離製程。 In this case, the apparatus can be preferably applied for the purpose of separating between the substrate and the cladding layer which are in contact with each other in the patterning step, or between the substrate and the cladding layer which are in close contact with each other in the transfer step. Of course, it can be used for both of them, and can also be used for other purposes. For example, it can also be applied to a peeling process when a film carried on a carrier is transferred to a substrate.
該剝離裝置1具有於安裝於殼體之主框架11上分別固定有平台塊3及上部吸附塊5之構造。於圖1中,為了表示裝置之內部構造,省略殼體之圖示。又,除該等各塊外,該剝離裝置1包括下文將述之控制單元70(圖10)。 The peeling device 1 has a structure in which a platform block 3 and an upper adsorption block 5 are fixed to a main frame 11 attached to a casing. In Fig. 1, in order to show the internal structure of the device, the illustration of the housing is omitted. Also, in addition to the blocks, the stripping device 1 includes a control unit 70 (Fig. 10) which will be described later.
平台塊3具有用以載置版或基板與包覆層密接而成之密接體(以下,稱為「工件」)之平台30。平台30包括:水平平台部31,其上表面大致呈水平之平面;及傾斜平台部32,其上表面相對於水平面而具有數度(例如2度左右)之傾斜度。於平台30之傾斜平台部32側、即(-Y)側之端部附近,設置有初始剝離單元33。又,以橫跨水平平台部31之方式設置輥單元34。 The platform block 3 has a platform 30 for placing a plate or a close-contact body (hereinafter referred to as a "workpiece") in which the substrate and the cladding layer are in close contact with each other. The platform 30 includes a horizontal platform portion 31 having a substantially horizontal plane on its upper surface, and an inclined platform portion 32 having an upper surface having an inclination of several degrees (e.g., about 2 degrees) with respect to a horizontal plane. An initial peeling unit 33 is provided on the side of the inclined platform portion 32 of the stage 30, that is, in the vicinity of the end portion on the (-Y) side. Further, the roller unit 34 is provided so as to straddle the horizontal platform portion 31.
另一方面,上部吸附塊5包括:支持框架50,其自主框架11立設,並且以覆蓋平台塊3之上部之方式設置;第1吸附單元51、第2吸附單元52、第3吸附單元53及第4吸附單元54,其等安裝於該支持框架 50。該等吸附單元51~54係依次排列於(+Y)方向。 On the other hand, the upper adsorption block 5 includes a support frame 50 whose main frame 11 is erected and disposed to cover the upper portion of the platform block 3; the first adsorption unit 51, the second adsorption unit 52, and the third adsorption unit 53 And a fourth adsorption unit 54, which is mounted on the support frame 50. The adsorption units 51 to 54 are sequentially arranged in the (+Y) direction.
圖2係表示該剝離裝置之主要構成之立體圖。更具體而言,圖2係表示剝離裝置1之各構成中之平台30、輥單元34及第2吸附單元52之構造。平台30包括:水平平台部31,其上表面310大致呈水平面;及傾斜平台部32,其上表面320呈傾斜面。水平平台部31之上表面310具有稍微大於載置之工件之平面尺寸之平面尺寸。 Fig. 2 is a perspective view showing the main configuration of the peeling device. More specifically, FIG. 2 shows the structure of the stage 30, the roller unit 34, and the second adsorption unit 52 in each configuration of the peeling device 1. The platform 30 includes a horizontal platform portion 31 having an upper surface 310 that is substantially horizontal; and an inclined platform portion 32 having an upper surface 320 that is inclined. The upper surface 310 of the horizontal platform portion 31 has a planar size that is slightly larger than the planar size of the workpiece being placed.
傾斜平台部32係密接設置於水平平台部31之(-Y)側端部。其上表面320係與水平平台部31相接觸之部分位於與水平平台部31之上表面310相同之高度(Z方向位置),另一方面,隨著自水平平台部31向(-Y)方向遠離而向下方、即(-Z)方向後退。因此,平台30整體係水平平台部31之上表面310之水平面與傾斜平台部32之上表面320的傾斜面連續,其等連接之脊線部E係呈於X方向上延伸之直線狀。 The inclined platform portion 32 is closely attached to the (-Y) side end portion of the horizontal platform portion 31. The portion of the upper surface 320 that is in contact with the horizontal platform portion 31 is located at the same height (Z-direction position) as the upper surface 310 of the horizontal platform portion 31, and on the other hand, along the (-Y) direction from the horizontal platform portion 31. Move away and go backwards, ie (-Z). Therefore, the platform 30 as a whole is continuous with the inclined surface of the upper surface 310 of the horizontal platform portion 31 and the inclined surface of the upper surface 320 of the inclined platform portion 32, and the ridge portion E connected thereto is linearly extending in the X direction.
又,於水平平台部31之上表面310刻設有格子狀之槽。更具體而言,於水平平台部31之上表面310之中央部設置格子狀之槽311。以包圍形成有該槽311之區域之方式,相當於除矩形中之傾斜平台部32側之1邊之3邊之形狀的槽312設置於水平平台部31之上表面310之周緣部。該等槽311、312係經由控制閥而連接於下文將述之負壓供給部704(圖10),具有作為藉由供給負壓而對載置於平台30之工件予以吸附保持之吸附槽之功能。2種槽311、312係不於平台上連結,又,經由彼此獨立之控制閥而連接於負壓供給部704,因此除可實現使用兩槽之吸附外,亦可實現僅使用一槽之吸附。 Further, a lattice-shaped groove is formed in the upper surface 310 of the horizontal platform portion 31. More specifically, a lattice-shaped groove 311 is provided in the central portion of the upper surface 310 of the horizontal platform portion 31. The groove 312 corresponding to the shape of the three sides of one side of the inclined land portion 32 side in the rectangular shape is provided on the peripheral edge portion of the upper surface 310 of the horizontal land portion 31 so as to surround the region in which the groove 311 is formed. The grooves 311 and 312 are connected to a negative pressure supply unit 704 (FIG. 10) to be described later via a control valve, and have adsorption tanks for adsorbing and holding the workpiece placed on the stage 30 by supplying a negative pressure. Features. The two types of grooves 311 and 312 are not connected to the platform, and are connected to the negative pressure supply unit 704 via independent control valves. Therefore, in addition to the adsorption using the two grooves, the adsorption using only one groove can be realized. .
以橫跨如此構成之平台30之方式,設置輥單元34。具體而言,沿著水平平台部31之X方向兩端部而1對導軌351、352延伸設置於Y方向上,該等導軌351、352係固定於主框架11。而且,以相對於導軌351、352而滑動自如之方式安裝有輥單元34。 The roller unit 34 is disposed in such a manner as to span the platform 30 thus constructed. Specifically, the pair of guide rails 351 and 352 are extended in the Y direction along both end portions of the horizontal platform portion 31 in the X direction, and the guide rails 351 and 352 are fixed to the main frame 11 . Further, the roller unit 34 is attached slidably with respect to the guide rails 351 and 352.
輥單元34包括分別與導軌351、352滑動自如地卡合之滑塊341、 342,以連結該等滑塊341、342之方式,設置有橫跨平台30之上部而延伸設置於X方向之下部角343。於下部角343經由適當之升降機構344而升降自如地安裝有上部角345。而且,相對於上部角345而旋轉自如地安裝延伸設置於X方向之圓柱狀之剝離輥340。 The roller unit 34 includes a slider 341 that is slidably engaged with the guide rails 351 and 352, respectively. 342 is provided with an upper portion 343 extending in the X direction across the upper portion of the platform 30 so as to connect the sliders 341 and 342. The upper corner 345 is detachably attached to the lower corner 343 via an appropriate lifting mechanism 344. Further, a cylindrical peeling roller 340 extending in the X direction is rotatably attached to the upper corner 345.
若上部角345藉由升降機構344而向下方、即(-Z)方向下降,則剝離輥340之下表面抵接於載置於平台30之工件之上表面。另一方面,於上部角345藉由升降機構344而定位於上方、即(+Z)方向之位置之狀態下,剝離輥340成為自工件之上表面向上方離開之狀態。於上部角345,旋轉自如地安裝用以抑制剝離輥340之撓曲之支承輥346,並且適當地設置用以防止上部角345本身之撓曲之肋。剝離輥340及支承輥346不具有驅動源,而該等係自由旋轉。 When the upper corner 345 is lowered downward by the elevating mechanism 344, that is, in the (-Z) direction, the lower surface of the peeling roller 340 abuts against the upper surface of the workpiece placed on the stage 30. On the other hand, in a state in which the upper corner 345 is positioned at the upper position, that is, the position in the (+Z) direction by the elevating mechanism 344, the peeling roller 340 is separated from the upper surface of the workpiece. At the upper corner 345, a support roller 346 for suppressing the deflection of the peeling roller 340 is rotatably mounted, and a rib for preventing the deflection of the upper corner 345 itself is appropriately provided. The peeling roller 340 and the backup roller 346 do not have a driving source, and these are free to rotate.
輥單元34係可藉由安裝於主框架11之馬達353而於Y方向移動。更具體而言,於作為將馬達353之旋轉運動轉換成直線運動之轉換機構之例如滾珠螺桿機構354連結有下部角343。若馬達353旋轉,則下部角343沿著導軌351、352而於Y方向移動,藉此輥單元34於Y方向移動。伴隨輥單元34之移動之剝離輥340之可動範圍係於(-Y)方向設為至水平平台部31之(-Y)側端部之附近為止,於(+Y)方向設為較水平平台部31之(+Y)側端部更外側、即進而向(+Y)側行進之位置為止。 The roller unit 34 is movable in the Y direction by the motor 353 attached to the main frame 11. More specifically, the lower corner 343 is coupled to, for example, the ball screw mechanism 354 as a conversion mechanism that converts the rotational motion of the motor 353 into a linear motion. When the motor 353 rotates, the lower corner 343 moves in the Y direction along the guide rails 351 and 352, whereby the roller unit 34 moves in the Y direction. The movable range of the peeling roller 340 accompanying the movement of the roller unit 34 is set to the vicinity of the (-Y) side end of the horizontal platform portion 31 in the (-Y) direction, and is set to the horizontal platform in the (+Y) direction. The (+Y) side end portion of the portion 31 is further outward, that is, further toward the (+Y) side.
其次,對第2吸附單元52之構成進行說明。再者,第1至第4吸附單元51~54係均具有相同之構造。此處,代表性地對第2吸附單元52之構造進行說明。第2吸附單元52具有延伸設置於X方向並固定於支持框架50之梁構件521,且鉛垂向下、即向(-Z)方向延伸之1對柱構件522、523於X方向使彼此位置不同而安裝於該梁構件521。於柱構件522、523,經由在圖中隱藏之導軌而升降自如地安裝有板構件524。板構件524係藉由包含馬達及轉換機構(例如滾珠螺桿機構)之升降機構525而升降驅動。 Next, the configuration of the second adsorption unit 52 will be described. Further, the first to fourth adsorption units 51 to 54 have the same structure. Here, the structure of the second adsorption unit 52 will be representatively described. The second adsorption unit 52 has a beam member 521 extending in the X direction and fixed to the support frame 50, and the pair of column members 522 and 523 extending vertically downward, that is, in the (-Z) direction are positioned in the X direction. It is attached to the beam member 521 differently. The plate members 522 and 523 are attached to the plate members 522 and 523 so as to be lifted and lowered by the guide rails hidden in the drawing. The plate member 524 is driven up and down by a lifting mechanism 525 including a motor and a switching mechanism (for example, a ball screw mechanism).
於板構件524之下部安裝有於X方向延伸之棒狀之墊支持構件526,於該墊支持構件526之下表面在X方向等間隔地排列有複數個吸附墊527。於圖2中,表示有使第2吸附單元52移動至較實際之位置更上方之狀態,但於板構件524藉由升降機構525而向下方移動時,吸附墊527可下降至極其接近水平平台部31之上表面310之位置為止。於在平台30載置有工件之狀態下,抵接於該工件之上表面。對各吸附墊527賦予來自下文將述之負壓供給部704之負壓而吸附保持工件之上表面。 A rod-shaped pad supporting member 526 extending in the X direction is attached to a lower portion of the plate member 524, and a plurality of adsorption pads 527 are arranged at equal intervals in the X direction on the lower surface of the pad supporting member 526. 2 shows a state in which the second adsorption unit 52 is moved to a position higher than the actual position. However, when the plate member 524 is moved downward by the elevating mechanism 525, the adsorption pad 527 can be lowered to an extremely close to the horizontal platform. The position of the upper surface 310 of the portion 31 is up. In the state in which the workpiece is placed on the platform 30, the upper surface of the workpiece is abutted. Each of the adsorption pads 527 is given a negative pressure from a negative pressure supply portion 704 which will be described later to adsorb and hold the upper surface of the workpiece.
圖3係表示初始剝離單元之構造及各部之位置關係之側視圖。首先,一面參照圖1及圖3,一面對初始剝離單元33之構造進行說明。初始剝離單元33具有於傾斜平台部32之上方延伸設置於X方向之棒狀之按壓構件331,按壓構件331係由支持臂332支持。支持臂332係經由延伸設置於鉛垂方向之導軌333而升降自如地安裝於柱構件334,藉由升降機構335之作動而支持臂332相對於柱構件334進行上下移動。柱構件334係由安裝於主框架11之基底部336而支持。然而,基底部336上之柱構件334之Y方向位置係可藉由位置調整機構337而於特定之範圍內調整。 Fig. 3 is a side view showing the structure of the initial peeling unit and the positional relationship of the respective parts. First, the structure of the initial peeling unit 33 will be described with reference to Figs. 1 and 3 . The initial peeling unit 33 has a rod-shaped pressing member 331 extending in the X direction above the inclined platform portion 32, and the pressing member 331 is supported by the support arm 332. The support arm 332 is attached to the column member 334 so as to be movable up and down via a guide rail 333 extending in the vertical direction, and the support arm 332 is moved up and down with respect to the column member 334 by the action of the elevating mechanism 335. The column member 334 is supported by a base portion 336 attached to the main frame 11. However, the position of the column member 334 on the base portion 336 in the Y direction can be adjusted within a specific range by the position adjustment mechanism 337.
相對於由水平平台部31及傾斜平台部32構成之平台30,載置作為剝離對象物之工件WK。上述圖案化步驟中之工件係版與包覆層介隔圖案形成材料之薄膜而密接之密接體。另一方面,轉印步驟中之工件係基板與包覆層介隔經圖案化之圖案而密接之密接體。以下,對將轉印步驟中之基板SB與包覆層BL之密接體設為工件WK之情形時的剝離裝置1之剝離動作進行說明。然而,於將版與包覆層之密接體作為工件之情形時,亦可藉由相同之方法而進行剝離。 The workpiece WK as the object to be peeled off is placed on the stage 30 composed of the horizontal platform portion 31 and the inclined platform portion 32. In the above-mentioned patterning step, the workpiece-based plate and the coating layer are in close contact with each other by the film of the pattern forming material. On the other hand, in the transfer step, the workpiece-based substrate and the cladding layer are in close contact with each other via the patterned pattern. In the following, the peeling operation of the peeling device 1 when the bonded body of the substrate SB and the coating layer BL in the transfer step is the workpiece WK will be described. However, in the case where the adherend of the plate and the coating layer is used as a workpiece, peeling can be performed by the same method.
就工件WK而言,設為包覆層BL具有大於基板SB之平面尺寸者。基板SB係密接於包覆層BL之大致中央部。工件WK係將包覆層 BL設為下方,將基板SB設為上方而載置於平台30。此時,如圖3所示,工件WK以如下方式載置於平台30:工件WK中之基板SB之(-Y)側端部成為水平平台部31與傾斜平台部32之交界的脊線部E之大致上方,更詳細而言,成為較脊線部E略微向(-Y)側偏移之位置。因此,於(-Y)方向上較基板SB更外側之包覆層BL係以向傾斜平台部32之上方凸出之方式配置,於包覆層BL之下表面與傾斜平台部32之上表面320之間產生間隙。包覆層BL之下表面與傾斜平台部32之上表面320所成之角θ係與傾斜平台部32之傾斜角相同之數度(於該實施形態中為2度)左右。 In the case of the workpiece WK, it is assumed that the cladding layer BL has a larger planar size than the substrate SB. The substrate SB is in close contact with a substantially central portion of the cladding layer BL. Workpiece WK system will cover The BL is set to the lower side, and the substrate SB is placed above and placed on the stage 30. At this time, as shown in FIG. 3, the workpiece WK is placed on the stage 30 in such a manner that the (-Y)-side end portion of the substrate SB in the workpiece WK becomes the ridge portion at the boundary between the horizontal platform portion 31 and the inclined platform portion 32. The upper side of E is, in more detail, the position where the ridge portion E is slightly shifted toward the (-Y) side. Therefore, the cladding layer BL outside the substrate SB in the (-Y) direction is disposed to protrude above the inclined land portion 32, and the lower surface of the cladding layer BL and the upper surface of the inclined land portion 32 are provided. A gap is created between 320. The angle θ between the lower surface of the cladding layer BL and the upper surface 320 of the inclined land portion 32 is about the same as the inclination angle of the inclined land portion 32 (2 degrees in this embodiment).
於水平平台部31設置有吸附槽311、312,吸附保持包覆層BL之下表面。其中,吸附槽311係吸附與基板SB之下部碰觸之包覆層BL之下表面,另一方面,吸附槽312係吸附較基板SB更外側之包覆層BL之下表面。吸附槽311、312可彼此獨立地打開.關閉吸附,從而可一併使用2種吸附槽311、312而強力地吸附包覆層BL。另一方面,藉由設為僅使用外側之吸附槽312進行吸附,不對有效地形成有圖案之包覆層BL之中央部進行吸附,可防止由於因吸附引起之包覆層BL之撓曲而引起之圖案之損傷。如此,藉由獨立地控制向中央部之吸附槽311與周緣部之吸附槽312之負壓供給,可根據目的而切換包覆層BL之吸附保持之態樣。 The horizontal platform portion 31 is provided with adsorption grooves 311 and 312 for adsorbing and holding the lower surface of the cladding layer BL. The adsorption groove 311 adsorbs the lower surface of the cladding layer BL that is in contact with the lower portion of the substrate SB. On the other hand, the adsorption groove 312 adsorbs the lower surface of the cladding layer BL outside the substrate SB. The adsorption grooves 311, 312 can be opened independently of each other. The adsorption is closed, so that the two types of adsorption grooves 311, 312 can be used together to strongly adsorb the coating layer BL. On the other hand, by using only the outer adsorption groove 312 for adsorption, the central portion of the coating layer BL in which the pattern is effectively formed is not adsorbed, and the deflection of the coating layer BL due to adsorption can be prevented. Damage caused by the pattern. As described above, by independently controlling the supply of the negative pressure to the adsorption grooves 311 at the center portion and the adsorption grooves 312 at the peripheral portion, the adsorption and holding of the coating layer BL can be switched depending on the purpose.
於以此方式吸附保持於平台30之工件WK之上方,配置第1至第4吸附單元51~54、及輥單元34之剝離輥340。如上所述,於第2吸附單元52之下部,在X方向上並列設置有複數個吸附墊527。更詳細而言,吸附墊527具有:吸附部527a,其由例如橡膠或矽樹脂等具有柔軟性及彈性之材料一體地形成,且下表面抵接於工件WK之上表面(更具體而言為基板SB之上表面)而吸附該工件WK;及波紋管部527b,其具有向上下方向(Z方向)之伸縮性。設置於其他吸附單元51、53及 54之吸附墊亦為相同之構造,但以下藉由對設置於該等各吸附單元51、53及54之吸附墊分別標示符號517、537及547而區分彼此。 The first to fourth adsorption units 51 to 54 and the separation roller 340 of the roller unit 34 are disposed above the workpiece WK held by the stage 30 in this manner. As described above, a plurality of adsorption pads 527 are arranged in parallel in the X direction in the lower portion of the second adsorption unit 52. More specifically, the adsorption pad 527 has an adsorption portion 527a integrally formed of a material having flexibility and elasticity such as rubber or silicone resin, and the lower surface abuts on the upper surface of the workpiece WK (more specifically, The workpiece WK is adsorbed on the upper surface of the substrate SB; and the bellows portion 527b has a stretchability in the up-down direction (Z direction). Provided in other adsorption units 51, 53 and The adsorption pads of 54 are also of the same construction, but the following are distinguished by designating symbols 517, 537 and 547 for the adsorption pads provided in the adsorption units 51, 53 and 54 respectively.
第1吸附單元51係設置於水平平台部31之(-Y)側端部之上方,於下降時,吸附基板SB之(-Y)側端部之上表面。另一方面,第4吸附單元54係設置於載置於平台30之基板SB之(+Y)側端部之上方,於下降時,吸附基板SB之(+Y)側端部之上表面。第2吸附單元52及第3吸附單元53係適當地分散配置於該等之間,例如吸附墊517~547可設為於Y方向大致成為等間隔。可於該等吸附單元51~54之間彼此獨立地執行向上下方向之移動及吸附之打開‧關閉。 The first adsorption unit 51 is provided above the (-Y) side end portion of the horizontal platform portion 31, and adsorbs the upper surface of the (-Y) side end portion of the substrate SB when descending. On the other hand, the fourth adsorption unit 54 is disposed above the (+Y) side end portion of the substrate SB placed on the stage 30, and adsorbs the upper surface of the (+Y) side end portion of the substrate SB when descending. The second adsorption unit 52 and the third adsorption unit 53 are appropriately dispersed and disposed therebetween. For example, the adsorption pads 517 to 547 may be substantially equally spaced in the Y direction. The movement in the up and down direction and the opening and closing of the adsorption can be performed independently of each other between the adsorption units 51 to 54.
剝離輥340係向上下方向移動而相對於基板SB接近‧離開移動,並且藉由在Y方向移動而沿著基板SB水平移動。於剝離輥340下降之狀態下,一面抵接於基板SB之上表面而轉動,一面進行水平移動。移動至最(-Y)側時之剝離輥340之位置係第1吸附單元51之最接近吸附墊517之(+Y)側之位置。為了可實現向此種接近位置之配置,對於第1吸附單元51而言係與圖2所示之第2吸附單元52相同之構造者,但如圖1所示般與其他第2至第4吸附單元52~54呈相反朝向而安裝於支持框架50。 The peeling roller 340 moves in the up-down direction to move away from the substrate SB, and moves horizontally along the substrate SB by moving in the Y direction. In a state in which the peeling roller 340 is lowered, it is horizontally moved while abutting against the upper surface of the substrate SB and rotating. The position of the peeling roller 340 when moving to the most (-Y) side is the position of the first adsorption unit 51 closest to the (+Y) side of the adsorption pad 517. In order to realize the arrangement to such an approach position, the first adsorption unit 51 is the same as the second adsorption unit 52 shown in FIG. 2, but as shown in FIG. 1 and other second to fourth The adsorption units 52 to 54 are attached to the support frame 50 in opposite directions.
初始剝離單元33調整其Y方向位置以使得按壓構件331位於突出於傾斜平台部32之上方之包覆層BL之上方。而且,藉由支持臂332下降,按壓構件331下降而其下端按壓包覆層BL之上表面。此時,按壓構件331之前端由彈性構件而形成,而不會使按壓構件331劃傷包覆層BL。 The initial peeling unit 33 adjusts its Y-direction position such that the pressing member 331 is positioned above the cladding layer BL that protrudes above the inclined platform portion 32. Further, by the support arm 332 descending, the pressing member 331 is lowered and the lower end thereof is pressed against the upper surface of the covering layer BL. At this time, the front end of the pressing member 331 is formed by the elastic member without causing the pressing member 331 to scratch the coating layer BL.
其次,對平台30之更詳細之構成進行說明。於該實施形態之平台30,除為了進行工件WK之剝離處理所需之上述各構成外,設置有用以順利地進行工件WK向剝離裝置1之搬入及剝離後之2片板狀體(版或基板與包覆層)之搬出之構成。以下,對該等構成進行說明。 Next, a more detailed configuration of the platform 30 will be described. In the platform 30 of the embodiment, in addition to the above-described respective components required for the peeling process of the workpiece WK, two plate-shaped bodies (plates or plates) for smoothly carrying in and peeling off the workpiece WK to the peeling device 1 are provided. The structure in which the substrate and the cladding layer are carried out. Hereinafter, the configurations will be described.
圖4係表示平台之更詳細之構成之立體圖。如圖4(a)所示,平台30之水平平台部31與傾斜平台部32係分別形成而可分離。傾斜平台部32係可藉由下文將述之水平移動機構,對於水平平台部31於水平方向接近‧離開移動,傾斜平台部32密接於水平平台部31之側面,藉此水平平台部31與傾斜平台部32係一體地作為平台30而發揮功能。 Figure 4 is a perspective view showing a more detailed configuration of the platform. As shown in Fig. 4(a), the horizontal platform portion 31 and the inclined platform portion 32 of the platform 30 are separately formed and separable. The inclined platform portion 32 can be moved away from the horizontal platform portion 31 in the horizontal direction by the horizontal movement mechanism to be described later, and the inclined platform portion 32 is in close contact with the side surface of the horizontal platform portion 31, whereby the horizontal platform portion 31 and the inclined portion The platform unit 32 functions integrally as the platform 30.
於水平平台部31之上表面310,除上述吸附槽311、312外,於複數個部位分別設置有形狀彼此不同之3種開口313、314、315。更具體而言,於水平平台部31之上表面310中之吸附槽311與吸附槽312之間之平坦部分的複數個部位,分散配置具有橢圓形狀之複數個第1開口313。又,於水平平台部31之上表面310之中央部之彼此隔離之4個部位,設置有大致圓形之第2開口314。第1開口313及第2開口314係均不於水平平台部31之上表面310上與吸附槽311、312連接。因此,於第2開口314之周圍,分斷有吸附槽311。又,於外側之吸附槽312與平台外緣之間之複數個部位,分散配置有具有橢圓形狀之複數個第3開口315。 On the upper surface 310 of the horizontal platform portion 31, in addition to the adsorption grooves 311 and 312, three types of openings 313, 314, and 315 having different shapes from each other are provided at a plurality of portions. More specifically, a plurality of first openings 313 having an elliptical shape are dispersedly disposed at a plurality of portions of the flat portion between the adsorption groove 311 and the adsorption groove 312 in the upper surface 310 of the horizontal land portion 31. Further, a substantially circular second opening 314 is provided at four locations where the central portion of the upper surface 310 of the horizontal platform portion 31 is isolated from each other. The first opening 313 and the second opening 314 are not connected to the adsorption grooves 311 and 312 on the upper surface 310 of the horizontal platform portion 31. Therefore, the adsorption groove 311 is divided around the second opening 314. Further, a plurality of third openings 315 having an elliptical shape are dispersedly disposed at a plurality of portions between the outer adsorption groove 312 and the outer edge of the platform.
進而,於水平平台部31中之與傾斜平台部32為相反側、即(+Y)側之端部,在平台上表面310上設置有具有與第3開口315相同程度之開口尺寸之複數個切口部316。外側之吸附槽312係避開切口部316而設置,於水平平台部31之上表面310,吸附槽312不與切口部316連接。 Further, in the end portion of the horizontal platform portion 31 opposite to the inclined platform portion 32, that is, at the (+Y) side, a plurality of opening sizes having the same degree as the third opening 315 are provided on the upper surface 310 of the platform. The cutout portion 316. The outer suction groove 312 is provided to avoid the notch portion 316, and the suction groove 312 is not connected to the cutout portion 316 on the upper surface 310 of the horizontal platform portion 31.
另一方面,於設置傾斜平台部32之側、即(-Y)側之水平平台部31之側面,在X方向上並列配置有4組主升降機36。該等主升降機36之構造係彼此相同。主升降機36之各者包括:升降銷361,其以沿著水平平台部31之側面之方式,精加工成薄板狀;及升降機構365,其自下方支持該升降銷361,並且根據來自控制單元70(圖10)之驅動信號而使該升降銷361於上下方向(Z方向)升降。升降機構365係固定於水平平台部31之底面。 On the other hand, on the side of the horizontal platform portion 31 on the side of the inclined platform portion 32, that is, on the (-Y) side, four sets of main lifters 36 are arranged side by side in the X direction. The construction of the main lifts 36 is identical to each other. Each of the main lifts 36 includes a lift pin 361 that is finished in a thin plate shape along the side of the horizontal platform portion 31, and a lift mechanism 365 that supports the lift pin 361 from below and is based on the control unit The drive signal of 70 (Fig. 10) causes the lift pin 361 to move up and down in the vertical direction (Z direction). The lifting mechanism 365 is fixed to the bottom surface of the horizontal platform portion 31.
圖4(b)係表示升降銷361之概略構造,如該圖所示,升降銷361之上表面361a係精加工成大致平面。於其中央部設置有吸附墊362,吸附墊362係與貫通升降銷361之內部而設置之負壓供給路徑363連通。負壓供給路徑363係經由控制閥而連接於下文將述之負壓供給部704(圖10)。如以下進行說明般,與第1開口313之各者對應而進而設置有具有相同之構造之主升降機36。 Fig. 4(b) shows a schematic structure of the lift pin 361. As shown in the figure, the upper surface 361a of the lift pin 361 is finished to be substantially flat. An adsorption pad 362 is provided at a central portion thereof, and the adsorption pad 362 is in communication with a negative pressure supply path 363 provided through the inside of the lift pin 361. The negative pressure supply path 363 is connected to a negative pressure supply portion 704 (FIG. 10) which will be described later via a control valve. As will be described below, the main elevator 36 having the same structure is further provided corresponding to each of the first openings 313.
圖5係表示圖6至圖8之平台剖面圖之剖面之方向之平台俯視圖。又,圖6係表示主升降機之配置之平台剖面圖。更具體而言,圖6係表示圖5之A-A'切斷面。再者,於圖5中,為了易於觀察圖,於配置該等吸附槽311、312之區域標示點進行表示來取代記載吸附槽311、312。 Figure 5 is a top plan view of the platform showing the direction of the cross-section of the platform of Figures 6-8. 6 is a cross-sectional view of the platform showing the arrangement of the main elevator. More specifically, Fig. 6 shows the cut surface of AA' of Fig. 5. In addition, in FIG. 5, in order to make an easy view, the indication points in the area in which these adsorption tanks 311 and 312 are arrange|positioned are shown, and the adsorption tanks 311 and 312 are mentioned.
如圖6(a)所示,傾斜平台部32係由水平移動機構支持,該水平移動機構包括:導軌321,其自水平平台部31之側面延伸設置於(-Y)方向;滑塊322,其以相對於導軌321而於Y方向上滑動自如之方式卡合;及移動機構323,其使滑塊322於Y方向移動。更具體而言,傾斜平台部32安裝於滑塊322,藉由移動機構323之作動而相對於Y方向、即水平平台部31向接近‧離開方向水平移動。 As shown in FIG. 6(a), the inclined platform portion 32 is supported by a horizontal moving mechanism including: a guide rail 321 extending from the side of the horizontal platform portion 31 in the (-Y) direction; and a slider 322, It is slidably engaged in the Y direction with respect to the guide rail 321, and the moving mechanism 323 moves the slider 322 in the Y direction. More specifically, the inclined platform portion 32 is attached to the slider 322, and is moved horizontally in the Y direction, that is, the horizontal platform portion 31 in the approaching and leaving direction by the movement of the moving mechanism 323.
與水平平台部31相接觸之傾斜平台部32之(+Y)側之側面係與主升降機36之升降銷361對應而切口,從而避免傾斜平台部32與水平平台部31結合時之與升降銷361之干涉。 The side of the (+Y) side of the inclined platform portion 32 that is in contact with the horizontal platform portion 31 is cut in correspondence with the lift pin 361 of the main lift 36, thereby avoiding the lift pin when the inclined platform portion 32 is combined with the horizontal platform portion 31. 361 interference.
相對於穿設於水平平台部31之上表面310之複數個第1開口313,分別按照1組設置有主升降機36。即,於自第1開口313貫通至水平平台部31之底面為止之貫通孔之下端,安裝升降機構365,升降銷361插通於各開口313。相對於未出現於圖6(a)之其他第1開口313,亦相同地按照1組設置有主升降機36。 The main lift 36 is provided in one set for each of the plurality of first openings 313 that are formed on the upper surface 310 of the horizontal platform portion 31. In other words, the elevating mechanism 365 is attached to the lower end of the through hole from the first opening 313 to the bottom surface of the horizontal platform portion 31, and the lift pin 361 is inserted into each of the openings 313. The main elevator 36 is also provided in the same group with respect to the other first openings 313 which are not shown in Fig. 6(a).
各主升降機36係根據來自控制單元70之驅動信號而進行相同之動作。即,各升降銷361可分別定位於下部位置與上部位置,該下部 位置係如圖6(a)所示般其上端後退至較水平平台部31之上表面310更下方,該上部位置係如圖6(b)所示般上端突出於較水平平台部31之上表面310更上方。根據來自控制單元70之驅動信號,各升降銷361於上部位置與下部位置之間一同升降。再者,如圖6(b)所示,升降銷361之向上部位置之定位係於使傾斜平台部32自水平平台部31離開之狀態下進行,安裝於水平平台部31之(-Y)側之側面之主升降機36的升降銷361係通過水平平台部31與傾斜平台部32之間之間隙而升降。 Each of the main elevators 36 performs the same operation based on the drive signal from the control unit 70. That is, each of the lift pins 361 can be respectively positioned at a lower position and an upper position, the lower portion The position is as shown in FIG. 6(a), and the upper end thereof is retracted below the upper surface 310 of the horizontal platform portion 31, and the upper position protrudes above the horizontal platform portion 31 as shown in FIG. 6(b). Surface 310 is further above. According to the drive signal from the control unit 70, each of the lift pins 361 is raised and lowered together between the upper position and the lower position. Further, as shown in FIG. 6(b), the positioning of the upper portion of the lift pin 361 is performed in a state where the inclined platform portion 32 is separated from the horizontal platform portion 31, and is mounted on the horizontal platform portion 31 (-Y). The lift pin 361 of the main lift 36 on the side of the side is lifted and lowered by the gap between the horizontal platform portion 31 and the inclined platform portion 32.
圖7係表示圖5之B-B'切斷面之平台剖面圖,且係表示子升降機之配置之圖。再者,對於傾斜平台部32及水平移動機構係省略圖示。於設置於水平平台部31之上表面310之中央部之4個部位的第2開口314之各者,安裝有子升降機37。更詳細而言,子升降機37包括:升降銷371,其插通於自第2開口314貫通至水平平台部31之底面為止之貫通孔;及升降機構375,其安裝於平台底面而使升降銷371於上下方向、即Z方向升降。升降銷371係上端呈大致圓板狀,根據來自控制單元70之驅動信號而於下部位置與上部位置之間升降,該下部位置係如圖7(a)所示般其上端後退至較水平平台部31之上表面310更下方,該上部位置係如圖7(c)所示般上端突出於較水平平台部31之上表面310更上方。 Fig. 7 is a cross-sectional view showing the platform of the cut surface of Fig. 5B', and showing the arrangement of the sub-lift. In addition, illustration of the inclined platform portion 32 and the horizontal movement mechanism is omitted. The sub-lift 37 is attached to each of the second openings 314 provided at four locations in the central portion of the upper surface 310 of the horizontal platform portion 31. More specifically, the sub-lift 37 includes a lift pin 371 that is inserted through a through hole that penetrates from the second opening 314 to the bottom surface of the horizontal platform portion 31, and a lift mechanism 375 that is attached to the bottom surface of the platform to lift the pin 371 is raised and lowered in the up and down direction, that is, in the Z direction. The lift pin 371 has a substantially disk-shaped upper end and is lifted between a lower position and an upper position according to a drive signal from the control unit 70. The lower position is retracted to a horizontal platform as shown in Fig. 7(a). The upper surface 310 of the portion 31 is further below, and the upper portion protrudes above the upper surface 310 of the horizontal platform portion 31 as shown in Fig. 7(c).
複數個主升降機36係根據來自控制單元70之驅動信號而一同進行相同之動作,另一方面,複數個子升降機37亦根據來自控制單元70之驅動信號而一同進行相同之動作。然而,主升降機36與子升降機37之間係彼此獨立地進行動作。因此,該實施形態係可切換如下3個狀態:如圖7(a)所示,主升降機36之升降銷361與子升降機37之升降銷371均處於下部位置之狀態;如圖7(b)所示,僅主升降機36之升降銷361處於上部位置之狀態;及如圖7(c)所示,主升降機36之升降銷361與子升降機37之升降銷371均處於上部位置之狀態。 The plurality of main lifts 36 perform the same operation together based on the drive signals from the control unit 70. On the other hand, the plurality of sub-lifts 37 also perform the same operation in accordance with the drive signals from the control unit 70. However, the main lift 36 and the sub-lift 37 operate independently of each other. Therefore, in this embodiment, the following three states can be switched: as shown in FIG. 7(a), the lift pin 361 of the main lift 36 and the lift pin 371 of the sub-lift 37 are in the lower position; as shown in FIG. 7(b) As shown, only the lift pin 361 of the main lift 36 is in the upper position; and as shown in Fig. 7(c), the lift pin 361 of the main lift 36 and the lift pin 371 of the sub-lift 37 are in the upper position.
圖8係表示圖5之C-C'切斷面之平台剖面圖,且係表示邊緣升降機之配置之圖。再者,對於傾斜平台部32及水平移動機構係省略圖示。邊緣升降機38包括:複數個振盪臂381,其等分別插通於自第3開口315貫通至水平平台部31之底面為止之貫通孔且一端延伸至平台上表面310為止;支持框架382,其支持振盪臂381之中央部使其振盪自如;驅動桿383,其連結於各振盪臂381之另一端;及移動機構384,其使驅動桿383於Y方向往復移動。 Fig. 8 is a cross-sectional view showing the platform of the C-C' cut surface of Fig. 5, and showing the arrangement of the edge lift. In addition, illustration of the inclined platform portion 32 and the horizontal movement mechanism is omitted. The edge lifter 38 includes a plurality of oscillating arms 381 that are respectively inserted through the through holes from the third opening 315 to the bottom surface of the horizontal platform portion 31 and one end extends to the upper surface 310 of the platform; the support frame 382 supports The central portion of the oscillating arm 381 is oscillated freely; a drive lever 383 coupled to the other end of each of the oscillating arms 381; and a moving mechanism 384 for reciprocating the drive lever 383 in the Y direction.
藉由移動機構384之作動而驅動桿383於Y方向移動,藉此各振盪臂381一同振盪而可切換如下狀態:如圖8(a)所示,各振盪臂381之上端381a自平台上表面310略微向下方後退之狀態;如圖8(b)所示,各振盪臂381之上端381a自平台上表面310略微向上方突出之狀態。於設置於水平平台部31之(+Y)側端部之切口部316,亦設置包含相同之機構之邊緣升降機。然而,該情形時之振盪臂381係排列於X方向。 The driving rod 383 is moved in the Y direction by the movement of the moving mechanism 384, whereby the oscillation arms 381 are oscillated together to switch the following state: as shown in FIG. 8(a), the upper end 381a of each of the oscillation arms 381 is from the upper surface of the platform. 310 is slightly retracted downward; as shown in FIG. 8(b), the upper end 381a of each of the oscillation arms 381 protrudes slightly upward from the upper surface 310 of the platform. An edge lifter including the same mechanism is also provided in the cutout portion 316 provided at the (+Y) side end portion of the horizontal platform portion 31. However, in this case, the oscillation arms 381 are arranged in the X direction.
如上所述,於水平平台部31之上表面310,設置用以使吸附槽311、312或各種機構升降之開口313~315等、自平台上表面310向下方凹陷之凹部。然而,就使工件WK抵接而保持平面姿勢之原本之功能而言,較理想的是平台上表面310儘可能地平坦。即,較理想的是平台上表面310中之由格子狀之吸附槽311、312包圍之矩形區域之各者、開口313~315之周圍之平面部、及較吸附槽312更外側之平面部之各者具有較高之平面度,並且該等均處於單一之平面上。又,對於吸附槽及各開口,亦較佳為其開口尺寸儘可能地小者。因此,該實施形態係使用如圖4(b)所示般精加工成薄型之升降銷361。 As described above, the upper surface 310 of the horizontal platform portion 31 is provided with recesses 313 to 315 for lifting and lowering the adsorption grooves 311 and 312 or various mechanisms, and recesses recessed downward from the upper surface 310 of the platform. However, in terms of the function of abutting the workpiece WK to maintain the planar posture, it is desirable that the upper surface 310 of the platform be as flat as possible. That is, it is preferable that each of the rectangular regions surrounded by the lattice-shaped adsorption grooves 311, 312 in the upper surface 310 of the platform, the planar portion around the openings 313 to 315, and the flat portion outside the adsorption groove 312 Each has a higher degree of flatness and these are all on a single plane. Further, it is preferable that the size of the opening of the adsorption tank and each opening is as small as possible. Therefore, this embodiment uses a lift pin 361 which is finished into a thin shape as shown in Fig. 4 (b).
就確保較高之平面度之方面而言,對於水平平台部31,較理想的是由不具有延展性之材料而構成。例如,可較佳地應用於石板或石英板等刻設吸附槽等開口而進行平面研磨(或者其相反順序)者。例如,如不鏽鋼之金屬材料係即便進行平面研磨,亦無法完全去除開口 之周圍之微細之凹凸,而此種凹凸可成為損壞剝離之良好度之原因。 In terms of ensuring a high degree of flatness, it is preferable for the horizontal stage portion 31 to be composed of a material having no ductility. For example, it can be preferably applied to a surface such as a slate or a quartz plate in which an opening such as an adsorption groove is formed to perform planar polishing (or the reverse order). For example, a metal material such as stainless steel cannot completely remove the opening even if it is ground-polished. The fine concavities around it, and such irregularities can be a cause of damage to the peeling.
圖9係表示平台與載置於該平台之工件之位置關係之圖。於基板SB與包覆層BL密接而成之工件WK中,包覆層BL具有大於基板SB之平面尺寸。因此,基板SB係其整個面與包覆層BL對向,與此相對,包覆層BL係其中央部分與基板SB對向,但周緣部成為不與基板SB對向之空白部分。於基板SB之表面區域中之除周緣部之中央部分,設定有效地轉印圖案而作為器件發揮功能之有效區域AR。因此,該剝離裝置1之目的在於,不損傷自包覆層BL轉印至基板SB之有效區域AR之圖案,而剝離基板SB與包覆層BL。 Figure 9 is a diagram showing the positional relationship between the platform and the workpiece placed on the platform. In the workpiece WK in which the substrate SB and the cladding layer BL are in close contact with each other, the cladding layer BL has a planar size larger than that of the substrate SB. Therefore, the entire surface of the substrate SB is opposed to the cladding layer BL, whereas the central portion of the cladding layer BL faces the substrate SB, but the peripheral portion is a blank portion that does not face the substrate SB. In the central portion of the surface region of the substrate SB excluding the peripheral portion, an effective region AR that functions as a device is effectively set by transferring the pattern. Therefore, the purpose of the peeling apparatus 1 is to peel off the substrate SB and the cladding layer BL without damaging the pattern transferred from the cladding layer BL to the effective region AR of the substrate SB.
工件WK係以基板SB之有效區域AR之整體位於水平平台部31之上表面310之方式,載置於平台30。另一方面,於較有效區域AR更外側,基板SB之(-Y)側端部係定位於較水平平台部31與傾斜平台部32之交界之脊線部E略微向(-Y)側突出之位置。 The workpiece WK is placed on the stage 30 such that the entire effective area AR of the substrate SB is located on the upper surface 310 of the horizontal platform portion 31. On the other hand, on the outer side of the more effective area AR, the (-Y) side end portion of the substrate SB is positioned to protrude slightly toward the (-Y) side of the ridge line portion E at the boundary between the horizontal platform portion 31 and the inclined platform portion 32. The location.
於圖中,標示有點之區域R1係表示藉由吸附槽311吸附包覆層BL之區域。藉由吸附槽311而吸附之區域R1覆蓋有效區域AR之整體。又,區域R2係表示藉由吸附槽312而吸附包覆層BL之區域。吸附槽312係於較有效區域AR更外側吸附包覆層BL。因此,例如僅藉由吸附槽312而吸附包覆層BL之態樣係避免有效區域AR內之圖案受到吸附之影響。對於圖9所示之其他區域R3至R8係於之後之動作說明時進行說明。 In the figure, a region R1 indicating a dot indicates a region where the coating layer BL is adsorbed by the adsorption groove 311. The region R1 adsorbed by the adsorption groove 311 covers the entirety of the effective region AR. Further, the region R2 indicates a region where the coating layer BL is adsorbed by the adsorption groove 312. The adsorption tank 312 is attached to the outer side of the more effective area AR to adsorb the coating layer BL. Therefore, for example, the state in which the coating layer BL is adsorbed only by the adsorption tank 312 prevents the pattern in the effective area AR from being affected by the adsorption. The other regions R3 to R8 shown in FIG. 9 will be described later in the description of the operation.
圖10係表示該剝離裝置之電性構成之方塊圖。裝置各部係藉由控制單元70而控制。控制單元70包括:CPU(Central Processing Unit,中央處理單元)701,其管理裝置整體之動作;馬達控制部702,其控制設置於各部之馬達類;閥控制部703,其控制設置於各部之閥類;負壓供給部704,其產生供給至各部之負壓;及使用者介面(UI)部705,其用以接受自使用者之操作輸入、或將裝置之狀態報告給使用 者。再者,於可利用工廠輸電管線等自外部供給之負壓之情形時,控制單元70亦可不包括負壓供給部。 Fig. 10 is a block diagram showing the electrical configuration of the peeling device. The various parts of the device are controlled by the control unit 70. The control unit 70 includes a CPU (Central Processing Unit) 701 that manages the operation of the entire device, a motor control unit 702 that controls the motors provided in the respective units, and a valve control unit 703 that controls the valves provided in the respective units. a negative pressure supply unit 704 that generates a negative pressure supplied to each unit; and a user interface (UI) unit 705 for accepting an operation input from a user or reporting the status of the device to use By. Further, the control unit 70 may not include the negative pressure supply portion when the negative pressure supplied from the outside such as the factory power transmission line can be utilized.
馬達控制部702係驅動控制設置於平台塊3之馬達353、分別設置於升降機構335、344、365、375及移動機構323、384、上部吸附塊5之各吸附單元51~54之升降機構525等之馬達群。再者,此處作為各可動部之驅動源而代表性地記載馬達,但並不限定於此,亦可根據其用途而將例如氣缸、電磁圈(solenoid)、壓電元件等各種致動器用作驅動源。 The motor control unit 702 drives and controls the motor 353 provided in the platform block 3, and the lifting mechanism 525 provided in each of the lifting units 335, 344, 365, and 375 and the moving mechanisms 323 and 384 and the adsorption units 51 to 54 of the upper adsorption block 5, respectively. Wait for the motor group. In addition, although the motor is typically described as a driving source of each movable portion, the motor is not limited thereto, and various actuators such as a cylinder, a solenoid, and a piezoelectric element may be used depending on the application. As a driving source.
閥控制部703係控制設置於平台塊3之閥群V3、及設置於上部吸附塊5之閥群V5等。閥群V3包含如下各種閥:設置於自負壓供給部704連結於設置於水平平台部31之吸附槽311、312及設置於升降銷361之吸附墊362之配管路徑上,用以對該等吸附槽及吸附墊個別地供給特定之負壓。閥群V5包含如下各種閥:設置於自負壓供給部704連結於各吸附墊517~547之配管路徑上,用以對各吸附墊517~547供給特定之負壓。 The valve control unit 703 controls the valve group V3 provided in the stage block 3, the valve group V5 provided in the upper adsorption block 5, and the like. The valve group V3 includes valves that are connected to the suction grooves 311 and 312 provided in the horizontal platform unit 31 and the adsorption paths 362 provided on the lift pins 361 from the negative pressure supply unit 704 for use in the same. The adsorption tank and the adsorption pad are individually supplied with a specific negative pressure. The valve group V5 includes various valves that are provided on the piping path that is connected to the adsorption pads 517 to 547 from the negative pressure supply unit 704, and supplies a specific negative pressure to each of the adsorption pads 517 to 547.
其次,一面參照圖11至圖15,一面對如上所述般構成之剝離裝置1之剝離動作進行說明。圖11係表示剝離處理之流程圖。又,圖12至圖15係表示處理中之各階段之各部之位置關係的圖,且係模式性地表示處理之進行狀況者。該剝離處理係藉由執行CPU701預先記憶之處理程式而控制各部完成。 Next, a peeling operation of the peeling device 1 configured as described above will be described with reference to Figs. 11 to 15 . Fig. 11 is a flow chart showing the peeling process. 12 to 15 are diagrams showing the positional relationship of each unit in each stage of the process, and schematically showing the progress of the process. This stripping process is performed by executing the processing program previously stored by the CPU 701 to control the completion of each unit.
首先,藉由操作員或外部之搬送機器人等而向平台30上之上述位置載入工件WK(步驟S101)。圖12係模式性地表示自外部搬入之工件WK載置至平台30為止之狀態。圖12(a)係表示工件WK之搬入前之平台30之狀態。此時,主升降機36之升降銷361、子升降機37之升降銷371及振盪臂381之上端係均處於退避至較平台上表面310更下方之位置。 First, the workpiece WK is loaded to the above position on the stage 30 by an operator or an external transfer robot or the like (step S101). FIG. 12 schematically shows a state in which the workpiece WK loaded from the outside is placed on the stage 30. Fig. 12 (a) shows the state of the stage 30 before the workpiece WK is carried in. At this time, the lift pin 361 of the main lift 36, the lift pin 371 of the sub-lift 37, and the upper end of the oscillating arm 381 are both retracted to a position lower than the upper surface 310 of the platform.
於該狀態下,如圖12(b)所示,由操作員操作或利用設置於搬送機器人之工件用手WH,以支持下表面之狀態搬入工件WK。接著,主升降機36之升降銷361上升而其上端移動至較平台上表面310更突出之上部位置為止,從而抵接於工件WK之下表面,更具體而言,抵接於包覆層BL之下表面。此時,如圖6(b)所示,傾斜平台部32自水平平台部31離開,升降銷361自其等之間隙突出。再者,亦可於工件WK之搬入前、或與該搬入並行地使升降銷361上升。 In this state, as shown in FIG. 12(b), the workpiece WK is carried by the operator or by using the workpiece WH provided on the transfer robot to support the lower surface. Then, the lift pin 361 of the main lift 36 rises and the upper end thereof moves to a position higher than the upper surface 310 of the platform to abut the upper surface of the workpiece WK, and more specifically, abuts against the cladding layer BL. lower surface. At this time, as shown in FIG. 6(b), the inclined platform portion 32 is separated from the horizontal platform portion 31, and the lift pins 361 protrude from the gaps thereof. Further, the lift pin 361 may be raised before the workpiece WK is carried in or in parallel with the carry-in.
於包覆層BL之下表面區域中之上表面側,重疊基板SB與包覆層BL,且於較形成有有效之圖案等之有效區域AR更外側之可抵接區域TR內,工件用手WH及升降銷361抵接於包覆層BL之下表面。即,工件WK之支持係藉由如下方式進行:於該可抵接區域TR內,使支持構件(升降銷361及工件用手WH)抵接於包覆層BL之下表面。不使支持構件抵接於有效區域AR內、或較可抵接區域TR更外側之不與基板SB重疊之區域。設為如上所述之原因如下。 On the upper surface side in the lower surface area of the cladding layer BL, the substrate SB and the cladding layer BL are overlapped, and in the abutable region TR which is outside the effective region AR in which an effective pattern or the like is formed, the workpiece is manually The WH and the lift pins 361 abut against the lower surface of the cladding layer BL. That is, the support of the workpiece WK is performed by abutting the support member (the lift pin 361 and the workpiece hand WH) against the lower surface of the cover layer BL in the abuttable region TR. The support member is not brought into contact with the region of the effective region AR or the outer side of the abuttable region TR that does not overlap the substrate SB. The reason set as described above is as follows.
於自外部搬入平板狀之工件WK而載置至平坦之平台30之過程中,需要暫時性地以局部性地支持工件WK之狀態進行交付。此時,於該支持部位,對載持於基板SB與包覆層BL之間之圖案等施加局部性之按壓力。由於存在因此種不均勻之按壓力引起之應力集中損壞圖案等之虞,故較理想的是對於形成有有效之圖案等之有效區域AR避開支持構件之抵接。 In the process of loading the flat workpiece WK from the outside and placing it on the flat platform 30, it is necessary to temporarily support the state of the workpiece WK in a partial manner. At this time, a local pressing force is applied to the pattern or the like between the substrate SB and the cladding layer BL at the support portion. Since there is a stress concentration due to such a non-uniform pressing force to damage the pattern or the like, it is preferable to avoid the contact of the supporting member with respect to the effective region AR in which an effective pattern or the like is formed.
另一方面,於較可抵接區域TR更外側之支持係於支持部位之上部不存在基板SB,故必須由包覆層BL之剛性支持工件WK整體之重量。特別是,於伴隨基板SB之大型化而工件WK之質量變大之情形時,存在包覆層BL無法耐此種負重而破損之虞。又,即便未至破損,亦存在如下情形:因負重而包覆層BL撓曲,藉此與基板SB之間產生偶發性之剝離。 On the other hand, the support outside the more abuttable region TR is such that the substrate SB is not present on the upper portion of the support portion, so the weight of the entire workpiece WK must be supported by the rigidity of the cover layer BL. In particular, when the mass of the workpiece WK increases as the substrate SB is enlarged, the coating layer BL cannot be damaged by such a load. Further, even if it is not damaged, there is a case where the coating layer BL is deflected by the load, whereby sporadic peeling occurs between the substrate SB and the substrate SB.
該實施形態係將基板SB與包覆層BL於較有效區域AR更外側密接之區域設為可抵接區域TR。使支持構件(工件用手WH及升降銷361)抵接於該可抵接區域TR內之包覆層BL之下表面,藉此可將如上所述之問題防患於未然。藉由支持該區域TR,可由基板SB之剛性與包覆層BL之剛性支撐工件WK之重量,從而亦可防止有效區域AR內之圖案等之損傷(damage)。 In this embodiment, a region in which the substrate SB and the cladding layer BL are in close contact with each other on the outer side of the effective area AR is referred to as a contactable region TR. The support member (the workpiece hand WH and the lift pin 361) is brought into contact with the lower surface of the coating layer BL in the abuttable region TR, whereby the problem as described above can be prevented. By supporting the region TR, the weight of the workpiece WK can be supported by the rigidity of the substrate SB and the rigidity of the cladding layer BL, and damage to the pattern or the like in the effective region AR can also be prevented.
圖9所示之區域R6係表示升降銷361之上表面361a抵接之包覆層BL之下表面區域。如該圖所示,於以包圍有效區域AR之周圍之方式分散配置之複數個部位,抵接於包覆層BL而支持工件WK,藉此可確實地支持工件WK。又,平坦地精加工各升降銷上表面361a,藉此可於抵接部位,使施加至包覆層BL之壓力分散。再者,於在有效區域AR之周圍間斷之區域R6抵接升降銷361之原因在於,可使工件用手WH通過升降銷361之間而進入。 The region R6 shown in Fig. 9 indicates the lower surface area of the cladding layer BL where the upper surface 361a of the lift pin 361 abuts. As shown in the figure, the workpiece WK is supported by the plurality of portions dispersed so as to surround the periphery of the effective area AR, and the workpiece WK is supported by the coating layer BL. Further, each of the lift pin upper surfaces 361a is finished flatly, whereby the pressure applied to the coating layer BL can be dispersed at the contact portion. Further, the reason why the region R6 is interrupted in the region around the effective region AR against the lift pin 361 is that the workpiece can be moved by the hand WH through the lift pin 361.
返回至圖12(b),於以此方式使升降銷361抵接於包覆層BL之下表面後,對於工件用手WH係使其向裝置外退避。藉此,如圖12(c)所示,工件WK交付至升降銷361而成為藉由升降銷361之自下表面之抵接而支持之狀態。此時,對設置於升降銷361之上表面之吸附墊362供給負壓而吸附保持包覆層BL之下表面,藉此可防止工件WK之位置偏移或掉落。於該情形時,亦藉由吸附較有效區域AR更外側而避免對圖案等之損傷。 Returning to Fig. 12(b), after the lift pin 361 abuts against the lower surface of the cover layer BL in this manner, the workpiece is manually retracted toward the outside of the apparatus by the WH. As a result, as shown in FIG. 12(c), the workpiece WK is delivered to the lift pin 361 and is supported by the abutment of the lift pin 361 from the lower surface. At this time, a negative pressure is applied to the adsorption pad 362 provided on the upper surface of the lift pin 361 to adsorb and hold the lower surface of the cladding layer BL, whereby the position of the workpiece WK can be prevented from shifting or falling. In this case, damage to the pattern or the like is also avoided by adsorbing the outer side of the more effective area AR.
升降銷361自該狀態下降而移動至下部位置,並且解除吸附墊362之吸附,藉此,如圖12(d)所示,升降銷361自包覆層BL之下表面離開而工件WK被交付至平台30之上表面310。接著,傾斜平台部32向水平平台部31側移動,如圖6(a)所示般與水平平台部31一體化。 The lift pin 361 is lowered from this state to move to the lower position, and the suction of the suction pad 362 is released, whereby, as shown in Fig. 12(d), the lift pin 361 is separated from the lower surface of the cover layer BL and the workpiece WK is delivered. To the upper surface 310 of the platform 30. Next, the inclined platform portion 32 moves toward the horizontal platform portion 31 side, and is integrated with the horizontal platform portion 31 as shown in Fig. 6(a).
返回至圖11,若以此方式而工件WK載置至平台30,則裝置各部設定為特定之初始狀態(步驟S102)。初始狀態係工件WK藉由吸附槽 311、312中之一者或兩者吸附保持而初始剝離單元33之按壓構件331、輥單元34之剝離輥340、第1至第4吸附單元51~54之吸附墊517~547均自工件WK離開。又,剝離輥340係於其可動範圍內,處於最靠近(-Y)側之位置。 Returning to Fig. 11, if the workpiece WK is placed on the stage 30 in this manner, the respective parts of the apparatus are set to a specific initial state (step S102). The initial state is the workpiece WK by the adsorption tank One or both of 311, 312 are adsorbed and held, and the pressing member 331 of the initial peeling unit 33, the peeling roller 340 of the roller unit 34, and the adsorption pads 517 to 547 of the first to fourth adsorption units 51 to 54 are all from the workpiece WK. go away. Further, the peeling roller 340 is in the movable range and is located closest to the (-Y) side.
使第1吸附單元51及剝離輥340自該狀態下降而分別抵接於工件WK之上表面(步驟S103)。此時,如圖13(a)所示,第1吸附單元51之吸附墊517吸附基板SB之(-Y)側端部之上表面,剝離輥340係於其(+Y)側鄰接位置抵接於基板SB之上表面。於圖13(a)中,標示於按壓構件331之附近之向下箭頭係意味著於繼續之步驟中,按壓構件331自圖所示之狀態向該箭頭方向移動。於以下之圖中亦相同。 The first adsorption unit 51 and the peeling roller 340 are lowered from the state and abut against the upper surface of the workpiece WK (step S103). At this time, as shown in Fig. 13 (a), the adsorption pad 517 of the first adsorption unit 51 adsorbs the upper surface of the (-Y) side end portion of the substrate SB, and the peeling roller 340 is attached to the (+Y) side adjacent position. Connected to the upper surface of the substrate SB. In Fig. 13(a), the downward arrow indicated in the vicinity of the pressing member 331 means that the pressing member 331 moves in the direction of the arrow from the state shown in the drawing in the continuation step. The same is true in the figures below.
圖9所示之區域R3係表示此時藉由第1吸附單元51而吸附基板SB之區域,區域R4係表示剝離輥340抵接於基板SB之區域。如圖9所示,第1吸附單元51吸附保持基板SB之(-Y)側端部,另一方面,剝離輥340係於鄰接於第1吸附單元51之吸附區域R3之(+Y)側之區域R4,抵接於基板SB。剝離輥340抵接之抵接區域R4係設為較有效區域AR更外側、即自有效區域AR靠近(-Y)側之位置。因此,有效區域AR之內部不受第1吸附單元51之吸附、剝離輥340之按壓中之任一者。 The region R3 shown in FIG. 9 indicates a region where the substrate SB is adsorbed by the first adsorption unit 51 at this time, and the region R4 indicates a region where the peeling roller 340 abuts on the substrate SB. As shown in FIG. 9, the first adsorption unit 51 adsorbs the (-Y) side end portion of the holding substrate SB, and the peeling roller 340 is attached to the (+Y) side of the adsorption region R3 adjacent to the first adsorption unit 51. The region R4 is in contact with the substrate SB. The abutting region R4 where the peeling roller 340 abuts is set to be outside the effective area AR, that is, a position closer to the (-Y) side from the effective area AR. Therefore, the inside of the effective area AR is not affected by the adsorption by the first adsorption unit 51 or the pressing of the peeling roller 340.
返回至圖11,其次使初始剝離單元33作動,使按壓構件331下降而按壓包覆層BL端部(步驟S104)。包覆層BL之端部係突出於傾斜平台部32之上方,於該包覆層BL之下表面與傾斜平台32之上表面320之間存在間隙。因此,如圖13(b)所示,按壓構件331向下方按壓包覆層BL之端部,藉此包覆層BL之端部沿著傾斜平台部32之傾斜面而向下方彎曲。其結果,藉由第1吸附單元51而吸附保持之基板SB之端部與包覆層BL之間離開而開始剝離。按壓構件331係形成為於X方向延伸之棒狀,而且其X方向長度較包覆層BL更長地設定。因此,如圖9所示,按壓構件331抵接於包覆層BL之抵接區域R5係自包覆層BL之(-X) 側端部至(+X)側端部為止延伸成直線狀。以此方式,可使包覆層BL彎曲成柱面狀,從而可將基板SB與包覆層BL已剝離之剝離區域、與仍未剝離之未剝離區域之交界線(以下,稱為「剝離交界線」)設為直線狀。 Returning to Fig. 11, the initial peeling unit 33 is actuated, and the pressing member 331 is lowered to press the end of the coating layer BL (step S104). The end of the cladding layer BL protrudes above the inclined platform portion 32, and there is a gap between the lower surface of the cladding layer BL and the upper surface 320 of the inclined platform 32. Therefore, as shown in FIG. 13(b), the pressing member 331 presses the end portion of the covering layer BL downward, whereby the end portion of the covering layer BL is bent downward along the inclined surface of the inclined land portion 32. As a result, the end portion of the substrate SB adsorbed and held by the first adsorption unit 51 is separated from the coating layer BL to start peeling. The pressing member 331 is formed in a rod shape extending in the X direction, and its length in the X direction is set longer than the coating layer BL. Therefore, as shown in FIG. 9 , the pressing member 331 abuts against the abutment region R5 of the cladding layer BL from the cladding layer BL (-X). The side end portion to the (+X) side end portion extends in a straight line shape. In this manner, the coating layer BL can be bent into a cylindrical shape, and the boundary between the peeled region where the substrate SB and the coating layer BL have been peeled off and the unpeeled region where the coating layer BL has not been peeled off (hereinafter referred to as "peeling" can be performed. The boundary line") is set to be linear.
自該狀態開始第1吸附單元51之上升,並且與此同步而使剝離輥340向(+Y)方向移動(步驟S105)。具體而言,於因第1吸附單元51之上升而向(+Y)方向移動之剝離交界線到達剝離輥340之正下方之時點,開始剝離輥340之移動。藉此,圖9所示之抵接區域R4向(+Y)方向移動。此後,第1吸附單元51以固定速度向上方、即(+Z)方向移動,又,剝離輥340以固定速度向(+Y)方向移動。 From this state, the first adsorption unit 51 is raised, and in synchronization with this, the peeling roller 340 is moved in the (+Y) direction (step S105). Specifically, the movement of the peeling roller 340 is started when the peeling boundary line that moves in the (+Y) direction by the rise of the first adsorption unit 51 reaches the immediately below the peeling roller 340. Thereby, the contact region R4 shown in FIG. 9 is moved in the (+Y) direction. Thereafter, the first adsorption unit 51 moves upward at a fixed speed, that is, in the (+Z) direction, and the peeling roller 340 moves in the (+Y) direction at a fixed speed.
如圖13(c)所示,保持基板SB之端部之第1吸附單元51上升,藉此提拉基板SB而與包覆層BL之剝離朝向(+Y)方向進行。此時,由於抵接剝離輥340,故不存在超過剝離輥340之抵接區域R4(圖9)而進行剝離之情形。一面使剝離輥340抵接於基板SB,一面以固定速度向(+Y)方向移動,藉此可固定地維持剝離之進行速度。即,剝離交界線成為沿著輥延伸設置方向即X方向之一直線,而且以固定速度向(+Y)方向進行。藉此,可確實地防止由於因剝離之進行速度之變動引起之應力集中而引起之圖案之損傷。 As shown in FIG. 13(c), the first adsorption unit 51 holding the end portion of the substrate SB is raised, whereby the substrate SB is pulled up and the peeling direction of the cladding layer BL is performed in the (+Y) direction. At this time, since the peeling roller 340 is abutted, there is no case where the contact region R4 ( FIG. 9 ) of the peeling roller 340 is not peeled off. When the peeling roller 340 is brought into contact with the substrate SB and moved in the (+Y) direction at a constant speed, the peeling speed can be fixedly maintained. In other words, the peeling boundary line is a straight line along the direction in which the roller extends, that is, the X direction, and is performed at a fixed speed in the (+Y) direction. Thereby, it is possible to surely prevent the damage of the pattern due to the stress concentration caused by the change in the speed of the peeling.
繼而,將用於以下之處理之內部之控制參數N的值設定為2(步驟S106)。接著,等待剝離輥340通過第N吸附位置(步驟S107)。第N吸附位置係基板SB之上表面中之第N吸附單元(N=1~4)之正下方位置,且係接受該第N吸附單元之吸附之位置。 Then, the value of the internal control parameter N used for the following processing is set to 2 (step S106). Next, the peeling roller 340 is waited for the Nth adsorption position to pass (step S107). The Nth adsorption position is a position immediately below the Nth adsorption unit (N=1 to 4) in the upper surface of the substrate SB, and is a position at which the adsorption of the Nth adsorption unit is received.
此處,由於N=2,因此等待至剝離輥340通過第2吸附位置、即第2吸附單元52之正下方位置。若剝離輥340通過第2吸附位置(於步驟S107中為是),則開始第2吸附單元52之下降,藉由第2吸附單元52之吸附墊527捕捉基板SB(步驟S108)。 Here, since N=2, the peeling roller 340 is waited for the second adsorption position, that is, the position directly below the second adsorption unit 52. When the peeling roller 340 passes the second adsorption position (YES in step S107), the lowering of the second adsorption unit 52 is started, and the substrate SB is captured by the adsorption pad 527 of the second adsorption unit 52 (step S108).
如圖13(d)所示,由於剝離輥340已通過,因此成為如下狀態:於第2吸附單元52之正下方位置,基板SB自包覆層BL剝離而向上方浮升。一面對由具有伸縮性之彈性構件構成之吸附墊527賦予負壓,一面接近基板SB,藉此可於吸附墊527之下表面抵接於基板SB之上表面之時間點,捕捉吸附基板SB。亦可為如下之態樣:於使吸附墊527下降至特定位置後,使提拉之基板SB待機。無論為哪種情形時,均可藉由使吸附墊具有柔軟性而防止吸附之失敗。 As shown in FIG. 13(d), since the peeling roller 340 has passed, the substrate SB is peeled off from the coating layer BL and floated upward at a position directly below the second adsorption unit 52. When the negative pressure is applied to the adsorption pad 527 composed of the elastic member having elasticity, the substrate SB is approached, whereby the adsorption substrate SB can be captured at a time point when the lower surface of the adsorption pad 527 abuts the upper surface of the substrate SB. . It is also possible to make the lifted substrate SB stand by after the adsorption pad 527 is lowered to a specific position. In either case, the failure of adsorption can be prevented by making the adsorption pad soft.
於開始基板SB之吸附後,將第2吸附單元52之移動變換為上升(步驟S109)。藉此,如圖14(a)所示,剝離之進行速度仍然藉由剝離輥340而控制,並且用以剝離之基板SB之提拉之主體係自第1吸附單元51承接至第2吸附單元52。又,剝離後之基板SB係自僅利用第1吸附單元51之保持切換至利用第1吸附單元51與第2吸附單元52之保持,從而保持部位增加。再者,於各吸附單元51~54上升時,以剝離後之基板SB之姿勢大致成為平面之方式,維持各吸附單元51~54間之Z方向上之相對位置。 After the adsorption of the substrate SB is started, the movement of the second adsorption unit 52 is changed to increase (step S109). Thereby, as shown in FIG. 14(a), the peeling progress speed is still controlled by the peeling roller 340, and the main system for pulling up the peeled substrate SB is taken from the first adsorption unit 51 to the second adsorption unit. 52. Moreover, the substrate SB after peeling is switched from being held by the first adsorption unit 51 to being held by the first adsorption unit 51 and the second adsorption unit 52, and the holding portion is increased. In addition, when each of the adsorption units 51 to 54 is raised, the relative position in the Z direction between the adsorption units 51 to 54 is maintained so that the posture of the substrate SB after peeling is substantially flat.
繼而,對控制參數N之值加上1(步驟S111),從而處理係成為返回至步驟S107之循環處理直至參數N成為4為止。因此,於下一循環中,在剝離輥340通過第3吸附單元53正下方之第3吸附位置之時間點,開始第3吸附單元53之下降,從而如圖14(b)所示,用以剝離之基板SB之提拉之主體自第2吸附單元52向第3吸附單元53移行。進而,於下一循環中,在剝離輥340通過第4吸附位置後,第4吸附單元54下降而提拉基板SB。藉由變更步驟S110中之N之上限值,亦可對應於吸附單元之數與上述不同之情形。 Then, by adding 1 to the value of the control parameter N (step S111), the processing returns to the loop processing of step S107 until the parameter N becomes 4. Therefore, in the next cycle, when the peeling roller 340 passes through the third adsorption position immediately below the third adsorption unit 53, the third adsorption unit 53 is lowered, and is used as shown in FIG. 14(b). The main body of the lifted substrate SB is moved from the second adsorption unit 52 to the third adsorption unit 53. Further, in the next cycle, after the peeling roller 340 passes through the fourth adsorption position, the fourth adsorption unit 54 is lowered to pull the substrate SB. By changing the upper limit of N in step S110, it is also possible to correspond to the case where the number of adsorption units is different from the above.
以此方式,藉由第4吸附單元54而提拉基板SB,藉此如圖14(c)所示,自包覆層BL拉離基板SB之整體。因此,於使第4吸附單元54上升後(於步驟S110中為是),使剝離輥340移動至較平台30更靠(+Y)側為 止而使該移動停止(步驟S112)。接著,如圖14(d)所示,於使各吸附單元51~54全部上升至相同之高度為止後停止(步驟S113)。又,使初始剝離單元33之按壓構件331自包覆層BL離開而移動至較包覆層BL之上表面更上方且較包覆層BL之(-Y)側端部更靠(-Y)側之退避位置為止(步驟S114)。此後,解除利用吸附槽之包覆層BL之吸附保持,從而向裝置外搬出經分離之基板SB及包覆層BL(步驟S115),藉此剝離處理結束。 In this manner, the substrate SB is pulled by the fourth adsorption unit 54, whereby the entire substrate SB is pulled from the cladding layer BL as shown in FIG. 14(c). Therefore, after the fourth adsorption unit 54 is raised (YES in step S110), the peeling roller 340 is moved to the (+Y) side of the platform 30. The movement is stopped (step S112). Next, as shown in FIG. 14(d), the adsorption units 51 to 54 are all raised to the same height and then stopped (step S113). Further, the pressing member 331 of the initial peeling unit 33 is moved away from the cladding layer BL to move above the upper surface of the cladding layer BL and further (-Y) than the (-Y) side end portion of the cladding layer BL. The side retracted position (step S114). Thereafter, the adsorption holding of the coating layer BL by the adsorption tank is released, and the separated substrate SB and the coating layer BL are carried out outside the apparatus (step S115), whereby the peeling process is completed.
將各吸附單元51~54之高度設為相同之原因在於,藉由平行地保持剝離後之基板SB與包覆層BL,而使藉由外部機器人或操作員而插入之交送用手之存取、與包覆層BL及基板SB向該交送用手之交付變得容易。 The reason why the heights of the respective adsorption units 51 to 54 are the same is that the substrate SB and the cladding layer BL after the separation are held in parallel, so that the insertion by the external robot or the operator is carried out by hand. It is easy to take and take the coating layer BL and the substrate SB to the delivery hand.
圖15係模式性地表示基板SB及包覆層BL自剝離至搬出為止之過程。於剛剛剝離後為如下狀態:如圖15(a)所示,基板SB藉由各吸附單元51~54吸附其上表面而大致保持為水平姿勢,包覆層BL載置於平台30。 Fig. 15 schematically shows a process from the peeling of the substrate SB and the coating layer BL to the removal. Immediately after the peeling, the substrate SB is held in a horizontal posture by the adsorption unit 51 to 54 adsorbing the upper surface thereof as shown in Fig. 15 (a), and the coating layer BL is placed on the stage 30.
對於基板SB係可藉由工件用手WH而搬出。即,如圖15(b)所示,使工件用手WH再次進入至基板SB與包覆層BL之間而抵接於基板SB之下表面端部,解除吸附單元51等之吸附,藉此基板SB自吸附單元51等交付至工件用手WH。此時,工件用手WH亦於有效區域AR之外側,與基板SB抵接,因此不會產生對經轉印之圖案等之損傷。 The substrate SB can be carried out by the workpiece by hand WH. In other words, as shown in FIG. 15(b), the workpiece is again moved between the substrate SB and the cladding layer BL by the hand WH and abuts against the lower end portion of the substrate SB, thereby releasing the adsorption by the adsorption unit 51 or the like. The substrate SB is delivered from the adsorption unit 51 or the like to the workpiece hand WH. At this time, since the workpiece WH is also on the outer side of the effective area AR and abuts against the substrate SB, damage to the transferred pattern or the like does not occur.
其次,對包覆層BL之搬出進行說明。包覆層BL為下表面之大部分抵接於平台30之狀態。使邊緣升降機38自該狀態作動,如圖15(c)所示,藉由振盪臂381而使包覆層BL之端部略微向上方位移。圖9所示之區域R7係表示此時邊緣升降機38之振盪臂381之上端抵接之包覆層BL之下表面區域。如此,振盪臂381係於接近平台30上之包覆層BL之周緣部之區域,抵接於包覆層BL之下表面。 Next, the carrying out of the coating layer BL will be described. The cladding layer BL is in a state in which most of the lower surface abuts against the stage 30. The edge lifter 38 is actuated from this state, and as shown in Fig. 15(c), the end portion of the coating layer BL is slightly displaced upward by the oscillation arm 381. The area R7 shown in Fig. 9 indicates the lower surface area of the cladding layer BL where the upper end of the oscillation arm 381 of the edge lifter 38 abuts. In this manner, the oscillating arm 381 is in contact with the lower surface of the cladding layer BL in a region close to the peripheral edge portion of the cladding layer BL on the stage 30.
因此,包覆層BL之周緣部以向上方翹曲上升之方式位移,從而於包覆層BL之下表面與平台上表面310之間形成略微之間隙。包覆層BL之撓曲及包覆層BL之中央部係由大氣壓按壓,因此包覆層BL之整體不會提昇。該動作之目的在於,於包覆層BL之下表面與平台上表面310之間製作間隙而導入外部空氣,藉此降低兩者之密接度而使下一提昇動作變得順利。 Therefore, the peripheral portion of the cladding layer BL is displaced in such a manner as to warp upward, so that a slight gap is formed between the lower surface of the cladding layer BL and the upper surface 310 of the stage. The deflection of the coating layer BL and the central portion of the coating layer BL are pressed by the atmospheric pressure, so that the entire coating layer BL is not lifted. The purpose of this operation is to introduce a gap between the lower surface of the cladding layer BL and the upper surface 310 of the platform to introduce external air, thereby reducing the adhesion between the two and making the next lifting operation smooth.
繼而,使主升降機36及子升降機37作動而使升降銷361、371上升。如圖15(d)所示,藉此提昇包覆層BL而自平台上表面310離開。此時,若包覆層BL密接於平台上表面310,則為了與大氣壓抗衡使包覆層BL自平台上表面310離開而需要較大之力。因此,可存在於與升降銷之抵接部位,包覆層BL之撓曲局部性地變大之情形。藉由預先於包覆層BL與平台上表面310之間製作間隙,可以更小之力提昇包覆層BL整體,從而亦減輕包覆層BL之撓曲。 Then, the main lift 36 and the sub-lift 37 are actuated to raise the lift pins 361 and 371. As shown in FIG. 15(d), the cladding layer BL is thereby lifted away from the upper surface 310 of the platform. At this time, if the coating layer BL is in close contact with the upper surface 310 of the platform, a large force is required to make the coating layer BL separate from the upper surface 310 of the platform in order to compete with the atmospheric pressure. Therefore, there is a case where the deflection of the coating layer BL is locally increased at the abutting portion with the lift pin. By making a gap between the cladding layer BL and the upper surface 310 of the stage in advance, the entire cladding layer BL can be lifted with less force, and the deflection of the cladding layer BL can also be alleviated.
將升降銷361、371之上端部定位於大致相同之高度,藉此可將包覆層BL保持為自平台上表面310離開之水平姿勢。此時,連同主升降機36之升降銷361一併使用子升降機37之升降銷371而支持包覆層BL係因以下之原因。 The upper ends of the lift pins 361, 371 are positioned at substantially the same height, whereby the cover layer BL can be maintained in a horizontal position away from the platform upper surface 310. At this time, the cover layer BL is supported by the lift pin 371 of the sub-lift 37 together with the lift pin 361 of the main lift 36 for the following reasons.
剝離後之包覆層BL與基板SB之密接被解除,故若與作為工件WK而與基板SB密接之狀態相比,則中央部易於撓曲。因此,存在如下情形:僅藉由升降銷361之於可抵接區域TR之支持係包覆層BL之中央部撓曲而無法自平台30提昇。為了使包覆層BL確實地自平台30離開,又,維持成水平姿勢而使搬出變得容易,藉由子升降機37之升降銷371支持包覆層BL之中央部之情形較為有效。圖9中之區域R8係表示此時升降銷371抵接之包覆層BL之下表面區域。該區域R8處於有效區域AR內,但於該時間點,有效區域AR內之圖案等已轉印至基板SB,從而抵接於有效區域AR之下表面而支持包覆層BL係無任何問 題。 Since the adhesion between the coating layer BL and the substrate SB after the peeling is released, the center portion is more likely to be bent than the state in which the workpiece WK is in close contact with the substrate SB. Therefore, there is a case where it is impossible to lift from the platform 30 only by the deflection of the central portion of the support-system cover layer BL of the lift pin 361 to the abuttable region TR. In order to allow the coating layer BL to be surely removed from the platform 30, it is possible to maintain the horizontal posture and facilitate the carrying out, and it is effective to support the center portion of the coating layer BL by the lift pins 371 of the sub-lift 37. The region R8 in Fig. 9 indicates the lower surface area of the cladding layer BL at which the lift pin 371 abuts. The region R8 is in the effective region AR, but at this point of time, the pattern or the like in the effective region AR has been transferred to the substrate SB, thereby abutting against the lower surface of the effective region AR to support the cladding layer BL without any question. question.
再者,進行自版向包覆層BL之圖案化之圖案化步驟係於自版剝離之包覆層BL載置有應向基板轉印之圖案等。於該情形時,卸除夾隔圖案等而密接於包覆層BL之版,故不存在藉由升降銷371向包覆層BL之下表面之抵接而對圖案等作用按壓力之情形。反而,使包覆層BL之撓曲變小之情形於抑制對圖案等之損傷之方面較為有效,因此較佳為於儘可能多之部位支持包覆層BL。 Further, the patterning step of patterning from the plate to the cladding layer BL is performed by placing a pattern to be transferred onto the substrate, such as a pattern to be peeled off from the substrate. In this case, since the interposer pattern or the like is removed and adhered to the plate of the clad layer BL, there is no case where the pressing force of the lift pin 371 is applied to the lower surface of the clad layer BL to apply a pressing force to the pattern or the like. On the other hand, in the case where the deflection of the cladding layer BL is made small, it is effective in suppressing damage to the pattern or the like. Therefore, it is preferable to support the cladding layer BL at as many places as possible.
於以此方式提昇包覆層BL之狀態下,使包覆層用手BH進入至包覆層BL之下表面與平台上表面310之間隙,自升降銷361、371接收包覆層BL而搬出。對於包覆層用手BH係亦可與工件用手WH兼用,但因與一併使用子升降機371之支持相同之原因,而較佳為於較工件搬入時更多之部位支持包覆層BL而搬出之構造。 In a state in which the cladding layer BL is lifted in this manner, the cladding layer enters the gap between the lower surface of the cladding layer BL and the upper surface 310 of the substrate by the hand BH, and the cladding layer BL is taken out from the lift pins 361 and 371 to be carried out. . The cover layer BH can also be used with the workpiece by hand WH, but for the same reason as the support of the sub-lift 371, it is preferable to support the coating layer BL more than when the workpiece is loaded. And the structure of moving out.
如上所述,該實施形態係使延伸設置於正交於剝離之進行方向(此處為Y方向)之X方向之剝離輥340抵接於基板SB,從而一面使剝離輥340以固定速度向剝離之進行方向移動,一面提拉基板SB,藉此可將剝離之進行速度保持為固定而良好地剝離基板SB與包覆層BL之間。此時,本實施形態之剝離處理係獲得如下之優點。 As described above, in this embodiment, the peeling roller 340 extending in the X direction orthogonal to the direction in which the peeling is performed (here, the Y direction) is brought into contact with the substrate SB, and the peeling roller 340 is peeled off at a constant speed. When the substrate SB is pulled in the direction of the movement, the speed of the peeling can be kept constant, and the gap between the substrate SB and the cladding layer BL can be favorably peeled off. At this time, the peeling treatment of the present embodiment has the following advantages.
圖16係用以說明本實施形態之剝離處理之優點之圖。本實施形態係使提拉基板SB之主體依次向處於剝離進行方向之下游側之吸附單元移行。因此,自剝離之初始至最終階段為止,剝離輥340之正下方之基板SB之曲率係於某固定之範圍內推移。因此,如圖16(a)所示,已剝離之部分之基板SB與包覆層BL所成之角α亦控制於固定範圍內。因此,於經剝離之部分與未剝離之部分之交界、即剝離輥340正下方之剝離交界線,拉離基板SB與包覆層BL之力(剝離力)亦大致為固定。因此,可不損傷圖案而良好地進行剝離。 Fig. 16 is a view for explaining the advantages of the peeling process of the embodiment. In the present embodiment, the main body of the pulling substrate SB is sequentially moved toward the adsorption unit on the downstream side in the peeling progress direction. Therefore, the curvature of the substrate SB directly under the peeling roller 340 is shifted within a certain fixed range from the initial stage to the final stage of the peeling. Therefore, as shown in Fig. 16 (a), the angle ? formed by the peeled portion of the substrate SB and the cladding layer BL is also controlled within a fixed range. Therefore, the force (peeling force) of pulling off the substrate SB and the coating layer BL is also substantially constant at the boundary between the peeled portion and the unpeeled portion, that is, the peeling boundary line directly under the peeling roller 340. Therefore, peeling can be performed favorably without damaging the pattern.
與此相對,若考慮僅保持基板SB之一端部而進行提拉之比較 例,則如圖16(b)所示,因基板SB之剛性或質量且隨著剝離推進而因自身重量產生之基板SB之撓曲量變大,從而基板SB之提拉因撓曲而吸收,從而剝離之進行遲鈍。即,剝離交界線附近之基板SB與包覆層BL所成之角β逐漸變小,從而產生於兩者之間之剝離力變小而剝離之進行變緩慢。 On the other hand, if it is considered to hold only one end of the substrate SB, the comparison is carried out. For example, as shown in FIG. 16( b ), the amount of deflection of the substrate SB due to its own weight increases due to the rigidity or mass of the substrate SB, and the pulling of the substrate SB is absorbed by the deflection. Thereby the peeling is slow. In other words, the angle β between the substrate SB in the vicinity of the peeling boundary line and the coating layer BL gradually decreases, and the peeling force between the two becomes small, and the progress of peeling becomes slow.
於更甚之情形時,產生如下之問題:吸附單元之吸附力無法支撐基板SB之質量而基板SB掉落;或基板SB無法耐於彎曲而破裂或折曲等。又,亦成為如下情形:為了自包覆層BL拉離基板SB之整體而所需之基板SB之提拉量變大,從而導致用以可實現該情形之裝置構成之大型化。特別是,若基板SB之大型化推進,則基板SB之質量變大,故該等問題進一步變明顯。 In a more extreme case, there is a problem that the adsorption force of the adsorption unit cannot support the mass of the substrate SB and the substrate SB is dropped; or the substrate SB cannot be bent or broken due to bending. Moreover, in order to increase the pulling amount of the substrate SB required to pull the entire substrate SB from the cladding layer BL, the size of the device for realizing this situation is increased. In particular, when the size of the substrate SB is advanced, the quality of the substrate SB is increased, and these problems are further apparent.
另一方面,該實施形態係可藉由伴隨剝離之進行依次增加基板SB之保持部位而使基板SB之保持變得確實,並且容易地維持剝離後之基板SB之姿勢。而且,可一面如上所述般賦予穩定之剝離力,一面進行剝離,因此亦防止圖案之損傷。又,與基板SB之尺寸對應地配置吸附單元,藉此亦可靈活地與基板SB之大型化對應。 On the other hand, in this embodiment, the holding of the substrate SB can be sequentially increased by the peeling, the holding of the substrate SB can be ensured, and the posture of the substrate SB after peeling can be easily maintained. Further, since peeling can be performed while imparting a stable peeling force as described above, damage of the pattern is also prevented. Further, by arranging the adsorption unit in accordance with the size of the substrate SB, it is also possible to flexibly correspond to the enlargement of the substrate SB.
又,該實施形態係如圖9所示,藉由在剝離之初始階段擔負基板SB之提拉之第1吸附單元51吸附基板SB之區域R3處於較形成有有效之圖案之有效區域AR更外側。藉由局部地吸附基板SB而基板SB於該部分局部地自包覆層BL剝離,藉此存在產生圖案變形或損傷等之影響之可能性,但藉由吸附有效區域外而避免此種問題。又,剝離交界線到達剝離輥340之正下方位置為止係剝離速度變得不穩定,但藉由相同地將初始階段之剝離輥340之抵接區域R4設為有效區域外,亦防止因剝離速度之變動引起之圖案之損傷。 Further, in this embodiment, as shown in Fig. 9, the region R3 in which the substrate SB is adsorbed by the first adsorption unit 51 which is pulled by the substrate SB at the initial stage of the peeling is more outward than the effective region AR in which the effective pattern is formed. . By partially adsorbing the substrate SB, the substrate SB is partially peeled off from the cladding layer BL at this portion, whereby there is a possibility of occurrence of pattern deformation, damage, or the like, but such a problem is avoided by adsorbing the effective region. Further, the peeling speed becomes unstable until the peeling boundary line reaches the position immediately below the peeling roller 340. However, the peeling speed is also prevented by setting the abutting region R4 of the peeling roller 340 in the initial stage as the effective region. Damage to the pattern caused by the change.
另一方面,於剝離之進行中,新吸附基板SB之第2至第4吸附單元52~54係於已自包覆層BL剝離之區域內與基板SB抵接,故不存在 因該情形時之吸附而損傷轉印至基板SB之圖案之情形。 On the other hand, in the progress of the peeling, the second to fourth adsorption units 52 to 54 of the new adsorption substrate SB are in contact with the substrate SB in the region separated from the cladding layer BL, so there is no such The pattern transferred to the substrate SB is damaged by the adsorption in this case.
又,一面由平面狀之平台30保持包覆層BL,一面進行剝離,藉此與局部性地抵接吸附機構而進行剝離之先前技術相比,不存在有效區域AR內之包覆層BL之局部性之變形,而亦防止因此種變形引起之對圖案等之損傷。 Further, when the coating layer BL is held by the flat platform 30 and peeled off, the coating layer BL in the effective region AR does not exist as compared with the prior art in which the adsorption mechanism is partially abutted and peeled off. The deformation of the locality also prevents damage to the pattern or the like caused by such deformation.
又,該實施形態係藉由主升降機36之升降銷361,接收自外部搬入之工件WK而載置至平台30。此時,升降銷361係抵接於基板SB(或版)與包覆層BL介隔圖案等而密接之工件WK之下表面中之、抵接區域TR內之工件WK之下表面。所謂可抵接區域TR係指,基板SB與包覆層BL重疊且較形成有有效之圖案等之有效區域AR更外側之區域。如此,保持基板SB與包覆層BL重疊之剛性較高之區域,藉此可確實地支持工件WK,又,亦防止因按壓有效區域AR內之圖案等引起之損傷。 Further, in this embodiment, the lift pin 361 of the main lift 36 receives the workpiece WK loaded from the outside and is placed on the stage 30. At this time, the lift pin 361 abuts against the lower surface of the workpiece WK in the contact region TR in the lower surface of the workpiece WK in which the substrate SB (or plate) is in contact with the cladding layer BL or the like. The contactable region TR is a region in which the substrate SB overlaps with the cladding layer BL and is formed outside the effective region AR in which an effective pattern or the like is formed. In this manner, the region where the rigidity of the substrate SB and the cladding layer BL overlap is high, whereby the workpiece WK can be surely supported, and damage due to the pattern or the like in the pressing effective region AR can be prevented.
特別是,於可抵接區域TR內,分散至複數個部位而抵接升降銷361,藉此可分散施加至包覆層BL之壓力而支持。除此之外,使搬送用手自升降銷361之間進退之情形變得容易。因此,可順利地進行工件WK之搬入及向平台30之載置。 In particular, in the abuttable region TR, the plurality of portions are dispersed and abutted against the lift pins 361, whereby the pressure applied to the cover layer BL can be dispersed and supported. In addition to this, it is easy to advance and retreat between the lift pins 361 by hand. Therefore, the loading of the workpiece WK and the placement on the stage 30 can be smoothly performed.
又,於平台30之中央部配置子升降機37,與主升降機36一併支持剝離後之包覆層BL。藉此,抑制剝離後之包覆層BL之撓曲而保持為水平姿勢,從而可使向外部之搬出變得容易。又,於使包覆層BL自平台30離開前,藉由邊緣升降機38使包覆層BL之端部向上方位移而與平台上表面310之間製作間隙。以此方式,可順利地進行利用升降銷361、371進行之包覆層BL之提昇。 Further, the sub-lifter 37 is disposed at the center of the stage 30, and the main lifter 36 supports the peeled coating layer BL. Thereby, the deflection of the coating layer BL after peeling is suppressed and the horizontal posture is maintained, and the removal to the outside can be facilitated. Further, before the coating layer BL is separated from the stage 30, the edge lifter 38 causes the end portion of the coating layer BL to be displaced upward to form a gap with the upper surface 310 of the stage. In this way, the lifting of the cladding layer BL by the lift pins 361, 371 can be smoothly performed.
又,於在平台30之一部分設置成傾斜而控制剝離之開始之構成中,無法於相當於平台30之水平面與傾斜面之交界之脊線部E之附近,設置用以插通升降銷之開口。其原因在於,若以此方式,則於開 口之邊緣部周邊,發生偶發性之剝離,從而無法控制剝離開始線。因此,該實施形態係將水平平台部31與傾斜平台部32設為可分離之構成,使升降銷自使兩者離開時之間隙突出。與此同時,於載置工件WK後,使水平平台部31與傾斜平台部32接觸而構成平台30。藉此,對於位於傾斜面側之可抵接區域TR,亦可由升降銷支持。 Further, in the configuration in which one of the stages 30 is inclined to control the start of peeling, the opening for inserting the lift pins cannot be provided in the vicinity of the ridge line portion E corresponding to the boundary between the horizontal plane of the platform 30 and the inclined surface. . The reason is that if this way, then open The sporadic peeling occurs around the edge of the mouth, so that the peeling start line cannot be controlled. Therefore, in this embodiment, the horizontal platform portion 31 and the inclined platform portion 32 are configured to be separable, and the lift pins are protruded from the gap when the two are separated. At the same time, after the workpiece WK is placed, the horizontal platform portion 31 is brought into contact with the inclined platform portion 32 to constitute the stage 30. Thereby, the abuttable region TR on the inclined surface side can also be supported by the lift pins.
如以上所說明般,於該實施形態中,作為剝離對象物之工件WK中之包覆層BL係相當於本發明之「第1板狀體」,另一方面,基板SB係相當於本發明之「第2板狀體」。又,包覆層BL之兩主面中之與基板SB密接之上表面係相當於「一面」,下表面係相當於「另一面」。 As described above, in the embodiment, the coating layer BL in the workpiece WK as the object to be peeled off corresponds to the "first plate-shaped body" of the present invention, and the substrate SB corresponds to the present invention. "The second plate-shaped body". Further, among the two main faces of the cladding layer BL, the upper surface in close contact with the substrate SB corresponds to "one surface", and the lower surface corresponds to "the other surface".
又,於上述實施形態中,平台30係作為本發明之「保持平台」而發揮功能,水平平台部31之上表面310係相當於本發明之「保持面」。又,吸附單元51~54係作為本發明之「剝離器件」而發揮功能。又,升降銷361係作為本發明之「支持構件」而發揮功能,另一方面,升降機構365係作為本發明之「升降器件」而發揮功能。又,於上述實施形態中,升降銷371係作為本發明之「輔助支持構件」而發揮功能,振盪臂381係作為本發明之「空隙形成構件」而發揮功能。 Further, in the above embodiment, the platform 30 functions as the "holding platform" of the present invention, and the upper surface 310 of the horizontal platform portion 31 corresponds to the "holding surface" of the present invention. Further, the adsorption units 51 to 54 function as the "peeling device" of the present invention. Further, the lift pin 361 functions as a "support member" of the present invention, and the lift mechanism 365 functions as a "lifting device" of the present invention. Moreover, in the above-described embodiment, the lift pin 371 functions as the "auxiliary support member" of the present invention, and the oscillation arm 381 functions as the "void forming member" of the present invention.
再者,本發明並不限定於上述實施形態,只要不脫離其主旨,則可除上述者外進行各種變更。例如,上述實施形態係於平台30設置格子狀之吸附槽311、312而吸附保持包覆層BL,但吸附槽之形狀並不限定於此。例如,亦可設置環狀之吸附槽,又,亦可適當地配置供給負壓之吸附孔而吸附包覆層。 It is to be noted that the present invention is not limited to the above-described embodiments, and various modifications may be made in addition to the above without departing from the spirit and scope of the invention. For example, in the above embodiment, the grid 30 is provided with the lattice-shaped adsorption grooves 311 and 312, and the coating layer BL is adsorbed and held. However, the shape of the adsorption groove is not limited thereto. For example, an annular adsorption tank may be provided, and the adsorption hole for supplying a negative pressure may be appropriately disposed to adsorb the coating layer.
又,上述實施形態之裝置1具有可於工件WK之有效區域AR內,抵接於該工件WK之下表面之子升降機37之升降銷371,於搬入工件時,不抵接該子升降機37之升降銷371,藉此抑制對有效區域AR內之圖案等之損傷。然而,根據圖案材料或其配置而亦存在不受因升降銷 371之抵接產生之影響者。於此種情形時,亦可視需要於搬入工件時亦一併使用子升降機37。 Further, the apparatus 1 of the above-described embodiment has a lift pin 371 that can abut against the sub-lift 37 of the lower surface of the workpiece WK in the effective area AR of the workpiece WK, and does not abut the lift of the sub-lift 37 when the workpiece is loaded. The pin 371 thereby suppresses damage to the pattern or the like in the effective area AR. However, depending on the pattern material or its configuration, there is also no lift pin The influence of the 371's abutment. In this case, the sub-lift 37 can also be used together when moving into the workpiece.
又,上述實施形態係以將剝離後之基板SB之姿勢維持成接近平面之狀態之方式,控制各吸附單元51~54之上升而減少施加至基板SB之應力(stress),但基板SB之提拉之態樣並不限定於此。例如,亦可設為以剝離後之基板大致成為水平之方式使各吸附單元以固定高度停止、或者基板保持為如具有特定之曲率而彎曲之姿勢。該等係可藉由控制各吸附單元之上升之態樣而自由地設定。 Further, in the above-described embodiment, the pressure of the respective adsorption units 51 to 54 is controlled to reduce the stress applied to the substrate SB so that the posture of the substrate SB after peeling is maintained close to the plane, but the substrate SB is raised. The aspect of pulling is not limited to this. For example, the adsorption unit may be stopped at a fixed height such that the substrate after peeling is substantially horizontal, or the substrate may be held in a posture that is bent as having a specific curvature. These lines can be freely set by controlling the ascending state of each adsorption unit.
又,上述實施形態係於基板SB之上部配置4個吸附單元而依次吸附基板SB,但吸附單元之數量為任意,而並不限定於此。若基板為大型,則使吸附單元變多即可,若為小型,則使吸附單元變少即可。 Further, in the above embodiment, four adsorption units are disposed on the upper portion of the substrate SB to sequentially adsorb the substrate SB. However, the number of adsorption units is arbitrary, and is not limited thereto. If the substrate is large, the number of adsorption units may be increased, and if it is small, the adsorption unit may be reduced.
又,上述實施形態係藉由真空吸附而保持基板及包覆層,但保持之態樣並不限定於此。例如,亦可為藉由靜電或磁性吸附力而進行吸附保持者。特別是,對於保持基板之有效區域外之第1吸附單元51,亦可藉由機械性地握持基板周緣部而保持,而不藉由吸附來保持。 Further, in the above embodiment, the substrate and the cladding layer are held by vacuum suction, but the aspect of the substrate is not limited thereto. For example, it is also possible to perform adsorption holding by electrostatic or magnetic adsorption. In particular, the first adsorption unit 51 that holds the outside of the effective area of the substrate can be held by mechanically holding the peripheral portion of the substrate without being held by adsorption.
又,上述實施形態之剝離裝置1係一面使剝離輥340抵接於基板SB而管理剝離交界線之進行,一面提拉基板SB,藉此於與包覆層BL之間進行剝離,但對於剝離處理之方式係並不限定於此。即,即便為藉由其他剝離方式進行剝離之裝置,亦搬入包含如版或基板與包覆層之2片板狀體之密接體,又,作為用以分別搬出剝離後之板狀體之構成,可應用本發明。 In the peeling apparatus 1 of the above-described embodiment, the peeling roller 340 is brought into contact with the substrate SB to manage the peeling boundary line, and the substrate SB is pulled, thereby peeling off from the coating layer BL, but peeling off The method of processing is not limited to this. In other words, even if it is a device that is peeled off by another peeling method, a dense body including a plate-like body such as a plate or a substrate and a coating layer is carried, and the plate-like body for carrying out the peeling is separately carried out. The invention can be applied.
又,上述實施形態係使包覆層BL突出於傾斜平台部32而保持,藉由按壓構件331使包覆層BL彎曲而製作剝離之槽口。然而,如上所述之情形並非係必需之必要條件,例如亦可設為僅藉由第1吸附單元之提拉而開始剝離。於該情形時,無需於平台設置成傾斜。 Further, in the above embodiment, the coating layer BL is held by the inclined land portion 32 and held, and the coating layer BL is bent by the pressing member 331 to form a notched slit. However, the above-described situation is not a necessary condition, and for example, peeling may be started only by pulling by the first adsorption unit. In this case, it is not necessary to set the platform to be tilted.
本發明係可應用於使2片板狀體密接而轉印圖案等之圖案形成處理之剝離製程,除此之外,可相對於良好地剝離彼此密接之2片板狀體之各種目的而較佳地應用,而不限定於伴隨此種圖案轉印者。 The present invention can be applied to a peeling process in which two sheet-like bodies are closely adhered to a pattern forming process such as a transfer pattern, and the like, in addition to the various purposes of peeling off two plate-like bodies that are in close contact with each other, Good application, not limited to those who accompany such a pattern transfer.
31‧‧‧水平平台部 31‧‧‧Horizontal Platform Division
310‧‧‧水平平台部之上表面 310‧‧‧Top surface of the horizontal platform
361‧‧‧升降銷 361‧‧‧lifting pin
371‧‧‧升降銷 371‧‧‧lifting pin
381‧‧‧振盪臂 381‧‧‧Oscillation arm
AR‧‧‧有效區域 AR‧‧‧Active area
BL‧‧‧包覆層 BL‧‧‧ coating
SB‧‧‧基板 SB‧‧‧ substrate
TR‧‧‧可抵接區域 TR‧‧‧able area
WH‧‧‧工件用手 WH‧‧‧ workpiece with hand
WK‧‧‧工件 WK‧‧‧ workpiece
+X‧‧‧方向 +X‧‧‧ directions
+Y‧‧‧方向 +Y‧‧ Direction
+Z‧‧‧方向 +Z‧‧‧ directions
Claims (6)
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JP2013068705A JP6080647B2 (en) | 2013-03-28 | 2013-03-28 | Peeling device |
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TW201437135A TW201437135A (en) | 2014-10-01 |
TWI593617B true TWI593617B (en) | 2017-08-01 |
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KR (1) | KR101541643B1 (en) |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI766810B (en) * | 2020-11-13 | 2022-06-01 | 日商信越工程股份有限公司 | Workpiece Adhesion Chuck Device and Workpiece Laminating Machine |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6345109B2 (en) * | 2014-12-26 | 2018-06-20 | 株式会社Screenホールディングス | Peeling method and peeling device |
JP6419619B2 (en) * | 2015-03-24 | 2018-11-07 | 株式会社Screenホールディングス | Method for creating a peeling device recipe |
JP6450238B2 (en) * | 2015-03-31 | 2019-01-09 | 株式会社Screenホールディングス | Peeling device |
CN105080803B (en) * | 2015-08-21 | 2018-08-07 | 京东方科技集团股份有限公司 | Base plate carrying structure, decompression drying equipment and decompression drying method |
JP6670683B2 (en) * | 2016-06-07 | 2020-03-25 | 株式会社Screenラミナテック | Method and apparatus for separating work composed of carrier substrate and resin layer |
KR101949367B1 (en) * | 2016-12-09 | 2019-02-18 | 주식회사 아바코 | Apparatus for Lifting Substrate of Mask Aligner |
JP7057336B2 (en) * | 2019-10-29 | 2022-04-19 | キヤノントッキ株式会社 | Substrate holding member, substrate holding device, substrate processing device, substrate holding method, film forming method, and manufacturing method of electronic device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6503130B2 (en) * | 2001-01-17 | 2003-01-07 | Samsung Electronics Co., Ltd. | Protective film separator in semiconductor wafer grinding process |
CN101110353A (en) * | 2006-07-20 | 2008-01-23 | 琳得科株式会社 | Folienabziehvorrichtung und abziehverfahren |
JP2009147042A (en) * | 2007-12-13 | 2009-07-02 | Sharp Corp | Substrate receiving method and substrate stage device |
CN1948004B (en) * | 2005-10-12 | 2012-04-04 | 日本梅克特隆株式会社 | Sticking device and method of sheet style thin film |
TW201307000A (en) * | 2011-07-04 | 2013-02-16 | Asahi Glass Co Ltd | Method for peeling glass substrate, and apparatus for peeling glass substrate |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06268051A (en) * | 1993-03-10 | 1994-09-22 | Mitsubishi Electric Corp | Wafer stripper |
JP2003072119A (en) * | 2001-06-22 | 2003-03-12 | Fuji Photo Film Co Ltd | Recording method and recorder |
JP4817805B2 (en) * | 2004-11-25 | 2011-11-16 | 株式会社東京精密 | Film peeling method and film peeling apparatus |
TWI335899B (en) * | 2006-11-03 | 2011-01-11 | Kodak Graphic Comm Canada Co | Methods and apparatus for peeling a flexible sheet from a substrate |
JP4957375B2 (en) * | 2007-05-16 | 2012-06-20 | ソニー株式会社 | Organic EL display device manufacturing equipment |
JP4733074B2 (en) | 2007-06-11 | 2011-07-27 | リンテック株式会社 | Separation apparatus and separation method |
JP2009224437A (en) | 2008-03-14 | 2009-10-01 | Seiko Epson Corp | Apparatus for manufacturing thin film electronic device and method for manufacturing thin film electronic device |
JP2010283097A (en) * | 2009-06-04 | 2010-12-16 | Lintec Corp | Double sided adhesive sheet |
CN102202994B (en) * | 2009-08-31 | 2014-03-12 | 旭硝子株式会社 | Peeling device |
JP5375586B2 (en) * | 2009-12-22 | 2013-12-25 | 株式会社スリーボンド | Peeling apparatus and peeling method |
JP5902406B2 (en) | 2010-06-25 | 2016-04-13 | 株式会社半導体エネルギー研究所 | Separation method and manufacturing method of semiconductor device |
JP2013055093A (en) * | 2011-09-01 | 2013-03-21 | Creative Technology:Kk | Adhesive chuck device and adhesion holding method of work-piece |
TWI585028B (en) * | 2013-01-30 | 2017-06-01 | 斯克林集團公司 | Detaching apparatus and detaching method |
-
2013
- 2013-03-28 JP JP2013068705A patent/JP6080647B2/en not_active Expired - Fee Related
- 2013-12-12 TW TW102145973A patent/TWI593617B/en not_active IP Right Cessation
-
2014
- 2014-02-21 KR KR1020140020538A patent/KR101541643B1/en active IP Right Grant
- 2014-03-21 CN CN201410108244.1A patent/CN104070778B/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6503130B2 (en) * | 2001-01-17 | 2003-01-07 | Samsung Electronics Co., Ltd. | Protective film separator in semiconductor wafer grinding process |
CN1948004B (en) * | 2005-10-12 | 2012-04-04 | 日本梅克特隆株式会社 | Sticking device and method of sheet style thin film |
CN101110353A (en) * | 2006-07-20 | 2008-01-23 | 琳得科株式会社 | Folienabziehvorrichtung und abziehverfahren |
JP2009147042A (en) * | 2007-12-13 | 2009-07-02 | Sharp Corp | Substrate receiving method and substrate stage device |
TW201307000A (en) * | 2011-07-04 | 2013-02-16 | Asahi Glass Co Ltd | Method for peeling glass substrate, and apparatus for peeling glass substrate |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI766810B (en) * | 2020-11-13 | 2022-06-01 | 日商信越工程股份有限公司 | Workpiece Adhesion Chuck Device and Workpiece Laminating Machine |
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KR20140118732A (en) | 2014-10-08 |
JP2014192459A (en) | 2014-10-06 |
CN104070778A (en) | 2014-10-01 |
JP6080647B2 (en) | 2017-02-15 |
KR101541643B1 (en) | 2015-08-03 |
TW201437135A (en) | 2014-10-01 |
CN104070778B (en) | 2017-03-01 |
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