TW201625822A - Method for manufacturing mono-like silicon - Google Patents

Method for manufacturing mono-like silicon Download PDF

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TW201625822A
TW201625822A TW104100431A TW104100431A TW201625822A TW 201625822 A TW201625822 A TW 201625822A TW 104100431 A TW104100431 A TW 104100431A TW 104100431 A TW104100431 A TW 104100431A TW 201625822 A TW201625822 A TW 201625822A
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single crystal
crystal
crucible
crucibles
preparing
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TW104100431A
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TWI541390B (en
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楊鎭豪
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茂迪股份有限公司
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Abstract

A method for manufacturing mono-like silicon is described, which includes the following steps. Various crucibles are disposed within a furnace body. One monocrystal seed crystal is disposed in each crucible. A silicon material is disposed on the monocrystal seed crystal in each crucible. A crystal growth step is performed to form a mono-like silicon ingot in each crucible using the silicon material and the monocrystal seed crystal.

Description

類單晶之製備方法 Method for preparing single crystal

本發明是有關於一種矽材之製作方法,且特別是有關於一種類單晶(mono-like silicon)之製備方法。 The present invention relates to a method for producing a coffin, and more particularly to a method for preparing a mono-like silicon.

類單晶成長技術係一種半融法技術。在類單晶成長技術中,係先在坩堝內先鋪設一些單晶來作為長晶的晶種,再於這些單晶上鋪設矽材。接著,在長晶爐內加熱坩堝內之矽材,藉以融化這些矽材。在加熱矽材的期間,透過溫控方式,使矽材由上而下融化,且控制矽材的融化高度於單晶晶種的位置。當矽材融化至單晶晶種的位置時,將長晶爐切換成長晶模式,此時矽晶的成長沿著單晶晶種成長,而得到單晶晶碇。但因為這樣的方式所成長之單晶晶碇並非柴氏(Czochralski)長晶技術所得,因而並非無缺陷,故一般稱為類單晶。 The monocrystalline growth technique is a semi-melting technique. In the single crystal growth technique, a single crystal is first laid in the crucible as a crystal seed of the long crystal, and then the crucible is laid on the single crystal. Next, the coffin in the crucible is heated in a crystal growth furnace to melt the coffins. During the heating of the coffin, the coffin is melted from top to bottom by means of temperature control, and the melting of the coffin is controlled to be higher than the position of the single crystal seed. When the coffin is melted to the position of the single crystal seed crystal, the crystal growth furnace is switched to the crystal growth mode, and at this time, the growth of the twin crystal grows along the single crystal seed crystal to obtain a single crystal crystal crucible. However, since the single crystal germanium grown in such a manner is not obtained by Czochralski crystal growth technology, it is not defect-free, and is generally called a single crystal.

類單晶無法有效量產的原因之一在於晶碇品質難以控制。晶碇品質不好控制的主因在於,受限於單晶晶種的尺寸,坩堝內需鋪設多片單晶晶種方能大致布滿坩堝之整個底面,而晶種與晶種之間的晶界在長晶過程中容易形成缺 陷起始區或雙晶的誘發區。如此一來,將導致所成長之晶碇品質變差,或無法維持單晶晶向。其中,雙晶的誘發區係發生在缺陷嚴重的情況下,矽晶的成長可能會長出多晶,而造成晶碇內有單晶與多晶均存在的現象。 One of the reasons why the single crystal cannot be effectively mass-produced is that the quality of the crystal is difficult to control. The main reason for the poor control of crystal quality is that, limited by the size of the single crystal seed crystal, it is necessary to lay a plurality of single crystal seeds in the crucible to substantially cover the entire bottom surface of the crucible, and the grain boundary between the seed crystal and the seed crystal. Easy to form defects in the process of crystal growth The initial region or the induced region of the twin crystal. As a result, the quality of the grown crystal is deteriorated, or the crystal orientation of the single crystal cannot be maintained. Among them, the induced zone of twin crystals occurs in the case of serious defects, and the growth of twins may grow polycrystals, resulting in the presence of both single crystals and polycrystals in the crystal grains.

類單晶無法有效量產的另一原因在於,由於類單晶製程之成本較多晶製程之成本高,因此需考量鑄碇過程中所能獲得之單晶比率與品質。此外,大尺寸之晶碇所需之晶種厚度相對較大,如此也會增加製程成本。 Another reason why a single crystal cannot be effectively mass-produced is that since the cost of the single crystal process is high and the cost of the crystal process is high, it is necessary to consider the ratio and quality of the single crystal which can be obtained in the casting process. In addition, the seed crystal thickness required for large-sized wafers is relatively large, which also increases the process cost.

因此,本發明之一目的就是在提供一種類單晶之製備方法,其在同一長晶爐之爐體內設置多個坩堝,並於每個坩堝中各設置一個單晶晶種,如此一來可在長晶時達到無晶界面之目的,並可減少晶碇之缺陷。 Therefore, an object of the present invention is to provide a method for preparing a single crystal in which a plurality of crucibles are disposed in a furnace body of the same crystal growth furnace, and a single crystal seed crystal is disposed in each crucible, so that It achieves the purpose of amorphous interface in the case of crystal growth, and can reduce defects of crystal crucible.

本發明之另一目的是在提供一種類單晶之製備方法,其可在相鄰坩堝之間設置加熱器,如此可在長晶過程中,有效控制每個坩堝內的熱場,進而可較準確的控制長晶的固液介面。 Another object of the present invention is to provide a method for preparing a single crystal, which can provide a heater between adjacent crucibles, so that the thermal field in each crucible can be effectively controlled during the crystal growth process, and thus Accurate control of the solid-liquid interface of the crystal.

本發明之又一目的是在提供一種類單晶之製備方法,其可在每個坩堝之底部中央區域的下方設置高熱傳導係數元件,或可額外再於坩堝之底部外緣區域的下方設置低熱傳導係數元件,藉此可更有效地控制每個坩堝內的熱場,而更準確地控制長晶的固液介面,使得固液介面呈現中間凸且外側低,以使固液介面之外側均為張應力,進而可減少晶 界面的缺陷。此外,由於固液介面可獲得有效控制,因此有利於減少過融(over-melt)程度,避免單晶晶種之局部區域,特別是外緣區域被融光。 It is still another object of the present invention to provide a method for producing a single crystal which can be provided with a high thermal conductivity element below the bottom central portion of each crucible, or can be additionally disposed below the bottom outer edge region of the crucible. The heat conduction coefficient element, thereby more effectively controlling the thermal field in each crucible, and more accurately controlling the solid-liquid interface of the crystal growth, so that the solid-liquid interface is convex and the outer side is low, so that the outer side of the solid-liquid interface is Is the tensile stress, which in turn reduces the crystal Defects in the interface. In addition, since the solid-liquid interface can be effectively controlled, it is advantageous to reduce the degree of over-melt and avoid partial melting of the single crystal seed, especially the outer edge region.

本發明之再一目的是在提供一種類單晶之製備方法,其中每個坩堝為長方形,因此於晶片切割時,可使晶碇獲得較有效率的利用。 A further object of the present invention is to provide a method for preparing a single crystal in which each crucible is rectangular, so that the wafer can be more efficiently utilized when the wafer is diced.

根據本發明之上述目的,提出一種類單晶之製備方法,其包含下列步驟。設置數個坩堝於爐體內。於每一坩堝中設置一單晶晶種。於每一坩堝中設置矽料於單晶晶種上。進行長晶步驟,以利用每一坩堝中之矽料與單晶晶種形成一類單晶晶碇。 In accordance with the above object of the present invention, a method of producing a single crystal-like method comprising the following steps is proposed. Set a few squats in the furnace. A single crystal seed crystal is placed in each crucible. The crucible is placed on the single crystal seed crystal in each crucible. A crystal growth step is performed to form a single crystal crystal enthalpy by using the tantalum in each crucible and the single crystal seed crystal.

依據本發明之一實施例,上述每一坩堝之底面的長與寬分別較單晶晶種之底面的長與寬大10mm至100mm。 According to an embodiment of the present invention, the length and the width of the bottom surface of each of the cymbals are respectively 10 mm to 100 mm longer than the length and the width of the bottom surface of the single crystal seed crystal.

依據本發明之另一實施例,上述每一坩堝之底面與單晶晶種之底面的尺寸實質相同。 According to another embodiment of the present invention, the bottom surface of each of the crucibles is substantially the same size as the bottom surface of the single crystal seed crystal.

依據本發明之又一實施例,上述之單晶晶種具有相同之晶向。 According to still another embodiment of the present invention, the single crystal seed crystals have the same crystal orientation.

依據本發明之再一實施例,上述之晶向為[100]晶向。 According to still another embodiment of the present invention, the above crystal orientation is a [100] crystal orientation.

依據本發明之再一實施例,上述每一坩堝之形狀為長方形。 According to still another embodiment of the present invention, each of the above shapes is rectangular.

依據本發明之再一實施例,於進行該長晶步驟前,上述類單晶之製備方法更包含設置數個加熱器分別位於 相鄰之坩堝之間,其中進行長晶步驟時包含利用這些加熱器加熱坩堝。 According to still another embodiment of the present invention, before the performing the crystal growth step, the method for preparing the single crystal-like method further comprises: setting a plurality of heaters respectively Between adjacent turns, wherein the growth step is performed, the heater is heated by these heaters.

依據本發明之再一實施例,於進行長晶步驟前,上述類單晶之製備方法更包含於每一坩堝之底部中央區域的下方設置高熱傳導係數元件。 According to still another embodiment of the present invention, before the crystal growth step, the method for preparing the single crystal-like method further comprises disposing a high thermal conductivity coefficient element below a central portion of the bottom of each crucible.

依據本發明之再一實施例,於進行長晶步驟前,上述類單晶之製備方法更包含於每一坩堝之底部中央區域的下方設置高熱傳導係數元件、以及於每一坩堝之底部外緣區域的下方設置低熱傳導係數元件。 According to still another embodiment of the present invention, before the crystal growth step, the method for preparing the single crystal-like method further comprises: providing a high thermal conductivity coefficient element under the bottom central portion of each crucible, and a bottom outer edge of each crucible A low heat transfer coefficient element is placed below the area.

100‧‧‧步驟 100‧‧‧ steps

102‧‧‧步驟 102‧‧‧Steps

104‧‧‧步驟 104‧‧‧Steps

106‧‧‧步驟 106‧‧‧Steps

200‧‧‧坩堝 200‧‧‧坩埚

202‧‧‧爐體 202‧‧‧ furnace body

204‧‧‧反應室 204‧‧‧Reaction room

206‧‧‧底部 206‧‧‧ bottom

208‧‧‧側壁 208‧‧‧ side wall

210‧‧‧長晶空間 210‧‧‧Changjing Space

212‧‧‧單晶晶種 212‧‧‧Single crystal seeds

214‧‧‧底面 214‧‧‧ bottom

216‧‧‧底面 216‧‧‧ bottom

218‧‧‧矽料 218‧‧‧矽

220‧‧‧類單晶 220‧‧‧ class single crystal

222‧‧‧液態矽 222‧‧‧ liquid 矽

224‧‧‧固液介面 224‧‧‧ solid-liquid interface

226‧‧‧高熱傳導係數元件 226‧‧‧High thermal conductivity element

228‧‧‧中央區域 228‧‧‧Central area

230‧‧‧外緣區域 230‧‧‧Outer area

232‧‧‧低熱傳導係數元件 232‧‧‧Low thermal conductivity component

234‧‧‧加熱器 234‧‧‧heater

為讓本發明之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下:〔圖1〕係繪示依照本發明之一實施方式的一種類單晶之製備方法的流程圖;〔圖2A〕係繪示依照本發明之一實施方式的一種成長類單晶之裝置的剖面示意圖;〔圖2B〕係繪示依照本發明之一實施方式的一種成長類單晶之裝置的上視示意圖;〔圖2C〕係繪示依照本發明之一實施方式的一種類單晶成長時的示意圖;〔圖3〕係繪示依照本發明之另一實施方式的一種成長類單晶之裝置的剖面示意圖; 〔圖4〕係繪示依照本發明之又一實施方式的一種成長類單晶之裝置的剖面示意圖;〔圖5A〕係繪示依照本發明之再一實施方式的一種成長類單晶之裝置的剖面示意圖;以及〔圖5B〕係繪示依照本發明之再一實施方式的一種成長類單晶之裝置的上視示意圖。 The above and other objects, features, advantages and embodiments of the present invention will become more <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; FIG. 2A is a schematic cross-sectional view showing a device for growing a single crystal according to an embodiment of the present invention; FIG. 2B is a growth class according to an embodiment of the present invention. FIG. 2C is a schematic view showing a growth of a single crystal according to an embodiment of the present invention; FIG. 3 is a schematic view showing another embodiment of the present invention. A schematic cross-sectional view of a device for growing a single crystal; FIG. 4 is a schematic cross-sectional view showing a device for growing a single crystal according to still another embodiment of the present invention; FIG. 5A is a view showing a device for growing a single crystal according to still another embodiment of the present invention. FIG. 5B is a schematic top view showing a device for growing a single crystal according to still another embodiment of the present invention.

有鑑於傳統成長類單晶時,因單晶晶種與晶種之間大都有晶界存在,而導致所成長之晶碇品質變差,甚至無法使晶碇維持單晶晶向,以及製程控制不易等問題。因此,本發明在此提出一種類單晶之製備方法,其在同一長晶爐體中設置多個坩堝,並於每一坩堝中設置單一片單晶晶種,藉此可達到無晶界面,而可有效減少類單晶晶碇之缺陷,大幅提升晶碇品質。此外,本發明之製備方法更可在相鄰二坩堝之間額外設置加熱器,及/或於每個坩堝底部的中央區域與外緣區域分別設置高熱傳導係數元件與低熱傳導係數元件,藉此可有效控制每個坩堝內之熱場,提升長晶過程中對固液介面的控制。故,除了可提高晶碇品質,更可降低過融程度。 In view of the conventional growth type single crystal, since the crystal grain boundary exists between the single crystal seed crystal and the seed crystal, the quality of the grown crystal is deteriorated, and even the crystal lattice cannot maintain the crystal orientation of the single crystal, and the process control is performed. Not easy to wait for questions. Therefore, the present invention proposes a method for preparing a single crystal in which a plurality of crucibles are disposed in the same crystal growth furnace body, and a single crystal seed crystal is disposed in each crucible, thereby achieving a crystal-free interface. The utility model can effectively reduce the defects of the single crystal crystal enthalpy and greatly improve the quality of the crystal enamel. In addition, the preparation method of the present invention can further provide a heater between the adjacent two turns, and/or a high heat conduction coefficient element and a low heat conduction coefficient element respectively in the central region and the outer edge region of the bottom of each crucible. It can effectively control the thermal field in each crucible and improve the control of the solid-liquid interface during the growth process. Therefore, in addition to improving the quality of the crystal, it can reduce the degree of over-melting.

請參照圖1、圖2A與圖2B,其中圖1係繪示依照本發明之一實施方式的一種類單晶之製備方法的流程圖,圖2A與圖2B係分別繪示依照本發明之一實施方式的一種成長類單晶之裝置的剖面示意圖與上視示意圖。在本實施 方式中,製備類單晶時,可先進行步驟100,以提供多個坩堝200,並將這些坩堝200均設置在同一長晶爐之爐體202內的反應室204中,如圖2A所示。這些坩堝200可以彼此鄰設的方式排列在反應室204中。每個坩堝200包含底部206與側壁208,其中側壁208沿著底部206之邊緣而設立在底部206上,且底部206與側壁208定義出長晶空間210。在一些例子中,如圖2B所示,每個坩堝200之形狀為長方形。長方形的坩堝設計,可使所成長出之類單晶晶碇為長方體,如此一來,於晶片切割時,可切出較多晶片,使類單晶晶碇獲得較佳的利用效率,但此處長方形坩堝僅為較佳實施例之說明,坩堝形狀並不限於長方形。 Referring to FIG. 1 , FIG. 2A and FIG. 2B , FIG. 1 is a flow chart showing a method for preparing a single crystal according to an embodiment of the present invention, and FIG. 2A and FIG. 2B are respectively diagrams according to the present invention. A schematic cross-sectional view and a top view of a device for growing a single crystal according to an embodiment. In this implementation In the method, when preparing a single crystal, step 100 may be first performed to provide a plurality of crucibles 200, and the crucibles 200 are all disposed in the reaction chamber 204 in the furnace body 202 of the same crystal growth furnace, as shown in FIG. 2A. . These crucibles 200 can be arranged in the reaction chamber 204 in a manner adjacent to each other. Each crucible 200 includes a bottom portion 206 and a side wall 208, wherein the side wall 208 is disposed on the bottom portion 206 along the edge of the bottom portion 206, and the bottom portion 206 and the side wall 208 define a crystal growth space 210. In some examples, as shown in Figure 2B, each of the crucibles 200 is rectangular in shape. The rectangular crucible design can make the grown single crystal crystal crucible into a rectangular parallelepiped, so that when the wafer is diced, more wafers can be cut out, so that the single crystal crystal germanium can obtain better utilization efficiency, but this The rectangular ridge is only a description of the preferred embodiment, and the 坩埚 shape is not limited to a rectangle.

接下來,可進行步驟102,以在每個坩堝200之長晶空間210中放置一個單晶晶種212。在每個坩堝200中,單晶晶種212係鋪放在坩堝200之底面214上。在一些例子中,每個坩堝200之底面214的尺寸較單晶晶種212之底面216大。舉例而言,每個坩堝200之底面214的長與寬分別較位於其上之單晶晶種212之底面216的長與寬大10mm至100mm,即每個單晶晶種212之底面216的每一邊分別與其所在之坩堝200之底面214中的鄰近一邊相隔約5mm至50mm。在一些特定例子中,每個坩堝200之底面214與位於其上之單晶晶種212之底面216的尺寸實質相同。此外,在一些例子中,放在這些坩堝200內的單晶晶種212具有不同之晶向;或者,這些單晶晶種212的晶向不全然相同,即一些單晶晶種212的晶向相同,另一些單晶晶種212 的晶向不同。在一些特定例子中,所有的單晶晶種212具有相同之晶向,例如[100]晶向。 Next, step 102 can be performed to place a single crystal seed 212 in the crystal growth space 210 of each crucible 200. In each crucible 200, a single crystal seed crystal 212 is placed on the bottom surface 214 of the crucible 200. In some examples, the bottom surface 214 of each crucible 200 is larger than the bottom surface 216 of the single crystal seed crystal 212. For example, the length and width of the bottom surface 214 of each crucible 200 are 10 mm to 100 mm longer than the bottom surface 216 of the single crystal seed crystal 212 located thereon, that is, each of the bottom surfaces 216 of each single crystal seed crystal 212. One side is separated from the adjacent side of the bottom surface 214 of the crucible 200 by about 5 mm to 50 mm. In some particular examples, the bottom surface 214 of each crucible 200 is substantially the same size as the bottom surface 216 of the single crystal seed crystal 212 located thereon. Moreover, in some examples, the single crystal seed crystals 212 placed in the crucibles 200 have different crystal orientations; or, the crystal orientations of the single crystal seed crystals 212 are not completely the same, that is, the crystal orientation of some single crystal seed crystals 212. Same as other single crystal seeds 212 The crystal orientation is different. In some specific examples, all single crystal seed crystals 212 have the same crystal orientation, such as [100] crystal orientation.

完成單晶晶種212的設置後,可進行步驟104,以在每個坩堝200中之單晶晶種212上設置矽料218。這些矽料218可例如為矽塊。接著,可進行長晶之步驟106,以利用加熱方式融化每個坩堝200內之矽料218。在長晶之步驟106期間,透過控制爐體202之反應室204內的熱場分布,使矽料218由上而下融化。並且,控制每個坩堝200內之矽料218的融化高度在單晶晶種212之上表面處,避免融穿全部或局部之單晶晶種212。 After the setting of the single crystal seed crystal 212 is completed, step 104 may be performed to provide a tantalum 218 on the single crystal seed crystal 212 in each crucible 200. These dips 218 can be, for example, a block. Next, a step 106 of crystal growth may be performed to melt the tantalum 218 in each crucible 200 by heating. During the step 106 of the crystal growth, the tantalum 218 is melted from top to bottom by controlling the distribution of the thermal field within the reaction chamber 204 of the furnace body 202. Also, the melting height of the tantalum 218 in each crucible 200 is controlled at the upper surface of the single crystal seed crystal 212 to avoid melting all or part of the single crystal seed crystal 212.

請同時參照圖2A與圖2C,其中圖2C係繪示依照本發明之一實施方式的一種類單晶成長時的示意圖。當每個坩堝200中之矽料218已融化至單晶晶種212之上表面處的位置時,即可將爐體202之反應室204的操作條件切換成長晶模式。此時,矽晶就會沿著單晶晶種212的晶格在坩堝200之長晶空間210中成長,而得到類單晶晶碇。在長晶的過程中,固態的類單晶220由單晶晶種212處開始往上成長,因而此時液態矽222會在固態之類單晶220的上方,且二者之間會形成有一固液介面224。在本實施方式中,在長晶期間,可控制固液介面224,使其呈現中央凸且外側低。藉由這樣的介面控制,可使張應力在中央區而壓應力產生在外側,如此若有晶格缺陷,這樣的應力分布會使得這些晶格缺陷形成在類單晶220之外側邊。當完成類單晶晶碇後,通常會將類單晶晶碇之外側的部分切除,因而可將形成在類單 晶220外側之缺陷一併切除。故,可減少類單晶220成品的缺陷,而可大幅提升類單晶220之品質。 Please refer to FIG. 2A and FIG. 2C simultaneously, wherein FIG. 2C is a schematic view showing a growth of a single crystal according to an embodiment of the present invention. When the tantalum 218 in each crucible 200 has melted to a position at the upper surface of the single crystal seed crystal 212, the operating conditions of the reaction chamber 204 of the furnace body 202 can be switched to the crystal growth mode. At this time, the twin crystal grows along the crystal lattice of the single crystal seed crystal 212 in the crystal growth space 210 of the crucible 200 to obtain a single crystal-like crystal germanium. In the process of the crystal growth, the solid-like single crystal 220 starts to grow upward from the single crystal seed crystal 212, and thus the liquid helium 222 is above the solid crystal such as the single crystal 220, and there is a Solid-liquid interface 224. In the present embodiment, during the growth of the crystal, the solid-liquid interface 224 can be controlled to have a central convexity and a low outer side. With such interface control, the tensile stress can be generated in the central region and the compressive stress is generated on the outer side, so that if there is a lattice defect, such a stress distribution causes these lattice defects to be formed on the outer side of the single crystal-like 220. When the single crystal-like crystal germanium is completed, the portion on the outer side of the single crystal-like crystal crucible is usually cut off, and thus it can be formed in the class The defects on the outer side of the crystal 220 are collectively removed. Therefore, defects of the finished single crystal 220 can be reduced, and the quality of the single crystal 220 can be greatly improved.

請同時參照圖1與圖3,其中圖3係繪示依照本發明之另一實施方式的一種成長類單晶之裝置的剖面示意圖。在本實施方式中,可在長晶之步驟106進行前,於每個坩堝200之底部206的中央區域228下方設置高熱傳導係數元件226。這些高熱傳導係數元件226可在類單晶220的長晶過程中,使坩堝200之底部206之中央區域228上方的矽融湯較快速地凝結成長,藉此可有利於使固液介面224呈中央凸且外側低凹的狀態。故,這樣的裝置設計有利於控制固液介面224,而可有效減少晶格缺陷,進而可提高類單晶220成品之品質。 Please refer to FIG. 1 and FIG. 3 simultaneously. FIG. 3 is a schematic cross-sectional view showing a device for growing a single crystal according to another embodiment of the present invention. In the present embodiment, a high thermal conductivity coefficient element 226 may be disposed below the central region 228 of the bottom portion 206 of each crucible 200 prior to the step 106 of growing crystals. These high thermal conductivity elements 226 can cause the mash melt above the central region 228 of the bottom 206 of the crucible 200 to condense faster during the growth of the single crystal 220, thereby facilitating the solid interface 224 The center is convex and the outer side is concave. Therefore, such a device design is advantageous for controlling the solid-liquid interface 224, and can effectively reduce lattice defects, thereby improving the quality of the finished single crystal 220.

請同時參照圖1與圖4,其中圖4係繪示依照本發明之又一實施方式的一種成長類單晶之裝置的剖面示意圖。在本實施方式中,可在長晶之步驟106進行前,於每個坩堝200之底部206的中央區域228下方設置高熱傳導係數元件226、以及於每個坩堝200之底部206的外緣區域230的下方設置低熱傳導係數元件232。在一些例子中,如圖4所示,這些坩堝之低熱傳導係數元件232可整合成一結構層,且高熱傳導係數元件226可嵌設在低熱傳導係數元件232之結構層中。在類單晶220的長晶過程中,這些高熱傳導係數元件226可使坩堝200之底部206之中央區域228上方的矽融湯較快速地凝結成長,而這些低熱傳導係數元件232可使坩堝200之底部206之外緣區域230上方的矽融湯 較中央緩慢地凝結成長,藉此可更有利於控制固液介面224呈中央凸且外側低凹的狀態。因此,這樣的裝置設計更有助於控制固液介面224,而可更有效減少晶格缺陷,進而可更有助於類單晶220成品之品質的提升。 Please refer to FIG. 1 and FIG. 4 simultaneously. FIG. 4 is a schematic cross-sectional view showing a device for growing a single crystal according to still another embodiment of the present invention. In the present embodiment, a high thermal conductivity coefficient element 226 and an outer edge region 230 of the bottom portion 206 of each crucible 200 may be disposed below the central region 228 of the bottom portion 206 of each crucible 200 prior to the step 108 of growing crystals. A low heat transfer coefficient element 232 is disposed below. In some examples, as shown in FIG. 4, the low thermal conductivity elements 232 of the crucibles can be integrated into a structural layer, and the high thermal conductivity component 226 can be embedded in the structural layer of the low thermal conductivity component 232. During the crystal growth of the single crystal-like 220, these high thermal conductivity elements 226 can cause the bismuth melt above the central region 228 of the bottom 206 of the crucible 200 to condense and grow faster, and these low thermal conductivity elements 232 can be used for 坩埚200. The bottom of the bottom 206 is outside the edge area 230 The condensed growth is slower than the center, whereby it is more advantageous to control the state in which the solid-liquid interface 224 is convex in the center and low in the outside. Therefore, such a device design is more conducive to controlling the solid-liquid interface 224, and can more effectively reduce lattice defects, thereby further contributing to the improvement of the quality of the single crystal-like 220 finished product.

請同時參照圖1、圖5A與圖5B,其中圖5A與圖5B係分別繪示依照本發明之再一實施方式的一種成長類單晶之裝置的剖面示意圖與上視示意圖。在本實施方式中,可在長晶之步驟106進行前,先在任二相鄰之坩堝200之間額外設置加熱器234。由於坩堝200彼此鄰設排列,且這些加熱器234係分別設置在相鄰二坩堝200之間,因此這些加熱器234分別位於每個坩堝200之側面,即每個坩堝200之側牆208旁。在一些例子中,如圖5A所示,這些加熱器234為石墨棒。如圖5B所示,這些加熱器234可分別排列在相鄰二坩堝200之間。或者,這些加熱器234可分別環繞住每個坩堝200。完成加熱器234的設置後,即可在類單晶220的長晶過程中,利用這些加熱器234從每個坩堝200之側面來加熱坩堝200,藉以在長晶過程中協助控制固液介面224,以利減少類單晶220之晶格缺陷,進而達到提升類單晶220成品之品質的效果。 Referring to FIG. 1 , FIG. 5A and FIG. 5B , FIG. 5A and FIG. 5B are respectively a schematic cross-sectional view and a top view of a device for growing a single crystal according to still another embodiment of the present invention. In the present embodiment, heater 234 may be additionally disposed between any two adjacent turns 200 before proceeding with step 108 of the growth. Since the crucibles 200 are arranged adjacent to one another and these heaters 234 are respectively disposed between adjacent turns 200, these heaters 234 are respectively located on the sides of each crucible 200, that is, beside the side walls 208 of each crucible 200. In some examples, as shown in Figure 5A, these heaters 234 are graphite rods. As shown in FIG. 5B, these heaters 234 can be arranged between adjacent turns 200, respectively. Alternatively, these heaters 234 can surround each of the turns 200, respectively. After the heater 234 is set, the heaters 234 can be used to heat the crucible 200 from the side of each crucible 200 during the growth of the single crystal 220, thereby assisting in controlling the solid-liquid interface 224 during the growth process. In order to reduce the lattice defects of the single crystal-like 220, and thereby achieve the effect of improving the quality of the single crystal 220 finished product.

由上述之實施方式可知,本發明之一優點就是因為本發明之類單晶之製備方法係在同一長晶爐之爐體內設置多個坩堝,並於每個坩堝中各設置一個單晶晶種,因此可在長晶時達到無晶界面之目的,並可減少晶碇之缺陷。 It is obvious from the above embodiments that one of the advantages of the present invention is that a method for preparing a single crystal according to the present invention is to provide a plurality of crucibles in a furnace body of the same crystal growth furnace, and to provide a single crystal seed crystal in each crucible. Therefore, the crystal-free interface can be achieved in the case of crystal growth, and the defects of the crystal crucible can be reduced.

由上述之實施方式可知,本發明之另一優點就是因為本發明之類單晶之製備方法可在相鄰坩堝之間設置加熱器,如此可在長晶過程中,有效控制每個坩堝內的熱場,進而可較準確的控制長晶的固液介面。 It can be seen from the above embodiments that another advantage of the present invention is that a method for preparing a single crystal according to the present invention can provide a heater between adjacent crucibles, thereby effectively controlling the inside of each crucible during the crystal growth process. The thermal field, in turn, can more accurately control the solid-liquid interface of the crystal growth.

由上述之實施方式可知,本發明之又一優點就是因為本發明之類單晶之製備方法可在每個坩堝之底部中央區域的下方設置高熱傳導係數元件,或可額外再於坩堝之底部外緣區域的下方設置低熱傳導係數元件,藉此可更有效地控制每個坩堝內的熱場,而更準確地控制長晶的固液介面,使得固液介面呈現中間凸且外側低,以使固液介面之外側均為張應力,進而可減少晶界面的缺陷。由於固液介面可獲得有效控制,因此有利於減少過融程度,避免局部區域之單晶晶種被融光。 According to the above embodiments, another advantage of the present invention is that a method for preparing a single crystal according to the present invention can provide a high thermal conductivity coefficient element under the central portion of the bottom of each crucible, or can be additionally placed outside the bottom of the crucible. A low heat conduction coefficient element is disposed under the edge region, thereby more effectively controlling the thermal field in each crucible, and more accurately controlling the solid-liquid interface of the crystal growth, so that the solid-liquid interface is convex and the outer side is low, so that The outer side of the solid-liquid interface is tensile stress, which can reduce the defects of the crystal interface. Since the solid-liquid interface can be effectively controlled, it is advantageous to reduce the degree of over-melting and to avoid the single-crystal seed in the local region being melted.

由上述之實施方式可知,本發明之再一優點就是因為在本發明之類單晶之製備方法中,每個坩堝可為長方形,因此於晶片切割時,可使晶碇獲得較有效率的利用。 It can be seen from the above embodiments that another advantage of the present invention is that in the preparation method of the single crystal of the present invention, each crucible can be rectangular, so that the wafer can be used more efficiently when the wafer is cut. .

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何在此技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 While the present invention has been described above by way of example, it is not intended to be construed as a limitation of the scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

100‧‧‧步驟 100‧‧‧ steps

102‧‧‧步驟 102‧‧‧Steps

104‧‧‧步驟 104‧‧‧Steps

106‧‧‧步驟 106‧‧‧Steps

Claims (9)

一種類單晶之製備方法,包含:設置複數個坩堝於一爐體內;於每一該複數個坩堝中設置一單晶晶種;於每一該複數個坩堝中設置一矽料於該單晶晶種上;以及進行一長晶步驟,以利用每一該複數個坩堝中之該矽料與該單晶晶種形成一類單晶晶碇。 A method for preparing a single crystal, comprising: setting a plurality of crucibles in a furnace; providing a single crystal seed in each of the plurality of crucibles; and disposing a crucible in the plurality of crucibles Seeding; and performing a crystal growth step to form a single crystal crystal enthalpy with the single crystal seed using each of the plurality of bismuth materials. 如申請專利範圍第1項之類單晶之製備方法,其中每一該複數個坩堝之底面的長與寬分別較該單晶晶種之底面的長與寬大10mm至100mm。 The method for preparing a single crystal according to the first aspect of the invention, wherein the length and the width of the bottom surface of each of the plurality of crucibles are respectively 10 mm to 100 mm longer than the length of the bottom surface of the single crystal seed crystal. 如申請專利範圍第1項之類單晶之製備方法,其中每一該複數個坩堝之底面與該單晶晶種之底面的尺寸實質相同。 The method for preparing a single crystal according to the first aspect of the invention, wherein the bottom surface of each of the plurality of crucibles is substantially the same size as the bottom surface of the single crystal seed crystal. 如申請專利範圍第1項之類單晶之製備方法,其中該複數個單晶晶種具有相同之一晶向。 The method for preparing a single crystal according to claim 1, wherein the plurality of single crystal seeds have the same crystal orientation. 如申請專利範圍第4項之類單晶之製備方法,其中該晶向為[100]晶向。 A method for producing a single crystal according to the fourth aspect of the patent application, wherein the crystal orientation is a [100] crystal orientation. 如申請專利範圍第1項之類單晶之製備方法,其中每一該複數個坩堝之形狀為長方形。 The method for preparing a single crystal according to claim 1, wherein each of the plurality of crucibles has a rectangular shape. 如申請專利範圍第1項之類單晶之製備方法,於進行該長晶步驟前,更包含設置複數個加熱器分別位於相鄰之該複數個坩堝之間,其中進行該長晶步驟時包含利用該複數個加熱器加熱該複數個坩堝。 The method for preparing a single crystal according to the first aspect of the patent application, before performing the crystal growth step, further comprising: setting a plurality of heaters respectively located between the adjacent plurality of crucibles, wherein the crystal growth step comprises The plurality of heaters are heated by the plurality of heaters. 如申請專利範圍第1項之類單晶之製備方法,於進行該長晶步驟前,更包含於每一該複數個坩堝之底部中央區域的下方設置一高熱傳導係數元件。 For the preparation method of the single crystal according to the first aspect of the patent application, before the crystal growth step, a high heat conduction coefficient element is further disposed under the central portion of the bottom of each of the plurality of crucibles. 如申請專利範圍第1項之類單晶之製備方法,於進行該長晶步驟前,更包含:於每一該複數個坩堝之底部中央區域的下方設置一高熱傳導係數元件;以及於每一該複數個坩堝之底部外緣區域的下方設置一低熱傳導係數元件。 The method for preparing a single crystal according to the first aspect of the patent application, before performing the crystal growth step, further comprising: disposing a high heat conduction coefficient element under the bottom central portion of each of the plurality of crucibles; A low heat conduction coefficient element is disposed below the bottom outer edge region of the plurality of turns.
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