TW201602715A - Mask for arrangement and the manufacturing method of the same - Google Patents

Mask for arrangement and the manufacturing method of the same Download PDF

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Publication number
TW201602715A
TW201602715A TW103134421A TW103134421A TW201602715A TW 201602715 A TW201602715 A TW 201602715A TW 103134421 A TW103134421 A TW 103134421A TW 103134421 A TW103134421 A TW 103134421A TW 201602715 A TW201602715 A TW 201602715A
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Taiwan
Prior art keywords
mask
mask body
layer
protrusion
workpiece
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TW103134421A
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Chinese (zh)
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Yoshihiro Kobayashi
Hirohito Tamaru
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Hitachi Maxell
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Publication of TW201602715A publication Critical patent/TW201602715A/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods

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  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

This invention provides a mask for arrangement that is still suitable even when the external size of the protrusion is minimized along the bumps. The solution is a mask for arrangement, which places solder balls (2) inside the holes (12) corresponding to predetermined pattern arrangement to thereby embark solder balls (2) on predetermined locations of the working piece (3). The feature includes: a mask body (10) with patterns composed of several holes (12); and a protrusion (15) on a side of the mask body (10) opposite to the working piece (3). A covering layer (50) is formed at the bottom of the mask body (10).

Description

配列用遮罩及其製造方法 Layout mask and manufacturing method thereof

本發明是有關例如為了形成焊錫凸塊而使用的配列用遮罩及其製造方法。 The present invention relates to a mask for arrangement used in order to form solder bumps, and a method of manufacturing the same.

焊錫凸塊的形成方法是經由:在晶圓.可撓性基板.剛性基板等的工件上的電極塗佈焊劑(flux)之印刷工程、在焊劑上配列焊錫球之配列工程、及將焊錫球加熱.溶解之加熱工程,來形成凸塊。而且,在前述的配列工程中,於工件上配列焊錫球的方式是有利用遮罩的放入方式。放入方式是使用對應於工件的電極的配列圖案而具有焊錫球可揮通的定位用的通孔之配列用遮罩(以下適當簡稱「遮罩」),使焊錫球搭載於工件的電極上。具體而言,以通孔與電極能夠一致的方式,對於工件對位遮罩之後,以刮刀或刷子等來掃過被供給於遮罩上的焊錫球,而將焊錫球一個一個投入各通孔中。而且,藉由使焊錫球黏著於焊劑,使焊錫球暫定性地搭載於工件上的預定位置。 The solder bump is formed by: on the wafer. Flexible substrate. The printing process of the electrode coating flux on the workpiece such as a rigid substrate, the arrangement of the solder balls on the solder, and the solder ball heating. Dissolve the heating process to form the bumps. Further, in the above-described arrangement, the method of arranging the solder balls on the workpiece is a method in which the mask is placed. The placement method is a mask for arranging a through hole for positioning a solder ball (hereinafter referred to as a "mask" as appropriate), and the solder ball is mounted on the electrode of the workpiece. . Specifically, after the through holes and the electrodes are aligned, after the workpiece is aligned, the solder balls supplied to the mask are swept by a doctor blade or a brush, and the solder balls are put into the through holes one by one. in. Further, the solder ball is temporarily placed on the workpiece at a predetermined position by adhering the solder ball to the flux.

此遮罩有揭示於專利文獻1者。專利文獻1記載的遮罩是在具有通孔的遮罩本體的下面設置多數根的 支撐用的突起部,突起部的突出尺寸是設定成同一尺寸。藉此,在工件上設置遮罩時,全部的支撐用的突起部的下端會被抵接於工件的上面,可確保具有通孔的遮罩本體與工件的對向間隙。 This mask is disclosed in Patent Document 1. The mask described in Patent Document 1 is provided with a plurality of roots under the mask body having the through holes. The protrusion for supporting, the protruding size of the protrusion is set to the same size. Thereby, when the mask is provided on the workpiece, the lower ends of all the supporting projections are abutted on the upper surface of the workpiece, and the opposing gap between the mask body having the through holes and the workpiece can be ensured.

[先行技術文獻] [Advanced technical literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2006-287215號公報 [Patent Document 1] Japanese Laid-Open Patent Publication No. 2006-287215

然而,近年來隨著電子機器的小型化,凸塊的微小化也跟著進展。亦即,隨著凸塊的微小化,遮罩的通孔間隔尺寸或圖案領域間隔尺寸會變窄,配置於通孔間或圖案領域間(圖案領域外周)的突起部本身的外形尺寸也有變小的傾向,因此遮罩與工件的對向間隔窄,配置於工件的電極上的焊劑容易附著於遮罩。尤其是一旦焊劑附著於遮罩本體的下面或通孔內面,則容易發生焊錫球的搭載不良。本發明的目的是在於提供一種即使隨著凸塊的微小化而縮小突起部本身的外形尺寸時,還是可無不良搭載焊錫球之配列用遮罩及其製造方法。 However, in recent years, with the miniaturization of electronic equipment, the miniaturization of bumps has also progressed. That is, as the size of the bumps is miniaturized, the size of the through-holes of the mask or the size of the pattern area is narrowed, and the outer dimensions of the protrusions disposed between the through-holes or between the pattern areas (the outer periphery of the pattern area) also change. Since the inclination is small, the distance between the mask and the workpiece is narrow, and the flux disposed on the electrode of the workpiece is likely to adhere to the mask. In particular, when the flux adheres to the lower surface of the mask body or the inner surface of the through hole, mounting failure of the solder ball is likely to occur. An object of the present invention is to provide a mask for arranging a solder ball without a defect, and a method of manufacturing the same, even when the outer dimensions of the protrusion itself are reduced as the bump is miniaturized.

本發明係一種配列用遮罩,在對應於預定的 配列圖案之通孔12內放進焊錫球2,藉此在工件3上的預定位置搭載焊錫球2,其特徵係具備:遮罩本體10,其係形成有多數個由通孔12所構成的圖案領域;及突起部15,其係設在遮罩本體10之與工件3的對向面側,又,至少在遮罩本體10下面形成有被覆層50。 The present invention is a matching mask, corresponding to a predetermined The solder ball 2 is placed in the through hole 12 of the arrangement pattern, whereby the solder ball 2 is mounted on a predetermined position on the workpiece 3, and is characterized in that the mask body 10 is formed with a plurality of through holes 12 formed therein. The pattern region; and the protrusion 15 are provided on the opposite side of the mask body 10 from the workpiece 3, and at least the coating layer 50 is formed on the underside of the mask body 10.

又,遮罩本體10及突起部15係形成為非一體。 Further, the mask body 10 and the protruding portion 15 are formed to be non-integral.

又,被覆層50係以覆蓋遮罩本體10下面及突起部15表面的方式形成。此被覆層50係以1μm以下的厚度形成即可。 Further, the covering layer 50 is formed to cover the lower surface of the mask body 10 and the surface of the protruding portion 15. The coating layer 50 may be formed to have a thickness of 1 μm or less.

又,本發明係一種配列用遮罩的製造方法,該配列用遮罩係具備:遮罩本體10,其係形成有多數個由通孔12所構成的圖案領域;及突起部15,其係設在遮罩本體10之與工件3的對向面側,又,至少在遮罩本體10下面形成有被覆層50。 Moreover, the present invention is a manufacturing method of a mask for arranging, wherein the mask body includes a mask body 10 in which a plurality of pattern regions formed by the through holes 12 are formed, and a protrusion portion 15 The cover body 50 is disposed on the opposite side of the mask body 10 from the workpiece 3, and at least the cover layer 50 is formed on the underside of the mask body 10.

首先,在母模40上形成具有光阻體41a的一次圖案光阻41。其次,利用光阻體41a,在母模40上形成一次電著層42。其次,在一次電著層42上形成具有光阻體44a的二次圖案光阻44。其次,在一次電著層42表面形成被覆層50。 First, a primary pattern resist 41 having a photoresist body 41a is formed on the master mold 40. Next, the primary electrode layer 42 is formed on the mother die 40 by the photoresist 41a. Next, a secondary pattern photoresist 44 having a photoresist body 44a is formed on the primary electric layer 42. Next, a coating layer 50 is formed on the surface of the primary electric layer 42.

此被覆層50係形成於一次電著層42之具有二次圖案 光阻44的側的表面及二次圖案光阻44的表面即可。 The coating layer 50 is formed on the primary electro-deposition layer 42 and has a secondary pattern. The surface of the side of the photoresist 44 and the surface of the secondary pattern resist 44 may be used.

若根據本發明的配列用遮罩,則因為在遮罩本體下面形成有被覆層,所以可防止焊劑原封不動附著於遮罩本體下面的狀態。並且,以覆蓋遮罩本體下面及突起部表面的方式形成被覆層,藉此被覆層實現作為突起部的保護層的機能,可防止突起部的脫落、變形、破損。 According to the arrangement mask of the present invention, since the coating layer is formed on the lower surface of the mask body, it is possible to prevent the flux from adhering to the underside of the mask body as it is. Further, the coating layer is formed to cover the lower surface of the mask body and the surface of the protrusion portion, whereby the coating layer functions as a protective layer for the protrusion portion, and the protrusion portion can be prevented from falling off, deformed, and damaged.

1‧‧‧遮罩 1‧‧‧ mask

2‧‧‧焊錫球 2‧‧‧ solder balls

3‧‧‧工件 3‧‧‧Workpiece

6‧‧‧電極 6‧‧‧Electrode

10‧‧‧遮罩本體 10‧‧‧mask body

12‧‧‧通孔 12‧‧‧through hole

15‧‧‧突起部 15‧‧‧Protruding

15a‧‧‧框架 15a‧‧‧Frame

15b‧‧‧支柱 15b‧‧‧ pillar

15c‧‧‧支柱 15c‧‧‧ pillar

15d‧‧‧凸部 15d‧‧‧ convex

15’‧‧‧前端部 15’‧‧‧ front end

15”‧‧‧根部 15"‧‧‧ root

30、40‧‧‧母模 30, 40‧‧‧ mother model

31、36、43‧‧‧光阻層(防焊漆層) 31, 36, 43‧‧‧ photoresist layer (solderproof paint layer)

34、41‧‧‧一次圖案光阻 34, 41‧‧‧ Once patterned photoresist

34a、41a‧‧‧光阻體 34a, 41a‧‧‧ photoresist

35、42‧‧‧一次電鑄層 35, 42‧‧‧ Once electroformed layer

38、44‧‧‧二次圖案光阻 38, 44‧‧‧ secondary pattern photoresist

38a、44a‧‧‧光阻體 38a, 44a‧‧‧ photoresist

39‧‧‧二次電鑄層 39‧‧‧Second electroforming layer

50‧‧‧被覆層 50‧‧‧covered layer

圖1是表示本發明的配列用遮罩及工件的全體構成的立體圖。 Fig. 1 is a perspective view showing the overall configuration of a mask and a workpiece according to the present invention.

圖2是本發明的第1實施形態的配列用遮罩的縱剖側面圖。 Fig. 2 is a longitudinal sectional side view showing a mask for arrangement according to the first embodiment of the present invention.

圖3是本發明的第1實施形態的配列用遮罩的平面圖。 3 is a plan view showing a mask for arrangement according to the first embodiment of the present invention.

圖4是本發明的第1實施形態的配列用遮罩的別的實施形態的縱剖側面圖。 Fig. 4 is a longitudinal sectional side view showing another embodiment of the arrangement mask according to the first embodiment of the present invention.

圖5是本發明的第1實施形態的配列用遮罩的別的實施形態的平面圖。 Fig. 5 is a plan view showing another embodiment of the arrangement mask according to the first embodiment of the present invention.

圖6是本發明的第1實施形態的配列用遮罩的別的實施形態的縱剖側面圖。 Fig. 6 is a longitudinal sectional side view showing another embodiment of the arrangement mask according to the first embodiment of the present invention.

圖7是本發明的第1實施形態的配列用遮罩的製造方 法的說明圖。 Fig. 7 is a view showing the manufacture of the mask for arrangement according to the first embodiment of the present invention; An illustration of the law.

圖8是本發明的第1實施形態的配列用遮罩的製造方法的說明圖。 FIG. 8 is an explanatory view showing a method of manufacturing the mask for arrangement according to the first embodiment of the present invention.

圖9是本發明的第2實施形態的配列用遮罩的縱剖側面圖。 Fig. 9 is a longitudinal sectional side view showing a mask for arrangement according to a second embodiment of the present invention.

圖10是本發明的第2實施形態的配列用遮罩的製造方法的說明圖。 FIG. 10 is an explanatory view showing a method of manufacturing the mask for arrangement according to the second embodiment of the present invention.

圖11是本發明的第2實施形態的配列用遮罩的製造方法的說明圖。 FIG. 11 is an explanatory view showing a method of manufacturing the mask for arrangement according to the second embodiment of the present invention.

圖12是本發明的別實施形態的配列用遮罩的部分擴大平面圖。 Fig. 12 is a partially enlarged plan view showing a mask for arrangement according to another embodiment of the present invention.

(第1實施形態) (First embodiment)

在圖1乃至圖3中顯示本發明的第1實施形態的焊錫球的配列用遮罩。此配列用遮罩(以下簡稱遮罩)1是供以在焊錫凸塊形成之焊錫球2的配列工程中使用者。在圖2中,符號3是表示成為遮罩1之焊錫球2的搭載對象的工件。此工件3是例如在玻璃環氧樹脂基板的基底4搭載複數個的半導體晶片5,以引線接合來配線之後轉注成形密封而成者,以包圍半導體晶片5的方式,在工件3的上面以預定的圖案形成輸出入端子的電極6。另外,工件3是在凸塊的形成後切斷成小片,成為各個的LSI晶片。 A mask for arranging solder balls according to the first embodiment of the present invention is shown in FIG. 1 to FIG. This arrangement mask (hereinafter referred to as mask) 1 is a user for the arrangement of the solder balls 2 formed in the solder bumps. In FIG. 2, reference numeral 3 denotes a workpiece to be mounted on the solder ball 2 to be the mask 1. In the workpiece 3, for example, a plurality of semiconductor wafers 5 are mounted on the base 4 of the glass epoxy substrate, and the wires are bonded by wire bonding, and then molded and sealed. The semiconductor wafer 5 is surrounded by the semiconductor wafer 5 so as to surround the workpiece 3. The pattern forms the electrode 6 that is output to the terminal. Further, the workpiece 3 is cut into small pieces after the formation of the bumps, and becomes an individual LSI wafer.

如圖1所示般,遮罩1是由以鎳或鎳鈷等的鎳合金、銅或其他的金屬作為素材形成的遮罩本體10所構成,可在此遮罩本體10以包圍的方式安裝框體11。在遮罩本體10的盤面中央部,對於各半導體晶片5,形成有多數個用以投入焊錫球2之多數獨立的通孔12所構成的圖案領域。如圖2所示般,通孔12是對應於配列圖案,該配列圖案是對應於工件3上的各半導體晶片5的電極6的配列位置。焊錫球2是具有50μm以下的半徑尺寸者,配合於此,各通孔12是形成具有比該球2的半徑尺寸稍微大的內徑尺寸之平面視圓形狀。 As shown in FIG. 1, the mask 1 is composed of a mask body 10 formed of a nickel alloy such as nickel or nickel cobalt, copper or other metal, and the mask body 10 can be mounted in a surrounding manner. Frame 11. In the central portion of the disk surface of the mask body 10, a plurality of pattern fields formed by a plurality of independent through holes 12 for feeding the solder balls 2 are formed for each of the semiconductor wafers 5. As shown in FIG. 2, the through holes 12 correspond to an arrangement pattern which corresponds to the arrangement position of the electrodes 6 of the respective semiconductor wafers 5 on the workpiece 3. The solder ball 2 has a radius of 50 μm or less. In combination, each of the through holes 12 is formed into a circular shape having an inner diameter which is slightly larger than the radius of the ball 2.

框體11是由鋁、42合金、因瓦材、SUS430等的材質所構成的平板體,在其盤面中央具備對應於遮罩本體10的一個四角形狀的開口,本實施形態是以一個的框體11保持一個的遮罩本體10。框體11是比遮罩本體10更厚的成形品,與遮罩本體10的外周緣不離一體地接合。在此,框體11的厚度尺寸是例如0.05~1.0mm程度,在本實施形態中是設定成0.5mm。並且,遮罩本體10的厚度最好設為10μm以上,本實施形態是設定成200μm。 The casing 11 is a flat plate made of a material such as aluminum, 42 alloy, Invar or SUS430, and has a rectangular opening corresponding to the mask body 10 at the center of the disk surface. This embodiment is a frame. The body 11 holds a mask body 10. The casing 11 is a molded article thicker than the mask body 10, and is integrally joined to the outer periphery of the mask body 10. Here, the thickness of the casing 11 is, for example, about 0.05 to 1.0 mm, and is set to 0.5 mm in the present embodiment. Further, the thickness of the mask main body 10 is preferably 10 μm or more, and is set to 200 μm in the present embodiment.

在遮罩本體10(遮罩1)的下面側,亦即與工件3的對向面側,可設置朝下方向呈突出狀的突起部15。詳細是如圖2及圖3所示般,可在圖案領域間(圖案領域的外周)以包圍此圖案領域的方式設置突起部15(框架15a)。此突起部15(框架15a)是像圖3那樣亦 可不連續性地設置,亦可斷續地設置。又,如圖4所示般,可在未形成有圖案領域內的通孔12的位置設置突起部15(支柱15b)。並且,在相鄰的圖案領域間(圖案領域的外周)以包圍圖案領域的方式設置的突起部15的形狀是不限於框架15a,如圖5所示般,亦可為支柱15c。若設置如此的突起部15,則在配列作業時,可抵接於工件3的上面來確保遮罩本體10與工件3的對向間隙。在各個的突起部15(框架15a、支柱15b),如圖3及圖5所示般,最好是形成從遮罩本體10的下面起朝突起部15的前端變窄,呈圓錐台狀。 On the lower surface side of the mask body 10 (mask 1), that is, on the side of the facing surface of the workpiece 3, a projection 15 that protrudes in the downward direction can be provided. As shown in detail in FIG. 2 and FIG. 3, the protrusion 15 (frame 15a) can be provided so as to surround the pattern area between the pattern areas (outer circumference of the pattern area). This protrusion 15 (frame 15a) is also like FIG. It can be set discontinuously or intermittently. Moreover, as shown in FIG. 4, the protrusion 15 (pillar 15b) can be provided in the position where the through-hole 12 in the pattern area is not formed. Further, the shape of the protrusion 15 provided between the adjacent pattern areas (outer circumference of the pattern area) so as to surround the pattern area is not limited to the frame 15a, and may be the pillar 15c as shown in FIG. When such a projection 15 is provided, it is possible to abut against the upper surface of the workpiece 3 during the alignment operation to secure the opposing gap between the mask body 10 and the workpiece 3. As shown in FIGS. 3 and 5, each of the projections 15 (the frame 15a and the pillar 15b) is preferably formed to have a truncated cone shape from the lower surface of the mask body 10 toward the front end of the projection 15.

突起部15的形狀,其他如圖6所示般,亦可為突起部15的根部尺寸隨著朝遮罩本體10的下面而變大的末端擴大形狀(隨著從突起部15的根部朝前端而變窄的前端窄形狀),側面形成圓弧狀者。藉此,可防止應力集中於突起部15特別是根部15”而發生的破損,且在將遮罩1載置於工件3時,即使假設焊劑17附著於突起部15,也可藉由突起部15的側面成為圓弧來防止焊劑17往通孔12繞入,因此可消除焊劑17附著於通孔12而導致焊錫球2的搭載不良之虞。另外,有關突起部15的根部15”的終端位置是最好位於遮罩本體10的下面的通孔12附近,可思考位於遮罩本體下面10a與通孔內面12a的交點之形態,位於從遮罩本體下面10a上的通孔12取間隙之處的形態。並且,突起部15的側面是凸狀圓弧或凹狀圓弧皆可,若為凸狀圓弧,則形成強度佳者,若凹狀圓 弧,則在突起部15側面的哪個位置皆不會有接近附著焊劑17的電極6的部分,亦即保持離附著焊劑17的電極6一定距離的狀態。而且,亦可將突起部15的前端部15’及/或根部15”形成圓弧狀,藉此可儘可能地減少焊劑17附著於突起部15之虞。 As shown in FIG. 6, the shape of the protrusion 15 may be an end-expanded shape in which the root size of the protrusion 15 becomes larger toward the lower surface of the mask body 10 (as the root portion of the protrusion 15 faces the front end). The narrowed front end has a narrow shape, and the side surface is formed into an arc shape. Thereby, it is possible to prevent the stress from being concentrated on the protrusion 15 and particularly the root portion 15", and when the mask 1 is placed on the workpiece 3, even if the flux 17 is attached to the protrusion 15, the protrusion can be used. The side surface of the 15 is formed as an arc to prevent the flux 17 from being wound around the through hole 12. Therefore, it is possible to eliminate the adhesion of the solder ball 2 to the through hole 12 and cause the mounting failure of the solder ball 2. Further, the terminal portion of the root portion 15" of the protrusion portion 15 The position is preferably located in the vicinity of the through hole 12 below the mask body 10, and can be considered in the form of the intersection of the lower surface 10a of the mask body and the inner surface 12a of the through hole, and the gap is located in the through hole 12 from the lower surface 10a of the mask body. The form of the place. Moreover, the side surface of the protrusion 15 may be a convex arc or a concave arc, and if it is a convex arc, a strong strength is formed, if a concave circle The arc does not have a portion close to the electrode 6 to which the flux 17 is attached, that is, a state in which the electrode 6 adhering to the flux 17 is kept at a certain distance from the position on the side surface of the protrusion 15. Further, the front end portion 15' and/or the root portion 15" of the projection portion 15 may be formed in an arc shape, whereby the adhesion of the flux 17 to the projection portion 15 can be reduced as much as possible.

在本遮罩1中,突起部15的高度與遮罩本體10的厚度的比是2對1以上為理想,更理想是上述遮罩本體10的厚度在10~300μm的範圍內符合。並且,突起部15是長寬比(突起部15的高度與前端尺寸的比)大為理想,在本實施形態是設為長寬比3。並且,突起部15的根部尺寸L2是設為突起部15的前端尺寸L1的1.0~1.5倍為理想,在本實施形態是設定成1.2倍。而且,突起部15的前端尺寸L1、根部尺寸L2及通孔12間的寬度尺寸L3的比是1對1.2對1.4以上為理想。而且,從圖案領域到突起部15(框架15a,支柱15c(後述),凸部15d(後述))的根部為止的尺寸L4是設定成0.01mm以上為理想,在本實施形態是設為0.02mm。根據如此的條件,可儘量防止焊劑的附著。此時,藉由符合上述突起部15的前端尺寸L1與根部尺寸L2的比的關係及從圖案領域到突起部15的根部為止的尺寸L4的關係,可使突起部15的破損防止及焊劑的附著防止並存。而且,在將從圖案領域到突起部15(框架15a,支柱15c(後述),凸部15d(後述))的前端中心為止的尺寸設為L5時,藉由L1、L2及L5的比設為1對3對2.5以上,可使上述並存 效果發揮到最大限度。 In the present mask 1, the ratio of the height of the protrusion 15 to the thickness of the mask body 10 is preferably two to one or more, and more preferably, the thickness of the mask body 10 is in the range of 10 to 300 μm. Further, the projection 15 is preferably an aspect ratio (ratio of the height of the projection 15 to the tip end dimension), and is preferably an aspect ratio 3 in the present embodiment. Further, the root portion size L2 of the projection portion 15 is preferably 1.0 to 1.5 times the front end dimension L1 of the projection portion 15, and is preferably set to 1.2 times in the present embodiment. Further, the ratio of the tip end dimension L1 of the projection portion 15 to the width dimension L3 between the root portion dimension L2 and the through hole 12 is preferably 1.2 to 1.4 or more. In addition, it is preferable that the dimension L4 from the pattern region to the root portion of the projection 15 (the frame 15a, the support 15c (described later), and the convex portion 15d (described later)) is set to 0.01 mm or more, and is 0.02 mm in the present embodiment. . According to such conditions, the adhesion of the flux can be prevented as much as possible. At this time, by the relationship between the ratio of the tip end dimension L1 of the projection 15 and the root dimension L2 and the relationship of the dimension L4 from the pattern region to the root of the projection 15, the damage of the projection 15 and the flux can be prevented. Adhesion prevents coexistence. In addition, when the dimension from the pattern area to the center of the front end of the protrusion 15 (the frame 15a, the pillar 15c (described later), and the convex portion 15d (described later)) is L5, the ratio of L1, L2, and L5 is set to 1 to 3 pairs of 2.5 or more, which can coexist The effect is maximized.

在上述實施形態中是遮罩本體10與突起部15成為一體的遮罩1,但遮罩本體10及突起部15亦可為以別的構件來一體形成者。這在上述遮罩1中,若以磁性體來形成遮罩本體10,以非磁性體來形成突起部15,則藉由磁石的磁力吸引來將遮罩1固定於工件3時,可使磁力對於遮罩1均一地作用,因此遮罩1無不慎彎曲之虞,可使良好地緊密結合於工件,可提升通孔12對於電極6的對位精度。並且,在卸下遮罩1時,由於工件3與突起部15不直接磁力結合,因此可良好地分離。該遮罩1是例如藉由磁性體金屬(鎳、鐵等)來形成遮罩本體10,藉由非磁性體金屬(銅、鋁等)來形成突起部15而取得。 In the above embodiment, the mask body 10 and the protrusion 15 are integrally formed. However, the mask body 10 and the protrusion 15 may be integrally formed by other members. In the above-described mask 1, when the mask body 10 is formed of a magnetic body and the protrusions 15 are formed of a non-magnetic material, the magnetic field can be attracted to the workpiece 3 by the magnetic attraction of the magnet. Since the mask 1 acts uniformly, the mask 1 can be tightly bonded to the workpiece without any inadvertent bending, and the alignment accuracy of the through hole 12 with respect to the electrode 6 can be improved. Further, when the mask 1 is removed, since the workpiece 3 and the protruding portion 15 are not directly magnetically coupled, they can be separated well. The mask 1 is obtained by forming the mask body 10 by a magnetic metal (nickel, iron, or the like), for example, and forming the protrusion 15 by a non-magnetic metal (copper, aluminum, or the like).

並且,在以非磁性體來形成突起部15者中,不限於上述金屬,亦可藉由樹脂或光阻來形成者。藉此,除了上述效果外,可發揮來自該樹脂的彈力性之緩衝作用,當突起部15抵接於工件3時,工件3損傷之虞變少。另外,為了顯著地取得該效果,在遮罩1中,不僅突起部15,最好與工件3抵接的部分全以樹脂形成。並且,在以樹脂形成突起部15時,只要使用與以電鑄法形成遮罩本體10時使用的光阻相同者,便可生產效率佳地形成。 Further, the protrusion 15 is formed of a non-magnetic material, and is not limited to the above metal, and may be formed of a resin or a photoresist. Thereby, in addition to the above effects, the elastic cushioning action from the resin can be exerted, and when the projections 15 abut against the workpiece 3, the damage of the workpiece 3 is reduced. Further, in order to remarkably obtain this effect, in the mask 1, not only the projections 15, but also the portion that abuts against the workpiece 3 is entirely formed of a resin. Further, when the projections 15 are formed of a resin, it is possible to produce them efficiently by using the same photoresist as that used when the mask body 10 is formed by electroforming.

並且,在本遮罩1中,如圖2、圖4、圖6所示般,在遮罩本體10下面或通孔12內面設置被覆層50。被覆層50最好是具有撥水性者,其材質有氟樹脂、 矽樹脂、乳劑、光阻(液狀)等。藉由設置該被覆層50,即使焊劑附著於遮罩本體10下面或通孔12內面,還是可彈開焊劑,可防止焊劑原封不動附著於遮罩本體10下面或通孔12內面的狀態。另外,該被覆層50是亦可形成於遮罩本體10上面,或在圖案領域間,在突起部15(框架15a)間的遮罩本體10下面是不形成。總之,最好形成於一旦焊劑附著則容易產生焊錫球的搭載不良的部分,在工件上載置遮罩1時,最好形成於與被塗佈於電極6上的焊劑17對面的遮罩本體10及突起部15的表面。 Further, in the present mask 1, as shown in FIGS. 2, 4, and 6, a coating layer 50 is provided on the lower surface of the mask body 10 or on the inner surface of the through hole 12. The coating layer 50 is preferably water-repellent, and is made of fluororesin. Antimony resin, emulsion, photoresist (liquid), etc. By providing the covering layer 50, even if the flux adheres to the underside of the mask body 10 or the inner surface of the through hole 12, the flux can be bounced off, and the flux can be prevented from adhering to the underside of the mask body 10 or the inner surface of the through hole 12 as it is. . Further, the covering layer 50 may be formed on the mask body 10 or may be formed under the mask body 10 between the protrusions 15 (frame 15a) between the pattern areas. In short, it is preferable to form a portion where the solder ball is poorly loaded when the flux adheres, and when the mask 1 is placed on the workpiece, it is preferably formed on the mask body 10 opposite to the flux 17 applied to the electrode 6. And the surface of the protrusion 15.

另外,各圖面不是表示實際的遮罩1的樣子,而是模式性地顯示者。並且,各圖面的通孔12的開口尺寸或遮罩本體10等的厚度尺寸等是基於圖面作成的方便起見,顯示如此的尺寸者。而且,在圖3、圖5中,以符號15所圖示的是突起部15的下端面(前端面),突起部15的根部是未圖示。並且,在圖3、圖5中,被覆層50是未圖示。 Further, each of the drawings is not a view of the actual mask 1, but is displayed in a pattern. Further, the opening size of the through hole 12 of each drawing, the thickness dimension of the mask body 10, and the like are displayed on the basis of the convenience of the drawing surface, and such a size is displayed. Further, in FIGS. 3 and 5, the lower end surface (front end surface) of the projection 15 is indicated by reference numeral 15, and the root portion of the projection 15 is not shown. Further, in FIGS. 3 and 5, the covering layer 50 is not shown.

使用該遮罩1的焊錫球2的配列作業是以其次那樣的程序來進行。另外,此配列作業是藉由專用的配列裝置(參照專利文獻1的圖1,圖5等)來進行。首先,在工件3的電極6上印刷塗佈焊劑17(參照圖2)。其次,以通孔12與電極6能夠一致的方式,在工件3上對位遮罩1之後,固定遮罩1。如此的對位作業實際是在對位框體11與工件3的外周緣之下進行。一旦對位作業終了,則在如此的固定狀態中,突起部15的下端面會抵 接於工件3的表面,遮罩本體10被保持於圖2、圖4、圖6所示那樣確保與工件3的對向間隙之分離姿勢。此時,亦可在工件3的下方配置磁石,而藉由此磁石的磁力作用來使遮罩1吸附於工件3側。 The arrangement of the solder balls 2 using the mask 1 is performed in the following procedure. In addition, this arrangement work is performed by a dedicated arrangement device (refer to FIG. 1 and FIG. 5 of Patent Document 1). First, the application flux 17 is printed on the electrode 6 of the workpiece 3 (refer to FIG. 2). Next, the mask 1 is fixed after the alignment mask 1 is aligned on the workpiece 3 so that the through hole 12 and the electrode 6 can match each other. Such alignment work is actually performed under the outer periphery of the alignment frame 11 and the workpiece 3. Once the alignment operation is finished, in such a fixed state, the lower end surface of the protrusion 15 will abut The mask body 10 is held on the surface of the workpiece 3, and the mask body 10 is held in a separated posture from the opposing gap of the workpiece 3 as shown in Figs. 2, 4, and 6. At this time, the magnet may be disposed below the workpiece 3, and the shield 1 may be adsorbed on the workpiece 3 side by the magnetic force of the magnet.

其次,在遮罩1上供給多數個的焊錫球2,且利用刮刀刷子來使焊錫球2分散於遮罩1上,而在通孔12內一個一個地投入焊錫球2。藉此,焊錫球2是暫時固定地黏著保持於焊劑17。在如此使用刮刀刷子的焊錫球2的投入作業中,即使刮刀刷子壓力施加於遮罩1大,還是可藉由突起部15來防止遮罩1彎曲,可作業效率佳地使投入作業順利進展。 Next, a plurality of solder balls 2 are supplied to the mask 1, and the solder balls 2 are dispersed on the mask 1 by a doctor blade, and the solder balls 2 are placed one by one in the through holes 12. Thereby, the solder ball 2 is temporarily fixedly adhered to the flux 17. In the operation of the solder ball 2 using the doctor blade in this manner, even if the blade pressure is applied to the mask 1, the protrusion 15 can be prevented from being bent by the protrusion 15, and the operation can be smoothly progressed with high work efficiency.

如以上般若根據本實施形態的遮罩1,則由於具備形成遮罩本體10與工件3的對向間隙之突起部15,因此可藉由突起部15來確實地確保與工件3的對向間隙,可有效率無漏地進行往通孔12內之焊錫球2的投入作業。 As described above, according to the mask 1 of the present embodiment, since the protrusion 15 which forms the opposing gap between the mask body 10 and the workpiece 3 is provided, the protrusion 15 can surely ensure the opposing gap with the workpiece 3. The operation of the solder ball 2 into the through hole 12 can be performed efficiently and without leakage.

可在遮罩本體10的外周緣設置補強用的框體11,只要在施加收縮於內方的方向的應力會作用於其本身那樣的張力(tension)之狀態下形成遮罩本體10,便可藉由朝收縮方向的張力來吸收隨周圍溫度的變化之遮罩本體10的膨脹部分。藉此,可防止遮罩本體10對於工件3之位移的發生。又,由於可賦予遮罩本體10的全體均一的張力,因此可使焊錫球2對於工件3位置精度佳地搭載。 The frame body 11 for reinforcement can be provided on the outer periphery of the mask body 10, and the mask body 10 can be formed in a state in which a stress in a direction in which the inner side is contracted is applied to a tension like itself. The expanded portion of the mask body 10 as a function of ambient temperature is absorbed by the tension in the contraction direction. Thereby, the occurrence of displacement of the mask body 10 with respect to the workpiece 3 can be prevented. Moreover, since the uniform tension of the entire body of the mask body 10 can be provided, the position of the solder ball 2 with respect to the workpiece 3 can be accurately mounted.

其次,將如此的構成的配列用遮罩1的製造方法顯示於圖7及圖8。首先,例如在具有導電性的不鏽鋼製或黃銅鋼製的母模30的表面形成光阻層31。此光阻層31是藉由熱壓著將負片型的感光性乾式光阻配合預定的高度來積層一片乃至數片而形成。接著,如圖7(a)所示般,使具有對應於突起部15的透光孔32a之圖案薄膜(玻璃遮罩)32緊密結合於光阻層31上之後,以紫外光燈33來照射紫外線光而進行曝光,且進行顯像、乾燥的各處理,藉由溶解除去未曝光部分,如圖7(b)所示般,將具有對應於前端窄狀的突起部15的光阻體34a之一次圖案光阻34形成於母模30上。此時,最好使用紫外線難透過的光阻,或減弱曝光量,在光阻體34a附有錐度者。接著,將上述母模30放入建浴成預定的條件之電鑄槽,如圖7(c)所示般,在先前的光阻體34a的高度的範圍內,於母模30之未以光阻體34a所覆蓋的表面電鑄鎳或銅等的電著金屬,而形成一次電鑄層35。在此是遍及母模30的大致全面形成一次電鑄層35(第一電鑄工程)。其次,如圖7(d)所示般,除去一次圖案光阻34。在此,對一次電鑄層35的表面實施研磨處理即可。 Next, a manufacturing method of the mask 1 for arrangement of such a configuration is shown in FIGS. 7 and 8. First, for example, a photoresist layer 31 is formed on the surface of a mother die 30 made of stainless steel or brass having conductivity. The photoresist layer 31 is formed by laminating one or even a plurality of negative-type photosensitive dry photoresists with a predetermined height by heat pressing. Next, as shown in FIG. 7(a), after the pattern film (glass mask) 32 having the light-transmissive holes 32a corresponding to the protrusions 15 is tightly bonded to the photoresist layer 31, it is irradiated with the ultraviolet lamp 33. The ultraviolet light is exposed, and each process of development and drying is performed, and the unexposed portion is removed by dissolution, and as shown in FIG. 7(b), the photoresist body 34a having the protrusion 15 corresponding to the narrow front end is formed. The primary pattern photoresist 34 is formed on the master mold 30. At this time, it is preferable to use a photoresist which is hard to transmit by ultraviolet rays, or to reduce the amount of exposure, and a taper is attached to the photoresist body 34a. Next, the master mold 30 is placed in an electroforming bath which is bathed under predetermined conditions, as shown in Fig. 7(c), in the range of the height of the previous photoresist body 34a, the master mold 30 is not The surface covered by the photoresist 34a electroforms an electroforming metal such as nickel or copper to form a primary electroformed layer 35. Here, the electroformed layer 35 (first electroforming process) is formed substantially throughout the master mold 30. Next, as shown in Fig. 7(d), the pattern resist 34 is removed once. Here, the surface of the primary electroformed layer 35 may be subjected to a polishing treatment.

其次,如圖8(a)所示般,在一次電鑄層35及母模30的表面的全體形成光阻層36之後,使具有對應於前述通孔12的透光孔37a之圖案薄膜(玻璃遮罩)37緊密結合於該光阻層36的表面之後,以紫外光燈33來照射紫外線光而進行曝光,且進行顯像、乾燥的各處理,藉 由溶解除去未曝光部分,如圖8(b)所示般,將具有對應於遮罩本體10的光阻體38a之二次圖案光阻38形成於一次電鑄層35的表面。接著,放入建浴成預定的條件之電鑄槽,如圖8(c)所示般,在先前的光阻體38a的高度的範圍內,於母模30之未以光阻體38a所覆蓋的一次電鑄層35的表面電鑄鎳或銅等的電著金屬,形成二次電鑄層39(第二電鑄工程)。其次,溶解除去二次圖案光阻38,從母模30及一次電鑄層35剝離二次電鑄層39。最後,在對應於遮罩本體10下面的二次電鑄層39的母模面側及對應於通孔12內面的二次電鑄層39之與二次圖案光阻38的對向面形成被覆層50,藉此可取得如圖8(e)及圖2所示那樣的遮罩1。 Next, as shown in FIG. 8(a), after the photoresist layer 36 is formed on the entire surface of the primary electroformed layer 35 and the mother mold 30, a pattern film having the light-transmissive holes 37a corresponding to the through holes 12 is formed ( After the glass mask 37 is tightly bonded to the surface of the photoresist layer 36, the ultraviolet light 33 is irradiated with ultraviolet light to perform exposure, and each process of development and drying is performed. The unexposed portion is removed by dissolution, and as shown in FIG. 8(b), a secondary pattern resist 38 having a photoresist 38a corresponding to the mask body 10 is formed on the surface of the primary electroformed layer 35. Next, an electroforming bath in which the bath is set to a predetermined condition is placed, as shown in Fig. 8(c), in the range of the height of the previous photoresist 38a, the photoresist 30a is not provided in the master mold 30. The surface of the primary electroformed layer 35 covered is electroformed with an electroforming metal such as nickel or copper to form a secondary electroformed layer 39 (second electroforming process). Next, the secondary pattern resist 38 is dissolved and removed, and the secondary electroformed layer 39 is peeled off from the master 30 and the primary electroformed layer 35. Finally, the opposite side of the secondary pattern resist 38 is formed on the side of the mother mold face corresponding to the secondary electroformed layer 39 under the mask body 10 and the secondary electroformed layer 39 corresponding to the inner surface of the through hole 12. The cover layer 50 can thereby obtain the mask 1 as shown in Fig. 8(e) and Fig. 2 .

若在如此取得的遮罩1安裝框體11,則可取得圖1所示那樣的配列用遮罩1。遮罩1(二次電鑄層39)是可在施加收縮於內方的方向的應力會作用於其本身那樣的張力之狀態下保持於框體11。如此的應力的賦予是例如可利用框體11與遮罩1的熱膨脹係數的差,在高溫環境下,於遮罩1的外周緣進行框體11的安裝作業,在常溫時使遮罩1收縮於內方側,藉此實現。 When the frame 11 is attached to the mask 1 thus obtained, the mask 1 for arrangement as shown in FIG. 1 can be obtained. The mask 1 (the secondary electroformed layer 39) is held by the frame 11 in a state in which the stress in the direction in which the contraction is applied to the inner side is applied to the tension itself. The stress is applied, for example, by the difference in thermal expansion coefficient between the frame 11 and the mask 1. In the high-temperature environment, the frame 11 is attached to the outer periphery of the mask 1, and the mask 1 is shrunk at normal temperature. On the inner side, this is achieved.

若根據以上那樣的遮罩1的製造方法,則可利用電鑄法來高精度地製作配列用遮罩,因此可位置精度佳地使焊錫球2搭載於工件3上。 According to the manufacturing method of the mask 1 as described above, the mask for arrangement can be produced with high precision by the electroforming method. Therefore, the solder ball 2 can be mounted on the workpiece 3 with high positional accuracy.

並且,若藉由一次的電鑄(第二電鑄工程)來使遮罩本體10與突起部15不離一體地形成具有突起部15的遮 罩1,則相較於各別形成遮罩本體10與突起部15者,發生該突起部15的破損等不良情況之虞少,可高精度取得可靠度佳的遮罩1的點亦佳。又,若以隨著接近遮罩本體10的下面而變大的方式來將突起部15形成前端窄狀,則可迴避應力集中於突起部15特別是根部,因此可一面牢固地補強突起部15的強度,一面可在離開塗佈有焊劑17的電極6之狀態下將突起部15抵接於電極6間,因此可防止被塗佈於電極6的焊劑17附著於遮罩本體10所造成焊錫球2的搭載不良。此時,將突起部15的前端部15’的尺寸與根部15”的尺寸的比設為1對3以上,且將突起部15的長寬比設為3以上,更具效果。具有該所望的尺寸及長寬比之突起部15的製作是可藉由調整光阻圖案35的形狀來容易取得。 Further, if the mask body 10 and the protrusion 15 are integrally formed without any separation by one-time electroforming (second electroforming process), the cover having the protrusion 15 is formed. In the case of the cover 1, the damage of the protrusion 15 is reduced as compared with the case where the mask body 10 and the protrusion 15 are formed separately, and the point of the mask 1 having high reliability can be obtained with high precision. Further, when the projection portion 15 is formed to have a narrow front end so as to become close to the lower surface of the mask main body 10, the stress can be concentrated on the projection portion 15, particularly the root portion, so that the projection portion 15 can be firmly reinforced on one surface. The strength of the protrusion 15 can be abutted between the electrodes 6 while leaving the electrode 6 coated with the flux 17, so that the solder adhered to the electrode 6 can be prevented from adhering to the mask body 10. Poor loading of the ball 2. In this case, the ratio of the size of the distal end portion 15' of the protruding portion 15 to the size of the root portion 15" is set to be 1 or more, and the aspect ratio of the protruding portion 15 is set to 3 or more, which is more effective. The size and aspect ratio of the protrusions 15 can be easily obtained by adjusting the shape of the photoresist pattern 35.

另外,在如此的構成的遮罩1中,通孔12及突起部15的形狀是可設為直狀或錐狀。在此,若具體說明有關將通孔12或突起部15設為錐狀的情況,則在通孔12中,藉由朝遮罩本體10之與工件3的對向面側設置前端窄狀的錐度,可容易將焊錫球2誘入通孔12內,且藉由朝遮罩本體10之與工件3的對向面側設置前端擴大狀的錐度,可防止焊劑被附著於遮罩本體10之與工件3的對向面側的通孔12周緣。並且,在突起部15中,藉由朝遮罩本體10之與工件3的對向面側設置前端窄狀的錐度,可使遮罩往工件3上的載置牢固,且藉由朝遮罩本體10之與工件3的對向面側設置前端擴大狀的錐度,即使 工件3的電極6為窄間距配列的情況,還是可一面確保突起部15的強度,一面好好地對應突起部15往工件3上的抵接。如此的形狀是可藉由變更光阻層31.36的感光度或曝光條件來容易取得。 Further, in the mask 1 having such a configuration, the shape of the through hole 12 and the protruding portion 15 can be straight or tapered. Here, in the case where the through hole 12 or the protruding portion 15 is tapered, the narrowing of the front end side of the mask body 10 facing the workpiece 3 is provided in the through hole 12 . The taper can easily attract the solder ball 2 into the through hole 12, and the solder can be prevented from being attached to the mask body 10 by providing a tapered taper toward the opposite side of the mask body 10 and the workpiece 3. The periphery of the through hole 12 on the opposite surface side of the workpiece 3. Further, in the protruding portion 15, by providing a taper having a narrow front end toward the opposite surface side of the mask body 10 with respect to the workpiece 3, the mounting of the mask on the workpiece 3 can be made firm, and by facing the mask The front side of the body 10 and the opposite side of the workpiece 3 are provided with a tapered front end, even if When the electrodes 6 of the workpiece 3 are arranged at a narrow pitch, the strength of the protrusions 15 can be ensured while the protrusions 15 are properly abutted against the workpiece 3. Such a shape can be easily obtained by changing the sensitivity or exposure conditions of the photoresist layer 31.36.

(第2實施形態) (Second embodiment)

其次,說明有關第2實施形態的配列用遮罩。在本實施形態中,如圖9所示般,被覆層50不只是遮罩本體10下面,在突起部15的表面也被形成。除此以外的點是與第1實施形態基本上相同,因此對於與第1實施形態相同的構件附上同一符號,省略其說明。 Next, a mask for arrangement according to the second embodiment will be described. In the present embodiment, as shown in FIG. 9, the covering layer 50 is formed not only on the lower surface of the mask body 10 but also on the surface of the protruding portion 15. The other points are substantially the same as those in the first embodiment. Therefore, the same members as those in the first embodiment are denoted by the same reference numerals and will not be described.

若根據本實施形態的配列用遮罩,則由於在突起部15表面也形成有被覆層50,因此對於突起部15也可防止焊劑的附著。並且,藉由在遮罩本體10下面、通孔12內面、及突起部15表面形成被覆層50,即使假設焊劑附著於通孔12內面,還是可撥掉焊劑,經由遮罩本體10下面及突起部15表面來流至工件上。並且,可更確實地防止焊劑17繞入至通孔12。 According to the arrangement mask of the present embodiment, since the coating layer 50 is also formed on the surface of the protrusion 15, the adhesion of the flux can be prevented with respect to the protrusion 15. Further, by forming the covering layer 50 on the lower surface of the mask body 10, the inner surface of the through hole 12, and the surface of the protruding portion 15, even if the flux adheres to the inner surface of the through hole 12, the flux can be removed, passing under the mask body 10 And the surface of the protrusion 15 flows onto the workpiece. Also, it is possible to more reliably prevent the flux 17 from being wound into the through hole 12.

而且,在以覆蓋遮罩本體10下面及突起部15表面的全面之方式形成被覆層50之下,例如以各別的構成形成遮罩本體10與突起部15時,兩者間的接合強度弱(這是因為隨著凸塊的微細化,通孔間隔尺寸或圖案領域間隔尺寸變窄,配置於通孔間或圖案領域間(圖案領域外周)的突起部15本身的外形尺寸也有變小的傾向,所以 突起部15與遮罩本體10的接合面積會變小),恐有在遮罩1使用時,恐有突起部15不慎脫落、變形、破損之虞,但藉由上述構成,被覆層50具有作為突起部15的保護層之機能,因此可有助於防止突起部15的脫落、變形、破損。另外,所欲特別防止突起部15的脫落、變形、破損時,藉由濺射或無電解電鍍來形成金屬層(Ni、Cu等)而設被覆層50即可。 Further, when the cover layer 50 is formed to cover the entire surface of the mask body 10 and the surface of the protrusion 15 in a comprehensive manner, for example, when the mask body 10 and the protrusion portion 15 are formed in separate configurations, the joint strength between the two is weak. (This is because the size of the via hole or the size of the pattern area is narrowed as the bump is miniaturized, and the outer shape of the protrusion 15 disposed between the through holes or between the pattern areas (outer circumference of the pattern area) is also small. Tend, so The joint area between the protrusion 15 and the mask body 10 is reduced. There is a fear that the protrusion 15 may be accidentally peeled off, deformed, or broken when the mask 1 is used. However, the cover layer 50 has the above configuration. Since it functions as a protective layer of the protrusion part 15, it can help prevent fall, deformation, and damage of the protrusion part 15. Further, when it is desired to prevent the protrusion 15 from being detached, deformed, or damaged, the coating layer 50 may be formed by forming a metal layer (Ni, Cu, or the like) by sputtering or electroless plating.

在圖10及圖11顯示本實施形態的配列用遮罩的製造方法。首先,如圖10(a)所示般,準備母模40。母模40是只要具有導電性者,任何皆可,本實施形態是使用不鏽鋼。其次,在母模40的表面形成光阻層,以周知的方法來進行曝光、顯像、乾燥的各處理,藉由溶解除去未曝光部分,如圖10(b)所示般,將具有光阻體41a的一次圖案光阻41形成於母模40上。上述光阻層是將負片型的感光性乾式薄膜光阻配合預定的高度來積層一片乃至數片而形成。其次,將上述母模40建浴成預定的條件之電鑄槽,如圖10(c)所示般,以和先前的光阻體41a的高度同程度,在母模40之未以光阻體41a所覆蓋的表面電鑄電著金屬,而形成一次電著層42。本實施形態是藉由Ni-Co電鑄來形成一次電著層42。另外,最好在形成一次電著層42之後對於一次電著層42表面進行磨帶研磨等機械性研磨及/或電解研磨。其次,如圖10(d)所示般,將光阻體41a溶解除去。 A method of manufacturing the mask for arrangement according to the present embodiment is shown in Figs. 10 and 11 . First, as shown in Fig. 10 (a), the master mold 40 is prepared. The master mold 40 is any one as long as it has conductivity. In the present embodiment, stainless steel is used. Next, a photoresist layer is formed on the surface of the master mold 40, and each process of exposure, development, and drying is performed by a known method, and the unexposed portion is removed by dissolution, and as shown in FIG. 10(b), the light is provided. The primary pattern resist 41 of the resistor 41a is formed on the master mold 40. The photoresist layer is formed by laminating one or more sheets of a negative-type photosensitive dry film photoresist at a predetermined height. Next, the electroforming groove in which the above-mentioned master mold 40 is bathed to a predetermined condition is as shown in Fig. 10(c) to the same extent as the height of the previous photoresist body 41a, and no photoresist is applied to the master mold 40. The surface covered by the body 41a is electroformed with a metal to form an electric layer 42. In this embodiment, the primary electroless layer 42 is formed by Ni-Co electroforming. Further, it is preferable to perform mechanical polishing and/or electrolytic polishing such as abrasive belt polishing on the surface of the primary electroless layer 42 after forming the primary electroconductive layer 42. Next, as shown in Fig. 10 (d), the photoresist 41a is dissolved and removed.

其次,如圖11(a)所示般,在一次電著層 42的表面上形成防焊漆層43。此防焊漆層43是配合預定的高度來積層一片乃至數片而形成。其次,進行曝光、顯像、乾燥的各處理,藉由溶解除去未曝光部分,如圖11(b)所示般,將具有光阻體44a的二次圖案光阻44一體形成於一次電著層42上。另外,在形成二次圖案光阻44之後進行預烘烤等的脫落防止處理為理想。藉此,具有光阻體44a的二次圖案光阻44與一次電著層42的緊密結合可更牢固。其次,如圖11(c)所示般,從母模40剝離一次電著層42及形成於其表面的二次圖案光阻44。最後,在一次電著層42之具有二次圖案光阻44的側的表面及二次圖案光阻44的表面形成被覆層50,藉此可取得圖11(d)及圖9所示的配列用遮罩1。另外,被覆層50是亦可從母模40剝離一次電著層42及二次圖案光阻44之前形成。並且,被覆層50是不限於一次電著層42之具有二次圖案光阻44的側的表面,亦可形成於一次電著層42的表面全面。當然,亦可在通孔12內面也形成被覆層50。 Second, as shown in Figure 11 (a), in an electric layer A solder resist layer 43 is formed on the surface of 42. The solder resist layer 43 is formed by laminating one or even a plurality of sheets in accordance with a predetermined height. Next, each treatment of exposure, development, and drying is performed, and the unexposed portion is removed by dissolution, and as shown in FIG. 11(b), the secondary pattern resist 44 having the photoresist body 44a is integrally formed at one time. On layer 42. Further, it is preferable to perform the fall prevention treatment such as prebaking after the secondary pattern resist 44 is formed. Thereby, the close bonding of the secondary pattern photoresist 44 having the photoresist body 44a to the primary electroless layer 42 can be made stronger. Next, as shown in Fig. 11(c), the primary electroconductive layer 42 and the secondary pattern photoresist 44 formed on the surface thereof are peeled off from the mother die 40. Finally, the coating layer 50 is formed on the surface of the primary layer 42 having the secondary pattern resist 44 and the surface of the secondary pattern resist 44, whereby the arrangement shown in FIGS. 11(d) and 9 can be obtained. Use mask 1. Further, the coating layer 50 is formed before the primary electrode layer 42 and the secondary pattern photoresist 44 are peeled off from the master mold 40. Further, the covering layer 50 is not limited to the surface of the primary electroconductive layer 42 having the secondary pattern resist 44, and may be formed on the entire surface of the primary electroless layer 42. Of course, the coating layer 50 may also be formed on the inner surface of the through hole 12.

在上述實施形態中,突起部15(支柱15b)及通孔12的配置是以突起部15(支柱15b)包圍一個通孔12的方式配置,或以一個突起部15被通孔12包圍的方式配置。並且,突起部15的形狀是不限於框架15a或圓柱,亦可為菱形.六角形等的多角形或楕圓。而且,在該等形狀中,如圖10所示般,最好是細長形狀及/或角帶圓弧者。在如此將該等形狀的長度方向.長徑方向調合於 一定方向之下,例如在洗淨遮罩1的背面時,可儘可能地消除洗淨手段(布或海綿等)卡住突起部15而造成洗淨手段或突起部15破損之虞,且可順暢地洗淨。因此,最好將突起部15全部的長度方向.長徑方向調合於一方向。另外,細長形狀始終是在突起部15的下端面(前端面),在突起部15的根部15b的面,基於強度等的點,不一定要設為細長形狀。 In the above embodiment, the projections 15 (pillars 15b) and the through holes 12 are disposed such that the projections 15 (struts 15b) surround one of the through holes 12, or the one projection 15 is surrounded by the through holes 12. Configuration. Moreover, the shape of the protrusion 15 is not limited to the frame 15a or the cylinder, and may also be a diamond shape. Polygonal or rounded hexagons. Further, in these shapes, as shown in Fig. 10, it is preferable that the shape is an elongated shape and/or a corner band. In such a length direction of the shape. Long diameter direction is blended In a certain direction, for example, when the back surface of the mask 1 is washed, the cleaning means (cloth or sponge, etc.) can be eliminated as much as possible to cause the cleaning means or the protruding portion 15 to be broken, and Wash it smoothly. Therefore, it is preferable to adjust the longitudinal direction and the long diameter direction of all the projections 15 in one direction. Further, the elongated shape is always the lower end surface (front end surface) of the protruding portion 15, and the surface of the root portion 15b of the protruding portion 15 does not necessarily have to be an elongated shape based on the point of strength or the like.

並且,在上述各實施形態中,亦可在通孔12的內面和遮罩本體10及突起部15的表面使被覆層50的厚度不同。具體而言,將通孔12的內面的被覆層50的厚度設為T1,且將遮罩本體10及突起部15的表面的被覆層50的厚度設為T2時(參照圖9),若T1>T2,則可更確實地防止引起焊錫球的搭載不良之焊劑朝通孔12內面的附著。又,若以容易滑動(摩擦小)的材質來形成被覆層50,則僅T1的厚度部分作為容易滑動的領域出現在遮罩本體10上面與通孔12內面的境界,T1的厚度越厚,該領域越大,因此在以刮刀刷子來掃過焊錫球2時,可使刮刀刷子或焊錫球2順暢地移動,可期待生產性或作業效率的提升。而且,若T1<T2,則在遮罩本體10下面各別形成突起部15時,可更確實地防止突起部15的脫落、變形、破損。另外,此被覆層50的形成方法有浸漬方式或噴霧方式等各種的方法,但在形成被覆層50時,以保護薄板來覆蓋所望的形成處以外的部分為佳。並且,想要將被覆層50形成厚時,可藉由局部地噴霧想要厚之處或使 遮罩1的浸漬方向不同(例如,在遮罩本體10下面想要厚時,使遮罩本體10下面與浸漬面形成平行的狀態下浸漬即可,在通孔12內面想要厚時,使遮罩本體10下面與浸漬面形成垂直的狀態下浸漬即可)來實現。 Further, in each of the above embodiments, the thickness of the coating layer 50 may be different between the inner surface of the through hole 12 and the surfaces of the mask body 10 and the protrusion portion 15. Specifically, when the thickness of the coating layer 50 on the inner surface of the through hole 12 is T1 and the thickness of the coating layer 50 on the surface of the mask body 10 and the protrusion 15 is T2 (see FIG. 9), When T1>T2, it is possible to more reliably prevent adhesion of the solder which causes the solder ball to be mounted on the inner surface of the through hole 12. Further, when the coating layer 50 is formed of a material that is easy to slide (small friction), only the thickness portion of T1 appears as a field of easy sliding on the upper surface of the mask body 10 and the inner surface of the through hole 12, and the thickness of T1 is thicker. In this case, when the solder ball 2 is swept by the doctor blade, the blade brush or the solder ball 2 can be smoothly moved, and productivity or work efficiency can be expected to be improved. Further, when T1 < T2, when the protrusions 15 are formed on the lower surface of the mask body 10, it is possible to more reliably prevent the protrusions 15 from falling off, being deformed, or being damaged. Further, the method of forming the coating layer 50 may be various methods such as a dipping method or a spraying method. However, when the coating layer 50 is formed, it is preferable to cover the portion other than the desired formation portion with a protective sheet. Moreover, when it is desired to form the coating layer 50 thick, it is possible to locally spray the desired thick portion or The impregnation direction of the mask 1 is different (for example, when the thickness of the mask body 10 is desired to be thick, the lower surface of the mask body 10 may be immersed in a state parallel to the dip surface, and when the inner surface of the through hole 12 is thick, This can be achieved by immersing the underside of the mask body 10 in a state perpendicular to the impregnation surface.

1‧‧‧遮罩 1‧‧‧ mask

2‧‧‧焊錫球 2‧‧‧ solder balls

3‧‧‧工件 3‧‧‧Workpiece

6‧‧‧電極 6‧‧‧Electrode

12‧‧‧通孔 12‧‧‧through hole

15‧‧‧突起部 15‧‧‧Protruding

15a‧‧‧框架 15a‧‧‧Frame

15’‧‧‧前端部 15’‧‧‧ front end

15”‧‧‧根部 15"‧‧‧ root

17‧‧‧焊劑 17‧‧‧Solder

50‧‧‧被覆層 50‧‧‧covered layer

Claims (6)

一種配列用遮罩,係在對應於預定的配列圖案之通孔(12)內放進焊錫球(2),藉此在工件(3)上的預定位置搭載前述焊錫球(2),其特徵係具備:遮罩本體(10),其係形成有多數個由前述通孔(12)所構成的圖案領域;及突起部(15),其係設在前述遮罩本體(10)之與前述工件(3)的對向面側,又,至少在前述遮罩本體(10)下面形成有被覆層(50)。 A matching mask for placing a solder ball (2) in a through hole (12) corresponding to a predetermined arrangement pattern, whereby the solder ball (2) is mounted at a predetermined position on the workpiece (3), and its characteristics A mask body (10) having a plurality of pattern regions formed by the through holes (12); and a protrusion portion (15) attached to the mask body (10) and the foregoing On the opposite side of the workpiece (3), a coating layer (50) is formed at least under the mask body (10). 如申請專利範圍第1項之配列用遮罩,其中,前述遮罩本體(10)及前述突起部(15)係形成為非一體。 The mask for arrangement according to claim 1, wherein the mask body (10) and the protrusion (15) are formed in a non-integral manner. 如申請專利範圍第1或2項之配列用遮罩,其中,前述被覆層(50)係以覆蓋遮罩本體(10)下面及前述突起部(15)表面的全面之方式形成。 The mask for arrangement according to claim 1 or 2, wherein the covering layer (50) is formed to cover the entire surface of the mask body (10) and the surface of the protrusion (15). 如申請專利範圍第1~3項中的任一項所記載之配列用遮罩,其中,前述被覆層(50)係以1μm以下的厚度形成。 The mask for arrangement according to any one of claims 1 to 3, wherein the coating layer (50) is formed to have a thickness of 1 μm or less. 一種配列用遮罩的製造方法,該配列用遮罩係具備:遮罩本體(10),其係形成有多數個由通孔(12)所構成的圖案領域;及突起部(15),其係設在前述遮罩本體(10)之與工件(3)的對向面側, 又,至少在前述遮罩本體(10)下面形成有被覆層(50),其特徵係具有:在母模(40)上形成具有光阻體(41a)的一次圖案光阻(41)之工程;利用前述光阻體(41a),在前述母模(40)上形成一次電著層(42)之工程;在前述一次電著層(42)上形成具有光阻體(44a)的二次圖案光阻(44)之工程;及在前述一次電著層(42)表面形成前述被覆層(50)之工程。 A manufacturing method for arranging a mask, comprising: a mask body (10) having a plurality of pattern regions formed by the through holes (12); and a protrusion portion (15) It is disposed on the opposite side of the mask body (10) and the workpiece (3), Further, at least under the mask body (10), a coating layer (50) having a feature of forming a primary pattern photoresist (41) having a photoresist body (41a) on the master mold (40) is provided. Using the photoresist body (41a) to form a primary electrode layer (42) on the mother die (40); forming a second photoresist layer (44a) on the primary electrode layer (42) The construction of the patterned photoresist (44); and the construction of the aforementioned coating layer (50) on the surface of the primary electro-depositive layer (42). 如申請專利範圍第5項之配列用遮罩的製造方法,其中,在形成前述被覆層(50)的工程中,在前述一次電著層(42)之具有前述二次圖案光阻(44)的側的表面及前述二次圖案光阻(44)的表面形成前述被覆層(50)。 The manufacturing method of the mask for arranging according to claim 5, wherein in the process of forming the coating layer (50), the primary pattern layer (42) has the secondary pattern photoresist (44) The surface of the side and the surface of the secondary pattern resist (44) form the aforementioned coating layer (50).
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