TW201521958A - Holding pad - Google Patents

Holding pad Download PDF

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Publication number
TW201521958A
TW201521958A TW103134004A TW103134004A TW201521958A TW 201521958 A TW201521958 A TW 201521958A TW 103134004 A TW103134004 A TW 103134004A TW 103134004 A TW103134004 A TW 103134004A TW 201521958 A TW201521958 A TW 201521958A
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Taiwan
Prior art keywords
resin sheet
resin
holding
holding mat
polyurethane resin
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TW103134004A
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Chinese (zh)
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TWI635930B (en
Inventor
Masataka Takagi
Takahiro Kume
Toshiaki Tanaka
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Fujibo Holdings Inc
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Publication of TWI635930B publication Critical patent/TWI635930B/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • H01L21/02008Multistep processes
    • H01L21/0201Specific process step
    • H01L21/02024Mirror polishing
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30625With simultaneous mechanical treatment, e.g. mechanico-chemical polishing

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Laminated Bodies (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

The holding pad according to the invention is a holding pad comprising a polyurethane resin sheet for holding a holding surface of an object to be polished, wherein the polyurethane resin sheet has a storage elastic modulus E' of 0.3 to 2.0 MPa at 40 DEG C, and the polyurethane resin sheet has a water absorbing capacity of 95 to 200 mg/50.3 cm2.

Description

保持墊 Hold pad

本發明關於一種保持墊。 The present invention relates to a retaining pad.

以往,在對於半導體晶圓、半導體裝置用矽晶圓、各種記錄用碟片的基板及液晶顯示器用玻璃基板等,尤其是玻璃基板進行精密平面研磨的情況,藉由水使貼附在研磨頭的保持墊吸附被研磨物來保持住被研磨物,然後使用研磨墊進行研磨加工。保持墊係具備由具有連續氣泡的聚胺甲酸乙酯樹脂等的彈性材料所構成的薄片,該薄片的表面(保持面)的微細氣泡可發揮如吸盤般的功用而保持被研磨物。亦即該薄片可作為保持層而發揮機能。 Conventionally, when a semiconductor wafer, a wafer for a semiconductor device, a substrate for various recording disks, a glass substrate for a liquid crystal display, or the like, in particular, a glass substrate is subjected to precision planar polishing, it is attached to the polishing head by water. The holding mat absorbs the object to be held by the object to be polished, and then grinds it using a polishing pad. The holding mat has a sheet made of an elastic material such as a polyurethane resin having continuous cells, and the fine bubbles on the surface (holding surface) of the sheet can function as a suction cup to hold the object to be polished. That is, the sheet can function as a holding layer.

附帶一提,在研磨加工時,保持墊會暴露於研磨液(研磨泥),因此會有研磨液滲入具備保持墊的保持層的內部存在的連續氣泡的情形。一旦研磨液滲入,則構成保持層的彈性材料會失去彈性、或保持層膨潤而難以安定地保持,其結果,研磨加工性降低。關於預防此現象的對策,例如在專利文獻1中揭示了一種含有氟系撥水劑的保 持墊。 Incidentally, during the polishing process, the holding mat is exposed to the polishing liquid (grinding mud), and thus the polishing liquid may permeate into the continuous air bubbles existing inside the holding layer having the holding mat. When the polishing liquid penetrates, the elastic material constituting the holding layer loses elasticity or the holding layer swells and is difficult to be stably held, and as a result, the polishing workability is lowered. Regarding countermeasures against this phenomenon, for example, Patent Document 1 discloses a protection containing a fluorine-based water repellent. Hold the pad.

先前技術文獻 Prior technical literature 專利文獻 Patent literature

專利文獻1:日本特開平9-254027號公報 Patent Document 1: Japanese Laid-Open Patent Publication No. Hei 9-254027

在使用如專利文獻1所記載的撥水劑的情況,可抑制研磨液滲入保持層內部。然而,為了使被研磨物吸附在保持墊而使用水來使保持層的保持面成為濕潤狀態,此時由於撥水劑存在,因此與水的親和性降低,在撥掉水之處容易發生吸附不良。另一方面,若為了防止這種吸附不良而減少撥水劑的添加量,則保持層內會發生撥水劑分散不均,水會由撥水性弱的部分滲入,結果在研磨加工時,保持層局部發生表皮磨耗,而難以安定地保持被研磨物。此處,「表皮磨耗」意指保持層因為滲水等而膨潤,結果該保持層的保持面直接接觸到研磨墊的研磨面而被削除,或接觸到被研磨物角部的保持面因為被該角部削除而開孔。這是因為保持層膨潤而由研磨頭剝離而部分地彎曲。 When the water repellent described in Patent Document 1 is used, it is possible to suppress penetration of the polishing liquid into the inside of the holding layer. However, in order to adsorb the object to be adhered to the holding mat, water is used to make the holding surface of the holding layer wet. At this time, since the water repellent is present, the affinity with water is lowered, and adsorption is likely to occur when water is removed. bad. On the other hand, if the amount of the water-repellent agent is reduced in order to prevent such adsorption failure, the water-repellent agent may be dispersed unevenly in the holding layer, and the water may be infiltrated by the water-repellent portion, and as a result, it is maintained during the grinding process. The skin wear occurs locally in the layer, and it is difficult to stably maintain the object to be polished. Here, "skin abrasion" means that the holding layer is swollen by water seepage or the like, and as a result, the holding surface of the holding layer is directly contacted with the polishing surface of the polishing pad to be removed, or the holding surface contacting the corner of the object to be polished is The corners are removed and the holes are opened. This is because the holding layer is swollen and peeled off by the polishing head to partially bend.

本發明鑑於上述課題而完成,目的為提供一種保持墊,其係可抑制被研磨物的吸附不良及表皮磨耗兩者。 The present invention has been made in view of the above problems, and an object thereof is to provide a holding mat which can suppress both adsorption failure of an object to be polished and skin abrasion.

本發明人等為了達成上述目的反覆潛心研究的結果, 發現若適度降低保持墊在40℃的貯藏彈性率E’,且具備由特定吸水量測定所測得的吸水量在適度範圍的薄片作為保持層,則可達成上述目的,而使本發明達到完成。 The inventors of the present invention have repeatedly conducted painstaking research in order to achieve the above object, It has been found that the above object can be attained if the storage elastic modulus E' of the holding mat at 40 ° C is appropriately lowered and the sheet having the water absorption amount measured by the specific water absorption amount is in a proper range as the holding layer, and the present invention is completed. .

亦即本發明如以下所述。 That is, the present invention is as follows.

[1]一種保持墊,其係具備具有用以保持被研磨物的保持面的聚胺甲酸乙酯樹脂薄片之保持墊,並且上述聚胺甲酸乙酯樹脂薄片在40℃的貯藏彈性率E’為0.3~2.0MPa,且上述聚胺甲酸乙酯樹脂薄片的吸水量為95~200mg/50.3cm2[1] A holding mat provided with a holding mat having a polyurethane resin sheet for holding a holding surface of an object to be polished, and a storage elastic modulus E' of the above polyurethane resin sheet at 40 ° C It is 0.3 to 2.0 MPa, and the water absorption amount of the above polyurethane resin sheet is 95 to 200 mg/50.3 cm 2 .

[2]如上述保持墊,其中上述聚胺甲酸乙酯樹脂薄片在40℃的KEL為1.0×105~5.0×105Pa-1[2] The above holding mat, wherein the above-mentioned polyurethane resin sheet has a KEL at 40 ° C of 1.0 × 10 5 to 5.0 × 10 5 Pa -1 .

[3]如上述保持墊,其中構成上述聚胺甲酸乙酯樹脂薄片的樹脂在25℃的100%模數為4.0~10.0MPa。 [3] The above-mentioned holding mat, wherein the resin constituting the above-mentioned polyurethane resin sheet has a 100% modulus at 25 ° C of 4.0 to 10.0 MPa.

[4]如上述保持墊,其中上述聚胺甲酸乙酯樹脂薄片係含有撥水劑。 [4] The above holding mat, wherein the above-mentioned polyurethane resin sheet contains a water repellent.

[5]如上述保持墊,其中上述撥水劑係含有具有碳數為6~8的全氟烷基的氟系撥水劑。 [5] The holding mat according to the above aspect, wherein the water repellent contains a fluorine-based water repellent having a perfluoroalkyl group having 6 to 8 carbon atoms.

[6]如上述保持墊,其中上述聚胺甲酸乙酯樹脂薄片所含有的上述氟系撥水劑之60~100莫耳%為具有碳數6的全氟烷基的氟系撥水劑。 [6] The above-mentioned holding mat, wherein 60 to 100 mol% of the fluorine-based water repellent agent contained in the polyurethane resin sheet is a fluorine-based water repellent having a perfluoroalkyl group having 6 carbon atoms.

依據本發明可提供一種保持墊,其係可抑制被研磨物的吸附不良及表皮磨耗兩者。 According to the present invention, it is possible to provide a holding mat which can suppress both adsorption failure of the workpiece and skin abrasion.

110‧‧‧保持墊 110‧‧‧ Keep pad

112‧‧‧聚胺甲酸乙酯樹脂薄片 112‧‧‧ Polyurethane resin sheet

114‧‧‧基材 114‧‧‧Substrate

116‧‧‧接著層 116‧‧‧Next layer

P‧‧‧保持面 P‧‧‧ Keep face

圖1表示本發明所關連的保持墊的一例之剖面模式圖。 Fig. 1 is a schematic cross-sectional view showing an example of a holding mat to which the present invention is attached.

圖2表示本發明所關連的吸附量測定所使用的器具之透視模式圖。 Fig. 2 is a perspective schematic view showing an apparatus used for measuring the amount of adsorption associated with the present invention.

以下,因應必要參照圖式而對於本發明的實施方式(以下簡稱為「本實施形態」)作詳細說明,然而本發明並不受下述本實施形態所限定。本發明在不脫離其要旨的範圍可作各種改變。此外,圖式中,相同要素採用相同符號,而省略重複的說明。另外,上下左右等的位置關係只要沒特別註明,則以圖式所示的位置關係為基準。此外,圖式的尺寸比率並不受圖示的比率所限定。 Hereinafter, an embodiment of the present invention (hereinafter simply referred to as "this embodiment") will be described in detail with reference to the drawings, but the present invention is not limited to the following embodiment. The invention can be variously modified without departing from the spirit and scope of the invention. In the drawings, the same elements are denoted by the same reference numerals, and the repeated description is omitted. In addition, the positional relationship of up, down, left, and the like is based on the positional relationship shown in the drawing unless otherwise specified. Moreover, the dimensional ratios of the drawings are not limited by the ratios illustrated.

本實施形態的保持墊係具備具有用以保持被研磨物的保持面的聚胺甲酸乙酯樹脂薄片的保持墊,並且聚胺甲酸乙酯樹脂薄片在40℃的貯藏彈性率E’為0.3~2.0MPa,且聚胺甲酸乙酯樹脂薄片的吸水量為95~200mg/50.3cm2The holding mat of the present embodiment is provided with a holding mat having a polyurethane resin sheet for holding the holding surface of the workpiece, and the storage modulus E' of the polyurethane resin sheet at 40 ° C is 0.3~ 2.0 MPa, and the water absorption of the polyurethane resin sheet is 95 to 200 mg/50.3 cm 2 .

圖1表示本實施形態所關連的保持墊的一例之模式剖面圖。在保持墊110依聚胺甲酸乙酯樹脂薄片(以下簡稱為「樹脂薄片」)112與基材114之序積層。樹脂薄片112與基材114互相接合,在此例中,樹脂薄片112與基材114是透過接著層116而接合。 Fig. 1 is a schematic cross-sectional view showing an example of a holding mat associated with the embodiment. The holding mat 110 is laminated in the order of the polyurethane resin sheet (hereinafter simply referred to as "resin sheet") 112 and the substrate 114. The resin sheet 112 and the substrate 114 are bonded to each other. In this example, the resin sheet 112 and the substrate 114 are joined through the adhesive layer 116.

保持墊110所含有的樹脂薄片112係含有聚胺甲酸乙酯樹脂,可作為具有用來保持被研磨物的保持面P的保持層而發揮機能。樹脂薄片112的貯藏彈性率E’,在40℃時為0.3~2.0MPa。藉由將在40℃的貯藏彈性率E’設定在0.3MPa以上,在研磨加工時,樹脂薄片112不易發生表皮磨耗。另一方面,藉由將在40℃的貯藏彈性率E’設定在2.0MPa以下,樹脂薄片112對被研磨物的吸附力提高,成為吸附不良不易發生。同樣的觀點看來,樹脂薄片112的貯藏彈性率E’係以在40℃時為0.4~1.5MPa為佳,0.5~1.0MPa為較佳,0.5~0.7MPa為更佳。 The resin sheet 112 contained in the holding mat 110 contains a polyurethane resin and functions as a holding layer having a holding surface P for holding the object to be polished. The storage modulus E' of the resin sheet 112 is 0.3 to 2.0 MPa at 40 °C. By setting the storage modulus E' at 40 °C to 0.3 MPa or more, the resin sheet 112 is less likely to cause skin abrasion during the polishing process. On the other hand, when the storage modulus E' at 40 °C is set to 2.0 MPa or less, the adsorption force of the resin sheet 112 on the object to be polished is increased, and adsorption failure is less likely to occur. From the same viewpoint, the storage elastic modulus E' of the resin sheet 112 is preferably 0.4 to 1.5 MPa at 40 ° C, preferably 0.5 to 1.0 MPa, more preferably 0.5 to 0.7 MPa.

(貯藏彈性率E’的測定方法) (Method for measuring storage modulus E')

在本說明書之中,樹脂薄片的貯藏彈性率E’,是使用動態黏彈性測定裝置(例如TA Instruments Japan公司製商品名「RSA III」)在下述條件測定兩枚,將其相加並且取平均值。 In the present specification, the storage elastic modulus E' of the resin sheet is measured by using a dynamic viscoelasticity measuring device (for example, "TAA III" manufactured by TA Instruments Japan Co., Ltd.) under the following conditions, and is added and averaged. value.

[測定條件] [Measurement conditions]

.試樣尺寸:10mm×10mm×厚度0.8mm×3枚重疊 . Sample size: 10mm × 10mm × thickness 0.8mm × 3 overlap

.測試方向:壓縮模式 . Test direction: compression mode

.荷重:100g/cm2 . Load: 100g/cm 2

.形變:0.10% . Deformation: 0.10%

.頻率:1Hz . Frequency: 1Hz

.溫度範圍:20~80℃、昇溫速度:5℃/min . Temperature range: 20~80°C, heating rate: 5°C/min

.試樣厚度:以厚度計作測定 . Sample thickness: measured by thickness

.在試樣厚度相異情況,重疊成2mm至3mm的範圍作測定。 . In the case where the thicknesses of the samples are different, the measurement is carried out by overlapping the range of 2 mm to 3 mm.

樹脂薄片112的吸水量為95~200mg/50.3cm2。藉由將此吸水量設定在95mg/50.3cm2以上,樹脂薄片112對被研磨物的吸附力提高,成為吸附不良不易發生。另一方面,藉由將吸附量設定在200mg/50.3cm2以下,在研磨加工時,樹脂薄片112變成不易發生表皮磨耗。從同樣的觀點看來,樹脂薄片112的吸水量係以100~160mg/50.3cm2為佳,107~150mg/50.3cm2為較佳,110~130mg/50.3cm2為更佳。 The water absorption amount of the resin sheet 112 is 95 to 200 mg/50.3 cm 2 . By setting the water absorption amount to 95 mg/50.3 cm 2 or more, the adsorption force of the resin sheet 112 on the workpiece is increased, and the adsorption failure is less likely to occur. On the other hand, when the adsorption amount is set to 200 mg/50.3 cm 2 or less, the resin sheet 112 is less likely to cause skin abrasion during the polishing process. From the same viewpoint, the water absorption amount of the resin sheet 112 is preferably 100 to 160 mg/50.3 cm 2 , preferably 107 to 150 mg/50.3 cm 2 , more preferably 110 to 130 mg/50.3 cm 2 .

(吸水量的測定方法) (Method for measuring water absorption)

樹脂薄片112的吸水量如下述般作測定。圖2表示測定樹脂薄片的吸水量所使用的器具的透視模式圖。首先準備直徑 125mm的保持墊110以作為測定對象的試樣10,還有氯乙烯製的對焊式法蘭20,以及同樣氯乙烯製的法蘭板30(任一者皆為JIS 10K-80A)。法蘭20、30的內徑為80mm(剖面積為50.3cm2)。接下來,使試樣10在40℃的乾燥機內乾燥10小時以上。然後在室溫20℃、相對濕度50%的大氣環境中進行作業。接下來,使試樣10在大氣環境下自然冷卻至室溫,以電子天秤測定其質量。接下來,如圖2所示般,試樣10的保持面P在對焊式法蘭20側,以對焊式法蘭20及法蘭板30夾住, 由上下夾緊而固定。接下來,在對焊式法蘭20的管內注入300mL的20℃離子交換水W(此時試樣10的保持面P至水面的高度成為約60mm)。注入後,在將該等靜置8小時,然後將固定的試樣10解開並取出,藉由濾紙吸取表面的水分。此時,以不按壓在試樣10而僅在試樣10的表面拭過的方式以濾紙吸取水分。然後迅速測定試樣10的質量。注入離子交換水W並且靜置,將靜置前後的試樣10的質量差定為樹脂薄片112的吸水量。 The water absorption amount of the resin sheet 112 was measured as follows. Fig. 2 is a perspective schematic view showing an apparatus used for measuring the water absorption amount of the resin sheet. First prepare the diameter The 125 mm holding pad 110 has a sample 10 to be measured, a butt-welded flange 20 made of vinyl chloride, and a flange plate 30 made of vinyl chloride (any of which is JIS 10K-80A). Inner diameter of flanges 20, 30 It is 80 mm (the sectional area is 50.3 cm 2 ). Next, the sample 10 was dried in a dryer at 40 ° C for 10 hours or more. The work was then carried out in an atmospheric environment at room temperature of 20 ° C and a relative humidity of 50%. Next, the sample 10 was naturally cooled to room temperature in an atmospheric environment, and its mass was measured by an electronic balance. Next, as shown in Fig. 2, the holding surface P of the sample 10 is sandwiched between the butt-welded flange 20 and the flange plate 30 on the butt-welded flange 20 side, and is fixed by being clamped up and down. Next, 300 mL of 20 ° C ion-exchanged water W was injected into the tube of the butt-welded flange 20 (at this time, the height of the holding surface P of the sample 10 to the water surface was about 60 mm). After the injection, the cells were allowed to stand for 8 hours, and then the fixed sample 10 was unwound and taken out, and the surface water was absorbed by the filter paper. At this time, the water is sucked by the filter paper so as not to be pressed against the sample 10 and wiped only on the surface of the sample 10. The mass of the sample 10 was then quickly determined. The ion-exchanged water W was injected and allowed to stand, and the mass difference of the sample 10 before and after standing was determined as the water absorption amount of the resin sheet 112.

作為本實施形態所關連的樹脂薄片112的貯藏彈性率E’及吸水量控制在上述範圍的方法,可列舉例如調整構成樹脂薄片112的樹脂在25℃的100%模數、在40℃的KEL、樹脂的種類、撥水劑的添加、該撥水劑的種類及添加量、樹脂薄片112的厚度、密度、及皮層相反側的樹脂薄片112背面的拋光加工量的方法。 The method of controlling the storage elastic modulus E' and the water absorption amount of the resin sheet 112 in the above-described embodiment in the above range is, for example, adjusting the 100% modulus of the resin constituting the resin sheet 112 at 25 ° C and the KEL at 40 ° C. The type of the resin, the addition of the water repellent, the type and amount of the water repellent, the thickness and density of the resin sheet 112, and the method of polishing the back surface of the resin sheet 112 on the opposite side of the skin layer.

構成樹脂薄片112的樹脂在25℃的100%模數係以4.0~10.0MPa為佳,5.0~9.0MPa為較佳,5.0~7.0MPa為更佳。藉由將此100%模數設定在4.0MPa以上,樹脂薄片112的貯藏彈性率E’成為容易在0.3MPa以上,藉由設定在10.0MPa以下,樹脂薄片112的貯藏彈性率E’容易在2.0MPa以下。此外,在本說明書之中,100%模數,是在室溫23±2℃的環境下,使用與樹脂薄片112相同材料的無發泡樹脂薄片(測試片),在延伸100%時,亦即延伸成原本長度的2倍時,將此時拉伸力除以測試片的初期剖面積所得到之值。 The resin constituting the resin sheet 112 preferably has a 100% modulus at 25 ° C of 4.0 to 10.0 MPa, preferably 5.0 to 9.0 MPa, more preferably 5.0 to 7.0 MPa. By setting the 100% modulus to 4.0 MPa or more, the storage elastic modulus E' of the resin sheet 112 is easily 0.3 MPa or more, and by setting it at 10.0 MPa or less, the storage elastic modulus E' of the resin sheet 112 is easily 2.0. Below MPa. Further, in the present specification, the 100% modulus is a non-foamed resin sheet (test piece) of the same material as that of the resin sheet 112 in an environment of room temperature of 23 ± 2 ° C, and when extending 100%, That is, when the elongation is twice the original length, the tensile force is divided by the initial sectional area of the test piece.

樹脂薄片112的在40℃的KEL係以1.0×105~5.0×105Pa-1為佳,1.5×105~4.0×105Pa-1為較佳,2.0×105~3.0×105Pa-1為更佳。藉由將此KEL設定在1.0×105Pa-1以上,樹脂薄片112成為容易變形,可提高被研磨物的保持性及吸附性。另外,研磨加工時不易偏離被研磨物的面內方向。另一方面,藉由將KEL設定在5.0×105Pa-1以下,可降低樹脂薄片112的變形量(亦即減低研磨加工時的樹脂薄片112的陷入量),較能夠抑制表皮磨耗的發生,可進一步增加保持墊110的壽命。 The KEL of the resin sheet 112 at 40 ° C is preferably 1.0 × 10 5 to 5.0 × 10 5 Pa -1 , more preferably 1.5 × 10 5 to 4.0 × 10 5 Pa -1 , and 2.0 × 10 5 to 3.0 × 10 5 Pa -1 is better. By setting the KEL to 1.0 × 10 5 Pa -1 or more, the resin sheet 112 is easily deformed, and the retainability and the adsorptivity of the object to be polished can be improved. In addition, it is difficult to deviate from the in-plane direction of the object to be polished during the polishing process. On the other hand, when the KEL is set to 5.0 × 10 5 Pa -1 or less, the amount of deformation of the resin sheet 112 can be reduced (that is, the amount of the resin sheet 112 at the time of polishing processing can be reduced), and the occurrence of skin abrasion can be suppressed. The life of the pad 110 can be further increased.

(KEL的計算方法) (KEL calculation method)

在本說明書之中,KEL(能量損失因子)是由依照與上述「貯藏彈性率E’的測定方法」相同條件所測得在40℃的貯藏彈性率E’及損失彈性率E”,藉由下述式(1a)及(1b)來計算。 In the present specification, KEL (energy loss factor) is a storage elastic modulus E' and a loss elastic modulus E" measured at 40 ° C according to the same conditions as the "measurement method of storage elastic modulus E'". It is calculated by the following formulas (1a) and (1b).

KEL=tanδ×1012/(E’×(1+tanδ2)) (1a) KEL=tanδ×10 12 /(E'×(1+tanδ 2 )) (1a)

tanδ=E”/E’ (1b) Tanδ=E”/E’ (1b)

本實施形態所關連的樹脂薄片112的密度(總體密度)在25℃時宜為0.15~0.30g/cm2。藉由將此密度設定在0.15g/cm2以上,成為樹脂薄片112的永久形變不易發生,另外,藉由設定在0.30g/cm2以下,整個樹脂薄片112成為容易更均勻地保持被研磨物。其結果,藉由將樹脂薄片112的密度設定在上述範圍,可進一步抑制研磨加工時被研磨物偏離保持墊110的面內方向,或研磨加工時 的研磨不均發生。 The density (total density) of the resin sheet 112 associated with this embodiment is preferably 0.15 to 0.30 g/cm 2 at 25 °C. When the density is set to 0.15 g/cm 2 or more, the permanent deformation of the resin sheet 112 is less likely to occur, and by setting it at 0.30 g/cm 2 or less, the entire resin sheet 112 can easily and more uniformly retain the object to be polished. . As a result, by setting the density of the resin sheet 112 to the above range, it is possible to further suppress the occurrence of unevenness in the polishing in the in-plane direction of the holding mat 110 during the polishing process or in the polishing process.

樹脂薄片112的厚度不受特別限定,而可為例如0.2~1.5mm,或0.6~1.2mm。此外,樹脂薄片112的厚度可依據JIS K 6550(1994)所記載的測定方法作測定。亦即,在樹脂薄片112的厚度方向,每1cm2施加100g的荷重(負荷)作為初始荷重時的厚度。 The thickness of the resin sheet 112 is not particularly limited, and may be, for example, 0.2 to 1.5 mm, or 0.6 to 1.2 mm. Further, the thickness of the resin sheet 112 can be measured in accordance with the measurement method described in JIS K 6550 (1994). In other words, in the thickness direction of the resin sheet 112, a load (load) of 100 g per 1 cm 2 is applied as the thickness at the initial load.

關於樹脂薄片112,樹脂等的母體的構成材料(以下稱為「母材」)中具有複數氣泡(未圖示),可藉由所謂濕式成膜法形成或藉由乾式成型法形成,從更有效且確實達成本發明目的的觀點看來,宜藉由濕式成膜法形成。在樹脂薄片112藉由濕式成膜法形成的情況,保持面P側亦可具有形成未圖示的緻密微多孔的皮層。皮層的表面具有微細的平坦性。另一方面,在皮層的較內側(樹脂薄片112的內部),亦可形成孔徑大於皮層的微多孔且沿著樹脂薄片112厚度方向的剖面為帶有圓角的三角形的空孔(連續氣泡;未圖示)。此空孔也能夠以保持面P側的孔徑小於保持面P的相反側的方式來形成。在樹脂薄片112亦可形成孔徑大於皮層的微多孔且小於空孔的孔(未圖示)。皮層的微多孔、空孔以及小孔徑的孔,亦可互相以連通孔的方式連接成網狀。 In the resin sheet 112, the constituent material of the precursor of the resin (hereinafter referred to as "base material") has a plurality of bubbles (not shown), which can be formed by a so-called wet film formation method or by a dry molding method. From the standpoint of more effective and indeed achieving the object of the present invention, it is preferred to form by a wet film formation method. When the resin sheet 112 is formed by a wet film formation method, the surface of the holding surface P may have a dense microporous skin layer (not shown). The surface of the skin layer has fine flatness. On the other hand, on the inner side of the skin layer (inside of the resin sheet 112), a microporous hole having a larger pore diameter than the skin layer and a triangular shape with rounded corners along the thickness direction of the resin sheet 112 may be formed (continuous air bubbles; Not shown). This hole can also be formed such that the hole diameter on the holding surface P side is smaller than the opposite side of the holding surface P. A hole (not shown) having a pore diameter larger than that of the skin layer and smaller than the pores may be formed in the resin sheet 112. The microporous, porous, and small-pore pores of the cortex may also be connected to each other in a mesh shape by communicating holes.

構成樹脂薄片112的母材,只要含有最多聚胺甲酸乙酯樹脂的組成,則並不受特別限定,例如樹脂薄片112中,相對於該母材的總量可含有聚胺甲酸乙酯樹脂80~100質量%。樹脂薄片112較佳為相對於其總量含有聚胺 甲酸乙酯樹脂85~100質量%,更佳為含有90~100質量%,特佳為含有90~95質量%。 The base material constituting the resin sheet 112 is not particularly limited as long as it contains a composition of the most polyurethane resin. For example, the resin sheet 112 may contain a polyurethane resin 80 with respect to the total amount of the base material. ~100% by mass. The resin sheet 112 preferably contains a polyamine relative to the total amount thereof. The ethyl formate resin is 85 to 100% by mass, more preferably 90 to 100% by mass, and particularly preferably 90 to 95% by mass.

作為聚胺甲酸乙酯樹脂可列舉例如聚酯系聚胺甲酸乙酯樹脂、聚醚系聚胺甲酸乙酯樹脂及聚碳酸酯系聚胺甲酸乙酯樹脂,該等可單獨使用一種或組合兩種以上來使用。從更有效且確實發揮出本發明目的的觀點看來,該等之中係以聚酯系聚胺甲酸乙酯樹脂為佳。 Examples of the polyurethane resin include a polyester-based polyurethane resin, a polyether-based polyurethane resin, and a polycarbonate-based polyurethane resin, and these may be used alone or in combination of two. More than one kind to use. From the viewpoint of more effectively and surely exerting the object of the present invention, a polyester-based polyurethane resin is preferred among these.

聚胺甲酸乙酯樹脂可藉由常法來合成,亦可由市售品取得。市售品可列舉例如Crisvon(DIC公司股份有限公司製商品名)、Sanprene(三洋化成工業公司股份有限公司製商品名)、Resamine(大日本精化工業公司股份有限公司製商品名)。聚胺甲酸乙酯樹脂可單獨使用一種或組合兩種以上來使用。 The polyurethane resin can be synthesized by a usual method or can be obtained from a commercially available product. The commercially available product is, for example, Crisvon (trade name, manufactured by DIC Corporation), Sanprene (trade name, manufactured by Sanyo Chemical Industries Co., Ltd.), and Resamine (trade name, manufactured by Dainippon Seika Co., Ltd.). The polyurethane resin may be used alone or in combination of two or more.

樹脂薄片112除了含有聚胺甲酸乙酯樹脂以外,還可含有聚碸樹脂及/或聚醯亞胺樹脂等的其他樹脂。聚碸樹脂可藉由常法來合成,亦可由市售品取得。市售品可列舉例如Udel(Solvay Advanced Polymers公司股份有限公司製商品名)。聚醯亞胺樹脂可藉由常法來合成,亦可由市售品取得。作為市售品可列舉例如Aurum(三井化學公司股份有限公司製商品名)。 The resin sheet 112 may contain, in addition to the polyurethane resin, other resins such as polyfluorene resin and/or polyimide resin. The polyanthracene resin can be synthesized by a conventional method or can be obtained from a commercially available product. Commercially available products include, for example, Udel (trade name, manufactured by Solvay Advanced Polymers Co., Ltd.). Polyimine resins can be synthesized by a conventional method or can be obtained from commercially available products. As a commercial item, for example, Aurum (trade name, manufactured by Mitsui Chemicals, Inc.) can be cited.

樹脂薄片112中除了母材以外宜含有撥水劑。作為撥水劑可列舉例如氟系撥水劑、矽系撥水劑及烴系撥水劑。從更有效且確實達成本發明之目的的觀點看來,該等之中係以氟系撥水劑為佳。撥水劑可單獨使用一種或組合兩種 以上來使用。 The resin sheet 112 preferably contains a water repellent agent in addition to the base material. Examples of the water repellent include a fluorine water repellent, a rhodium water repellent, and a hydrocarbon water repellent. From the viewpoint of more effective and indeed achieving the object of the present invention, it is preferred that the fluorine-based water repellent is used among the above. Water repellent can be used alone or in combination Use above.

作為氟系撥水劑可列舉例如具有全氟烷基的化合物(氟系撥水劑),宜為下述式(2)所表示之氟調聚物。 The fluorine-based water repellent is, for example, a compound having a perfluoroalkyl group (fluorine-based water repellent), and is preferably a fluorotelomer represented by the following formula (2).

Rf-R-X (2) Rf-R-X (2)

此處,Rf表示全氟烷基,其碳數為3~8,宜為4~8,較佳為6~8,特佳為6。另外,R表示伸烷基,其碳數為2~6,宜為2~4,特佳為2。X表示官能基,可列舉例如羥基、CH2=CHC(=O)CO-、H(OCH2CH2)xO-、YSO3-[Y表示氫原子或NH4]等,宜為羥基。另外,作為具有全氟烷基的化合物還可列舉以全氟烷基使樹脂變性而成的化合物。作為樹脂,從提升樹脂薄片的分散性及逐時安定性的觀點看來,可構成保持墊的樹脂薄片的樹脂,可列舉例如聚胺甲酸乙酯樹脂,作為變性方法可列舉例如在樹脂的末端及/或側鏈導入全氟烷基的方法。具有全氟烷基的化合物可單獨使用一種或組合兩種以上來使用。 Here, Rf represents a perfluoroalkyl group having a carbon number of 3 to 8, preferably 4 to 8, preferably 6 to 8, and particularly preferably 6. Further, R represents an alkylene group having a carbon number of 2 to 6, preferably 2 to 4, and particularly preferably 2. X represents a functional group, and examples thereof include a hydroxyl group, CH 2 =CHC(=O)CO-, H(OCH 2 CH 2 ) x O-, YSO 3 -[Y represents a hydrogen atom or NH 4 ], and the like is preferably a hydroxyl group. Further, examples of the compound having a perfluoroalkyl group include a compound obtained by denaturation of a resin with a perfluoroalkyl group. The resin which can form the resin sheet which retains a pad is a resin, and a polyurethane resin is mentioned, for example, as a resin, and the denaturation method is mentioned, for example, at the end of resin. And/or a method of introducing a perfluoroalkyl group into a side chain. The compound having a perfluoroalkyl group may be used alone or in combination of two or more.

從更有效且確實達成本發明目的的觀點看來,氟調聚物之中係以Rf的碳數為6者為佳,R的碳數為2者為更佳。另外,若考慮樹脂薄片的分散性及逐時安定性,則作為以全氟烷基使樹脂變性而成的化合物,為將氟調聚物導入該樹脂而成的化合物,例如以具有上述式(2)中以Rf-R-所表示的基團的樹脂為佳,具有上述式(2)中以Rf-R-所表示的基團的聚胺甲酸乙酯樹脂為較佳。作為這種樹脂可列舉例如國際公開第2012/172936號所記載之聚胺甲酸乙酯樹脂。 From the viewpoint of more effectively and surely achieving the object of the present invention, it is preferred that the fluorine telomer has a carbon number of Rf of 6 and a carbon number of R of 2 is more preferable. In addition, in consideration of dispersibility and time-dependent stability of the resin sheet, a compound obtained by denaturation of a resin with a perfluoroalkyl group is a compound obtained by introducing a fluorotelomer into the resin, for example, having the above formula ( 2) A resin having a group represented by Rf-R- is preferable, and a polyurethane resin having a group represented by Rf-R- in the above formula (2) is preferred. As such a resin, for example, a polyurethane resin described in International Publication No. 2012/172936 can be mentioned.

氟調聚物可藉由常法來合成,亦可由市售品取得。市售品可列舉例如Crisvon Assistor SD系列(DIC股份有限公司製商品名)、Asahiguard E系列(AGC Seimi Chemical股份有限公司製商品名)、NK Guard S系列(日華化學股份有限公司製商品名)、Unidyne Multi系列(Daikin工業股份有限公司製商品名)等。氟調聚物可單獨使用一種或組合兩種以上來使用。 The fluorotelomer can be synthesized by a conventional method or can be obtained from a commercially available product. For example, the Crisvon Assistor SD series (trade name, manufactured by DIC Corporation), the Asahiguard E series (trade name, manufactured by AGC Seimi Chemical Co., Ltd.), and the NK Guard S series (product name manufactured by Rihua Chemical Co., Ltd.) , Unidyne Multi series (trade name by Daikin Industrial Co., Ltd.), etc. The fluorotelomer may be used singly or in combination of two or more.

樹脂薄片112中的撥水劑含量,係以相對於構成樹脂薄片112的樹脂30質量份為2~14質量份為佳,3~13質量份為較佳。藉由將撥水劑的含量設定在相對於樹脂30質量份為2質量份以上,吸水量成為容易在200mg/50.3cm2以下,而且還可防止撥水劑局部存在,因此亦可抑制表皮局部磨耗。另外,藉由將撥水劑的含量設定在相對於樹脂30質量份為14質量份以下,吸水量容易在95mg/50.3cm2以上。另外,在後述保持墊110的製造方法中,經過凝固再生步驟製作出樹脂薄片112的情況且在凝固再生步驟之前的階段樹脂溶液中已含有撥水劑的情況,成為不易發生凝固不均,就結果而言,較能夠抑制樹脂薄片112的成膜不均。 The water repellent content in the resin sheet 112 is preferably 2 to 14 parts by mass, and preferably 3 to 13 parts by mass, based on 30 parts by mass of the resin constituting the resin sheet 112. When the content of the water repellent is 2 parts by mass or more based on 30 parts by mass of the resin, the water absorption amount is easily 200 mg/50.3 cm 2 or less, and the water repellent can be prevented from being locally present, so that the skin portion can also be suppressed. Wear. In addition, by setting the content of the water repellent to 14 parts by mass or less based on 30 parts by mass of the resin, the water absorption amount is easily 95 mg/50.3 cm 2 or more. In the method of manufacturing the holding mat 110 described later, when the resin sheet 112 is produced by the coagulation and regeneration step and the water repellent is contained in the resin solution at the stage before the coagulation and regeneration step, the coagulation unevenness is less likely to occur. As a result, film formation unevenness of the resin sheet 112 can be suppressed more.

另外,作為撥水劑是採用如氟調聚物般的氟系撥水劑,在該氟系撥水劑含有具有碳數6的Rf的氟系撥水劑的情況,樹脂薄片112所含的氟系撥水劑中,60~100莫耳%宜為具有碳數為6的Rf的氟系撥水劑。這代表要限制住如具有碳數超過6的Rf的氟調聚物般含有多量氟原 子的化合物、或如具有碳數未滿6的Rf的氟調聚物般含有少量氟原子的化合物。藉此,可降低含有多量氟原子的化合物的含量,而更有效地抑制吸水量的降低及吸附不良,另外還可減低含有少量氟原子的化合物的含量,而更有效地確保適度的撥水性。 In addition, a fluorine-based water repellent agent such as a fluorine telomer is used as the water repellent, and when the fluorine water repellent contains a fluorine water repellent having Rf of carbon number 6, the resin sheet 112 contains In the fluorine-based water repellent, 60 to 100 mol% is preferably a fluorine-based water repellent having a carbon number of 6 Rf. This means that a large amount of fluorocarbon is contained as a fluorine telomer having a carbon number of more than 6 A compound having a small amount of a fluorine atom as in the case of a fluorotelomer having Rf having a carbon number of less than 6. Thereby, the content of the compound containing a large amount of fluorine atoms can be reduced, and the decrease in the amount of water absorption and the poor adsorption can be more effectively suppressed, and the content of the compound containing a small amount of fluorine atoms can be reduced, and the appropriate water repellency can be more effectively ensured.

在不阻礙解決本發明課題的範圍,樹脂薄片112除了含有樹脂及任意撥水劑以外,還可含有通常使用於保持墊的樹脂薄片的材料,例如碳黑等的顏料、親水性添加劑及疏水性添加劑的一種或兩種以上。此外,在不阻礙解決本發明課題的範圍,在樹脂薄片112中亦可殘存樹脂薄片112的製造過程中所使用的溶劑等的各種材料。 In addition to the resin and any water repellent, the resin sheet 112 may contain a material which is usually used for a resin sheet of a holding mat, such as a pigment such as carbon black, a hydrophilic additive, and hydrophobicity. One or two or more kinds of additives. In addition, various materials such as a solvent used in the production process of the resin sheet 112 may remain in the resin sheet 112 without hindering the solution of the problem of the present invention.

在樹脂薄片112的保持面P亦可存在微細氣孔。微細氣孔可藉由例如在樹脂薄片112成膜時,添加使保持面(皮層)形成微細氣孔的添加劑而形成。 Fine pores may also be present on the holding surface P of the resin sheet 112. The fine pores can be formed, for example, by adding an additive which forms a fine pore on the holding surface (cortex) when the resin sheet 112 is formed into a film.

保持墊110所具備的基材114,只要可用來支持樹脂薄片112則不受特別限定,可為以往的保持墊中作為基材所含有者,具體而言,可列舉聚對苯二甲酸乙二酯(以下稱為「PET」)薄膜等的樹脂薄膜。 The base material 114 provided in the holding mat 110 is not particularly limited as long as it can support the resin sheet 112, and may be included in the conventional holding mat as a base material. Specifically, polyethylene terephthalate may be mentioned. A resin film such as an ester (hereinafter referred to as "PET") film.

另外,接著層116還可含有已知使用於保持墊的接著劑或黏著劑。作為接著層116的材料可列舉例如丙烯酸系、腈系、腈橡膠系、聚醯胺系、聚胺甲酸乙酯系、聚酯系等的各種熱塑性接著劑。 Additionally, the adhesive layer 116 may also contain an adhesive or adhesive known to be used to hold the mat. Examples of the material of the adhesive layer 116 include various thermoplastic adhesives such as an acrylic, a nitrile, a nitrile rubber, a polyamine, a polyurethane, and a polyester.

此外,保持墊110的基材114及接著層116亦可來自具備該等的雙面膠帶。該雙面膠帶在基材114的兩面皆具 有含接著劑或黏著劑的接著層,其中一個接著層相當於上述接著層116。另一個接著層是用來將保持墊110貼合而安裝在研磨機的保持用定盤。雙面膠帶可為以往的保持墊所含有者,在基材114的相反側亦可具有未圖示的剝離紙。 Further, the base material 114 and the adhesive layer 116 of the holding mat 110 may also come from a double-sided tape provided with these. The double-sided tape has both sides of the substrate 114 There is an adhesive layer containing an adhesive or an adhesive, wherein one of the subsequent layers corresponds to the above-mentioned adhesive layer 116. The other adhesive layer is a holding plate for attaching the holding mat 110 to the holding machine. The double-sided tape may be included in the conventional holding mat, and may have a release paper (not shown) on the opposite side of the base material 114.

接下來針對本實施形態的保持墊的製造方法的一個例子作說明。此處是對於以濕式成膜法製作樹脂薄片112的情況作說明,然而樹脂薄片112之製作方法並不受其限定。在此製造方法中,包括了準備樹脂薄片112的步驟、及將基材114接合在樹脂薄片112而得到保持墊110的步驟。 Next, an example of a method of manufacturing the holding mat of the present embodiment will be described. Here, the case where the resin sheet 112 is produced by the wet film formation method will be described. However, the method of producing the resin sheet 112 is not limited thereto. In this manufacturing method, the step of preparing the resin sheet 112 and the step of joining the substrate 114 to the resin sheet 112 to obtain the holding mat 110 are included.

準備樹脂薄片112的步驟進一步包括:調製出含有樹脂與溶劑,因應必要含有撥水劑的樹脂溶液的步驟(樹脂溶液調製步驟);將樹脂溶液塗佈在成膜用基材的表面的步驟(塗佈步驟);使樹脂溶液中的樹脂凝固再生而形成前驅物薄片的步驟(凝固再生步驟);由前驅物薄片除去溶劑而得到樹脂薄片112的步驟(溶劑除去步驟);及藉由拋光處理或削片處理將樹脂薄片112研磨及/或除去一部分的步驟(研磨.除去步驟)。以下針對各步驟作說明。 The step of preparing the resin sheet 112 further includes a step of preparing a resin solution containing a resin and a solvent, if necessary, a water repellent (resin solution preparation step); and a step of coating the resin solution on the surface of the film formation substrate ( a coating step); a step of solidifying and regenerating the resin in the resin solution to form a precursor sheet (coagulation regeneration step); a step of removing the solvent from the precursor sheet to obtain a resin sheet 112 (solvent removal step); and polishing treatment Or a chipping process of grinding and/or removing a part of the resin sheet 112 (grinding. removal step). The following describes each step.

首先,在樹脂溶液調製步驟中,將上述聚胺甲酸乙酯樹脂等的樹脂、可使該樹脂溶解且混和至後述凝固液的溶劑,因應必要將樹脂薄片112所含的撥水劑及其他材料(例如顏料、親水性添加劑及疏水性添加劑)加以混合, 進一步因應必要在減壓下脫泡,調製出樹脂溶液。作為溶劑並未受到特別限定,而可列舉例如N,N-二甲基甲醯胺(以下稱為「DMF」)及N,N-二甲基乙醯胺。樹脂相對於樹脂溶液總量的含量並未受到特別限定,可設定在例如10~50質量%的範圍,或15~35質量%的範圍。 First, in the resin solution preparation step, a resin such as the above-mentioned polyurethane resin, a solvent which can dissolve the resin and be mixed into a coagulating liquid described later, and a water repellent and other materials contained in the resin sheet 112 are necessary. (for example, pigments, hydrophilic additives and hydrophobic additives), Further, the resin solution was prepared by defoaming under reduced pressure as necessary. The solvent is not particularly limited, and examples thereof include N,N-dimethylformamide (hereinafter referred to as "DMF") and N,N-dimethylacetamide. The content of the resin relative to the total amount of the resin solution is not particularly limited, and may be, for example, in the range of 10 to 50% by mass or 15 to 35% by mass.

接下來,在塗佈步驟中,宜在常溫下,使用刀式塗佈機等的塗佈裝置將樹脂溶液塗佈於帶狀成膜用基材的表面,而形成塗膜。此時所塗佈的樹脂溶液的厚度,只要適當地調整以使最終所得到的樹脂薄片112的厚度成為所希望的厚度即可。成膜用基材的材質可列舉例如PET薄膜等的樹脂薄膜、布帛及不織布。該等之中,以液體難以滲透的PET薄膜等的樹脂薄膜為佳。 Next, in the coating step, it is preferred to apply a resin solution to the surface of the tape-form film-forming substrate at a normal temperature using a coating device such as a knife coater to form a coating film. The thickness of the resin solution applied at this time may be appropriately adjusted so that the thickness of the finally obtained resin sheet 112 becomes a desired thickness. The material of the substrate for film formation may, for example, be a resin film such as a PET film, a cloth or a non-woven fabric. Among these, a resin film such as a PET film which is difficult to penetrate liquid is preferable.

接下來,在凝固再生步驟中,將塗佈於成膜用基材的樹脂溶液的塗膜連續導引至以與樹脂對應的貧溶劑(例如聚胺甲酸乙酯樹脂的情況為水)為主成分的凝固液中。為了調整樹脂的再生速度,在凝固液中亦可添加與樹脂溶液中的溶劑相異的極性溶劑等有機溶劑。另外,凝固液的溫度只要是可使樹脂凝固的溫度,則不受特別限定,可為例如15~65℃。在凝固液中,首先會在樹脂溶液塗膜與凝固液的界面形成被膜(皮層),在被膜旁邊的樹脂中形成無數緻密的微多孔。然後,藉由樹脂溶液所含有的溶劑擴散至凝固液中與貧溶劑滲入樹脂中的協調現象,來進行樹脂的再生,理想的情況為具有連續氣泡構造的樹脂。此時,若液體難以滲透至成膜用基材的情況(例如PET薄 膜),則凝固液不會滲透至該基材,因此樹脂溶液中的溶劑與貧溶劑會在皮層附近優先發生置換,在皮層附近較內側的區域會有形成較大空孔的傾向。像這樣,在成膜用基材上會形成前驅物薄片。 Next, in the solidification regeneration step, the coating film of the resin solution applied to the substrate for film formation is continuously guided to a poor solvent (for example, water in the case of polyurethane resin) corresponding to the resin. In the coagulation solution of the ingredients. In order to adjust the regeneration rate of the resin, an organic solvent such as a polar solvent different from the solvent in the resin solution may be added to the coagulation liquid. Further, the temperature of the coagulation liquid is not particularly limited as long as it is a temperature at which the resin can be solidified, and may be, for example, 15 to 65 °C. In the coagulation liquid, a film (skin layer) is first formed at the interface between the resin solution coating film and the coagulating liquid, and numerous dense micropores are formed in the resin beside the film. Then, the resin is regenerated by the diffusion of the solvent contained in the resin solution into the coagulating solution and the infiltration of the poor solvent into the resin, and is preferably a resin having an open cell structure. At this time, if the liquid is difficult to penetrate into the substrate for film formation (for example, PET thin) In the film), the coagulating liquid does not permeate the substrate, so that the solvent and the poor solvent in the resin solution are preferentially displaced in the vicinity of the skin layer, and a large void is formed in the inner side of the skin layer. In this manner, a precursor sheet is formed on the film forming substrate.

在樹脂溶液含有撥水劑的情況,若撥水劑的含量相對於樹脂30質量份為14質量份以下,則較能夠抑制撥水劑與凝固液之間的干涉所可能造成的凝固不均,因此就結果而言,較能夠防止所得到的樹脂薄片112的成膜不均。 When the water repellent is contained in the resin solution, if the content of the water repellent is 14 parts by mass or less based on 30 parts by mass of the resin, it is possible to suppress uneven coagulation which may be caused by interference between the water repellent and the coagulating liquid. Therefore, as a result, the film formation unevenness of the obtained resin sheet 112 can be prevented more.

接下來,在溶劑除去步驟中,將所形成的前驅物薄片中殘存的溶劑除去,而得到樹脂薄片112。溶劑的除去可採用已知的洗淨液。另外,在將溶劑除去之後,亦可因應必要使樹脂薄片112乾燥。樹脂薄片112的乾燥,可採用例如具備內部具有熱源的圓筒的圓筒式乾燥機,然而乾燥方法並不受其限定。在使用圓筒式乾燥機的情況,前驅物薄片會沿著圓筒的周面經過而乾燥。此外還可將所得到的樹脂薄片112纏繞成輥狀。 Next, in the solvent removal step, the solvent remaining in the formed precursor sheet is removed to obtain a resin sheet 112. The solvent can be removed by using a known cleaning solution. Further, after the solvent is removed, the resin sheet 112 may be dried as necessary. The drying of the resin sheet 112 may be, for example, a cylindrical dryer having a cylinder having a heat source therein, but the drying method is not limited thereto. In the case of using a cylindrical dryer, the precursor sheet is dried along the circumferential surface of the cylinder. Further, the obtained resin sheet 112 may be wound into a roll shape.

接下來,在研磨除去步驟中,宜將樹脂薄片112皮層側的主面、其相反側的背面之中的至少一者藉由拋光處理或削片處理研磨及/或除去一部分。藉由拋光處理或削片處理,可謀求樹脂薄片112厚度的均勻化,因此可使施加在被研磨物的按壓力更均等,進一步抑制被研磨物的損傷,同時可提升被研磨物的平坦性。另外,樹脂薄片112皮層側的主面是作為保持面P,因此宜對背面實施研磨處理,以提升被研磨物的研磨均勻性。 Next, in the polishing removal step, at least one of the main surface on the skin side of the resin sheet 112 and the back surface on the opposite side thereof is preferably ground and/or removed by a buffing treatment or a chipping treatment. By the polishing treatment or the chipping treatment, the thickness of the resin sheet 112 can be made uniform, so that the pressing force applied to the workpiece can be more uniform, and the damage of the object to be polished can be further suppressed, and the flatness of the object to be polished can be improved. . Further, since the main surface of the resin sheet 112 on the skin side is the holding surface P, it is preferable to perform a polishing treatment on the back surface to improve the polishing uniformity of the workpiece.

接下來將基材114接合在樹脂薄片112,而得到保持墊110。在此步驟中,例如使用基材114及具有接著層116的雙面膠帶,藉由接著層116,將基材114接合在樹脂薄片112的保持面P的相反面。此外,在該基材114之中的接著層116相反側,亦可具備另一個雙面膠帶接著層與剝離紙。以這樣的方式可得到保持墊110。 Next, the substrate 114 is bonded to the resin sheet 112 to obtain a holding mat 110. In this step, the substrate 114 is bonded to the opposite surface of the holding surface P of the resin sheet 112 by the adhesive layer 116, for example, using the substrate 114 and the double-sided tape having the adhesive layer 116. Further, on the opposite side of the adhesive layer 116 of the substrate 114, another double-sided tape adhesive layer and a release paper may be provided. The holding mat 110 can be obtained in this manner.

接下來針對使用本實施形態的保持墊110的研磨加工的方法作說明。研磨加工的被研磨物並未受到特別限定,而可列舉例如半導體、半導體裝置用矽晶圓、各種記錄用碟片的基板、液晶顯示器用玻璃基板的材料。從更有效且確實發揮出本發明產生的效果的觀點看來,被研磨物宜為該等之中的玻璃基板。 Next, a method of polishing processing using the holding mat 110 of the present embodiment will be described. The object to be polished is not particularly limited, and examples thereof include a semiconductor, a wafer for a semiconductor device, a substrate for various recording disks, and a material for a glass substrate for a liquid crystal display. From the viewpoint of more effectively and surely exerting the effects produced by the present invention, the object to be polished is preferably a glass substrate among the above.

在研磨加工之中,首先,將保持墊110安裝在研磨機的被研磨物固定座,以保持墊110來保持被研磨物。為了將保持墊110安裝在被研磨物固定座,因應必要將雙面膠帶的剝離紙去除,以露出的接著層接著固定在被研磨物固定座,並使保持面P朝向下方(或上方)。或者,在保持墊110不具備雙面膠帶的情況,以另外準備的接著劑或黏著劑將保持墊110接著固定在被研磨物固定座。接下來,使樹脂薄片112的保持面P含有適量的水,並且按壓被研磨物,被研磨物會藉由水的表面張力及樹脂薄片112的黏著性而透過保持墊110保持在被研磨物固定座。此時,被研磨物的被研磨面(加工面)會朝向下方(或上方)。另一方面,在被研磨物固定座的下方(或上方)且與被研磨 物固定座對向配置的研磨用定盤的表面安裝研磨墊(研磨布),使研磨面朝向上方(或下方)。 In the polishing process, first, the holding mat 110 is attached to the workpiece holder of the grinder to hold the mat 110 to hold the object to be polished. In order to attach the holding mat 110 to the workpiece holder, the release paper of the double-sided tape is removed as necessary, and the exposed adhesive layer is then fixed to the workpiece holder, and the holding surface P is directed downward (or upward). Alternatively, in a case where the holding mat 110 does not have a double-sided tape, the holding mat 110 is subsequently fixed to the object holder by a separately prepared adhesive or adhesive. Next, the holding surface P of the resin sheet 112 contains an appropriate amount of water, and the object to be polished is pressed, and the object to be polished is held by the holding object by the holding pad 110 by the surface tension of the water and the adhesiveness of the resin sheet 112. seat. At this time, the surface to be polished (machined surface) of the object to be polished is directed downward (or upward). On the other hand, under the (or above) the object to be polished and ground The polishing pad (abrasive cloth) is attached to the surface of the polishing plate disposed opposite to the object holder so that the polishing surface faces upward (or below).

接下來,使被研磨物固定座往研磨用定盤移動來搬運被研磨物,而使被研磨物的被研磨面接觸研磨墊的研磨面。然後,在被研磨物與研磨墊之間循環供給含有研磨粒(研磨粒子;例如SiO2、CeO2)及以過氧化氫為代表的氧化劑等化學成分的研磨泥。隨著如此,藉由被研磨物固定座將被研磨物按壓在研磨墊側,同時使被研磨物固定座與研磨用定盤旋轉,以研磨墊藉由CMP對被研磨物的加工面實施研磨加工。 Next, the object to be polished is moved to the polishing platen to convey the object to be polished, and the surface to be polished of the object to be polished is brought into contact with the polishing surface of the polishing pad. Then, a polishing slurry containing chemical components such as abrasive grains (abrasive particles; for example, SiO 2 or CeO 2 ) and an oxidizing agent typified by hydrogen peroxide is circulated and supplied between the object to be polished and the polishing pad. In this manner, the object to be polished is pressed against the polishing pad by the object to be polished, and the object to be polished and the polishing platen are rotated, and the surface of the object to be polished is polished by the polishing pad by CMP. machining.

在本實施形態中,藉由將樹脂薄片112在40℃的貯藏彈性率E’設定在0.3~2.0MPa,且將樹脂薄片112的吸水量設定在95~200mg/50.3cm2,可抑制被研磨物的吸附不良及表皮磨耗兩者。藉由將在40℃的貯藏彈性率E’設定在0.3MPa以上,在研磨加工時,樹脂薄片112成為不易發生表皮磨耗。另一方面,藉由將在40℃的貯藏彈性率E’設定在2.0MPa以下,樹脂薄片112對被研磨物的吸附力提高,成為吸附不良不易發生。此外,藉由將吸水量設定在95mg/50.3cm2以上,樹脂薄片112對被研磨物的吸附力提高,成為吸附不良不易發生。另一方面,藉由將吸附量設定在200mg/50.3cm2以下,在研磨加工時,樹脂薄片112成為不易發生表皮磨耗。抑制表皮磨耗的發生可防止保持面P損傷,因此就結果而言,牽涉到保持墊110壽命的延長。 In the present embodiment, the storage elastic modulus E' of the resin sheet 112 at 40 ° C is set to 0.3 to 2.0 MPa, and the water absorption amount of the resin sheet 112 is set to 95 to 200 mg / 50.3 cm 2 , thereby suppressing the polishing. Both the adsorption of the substance and the abrasion of the skin. By setting the storage modulus E' at 40 ° C to 0.3 MPa or more, the resin sheet 112 is less likely to cause skin abrasion during the polishing process. On the other hand, when the storage elastic modulus E' at 40 ° C is set to 2.0 MPa or less, the adsorption force of the resin sheet 112 on the workpiece is increased, and adsorption failure is less likely to occur. In addition, by setting the water absorption amount to 95 mg/50.3 cm 2 or more, the adsorption force of the resin sheet 112 on the workpiece is increased, and the adsorption failure is less likely to occur. On the other hand, when the adsorption amount is set to 200 mg/50.3 cm 2 or less, the resin sheet 112 is less likely to cause skin abrasion during the polishing process. Inhibition of the occurrence of epidermal abrasion prevents the holding surface P from being damaged, and as a result, the life of the holding mat 110 is prolonged.

以上針對本實施形態作詳細說明,然而本發明並不受上述本實施形態所限定。例如在上述本實施形態中,樹脂薄片112與基材114的接合是使用接著層116,而該等的接合不受限於使用接著層116。此外,本發明之保持墊亦可不具備基材,而從保持墊操作性的觀點看來,係以具備基材為佳。另外,在保持墊的製造方法之中,亦可省略研磨.除去步驟。此外,在保持墊的製造方法之中,還可藉由將在樹脂溶液中添加撥水劑改成在所得到的樹脂薄片塗佈撥水劑,或者一起進行,然後因應必要乾燥,而使樹脂薄片含有撥水劑。撥水劑的塗佈方法可列舉例如浸漬法及噴霧法。 Although the present embodiment has been described in detail above, the present invention is not limited to the above embodiment. For example, in the above-described embodiment, the bonding of the resin sheet 112 and the substrate 114 is performed using the adhesive layer 116, and the bonding is not limited to the use of the adhesive layer 116. Further, the holding mat of the present invention may not have a base material, and it is preferable to provide a base material from the viewpoint of maintaining the operability of the mat. In addition, in the method of manufacturing the holding mat, the grinding may be omitted. Remove the steps. Further, in the method of manufacturing the holding mat, the water repellent may be added to the resin solution to be applied to the obtained resin sheet, or the water repellent may be applied together, and then the resin may be dried as necessary. The flakes contain a water repellent. Examples of the method of applying the water repellent include a dipping method and a spraying method.

[實施例] [Examples]

以下藉由實施例對於本發明作進一步詳細說明,而本發明並不受這些實施例所限定。 The invention is further illustrated by the following examples, but the invention is not limited by the examples.

(實施例1) (Example 1)

相對於原料樹脂的100%模數(在25℃時的值,以下同樣)為6.0MPa的聚酯系聚胺甲酸乙酯樹脂的30%DMF溶液100質量份,添加DMF50質量份、水8質量份、作為撥水劑而且含有全氟己基化合物的DIC股份有限公司製「Crisvon Assistor SD-38」(商品名)3質量份,並且混合攪拌,而調製出樹脂溶液。接下來,準備作為成膜用基材的PET薄膜,使用刀式塗佈機將上述樹脂溶液塗佈在 其上,而得到厚度1.0mm的塗膜。作為聚酯系聚胺甲酸乙酯樹脂是採用使乙二醇及丙二醇與己二酸脫水縮合所得到的聚酯多元醇、及亞甲基雙(4,1-亞苯基)=二異氰酸酯(MDI)與低分子二醇縮合所得到者(以下的實施例及比較例亦同)。 100 parts by mass of the polyester resin polyurethane resin of 6.0 MPa, 100 parts by mass of the raw material resin (the same as the value at 25 ° C, the same applies hereinafter), 50 parts by mass of DMF, and 8 mass of water. In a portion, 3 parts by mass of "Crisvon Assistor SD-38" (trade name) manufactured by DIC Corporation, which is a water-repellent agent and containing a perfluorohexyl compound, was mixed and stirred to prepare a resin solution. Next, a PET film as a substrate for film formation is prepared, and the resin solution is applied to the resin solution using a knife coater. On top of this, a coating film having a thickness of 1.0 mm was obtained. The polyester-based polyurethane resin is a polyester polyol obtained by dehydrating and condensing ethylene glycol, propylene glycol and adipic acid, and methylene bis(4,1-phenylene)=diisocyanate ( MDI) is obtained by condensation with a low molecular weight diol (the same applies to the following examples and comparative examples).

接下來,將所得到的塗膜與成膜用基材一起浸漬於以水為凝固液的18℃凝固浴,使樹脂凝固再生,而得到前驅物薄片。由凝固浴取出前驅物薄片,將成膜用基材由前驅物薄片剝離,然後將前驅物薄片浸漬於由水所構成而且在室溫下的洗淨液(脫溶劑浴),並除去作為溶劑的DMF,而得到樹脂薄片。然後,使樹脂薄片乾燥同時加以纏繞。接下來,對於樹脂薄片的背面(將成膜用基材剝離的一側且接觸到成膜基材的一面)實施拋光處理,使厚度成為0.8mm。 Next, the obtained coating film was immersed in a 18° C. coagulation bath containing water as a coagulation liquid together with the substrate for film formation, and the resin was solidified and regenerated to obtain a precursor sheet. The precursor sheet is taken out from the coagulation bath, the film-forming substrate is peeled off from the precursor sheet, and then the precursor sheet is immersed in a washing liquid (desolvent bath) composed of water and at room temperature, and removed as a solvent. DMF, while getting a resin sheet. Then, the resin sheet is dried while being entangled. Next, the back surface of the resin sheet (the side on which the film formation substrate was peeled off and the surface in contact with the film formation substrate) was subjected to a buffing treatment to have a thickness of 0.8 mm.

接下來,將PET製基材的雙面具有接著層(材質:丙烯酸系樹脂)並且進一步在單面具有剝離紙的雙面膠帶,以與該剝離紙相反側的接著層貼合在樹脂薄片實施拋光處理的一面,然後裁成外徑33.5cm的圓形,而得到保持墊。 Next, a double-sided tape having a backing layer (material: acrylic resin) on both sides of the PET substrate and further having a release paper on one side is attached to the resin sheet in an adhesive layer on the opposite side to the release paper. The polished side was then cut into a circle having an outer diameter of 33.5 cm to obtain a holding mat.

保持墊所具備的樹脂薄片,其在40℃的貯藏彈性率E’是藉由上述「貯藏彈性率E’的測定方法」作測定,吸水量是藉由上述「吸水量的測定方法」作測定,在40℃的KEL是藉由上述「KEL的計算方法」作測定。此外,在貯藏彈性率E’及KEL的測定方法中,動態黏彈性測定裝置 採用TA Instruments Japan公司製製品名「RSA III」。 The storage elastic modulus E' at 40 ° C of the resin sheet provided in the holding mat is measured by the above-mentioned "measurement method of storage elastic modulus E'", and the water absorption amount is measured by the "measurement method of water absorption amount". The KEL at 40 ° C was measured by the above "calculation method of KEL". Further, in the method for measuring the storage modulus E' and KEL, the dynamic viscoelasticity measuring device The product name "RSA III" manufactured by TA Instruments Japan was used.

(吸附力的測定) (Measurement of adsorption force)

將保持墊切成約100mm×100mm的正方形。另外,準備直徑 60mm、厚度約1mm的玻璃基板作為吸附對象物。將切好的保持墊安裝在固定的定盤上。接下來,在保持墊所具備的樹脂薄片的保持面噴灑適量的水,適度地清除水份,然後將玻璃基板確實按壓使其吸附在保持墊。接下來,透過與玻璃基板相同尺寸且具有緩衝層的雙面膠帶,將拉伸用的夾具確實按壓貼附在保持墊相反側的玻璃基板表面。然後將拉伸用的夾具往與玻璃基板的相反側拉伸,在玻璃基板由保持墊拉開時,讀取拉伸荷重的最大值。拉伸測試機採用萬能拉力試驗機TENSILON(ORIENTEC公司製)。不更換安裝在被研磨物固定座的保持墊,重覆上述操作3次,(但是第2次以後,在拉伸用的夾具貼附於玻璃基板的狀態下使玻璃基板吸附在保持墊),將此3次拉伸荷重的最大值相加並且取平均值,而定為吸附力。 The holding mat was cut into squares of about 100 mm x 100 mm. In addition, prepare the diameter A glass substrate having a thickness of 60 mm and a thickness of about 1 mm is used as an object to be adsorbed. Install the cut retaining pad on the fixed plate. Next, an appropriate amount of water is sprayed on the holding surface of the resin sheet provided on the holding mat to appropriately remove the moisture, and then the glass substrate is surely pressed to be adsorbed on the holding mat. Next, the jig for stretching was pressed against the surface of the glass substrate on the opposite side of the holding mat by a double-sided tape having the same size and a buffer layer as the glass substrate. Then, the jig for stretching was stretched to the opposite side to the glass substrate, and the maximum value of the tensile load was read when the glass substrate was pulled apart by the holding mat. The tensile testing machine was a universal tensile testing machine TENSILON (manufactured by ORIENTEC Co., Ltd.). The above-described operation is repeated three times without replacing the holding mat attached to the object to be polished, (but after the second time, the glass substrate is attached to the holding mat in a state in which the jig for stretching is attached to the glass substrate). The maximum values of the three tensile loads were added and averaged to determine the adsorption force.

(保持墊的壽命測定) (maintaining the life of the pad)

將保持墊安裝在研磨機(SpeedFam股份有限公司製,商品名「SP-1200」)的既定位置。接下來,對保持墊所具備的樹脂薄片的保持面噴灑適量的水,適度地清除水份,然後使作為被研磨物的液晶顯示器用玻璃基板 (470mm×370mm×0.5mm)吸附在保持墊。研磨墊採用Polypas FX-7M(富士紡愛媛股份有限公司製商品名),依照下述的條件進行研磨加工。將被研磨物由保持墊脫離而破損的時間點或保持墊發生表皮磨耗的時間點定為壽命終點,進行研磨加工直到無法研磨,研磨結束後將被研磨物的枚數評為保持墊的壽命。此外,被研磨物的枚數最大為50枚。 The holding mat was attached to a predetermined position of a grinder (manufactured by SpeedFam Co., Ltd., trade name "SP-1200"). Next, an appropriate amount of water is sprayed on the holding surface of the resin sheet provided in the holding mat to appropriately remove the moisture, and then the glass substrate for the liquid crystal display as the object to be polished is used. (470 mm × 370 mm × 0.5 mm) was adsorbed on the holding mat. The polishing pad was polished using Polypas FX-7M (trade name, manufactured by Fujifilm Ehime Co., Ltd.) under the following conditions. The time point at which the object to be polished is detached from the holding mat and the time at which the pad is worn is determined as the end point of the life, and the polishing process is performed until the polishing is impossible. After the polishing is completed, the number of objects to be polished is evaluated as the life of the pad. . In addition, the number of objects to be polished is up to 50.

使用研磨機:奧斯卡式研磨機SP-1200(SpeedFam股份有限公司製商品名) Grinding machine: Oscar grinder SP-1200 (trade name, manufactured by SpeedFam Co., Ltd.)

研磨速度(轉速):61rpm Grinding speed (speed): 61rpm

加工壓力:76gf/cm2 Processing pressure: 76gf/cm 2

研磨泥:Shorox A-10(昭和電工股份有限公司製商品名)10%的研磨泥 Grinding mud: 10% grinding mud from Shorex A-10 (trade name of Showa Denko Co., Ltd.)

研磨時間:10分鐘/枚 Grinding time: 10 minutes / piece

將上述各測定的結果揭示於表1。 The results of the above respective measurements are disclosed in Table 1.

(實施例2) (Example 2)

將撥水劑的添加量變更為相對於聚酯系聚胺甲酸乙酯 樹脂之30%DMF溶液100質量份為7質量份,除此之外與實施例1同樣地製作出保持墊,進行各測定。將各測定的結果揭示於表1。 Change the amount of water repellent added to polyester-based polyurethane A holding mat was prepared in the same manner as in Example 1 except that 100 parts by mass of the resin was used in an amount of 7 parts by mass, and each measurement was carried out. The results of each measurement are disclosed in Table 1.

(實施例3) (Example 3)

將撥水劑的添加量變更為相對於聚酯系聚胺甲酸乙酯樹脂之30%DMF溶液100質量份為10質量份,除此之外與實施例1同樣地製作出保持墊,進行各測定。將各測定的結果揭示於表1。 A holding mat was produced in the same manner as in Example 1 except that the amount of the water-repellent agent was changed to 10 parts by mass based on 100 parts by mass of the 30% DMF solution of the polyester-based polyurethane resin. Determination. The results of each measurement are disclosed in Table 1.

(實施例4) (Example 4)

將撥水劑的添加量變更為相對於聚酯系聚胺甲酸乙酯樹脂之30%DMF溶液100質量份為13質量份,除此之外與實施例1同樣地製作出保持墊,進行各測定。將各測定的結果揭示於表1。 A holding mat was prepared in the same manner as in Example 1 except that the amount of the water-repellent agent was changed to 13 parts by mass based on 100 parts by mass of the 30% DMF solution of the polyester-based polyurethane resin. Determination. The results of each measurement are disclosed in Table 1.

(實施例5) (Example 5)

將原料樹脂變更為100%模數為8.4MPa的聚酯系聚胺甲酸乙酯樹脂,除此之外與實施例3同樣地製作出保持墊,進行各測定。將各測定的結果揭示於表1。 A holding mat was produced in the same manner as in Example 3 except that the raw material resin was changed to a polyester-based polyurethane resin having a 100% modulus of 8.4 MPa, and each measurement was carried out. The results of each measurement are disclosed in Table 1.

(比較例1) (Comparative Example 1)

將原料樹脂變更為100%模數為3.0MPa的聚酯系聚胺甲酸乙酯樹脂,除此之外與實施例3同樣地製作出保持 墊,進行各測定。將各測定的結果揭示於表1。 In the same manner as in Example 3 except that the raw material resin was changed to a polyester-based polyurethane resin having a 100% modulus of 3.0 MPa. Pads were taken for each measurement. The results of each measurement are disclosed in Table 1.

(比較例2) (Comparative Example 2)

將撥水劑變更為含有全氟辛基化合物的DIC股份有限公司製的「Crisvon Assistor SD-27」(商品名),除此之外與實施例3同樣地製作出保持墊,進行各測定。將各測定的結果揭示於表1。 A holding mat was prepared in the same manner as in Example 3 except that the water-repellent was changed to "Crisvon Assistor SD-27" (trade name) manufactured by DIC Co., Ltd. containing a perfluorooctyl compound, and each measurement was performed. The results of each measurement are disclosed in Table 1.

(比較例3) (Comparative Example 3)

將撥水劑的添加量變更為相對於聚酯系聚胺甲酸乙酯樹脂之30%DMF溶液100質量份為1質量份,除此之外與實施例1同樣地製作出保持墊,進行各測定。將各測定的結果揭示於表1。 A holding mat was prepared in the same manner as in Example 1 except that the amount of the water-repellent agent was changed to 1 part by mass based on 100 parts by mass of the 30% DMF solution of the polyester-based polyurethane resin. Determination. The results of each measurement are disclosed in Table 1.

(比較例4) (Comparative Example 4)

將撥水劑的添加量變更為相對於聚酯系聚胺甲酸乙酯樹脂之30%DMF溶液100質量份為15質量份,除此之外與實施例1同樣地製作出保持墊,進行各測定。將各測定的結果揭示於表1。 A holding mat was prepared in the same manner as in Example 1 except that the amount of the water-repellent agent was changed to 15 parts by mass based on 100 parts by mass of the 30% DMF solution of the polyester-based polyurethane resin. Determination. The results of each measurement are disclosed in Table 1.

(比較例5) (Comparative Example 5)

將原料樹脂變更為100%模數為20MPa的聚酯系聚胺甲酸乙酯樹脂,除此之外與實施例3同樣地製作出保持墊,進行各測定。將各測定的結果揭示於表1。 A holding mat was produced in the same manner as in Example 3 except that the raw material resin was changed to a polyester-based polyurethane resin having a 100% modulus of 20 MPa, and each measurement was performed. The results of each measurement are disclosed in Table 1.

在保持墊的壽命測定之中,在比較例1、3的情況,樹脂薄片發生表皮磨耗,被研磨物偏離保持墊的面內方向,結果難以進行研磨。另外,在比較例2、4、5的情況,被研磨物會脫離保持墊,結果難以進行研磨。 In the measurement of the life of the holding mat, in the case of Comparative Examples 1 and 3, the resin sheet was subjected to skin abrasion, and the object to be polished was deviated from the in-plane direction of the holding mat, and as a result, polishing was difficult. Further, in the case of Comparative Examples 2, 4, and 5, the object to be polished was released from the holding mat, and as a result, it was difficult to perform polishing.

產業上的可利用性 Industrial availability

本發明之保持墊適合使用於以半導體、半導體裝置用矽晶圓、各種記錄用碟片的基板、液晶顯示器用玻璃基板等作為被研磨物的研磨加工,因此在這些用途具有產業上的可利用性。 The holding mat of the present invention is suitably used for polishing a semiconductor, a substrate for a semiconductor device, a substrate for various recording discs, a glass substrate for a liquid crystal display, or the like as an object to be polished, and therefore is industrially usable for these uses. Sex.

Claims (6)

一種保持墊,其係具備具有用以保持被研磨物的保持面的聚胺甲酸乙酯樹脂薄片之保持墊,並且前述聚胺甲酸乙酯樹脂薄片在40℃的貯藏彈性率E’為0.3~2.0MPa,且前述聚胺甲酸乙酯樹脂薄片的吸水量為95~200mg/50.3cm2A holding mat provided with a holding mat having a polyurethane resin sheet for holding a holding surface of an object to be polished, and the storage elastic modulus E' of the polyurethane resin sheet at 40 ° C is 0.3~ 2.0 MPa, and the water absorption amount of the aforementioned polyurethane resin sheet is 95 to 200 mg/50.3 cm 2 . 如申請專利範圍第1項之保持墊,其中前述聚胺甲酸乙酯樹脂薄片在40℃的KEL為1.0×105~5.0×105Pa-1The holding mat of claim 1, wherein the polyurethane resin sheet has a KEL of from 1.0 × 10 5 to 5.0 × 10 5 Pa -1 at 40 °C. 如申請專利範圍第1或2項之保持墊,其中構成前述聚胺甲酸乙酯樹脂薄片的樹脂在25℃的100%模數為4.0~10.0MPa。 The holding mat according to claim 1 or 2, wherein the resin constituting the polyurethane resin sheet has a 100% modulus at 25 ° C of 4.0 to 10.0 MPa. 如申請專利範圍第1或2項之保持墊,其中前述聚胺甲酸乙酯樹脂薄片係含有撥水劑。 The holding mat of claim 1 or 2, wherein the polyurethane resin sheet contains a water repellent. 如申請專利範圍第4項之保持墊,其中前述撥水劑係含有具有碳數為6~8的全氟烷基的氟系撥水劑。 The retaining pad of claim 4, wherein the water repellent comprises a fluorine-based water repellent having a perfluoroalkyl group having a carbon number of 6-8. 如申請專利範圍第5項之保持墊,其中前述聚胺甲酸乙酯樹脂薄片所含有的前述氟系撥水劑的60~100莫耳%係具有碳數6的全氟烷基的氟系撥水劑。 The holding mat of the fifth aspect of the invention, wherein 60 to 100 mol% of the fluorine-based water repellent agent contained in the polyurethane resin sheet is a fluorine-based dial having a carbon number of 6 perfluoroalkyl group Aqueous agent.
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