JPH11151665A - Back pad and water absorption prevention method therefor - Google Patents

Back pad and water absorption prevention method therefor

Info

Publication number
JPH11151665A
JPH11151665A JP31986597A JP31986597A JPH11151665A JP H11151665 A JPH11151665 A JP H11151665A JP 31986597 A JP31986597 A JP 31986597A JP 31986597 A JP31986597 A JP 31986597A JP H11151665 A JPH11151665 A JP H11151665A
Authority
JP
Japan
Prior art keywords
back pad
polishing
water absorption
substrate
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31986597A
Other languages
Japanese (ja)
Inventor
Yoshiaki Tsujii
義明 辻井
Tomoko Matsuo
智子 松尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Central Glass Co Ltd
Original Assignee
Central Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Central Glass Co Ltd filed Critical Central Glass Co Ltd
Priority to JP31986597A priority Critical patent/JPH11151665A/en
Publication of JPH11151665A publication Critical patent/JPH11151665A/en
Pending legal-status Critical Current

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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent local stress from being applied on a polishing face of a substrate and a crack thereof. SOLUTION: In a back pad 3 used in a method for polishing one face of a substrate 2 by attaching the substrate 2 on a lower face of an upper surface plate 1 through the back pad 3 of a foaming elastic body and rotating and pressurizing a grinding panel 5 provided in a lower part thereof, a water absorption rate from a surface thereof is 20 mg/cm<2> or less. Moreover, according to a water absorption prevention method of the back pad 3, a thin coat of resin paint is applied on a surface of the back pad 3 and then the surface thereof is dried and hardened, a part of an air hole on the surface of the back pad is blocked to control the water absorption rate from the surface thereof, and then the back pad 3 is mounted on a lower face of the upper surface plate 1.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、液晶基板用ガラス
或いは半導体ウエハ等の基板を、片面研磨する際に用い
るバックパッド及びその吸水防止方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a back pad used for polishing one side of a substrate such as glass for a liquid crystal substrate or a semiconductor wafer, and a method of preventing water absorption thereof.

【0002】[0002]

【従来の技術】液晶基板用ガラス或いは半導体ウエハ等
に用いられる薄板状の基板は、超高精度の面平滑性が要
求されており、例えば液晶基板用ガラスの場合、通常の
ガラス板を製造するフロート法や或いはダウンドロー法
等の火造り法で製造されたガラスでは、ガラス表面の凹
凸や目に見えない小さな傷、或いはウネリ等が存在して
おり、そのまま基板用として使用することは出来ない。
従来、薄板ガラスや半導体ウエハ等の基板の面を改善す
る方法として基板の片面を研磨する方法が用いられてい
る。その片面研磨法は、一般に上部定盤と、その上面に
研磨盤が一体に設置された下部定盤との間に基板を配置
し、上部定盤で加圧しながら研磨液を供給する研磨盤を
回転し、基板の片面を平滑に研磨する方法が、例えば、
特開平7−285066号、特開平8−1509号、特
開平9−57592号等で知られている。この研磨方法
の場合、通常上部定盤と基板との間に、弾性を有するバ
ックパッドと呼ばれる板状体を介在させ、基板を保持す
ると共に、加圧研磨する時に基板に集中応力が加わらな
いように弾性体のバックパッドで保護している。
2. Description of the Related Art Ultra-high-precision surface smoothness is required for thin-plate substrates used for glass for liquid crystal substrates or semiconductor wafers. For example, in the case of glass for liquid crystal substrates, a normal glass plate is manufactured. Glass manufactured by the fire method such as the float method or the down draw method has irregularities on the glass surface, small invisible scratches, or undulations, and cannot be used as it is for substrates. .
Conventionally, a method of polishing one surface of a substrate has been used as a method of improving the surface of a substrate such as a thin glass or a semiconductor wafer. The single-side polishing method generally involves placing a substrate between an upper platen and a lower platen on which a polishing plate is integrally mounted, and using a polishing plate that supplies a polishing liquid while pressing the upper platen. Rotate, a method of polishing one side of the substrate smoothly, for example,
It is known in JP-A-7-285066, JP-A-8-1509, JP-A-9-57592 and the like. In the case of this polishing method, a plate-like body called an elastic back pad is usually interposed between the upper surface plate and the substrate to hold the substrate and to prevent concentrated stress from being applied to the substrate during pressure polishing. It is protected by an elastic back pad.

【0003】[0003]

【発明が解決しようとする課題】上述の従来の片面研磨
法においては、原因不明で基板の割れがしばしば発生
し、生産に支障を来すことがある。
In the above-described conventional single-side polishing method, the substrate often breaks for unknown reasons, which may hinder production.

【0004】[0004]

【課題を解決するための手段】本発明者は、鋭意研究し
た結果、研磨に用いられているバックパッドの吸水率と
基板との割れ発生率が相関関係にあることを見い出し
た。すなわち、例えばバックパッドとしては通常、連続
気泡を有するウレタン樹脂等が用いられているが、研磨
中にこのウレタン製バックパッドの表面から研磨液を多
量に吸水し、連続気泡を有する樹脂の内部まで水が挿通
し、使用している間にウレタン樹脂の加水分解が起こ
り、部分的に膨れる等の欠陥が生じ、この部分的に膨れ
た欠陥が生じたバックパッドを用いたまま研磨を続ける
と、基板に局部応力が発生して基板の割れに繋がること
が判明した。
Means for Solving the Problems As a result of diligent research, the present inventor has found that the water absorption of the back pad used for polishing and the rate of occurrence of cracks with the substrate are correlated. That is, for example, a urethane resin or the like having open cells is usually used as the back pad.However, during polishing, a large amount of polishing liquid is absorbed from the surface of the urethane back pad to the inside of the resin having open cells. When water is inserted and hydrolysis of the urethane resin occurs during use, defects such as partial swelling occur, and if polishing is continued while using the back pad with the partially swelled defect, It has been found that local stress is generated in the substrate, which leads to cracking of the substrate.

【0005】本発明は、以上のような従来の問題点に鑑
みてなしたものであり、発泡弾性体のバックパッドの吸
水量を所定量以下に制御することにより、吸水による発
泡弾性体樹脂の加水分解による劣化を極めて遅くし、基
板への局部応力解消による割れの減少、バックパッドの
監視作業の軽減、バックパッドの交換頻度の減少、コス
トダウン、研磨稼働率の向上等に寄与できるバックパッ
ド及びその吸水防止方法を提供するものである。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned conventional problems. By controlling the water absorption of a back pad of a foamed elastic body to a predetermined amount or less, the resin of the foamed elastic resin due to water absorption is controlled. A back pad that extremely slows degradation due to hydrolysis and contributes to reducing cracks by eliminating local stress on the substrate, reducing the work of monitoring the back pad, reducing the frequency of back pad replacement, reducing costs, improving the polishing operation rate, etc. And a method for preventing water absorption thereof.

【0006】すなわち本発明は、上部定盤の下面に連続
気泡を有する発泡弾性体のバックパッドを介して基板を
取り付け、該上部定盤と下方に設けた研磨盤を回転し、
加圧しながら基板の片面を研磨する方法に用いられるバ
ックパッドにおいて、表面からの吸水率を20mg/cm2
以下としたバックパッドに関する。
That is, according to the present invention, a substrate is mounted on a lower surface of an upper surface plate through a back pad of a foamed elastic body having open cells, and the upper surface plate and a polishing plate provided below are rotated.
In a back pad used for a method of polishing one surface of a substrate while applying pressure, the water absorption from the surface is 20 mg / cm 2.
The following relates to the back pad.

【0007】また、上部定盤に装着前のバックパッドの
表面を樹脂塗料で薄く塗装し、表面の気孔の一部を塗料
で塞ぎ、表面からの吸水量を制御することが好まし
い。。さらに本発明は、上部定盤の下面に連続気泡を有
する発泡弾性体のバックパッドを介して基板を取り付
け、該上部定盤で加圧しながら下方に設けた研磨盤に研
磨液を供給しながら回転し、基板の片面を研磨する方法
において、バックパッドの表面を樹脂塗料で薄く塗装し
た後、乾燥・硬化し、該バックパッド表面の気孔の一部
を塞ぎ表面からの吸水率を制御した後、上部定盤の下面
にバックパッドを装着させてなるバックパッドの吸水防
止方法に関する。
Further, it is preferable to control the amount of water absorption from the surface by coating the surface of the back pad before mounting on the upper surface plate with a thin resin paint and closing some of the pores on the surface with the paint. . Further, according to the present invention, a substrate is attached to the lower surface of an upper surface plate through a foamed elastic body back pad having open cells, and the upper surface plate is rotated while supplying a polishing liquid to a lower polishing surface while applying pressure. Then, in the method of polishing one surface of the substrate, after the surface of the back pad is thinly coated with a resin paint, dried and cured, and partially closed the pores of the back pad surface to control the water absorption from the surface, The present invention relates to a method for preventing water absorption of a back pad in which a back pad is attached to a lower surface of an upper surface plate.

【0008】さらに、上部定盤に装着前の塗装したバッ
クパッドの塗装面に金属製リングを載置し、該リング内
に所定量の水を充填し、所定時間経過後の吸水量を測定
して、表面からの吸水率を求めることにより所要の塗装
量を定めることことが好ましい。
Further, a metal ring is placed on the painted surface of the painted back pad before being mounted on the upper surface plate, a predetermined amount of water is filled in the ring, and the water absorption after a predetermined time has elapsed is measured. Then, it is preferable to determine the required coating amount by determining the water absorption from the surface.

【0009】[0009]

【発明の実施の形態】以下、図面に従って本発明のバッ
クパッド及びその吸水防止方法についての一実施例につ
いて説明する。なお、本発明は、この実施例に限定され
るものではない。
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view showing a back pad and a method for preventing water absorption of the back pad according to the present invention. Note that the present invention is not limited to this embodiment.

【0010】図1において、上部定盤1の下面に、被研
磨板である基板2のサイズより大きな発泡弾性体樹脂よ
りなるバックパッド3を接着剤により貼付けた後、基板
2をバックパッド3の表面に貼り付ける。一方下部定盤
4の上面には研磨盤5が一体に装着され、研磨する時に
は下方より研磨液が研磨盤5に供給できるようになって
おり、研磨盤5と一体となった下部定盤4を回転駆動さ
せながら研磨液を供給する。続いて上部定盤1を基板2
が研磨盤5に接触するまで下方へ移動させた後、上部定
盤1をさらに下部定盤4上の研磨盤5に加圧し、加圧状
態のまま基板2の片面を研磨する。一定時間研磨の後、
上部加圧定盤1を上方へ移動し、片面研磨された基板2
をバックパッド3より取外し、一枚の基板2の研磨は終
了する。
In FIG. 1, a back pad 3 made of a foamed elastic resin larger than the size of a substrate 2 to be polished is adhered to the lower surface of an upper platen 1 with an adhesive. Paste on the surface. On the other hand, a polishing plate 5 is integrally mounted on the upper surface of the lower platen 4, so that a polishing liquid can be supplied to the polishing plate 5 from below when polishing, and the lower platen 4 integrated with the polishing plate 5 is provided. The polishing liquid is supplied while rotating the. Then, the upper platen 1 is
Then, the upper surface plate 1 is further pressed against the polishing plate 5 on the lower surface plate 4, and one surface of the substrate 2 is polished in the pressed state. After polishing for a certain time,
The upper pressure platen 1 is moved upward, and the substrate 2 polished on one side is moved.
Is removed from the back pad 3, and polishing of one substrate 2 is completed.

【0011】なお、連続気泡を有する発泡弾性体のバッ
クパッドは、上部定盤に接着される前に表面を樹脂塗料
で塗装し、乾燥・硬化を行い表面の気孔の一部を塞ぎ、
表面からの吸水率を20mg/cm2以下に制御した後、上
部定盤に接着する。バックパッド表面の気孔の一部を塞
いだことにより、研磨時にあまり吸水せず、そのため長
時間使用しても加水分解することなく、長期間の使用に
耐え、耐久性が向上する。
The back pad of the foamed elastic body having open cells is coated with a resin paint before being adhered to the upper surface plate, dried and cured to partially close the pores on the surface,
After controlling the water absorption from the surface to 20 mg / cm 2 or less, it is adhered to the upper surface plate. By closing a part of the pores on the surface of the back pad, it does not absorb much water at the time of polishing, so that it does not hydrolyze even if used for a long time, can withstand long-term use, and has improved durability.

【0012】バックパッドの吸水率は、20mg/cm2
下であれば使用可能であるが、吸水率が15mg/cm2
こえるとバックパッドの耐久性のバラツキが大きくな
り、1.5〜10mg/cm2の範囲がより好ましい。1.
5mg/cm2以下では基板を水で接着させる際に基板の保
持力が低下し、研磨中に基板がバックパッドから外れて
破損が生じやすくなる。
The water absorption of the back pad can be used as long as it is 20 mg / cm 2 or less. However, if the water absorption exceeds 15 mg / cm 2 , the durability of the back pad greatly varies, and 1.5 to 10 mg / cm 2. / Cm 2 is more preferable. 1.
If it is 5 mg / cm 2 or less, the holding power of the substrate is reduced when the substrate is adhered with water, and the substrate is detached from the back pad during polishing, so that the substrate is easily damaged.

【0013】バックパッド表面の塗装する領域は、上部
定盤と接着する部分を除いたその他の全表面とすること
が好ましい。また、塗装の厚さは、基板を水の表面張力
だけでバックパッドに取り付ける際には、基板の保持力
が低下しない程度の厚みに塗装することが好ましい。
It is preferable that the area to be coated on the surface of the back pad be the entire surface except for the portion that is bonded to the upper surface plate. When the substrate is attached to the back pad only by the surface tension of water, it is preferable to apply the coating to such a thickness that the holding force of the substrate does not decrease.

【0014】バックパッドは、前述の通り上下の定盤で
挟まれた基板を研磨する際に、基板にしっかりと保持す
るためのものであり、そのため連続気泡を有する発泡弾
性体の構造を有するものが好ましく、且つある程度の強
度、耐久性を備えているものであれば使用可能であり、
特に発泡性ウレタン樹脂、アクリル樹脂等が好ましい。
The back pad is for holding the substrate firmly when polishing the substrate sandwiched between the upper and lower platens as described above, and therefore has a structure of a foamed elastic body having open cells. Is preferred, and can be used as long as it has a certain strength and durability,
In particular, foamable urethane resin, acrylic resin and the like are preferable.

【0015】上部定盤の下面にバックパッドを接着する
には、通常の接着剤を用いても良いが、両面接着シート
を用いることが、作業性の点で能率が良く好ましい。バ
ックパッドに基板を取り付ける方法は、基板の脱着性を
考えると、バックパッドの下面を水で湿潤し、そこへ基
板を水の表面張力を利用して貼り付けることが好ましい
が、これに限定されるものではなく、接着剤で貼り付け
ても構わない。
To bond the back pad to the lower surface of the upper platen, a normal adhesive may be used, but it is preferable to use a double-sided adhesive sheet in terms of workability because it is efficient. The method of attaching the substrate to the back pad is, considering the desorption property of the substrate, it is preferable to wet the lower surface of the back pad with water and affix the substrate to the surface using the surface tension of water, but it is not limited thereto. It is not necessary to attach it and it may be attached with an adhesive.

【0016】研磨するときには下部定盤は、一定速度で
駆動され回転し、それに従って研磨盤も回転するが、基
板が取り付けられた上部定盤は、フリーになっており下
部定盤の回転に伴って回転する機構にするのが好まし
い。なお、上部定盤も回転させても構わない。
When polishing, the lower platen is driven and rotated at a constant speed, and the polishing plate also rotates accordingly. However, the upper platen on which the substrate is mounted is free and rotates with the rotation of the lower platen. It is preferable to use a rotating mechanism. The upper surface plate may be rotated.

【0017】基板は、液晶用ガラス基板の他、半導体ウ
エハー等の基板を用いることが出来るが、これに限定す
るものではなく、薄板状の基板を片面研磨するものにつ
いては何でも用いることが出来る。なお、ガラス基板の
場合、ガラス板の板厚は主に約0.3〜3.0mm程度で
あり、普通板ガラス、いわゆるフロート板ガラスなどで
あり、クリアーをはじめ各種の着色ガラス等が使用でき
ることは言うまでもない。また、ガラスの組成は、ソー
ダ石灰ガラス、アルミノシリケートガラス、硼珪酸ガラ
ス等であるが、これらに限定されないことは、言うまで
もない。
As the substrate, other than a glass substrate for liquid crystal, a substrate such as a semiconductor wafer can be used. However, the present invention is not limited to this, and any substrate can be used for polishing a thin plate on one side. In the case of a glass substrate, the thickness of the glass plate is mainly about 0.3 to 3.0 mm, and is a normal plate glass, a so-called float plate glass, and it goes without saying that various colored glasses including clear can be used. No. The glass composition is soda lime glass, aluminosilicate glass, borosilicate glass, or the like, but it is needless to say that the composition is not limited to these.

【0018】塗布の方法は、スプレー法、ロール法等が
好ましいがこれに限定するものではない。さらに、塗布
後のバックパッドは、塗膜を乾燥・硬化するために、約
60〜100℃で10分程度乾燥する。
The coating method is preferably a spray method, a roll method or the like, but is not limited thereto. Furthermore, the back pad after application is dried at about 60 to 100 ° C. for about 10 minutes in order to dry and harden the coating film.

【0019】実施例1〜3 以下に述べる順序で行った。 基板としてのガラス(サイズ:450mm×500mm×
0.7mm)及びバックパッド(材質:連続気泡を有する
ウレタン樹脂、サイズ:ガラスより各辺の長さを40mm
ずつ大きくしたもの)を準備する。なお、バックパッド
の上部定盤と接着する面には、予め両面接着シートを貼
り付けておく。
Examples 1 to 3 were performed in the following order. Glass as substrate (size: 450mm x 500mm x
0.7mm) and back pad (Material: Urethane resin with open cells, Size: 40mm each side length from glass
Are prepared). Note that a double-sided adhesive sheet is attached in advance to the surface of the back pad that is to be bonded to the upper surface plate.

【0020】ウレタン樹脂塗料と硬化剤(主成分は酢
酸ブチル)を100:5に混合した混合液を、バックパ
ッドの接着剤層の塗布された以外の全表面に噴霧器を用
いて薄く塗布したのち、90℃の乾燥機中で10分間乾
燥硬化させ、ウレタン樹脂製バックパッド表面の気孔の
一部を塞ぐ。なお、テストサンプルとしては表面の塗装
量を種々変えた表1に記載の3種類とした。
A mixture of a urethane resin paint and a curing agent (mainly butyl acetate) mixed at a ratio of 100: 5 is applied thinly to all surfaces of the back pad except for the adhesive layer by using a sprayer. And dried and cured in a dryer at 90 ° C. for 10 minutes to block some of the pores on the surface of the urethane resin back pad. The test samples were three types shown in Table 1 in which the amount of coating on the surface was variously changed.

【0021】バックパッドの接着剤層を上にして、上
部定盤の下部にバックパッドを接着させる。 バックパッドの下面を水で湿潤したのち、上述のガラ
ス板をその部分に貼り付ける。
The back pad is adhered to the lower portion of the upper platen with the adhesive layer of the back pad facing upward. After the lower surface of the back pad is wetted with water, the above-mentioned glass plate is attached to the portion.

【0022】上部定盤を研磨盤の近傍まで下方へ移動
したのち、研磨盤に研磨液を供給しながら下部定盤を回
転(研磨盤も回転する)させる。なお、回転数は、15
0回/分で行った。
After the upper platen is moved downward to the vicinity of the polishing plate, the lower platen is rotated (the polishing plate also rotates) while supplying the polishing liquid to the polishing plate. The rotation speed is 15
Performed at 0 times / minute.

【0023】上部定盤をさらに下方へ移動させ、ガラ
ス板を研磨盤に加圧し10分間研磨する。なお、加圧圧
力は、90g/cm2で行った。 研磨が終了したら、上部定盤を上方へ解放し、研磨盤
の回転を停止したのち、ガラスサンプルをバックパッド
より外す。
The upper platen is moved further downward, and the glass plate is pressed against the polishing plate and polished for 10 minutes. The pressurizing pressure was 90 g / cm 2 . When the polishing is completed, the upper platen is released upward, the rotation of the polishing plate is stopped, and the glass sample is removed from the back pad.

【0024】なお、バックパッドは膨れが発生するま
で交換せずに上記研磨を連続して行った。結果、表1に
示す通り吸水率が20mg/cm2以下の実施例1〜3は、
耐久性が70時間以上と良好な結果を示した。
The above-mentioned polishing was continuously performed without replacing the back pad until swelling occurred. As a result, as shown in Table 1, Examples 1 to 3 having a water absorption of 20 mg / cm 2 or less
The durability was good at 70 hours or more.

【0025】なお、バックパッドの吸水率の測定は、以
下の方法で行った。バックパッドサンプルの塗装表面に
アルミニュウム製のリング(径:30mmφ、深さ:5m
m)を置き、そのリング内に5mlの水を充填し、5分
間放置した時の吸水量(mg)を測定した。なお、吸水率
は(吸水量(mg)÷リングの断面積(7.07cm2))
で求めた。
The water absorption of the back pad was measured by the following method. Aluminum ring (diameter: 30mmφ, depth: 5m) on the painted surface of the back pad sample
m) was placed, and the ring was filled with 5 ml of water, and the amount of water absorption (mg) when left for 5 minutes was measured. The water absorption is (water absorption (mg) ÷ cross-sectional area of the ring (7.07 cm 2 )).
I asked for it.

【0026】比較例1〜2 上記実施例1〜3と同様な方法で塗装及び耐久性の評価
を行った。結果、表1に示すように吸水率が20mg/cm
2以上の比較例1、2は耐久性が30時間以下と短く、
好ましいものではなかった。
Comparative Examples 1-2 Coating and durability were evaluated in the same manner as in Examples 1-3. As a result, as shown in Table 1, the water absorption was 20 mg / cm
The durability of Comparative Examples 1 and 2 of 2 or more was as short as 30 hours or less,
It was not preferred.

【0027】[0027]

【表1】 [Table 1]

【0028】[0028]

【発明の効果】本発明は、発泡弾性体のバックパッドの
表面を樹脂塗料等で塗装し、表面の気孔の一部を塞ぎ、
表面からの吸水率を制御することにより、長時間研磨し
ても吸水することがなく、発泡弾性体樹脂の加水分解に
よる劣化が極めて遅くなり、簡単な方法で基板の局部応
力解消による割れの減少、バックパッドの監視作業の軽
減、バックパッドの交換頻度の減少、コストダウン、研
磨稼働率の向上等に寄与できる顕著な効果を有する。
According to the present invention, the surface of the foamed elastic back pad is coated with a resin paint or the like to partially close the pores on the surface,
By controlling the water absorption from the surface, it does not absorb water even if it is polished for a long time, and the degradation of the foamed elastic resin due to hydrolysis becomes extremely slow. This has a remarkable effect that can contribute to reducing the work of monitoring the back pad, reducing the frequency of replacing the back pad, reducing the cost, improving the polishing operation rate, and the like.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 図1は本発明に用いることができる片面研磨
機の側面図である。
FIG. 1 is a side view of a single-side polishing machine that can be used in the present invention.

【符号の説明】[Explanation of symbols]

1 上部定盤 2 基板 3 バックパッド 4 下部定盤 5 研磨盤 DESCRIPTION OF SYMBOLS 1 Upper surface plate 2 Substrate 3 Back pad 4 Lower surface plate 5 Polishing disk

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】上部定盤の下面に連続気泡を有する発泡弾
性体のバックパッドを介して基板を取り付け、該上部定
盤と下方に設けた研磨盤を回転し、加圧しながら基板の
片面を研磨する方法に用いられるバックパッドにおい
て、表面からの吸水率を20mg/cm2以下としたことを
特徴とするバックパッド。
1. A substrate is mounted on the lower surface of an upper platen via a foamed elastic back pad having open cells, and the upper platen and a polishing plate provided below are rotated to press one surface of the substrate while pressing. A back pad used in a polishing method, wherein a water absorption from a surface is set to 20 mg / cm 2 or less.
【請求項2】上部定盤に装着前のバックパッドの表面を
樹脂塗料で薄く塗装し、表面の気孔の一部を塗料で塞
ぎ、表面からの吸水量を制御したことを特徴とする請求
項1記載のバックパッド。
2. The method according to claim 1, wherein the surface of the back pad before being attached to the upper surface plate is thinly coated with a resin paint, and pores on the surface are partially covered with the paint to control the amount of water absorption from the surface. 1. The back pad according to 1.
【請求項3】上部定盤の下面に連続気泡を有する発泡弾
性体のバックパッドを介して基板を取り付け、該上部定
盤で加圧しながら下方に設けた研磨盤に研磨液を供給し
ながら回転し、基板の片面を研磨する方法において、バ
ックパッドの表面を樹脂塗料で薄く塗装した後、乾燥・
硬化し、該バックパッド表面の気孔の一部を塞ぎ表面か
らの吸水率を制御した後、上部定盤の下面にバックパッ
ドを装着させてなることを特徴とするバックパッドの吸
水防止方法。
3. A substrate is mounted on the lower surface of an upper surface plate via a back pad made of foamed elastic material having open cells, and the upper surface plate is rotated while supplying polishing liquid to a lower polishing surface while applying pressure. In the method of polishing one side of the substrate, the surface of the back pad is thinly coated with a resin paint, and then dried and
A method of preventing water absorption of a back pad, comprising: curing, controlling a water absorption rate from a surface by closing a part of pores on the surface of the back pad, and then attaching the back pad to a lower surface of an upper surface plate.
【請求項4】上部定盤に装着前の塗装したバックパッド
の塗装面に金属製リングを載置し、該リング内に所定量
の水を充填し、所定時間経過後の吸水量を測定して、表
面からの吸水率を求めることにより所要の塗装量を定め
ることを特徴とする請求項3記載のバックパッドの吸水
防止方法。
4. A metal ring is placed on the painted surface of the painted back pad before being mounted on the upper surface plate, and the ring is filled with a predetermined amount of water, and the water absorption after a predetermined time has elapsed is measured. 4. The method according to claim 3, wherein the required amount of coating is determined by determining the water absorption from the surface.
JP31986597A 1997-11-20 1997-11-20 Back pad and water absorption prevention method therefor Pending JPH11151665A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31986597A JPH11151665A (en) 1997-11-20 1997-11-20 Back pad and water absorption prevention method therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31986597A JPH11151665A (en) 1997-11-20 1997-11-20 Back pad and water absorption prevention method therefor

Publications (1)

Publication Number Publication Date
JPH11151665A true JPH11151665A (en) 1999-06-08

Family

ID=18115107

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31986597A Pending JPH11151665A (en) 1997-11-20 1997-11-20 Back pad and water absorption prevention method therefor

Country Status (1)

Country Link
JP (1) JPH11151665A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001015864A1 (en) * 1999-08-31 2001-03-08 Rodel Holdings, Inc. Stacked polishing pad having sealed edge
JP2014069284A (en) * 2012-09-28 2014-04-21 Fujibo Holdings Inc Holding pad
WO2015046203A1 (en) * 2013-09-30 2015-04-02 富士紡ホールディングス株式会社 Holding pad

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001015864A1 (en) * 1999-08-31 2001-03-08 Rodel Holdings, Inc. Stacked polishing pad having sealed edge
US6620036B2 (en) 1999-08-31 2003-09-16 Rodel Holdings, Inc Stacked polishing pad having sealed edge
JP2014069284A (en) * 2012-09-28 2014-04-21 Fujibo Holdings Inc Holding pad
WO2015046203A1 (en) * 2013-09-30 2015-04-02 富士紡ホールディングス株式会社 Holding pad
CN105579195A (en) * 2013-09-30 2016-05-11 富士纺控股株式会社 Holding pad
JPWO2015046203A1 (en) * 2013-09-30 2017-03-09 富士紡ホールディングス株式会社 Holding pad
CN105579195B (en) * 2013-09-30 2018-06-15 富士纺控股株式会社 Keep pad

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