JP2002355754A - Method of manufacturing backing material for holding polished object - Google Patents

Method of manufacturing backing material for holding polished object

Info

Publication number
JP2002355754A
JP2002355754A JP2001165891A JP2001165891A JP2002355754A JP 2002355754 A JP2002355754 A JP 2002355754A JP 2001165891 A JP2001165891 A JP 2001165891A JP 2001165891 A JP2001165891 A JP 2001165891A JP 2002355754 A JP2002355754 A JP 2002355754A
Authority
JP
Japan
Prior art keywords
backing material
resin layer
polished
layer
adhesive resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001165891A
Other languages
Japanese (ja)
Other versions
JP4659273B2 (en
Inventor
Hiroyuki Yamada
博行 山田
Katsumasa Kawabata
克昌 川端
Naoya Maeda
直也 前田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Shinko Corp
Nitta DuPont Inc
Original Assignee
Nitto Shinko Corp
Rodel Nitta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Shinko Corp, Rodel Nitta Inc filed Critical Nitto Shinko Corp
Priority to JP2001165891A priority Critical patent/JP4659273B2/en
Publication of JP2002355754A publication Critical patent/JP2002355754A/en
Application granted granted Critical
Publication of JP4659273B2 publication Critical patent/JP4659273B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a method of manufacturing a backing material that can secure a flat backing face by preventing the bite of air between an attached body and the backing material. SOLUTION: This method of manufacturing the backing material for holding a polished object, having a base material 2, an elastic layer 3 laminated on the base material 2, and an adhesive resin layer 4 laminated on the elastic layer 3, includes a process of sticking a film 7 with micro unevenness with a surface roughness Ra of 0.4-4.0 μm, to the surface of the adhesive resin layer 4 before the adhesive resin layer 4 is completely hardened, and a process of separating the film 7 from the surface of the adhesive resin layer after the adhesive resin layer 4 is hardened.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、シリコン、ガリウ
ム砒素やインジウム燐などの半導体基板または半導体ウ
エハ、各種基板、ガラス、LCD、ディスクなどの表面
を研磨する際に、これらの被研磨物を保持しておくため
に使用するバッキング材の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing method for polishing a semiconductor substrate such as silicon, gallium arsenide, indium phosphide or the like, a semiconductor wafer, various substrates, glass, an LCD, a disk, etc., and holding these objects to be polished. The present invention relates to a method for manufacturing a backing material used for storage.

【0002】[0002]

【従来の技術】従来、半導体ウェーハ、半導体デバイス
の層間絶縁膜及びメタル配線、メモリー・ディスク、L
CD用ガラス等の精密平面研磨を行う際には、回転する
定盤に装着された人工皮革様の研磨布と、対向する位置
に置かれた回転可能な被研磨物保持プレートに下記に述
べるような種々の被研磨物の装置法により固定された被
研磨物との間に研磨砥粒を含む研磨液を供給して、被研
磨物及び研磨布を互いに摺動させることにより行われて
きた。
2. Description of the Related Art Conventionally, semiconductor wafers, interlayer insulating films and metal wiring of semiconductor devices, memory disks, L
When performing precision flat polishing of glass for CDs, etc., an artificial leather-like polishing cloth mounted on a rotating surface plate and a rotatable workpiece holding plate placed at an opposite position are described below. A polishing liquid containing abrasive grains is supplied between the polishing object and the object fixed by various apparatus methods, and the object and the polishing cloth are slid with each other.

【0003】従来技術による被研磨物の保持・固定法と
しては、例えば、以下の方法が用いられてきた。
For example, the following method has been used as a method for holding and fixing an object to be polished according to the prior art.

【0004】(1)金属やセラミックスで製作された被
研磨物保持プレートに加熱下で流延、塗布されたワック
スを介し、該ワックスの軟化点以下まで冷却することに
より被研磨物を固定する、いわゆるワックス・マウンテ
ィング法。
(1) An object to be polished is fixed by cooling it to a temperature lower than the softening point of the wax through a wax that has been cast and applied to a holding plate made of metal or ceramics under heating. The so-called wax mounting method.

【0005】(2)金属やセラミックスで製作された被
研磨物保持プレートに機械加工により直径0.5mm〜
数mmの吸引口をあけ、この保持プレートの裏面及び側
面から真空ポンプにより吸引することで保持プレート表
面に装着された被研磨物を固定する、いわゆるバキュー
ム・チャック法。
(2) A workpiece holding plate made of metal or ceramic is machined to a diameter of 0.5 mm or more.
A so-called vacuum chuck method in which a suction port of several mm is opened, and a workpiece to be polished mounted on the surface of the holding plate is fixed by suctioning from the back and side surfaces of the holding plate with a vacuum pump.

【0006】(3)人工皮革様の高分子発泡材料からな
るバッキング材を被研磨物保持プレートに装置し、該バ
ッキング材を水で濡らし発泡孔中の水が被研磨物を介し
て加えられる圧力により外部へ排出された時に生じる発
泡孔中の水の陰圧及び水自体の表面張力の複合により被
研磨物を保持プレート表面に固定する、いわゆるノーワ
ックス・マウンディング法。
(3) A backing material made of an artificial leather-like polymer foam material is mounted on a plate for holding an object to be polished, the backing material is wetted with water, and the pressure in which water in the foamed holes is applied through the object to be polished. A so-called no-wax mounting method in which the object to be polished is fixed to the surface of the holding plate by a combination of the negative pressure of water in the foamed pores and the surface tension of the water itself when the water is discharged outside.

【0007】しかしながら、これら種々の被研磨物保持
法には各々に特有の欠点も存在した。すなわち、(1)
ワックス・マウンティング法においては、被研磨物の研
磨終了後、被研磨物裏面に固定に用いたワックスが残留
し、その汚染を除去するために煩雑な洗浄操作を行う必
要があること、固定に用いるワックス自体に軟化点があ
ることから、研磨加工温度をその軟化点以上に上げるこ
とができないこと、ワックス中にゲル化物や外来粉塵が
含まれているとそれらの存在が研磨中に被研磨物表面の
ディンプルとして転写され研磨の仕上り状態を悪化させ
ること、さらに着脱の際の手間がかかること、などが挙
げられる。
[0007] However, these various methods for holding the object to be polished also have their own specific disadvantages. That is, (1)
In the wax mounting method, after completion of polishing of the object to be polished, the wax used for fixing remains on the back surface of the object to be polished, and it is necessary to perform a complicated cleaning operation to remove the contamination, which is used for fixing. Since the wax itself has a softening point, the polishing temperature cannot be raised above the softening point.If the wax contains gelled substances or foreign dust, the presence of these substances will cause the surface of the workpiece to be polished during polishing. And that the finished state of polishing is deteriorated by being transferred as dimples, and that it takes time and effort to attach and detach the dimples.

【0008】(2)従来のバキューム・チャック法につ
いては、機械加工により形成された吸引口付近で被研磨
物が吸引口側にたわみ、研磨加工後の被研磨物表面では
逆に研磨による表面の除去が不足であった突起点として
残り、研磨の仕上がり状態を悪化させること、研磨液が
加工中に被研磨物裏面と保持プレート間の間隙を通って
吸引口から真空ポンプ配管系中に吸い込まれ、ポンプ故
障や配管を腐食などを起こし易いことなどが挙げられ
る。
(2) In the conventional vacuum chuck method, the object to be polished bends toward the suction port near the suction port formed by machining, and the surface of the object to be polished after polishing is conversely polished. The removal is left as a projection point that was insufficient and deteriorates the finished state of polishing, and the polishing liquid is sucked into the vacuum pump piping system from the suction port through the gap between the back surface of the workpiece and the holding plate during processing. And failure of the pump or corrosion of the piping.

【0009】(3)ワックスを用いないで半導体ウエハ
をバッキング材に固着する方法は、下定盤上に研磨パッ
ドを貼り付けると共に上定盤下面にバッキング材および
テンプレートを固定し、該テンプレートに設けられたウ
エハ保持用リセスに半導体ウエハを配置し、上下定盤を
相対的に回転させると共に、研磨スラリーを研磨パッド
上に供給しながら半導体ウエハを研磨パッドに押圧する
ことで被研磨物の表面研磨を行うものである。
(3) A method of fixing a semiconductor wafer to a backing material without using wax is to attach a polishing pad on a lower surface plate, fix the backing material and the template on the lower surface of the upper surface plate, and provide the template. The semiconductor wafer is placed in the recess for holding the wafer, and the upper and lower platens are relatively rotated, and while the polishing slurry is supplied onto the polishing pad, the semiconductor wafer is pressed against the polishing pad to polish the surface of the object to be polished. Is what you do.

【0010】ここで使用するバッキング材は、例えば、
図8に示すように、基材12にコーティングしたウレタ
ン樹脂のDMF溶液層を水中にて凝固させ、温水中で洗
浄、熱風で乾燥を行って発泡層13を形成し、その表面
を平滑加工して形成されたものである。なお、図中、6
は被研磨物、14は基材12の裏面に貼着された感圧接
着剤層である。
The backing material used here is, for example,
As shown in FIG. 8, the DMF solution layer of the urethane resin coated on the base material 12 is coagulated in water, washed in warm water, dried with hot air to form a foam layer 13, and its surface is smoothed. It was formed. In the figure, 6
Denotes a polishing object, and 14 denotes a pressure-sensitive adhesive layer adhered to the back surface of the substrate 12.

【0011】しかし、このバッキング材11の保持面の
表面精度は、コーターの塗工精度、欠陥を反映している
ので、その保持面を平滑加工したバッキング材に比べ、
表面精度が悪く、またスジ等、表面欠陥が被研磨物に転
写するという欠点がある。
However, since the surface accuracy of the holding surface of the backing material 11 reflects the coating accuracy and the defects of the coater, the surface accuracy is lower than that of the backing material having the holding surface smoothed.
There is a defect that surface accuracy is poor and surface defects such as stripes are transferred to the object to be polished.

【0012】また、平滑加工した通常のバッキング材で
は、被研磨物に対する吸着力が弱いので、被研磨物がバ
ッキング材表面でずれるのを防止するためにテンプレー
トを使用することが必要である。
In addition, a smooth backed ordinary backing material has a weak adsorbing force on an object to be polished. Therefore, it is necessary to use a template to prevent the object to be polished from shifting on the surface of the backing material.

【0013】そこで、本発明者らは、上記発泡層13の
表面に、樹脂よりなる粘着性樹脂層を設けたバッキング
材を検討した。このバッキング材においては、樹脂層は
被研磨物を回転させない程度の粘着性を有しているの
で、被研磨物がバッキング材表面でずれるのを防止する
と共に、その表面は比較的平滑であるので、表面精度が
良く、またスジ等表面欠陥が被研磨物に転写することが
ない。
The present inventors have studied a backing material in which an adhesive resin layer made of a resin is provided on the surface of the foam layer 13. In this backing material, the resin layer has such adhesiveness that the object to be polished is not rotated, so that the object to be polished is prevented from shifting on the surface of the backing material, and the surface is relatively smooth. The surface accuracy is good, and no surface defects such as streaks are transferred to the object to be polished.

【0014】しかし、被着体をそのバッキング材表面に
貼り付けるときに、被着体とバッキング材との間に空気
を咬み込んで両者の界面のたわみが生じ、平らなバッキ
ング面が得られないという欠点がある。また、ガラス等
の被研磨物はバッキング材表面に密着しすぎて、マシン
によるハンドリング性が悪い上に、被着体をバッキング
材から剥がし難いという欠点もある。
However, when the adherend is attached to the surface of the backing material, air is trapped between the adherend and the backing material, and the interface between the adherend and the backing material is bent, so that a flat backing surface cannot be obtained. There is a disadvantage that. Further, the object to be polished, such as glass, is too closely adhered to the surface of the backing material, resulting in poor handleability by a machine, and also has the disadvantage that the adherend is difficult to peel off from the backing material.

【0015】[0015]

【発明が解決しようとする課題】本発明は上記の欠点を
解消するためになされたものであって、その目的とする
ところは、バッキング材の表面欠陥の被研磨物への転写
をなくし、被研磨物の表面精度を上げることができるバ
ッキング材の製造方法を提供することにある。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned drawbacks, and an object of the present invention is to eliminate the transfer of surface defects of a backing material to an object to be polished. An object of the present invention is to provide a method of manufacturing a backing material that can improve the surface accuracy of a polished object.

【0016】本発明の他の目的は、被研磨物に対する吸
着力を上げることでテンプレートの使用をなくすことが
できるバッキング材の製造方法を提供することにある。
Another object of the present invention is to provide a method of manufacturing a backing material which can eliminate the use of a template by increasing the attraction force to an object to be polished.

【0017】本発明のさらに他の目的は、被着体とバッ
キング材との間に空気の咬み込みを防いで平らなバッキ
ング面が得られるようにしたバッキング材の製造方法を
提供することにある。
Still another object of the present invention is to provide a method of manufacturing a backing material capable of preventing air from being trapped between an adherend and a backing material so as to obtain a flat backing surface. .

【0018】本発明のさらに他の目的は、ガラス等の被
研磨物がバッキング材表面に密着しすぎるということが
なくマシンによるハンドリング性が良い上に、被着体の
バッキング材表面からの剥離性も適度であるバッキング
材の製造方法を提供することにある。
Still another object of the present invention is to provide a method in which an object to be polished such as glass is not excessively adhered to the surface of the backing material, the handleability by the machine is good, and the releasability of the object from the surface of the backing material. It is another object of the present invention to provide a method of manufacturing a backing material which is appropriate.

【0019】[0019]

【課題を解決するための手段】本発明の被研磨物を保持
するためのバッキング材の製造方法は、基材と、該基材
上に積層された弾性層と、該弾性層上に積層された粘着
性樹脂層と、を有する被研磨物を保持するためのバッキ
ング材の製造方法であって、該粘着性樹脂層が完全に硬
化する前に、その樹脂層の表面に、表面粗さRaが0.
4〜4.0μmの微少な凹凸を有するフィルムを貼り付
ける工程、および該粘着性樹脂層が硬化した後、該フィ
ルムを粘着性樹脂層表面から剥離する工程、を包含し、
そのことにより上記目的が達成される。
A method of manufacturing a backing material for holding an object to be polished according to the present invention comprises a substrate, an elastic layer laminated on the substrate, and an elastic layer laminated on the elastic layer. A method of manufacturing a backing material for holding an object to be polished having a surface roughness Ra on the surface of the resin layer before the adhesive resin layer is completely cured. Is 0.
Affixing a film having fine irregularities of 4 to 4.0 μm, and a step of peeling the film from the surface of the adhesive resin layer after the adhesive resin layer is cured,
Thereby, the above object is achieved.

【0020】一つの実施態様では、前記基材表面に積層
された弾性層の表面をバフして一定の表面粗さとする工
程、を包含する。
In one embodiment, the method includes a step of buffing the surface of the elastic layer laminated on the surface of the base material to have a constant surface roughness.

【0021】一つの実施態様では、前記弾性層はポリウ
レタン樹脂からなり、その圧縮率が5〜60%であり、
前記粘着性樹脂層は熱硬化性樹脂又は熱可塑性樹脂から
なり、その硬度が48〜88(JIS A硬度)であ
り、その圧縮率が3〜52%である。
In one embodiment, the elastic layer is made of a polyurethane resin, and has a compression ratio of 5 to 60%;
The adhesive resin layer is made of a thermosetting resin or a thermoplastic resin, has a hardness of 48 to 88 (JIS A hardness), and has a compression ratio of 3 to 52%.

【0022】本発明の作用は次の通りである。The operation of the present invention is as follows.

【0023】従来のバッキング材表面は、製造工程およ
び塗工精度を反映して、その厚み精度が悪い。そして、
このバッキング材の保持面の表面欠陥が被研磨物に転写
する場合が多い。
The conventional backing material surface has poor thickness accuracy, reflecting the manufacturing process and coating accuracy. And
In many cases, the surface defect of the holding surface of the backing material is transferred to the object to be polished.

【0024】そこで、本発明においては、バッキング材
の粘着性樹脂層表面を平滑加工し、その後、保持面に熱
可塑性樹脂又は熱硬化性樹脂をラミネートし樹脂層を形
成する。この樹脂層は被研磨物を回転させない程度の粘
着性を有しているので、スラリーが被研磨物の裏側へ回
り込んで保持力が低下するのを防止できると共に、被研
磨物に傷が付くのを防止することができる。
Therefore, in the present invention, the surface of the adhesive resin layer of the backing material is smoothed, and then a thermoplastic resin or a thermosetting resin is laminated on the holding surface to form a resin layer. Since this resin layer has such an adhesive property that the object to be polished is not rotated, it is possible to prevent the slurry from sneaking to the back side of the object to be polished and to decrease the holding force, and to damage the object to be polished. Can be prevented.

【0025】さらに、本発明のバッキング材の粘着性樹
脂層表面に、表面粗さRaが0.4〜4.0μmの微少
な凹凸を設けることにより、被研磨物に対する吸着度合
いをコントロールすることができると共に、バッキング
材に被研磨物を貼着する際に、凹凸を通してエアを外部
へ逃がすことができ、被研磨物と粘着性樹脂層との間に
発生するエア咬みを防止することができる。
Further, by providing fine irregularities having a surface roughness Ra of 0.4 to 4.0 μm on the surface of the adhesive resin layer of the backing material of the present invention, it is possible to control the degree of adsorption to the object to be polished. In addition, when the object to be polished is adhered to the backing material, the air can escape to the outside through the unevenness, and the air bite generated between the object to be polished and the adhesive resin layer can be prevented.

【0026】本発明の製造方法によれば、表面粗さRa
が0.4〜4.0μmの微少な凹凸を有するフィルムを
樹脂層表面に貼り付け、樹脂層が硬化した後にフィルム
を剥離することにより、樹脂層表面に凹凸を転写できる
ので、製造が簡単であり、また均一で微細な凹凸をバッ
キング材表面に形成できる。
According to the manufacturing method of the present invention, the surface roughness Ra
Can be transferred to the surface of the resin layer by attaching a film having fine irregularities of 0.4 to 4.0 μm to the surface of the resin layer and peeling the film after the resin layer is cured, so that the production is simple. In addition, uniform and fine irregularities can be formed on the backing material surface.

【0027】[0027]

【発明の実施の形態】以下本発明を詳細に説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail.

【0028】本発明の製造方法によって得られるバッキ
ング材1は、図1〜図3に示すように、基材2と、該基
材2上に積層された弾性を有する弾性層3と、該弾性層
3上に積層された粘着性樹脂層4と、必要に応じて該基
材2の裏面に積層された感圧接着剤層5とを有する。使
用されるまでは、この感圧接着剤層5の裏面にさらに離
型シートが剥離可能に貼着される。
As shown in FIGS. 1 to 3, the backing material 1 obtained by the manufacturing method of the present invention comprises a base material 2, an elastic layer 3 having elasticity laminated on the base material 2, It has an adhesive resin layer 4 laminated on the layer 3 and, if necessary, a pressure-sensitive adhesive layer 5 laminated on the back surface of the substrate 2. Until used, a release sheet is further releasably attached to the back surface of the pressure-sensitive adhesive layer 5.

【0029】上記基材2としては、ポリエステルシー
ト、ポリ塩化ビニルシート、ナイロンシート、ポリイミ
ドシート等を使用することができる。
As the substrate 2, a polyester sheet, a polyvinyl chloride sheet, a nylon sheet, a polyimide sheet or the like can be used.

【0030】また、上記弾性層3としては、従来よりバ
ッキング材1の発泡層を形成するものが使用でき、例え
ば、基材2にウレタン樹脂のDMF溶液をコーティング
し、その層を湿式凝固させ、温水中で洗浄、熱風で乾燥
を行って形成することができる。この弾性層3の表面は
平滑加工され、弾性層3の表面には多数の独立発泡の孔
部が形成されている。弾性層3の圧縮率は5〜60%
(JIS L1096にて測定)が好ましい。
As the elastic layer 3, a layer which forms a foamed layer of the backing material 1 can be used conventionally. For example, a base material 2 is coated with a DMF solution of a urethane resin, and the layer is wet-solidified. It can be formed by washing in hot water and drying with hot air. The surface of the elastic layer 3 is smoothed, and a large number of independently foamed holes are formed on the surface of the elastic layer 3. The compression ratio of the elastic layer 3 is 5 to 60%.
(Measured by JIS L1096) is preferred.

【0031】弾性層3の表面に積層された粘着性樹脂層
4は、アクリル樹脂、ポリウレタン、ポリエステル、エ
ポキシ樹脂、ナイロン、ポリ塩化ビニル等の熱硬化性樹
脂又は熱可塑性樹脂からなり、表面が平滑であり、かつ
被研磨物に対して粘着性を有しているものである。該樹
脂層4の硬度は48〜88が好ましく(JIS−A,J
ISK6301 5.2(A形)にて測定)、その圧縮
率は3〜52%が好ましい。
The adhesive resin layer 4 laminated on the surface of the elastic layer 3 is made of a thermosetting resin or a thermoplastic resin such as acrylic resin, polyurethane, polyester, epoxy resin, nylon, or polyvinyl chloride, and has a smooth surface. And has adhesiveness to the object to be polished. The hardness of the resin layer 4 is preferably 48 to 88 (JIS-A, J
ISK6301 (measured by 5.2 (A type)), and the compression ratio is preferably 3 to 52%.

【0032】この粘着性樹脂層4の表面に、表面粗さR
aが0.4〜4.0μmの微少な凹凸が全面に亘って形
成されている。この微少な凹凸は、粘着性樹脂層4の表
面にランダムに(方向性がなく)形成されている。さら
に好ましい表面粗さRaの範囲は、0.5〜2.0(U
70〜DM42)μmである。微少な凹凸のRaが0.
4μm未満であると、空気の抜けるる速度が遅く被着体
とバッキング材との間に空気の咬み込む場合があり、ま
たマシンによるハンドリング性が悪く、4.0μmを超
えると表面精度が低下する。
The surface of the adhesive resin layer 4 has a surface roughness R
The fine irregularities having a of 0.4 to 4.0 μm are formed over the entire surface. These minute irregularities are formed randomly (without directionality) on the surface of the adhesive resin layer 4. A more preferable range of the surface roughness Ra is 0.5 to 2.0 (U
70-DM42) μm. Ra of minute irregularities is 0.
If it is less than 4 μm, the air escape speed is low and air may bite between the adherend and the backing material, and the handling property by the machine is poor. If it exceeds 4.0 μm, the surface accuracy is reduced. .

【0033】バッキング材1は、例えば、以下のように
して製造することができる。
The backing material 1 can be manufactured, for example, as follows.

【0034】基材2表面に積層された弾性層3の表面を
バフして一定の表面粗さ(凹凸)とし、次に、この弾性
層3の表面に熱硬化性のウレタン樹脂をコーティングす
る。次に、この樹脂4が完全に硬化してしまう(反応が
完結する)前に、図3に示すように、微少な凹凸を有す
るフィルム7を、熱ロールにより圧着ラミネートし、バ
ッキング材1表面とウレタン樹脂層4を接着させた後
に、該フィルムを樹脂層4表面から剥がす。すると、フ
ィルム自体の表面粗さが、バッキング材1の樹脂層4の
表面に転写され、表層の無発泡ウレタン層に、ある一定
の粗さをもった自己吸着タイプバッキング材1が得られ
る。
The surface of the elastic layer 3 laminated on the surface of the substrate 2 is buffed to have a constant surface roughness (irregularity), and then the surface of the elastic layer 3 is coated with a thermosetting urethane resin. Next, before this resin 4 is completely cured (the reaction is completed), as shown in FIG. 3, a film 7 having fine irregularities is pressure-bonded and laminated by a hot roll, and the surface of the backing material 1 is After bonding the urethane resin layer 4, the film is peeled off from the surface of the resin layer 4. Then, the surface roughness of the film itself is transferred to the surface of the resin layer 4 of the backing material 1, and the self-adsorption type backing material 1 having a certain roughness is obtained on the surface non-foamed urethane layer.

【0035】このような製法でバッキング材1を作製す
ることにより、フィルム7の表面粗さをコントロールす
ることで、バッキング材1の樹脂層4の表面粗さをコン
トロールすることができる。
By producing the backing material 1 by such a manufacturing method, the surface roughness of the resin layer 4 of the backing material 1 can be controlled by controlling the surface roughness of the film 7.

【0036】このバッキング材1を用いて、半導体ウエ
ハ等の被研磨物を研磨するには、被研磨物の被加工面を
下側にしてバッキング材1の樹脂層4下面に水吸着さ
せ、その保持状態で保持装置を下降させ、下定盤上の研
磨パッド面に所定の圧力で加圧して定盤を回転させ、ノ
ズルからスラリーを供給し、また被研磨物を保持した保
持盤を回転させて被研磨物の研磨面を研磨する。
In order to polish an object to be polished such as a semiconductor wafer using the backing material 1, water is adsorbed to the lower surface of the resin layer 4 of the backing material 1 with the surface to be polished facing down. Lower the holding device in the holding state, press the polishing pad surface on the lower platen with a predetermined pressure to rotate the platen, supply the slurry from the nozzle, and rotate the holding plate holding the object to be polished. Polish the polishing surface of the object to be polished.

【0037】バッキング材1は、その表面に粘着性樹脂
層4が形成されていることにより、半導体ウエハ等の被
研磨物を粘着保持し、研磨時の横ずれを防止し、また被
研磨物の裏面に研磨スラリー等が回り込むのを防止する
ことができる。
The backing material 1 has an adhesive resin layer 4 formed on its surface, thereby holding an object to be polished such as a semiconductor wafer in an adhesive state, preventing lateral displacement during polishing, and a back surface of the object to be polished. It is possible to prevent the polishing slurry and the like from flowing around.

【0038】また、自己粘着性の樹脂層4の裏面に弾性
層3が形成されていることにより、研磨屑等が被研磨物
と樹脂層4との間に介在した場合でもその部分が変形す
ることで被研磨物が傷つくことを防止することができ
る。
Further, since the elastic layer 3 is formed on the back surface of the self-adhesive resin layer 4, even if polishing dusts and the like are interposed between the object to be polished and the resin layer 4, the portion is deformed. This can prevent the object to be polished from being damaged.

【0039】[0039]

【実施例】はじめに、本実施例で使用した吸着力の測定
方法を以下に示す。 1.吸着力測定方法 垂直及び水平方向についての、ドライ又はウエット状態
で、吸着力を連続5回及び20回測定した。 1.1 垂直方向 図4に示すように、面精度のある円柱状ガラス(50m
m径)20をケプラーワイヤ21で吊り下げ、定盤22
に固定されたバッキング材1(75mm径)にそのガラ
ス20を荷重をかけて吸着させる。加圧条件は、次の通
りとした。面圧:150g/cm2、時間10秒、水量
10ml。
EXAMPLES First, the method of measuring the attraction force used in this example will be described below. 1. Adsorption force measurement method Adsorption force was measured 5 times and 20 times continuously in a dry or wet state in the vertical and horizontal directions. 1.1 Vertical direction As shown in FIG. 4, a cylindrical glass (50 m
m diameter) 20 is suspended by a Kepler wire 21,
The glass 20 is adsorbed by applying a load to the backing material 1 (diameter: 75 mm) fixed to the substrate. Pressing conditions were as follows. Surface pressure: 150 g / cm 2 , time 10 seconds, water volume 10 ml.

【0040】その後、一定速度で上方へ引っ張り(引張
速度:200mm/min)、ガラス20がバッキング
材1から剥離する際の剥離強度をオートグラフ23で測
定する。
Thereafter, the glass 20 is pulled upward at a constant speed (tensile speed: 200 mm / min), and the peel strength when the glass 20 peels off the backing material 1 is measured by the autograph 23.

【0041】なお、ウエット状態の測定では、バッキン
グ表面に純水を滴下後、バッキング材1表面をワイプし
て表面の水をぬぐい取り、その後、ガラス20を吸着さ
せた。 1.2 水平荷重 図5に示すように、所定荷重をかけて、定盤に固定され
たバッキング材1にガラス20を吸着させる。その後、
荷重をかけた状態でガラス20を水平方向へ引っ張り、
ガラス20が動き始める時の強度をオートグラフ23で
測定する。
In the measurement of the wet state, after pure water was dropped on the backing surface, the surface of the backing material 1 was wiped off to remove the water on the surface, and then the glass 20 was adsorbed. 1.2 Horizontal Load As shown in FIG. 5, a predetermined load is applied to cause the glass 20 to be adsorbed to the backing material 1 fixed to the surface plate. afterwards,
With the load applied, pull the glass 20 in the horizontal direction,
The intensity at which the glass 20 starts to move is measured by the autograph 23.

【0042】ウエット状態については、垂直方向測定と
同様にガラス表面に純水を滴下した後、その表面をワイ
プした。加圧条件、引張条件は垂直荷重の場合と同条件
とした。 2.樹脂層表面の凹凸(表面粗さRa)の測定 測定器として、(株)東京精密社製SURFCOMを使
用し、以下の条件で実施した。 測定端子:R5μmの90°円錐状ダイヤモンド端子 測定長さ:12.5mm 測定速度:0.3mm/秒 測定荷重:0.4mN(0.04gf) (実施例1)ポリエステルフィルム表面にポリウレタン
樹脂の発泡層(厚み30μm)を形成し、この発泡層の
表面をバフ(表面平滑加工)して一定の表面粗さ(凹
凸)とした。次に、この発泡層の表面に熱硬化性のウレ
タン樹脂をコーティングした。その樹脂が完全に硬化し
てしまう前に、表面粗さRaが0.3(U70)μmの
凹凸を多数有するフィルム(セパレーター)を、熱ロー
ルにより圧着し、樹脂層を硬化させた後に、該フィルム
を樹脂層表面から剥がして、バッキング材を得た。
With respect to the wet state, pure water was dropped on the glass surface in the same manner as in the vertical direction measurement, and the surface was wiped. Pressing conditions and tensile conditions were the same as in the case of vertical load. 2. Measurement of Roughness (Surface Roughness) of Resin Layer Surface The measurement was performed under the following conditions using SURFCOM manufactured by Tokyo Seimitsu Co., Ltd. as a measuring device. Measurement terminal: R5 μm 90 ° conical diamond terminal Measurement length: 12.5 mm Measurement speed: 0.3 mm / sec Measurement load: 0.4 mN (0.04 gf) (Example 1) Foaming of polyurethane resin on polyester film surface A layer (thickness: 30 μm) was formed, and the surface of the foam layer was buffed (surface smoothing) to have a constant surface roughness (irregularities). Next, the surface of the foam layer was coated with a thermosetting urethane resin. Before the resin is completely cured, a film (separator) having a large number of irregularities having a surface roughness Ra of 0.3 (U70) μm is pressed with a hot roll to cure the resin layer. The film was peeled off from the surface of the resin layer to obtain a backing material.

【0043】得られたバッキング材の樹脂層表面の凹凸
を測定したところ、0.6(U70)μmであった。
When the unevenness of the resin layer surface of the obtained backing material was measured, it was 0.6 (U70) μm.

【0044】バッキング材の垂直及び水平方向について
のドライ又はウエット状態で吸着力を、連続5回及び2
0回測定した結果を図6〜図7に示す。 (比較例1)表面粗さRaが0.30μmの凹凸を多数
有するフィルム(セパレーター)を使用したこと以外
は、実施例1と同様にしてバッキング材を得た。
In the dry or wet state of the backing material in the vertical and horizontal directions, the adsorbing force was continuously measured 5 times and 2 times.
The results of zero measurements are shown in FIGS. (Comparative Example 1) A backing material was obtained in the same manner as in Example 1 except that a film (separator) having many irregularities having a surface roughness Ra of 0.30 µm was used.

【0045】得られたバッキング材の樹脂層表面の凹凸
を測定したところ、0.30μmであった。
The unevenness of the resin layer surface of the obtained backing material was measured and found to be 0.30 μm.

【0046】バッキング材の垂直及び水平方向について
のドライ又はウエット状態で吸着力を、連続5回及び2
0回測定した結果を図6〜図7示す。
In the dry or wet state of the backing material in the vertical and horizontal directions, the adsorbing force was continuously measured 5 times and 2 times.
6 and 7 show the results of the measurement performed 0 times.

【0047】図6−7から以下のことがわかる。The following can be seen from FIGS.

【0048】樹脂層の表面微少凹凸処理品(実施例1)
は、表面未処理品(比較例1)より、垂直方向の吸着力
は低減した。また、水平方向の吸着力は、若干の減少は
あるが、両者ほぼ同等レベルであった。
[0048] Product with minute surface irregularities on resin layer (Example 1)
Has a lower adsorption force in the vertical direction than the surface-untreated product (Comparative Example 1). Further, the suction force in the horizontal direction was almost the same level, although there was a slight decrease.

【0049】エア巻きに関しては、実際にサンプルをフ
ラットな定盤に貼り込み、ガラスを付けてみたところ、
若干のエア残りは見られるが、表面未処理品と比較した
場合、付加時のエアの流動性が生じ、明らかにエアの逃
げは改善されていることがわかった。
Regarding the air winding, the sample was actually pasted on a flat surface plate and glass was attached.
Although a slight air residue is observed, when compared with the untreated surface product, it was found that air flow at the time of addition occurred and air escape was clearly improved.

【0050】[0050]

【発明の効果】本発明によれば、フィルム(セパレータ
ー)表面の凹凸を樹脂層表面に転写することによってバ
ッキング材表面に微少な凹凸を形成できるので、製造が
簡単であり、また均一で微細な凹凸をバッキング材表面
に形成できる。
According to the present invention, fine irregularities can be formed on the surface of the backing material by transferring the irregularities on the surface of the film (separator) to the surface of the resin layer, so that the production is simple and uniform and fine. Asperities can be formed on the backing material surface.

【0051】本発明によって得られたバッキング材は、
バッキング材の基材表面をバフした後に、その表層に樹
脂をラミネートすることにより、厚み精度が向上し、ま
たそれにより被研磨物(ガラス等)に転写筋が解消さ
れ、平坦性、うねりが向上する。よって、バッキング材
の表面欠陥の被研磨物への転写をなくし、被研磨物の表
面精度を上げることができる。また、被研磨物に対する
吸着力を上げることでテンプレートの使用をなくすこと
ができる。
The backing material obtained according to the present invention comprises:
After buffing the base material surface of the backing material, laminating a resin on the surface layer improves thickness accuracy, and thereby eliminates transfer streaks on the workpiece (glass etc.), improving flatness and undulation I do. Therefore, transfer of surface defects of the backing material to the object to be polished can be eliminated, and the surface accuracy of the object to be polished can be improved. Further, the use of the template can be eliminated by increasing the attraction force to the object to be polished.

【0052】さらに、弾性層の表面に粘着性樹脂層が積
層されているので、次のような効果がある。 (1)撥水効果:粘着性樹脂層が液体の浸入に対して遮
断層としての役割を果たし、バッキング材内部へのスラ
リーの浸入はなくなる。これにより、従来のバッキング
材で問題となってきた基板裏面焼けの問題や、バッキン
グ材内スラリーの湿潤ムラ(バッキング材中のスラリー
へのキャリアヘッド回転運動による遠心、向心力作用)
による研磨後の基板研磨ムラが解消される。 (2)表面平滑性 バフにより厚さ精度の優れた弾性層上に、面平滑性の良
い樹脂層(トップコート層)を貼り合わせることで、基
板との密着作用又は極僅かに存在する水との分子間力に
よる作用によって、従来のバッキング材に比べ、はるか
に強い吸着力(垂直方向、剪断方向)が発生する。この
保持性能により、ワックス方式同様、研磨中の基板のズ
レや回転等が発生しないため、研磨後基板のフラットネ
ス(特に、エッジ部のフチダレの抑止)が優れる利点が
ある。
Further, since the adhesive resin layer is laminated on the surface of the elastic layer, the following effects can be obtained. (1) Water-repellent effect: The adhesive resin layer plays a role as a blocking layer against liquid intrusion, so that the slurry does not enter the inside of the backing material. As a result, the problem of scorching of the back surface of the substrate, which has been a problem with the conventional backing material, and uneven wetting of the slurry in the backing material (centrifugal and centripetal effects due to the rotational movement of the carrier head on the slurry in the backing material)
Substrate unevenness after polishing by polishing is eliminated. (2) Surface smoothness By laminating a resin layer (top coat layer) with good surface smoothness on the elastic layer with excellent thickness accuracy by buffing, By the action of the intermolecular force, a much stronger adsorption force (vertical direction, shear direction) is generated as compared with the conventional backing material. Since the holding performance does not cause displacement or rotation of the substrate during polishing as in the case of the wax method, there is an advantage that the flatness of the substrate after polishing (particularly, suppression of edge dripping at the edge portion) is excellent.

【0053】さらに、バッキング材の樹脂層に微少な凹
凸を設けたので、以下の効果がある。 (3)基板/バッキング材間のエア咬みを軽減させる。
Further, since the resin layer of the backing material has minute irregularities, the following effects are obtained. (3) Air bite between the substrate and the backing material is reduced.

【0054】表面処理を行っていないトップコート層を
有するバッキング材では、上下方向や横方向に対するエ
アの逃げが起こらないことから、エア咬みによる研磨ム
ラが発生する可能性があるが、本発明では、表面に微少
な凹凸を形成したため、吸着力とエア咬みレベルのバラ
ンスがとれるようになった。
In the case of a backing material having a topcoat layer that has not been subjected to surface treatment, air does not escape in the vertical direction or the horizontal direction. Since fine irregularities were formed on the surface, the suction force and the air bite level could be balanced.

【0055】表面微少凹凸によりガラスの脱着性を向上
させ、従来のように吸着力が強すぎて吸着時の作業性を
低減させることがなくなった。
The desorption of the glass is improved by the fine irregularities on the surface, and the adsorbing power is too strong as in the prior art, so that the workability at the time of adsorbing is not reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】バッキング材の一実施例の要部断面図である。FIG. 1 is a sectional view of a main part of an embodiment of a backing material.

【図2】図1に示すバッキング材の製造工程を示す説明
図である。
FIG. 2 is an explanatory view showing a manufacturing process of the backing material shown in FIG.

【図3】図1に示すバッキング材の拡大断面図である。FIG. 3 is an enlarged sectional view of the backing material shown in FIG.

【図4】垂直方向の吸着力の測定方法を示す説明図であ
る。
FIG. 4 is an explanatory view showing a method of measuring a suction force in a vertical direction.

【図5】水平方向の吸着力の測定方法を示す説明図であ
る。
FIG. 5 is an explanatory diagram showing a method of measuring a suction force in a horizontal direction.

【図6】垂直方向の吸着力の測定結果を示すグラフであ
る。
FIG. 6 is a graph showing a measurement result of a suction force in a vertical direction.

【図7】水平方向の吸着力の測定結果を示すグラフであ
る。
FIG. 7 is a graph showing a measurement result of a suction force in a horizontal direction.

【図8】従来のバッキング材の要部断面図である。FIG. 8 is a sectional view of a main part of a conventional backing material.

【符号の説明】[Explanation of symbols]

1 バッキング材 2 基材 3 弾性層 4 粘着性樹脂層 5 感圧接着剤層 DESCRIPTION OF SYMBOLS 1 Backing material 2 Substrate 3 Elastic layer 4 Adhesive resin layer 5 Pressure-sensitive adhesive layer

フロントページの続き (72)発明者 川端 克昌 奈良県大和郡山市池沢町172 ロデール・ ニッタ株式会社奈良工場内 (72)発明者 前田 直也 奈良県大和郡山市池沢町172 ロデール・ ニッタ株式会社奈良工場内 Fターム(参考) 3C058 AB04 CA01 CA06 CB01 CB02 CB05 CB06 DA17 Continued on the front page (72) Inventor Katsumasa Kawabata 172 Ikezawa-cho, Yamatokoriyama-shi, Nara Pref.Rodale Nita Co., Ltd. (72) Inventor Naoya Maeda 172 Ikezawa-cho, Yamatokoriyama-shi, Nara Pref. F term (reference) 3C058 AB04 CA01 CA06 CB01 CB02 CB05 CB06 DA17

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 基材と、該基材上に積層された弾性層
と、該弾性層上に積層された粘着性樹脂層と、を有する
被研磨物を保持するためのバッキング材の製造方法であ
って、 該粘着性樹脂層が完全に硬化する前に、その樹脂層の表
面に、表面粗さRaが0.4〜4.0μmの微少な凹凸
を有するフィルムを貼り付ける工程、および該粘着性樹
脂層が硬化した後、該フィルムを粘着性樹脂層表面から
剥離する工程、を包含するバッキング材の製造方法。
1. A method of manufacturing a backing material for holding an object to be polished having a substrate, an elastic layer laminated on the substrate, and an adhesive resin layer laminated on the elastic layer. Before the adhesive resin layer is completely cured, a step of attaching a film having fine irregularities with a surface roughness Ra of 0.4 to 4.0 μm to the surface of the resin layer, and A step of peeling the film from the surface of the adhesive resin layer after the adhesive resin layer is cured.
【請求項2】 前記基材表面に積層された弾性層の表面
をバフして一定の表面粗さとする工程、を包含する請求
項1に記載のバッキング材の製造方法。
2. The method for producing a backing material according to claim 1, further comprising the step of buffing the surface of the elastic layer laminated on the surface of the base material to have a constant surface roughness.
JP2001165891A 2001-05-31 2001-05-31 Manufacturing method of backing material for holding workpiece Expired - Lifetime JP4659273B2 (en)

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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001165891A JP4659273B2 (en) 2001-05-31 2001-05-31 Manufacturing method of backing material for holding workpiece

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Publication Number Publication Date
JP2002355754A true JP2002355754A (en) 2002-12-10
JP4659273B2 JP4659273B2 (en) 2011-03-30

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KR100828627B1 (en) 2006-07-20 2008-05-09 대원화성 주식회사 r preparing polyurethane pad grasping an object for polishing
JP2008119861A (en) * 2006-11-09 2008-05-29 Fujibo Holdings Inc Surface flattening method of polyurethane sheet for holding pad
JP2009088456A (en) * 2007-10-03 2009-04-23 Toray Ind Inc Backing material, holding member for workpiece to be polished, method for polishing semiconductor using holding member, and semiconductor wafer
JP2010094805A (en) * 2010-02-01 2010-04-30 Fujibo Holdings Inc Polishing method
JP2011020189A (en) * 2009-07-14 2011-02-03 Nitta Haas Inc Method for manufacturing workpiece holder, and workpiece holder
JP2011073093A (en) * 2009-09-30 2011-04-14 Fujibo Holdings Inc Sheet-like polishing member
US7927452B2 (en) 2005-07-15 2011-04-19 Toyo Tire & Rubber Co., Ltd. Layered sheets and processes for producing the same
JP2011156634A (en) * 2010-02-03 2011-08-18 Nitta Haas Inc Workpiece holding member
JP2011156633A (en) * 2010-02-03 2011-08-18 Nitta Haas Inc Workpiece holding member
JP2011224703A (en) * 2010-04-19 2011-11-10 Teijin Cordley Ltd Method of manufacturing material for suction pad
US8167690B2 (en) 2006-09-08 2012-05-01 Toyo Tire & Rubber Co., Ltd. Polishing pad
US8257153B2 (en) 2007-01-15 2012-09-04 Toyo Tire & Rubber Co., Ltd. Polishing pad and a method for manufacturing the same
CN103128618A (en) * 2011-11-21 2013-06-05 株式会社东洋质量第一 A glass grinding method and a laminated board used in the method
US8476328B2 (en) 2008-03-12 2013-07-02 Toyo Tire & Rubber Co., Ltd Polishing pad
JP2013139082A (en) * 2013-04-19 2013-07-18 Fujibo Holdings Inc Holding pad
JP2014097554A (en) * 2012-11-15 2014-05-29 Fujibo Holdings Inc Holding pad and method for manufacturing the same
US9126303B2 (en) 2005-08-30 2015-09-08 Toyo Tire & Rubber Co., Ltd. Method for production of a laminate polishing pad
JP2019058984A (en) * 2017-09-27 2019-04-18 富士紡ホールディングス株式会社 Laminate used for manufacturing holding pad and method for manufacturing the same

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JPH0661202A (en) * 1991-10-28 1994-03-04 Shin Etsu Chem Co Ltd Method of holding semiconductor wafer
JPH0699516A (en) * 1992-09-22 1994-04-12 Ube Nitto Kasei Co Ltd Hollow sheet made of thermoplastic resin
JPH08203849A (en) * 1995-01-30 1996-08-09 Rodel Nitta Kk Wafer retention member for polishing and method for fitting wafer retention member to surface plate
JP2004510335A (en) * 2000-09-29 2004-04-02 インフィネオン テクノロジース エスシー300 ゲゼルシャフト ミット ベシュレンクテル ハフツング ウント コンパニー コマンディートゲゼルシャフト Equipment for polishing disk-shaped objects
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7927452B2 (en) 2005-07-15 2011-04-19 Toyo Tire & Rubber Co., Ltd. Layered sheets and processes for producing the same
US8318298B2 (en) 2005-07-15 2012-11-27 Toyo Tire & Rubber Co., Ltd. Layered sheets and processes for producing the same
US9126303B2 (en) 2005-08-30 2015-09-08 Toyo Tire & Rubber Co., Ltd. Method for production of a laminate polishing pad
KR100828627B1 (en) 2006-07-20 2008-05-09 대원화성 주식회사 r preparing polyurethane pad grasping an object for polishing
US8167690B2 (en) 2006-09-08 2012-05-01 Toyo Tire & Rubber Co., Ltd. Polishing pad
JP2008119861A (en) * 2006-11-09 2008-05-29 Fujibo Holdings Inc Surface flattening method of polyurethane sheet for holding pad
US8257153B2 (en) 2007-01-15 2012-09-04 Toyo Tire & Rubber Co., Ltd. Polishing pad and a method for manufacturing the same
US8602846B2 (en) 2007-01-15 2013-12-10 Toyo Tire & Rubber Co., Ltd. Polishing pad and a method for manufacturing the same
JP2009088456A (en) * 2007-10-03 2009-04-23 Toray Ind Inc Backing material, holding member for workpiece to be polished, method for polishing semiconductor using holding member, and semiconductor wafer
US8476328B2 (en) 2008-03-12 2013-07-02 Toyo Tire & Rubber Co., Ltd Polishing pad
JP2011020189A (en) * 2009-07-14 2011-02-03 Nitta Haas Inc Method for manufacturing workpiece holder, and workpiece holder
JP2011073093A (en) * 2009-09-30 2011-04-14 Fujibo Holdings Inc Sheet-like polishing member
JP2010094805A (en) * 2010-02-01 2010-04-30 Fujibo Holdings Inc Polishing method
JP2011156633A (en) * 2010-02-03 2011-08-18 Nitta Haas Inc Workpiece holding member
JP2011156634A (en) * 2010-02-03 2011-08-18 Nitta Haas Inc Workpiece holding member
JP2011224703A (en) * 2010-04-19 2011-11-10 Teijin Cordley Ltd Method of manufacturing material for suction pad
CN103128618A (en) * 2011-11-21 2013-06-05 株式会社东洋质量第一 A glass grinding method and a laminated board used in the method
JP2014097554A (en) * 2012-11-15 2014-05-29 Fujibo Holdings Inc Holding pad and method for manufacturing the same
JP2013139082A (en) * 2013-04-19 2013-07-18 Fujibo Holdings Inc Holding pad
JP2019058984A (en) * 2017-09-27 2019-04-18 富士紡ホールディングス株式会社 Laminate used for manufacturing holding pad and method for manufacturing the same

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