JP2002355756A - Backing material for holding polished object - Google Patents

Backing material for holding polished object

Info

Publication number
JP2002355756A
JP2002355756A JP2001165910A JP2001165910A JP2002355756A JP 2002355756 A JP2002355756 A JP 2002355756A JP 2001165910 A JP2001165910 A JP 2001165910A JP 2001165910 A JP2001165910 A JP 2001165910A JP 2002355756 A JP2002355756 A JP 2002355756A
Authority
JP
Japan
Prior art keywords
backing material
polished
holding
layer
resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001165910A
Other languages
Japanese (ja)
Inventor
Hiroyuki Yamada
博行 山田
Katsumasa Kawabata
克昌 川端
Naoya Maeda
直也 前田
Kunihiro Fujiyama
邦弘 藤山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Shinko Corp
Nitta DuPont Inc
Original Assignee
Nitto Shinko Corp
Rodel Nitta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Shinko Corp, Rodel Nitta Inc filed Critical Nitto Shinko Corp
Priority to JP2001165910A priority Critical patent/JP2002355756A/en
Publication of JP2002355756A publication Critical patent/JP2002355756A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a backing material that can improve the surface accuracy of a polished object by eliminating the transfer of a surface defect of the backing material to the polished object and can eliminate the use of a template. SOLUTION: This backing material 1 for holding the polished object 6 has a base material 2, an elastic foam layer 3 laminated on the base material 2, and a resin layer 4 laminated on the foam layer 3. The foam layer 3 is formed of polyurethane resin or the like, and the resin layer is preferably formed of a thermoplastic resin.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、シリコン、ガリウ
ム砒素やインジウム燐などの半導体基板または半導体ウ
エハ、各種基板、ガラス、LCD、ディスクなどの表面
を研磨する際に、これらの被研磨物を保持しておくため
に使用するバッキング材に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing method for polishing a semiconductor substrate such as silicon, gallium arsenide, indium phosphide or the like, a semiconductor wafer, various substrates, glass, LCD, a disk, etc., and holding these polished objects. For backing material used to keep.

【0002】[0002]

【従来の技術】従来、半導体ウェーハ、半導体デバイス
の層間絶縁膜及びメタル配線、メモリー・ディスク、L
CD用ガラス等の精密平面研磨を行う際には、回転する
定盤に装着された人工皮革様の研磨布と、対向する位置
に置かれた回転可能な被研磨物保持プレートに下記に述
べるような種々の被研磨物の装置法により固定された被
研磨物との間に研磨砥粒を含む研磨液を供給して、被研
磨物及び研磨布を互いに摺動させることにより行われて
きた。
2. Description of the Related Art Conventionally, semiconductor wafers, interlayer insulating films and metal wiring of semiconductor devices, memory disks, L
When performing precision flat polishing of glass for CDs, etc., an artificial leather-like polishing cloth mounted on a rotating surface plate and a rotatable workpiece holding plate placed at an opposite position are described below. A polishing liquid containing abrasive grains is supplied between the polishing object and the object fixed by various apparatus methods, and the object and the polishing cloth are slid with each other.

【0003】従来技術による被研磨物の保持・固定法と
しては、例えば、以下の方法が用いられてきた。
For example, the following method has been used as a method for holding and fixing an object to be polished according to the prior art.

【0004】(1)金属やセラミックスで製作された被
研磨物保持プレートに加熱下で流延、塗布されたワック
スを介し、該ワックスの軟化点以下まで冷却することに
より被研磨物を固定する、いわゆるワックス・マウンテ
ィング法。
(1) An object to be polished is fixed by cooling it to a temperature lower than the softening point of the wax through a wax that has been cast and applied to a holding plate made of metal or ceramics under heating. The so-called wax mounting method.

【0005】(2)金属やセラミックスで製作された被
研磨物保持プレートに機械加工により直径0.5mm〜
数mmの吸引口をあけ、この保持プレートの裏面及び側
面から真空ポンプにより吸引することで保持プレート表
面に装着された被研磨物を固定する、いわゆるバキュー
ム・チャック法。
(2) A workpiece holding plate made of metal or ceramic is machined to a diameter of 0.5 mm or more.
A so-called vacuum chuck method in which a suction port of several mm is opened, and a workpiece to be polished mounted on the surface of the holding plate is fixed by suctioning from the back and side surfaces of the holding plate with a vacuum pump.

【0006】(3)人工皮革様の高分子発泡材料からな
るバッキング材を被研磨物保持プレートに装置し、該バ
ッキング材を水で濡らし発泡孔中の水が被研磨物を介し
て加えられる圧力により外部へ排出された時に生じる発
泡孔中の水の陰圧及び水自体の表面張力の複合により被
研磨物を保持プレート表面に固定する、いわゆるノーワ
ックス・マウンディング法。
(3) A backing material made of an artificial leather-like polymer foam material is mounted on a plate for holding an object to be polished, the backing material is wetted with water, and the pressure in which water in the foamed holes is applied through the object to be polished. A so-called no-wax mounting method in which the object to be polished is fixed to the surface of the holding plate by a combination of the negative pressure of water in the foamed pores and the surface tension of the water itself when the water is discharged outside.

【0007】しかしながら、これら種々の被研磨物保持
法には各々に特有の欠点も存在した。すなわち、(1)
ワックス・マウンティング法においては、被研磨物の研
磨終了後、被研磨物裏面に固定に用いたワックスが残留
し、その汚染を除去するために煩雑な洗浄操作を行う必
要があること、固定に用いるワックス自体に軟化点があ
ることから、研磨加工温度をその軟化点以上に上げるこ
とができないこと、ワックス中にゲル化物や外来粉塵が
含まれているとそれらの存在が研磨中に被研磨物表面の
ディンプルとして転写され研磨の仕上り状態を悪化させ
ること、さらに着脱の際の手間がかかること、などが挙
げられる。
[0007] However, these various methods for holding the object to be polished also have their own specific disadvantages. That is, (1)
In the wax mounting method, after completion of polishing of the object to be polished, the wax used for fixing remains on the back surface of the object to be polished, and it is necessary to perform a complicated cleaning operation to remove the contamination, which is used for fixing. Since the wax itself has a softening point, the polishing temperature cannot be raised above the softening point.If the wax contains gelled substances or foreign dust, the presence of these substances will cause the surface of the workpiece to be polished during polishing. And that the finished state of the polishing is deteriorated after being transferred as dimples, and that it takes much time to attach and detach.

【0008】(2)従来のバキューム・チャック法につ
いては、機械加工により形成された吸引口付近で被研磨
物が吸引口側にたわみ、研磨加工後の被研磨物表面では
逆に研磨による表面の除去が不足であった突起点として
残り、研磨の仕上がり状態を悪化させること、研磨液が
加工中に被研磨物裏面と保持プレート間の間隙を通って
吸引口から真空ポンプ配管系中に吸い込まれ、ポンプ故
障や配管を腐食などを起こし易いことなどが挙げられ
る。
(2) In the conventional vacuum chuck method, an object to be polished bends to the suction port side near a suction port formed by machining, and conversely, the surface of the object to be polished after polishing has a surface which is polished. The removal is left as a projection point that was insufficient, worsening the finished state of polishing, and the polishing liquid is sucked into the vacuum pump piping system from the suction port through the gap between the back surface of the workpiece and the holding plate during processing. And failure of the pump or corrosion of the piping.

【0009】(3)ワックスを用いないで半導体ウエハ
をバッキング材に固着する方法は、下定盤上に研磨パッ
ドを貼り付けると共に上定盤下面にバッキング材および
テンプレートを固定し、該テンプレートに設けられたウ
エハ保持用リセスに半導体ウエハを配置し、上下定盤を
相対的に回転させると共に、研磨スラリーを研磨パッド
上に供給しながら半導体ウエハを研磨パッドに押圧する
ことで被研磨物の表面研磨を行うものである。
(3) A method of fixing a semiconductor wafer to a backing material without using wax is to attach a polishing pad on a lower surface plate, fix the backing material and the template on the lower surface of the upper surface plate, and provide the template. The semiconductor wafer is placed in the recess for holding the wafer, and the upper and lower platens are relatively rotated, and while the polishing slurry is supplied onto the polishing pad, the semiconductor wafer is pressed against the polishing pad to polish the surface of the object to be polished. Is what you do.

【0010】ここで使用するバッキング材11は、例え
ば、図3に示すように、基材12にコーティングしたウ
レタン樹脂のDMF溶液層を水中にて凝固させ、温水中
で洗浄、熱風で乾燥を行って発泡層13を形成し、その
表面を平滑加工して形成されたものである。なお、図
中、6は被研磨物、14は感圧接着剤層である。
The backing material 11 used here is, for example, as shown in FIG. 3, a DMF solution layer of a urethane resin coated on a base material 12, which is solidified in water, washed in warm water, and dried with hot air. The foamed layer 13 is formed by smoothing the surface. In the drawing, reference numeral 6 denotes an object to be polished, and 14 denotes a pressure-sensitive adhesive layer.

【0011】しかし、このバッキング材11の保持面の
表面精度は、コーターの塗工精度、欠陥を反映している
ので、その保持面を平滑加工したバッキング材に比べ、
表面精度が悪く、またスジ等、表面欠陥が被研磨物に転
写するという欠点がある。
However, since the surface accuracy of the holding surface of the backing material 11 reflects the coating accuracy and defects of the coater, the surface accuracy is lower than that of the backing material whose surface is smoothed.
There is a defect that surface accuracy is poor and surface defects such as stripes are transferred to the object to be polished.

【0012】また、平滑加工した通常のバッキング材で
は、被研磨物に対する吸着力が弱いので、被研磨物がバ
ッキング材表面でずれるのを防止するためにテンプレー
トを使用することが必要である。
In addition, a smooth backed ordinary backing material has a weak adsorbing force on an object to be polished. Therefore, it is necessary to use a template to prevent the object to be polished from shifting on the surface of the backing material.

【0013】[0013]

【発明が解決しようとする課題】本発明は上記の欠点を
解消するためになされたものであって、その目的とする
ところは、バッキング材の表面欠陥の被研磨物への転写
をなくし、被研磨物の表面精度を上げることができるバ
ッキング材を提供することにある。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned drawbacks, and an object of the present invention is to eliminate the transfer of surface defects of a backing material to an object to be polished. An object of the present invention is to provide a backing material capable of improving the surface accuracy of a polished object.

【0014】本発明の他の目的は、被研磨物に対する吸
着力を上げることでテンプレートの使用をなくすことが
できるバッキング材を提供することにある。
Another object of the present invention is to provide a backing material which can eliminate the use of a template by increasing the attraction force to the object to be polished.

【0015】[0015]

【課題を解決するための手段】本発明の被研磨物を保持
するためのバッキング材は、基材と、該基材上に積層さ
れた弾性を有する発泡層と、該発泡層上に積層された樹
脂層と、を有し、そのことにより上記目的が達成され
る。
A backing material for holding an object to be polished according to the present invention comprises a substrate, an elastic foam layer laminated on the substrate, and an elastic foam layer laminated on the foam layer. And the above-mentioned object is achieved.

【0016】一つの実施態様では、前記発泡層はポリウ
レタン樹脂からなる発泡層であり、前記樹脂層は熱硬化
性樹脂又は熱可塑性樹脂からなる。
In one embodiment, the foam layer is a foam layer made of a polyurethane resin, and the resin layer is made of a thermosetting resin or a thermoplastic resin.

【0017】一つの実施態様では、前記樹脂層の硬度が
48〜88(JIS A硬度)であり、その圧縮率が3
〜52%(JIS L1096にて測定)である。
In one embodiment, the resin layer has a hardness of 48 to 88 (JIS A hardness) and a compression ratio of 3 to 3.
~ 52% (measured by JIS L1096).

【0018】本発明の作用は次の通りである。The operation of the present invention is as follows.

【0019】従来のバッキング材表面は、製造工程およ
び塗工精度を反映して、その厚み精度が悪い。そして、
このバッキング材の保持面の表面欠陥が被研磨物に転写
する場合が多い。
The thickness of the conventional backing material surface is poor, reflecting the manufacturing process and coating accuracy. And
In many cases, the surface defect of the holding surface of the backing material is transferred to the workpiece.

【0020】そこで、本発明においては、バッキング材
の保持面を平滑加工し、その後、保持面に熱可塑性樹脂
又は熱硬化性樹脂をラミネートし、樹脂層を形成する。
この樹脂層は被研磨物を回転させない程度の粘着性を有
しているので、スラリーが被加工物の裏側へ回り込んで
保持力が低下するのを防止できると共に、被研磨物に傷
が付くのを防止することができる。
Therefore, in the present invention, the holding surface of the backing material is smoothed, and thereafter, a thermoplastic resin or a thermosetting resin is laminated on the holding surface to form a resin layer.
Since this resin layer has such an adhesiveness that the object to be polished is not rotated, it is possible to prevent the slurry from sneaking to the back side of the object to be worked and to reduce the holding force, and to damage the object to be polished. Can be prevented.

【0021】[0021]

【発明の実施の形態】以下本発明を詳細に説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail.

【0022】本発明のバッキング材1は、図1〜図3に
示すように、基材2と、該基材2上に積層された弾性を
有する発泡層3と、該発泡層3上に積層された粘着性樹
脂層4と、該基材2の裏面に積層された感圧接着剤層5
とを有する。使用されるまでは、この感圧接着剤層5の
裏面にさらに離型シートが剥離可能に貼着される。
As shown in FIGS. 1 to 3, a backing material 1 of the present invention comprises a base material 2, an elastic foam layer 3 laminated on the base material 2, and a laminate layer on the foam layer 3. Adhesive resin layer 4 and a pressure-sensitive adhesive layer 5 laminated on the back surface of the substrate 2
And Until used, a release sheet is further releasably attached to the back surface of the pressure-sensitive adhesive layer 5.

【0023】上記基材2としては、ポリエステルシー
ト、ポリ塩化ビニルシート、ナイロンシート、ポリイミ
ドシート等を使用することができる。
As the substrate 2, a polyester sheet, a polyvinyl chloride sheet, a nylon sheet, a polyimide sheet or the like can be used.

【0024】また、上記発泡層3としては、従来よりバ
ッキング材1の発泡層を形成するものが使用でき、例え
ば、基材2にウレタン樹脂のDMF溶液をコーティング
し、その層を湿式凝固させ、温水中で洗浄、熱風で乾燥
を行って形成することができる。この発泡層3の表面は
平滑加工され、発泡層3の表面には多数の独立発泡の吸
着用孔が形成されている。発泡層3の圧縮率は5〜60
%(JIS L1096にて測定)が好ましい。
As the foamed layer 3, a foamed layer of the backing material 1 which has been conventionally used can be used. For example, a base material 2 is coated with a DMF solution of a urethane resin, and the layer is wet-solidified. It can be formed by washing in hot water and drying with hot air. The surface of the foam layer 3 is smoothed, and the surface of the foam layer 3 has a large number of independent foaming suction holes. The compression ratio of the foam layer 3 is 5 to 60.
% (Measured by JIS L1096) is preferred.

【0025】発泡層3の表面に積層された粘着性樹脂層
4は、アクリル樹脂、ポリウレタン、ポリエステル、エ
ポキシ樹脂、ナイロン、ポリ塩化ビニル等の熱硬化性樹
脂又は熱可塑性樹脂からなり、表面が平滑であり、かつ
被研磨物に対して粘着性を有しているものである。該樹
脂層4の硬度は48〜88が好ましく(JIS−A,J
ISK6301 5.2(A形)にて測定)、その圧縮
率は3〜52%が好ましい。
The adhesive resin layer 4 laminated on the surface of the foam layer 3 is made of a thermosetting resin or a thermoplastic resin such as acrylic resin, polyurethane, polyester, epoxy resin, nylon, or polyvinyl chloride, and has a smooth surface. And has adhesiveness to the object to be polished. The hardness of the resin layer 4 is preferably from 48 to 88 (JIS-A, J
ISK6301 (measured by 5.2 (A type)), and the compression ratio is preferably 3 to 52%.

【0026】半導体ウエハ等の被研磨物を研磨するに
は、被研磨物の被加工面を下側にしてバッキング材1の
樹脂層4下面に水吸着させ、その保持状態で保持装置を
下降させ、下定盤上の研磨パッド面に所定の圧力で加圧
して定盤を回転させ、ノズルからスラリーを供給し、ま
た被研磨物を保持した保持盤を回転させて被研磨物の研
磨面を研磨する。
In order to polish an object to be polished such as a semiconductor wafer, water is adsorbed on the lower surface of the resin layer 4 of the backing material 1 with the surface of the object to be polished facing down, and the holding device is lowered in the holding state. The surface of the polishing pad on the lower platen is pressurized at a predetermined pressure to rotate the platen, the slurry is supplied from a nozzle, and the holding plate holding the workpiece is rotated to polish the polishing surface of the workpiece. I do.

【0027】本発明のバッキング材1は、その表面に粘
着性樹脂層4が形成されていることにより、半導体ウエ
ハ等の被研磨物を粘着保持し、研磨時の横ずれを防止
し、また被研磨物の裏面に研磨スラリー等が回り込むの
を防止することができる。
The backing material 1 of the present invention has an adhesive resin layer 4 formed on the surface thereof, thereby holding an object to be polished such as a semiconductor wafer in an adhesive state, preventing lateral displacement during polishing, and preventing polishing. It is possible to prevent the polishing slurry or the like from going around the back surface of the object.

【0028】また、自己粘着性の樹脂層4の裏面に発泡
層3が形成されていることにより、研磨屑等が被研磨物
と樹脂層4との間に介在した場合でもその部分が変形す
ることで被研磨物が傷つくことを防止することができ
る。
Further, since the foamed layer 3 is formed on the back surface of the self-adhesive resin layer 4, even if polishing dust or the like is interposed between the object to be polished and the resin layer 4, the portion is deformed. This can prevent the object to be polished from being damaged.

【0029】[0029]

【発明の効果】本発明によれば、バッキング材の基材表
面をバフした後に、その表層に樹脂をラミネートしたの
で、厚み精度が向上し、またそれにより被研磨物(ガラ
ス等)に転写筋が解消され、平坦性、うねりが向上す
る。よって、バッキング材の表面欠陥の被研磨物への転
写をなくし、被研磨物の表面精度を上げることができ
る。また、被研磨物に対する吸着力を上げることでテン
プレートの使用をなくすことができる。
According to the present invention, after buffing the base material surface of the backing material, the resin is laminated on the surface of the backing material, so that the thickness accuracy is improved. And flatness and undulation are improved. Therefore, the transfer of the surface defect of the backing material to the object to be polished can be eliminated, and the surface accuracy of the object to be polished can be improved. Further, the use of the template can be eliminated by increasing the attraction force to the object to be polished.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のバッキング材の一実施例の要部断面図
である。
FIG. 1 is a sectional view of a main part of an embodiment of a backing material of the present invention.

【図2】図1に示すバッキング材の製造工程を示す説明
図である。
FIG. 2 is an explanatory view showing a manufacturing process of the backing material shown in FIG.

【図3】従来のバッキング材の要部断面図である。FIG. 3 is a sectional view of a main part of a conventional backing material.

【符号の説明】[Explanation of symbols]

1 バッキング材 2 基材 3 発泡層 4 粘着性樹脂層 5 感圧接着剤層 DESCRIPTION OF SYMBOLS 1 Backing material 2 Base material 3 Foam layer 4 Adhesive resin layer 5 Pressure-sensitive adhesive layer

───────────────────────────────────────────────────── フロントページの続き (72)発明者 川端 克昌 奈良県大和郡山市池沢町172 ロデール・ ニッタ株式会社奈良工場内 (72)発明者 前田 直也 奈良県大和郡山市池沢町172 ロデール・ ニッタ株式会社奈良工場内 (72)発明者 藤山 邦弘 奈良県大和郡山市池沢町172 ロデール・ ニッタ株式会社奈良工場内 Fターム(参考) 3C058 AA07 AB04 CB01 DA17 4F100 AK01C AK15 AK15G AK25G AK41 AK41G AK48 AK48G AK49 AK51B AK51G AK53G AT00A BA03 BA07 BA10A BA10C CB00C DJ01B DJ02 EJ27 GB90 JB13C JB16C JK07C JK12C JL13C  ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Katsumasa Kawabata 172 Ikezawa-cho, Yamatokoriyama-shi, Nara Prefecture Inside the Rodale Nita Plant (72) Inventor Naoya Maeda 172 Ikezawacho, Yamatokoriyama-shi, Nara Prefecture Rodel Nita Corporation Nara Factory (72) Inventor Kunihiro Fujiyama 172 Ikezawa-cho, Yamatokoriyama City, Nara Prefecture Rodel Nita Corporation Nara Factory F-term (reference) BA03 BA07 BA10A BA10C CB00C DJ01B DJ02 EJ27 GB90 JB13C JB16C JK07C JK12C JL13C

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 基材と、該基材上に積層された弾性を有
する発泡層と、該発泡層上に積層された粘着性樹脂層
と、を有する被研磨物を保持するためのバッキング材。
1. A backing material for holding an object to be polished having a substrate, an elastic foam layer laminated on the substrate, and an adhesive resin layer laminated on the foam layer. .
【請求項2】 前記発泡層はポリウレタン樹脂からなる
発泡層であり、前記粘着性樹脂層は熱硬化性樹脂又は熱
可塑性樹脂からなる請求項1に記載のバッキング材。
2. The backing material according to claim 1, wherein the foamed layer is a foamed layer made of a polyurethane resin, and the adhesive resin layer is made of a thermosetting resin or a thermoplastic resin.
【請求項3】 前記樹脂層の硬度が48〜88(JIS
A硬度)であり、その圧縮率が3〜52%である請求
項1又は2に記載のバッキング材。
3. The resin layer has a hardness of 48 to 88 (JIS).
The backing material according to claim 1 or 2, wherein the compression ratio is 3 to 52%.
【請求項4】 基材と、該基材上に積層された弾性を有
する粘着性樹脂層と、を有する被研磨物を保持するため
のバッキング材。
4. A backing material for holding an object to be polished having a base material and an elastic adhesive resin layer laminated on the base material.
JP2001165910A 2001-05-31 2001-05-31 Backing material for holding polished object Pending JP2002355756A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001165910A JP2002355756A (en) 2001-05-31 2001-05-31 Backing material for holding polished object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001165910A JP2002355756A (en) 2001-05-31 2001-05-31 Backing material for holding polished object

Publications (1)

Publication Number Publication Date
JP2002355756A true JP2002355756A (en) 2002-12-10

Family

ID=19008527

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001165910A Pending JP2002355756A (en) 2001-05-31 2001-05-31 Backing material for holding polished object

Country Status (1)

Country Link
JP (1) JP2002355756A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002355754A (en) * 2001-05-31 2002-12-10 Rodel Nitta Co Method of manufacturing backing material for holding polished object
JP2004349407A (en) * 2003-05-21 2004-12-09 Hitachi Cable Ltd Method of polishing semiconductor wafer
WO2006041024A1 (en) * 2004-10-15 2006-04-20 Musashi Chemicals Industry Co., Ltd. Pressure-sensitive adhesive tape for fixing lens and method for processing lens using the same
JP2006123092A (en) * 2004-10-29 2006-05-18 Okamoto Machine Tool Works Ltd Wafer holding backing material and polishing head structure having this backing material

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002355754A (en) * 2001-05-31 2002-12-10 Rodel Nitta Co Method of manufacturing backing material for holding polished object
JP4659273B2 (en) * 2001-05-31 2011-03-30 ニッタ・ハース株式会社 Manufacturing method of backing material for holding workpiece
JP2004349407A (en) * 2003-05-21 2004-12-09 Hitachi Cable Ltd Method of polishing semiconductor wafer
WO2006041024A1 (en) * 2004-10-15 2006-04-20 Musashi Chemicals Industry Co., Ltd. Pressure-sensitive adhesive tape for fixing lens and method for processing lens using the same
JPWO2006041024A1 (en) * 2004-10-15 2008-05-15 ムサシ化成工業株式会社 Lens fixing adhesive tape and lens processing method using the same
US7985123B2 (en) 2004-10-15 2011-07-26 Musashi Chemicals Industry Co., Ltd. Adhesive tape for fixing lens and method for processing lens using the same
KR101266308B1 (en) * 2004-10-15 2013-05-22 무사시 가세이 고교 가부시키가이샤 Pressure-sensitive adhesive tape for fixing lens and method for processing lens using the same
JP2006123092A (en) * 2004-10-29 2006-05-18 Okamoto Machine Tool Works Ltd Wafer holding backing material and polishing head structure having this backing material

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