TW201438847A - Method for manufacturing glass substrate and method for manufacturing glass substrate for display - Google Patents

Method for manufacturing glass substrate and method for manufacturing glass substrate for display Download PDF

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Publication number
TW201438847A
TW201438847A TW103111310A TW103111310A TW201438847A TW 201438847 A TW201438847 A TW 201438847A TW 103111310 A TW103111310 A TW 103111310A TW 103111310 A TW103111310 A TW 103111310A TW 201438847 A TW201438847 A TW 201438847A
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glass substrate
end surface
acid
cleaning
grinding
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TW103111310A
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Chinese (zh)
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TWI600478B (en
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Takara Misumi
Satoru Itakura
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Avanstrate Inc
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B11/00Cleaning flexible or delicate articles by methods or apparatus specially adapted thereto
    • B08B11/04Cleaning flexible or delicate articles by methods or apparatus specially adapted thereto specially adapted for plate glass, e.g. prior to manufacture of windshields

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  • Surface Treatment Of Glass (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Detergent Compositions (AREA)
  • Cleaning By Liquid Or Steam (AREA)

Abstract

This invention may inhibit the generation of dust particles in the subsequent steps by cleaning the end face of a glass substrate to remove residues on the end face. The method for manufacturing a glass substrate of this invention is a method for manufacturing a glass panel provided with a grinding processed part that has been subjected to a grinding process. The processed part is grinded by contacting magnet grinding particles. Acidic cleaning solution is supplied to the grinded processed part, such that the processed part and the surface of the magnet attached on the processed part are charged with the same polarity, so that the processed part and the magnet are repulsed by each other to make the metal attachments move to the acidic cleaning solution.

Description

玻璃基板之製造方法及顯示器用玻璃基板之製造方法 Method for producing glass substrate and method for producing glass substrate for display

本發明係關於一種於玻璃基板之端面處理方面具有特徵之顯示器用玻璃基板之製造方法。 The present invention relates to a method for producing a glass substrate for a display which is characterized in the end surface treatment of a glass substrate.

液晶顯示器等之顯示器用面板及顯示器用玻璃基板之製造步驟包括對切斷玻璃基板而形成之端面進行倒角之步驟。對於玻璃基板之端面,利用鑽石磨輪進行研削,而除去因切斷而產生之裂痕及銳邊。例如,利用鑽石磨輪以剖面成為R形之方式調整形狀。其後,玻璃基板之端面係藉由使用例如包含發泡樹脂之具有柔軟性之研磨輪之研磨加工而進行研磨。 The manufacturing step of the display panel such as a liquid crystal display panel and the glass substrate for a display includes a step of chamfering the end surface formed by cutting the glass substrate. The end surface of the glass substrate was ground by a diamond grinding wheel to remove cracks and sharp edges caused by the cutting. For example, the shape is adjusted in such a manner that the cross section becomes an R shape by using a diamond grinding wheel. Thereafter, the end surface of the glass substrate is polished by using a polishing process of a flexible polishing wheel containing, for example, a foamed resin.

又,作為研磨加工技術,已知有如專利文獻1所記載之將含有磁性體之研磨漿料用於玻璃基板端面之研磨加工的技術。又,已知有如專利文獻2、3所記載之為了進行表面之鏡面加工而使用含有磁性體之研磨漿料的技術。 Further, as a polishing processing technique, a technique in which a polishing slurry containing a magnetic material is used for polishing a glass substrate end surface as described in Patent Document 1 is known. Further, a technique of using a polishing slurry containing a magnetic material for mirror surface processing as described in Patent Documents 2 and 3 is known.

又,對於經研磨加工之玻璃基板,需要藉由清洗玻璃基板之表背面(主表面)及端面,而將研磨加工時所產生之玻璃粉及所附著之研磨材料、研磨顆粒自玻璃基板上去除。 Moreover, for the polished glass substrate, it is necessary to remove the glass frit and the attached abrasive material and abrasive particles generated during the polishing process from the glass substrate by cleaning the front surface (main surface) and the end surface of the glass substrate. .

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]國際公開第2012/067587號 [Patent Document 1] International Publication No. 2012/067587

[專利文獻2]日本專利特開2011-83827號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2011-83827

[專利文獻3]日本專利特開2000-233359號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2000-233359

近年來,隨著顯示面板向高精細化、高解析度化方向發展,對於驅動面板側要求TFT線寬之細線化,又,對於濾色器面板側更進一步要求黑色矩陣之細線化。為了應對此種對玻璃基板之要求,對於玻璃基板之表面要求更高之潔淨度。 In recent years, as the display panel has been developed in the direction of high definition and high resolution, the thinning of the TFT line width is required for the driving panel side, and the thinning of the black matrix is further required for the color filter panel side. In order to cope with such a demand for a glass substrate, a higher cleanliness is required for the surface of the glass substrate.

因此,本發明提供一種玻璃基板之製造方法,其使用清洗因研磨加工而附著於玻璃基板端面之異物的技術。 Accordingly, the present invention provides a method of producing a glass substrate using a technique of cleaning foreign matter adhering to an end surface of a glass substrate by polishing.

作為玻璃基板之主表面所附著之異物之主要產生原因之一,已知有曾附著於玻璃基板之端面之異物附著並殘留於其主表面。利用磁性體研磨粒進行鏡面研磨之玻璃基板之端面上亦會殘留存在先前之清洗步驟無法去除之異物。 One of the main causes of foreign matter adhering to the main surface of the glass substrate is that foreign matter adhering to the end surface of the glass substrate adheres to and remains on the main surface. The end surface of the glass substrate which is mirror-polished by the magnetic abrasive grains may also have foreign matter which cannot be removed by the previous cleaning step.

因此,本發明係具有經研磨加工之處理部的玻璃基板之製造方法,並且上述處理部藉由與包含磁性體之研磨漿料接觸而被研磨,對經研磨之上述處理部供給清洗液,使上述處理部之表面與上述處理部所附著之上述磁性體之表面帶同極電荷,而使上述處理部與上述磁性體相互排斥,從而使上述磁性體移動至清洗液中。例如,對於具有利用磁性體研磨粒進行研磨加工之端面之玻璃基板,藉由對經研磨加工之端面供給酸性清洗液、較佳為含有有機酸之清洗液,使玻璃基板之端面與該端面所附著之磁性體研磨粒即鐵系微粒子之表面帶同極電荷,而使該端面與鐵系微粒子相互排斥,從而使鐵系微粒子移動至清 洗液中。 Therefore, the present invention is a method for producing a glass substrate having a processed portion to be polished, and the processing portion is polished by being brought into contact with a polishing slurry containing a magnetic material, and a cleaning liquid is supplied to the polished processing portion. The surface of the processing unit is charged with the same polarity as the surface of the magnetic body to which the processing unit is attached, and the processing unit and the magnetic body are mutually repelled, and the magnetic body is moved into the cleaning liquid. For example, in the glass substrate having the end surface polished by the magnetic abrasive grains, the end surface of the glass substrate and the end surface are provided by supplying an acidic cleaning liquid, preferably a cleaning liquid containing an organic acid, to the polished end surface. The surface of the attached magnetic abrasive grains, that is, the iron-based fine particles, is charged with the same polarity, and the end face and the iron-based fine particles are mutually repelled, so that the iron-based fine particles are moved to the clear In the lotion.

又,本發明提供一種顯示器用玻璃基板之製造步驟,其具備如下步驟作為去除利用磁性體研磨粒進行研磨加工之玻璃基板之端面所附著之磁性體研磨粒的方法,此步驟係於特定pH值環境下將玻璃基板之端面所附著之磁性體研磨粒之表面離子化,並且使玻璃基板之端面之表面電位成為正電位,使磁性體研磨粒自玻璃基板之端面上浮,並且藉由螯合作用防止磁性體研磨粒再次附著於玻璃基板之主表面及端面,而自玻璃基板清洗去除磁性體研磨粒。又,對於玻璃基板,於端面處理步驟及清洗步驟之後,經過端面之沖洗步驟,進行利用鹼性清洗劑等所進行之玻璃基板之主表面及端面之清洗。 Moreover, the present invention provides a method for producing a glass substrate for a display, which comprises the following steps as a method of removing magnetic abrasive grains attached to an end surface of a glass substrate polished by magnetic abrasive grains, the step being at a specific pH value In the environment, the surface of the magnetic abrasive grains adhered to the end surface of the glass substrate is ionized, and the surface potential of the end surface of the glass substrate is made to be a positive potential, and the magnetic abrasive grains are floated from the end surface of the glass substrate, and by chelation The magnetic abrasive grains are prevented from adhering again to the main surface and the end surface of the glass substrate, and the magnetic abrasive grains are removed from the glass substrate. Further, in the glass substrate, after the end surface treatment step and the cleaning step, the main surface and the end surface of the glass substrate which are subjected to the alkaline cleaning agent or the like are cleaned by the rinsing step of the end surface.

又,本發明之玻璃基板之製造方法具有如下步驟:成形步驟,其由熔融玻璃成形玻璃板;切斷步驟,其將上述玻璃板切斷而形成玻璃基板;端面處理步驟,其藉由使由磁力體所保持之包含磁性體的研磨漿料接觸上述玻璃基板之端面而進行鏡面研磨;及清洗步驟,其使用pH值2以下之酸性化學藥液而清洗由上述玻璃基板之端面所附著之上述磁性體所產生之鐵系微粒子;並且上述清洗步驟之特徵為將構成上述鐵系微粒子之Fe3+還原為Fe2+離子,藉由上述Fe2+離子之雙齒以上之配位而形成錯合物。 Moreover, the method for producing a glass substrate of the present invention has a step of forming a glass plate from molten glass, a cutting step of cutting the glass plate to form a glass substrate, and an end surface treatment step by a polishing slurry containing a magnetic body held by the magnetic body is in contact with the end surface of the glass substrate to perform mirror polishing; and a cleaning step of cleaning the above-mentioned surface of the glass substrate by using an acidic chemical solution having a pH of 2 or less The iron-based fine particles generated by the magnetic body; and the cleaning step is characterized in that Fe 3+ constituting the iron-based fine particles is reduced to Fe 2+ ions, and the above-mentioned Fe 2+ ions are complexed to form a fault. Compound.

又,本發明之顯示器用玻璃基板之製造方法具有如下步驟:成形步驟,其由熔融玻璃成形玻璃板;切斷步驟,其將上述玻璃板切斷而形成玻璃基板;端面處理步驟,其藉由使由磁力體所保持之包含磁性體的研磨漿料接觸上述玻璃基板之端面而進行鏡面研磨處理;及清洗步驟,其利用酸性化學藥液而清洗上述端面。上述端面處理步驟係使用磁性體研磨粒之研磨,係使用具備具有與旋轉軸一同旋轉之第1磁力體及第2磁力體之磁場形成部、及上述包含磁性體研磨粒及液體且由形成於上述第1磁力體與上述第2磁力體之間之磁場所保持的含有 上述磁性體之研磨漿料之研磨輪,於使上述旋轉軸進行旋轉之狀態下,使上述研磨漿料與上述玻璃基板之端面接觸而進行鏡面研磨加工。而且,上述清洗步驟之特徵為,為了去除於上述端面處理步驟中由上述玻璃基板之端面所附著之上述磁性體研磨粒所產生之鐵系微粒子,而使用pH值2以下、較佳為pH值1.6以下之酸性化學藥液,將構成上述鐵系微粒子之Fe3+還原為Fe2+離子,使上述Fe2+離子之2處以上發生配位而形成錯合物。再者,上述鏡面研磨處理所使用之上述研磨漿料中之上述磁性體研磨粒之濃度較佳為85~95wt%。 Moreover, the method for producing a glass substrate for a display according to the present invention has the steps of: forming a glass plate from molten glass; cutting step of cutting the glass plate to form a glass substrate; and an end surface treatment step by The polishing slurry containing the magnetic material held by the magnetic body is brought into contact with the end surface of the glass substrate to perform mirror polishing treatment, and the cleaning step is performed by cleaning the end surface with an acidic chemical solution. The end surface treatment step is a polishing using magnetic abrasive grains, and a magnetic field forming portion including a first magnetic body and a second magnetic body that rotate together with the rotating shaft, and the magnetic abrasive particles and the liquid are formed and formed. a polishing wheel including the polishing slurry of the magnetic material held by a magnetic field between the first magnetic body and the second magnetic body, and the polishing slurry and the glass substrate are rotated while rotating the rotating shaft The end faces are in contact with each other for mirror polishing. Further, the cleaning step is characterized in that a pH of 2 or less, preferably a pH value, is used in order to remove the iron-based fine particles generated by the magnetic abrasive grains adhered to the end surface of the glass substrate in the end surface treatment step. 1.6 or less of the acidic chemical liquid, the Fe 3+ constituting the iron-based fine particles is reduced to Fe 2+ ions, and two or more of the Fe 2+ ions are coordinated to form a complex. Further, the concentration of the magnetic abrasive grains in the polishing slurry used in the mirror polishing treatment is preferably 85 to 95% by weight.

又,本發明之顯示器用玻璃基板之製造方法具有如下清洗步驟,該清洗步驟係對使用磁性體研磨粒進行研磨之玻璃基板之端面供給特定pH值以下、較佳為pH值2以下、更佳為pH值1.6以下之酸性化學藥液,而物理清洗上述端面。上述清洗步驟所使用之上述酸性化學藥液較佳為於特定pH值下發揮螯合效果之選自由水楊酸、鄰苯二甲酸、乙醛酸、草酸、反丁烯二酸、順丁烯二酸、丙二酸、琥珀酸、葡萄糖酸、反式烏頭酸、羥基丙二酸、乳酸、丙酮酸、檸檬酸、異檸檬酸、乙醇酸、蘋果酸、酒石酸等有機酸,次氮基三乙酸、乙二胺四乙酸、羥基乙基乙二胺三乙酸、二乙三胺五乙酸等胺基羧酸,絲胺酸、天冬胺酸、麩胺酸、半胱胺酸等胺基酸所組成之群中之1種以上,更適宜為選自上述群中之2種以上。 Moreover, the method for producing a glass substrate for a display of the present invention has a cleaning step of supplying a specific pH to the end surface of the glass substrate polished using the magnetic abrasive grains, preferably at a pH of 2 or less, more preferably The acidic chemical liquid having a pH of 1.6 or less is physically cleaned of the above end faces. The acidic chemical solution used in the above washing step is preferably selected from the group consisting of salicylic acid, phthalic acid, glyoxylic acid, oxalic acid, fumaric acid, and maleic acid, which exhibit a chelation effect at a specific pH. Organic acids such as diacid, malonic acid, succinic acid, gluconic acid, trans-aconitic acid, hydroxymalonic acid, lactic acid, pyruvic acid, citric acid, isocitric acid, glycolic acid, malic acid, tartaric acid, etc. Aminocarboxylic acid such as acetic acid, ethylenediaminetetraacetic acid, hydroxyethylethylenediaminetriacetic acid, diethylenetriaminepentaacetic acid, amino acid such as serine, aspartic acid, glutamic acid or cysteine One or more of the above-described groups are more preferably selected from the group consisting of two or more of the above groups.

又,本發明之清洗步驟所使用之具有螯合效果之化學藥液較佳為選自由草酸、酒石酸及檸檬酸所組成之群中之濃度被調整為0.5wt%以上之化學藥液。 Further, the chemical liquid having a chelation effect used in the washing step of the present invention is preferably a chemical liquid selected from the group consisting of oxalic acid, tartaric acid and citric acid adjusted to have a concentration of 0.5% by weight or more.

根據本發明之玻璃基板之製造方法及顯示器用玻璃基板之製造方法,可去除玻璃基板之端面所附著之磁性體,並且抑制磁性體再次附著於玻璃基板之主表面及端面。 According to the method for producing a glass substrate of the present invention and the method for producing a glass substrate for a display, the magnetic body adhered to the end surface of the glass substrate can be removed, and the magnetic body can be prevented from adhering again to the main surface and the end surface of the glass substrate.

30‧‧‧第1端面加工機 30‧‧‧1st face processing machine

31‧‧‧第1研削輪 31‧‧‧1st grinding wheel

32‧‧‧第2研削輪 32‧‧‧2nd grinding wheel

33‧‧‧玻璃基板G之端面 33‧‧‧End face of glass substrate G

34‧‧‧第2端面加工機 34‧‧‧2nd face processing machine

35‧‧‧旋轉軸 35‧‧‧Rotary axis

36‧‧‧旋轉輪 36‧‧‧Rotary wheel

36a、36b‧‧‧磁力體 36a, 36b‧‧‧ magnetic body

37‧‧‧含有磁性體之研磨漿料 37‧‧‧Abrasive slurry containing magnetic material

40‧‧‧研磨裝置 40‧‧‧ grinding device

60‧‧‧第1端面清洗裝置 60‧‧‧1st end cleaning device

61‧‧‧端面清洗治具 61‧‧‧End face cleaning fixture

61a‧‧‧旋轉軸 61a‧‧‧Rotary axis

61b‧‧‧支持部 61b‧‧‧Support Department

61c‧‧‧清洗墊 61c‧‧‧cleaning mat

62‧‧‧搬送輥 62‧‧‧Transport roller

63、63a、63b‧‧‧端面清洗噴嘴 63, 63a, 63b‧‧‧ end face cleaning nozzle

64‧‧‧第2端面清洗治具 64‧‧‧2nd face cleaning fixture

64a、64b‧‧‧清洗噴嘴 64a, 64b‧‧‧ cleaning nozzle

65‧‧‧清洗輥 65‧‧‧cleaning roller

70‧‧‧第2端面清洗裝置 70‧‧‧2nd end cleaning device

80‧‧‧表面清洗裝置 80‧‧‧Surface cleaning device

100‧‧‧裝置 100‧‧‧ device

180‧‧‧研磨裝置 180‧‧‧grinding device

182‧‧‧旋轉輪 182‧‧‧Rotating wheel

184‧‧‧供給部 184‧‧‧Supply Department

185‧‧‧磁力體 185‧‧‧ magnetic body

186‧‧‧回收部 186‧‧Recycling Department

187‧‧‧研磨漿料 187‧‧‧grinding slurry

200‧‧‧熔解裝置 200‧‧‧melting device

300‧‧‧澄清裝置 300‧‧‧Clarification device

400‧‧‧輸送管 400‧‧‧ delivery tube

500‧‧‧成形裝置 500‧‧‧Forming device

611‧‧‧清洗輥 611‧‧‧cleaning roller

700‧‧‧液槽 700‧‧‧ liquid tank

800‧‧‧卡匣 800‧‧‧Carmen

G‧‧‧玻璃基板 G‧‧‧glass substrate

G1‧‧‧帶狀之玻璃板 G1‧‧‧Striped glass plate

L‧‧‧液體 L‧‧‧Liquid

圖1係表示本發明之玻璃基板之製造方法中之各步驟的流程圖。 Fig. 1 is a flow chart showing the steps in the method for producing a glass substrate of the present invention.

圖2表示本發明中之熔解步驟至切斷步驟之模式圖。 Fig. 2 is a schematic view showing the melting step to the cutting step in the present invention.

圖3表示本發明之玻璃基板之端面處理之態樣的圖。 Fig. 3 is a view showing a state of end surface treatment of the glass substrate of the present invention.

圖4(a)、(b)係表示使用本發明之含有磁性體之研磨漿料之研磨加工之態樣的圖。 4(a) and 4(b) are views showing a state of polishing processing using the polishing slurry containing a magnetic material of the present invention.

圖5係表示本發明所加工之玻璃基板之端面部分的模式圖。 Fig. 5 is a schematic view showing an end face portion of a glass substrate processed by the present invention.

圖6(a)~(c)係表示本發明所使用之清洗裝置之動作的圖。 6(a) to 6(c) are views showing the operation of the cleaning device used in the present invention.

圖7(a)~(c)係表示本發明所使用之清洗裝置所具備之清洗治具之動作的圖。 7(a) to 7(c) are views showing the operation of the cleaning jig included in the cleaning device used in the present invention.

圖8係表示本發明之另一實施形態之玻璃表面之加工之態樣的圖。 Fig. 8 is a view showing a state of processing of a glass surface according to another embodiment of the present invention.

圖9係表示本發明所使用之批次清洗系統之一部分構成的剖面圖。 Figure 9 is a cross-sectional view showing a part of a batch cleaning system used in the present invention.

以下,參照圖式,對本發明之玻璃基板之製造方法之一實施形態進行說明。再者,於本說明書中,玻璃基板包括顯示器用玻璃基板。 Hereinafter, an embodiment of a method for producing a glass substrate of the present invention will be described with reference to the drawings. Furthermore, in the present specification, the glass substrate includes a glass substrate for a display.

(1)玻璃基板之製造方法之概要 (1) Outline of the manufacturing method of the glass substrate

圖1係本實施形態之玻璃基板之製造方法的流程圖。玻璃基板如圖1所示係經過熔解步驟T1、成形步驟T2、切斷步驟T3、端面處理步驟T4、清洗步驟T5、及檢査步驟T6之各步驟而製造。 Fig. 1 is a flow chart showing a method of manufacturing a glass substrate of the embodiment. As shown in FIG. 1, the glass substrate is manufactured through the steps of the melting step T1, the forming step T2, the cutting step T3, the end surface processing step T4, the cleaning step T5, and the inspection step T6.

使用圖2,對本發明之玻璃基板之製造方法所使用之製造裝置之一部分(裝置100)進行說明。於熔解步驟T1中,藉由於熔解裝置200內加熱玻璃原料使之熔解,而製成熔融玻璃。並且,於澄清裝置300內使熔融玻璃中所含之氣體成分自熔融玻璃中釋放出來,或者使熔融玻 璃中所含之氣體成分被吸收至熔融玻璃中。例如,玻璃原料包含SiO2、Al2O3等組成。 A part (device 100) of a manufacturing apparatus used in the method for producing a glass substrate of the present invention will be described with reference to Fig. 2 . In the melting step T1, molten glass is produced by melting the glass raw material in the melting device 200 to melt it. Further, in the clarification device 300, the gas component contained in the molten glass is released from the molten glass, or the gas component contained in the molten glass is absorbed into the molten glass. For example, the glass raw material contains a composition such as SiO 2 or Al 2 O 3 .

於成形步驟T2中,利用輸送管400將經澄清之熔融玻璃供給至成形裝置500,而成形為帶狀之玻璃板G1。 In the forming step T2, the clarified molten glass is supplied to the forming apparatus 500 by the transfer pipe 400, and is formed into a strip-shaped glass plate G1.

於切斷步驟T3中,玻璃板G1係利用未圖示之切斷裝置沿著寬度方向切斷而單片化。進而以成為特定尺寸之方式切斷4邊,而製成製品尺寸之玻璃基板G。 In the cutting step T3, the glass sheet G1 is cut into a single piece by cutting in the width direction by a cutting device (not shown). Further, the four sides are cut to a specific size to form a glass substrate G having a product size.

於端面處理步驟T4中,利用圖3所示之第1端面加工機30,對藉由切斷而形成之端面進行加工。於移動之玻璃基板G之兩端面,使利用未圖示之旋轉軸而自轉之第1研削輪31與第2研削輪32接觸,藉此對玻璃基板G之端面33進行加工。於加工過玻璃基板G之長邊側之端面33後,對短邊側之端面33進行加工。其後,利用設置於圖4所示之第2端面加工機34上之研磨裝置40進行端面33之鏡面研磨加工。此處係使用含有磁性體之研磨漿料。所謂含有磁性體之研磨漿料係指磁性體主要作為研磨顆粒而發揮作用之含有磁性體研磨粒之流動體、或磁性體主要作為用於運送研磨顆粒之載體而發揮作用之流動體。 In the end surface processing step T4, the end surface formed by the cutting is processed by the first end surface processing machine 30 shown in FIG. The end faces 33 of the glass substrate G are processed by bringing the first grinding wheel 31 that rotates by a rotating shaft (not shown) into contact with the second grinding wheel 32 on both end faces of the moving glass substrate G. After the end surface 33 of the long side of the glass substrate G is processed, the end surface 33 of the short side is processed. Thereafter, the mirror surface polishing processing of the end surface 33 is performed by the polishing apparatus 40 provided on the second end surface processing machine 34 shown in FIG. Here, a polishing slurry containing a magnetic body is used. The polishing slurry containing a magnetic material refers to a fluid containing a magnetic abrasive grain mainly serving as a polishing particle, or a fluid mainly serving as a carrier for transporting abrasive particles.

其次,對包括將端面處理步驟T4之研磨加工中所附著之磁性體自玻璃基板G之端面去除之步驟的清洗步驟進行說明。 Next, a washing step including a step of removing the magnetic body attached to the polishing process in the end surface processing step T4 from the end surface of the glass substrate G will be described.

於清洗步驟T5中,利用圖6(a)所示之第1端面清洗裝置60,將於端面處理步驟T4中經鏡面研磨處理之玻璃基板G之端面33利用端面清洗治具61加以清洗。於第1端面清洗裝置60中,於在搬送輥62上搬送之玻璃基板G之兩側設置第1端面清洗治具61,並且設置自玻璃基板G之主表面側向端面側噴射清洗液之端面清洗噴嘴63。 In the cleaning step T5, the end surface 33 of the glass substrate G subjected to the mirror polishing treatment in the end surface treatment step T4 is cleaned by the end surface cleaning jig 61 by the first end surface cleaning device 60 shown in Fig. 6(a). In the first end surface cleaning device 60, the first end surface cleaning jig 61 is provided on both sides of the glass substrate G conveyed on the conveying roller 62, and the end surface of the cleaning liquid is sprayed from the main surface side end surface side of the glass substrate G. The nozzle 63 is cleaned.

對於通過第1端面清洗裝置60之玻璃基板G,繼而利用圖6(b)所示之第2端面清洗裝置70而清洗端面。於第2端面清洗裝置70中,於在搬送輥62上搬送之玻璃基板G之兩側設置第2端面清洗治具64。 The end surface is cleaned by the second end surface cleaning device 70 shown in FIG. 6(b) by the glass substrate G of the first end surface cleaning device 60. In the second end surface cleaning device 70, the second end surface cleaning jig 64 is provided on both sides of the glass substrate G conveyed on the conveying roller 62.

對於利用第1端面清洗裝置60、第2端面清洗裝置70清洗了長邊側之端面33之玻璃基板G,利用未圖示之反轉機將玻璃基板G之朝向旋轉90度,與長邊側同樣地清洗玻璃基板G之短邊側。 The glass substrate G on which the end surface 33 of the long side is cleaned by the first end surface cleaning device 60 and the second end surface cleaning device 70 is rotated by 90 degrees and the long side by a reversing machine (not shown). The short side of the glass substrate G is cleaned in the same manner.

進而,對玻璃基板G之端面33之4邊進行清洗後,清洗玻璃基板G之主表面。利用圖6(c)所示之表面清洗裝置80而清洗玻璃基板G之表面、背面。於在搬送輥62上搬送之玻璃基板G之表面側、背面側設置清洗輥65,塗佈玻璃基板用之鹼性清洗劑而清洗玻璃基板G之主表面。於本實施形態中,清洗輥65係將毛刷輥與海綿輥組合使用,而去除玻璃基板之主表面所附著之有機物及顆粒。 Further, after cleaning the four sides of the end surface 33 of the glass substrate G, the main surface of the glass substrate G is cleaned. The surface and the back surface of the glass substrate G are cleaned by the surface cleaning apparatus 80 shown in FIG. 6(c). The cleaning roller 65 is provided on the front side and the back side of the glass substrate G conveyed on the conveying roller 62, and the main surface of the glass substrate G is cleaned by applying an alkaline cleaning agent for the glass substrate. In the present embodiment, the cleaning roller 65 uses a brush roller in combination with a sponge roller to remove organic substances and particles adhering to the main surface of the glass substrate.

於檢査步驟T6中,對玻璃基板G之端面33及主表面進行檢査,其後,以顯示器用玻璃基板之形式出貨給顯示面板製造商等。 In the inspection step T6, the end surface 33 of the glass substrate G and the main surface are inspected, and then shipped to a display panel manufacturer or the like in the form of a glass substrate for display.

以下,參照圖式對本發明之端面處理步驟T4及清洗步驟T5更詳細地進行說明。本實施形態之端面處理步驟T4具有圖3所示之第1研削步驟、第2研削步驟及圖4所示之研磨步驟。 Hereinafter, the end surface treatment step T4 and the cleaning step T5 of the present invention will be described in more detail with reference to the drawings. The end surface treatment step T4 of the present embodiment has the first grinding step, the second grinding step, and the polishing step shown in Fig. 4 shown in Fig. 3 .

首先,對第1端面加工機30及第2端面加工機34進行說明。如圖3所示,於第1端面加工機30中,一面沿著箭頭方向搬送玻璃基板G,一面利用設置於玻璃基板之兩端之第1研削輪31、第2研削輪32先對長邊側之端面依序進行研削加工。並且,對長邊側進行研削加工後,同樣地進行短邊側之研削加工,視需要進行未圖示之定向平面加工、切角。 First, the first end surface processing machine 30 and the second end surface processing machine 34 will be described. As shown in FIG. 3, in the first end surface processing machine 30, the glass substrate G is conveyed in the direction of the arrow, and the first grinding wheel 31 and the second grinding wheel 32 provided at both ends of the glass substrate are used to face the long side. The end faces of the sides are sequentially ground. In addition, after the grinding process is performed on the long side, the grinding process on the short side is performed in the same manner, and the orientation flat processing and the chamfering (not shown) are performed as needed.

第1研削輪31係利用含有鐵之金屬系黏合劑而固定有鑽石研磨粒之研削輪。第1研削輪所使用之黏合劑之硬度及剛性高於第2研削輪32之黏合劑。此處所謂硬度係指蕭氏硬度,所謂剛性係指楊氏模數。第1研削輪31之黏合劑若為金屬系,則亦可使用例如鈷系、青銅系等之其他金屬黏合劑。又,只要硬度及剛性高於第2研削輪之黏合劑,則亦可使用陶瓷質之黏合劑作為第1研削輪31之黏合劑。第1研削輪31例 如可使用JIS R6001-1987所規定之# 300至# 400程度之粒度之鑽石研磨粒。於本實施形態中,第1研削輪31係使用# 400之粒度之鑽石研磨粒。研磨粒不限於鑽石,亦可為CBN(氮化硼)。 The first grinding wheel 31 is a grinding wheel in which diamond abrasive grains are fixed by using a metal-based adhesive containing iron. The hardness and rigidity of the adhesive used in the first grinding wheel are higher than those of the second grinding wheel 32. Here, the hardness means the hardness of the Shore, and the term "rigidity" means the Young's modulus. When the binder of the first grinding wheel 31 is a metal system, other metal binders such as cobalt or bronze may be used. Further, as long as the hardness and rigidity are higher than those of the second grinding wheel, a ceramic binder can be used as the binder of the first grinding wheel 31. The first grinding wheel 31 cases For example, diamond abrasive grains having a particle size of #300 to #400 as specified in JIS R6001-1987 can be used. In the present embodiment, the first grinding wheel 31 is made of diamond abrasive grains having a particle size of #400. The abrasive grains are not limited to diamonds, and may be CBN (boron nitride).

第1研削輪31之粒度可等同或大於第2研削輪32之鑽石研磨粒之粒度。 The particle size of the first grinding wheel 31 may be equal to or larger than the particle size of the diamond abrasive grains of the second grinding wheel 32.

第2研削輪32係利用含有環氧樹脂之樹脂系之黏合劑而固定有鑽石研磨粒之研削輪。第2研削輪32之黏合劑係使用硬度及剛性低於第1研削輪31之黏合劑之黏合劑。關於第2研削輪32之黏合劑,只要硬度及剛性低於第1研削輪31之黏合劑,則亦可使用陶瓷質之黏合劑。若為樹脂系,則例如亦可使用聚醯亞胺系之材質。研磨粒不限於鑽石,亦可為CBN。於本實施形態中,第2研削輪32係使用JIS R6001-1987所規定之# 400之粒度之鑽石研磨粒。 The second grinding wheel 32 is a grinding wheel in which diamond abrasive grains are fixed by a resin-based adhesive containing an epoxy resin. The adhesive of the second grinding wheel 32 is a binder which is lower in hardness and rigidity than the adhesive of the first grinding wheel 31. As for the adhesive of the second grinding wheel 32, a ceramic binder can be used as long as the hardness and rigidity are lower than that of the first grinding wheel 31. In the case of a resin system, for example, a polyimide-based material can also be used. The abrasive particles are not limited to diamonds, and may also be CBN. In the present embodiment, the second grinding wheel 32 is a diamond abrasive grain having a particle size of #400 as defined in JIS R6001-1987.

再者,就高效率地進行研削之方面而言,第1研削輪31之研磨粒之粒度較佳為等同或大於第2研削輪32之研磨粒之粒度。 Further, in terms of performing grinding efficiently, the particle size of the abrasive grains of the first grinding wheel 31 is preferably equal to or larger than the particle size of the abrasive grains of the second grinding wheel 32.

於第1研削步驟中,利用第1研削輪31上所形成之形狀、例如具有特定曲率之研削槽,對玻璃基板G之端面33以特定之研削量進行研削。藉此,玻璃基板G之端面33與原端面33相比後退至玻璃基板之中央側,端面33之剖面形狀對應於第1研削輪31之研削槽之剖面形狀而被研削成帶有曲率之凸形狀、圓弧狀或R形狀。此處,所謂研削量係指自研削前之原端面33起至被研削而後退之研削後之凸形狀之端面33之頂點為止的距離。即,係指玻璃基板G之端面33於玻璃基板G之主表面之方向上被研削之量。利用第1研削輪31所造成之玻璃基板G之研削量例如為40μm至80μm之範圍內。就確保生產性之觀點而言,第1研削步驟中之玻璃基板G之搬送速度較佳為10m/min以上。於本實施形態中,玻璃基板G之搬送速度為10m/min。 In the first grinding step, the end surface 33 of the glass substrate G is ground by a specific grinding amount by the shape formed on the first grinding wheel 31, for example, a grinding groove having a specific curvature. Thereby, the end surface 33 of the glass substrate G retreats from the original end surface 33 to the center side of the glass substrate, and the cross-sectional shape of the end surface 33 is ground into a convex curvature with respect to the cross-sectional shape of the grinding groove of the 1st grinding wheel 31. Shape, arc or R shape. Here, the amount of grinding refers to the distance from the original end surface 33 before the grinding to the apex of the convex end surface 33 after grinding and being retracted. That is, it means the amount by which the end surface 33 of the glass substrate G is ground in the direction of the main surface of the glass substrate G. The amount of grinding of the glass substrate G by the first grinding wheel 31 is, for example, in the range of 40 μm to 80 μm. The transport speed of the glass substrate G in the first grinding step is preferably 10 m/min or more from the viewpoint of ensuring productivity. In the present embodiment, the transport speed of the glass substrate G is 10 m/min.

於第1研削步驟中,以玻璃基板G之端面33之JIS B 0601-1982所 規定之最大高度Rmax成為至少10μm以上且18μm以下、更佳為13μm以上且14μm以下之方式研削玻璃基板G之端面33。又,玻璃基板G之端面33之JIS B 0601-1994所規定之算術平均粗糙度Ra例如達到0.5μm左右。 In the first grinding step, JIS B 0601-1982 of the end face 33 of the glass substrate G is used. The end surface 33 of the glass substrate G is ground to a predetermined maximum height Rmax of at least 10 μm or more and 18 μm or less, more preferably 13 μm or more and 14 μm or less. Further, the arithmetic mean roughness Ra defined by JIS B 0601-1994 of the end surface 33 of the glass substrate G is, for example, about 0.5 μm.

其後,於繼第1研削步驟之後所設置之第2研削步驟中,對於玻璃基板G,利用第2研削輪32之研削槽而研削端面33。藉此,玻璃基板G之端面33之剖面形狀對應於第2研削輪32之研削槽之剖面形狀而被研削成帶有曲率之凸形狀、圓弧狀或R形狀。於本實施形態中,藉由將第2研削輪32之研削槽設為與第1研削輪31之研削槽大致相同之形狀,可在不改變玻璃基板G之端面33之外觀形狀之情況下以特定研削量研削玻璃基板G之端面33。 Thereafter, in the second grinding step which is provided after the first grinding step, the end surface 33 is ground by the grinding groove of the second grinding wheel 32 on the glass substrate G. Thereby, the cross-sectional shape of the end surface 33 of the glass substrate G is ground into a convex shape having an curvature, an arc shape, or an R shape in accordance with the cross-sectional shape of the grinding groove of the second grinding wheel 32. In the present embodiment, the grinding groove of the second grinding wheel 32 is substantially the same shape as the grinding groove of the first grinding wheel 31, so that the outer shape of the end surface 33 of the glass substrate G can be changed without changing the outer shape of the end surface 33 of the glass substrate G. The end face 33 of the glass substrate G is ground by a specific amount of grinding.

利用第2研削輪32所產生之玻璃基板G之研削量例如為10μm至30μm之範圍內。於第2研削步驟中,以玻璃基板G之端面33之JIS B 0601-1982所規定之最大高度Rmax成為至少4μm以上且8μm以下、更佳為6μm左右之方式研削玻璃基板G之端面33。又,玻璃基板G之端面之上述算術平均粗糙度Ra達到0.2μ以下、例如0.1μm至0.2μm左右。 The amount of grinding of the glass substrate G produced by the second grinding wheel 32 is, for example, in the range of 10 μm to 30 μm. In the second grinding step, the end surface 33 of the glass substrate G is ground so that the maximum height Rmax defined by JIS B 0601-1982 of the end surface 33 of the glass substrate G is at least 4 μm or more and 8 μm or less, more preferably about 6 μm. Moreover, the arithmetic mean roughness Ra of the end surface of the glass substrate G is 0.2 μ or less, for example, 0.1 μm to 0.2 μm.

於藉由上述之第1研削步驟、第2研削步驟對玻璃基板G之長邊側進行加工後,利用未圖示之反轉機使玻璃基板G之朝向旋轉90度,與長邊側同樣地對玻璃基板G之短邊側進行加工。 After the long side of the glass substrate G is processed by the first grinding step and the second grinding step, the orientation of the glass substrate G is rotated by 90 degrees by a reversing machine (not shown), similarly to the long side. The short side of the glass substrate G is processed.

再者,關於第1研削輪31、第2研削輪32之旋轉方向,可將與玻璃基板G接觸之點之研削輪31之外周面之移動方向設定為與玻璃基板G之搬送方向相同,亦可設定為反方向。於本實施形態中,以於第1研削步驟、第2研削步驟中與玻璃基板G接觸之點之第1研削輪31、第2研削輪32之外周面之移動方向成為玻璃基板G之搬送方向之反方向之方式,使第1研削輪31、第2研削輪32沿著一方向旋轉。 In addition, in the rotation direction of the first grinding wheel 31 and the second grinding wheel 32, the moving direction of the outer peripheral surface of the grinding wheel 31 at the point of contact with the glass substrate G can be set to be the same as the conveying direction of the glass substrate G, Can be set to the opposite direction. In the present embodiment, the moving direction of the outer peripheral surface of the first grinding wheel 31 and the second grinding wheel 32 at the point of contact with the glass substrate G in the first grinding step and the second grinding step is the conveying direction of the glass substrate G. In the opposite direction, the first grinding wheel 31 and the second grinding wheel 32 are rotated in one direction.

於研削步驟中,如上所述,將玻璃基板G之端面33之剖面形狀研削成帶有曲率之凸形狀、圓弧狀或R形狀,並且將玻璃基板G之端面33之上述算術平均粗糙度Ra研削至0.2μm以下。然而,於利用作為鑽石磨輪之第1研削輪31及第2研削輪32進行研削之玻璃基板G之端面33上,會形成含有稱為微裂痕或髮絲裂痕之微小裂痕的層。該層被稱為加工變質層或者脆弱破壞層,即使經過上述第1研削步驟、第2研削步驟,仍會以1μm至3μm左右之厚度而存在。因存在此種層,玻璃基板G之端面33之破壞強度會降低,或玻璃自微小裂痕中脫落。為了去除此種層以提高玻璃基板G之端面33之破壞強度,而進行研磨加工。 In the grinding step, as described above, the cross-sectional shape of the end surface 33 of the glass substrate G is ground into a convex shape, an arc shape or an R shape with curvature, and the arithmetic mean roughness Ra of the end surface 33 of the glass substrate G is performed. Grinding to 0.2 μm or less. However, on the end surface 33 of the glass substrate G which is ground by the first grinding wheel 31 and the second grinding wheel 32 which are diamond grinding wheels, a layer containing minute cracks called microcracks or hairline cracks is formed. This layer is referred to as a work-affected layer or a fragile fracture layer, and is present in a thickness of about 1 μm to 3 μm even after the first grinding step and the second grinding step. Due to the presence of such a layer, the fracture strength of the end face 33 of the glass substrate G is lowered, or the glass is detached from the microcrack. In order to remove such a layer to improve the fracture strength of the end surface 33 of the glass substrate G, the polishing process is performed.

於研磨步驟中,去除玻璃基板G之端面33之加工變質層或者脆弱破壞層,以玻璃基板G之端面33之算術平均粗糙度Ra例如成為未達0.01μm之方式,利用研磨裝置40而研磨玻璃基板G之端面33。 In the polishing step, the work-affected layer or the fragile fracture layer of the end surface 33 of the glass substrate G is removed, and the arithmetic mean roughness Ra of the end surface 33 of the glass substrate G is, for example, less than 0.01 μm, and the glass is ground by the polishing device 40. The end face 33 of the substrate G.

如圖4所示,藉由研削步驟而完成了長邊側、短邊側之玻璃基板之端面33之研削的玻璃基板G被搬送至利用研磨裝置40進行研磨之位置。其後,利用圖4(a)、(b)所示之第2端面加工機34上所安裝之研磨裝置40,對玻璃基板G之端面33進行研磨加工。圖4(b)係沿著圖4(a)之II-II鏈線之剖面圖。研磨裝置40係以旋轉軸35為中心使旋轉輪36旋轉。旋轉輪36係於沿著旋轉軸35之長度方向平行地設置之圓盤狀之磁力體36a、36b之間隙(亦稱為磁場形成部)中保持含有磁性體之研磨漿料37。 As shown in FIG. 4, the glass substrate G which finished the grinding|polishing of the end surface 33 of the glass substrate of the long side and the short side by the grinding|polishing process is conveyed to the position by the grinding|polishing apparatus 40. Thereafter, the end surface 33 of the glass substrate G is polished by the polishing apparatus 40 attached to the second end surface processing machine 34 shown in Figs. 4(a) and 4(b). Fig. 4(b) is a cross-sectional view taken along line II-II of Fig. 4(a). The polishing apparatus 40 rotates the rotating wheel 36 around the rotating shaft 35. The rotating wheel 36 holds a polishing slurry 37 containing a magnetic body in a gap (also referred to as a magnetic field forming portion) of the disk-shaped magnetic bodies 36a and 36b which are disposed in parallel along the longitudinal direction of the rotating shaft 35.

玻璃基板G之端部33沒入被由磁力體36a、36b所形成之磁場所保持之含有磁性體之研磨漿料37中,旋轉輪36係於玻璃基板G之端面33與含有磁性體之研磨漿料37接觸之狀態下旋轉。藉此,含有磁性體之研磨漿料37與玻璃基板G之端面33相對地移動,玻璃基板G之端面33藉由與被磁場形成部所形成之磁場束縛之含有磁性體之研磨漿料接觸而被研磨。 The end portion 33 of the glass substrate G is immersed in the polishing slurry 37 containing the magnetic body held by the magnetic field formed by the magnetic bodies 36a and 36b, and the rotating wheel 36 is attached to the end surface 33 of the glass substrate G and the polishing containing the magnetic body. The slurry 37 is rotated in contact with it. Thereby, the polishing slurry 37 containing the magnetic material moves relative to the end surface 33 of the glass substrate G, and the end surface 33 of the glass substrate G is brought into contact with the polishing slurry containing the magnetic body bound by the magnetic field formed by the magnetic field forming portion. Grinded.

含有磁性體之研磨漿料37所含之研磨粒形狀為真圓度較小之多邊形狀、或具有角部之不定形狀。所謂具有角部之不定形狀,包括具有一個或多個銳角之立體上不一致之形狀。又,所謂具有角部,包括如下情況:粒子向邊緣變薄;粒子之剖面之輪廓線形成一個或多個銳角或鈍角;及粒子之邊緣尖銳。又,研磨粒亦可為球狀。所謂球狀不僅包括剖面形狀為圓形之形狀,亦包括剖面形狀為橢圓形、長圓形等無角之帶圓弧之形狀。又,於含有磁性體之研磨漿料中之研磨粒為磁性體研磨粒之情形時,該研磨漿料中之磁性體研磨粒之濃度較佳為85~95wt%。該磁性體研磨粒之濃度越高,研磨玻璃基板G之端面33之能力越提高,但另一方面,由水蒸發產生之冷卻效果越減小。因此,若該研磨漿料中之磁性體研磨粒之濃度達到95wt%以上,則會因加工熱使玻璃基板G之端面33燒熱。 The shape of the abrasive grains contained in the polishing slurry 37 containing a magnetic material is a polygonal shape having a small roundness or an indefinite shape having a corner portion. The indefinite shape having a corner includes a three-dimensionally inconsistent shape having one or more acute angles. Further, the term "having a corner" includes the case where the particles are thinned toward the edge; the outline of the cross section of the particle forms one or more acute or obtuse angles; and the edges of the particles are sharp. Further, the abrasive grains may be spherical. The spherical shape includes not only a shape in which the cross-sectional shape is a circular shape but also a shape in which the cross-sectional shape is an elliptical shape such as an elliptical shape or an oblong shape. Further, when the abrasive grains in the polishing slurry containing the magnetic material are magnetic abrasive grains, the concentration of the magnetic abrasive grains in the polishing slurry is preferably from 85 to 95% by weight. The higher the concentration of the magnetic abrasive grains, the higher the ability to polish the end faces 33 of the glass substrate G, but on the other hand, the cooling effect by evaporation of water is reduced. Therefore, when the concentration of the magnetic abrasive grains in the polishing slurry is 95% by weight or more, the end surface 33 of the glass substrate G is heated by the processing heat.

經過研磨步驟,玻璃基板G之端面33如圖5所示,具有頂部A、端面與主表面之邊界部B、C,於該等部位,對於玻璃基板G,去除端面33之加工變質層或者脆弱破壞層,以算術平均粗糙度Ra未達0.01μm之方式進行鏡面研磨處理。尤其是,藉由使邊界部B、C之Ra未達0.01,會抑制自端面33產生玻璃粉,而減輕其向玻璃基板G主表面之附著。又,亦可實現玻璃基板G之彎曲強度之提高。 After the polishing step, the end surface 33 of the glass substrate G has a top portion A, a boundary portion B and a surface of the end surface and the main surface, and at these portions, the glass substrate G is removed from the processing layer of the end surface 33 or is fragile. The fracture layer was subjected to mirror polishing treatment so that the arithmetic mean roughness Ra was less than 0.01 μm. In particular, when the Ra of the boundary portions B and C is less than 0.01, the generation of the glass frit from the end surface 33 is suppressed, and the adhesion to the main surface of the glass substrate G is reduced. Moreover, the improvement of the bending strength of the glass substrate G can also be achieved.

再者,對於玻璃基板G,可於固定在平台上之狀態下進行端面研磨,亦可藉由使之向固定之研磨輪移動而進行端面研磨。又,可對玻璃基板G之端面33逐邊研磨,亦可準備多個旋轉輪36,同時研磨玻璃基板G之端面33之多個邊。又,含有磁性體之研磨漿料37可為磁性體主要作為研磨顆粒而發揮作用之含有磁性體研磨粒之流動體,亦可為磁性體主要作為用於運送研磨顆粒之載體而發揮作用之流動體。 Further, the glass substrate G may be subjected to end surface polishing in a state of being fixed to the stage, or may be subjected to end surface polishing by moving it to a fixed grinding wheel. Further, the end surface 33 of the glass substrate G may be polished side by side, or a plurality of rotating wheels 36 may be prepared, and a plurality of sides of the end faces 33 of the glass substrate G may be polished. Further, the polishing slurry 37 containing a magnetic material may be a fluid containing magnetic abrasive grains mainly functioning as polishing particles for the magnetic material, or may be a flow of the magnetic body mainly serving as a carrier for transporting the abrasive particles. body.

又,玻璃基板G之去除量及表面粗糙度即算術平均粗糙度Ra之測定係使用東京精密公司製造之Surfcom A1400,於圖5所示之玻璃基板 G之端面33之頂點A、及端面33與主表面之邊界附近之邊界部B、C處進行。玻璃基板G之去除量之測定係於測量模式為剖面測量模式、測定速度為0.6mm/s、傾斜校正為前半校正、測定距離為20mm之條件下進行。又,表面粗糙度之測定係於測量模式為粗糙度測量、測定速度為0.3mm/s、測定方法為JIS 1994之條件下進行。又,關於算術平均粗糙度Ra之測定,於Ra<0.02時設為截止值0.08及測定長度0.4mm,於0.02<Ra<0.2時設為截止值0.25及測定長度1.25mm,於0.1<Ra<2時設為截止值0.8及測定長度4mm。 In addition, the measurement of the amount of removal of the glass substrate G and the surface roughness, that is, the arithmetic mean roughness Ra, was performed using a Surfcom A1400 manufactured by Tokyo Precision Co., Ltd., and the glass substrate shown in FIG. The apex A of the end surface 33 of G and the boundary portions B and C near the boundary between the end surface 33 and the main surface are performed. The measurement of the removal amount of the glass substrate G was performed under the condition that the measurement mode was the cross-sectional measurement mode, the measurement speed was 0.6 mm/s, the tilt correction was the first half correction, and the measurement distance was 20 mm. Further, the measurement of the surface roughness was carried out under the conditions that the measurement mode was roughness measurement, the measurement speed was 0.3 mm/s, and the measurement method was JIS 1994. In addition, the measurement of the arithmetic mean roughness Ra is a cutoff value of 0.08 and a measurement length of 0.4 mm when Ra<0.02, and a cutoff value of 0.25 and a measurement length of 1.25 mm when 0.02<Ra<0.2, at 0.1<Ra< At 2 o'clock, the cutoff value was 0.8 and the measurement length was 4 mm.

其次,對清洗步驟T5及其清洗作用進行說明。於本發明中,作為去除利用含有磁性體之研磨漿料進行研磨加工之玻璃基板G之端面所附著之磁性體的方法,研究有於特定pH值環境下使玻璃基板G之端面所附著之磁性體之表面正離子化,並且使玻璃基板G之端面之表面電位成為正電位,使磁性體自玻璃基板G之端面上浮,並且藉由螯合作用而防止再附著。 Next, the washing step T5 and its washing action will be described. In the present invention, as a method of removing the magnetic body attached to the end surface of the glass substrate G polished by the polishing slurry containing the magnetic material, the magnetic property attached to the end surface of the glass substrate G in a specific pH environment is examined. The surface of the body is ionized, and the surface potential of the end surface of the glass substrate G is made to be a positive potential, the magnetic body is floated from the end surface of the glass substrate G, and re-adhesion is prevented by chelation.

首先,於本發明中,於利用圖6(a)所示之第1端面清洗裝置60所進行之第1端面清洗步驟中,將pH值2以下、較佳為pH值1.6以下之酸性化學藥液自端面清洗噴嘴63供給至玻璃基板G之端面,進行玻璃基板G之端面所附著之磁性體之離子化。藉此,減小表面電位成為正電位之玻璃基板G之端面與磁性體之靜電相互作用,使磁性體變得容易自玻璃基板G之端面離開。而且,藉由於減小玻璃基板G之端面與磁性體之靜電相互作用之狀態下利用海綿進行物理清洗,而使磁性體自玻璃基板G之端面確實地脫離。 First, in the first end surface cleaning step by the first end surface cleaning device 60 shown in Fig. 6(a), an acidic chemical having a pH of 2 or less, preferably a pH of 1.6 or less is used. The liquid is supplied from the end surface cleaning nozzle 63 to the end surface of the glass substrate G, and ionization of the magnetic body adhered to the end surface of the glass substrate G is performed. Thereby, the electrostatic interaction between the end surface of the glass substrate G whose surface potential becomes a positive potential and the magnetic body is reduced, and the magnetic body is easily separated from the end surface of the glass substrate G. Further, the magnetic body is reliably removed from the end surface of the glass substrate G by physically cleaning with a sponge in a state where the electrostatic interaction between the end surface of the glass substrate G and the magnetic body is reduced.

再者,藉由使第1端面清洗步驟中所供給之化學藥液含有在pH值2以下之環境下對鐵具有螯合效果之化學藥液,使離子化之鐵螯合化,而防止再附著於玻璃基板G之表面。 Further, the chemical liquid supplied to the first end surface cleaning step contains a chemical liquid having a chelate effect on iron in an environment having a pH of 2 or less, thereby sequestering the ionized iron to prevent further Adhered to the surface of the glass substrate G.

作為具有還原效果之化學藥液,較佳為含有至少標準氧化還原 電位為-0.35V以下之酸性化學藥液。例如,Fe3+離子之還原需要-0.77V,藉由使用具有螯合效果之化學藥液,可降低Fe3+離子之還原電位。即,於上述電位以上亦可獲得還原效果,玻璃基板G之端面之清洗作用進一步提高。 As the chemical liquid having a reducing effect, it is preferred to contain an acidic chemical liquid having at least a standard redox potential of -0.35 V or less. For example, the reduction of Fe 3+ ions requires -0.77 V, and the reduction potential of Fe 3+ ions can be lowered by using a chemical solution having a chelate effect. That is, the reduction effect can be obtained even above the above potential, and the cleaning action of the end faces of the glass substrate G is further improved.

藉由物理清洗而離開玻璃基板G之端面之磁性體即使被放置於足以增大玻璃基板G之表面與磁性體之靜電相互作用之程度之pH值環境下,亦會因磁性體構成螯合物,而防止磁性體再附著於玻璃基板G上。 The magnetic body which leaves the end surface of the glass substrate G by physical cleaning is formed into a chelate compound by the magnetic body even if it is placed in a pH environment sufficient to increase the electrostatic interaction between the surface of the glass substrate G and the magnetic body. And preventing the magnetic body from adhering again to the glass substrate G.

繼而,於利用圖6(b)所示之第2端面清洗裝置70所進行之第2端面清洗步驟中,進行用於清洗去除第1端面清洗步驟中成為螯合物之磁性體之沖洗。於第2端面清洗步驟中,較佳為設法不使磁性體帶入以後步驟。例如,為了去除構成螯合物之鐵成分,而使用pH值2以下、較佳為pH值1.6以下之酸性化學藥液,其後藉由純水清洗而將沖洗所使用之化學藥液洗去。 Then, in the second end surface cleaning step by the second end surface cleaning device 70 shown in FIG. 6(b), the rinsing for cleaning and removing the magnetic material which becomes a chelate in the first end surface cleaning step is performed. In the second end face cleaning step, it is preferable to try not to bring the magnetic body into the subsequent step. For example, in order to remove the iron component constituting the chelate compound, an acidic chemical liquid having a pH of 2 or less, preferably pH of 1.6 or less is used, and then the chemical liquid used for washing is washed away by washing with pure water. .

使用圖7(a)、(b)對圖6(a)之第1端面清洗治具61進行說明。圖7(a)表示第1端面清洗機60中之玻璃基板G之端面之一部分。第1端面清洗治具61具有利用旋轉軸61a進行旋轉之支持部61b上所設置之清洗墊61c,其清洗利用搬送輥62所搬送之玻璃基板G之兩端。 The first end face cleaning jig 61 of Fig. 6(a) will be described with reference to Figs. 7(a) and 7(b). Fig. 7(a) shows a part of the end surface of the glass substrate G in the first end face cleaning machine 60. The first end surface cleaning jig 61 has a cleaning pad 61c provided on the support portion 61b that is rotated by the rotating shaft 61a, and cleans both ends of the glass substrate G conveyed by the conveying roller 62.

對於清洗墊61c與玻璃基板G之端面,自端面清洗噴嘴63a噴出pH值2以下、較佳為pH值1.6以下之酸性化學藥液。作為一例,可將草酸與酒石酸之混合液塗佈至玻璃基板G之端面。清洗墊61c含有酸性化學藥液,其接觸玻璃基板G之端面並滑動,藉此可對玻璃基板G之端面進行化學清洗與物理清洗,而使玻璃基板G之端面所附著之磁性體脫離玻璃基板G之端面。脫離之磁性體係利用酒石酸而螯合化。 The end surface of the cleaning pad 61c and the glass substrate G is ejected from the end surface cleaning nozzle 63a with an acidic chemical liquid having a pH of 2 or less, preferably a pH of 1.6 or less. As an example, a mixed liquid of oxalic acid and tartaric acid may be applied to the end faces of the glass substrate G. The cleaning pad 61c contains an acidic chemical liquid that contacts the end surface of the glass substrate G and slides, whereby the end surface of the glass substrate G can be chemically cleaned and physically cleaned, and the magnetic body attached to the end surface of the glass substrate G is separated from the glass substrate. The end face of G. The detached magnetic system is chelated by tartaric acid.

與玻璃基板G之端面接觸之端面清洗治具61亦可為如圖7(b)般旋轉方向與端面大致垂直之清洗輥611。又,亦可如端面清洗噴嘴63b般 自正面方向對端面供給化學藥液。 The end surface cleaning jig 61 that is in contact with the end surface of the glass substrate G may be a cleaning roller 611 whose rotation direction is substantially perpendicular to the end surface as shown in Fig. 7(b). Moreover, it can also be like the end face cleaning nozzle 63b The chemical liquid is supplied to the end face from the front direction.

其次,使用圖7(c)對圖6(b)之第2端面清洗裝置70進行說明。通過第1端面清洗裝置60之玻璃基板G被投入至第2端面清洗裝置70中,利用第2端面清洗治具64a、64b而沖洗掉前步驟之化學藥液。 Next, the second end face cleaning device 70 of Fig. 6(b) will be described with reference to Fig. 7(c). The glass substrate G of the first end surface cleaning device 60 is introduced into the second end surface cleaning device 70, and the chemical solution liquid of the previous step is washed away by the second end surface cleaning jigs 64a and 64b.

圖7(c)表示第2端面清洗裝置70中之玻璃基板G之端面之一部分。於第2清洗步驟中,利用沖洗液而沖洗掉經螯合化之磁性體,直至以後步驟之表面清洗裝置,並且降低玻璃基板所附著之酸性化學藥液之pH值,抑制酸性化學藥液被帶入以後步驟。 FIG. 7(c) shows a part of the end surface of the glass substrate G in the second end surface cleaning device 70. In the second cleaning step, the chelating magnetic body is washed away by the rinsing liquid until the surface cleaning device of the subsequent step, and the pH value of the acidic chemical liquid adhered to the glass substrate is lowered, and the acidic chemical liquid is suppressed. Take the next steps.

第2端面清洗治具64如圖7(c)所示,具有以對玻璃基板G之端面有特定角度之方式對向設置之清洗噴嘴64a、64b。首先,利用自清洗噴嘴64a噴出之第1沖洗液而沖洗玻璃基板G之端面。第1沖洗液係使用具有與第1端面清洗步驟中所使用之化學藥液同等之pH值的沖洗液。利用第1沖洗液而沖洗掉自第1端面清洗步驟附著之化學藥液後,使用純水作為第2沖洗液而沖洗玻璃基板G之端面。藉此,可防止將酸性化學藥液帶入作為以後步驟之圖6(c)所示之利用表面清洗裝置80所進行之玻璃基板G之主表面清洗步驟中。又,藉由將具有與第1端面清洗步驟同等之pH值之化學藥液用於第1沖洗液,而確實地沖洗掉磁性體。 As shown in FIG. 7(c), the second end face cleaning jig 64 has cleaning nozzles 64a and 64b which are opposed to each other at a specific angle to the end surface of the glass substrate G. First, the end surface of the glass substrate G is rinsed by the first rinse liquid discharged from the cleaning nozzle 64a. The first rinse liquid uses a rinse liquid having a pH equivalent to that of the chemical liquid used in the first end face cleaning step. After the chemical liquid adhered from the first end surface cleaning step is washed away by the first rinse liquid, the end surface of the glass substrate G is rinsed with pure water as the second rinse liquid. Thereby, it is possible to prevent the acidic chemical liquid from being carried into the main surface cleaning step of the glass substrate G by the surface cleaning device 80 shown in Fig. 6(c) which is a later step. Further, by using the chemical liquid having the pH equivalent to the first end surface cleaning step for the first rinse liquid, the magnetic body is surely washed away.

再者,於本實施形態中,於玻璃基板G之主表面側,亦可設置自主表面側向端面側噴出沖洗液之清洗噴嘴,並且設置自端面之正面側亦噴出沖洗液之清洗噴嘴。 Further, in the present embodiment, a cleaning nozzle that ejects the rinsing liquid on the side of the abutting surface of the autonomous surface may be provided on the main surface side of the glass substrate G, and a cleaning nozzle that ejects the rinsing liquid from the front side of the end surface may be provided.

於本發明之顯示器用玻璃基板之製造方法中,認為較佳為將鐵之價電子數設為Fe2+並形成錯合物,因此較佳為將還原性較強之草酸添加至第1端面清洗裝置60所使用之酸性化學藥液中。 In the method for producing a glass substrate for a display of the present invention, it is preferable that the valence electron number of iron is Fe 2+ and a complex compound is formed. Therefore, it is preferable to add oxalic acid having a strong reducing property to the first end face. The acidic chemical liquid used in the cleaning device 60 is used.

關於錯合物之穩定性,鐵之價電子數為Fe3+時,穩定性高於Fe2+。但是,於自玻璃基板G之端面剝離之鐵系微粒子為Fe3+之狀態下,於 未能將該Fe3+完全螯合化之情形時,於上述沖洗步驟中,與Fe2+相比,Fe3+之鐵系微粒子容易於玻璃基板G之主表面及端面鈍化而引起再附著。 Regarding the stability of the complex, when the electron number of iron is Fe 3+ , the stability is higher than that of Fe 2+ . However, in the case where the iron-based fine particles peeled off from the end surface of the glass substrate G are Fe 3+ , when the Fe 3+ is not completely sequestered, in the above-described rinsing step, compared with Fe 2+ The Fe 3+ iron-based fine particles are easily passivated on the main surface and the end surface of the glass substrate G to cause re-adhesion.

因此,於本發明中,由於減小磁性體未螯合化而殘留之可能性,故而於搬送至主表面清洗步驟之前之自玻璃基板G去除磁性體之錯合物之沖洗步驟中,即使清洗液之pH值自酸性變化至中性側,亦會抑制磁性體再附著於玻璃基板G之主表面而鈍化。 Therefore, in the present invention, since the possibility that the magnetic body is not sequestered remains, the rinsing step of removing the complex of the magnetic material from the glass substrate G before the main surface cleaning step is performed, even if it is cleaned. The pH of the liquid changes from acidic to neutral, and also inhibits the magnetic body from adhering to the main surface of the glass substrate G to be passivated.

即,根據本發明,可發揮如下效果:藉由將構成磁性體之Fe3+還原為Fe2+,與Fe3+相比,藉由本發明之清洗步驟可抑制玻璃基板G之主表面之由鈍化引起之再附著。 That is, according to the present invention, the following effects are achieved: By constituting the magnetic body Fe 3+ is reduced to Fe 2+, Fe 3+ and compared, by the washing step of the present invention inhibit the major surface of the glass substrate G Re-adhesion caused by passivation.

作為本發明中所使用之螯合劑,較佳為進行雙齒以上之配位之螯合劑。具體而言,較佳為具備自Fe之正八面體之六配位之鐵離子中心起於xyz軸方向上以3Å以下之距離具有供電子基之分子結構。 The chelating agent used in the present invention is preferably a chelating agent which is coordinated to a bidentate or more. Specifically, it is preferable that the iron ion center having a six-coordinated position from the regular octahedron of Fe has a molecular structure of an electron-donating group at a distance of 3 Å or less in the xyz-axis direction.

作為具體例,上述具有螯合效果之化學藥液較佳為選自由水楊酸、鄰苯二甲酸、乙醛酸、草酸、反丁烯二酸、順丁烯二酸、丙二酸、琥珀酸、葡萄糖酸、反式烏頭酸、羥基丙二酸、乳酸、丙酮酸、檸檬酸、異檸檬酸、乙醇酸、蘋果酸、酒石酸等有機酸,次氮基三乙酸、乙二胺四乙酸、羥基乙基乙二胺三乙酸、二乙三胺五乙酸等胺基羧酸,絲胺酸、天冬胺酸、麩胺酸、半胱胺酸等胺基酸所組成之群中之1種以上,尤其適宜為2種以上。 As a specific example, the above chemical solution having a chelation effect is preferably selected from the group consisting of salicylic acid, phthalic acid, glyoxylic acid, oxalic acid, fumaric acid, maleic acid, malonic acid, and amber. Organic acids such as acid, gluconic acid, trans-aconitic acid, hydroxymalonic acid, lactic acid, pyruvic acid, citric acid, isocitric acid, glycolic acid, malic acid, tartaric acid, nitrilotriacetic acid, ethylenediaminetetraacetic acid, An aminocarboxylic acid such as hydroxyethylethylenediaminetriacetic acid or diethylenetriaminepentaacetic acid, or one of a group consisting of amino acids such as serine, aspartic acid, glutamic acid, and cysteine The above is particularly preferably two or more.

以上,詳細地說明了本發明之玻璃基板之製造方法之實施形態,但本發明並不限定於上述實施形態,亦可在不脫離本發明之主旨之範圍內進行各種改良或變更。 In the above, the embodiment of the present invention is not limited to the above-described embodiments, and various modifications and changes can be made without departing from the spirit and scope of the invention.

[實施例] [Examples]

以下,對本發明之實施例進行詳細說明。 Hereinafter, embodiments of the invention will be described in detail.

(實施例1~5)及(比較例1~3) (Examples 1 to 5) and (Comparative Examples 1 to 3)

首先,玻璃基板之端面之研磨加工所使用之含有磁性體之研磨漿料係磁性體主要作為研磨顆粒而發揮作用之含有磁性體研磨粒之流動體。該磁性體研磨粒係鐵氧體系之磁性體,係包含粒子之形狀為具有角部之不定形狀,平均粒徑為5μm以上且10μm以下,最大磁通密度為1.3T,最大磁導率為3.0H/m之磁性體的研磨顆粒。其次,藉由將所準備之研磨顆粒與水混合,而製作研磨漿料。作為一例,宜以研磨漿料中之研磨粒之濃度成為85~95wt%之方式將磁性體研磨粒與水混合。 First, the polishing slurry-based magnetic material containing a magnetic material used for polishing the end surface of the glass substrate mainly serves as a flow body containing the magnetic abrasive grains as the polishing particles. The magnetic body of the magnetic abrasive grain-based ferrite system is characterized in that the shape of the particles is an indefinite shape having a corner portion, the average particle diameter is 5 μm or more and 10 μm or less, the maximum magnetic flux density is 1.3 T, and the maximum magnetic permeability is 3.0. Abrasive particles of the magnetic body of H/m. Next, a polishing slurry is prepared by mixing the prepared abrasive particles with water. As an example, the magnetic abrasive grains are preferably mixed with water so that the concentration of the abrasive grains in the polishing slurry is 85 to 95% by weight.

於本實施例中,考慮到管理之容易性、量產適用性而使用wt%進行磁性流動體之濃度管理,但磁性流動體之濃度管理亦可使用vol%而進行。wt%與vol%之換算可基於磁性體研磨粒之容積比重與水之密度1g/cm3進行計算。又,於本實施例中,考慮到自研磨加工中之含有磁性體之研磨漿料中之水之蒸發,將所蒸發之量之水補充至該研磨漿料中。具體而言,以特定間隔,對研磨玻璃基板之端面之旋轉輪供給將磁性體研磨粒與水混合而成之含有磁性體之研磨漿料。關於該含有磁性體之研磨漿料,其濃度低於旋轉輪所保持之含有磁性體之研磨漿料,係以流動性高之狀態進行供給。 In the present embodiment, the concentration management of the magnetic fluid is performed using wt% in consideration of the ease of management and the suitability for mass production, but the concentration management of the magnetic fluid can also be carried out using vol%. The conversion between wt% and vol% can be calculated based on the bulk specific gravity of the magnetic abrasive grains and the density of water of 1 g/cm 3 . Further, in the present embodiment, the amount of water evaporated is added to the polishing slurry in consideration of evaporation of water in the polishing slurry containing the magnetic body in the polishing process. Specifically, a polishing slurry containing a magnetic material obtained by mixing magnetic abrasive grains and water is supplied to a rotating wheel that polishes an end surface of a glass substrate at a predetermined interval. The polishing slurry containing the magnetic material is supplied at a lower concentration than the polishing slurry containing the magnetic material held by the rotating wheel.

於藉由上述研磨處理而獲得之玻璃基板之端面上,於圖5所示之邊界部B、邊界部C附著磁性體研磨粒。 Magnetic abrasive grains are attached to the boundary portion B and the boundary portion C shown in FIG. 5 on the end surface of the glass substrate obtained by the above-described polishing treatment.

使用下述「表1」所記載之酸性化學藥液對該玻璃基板之端面進行清洗,並評估清洗結果。將評估結果匯總示於表1。 The end surface of the glass substrate was cleaned using the acidic chemical liquid described in "Table 1" below, and the washing result was evaluated. The evaluation results are summarized in Table 1.

具體而言,於實施例1~5中,將含有有機酸之酸性化學藥液之濃度調整為2wt%。又,沖洗時以pH值成為2以下之方式實施作業。 Specifically, in Examples 1 to 5, the concentration of the acidic chemical liquid containing an organic acid was adjusted to 2% by weight. Moreover, the operation was performed so that the pH value became 2 or less at the time of washing.

於利用磁性體研磨粒所進行之玻璃基板之端面研磨加工之後,於以下步驟中實施此端面之清洗。 After the end surface polishing of the glass substrate by the magnetic abrasive grains, the cleaning of the end faces is carried out in the following steps.

1)自噴嘴對玻璃基板之端面噴射表1所示之酸性化學藥液, 2)利用浸漬有化學藥液之海綿盤進行清洗,3)自噴嘴對玻璃基板之端面噴射化學藥液進行沖洗,4)對玻璃基板之端面噴射純水進行沖洗。 1) spraying the acidic chemical liquid shown in Table 1 from the nozzle to the end surface of the glass substrate, 2) Washing with a sponge disk impregnated with a chemical liquid, 3) spraying a chemical liquid from the nozzle on the end surface of the glass substrate, and 4) spraying pure water on the end surface of the glass substrate to rinse.

再者,於實施例1~5及比較例1~3中,使用厚度為0.5mm之玻璃基板。 Further, in Examples 1 to 5 and Comparative Examples 1 to 3, a glass substrate having a thickness of 0.5 mm was used.

評估方法係利用具有黏著性之治具將玻璃基板之端面所殘存之異物剝離,並測定其每單位面積之附著量而進行。具體而言,關於玻璃基板端面所殘存之異物之殘存面積比率,於各試樣之玻璃基板之四邊之端面之各自中央部貼附透明膠帶,再剝去透明膠帶,使用附帶CCD(Charge Coupled Device,電荷耦合元件)攝像裝置之光學顯微鏡而觀察所剝下之透明膠帶之表面。再者,設法於玻璃基板之端面之加工區域之整個厚度方向(圖5之B點至C點)貼附透明膠帶。 In the evaluation method, the foreign matter remaining on the end surface of the glass substrate was peeled off by an adhesive jig, and the adhesion amount per unit area was measured. Specifically, the ratio of the remaining area of the foreign matter remaining on the end surface of the glass substrate is attached to the central portion of the four end faces of the glass substrate of each sample, and the transparent tape is peeled off, and the CCD (Charge Coupled Device) is used. The charge-coupled element is an optical microscope of the imaging device to observe the surface of the peeled transparent tape. Further, it is attempted to attach a transparent tape to the entire thickness direction of the processing region of the end surface of the glass substrate (points B to C of Fig. 5).

利用光學顯微鏡之觀察區域係設為圖5之玻璃基板之端面之B點至C點之距離、即0.75mm×玻璃基板之長度方向0.75mm之區域。計數該區域之異物之個數,並進行評估。 The observation area by the optical microscope was set to a distance of point B to point C of the end surface of the glass substrate of Fig. 5, that is, a region of 0.75 mm × a length direction of the glass substrate of 0.75 mm. Count the number of foreign objects in the area and evaluate them.

又,對於清洗步驟後之玻璃基板之主表面(表背面)所附著之異物亦進行評估。具體而言,對於玻璃表背面所附著之異物量,使用玻璃基板表面檢査裝置(日立高科技電子工程公司製造之GI4830)進行測定。關於測定條件,於檢測聚苯乙烯標準粒子1μm以上之條件下進行測定。 Further, foreign matter attached to the main surface (back surface) of the glass substrate after the cleaning step was also evaluated. Specifically, the amount of foreign matter adhering to the back surface of the glass was measured using a glass substrate surface inspection apparatus (GI4830 manufactured by Hitachi High-Tech Electronics Co., Ltd.). The measurement conditions were measured under conditions of measuring polystyrene standard particles of 1 μm or more.

如表1所示,關於清洗後之玻璃基板之端面狀態,對圖5所示之A點、B點及C點利用雷射顯微鏡進行表面觀察,並實施清洗效果之評估。對於pH值、還原效果、螯合效果各條件,根據化學藥液物性進行量化。 As shown in Table 1, the surface state of the glass substrate after the cleaning was observed by a laser microscope at points A, B, and C shown in Fig. 5, and the cleaning effect was evaluated. The conditions of the pH value, the reduction effect, and the chelation effect were quantified based on the physical properties of the chemical liquid.

於表1之實施例、比較例中,關於酸離解常數(pKa),將pH值4.4以下表示為◎,將pH值4.4~6表示為◎,將pH值未達6表示為×。又,關於還原能力,根據標準氫電極之電極電位,將-0.35V以下設為◎,將-0.35V~-0.05V設為◎,將-0.05V以上設為×。 In the examples and comparative examples of Table 1, the acid dissociation constant (pKa) was expressed as ◎ at a pH of 4.4 or less, ◎ at a pH of 4.4 to 6, and × at a pH of not 6. Further, regarding the reducing ability, the electrode potential of the standard hydrogen electrode is set to -0.35 V or less to ◎, -0.35 V to -0.05 V to ◎, and -0.05 V or more to x.

關於清洗效果,將清洗後之端面顆粒個數未達150之情形設為「清洗效果:高」,將未達300之情形設為「清洗效果:有」。又,將300以上之情形設為「清洗效果:無」。 Regarding the cleaning effect, the case where the number of end face particles after cleaning is less than 150 is set to "cleaning effect: high", and the case where the number of pieces is less than 300 is set to "cleaning effect: yes". Moreover, the case of 300 or more is set as "cleaning effect: none."

若上述觀察面積中異物未超過300個,則於顯示器製造步驟中,不會因存在鐵系微粒子而引起良率降低。於擔憂鐵系微粒子之影響之TFT面板製造步驟中亦無問題。又,利用玻璃基板表面檢査裝置,自上述觀察面積中異物未超過300個之玻璃基板未檢測到超過1μm之異物。 If the number of foreign matters in the observation area is less than 300, the yield reduction is not caused by the presence of iron-based fine particles in the display manufacturing step. There is no problem in the TFT panel manufacturing steps that are concerned about the influence of iron-based particles. Further, with the glass substrate surface inspection device, foreign matter exceeding 1 μm was not detected from the glass substrate in which the foreign matter did not exceed 300 in the observation area.

關於上述實施例1~5及比較例1~3之結果,若使用具有有機酸之酸性度、還原能力之草酸、螯合價較高之酒石酸,則可確認到較高之潔淨效果。於實施例4中,獲得尤其高之清洗效果。 As a result of the above Examples 1 to 5 and Comparative Examples 1 to 3, when oxalic acid having an acidity and reducing ability of an organic acid and tartaric acid having a high chelating value were used, a high cleansing effect was confirmed. In Example 4, a particularly high cleaning effect was obtained.

根據上述實施例1~5,較佳為使用含有有機酸之羧基的化學藥液,調整化學藥液,而使之具有至少一部分羧基經離子化之pH值。更佳為使用具有多處之羧基,且以多處之羧基發生離子化且低於玻璃等電點pH值之方式進行調整之化學藥液。 According to the above Examples 1 to 5, it is preferred to use a chemical liquid containing a carboxyl group of an organic acid to adjust the chemical liquid to have a pH at which at least a part of the carboxyl groups are ionized. More preferably, it is a chemical liquid which has a plurality of carboxyl groups and is ionized at a plurality of positions and is adjusted to have a pH lower than the isoelectric point of the glass.

如上所述,於本發明之一態樣中,藉由設為pH值2以下、較佳為pH值1.6以下,而減小玻璃基板之端面與磁性體之靜電相互作用,將作為磁性體之鐵系微粒子離子化而使之自玻璃基板之端面上浮,進而使離子化之鐵系微粒子螯合化,藉此防止其再附著於玻璃基板之主表面及端面。而且,於以後步驟之沖洗步驟中進行清洗去除。沖洗所使用之化學藥液較佳為設為pH值3以下、或pH值2~3之範圍內。但是,沖洗所使用之化學藥液亦可設為與還原或螯合化所使用之化學藥液相同之pH值。 As described above, in one aspect of the present invention, by setting the pH to 2 or less, preferably to a pH of 1.6 or less, the electrostatic interaction between the end surface of the glass substrate and the magnetic body is reduced, and the magnetic body is used as the magnetic body. The iron-based fine particles are ionized to float from the end surface of the glass substrate, and the ionized iron-based fine particles are sequestered, thereby preventing the adhesion to the main surface and the end surface of the glass substrate. Moreover, the cleaning is removed in the rinsing step of the subsequent step. The chemical solution used for the rinsing is preferably set to a pH of 3 or less, or a pH of 2 to 3. However, the chemical solution used for the rinsing may be set to the same pH as the chemical solution used for reduction or chelation.

若使用濃硝酸或濃硫酸等具有強氧化能力之酸作為酸性化學藥液,則會使鐵系微粒子之表面鈍化,因而具有強氧化能力之酸欠佳。 When an acid having strong oxidizing power such as concentrated nitric acid or concentrated sulfuric acid is used as the acidic chemical liquid, the surface of the iron-based fine particles is passivated, so that the acid having strong oxidizing ability is unsatisfactory.

又,於本發明之玻璃基板之製造方法中,較佳為將鐵之價電子數設為Fe2+而形成錯合物。就錯合物之穩定性而言,關於鐵之價電子數,Fe3+之穩定性高於Fe2+。但是,於將自玻璃基板之端面剝離之鐵系微粒子自Fe3+還原為Fe2+之情形時,於未能將Fe3+完全螯合化之情形時,有於沖洗步驟中鐵系微粒子會於玻璃基板之表面鈍化而再附著於玻璃基板之主表面及端面之虞。 Further, in the method for producing a glass substrate of the present invention, it is preferred that the valence electron number of iron is Fe 2+ to form a complex compound. As far as the stability of the complex is concerned, the stability of Fe 3+ is higher than that of Fe 2+ with respect to the number of electrons of iron. However, when the iron-based fine particles peeled off from the end surface of the glass substrate are reduced from Fe 3+ to Fe 2+ , the iron-based fine particles in the rinsing step are present when the Fe 3+ is not completely chelated. The surface of the glass substrate is passivated and adhered to the main surface and the end surface of the glass substrate.

因此,於本發明中,於去除鐵之錯合物並且去除其他異物之沖洗步驟中,即使為了進行沖洗而將清洗液之pH值自酸性變化至中性側,藉由將鐵系微粒子之Fe3+還原為Fe2+,與Fe3+相比,亦可抑制玻璃基板之主表面及端面之鈍化,抑制鐵系微粒子再附著於玻璃基板之主表面及端面。即,抑制曾附著於玻璃基板之端面之鐵系微粒子圍繞附著於主表面。 Therefore, in the present invention, in the rinsing step of removing the iron complex and removing other foreign matter, even if the pH of the cleaning liquid is changed from the acidic state to the neutral side for the rinsing, the Fe-based fine particles are Fe. 3+ is reduced to Fe 2+ , and compared with Fe 3+ , the passivation of the main surface and the end surface of the glass substrate can be suppressed, and the iron-based fine particles can be prevented from adhering to the main surface and the end surface of the glass substrate. That is, the iron-based fine particles that have adhered to the end faces of the glass substrate are suppressed from adhering to the main surface.

又,上述具有還原效果之化學藥液較佳為含有至少標準氧化還原電位為-0.35V以下之酸性化學藥液。Fe3+離子之還原需要-0.77V,藉由使用具有螯合效果之化學藥液,可降低Fe3+離子之還原電位。即,於上述設定電位以上便可獲得還原效果,而可進行端面清洗。上 述實施例中係使用草酸。再者,Fe3+離子之還原需要-0.77V,因此為了獲得更高之清洗性,宜使用具有-0.8V以下之酸性化學藥液之標準氧化電位的化學藥液。 Further, it is preferable that the chemical liquid having the reducing effect contains an acidic chemical liquid having at least a standard oxidation-reduction potential of -0.35 V or less. The reduction of Fe 3+ ions requires -0.77 V, and the reduction potential of Fe 3+ ions can be lowered by using a chemical solution having a chelate effect. That is, the reduction effect can be obtained at the above set potential or higher, and the end face cleaning can be performed. Oxalic acid is used in the above examples. Further, since the reduction of Fe 3+ ions requires -0.77 V, in order to obtain higher cleaning properties, a chemical liquid having a standard oxidation potential of an acidic chemical liquid of -0.8 V or less is preferably used.

又,作為螯合劑,較佳為進行雙齒以上之配位之螯合劑。具體而言,較佳為具備自Fe之正八面體之六配位之鐵離子中心起於xyz軸方向上以3Å以下之距離具有供電子基的分子結構。作為具體例,上述具有螯合效果之化學藥液可列舉選自由水楊酸、鄰苯二甲酸、乙醛酸、草酸、反丁烯二酸、順丁烯二酸、丙二酸、琥珀酸、葡萄糖酸、反式烏頭酸、羥基丙二酸、乳酸、丙酮酸、檸檬酸、異檸檬酸、乙醇酸、蘋果酸、酒石酸等有機酸,次氮基三乙酸、乙二胺四乙酸、羥基乙基乙二胺三乙酸、二乙三胺五乙酸等胺基羧酸,絲胺酸、天冬胺酸、麩胺酸、半胱胺酸等胺基酸所組成之群中之1種以上。 Further, as the chelating agent, a chelating agent which is coordinated to a bidentate or more is preferable. Specifically, it is preferable that the iron ion center having a six-coordinated position from the regular octahedron of Fe has a molecular structure having an electron-donating group at a distance of 3 Å or less in the xyz-axis direction. As a specific example, the above chemical liquid having a chelation effect may be selected from the group consisting of salicylic acid, phthalic acid, glyoxylic acid, oxalic acid, fumaric acid, maleic acid, malonic acid, and succinic acid. , gluconic acid, trans-aconitic acid, hydroxymalonic acid, lactic acid, pyruvic acid, citric acid, isocitric acid, glycolic acid, malic acid, tartaric acid and other organic acids, nitrilotriacetic acid, ethylenediaminetetraacetic acid, hydroxyl One or more of an aminocarboxylic acid such as ethylethylenediaminetriacetic acid or diethylenetriaminepentaacetic acid, or an amino acid such as serine, aspartic acid, glutamic acid or cysteic acid. .

玻璃基板之端面之清洗較佳為伴有物理清洗之清洗。為了將自玻璃基板之端面剝離之磁性體確實地自端面去除,宜使用於含有或保持有化學藥液之狀態下接觸玻璃基板之端面而清洗端面之清洗治具。例如,較佳為盤狀之海綿或刷子等。 The cleaning of the end faces of the glass substrate is preferably accompanied by physical cleaning. In order to remove the magnetic body peeled off from the end surface of the glass substrate from the end surface, it is preferable to use the cleaning jig which contacts the end surface of the glass substrate in the state containing or holding the chemical liquid, and washes the end surface. For example, a disc-shaped sponge or brush or the like is preferable.

作為使用本發明而製造之玻璃基板,並不限定於顯示器用途,亦可應用於其他玻璃基板之製造。又,亦可應用於捲取成輥狀之薄板之玻璃基板。對於捲取成輥狀之玻璃基板,切斷所成形之玻璃板之兩側部,對該兩側部之切斷面進行加工,並對該切斷面進行加工、清洗。 The glass substrate produced by using the present invention is not limited to the use of the display, and can be applied to the production of other glass substrates. Further, it can also be applied to a glass substrate which is wound into a roll-shaped thin plate. The glass substrate wound into a roll shape is cut into both sides of the formed glass plate, and the cut surface of the both sides is processed, and the cut surface is processed and washed.

上述實施形態中係使用實施形態及圖4中所說明之研磨裝置40,利用安裝於旋轉軸35上之磁力體36a、36b之間所保持之含有磁性體之研磨漿料37而進行玻璃基板G之端面33之鏡面研磨加工,亦可藉由另一形態,用於使磁性體研磨粒與玻璃基板之端面接觸而進行研磨之玻璃之清洗。圖8表示另一形態之研磨裝置180。含有磁性體之研磨漿料 187自供給部184被供給至具有未圖示之槽之旋轉輪182之槽中,利用設置於旋轉輪182上之磁力體185而保持含有磁性體之研磨漿料187並使之移動。含有磁性體之研磨漿料187隨著旋轉而接觸玻璃板之端面,並被回收部186回收。又,圖4(b)表示包含空出間隙(磁場形成部)而配置旋轉輪36之兩個磁力體36a、36b,且於該磁場形成部保持含有磁性體之研磨漿料37之態樣。但是,亦可不使兩個磁力體36a、36b空出間隙而緊密配置。於不使兩個磁力體36a、36b空出間隙而緊密配置之情形時,研磨漿料37因旋轉輪36所形成之磁場而被保持於旋轉輪36之外周面上。 In the above-described embodiment, the polishing apparatus 40 described in the embodiment and the polishing apparatus 40 described in FIG. 4 is used to perform the glass substrate G by using the polishing slurry 37 containing the magnetic material held between the magnetic bodies 36a and 36b attached to the rotating shaft 35. The mirror polishing process of the end face 33 may be performed by cleaning the glass to be polished by bringing the magnetic abrasive grains into contact with the end faces of the glass substrate. Fig. 8 shows a polishing apparatus 180 of another embodiment. Polishing slurry containing magnetic body The 187 is supplied from the supply unit 184 to the groove of the rotary wheel 182 having a groove (not shown), and the polishing slurry 187 containing the magnetic body is held by the magnetic body 185 provided on the rotary wheel 182. The polishing slurry 187 containing a magnetic body contacts the end surface of the glass plate as it rotates, and is recovered by the recovery portion 186. Moreover, FIG. 4(b) shows a state in which the two magnetic bodies 36a and 36b of the rotating wheel 36 are disposed including the vacant gap (magnetic field forming portion), and the polishing slurry 37 containing the magnetic body is held in the magnetic field forming portion. However, it is also possible to arrange the two magnetic bodies 36a and 36b without leaving a gap. When the two magnetic bodies 36a and 36b are not closely spaced apart from each other, the polishing slurry 37 is held on the outer circumferential surface of the rotating wheel 36 by the magnetic field formed by the rotating wheel 36.

於上述實施形態中,參照圖6及圖7對逐一清洗玻璃基板G之單片清洗方式進行了說明。但是,於本發明之清洗步驟T5中,亦可採用同時清洗多塊玻璃基板G之批次清洗系統。 In the above embodiment, a single-chip cleaning method for cleaning the glass substrates G one by one has been described with reference to FIGS. 6 and 7. However, in the cleaning step T5 of the present invention, a batch cleaning system in which a plurality of glass substrates G are simultaneously cleaned may be employed.

圖9係概念地表示同時清洗多塊玻璃基板G之批次清洗系統中之多個液槽700中之一個的剖面圖。批次清洗系統具備多個圖9所示之液槽700,並且具備將容納多塊玻璃基板G之卡匣800加以搬送之搬送機構。各液槽700視需要而具備於將玻璃基板G浸漬於液體L中之狀態下藉由超聲波對其進行清洗之超聲波清洗機構、及調節液體L之溫度之溫度調節機構。又,批次清洗系統具備向各液槽700中供給液體L之儲罐。 Fig. 9 is a cross-sectional view conceptually showing one of a plurality of liquid tanks 700 in a batch cleaning system for simultaneously cleaning a plurality of glass substrates G. The batch cleaning system includes a plurality of liquid tanks 700 shown in FIG. 9 and a transport mechanism that transports cassettes 800 that accommodate a plurality of glass substrates G. Each of the liquid tanks 700 includes an ultrasonic cleaning mechanism that cleans the glass substrate G by ultrasonic waves in a state where the glass substrate G is immersed in the liquid L, and a temperature adjustment mechanism that adjusts the temperature of the liquid L. Further, the batch cleaning system includes a storage tank that supplies the liquid L to each of the liquid tanks 700.

容納多塊玻璃基板G之卡匣800被搬送設備所搬送,並被依序浸漬於液槽700中所儲存之酸性化學藥液、純水、超純水等液體L中。各液槽700中所儲存之酸性化學藥液係向利用水稀釋玻璃基板G用之清洗劑而成之稀釋液中添加選自草酸、酒石酸及檸檬酸等多元有機酸中之1種以上之酸性成分而製作。藉由使含有有機酸之酸性化學藥液之pH值降低至2.0以下、較佳為1.6以下,使玻璃基板G之表面之ζ電位成為正電位,而使玻璃基板G之端面及主表面所附著之磁性體容易離開 玻璃基板G。再者,藉由酸性化學藥液成分之螯合效果,而防止磁性體再附著於玻璃基板G上。藉由發揮出酸性化學藥液之該等功能,可有效地清洗玻璃基板G所附著之磁性體。 The cassette 800 accommodating the plurality of glass substrates G is transported by the transport apparatus, and is sequentially immersed in the liquid L such as the acidic chemical liquid, the pure water, or the ultrapure water stored in the liquid tank 700. The acidic chemical liquid stored in each of the liquid tanks 700 is added to the diluent obtained by diluting the cleaning agent for the glass substrate G with water, and one or more kinds of acidic acids selected from the group consisting of polybasic organic acids such as oxalic acid, tartaric acid, and citric acid are added. Made with ingredients. When the pH of the acidic chemical solution containing an organic acid is lowered to 2.0 or less, preferably 1.6 or less, the zeta potential of the surface of the glass substrate G becomes a positive potential, and the end surface and the main surface of the glass substrate G are attached. The magnetic body is easy to leave Glass substrate G. Further, the magnetic substance is prevented from adhering to the glass substrate G by the chelation effect of the acidic chemical solution component. By exhibiting these functions of the acidic chemical liquid, the magnetic body to which the glass substrate G is attached can be effectively cleaned.

又,於利用酸性化學藥液進行清洗後,亦可加入利用鹼性清洗液之清洗步驟。作為鹼性清洗液,例如可使用氫氧化鉀(KOH)之溶液。 Further, after washing with an acidic chemical solution, a washing step using an alkaline cleaning solution may be added. As the alkaline cleaning liquid, for example, a solution of potassium hydroxide (KOH) can be used.

[產業上之利用可能性] [Industry use possibility]

作為藉由本發明而製造之玻璃基板,並不限於顯示器用途,可適宜地用於顯示器用途。作為使用本發明而製造之顯示器用玻璃基板,並不限於驅動用之TFT面板用玻璃基板,例如亦包括:濾色器用玻璃基板、或覆蓋玻璃(cover glass)用之玻璃基板等。又,作為顯示器裝置,不限於液晶顯示器或有機EL顯示器,亦可為其他顯示器用途。 The glass substrate produced by the present invention is not limited to the use of the display, and can be suitably used for display applications. The glass substrate for a display manufactured by using the present invention is not limited to the glass substrate for a TFT panel for driving, and includes, for example, a glass substrate for a color filter or a glass substrate for a cover glass. Further, the display device is not limited to a liquid crystal display or an organic EL display, and may be used for other displays.

Claims (12)

一種玻璃基板之製造方法,其係具有經研磨加工之處理部的玻璃基板之製造方法,上述處理部藉由與包含磁性體之研磨漿料接觸而被研磨,對經研磨之上述處理部供給清洗液,使上述處理部之表面與上述處理部上所附著之上述磁性體之表面同極性帶電,而使上述處理部與上述磁性體相互排斥,從而使上述磁性體移動至清洗液中。 A method for producing a glass substrate, comprising: a method of producing a glass substrate having a processed portion, wherein the processing portion is polished by contact with a polishing slurry containing a magnetic material, and the polishing portion is supplied with cleaning The liquid charges the surface of the processing portion and the surface of the magnetic body attached to the processing portion in the same polarity, and the processing portion and the magnetic body repel each other to move the magnetic body into the cleaning liquid. 一種玻璃基板之製造方法,其包括如下步驟:成形步驟,其由熔融玻璃成形玻璃板;切斷步驟,其將上述玻璃板切斷而形成玻璃基板;端面處理步驟,其藉由使由磁力體所保持之包含磁性體的研磨漿料接觸上述玻璃基板之端面而進行鏡面研磨;及清洗步驟,其使用pH值2以下之酸性化學藥液而清洗由接觸上述端面之上述磁性體產生之鐵系微粒子;並且上述清洗步驟之特徵為將構成上述鐵系微粒子之Fe3+還原為Fe2+離子,並藉由上述Fe2+離子之雙齒以上之配位而形成錯合物。 A method for producing a glass substrate, comprising: a forming step of forming a glass plate from molten glass; a cutting step of cutting the glass plate to form a glass substrate; and an end surface treatment step of causing the magnetic body The held polishing slurry containing the magnetic material is subjected to mirror polishing to the end surface of the glass substrate, and the cleaning step is performed by using an acidic chemical liquid having a pH of 2 or less to clean the iron system generated by the magnetic body contacting the end surface The microparticles are characterized in that the cleaning step is characterized in that Fe 3+ constituting the iron-based microparticles is reduced to Fe 2+ ions, and a complex compound is formed by coordination of the bidentate or more of the Fe 2+ ions. 如請求項2之玻璃基板之製造方法,其中上述酸性化學藥液包含2種以上之化學藥液,該化學藥液含有具有螯合效果之化學藥液。 The method for producing a glass substrate according to claim 2, wherein the acidic chemical solution contains two or more kinds of chemical liquids, and the chemical liquid contains a chemical liquid having a chelation effect. 如請求項2或3之玻璃基板之製造方法,其中上述清洗步驟具備用以接觸上述端面而物理清洗上述端面之清洗治具。 The method for producing a glass substrate according to claim 2 or 3, wherein the cleaning step includes a cleaning jig for physically cleaning the end surface in contact with the end surface. 如請求項3之玻璃基板之製造方法,其中上述具有螯合效果之化學藥液具有自Fe之正八面體之六配位之鐵離子中心起於xyz軸方向上以3Å以下之距離具有供電子基之分子結構。 The method for producing a glass substrate according to claim 3, wherein the chemical liquid having the chelate effect has an electron source from a six-coordinated iron ion center of the regular octahedron of Fe, and has an electron supply distance of 3 Å or less from the xyz axis direction. The molecular structure of the base. 如請求項3之玻璃基板之製造方法,其中上述具有螯合效果之化學藥液係選自由水楊酸、鄰苯二甲酸、乙醛酸、草酸、反丁烯二酸、順丁烯二酸、丙二酸、琥珀酸、葡萄糖酸、反式烏頭酸、羥基丙二酸、乳酸、丙酮酸、檸檬酸、異檸檬酸、乙醇酸、蘋果酸、酒石酸、次氮基三乙酸、乙二胺四乙酸、羥基乙基乙二胺三乙酸、二乙三胺五乙酸、絲胺酸、天冬胺酸、麩胺酸、及半胱胺酸所組成之群中之1種以上。 The method for producing a glass substrate according to claim 3, wherein the chemical liquid having the chelation effect is selected from the group consisting of salicylic acid, phthalic acid, glyoxylic acid, oxalic acid, fumaric acid, maleic acid. , malonic acid, succinic acid, gluconic acid, trans-aconitic acid, hydroxymalonic acid, lactic acid, pyruvic acid, citric acid, isocitric acid, glycolic acid, malic acid, tartaric acid, nitrilotriacetic acid, ethylenediamine One or more of the group consisting of tetraacetic acid, hydroxyethylethylenediaminetriacetic acid, diethylenetriaminepentaacetic acid, serine acid, aspartic acid, glutamic acid, and cysteine. 如請求項6之玻璃基板之製造方法,其中上述具有螯合效果之化學藥液係選自由草酸、酒石酸及檸檬酸所組成之群中之濃度被調整為0.5wt%以上之化學藥液。 The method for producing a glass substrate according to claim 6, wherein the chemical liquid having the chelating effect is selected from the group consisting of oxalic acid, tartaric acid and citric acid, wherein the concentration is adjusted to 0.5% by weight or more. 如請求項2之玻璃基板之製造方法,其中於上述清洗步驟之後步驟中具有第1沖洗步驟及第2沖洗步驟,上述第1沖洗步驟中係使用pH值3以下之化學藥液,上述第2沖洗步驟中係使用pH值超過3之化學藥液。 The method for producing a glass substrate according to claim 2, wherein the step of the cleaning step includes a first rinsing step and a second rinsing step, wherein the first rinsing step uses a chemical solution having a pH of 3 or less, and the second portion A chemical solution having a pH of more than 3 is used in the rinsing step. 一種顯示器用玻璃基板之製造方法,其包括如下步驟:成形步驟,其由熔融玻璃成形玻璃板;切斷步驟,其將上述玻璃板切斷而形成玻璃基板;端面處理步驟,其藉由使由磁力體所保持之包含磁性體的研磨漿料接觸上述玻璃基板之端面而進行鏡面研磨處理;清洗步驟,其利用酸性化學藥液清洗上述端面;並且上述端面處理步驟之特徵為使用研磨輪,上述研磨輪具備:具有與旋轉軸一同旋轉之第1磁力體及第2磁力體之磁場形成部、與包含磁性體研磨粒及液體且由形成於上述第1磁力體與上述第2磁力體之間之磁場所保持的含有上述磁性體之研磨漿料,於使上述旋轉軸進行旋轉之狀態下使含有上述磁性體之研磨 漿料與上述玻璃基板之端面接觸;上述清洗步驟之特徵為為了去除於上述端面處理步驟中由上述玻璃基板之端面上所附著之上述磁性體研磨粒所產生之鐵系微粒子,而使用pH值1.6以下之酸性化學藥液,將構成上述鐵系微粒子之Fe3+還原為Fe2+離子,使上述Fe2+離子之2處以上進行配位而形成錯合物。 A method for manufacturing a glass substrate for a display, comprising: a forming step of forming a glass plate from molten glass; a cutting step of cutting the glass plate to form a glass substrate; and an end surface treatment step by a polishing slurry containing a magnetic body held by the magnetic body is subjected to a mirror polishing treatment in contact with an end surface of the glass substrate; a cleaning step of cleaning the end surface with an acidic chemical liquid; and the end surface treatment step is characterized by using a grinding wheel, The grinding wheel includes: a magnetic field forming portion having a first magnetic body and a second magnetic body that rotate together with the rotating shaft, and a magnetic abrasive grain and a liquid, and is formed between the first magnetic body and the second magnetic body a polishing slurry containing the magnetic material held by the magnetic field, wherein the polishing slurry containing the magnetic body is brought into contact with an end surface of the glass substrate while rotating the rotating shaft; and the cleaning step is characterized in that In the end surface treatment step, the magnetic abrasive grains adhered to the end surface of the glass substrate are produced. The iron-based fine particles are used, and the Fe 3+ constituting the iron-based fine particles is reduced to Fe 2+ ions by using an acidic chemical liquid having a pH of 1.6 or less, and two or more of the Fe 2+ ions are coordinated to form a fault. Compound. 如請求項9之顯示器用玻璃基板之製造方法,其中上述端面處理步驟於上述鏡面研磨處理之前具有研削上述玻璃基板之端面之研削處理,上述研削處理之特徵為具有使用利用第1黏合劑固定有研磨粒之第1研削輪而研削上述玻璃基板之端面的第1研削處理、與於上述第1研削處理之後使用利用硬度及剛性低於上述第1黏合劑之第2黏合劑固定有研磨粒之第2研削輪而研削上述玻璃基板之端面的第2研削處理,上述鏡面研磨處理之特徵為上述研磨漿料中之上述磁性體研磨粒之濃度為85~95wt%。 The method for producing a glass substrate for a display according to claim 9, wherein the end surface treatment step has a grinding treatment for grinding an end surface of the glass substrate before the mirror polishing treatment, and the grinding treatment is characterized in that the polishing is fixed by using a first adhesive. Grinding the first grinding wheel of the abrasive grain, grinding the end surface of the glass substrate, and grinding the abrasive grain with the second adhesive having a lower hardness and rigidity than the first adhesive after the first grinding process The second grinding process for grinding the end surface of the glass substrate by the second grinding wheel is characterized in that the concentration of the magnetic abrasive grains in the polishing slurry is 85 to 95% by weight. 如請求項10之顯示器用玻璃基板之製造方法,其中上述第1黏合劑為金屬黏合劑,上述第2黏合劑為樹脂黏合劑。 The method for producing a glass substrate for a display according to claim 10, wherein the first binder is a metal binder, and the second binder is a resin binder. 如請求項10之顯示器用玻璃基板之製造方法,其中於上述研削處理中,上述玻璃基板之端面被研削至JIS B 0601-1994所規定之算術平均粗糙度Ra成為0.2μm以下,於上述鏡面研磨處理中,上述玻璃基板之端面被研磨至上述算術平均粗糙度Ra未達0.01μm。 The method for producing a glass substrate for a display according to claim 10, wherein in the grinding process, the end surface of the glass substrate is ground to an arithmetic mean roughness Ra defined by JIS B 0601-1994 to be 0.2 μm or less, and the mirror surface is polished. During the treatment, the end faces of the glass substrates were polished until the arithmetic mean roughness Ra was less than 0.01 μm.
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