TW201411696A - Led磊晶制程 - Google Patents

Led磊晶制程 Download PDF

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TW201411696A
TW201411696A TW101133911A TW101133911A TW201411696A TW 201411696 A TW201411696 A TW 201411696A TW 101133911 A TW101133911 A TW 101133911A TW 101133911 A TW101133911 A TW 101133911A TW 201411696 A TW201411696 A TW 201411696A
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epitaxial layer
epitaxial
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Ya-Wen Lin
Shih-Cheng Huang
Po-Min Tu
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Advanced Optoelectronic Tech
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Abstract

一種LED磊晶制程,包括以下的步驟:在基板的表面上生長緩衝層;在第一溫度下,在緩衝層的表面生長第一磊晶層;在低於第一溫度的第二溫度下,在第一磊晶層的表面生長第二磊晶層,從而使第二磊晶層的表面粗糙化;蝕刻的方法蝕刻第二磊晶層與第一磊晶層,直至將第二磊晶層的粗糙表面複刻至第一磊晶層;在第一磊晶層的粗糙表面沉積一層二氧化矽層;蝕刻二氧化矽層的頂面直至暴露出第一磊晶層,以形成多個凸起;以及在第一磊晶層上依次成長N型磊晶層、發光層以及P型磊晶層。

Description

LED磊晶制程
本發明涉及一種LED磊晶制程,尤其涉及一種具有較佳出光效率的LED磊晶制程。
發光二極體(Light Emitting Diode,LED)是一種可將電流轉換成特定波長範圍的光電半導體元件。發光二極體以其亮度高、工作電壓低、功耗小、易與積體電路匹配、驅動簡單、壽命長等優點,從而可作為光源而廣泛應用於照明領域。
在LED晶粒的生長過程中,由於LED的結構是以磊晶方式生長在藍寶石基板上,磊晶與藍寶石基板的晶格常數以及熱膨脹係數差異極大,所以會產生高密度線差排(Thread Dislocation),此種高密度線差排會限制LED的發光效率。此外,在LED的結構中,除了發光層(Active Layer)及其它磊晶層會吸收光以外,其半導體的高折射係數也會使得LED產生的光受到局限,且常產生全內反射使大部分從發光層發出的光線,被局限在半導體內部,這種被局限的光有可能被較厚的基板吸收。所以如何從半導體的發光層萃取光源,進而增加光萃取效率,是目前LED產業努力的課題。
有鑒於此,有必要提供一種具有較佳出光效率的LED磊晶制程。
一種LED磊晶制程,包括以下的步驟:
提供一個基板,在所述基板的表面上生長一個緩衝層;
在第一溫度下,在緩衝層的表面生長一個第一磊晶層;
在低於第一溫度的第二溫度下,在第一磊晶層的表面生長第二磊晶層,從而使第二磊晶層的表面粗糙化;
蝕刻第二磊晶層與第一磊晶層,直至將第二磊晶層的粗糙表面複刻至第一磊晶層;
在第一磊晶層的粗糙表面沉積一層二氧化矽層;
蝕刻所述二氧化矽層的頂面直至暴露出第一磊晶層,以形成多個凸起;以及
在第一類晶層上依次成長一個N型磊晶層、一個發光層以及一個P型磊晶層。
上述的LED磊晶制程中,由於第二磊晶層的表面為粗糙面,並且所述二氧化矽層的頂面以蝕刻方式形成多個凸起,藉由所述粗糙面以及所述凸起對光的反射、阻擋作用,所述LED磊晶結構的出光角度將較為狹窄,出光角度狹窄可具有集中光線的作用,有效提高所述LED晶粒的發光強度。
以下參照圖示,對本發明的LED磊晶制程進行進一步的說明。
請參見圖1,首先提供一個基板110。在本實施例中,所述基板110為藍寶石基板,所述藍寶石基板具有一個平坦的表面。
請參見圖2,在基板110上成長一個緩衝層120。
請參見圖3,在緩衝層120上成長一個第一磊晶層130。所述第一磊晶層130在第一溫度下生長。在本實施例中,所述第一溫度的溫度範圍為1100℃到1300℃。所述第一磊晶層130可以是未摻雜的GaN層或者是N型摻雜的GaN層。
請參見圖4,在第一磊晶層130上成長第二磊晶層140。所述第二磊晶層 140的生長過程在低於第一溫度的第二溫度下進行,從而在第二磊晶層140的頂面形成一個粗糙表面141。在本實施例中,所述第二溫度的溫度範圍為500℃到600℃。同樣地,所述第二磊晶層140可以是未摻雜的GaN層或者是N型摻雜的GaN層。
請參見圖5,採用電感耦合等離子蝕刻的方法蝕刻第二磊晶層140與第一磊晶層130,直至將第二磊晶層140的粗糙表面141蝕刻至第一磊晶層130之上。在上述蝕刻過程中,由於電感耦合等離子蝕刻的蝕刻厚度與蝕刻時間成正比關係,當第二磊晶層140的厚度較小的區域被蝕刻去除之後,所暴露出的第一磊晶層130的區域將會繼續被蝕刻。當第二磊晶層140被完全去除後,第二磊晶層140表面的形狀將會被複製到第一磊晶層130的表面,從而在第一磊晶層130上形成粗糙表面131。根據需要,亦可以藉由反應離子蝕刻(RIE, Reactive Ion Etching)蝕刻第二磊晶層140和第一磊晶層130,直至將第二磊晶層140的粗糙表面141複刻至第一磊晶層130之上。
請參見圖6,在第一磊晶層130的粗糙表面131上沉積一層二氧化矽層150。
請參見圖7,蝕刻所述二氧化矽層150的頂面直至暴露出第一磊晶層130,以在二氧化矽層150的頂面形成多個凸起151。所述凸起151的形狀並沒有限制,其可以是圓形、矩形或者多邊形。請參見圖8,所述凸起151為六邊形形狀,其排列成蜂巢形狀。請參見圖9,所述凸起151為圓形。所述凸起151的直徑為2微米到3微米之間。凸起151與凸起151之間形成有間隙152,所述間隙152的大小為1微米到2微米之間。在本實施例中,所述凸起151的直徑為3微米,凸起151與凸起151之間的間隙152為2微米。根據需要,所述凸起151的直徑也可以是2微米,相應的凸起151與凸起151之間的間隙152為1微米。
請參見圖10,在第一磊晶層130上依次成長一個N型磊晶層160、一個發光層170以及一個P型磊晶層180。在本實施例中,所述N型磊晶層160、發光層170以及P型磊晶層180的製作材料選自GaN、AlGaN、InGaN以及AlInGaN其中之一。
在上述LED晶粒的工作過程中,在P型磊晶層180與N型磊晶層160之間施加一個正向電壓,P型磊晶層180中的空穴以及N型磊晶層160中電子將會在發光層170中複合,能量以光線的形式釋放。由於二氧化矽層150的頂面形成有多個凸起151,並且第一磊晶層130上形成有粗糙表面131,所述粗糙表面131以及所述凸起151將會對發光層170所發出的光線產生阻擋以及反射作用,從而使發光層170所發出的光線向上集中,以有效提高所述LED晶粒的發光強度。
根據需要,所述LED磊晶制程並不限於上述實施方式。請參見圖11,在二氧化矽層150的頂面形成多個凸起151之後,可進一步在第一磊晶層130以及二氧化矽層150的表面形成一個覆蓋層190,然後再在覆蓋層190上依次成長一個N型磊晶層160、一個發光層170以及一個P型磊晶層180。所述覆蓋層190可以是氮化鋁(AlN)薄膜層,其在第一溫度下生長。所述氮化鋁薄膜層有助於後續N型磊晶層160、發光層170以及P型磊晶層180的沉積。
根據需要,所述基板110亦不限於上述實施方式。請參見圖12,所述基板110為圖案化的藍寶石基板,所述藍寶石基板的表面形成有多個凸起111。上述圖案化的藍寶石基板可替代第一實施例中的基板110,然後再在圖案化的藍寶石基板上生長後續的磊晶結構層。
綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。
110...基板
111...凸起
120...緩衝層
130...第一磊晶層
131...粗糙表面
140...第二磊晶層
141...粗糙表面
150...二氧化矽層
151...凸起
152...間隙
160...N型磊晶層
170...發光層
180...P型磊晶層
190...覆蓋層
圖1係本發明第一實施例所提供的LED磊晶制程的第一個步驟。
圖2係本發明第一實施例所提供的LED磊晶制程的第二個步驟。
圖3係本發明第一實施例所提供的LED磊晶制程的第三個步驟。
圖4係本發明第一實施例所提供的LED磊晶制程的第四個步驟。
圖5係本發明第一實施例所提供的LED磊晶制程的第五個步驟。
圖6係本發明第一實施例所提供的LED磊晶制程的第六個步驟。
圖7係本發明第一實施例所提供的LED磊晶制程的第七個步驟。
圖8係圖7中的二氧化矽層的俯視示意圖。
圖9係圖7中的二氧化矽層的另一實施例的俯視示意圖。
圖10係本發明第一實施例所提供的LED磊晶制程的第八個步驟。
圖11係本發明第二實施例所提供的LED磊晶制程的截面示意圖。
圖12係本發明第三實施例所提供的LED磊晶制程的截面示意圖。
110...基板
120...緩衝層
130...第一磊晶層
150...二氧化矽層
160...N型磊晶層
170...發光層
180...P型磊晶層

Claims (10)

  1. 一種LED磊晶制程,包括以下的步驟:
    提供基板,在所述基板的表面上生長緩衝層;
    在第一溫度下,在緩衝層的表面生長第一磊晶層;
    在低於第一溫度的第二溫度下,在第一磊晶層的表面生長第二磊晶層,從而使第二磊晶層的表面粗糙化;
    蝕刻第二磊晶層與第一磊晶層,直至將第二磊晶層的粗糙表面複刻至第一磊晶層;
    在第一磊晶層的粗糙表面沉積二氧化矽層;
    蝕刻所述二氧化矽層的頂面直至暴露出第一磊晶層,以形成多個凸起;以及
    在第一磊晶層上依次成長N型磊晶層、發光層以及P型磊晶層。
  2. 如申請專利範圍第1項所述之LED磊晶制程,其中,所述第一溫度的溫度範圍為1100℃-1300℃。
  3. 如申請專利範圍第2項所述之LED磊晶制程,其中,所述第二溫度的溫度範圍為500℃-600℃。
  4. 如申請專利範圍第1項所述之LED磊晶制程,其中,在形成多個凸起之後,進一步在第一磊晶層及二氧化矽層的表面形成覆蓋層,然後再在覆蓋層上依次成長所述N型磊晶層、所述發光層以及所述P型磊晶層,所述覆蓋層在第一溫度下生長。
  5. 如申請專利範圍第4項所述之LED磊晶制程,其中,所述覆蓋層為氮化鋁薄膜層。
  6. 如申請專利範圍第1項所述之LED磊晶制程,其中,所述凸起的直徑為2微米到3微米。
  7. 如申請專利範圍第1項所述之LED磊晶制程,其中,所述凸起與凸起之間形成有間隙,所述間隙的大小位於1微米到2微米之間。
  8. 如申請專利範圍第1項所述之LED磊晶制程,其中,所述基板為藍寶石基板,所藍寶石基板的頂面形成有多個凸起。
  9. 如申請專利範圍第1項所述之LED磊晶制程,其中,所述基板為藍寶石基板,所述藍寶石基板的頂面為平坦的表面。
  10. 如申請專利範圍第1項所述之LED磊晶制程,其中,所述N型磊晶層、發光層以及P型磊晶層的製作材料選自GaN、AlGaN、InGaN以及AlInGaN其中之一。
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