TW201408133A - Manufacturing device of organic el device and method of manufacturing organic el device and layer forming device and layer forming method - Google Patents

Manufacturing device of organic el device and method of manufacturing organic el device and layer forming device and layer forming method Download PDF

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Publication number
TW201408133A
TW201408133A TW102140479A TW102140479A TW201408133A TW 201408133 A TW201408133 A TW 201408133A TW 102140479 A TW102140479 A TW 102140479A TW 102140479 A TW102140479 A TW 102140479A TW 201408133 A TW201408133 A TW 201408133A
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Taiwan
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substrate
vapor deposition
processing
loading
chamber
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TW102140479A
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Chinese (zh)
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Tadashi Wakabayashi
Nobuhiro Nirasawa
Kenji Yumiba
Mikio Asada
Yukio Ochiai
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Hitachi High Tech Corp
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Priority claimed from JP2008227488A external-priority patent/JP4768001B2/en
Application filed by Hitachi High Tech Corp filed Critical Hitachi High Tech Corp
Publication of TW201408133A publication Critical patent/TW201408133A/en

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • C23C14/566Means for minimising impurities in the coating chamber such as dust, moisture, residual gases using a load-lock chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67201Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber

Abstract

The invention provides an organic apparatus manufacturing installation and/or a production method thereof or a film-forming device and/or a film-forming method, which have the advantages of small material damage, good economical efficiency, high productivity and high running rate. The organic EL apparatus manufacturing installation provided by the invention is characterized in that, N (more than 2) pieces of base plates are stored in the vacuum cavity, when coating the first base plate of the first sheet by vaporization using the evaporation source, the Nth base plate of the Nth sheet is movedinto the vacuum cavity, when coating the second base plate of the second sheet by vaporization using the evaporation source, the first base plate is moved out the vacuum cavity, or when coating the first base plate by vaporization, the positioning of the second base plate ends, through the coating period by vaporization and the same evaporation source, when coating the second base plate by vaporization, the first base plate is moved out from the vacuum cavity.

Description

有機電激發光裝置製造裝置及其製造方法以及成膜裝置及成膜方法 Organic electroluminescent device manufacturing device, manufacturing method thereof, film forming device and film forming method

本發明係關於有機電激發光(Electro Luminescence以下,亦簡稱為EL)裝置製造裝置及其製造方法以及成膜裝置及成膜方法,特別是關於適於藉由蒸鍍法製造的有機電激發光裝置製造裝置及其製造方法。 The present invention relates to an apparatus for manufacturing an organic electroluminescence (hereinafter referred to as EL) apparatus, a method of manufacturing the same, a film formation apparatus and a film formation method, and more particularly to an organic electroluminescence light suitable for being produced by an evaporation method. Device manufacturing apparatus and method of manufacturing the same.

作為製造有機電激發光裝置之有力方法有真空蒸鍍法。伴隨著顯示裝置的大型化,對於有機電激發光裝置也被要求其大型化,基板尺寸甚至達到1500mm×1850mm。 A powerful method for manufacturing an organic electroluminescent device is a vacuum evaporation method. With the increase in the size of the display device, the organic electroluminescent device is also required to be enlarged, and the substrate size is even 1500 mm × 1850 mm.

在一般的真空蒸鍍法,為了持續安定的蒸鍍,必須要控制使來自蒸發源的材料蒸發速度保持一定。使用電阻加熱或誘導加熱等方法加熱蒸鍍材料進行物理蒸鍍(PVC)的場合,蒸發速度的安定必須要花一定時間才能達成。因此來自蒸發源的材料蒸發並無法容易實現恰如打開關閉一個開關那樣地進行控制。 In the general vacuum evaporation method, in order to continue the stable vapor deposition, it is necessary to control the evaporation rate of the material from the evaporation source to be constant. When the vapor deposition material is heated by physical means such as resistance heating or induction heating to carry out physical vapor deposition (PVC), the evaporation speed must be stabilized in a certain period of time. Therefore, the evaporation of the material from the evaporation source cannot be easily controlled as if a switch was turned on and off.

作為這樣藉由真空蒸鍍法之有機電激發光裝置的製造之先行技術例如有下列專利文獻1與2。從前,如下列專 利文獻那樣係在真空蒸鍍室內放入1枚1枚處理對象之基板而進行處理。此外,在專利文獻1為了縮短處理時間,採用把基板搬入真空蒸鍍室之前進行對準(位置對準)之方法,而在專利文獻2採用使基板垂直而蒸鍍的方法。 The prior art for the production of the organic electroluminescent device by the vacuum evaporation method is as follows, for example, the following Patent Documents 1 and 2. Once upon a time, such as the following In the vacuum deposition chamber, a single substrate to be processed is placed in a vacuum deposition chamber for processing. Further, in Patent Document 1, in order to shorten the processing time, a method of performing alignment (position alignment) before the substrate is carried into the vacuum deposition chamber is employed, and Patent Document 2 employs a method of vapor-depositing the substrate vertically.

此外,伴隨著基板的大型化,對於可以藉由簡單的機構來進行高精度蒸鍍的基板搬送之要求也變得更高。作為一般的真空蒸鍍法之基板搬送方法,為了由下方蒸鍍有使蒸鍍面朝下而搬送之下面搬送法。在下面搬送法,下面為蒸鍍面,無法支撐同時作為蒸鍍面,有必要支撐在不作為顯示面使用之框部份而進行搬送。此外,伴隨著基板的大型化,將基板插入托盤而垂直搬送之垂直搬送法也被提出。關於基板搬送之先行技術,例如有下列之專利文獻1、3。 Further, as the size of the substrate increases, the demand for substrate transfer capable of performing high-precision vapor deposition by a simple mechanism is also increased. In the substrate transfer method of the general vacuum vapor deposition method, a lower conveyance method in which the vapor deposition surface is directed downward is vapor-deposited from below. In the following transfer method, the following is a vapor deposition surface, which cannot be supported as a vapor deposition surface, and it is necessary to support the transfer on a frame portion that is not used as a display surface. Further, as the size of the substrate is increased, a vertical transfer method in which a substrate is inserted into a tray and vertically transported is also proposed. Regarding the prior art of substrate transfer, for example, the following Patent Documents 1 and 3.

[先行技術文獻] [Advanced technical literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利特開2004-259638號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2004-259638

[專利文獻2]日本專利特開2007-177319號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2007-177319

[專利文獻3]日本專利特開2006-147488號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2006-147488

然而,如前所述為了使材料蒸發速度保持一定必須要使其維持蒸發。亦即,前述步驟之中不需要蒸鍍的基板搬出搬入、定位步驟等階段也必須要使其蒸發,其間由蒸發 源蒸發的材料對於蒸鍍步驟沒有貢獻,直接成為材料損失。在前述專利文獻1,雖然縮短對準時間,以謀求生產性的提高,也因此減低了材料損失,但是基板的搬出搬入很耗時間,並不是根本的解決對策。 However, as described above, in order to keep the evaporation rate of the material constant, it is necessary to maintain evaporation. In other words, in the step of carrying out the substrate loading and unloading, the positioning step, and the like, which are not required to be vapor-deposited, it is necessary to evaporate, and evaporate therebetween. The source evaporated material does not contribute to the evaporation step and directly becomes a material loss. In the above-described Patent Document 1, the alignment time is shortened, and the productivity is improved, so that the material loss is reduced. However, it takes a long time to carry out the loading and unloading of the substrate, and this is not a fundamental solution.

特別是有機電激發光材料很昂貴所以製品價格很高,對於有機電激發光裝置的普及造成很大的影響。此外,損失材料變多所以材料的交換頻率也變高,因而有裝置的工作時間減低之課題。 In particular, organic electroluminescent materials are expensive, so that the products are expensive, which has a great influence on the popularity of organic electroluminescent devices. In addition, since the amount of material lost is increased, the frequency of exchange of materials is also increased, and thus the working time of the device is reduced.

此外,蒸鍍步驟與其他步驟之處理時間幾乎相等,而有生產性不佳的課題。 In addition, the vapor deposition step is almost equal to the processing time of other steps, and there is a problem of poor productivity.

另一方面在下面搬送法,因為是僅保持框部份之搬送,所以伴隨著基板大型化之撓曲也變大。撓曲變大的話僅有框部份之保持力,所以必須要有特別的保持機構。此外,保持力不足的話,落下的危險性也很高。進而,撓曲的問題不僅影響搬送,在下面蒸鍍時也會影響到遮蔽遮罩的撓曲,兩者影響的結果會造成無法進行高精度蒸鍍之課題。此外,垂直搬送雖然可以解消撓曲的問題,但是必須要有搬送用托盤,該托盤亦為大型物,會有托盤導致搬送時放出粉塵或必須要有托盤的回收/洗淨機構等課題。 On the other hand, in the lower conveyance method, since only the frame portion is conveyed, the deflection accompanying the enlargement of the substrate also becomes large. If the deflection becomes large, only the holding force of the frame portion is required, so a special holding mechanism must be provided. In addition, if the holding power is insufficient, the risk of falling is also high. Further, the problem of deflection not only affects the conveyance, but also affects the deflection of the shadow mask when vapor deposition is performed below, and as a result of the influence of both, the problem of high-precision vapor deposition cannot be performed. In addition, although vertical conveyance can solve the problem of deflection, it is necessary to have a transfer tray, which is also a large object, and there is a problem that a tray may cause dust to be discharged during transportation or a tray recovery/cleaning mechanism.

因而,本發明之第一目的,在於提供材料的損失很少、經濟性佳之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方法。 Accordingly, a first object of the present invention is to provide an apparatus for producing an organic electroluminescent device, a method for producing the same, or a film forming apparatus or a film forming method, which has little loss of material and is economical.

此外,本發明之第二目的,在於提供生產性高之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方 法。 Further, a second object of the present invention is to provide a highly productive organic electroluminescent device manufacturing apparatus, a method of manufacturing the same, or a film forming apparatus or film forming method. law.

進而,本發明之第三目的,在於提供運轉率高之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方法。 Further, a third object of the present invention is to provide an apparatus for producing an organic electroluminescence device having a high operation rate, a method for producing the same, or a film formation device or a film formation method.

此外,本發明之第四目的,在於提供機構簡單可以上面搬送之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方法。 Further, a fourth object of the present invention is to provide an apparatus for manufacturing an organic electroluminescence device, a method for producing the same, or a film formation device or a film formation method, which can be transported on a simple mechanism.

此外,本發明之第五目的,在於提供於上面搬送也可以高精度地蒸鍍之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方法。 Further, a fifth object of the present invention is to provide an apparatus for producing an organic electroluminescent device which can be vapor-deposited on the upper surface, a method for producing the same, a film forming apparatus or a film forming method.

為了達成前述目的,以於前述真空室內收容N(N為2以上)枚基板,而在使第1枚之第1基板以前述蒸發源蒸鍍時,把第N枚之第N基板搬入前述真空室內,以前述蒸發源蒸鍍第2枚之第2基板時把前述第1基板由前述真空室內搬出為第1特徵。 In order to achieve the above object, the N (N is 2 or more) substrates are accommodated in the vacuum chamber, and when the first substrate is vapor-deposited by the evaporation source, the Nth Nth substrate is carried into the vacuum. When the second substrate of the second one is vapor-deposited by the evaporation source, the first substrate is carried out from the vacuum chamber as the first feature.

此外,為了達成前述目的,以在蒸鍍第1之前述基板時,結束第2之前述基板之前述位置對準,以與前述蒸鍍時相同的蒸發源蒸鍍前述第2之基板時把前述第1基板由前述真空室內搬出為第2特徵。 Further, in order to achieve the above object, when the first substrate is vapor-deposited, the alignment of the second substrate is completed, and the second substrate is deposited by the same evaporation source as that during the vapor deposition. The first substrate is carried out from the vacuum chamber to have a second feature.

進而,為了達成前述目的,以將基板由搬入加載互鎖(load-lock)室搬入,透過至少1台真空室,往搬出加載互鎖室搬送,而於前述真空室將蒸鍍材料蒸鍍於前述基板 時,使前述基板之蒸鍍面為上面而搬送,至少在使前述基板移動的場合保持前述基板之搬送面不滑動為第3特徵。 Further, in order to achieve the above object, the substrate is carried in a loading-lock chamber, passed through at least one vacuum chamber, and transported to the loading and unloading chamber, and the vapor deposition material is vapor-deposited in the vacuum chamber. The aforementioned substrate In this case, the vapor deposition surface of the substrate is transported on the upper surface, and at least when the substrate is moved, the transfer surface of the substrate is prevented from slipping to the third feature.

此外,為了達成前述目的,除了第1及第2特徵以外,還有使前述蒸發源移動至分別對個別基板而設的蒸鍍位置為第4特徵。 Further, in order to achieve the above object, in addition to the first and second features, the evaporation source is moved to a vapor deposition position provided for each individual substrate as a fourth feature.

進而,為了達成前述目的,除了第1及第2特徵以外,還有使前述位置對準所必要的遮蔽遮罩與前述基板成為一體而移動至前述蒸發源位置為第5特徵。 Further, in order to achieve the above object, in addition to the first and second features, the shielding mask necessary for the alignment is integrated with the substrate, and the movement to the evaporation source position is a fifth feature.

此外,為了達成前述目的,除了第1及第2特徵以外,還有使前述基板移動到前述蒸鍍的位置,之後實施前述位置對準為第6特徵。 Further, in order to achieve the above object, in addition to the first and second features, the substrate is moved to the position where the vapor deposition is performed, and then the alignment is performed to be the sixth feature.

進而,為了達成前述目的,除了第1至第3特徵以外,還有使前述基板在垂直立起的狀態實施前述蒸鍍,使以水平狀態搬送的前述基板成為垂直為第7特徵。 Furthermore, in order to achieve the above-described object, in addition to the first to third features, the substrate is subjected to the vapor deposition in a state in which the substrate is vertically raised, and the substrate that is conveyed in a horizontal state is turned into a seventh feature.

根據本發明,可以提供材料的損失很少、經濟性佳之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方法。 According to the present invention, it is possible to provide an apparatus for producing an organic electroluminescent device, a method for producing the same, or a film forming apparatus or a film forming method, which has little loss of material and is economical.

此外,根據本發明,可以提供生產性高之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方法。 Further, according to the present invention, it is possible to provide a highly productive organic electroluminescent device manufacturing apparatus, a method of manufacturing the same, or a film forming apparatus or a film forming method.

進而,根據本發明,可以提供運轉率高之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方法。 Further, according to the present invention, it is possible to provide an apparatus for producing an organic electroluminescence device having a high operation rate, a method for producing the same, a film formation device or a film formation method.

此外,根據本發明,可以提供構造簡單且可以進行上 面搬送之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方法。 Further, according to the present invention, it is possible to provide a simple structure and can be carried out An apparatus for producing an organic electroluminescence device, a method for producing the same, or a film formation device or a film formation method.

進而,根據本發明,可以提供於上面搬送亦可高精度蒸鍍之有機電激發光裝置製造裝置或其製造方法或成膜裝置或成膜方法。 Further, according to the present invention, it is possible to provide an apparatus for producing an organic electroluminescence device which can be transported on the upper surface or to perform high-precision vapor deposition, a method for producing the same, a film formation device or a film formation method.

1‧‧‧處理室 1‧‧‧Processing room

1bu‧‧‧真空蒸鍍室 1bu‧‧‧vacuum evaporation chamber

2‧‧‧搬送室 2‧‧‧Transport room

3‧‧‧裝載群組(cluster) 3‧‧‧Loading group (cluster)

4‧‧‧收授室 4‧‧‧Receiving room

5‧‧‧搬送機械臂 5‧‧‧Transporting robotic arm

6‧‧‧基板 6‧‧‧Substrate

7‧‧‧蒸鍍部 7‧‧‧Decanting Department

8‧‧‧對準部 8‧‧‧Alignment Department

9‧‧‧處理收授部 9‧‧‧Handling Department

10‧‧‧閘閥 10‧‧‧ gate valve

11‧‧‧隔板 11‧‧‧Baffle

20‧‧‧保持手段(黏接性橡膠) 20‧‧‧Maintenance means (adhesive rubber)

31‧‧‧加載互鎖(load-lock)室 31‧‧‧Load-lock room

41‧‧‧收授室之基板保持部 41‧‧‧Substrate retention unit

71‧‧‧蒸發源 71‧‧‧ evaporation source

81‧‧‧遮蔽遮罩(shadow:rmask) 81‧‧‧shadow mask (shadow:rmask)

92‧‧‧基板面控制手段 92‧‧‧Substrate surface control

100‧‧‧有機電激發光裝置之製造裝置 100‧‧‧Manufacturing device for organic electroluminescent device

A~D‧‧‧群組(cluster) A~D‧‧‧ group (cluster)

圖1係顯示本發明的實施形態之有機電激發光裝置之製造裝置之圖。 Fig. 1 is a view showing a manufacturing apparatus of an organic electroluminescent device according to an embodiment of the present invention.

圖2係顯示本發明之實施形態之搬送室2與處理室1的構成之概要。 Fig. 2 is a view showing the outline of the configuration of the transfer chamber 2 and the processing chamber 1 according to the embodiment of the present invention.

圖3係顯示本發明之實施形態之搬送室與處理室的構成之模式圖與動作說明圖。 Fig. 3 is a schematic view and an operation explanatory view showing a configuration of a transfer chamber and a processing chamber according to an embodiment of the present invention.

圖4係顯示遮蔽遮造(shadow mask)之圖。 Figure 4 is a diagram showing a shadow mask.

圖5係顯示本發明的實施形態之搬送機構之圖。 Fig. 5 is a view showing a conveying mechanism according to an embodiment of the present invention.

圖6係顯示本發明的實施形態之處理室1之處理流程之圖。 Fig. 6 is a view showing the processing flow of the processing chamber 1 according to the embodiment of the present invention.

圖7係說明使基板垂直立起而蒸鍍的理由之圖。 Fig. 7 is a view for explaining the reason why the substrate is vertically erected and vapor-deposited.

圖8(a)係顯示本發明的處理室之第2實施形態之圖。(b)係顯示本發明的處理室之第3實施形態之圖。 Fig. 8 (a) is a view showing a second embodiment of the processing chamber of the present invention. (b) is a view showing a third embodiment of the processing chamber of the present invention.

圖9係顯示本發明的處理室之第4實施形態之圖。 Fig. 9 is a view showing a fourth embodiment of the processing chamber of the present invention.

用圖1~圖5,說明本發明之第1實施形態。有機EL 裝置製造裝置,並不僅是形成發光材料層(EL層)而以電極夾住之構造,還包括在陽極之上形成正孔注入層或輸送層、在陰極上形成電子注入層或輸送層等種種材料形成薄膜而構成多層構造,或是洗淨基板等步驟。圖1顯示該製造裝置之一例。 A first embodiment of the present invention will be described with reference to Figs. 1 to 5 . Organic EL The device manufacturing device is not only a structure in which an electrode layer (EL layer) is formed but is sandwiched by electrodes, and includes a positive hole injection layer or a transport layer formed on the anode, an electron injection layer or a transport layer formed on the cathode, and the like. The material forms a film to form a multilayer structure, or a step of washing the substrate. Fig. 1 shows an example of the manufacturing apparatus.

本實施形態之有機EL裝置製造裝置100,大致係由搬入處理對象之基板6之裝載群組(cluster)3、處理基板6之4個群組(A~D)、在各群組間或群組與裝載群組3或次一步驟(密封步驟)之間設置的5個收授室4所構成。次一步驟之後方為了搬出基板之用至少設置如後述之加載互鎖(load-lock)室那樣的卸載互鎖(unload-lock)室(未圖示)。 In the organic EL device manufacturing apparatus 100 of the present embodiment, four groups (A to D) of the mounting group 3 and the processing substrate 6 of the substrate 6 to be processed are placed, and between groups or groups. The group consists of five receiving rooms 4 arranged between the loading group 3 or the next step (sealing step). In order to carry out the substrate after the next step, at least an unload-lock chamber (not shown) such as a load-lock chamber to be described later is provided.

裝載群組3,係由於前後具有維持真空之用的閘閥10之加載互鎖(load-lock)室31、由加載互鎖室31接取基板6(以下簡稱基板),旋轉而把基板6插入收授室4a之搬送機械臂5a所構成。各加載互鎖室31以及各收授室4於前後具有閘閥10,控制該閘閥10之開閉維持真空同時往裝載群組3或次一群組等收授基板。 The loading group 3 is inserted into the load-lock chamber 31 of the gate valve 10 for maintaining the vacuum before and after, and the substrate 6 (hereinafter referred to as the substrate) is picked up by the load-lock chamber 31, and the substrate 6 is inserted by rotation. The transport robot 5a of the reception room 4a is constituted. Each of the load lock chambers 31 and the receiving chambers 4 has a gate valve 10 in front and rear, and controls the opening and closing of the gate valve 10 to maintain a vacuum while receiving the substrate to the loading group 3 or the next group.

各群組(A~D),具有具一台搬送機械臂5之搬送室2、由搬送機械臂5收取基板,進行特定處理之在圖面上配置於上下的2個處理室1(第1個下標a~d代表群組,第2個下標u,d代表上側下側)。搬送室2與處理室1之間設有閘閥10。 Each of the groups (A to D) has a transfer chamber 2 having one transfer robot arm 5, and a substrate is received by the transfer robot 5, and the two processing chambers 1 disposed on the upper surface of the substrate are subjected to specific processing (first Subscripts a~d represent groups, the second subscript u, d represents the upper side of the upper side). A gate valve 10 is provided between the transfer chamber 2 and the processing chamber 1.

圖2係顯示搬送室2與處理室1的構成之概要。處理 室1的構成隨處理內容而不同,此處以在真空下蒸鍍發光材料形成EL層之真空蒸鍍室1bu為例進行說明。圖3係顯示搬送室2b與真空蒸鍍室1bu的構成之模式圖與動作說明圖。圖2之搬送機械臂5,具有可以使全體可以上下移動(參照圖3之箭頭53),左右旋轉的連結(link)構造之臂51,其前端分上下兩段具有基板搬送用之2個梳齒狀手部52。藉由使成為上下兩段,可使上段為搬入用,下段為搬出用,以1個動作同時進行搬出入處理。使其具有2個手部或1個手部是隨著處理內容而決定的。在以後之說明,為了簡化說明係以具有1個手部來進行說明。 FIG. 2 is a view showing the outline of the configuration of the transfer chamber 2 and the processing chamber 1. deal with The configuration of the chamber 1 differs depending on the processing contents. Here, a vacuum vapor deposition chamber 1bu in which an EL layer is formed by vapor deposition of a light-emitting material under vacuum will be described as an example. 3 is a schematic view and an operation explanatory view showing a configuration of the transfer chamber 2b and the vacuum vapor deposition chamber 1bu. The transport robot arm 5 of Fig. 2 has an arm 51 that can move up and down (see an arrow 53 in Fig. 3) and rotates left and right. The front end has two combs for substrate transport in two stages. Toothed hand 52. By making the upper and lower sections, the upper stage can be carried in, and the lower stage can be carried out, and the carry-in processing can be performed simultaneously in one operation. Making it 2 hands or 1 hand is determined by the content of the process. In the following description, in order to simplify the description, the description will be made with one hand.

另一方面,真空蒸鍍室1bu,大至係由使發光材料蒸發而蒸鍍於基板6之蒸鍍部7、及使蒸鍍於基板6之必要部分之對準部8、及進行搬送機械臂5與基板之授受,使基板6往蒸鍍部7移動之處理收授部9所構成。對準部8與處理收授部9設有右側R線與左側L線2個系統。處理收授部9,具有具可以與搬送機械臂6之梳齒狀手部52不相互干涉地收授基板6,而固定基板6的手段94之梳齒狀手部91,與使前述梳齒狀手部91旋轉而使基板6直立而移動使其面對對準部8或蒸鍍部7之基板面控制手段92。作為固定基板6之手段94,考慮在真空中下操作而使用電磁吸附或迴紋夾(clip)等手段。 On the other hand, the vacuum vapor deposition chamber 1bu is larger than the vapor deposition portion 7 which evaporates the light-emitting material on the substrate 6, and the alignment portion 8 which is required to be vapor-deposited on the substrate 6, and the conveyance mechanism. The processing and receiving unit 9 is configured such that the arm 5 and the substrate are transferred to and from the vapor deposition unit 7. The alignment unit 8 and the process receiving unit 9 are provided with two systems of a right R line and a left L line. The processing and receiving unit 9 has a comb-shaped hand portion 91 that can receive the substrate 6 without interfering with the comb-like hand portion 52 of the transport robot arm 6 and fix the substrate 6, and the comb tooth The handle portion 91 is rotated to move the substrate 6 upright and to face the alignment portion 8 or the substrate surface control means 92 of the vapor deposition portion 7. As means 94 for fixing the substrate 6, it is conceivable to use electromagnetic adsorption or a clip such as a clip in a vacuum operation.

對準部8,具有藉由圖4所示之由遮罩81m、框架81f所構成的遮蔽遮罩81與基板6上之對準標記84而使基板6與遮蔽遮罩81對準位置之對準驅動部83。蒸鍍部 7,具有使蒸發源71沿著軌道76上移動於上下方向之上下驅動手段72,及使蒸發源71沿著軌道75上移動於左右之對準部間之左右驅動基座74。蒸發源71,成為內部具有蒸鍍材料之發光材料,藉由加熱控制(未圖示)前述蒸鍍材料而得到安定的蒸發速度,如圖3之引伸圖所示,由線狀排列之複數噴射噴嘴73來噴射的構造。隨著需要,以可得到安定蒸鍍的方式同時加熱添加劑而進行蒸鍍。 The alignment portion 8 has a pair of alignment positions of the substrate 6 and the shielding mask 81 by the shielding mask 81 formed by the mask 81m and the frame 81f and the alignment mark 84 on the substrate 6 as shown in FIG. Quasi-drive unit 83. Evaporation department 7. The left and right drive bases 74 that move the evaporation source 71 along the rail 76 in the up and down direction and the upper and lower drive means 72, and move the evaporation source 71 along the rails 75 between the left and right alignment portions. The evaporation source 71 is a luminescent material having a vapor deposition material therein, and a stable evaporation rate is obtained by heating control (not shown) of the vapor deposition material. As shown in the extension diagram of FIG. 3, a plurality of ejections are arranged by linear arrangement. The configuration in which the nozzle 73 is ejected. If necessary, vapor deposition is carried out by simultaneously heating the additive in such a manner that stable vapor deposition is obtained.

以上,在說明的實施形態中,構成搬送機構的,是裝載群組3之加載互鎖(load-lock)室31、搬送機械臂5a、收授室4、搬送室2之搬送機械臂5以及處理室1之處理收授部9。這些可以大致區分為具有梳齒狀手部的搬送機械臂5,5a,以及該手部插入的加載互鎖(load-lock)室31、收授室4以及處理收授室9。透過這兩組進行交互作用而同時搬送基板6。 As described above, in the embodiment, the transport mechanism is the load-lock chamber 31, the transfer robot 5a, the reception room 4, and the transport robot 5 of the transfer chamber 2; The processing unit 9 of the processing chamber 1 is processed. These can be roughly classified into a transfer robot arm 5, 5a having a comb-shaped hand, and a load-lock chamber 31, a receiving room 4, and a process receiving chamber 9 into which the hand is inserted. The substrate 6 is simultaneously transported through the interaction of the two groups.

圖5係作為其一例,顯示對收授室4之基板保持部41插入搬送機械臂5之梳齒狀手部52,收取基板6的狀況與構成。基板6之上面係成為顯示面的被蒸鍍面,其下面為非顯示面。亦即,在從前之下面搬送僅在可接觸的框部保持著,在上面搬送則包含中央部都可以作為接觸區域利用所以可達成撓曲很少的安定的搬送。在圖5顯示具有梳齒狀手部52之2個機械臂,在收授室具有3根軌道狀之基板保持部41。於梳齒狀手部52之與基板6接觸的上面52u,被設有作為在手部旋轉時以基板不滑動的方式進 行保持之保持手段之黏接性橡膠20。面狀地貼附橡膠亦可但是黏接力太強的話必須要考慮到脫離性會變差。除了黏接性橡膠以外,考慮到真空環境亦可以適用電磁吸附等。 FIG. 5 shows an example in which the comb-like hand 52 of the transport robot 5 is inserted into the substrate holding portion 41 of the receiving room 4, and the state and configuration of the substrate 6 are collected. The upper surface of the substrate 6 is a vapor-deposited surface of the display surface, and the lower surface thereof is a non-display surface. In other words, the conveyance from the front lower side is held only in the contactable frame portion, and the conveyance on the upper side includes the center portion, which can be used as the contact area, so that the conveyance with little flexibility can be achieved. In Fig. 5, two robot arms having comb-like hands 52 are shown, and three orbital substrate holding portions 41 are provided in the receiving chamber. The upper surface 52u of the comb-shaped hand portion 52 that is in contact with the substrate 6 is provided so as to prevent the substrate from slipping when the hand is rotated. The adhesive rubber 20 is held in a row. It is also possible to attach rubber to the surface, but if the adhesion is too strong, it must be considered that the detachment will be deteriorated. In addition to the adhesive rubber, electromagnetic adsorption or the like can be applied in consideration of a vacuum environment.

其次,重點說明如何使高精度蒸鍍成為可能。圖6係顯示由圖1至圖3所示之處理室1之處理流程。本實施形態之處理的基本想法有二。 Second, focus on how to make high-precision evaporation possible. Fig. 6 is a view showing the processing flow of the processing chamber 1 shown in Figs. 1 to 3. There are two basic ideas for the processing of this embodiment.

首先,在一方生產線蒸鍍時,另一方之生產線則進行基板搬出搬入、位置對準、結束蒸鍍之準備。如發明所欲解決之課題那裡所說明的,蒸鍍的步驟,與對處理室1之基板搬出搬入作業等其他步驟所需要的時間幾乎相同,在本實施形態雙方分別為約略1分鐘。藉由交互進行此處理,可以減少浪費蒸鍍的時間。 First, when one of the production lines is vapor-deposited, the other production line prepares for substrate loading and unloading, positioning, and end of vapor deposition. As described in the problem to be solved by the invention, the step of vapor deposition is almost the same as the time required for other steps such as carrying out the substrate loading and unloading operation in the processing chamber 1, and in the present embodiment, each of them is approximately one minute. By performing this process interactively, the time for wasting evaporation can be reduced.

第二點,係使上面搬送的基板垂直立起,搬送至對準部8,而進行蒸鍍。搬送時基板6的下面若為蒸鍍面則有必要反轉,但因上面為蒸鍍面所以只要垂直立起即可。 The second point is that the substrate conveyed on the upper side is vertically erected and conveyed to the alignment portion 8 to be vapor-deposited. When the bottom surface of the substrate 6 is conveyed, it is necessary to reverse the surface of the vapor deposition surface. However, since the upper surface is the vapor deposition surface, it may be vertically raised.

使用圖7說明使基板垂直立起而蒸鍍的理由。如圖4所示對應於大型基板之遮蔽遮罩81的大小,為1800mm×2000mm程度,而且遮罩81m的厚度為40μm,今後還有更為薄化的傾向。在此,由下面蒸鍍的話基板的重量約5kg,遮罩81m的重量為200kg,所以對於遮罩81m因受到二者重量影響而有大幅的撓曲。在撓曲的基板以撓曲的遮罩81m進行蒸鍍,所以會蒸鍍到相鄰之色區域,產生色混濁的狀態使彩度掉落。在此,使基板6與遮蔽遮罩 81一起成為立起狀態解消撓曲,以得到高精度高彩度之色。 The reason why the substrate is vertically raised and vapor-deposited will be described with reference to Fig. 7 . As shown in FIG. 4, the size of the shielding mask 81 corresponding to the large substrate is about 1800 mm × 2000 mm, and the thickness of the mask 81 m is 40 μm, which tends to be thinner in the future. Here, when the vapor deposition is performed by the lower surface, the weight of the substrate is about 5 kg, and the weight of the mask 81 m is 200 kg. Therefore, the mask 81m is greatly deflected by the weight of both. Since the deflected substrate is vapor-deposited with the curved mask 81m, it is vapor-deposited to the adjacent color region, and the state of color turbidity causes the chroma to fall. Here, the substrate 6 and the mask are made 81 together become the state of the state to solve the deflection, in order to obtain high-precision and high-color color.

其次,參照圖3同時使用圖6,說明本實施形態之處理流程。於圖3,基板6存在之處以實線表示。 Next, the processing flow of this embodiment will be described with reference to Fig. 3 using Fig. 6 at the same time. In Fig. 3, the presence of the substrate 6 is indicated by a solid line.

首先,於R線(生產線)搬入基板6R,使基板6R垂直立起移動至對準部8R,進行位置對準(由步驟R1至步驟R3)。此時,垂直立起之後立刻進行位置對準,所以使蒸鍍面在上而搬送基板6。位置對準,係如圖3之延伸圖所示,以CCD攝影機86攝影,使設於基板6的對準標記84進入設在遮罩81m的窗85中心的方式,使遮蔽遮罩81R以前述對準驅動部83控制而進行的。本蒸鍍若為發出紅(R)光的材料,如圖4所示在對應餘遮罩81m之R的部分開有窗部,而在該部分被蒸鍍。該窗部的大小隨顏色而不同,平均為寬幅50μm、高度150μm程度。遮罩81m的厚度為40μm,今後還有更薄化的傾向。 First, the substrate 6R is carried in the R line (production line), and the substrate 6R is vertically erected and moved to the alignment portion 8R to be aligned (from step R1 to step R3). At this time, since the alignment is performed immediately after standing upright, the vapor deposition surface is placed on the substrate 6 to be transported. Positioning, as shown in the extension of FIG. 3, is photographed by the CCD camera 86 so that the alignment mark 84 provided on the substrate 6 enters the center of the window 85 provided in the mask 81m, so that the shielding mask 81R is as described above. The alignment is performed by the drive unit 83. In the case where the vapor deposition is a material that emits red (R) light, as shown in FIG. 4, a window portion is formed in a portion corresponding to R of the residual mask 81m, and the portion is vapor-deposited. The size of the window portion varies depending on the color, and is about 50 μm in width and 150 μm in height on average. The thickness of the mask 81m is 40 μm, and there is a tendency to be thinner in the future.

位置對準結束之後,使蒸發源71移動至R線側(步驟R4),其後使線狀之蒸發源71移動往上或下而進行蒸鍍(步驟R5)。於R線蒸鍍中,在L線與R線同樣地進行步驟L1至步驟L3之處理。亦即,搬入其他基板6L,使基板6L垂直立起移動至對準部8L,進行與遮蔽遮罩81L之位置對準。結束R線的基板6R之蒸鍍之後,蒸發源71移動至L線(步驟L4),蒸鍍在L線之基板6L(步驟L5)。此時蒸發源71由R線之蒸鍍區域完全離開之前,基板6R由對準部8R離開的話,會有進行不必要 的蒸鍍的可能,所以在完全離開之後,開始基板6R之由處理室1搬出的動作,其後進入新的基板6R的準備。為了避免前述不必要的蒸鍍而在生產線之間設有隔板11。又,圖3顯示步驟R5以及步驟L1之狀態。亦即在R線開始蒸鍍,在L線把基板搬入真空蒸鍍室1bu的狀態。 After the alignment is completed, the evaporation source 71 is moved to the R line side (step R4), and thereafter the linear evaporation source 71 is moved upward or downward to perform vapor deposition (step R5). In the R-line vapor deposition, the processing of steps L1 to L3 is performed in the same manner as the L line and the L line. That is, the other substrate 6L is carried in, and the substrate 6L is vertically erected and moved to the alignment portion 8L, and aligned with the position of the shielding mask 81L. After the vapor deposition of the substrate 6R of the R line is completed, the evaporation source 71 moves to the L line (step L4), and is vapor-deposited on the substrate 6L of the L line (step L5). At this time, before the evaporation source 71 is completely separated from the vapor deposition region of the R line, if the substrate 6R is separated by the alignment portion 8R, it may be unnecessary. Since it is possible to carry out vapor deposition, the operation of carrying out the substrate 6R by the processing chamber 1 is started, and then the preparation of the new substrate 6R is started. A partition 11 is provided between the production lines in order to avoid the aforementioned unnecessary evaporation. 3 shows the state of step R5 and step L1. That is, the vapor deposition is started on the R line, and the substrate is carried into the vacuum deposition chamber 1bu on the L line.

其後,藉由連續進行前述流程,根據本實施形態,可以在除了蒸發部7的移動時間以外,進行不浪費使用蒸鍍材料之蒸鍍。如前所述必要的蒸鍍時間與其他處理時間約為1分鐘,蒸發源71的移動時間為5秒鐘的話,從前長達1分鐘的無謂浪費的蒸鍍時間在本實施形態可以縮短為5秒鐘。 Thereafter, by continuously performing the above-described flow, according to the present embodiment, it is possible to perform vapor deposition without using a vapor deposition material in addition to the movement time of the evaporation portion 7. When the evaporation time required for the above-described evaporation time and the other processing time are about 1 minute, and the movement time of the evaporation source 71 is 5 seconds, the vapor deposition time of the wasteful time of up to 1 minute can be shortened to 5 in this embodiment. Seconds.

此外,根據本實施形態,如圖6所示真空蒸鍍室1bu之處理1枚基板的處理週期在實質上成為蒸鍍時間+蒸發源71的移動時間,所以可提高生產性。評估在前述條件下的處理時間的話,相對於從前的2分鐘,在本實施形態可以縮短為1分5秒,把生產性提高至約略2倍。 Further, according to the present embodiment, as shown in FIG. 6, the processing cycle of one substrate for the vacuum vapor deposition chamber 1bu is substantially the vapor deposition time + the movement time of the evaporation source 71, so that the productivity can be improved. When the processing time under the above conditions is evaluated, the present embodiment can be shortened to 1 minute and 5 seconds with respect to the previous 2 minutes, and the productivity is improved to approximately 2 times.

進而,對相同量的蒸鍍材料而言蒸鍍部7消耗的時間,雖與從前例沒有不同,但是生產量變成2倍,因而減低附著於真空室壁的材料附著量,因此對於室壁等的附著之維修循環時間以及所要時間也可以縮短。結果,根據本實施形態可以提高裝置的運轉率。 Further, the time required for the vapor deposition unit 7 to be the same amount of the vapor deposition material is not different from that of the previous example, but the production amount is doubled, so that the amount of material adhering to the vacuum chamber wall is reduced, so that the chamber wall or the like is used. The maintenance cycle time and the required time for attachment can also be shortened. As a result, according to the present embodiment, the operation rate of the apparatus can be improved.

在前述實施形態,在一個處理裝置之中對一個蒸鍍部7設有對準部8、處理收授部9所構成之2系統之處理線。例如,蒸鍍時間為30秒,其他處理時間為1分鐘的 話,在一個處理裝置之中對一個蒸鍍部7設有3個處理線也可以同樣得到很大的效果。 In the above-described embodiment, the processing line of the two systems including the alignment unit 8 and the processing and receiving unit 9 is provided to one vapor deposition unit 7 in one processing apparatus. For example, the evaporation time is 30 seconds, and the other processing time is 1 minute. In the case where three processing lines are provided to one vapor deposition unit 7 in one processing apparatus, a large effect can be obtained in the same manner.

此外,根據本實施形態,於具有蒸鍍裝置之裝置能夠以簡單的構造達成上面搬送。 Further, according to the present embodiment, the apparatus having the vapor deposition device can achieve the above-described conveyance with a simple structure.

進而,根據本實施形態,進行上面搬送使基板立起而蒸鍍,所以可對基板高精度且高彩度地蒸鍍。 Further, according to the present embodiment, since the substrate is lifted up and vapor-deposited by the upper surface transfer, the substrate can be vapor-deposited with high precision and high chroma.

其次,使用圖8說明第2、第3實施形態。在第1實施形態,蒸發源71移動而進行處理,在本實施形態,圖8(a)顯示對準部8移動之例,圖8(b)顯示處理收授部9移動之例。基本的動作與實施形態1相同。 Next, the second and third embodiments will be described with reference to Fig. 8 . In the first embodiment, the evaporation source 71 is moved and processed. In the present embodiment, FIG. 8(a) shows an example in which the alignment unit 8 moves, and FIG. 8(b) shows an example in which the processing reception unit 9 moves. The basic operation is the same as that of the first embodiment.

首先,說明圖8(a)之由處理收授部9收取而保持基板6的對準部8進行移動而處理之例。又,於圖6,基板6、對準部8以及處理收授部9存在之處以實線表示。 First, an example will be described in which the processing unit 9 of FIG. 8(a) collects and holds the alignment unit 8 of the substrate 6 and moves it. Further, in Fig. 6, the substrate 6, the alignment portion 8, and the processing and receiving portion 9 are indicated by solid lines.

首先,於R線(生產線)搬入基板6R,使基板6R垂直立起使基板6R移動至對準部8R,進行位置對準。其後,對準部8R、8L藉由對準基座8B成為一體在到達蒸鍍部之前往左方移動。又,對準部8R、8L亦可為個別左右移動之構造。作為該移動機構(未圖示),亦可使用與實施形態1同樣設有軌道,而使移動於其上之方法。其次進行基板6R之蒸鍍。基板6R蒸鍍時,對準部8L來到處理收授部9L之前,所以可收授其他基板6L,進行位置對準等之處理。基板6R之蒸鍍處理結束之後,對準部8R、8L成為一體而在到達蒸鍍部7之前往右移動,進行基板6L之蒸鍍處理。這次,對準部8R來到處理收授部9R之 前,可以收授其他基板6R進行下一蒸鍍的準備。又,圖8(a)顯示在蒸鍍基板6L時,基板6R在對準部8R被收取之情形。 First, the substrate 6R is carried in the R line (production line), the substrate 6R is vertically raised, and the substrate 6R is moved to the alignment portion 8R to be aligned. Thereafter, the alignment portions 8R and 8L are integrally moved to the left side by reaching the vapor deposition unit by the alignment base 8B. Further, the alignment portions 8R and 8L may be configured to move individually to the left and right. As the moving mechanism (not shown), a method in which a rail is provided in the same manner as in the first embodiment and is moved thereon can be used. Next, vapor deposition of the substrate 6R is performed. When the substrate 6R is vapor-deposited, the alignment portion 8L comes before the process receiving portion 9L. Therefore, the other substrate 6L can be received and processed such as alignment. After the vapor deposition process of the substrate 6R is completed, the alignment portions 8R and 8L are integrated and moved to the right after reaching the vapor deposition unit 7, and the vapor deposition process of the substrate 6L is performed. This time, the alignment portion 8R comes to the processing receiving portion 9R. Before, the other substrate 6R can be prepared for the next vapor deposition. Further, Fig. 8(a) shows a case where the substrate 6R is received in the alignment portion 8R when the substrate 6L is vapor-deposited.

根據本實施形態,對於蒸鍍材料使用量的降低,生產性的提高等效果,可以得到與實施形態1同樣大的效果。 According to the present embodiment, effects such as reduction in the amount of use of the vapor deposition material and improvement in productivity can be obtained as large as in the first embodiment.

其次,說明圖8(b)之處理收授部9移動而進行處理之例。在此場合,對準部8與蒸鍍部7是固定的。處理收授部9R、9L成為一體而往左右移動。又,處理收授部9R、9L亦可為個別左右移動之構造。在本例,係處理收授部9移動,使基板垂直立起,進行位置對準,而進行蒸鍍。進行蒸鍍時,可以進行另一方基板的搬入與新的基板的搬入。又,圖6(b)顯示在蒸鍍基板6L時,基板6R被搬入處理收授部9R之情形。 Next, an example in which the process receiving unit 9 of FIG. 8(b) moves and performs processing will be described. In this case, the alignment portion 8 and the vapor deposition portion 7 are fixed. The processing and receiving units 9R and 9L are integrated and moved to the left and right. Further, the process receiving units 9R and 9L may be configured to move individually to the left and right. In this example, the processing unit 9 is moved, the substrate is vertically raised, and the alignment is performed to perform vapor deposition. When performing vapor deposition, it is possible to carry in the other substrate and carry in the new substrate. Moreover, FIG. 6(b) shows a case where the substrate 6R is carried into the process receiving portion 9R when the substrate 6L is vapor-deposited.

亦即,本實施形態,與前2個實施形態相比效果較小,但與從前例相比同樣還是多少可以得到一些效果。 That is, this embodiment has a smaller effect than the first two embodiments, but it is somewhat more effective than the previous example.

此外,根據第2、第3實施形態的話,能夠以簡單的構造進行上面搬送,可以使上面搬送之基板幾乎垂直立起而高精度高彩度地進行蒸鍍。 Further, according to the second and third embodiments, the upper surface can be conveyed with a simple structure, and the substrate that has been transported on the upper surface can be almost vertically erected, and the vapor deposition can be performed with high precision and high chroma.

此外,於以上之實施形態之說明,蒸鍍部7、對準部8以及處理收授部9係設於同一真空室,但中介著閘閥而進行真空室之間的移動,亦可以把蒸鍍部7設於處理室,把對準部8及處理收授部9設於搬送室等。 Further, in the above embodiment, the vapor deposition unit 7, the alignment unit 8, and the process receiving unit 9 are disposed in the same vacuum chamber, but the gate valve is interposed to move between the vacuum chambers, and the vapor deposition may be performed. The portion 7 is provided in the processing chamber, and the alignment portion 8 and the processing receiving portion 9 are provided in the transfer chamber or the like.

以上之實施形態係針對使基板6之蒸鍍面在上而搬送的場合來進行說明。作為此點之其他的基板之搬送方法, 亦有使蒸鍍面在下而搬送的方法、把基板放入箱內立起搬送的方法。以下所述之實施例,雖無法發揮上面搬送之效果,但可以發揮減少無謂浪費進行蒸鍍的時間之效果。 The above embodiment will be described with respect to the case where the vapor deposition surface of the substrate 6 is transported up. As a method of transporting other substrates at this point, There is also a method of transporting the vapor deposition surface underneath, and a method of placing the substrate in the tank and lifting it. In the examples described below, the effect of the above conveyance cannot be exhibited, but the effect of reducing the time required for vapor deposition can be exhibited.

使蒸鍍面在下的場合,有必要由下方進行蒸鍍處理,所以於前述實施形態之蒸鍍時,只要是維持了基板6、對準部8以及蒸鍍部7之位置關係的配置構造即可,作為處理流程省略使基板垂直立起之處理即可。例如圖9係使蒸鍍面在下的場合之對應於圖3的案例之實施形態,構造上是在處理收授部9R、9L之下配置對準部8R、8L,於該對準部8R、8L之下設有蒸鍍部7,蒸發源71可以移動於兩對準部間之構造。 When the vapor deposition surface is placed below, it is necessary to carry out the vapor deposition treatment from the lower side. Therefore, in the vapor deposition process of the above-described embodiment, the positional relationship between the substrate 6, the alignment portion 8, and the vapor deposition portion 7 is maintained. Alternatively, the process of erecting the substrate vertically may be omitted as the processing flow. For example, FIG. 9 corresponds to the embodiment of the example of FIG. 3 in the case where the vapor deposition surface is below, and the alignment portions 8R and 8L are disposed under the processing receiving portions 9R and 9L, and the alignment portion 8R, Below the 8L, a vapor deposition portion 7 is provided, and the evaporation source 71 can be moved between the two alignment portions.

其次,於立起搬送的場合,只要省掉使基板垂直立起的處理就可以適用前述實施形態。 Next, in the case of erecting and transporting, the above embodiment can be applied as long as the process of vertically erecting the substrate is omitted.

以上,如說明的內容,對於蒸發源之有效利用之下降,無論搬送方法之內容如何均可以適用本發明。 As described above, the present invention can be applied to the decline in the effective use of the evaporation source regardless of the content of the transfer method.

另一方面,相關於上面搬送之本發明於以上之實施形態之說明,係使搬送系統構成於真空內,但亦可如專利文獻3所示那樣揭示了在真空處理室之前在真空外設有滑移裝置,在處理室之前使機械臂伸縮而搬進搬出基板。於這樣的裝置,由前述滑移裝置、伸縮機械臂、往處理室之搬出搬入裝載部以及處理室內之處理收授部所構成的搬送系亦可以適用本發明。 On the other hand, the present invention relating to the above-described embodiment is described in the above embodiment, in which the transport system is configured in a vacuum, but as disclosed in Patent Document 3, it is disclosed that the vacuum processing chamber is provided outside the vacuum chamber. The slip device expands and contracts the robot arm before loading and unloading the substrate before the processing chamber. In such a device, the present invention can also be applied to a transport system including the slip device, the telescopic robot arm, the transport-loading unit to the processing chamber, and the processing and receiving unit in the processing chamber.

最後,在前述說明以有機EL裝置為例來進行說明,但對於進行與有機EL裝置有相同背景的蒸鍍處理之成膜 裝置及成膜方法亦可以適用。 Finally, in the above description, an organic EL device will be described as an example, but a film deposition process having the same background as that of the organic EL device is performed. The device and the film forming method are also applicable.

1‧‧‧處理室 1‧‧‧Processing room

5‧‧‧搬送機械臂 5‧‧‧Transporting robotic arm

6‧‧‧基板 6‧‧‧Substrate

51‧‧‧臂 51‧‧‧ Arm

52‧‧‧梳齒狀手部 52‧‧‧ comb-toothed hand

53‧‧‧箭頭 53‧‧‧ arrow

71‧‧‧蒸發源 71‧‧‧ evaporation source

73‧‧‧複數噴射噴嘴 73‧‧‧Multiple spray nozzles

74‧‧‧驅動基座 74‧‧‧Drive base

75‧‧‧軌道 75‧‧‧ Track

76‧‧‧軌道 76‧‧‧ Track

81‧‧‧遮蔽遮罩(shadow mask) 81‧‧‧shadow mask

84‧‧‧標記 84‧‧‧ mark

85‧‧‧窗 85‧‧‧ window

86‧‧‧CCD攝影機 86‧‧‧CCD camera

91‧‧‧梳齒狀手部 91‧‧‧ comb-toothed hand

92‧‧‧基板面控制手段 92‧‧‧Substrate surface control

94‧‧‧手段 94‧‧ means

L,R‧‧‧線 L, R‧‧‧ line

Claims (10)

一種有機電激發光裝置製造裝置,係具有搬入基板的搬入裝載室,具有位置對準前述基板與蒸鍍位置之遮蔽遮罩而將蒸鍍材料蒸鍍於前述基板之至少1台真空室,搬出前述基板的搬出裝載室,以及將前述基板由前述搬入裝載室往前述搬出裝載室搬送的搬送機構,其特徵為:前述真空室具有:收授前述基板,使前述基板垂直或約略垂直地立起而面對存在於進行蒸鍍的位置之遮蔽遮罩之基板面控制手段的第1處理收授部及第2處理收授部,以及在蒸鍍透過前述第1處理收授部搬入的第1之基板時,使透過前述第2處理收授部搬入的第2之基板結束前述位置對準,以蒸鍍第1之前述基板的蒸鍍源來蒸鍍第2之前述基板時,把第1之前述基板由前述真空室內搬出的蒸鍍手段;前述搬送機構除了前述第1處理收授部及前述第2處理收授部以外使前述基板之蒸鍍面為上面而搬送。 An apparatus for manufacturing an organic electroluminescence device, comprising: a loading and loading chamber loaded into a substrate; and a mask having a position of the substrate and a vapor deposition position; and vapor-depositing the vapor deposition material in at least one vacuum chamber of the substrate, and carrying out a loading and unloading chamber of the substrate, and a transport mechanism for transporting the substrate from the loading and unloading chamber to the loading and unloading chamber, wherein the vacuum chamber has a substrate that is erected vertically or approximately vertically. The first processing receiving unit and the second processing receiving unit that face the substrate surface control means for the masking at the position where the vapor deposition is performed, and the first processing carried in the vapor deposition through the first processing receiving unit In the case of the substrate, the second substrate that has been transported through the second processing and receiving unit is aligned, and the second substrate is vapor-deposited by vapor deposition of the first substrate, and the first substrate is deposited. The deposition means is carried out by the vapor deposition means carried out in the vacuum chamber, and the transfer means transports the vapor deposition surface of the substrate to the upper surface in addition to the first process receiving portion and the second process receiving portion. 如申請專利範圍第1項之有機電激發光裝置製造裝置,其中前述搬送機構之中至少在使前述基板移動的機構部具有保持前述基板的保持手段。 The apparatus for manufacturing an organic electroluminescence device according to the first aspect of the invention, wherein the mechanism unit that moves the substrate is at least a holding means for holding the substrate. 如申請專利範圍第2項之有機電激發光裝置製造裝置,其中前述保持手段係被設於使前述基板移動之機構部上面的黏接性橡膠。 The apparatus for manufacturing an organic electroluminescence device according to the second aspect of the invention, wherein the holding means is an adhesive rubber provided on a surface of a mechanism portion for moving the substrate. 如申請專利範圍第1至3項之任一項之有機電激發光裝置製造裝置,其中前述蒸鍍手段,具有使前述蒸發源移動於前述第1基板與前述第2基板之間的驅動基座。 The apparatus for manufacturing an organic electroluminescence device according to any one of claims 1 to 3, wherein the vapor deposition means has a driving base for moving the evaporation source between the first substrate and the second substrate . 如申請專利範圍第1至3項之任一項之有機電激發光裝置製造裝置,其中前述蒸鍍手段,具有使進行了前述位置對準的前述基板與前述遮蔽遮罩移動至前述遮鍍源側的手段。 The apparatus for manufacturing an organic electroluminescence device according to any one of claims 1 to 3, wherein the vapor deposition means has the substrate and the mask to be aligned to the mask source Side means. 如申請專利範圍第1至3項之任一項之有機電激發光裝置製造裝置,其中前述蒸鍍手段,具有使前述第1及第2處理收授部依序移動至前述遮鍍源側的移動機構。 The apparatus for manufacturing an organic electroluminescence device according to any one of claims 1 to 3, wherein the vapor deposition means has the first and second treatment receiving portions sequentially moved to the side of the shielding source Mobile agency. 一種有機電激發光裝置製造方法,係把基板由搬入裝載室搬入,透過至少1台真空室,往搬出裝載室搬送,於前述真空室位置對準前述基板與遮蔽遮罩之蒸鍍位置,將蒸鍍材料蒸鍍於前述基板,其特徵為:使前述基板的蒸鍍面為上面進行搬送,把使蒸鍍面為上面而被搬送來的前述基板在前述真空室內的第1或第2處理收授部收授,在蒸鍍透過前述第1處理收授部搬入的第1基板時,使透過前述第2處理收授部搬入的第2基板結束前述位置對準,以蒸鍍前述第1基板的蒸鍍源來蒸鍍前述第2基板時,把前述第1基板由前述真空室內搬出,前述蒸鍍係使前述第1及第2基板垂直或約略垂直地立起而面對著存在於進行蒸鍍的位置之遮蔽遮罩而進行的。 A method for manufacturing an organic electroluminescence device, wherein a substrate is carried into a loading chamber, passed through at least one vacuum chamber, and transported to a loading and unloading chamber, and the vapor deposition position of the substrate and the shielding mask is aligned at the vacuum chamber. The vapor deposition material is deposited on the substrate, and is characterized in that the vapor deposition surface of the substrate is transported on the upper surface, and the first or second processing in the vacuum chamber is performed by transferring the vapor deposition surface to the upper surface. When the first substrate loaded in the first processing receiving unit is vapor-deposited, the second substrate that has been transported through the second processing receiving unit ends the alignment, and the first portion is vapor-deposited. When the second substrate is deposited by the vapor deposition source of the substrate, the first substrate is carried out from the vacuum chamber, and the vapor deposition system causes the first and second substrates to stand vertically or approximately vertically to face each other. It is carried out by masking the mask at the position where the vapor deposition is performed. 如申請專利範圍第7項之有機電激發光裝置製造方法,其中至少在移動前述基板的場合以前述基板的搬送面不滑動的方式予以保持。 The method of manufacturing an organic electroluminescence device according to claim 7, wherein at least the substrate is moved so that the transfer surface of the substrate does not slide. 一種成膜裝置,係具有搬入基板的搬入裝載室,具有位置對準前述基板與蒸鍍位置之遮蔽遮罩而將蒸鍍材料 蒸鍍於前述基板之至少1台真空室,搬出前述基板的搬出裝載室,以及將前述基板由前述搬入裝載室往前述搬出裝載室搬送的搬送機構,其特徵為:前述真空室具有:收授前述基板,使前述基板垂直或約略垂直地立起而面對存在於進行蒸鍍的位置之遮蔽遮罩之基板面控制手段的第1處理收授部及第2處理收授部,以及在蒸鍍透過前述第1處理收授部搬入的第1之基板時,使透過前述第2處理收授部搬入的第2之基板結束前述位置對準,以蒸鍍第1之前述基板的蒸鍍源來蒸鍍第2之前述基板時,把第1之前述基板由前述真空室內搬出的蒸鍍手段;前述搬送機構除了前述第1處理收授部及前述第2處理收授部以外使前述基板之蒸鍍面為上面而搬送。 A film forming apparatus having a loading and unloading chamber loaded into a substrate and having a shielding mask that is aligned with the substrate and the vapor deposition position to vaporize the material a transfer mechanism that vapor-deposits at least one vacuum chamber of the substrate, carries out the loading and unloading chamber of the substrate, and transports the substrate from the loading/unloading chamber to the loading and unloading chamber, wherein the vacuum chamber is provided with: In the substrate, the first processing receiving unit and the second processing receiving unit that face the substrate surface control means that are present in the mask mask at the position where the vapor deposition is performed, and the substrate is raised vertically or approximately vertically. When the first substrate carried in the first processing and receiving unit is plated, the second substrate that has been inserted through the second processing and receiving unit is finished, and the first alignment is performed to vaporize the vapor deposition source of the first substrate. When the second substrate is vapor-deposited, the first substrate is carried out by the vapor deposition means in the vacuum chamber, and the transfer means is made of the substrate other than the first process receiving portion and the second process receiving portion. The vapor deposition surface is transferred to the top. 一種成膜方法,係把基板由搬入裝載室搬入,透過至少1台真空室,往搬出裝載室搬送,於前述真空室位置對準前述基板與遮蔽遮罩之蒸鍍位置,將蒸鍍材料蒸鍍於前述基板,其特徵為:使前述基板的蒸鍍面為上面進行搬送,把使蒸鍍面為上面而被搬送來的前述基板在前述真空室內的第1或第2處理收授部收授,在蒸鍍透過前述第1處理收授部搬入的第1基板時,使透過前述第2處理收授部搬入的第2基板結束前述位置對準,以蒸鍍前述第1基板的蒸鍍源來蒸鍍前述第2基板時,把前述第1基板由前述真空室內搬出,前述蒸鍍係使前述第1及第2基板垂直或約略垂直地立起而面對著存在於進行蒸鍍的位置之遮蔽遮罩而進行的。 A film forming method is carried out by loading a substrate into a loading chamber, passing through at least one vacuum chamber, and transporting it to a loading and unloading chamber, aligning the vapor deposition position of the substrate and the mask in the vacuum chamber, and steaming the vapor deposition material. The substrate is plated on the substrate, and the vapor deposition surface of the substrate is transported on the upper surface, and the substrate that has been transported on the vapor deposition surface is placed in the first or second processing receiving portion of the vacuum chamber. When the first substrate carried in the first processing and receiving unit is vapor-deposited, the second substrate that has been transported through the second processing and receiving unit is finished, and the vapor deposition is performed on the first substrate. When the second substrate is vapor-deposited, the first substrate is carried out from the vacuum chamber, and the vapor deposition system causes the first and second substrates to stand vertically or approximately vertically, and faces the vapor deposition. The position is masked by the mask.
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