TW201332768A - Method for producing electronic device - Google Patents

Method for producing electronic device Download PDF

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Publication number
TW201332768A
TW201332768A TW101137512A TW101137512A TW201332768A TW 201332768 A TW201332768 A TW 201332768A TW 101137512 A TW101137512 A TW 101137512A TW 101137512 A TW101137512 A TW 101137512A TW 201332768 A TW201332768 A TW 201332768A
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Taiwan
Prior art keywords
glass substrate
electronic device
layer
resin composition
peelable
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TW101137512A
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Chinese (zh)
Inventor
Kenichi Ebata
Daisuke Uchida
Junichi Kakuta
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Asahi Glass Co Ltd
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Publication of TW201332768A publication Critical patent/TW201332768A/en

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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303Apparatus specially adapted to the manufacture of LCDs
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • B32B17/10Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
    • B32B17/10005Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin laminated safety glass or glazing
    • B32B17/10009Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin laminated safety glass or glazing characterized by the number, the constitution or treatment of glass sheets
    • B32B17/10128Treatment of at least one glass sheet
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1313Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells specially adapted for a particular application
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/041Provisions for preventing damage caused by corpuscular radiation, e.g. for space applications
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Abstract

A manufacturing method of an electronic device capable of including a fissility glass substrate and a member for the electronic device is provided to provide the manufacturing method of the electronic device in which the productivity is excellent, and uses a carrier substrate including a resin layer with excellent flatness. A manufacturing method of an electronic device prepares a surface treatment process(S102) obtaining a fissility glass substrate having a surface showing an easy fissility by treating a first main surface of the glass substrate having the first main surface and a second main surface with a fissility material. By covering a curing resin composition layer on a surface showing an easy fissility of the fissility glass substrate, the curing resin composition layer formation process(S104) forming a hardening property resin composition layer is prepared. A lamination process (S106) is prepared to obtain the former hardening laminate layer by laminating a carrier substrate, having a smaller outer size than the outer size of the hardening property resin composition layer of the uncured, on the hardening property resin composition layer of the uncured in order to leave a fringe area which does not contact with the carrier substrate on the hardening property resin composition layer of the uncured. A hardening process(S108) obtaining the laminated layer after the hardening and having the resin layer is prepared by hardening the hardening property resin composition layer of the uncured in the former hardening laminated layer. A sawing process(S110) cutting the resin layer and the fissility glass substrate is prepared along the outer periphery of the carrier substrate within the post-cure laminate. A member formation process(S112) obtaining the laminate layer equipped with the member for the electronic device is prepared by forming the member for the electronic device on the second major surface of the fissility glass substrate. A singulation process(S114) obtaining the electronic device having the fissility glass substrate and the member for the electronic device is prepared as the laminate layer including the member for the electronic device.

Description

電子裝置之製造方法 Electronic device manufacturing method

本發明係關於一種電子裝置之製造方法。 The present invention relates to a method of fabricating an electronic device.

近年來,太陽電池(PV,Photovoltaic,太陽能光伏)、液晶面板(LCD,Liquid Crystal Display,液晶顯示器))、有機EL(Electro Luminescence,電致發光)面板(OLED,Organic Light Emitting Diode,有機發光二極體)等裝置(電子機器)之薄型化、輕量化正不斷進展,該等裝置所使用之玻璃基板之薄板化正不斷進展。若因薄板化而導致玻璃基板之強度不足,則於裝置之製造步驟中玻璃基板之操作性降低。 In recent years, solar cells (PV, Photovoltaic, liquid crystal displays), organic EL (Electro Luminescence) panels (OLED, Organic Light Emitting Diode, organic light-emitting diodes) The thinning and weight reduction of devices (electronic devices) such as the polar body are progressing, and the thinning of the glass substrate used in these devices is progressing. If the strength of the glass substrate is insufficient due to the thinning, the handleability of the glass substrate is lowered in the manufacturing process of the device.

因此,自先前以來廣泛採用於在較最終厚度厚之玻璃基板上形成裝置用構件(例如,薄膜電晶體)後,藉由化學蝕刻處理而使玻璃基板薄板化之方法。然而,於該方法中,例如於使1片玻璃基板之厚度自0.7 mm薄板化為0.2 mm或0.1 mm之情形時,利用蝕刻液將原本之玻璃基板之大半材料削掉,故而就生產性或原材料之使用效率之觀點而言欠佳。 Therefore, a method of thinning a glass substrate by chemical etching treatment after forming a device member (for example, a thin film transistor) on a glass substrate having a thicker final thickness has been widely used. However, in this method, for example, when the thickness of one glass substrate is reduced from 0.7 mm to 0.2 mm or 0.1 mm, most of the original glass substrate is scraped off by an etching solution, so that productivity or The use efficiency of raw materials is not good.

又,於藉由上述化學蝕刻而產生之玻璃基板之薄板化方法中,於在玻璃基板表面存在微小之損傷之情形時,存在因蝕刻處理而以損傷為起點形成微小之凹坑(腐蝕坑)而成為光學上之缺陷之情況。 Further, in the thinning method of the glass substrate produced by the above chemical etching, when there is a slight damage on the surface of the glass substrate, minute pits (corrosion pits) are formed from the damage by the etching process. It becomes a case of optical defects.

最近,為應對上述問題,提出有準備積層有玻璃基板與 增強板之積層體,於在積層體之玻璃基板上形成顯示裝置等電子裝置用構件後自玻璃基板分離增強板之方法(例如,參照專利文獻1)。增強板具有支持體、及固定於該支持體上之樹脂層,且樹脂層與玻璃基板可剝離地密接。將積層體之樹脂層與玻璃基板之界面剝離,自玻璃基板分離之增強板可與新玻璃基板積層,作為積層體而再利用。 Recently, in order to cope with the above problems, it is proposed to have a laminated glass substrate and In the laminated body of the reinforcing plate, a method of separating the reinforcing plate from the glass substrate after forming a member for an electronic device such as a display device on the glass substrate of the laminated body (for example, refer to Patent Document 1). The reinforcing plate has a support and a resin layer fixed to the support, and the resin layer and the glass substrate are detachably adhered to each other. The interface between the resin layer of the laminate and the glass substrate is peeled off, and the reinforcing plate separated from the glass substrate can be laminated with the new glass substrate to be reused as a laminate.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]國際公開第07/018028號小冊子 [Patent Document 1] International Publication No. 07/018028

另一方面,近年來,伴隨著電子裝置之高性能化之要求,電子裝置用構件之更微小化不斷進展,所實施之步驟更繁雜化。即便於該狀況下,亦要求生產性良好地製造性能優異之電子裝置。 On the other hand, in recent years, with the demand for higher performance of electronic devices, the miniaturization of components for electronic devices has progressed, and the steps performed have become more complicated. That is, in this case, it is also required to manufacture an electronic device excellent in performance with good productivity.

本發明者等人使用專利文獻1中記載之積層體進行電子裝置之製造,結果發現有所獲得之電子裝置之性能低劣之情形。例如,進行OLED面板之製作之結果為,有於該面板之驅動區域內產生顯示不均之情形。 When the inventors of the present invention used the laminate described in Patent Document 1 to manufacture an electronic device, it was found that the performance of the obtained electronic device was inferior. For example, as a result of the fabrication of the OLED panel, there is a case where display unevenness occurs in the driving region of the panel.

本發明者等人對上述原因進行了研究,結果發現,存在專利文獻1中記載之積層體中之樹脂層之厚度不均(尤其於周緣部具有凸部),其會損害玻璃基板之平坦性,結果使電子裝置之製造良率降低。 The inventors of the present invention have studied the above-mentioned causes and found that the thickness of the resin layer in the laminate described in Patent Document 1 is uneven (particularly, the peripheral portion has a convex portion), which may impair the flatness of the glass substrate. As a result, the manufacturing yield of the electronic device is lowered.

於圖8(A)中表示於製作專利文獻1中記載之積層體時所 使用之具有載體基板14與樹脂層18之附樹脂層之載體基板28之剖面圖。於附樹脂層之載體基板28中之樹脂層18之露出表面上積層玻璃基板,而形成積層體。如圖8(A)所示,利用專利文獻1中記載之方法形成之樹脂層18具有厚度不均。尤其,該厚度不均於樹脂層18之外周緣附近較為顯著,且形成凸部80。若於具有該種厚度不均之樹脂層18上積層玻璃基板82,則玻璃基板82之中央部以凹陷之方式彎曲,而損害玻璃基板82之平坦性(參照圖8(B))。由於損害玻璃基板82之平坦性,故而有產生配置於玻璃基板82上之電子裝置用構件之位置偏移等,結果引起電子裝置之性能降低之虞。 In the case of producing the laminate described in Patent Document 1, it is shown in Fig. 8(A). A cross-sectional view of a carrier substrate 28 having a carrier layer of a carrier substrate 14 and a resin layer 18 is used. A glass substrate is laminated on the exposed surface of the resin layer 18 in the carrier substrate 28 with the resin layer to form a laminate. As shown in FIG. 8(A), the resin layer 18 formed by the method described in Patent Document 1 has thickness unevenness. In particular, the thickness is not uniform in the vicinity of the outer periphery of the resin layer 18, and the convex portion 80 is formed. When the glass substrate 82 is laminated on the resin layer 18 having such a thickness unevenness, the central portion of the glass substrate 82 is bent in a concave manner to impair the flatness of the glass substrate 82 (see FIG. 8(B)). Since the flatness of the glass substrate 82 is impaired, the positional displacement of the member for an electronic device disposed on the glass substrate 82 is caused, and as a result, the performance of the electronic device is lowered.

又,如圖8(B)所示,若於該種附樹脂層之載體基板28上積層玻璃基板82,則於玻璃基板82與樹脂層18之間形成空隙84。積層體被供給至電子裝置用構件之製造步驟,且導電層等功能層形成於玻璃基板82之露出表面上。此時,使用抗蝕液等各種溶液。 Further, as shown in FIG. 8(B), when the glass substrate 82 is laminated on the carrier substrate 28 of the resin-attached layer, a void 84 is formed between the glass substrate 82 and the resin layer 18. The laminated body is supplied to a manufacturing step of the member for an electronic device, and a functional layer such as a conductive layer is formed on the exposed surface of the glass substrate 82. At this time, various solutions such as a resist liquid are used.

若於積層體中存在空隙84,則各種溶液藉由毛細現象而進入。進入至空隙84之材料即便藉由清洗亦難以去除,乾燥後作為異物而容易殘留。該異物因加熱處理等而成為污染電子裝置用構件之污染源,故而引起電子裝置之性能降低,結果使良率降低。 If voids 84 are present in the laminate, various solutions enter by capillary action. The material that has entered the void 84 is difficult to remove even by washing, and is easily left as a foreign matter after drying. Since the foreign matter becomes a source of contamination of the member for contaminating the electronic device by heat treatment or the like, the performance of the electronic device is lowered, and as a result, the yield is lowered.

本發明係鑒於上述問題而完成者,其目的在於提供一種使用平坦性優異之附樹脂層之載體基板之生產性優異的電子裝置的製造方法。 The present invention has been made in view of the above problems, and an object of the invention is to provide a method for producing an electronic device which is excellent in productivity of a carrier substrate having a resin layer excellent in flatness.

本發明者等人為了解決上述問題而進行銳意研究,結果完成本發明。 The present inventors conducted intensive studies in order to solve the above problems, and as a result, completed the present invention.

即,本發明之第1態樣係一種電子裝置之製造方法,其係製造包含剝離性玻璃基板與電子裝置用構件之電子裝置者,且包括:表面處理步驟,其係利用剝離劑對具有第1主表面及第2主表面之玻璃基板之上述第1主表面進行處理,而獲得具有呈易剝離性之表面之剝離性玻璃基板;硬化性樹脂組成物層形成步驟,其係於上述剝離性玻璃基板之呈易剝離性之表面上塗佈硬化性樹脂組成物,而形成未硬化之硬化性樹脂組成物層;積層步驟,其係將具有較上述未硬化之硬化性樹脂組成物層之外形尺寸小之外形尺寸之載體基板,以於上述未硬化之硬化性樹脂組成物層中殘留未與上述載體基板接觸之周緣區域之方式,積層於上述未硬化之硬化性樹脂組成物層上,而獲得硬化前積層體;硬化步驟,其係使上述硬化前積層體中之上述未硬化之硬化性樹脂組成物層硬化,而獲得具有樹脂層之硬化後積層體;切斷步驟,其係沿著上述硬化後積層體中之上述載體基板之外周緣將上述樹脂層及上述剝離性玻璃基板切斷;構件形成步驟,其係於上述剝離性玻璃基板之上述第2主表面上形成電子裝置用構件,而獲得附電子裝置用構件之積層體;以及分離步驟,其係自附上述電子裝置用構件之積層體將具有上述剝離性玻璃基板與上述電子裝置用構件之電子裝置分離。 That is, the first aspect of the present invention is a method of manufacturing an electronic device, which is an electronic device including a member for a release glass substrate and an electronic device, and includes a surface treatment step of using a release agent pair The first main surface of the glass substrate of the main surface and the second main surface is treated to obtain a peelable glass substrate having a surface that is easily peelable; and the curable resin composition layer forming step is performed by the peeling property The curable resin composition is coated on the surface of the glass substrate which is easily peelable, and the uncured curable resin composition layer is formed; and the laminating step is performed to have a shape other than the uncured curable resin composition layer. The carrier substrate having a small size and a small size is laminated on the uncured curable resin composition layer so that the peripheral portion of the uncured curable resin composition layer does not remain in contact with the carrier substrate. Obtaining a pre-hardened laminate; a hardening step of hardening the uncured hardenable resin composition layer in the pre-hardened laminate Obtaining a cured laminated body having a resin layer; and a cutting step of cutting the resin layer and the peelable glass substrate along a periphery of the carrier substrate in the cured laminated body; and forming a member a laminate for forming an electronic device on the second main surface of the peelable glass substrate to obtain a laminate for a member for an electronic device, and a separation step for attaching the laminate to the member for the electronic device The glass substrate is separated from the electronic device of the above-described electronic device member.

於第1態樣中,較佳為進而包括消泡步驟,該消泡步驟係於上述積層步驟後且上述硬化步驟前進行上述未硬化之硬化性樹脂組成物層之消泡處理。 In the first aspect, it is preferable to further include a defoaming step of performing the defoaming treatment of the uncured curable resin composition layer after the laminating step and before the curing step.

於第1態樣中,較佳為上述剝離劑包含具有甲基矽基或氟烷基之化合物。 In the first aspect, it is preferred that the release agent comprises a compound having a methyl fluorenyl group or a fluoroalkyl group.

於第1態樣中,較佳為上述剝離劑含有矽氧油或氟系化合物。 In the first aspect, it is preferred that the release agent contains an oxime oil or a fluorine compound.

於第1態樣中,較佳為上述樹脂層含有矽氧樹脂。 In the first aspect, it is preferred that the resin layer contains a silicone resin.

於第1態樣中,較佳為上述樹脂層為包含具有烯基之有機烯基聚矽氧烷、與具有鍵結於矽原子之氫原子之有機氫聚矽氧烷之組合的加成反應型矽氧之硬化物。 In the first aspect, preferably, the resin layer is an addition reaction comprising a combination of an alkenyl group-containing organic alkenyl polyoxyalkylene and an organic hydrogen polyoxyalkylene having a hydrogen atom bonded to a halogen atom. Type of hardened oxygen.

較佳為上述有機氫聚矽氧烷之鍵結於矽原子之氫原子相對於上述有機烯基聚矽氧烷之烯基之莫耳比為0.5~2。 Preferably, the organic hydrogen polyoxyalkylene has a molar ratio of a hydrogen atom bonded to a halogen atom to an alkenyl group of the above organic alkenyl polyoxyalkylene of 0.5 to 2.

於第1態樣中,較佳為上述樹脂層含有非硬化性之有機矽氧烷5質量%以下。 In the first aspect, the resin layer preferably contains 5% by mass or less of non-hardenable organic siloxane.

於第1態樣中,較佳為於上述切斷步驟中,由載物台支持上述硬化後積層體中之載體基板之主表面,並且使上述載體基板之外周抵接於設置於上述載物台上之定位塊。 In the first aspect, preferably, in the cutting step, the main surface of the carrier substrate in the cured laminated body is supported by the stage, and the outer periphery of the carrier substrate is brought into contact with the carrier. Positioning block on the stage.

於第1態樣中,較佳為於上述切斷步驟中,於上述硬化後積層體中之剝離性玻璃基板之表面形成切割線後,沿著切割線將上述硬化後積層體中之剝離性玻璃基板及樹脂層之各者之外周部一次割斷。 In the first aspect, preferably, in the cutting step, after the dicing line is formed on the surface of the peelable glass substrate in the cured laminated body, the peeling property in the cured laminated body is along the dicing line. The outer periphery of each of the glass substrate and the resin layer was cut at one time.

根據本發明,可提供一種使用平坦性優異之附樹脂層之 載體基板之生產性優異的電子裝置的製造方法。 According to the present invention, it is possible to provide a resin layer which is excellent in flatness. A method of manufacturing an electronic device excellent in productivity of a carrier substrate.

以下,參照圖式對用以實施本發明之形態進行說明,但本發明並不限制於以下實施形態,可於不脫離本發明之範圍之情況下對以下實施形態施加各種變形及置換。 In the following, the embodiments of the present invention are described with reference to the drawings, but the present invention is not limited to the following embodiments, and various modifications and substitutions may be made in the following embodiments without departing from the scope of the invention.

本發明者等人對專利文獻1之發明之問題進行了研究,結果發現,受到硬化性樹脂組成物之塗佈所產生之影響、或空氣界面之表面張力之影響,而於樹脂層表面產生凹凸。 The inventors of the present invention have studied the problems of the invention of Patent Document 1, and have found that the surface of the resin layer is unevenly affected by the influence of the application of the curable resin composition or the surface tension of the air interface. .

因此,發現於使樹脂層以未硬化之狀態與呈現特定之剝離性之玻璃基板接觸而賦予有平坦性後,使其硬化,藉此可獲得包含具有特定之平坦性之樹脂層之積層體,結果可抑制電子裝置之性能降低。 Therefore, it has been found that when the resin layer is brought into contact with a glass substrate exhibiting specific releasability in an uncured state, flatness is imparted, and then cured, whereby a laminate including a resin layer having specific flatness can be obtained. As a result, the performance degradation of the electronic device can be suppressed.

以下,按照各步驟之順序對電子裝置之製造方法進行說明。 Hereinafter, a method of manufacturing an electronic device will be described in the order of the respective steps.

再者,於本發明中,將下述之硬化後積層體中之樹脂層與載體基板之層之界面之剝離強度較玻璃基板之層與樹脂層之界面之剝離強度高於以下亦稱為樹脂層固定於載體基板,且樹脂層可剝離地密接於玻璃基板。 Further, in the present invention, the peeling strength at the interface between the resin layer and the layer of the carrier substrate in the cured laminated body described below is higher than the peeling strength at the interface between the layer of the glass substrate and the resin layer, which is also referred to as a resin. The layer is fixed to the carrier substrate, and the resin layer is detachably adhered to the glass substrate.

[第1實施態樣] [First embodiment]

圖1係表示本發明之電子裝置之製造方法之一實施形態之製造步驟的流程圖。如圖1所示,電子裝置之製造方法包括表面處理步驟S102、硬化性樹脂組成物層形成步驟S104、積層步驟S106、硬化步驟S108、切斷步驟S110、構 件形成步驟S112、及分離步驟S114。 BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a flow chart showing the manufacturing steps of an embodiment of a method of manufacturing an electronic device according to the present invention. As shown in FIG. 1, the manufacturing method of the electronic device includes a surface treatment step S102, a curable resin composition layer forming step S104, a lamination step S106, a hardening step S108, a cutting step S110, and a structure. The forming step S112 and the separating step S114.

又,圖2(A)~2(G)係依序表示本發明之電子裝置之製造方法之各製造步驟之模式性剖面圖。 2(A) to 2(G) are schematic cross-sectional views showing respective manufacturing steps of the method of manufacturing the electronic device of the present invention.

以下,一面參照圖2(A)~2(G)一面對各步驟中使用之材料及其次序進行詳細敍述。首先,對表面處理步驟S102進行詳細敍述。 Hereinafter, the materials used in the respective steps and the order thereof will be described in detail with reference to FIGS. 2(A) to 2(G). First, the surface treatment step S102 will be described in detail.

[表面處理步驟] [Surface treatment steps]

表面處理步驟S102如下之步驟:利用剝離劑對具有第1主表面及第2主表面之玻璃基板之第1主表面進行處理,而獲得具有呈易剝離性之表面之剝離性玻璃基板。藉由實施該步驟S102,而可獲得與下述之樹脂層可剝離地密接之剝離性玻璃基板10(參照圖2(A))。此處所謂之剝離性玻璃基板10,係指具有對於下述之樹脂層呈易剝離性之表面10a之玻璃基板。再者,所謂剝離性玻璃基板之表面具有之易剝離性,係指於施加用以自下述之硬化後積層體將剝離性玻璃基板剝離之外力之情形時,不於載體基板與樹脂層之界面及樹脂層內部剝離而於剝離性玻璃基板與樹脂層之界面剝離之性質。 The surface treatment step S102 is a step of treating the first main surface of the glass substrate having the first main surface and the second main surface with a release agent to obtain a peelable glass substrate having a surface which is easily peelable. By performing this step S102, the peelable glass substrate 10 which is peelably adhered to the resin layer described below can be obtained (see FIG. 2(A)). The peelable glass substrate 10 herein refers to a glass substrate having a surface 10a which is easily peelable to the resin layer described below. In addition, the surface of the peelable glass substrate has an easy-peelability, and is a case where a force for peeling off the peelable glass substrate from the laminated body after hardening is applied, and the carrier substrate and the resin layer are not used. The interface and the inside of the resin layer are peeled off to peel off the interface between the peelable glass substrate and the resin layer.

首先,對本步驟中使用之玻璃基板及剝離劑進行詳細詳述,其後對該步驟S102之次序進行詳細敍述。 First, the glass substrate and the release agent used in this step will be described in detail, and the procedure of step S102 will be described in detail later.

(玻璃基板) (glass substrate)

玻璃基板係具有第1主表面及第2主表面之板狀基板,藉由剝離劑對其第1主表面進行表面處理。經表面處理而呈現易剝離性之第1主表面與下述之樹脂層可剝離地密接, 於與樹脂層密接之側之相反之側之第2主表面設置有電子裝置用構件。 The glass substrate is a plate-shaped substrate having a first main surface and a second main surface, and the first main surface thereof is surface-treated by a release agent. The first main surface which is subjected to surface treatment to exhibit easy peelability is detachably adhered to the resin layer described below, A member for an electronic device is provided on the second main surface on the side opposite to the side in contact with the resin layer.

玻璃基板之種類可為通常者,例如可列舉LCD、OLED等顯示裝置用玻璃基板等。玻璃基板之耐化學品性、耐透濕性優異,且熱收縮率較低。作為熱收縮率之指標,使用JIS(Japanese Industrial Standards,日本工業標準)R3102(1995年改正)中所規定之線膨脹係數。 The type of the glass substrate may be a normal one, and examples thereof include a glass substrate for a display device such as an LCD or an OLED. The glass substrate is excellent in chemical resistance and moisture permeability, and has a low heat shrinkage rate. As an index of the heat shrinkage rate, the linear expansion coefficient prescribed in JIS (Japanese Industrial Standards) R3102 (1995 correction) is used.

若玻璃基板之線膨脹係數較大,則構件形成步驟S112大多伴隨有加熱處理,故而容易產生各種不良情形。例如於在玻璃基板上形成TFT(Thin Film Transistor,薄膜電晶體)之情形時,若將於加熱下形成TFT之玻璃基板冷卻,則有因玻璃基板之熱收縮而使TFT之位置偏移變得過大之虞。 When the linear expansion coefficient of the glass substrate is large, the member forming step S112 is often accompanied by heat treatment, so that various problems are likely to occur. For example, when a TFT (Thin Film Transistor) is formed on a glass substrate, if the glass substrate on which the TFT is formed under heating is cooled, the positional shift of the TFT is caused by thermal contraction of the glass substrate. Too big.

玻璃基板係使玻璃原料熔融並使熔融玻璃成形為板狀而獲得。該種成形方法可為通常者,例如可使用:浮式法、熔融法、流孔下引法、富可法、魯伯法等。又,尤其厚度較薄之玻璃基板係將暫時成形為板狀之玻璃加熱為可成形之溫度,並利用以延伸等手段將其拉長而變薄之方法(再曳引法)成形而獲得。 The glass substrate is obtained by melting a glass raw material and forming the molten glass into a plate shape. Such a molding method may be a normal one, and for example, a floating method, a melting method, a flow hole down method, a rich method, a Luber method, or the like may be used. Further, in particular, a glass substrate having a small thickness is obtained by heating a glass which has been temporarily formed into a plate shape to a temperature at which it can be formed, and forming it by a method of stretching and thinning by means of stretching or the like (re-drawing method).

玻璃基板之玻璃並無特別限定,但較佳為無鹼硼矽酸玻璃、硼矽酸玻璃、鈉鈣玻璃、高二氧化矽玻璃、其他以氧化矽為主成分之氧化物系玻璃。作為氧化物系玻璃,較佳為藉由氧化物換算而得之氧化矽之含量為40~90質量%之玻璃。 The glass of the glass substrate is not particularly limited, but is preferably an alkali-free borosilicate glass, a borosilicate glass, a soda lime glass, a high cerium oxide glass, or another oxide-based glass containing cerium oxide as a main component. The oxide-based glass is preferably a glass having a content of cerium oxide of 40 to 90% by mass in terms of oxide.

作為玻璃基板之玻璃,採用適於電子裝置用構件之種類 或其製造步驟之玻璃。例如,液晶面板用玻璃基板因鹼金屬成分之溶出而容易對液晶產生影響,故而包含實質上不含有鹼金屬成分之玻璃(無鹼玻璃)(但是,通常包含鹼土金屬成分)。如此,玻璃基板之玻璃根據所應用之裝置之種類及其製造步驟而適當選擇。 As the glass of the glass substrate, a type suitable for a member for an electronic device is used. Or the glass of its manufacturing steps. For example, the glass substrate for a liquid crystal panel easily affects the liquid crystal by elution of an alkali metal component, and therefore contains glass (alkali-free glass) which does not substantially contain an alkali metal component (however, it usually contains an alkaline earth metal component). As such, the glass of the glass substrate is appropriately selected depending on the type of the apparatus to be applied and the manufacturing steps thereof.

玻璃基板之厚度並無特別限定,就玻璃基板之薄型化及/或輕量化之觀點而言,通常較佳為0.8 mm以下,更佳為0.3 mm以下,進而較佳為0.15 mm以下。於超過0.8 mm之情形時,無法滿足玻璃基板之薄型化及/或輕量化之要求。於0.3 mm以下之情形時,可對玻璃基板賦予良好之軟性。於0.15 mm以下之情形時,可將玻璃基板捲取為輥狀。又,就容易製造玻璃基板、及容易操作玻璃基板等理由而言,玻璃基板之厚度較佳為0.03 mm以上。 The thickness of the glass substrate is not particularly limited, but is preferably 0.8 mm or less, more preferably 0.3 mm or less, and still more preferably 0.15 mm or less from the viewpoint of thickness reduction and/or weight reduction of the glass substrate. When it exceeds 0.8 mm, the requirements for thinning and/or weight reduction of the glass substrate cannot be satisfied. When it is 0.3 mm or less, the glass substrate can be imparted with good softness. When the thickness is 0.15 mm or less, the glass substrate can be wound into a roll shape. Moreover, the thickness of the glass substrate is preferably 0.03 mm or more for the reason that the glass substrate is easily produced and the glass substrate is easily handled.

再者,玻璃基板亦可包含2層以上,於此情形時,形成各層之材料可為同種材料,亦可為不同種材料。又,於此情形時,「玻璃基板之厚度」係指所有層之合計之厚度。 Further, the glass substrate may include two or more layers. In this case, the materials forming the layers may be the same material or different materials. In this case, the "thickness of the glass substrate" means the total thickness of all the layers.

又,亦可於玻璃基板之一表面積層其他層狀材料。例如,為了增強玻璃基板之強度,可積層樹脂層等,亦可積層氧化銦錫或氧化矽等無機物薄膜層。 Further, other layered materials may be layered on one surface area of the glass substrate. For example, in order to enhance the strength of the glass substrate, a resin layer or the like may be laminated, and an inorganic thin film layer such as indium tin oxide or cerium oxide may be laminated.

(剝離劑) (release agent)

作為剝離劑,可使用公知之剝離劑,例如可列舉:矽氧系化合物(例如,矽氧油等)、矽烷化劑(例如,六甲基二矽氮烷等)、氟系化合物(例如,氟樹脂等)等。剝離劑可用作乳液型、溶劑型、無溶劑型。就剝離力、安全性、成本等 而言,作為一較佳例,可列舉含有甲基矽基(≡SiCH3、=Si(CH3)2、-Si(CH3)3中之任一者)或氟烷基(-CmF2m+1)(m較佳為1~6之整數)之化合物,作為其他較佳例,可列舉矽氧系化合物或氟系化合物,尤其較佳為矽氧油。 As the release agent, a known release agent can be used, and examples thereof include a ruthenium-based compound (for example, a sulfonium-oxygen oil), a decylating agent (for example, hexamethyldiazepine or the like), and a fluorine-based compound (for example, Fluorine resin, etc.). The release agent can be used as an emulsion type, a solvent type, or a solventless type. In terms of peeling force, safety, cost, and the like, as a preferred example, any one containing a methyl fluorenyl group (≡SiCH 3 , =Si(CH 3 ) 2 , or -Si(CH 3 ) 3 ) may be mentioned. Or a fluoroalkyl group (-C m F 2m+1 ) (m is preferably an integer of 1 to 6), and other preferred examples include a fluorene-based compound or a fluorine-based compound, and particularly preferably ruthenium. Oxygen oil.

矽氧油之種類並無特別限定,可例示:二甲基矽氧油、甲基苯基矽氧油、甲基氫矽氧油等純矽氧油,於純矽氧油之側鏈或末端導入有烷基、氫基、環氧基、胺基、羧基、聚醚基、鹵基等之改性矽氧油。作為純矽氧油之具體例,可列舉:甲基氫聚矽氧烷、二甲基聚矽氧烷、甲基苯基聚矽氧烷、二苯基聚矽氧烷等,且耐熱性以列舉之順序增加,耐熱性最高者為二苯基聚矽氧烷。該等矽氧油通常用於玻璃基板或經底層處理之金屬基板等基板之表面之撥水處理。 The type of the oxime oil is not particularly limited, and examples thereof include pure oxime oil such as dimethyl sulfonium oil, methyl phenyl sulfonium oil, and methylhydroquinone oxy-oil, and the side chain or end of the pure bismuth oil. A modified oxygenated oil having an alkyl group, a hydrogen group, an epoxy group, an amine group, a carboxyl group, a polyether group, a halogen group or the like is introduced. Specific examples of the pure helium oxide oil include methylhydrogenpolysiloxane, dimethylpolysiloxane, methylphenylpolysiloxane, diphenylpolysiloxane, and the like, and heat resistance is The order of enumeration is increased, and the highest heat resistance is diphenyl polysiloxane. The helium oxide oil is usually used for water repellent treatment on the surface of a substrate such as a glass substrate or a metal substrate subjected to an underlayer treatment.

就與玻璃基板之被處理表面結合之處理之效率性之觀點而言,矽氧油較佳為25℃下之動黏度為5000 mm2/s以下,更佳為500 mm2/s以下。動黏度之下限並無特別限制,但考慮到操作方面或成本,較佳為0.5 mm2/s以上。 The silicone oil preferably has an kinetic viscosity at 25 ° C of 5000 mm 2 /s or less, more preferably 500 mm 2 /s or less, from the viewpoint of the efficiency of the treatment in combination with the treated surface of the glass substrate. The lower limit of the dynamic viscosity is not particularly limited, but is preferably 0.5 mm 2 /s or more in view of handling or cost.

就與樹脂層之剝離性良好之方面而言,上述矽氧油較佳為純矽氧油,就賦予尤其高之剝離性之方面而言,上述矽氧油較佳為二甲基聚矽氧烷。又,於必需具有剝離性且特別是耐熱性之情形時,較佳為甲基苯基聚矽氧烷或二苯基聚矽氧烷。 The above-mentioned helium oxide oil is preferably a pure helium oxide oil, and the above-mentioned helium oxide oil is preferably dimethylpolyoxyl in terms of imparting particularly high releasability in terms of good releasability from the resin layer. alkyl. Further, in the case where it is necessary to have releasability and particularly heat resistance, methylphenyl polysiloxane or diphenyl polysiloxane is preferred.

氟系化合物之種類並無特別限定,可列舉:全氟烷基銨鹽、全氟烷基磺酸醯胺、全氟烷基磺酸鹽(例如,全氟烷 基磺酸鈉)、全氟烷基鉀鹽、全氟烷基羧酸鹽、全氟烷基環氧乙烷加成物、全氟烷基三甲基銨鹽、全氟烷基胺基磺酸鹽、全氟烷基磷酸酯、全氟烷基化合物、全氟烷基甜菜鹼、全氟烷基鹵化物等。再者,作為含有氟烷基(CmF2m+1)之化合物,例如可列舉上述氟系化合物之例示化合物中之具有氟烷基之化合物。m之上限於剝離性能上並無特別限制,但就操作上之安全性更優異之方面而言,m較佳為1~6之整數。 The type of the fluorine-based compound is not particularly limited, and examples thereof include a perfluoroalkylammonium salt, a perfluoroalkylsulfonium decylamine, a perfluoroalkylsulfonate (for example, sodium perfluoroalkylsulfonate), and perfluoro Alkyl potassium salt, perfluoroalkyl carboxylate, perfluoroalkyl ethylene oxide adduct, perfluoroalkyl trimethyl ammonium salt, perfluoroalkyl amine sulfonate, perfluoroalkyl phosphate Esters, perfluoroalkyl compounds, perfluoroalkyl betaines, perfluoroalkyl halides, and the like. In addition, examples of the compound containing a fluoroalkyl group (C m F 2m+1 ) include a compound having a fluoroalkyl group among the above-exemplified compounds of the above fluorine-based compound. The upper limit of m is not particularly limited in terms of peeling performance, but m is preferably an integer of 1 to 6 in terms of safety in terms of handling.

(步驟之次序) (order of steps)

玻璃基板之表面之處理方法根據所使用之剝離劑而適當選擇最佳方法。通常,藉由將剝離劑賦予(例如塗佈)至玻璃基板之第1主表面之表面而進行處理。 The method of treating the surface of the glass substrate is appropriately selected depending on the release agent to be used. Usually, the treatment is carried out by applying (for example, coating) a release agent to the surface of the first main surface of the glass substrate.

例如,於使用矽氧油之情形時,可列舉將矽氧油塗佈於玻璃基板表面之方法。其中,較佳為於塗佈矽氧油後進行使矽氧油與玻璃基板之被處理表面結合之處理。使矽氧油與被處理表面結合之處理係如將矽氧油之分子鏈切斷之處理,所切斷之斷片與被處理表面結合(以下,將該處理稱為矽氧油之低分子化)。 For example, in the case of using a helium oxide oil, a method of applying a helium oxide oil to the surface of a glass substrate is mentioned. Among them, it is preferred to carry out a treatment of bonding the helium oxide oil to the treated surface of the glass substrate after applying the oxime oil. The treatment for binding the helium oxide oil to the surface to be treated is a treatment in which the molecular chain of the helium oxide oil is cut, and the cut piece is bonded to the surface to be treated (hereinafter, the treatment is referred to as low molecular weight of the helium oxide oil). ).

矽氧油之塗佈方法可為通常之方法。例如,可自噴塗法、擠壓式塗佈法、旋轉塗佈法、浸塗法、輥塗法、棒式塗佈法、絲網印刷法、凹版塗佈法等中根據矽氧油之種類或塗佈量等而適當選擇。 The coating method of the helium oxide oil can be a usual method. For example, it can be used in a spray coating method, a squeeze coating method, a spin coating method, a dip coating method, a roll coating method, a bar coating method, a screen printing method, a gravure coating method, or the like according to the type of the silicone oil. The coating amount or the like is appropriately selected.

作為塗佈液,較為理想的是使用於己烷、庚烷、二甲苯、異構石蠟等之溶劑中稀釋有矽氧油5質量%以下之溶 液。若超過5質量%,則低分子化之處理時間過長。 The coating liquid is preferably dissolved in a solvent such as hexane, heptane, xylene or isoparaffin, and is dissolved in an amount of 5 mass% or less of the oxime oil. liquid. If it exceeds 5% by mass, the treatment time for the low molecular weight is too long.

塗佈液所含之溶劑視需要利用加熱及/或減壓乾燥等方法去除。亦可藉由低分子化步驟中之加熱而去除。 The solvent contained in the coating liquid is removed by heating or/or drying under reduced pressure as needed. It can also be removed by heating in the low molecularization step.

矽氧油之塗佈量較佳為0.1~10 μg/cm2。若為0.1 μg/cm2以上,則剝離性更優異,就此方面而言較佳,若為10 μg/cm2以下,則塗佈液之塗佈性及低分子化處理性更優異,就此方面而言較佳。 The coating amount of the helium oxide oil is preferably from 0.1 to 10 μg/cm 2 . When it is 0.1 μg/cm 2 or more, the peeling property is more excellent, and in this respect, it is preferable, and when it is 10 μg/cm 2 or less, the coating property and the low molecular weight treatment property of the coating liquid are more excellent. It is better.

於使矽氧油低分子化之方法中,使用通常之方法,例如有藉由光分解或熱分解而將矽氧油之矽氧鍵切斷之方法。於光分解中利用自低壓水銀燈或氙弧燈等照射之紫外線,亦可併用大氣中之紫外線照射所產生之臭氧。熱分解可利用批次爐、輸送爐等進行,亦可利用電漿或電弧放電等。 In the method of lowering the molecular weight of the helium oxide oil, a usual method such as a method of cutting off the oxygen bond of the helium oxide oil by photolysis or thermal decomposition is used. In the photolysis, ultraviolet rays irradiated from a low-pressure mercury lamp or a xenon arc lamp or the like may be used, and ozone generated by ultraviolet rays in the atmosphere may be used in combination. The thermal decomposition can be carried out by using a batch furnace, a conveying furnace, or the like, or by using plasma or arc discharge.

若將矽氧油之矽氧鍵、或矽原子與碳原子之鍵切斷,則產生之活性點與被處理表面之羥基等活性基反應。結果為,被處理表面之甲基等疏水性官能基之密度變高,親水性之極性基之密度降低,結果對被處理表面賦予易剝離性。 When the helium oxygen bond of the helium oxide oil or the bond of the helium atom and the carbon atom is cleaved, the active site generated reacts with an active group such as a hydroxyl group of the surface to be treated. As a result, the density of the hydrophobic functional group such as a methyl group on the surface to be treated becomes high, and the density of the hydrophilic polar group is lowered, and as a result, the surface to be treated is easily peelable.

再者,進行表面處理之玻璃基板之表面較佳為足夠潔淨之面,較佳為剛清洗後之面。作為清洗方法,使用玻璃表面或樹脂表面之清洗中所使用之通常方法。 Further, the surface of the surface-treated glass substrate is preferably a sufficiently clean surface, preferably a surface just after cleaning. As the cleaning method, a usual method used for cleaning the glass surface or the resin surface is used.

較理想的是,未進行表面處理之表面由遮罩等保護膜預先保護。 Preferably, the surface which has not been surface-treated is previously protected by a protective film such as a mask.

又,於使用六甲基二矽氮烷等矽烷化劑之情形時,較佳為使矽烷化劑之蒸氣與玻璃基板表面接觸。再者,亦可於 加熱玻璃基板之狀態下使其與矽烷化劑之蒸氣接觸。 Further, in the case of using a decylating agent such as hexamethyldiazepine, it is preferred to bring the vapor of the decylating agent into contact with the surface of the glass substrate. Furthermore, it can also The glass substrate is heated to be in contact with the vapor of the alkylating agent.

矽烷化劑之蒸氣濃度較高者即接近飽和濃度者可縮短處理時間,故而較佳。 It is preferred that the higher the vapor concentration of the alkylating agent, that is, the near-saturated concentration, can shorten the processing time.

矽烷化劑與玻璃基板之接觸時間只要不損害剝離性玻璃基板之功能,則可縮短。 The contact time between the decylating agent and the glass substrate can be shortened as long as the function of the peelable glass substrate is not impaired.

藉由上述次序而製造之剝離性玻璃基板之呈易剝離性之表面之表面粗糙度Ra就進一步抑制下述之硬化步驟S108中獲得之樹脂層之厚度不均之方面而言,較佳為2.0 nm以下,更佳為1.0 nm以下,進而較佳為0.5 nm以下。下限並無特別限制,但尤佳為0 nm。 The surface roughness Ra of the surface of the peelable glass substrate which is produced by the above-described order is further suppressed in terms of the thickness unevenness of the resin layer obtained in the hardening step S108 described below, and is preferably 2.0. Below nm, it is more preferably 1.0 nm or less, and further preferably 0.5 nm or less. The lower limit is not particularly limited, but is preferably 0 nm.

再者,表面粗糙度Ra之測定可使用原子力顯微鏡(Pacific Nanotechnology公司製造,Nano Scope IIIa;Scan Rate 1.0 Hz,Sample Lines256,Off-line Modify Flatten order-2,Planefit order-2等)且依據JIS B 0601(2001)進行。 Further, the surface roughness Ra can be measured by an atomic force microscope (manufactured by Pacific Nanotechnology, Nano Scope IIIa; Scan Rate 1.0 Hz, Sample Lines 256, Off-line Modify Flatten order-2, Planefit order-2, etc.) and in accordance with JIS B. 0601 (2001).

就容易進一步進行剝離性玻璃基板與樹脂層之界面之剝離之方面而言,剝離性玻璃基板之呈易剝離性之表面之水接觸角較佳為90°以上,更佳為90~120°,進而較佳為90~110°。 The water contact angle of the surface of the peelable glass substrate which is easily peelable is preferably 90° or more, more preferably 90 to 120°, in terms of facilitating further peeling of the interface between the peelable glass substrate and the resin layer. Further preferably, it is 90 to 110°.

再者,水接觸角之測定可使用接觸角計(Kurusu公司製造,DROP SHAPE ANALYSIS SYSTEM DSA 10Mk2等)進行。 Further, the measurement of the water contact angle can be carried out using a contact angle meter (manufactured by Kurusu Co., Ltd., DROP SHAPE ANALYSIS SYSTEM DSA 10Mk2, etc.).

[硬化性樹脂組成物層形成步驟] [Sclerosing resin composition layer forming step]

硬化性樹脂組成物層形成步驟S104係如下之步驟:於上 述表面處理步驟S102中獲得之剝離性玻璃基板之呈易剝離性之表面上塗佈硬化性樹脂組成物,而形成未硬化之硬化性樹脂組成物層。更具體而言,如圖2(B)所示,於剝離性玻璃基板10之呈剝離性之表面10a上形成未硬化之硬化性樹脂組成物層12。 The curable resin composition layer forming step S104 is a step of: The surface of the peelable glass substrate obtained in the surface treatment step S102 is coated with a curable resin composition on the surface of the peelable glass substrate to form an uncured curable resin composition layer. More specifically, as shown in FIG. 2(B), the uncured curable resin composition layer 12 is formed on the peelable surface 10a of the peelable glass substrate 10.

未硬化之硬化性樹脂組成物層與剝離性玻璃基板之呈剝離性之表面未空出間隙地接觸。因此,於下述之硬化步驟S108中,若使該硬化性樹脂組成物層硬化,則可獲得轉印有剝離性玻璃基板之平坦之表面之樹脂層,而可抑制剝離性玻璃基板之變形。 The uncured curable resin composition layer is in contact with the peelable surface of the peelable glass substrate without leaving a gap. Therefore, when the curable resin composition layer is cured in the curing step S108 described below, the resin layer on which the flat surface of the peelable glass substrate is transferred can be obtained, and deformation of the peelable glass substrate can be suppressed.

首先,對本步驟中使用之硬化性樹脂組成物進行詳細敍述,其後對該步驟S104之次序進行詳細敍述。 First, the curable resin composition used in this step will be described in detail, and the procedure of the step S104 will be described in detail later.

(硬化性樹脂組成物) (curable resin composition)

本步驟S104中使用之硬化性樹脂組成物係可於下述之硬化步驟S108中形成樹脂層(密接性樹脂層)之組成物。 The curable resin composition used in the step S104 can form a composition of a resin layer (adhesive resin layer) in the curing step S108 described below.

作為硬化性樹脂組成物中所含之硬化性樹脂,只要具有其硬化膜對於對象物可剝離地密接之密接性即可,可使用公知之硬化性樹脂(例如,熱硬化性組成物、光硬化性組成物等)。例如可列舉:硬化性丙烯酸系樹脂、硬化性胺基甲酸酯樹脂、硬化性矽氧等。亦可混合使用若干種硬化性樹脂。其中,較佳為硬化性矽氧。其原因在於,使硬化性矽氧硬化而獲得之矽氧樹脂之耐熱性或剝離性優異。又,其原因在於,若使用硬化性矽氧,則因與下述之玻璃基板表面之矽烷醇基之縮合反應而容易固定於玻璃基板。 The curable resin to be contained in the curable resin composition may have a tackifying property in which the cured film is adhered to the object, and a known curable resin (for example, a thermosetting composition, photohardening) may be used. Sex composition, etc.). For example, a curable acrylic resin, a curable urethane resin, a curable oxime, etc. are mentioned. Several kinds of curable resins may also be used in combination. Among them, curable oxime is preferred. This is because the heat-sensitive resin or the peeling property obtained by curing the curable oxime is excellent. Further, the reason is that when curable oxime is used, it is easily fixed to the glass substrate by a condensation reaction with a stanol group on the surface of the glass substrate described below.

作為硬化性樹脂組成物,較佳為硬化性矽氧樹脂組成物(尤其較佳為使用於剝離紙用之硬化性矽氧樹脂組成物)。使用該硬化性矽氧樹脂組成物而形成之樹脂層密接於玻璃基板表面,並且其自由表面具有優異之易剝離性,故而較佳。 The curable resin composition is preferably a curable epoxy resin composition (particularly preferably used as a curable silicone resin composition for release paper). The resin layer formed using the curable epoxy resin composition is intimately bonded to the surface of the glass substrate, and its free surface has excellent peelability, which is preferable.

成為該種剝離紙用矽氧樹脂之硬化性矽氧根據其硬化機構而分類為縮合反應型矽氧、加成反應型矽氧、紫外線硬化型矽氧及電子束硬化型矽氧,可使用任一者。於該等中,較佳為加成反應型矽氧。其原因在於,硬化反應容易進行,形成樹脂層時剝離性之程度良好,且耐熱性亦較高。 The curable oxime which is used as the oxime resin for the release paper is classified into a condensation reaction type 矽 oxygen, an addition reaction type 矽 oxygen, an ultraviolet curing type 矽 oxygen, and an electron beam curing type 矽 oxygen according to the curing mechanism thereof, and any of them can be used. One. Among these, an addition reaction type helium oxygen is preferred. This is because the hardening reaction proceeds easily, and the degree of peeling property is good when the resin layer is formed, and the heat resistance is also high.

加成反應型矽氧樹脂組成物係含有主劑及交聯劑且於鉑系觸媒等觸媒之存在下硬化之硬化性組成物。加成反應型矽氧樹脂組成物之硬化係藉由加熱處理而促進。加成反應型矽氧樹脂組成物中之主劑較佳為具有鍵結於矽原子之烯基(乙烯基等)之有機聚矽氧烷(即,有機烯基聚矽氧烷,再者,較佳為直鏈狀),烯基等成為交聯點。加成反應型矽氧樹脂組成物中之交聯劑較佳為具有鍵結於矽原子之氫原子(氫矽烷基)之有機矽氧烷(即,有機氫聚矽氧烷,再者,較佳為直鏈狀),氫矽烷基等成為交聯點。 The addition reaction type oxime resin composition contains a main component and a crosslinking agent and is hardened by the presence of a catalyst such as a platinum-based catalyst. The hardening of the addition reaction type epoxy resin composition is promoted by heat treatment. The main component in the addition reaction type oxirane resin composition is preferably an organic polyoxyalkylene having an alkenyl group (vinyl group or the like) bonded to a ruthenium atom (i.e., an organic alkenyl polyoxane, further, It is preferably a linear chain), and an alkenyl group or the like becomes a crosslinking point. The crosslinking agent in the addition reaction type oxirane resin composition is preferably an organic oxirane having a hydrogen atom (hydroalkylene group) bonded to a ruthenium atom (i.e., an organic hydrogen polyoxy siloxane, and further, Preferably, it is a linear chain), and a hydroquinone group or the like becomes a crosslinking point.

加成反應型矽氧樹脂組成物係藉由主劑與交聯劑之交聯點進行加成反應而硬化。 The addition reaction type epoxy resin composition is hardened by an addition reaction of a crosslinking point of a main agent and a crosslinking agent.

再者,就源自交聯結構之耐熱性更優異之方面而言,較佳為有機氫聚矽氧烷之鍵結於矽原子之氫原子相對於有機 烯基聚矽氧烷之烯基之莫耳比為0.5~2。 Further, in terms of the more excellent heat resistance of the crosslinked structure, it is preferred that the organic hydrogen polyoxyalkylene is bonded to the hydrogen atom of the halogen atom relative to the organic The alkenyl group of the alkenyl polyoxyalkylene has a molar ratio of 0.5 to 2.

又,用以形成剝離紙等剝離層之硬化性矽氧樹脂組成物就形態而言有溶劑型、乳液型及無溶劑型,可使用任一型。於該等中,較佳為無溶劑型。其原因在於,生產性、安全性、環境特性方面優異。又,其原因在於,因不含有於形成下述之樹脂層時之硬化時即加熱硬化、紫外線硬化或電子束硬化時產生發泡之溶劑,故而氣泡難以殘留於樹脂層中。 Further, the curable silicone resin composition for forming a release layer such as release paper may be of a solvent type, an emulsion type or a solventless type, and any type may be used. Among these, a solventless type is preferred. The reason is that it is excellent in productivity, safety, and environmental characteristics. In addition, the solvent is not contained in the resin layer which is formed when the resin layer is formed, that is, when it is cured by heat, ultraviolet curing, or electron beam curing, so that bubbles do not easily remain in the resin layer.

又,作為用以形成剝離紙等剝離層之硬化性矽氧樹脂組成物,具體而言可列舉:作為市售之商品名或型號之KNS-320A、KS-847(均為Shin-Etsu Silicones公司製造)、TPR6700(Momentive Performance Materials JaPan有限公司製造)、乙烯基矽氧「8500」(荒川化學工業公司製造)與甲基氫聚矽氧烷「12031」(荒川化學工業公司製造)之組合、乙烯基矽氧「11364」(荒川化學工業公司製造)與甲基氫聚矽氧烷「12031」(荒川化學工業公司製造)之組合、乙烯基矽氧「11365」(荒川化學工業公司製造)與甲基氫聚矽氧烷「12031」(荒川化學工業公司製造)之組合等。 In addition, as a curable silicone resin composition for forming a release layer such as a release paper, specifically, KNS-320A and KS-847 (both Shin-Etsu Silicones) are commercially available as trade names or models. Manufactured, TPR6700 (manufactured by Momentive Performance Materials JaPan Co., Ltd.), vinyl oxime "8500" (manufactured by Arakawa Chemical Industries, Ltd.), and methyl hydrogen polyoxyalkylene "12031" (manufactured by Arakawa Chemical Industries, Ltd.), ethylene A combination of a group of "11364" (manufactured by Arakawa Chemical Industries Co., Ltd.) and a methyl hydrogen polyoxyalkylene "12031" (manufactured by Arakawa Chemical Industries Co., Ltd.), vinyl oxime "11365" (manufactured by Arakawa Chemical Industries Co., Ltd.) and A A combination of a base hydrogen polyoxane "12031" (manufactured by Arakawa Chemical Industries, Ltd.).

再者,KNS-320A、KS-847及TPR6700為預先含有主劑與交聯劑之硬化性矽氧樹脂組成物。 Further, KNS-320A, KS-847, and TPR6700 are hardenable oxime resin compositions containing a main component and a crosslinking agent in advance.

(步驟之次序) (order of steps)

於剝離性玻璃基板之呈易剝離性之表面上塗佈硬化性樹脂組成物之方法並無特別限制,可採用公知之方法。例如,作為塗佈方法,可列舉:噴塗法、擠壓式塗佈法、旋 轉塗佈法、浸塗法、輥塗法、棒式塗佈法、絲網印刷法、凹版塗佈法等。可自該種方法中根據硬化性樹脂組成物之種類而適當選擇。 The method of applying the curable resin composition on the surface of the peelable glass substrate which is easily peelable is not particularly limited, and a known method can be employed. For example, as a coating method, a spraying method, a squeeze coating method, and a spinning method are mentioned. A spin coating method, a dip coating method, a roll coating method, a bar coating method, a screen printing method, a gravure coating method, or the like. From the above methods, it can be appropriately selected depending on the kind of the curable resin composition.

又,硬化性樹脂組成物之塗佈量並無特別限制,就可獲得樹脂層之較佳厚度之方面而言,較佳為1~100 g/m2,更佳為5~20 g/m2Further, the coating amount of the curable resin composition is not particularly limited, and from the viewpoint of obtaining a preferable thickness of the resin layer, it is preferably from 1 to 100 g/m 2 , more preferably from 5 to 20 g/m. 2 .

再者,於硬化性樹脂組成物含有溶劑之情形時,亦可視需要進行硬化性樹脂未硬化之程度之加熱處理而使溶劑揮發。 In the case where the curable resin composition contains a solvent, the solvent may be volatilized by heat treatment to the extent that the curable resin is not cured.

將硬化性樹脂組成物塗佈於剝離性玻璃基板上而獲得之未硬化之硬化性樹脂組成物層之厚度並無特別限制,為了獲得下述之具有較佳厚度之樹脂層而適當調整。 The thickness of the uncured curable resin composition layer obtained by applying the curable resin composition to the release glass substrate is not particularly limited, and is appropriately adjusted in order to obtain a resin layer having a preferable thickness as described below.

所形成之未硬化之硬化性樹脂組成物層之外形尺寸與剝離性玻璃基板之外形尺寸為相同程度,或較其小。 The outer shape of the formed uncured curable resin composition layer is the same as or smaller than the outer shape of the peelable glass substrate.

[積層步驟] [Lamination step]

積層步驟S106係如下之步驟:將具有較未硬化之硬化性樹脂組成物層之外形尺寸小之外形尺寸之載體基板,以於上述硬化性樹脂組成物層形成步驟S104中獲得之未硬化之硬化性樹脂組成物層中殘留未與載體基板接觸之周緣區域之方式,積層於未硬化之硬化性樹脂組成物層上,而獲得硬化前積層體(實施硬化處理前之積層體)。換而言之,載體基板以於載體基板之外周露出未硬化之硬化性樹脂組成物層之方式積層於未硬化之硬化性樹脂組成物層上。 The lamination step S106 is a step of: a carrier substrate having a shape smaller than that of the uncured curable resin composition layer, and an uncured hardening obtained in the above-described curable resin composition layer forming step S104. The resin composition layer is laminated on the uncured curable resin composition layer so as to remain in the peripheral layer region which is not in contact with the carrier substrate, and the pre-cured laminate (the laminate before the hardening treatment) is obtained. In other words, the carrier substrate is laminated on the uncured curable resin composition layer so that the uncured curable resin composition layer is exposed on the periphery of the carrier substrate.

更具體而言,如圖2(C)所示,根據本步驟S106,將較未 硬化之硬化性樹脂組成物層12之外形尺寸小之載體基板14,以於未硬化之硬化性樹脂組成物層12中產生未與載體基板14接觸之周緣區域12a之方式,積層於未硬化之硬化性樹脂組成物層12上,而獲得硬化前積層體16。圖3(A)係硬化前積層體16之俯視圖,如該圖所示,未硬化之硬化性樹脂組成物層12之周緣區域12a未與載體基板14接觸。 More specifically, as shown in FIG. 2(C), according to this step S106, The carrier substrate 14 having a small size outside the hardened curable resin composition layer 12 is laminated on the unhardened curable resin composition layer 12 to form a peripheral region 12a which is not in contact with the carrier substrate 14, and is laminated in an unhardened manner. On the curable resin composition layer 12, a laminated body 16 before hardening is obtained. 3(A) is a plan view of the laminated body 16 before hardening, and as shown in the figure, the peripheral region 12a of the uncured curable resin composition layer 12 is not in contact with the carrier substrate 14.

通常,於未硬化之硬化性樹脂組成物層12之露出表面,因其表面張力之影響而容易於周緣部附近產生凸部(參照圖3(B))。於積層載體基板14時,若與該種凸部接觸,則有於載體基板14與未硬化之硬化性樹脂組成物層12之間產生空隙32等之情形,結果有產生載體基板14與未硬化之硬化性樹脂組成物層12未接觸之區域之情形(圖3(C))。若存在該種區域,則有硬化步驟S108中獲得之樹脂層對於載體基板14之密接性降低之情形。又,亦有產生樹脂層之厚度不均之情形,亦可能成為於附樹脂層之載體基板之露出表面可形成表面凹凸之原因。進而,異物進入至該空隙32中而成為污染電子裝置用構件之污染源,而亦可能成為使電子裝置之良率降低之原因。 In general, the exposed surface of the uncured curable resin composition layer 12 is likely to have a convex portion in the vicinity of the peripheral portion due to the influence of the surface tension (see FIG. 3(B)). When the carrier substrate 14 is laminated, when the contact portion is in contact with the convex portion, a void 32 or the like is formed between the carrier substrate 14 and the uncured curable resin composition layer 12, and as a result, the carrier substrate 14 is unhardened. The case where the region of the curable resin composition layer 12 is not in contact (Fig. 3(C)). If such a region is present, there is a case where the adhesion of the resin layer obtained in the hardening step S108 to the carrier substrate 14 is lowered. Further, there is a case where the thickness of the resin layer is uneven, and the surface unevenness may be formed on the exposed surface of the carrier substrate with the resin layer. Further, foreign matter enters the gap 32 and becomes a source of contamination of the member for contaminating the electronic device, which may also cause a decrease in the yield of the electronic device.

因此,藉由使用具有較未硬化之硬化性樹脂組成物層12之外形尺寸小之外形尺寸之載體基板14,而可於不與該凸部接觸之情況下使載體基板14與未硬化之硬化性樹脂組成物層12接觸。結果為,進一步抑制產生載體基板14與未硬化之硬化性樹脂組成物層12未接觸之區域,而使樹脂層對於載體基板14之密接性更優異,並且亦進一步抑制產生樹 脂層之厚度不均。 Therefore, by using the carrier substrate 14 having a shape smaller than that of the uncured curable resin composition layer 12, the carrier substrate 14 can be hardened without being hardened by contact with the convex portion. The resin composition layer 12 is in contact. As a result, the region where the carrier substrate 14 and the uncured curable resin composition layer 12 are not contacted is further suppressed, and the adhesion of the resin layer to the carrier substrate 14 is further improved, and the generation of the tree is further suppressed. The thickness of the lipid layer is uneven.

首先,對本步驟中使用之載體基板進行詳細敍述,其後對該步驟S106之次序進行詳細敍述。 First, the carrier substrate used in this step will be described in detail, and the sequence of step S106 will be described in detail later.

(載體基板) (carrier substrate)

載體基板係於下述之構件形成步驟S112(製造電子裝置用構件之步驟)中於電子裝置用構件之製造時防止剝離性玻璃基板之變形、附損傷、破損等之基板。 The carrier substrate is a substrate that prevents deformation, damage, breakage, or the like of the peelable glass substrate during manufacture of the electronic device member in the member forming step S112 (step of manufacturing the electronic device) described below.

作為載體基板,例如可使用玻璃板、塑膠板、SUS(Steel Use Stainless,日本不鏽鋼標準)板等金屬板等。載體基板於構件形成步驟S112伴隨有熱處理之情形時,較佳為由與剝離性玻璃基板之線膨脹係數之差較小之材料形成,更佳為由與剝離性玻璃基板相同之材料形成,載體基板較佳為玻璃板。尤其,載體基板較佳為包含與剝離性玻璃基板相同之玻璃材料之玻璃板。 As the carrier substrate, for example, a glass plate, a plastic plate, a metal plate such as a SUS (Steel Use Stainless) plate, or the like can be used. When the carrier substrate is subjected to heat treatment in the member forming step S112, it is preferably formed of a material having a small difference in linear expansion coefficient from the peelable glass substrate, and more preferably formed of the same material as the peelable glass substrate. The substrate is preferably a glass plate. In particular, the carrier substrate is preferably a glass plate containing the same glass material as the release glass substrate.

載體基板之厚度可較剝離性玻璃基板厚,亦可較其薄。較佳為根據剝離性玻璃基板之厚度、樹脂層之厚度、及下述之切斷後積層體之厚度而選擇載體基板之厚度。例如,現行之構件形成步驟係為了對厚度0.5 mm之構件形成用基板(無載體基板之積層而作為載體基板之單板進行操作之現行之情形)進行構件形成用處理(例如清洗、成膜、曝光現象、檢查等)而設計者,於剝離性玻璃基板之厚度與樹脂層之厚度之和為0.1 mm之情形時,將載體基板之厚度設為0.4 mm。載體基板之厚度於通常之情形時較佳為0.2~5.0 mm。 The thickness of the carrier substrate may be thicker than that of the peelable glass substrate, or may be thinner. It is preferable to select the thickness of the carrier substrate in accordance with the thickness of the peelable glass substrate, the thickness of the resin layer, and the thickness of the laminated body after the cutting. For example, the current member forming step is a member forming process (for example, cleaning, film formation, or the like) for a member for forming a member having a thickness of 0.5 mm (the current operation as a substrate of a carrier substrate without a laminate of a carrier substrate). In the case where the thickness of the peelable glass substrate and the thickness of the resin layer are 0.1 mm, the thickness of the carrier substrate is set to 0.4 mm. The thickness of the carrier substrate is preferably 0.2 to 5.0 mm in the usual case.

於載體基板為玻璃板之情形時,就容易操作、難以破裂等理由而言,玻璃板之厚度較佳為0.08 mm以上。又,就期望如於電子裝置用構件形成後進行剝離時不破裂而適度地彎曲般之剛性之理由而言,玻璃板之厚度較佳為1.0 mm以下。 When the carrier substrate is a glass plate, the thickness of the glass plate is preferably 0.08 mm or more for reasons of easy handling and difficulty in cracking. In addition, it is desirable that the thickness of the glass plate is 1.0 mm or less for the reason that the member for the electronic device is formed to be rigid and not bent at the time of peeling and is appropriately bent.

剝離性玻璃基板與載體基板之於25~300℃下之平均線膨脹係數(以下,僅稱為「平均線膨脹係數」)之差較佳為500×10-7/℃以下,更佳為300×10-7/℃以下,進而較佳為200×10-7/℃以下。若差過大,則有於構件形成步驟S112中之加熱冷卻時積層體嚴重翹曲之虞。於剝離性玻璃基板之材料與載體基板之材料相同之情形時,可抑制該種問題產生。 The difference between the average linear expansion coefficient (hereinafter simply referred to as "average linear expansion coefficient") of the peelable glass substrate and the carrier substrate at 25 to 300 ° C is preferably 500 × 10 -7 / ° C or less, more preferably 300. ×10 -7 /°C or less, further preferably 200×10 -7 /°C or less. If the difference is too large, there is a possibility that the laminated body is severely warped during heating and cooling in the member forming step S112. When the material of the peelable glass substrate is the same as the material of the carrier substrate, the occurrence of such a problem can be suppressed.

(步驟之次序) (order of steps)

將載體基板積層於未硬化之硬化性樹脂組成物層上之方法並無特別限制,可採用公知之方法。 The method of laminating the carrier substrate on the uncured curable resin composition layer is not particularly limited, and a known method can be employed.

例如,可列舉於常壓環境下於未硬化之硬化性樹脂組成物層之表面上堆疊載體基板之方法。再者,視需要亦可於在未硬化之硬化性樹脂組成物層之表面上堆疊載體基板後使用輥或壓機使載體基板壓接於未硬化之硬化性樹脂組成物層。藉由利用輥或壓機之壓接,而比較容易去除未硬化之硬化性樹脂組成物層與載體基板之層之間混入之氣泡,故而較佳。 For example, a method of stacking a carrier substrate on the surface of an uncured curable resin composition layer under a normal pressure environment can be exemplified. Further, if necessary, the carrier substrate may be stacked on the surface of the uncured curable resin composition layer, and then the carrier substrate may be pressure-bonded to the uncured curable resin composition layer using a roll or a press. It is preferable to use a pressure contact by a roll or a press to relatively easily remove bubbles which are mixed between the layer of the uncured curable resin composition and the layer of the carrier substrate.

若藉由真空層壓法或真空加壓法壓接,則進行氣泡之混入之抑制或良好之密接之確保,故而更佳。藉由於真空下 壓接,而具有即便於殘留微小之氣泡之情形時亦不會因加熱而使氣泡成長,而難以導致產生載體基板之變形缺陷之優點。 When the pressure is bonded by a vacuum lamination method or a vacuum press method, it is more preferable to suppress the incorporation of air bubbles or to ensure good adhesion. By vacuum When the pressure is applied, even if minute bubbles are left, the bubbles are not grown by heating, and it is difficult to cause deformation defects of the carrier substrate.

於積層載體基板時,較佳為對與未硬化之硬化性樹脂組成物層接觸之載體基板之表面進行充分清洗,而於清潔度較高之環境下積層。清潔度越高,則載體基板之平坦性越良好,故而較佳。 In the case of laminating a carrier substrate, it is preferred to sufficiently clean the surface of the carrier substrate which is in contact with the uncured curable resin composition layer, and to laminate the layer in an environment having a high degree of cleanliness. The higher the cleanliness, the better the flatness of the carrier substrate, which is preferable.

於藉由上述步驟而獲得之硬化前積層體中依序包含剝離性玻璃基板之層、未硬化之硬化性樹脂組成物層、及載體基板之層。 The layer before the hardening obtained by the above steps sequentially includes a layer of a peelable glass substrate, an uncured curable resin composition layer, and a layer of a carrier substrate.

於該態樣中,未硬化之硬化性樹脂組成物層之外形尺寸較載體基板之外形尺寸大。未硬化之硬化性樹脂組成物層之與載體基板接觸之區域之面積A與未硬化之硬化性樹脂組成物層之總面積B之比(面積A/總面積B)較佳為0.98以下,更佳為0.95以下。若為上述範圍內,則進一步抑制樹脂層之厚度不均之產生。下限並無特別限制,但就生產性等方面而言,較佳為0.75以上,更佳為0.80以上。 In this aspect, the shape of the uncured curable resin composition layer is larger than that of the carrier substrate. The ratio (area A / total area B) of the area A of the region of the uncured curable resin composition layer in contact with the carrier substrate to the total area B of the uncured curable resin composition layer is preferably 0.98 or less. Good is below 0.95. When it is in the above range, the occurrence of thickness unevenness of the resin layer is further suppressed. The lower limit is not particularly limited, but is preferably 0.75 or more, and more preferably 0.80 or more in terms of productivity and the like.

又,自載體基板之外周緣至未硬化之硬化性樹脂組成物層之外周緣為止之長度較佳為10 mm以上,更佳為15 mm以上。若為上述範圍內,則進一步抑制樹脂層之厚度不均之產生。上限並無特別限制,但就生產性等方面而言,較佳為100 mm以下。 Moreover, the length from the outer periphery of the carrier substrate to the outer periphery of the uncured curable resin composition layer is preferably 10 mm or more, and more preferably 15 mm or more. When it is in the above range, the occurrence of thickness unevenness of the resin layer is further suppressed. The upper limit is not particularly limited, but is preferably 100 mm or less in terms of productivity and the like.

[硬化步驟] [hardening step]

硬化步驟S108係如下之步驟:對上述積層步驟S106中獲 得之硬化前積層體實施硬化處理,使硬化前積層體中之未硬化之硬化性樹脂組成物層硬化,而獲得具有樹脂層之硬化後積層體(實施硬化處理之積層體)。更具體而言,如圖2(D)所示,藉由實施該步驟,而使未硬化之硬化性樹脂組成物層12硬化從而獲得樹脂層18,而獲得依序具有剝離性玻璃基板10之層、樹脂層18、及載體基板14之層之硬化後積層體20。 The hardening step S108 is a step of obtaining the above-mentioned lamination step S106 The hardened pre-hardened laminate is subjected to a hardening treatment to harden the uncured curable resin composition layer in the laminate before curing, thereby obtaining a post-hardened laminate having a resin layer (a laminate subjected to hardening treatment). More specifically, as shown in FIG. 2(D), by performing this step, the uncured curable resin composition layer 12 is cured to obtain the resin layer 18, and the peelable glass substrate 10 is obtained in order. The laminated layer 20 of the layer, the resin layer 18, and the layer of the carrier substrate 14 is cured.

以下,對本步驟中實施之步驟之次序進行詳細敍述,其後對所獲得之積層體之構成進行詳細敍述。 Hereinafter, the procedure of the steps carried out in this step will be described in detail, and then the configuration of the obtained laminate will be described in detail.

(步驟之次序) (order of steps)

本步驟中實施之硬化處理根據所使用之硬化性樹脂之種類而適當選擇最佳方法,但通常進行加熱處理或曝光處理。 The hardening treatment carried out in this step is appropriately selected depending on the type of the curable resin to be used, but usually, heat treatment or exposure treatment is performed.

於硬化性樹脂組成物層中所含之硬化性樹脂為熱硬化性之情形時,可藉由對未硬化之硬化性樹脂組成物層實施加熱處理而使該層硬化。加熱處理之條件根據所使用之熱硬化性樹脂之種類而適當選擇最佳條件。其中,就硬化性樹脂之硬化速度及所形成之樹脂層之耐熱性等方面而言,較佳為於150~300℃(較佳為180~250℃)下進行加熱處理10~120分鐘(較佳為30~60分鐘)。 When the curable resin contained in the curable resin composition layer is thermosetting, the layer can be cured by heat-treating the uncured curable resin composition layer. The conditions of the heat treatment are appropriately selected depending on the type of the thermosetting resin to be used. Among them, in terms of the curing speed of the curable resin and the heat resistance of the formed resin layer, it is preferably heated at 150 to 300 ° C (preferably 180 to 250 ° C) for 10 to 120 minutes (compared to Good for 30~60 minutes).

於硬化性樹脂組成物層中所含之硬化性樹脂為光硬化性樹脂之情形時,可藉由對未硬化之硬化性樹脂組成物層實施曝光處理而使該層硬化。曝光處理時所照射之光之種類根據光硬化性樹脂之種類而適當選擇,例如可列舉:紫外 光、可見光、紅外光等。又,就硬化性樹脂之硬化速度及所形成之樹脂層之耐光性等方面而言,曝光處理時之照射時間較佳為0.1~10分鐘(較佳為0.5~5分鐘)。 When the curable resin contained in the curable resin composition layer is a photocurable resin, the layer can be cured by subjecting the uncured curable resin composition layer to an exposure treatment. The type of light to be irradiated during the exposure treatment is appropriately selected depending on the type of the photocurable resin, and examples thereof include ultraviolet light. Light, visible light, infrared light, etc. Further, the irradiation time during the exposure treatment is preferably from 0.1 to 10 minutes (preferably from 0.5 to 5 minutes) in terms of the curing speed of the curable resin and the light resistance of the formed resin layer.

(樹脂層) (resin layer)

其次,對硬化後積層體中之樹脂層進行詳細敍述。 Next, the resin layer in the laminated body after hardening will be described in detail.

樹脂層之厚度並無特別限定,較佳為1~100 μm,更佳為5~30 μm,進而較佳為7~20 μm。其原因在於,若樹脂層之厚度為該種範圍,則樹脂層與載體基板之密接變得充分。又,其原因在於,即便有於樹脂層與載體基板之間夾雜有氣泡或異物之情形,亦可抑制剝離性玻璃基板之變形缺陷之產生。又,若樹脂層之厚度過厚,則於形成時需要時間及材料,故而不經濟。 The thickness of the resin layer is not particularly limited, but is preferably 1 to 100 μm, more preferably 5 to 30 μm, still more preferably 7 to 20 μm. This is because if the thickness of the resin layer is in this range, the adhesion between the resin layer and the carrier substrate becomes sufficient. Moreover, this is because the occurrence of deformation defects of the peelable glass substrate can be suppressed even when air bubbles or foreign matter are interposed between the resin layer and the carrier substrate. Further, if the thickness of the resin layer is too thick, time and material are required at the time of formation, which is uneconomical.

再者,樹脂層亦可包含2層以上。於此情形時,「樹脂層之厚度」係指所有層之合計之厚度。 Further, the resin layer may contain two or more layers. In this case, the "thickness of the resin layer" means the total thickness of all the layers.

又,於樹脂層包含2層以上之情形時,形成各層之樹脂之種類亦可不同。 Further, when the resin layer contains two or more layers, the types of the resins forming the respective layers may be different.

樹脂層較佳為包含玻璃轉移點較室溫(25℃左右)低或不具有玻璃轉移點之材料。其原因在於,可更容易地與剝離性玻璃基板剝離,同時與剝離性玻璃基板之密接亦變得充分。 The resin layer preferably contains a material having a glass transition point lower than room temperature (about 25 ° C) or having no glass transition point. This is because the peeling glass substrate can be more easily peeled off and the adhesion to the peelable glass substrate is also sufficient.

形成樹脂層之樹脂之種類並無特別限定,根據上述硬化性樹脂組成物所含之樹脂之種類而不同。例如可列舉:丙烯酸系樹脂、聚烯烴樹脂、聚胺基甲酸酯樹脂、或矽氧樹脂。其中,如上所述較佳為矽氧樹脂。 The type of the resin forming the resin layer is not particularly limited, and varies depending on the type of the resin contained in the curable resin composition. For example, an acrylic resin, a polyolefin resin, a polyurethane resin, or a oxime resin can be mentioned. Among them, as described above, a silicone resin is preferred.

再者,樹脂層視需要亦可含有非硬化性之有機矽氧烷,其含量具體而言為5質量%以下(0~5質量%),較佳為可列舉0.01~1質量%。若非硬化性之有機矽氧烷含於樹脂層中,則下述之分離步驟S114中之剝離性玻璃基板與樹脂層之界面之剝離進一步效率良好地進行。 In addition, the resin layer may contain a non-hardening organic siloxane, and the content thereof is specifically 5% by mass or less (0 to 5% by mass), preferably 0.01 to 1% by mass. When the non-hardenable organic siloxane is contained in the resin layer, the separation of the interface between the detachable glass substrate and the resin layer in the separation step S114 described below is further efficiently performed.

使樹脂層含有該非硬化性之有機矽氧烷之方法並無特別限制,可列舉添加於上述硬化性樹脂組成物中之方法。 The method of containing the non-curable organic decane in the resin layer is not particularly limited, and a method of adding the composition to the curable resin composition is exemplified.

再者,作為非硬化性之有機矽氧烷,可列舉不含有Si-H鍵之矽氧油,具體而言可列舉聚二甲基矽氧烷系或聚甲基苯基矽氧烷系矽氧油等。 Further, examples of the non-curable organic siloxane include an oxime oil which does not contain a Si—H bond, and specific examples thereof include a polydimethyl siloxane or a polymethyl phenyl siloxane. Oxygen oil, etc.

(硬化後積層體) (Laminated body after hardening)

藉由上述硬化步驟而獲得之硬化後積層體依序具有剝離性玻璃基板之層、樹脂層、及載體基板之層。 The cured laminated body obtained by the above-described hardening step sequentially has a layer of a peelable glass substrate, a resin layer, and a layer of a carrier substrate.

所獲得之硬化後積層體中,樹脂層固定(接著)於載體基板上,而且可剝離地密接於剝離性玻璃基板。樹脂層係防止剝離性玻璃基板之位置偏移直至於下述之分離步驟S114中進行將剝離性玻璃基板與附樹脂層之載體基板分離之操作為止。 In the obtained post-hardened laminate, the resin layer was fixed (and subsequently) on the carrier substrate, and was peelably adhered to the peelable glass substrate. The resin layer prevents the positional shift of the peelable glass substrate until the separation of the peelable glass substrate and the carrier substrate with the resin layer is performed in the separation step S114 described below.

剝離性玻璃基板之與樹脂層接觸之表面可剝離地密接於樹脂層之表面。於本發明中,將該剝離性玻璃基板之可容易剝離之性質稱為易剝離性。 The surface of the peelable glass substrate that is in contact with the resin layer is peelably adhered to the surface of the resin layer. In the present invention, the property of the peelable glass substrate which can be easily peeled off is referred to as easy peelability.

於本發明中,上述固定與(可剝離之)密接於剝離強度(即,剝離所需要之應力)方面存在差異,固定係指相對於密接而言剝離強度較大。具體而言,硬化後積層體中之樹 脂層與載體基板之層之界面之剝離強度較剝離性玻璃基板之層與樹脂層之界面之剝離強度大。 In the present invention, the above-mentioned fixation differs from the (peelable) in the peel strength (that is, the stress required for peeling), and the fixing means that the peel strength is large with respect to the adhesion. Specifically, the tree in the laminated body after hardening The peeling strength of the interface between the layer of the lipid layer and the carrier substrate is larger than the peeling strength of the interface between the layer of the peelable glass substrate and the resin layer.

又,可剝離之密接係指可剝離,同時亦指於不產生固定之面之剝離之情況下可剝離。具體而言係指於硬化後積層體中,於進行將剝離性玻璃基板與載體基板分離之操作之情形時,於密接之面剝離,而於固定之面不剝離。因此,若進行將硬化後積層體分離成剝離性玻璃基板與載體基板之操作,則硬化後積層體被分離成剝離性玻璃基板與附樹脂層之載體基板之該2個。 Further, the peelable adhesive means peelable, and also refers to peeling off in the case where peeling of the fixed surface is not caused. Specifically, in the case where the peeling glass substrate and the carrier substrate are separated from each other in the laminated body after curing, the surface is adhered to the surface to be adhered, and the surface to be fixed is not peeled off. Therefore, when the laminated body after hardening is separated into the peelable glass substrate and the carrier substrate, the laminated body after the hardening is separated into two of the peelable glass substrate and the carrier substrate with the resin layer.

如上所述,使未硬化之硬化性樹脂組成物層於與載體基板表面接觸之狀態下反應硬化,故而所形成之樹脂層較強地接著於載體基板表面。另一方面,未硬化之硬化性樹脂組成物層係於亦與剝離性玻璃基板接觸之狀態下反應硬化,但由於剝離性玻璃基板表面之易剝離性(非附著性),故而所形成之樹脂層對於剝離性玻璃基板以固體分子間之凡得瓦(Van Der Waals)力所致之結合力等較弱之結合力密接。 As described above, the uncured curable resin composition layer is reactively cured in a state of being in contact with the surface of the carrier substrate, so that the formed resin layer is strongly adhered to the surface of the carrier substrate. On the other hand, the uncured curable resin composition layer is reactively cured in a state of being in contact with the peelable glass substrate, but the resin formed by the surface of the peelable glass substrate is easily peelable (non-adhesive). The layer is intimately bonded to the peeling glass substrate by a weak bonding force such as a bonding force between solid molecules and a Van Der Waals force.

[切斷步驟] [cutting step]

切斷步驟S110係沿著上述硬化步驟S108中獲得之硬化後積層體中之載體基板之外周緣將樹脂層及剝離性玻璃基板切斷之步驟。換而言之,係將硬化後積層體中之樹脂層及剝離性玻璃基板之各者之外周部切斷而使載體基板、樹脂層、及剝離性玻璃基板之各者之外周緣之全周對齊之步驟。更具體而言,如圖2(E)所示,根據本步驟,沿著載體 基板14之外周緣將樹脂層18及剝離性玻璃基板10切斷,而獲得切斷後積層體22(實施切斷處理之積層體)。 The cutting step S110 is a step of cutting the resin layer and the peelable glass substrate along the outer periphery of the carrier substrate in the cured laminated body obtained in the curing step S108. In other words, the outer peripheral portion of each of the resin layer and the peelable glass substrate in the laminated body after curing is cut so that the periphery of each of the carrier substrate, the resin layer, and the peelable glass substrate is completed. The step of aligning. More specifically, as shown in FIG. 2(E), according to this step, along the carrier The resin layer 18 and the peelable glass substrate 10 are cut off from the outer periphery of the substrate 14, and the laminated body 22 after cutting (the laminated body subjected to the cutting process) is obtained.

以下,對本步驟S110之次序進行詳細敍述。 Hereinafter, the sequence of this step S110 will be described in detail.

將樹脂層及剝離性玻璃基板切斷之方法並無特別限制,可採用公知之方法。例如,就操作性等方面而言基於圖4~圖6所說明之切斷方法較佳。 The method of cutting the resin layer and the peelable glass substrate is not particularly limited, and a known method can be employed. For example, the cutting method described based on FIGS. 4 to 6 is preferable in terms of operability and the like.

圖4係透視載置於載物台上之硬化後積層體之一部分而表示之平面圖,圖5係破壞載置於載物台上之硬化後積層體及加工頭(working head)之一部分而表示之剖面圖,圖6係表示載置於另一載物台上之硬化後積層體及夾持夾具之剖面圖。 Figure 4 is a plan view showing a portion of the hardened laminated body placed on the stage, and Figure 5 is a view showing a part of the hardened laminated body and the working head placed on the stage. FIG. 6 is a cross-sectional view showing the hardened laminated body and the holding jig placed on the other stage.

如圖4所示,硬化後積層體20係由載物台50支持載體基板14之主表面,並且使載體基板之外周緣抵接於設置於載物台50上之定位塊51~53。 As shown in FIG. 4, the laminated body 20 after curing is supported by the stage 50 to support the main surface of the carrier substrate 14, and the outer periphery of the carrier substrate is brought into contact with the positioning blocks 51 to 53 provided on the stage 50.

於圖4中,載體基板14之露出表面由載物台50之上表面支持,並且使矩形狀之載體基板14之相互垂直之2邊14a及14b抵接於定位塊51~53。其後,使移動塊54、55接近、抵接於載體基板14之剩餘之各邊14c、14d。 In FIG. 4, the exposed surface of the carrier substrate 14 is supported by the upper surface of the stage 50, and the mutually perpendicular sides 14a and 14b of the rectangular carrier substrate 14 are brought into contact with the positioning blocks 51-53. Thereafter, the moving blocks 54, 55 are brought close to and abut against the remaining sides 14c, 14d of the carrier substrate 14.

如圖4所示,若使載體基板14之外周緣抵接於定位塊51~53,則載體基板14之外周緣與載物台50之位置對準精度變得良好。因此,將載體基板14之外周緣、與樹脂層18及剝離性玻璃基板10之外周緣精度良好地對齊。 As shown in FIG. 4, when the outer peripheral edge of the carrier substrate 14 is brought into contact with the positioning blocks 51 to 53, the alignment accuracy of the outer peripheral edge of the carrier substrate 14 and the stage 50 is improved. Therefore, the outer periphery of the carrier substrate 14 and the outer periphery of the resin layer 18 and the peelable glass substrate 10 are accurately aligned.

又,設置於載物台50之上表面之複數個吸附孔內由真空泵等減壓,將載體基板14吸附於載物台50之上表面。為了 保護載體基板14,亦可於載物台50之上表面設置樹脂膜等。 Further, the plurality of adsorption holes provided on the upper surface of the stage 50 are decompressed by a vacuum pump or the like, and the carrier substrate 14 is adsorbed on the upper surface of the stage 50. in order to The carrier substrate 14 may be protected, and a resin film or the like may be provided on the upper surface of the stage 50.

其次,攝像裝置對載物台50上之硬化後積層體20進行攝像。所攝像之圖像被傳送至電腦中。電腦對所接收之圖像進行圖像處理,檢測載體基板14之外周緣與載物台50之位置關係。 Next, the imaging device images the hardened laminated body 20 on the stage 50. The captured image is transferred to a computer. The computer performs image processing on the received image to detect the positional relationship between the outer periphery of the carrier substrate 14 and the stage 50.

其次,電腦基於圖像處理之結果而使加工硬化後積層體20之加工頭60相對於載物台50相對移動。加工頭60之移動軌跡以俯視下與載體基板14之外周緣重疊之方式控制(參照圖5)。 Next, the computer relatively moves the processing head 60 of the laminated body 20 after work hardening with respect to the stage 50 based on the result of the image processing. The movement locus of the processing head 60 is controlled so as to overlap the outer periphery of the carrier substrate 14 in plan view (see FIG. 5).

再者,於本實施形態中,電腦為了控制加工頭之移動軌跡而利用圖像處理之結果,但亦可取而代之利用預先記錄於硬碟等記錄媒體等中之有關載體基板之形狀尺寸的資訊。於此情形時,不需要攝像裝置。 Further, in the present embodiment, the computer uses the result of image processing in order to control the movement trajectory of the processing head, but may alternatively use information on the shape and size of the carrier substrate previously recorded on a recording medium such as a hard disk. In this case, an imaging device is not required.

圖5所示之加工頭60根據剝離性玻璃基板10之種類或厚度等而構成。例如,加工頭60係於剝離性玻璃基板10之表面形成切割線66者且由切割器62等構成。 The processing head 60 shown in FIG. 5 is configured according to the type, thickness, and the like of the peelable glass substrate 10. For example, the processing head 60 is formed of a cutter 62 or the like by forming a cutting line 66 on the surface of the peelable glass substrate 10.

切割器62例如為圓板狀,且外周部由金剛石或超合金等形成,固持器64可旋轉地被支持。若於將切割器62之外周部按壓於剝離性玻璃基板10之表面之狀態下使固持器64於剝離性玻璃基板10之面內方向上相對移動,則切割器62一面旋轉一面於剝離性玻璃基板10之表面形成切割線66。 The cutter 62 is, for example, a disk shape, and the outer peripheral portion is formed of diamond or superalloy, and the holder 64 is rotatably supported. When the retainer 64 is relatively moved in the in-plane direction of the peelable glass substrate 10 while the outer peripheral portion of the cutter 62 is pressed against the surface of the peelable glass substrate 10, the cutter 62 is rotated on the peeling glass. The surface of the substrate 10 forms a cutting line 66.

切割線66係對應於矩形狀之載體基板14之4邊14a、14b、14c、14d而設置有4條,且各者以俯視下與載體基板 14之對應之邊重疊之方式形成。各切割線66以將剝離性玻璃基板10之表面分斷之方式自剝離性玻璃基板10之一邊延伸至另一邊。 The cutting line 66 is provided in four rows corresponding to the four sides 14a, 14b, 14c, and 14d of the rectangular carrier substrate 14, and each of them is arranged in a plan view and a carrier substrate. The corresponding sides of 14 are formed in an overlapping manner. Each of the dicing lines 66 extends from one side of the detachable glass substrate 10 to the other side so as to break the surface of the detachable glass substrate 10.

再者,圖5中所示之本實施形態之加工頭60由切割器62等構成,但前端亦可為圓錐狀且由金剛石形成且藉由滑刻而切入切割線之點刻劃器,亦可由雷射光源等構成。雷射光源對剝離性玻璃基板10之表面照射光點。光點於剝離性玻璃基板10之表面上掃描,藉由熱應力而形成切割線66。 Further, the processing head 60 of the present embodiment shown in FIG. 5 is constituted by a cutter 62 or the like, but the front end may also be a point-shaped scriber which is formed in a conical shape and formed by diamond and cut into a cutting line by sliding. It can be composed of a laser light source or the like. The laser light source irradiates the surface of the peelable glass substrate 10 with a light spot. The light spot is scanned on the surface of the peelable glass substrate 10, and the cut line 66 is formed by thermal stress.

於藉由加工頭60形成切割線66後,使真空泵停止動作,使抽吸孔內開放於大氣中,而解除抽吸。其次,使移動塊54、55與載體基板14相離,並且使載體基板14與定位塊51~53相離。其後,硬化後積層體20被提昇至載物台50之上方,然後被移送至另一載物台70之上方。繼而,硬化後積層體20被降至下方,然後被載置於載物台70(參照圖6)。 After the cutting line 66 is formed by the processing head 60, the vacuum pump is stopped, the inside of the suction hole is opened to the atmosphere, and the suction is released. Next, the moving blocks 54, 55 are separated from the carrier substrate 14, and the carrier substrate 14 is separated from the positioning blocks 51-53. Thereafter, the hardened laminated body 20 is lifted above the stage 50 and then transferred to the upper side of the other stage 70. Then, the hardened laminated body 20 is lowered to the lower side and then placed on the stage 70 (refer to FIG. 6).

其次,如圖6所示,設置於載物台70之上表面之複數個抽吸孔內由真空泵等減壓,將載體基板14吸附於載物台70之上表面。於此狀態下,於載物台70之外側伸出一條切割線66。 Next, as shown in FIG. 6, the plurality of suction holes provided on the upper surface of the stage 70 are decompressed by a vacuum pump or the like, and the carrier substrate 14 is adsorbed on the upper surface of the stage 70. In this state, a cutting line 66 protrudes from the outer side of the stage 70.

其次,較一條切割線66靠外側之部分於板厚方向上由夾持夾具72所夾持。於此狀態下,若夾持夾具72向下方向旋動,則對剝離性玻璃基板10及樹脂層18施加彎曲應力,故而以1條切割線66為起點於板厚方向上使裂痕68延伸展開,而將剝離性玻璃基板10及樹脂層18一次割斷(參照圖6)。 Next, the portion outside the one cutting line 66 is sandwiched by the holding jig 72 in the thickness direction. In this state, when the clamp jig 72 is rotated in the downward direction, bending stress is applied to the peelable glass substrate 10 and the resin layer 18, so that the crack 68 is extended in the thickness direction from the one cutting line 66 as a starting point. The peelable glass substrate 10 and the resin layer 18 are once cut (see FIG. 6).

其次,解除載物台50上之載體基板14之吸附,硬化後積層體20於平行移動或旋動90°後再次被吸附。其後,沿著另一條切割線66將剝離性玻璃基板10及樹脂層18割斷。重複進行上述動作,沿著4條切割線66將剝離性玻璃基板10及樹脂層18割斷。 Next, the adsorption of the carrier substrate 14 on the stage 50 is released, and after the hardening, the layered body 20 is again adsorbed by being moved in parallel or rotated by 90°. Thereafter, the peelable glass substrate 10 and the resin layer 18 are cut along the other cutting line 66. The above operation is repeated, and the peelable glass substrate 10 and the resin layer 18 are cut along the four cutting lines 66.

再者,於本實施形態中,為了進行割斷,將硬化後積層體自載物台50移送至另一載物台70,但亦可於相同之載物台50上平行移動或旋動90°後進行割斷。又,亦可視需要對割斷部實施倒角處理。 Further, in the present embodiment, in order to perform the cutting, the laminated body after curing is transferred from the stage 50 to the other stage 70, but may be moved or rotated 90° in parallel on the same stage 50. Then cut it. Further, the cut portion may be chamfered as needed.

[構件形成步驟] [Component forming step]

構件形成步驟S112係如下之步驟:於上述切斷步驟S110中獲得之切斷後積層體中之剝離性玻璃基板之第2主表面上形成電子裝置用構件,而獲得附電子裝置用構件之積層體。 The member forming step S112 is a step of forming a member for an electronic device on the second main surface of the peelable glass substrate in the laminated body obtained in the cutting step S110, and obtaining a laminate of the member for an electronic device. .

更具體而言,如圖2(F)所示,於剝離性玻璃基板10之第2主表面10b上形成電子裝置用構件24,而獲得附電子裝置用構件之積層體26。 More specifically, as shown in FIG. 2(F), the electronic device member 24 is formed on the second main surface 10b of the peelable glass substrate 10, and the laminated body 26 for the electronic device is obtained.

首先,對本步驟中使用之電子裝置用構件進行詳細敍述,其後對步驟之次序進行詳細敍述。 First, the components for electronic devices used in this step will be described in detail, and the order of the steps will be described in detail later.

(電子裝置用構件(功能性元件)) (Mechanical components (functional components))

電子裝置用構件係形成於切斷後積層體中之剝離性玻璃基板之第2主表面上而構成電子裝置之至少一部分之構件。更具體而言,作為電子裝置用構件,可列舉:顯示裝置用面板、太陽電池、薄膜二次電池、或於表面形成有電 路之半導體晶圓等電子零件等中所使用之構件。作為顯示裝置用面板,包含有機EL面板、電漿顯示器面板、場發射面板等。 The member for an electronic device is formed on the second main surface of the peelable glass substrate in the laminated body after the cutting, and constitutes at least a part of the electronic device. More specifically, examples of the member for an electronic device include a panel for a display device, a solar cell, a thin film secondary battery, or a surface formed with electricity. A component used in electronic parts such as semiconductor wafers. The panel for a display device includes an organic EL panel, a plasma display panel, a field emission panel, and the like.

例如,作為太陽電池用構件,就矽型而言,可列舉:正極之氧化錫等透明電極、由p層/i層/n層表示之矽層、及負極金屬等,除此以外,可列舉與化合物型、色素增感型、量子點型等對應之各種構件等。 For example, as a member for a solar cell, a transparent electrode such as tin oxide of a positive electrode, a tantalum layer represented by a p layer/i layer/n layer, and a negative electrode metal may be mentioned. Various members corresponding to compound type, dye-sensitized type, quantum dot type, and the like.

又,作為薄膜二次電池用構件,就鋰離子型而言,可列舉:正極及負極金屬或金屬氧化物等透明電極、電解質層之鋰化合物、集電層之金屬、作為密封層之樹脂等,除此以外,可列舉與鎳氫型、聚合物型、陶瓷電解質型等對應之各種構件等。 In addition, examples of the lithium ion type include a transparent electrode such as a positive electrode, a negative electrode metal or a metal oxide, a lithium compound of an electrolyte layer, a metal of a collector layer, a resin as a sealing layer, and the like. In addition, various members corresponding to a nickel hydrogen type, a polymer type, a ceramic electrolyte type, etc. are mentioned.

又,作為電子零件用構件,就CCD(Charge Coupled Device,電荷耦合器件)或CMOS(Complementary Metal Oxide Semiconductor,互補金屬氧化物半導體)而言,可列舉:導電部之金屬、絕緣部之氧化矽或氮化矽等,除此以外,可列舉與壓力感測器、加速感測器等各種感測器或硬性印刷基板、軟性印刷基板、硬性軟性印刷基板等對應之各種構件等。 In addition, as a member for an electronic component, a CCD (Charge Coupled Device) or a CMOS (Complementary Metal Oxide Semiconductor) may be exemplified by a metal of a conductive portion or a ruthenium oxide of an insulating portion. Other than the above, various components such as a pressure sensor and an acceleration sensor, or a rigid printed circuit board, a flexible printed circuit board, a rigid flexible printed circuit board, or the like can be used.

(步驟之次序) (order of steps)

上述附電子裝置用構件之積層體之製造方法並無特別限定,根據電子裝置用構件之構成構件之種類而利用先前公知之方法,於切斷後積層體之剝離性玻璃基板之第2主表面上形成電子裝置用構件。 The method for producing the laminated body of the member for an electronic device is not particularly limited, and the second main surface of the peelable glass substrate of the laminated body after the cutting is used according to the type of the constituent member of the electronic device member by a conventionally known method. A member for an electronic device is formed.

再者,電子裝置用構件亦可並非為最終形成於剝離性玻璃基板之第2主表面之構件之全部(以下稱為「全部構件」),而為全部構件之一部分(以下稱為「部分構件」)。亦可將自樹脂層剝離之附部分構件之剝離性玻璃基板於之後之步驟中設為附全部構件之剝離性玻璃基板(與下述之電子裝置相當)。 In addition, the member for the electronic device may not be the entire member (hereinafter referred to as "all members") which is finally formed on the second main surface of the peelable glass substrate, and is a part of all members (hereinafter referred to as "partial member" "). In the subsequent step, the peelable glass substrate to which the member is peeled off from the resin layer may be a peelable glass substrate (corresponding to an electronic device described below).

又,亦可組裝附全部構件之積層體,並於其後自附全部構件之積層體將附樹脂層之載體基板剝離而製造電子裝置。進而,亦可使用2片附全部構件之積層體組裝電子裝置,並於其後自附全部構件之積層體將2片附樹脂層之載體基板剝離而製造電子裝置。 Moreover, the laminated body with all the members may be assembled, and the carrier substrate with the resin layer may be peeled off from the laminated body of all the members thereafter to manufacture an electronic device. Further, the electronic device can be assembled by using two laminated bodies with all the members, and the carrier substrate of the two resin-attached layers can be peeled off from the laminated body of all the members thereafter to manufacture an electronic device.

例如,若取製造OLED之情形為例,則為了於切斷後積層體之剝離性玻璃基板之與樹脂層側相反之側之表面上(與剝離性玻璃基板之第2主表面相當)形成有機EL結構體,而進行形成透明電極,進而於形成有透明電極之面上蒸鍍電洞注入層、電洞輸送層、發光層、電子輸送層等,形成背面電極,使用密封板密封等各種層形成或處理。作為該種層形成或處理,具體而言,例如可列舉:成膜處理、蒸鍍處理、密封板之接著處理等。 For example, in the case of manufacturing an OLED, an organic EL is formed on the surface on the side opposite to the resin layer side of the peelable glass substrate of the laminated body (corresponding to the second main surface of the peelable glass substrate). In the structure, a transparent electrode is formed, and a hole injection layer, a hole transport layer, a light-emitting layer, an electron transport layer, and the like are deposited on the surface on which the transparent electrode is formed, and a back electrode is formed, and various layers such as a sealing plate are used for sealing. Or deal with. Specific examples of the formation or treatment of such a layer include a film formation treatment, a vapor deposition treatment, and a subsequent treatment of a sealing plate.

又,例如,TFT-LCD之製造方法具有如下等各步驟:TFT形成步驟,其係於切斷後積層體之剝離性玻璃基板之第2主表面上,使用抗蝕液圖案形成於藉由CVD(Chemical Vapor Deposition,化學氣相沈積)法及濺鍍法等通常之成膜法而形成之金屬膜及金屬氧化膜等而形成薄膜電晶體 (TFT);CF(Color Filter,彩色濾光片)形成步驟,其係於另一切斷後積層體之玻璃基板之第2主表面1上,將抗蝕液用於圖案形成而形成彩色濾光片(CF);以及貼合步驟,其係將TFT形成步驟中獲得之附TFT之積層體與CF形成步驟中獲得之附CF之積層體以TFT與CF相對向之方式介隔片材積層。 Further, for example, the TFT-LCD manufacturing method has the steps of forming a TFT on the second main surface of the peelable glass substrate after the cut laminated body, and forming the film by CVD (using CVD) Thin film transistor formed by metal film and metal oxide film formed by a usual film formation method such as Chemical Vapor Deposition, Chemical Vapor Deposition, and sputtering (TFT); CF (Color Filter) forming step of the second main surface 1 of the glass substrate of the laminated body after the cutting, and the resist liquid is used for pattern formation to form a color filter (CF); and a bonding step of interposing the laminated body of the TFT obtained in the TFT forming step and the laminated body of the CF obtained in the CF forming step so as to face the sheet by the TFT and the CF.

於TFT形成步驟或CF形成步驟中,使用眾所周知之光微影技術或蝕刻技術等於剝離性玻璃基板之第2主表面形成TFT或CF。此時,作為圖案形成用之塗佈液,使用抗蝕液。 In the TFT forming step or the CF forming step, TFT or CF is formed on the second main surface of the peelable glass substrate using a well-known photolithography technique or etching technique. At this time, a resist liquid was used as the coating liquid for pattern formation.

再者,於形成TFT或CF前,視需要亦可清洗剝離性玻璃基板之第2主表面。作為清洗方法,可使用眾所周知之乾式清洗或濕式清洗。 Further, the second main surface of the peelable glass substrate may be cleaned as needed before forming the TFT or CF. As the cleaning method, a well-known dry cleaning or wet cleaning can be used.

於貼合步驟中,例如於附TFT之積層體與附CF之積層體之間注入液晶材而積層。作為注入液晶材之方法,例如有減壓注入法、滴下注入法。 In the bonding step, for example, a liquid crystal material is injected between the laminated body with the TFT and the laminated body with the CF to laminate. As a method of injecting a liquid crystal material, for example, a pressure reduction injection method or a dropping injection method is available.

[分離步驟] [Separation step]

分離步驟S114係如下之步驟:自上述構件形成步驟S112中獲得之附電子裝置用構件之積層體,以剝離性玻璃基板與樹脂層之界面為剝離面去除具有樹脂層及載體基板之附樹脂層之載體基板,而獲得具有剝離性玻璃基板與電子裝置用構件之電子裝置。更具體而言,如圖2(G)所示,根據該步驟S114,自附電子裝置用構件之積層體26將附樹脂層之載體基板28分離、去除,而獲得包含剝離性玻璃基板10 與電子裝置用構件24之電子裝置30。 The separation step S114 is a step of forming a laminate of the member for an electronic device obtained in the step S112 from the member, and removing the resin layer having the resin layer and the carrier substrate with the peeling surface at the interface between the peelable glass substrate and the resin layer. The carrier substrate is used to obtain an electronic device having a peelable glass substrate and a member for an electronic device. More specifically, as shown in FIG. 2(G), the carrier substrate 28 with the resin layer is separated and removed by the laminated body 26 of the member for electronic device according to the step S114, and the peelable glass substrate 10 is obtained. The electronic device 30 is connected to the member 24 for electronic devices.

於剝離時之剝離性玻璃基板上之電子裝置用構件為所需之全部構成構件之形成之一部分之情形時,亦可於分離後於剝離性玻璃基板上形成剩餘之構成構件。 In the case where the member for an electronic device on the peelable glass substrate at the time of peeling is a part of all the constituent members required, the remaining constituent members may be formed on the peelable glass substrate after the separation.

將剝離性玻璃基板與樹脂層剝離之方法並無特別限定。具體而言,例如可於剝離性玻璃基板與樹脂層之界面插入銳利之刀具狀者而賦予剝離之起點,然後噴出水與壓縮空氣之混合流體等進行剝離。較佳為以附電子裝置用構件之積層體中之載體基板成為上側、電子裝置用構件成為下側之方式設置於壓盤上,將電子裝置用構件側真空吸附於壓盤上,於該狀態下首先使刀具進入至剝離性玻璃基板與樹脂層之界面。而且,於其後利用複數個真空吸附墊吸附載體基板側,自插入有刀具之部位附近依序使真空吸附墊上升。如此一來,於剝離性玻璃基板與樹脂層之界面形成空氣層,且該空氣層擴展於界面之整個面,而可容易將附樹脂層之載體基板剝離。 The method of peeling off the peelable glass substrate and the resin layer is not specifically limited. Specifically, for example, a sharp cutter can be inserted into the interface between the peelable glass substrate and the resin layer to provide a starting point for peeling, and then a mixed fluid of water and compressed air can be discharged and peeled off. Preferably, the carrier substrate in the laminate of the member for electronic device is placed on the upper side of the carrier, and the member for electronic device is placed on the pressure plate, and the member side of the electronic device is vacuum-applied to the pressure plate. Next, the cutter is first introduced into the interface between the peelable glass substrate and the resin layer. Then, the side of the carrier substrate was adsorbed by a plurality of vacuum suction pads, and the vacuum suction pad was sequentially raised from the vicinity of the portion where the cutter was inserted. As a result, an air layer is formed at the interface between the peelable glass substrate and the resin layer, and the air layer spreads over the entire surface of the interface, and the carrier substrate with the resin layer can be easily peeled off.

又,於自附電子裝置用構件之積層體去除附樹脂層之載體基板時,藉由控制電離器之噴出或濕度,而可抑制可能對電子裝置產生影響之靜電。或者,亦可於電子裝置組入消耗靜電之電路,或組入犧牲電路而自端子部至積層體外取得導通。 Further, when the carrier substrate with the resin layer is removed from the laminate of the member for electronic device, by controlling the discharge or humidity of the ionizer, it is possible to suppress static electricity which may affect the electronic device. Alternatively, the electronic device may be incorporated into a circuit that consumes static electricity, or a sacrificial circuit may be incorporated to obtain conduction from the terminal portion to the outside of the laminate.

藉由上述步驟而獲得之電子裝置較佳用於行動電話或PDA(Personal Digital Assistant,個人數位助理)之類之移動末端所使用之小型顯示裝置之製造。顯示裝置主要為 LCD或OLED,作為LCD,包含TN(Twisted Nematic,扭轉向列)型、STN(Super Twisted Nematic,超扭轉向列)型、FE(Field Effect,場效應)型、TFT型、MIM(Metal Insulator Metal,金屬-絕緣體-金屬)型、IPS(In-Plane Switching,橫向電場驅動)型、VA(Vertical Alignment,垂直配向)型等。基本上於被動驅動型、主動驅動型中之任一型顯示裝置之情形時均可應用。 The electronic device obtained by the above steps is preferably used for the manufacture of a small display device used in a mobile terminal such as a mobile phone or a PDA (Personal Digital Assistant). Display device is mainly LCD or OLED, as LCD, including TN (Twisted Nematic), STN (Super Twisted Nematic), FE (Field Effect), TFT, MIM (Metal Insulator Metal) , metal-insulator-metal type, IPS (In-Plane Switching) type, VA (Vertical Alignment) type, etc. It can be applied basically in the case of any of the passive driving type and the active driving type.

[第2實施態樣] [Second embodiment]

圖7係表示本發明之電子裝置之製造方法之另一實施形態中之製造步驟的流程圖。如圖7所示,電子裝置之製造方法包括:表面處理步驟S102、硬化性樹脂組成物層形成步驟S104、積層步驟S106、消泡步驟S116、硬化步驟S108、切斷步驟S110、構件形成步驟S112、及分離步驟S114。 Fig. 7 is a flow chart showing the manufacturing steps in another embodiment of the method of manufacturing the electronic device of the present invention. As shown in FIG. 7, the manufacturing method of the electronic device includes a surface treatment step S102, a curable resin composition layer forming step S104, a lamination step S106, a defoaming step S116, a hardening step S108, a cutting step S110, and a member forming step S112. And separating step S114.

圖7所示之各步驟除包括消泡步驟S116之該點外,為與圖1所示之步驟相同之次序,於相同之步驟中標附相同之參照符號,並省略其說明,以下主要對消泡步驟S116進行說明。 The steps shown in FIG. 7 are the same as the steps shown in FIG. 1 except for the point of the defoaming step S116, and the same reference numerals are attached to the same steps, and the description thereof is omitted, and the following main cancellations are omitted. The bubble step S116 will be described.

[消泡步驟] [Defoaming step]

消泡步驟S116係於上述積層步驟S106後且硬化步驟S108前進行未硬化之硬化性樹脂組成物層之消泡處理之步驟。藉由設置該步驟S116,而自未硬化之硬化性樹脂組成物層去除氣泡或易揮發成分,而使所獲得之樹脂層與載體基板之密接性進一步強化。 The defoaming step S116 is a step of performing a defoaming treatment of the uncured curable resin composition layer after the laminating step S106 and before the curing step S108. By providing this step S116, bubbles or volatile components are removed from the uncured curable resin composition layer, and the adhesion between the obtained resin layer and the carrier substrate is further enhanced.

消泡步驟之處理方法根據所使用之未硬化之硬化性樹脂組成物層之材料而適當選擇最佳方法,例如可列舉:使用真空泵之減壓消泡、或使用離心力之離心分離消泡、使用超音波消泡裝置之超音波消泡等。就生產性等方面而言,較佳為於減壓下進行消泡處理之減壓消泡,作為其條件,較佳為於1000 Pa以下(較佳為100 Pa以下)實施消泡處理1~30分鐘左右。 The treatment method of the defoaming step is appropriately selected depending on the material of the uncured curable resin composition layer to be used, and examples thereof include vacuum defoaming using a vacuum pump or centrifugal defoaming using centrifugal force. Ultrasonic defoaming of the ultrasonic defoaming device. In terms of productivity, etc., it is preferred to carry out defoaming and defoaming under decompression under reduced pressure, and as a condition, it is preferable to carry out defoaming treatment at 1000 Pa or less (preferably 100 Pa or less). 30 minutes or so.

[實施例] [Examples]

以下,藉由實施例等對本發明進行具體說明,但本發明並不由該等例限定。 Hereinafter, the invention will be specifically described by way of examples, but the invention is not limited by the examples.

於以下之實施例1及4~6、比較例1~2中,作為剝離性玻璃基板用之玻璃基板,使用包含無鹼硼矽酸玻璃之玻璃板(縱760 mm,橫640 mm,板厚0.3 mm,線膨脹係數38×10-7/℃,旭硝子公司製造,商品名「AN100」)。又,作為載體基板,相同地使用包含無鹼硼矽酸玻璃之玻璃板(縱720 mm,橫600 mm,板厚0.7 mm,線膨脹係數38×10-7/℃,旭硝子公司製造,商品名「AN100」)。 In the following Examples 1 and 4 to 6 and Comparative Examples 1 and 2, a glass plate containing an alkali-free borosilicate glass (length 760 mm, width 640 mm, thickness) was used as the glass substrate for the peelable glass substrate. 0.3 mm, linear expansion coefficient 38 × 10 -7 / ° C, manufactured by Asahi Glass Co., Ltd., trade name "AN100"). Further, as the carrier substrate, a glass plate containing an alkali-free borosilicate glass (720 mm in length, 600 mm in width, 0.7 mm in plate thickness, and a coefficient of linear expansion of 38 × 10 -7 /° C., manufactured by Asahi Glass Co., Ltd., trade name) was used in the same manner. "AN100").

(實施例1) (Example 1)

對用作剝離性玻璃基板之玻璃基板進行純水清洗、UV(Ultraviolet,紫外線)清洗,而使表面潔淨化。其後,於玻璃基板之單面即第2主表面實施遮罩,然後於相反側之第1主表面噴塗矽氧油含量為1質量%之庚烷溶液並進行乾燥。矽氧油係使用二甲基聚矽氧烷(Dow Corning Toray公司製造,SH200,動黏度190~210 mm2/s)。繼而,為了 實現矽氧油之低分子化,進行350℃下之加熱處理5分鐘,而獲得剝離性玻璃基板。 The glass substrate used as the peelable glass substrate is subjected to pure water washing and UV (ultraviolet) cleaning to clean the surface. Thereafter, a mask was applied to the second main surface of one side of the glass substrate, and then a heptane solution having a parafoaming oil content of 1% by mass was sprayed on the first main surface on the opposite side and dried. The oxime oil was dimethylpolysiloxane (manufactured by Dow Corning Toray, SH200, dynamic viscosity: 190 to 210 mm 2 /s). Then, in order to achieve low molecular weight of the oxime oil, heat treatment at 350 ° C was performed for 5 minutes to obtain a peelable glass substrate.

其後,使用接觸角計(kurusu公司製造,DROP SHAPE ANALYSIS SYSTEM DSA 10Mk2)測定剝離性玻璃基板之第1主表面之水接觸角,結果為100°。 Then, the water contact angle of the first main surface of the peelable glass substrate was measured using a contact angle meter (DROP SHAPE ANALYSIS SYSTEM DSA 10Mk2, manufactured by Kurusu Co., Ltd.), and it was 100°.

又,使用原子力顯微鏡(Pacific Nanotechnology公司製造,Nano Scope IIIa;Scan Rate 1.0 Hz,Sample Lines256,Off-line Modify Flatten order-2,Planefit order-2)測定剝離性玻璃基板之第1主表面之平均表面粗糙度Ra,結果為0.5 nm。平均表面粗糙度Ra係根據測定範圍10 μm見方之測定值而算出。 Further, the average surface of the first main surface of the peelable glass substrate was measured using an atomic force microscope (manufactured by Pacific Nanotechnology, Nano Scope IIIa; Scan Rate 1.0 Hz, Sample Lines 256, Off-line Modify Flatten order-2, Planefit order-2). Roughness Ra, the result is 0.5 nm. The average surface roughness Ra is calculated based on the measurement value of the measurement range of 10 μm square.

其次,於剝離性玻璃基板之第1主表面上,將於兩末端具有乙烯基之直鏈狀有機烯基聚矽氧烷(乙烯基矽氧,荒川化學工業公司製造,8500)、於分子內具有氫矽烷基之甲基氫矽氧烷(荒川化學工業公司製造,12031)、及鉑系觸媒(荒川化學工業公司製造,CAT12070)之混合液利用絲網印刷機塗敷成縱750 mm、橫630 mm之大小且長方形,將含有未硬化之硬化性矽氧之層設置於剝離性玻璃基板上(塗敷量35 g/m2)。此處,直鏈狀有機烯基聚矽氧烷、與甲基氫聚矽氧烷之混合比係以乙烯基與氫矽烷基之莫耳比成為1:1之方式調節。又,鉑系觸媒相對於直鏈狀有機烯基聚矽氧烷與甲基氫聚矽氧烷之合計100質量份設為5質量份。 Next, on the first main surface of the peelable glass substrate, a linear organic alkenyl polyoxyalkylene (vinyl anthracene, manufactured by Arakawa Chemical Industries, Ltd., 8500) having a vinyl group at both ends is used in the molecule. A mixture of methylhydroquinone (hydrocarbon alkyl) (available from Arakawa Chemical Industries, Inc., 12031) and a platinum-based catalyst (manufactured by Arakawa Chemical Industries, Inc., CAT12070) was applied by a screen printer to a length of 750 mm. A rectangular shape having a size of 630 mm and a layer containing uncured hardenable oxygen was placed on the peelable glass substrate (coating amount: 35 g/m 2 ). Here, the mixing ratio of the linear organic alkenyl polyoxyalkylene to the methylhydrogenpolysiloxane is adjusted so that the molar ratio of the vinyl group to the hydrofluorenyl group is 1:1. In addition, the platinum-based catalyst is used in an amount of 5 parts by mass based on 100 parts by mass of the total of the linear organoalkenyl polysiloxane and the methylhydrogenpolyoxyalkylene.

其次,對板厚0.4 mm之載體基板之與矽氧樹脂接觸之側 之面(第1主表面)進行純水清洗,其後進行UV清洗而使其潔淨化。其後,將載體基板之第1主表面、與含有未硬化之硬化性矽氧之層於室溫下利用真空壓機貼合,並於30 Pa下靜置5分鐘,進行含有未硬化之硬化性矽氧之層之消泡處理,而獲得硬化前積層體A0。此時,以於含有未硬化之硬化性矽氧之層中殘留未與載體基板接觸之周緣區域之方式,將載體基板積層於含有未硬化之硬化性矽氧之層上。再者,自載體基板之外周緣至未硬化之硬化性樹脂組成物層之外周緣之長度為約15 mm以上。又,未硬化之硬化性樹脂組成物層之與載體基板接觸之區域之面積A與未硬化之硬化性樹脂組成物層之總面積B之比(面積A/總面積B)為0.91。 Secondly, the side of the carrier substrate with a thickness of 0.4 mm in contact with the epoxy resin The surface (the first main surface) was cleaned with pure water, and then cleaned by UV cleaning. Thereafter, the first main surface of the carrier substrate and the layer containing the uncured curable cerium oxide were bonded together at room temperature by a vacuum press, and allowed to stand at 30 Pa for 5 minutes to carry out uncured hardening. The defoaming treatment of the layer of the bismuth oxygen is carried out to obtain the layered body A0 before hardening. At this time, the carrier substrate is laminated on the layer containing the uncured curable cerium oxide so that the peripheral region which is not in contact with the carrier substrate remains in the layer containing the uncured curable cerium oxide. Further, the length from the outer periphery of the carrier substrate to the outer periphery of the uncured curable resin composition layer is about 15 mm or more. Moreover, the ratio (area A / total area B) of the area A of the region of the uncured curable resin composition layer in contact with the carrier substrate and the total area B of the uncured curable resin composition layer (area A / total area B) was 0.91.

其次,將其於250℃下於大氣中加熱硬化30分鐘,而獲得含有厚度10 μm之硬化之矽氧樹脂層之硬化後積層體A1。 Next, this was heat-hardened in the atmosphere at 250 ° C for 30 minutes to obtain a post-hardened layered product A1 containing a hardened epoxy resin layer having a thickness of 10 μm.

繼而,於安裝有定位夾具之壓盤上固定硬化後積層體A1之載體基板,自壓盤之上表面以與載體基板之外周緣中之一邊重疊之方式,於剝離性玻璃基板之第2主表面上利用金剛石輪切割器刻劃切割線後,利用夾持夾具將剝離性玻璃基板之切割線之外側夾入並割斷。同樣地,亦將與載體基板之外周緣之剩餘之3邊重疊之剝離性玻璃之外側割斷,之後利用具有曲面之磨石對剝離性玻璃基板之割斷面進行研磨並實施倒角,而獲得切斷後積層體A2。 Then, the carrier substrate of the laminated body A1 is fixed to the platen on which the positioning jig is attached, and the upper surface of the platen is overlapped with one of the outer edges of the carrier substrate to form the second main body of the peelable glass substrate. After the cutting line was scored on the surface by a diamond wheel cutter, the outer side of the cutting line of the peelable glass substrate was sandwiched and cut by a clamp jig. Similarly, the outer side of the peeling glass which overlaps with the remaining three sides of the outer periphery of the carrier substrate is also cut, and then the cut surface of the peelable glass substrate is ground and chamfered by a grindstone having a curved surface to obtain a cut. After the break, the layered body A2.

繼而,將切斷後積層體A2之剝離性玻璃基板之與矽氧樹 脂之接觸面相反之面(第2主表面)真空吸附於壓盤後,於剝離性玻璃基板之4個部位之角部中之1個部位之角部的剝離性玻璃基板與矽氧樹脂層之界面插入厚度0.1 mm之不鏽鋼製刀具,對剝離性玻璃基板與矽氧樹脂層之界面賦予剝離之起點。而且,於利用24個真空吸附墊吸附載體基板表面後,自靠近插入刀具之角部之吸附墊依序使其上升。此處,刀具之插入係一面自電離器(KEYENCE公司製造)將除電性流體噴出至該界面一面進行。其次,一面自電離器繼續向形成之空隙噴出除電性流體一面提拉真空吸附墊。其結果為,可於壓盤上將於第1主表面形成有矽氧樹脂層之載體基板(附樹脂層之載體基板)剝離。此時,於剝離性玻璃基板之與矽氧樹脂層密接之面(第1主表面)上未目視觀察到矽氧樹脂之附著。再者,根據該結果確認,樹脂層與載體基板之層之界面之剝離強度較剝離性玻璃基板之層與樹脂層之界面之剝離強度大。 Then, the peeling glass substrate of the laminated body A2 is cut off and the oxygen tree is After the surface of the opposite side of the contact surface of the grease (the second main surface) is vacuum-adsorbed to the platen, the peelable glass substrate and the epoxy resin layer are formed at the corners of one of the corner portions of the four portions of the peelable glass substrate. A stainless steel cutter having a thickness of 0.1 mm was inserted into the interface to provide a starting point for peeling off the interface between the peelable glass substrate and the silicone resin layer. Further, after the surface of the carrier substrate was adsorbed by the 24 vacuum adsorption pads, the adsorption pads from the corners of the insertion tool were sequentially raised. Here, the inserting of the cutter is performed while ejecting the static eliminating fluid to the interface from the ionizer (manufactured by KEYENCE Corporation). Next, the vacuum adsorption pad is pulled while the ionizer continues to eject the neutralizing fluid into the formed void. As a result, the carrier substrate (the carrier substrate with the resin layer) on which the epoxy resin layer is formed on the first main surface can be peeled off from the platen. At this time, adhesion of the epoxy resin was not visually observed on the surface (first main surface) of the peelable glass substrate which was in contact with the silicone resin layer. Further, from the results, it was confirmed that the peel strength at the interface between the resin layer and the layer of the carrier substrate was larger than the peel strength at the interface between the layer of the peelable glass substrate and the resin layer.

(實施例2) (Example 2)

作為載體基板及玻璃基板,使用包含鈉鈣玻璃之玻璃板,除此以外藉由與實施例1相同之方法獲得切斷後積層體B2。再者,使用之載體基板與玻璃基板之大小、與實施例1中使用之載體基板與玻璃基板之大小相同。 The cut laminated body B2 was obtained in the same manner as in Example 1 except that a glass plate containing soda lime glass was used as the carrier substrate and the glass substrate. Further, the size of the carrier substrate and the glass substrate used was the same as that of the carrier substrate and the glass substrate used in Example 1.

其次,藉由與實施例1相同之方法,自切斷後積層體B2將附樹脂層之載體基板剝離,而獲得鈉鈣玻璃基板B3(剝離性玻璃基板)。此時,於鈉鈣玻璃基板B3之與矽氧樹脂層密接之面(第1主表面)上未目視觀察到矽氧樹脂之附著。 Then, the carrier substrate with the resin layer was peeled off from the laminated body B2 after the cutting in the same manner as in Example 1 to obtain a soda lime glass substrate B3 (peelable glass substrate). At this time, adhesion of the epoxy resin was not visually observed on the surface (first main surface) of the soda lime glass substrate B3 which was in contact with the silicone resin layer.

(實施例3) (Example 3)

作為載體基板及玻璃基板,使用包含經化學強化之玻璃板之玻璃板,除此以外藉由與實施例1相同之方法獲得切斷後積層體C2。再者,使用之載體基板與玻璃基板之大小、與實施例1中使用之載體基板與玻璃基板之大小相同。 The cut laminated body C2 was obtained in the same manner as in Example 1 except that a glass plate including a chemically strengthened glass plate was used as the carrier substrate and the glass substrate. Further, the size of the carrier substrate and the glass substrate used was the same as that of the carrier substrate and the glass substrate used in Example 1.

其次,藉由與實施例1相同之方法,自切斷後積層體C2將附樹脂層之載體基板剝離,而獲得經化學強化之玻璃基板C3(剝離性玻璃基板)。此時,於玻璃基板C3之與矽氧樹脂層密接之面(第1主表面)上未目視觀察到矽氧樹脂之附著。 Then, the carrier substrate with the resin layer was peeled off from the laminated body C2 after the cutting in the same manner as in Example 1 to obtain a chemically strengthened glass substrate C3 (peelable glass substrate). At this time, adhesion of the epoxy resin was not visually observed on the surface (first main surface) of the glass substrate C3 which was in close contact with the epoxy resin layer.

(實施例4) (Example 4)

對玻璃基板之第1主表面上即與矽氧樹脂接觸之側之面進行純水清洗,其後進行UV清洗而使其潔淨化,進而於潔淨化之面藉由磁控濺鍍法(加熱溫度300℃,成膜壓力5 mTorr,功率密度0.5 W/cm2)形成厚度10 nm之氧化銦錫之薄膜(片材電阻300 Ω/□),其後於氧化銦錫之薄膜上噴塗矽氧油含量為1質量%之庚烷溶液並進行乾燥,除此以外藉由與實施例1相同之方法獲得切斷後積層體D2。 The surface of the first main surface of the glass substrate, that is, the side in contact with the epoxy resin, is cleaned with pure water, then cleaned by UV cleaning, and further cleaned by magnetron sputtering (heating) Temperature 300 ° C, film formation pressure 5 mTorr, power density 0.5 W / cm 2 ) film of indium tin oxide having a thickness of 10 nm (sheet resistance 300 Ω / □), and then sprayed on the film of indium tin oxide The cut laminated body D2 was obtained by the same method as in Example 1 except that the oil content was 1% by mass of heptane solution and dried.

其次,藉由與實施例1相同之方法,自切斷後積層體D2將附樹脂層之載體基板剝離,而獲得於第1主表面形成有氧化銦錫之薄膜層之玻璃基板D3(剝離性玻璃基板)。此時,於玻璃基板D3之與矽氧樹脂層密接之面(第1主表面)上未目視觀察到矽氧樹脂之附著。 Then, in the same manner as in the first embodiment, the carrier substrate with the resin layer is peeled off from the laminated body D2 after the cutting, and the glass substrate D3 in which the thin film layer of indium tin oxide is formed on the first main surface is obtained (peelable glass) Substrate). At this time, adhesion of the epoxy resin was not visually observed on the surface (first main surface) of the glass substrate D3 which was in close contact with the epoxy resin layer.

(實施例5) (Example 5)

於本例中,使用實施例1中獲得切斷後積層體A2製作OLED。 In this example, an OLED was produced using the cut-back laminated body A2 obtained in Example 1.

更具體而言,於切斷後積層體A2之剝離性玻璃基板之第2主表面上,藉由濺鍍法使鉬成膜,且藉由使用光微影法之蝕刻形成閘極電極。其次,藉由電漿CVD法於設置有閘極電極之剝離性玻璃基板之第2主表面側進而使氮化矽、本徵非晶矽、n型非晶矽依序成膜,繼而藉由濺鍍法使鉬成膜,且藉由使用光微影法之蝕刻形成閘極絕緣膜、半導體元件部及源極/汲極電極。其次,藉由電漿CVD法於剝離性玻璃基板之第2主表面側進而使氮化矽成膜而形成鈍化層後,藉由濺鍍法使氧化銦錫成膜,且藉由使用光微影法之蝕刻形成像素電極。 More specifically, on the second main surface of the peelable glass substrate of the laminated body A2 after the cutting, molybdenum is formed by sputtering, and the gate electrode is formed by etching using photolithography. Next, by the plasma CVD method, the tantalum nitride, the intrinsic amorphous germanium, and the n-type amorphous germanium are sequentially formed on the second main surface side of the peelable glass substrate provided with the gate electrode, and then by the plasma CVD method. The sputtering method forms a film of molybdenum, and forms a gate insulating film, a semiconductor element portion, and a source/drain electrode by etching using photolithography. Next, a passivation layer is formed by forming a passivation layer on the second main surface side of the peelable glass substrate by a plasma CVD method, and then indium tin oxide is formed by sputtering, and light micron is used. The etching of the shadow method forms a pixel electrode.

繼而,於剝離性玻璃基板之第2主表面側,進而藉由蒸鍍法使作為正孔注入層之4,4',4"-三(3-甲基苯基苯基胺基)三苯基胺、作為正孔輸送層之雙[(N-萘基)-N-苯基]聯苯胺、於作為發光層之8-羥基喹啉鋁錯合物(Alq3)中混合有40體積%之2,6-雙[4-[N-(4-甲氧基苯基)-N-苯基]胺基苯乙烯基]萘-1,5-二甲腈(BSN-BCN)者、及作為電子輸送層之Alq3依序成膜。其次,於剝離性玻璃基板之第2主表面側藉由濺鍍法使鋁成膜,且藉由使用光微影法之蝕刻形成對向電極。其次,於形成有對向電極之剝離性玻璃基板之第2主表面上,介隔紫外線硬化型之接著層貼合另一片玻璃基板並進行密封。藉由上述次序而獲得之於剝離性玻璃基 板上具有有機EL結構體之切斷後積層體A2與附載體基板之顯示裝置用面板(面板A2)(附電子裝置用構件之積層體)相當。 Then, on the second main surface side of the peelable glass substrate, 4,4',4"-tris(3-methylphenylphenylamino)triphenyl which is a positive hole injection layer is further deposited by a vapor deposition method. The base amine, bis[(N-naphthyl)-N-phenyl]benzidine as a positive hole transport layer, and 40% by volume mixed in the 8-hydroxyquinoline aluminum complex (Alq 3 ) as a light-emitting layer 2,6-bis[4-[N-(4-methoxyphenyl)-N-phenyl]aminostyryl]naphthalene-1,5-dicarbonitrile (BSN-BCN), and The Alq 3 as the electron transport layer was sequentially formed into a film. Next, aluminum was formed on the second main surface side of the peelable glass substrate by sputtering, and the counter electrode was formed by etching using photolithography. Next, on the second main surface of the peelable glass substrate on which the counter electrode is formed, another glass substrate is bonded and sealed by an ultraviolet curing type adhesive layer. The peeling glass substrate obtained by the above procedure is obtained. The post-cut laminated body A2 having the organic EL structure is equivalent to the display device panel (panel A2) (the laminated body of the member for electronic devices) having the carrier substrate.

繼而,將面板A2之密封體側真空吸附於壓盤,於面板A2之角部之剝離性玻璃基板與矽氧樹脂層之界面插入厚度0.1 mm之不鏽鋼製刀具,自面板A2將附樹脂層之載體基板分離,而獲得OLED面板(與電子裝置相當,以下稱為面板A)。 Then, the sealing body side of the panel A2 is vacuum-adsorbed to the pressure plate, and a stainless steel cutter having a thickness of 0.1 mm is inserted into the interface between the peelable glass substrate and the silicone resin layer at the corner of the panel A2, and the resin layer is attached from the panel A2. The carrier substrate is separated to obtain an OLED panel (corresponding to an electronic device, hereinafter referred to as panel A).

於製作之面板A連接IC(Integrated Circuit,積體電路)驅動器並使其驅動,結果於驅動區域內未確認到顯示不均。 When an IC (Integrated Circuit) driver was connected to the panel A to be fabricated and driven, no display unevenness was confirmed in the drive region.

(實施例6) (Example 6)

於本例中,使用實施例1中獲得之切斷後積層體A2製作LCD。 In this example, an LCD was produced using the cut laminated body A2 obtained in Example 1.

準備2片切斷後積層體A2,首先,於一片切斷後積層體A2之剝離性玻璃基板之第2主表面上,藉由濺鍍法使鉬成膜,且藉由使用光微影法之蝕刻形成閘極電極。其次,藉由電漿CVD法於設置有閘極電極之剝離性玻璃基板之第2主表面側進而使氮化矽、本徵非晶矽、n型非晶矽依序成膜,繼而藉由濺鍍法使鉬成膜,且藉由使用光微影法之蝕刻形成閘極絕緣膜、半導體元件部及源極/汲極電極。其次,藉由電漿CVD法於剝離性玻璃基板之第2主表面側進而使氮化矽成膜而形成鈍化層後,藉由濺鍍法使氧化銦錫成膜,且藉由使用光微影法之蝕刻形成像素電極。其次,於形成有像素電極之剝離性玻璃基板之第2主表面上,藉 由輥塗法塗佈聚醯亞胺樹脂液,藉由熱硬化而形成配向層,且進行摩擦。將所獲得之切斷後積層體A2稱為切斷後積層體A2-1。 Two sheets of the laminated body A2 after cutting are prepared. First, on the second main surface of the peelable glass substrate of the laminated body A2 after the cutting, the molybdenum is formed by sputtering, and etching by photolithography is performed. A gate electrode is formed. Next, by the plasma CVD method, the tantalum nitride, the intrinsic amorphous germanium, and the n-type amorphous germanium are sequentially formed on the second main surface side of the peelable glass substrate provided with the gate electrode, and then by the plasma CVD method. The sputtering method forms a film of molybdenum, and forms a gate insulating film, a semiconductor element portion, and a source/drain electrode by etching using photolithography. Next, a passivation layer is formed by forming a passivation layer on the second main surface side of the peelable glass substrate by a plasma CVD method, and then indium tin oxide is formed by sputtering, and light micron is used. The etching of the shadow method forms a pixel electrode. Next, on the second main surface of the peelable glass substrate on which the pixel electrode is formed, The polyimine resin liquid is applied by a roll coating method to form an alignment layer by heat hardening, and rubbing is performed. The obtained laminated body A2 after cutting is referred to as a cut laminated body A2-1.

其次,於另一片切斷後積層體A2之剝離性玻璃基板之第2主表面上,藉由濺鍍法使鉻成膜,且藉由使用光微影法之蝕刻形成遮光層。其次,於設置有遮光層之剝離性玻璃基板之第2主表面側進而藉由擠壓式塗佈法塗佈彩色光阻,藉由光微影法及熱硬化形成彩色濾光片層。其次,於剝離性玻璃基板之第2主表面側進而藉由濺鍍法使氧化銦錫成膜,形成對向電極。其次,於設置有對向電極之剝離性玻璃基板之第2主表面上,藉由擠壓式塗佈法塗佈紫外線硬化樹脂液,藉由光微影法及熱硬化形成柱狀間隔件。其次,於形成有柱狀間隔件之剝離性玻璃基板之第2主表面上,藉由輥塗法塗佈聚醯亞胺樹脂液,藉由熱硬化而形成配向層,且進行摩擦。其次,於剝離性玻璃基板之第2主表面側,藉由分配法將片材用樹脂液描畫成框狀,於框內藉由分配法滴下液晶後,使用上述切斷後積層體A2-1將2片切斷後積層體A2之剝離性玻璃基板之第2主表面側彼此貼合,藉由紫外線硬化及熱硬化而獲得具有LCD面板之積層體。將此處之具有LCD面板之積層體於以下稱為附面板之積層體B2。 Next, on the second main surface of the peelable glass substrate of the laminated body A2 after another cut, chromium is formed by sputtering, and a light shielding layer is formed by etching using photolithography. Next, a color filter is applied by a die coating method on the second main surface side of the peelable glass substrate provided with the light shielding layer, and a color filter layer is formed by photolithography and thermal curing. Next, on the second main surface side of the peelable glass substrate, indium tin oxide was further formed into a film by sputtering to form a counter electrode. Next, on the second main surface of the peelable glass substrate provided with the counter electrode, the ultraviolet curable resin liquid was applied by a squeeze coating method, and a columnar spacer was formed by photolithography and thermal hardening. Next, on the second main surface of the peelable glass substrate on which the columnar spacers are formed, the polyimide film solution is applied by a roll coating method to form an alignment layer by thermal curing, and rubbing is performed. Next, on the second main surface side of the peelable glass substrate, the resin liquid for sheet is drawn into a frame shape by a dispensing method, and the liquid crystal is dropped by a dispensing method in the frame, and then the laminated body A2-1 after the cutting is used. The second main surface sides of the peelable glass substrate of the laminated body A2 after the two cuts are bonded to each other, and a laminate having an LCD panel is obtained by ultraviolet curing and thermal curing. Here, the laminated body having the LCD panel is hereinafter referred to as a laminated body B2.

其次,與實施例1同樣地,自附面板之積層體B2將兩面之附樹脂層之載體基板剝離,而獲得包含形成有TFT陣列之玻璃基板及形成有彩色濾光片之玻璃基板之LCD面板 B(與電子裝置相當)。 Then, in the same manner as in the first embodiment, the laminated body B2 of the self-attached panel peels off the carrier substrate with the resin layers on both sides, thereby obtaining an LCD panel including the glass substrate on which the TFT array is formed and the glass substrate on which the color filter is formed. B (comparable to electronic devices).

於製作之LCD面板B連接IC驅動器並使其驅動,結果於驅動區域內未確認到顯示不均。 When the IC panel of the manufactured LCD panel B was connected and driven, the display unevenness was not confirmed in the drive area.

(比較例1) (Comparative Example 1)

與實施例1同樣地,對載體基板之第1主表面進行純水清洗、UV清洗,而使其潔淨化。 In the same manner as in Example 1, the first main surface of the carrier substrate was subjected to pure water washing and UV cleaning to be cleaned.

其次,將實施例1中之於末端具有乙烯基之直鏈狀有機烯基聚矽氧烷、於分子內具有氫矽烷基之甲基氫聚矽氧烷、及鉑系觸媒之混合液99.5質量份與矽氧油(Dow Corning Toray公司製造,SH200)0.5質量份之混合物藉由絲網印刷而塗佈於載體基板之第1主表面上。其次,將其於250℃下於大氣中加熱硬化30分鐘,而形成厚度10 μm之硬化之矽氧樹脂層。 Next, a mixture of a linear organoalkenyl polyoxyalkylene having a vinyl group at the terminal, a methylhydrogenpolysiloxane having a hydrofluorenyl group in the molecule, and a platinum-based catalyst in Example 1 was used. A mixture of 0.5 parts by mass of a part by mass and a buffer of a fluorinated oil (manufactured by Dow Corning Toray Co., Ltd., SH200) was applied to the first main surface of the carrier substrate by screen printing. Next, it was heat-hardened in the atmosphere at 250 ° C for 30 minutes to form a hardened epoxy resin layer having a thickness of 10 μm.

繼而,對玻璃基板之第1主表面進行純水清洗、UV清洗而使其潔淨化後,於室溫下藉由真空壓機使其與形成於載體基板之第1主表面上之矽氧樹脂層密接,而獲得積層體P1。 Then, the first main surface of the glass substrate is subjected to pure water washing, UV cleaning, and cleaned, and then subjected to a vacuum press at room temperature to form a silicone resin formed on the first main surface of the carrier substrate. The layers are closely bonded to obtain a layered body P1.

而且,於積層體P1之玻璃基板上,藉由與實施例5相同之次序製作OLED後將附樹脂層之載體基板剝離,而獲得OLED面板(以下稱為面板P)。 Further, on the glass substrate of the laminate P1, an OLED was produced in the same manner as in Example 5, and then the carrier substrate with the resin layer was peeled off to obtain an OLED panel (hereinafter referred to as a panel P).

於製作之面板P連接IC驅動器並使其驅動,結果於驅動區域內確認到顯示不均,不良部存在於與積層體P1之端部附近相當之部分。 When the IC driver is connected to the panel P to be produced and driven, unevenness of display is confirmed in the driving region, and the defective portion exists in a portion corresponding to the vicinity of the end portion of the laminated body P1.

(比較例2) (Comparative Example 2)

以與比較例1相同之方法獲得2片積層體P1。 Two laminated bodies P1 were obtained in the same manner as in Comparative Example 1.

其次,依據與實施例6相同之次序,使用2片積層體P1獲得具有LCD面板之積層體。進而,自所獲得之積層體將兩面之附樹脂層之載體基板剝離,而獲得LCD面板(以下稱為面板Q)。 Next, in the same order as in the embodiment 6, a laminate having an LCD panel was obtained using two laminated bodies P1. Further, the obtained laminated body was peeled off from the carrier substrate with the resin layers on both sides to obtain an LCD panel (hereinafter referred to as panel Q).

於製作之面板Q連接IC驅動器並使其驅動,結果於驅動區域內確認到顯示不均,不良部存在於與積層體P1之端部附近相當之部分。 When the panel driver Q is connected to the IC driver and driven, the display unevenness is confirmed in the driving region, and the defective portion exists in a portion corresponding to the vicinity of the end portion of the laminated body P1.

如上述實施例5及6所示,根據本發明之電子裝置之製造方法,可良率良好地製造性能優異之電子裝置。 As shown in the above-described fifth and sixth embodiments, according to the method of manufacturing an electronic device of the present invention, an electronic device having excellent performance can be manufactured with good yield.

另一方面,於專利文獻1中記載之先前之方法中,如上述比較例1及2所示,有引起所獲得之電子裝置之性能降低之情形。於比較例1及2中,於電子裝置之端部(周緣部)附近觀察到顯示不均。認為其係如上所述般因藉由硬化處理而獲得之樹脂層(尤其是樹脂層之外周緣附近)存在厚度不均,而於玻璃基板與樹脂層之間產生空隙,異物進入至該空隙中而產生電子裝置之性能降低。 On the other hand, in the prior method described in Patent Document 1, as shown in the above Comparative Examples 1 and 2, there is a case where the performance of the obtained electronic device is lowered. In Comparative Examples 1 and 2, display unevenness was observed in the vicinity of the end portion (peripheral portion) of the electronic device. It is considered that the resin layer obtained by the hardening treatment (especially in the vicinity of the periphery of the resin layer) has thickness unevenness as described above, and a void is generated between the glass substrate and the resin layer, and foreign matter enters the void. The performance of the resulting electronic device is reduced.

本申請案係基於2011年10月12日提出申請之日本專利申請案2011-225239者,其內容作為參照而併入本文。 The present application is based on Japanese Patent Application No. 2011-225239, filed on Jan.

10‧‧‧剝離性玻璃基板 10‧‧‧Release glass substrate

12‧‧‧未硬化之硬化性樹脂組成物層 12‧‧‧Unhardened curable resin composition layer

14‧‧‧載體基板 14‧‧‧ Carrier substrate

16‧‧‧硬化前積層體 16‧‧‧Pre-hardening laminate

18‧‧‧樹脂層 18‧‧‧ resin layer

20‧‧‧硬化後積層體 20‧‧‧ hardened laminated body

22‧‧‧切斷後積層體 22‧‧‧After cutting the laminated body

24‧‧‧電子裝置用構件 24‧‧‧Members for electronic devices

26‧‧‧附電子裝置用構件之積層體 26‧‧‧Laminated body of components for electronic devices

28‧‧‧附樹脂層之載體基板 28‧‧‧ Carrier substrate with resin layer

30‧‧‧電子裝置 30‧‧‧Electronic devices

32‧‧‧空隙 32‧‧‧ gap

50‧‧‧載物台 50‧‧‧stage

51~53‧‧‧定位塊 51~53‧‧‧ positioning block

54‧‧‧移動塊 54‧‧‧moving block

55‧‧‧移動塊 55‧‧‧moving block

60‧‧‧加工頭 60‧‧‧Processing head

62‧‧‧切割器 62‧‧‧Cut cutter

64‧‧‧固持器 64‧‧‧Retainer

66‧‧‧切割線 66‧‧‧ cutting line

68‧‧‧裂痕 68‧‧‧ crack

70‧‧‧載物台 70‧‧‧stage

72‧‧‧夾持夾具 72‧‧‧Clamping fixture

80‧‧‧凸部 80‧‧‧ convex

82‧‧‧玻璃基板 82‧‧‧ glass substrate

84‧‧‧空隙 84‧‧‧ gap

圖1係表示本發明之電子裝置之製造方法之一實施形態之製造步驟的流程圖。 BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a flow chart showing the manufacturing steps of an embodiment of a method of manufacturing an electronic device according to the present invention.

圖2(A)~2(G)係按照步驟順序表示本發明之電子裝置之製造方法之一實施形態之模式性剖面圖。 2(A) to 2(G) are schematic cross-sectional views showing an embodiment of a method of manufacturing an electronic device according to the present invention in order of steps.

圖3(A)係於積層步驟中獲得之硬化前積層體之俯視圖。圖3(B)係表示載體基板之積層前之狀態之部分剖面圖。圖3(C)係表示積層載體基板後之狀態之部分剖面圖。 Fig. 3(A) is a plan view of the laminated body before hardening obtained in the lamination step. Fig. 3(B) is a partial cross-sectional view showing a state before lamination of the carrier substrate. Fig. 3(C) is a partial cross-sectional view showing a state in which a carrier substrate is laminated.

圖4係透視載置於載物台上之硬化後積層體之一部分而表示之平面圖。 Figure 4 is a plan view showing a portion of the hardened laminated body placed on the stage in perspective.

圖5係破壞載置於載物台上之硬化後積層體及加工頭之一部分而表示之剖面圖。 Fig. 5 is a cross-sectional view showing a portion of the hardened laminated body and the processing head placed on the stage.

圖6係表示載置於另一載物台上之硬化後積層體及夾持夾具之剖面圖。 Fig. 6 is a cross-sectional view showing the hardened laminated body and the holding jig placed on the other stage.

圖7係表示本發明之電子裝置之製造方法之另一實施形態之製造步驟的流程圖。 Fig. 7 is a flow chart showing the manufacturing steps of another embodiment of the method of manufacturing the electronic device of the present invention.

圖8(A)係基於先前技術之附樹脂層之載體基板之剖面圖。圖8(B)係基於先前技術之積層體之端部之部分剖面圖。 Fig. 8(A) is a cross-sectional view of a carrier substrate with a resin layer according to the prior art. Fig. 8(B) is a partial cross-sectional view showing the end portion of the laminated body based on the prior art.

10‧‧‧剝離性玻璃基板 10‧‧‧Release glass substrate

14‧‧‧載體基板 14‧‧‧ Carrier substrate

18‧‧‧樹脂層 18‧‧‧ resin layer

20‧‧‧硬化後積層體 20‧‧‧ hardened laminated body

50‧‧‧載物台 50‧‧‧stage

52‧‧‧定位塊 52‧‧‧ Positioning block

60‧‧‧加工頭 60‧‧‧Processing head

62‧‧‧切割器 62‧‧‧Cut cutter

64‧‧‧固持器 64‧‧‧Retainer

66‧‧‧切割線 66‧‧‧ cutting line

Claims (10)

一種電子裝置之製造方法,其係製造包含剝離性玻璃基板與電子裝置用構件之電子裝置者,且包括:表面處理步驟,其係利用剝離劑對具有第1主表面及第2主表面之玻璃基板之上述第1主表面進行處理,而獲得具有呈易剝離性之表面之剝離性玻璃基板;硬化性樹脂組成物層形成步驟,其係於上述剝離性玻璃基板之呈易剝離性之表面上塗佈硬化性樹脂組成物,而形成未硬化之硬化性樹脂組成物層;積層步驟,其係將具有較上述未硬化之硬化性樹脂組成物層之外形尺寸小之外形尺寸之載體基板,以於上述未硬化之硬化性樹脂組成物層中殘留未與上述載體基板接觸之周緣區域之方式,積層於上述未硬化之硬化性樹脂組成物層上,而獲得硬化前積層體;硬化步驟,其係使上述硬化前積層體中之上述未硬化之硬化性樹脂組成物層硬化,而獲得具有樹脂層之硬化後積層體;切斷步驟,其係沿著上述硬化後積層體中之上述載體基板之外周緣將上述樹脂層及上述剝離性玻璃基板切斷;構件形成步驟,其係於上述剝離性玻璃基板之上述第2主表面上形成電子裝置用構件,而獲得附電子裝置用構件之積層體;以及分離步驟,其係自附上述電子裝置用構件之積層體將 具有上述剝離性玻璃基板與上述電子裝置用構件之電子裝置分離。 A method of manufacturing an electronic device for manufacturing an electronic device including a member for a release glass substrate and an electronic device, and comprising: a surface treatment step of using a release agent for the glass having the first main surface and the second main surface The first main surface of the substrate is treated to obtain a peelable glass substrate having a surface that is easily peelable; and a curable resin composition layer forming step is formed on the surface of the peelable glass substrate that is easily peelable Coating a curable resin composition to form an uncured curable resin composition layer; and a laminating step of disposing a carrier substrate having a size smaller than that of the uncured curable resin composition layer a layer of the unhardened curable resin composition layer is laminated on the uncured curable resin composition layer so as to remain in the uncured curable resin composition layer, and a hardening step is obtained. And hardening the uncured curable resin composition layer in the pre-hardened laminate to obtain hardening with a resin layer a layered body; the cutting step of cutting the resin layer and the peelable glass substrate along a periphery of the carrier substrate in the cured laminated body; and a member forming step of the peelable glass substrate a layered body for forming an electronic device member on the second main surface to obtain a member for an electronic device; and a separating step for attaching the laminated body of the member for the electronic device The peelable glass substrate is separated from the electronic device of the electronic device member. 如請求項1之電子裝置之製造方法,其進而包括消泡步驟,該消泡步驟係於上述積層步驟後且上述硬化步驟前進行上述未硬化之硬化性樹脂組成物層之消泡處理。 The method of manufacturing an electronic device according to claim 1, further comprising a defoaming step of performing a defoaming treatment of the uncured curable resin composition layer after the stacking step and before the hardening step. 如請求項1或2之電子裝置之製造方法,其中上述剝離劑包含含有甲基矽基或氟烷基之化合物。 The method of producing an electronic device according to claim 1 or 2, wherein the release agent comprises a compound containing a methyl fluorenyl group or a fluoroalkyl group. 如請求項1或2之電子裝置之製造方法,其中上述剝離劑含有矽氧油或氟系化合物。 The method of producing an electronic device according to claim 1 or 2, wherein the release agent contains a fluorinated oil or a fluorine-based compound. 如請求項1至4中任一項之電子裝置之製造方法,其中上述樹脂層含有矽氧樹脂。 The method of manufacturing an electronic device according to any one of claims 1 to 4, wherein the resin layer contains a silicone resin. 如請求項1至5中任一項之電子裝置之製造方法,其中上述樹脂層為包含具有烯基之有機烯基聚矽氧烷、與具有鍵結於矽原子之氫原子之有機氫聚矽氧烷之組合的加成反應型矽氧之硬化物。 The method of producing an electronic device according to any one of claims 1 to 5, wherein the resin layer is an organic alkenyl group having an alkenyl group and an organic hydrogen group having a hydrogen atom bonded to a ruthenium atom. An addition reaction type oxygenated product of a combination of oxynes. 如請求項6之電子裝置之製造方法,其中上述有機氫化聚矽氧烷之鍵結於矽原子之氫原子相對於上述有機烯基聚矽氧烷之烯基之莫耳比為0.5~2。 The method of producing an electronic device according to claim 6, wherein the organic hydrogenated polyoxyalkylene has a molar ratio of a hydrogen atom bonded to a halogen atom to an alkenyl group of the above organic alkenyl polyoxyalkylene of 0.5 to 2. 如請求項1至7中任一項之電子裝置之製造方法,其中上述樹脂層含有非硬化性之有機聚矽氧烷5質量%以下。 The method of producing an electronic device according to any one of claims 1 to 7, wherein the resin layer contains 5% by mass or less of non-hardenable organic polyoxane. 如請求項1至8中任一項之電子裝置之製造方法,其中於上述切斷步驟中,由載物台支持上述硬化後積層體中之載體基板之主表面,並且使上述載體基板之外周抵接於設置於上述載物台上之定位塊。 The method of manufacturing an electronic device according to any one of claims 1 to 8, wherein in the cutting step, the main surface of the carrier substrate in the hardened laminated body is supported by the stage, and the outer periphery of the carrier substrate is made Abutting on the positioning block disposed on the above stage. 如請求項1至9中任一項之電子裝置之製造方法,其中於上述切斷步驟中,於在上述硬化後積層體中之剝離性玻璃基板之表面形成切割線後,沿著該切割線將上述硬化後積層體中之剝離性玻璃基板及樹脂層之各者之外周部一次割斷。 The method of manufacturing an electronic device according to any one of claims 1 to 9, wherein in the cutting step, after the cutting line is formed on the surface of the peelable glass substrate in the hardened laminated body, along the cutting line The outer peripheral portion of each of the peelable glass substrate and the resin layer in the cured laminated body is once cut.
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