TW201318779A - 清潔基板之刷具 - Google Patents
清潔基板之刷具 Download PDFInfo
- Publication number
- TW201318779A TW201318779A TW101135344A TW101135344A TW201318779A TW 201318779 A TW201318779 A TW 201318779A TW 101135344 A TW101135344 A TW 101135344A TW 101135344 A TW101135344 A TW 101135344A TW 201318779 A TW201318779 A TW 201318779A
- Authority
- TW
- Taiwan
- Prior art keywords
- brush
- substrates
- cylindrical base
- substrate
- nodules
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 258
- 238000004140 cleaning Methods 0.000 title claims abstract description 51
- 238000005498 polishing Methods 0.000 claims abstract description 53
- 239000000126 substance Substances 0.000 claims abstract description 50
- 238000000034 method Methods 0.000 claims description 19
- 239000006260 foam Substances 0.000 claims description 8
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 4
- 230000001186 cumulative effect Effects 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 description 17
- 230000008569 process Effects 0.000 description 12
- 230000006835 compression Effects 0.000 description 8
- 238000007906 compression Methods 0.000 description 8
- 239000002184 metal Substances 0.000 description 7
- 230000008901 benefit Effects 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 238000005201 scrubbing Methods 0.000 description 5
- 230000004323 axial length Effects 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 239000002002 slurry Substances 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- 238000000151 deposition Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000006837 decompression Effects 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 238000006748 scratching Methods 0.000 description 2
- 230000002393 scratching effect Effects 0.000 description 2
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 241001080929 Zeugopterus punctatus Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 230000003389 potentiating effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
- H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
- H01L21/02074—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers the processing being a planarization of conductive layers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Cleaning In General (AREA)
- Rolls And Other Rotary Bodies (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161539342P | 2011-09-26 | 2011-09-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201318779A true TW201318779A (zh) | 2013-05-16 |
Family
ID=47996722
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101135344A TW201318779A (zh) | 2011-09-26 | 2012-09-26 | 清潔基板之刷具 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20140230170A1 (enExample) |
| JP (1) | JP2014534615A (enExample) |
| KR (1) | KR20140069043A (enExample) |
| CN (1) | CN103918063A (enExample) |
| TW (1) | TW201318779A (enExample) |
| WO (1) | WO2013049207A2 (enExample) |
Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10504753B2 (en) * | 2013-12-13 | 2019-12-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Brush cleaning apparatus, chemical-mechanical polishing (CMP) system and wafer processing method |
| JP6843621B2 (ja) | 2014-02-20 | 2021-03-17 | インテグリス・インコーポレーテッド | 目標とする高い洗浄性能を得るためのこぶの比率 |
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| SG10202002601QA (en) | 2014-10-17 | 2020-05-28 | Applied Materials Inc | Cmp pad construction with composite material properties using additive manufacturing processes |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| JP6316730B2 (ja) * | 2014-10-31 | 2018-04-25 | 株式会社荏原製作所 | ロール部材、ペンシル部材、及びそれらの少なくともいずれか一方を含む基板処理装置 |
| KR102389613B1 (ko) | 2015-05-06 | 2022-04-22 | 삼성전자주식회사 | 기판 세정 장치 |
| WO2017074773A1 (en) | 2015-10-30 | 2017-05-04 | Applied Materials, Inc. | An apparatus and method of forming a polishing article that has a desired zeta potential |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| JP6643942B2 (ja) * | 2016-04-12 | 2020-02-12 | 株式会社荏原製作所 | 洗浄部材、基板洗浄装置及び基板処理装置 |
| US11923208B2 (en) | 2017-05-19 | 2024-03-05 | Illinois Tool Works Inc. | Methods and apparatuses for chemical delivery for brush conditioning |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| KR20210042171A (ko) | 2018-09-04 | 2021-04-16 | 어플라이드 머티어리얼스, 인코포레이티드 | 진보한 폴리싱 패드들을 위한 제형들 |
| US11694910B2 (en) * | 2019-09-10 | 2023-07-04 | Illinois Tool Works Inc. | Brush with non-constant nodule density |
| US11470956B2 (en) | 2020-03-06 | 2022-10-18 | Applied Materials, Inc. | Brush, method of forming a brush, and structure embodied in a machine readable medium used in a design process |
| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
| JP2022134658A (ja) * | 2021-03-03 | 2022-09-15 | アイオン株式会社 | ブラシローラ |
| EP4533528A4 (en) * | 2022-05-31 | 2025-08-20 | Entegris Inc | Cleaning brush for semiconductor fabrication process |
| JP2024047416A (ja) * | 2022-09-26 | 2024-04-05 | 株式会社Screenホールディングス | 基板洗浄ブラシおよび基板洗浄装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS596974A (ja) * | 1982-07-05 | 1984-01-14 | カネボウ株式会社 | 洗浄方法 |
| US6299698B1 (en) * | 1998-07-10 | 2001-10-09 | Applied Materials, Inc. | Wafer edge scrubber and method |
| JP4554011B2 (ja) * | 1999-08-10 | 2010-09-29 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置の製造方法 |
| US6467120B1 (en) * | 1999-09-08 | 2002-10-22 | International Business Machines Corporation | Wafer cleaning brush profile modification |
| JP2001358110A (ja) * | 2000-06-13 | 2001-12-26 | Hitachi Ltd | スクラブ洗浄装置およびそれを用いた半導体装置の製造方法 |
| JP2003051481A (ja) * | 2001-08-07 | 2003-02-21 | Hitachi Ltd | 半導体集積回路装置の製造方法 |
| EP1680260B1 (en) * | 2003-08-08 | 2014-04-30 | Entegris, Inc. | Methods and materials for making a monolithic porous pad cast onto a rotatable base |
| US7469443B2 (en) * | 2005-01-10 | 2008-12-30 | Intel Corporation | Brush for cleaning wafer |
| JP2008119621A (ja) * | 2006-11-14 | 2008-05-29 | Matsushita Electric Ind Co Ltd | 洗浄用ローラブラシ |
| JP2009117765A (ja) * | 2007-11-09 | 2009-05-28 | Aion Kk | 洗浄用スポンジローラ |
| WO2010001761A1 (ja) * | 2008-06-30 | 2010-01-07 | アイオン株式会社 | 洗浄用スポンジローラ |
| USD682497S1 (en) * | 2010-12-21 | 2013-05-14 | Entegris, Inc. | Substrate cleaning brush |
-
2012
- 2012-09-26 KR KR1020147008038A patent/KR20140069043A/ko not_active Withdrawn
- 2012-09-26 JP JP2014533684A patent/JP2014534615A/ja active Pending
- 2012-09-26 WO PCT/US2012/057337 patent/WO2013049207A2/en not_active Ceased
- 2012-09-26 US US14/347,170 patent/US20140230170A1/en not_active Abandoned
- 2012-09-26 CN CN201280045932.7A patent/CN103918063A/zh active Pending
- 2012-09-26 TW TW101135344A patent/TW201318779A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2013049207A3 (en) | 2013-07-11 |
| KR20140069043A (ko) | 2014-06-09 |
| JP2014534615A (ja) | 2014-12-18 |
| US20140230170A1 (en) | 2014-08-21 |
| WO2013049207A2 (en) | 2013-04-04 |
| CN103918063A (zh) | 2014-07-09 |
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