TW201227054A - Film for testing LCD panel, test device for testing LCD panel and method for manufacturing test device for testing LCD panel - Google Patents

Abstract

A film for testing a liquid crystal display (LCD) panel, a test device for testing a LCD panel, and a method of manufacturing the test device are provided. The test device includes a film configured to have first lines and second lines formed thereon wherein the first lines receive test signals and the second lines are disposed apart from the first lines, branch the test signals received from the first lines into n (n is a natural number) signals and transmit the branched test signals to corresponding input lines of the LCD panel; a line connection unit configured to be formed on a substrate and include metal lines to transmit signals received via the first lines to the respective corresponding second lines; and bumps configured to electrically connect the first lines and the second lines to the corresponding metal lines.

Description

201227054

BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a film for testing a liquid crystal display panel, a test device for testing a liquid crystal display panel, and a method of manufacturing the test device. In particular, it relates to a film for testing a liquid crystal display panel, a test device for testing a liquid crystal display panel, and a method of manufacturing the test device, which can reduce manufacturing steps and costs.先前 [Prior Art] As the use of display devices in various fields has increased, research on liquid crystal display panels mounted on display devices and methods of testing liquid crystal display panels is actively underway. A normal liquid crystal panel that has been tested by 瑕疵 has a module attached thereto and can be used for a display device such as a television or a monitor. Fig. 1 is a schematic view showing an example of a test apparatus for testing a liquid crystal display panel in the prior art. Figure 2 is a plan view of the test apparatus of Figure 1. Referring to FIG. 1 and FIG. 2, the test apparatus TD of the prior art includes a driving unit DRV and a probe unit PRB. The driving unit DRV includes a driving integrated circuit (drive IC) DIC to receive a soft printing. a test signal applied by the circuit board FPC, and converting the received test signal into an analog voltage for driving a liquid crystal display panel PAN; and the probe unit PRB transmits a test signal converted into an analog voltage to the probe unit PRB The input line PILIN of the liquid crystal display panel PAN is in contact. The drive unit DRV can be 5 201227054

The TW8217PA is a tape-type automatic bonding integrated circuit (TAB 1C), and the probe unit PRB can be a needle-type or blade-type probe. TAB 1C refers to a driver integrated circuit DIC packaged in a thin film form. The test signal is an electronic signal, which is received from the flexible printed circuit board FPC via the first trace LIN1 disposed on the film FIL and transmitted to the driving unit DRV, and the test signal converted by the driving unit DRV into an analog voltage is disposed on the film FIL. The second trace LIN2 is transmitted to the probe unit PRB. Fig. 3 is a schematic view showing another test apparatus for testing a liquid crystal display panel in the prior art. Figure 4 is a plan view of the test apparatus of Figure 3. Referring to FIG. 3 and FIG. 4, the driving unit DRV of the prior art test apparatus TD does not include a separate driving 1C, and directly receives a picture signal (analog voltage) from a flexible printed circuit board FPC as Driving a test signal of the liquid crystal display panel PAN, copying the received image signal into a quantity required for testing the liquid crystal display panel PAN, and transmitting the copy signals to the liquid crystal display panel PAN. Figs. 3 and 4 particularly illustrate an example in which the drive unit DRV receives six image signals from the flexible printed circuit board FPC. The six image signals may be color signals for driving the liquid crystal display panel PAN, including R, G, B, R', G' and B'. The drive unit DRV shown in Figs. 3 and 4 has a routing structure for recursively outputting six test signals TET received from the flexible printed circuit board FPC. Unlike the test apparatus shown in Figures 1 and 2, the test apparatus TD shown in Figures 3 and 4 is difficult to test the flaw of the liquid crystal display panel PAN with respect to a particular pattern, but may be suitable by applying a single Color in the whole liquid 6 201227054

' TW8217PA crystal display panel PAN to test the presence of defective cells. Fig. 5 is a schematic view showing a wiring structure formed on a film for use in the test apparatus shown in Figs. 3 and 4. + Referring to Fig. 5, the first trace LIN1 is formed on a first surface of the thin film as an insulator, and the second trace UN2 is formed on one of the first surfaces of the film. The first trace LIN1 can receive the soft printed circuit board FPC = test signal ' and the second trace L! N 2 can transmit the j received via the first trace to the input of the corresponding liquid crystal display panel pAN line. In this example, the phase I, the fish line UN1 and the second line UN2 can be ultra-shortened by the hole VIA and are shown in Figure 5 when the complexity of the trace on the film FIL is made: : When adding 'and the lines are formed on both sides of the film, the cost will increase. SUMMARY OF THE INVENTION The present invention provides a film for use in a test panel of a liquid crystal display panel, which can simplify manufacturing, can be used, and can be manufactured at a low manufacturing cost. The film is also used in the cost step, thereby reducing the present invention to provide a test device for testing the 曰 曰 & 刚 test device comprising: "thin / day / item" panel, the line 舆 multiple second traces ' The plurality of first-two-way traces formed on the film are separately matched with the first trace [two traces receive multiple test signals] and the first miss signal branch is n彳$ two traces Receiving from the first-route test signal to the corresponding y: In is a natural number) 'and the branching unit after the branch is formed into a plurality of input lines of the display panel; - the circuit is connected to the substrate and includes a plurality of metals Line to be passed through the number 201227054

The test signal received by the TW82I7PA is transmitted to the corresponding second trace; and the plurality of bumps electrically connect the first trace and the second trace to the corresponding metal line. Each of the first traces and the second traces may be formed on one of the first surfaces of the film. The first trace has an amount equal to the number of test signals, and the second trace can be n times the number of first traces. The metal lines can have an amount equal to the number of first traces. Each of the metal wires may form a closed rectangle having four sides connected to each other, and the first wires may be respectively connected to one side of the corresponding metal wires, and the second wires may be respectively connected to the corresponding metal wires respectively. The other side. The other side can be opposite the one side of the wire. The first metal line corresponding to the first test signal of the test signal may be located at the outermost side, and the other metal lines except the first metal line may be located inside the first metal line, and along with the first metal line to the other metal lines The distance between the lines gradually increases, and the total length of the four sides of the other metal lines can be gradually reduced. The first metal line corresponding to the first test signal of the test signal may be located at the innermost side, and the other metal lines except the first metal line may be located outside the first metal line, and along with the first metal line to the other metal The distance between the lines gradually increases, and the total length of the four sides of the other metal lines can be gradually increased. Each of the first traces may be connected to the other side of the metal line. Each of the metal wires may be formed in a rectangular shape having a slit on one side thereof, the first trace may be connected to one side of the corresponding metal wire, and the second trace may be connected to the corresponding metal wire respectively One side. Each of the metal wires may be formed in a rectangular shape having a slit on the other side. 201227054

TW8217PA shape. Each strip-line can be branched into a natural number. The M signal phase _ X-element line connection unit may further include a test signal from the second trace output. It can be used for a plurality of liquid crystal display surfaces. 1 is connected to the test signal output from the second line connection unit from the second line and can be used for the liquid-to-day display (four) board t line connection unit number can be included R, G, B, R, r, The test letter of rt 'Men's one line drives the LCD panel. The test device can be further advanced, and the color number is used to eliminate the plurality of probes transmitted from the branch of the second trace, which is the wheel line of the display panel. The second trace can directly correspond to the input line of the LCD panel. The present invention also provides a method for manufacturing a device, comprising: forming a plurality of strips: walking: wires into a plurality of metal wires on a substrate, Α, brother-walking and shape, second walking The line is configured separately from the first-traffic line, and the second pass=receives a test signal branch of a plurality of test letters and a trace. The "sales letter_ is the signal after the first branch, and the corresponding liquid crystal fresh & The wire is electrically connected to each of the first to the reverse by the plurality of bumps: the second line 'the line; the material (four) - the insulating (four) material plate and the gold;;: brother: walking on the insulation layer, multiple connections, a bump is formed; a plurality of protrusions i4 are formed in the joint region; and the first trace and the second trace on the film are joined to the film, and the other features of the knife in the present invention will be as follows It is proposed in the description and achieves a certain degree of understanding by the above-mentioned Japanese 201227054 TW8217PA, or can be learned by the practice of the present invention. According to an exemplary embodiment of the present invention, a film for testing a liquid crystal display panel, Test apparatus and method of manufacturing the test apparatus, which can improve the wiring method of the film (w Irring method), thereby simplifying the process steps and reducing the manufacturing cost. [Embodiment] The present invention is more fully disclosed by the following exemplified embodiments and the accompanying drawings. However, the present invention can be in various forms. The present invention is to be construed as being limited to the scope of the invention, and the scope of the present invention is fully understood. The size or relative sizes of the elements or regions in the drawings may be exaggerated. The same elements in the drawings are used to denote the same elements. FIG. 6 depicts a first exemplary embodiment in accordance with the present invention. Test the pattern of the test device for the liquid crystal display panel (LCD panel). Referring to Figure 6, the test device TD may include a plurality of first traces LINls, a plurality of second traces LIN2s, and a line connection unit CNLIN. The line LINls receives a plurality of test signals XTET from a flexible printed circuit board FPC, and the second line LIN2s transmits the test signal XTET to one of the corresponding panels. As in the related art, the test signal XTET may have an analog voltage value. Each of the first traces LINls and the second traces LIN2s may be disposed on one of the first surfaces of a thin film FIL. The first trace LINls With the second line LIN2s series 10 201227054

The TW8217PA is placed separately on the film FIL. That is, the first trace UNls and the second trace LIN2s are disposed on the thin film FIL, but unless the line connection unit cnlin is electrically connected, otherwise the first-line LINls and the second trace LIN2s are not electrically connected to each other. Sexual connection. The line connection unit CNLIN includes a metal line MLs that connects the first trace UNls to the corresponding second trace LIN2s, respectively. The second trace LIN2s is electrically connected to the corresponding first trace LINls, so that the test signal received via the first trace UNls can be copied (branched) and the replicated (branch) test signals are transmitted. ΧΤΕΤ Transfer to the LCD panel ρΑΝ. Thus, the metal lines MLs may be formed to have the same number as the first traces [13, and the number of the second traces LIN2s may be n times the number of the first traces LINls, where η is a natural number. However, in order to facilitate the description of the figure, the second trace in Fig. 6 is set to be twice the number of the first trace LINls by ^^. In the example depicted in Figure 6, there are six first traces LINls, and the flexible printed circuit board Fpc 包含 contains 11, (},; 8, 11', (}' and six color signals The test signal sent to the first-line UNls. Correspondingly, there may be six metal lines MLs 'including the first to sixth metal lines MU, paper 2, mL3, ML4, paper 5 and ML6. However, the number of lines is not limited In the above example, the number of the first traces, the first traces, and the metal lines may be changed. The metal lines MLs may be connected to the corresponding first and second traces via the bumps BUM. For example, the first metal lines ML1 are via A bump BUM is connected to an eleventh trace LIN11 and a second eleven trace UN2, wherein the eleventh trace LIN11 receives a first test signal χΤΕΤ1, and the eleventh trace 11 201227054

The TW8217PA LIN21 applies the first test signal XTET1 to the liquid crystal display panel PAN. The second metal line ML2 is connected to a twelfth trace LIN12 and a twenty-second trace LIN22 via a bump BUM, wherein the twelfth trace uni2 receives a second test signal XTET2, and the twenty-second walk The line LIN22 applies the first test No. XTET2 to the liquid crystal display panel PAN. The third metal line ML3 is connected to a thirteenth trace UN13 and a twenty-third trace UN23 via a bump Bum, wherein the thirteenth trace LIN13 receives a third test signal XTET3' and the twenty-third walk The line UN23 applies the third test signal χτΕτ3 to the liquid crystal display panel ΡΑΝ. Similarly, the fourth metal line is connected to a fourteenth trace LIN14 and a twenty-fourth trace LIN24 via a bump BUM, wherein the fourteenth trace UN14 receives a fourth test signal XTET4, and the twentieth The fourth trace LIN24 applies the fourth test signal χτΕτ4 to the liquid crystal display panel. The fifth metal line ML5 is connected to a fifteenth trace LIN15 and a twenty-fifth trace UN25 via a bump bum, wherein the fifteenth trace LIN15 receives a fifth test signal ΧΤΕΤ5, and the twenty-fifth walk The line LIN25 applies the fifth test signal χτΕΤ5 to the liquid crystal display panel PAN. The sixth metal line ML6 is connected to a sixteenth trace LIN16 and a twenty-sixth trace UN26 via a bump BUM, wherein the sixteenth trace UNi6 receives a sixth test signal XTET6, and the second sixteen The trace UN26 applies the sixth test 彳§ XTET6 to the liquid crystal display panel PAN. For details, please refer to Fig. 7. The metal wires MLs are electrically disconnected via an insulating layer IS〇, and the bumps BUM are respectively connected to the corresponding metal wires MLs, thereby electrically connecting the metal wires MLs to the corresponding wires LINls or LIN2s. . No need for semiconductor fabs like the prior art (semic〇nduct〇r 12 201227054

TW8217PA FAB) by stacking a vja process and a line stacking process (i-gamma process) by stacking a plurality of layers having interconnects connected to each other; connecting the wires by the manner described above And the traces, as shown in FIGS. 6 and 7 can be made such that the metal lines MLs disposed under the bumps and the traces LINls or LIN2s disposed on the bumps are cross-connected to each other via the bumps, thereby being manufactured A tape-and-tape automatic bonding integrated circuit (TAB 1C) (film) for liquid crystal I-in-one (LCD) testing. The TAB IC (film) can copy the input signal to the original ◎ input signal by a factor of h. Multiple signals and output these (four) signals. Bu does not have to perform pre-processing of the semiconductor fab (pre_pr〇cess), the manufacturing of the line connection unit CNLIN is only f-bump P, that is, the post-process of the semiconductor wafer, so Reduce manufacturing costs. • In the case of copying the input signal to n times the number of original input signals, if the second trace UN2s is manufactured and the plurality of metal lines MLs in the L number copy number are configured, Having determined the value of η, it is not necessary to repeat the bump system (4) to manufacture TAB 1C. The port is manufactured to copy the input signal into the number of original input signals n Γ TABIC _ 'only - what needs to be done is - assembly of the second trace due to the S / i line connection unit CNUN process, which can be greatly Reduce the time and cost of additional line connection units CNLIN. ^ ",, Figure 6, each metal line MLs can form a closed rectangle with interconnected Li ^ la. * In this example, each strip first line, line LIN1W divides the gold I (four) - side, and each The second trace s β knife is connected to the other side of the corresponding metal line. Metal line 13 201227054

The other side of the TW8217PA can be opposite the side of the wire. For example, in FIG. 6, the first metal line ML1 may form a closed rectangle having interconnected sides 1 to 4, and the LIN11 of the first trace may be connected to the side 1' of the first metal line Mu. The LIN21 of the two traces can be connected to the other side 3 of the first metal line Mu. In Fig. 6, the first metal line ML 1 is located at the outermost side of the metal line, and the first metal line ML2 is disposed inside the first metal line ml 1 and close to the first metal line ML1, and the third metal line ML3 is disposed. The inside of the second metal line ML2 is close to the second metal line ML2. Similarly, the fourth metal line ML4 is disposed inside the third metal line ML3 and close to the third metal line ML3, and the fifth metal line ML5 is disposed inside the fourth metal line ML4 and close to the fourth metal line ML4, and the sixth The metal wire ML6 is disposed on the innermost side of the metal wire MLs. However, the arrangement of the metal lines MLs is not limited to the above examples. Please refer to FIG. 8 of the test device TD for testing the liquid crystal display panel according to the second exemplary embodiment of the present invention, and connect to the eleventh trace LINU to receive the first metal line of the first test signal χΤΕΤ1. ML1 may be located at the innermost side, and the sixth metal wire ML6 connected to the sixteenth trace LIN16 to receive the sixth test signal χτΕΤ6 may be located at the outermost side. In the example illustrated in Fig. 6, it is depicted that each of the metal wires MLs forms a closed rectangle, but the shape of the metal wires is not limited thereto. Referring to FIG. 9 which depicts a test set TD for testing a liquid crystal display panel according to a third exemplary embodiment of the present invention, each of the metal lines MLs does not form a closed rectangle, but has a rectangular shape with a slit on one side. shape. Especially in the metal line MLs painted in Figure 9, in consideration of the situation of noise (n〇ise), etc. 14 201227054

The TW8217PA under 'has a slit with respect to the side opposite to the side connected to the first trace LINls. Please refer to the first drawing of the test apparatus TD for testing the liquid crystal display panel according to the fourth exemplary embodiment of the present invention. The figure 'each metal line MLs' can form a closed circle. The first drawing depicts a schematic diagram of a test apparatus for testing a liquid crystal display panel in accordance with a fifth exemplary embodiment of the present invention. Referring to Figure u, the test device TD has metal wires each configured to form a closed rectangle. Each of the metal wires has two opposite sides connected to the first trace LINls. For example, the eleventh trace LIN11 is simultaneously connected to one side i and the other side 3 of the first metal line MU (the reference symbols of the side are the same as the symbols of the side of the first metal line MU in FIG. 6) . As shown in the test apparatus TD depicted in FIG. u, when the metal line MLs and the first trace LINls are connected to each other, the position to be transmitted to the first trace LINls is relatively close to the first trace LIN1 s on the metal line. The test signal of the second trace is transmitted to the test signal of the second trace which is relatively far away from the second line - the LINls (away from the first line on the metal line), due to the different transmission distances. The difference is shown in Fig. 12 as a schematic diagram of a test apparatus for a liquid crystal display panel according to the six exemplary embodiment of the present invention. Please refer to the same, > The ancient walking device TD may include a plurality of first routing LINls groups to branch each test signal XTET from the circuit board FPC into X signals and connect the = branch signal to the metal line MLs Where X is a natural number, and X is 2 in the examples depicted in the first and the & A line connection as shown in Figure 12 15 201227054

TW8217PA CNUN line material (3) The second line of the coffee q ^ (four) of the first-time line to receive some of the first line UNls group. Connect CNLIN2) to connect to the second trace of the car C_2 in Fig. 12 == connect the CNUni and the liquid crystal display panel PAN. , a, the transmission to the two independent liquid crystal display panel pAN can be a single liquid - in this case 'a plurality of independent individual liquid crystal display panels. The day/and the day, the part of the panel, or the line connection unit of each sub-line connection unit and the figure are the same, so it is not here: it is depicted in Figures 6 to 12, and the diagram is depicted according to the figures 6 to 12. Partial cross-sectional view of the test device of the liquid crystal display panel. &歹 for testing 凊 Refer to Figure 13, as described above, the test system is placed on top of the 4 board coffee, and has the insertion M = genus仏: The metal line MLS is connected to the first-line 2 through the bump BUM: the first-line LIN2s, wherein the first-line LINls and the second line un2s are arranged on one of the first surfaces of the film FIL. The test apparatus TD shown in Fig. 13 can be manufactured by the process described in Fig. 14. θ In the process of manufacturing the test apparatus TD for testing the liquid crystal display panel according to an exemplary embodiment of the present invention, as shown in Fig. 14. (&), the metal/route MLs are formed on a substrate SUB. Then, as shown in Fig. 4(b), an insulating material is applied to the beauty having the metal lines MLs formed thereon. On the board SUB, to fabricate an insulating layer IS0. Etching the insulating layer IS〇 to form a second 201227054

TW8217PA 14 The pad PAD shown in (c), the bump BUM is in contact with the metal wire MLs via the pad. Thereafter, as shown in FIG. 14(d), bumps BUM are formed on the pads PAD, respectively, and the bumps BUM are bonded to the film FIL having the traces LIN1 and LIN2 formed thereon, as shown in FIG. 14(e). Show.

In the prior art TAB 1C manufacturing method, the manufacturing cost increases with the number of masks used. In accordance with an exemplary embodiment of the present invention, a method of manufacturing a test apparatus TD, except for a mask for forming traces LIN1 and LIN2 on a film, only three masks are used: one for forming a metal line on the substrate SUB. MLs; the other is used to etch the pad area; the last one is used to form the bump BUM. This simplifies the process and reduces manufacturing costs. Fig. 15 is a view showing an example of a connection structure between a liquid crystal display panel and a second wiring of the test apparatus according to the sixth to twelfth embodiment. Fig. 16 is a view showing another example of the connection structure between the liquid crystal display panel and the second wiring of the liquid crystal display panel test device. Referring to Fig. 15, the second trace LIN2s of the test device TD is electrically connected to the input line PILIN of the liquid crystal display panel PAN via a contact means such as the probe unit PRB (not shown in Fig. 15). On the other hand, in the example depicted in FIG. 16, the second trace LIN2s located on the film FIL of the test device TD is directly electrically connected to the input line PILIN of the liquid crystal display panel PAN (not shown in FIG. 16). Additional means of contact, such as probe unit PRB of Figure 15. Although not shown in Figures 15 and 16, the liquid crystal display panel PAN may include pads for applying a test signal transmitted from the second trace LIN2s to the input line PILIN. Also, although the examples shown in Figs. 15 and 16 are depicted as applying the line connection unit illustrated in Fig. 6 2012 20120

TW8217PA CNLIN, can also be used in the description of CNUN. The present invention has been described above with reference to the line connection unit 1 to 2 of the drawings. Although the present invention has been disclosed in the preferred embodiment, the present invention is not limited to the present invention. The technology of the present invention has the usual wealth: the person who knows, does not deviate from the reading of the god domain # and retouching. Therefore, this cigarette will only be 啥~ 么 之 之 么 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 [Simple description of the drawing] The test for testing the liquid crystal display panel Fig. 1 depicts a prior art design of a 5-type device. The f 2 diagram is a plan view of the test apparatus of Fig. 1. Figure 3 below shows a schematic diagram of the test device used to test the board in the prior art. The f4 diagram is a top view of the test t placed in Figure 3. Fig. 5 is a schematic view showing a wiring structure which is not formed on the 〆/specific film of the test apparatus of Figs. 3 and 4. Fig. 6 is a schematic view showing a test apparatus for testing a liquid helium display panel according to a first exemplary embodiment of the present invention. Figure 7 is a schematic view of the detail of the connection of the trace and the metal line in Figure 6 of the drawing. According to the second exemplary embodiment of the present invention, the test apparatus for testing the liquid helium, the panel is shown. schematic diagram. Fig. 9 is a schematic view showing a test apparatus for testing a liquid panel display panel according to a third exemplary embodiment of the present invention. 18 201227054

'TW82I7PA FIG. 10 is a schematic view showing a test apparatus for testing a liquid crystal display panel according to a fourth exemplary embodiment of the present invention. Figure 11 is a diagram showing a test apparatus for testing a liquid crystal display panel according to a fifth exemplary embodiment of the present invention. Figure 12 is a schematic view showing a test apparatus for testing a liquid crystal display panel according to a sixth exemplary embodiment of the present invention. Figure 13 is a partial cross-sectional view showing a test apparatus for testing a liquid crystal display panel according to the illustrated embodiment of Figures 6 to 12. Figure 14 is a schematic diagram showing a method of fabricating a test apparatus for testing a liquid crystal display panel according to an exemplary embodiment of the present invention. Fig. 15 is a view showing an example of a connection structure between a liquid crystal display panel and a second wiring of the test apparatus according to the sixth to twelfth embodiment. Fig. 16 is a view showing another example of the connection structure between the liquid crystal display panel and the second wiring of the liquid crystal display panel test device. [Description of main component symbols] 〇 1, 2, 3, 4: Side BUM: Bump CNLIN: Line connection unit DIC: Drive integrated circuit DRV: Drive unit FIL: Film FPC: Flexible printed circuit board ISO: Insulation layer LIN : Trace 19 201227054

TW8217PA LINll: eleventh line LIN12: twelfth line LIN13: thirteenth line LIN14: fourteenth line LIN15 · · fifteenth line LIN16: sixteenth line LIN1, LINls: first Trace LIN21: 21st trace LIN22: 22nd trace LIN23: 23rd trace LIN24: 24th trace LIN25: 25th trace LIN26 .苐26 LIN2, LIN2s: second trace ML, MLs: metal line ML1: first metal line ML2: second metal line ML3: third metal line ML4: fourth metal line ML5: fifth metal line ML6: sixth metal line PAD: Pad PAN: LCD panel PILIN: Input line 20 201227054

I W8217PA PRB: Probe SUB: Substrate TD: Test device TET, ΧΤΕΤ: Test signal VIA: Hole XTET1: First test signal XTET2: Second test signal XTET3: Third test signal XTET4: Fourth test signal XTET5: Fifth Test signal XTET6: sixth test signal 21

Claims (1)

201227054 TW8217PA VII. Patent Application Range: 1. A test device for testing a liquid crystal display panel, the test display includes: a film having a plurality of first-line and a plurality of segments formed on the substrate The traces, wherein the plurality of test lines receive a plurality of test signals, and the second traces are disposed separately from the first traces, and the second traces are received from the first-routes The test signals are branched into n test signals (n is natural, and four branch slave signals are transmitted to the plurality of input lines of the corresponding liquid crystal display panel; "the line connection unit is formed on a substrate and includes a plurality of metal pair libraries:,: the test signals received by the first trace of i are transmitted to the corresponding second traces respectively; and, the plurality of bumps 'the first and the traces are The second trace is electrically connected to the corresponding metal wires. The test device described in the above paragraph 1, wherein each of the first traces on the first surface is formed in one of the films The first test device as described in the patent application scope The = line has an amount equal to the number of the test signals; the number of traces (4) is η times the number of the first-routes. ^ The test apparatus of the first line of claim 1 of the patent scope, Among them, the gold, and, "there are a total number of the first traces of the same number.", 兮 八 八 如 如 如 如 如 中 中 中 中 中 如 如 如 如 如 如 如 如 如 如 如 如 如 如 测试 测试 测试One core having four sides connected to each other: 22 201227054 • 1W8217PA Some of the first wiring lines are respectively connected to one side of the corresponding metal lines, and the second routing lines are respectively connected to corresponding ones 6. The test device of claim 5, wherein the other side of the metal wires is opposite the side of the metal wires. The test device of claim 5, wherein the first metal wire corresponding to one of the first test signals is located at the outermost side, except for the first metal wire Is located on the inside of the third metal line And as the distance from the first metal line to the other metal lines gradually increases, the total length of the other side of the metal lines is gradually reduced. 8. The test device of the present invention, wherein a first metal line corresponding to one of the first test signals is located at an innermost side, and the other metal lines other than the first metal line are located at the first metal On the outer side of the line, and as the distance from the first metal line to the other metal lines gradually increases, the total length of the other side lines of the metal lines is gradually increased. The test device of claim 5, wherein each of the first traces is connected to the other side. 10. The test apparatus of claim 1, wherein each of the metal wires is formed in a rectangular shape having a slit on one side thereof, and the first traces are connected to the respective ones The side edges of the metal lines are connected to the other side of the respective metal lines. 23 201227054 TW8217PA M. The test device according to the scope of the third aspect of the invention, wherein each of the metal wires is formed in a rectangular shape having a slit on the other side. 2. For the scope of the patent: The first-traffic line is relative to the corresponding one of the maternal mothers - a natural number. And 忒4唬 and branch into X (X 13. As claimed in the patent scope! The road connection unit further includes 次 sub-line connection unit. Η衣置' its secret (4) L4. As described in claim 12 Testing the device, and causing the first-shot r test signal from the eight-wire connection unit to be connected to the test circuit, and the test device described in the other items, wherein the self-testing The signal system is provided to the test device of the first === Patent (4) item 1 of the single-two-wire output, wherein the six colors of the two are about 1 to drive the liquid crystal display. The panel color community includes R, g, b, r', g, b', and the test described in the first item, and includes: the 4? 2: the second line will be transmitted from the second line. And the test device described in the first application of the first application of the liquid crystal display panel, wherein the phase is directly connected to the corresponding liquid crystal display panel. Manufacturers of test devices for testing liquid crystal display panels 24 201227054 i W821/P In the method of A, the manufacturing method includes: forming a plurality of first traces and a plurality of second traces on a film, and forming a plurality of metal lines on a substrate, wherein the first traces receive a plurality of test signals The second traces are disposed separately from the first traces, and the second traces branch the test signals received from the first traces into n test signals (n is a natural number) And transmitting the test signals of the branches to a plurality of input lines of the corresponding liquid crystal display panel, the metal wires being electrically connected to each of the first traces and the second portions via a plurality of bumps ◎ routing; by coating an insulating material on the substrate and the metal lines to form an insulating layer; etching a plurality of pad regions on the insulating layer, whereby the bumps will be Metal wire bonding; forming the bumps in the pad regions; and bonding the bumps to the first traces and the second traces respectively located on the film.