CN103189790A - Film for testing LCD panel, test device for testing LCD panel and method for manufacturing test device for testing LCD panel - Google Patents
Film for testing LCD panel, test device for testing LCD panel and method for manufacturing test device for testing LCD panel Download PDFInfo
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- CN103189790A CN103189790A CN2011800515549A CN201180051554A CN103189790A CN 103189790 A CN103189790 A CN 103189790A CN 2011800515549 A CN2011800515549 A CN 2011800515549A CN 201180051554 A CN201180051554 A CN 201180051554A CN 103189790 A CN103189790 A CN 103189790A
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- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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Abstract
A film for testing a liquid crystal display (LCD) panel, a test device for testing a LCD panel, and a method of manufacturing the test device are provided. The test device includes a film configured to have first lines and second lines formed thereon wherein the first lines receive test signals and the second lines are disposed apart from the first lines, branch the test signals received from the first lines into n (n is a natural number) signals and transmit the branched test signals to corresponding input lines of the LCD panel; a line connection unit configured to be formed on a substrate and include metal lines to transmit signals received via the first lines to the respective corresponding second lines; and bumps configured to electrically connect the first lines and the second lines to the corresponding metal lines.
Description
Technical field
The present invention relates to a kind of film for test liquid crystal display (LCD) panel, a kind of for the proving installation of test LCD panel and the method for making this proving installation, relate to more specifically and can reduce a kind of for the film of testing the LCD panel, a kind of for the proving installation of test LCD panel and the method for making this proving installation of manufacturing process and cost.
Background technology
Along with the increase of the use of display device in every field, carrying out actively for the research that is assemblied in the display panels on the display device and is used for the method for test LCD panel always.Normal liquid crystal panel through defects detection has the module that is mounted thereon, and can be used to for example display device of TV, monitor etc.
Figure l is the figure of example that describes the proving installation that is used for test LCD panel of prior art.Fig. 2 is the figure that describes the planimetric map of the described proving installation of Fig. 1.
See figures.1.and.2, the proving installation TD of prior art comprises driver element DRV and probe unit PRB, wherein driver element DRV comprises that drive IC DIC is to receive the test signal that flexible printed circuit board FPC is applied, and the test signal that receives is converted to for the aanalogvoltage that drives LCD panel PAN, and probe unit PRB will be converted to the input line PILIN that the test signal of aanalogvoltage is sent to the LCD panel PAN that contacts with probe unit PRB.Driver element DRV can be TAB IC, and probe unit PRB can be pin type or blade type (blade-type) probe.TAB IC represents the drive IC DIC with the form encapsulation of film.Test signal as electronic signal is received and is transferred into driver element DRV from flexible printed circuit board FPC via the first line LINl that is arranged on the film F IL, and the test signal that driver element DRV will be converted to aanalogvoltage is sent to probe unit PRB via the second line LIN2 that is arranged on the film F IL.
Fig. 3 is the figure that describes the proving installation that is used for test LCD panel of another prior art, and Fig. 4 is the planimetric map of describing proving installation shown in Figure 1.
With reference to Fig. 3 and Fig. 4, the driver element DRV of the proving installation TD of prior art does not comprise independently drive IC, but the picture signal (aanalogvoltage) that directly receives from flexible printed circuit board FPC is used for driving LCD panel PAN as test signal, the picture signal that receives is copied into the signal of testing the needed quantity of LCD panel PAN, and the signal that these copy is sent to LCD panel PAN.
Fig. 3 and Fig. 4 illustrate driver element DRV receives six kinds of picture signals from flexible printed circuit board FPC example especially.Six kinds of picture signals can be to drive the required chrominance signal that comprises R, G, B, R`, G` and B` of LCD panel PAN.Fig. 3 and driver element DRV shown in Figure 4 have a line structure, and recursively (recursively) output is from six kinds of test signal TET of flexible printed circuit board FPC reception.
Be different from proving installation illustrated in figures 1 and 2, Fig. 3 and proving installation TD shown in Figure 4 are difficult to test the defective about specific pattern on the LCD panel PAN, but can be suitable for the test defect unit by whole LCD panel PAN is applied identical color.
Fig. 5 is the synoptic diagram that is illustrated in the line structure that forms on the film, and described film is used for Fig. 3 and proving installation shown in Figure 4.
With reference to Fig. 5, the first line LIN1 forms at the first surface as the film of insulator, and the second line LIN2 forms at the second surface of film.The first line LIN1 can receive the test signal from flexible printed circuit board FPC, and the second line LIN2 can be sent to the test signal that receives via first line input line of corresponding LCD panel PAN.In the case, via hole VIA, the first line LINl and the second line LIN2 can be electrically connected to each other.But, as shown in Figure 5, increase along with all form pitch smaller that wired film F IL reaches the standard grade and the quantity of line on the film two sides, will increase complexity and the manufacturing cost of technology.
Summary of the invention
Technical matters
The invention provides a kind of film for test liquid crystal display (LCD) panel, be used for the proving installation of test LCD panel and the method for making described proving installation, described method can be simplified the expensive technology of the film (reversible film) that manufacturing can two-sided use, therefore reduces manufacturing cost.
Solution
The invention provides with a kind of proving installation in test liquid crystal display (LCD) panel, described proving installation comprises: film, described film is arranged to have many first lines and many second lines thereon, wherein said first line receives a plurality of test signals, and described second line and the described first line branch are arranged, and described second line will branch into n test signal (n is natural number) from the described test signal that described first line receives and the test signal that is branched will be sent to many input lines of the correspondence of display panels; Line connection unit, described line connection unit are arranged on the substrate and form and comprise that many metal line will be being sent to each self-corresponding described second line via the described test signal that described first line receives; And a plurality of projections (Bump), described projection is arranged to described first line is electrically connected to corresponding described metal wire with described second line.
Described first line and described second-line every can form at the first surface of described film.Can form first line with the quantity equal amount of described test signal, and second-line quantity can be described first-line quantity n doubly.Can form the metal wire with described first-line quantity equal amount.
Can be arranged to form for every of described metal wire and have the closed rectangular that four sides connect successively, each first line can be connected to a side of each self-corresponding metal wire, and each second line can be connected to another side of each self-corresponding metal wire.Described another side of described metal wire can be relative with a described side of described metal wire.
First metal wire corresponding with first test signal of described test signal can be positioned at outermost, other metal wires except described first metal wire can be positioned at the inboard of described first metal wire, and along with every the distance of described first metal wire to described other metal wires increases, the length sum of four sides of every of described other metal wires can reduce.
First metal wire corresponding with first test signal of described test signal can be positioned at the most inboard, other metal wires except described first metal wire can be positioned at the outside of described first metal wire, and along with every the distance of described first metal wire to described other metal wires increases, the length sum of four sides of every of described other metal wires can increase.Described first-line every can be connected to described another side.
Can be arranged to form the shape that a side has the rectangle of otch for every of described metal wire, described first line can be connected to a side of each self-corresponding described metal wire, and described second line can be connected to another side of each self-corresponding metal wire.
Can be arranged to form the shape that another side has the rectangle of otch for every of described metal wire.Described first-line every can be with respect to the test signal of correspondence and be branched into x bar (x is natural number).
Described line connection unit can also be arranged to comprise x secondary line linkage unit.
The described test signal of exporting respectively from described second line that is connected to described x secondary line linkage unit can be applied to a plurality of display panels.
The described test signal of exporting respectively from described second line that is connected to described x secondary line linkage unit can be applied to a display panels.The described test signal that receives from described first line can be for the six kinds of chrominance signals that comprise R, G, B, R`, G` and B` that drive display panels.Proving installation can comprise probe further, and the described test signal that is branched that described probe is arranged to transmit from described second line is electrically connected to the input line of the correspondence of display panels.Described second line can directly be connected to each self-corresponding input line of display panels.
The present invention also provides a kind of manufacturing to be used for the method for the proving installation of test fluid LCD panel, comprise: form many first lines at substrate, many second lines and many metal line, wherein said first line receives a plurality of test signals, described second line and the described first line branch are arranged, described second line will branch into n test signal (n is natural number) from the described test signal that described first line receives, and the test signal that is branched is sent to many input lines of the correspondence of LCD panel, and described metal wire is electrically connected to described first line and described second-line every via a plurality of projections; By applying insulating material formation insulation course at described substrate and described metal wire; Etch a plurality of pad zones at described insulation course, described whereby projection will engage with described metal wire; Form described projection at described pad zone; And on described film, described first line of described projection and each and described second line are engaged.
Other features of the present invention will be listed in the following description, will be partly clear by describing, and maybe can be by practice of the present invention be learned.
Beneficial effect of the present invention
According to according to the film, the proving installation that are used for test liquid crystal display (LCD) panel of exemplary embodiment of the present invention and the method for making described proving installation, can improve the wiring method (wiring method) of film, therefore simplify the technology of making film and reduce manufacturing cost.
Description of drawings
The accompanying drawing that comprises provides further understanding of the present invention and is merged in and forms the part of instructions for this reason.Described accompanying drawing is described embodiments of the invention, and plays the effect of explaining principle of the present invention with text description.
Figure l is the synoptic diagram of example of describing the proving installation that is used for test liquid crystal display (LCD) panel of prior art.
Fig. 2 is the synoptic diagram of describing the planimetric map of the described proving installation of Fig. 1.
Fig. 3 is the synoptic diagram of describing the proving installation that is used for test LCD panel of another prior art
Fig. 4 is the synoptic diagram of describing the planimetric map of proving installation shown in Figure 1.
Fig. 5 is the synoptic diagram of the line structure that forms on the film that is illustrated in for Fig. 3 and proving installation shown in Figure 4.
Fig. 6 is the synoptic diagram of describing the proving installation that is used for test LCD panel of first exemplary embodiment according to the present invention.
Fig. 7 is the synoptic diagram of describing in detail between line shown in Figure 6 and the metal wire that is connected.
Fig. 8 is the synoptic diagram of describing the proving installation TD that is used for test LCD panel of second exemplary embodiment according to the present invention.
Fig. 9 is the synoptic diagram of describing the proving installation TD that is used for test LCD panel of the 3rd exemplary embodiment according to the present invention.
Figure 10 is the synoptic diagram of describing the proving installation TD that is used for test LCD panel of the 4th exemplary embodiment according to the present invention.
Figure 11 is the synoptic diagram of describing the proving installation that is used for test LCD panel of the 5th exemplary embodiment according to the present invention.
Figure 12 is the synoptic diagram of describing the proving installation that is used for the test fluid LCD panel of the 6th exemplary embodiment according to the present invention.
Figure 13 describes the synoptic diagram to the partial sectional view of the proving installation that is used for test LCD panel of exemplary embodiment shown in Figure 12 according to Fig. 6.
Figure 14 illustrates description is used for the proving installation of test LCD panel according to the manufacturing of the exemplary embodiment of the present invention synoptic diagram of method.
Figure 15 is the synoptic diagram of describing according to the example of the syndeton between second line of the LCD panel of the exemplary embodiment of Fig. 6 to Figure 12 and proving installation.
Figure 16 is the synoptic diagram of describing another example of the syndeton between second line of display panels and display panels proving installation.
Embodiment
Followingly describe the present invention more fully with reference to accompanying drawing, accompanying drawing illustrates exemplary embodiment of the present invention.But the present invention can realize with many different forms, and should not be understood that the present invention is confined to the embodiment of the following stated.On the contrary, it is feasible open more thorough that these embodiment are provided, and scope of the present invention is fully conveyed to those skilled in the art.For the sake of clarity, in the accompanying drawings, turgidly presentation layer or the zone size or relative size.In the accompanying drawings, identical label is represented components identical.
Fig. 6 is the synoptic diagram of describing the proving installation that is used for test liquid crystal display (LCD) panel of first exemplary embodiment according to the present invention.
With reference to Fig. 6, proving installation (TD) can comprise many first line LIN1s, many second line LIN2s and a line connection unit CNLIN.The first line LINls receives a plurality of test signal XTET from flexible printed circuit board (FPC), and the second line LIN2s is sent to test signal XTET the input line of corresponding panel.Test signal XTET can have the analog voltage as in the prior art.
The first line LIN1s and the second line LIN2s every can be arranged on the first surface of film F IL.The first line LIN1s and the second line LIN2s are arranged apart from each other on film F IL.That is, the first line LIN1s and the second line LIN2s settle at film F IL, unless but line connection unit CNLIN will be electrically connected to each other, otherwise they do not electrically connect each other.
Line connection unit CNLIN comprises many metal line MLs that the first line LINls and the corresponding second line LIN2s are connected respectively.The second line LIN2s is electrically connected to the first corresponding line LIN1s, therefore can copy the test signal XTET that (branch) receive via the first line LINls and the test signal XTET that will be replicated (being branched) and be sent to liquid crystal display (LCD) panel (PAN).Therefore, can form the metal wire MLs with the number of the first line LIN1s, and the quantity of the second line LIN2s can be the first line LIN1s quantity n doubly, wherein n is natural number.
But for the convenience that Fig. 6 describes, the quantity of the second line LIN2s is the twice of the first line LINls quantity.In example shown in Figure 6, there are six first line LINls and flexible printed circuit board FPC will comprise that six kinds of chrominance signals of R, G, B, R`, G` and B` are applied to each first line LINls as test signal.Correspondingly, the six metal line MLs that comprise first to the 6th metal wire MLl, ML2, ML3, ML4, ML5 and ML6 can be arranged.But the quantity of circuit is not limited to above, can change the quantity of first line, second line and metal wire.
Metal wire MLs can be connected to each self-corresponding first and second line via projection BUM.For example, the first metal wire ML1 is connected with the 11 line LIN11 and the 21 line LIN21 via projection BUM, and wherein the 11 line LIN11 receives the first test signal XTET1 and the 21 line LIN21 is applied to LCD panel PAN with the first test signal XTET1.The second metal wire ML2 is connected with the tenth two wires LIN12 and the 20 two wires LIN22 via projection BUM, and wherein the tenth two wires LIN12 receives the second test signal XTET2 and the 20 two wires LIN22 is applied to LCD panel PAN with the second test signal XTET2.The 3rd metal wire ML3 is connected with the 13 line LIN13 and the 23 line LIN23 via projection BUM, and wherein the 13 line LIN13 receives the 3rd test signal XTET3 and the 23 line LIN23 is applied to LCD panel PAN with the 3rd test signal XTET3.In the same way, the 4th metal wire ML4 is connected with the 14 line LIN14 and the 24 line LIN24 via projection BUM, and wherein the 14 line LIN14 receives the 4th test signal XTET4 and the 24 line LIN24 is applied to LCD panel PAN with the 4th test signal XTET4.The 5th metal wire ML5 is connected with the 15 line LIN15 and the 25 line LIN25 via projection BUM, and wherein the 15 line LIN15 receives the 5th test signal XTET5 and the 25 line LIN25 is applied to LCD panel PAN with the 5th test signal XTET5.The 6th metal wire ML6 is connected with the 16 line LIN16 and the 26 line LIN26 via projection BUM, and wherein the 16 line LIN16 receives the 6th test signal XTET6 and the 26 line LIN26 is applied to LCD panel PAN with the 6th test signal XTET6.
At length, with reference to Fig. 7, described metal wire MLs does not electrically link to each other via insulation course ISO, and projection BUM contacts with each self-corresponding metal wire MLs, so projection BUM is with metal wire MLs and corresponding line electric connection.
As what in the semiconductor FAB of prior art, carry out, pile up technology (line stacking process) by hole technology (via process) and circuit and make every layer of multilayer that line is intersected with each other to be connected, do not need stacked multilayer by as mentioned above metal wire being connected with line, as shown in Figure 6 and Figure 7, the metal wire MLs that allows to be arranged on each projection below via projection be arranged on each projection above line LIN1s or LIN2s is intersected with each other is connected, therefore can make the TAB IC (film) for the LCD test, wherein input signal can be copied into be n a plurality of signals doubly of original input signal quantity to TAB IC (film), and export the signal that these are replicated.
Do not carry out the pre-service of semiconductor FAB in addition, only make line connection unit CNLIN by the mode of projection technology (bump process), described projection technology is the aftertreatment of semiconductor FAB, therefore can reduce manufacturing cost.
Further, if under the situation of the n that input signal is copied into original input signal quantity times of many a plurality of signals that are replicated, when when making the second line LIN2s, determining n value and the signal that many metal line MLs is replicated with many of enough coverings being set, need not repeatedly to carry out projection technology with manufacturing TAB IC.
Therefore, when making when signal replication become the new TAB IC of original input signal quantity n signal doubly, only need carry out the technology of the assembling second line LIN2s and line connection unit CNLIN, the result is used in and makes time and the cost that extra line connection unit CNLIN spends and sharply reduce.
Refer again to Fig. 6, every metal line MLs can be arranged to form the rectangle of the closure of the four side with one in company.In this case, every first line LINls can be connected to a side of the metal wire of every correspondence, and every second line LIN2s can be connected to another side of corresponding metal wire.Another side of metal wire can be relative with a side of metal wire.For example, in Fig. 6, the first metal wire ML1 can be arranged to form the rectangle of the closure of four sides 1 to 4 with one in company, and the first line LIN1 can be connected to the side 1 of the first metal wire MLl, and the second line LIN21 and LIN22 can be connected to another side 3 of the first metal wire MLl.
In Fig. 6, the first metal wire ML1 is positioned at the outermost of these metal wires, and it is inboard and near the first metal wire MLl that the second metal wire ML2 is arranged on the first metal wire MLl, and it is inboard and near the second metal wire ML2 that the 3rd metal wire ML3 is arranged on the second metal wire ML2.In an identical manner, it is inboard and near the 3rd metal wire ML3 that the 4th metal wire ML4 is arranged on the 3rd metal wire ML3, it is inboard and near the 4th metal wire ML4 that the 5th metal wire ML5 is arranged on the 4th metal wire ML4, and the 6th metal wire ML6 is arranged on the most inboard of these metal wires MLs.
But the arrangement of metal wire MLs is not limited to above-mentioned example.With reference to the Fig. 8 that describes the proving installation TD that is used for test LCD panel of second exemplary embodiment according to the present invention, be connected to the 11 line LINll and can be positioned at the most inboardly with the first metal wire MLl that receives the first test signal XTETl, can be positioned at outermost and be connected to the 16 line LIN16 with the 6th metal wire ML6 that receives the 6th test signal XTET6.
In example shown in Figure 6, every metal line MLs is described to be arranged to form the rectangle of a closure, but the shape of metal wire is not limited thereto.With reference to the Fig. 9 that describes the proving installation TD that is used for test LCD panel of the 3rd exemplary embodiment according to the present invention, every metal line MLs is not arranged to form closed rectangle, but a side has the rectangular-shaped shape of otch.Especially, in metal wire MLs shown in Figure 9, consider the situation of noise and so on, have otch with the side opposed side edges that is connected with the first line LIN1s.
In addition, with reference to the Figure 10 that describes the proving installation TD that is used for test LCD panel of the 4th exemplary embodiment according to the present invention, every metal line MLs can be arranged to form closed circle.
Figure 11 is the figure that describes the proving installation that is used for test LCD panel of the 5th exemplary embodiment according to the present invention.With reference to Figure 11, proving installation TD has every metal wire of being arranged to form closed rectangle.Every metal line all has two opposed side edges that are connected to the first line LIN1s.For example, the 11 line LIN11 side 1 that is connected to the first metal wire ML1 and another side 2 (with reference to example shown in Figure 6 in the identical label of the side of the first metal wire ML1).Proving installation TD as shown in figure 11, when metal wire MLs and the first line LIN1s are connected to each other, can avoid owing to waiting to be sent to the connect second-line test signal and the generation of waiting to be sent to the relative difference that causes away from the transmitting range between the second-line test signal of the first line LIN1s (on the metal wire away from the first line LIN1s) of nearly first line LIN1s (metal wire is near the first line LIN1s).
Figure 12 is the figure that describes the proving installation that is used for test LCD panel of the 6th exemplary embodiment according to the present invention.With reference to Figure 12, proving installation TD can comprise many first line LIN1As and LIN1Bs, will branch into x signal from each test signal XTET of flexible printed circuit board FPC and the signal that these are branched will be connected to metal wire MLs, wherein x is natural number, and x is 2 in the described example of Figure 12.Line connection unit CNLIN shown in Figure 12 can comprise x secondary line linkage unit (among Figure 12 the first time line connection unit CNLINl and line connection unit CNLIN2 for the second time), first line LINlAs and the LIN1Bs that is branched with reception.
In Figure 12, the test signal that is connected to the second line LIN2s output of secondary line linkage unit CNLINl and CNLIN2 certainly is transferred into any of two LCD panel PAN that separate.In this case, the LCD panel PAN of a plurality of separation can be the part of single LCD panel or independent LCD panel.
The configuration of each secondary line linkage unit and operation can be identical with the described line connection unit of Fig. 6 to 11, therefore will it does not repeated detailed description.
Figure 13 describes the figure to the cut-away section view of the proving installation that is used for test LCD panel of exemplary embodiment shown in Figure 12 according to Fig. 6.
With reference to Figure 13, as mentioned above, the metal wire MLs in driver element DRV is arranged on the substrate SUB, and has the insulation course ISO that is arranged on therebetween.Metal wire MLs is connected to the first line LINls and the second line LIN2s via projection BUM, and wherein the first line LINls and the second line LIN2s arrange at the first surface of film F IL.
Can make as shown in figure 13 driver element DRV by technology shown in Figure 14.
In the process of making the proving installation TD that is used for test LCD panel according to an exemplary embodiment of the present invention, shown in Figure 14 (a), metal wire MLs forms at substrate SUB.Then, shown in Figure 14 (b), insulating material is applied on the substrate SUB that is formed with metal wire MLs on it, to make insulation course ISO.The described insulation course of etching, contacts with metal wire MLs via described weld pad projection BUM shown in Figure 14 (c) to form weld pad.Shown in Figure 14 (d), projection BUM forms in each weld pad PAD afterwards, and shown in Figure 14 (e), projection BUM with its on form wired LIN1 and engage with the film F IL of LIN2.
In the TAB of prior art IC manufacture method, manufacturing cost increases along with the quantity of the photomask that adopts.According to the method for the manufacturing driver element DRV of exemplary embodiment of the present invention, except being used for only using three photomasks film forms the photomask of line LIN1 and LIN2: one is used for forming metal wire MLs at substrate SUB; Another is used for the etching pad zone; Another is used to form projection BUM again.Therefore can also can reduce manufacturing cost by simplified manufacturing technique.
Figure 15 is the figure that describes according to the example of the syndeton between second line of the LCD panel of the exemplary embodiment of Fig. 6 to Figure 12 and proving installation.Figure 16 is the figure that describes another example of the syndeton between second line of display panels and display panels proving installation.
With reference to Figure 15, via the contact device such as probe PRB, the second line LIN2s of proving installation TD is electrically connected to the input line PILIN of LCD panel PAN.On the contrary, in the described example of Figure 16, the second line LIN2s on the film F IL of proving installation TD directly is electrically connected to the input line PILIN of LCD panel PAN, and does not have the extra contact device such as the probe PRB of Figure 15.Although describe in Figure 15 and 16, LCD panel PAN can comprise be used to the weld pad that sends from the test signal in input line PILIN to be applied of the second line LIN2s.In addition, although the example shown in Figure 15 and 16 is described to be applied to the line connection unit CNLIN of the example of Fig. 6, described example also can be applicable to the line connection unit (CNLIN) in the described example of Fig. 8 to 12.
It is evident that for those skilled in the art, under the situation that does not break away from the spirit and scope of the present invention, can make various modifications and variations to the present invention.Therefore, the invention is intended to cover these modifications and variations, if they fall into the protection domain of appended claims and equivalent thereof.
Claims (19)
1. proving installation that is used for the test fluid LCD panel, described proving installation comprises:
Film, described film is arranged to have many first lines and many second lines thereon, wherein said first line receives a plurality of test signals, and described second line and the described first line branch are arranged, and described second line will branch into n test signal (n is natural number) from the described test signal that described first line receives and the test signal that is branched will be sent to many input lines of the correspondence of display panels;
Line connection unit, described line connection unit are arranged on the substrate and form and comprise that many metal line will be being sent to each self-corresponding described second line via the described test signal that described first line receives; And
A plurality of projections, described projection are arranged to described first line is electrically connected to corresponding described metal wire with described second line.
2. proving installation as claimed in claim 1, wherein said first line and described second-line every first surface at described film form.
3. proving installation as claimed in claim 1 wherein forms first line with the quantity equal amount of described test signal, and second-line quantity be described first-line quantity n doubly.
4. proving installation as claimed in claim 1 wherein forms the metal wire with described first-line quantity equal amount.
5. proving installation as claimed in claim 1, be arranged to form for every of wherein said metal wire and have the closed rectangular that four sides connect successively, each first line is connected to a side of each self-corresponding metal wire, and each second line is connected to another side of each self-corresponding metal wire.
6. proving installation as claimed in claim 5, described another side of wherein said metal wire is relative with a described side of described metal wire.
7. proving installation as claimed in claim 5, first wherein corresponding with first test signal of the described test signal metal wire is positioned at outermost, other metal wires except described first metal wire are positioned at the inboard of described first metal wire, and along with the increase of described first metal wire to the distance of described other every metal line, the length sum of four sides of described other every metal line reduces.
8. proving installation as claimed in claim 5, first wherein corresponding with first test signal of the described test signal metal wire is positioned at the most inboard, other metal wires except described first metal wire are positioned at the outside of described first metal wire, and along with the increase of described first metal wire to the distance of described other every metal line, the length sum of four sides of described other every metal line increases.
9. proving installation as claimed in claim 1, wherein said first-line every is connected to described another side.
10. proving installation as claimed in claim 1, be arranged to form the shape that a side has the rectangle of otch for every of wherein said metal wire, described first line is connected to a side of each self-corresponding described metal wire, and described second line is connected to another side of each self-corresponding metal wire.
11. proving installation as claimed in claim 10 is arranged to form the shape that another side has the rectangle of otch for every of wherein said metal wire.
12. proving installation as claimed in claim 1, wherein said first-line every with respect to the test signal of correspondence and be branched into x bar (x is natural number).
13. proving installation as claimed in claim 12, wherein said line connection unit also are arranged to comprise x secondary line linkage unit.
14. proving installation as claimed in claim 12, wherein the described test signal of exporting respectively from described second line that is connected to described x secondary line linkage unit is applied to a plurality of display panels.
15. proving installation as claimed in claim 12, wherein the described test signal of exporting respectively from described second line that is connected to described x secondary line linkage unit is applied to a display panels.
16. proving installation as claimed in claim 1, wherein the described test signal that receives from described first line is for the six kinds of chrominance signals that comprise R, G, B, R`, G` and B` that drive display panels.
17. proving installation as claimed in claim 1 also comprises:
The described test signal that is branched that a plurality of probes, described probe are arranged to transmit from described second line is electrically connected to the input line of the correspondence of display panels.
18. proving installation as claimed in claim 1, wherein said second line directly are connected to each self-corresponding input line of display panels.
19. a manufacturing is used for the method for the proving installation of test fluid LCD panel, described method comprises:
Form many first lines, many second lines and many metal line at substrate, wherein said first line receives a plurality of test signals, described second line and the described first line branch are arranged, described second line will branch into n test signal (n is natural number) from the described test signal that described first line receives, and the test signal that is branched is sent to many input lines of the correspondence of display panels, and described metal wire is electrically connected in described first line and described second line every via a plurality of projections;
By applying insulating material formation insulation course at described substrate and described metal wire;
Etch a plurality of pad zones at described insulation course, described whereby projection will engage with described metal wire;
Form described projection at described pad zone; And
On described film, described first line of described projection and each bar and described second line are engaged.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2010-0103869 | 2010-10-25 | ||
| KR20100103869A KR101256642B1 (en) | 2010-10-25 | 2010-10-25 | Film for testing lcd panel, test device for testing lcd panel and method for manufacturing test device for testing lcd panel |
| PCT/KR2011/007803 WO2012057468A2 (en) | 2010-10-25 | 2011-10-19 | Film for testing lcd panel, test device for testing lcd panel and method for manufacturing test device for testing lcd panel |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103189790A true CN103189790A (en) | 2013-07-03 |
| CN103189790B CN103189790B (en) | 2016-04-20 |
Family
ID=45994512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201180051554.9A Expired - Fee Related CN103189790B (en) | 2010-10-25 | 2011-10-19 | For the manufacture method of the film and proving installation and this device of testing LCD |
Country Status (4)
| Country | Link |
|---|---|
| KR (1) | KR101256642B1 (en) |
| CN (1) | CN103189790B (en) |
| TW (1) | TW201227054A (en) |
| WO (1) | WO2012057468A2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101586334B1 (en) | 2014-09-26 | 2016-01-20 | 주식회사 디에스케이 | Inspection apparatus for panel |
| KR20190091802A (en) | 2018-01-29 | 2019-08-07 | 주식회사 디에스케이 | Inspection apparatus for panel |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030023662A (en) * | 2003-02-25 | 2003-03-19 | 프롬써어티 주식회사 | Needle assembly in probe device for testing liquid crystal display panel and method for manufacturing thereof |
| US20040090585A1 (en) * | 2002-11-04 | 2004-05-13 | Kim Dae You | Apparatus for inspecting liquid crystal panel |
| KR20060029712A (en) * | 2004-08-04 | 2006-04-07 | 주식회사 코디에스 | Probe unit for inspection of flat display panels |
| KR100974535B1 (en) * | 2010-03-23 | 2010-08-10 | (주)유비프리시젼 | Film type probe contactor and for manufacturing thereof |
| CN102859371A (en) * | 2010-04-14 | 2013-01-02 | 普罗-2000有限公司 | Probe sheet for LCD panel inspection, a probe unit comprising the probe sheet, and a method of manufacturing the probe sheet for LCD panel inspection |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20120006335A (en) * | 2010-07-12 | 2012-01-18 | 엘지디스플레이 주식회사 | Driving chip and test board of display device |
-
2010
- 2010-10-25 KR KR20100103869A patent/KR101256642B1/en active IP Right Review Request
-
2011
- 2011-10-19 CN CN201180051554.9A patent/CN103189790B/en not_active Expired - Fee Related
- 2011-10-19 WO PCT/KR2011/007803 patent/WO2012057468A2/en active Application Filing
- 2011-10-20 TW TW100138116A patent/TW201227054A/en unknown
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040090585A1 (en) * | 2002-11-04 | 2004-05-13 | Kim Dae You | Apparatus for inspecting liquid crystal panel |
| KR20030023662A (en) * | 2003-02-25 | 2003-03-19 | 프롬써어티 주식회사 | Needle assembly in probe device for testing liquid crystal display panel and method for manufacturing thereof |
| KR20060029712A (en) * | 2004-08-04 | 2006-04-07 | 주식회사 코디에스 | Probe unit for inspection of flat display panels |
| KR100974535B1 (en) * | 2010-03-23 | 2010-08-10 | (주)유비프리시젼 | Film type probe contactor and for manufacturing thereof |
| CN102859371A (en) * | 2010-04-14 | 2013-01-02 | 普罗-2000有限公司 | Probe sheet for LCD panel inspection, a probe unit comprising the probe sheet, and a method of manufacturing the probe sheet for LCD panel inspection |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012057468A2 (en) | 2012-05-03 |
| CN103189790B (en) | 2016-04-20 |
| WO2012057468A3 (en) | 2012-06-21 |
| TW201227054A (en) | 2012-07-01 |
| KR101256642B1 (en) | 2013-04-22 |
| KR20120048048A (en) | 2012-05-15 |
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