KR100586007B1 - Probe Unit for inspection of Flat Display Panels - Google Patents

Probe Unit for inspection of Flat Display Panels Download PDF

Info

Publication number
KR100586007B1
KR100586007B1 KR1020040061519A KR20040061519A KR100586007B1 KR 100586007 B1 KR100586007 B1 KR 100586007B1 KR 1020040061519 A KR1020040061519 A KR 1020040061519A KR 20040061519 A KR20040061519 A KR 20040061519A KR 100586007 B1 KR100586007 B1 KR 100586007B1
Authority
KR
South Korea
Prior art keywords
lines
signal
probe
signal lines
green
Prior art date
Application number
KR1020040061519A
Other languages
Korean (ko)
Other versions
KR20060029712A (en
Inventor
안재일
Original Assignee
주식회사 코디에스
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 코디에스 filed Critical 주식회사 코디에스
Priority to KR1020040061519A priority Critical patent/KR100586007B1/en
Publication of KR20060029712A publication Critical patent/KR20060029712A/en
Application granted granted Critical
Publication of KR100586007B1 publication Critical patent/KR100586007B1/en

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Liquid Crystal (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

본 발명은 TFT-LCD패널과 같은 평판형 디스플레이패널을 검사하는데 사용되는 프로브유니트에 관한 것이다. 본 발명은 프로브장치의 매니퓰레이터(1)에 고정되는 프로브블록(3)과, 상기 프로브블록(3)의 저면에 접합되어 피검사체의 패턴과 접촉하는 복수개의 탐침부재(5)를 필름(6)상에 고정한 프로브시트(10)와, 적색신호선(R1...Rn),녹색 신호선(G1...Gn),청색 신호선(B1...Bn)들을 교대로 반복하여 일정한 간격으로 필름(6)상에 고착하고, 상기 복수개의 신호선(R1...Rn)(G1...Gn)(B1...Bn)들의 선단이 각각에 대응하는 상기 프로브시트(10)의 각 탐침부재(5)에 연결접속한 FPC접속시트(20)로 이루어지고, 상기 FPC접속시트(20)의 복수개의 적색신호선(R1...Rn)들은 가로질러 배치되는 적색신호 연결선(22a,22b)에 의해 서로 접속되어 쇼팅되고, 복수개의 녹색신호선(G1...Gn)들은 가로지르는 녹색신호 연결선(24a,24b)에 의해 서로 접속되어 쇼팅되며, 복수개의 청색신호선(B1...Bn)들은 청색신호 연결선(26a,26b)으로 서로 접속되어 쇼팅되고, 상기 각 신호연결선(22a,22b)(24a,24b)(26a,26b)들은 직접 신호발생기(30)에 연결된다. The present invention relates to a probe unit used to inspect a flat panel display panel such as a TFT-LCD panel. According to the present invention, a probe block (3) fixed to a manipulator (1) of a probe device and a plurality of probe members (5) bonded to a bottom surface of the probe block (3) and in contact with a pattern of a subject under test (6) The probe sheet 10 fixed on the substrate, the red signal lines (R1 ... Rn), the green signal lines (G1 ... Gn), and the blue signal lines (B1 ... Bn) are alternately repeated, and the film (6) at regular intervals. Each probe member 5 of the probe sheet 10 is fixed on the probe sheet 10 and the tip of each of the plurality of signal lines R1 ... Rn (G1 ... Gn) (B1 ... Bn) corresponds to each other. ) And a plurality of red signal lines R1 ... Rn of the FPC connection sheet 20 are connected to each other by red signal connection lines 22a and 22b disposed across. The plurality of green signal lines G1 ... Gn are connected and shorted to each other by the green signal connecting lines 24a and 24b crossing each other, and the plurality of blue signal lines B1 ... Bn are blue No. shorting and are connected to one another by connection lines (26a, 26b), each of the signal connecting line (22a, 22b) (24a, 24b) (26a, 26b) are connected directly to the signal generator 30.

평판형 디스플레이패널, 패턴검사, 쇼팅바, 비쥬얼검사, 신호연결선Flat Panel Display, Pattern Inspection, Shorting Bar, Visual Inspection, Signal Connection Line

Description

평판형 디스플레이패널 검사용 프로브유니트{ Probe Unit for inspection of Flat Display Panels}Probe Unit for inspection of Flat Display Panels

도 1은 본 발명에 따른 프로브유니트의 개략적인 구성도,1 is a schematic configuration diagram of a probe unit according to the present invention;

도 2는 본 발명의 프로브유니트의 저면도,2 is a bottom view of the probe unit of the present invention;

도 3은 본 발명의 프로브유니트를 구성하는 프로브시트의 사시도,3 is a perspective view of a probe sheet constituting the probe unit of the present invention;

도 4는 도 2의 "A"부분 확대상세도,4 is an enlarged detail "A" part of FIG.

도 5는 도 2의 "B"부분 확대상세도이다.5 is an enlarged detail "B" of FIG.

※ 도면의 주요부분에 대한 부호의 설명※※ Explanation of code about main part of drawing ※

1: 매니퓰레이터 3: 프로브블록1: Manipulator 3: Probe Block

P: 피검사체 5: 탐침부재P: Subject 5: Probe member

6: 필름 7: 배선6: film 7: wiring

10: 프로브시트 20: FPC접속시트10: probe sheet 20: FPC connection sheet

R1,...Rn: 적색신호선R1, ... Rn: Red signal line

G1,..,Gn: 녹색신호선 B1,..,Bn: 청색신호선G1, .., Gn: Green signal line B1, .., Bn: Blue signal line

22a,22b: 적색신호 연결선 24a,24b: 녹색신호 연결선22a, 22b: red signal connection line 24a, 24b: green signal connection line

26a,26b: 청색신호 연결선 W1,..,Wn: 와이어26a, 26b: Blue signal connection line W1, .., Wn: Wire

28: 전원입력선28: power input line

본 발명은 평판형 디스플레이패널 검사용 프로브유니트에 관한 것으로, 특히 TFT-LCD의 패턴을 검사하는데 사용되는 프로브유니트에 관한 것이다.The present invention relates to a probe unit for inspecting a flat panel display panel, and more particularly, to a probe unit used for inspecting a pattern of a TFT-LCD.

평판형 통상 TFT-LCD 패널(이하, 'LCD'라 한다)에 구동IC를 설치하기 전 LCD 패널의 픽셀의 상태를 검사하는 방법에는 쇼팅바를 이용한 비쥬얼테스트방식과, 그로스테스트방식이 있다. As a method of inspecting the state of the pixels of the LCD panel before installing the driver IC in a flat panel TFT-LCD panel (hereinafter referred to as 'LCD'), there are a visual test method using a shorting bar and a gross test method.

쇼팅바를 이용한 비쥬얼 테스트방식은 쇼팅바 자체의 신뢰성이 낮아서 라인결함이 발생활 확률이 높고, LCD패널의 배선의 저항증가로 인하여 균일성이 낮은 단점이 있다. 한편, 그로스테스트방식은 모듈에서 사용하는 신호와 동일한 신호를 인가하기 위하여 LCD패널의 패드에 일대일로 접촉하여 원하는 패턴을 구현할 수 있지만, 완전 접촉방식에 의한 개별 신호를 인가하여 모듈과 동일한 시인성을 확보할 수 있으나, 접촉상태가 불안정하므로 라인결함과 프로빙 누락중 어느 것에 의한 불량인지의 판별이 불명확하여 검사신뢰성이 낮은 단점이 있다. The visual test method using the shorting bar has a disadvantage in that the shorting bar itself has a low reliability and a high probability of occurrence of line defects and a low uniformity due to an increase in resistance of the LCD panel wiring. On the other hand, the gross test method can implement a desired pattern by one-to-one contact with the pad of the LCD panel in order to apply the same signal as the signal used in the module, but secures the same visibility as the module by applying individual signals by the full contact method. However, since the contact state is unstable, it is unclear whether the line defect and the probing omission is unclear, which leads to a disadvantage of low inspection reliability.

이에 본 발명은 상기한 종래 LCD패널의 검사용 프로브유니트가 가진 단점을 해소하기 위하여 고안된 것으로, 구동IC없이 신호입력선을 쇼팅시킨 배선을 곧바로 신호발생기에 연결함으로써 검사신뢰성을 높일 수 있는 프로브유니트를 제공함에 목적이 있다. Accordingly, the present invention is designed to solve the disadvantages of the conventional probe panel for inspection of the conventional LCD panel, a probe unit that can increase the test reliability by connecting the signal input line short-circuit directly to the signal generator without a drive IC. The purpose is to provide.

상기 목적을 달성하기 위한 본 발명은 프로브장치의 매니퓰레이터에 고정되는 프로브블록과, 상기 프로브블록의 저면에 접합되어 피검사체의 패턴과 접촉하는 복수개의 탐침부재를 필름상에 고정한 프로브시트와, 적색신호선,녹색 신호선,청색 신호선들을 교대로 반복하여 일정한 간격으로 필름상에 고착하고, 상기 복수개의 신호선들의 선단이 각각에 대응하는 상기 프로브시트의 각 탐침부재에 연결접속한 FPC접속시트를 포함한 평판형 디스플레이패널 검사용 프로브유니트에 있어서, The present invention for achieving the above object is a probe block fixed to the manipulator of the probe device, a probe sheet bonded to the bottom surface of the probe block and a plurality of probe members fixed on the film contacting the pattern of the test object, and the red signal line And repeating the green signal lines and the blue signal lines alternately to be fixed on the film at regular intervals, and the flat panel display including an FPC connection sheet in which the ends of the plurality of signal lines are connected to the respective probe members of the probe sheet. In the probe unit for panel inspection,

상기 접속시트의 신호배선은 적색신호선,녹색 신호선,청색 신호선들이 교대로 반복하여 배열되고, 상기 적색신호선, 녹색 신호선, 청색 신호선들은 각각 동일한 색상들끼리 쇼팅신호선으로 접속되어 상기 신호발생기에 직접 연결된 구조에 특징이 있다. The signal line of the connection sheet has a structure in which red signal lines, green signal lines, and blue signal lines are alternately arranged alternately, and the red signal lines, green signal lines, and blue signal lines are connected to short-circuit signal lines with the same colors, respectively, and are directly connected to the signal generator. It is characterized by.

상기한 바와 같이 구성된 본 발명에 의하면, 자체에 구비된 신호연결선들에 의해 쇼팅시키는 기능을 하게 되므로 피검사체에 쇼팅바를 마련하고 쇼팅바를 통하여 검사하였던 종전의 검사방식이 가진 문제점을 해소하였고, 아울러 피검사체의 배선이 증가하더라도 얼룩현상이 일어나지 않게 된다.According to the present invention configured as described above, the short circuit is provided by the signal connection lines provided therein, so that a shorting bar is provided on the inspected object and the conventional test method that has been inspected through the shorting bar solves a problem. Staining does not occur even if the wiring of the body increases.

또한 본 발명의 프로브유니트는 구동IC를 사용하지 않고 프로브유니트 자체에서 신호선들을 신호연결선으로 연결하여 직접 신호발생기에 접속하므로 입력전압을 자유롭게 조절할 수 있는 장점이 있다. In addition, the probe unit of the present invention has an advantage that the input voltage can be freely adjusted because the probe unit is directly connected to the signal generator by connecting the signal lines to the signal connection line without using the driving IC.

이러한 본 발명의 프로브유니트는 무인 자동 시인검사기에 적용할 수 있어 검사의 신뢰성을 높이고 검사효율을 향상시킬 수 있다. The probe unit of the present invention can be applied to an unmanned automatic visual inspection machine can increase the reliability of the inspection and improve the inspection efficiency.

이하, 본 발명에 따른 실시예를 첨부도면에 따라 상세히 설명한다. Hereinafter, embodiments according to the present invention will be described in detail according to the accompanying drawings.

도 1은 본 발명에 따른 프로브유니트의 개략적인 구성도이고, 도 2는 본 발명에 따른 프로브유니트의 저면도이다. 본 발명에 따른 프로브유니트는 도 1 및 도 2에 도시된 바와 같이, 프로브장치의 매니퓰레이터(1)에 고정되는 프로브블록(3)과, 상기 프로브블록(3)의 저면에 접합되어 평판형 디스플레이 패널(P)(이하, '피검사체'라 한다)의 패턴과 접촉하는 복수개의 탐침부재(5)를 필름(6)상에 고정한 프로브시트(10)와, 필름상에 적색신호선(R1...Rn),녹색 신호선(G1...Gn),청색 신호선(B1...Bn)들이 교대로 반복하여 일정한 간격으로 고착되고, 이들 복수개의 신호선(R1-n,G1-n,B1-n)들의 선단을 각각 대응하는 상기 프로브시트(10)의 각 탐침부재(5)에 연결접속한 FPC접속시트(20)로 구성된다. 1 is a schematic configuration diagram of a probe unit according to the present invention, Figure 2 is a bottom view of the probe unit according to the present invention. 1 and 2, the probe unit according to the present invention is bonded to the probe block (3) fixed to the manipulator (1) of the probe device, the bottom surface of the probe block (3) flat panel display panel (P) (hereinafter, referred to as 'inspection') a plurality of probe members (5) in contact with the pattern on the film 6 and the red signal line (R1 ... Rn), green signal lines (G1 ... Gn), and blue signal lines (B1 ... Bn) are alternately repeatedly fixed at regular intervals, and the plurality of signal lines (R1-n, G1-n, B1-n) It is composed of FPC connection sheet 20 is connected to each of the probe member 5 of the probe sheet 10 corresponding to the front end of these.

상기 프로브시트(10)는 도 3에 도시된 바와 같이, 폭방향을 따라 피검사체의 배선과 동일한 간격으로 배치되는 복수개의 탐침부재(5)와, 상기 각 탐침부재(5)마다 연결되어 탐침부재(5)에서 탐침한 신호를 전달하는 배선(7)이 폴리아미드와 같은 절연성 필름(6)에 고착된 구조로 되어 있다. As illustrated in FIG. 3, the probe sheet 10 includes a plurality of probe members 5 disposed at the same interval as the wiring of the test object along the width direction, and connected to each probe member 5. The wiring 7 which transmits the signal probed in (5) has the structure fixed to the insulating film 6 like polyamide.

도 4 및 도 5에 도시된 바와 같이, 상기 FPC접속시트(20)에서 복수개의 적색신호선(R1...Rn)들은 가로질러 배치되는 적색신호 연결선(22a,22b)에 의해 서로 접속되어 쇼팅되고, 복수개의 녹색신호선(G1...Gn)들은 가로지르는 녹색신호 연결선 (24a,24b)에 의해 서로 접속되어 쇼팅되며, 복수개의 청색신호선(B1...Bn)들은 청색신호 연결선(26a,26b)으로 서로 접속되어 쇼팅되어 있다. As shown in FIGS. 4 and 5, in the FPC connection sheet 20, the plurality of red signal lines R1... Rn are connected to each other and shorted by the red signal connecting lines 22a and 22b disposed across them. The plurality of green signal lines G1 ... Gn are shorted by being connected to each other by the crossing green signal connection lines 24a and 24b, and the plurality of blue signal lines B1 ... Bn are blue signal connection lines 26a and 26b. Are connected to each other and shorted.

상기 적색신호 연결선(22a,22b), 녹색신호 연결선(24a,24b), 청색신호 연결선(26a,26b)들은 연장되어 프로브장치의 신호발생기(30)에 연결된다. 상기 적색신호 연결선(22a,22b)은 홀수열의 적색신호선(R1,R3,...,R2n-1)들을 한꺼번에 묶은 제1적색신호 연결선(22a)과, 짝수열의 적색신호선(R2,R4,...,R2n)들을 한꺼번에 연결접속한 제2적색신호 연결선(22b)으로 구성되고, 상기 녹색신호 연결선(24a,24b)은 홀수열의 녹색신호선(G1,G3,...,G2n-1)들을 한꺼번에 묶은 제1녹색신호 연결선(24a)과, 짝수열의 녹색신호선(G2,G4,...,G2n)들을 한꺼번에 연결접속한 제2녹색신호 연결선(24b)으로 구성되며, 상기 청색신호 연결선(26a,26b)은 홀수열의 청색신호선(B1,B3,...,B2n-1)들을 한꺼번에 묶은 제1청색신호 연결선(26a)과, 짝수열의 녹색신호선(B2,B4,...,B2n)들을 한꺼번에 연결접속한 제2청색신호 연결선(26b)으로 구성된다. The red signal connecting lines 22a and 22b, the green signal connecting lines 24a and 24b, and the blue signal connecting lines 26a and 26b are extended to be connected to the signal generator 30 of the probe device. The red signal connecting lines 22a and 22b include a first red signal connecting line 22a in which odd number of red signal lines R1, R3, ..., R2n-1 are bundled together, and an even number of red signal lines R2, R4,. And second red signal connecting lines 22b connecting R2n at a time, and the green signal connecting lines 24a and 24b connect odd-numbered green signal lines G1, G3, ..., G2n-1. A first green signal connecting line 24a bundled together and a second green signal connecting line 24b connecting the even-numbered green signal lines G2, G4, ..., G2n at once, and the blue signal connecting line 26a. (26b) shows the first blue signal connecting line (26a) which bundles the odd number of blue signal lines (B1, B3, ..., B2n-1) and the even number of green signal lines (B2, B4, ..., B2n). It consists of the 2nd blue signal connection line 26b connected at the same time.

그리고 상기 신호 연결선(22a,22b)(24a,24b)(26a,26b)들의 선단들은 연장되어 상기 FPC접속시트(20)의 선단에서 적색,녹색, 청색의 순서로 반복배치되어 고정되고, 이들 각 신호연결선(22a,22b)(24a,24b)(26a,26b)들은 각각 와이어(W1,..,Wn)를 통하여 신호발생기(30)에 연결되어 신호발생기(30)와 피검사체의 배선 사이에 적색, 녹색, 청색의 검사신호를 상호 전달하게 되는 것이다. The ends of the signal connection lines 22a, 22b, 24a, 24b, 26a, and 26b are extended to be repeatedly arranged in the order of red, green, and blue at the ends of the FPC connection sheet 20, and fixed. The signal connection lines 22a, 22b, 24a, 24b, 26a, and 26b are connected to the signal generator 30 through wires W1, ..., Wn, respectively, between the signal generator 30 and the wiring of the object under test. The red, green, and blue test signals are transmitted to each other.

설명하지 않은 도면부호 28은 전원입력선이다. Reference numeral 28, which has not been described, is a power input line.

상기한 바와 같은 구성의 프로브 유니트는 자체에 구비된 신호연결선들에 의해 쇼팅시키는 기능을 하게 되므로 피검사체에 쇼팅바를 마련하고 쇼팅바를 통하여 검사하였던 종전의 검사방식이 가진 문제점을 해소하였고, 아울러 피검사체의 배선이 증가하더라도 얼룩현상이 일어나지 않게 된다. The probe unit having the configuration as described above has a function of shorting by the signal connection lines provided therein, thus eliminating the problem of the conventional inspection method provided with the shorting bar on the inspected object and inspected through the shorting bar. Even if the wiring is increased, staining does not occur.

또한 본 발명의 프로브유니트는 구동IC를 사용하지 않고 프로브유니트 자체에서 신호선들을 신호연결선으로 연결하여 직접 신호발생기에 접속하므로 입력전압을 자유롭게 조절할 수 있는 장점이 있다. In addition, the probe unit of the present invention has an advantage that the input voltage can be freely adjusted because the probe unit is directly connected to the signal generator by connecting the signal lines to the signal connection line without using the driving IC.

이러한 본 발명의 프로브유니트는 무인 자동 시인검사기에 적용할 수 있어 검사의 신뢰성을 높이고 검사효율을 향상시킬 수 있다. The probe unit of the present invention can be applied to an unmanned automatic visual inspection machine can increase the reliability of the inspection and improve the inspection efficiency.

Claims (3)

삭제delete 프로브장치의 매니퓰레이터(1)에 고정되는 프로브블록(3)과, 상기 프로브블록(3)의 저면에 접합되어 피검사체의 패턴과 접촉하는 복수개의 탐침부재(5)를 필름(6)상에 고정한 프로브시트(10)와, 적색신호선(R1...Rn),녹색 신호선(G1...Gn),청색 신호선(B1...Bn)들을 교대로 반복하여 일정한 간격으로 필름(6)상에 고착하고, 상기 복수개의 신호선(R1...Rn)(G1...Gn)(B1...Bn)들의 선단이 각각에 대응하는 상기 프로브시트(10)의 각 탐침부재(5)에 연결접속한 FPC접속시트(20)를 포함한 평판형 디스플레이패널 검사용 프로브유니트에 있어서, The probe block 3 fixed to the manipulator 1 of the probe device and the plurality of probe members 5 bonded to the bottom surface of the probe block 3 and in contact with the pattern of the object under test are fixed on the film 6. The probe sheet 10, the red signal lines R1 ... Rn, the green signal lines G1 ... Gn, and the blue signal lines B1 ... Bn are alternately repeated on the film 6 at regular intervals. A plurality of signal lines R1 ... Rn (G1 ... Gn) (B1 ... Bn) are fixed to each probe member 5 of the corresponding probe sheet 10. In the probe unit for inspecting a flat panel display panel including the connected FPC connection sheet 20, 상기 FPC접속시트(20)의 복수개의 적색신호선(R1...Rn)들은 가로질러 배치되는 적색신호 연결선(22a,22b)에 의해 서로 접속되어 쇼팅되고, 복수개의 녹색신호선(G1...Gn)들은 가로지르는 녹색신호 연결선(24a,24b)에 의해 서로 접속되어 쇼팅되며, 복수개의 청색신호선(B1...Bn)들은 청색신호 연결선(26a,26b)으로 서로 접속되어 쇼팅되고, 상기 각 신호연결선(22a,22b)(24a,24b)(26a,26b)들은 직접 신호발생기(30)에 연결되고, 상기 적색신호 연결선(22a,22b)은 홀수열의 적색신호선(R1,R3,...,R2n-1)들을 한꺼번에 묶은 제1적색신호 연결선(22a)과, 짝수열의 적색신호선(R2,R4,...,R2n)들을 한꺼번에 연결접속한 제2적색신호 연결선(22b)으로 구성되고, 상기 녹색신호 연결선(24a,24b)은 홀수열의 녹색신호선(G1,G3,...,G2n-1)들을 한꺼번에 묶은 제1녹색신호 연결선(24a)과, 짝수열의 녹색신호선(G2,G4,...,G2n)들을 한꺼번에 연결접속한 제2녹색신호 연결선(24b)으로 구성되며, 상기 청색신호 연결선(26a,26b)은 홀수열의 청색신호선(B1,B3,...,B2n-1)들을 한꺼번에 묶은 제1청색신호 연결선(26a)과, 짝수열의 녹색신호선(B2,B4,...,B2n)들을 한꺼번에 연결접속한 제2청색신호 연결선(26b)으로 구성된 것을 특징으로 하는 평판형 디스플레이패널 검사용 프로브유니트. The plurality of red signal lines R1 ... Rn of the FPC connection sheet 20 are shorted by being connected to each other by red signal connection lines 22a and 22b disposed across the plurality of green signal lines G1 ... Gn. ) Are shorted by being connected to each other by the green signal connecting lines 24a and 24b that cross each other, and the plurality of blue signal lines B1 ... Bn are shorted by being connected to each other by the blue signal connecting lines 26a and 26b. The connecting lines 22a and 22b, 24a and 24b and 26a and 26b are directly connected to the signal generator 30, and the red signal connecting lines 22a and 22b are odd-numbered red signal lines R1, R3, ..., A first red signal connecting line 22a which bundles R2n-1) together and a second red signal connecting line 22b which connects and connects even-numbered red signal lines R2, R4, ..., R2n at once. The green signal connection lines 24a and 24b are the first green signal connection lines 24a which bundle the odd number of green signal lines G1, G3, ..., G2n-1, and the even number green signal lines G2, G4,. And the second green signal connecting line 24b connecting G2n at a time, and the blue signal connecting lines 26a and 26b connect the odd number of blue signal lines B1, B3, ..., B2n-1. A flat panel display panel comprising a first blue signal connecting line 26a bundled together and a second blue signal connecting line 26b connecting and connecting even-numbered green signal lines B2, B4, ..., B2n at one time. Probe unit for inspection. 제2항에 있어서, 상기 신호연결선(22a,22b)(24a,24b)(26a,26b)들의 선단들은 연장되어 상기 FPC접속시트(20)의 선단에서 적색,녹색,청색의 순서로 반복배치되어 필름에 고정되고, 이들 각 신호연결선(22a,22b)(24a,24b)(26a,26b)은 각각 와이어(W1,..,Wn)를 통하여 상기 신호발생기(30)에 연결된 것을 특징으로 하는 평판형 디스플레이패널 검사용 프로브유니트. The tip of the signal connection lines (22a, 22b) (24a, 24b) (26a, 26b) is extended to be repeatedly arranged in the order of red, green, blue at the tip of the FPC connection sheet (20) It is fixed to the film, and each of these signal connection lines 22a, 22b, 24a, 24b, 26a, 26b is connected to the signal generator 30 via wires W1, ..., Wn, respectively. Probe unit for inspecting display panels.
KR1020040061519A 2004-08-04 2004-08-04 Probe Unit for inspection of Flat Display Panels KR100586007B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020040061519A KR100586007B1 (en) 2004-08-04 2004-08-04 Probe Unit for inspection of Flat Display Panels

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020040061519A KR100586007B1 (en) 2004-08-04 2004-08-04 Probe Unit for inspection of Flat Display Panels

Publications (2)

Publication Number Publication Date
KR20060029712A KR20060029712A (en) 2006-04-07
KR100586007B1 true KR100586007B1 (en) 2006-06-08

Family

ID=37139933

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020040061519A KR100586007B1 (en) 2004-08-04 2004-08-04 Probe Unit for inspection of Flat Display Panels

Country Status (1)

Country Link
KR (1) KR100586007B1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100818563B1 (en) * 2007-02-16 2008-04-02 안재일 Method of testing for display panel and the device thereof
WO2012057468A2 (en) * 2010-10-25 2012-05-03 Pro-2000 Co. Ltd. Film for testing lcd panel, test device for testing lcd panel and method for manufacturing test device for testing lcd panel

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20070103990A (en) * 2006-04-21 2007-10-25 삼성전자주식회사 Apparatus and method of testing display panel
KR100781379B1 (en) * 2007-01-30 2007-11-30 안재일 Probe apparatus
KR100820277B1 (en) * 2007-08-21 2008-04-08 주식회사 나노픽셀 Probe apparatus and probe block include the same
KR100884475B1 (en) * 2007-10-10 2009-02-20 유명자 A device for testing for display panel
KR100958007B1 (en) * 2008-07-30 2010-05-17 삼성모바일디스플레이주식회사 Testing Apparatus for Testing Flat Display Panel
KR101114824B1 (en) * 2010-04-14 2012-02-15 주식회사 프로이천 Probe seat for testing lcd panel and probe unit having the same and method for manufacturing probe seat for testing lcd panel
KR101703799B1 (en) * 2016-01-28 2017-02-20 주식회사 프로이천 Probe film for testing liquid crystal display panel

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100818563B1 (en) * 2007-02-16 2008-04-02 안재일 Method of testing for display panel and the device thereof
WO2012057468A2 (en) * 2010-10-25 2012-05-03 Pro-2000 Co. Ltd. Film for testing lcd panel, test device for testing lcd panel and method for manufacturing test device for testing lcd panel
WO2012057468A3 (en) * 2010-10-25 2012-06-21 Pro-2000 Co. Ltd. Film for testing lcd panel, test device for testing lcd panel and method for manufacturing test device for testing lcd panel

Also Published As

Publication number Publication date
KR20060029712A (en) 2006-04-07

Similar Documents

Publication Publication Date Title
KR100235477B1 (en) Display device and its testing method
KR100725194B1 (en) Display device
KR100281058B1 (en) Liquid Crystal Display
US7439756B2 (en) Testing circuit and testing method for liquid crystal display device
CN100428003C (en) Liquid crystal display panel and its probe for detection
KR100800330B1 (en) Liquid crystal panel for testing signal line of line on glass type
KR100736279B1 (en) Display device, inspection method for display device, and inspection device for display device
KR20020059071A (en) Method for testing defect of lcd panel wiring
KR100586007B1 (en) Probe Unit for inspection of Flat Display Panels
KR100818563B1 (en) Method of testing for display panel and the device thereof
WO2020098036A1 (en) Display panel, detection method and display device
KR102544983B1 (en) Test system and test controller
KR101114824B1 (en) Probe seat for testing lcd panel and probe unit having the same and method for manufacturing probe seat for testing lcd panel
KR20070032485A (en) Organic Electroluminescence Array Substrate for performing Sheet Unit Test
JP4864300B2 (en) Display device, display device inspection method, and display device inspection device
KR100782464B1 (en) Organic Light-Emitting Diode Array Substrate
KR100278612B1 (en) LCD Panel
JP4476737B2 (en) Display device, display device inspection method, and display device inspection device
KR100712179B1 (en) Organic light-emitting diode array substrate
KR20070118461A (en) Probe device
KR101274922B1 (en) Multi array substrate for liquid crystal panel
JPH05333357A (en) Method and device for inspecting stripe electrode pattern of liquid crystal display element
JP2014032322A (en) Liquid crystal display device and wiring inspection method
KR20040061951A (en) PAD structure of small size Liquid Crystal Display for test
KR100916218B1 (en) Multi testing apparatus for flat panel display

Legal Events

Date Code Title Description
A201 Request for examination
A302 Request for accelerated examination
E902 Notification of reason for refusal
E601 Decision to refuse application
AMND Amendment
J201 Request for trial against refusal decision
B601 Maintenance of original decision after re-examination before a trial
J301 Trial decision

Free format text: TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20050302

Effective date: 20060330

S901 Examination by remand of revocation
GRNO Decision to grant (after opposition)
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20130423

Year of fee payment: 8

FPAY Annual fee payment

Payment date: 20140410

Year of fee payment: 9

FPAY Annual fee payment

Payment date: 20160513

Year of fee payment: 11

LAPS Lapse due to unpaid annual fee