CN100428003C - Liquid crystal display panel and its probe for detection - Google Patents
Liquid crystal display panel and its probe for detection Download PDFInfo
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- CN100428003C CN100428003C CNB2006101498240A CN200610149824A CN100428003C CN 100428003 C CN100428003 C CN 100428003C CN B2006101498240 A CNB2006101498240 A CN B2006101498240A CN 200610149824 A CN200610149824 A CN 200610149824A CN 100428003 C CN100428003 C CN 100428003C
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Abstract
The invention discloses a kind of liquid crystal display panel with a displayer and an outlying circuit area on the liquid crystal displaying panel. There are a number of testing-pads in the outlying circuit zone,and the distances between the testing-pads are formed by staggered arrangement, and n of the test-pads is taken as a circulated arrangement and divided into n of testing-pad groups, and all the pads of each testing-pad group are paralleled, in which, n is a positive integer greater than or equal to 2. The invention also includes probes on the liquid crystal displayer panel.
Description
Technical field
The present invention relates to a kind of display panels and test its probe, particularly relate to a kind of display panels that reduces testing cost and repeated test display panels and probe of testing it of being applicable to.
Background technology
Generally in the leading portion process of making LCD, use the method for extension on a substrate, to form millions of thin film transistor (TFT) with as control module, yet, if there is thin film transistor (TFT) quality when making of part to be not so good as expection, cause to show its switch control characteristic, then can produce defective, significantly reduce the quality of LCD as bright spot and dim spot.Therefore, must efficient thin film transistor (TFT) be tested, to keep the quality of LCD.
Please refer to Fig. 1, be known LCD TEST conspectus.Many data lines 11, most bar gate line 12, two data short-circuit rods 13 and two gate short bars 14 on the substrate of LCD, have been comprised.These two data short-circuit rods 13 are connected to the data line 111 of odd number bar and the data line 112 of even number bar respectively, and two gate short bars 14 are connected to the gate line 121 of odd number bar and the gate line 122 of even number bar respectively, at last, data short-circuit rods 13 is connected to corresponding testing cushion 15,16 respectively with the end with gate short bar 14, tests for the end of probe contact of proving installation.This kind mode is the measurement circuit of 2D2G (promptly two data lines 11 and the two poles of the earth gate line 12 are tested).When testing, proving installation can be sent into test signal in specific a plurality of thin film transistor (TFT)s to test through data short-circuit rods 13 and gate short bar 14 by a plurality of end of probe with after corresponding testing cushion 15,16 contacts.In this method of testing, because two arbitrarily adjacent data lines 11 or gate line 12 all is not connected to identical short-circuit rods.Therefore, when arbitrarily adjacent two data lines 11 or gate line 12 short circuit on the make, this can be made flaw by the method and test out.
Have, another kind of known LCD TEST circuit please refer to Fig. 2 again, same many data lines 11, many gate lines 12, three data short-circuit rods 17 and two gate short bars 14 of having comprised on the substrate of LCD.Three data short-circuit rods 17 are connected to the data line 113,114,115 of 3m+1,3m+2 and 3m+3 respectively, and wherein m is zero or positive integer.And two gate short bars 14 are connected to the gate line 121 of odd number bar and the gate line 122 of even number bar respectively.At last with data short-circuit rods 17 being connected to corresponding testing cushion 18,16 respectively with gate short bar 14 1 ends, this kind mode is the measurement circuit of 3D2G (promptly three data lines 11 and the two poles of the earth gate line 12 are tested).When testing, proving installation, is sent into test signal in the specific thin film transistor (TFT) to test through data short-circuit rods 17 and gate short bar 14 with after corresponding testing cushion 16,18 contacts by a plurality of end of probe.This test mode is categorized into data line corresponding with basic primary colors (red, green, blueness), the specific basic primary colors of output behind specific data short-circuit rods input test signal.
But, no matter be the measurement circuit mode of 3D2G among 2D2G or Fig. 2 among Fig. 1, the testing efficiency in array (Array) process segment and structure cell (Cell) process segment in the time of all can't effectively promoting LCD simultaneously and make.In addition, all can be after line test is intact with short-circuit rods, just data short-circuit rods and gate short bar cut off, and this kind mode can't be tested after short-circuit rods cuts off again again.Promptly when doing when test before the process segment at liquid crystal display device module, whether short circuit of measurement circuit again.Therefore, can't guarantee the quality of lcd products fully.
Summary of the invention
The object of the present invention is to provide a kind of display panels and test its probe, with solving the problem that exists in the above-mentioned known technology.
To achieve these goals, the invention provides a kind of display panels, comprising: one first substrate, one second substrate, a liquid crystal layer, a plurality of pixel, many signal line, a plurality of testing cushion.Second substrate has a viewing area and a periphery circuit district, and the viewing area is corresponding to first substrate, and the periphery circuit district is positioned at around this viewing area.Liquid crystal layer is between this first substrate and this second substrate.A plurality of pixels are formed in this viewing area of this second substrate.Many signal line are electrically connected to this pixel.A plurality of testing cushion are formed in this periphery circuit district of this second substrate and correspondence is electrically connected to this signal wire, the mode of arranging for dislocation between this testing cushion, and make a cycle arrangement with n testing cushion, be divided into n testing cushion group, the configuration that is arranged in parallel of this testing cushion of each testing cushion group, wherein, n is the positive integer more than or equal to 2, this testing cushion contacts with a proving installation, this proving installation comprises a plurality of sensor pads, respectively corresponding this testing cushion of test group, testing this display panels, this sensor pad is arranged in a side of the thin material that this proving installation comprises and electrically connects a plurality of leads of this proving installation.
Display panels of the present invention, wherein, n testing cushion can be made cycle arrangement along the vertical direction of signal wire.Have, this signal wire comprises many data lines, many gate lines or common electrode lines again.In addition, testing cushion can be electrically connected to this many data lines.And preferable the comprising with n=2 of this testing cushion is a cycle arrangement or is a cycle arrangement with n=3.The preferable conductive material that can be of this testing cushion is arranged again.Preferable, the material of testing cushion can be identical with the material of pixel.
First substrate can be a colored optical filtering substrates among the present invention, and second substrate can be a thin film transistor base plate.
Above-mentioned proving installation can comprise a film probe or a flexible printed circuit board (FPCB).These a plurality of sensor pads can the corresponding respectively formed testing cushion group of testing cushion who is positioned at periphery circuit district on second substrate.
To achieve these goals, the present invention also provides a kind of test probe of test fluid LCD panel, be used to test a display panels, this display panels has a plurality of testing cushion groups, and this test probe comprises at least: a thin material, a plurality of lead and a plurality of sensor pad.A plurality of leads be positioned at this thin material or or the surface of this thin material, and do not electrically connect between this lead, this lead is electrically connected to a test driving circuit.A plurality of sensor pads are positioned at a side of this thin material and electrically connect this lead, and corresponding respectively this testing cushion group who is electrically connected to this display panels of this sensor pad.
The probe of test fluid LCD panel among the present invention, wherein, which kind of shape lead and its sensor pad of part do not limit, as long as can contact with the testing cushion in the display panels, for example can present shapes such as one " L " shape, "T"-shaped or " one " font.
From the above, the present invention is by the configuration of the testing cushion in the periphery circuit district in second substrate, short-circuit rods (shorting bar) can be provided simultaneously or make the sensor pad in the probe of test contact (fullcontact) two kinds of test modes fully.After the short-circuit rods measurement circuit is cut off, still can test after the process segment finishing structure cell (cell).When doing test, can test, also can carry out independent test at the sets of lines of zones of different at odd number circuit or even number circuit.The present invention has reduced testing cost, has also improved the quality of lcd products simultaneously.
Describe the present invention below in conjunction with the drawings and specific embodiments, but not as a limitation of the invention.
Description of drawings
Fig. 1 is known LCD TEST conspectus;
Fig. 2 is another known LCD TEST conspectus;
Fig. 3 is the display panels cut-open view of a preferred embodiment of the present invention;
Fig. 4 is the thin film transistor base plate synoptic diagram of a preferred embodiment of the present invention;
Fig. 5 A and Fig. 5 B are periphery circuit district synoptic diagram on the thin film transistor base plate of a preferred embodiment of the present invention;
Fig. 6 is that the display panels of a preferred embodiment of the present invention contacts synoptic diagram with probe;
Fig. 7 is the probe synoptic diagram of the test fluid LCD panel of a preferred embodiment of the present invention;
Fig. 8 be a preferred embodiment of the present invention with circuit board testing display panels synoptic diagram;
Fig. 9 A and Fig. 9 B contact synoptic diagram for periphery circuit district on the thin film transistor base plate of another preferred embodiment of the present invention and the probe that is in contact with it;
Figure 10 be a preferred embodiment of the present invention with circuit board testing display panels synoptic diagram;
Figure 11 A and Figure 11 B contact synoptic diagram for periphery circuit district on the thin film transistor base plate of another preferred embodiment of the present invention and the probe that is in contact with it;
Figure 12 is periphery circuit district synoptic diagram on the thin film transistor base plate of another preferred embodiment of the present invention;
Figure 13 A to Figure 13 F for other preferred embodiment of the present invention with circuit board testing display panels synoptic diagram.
Wherein, Reference numeral:
11,111,112,113,114,115,32 data lines
12,121,122,33 gate lines
13,17 data short-circuit rods
14 gate short bars
15,16,18 testing cushion
20 display panels
21 colored optical filtering substrates
22 thin film transistor base plates
221 viewing areas
222 periphery circuit districts
23 liquid crystal layers
24 end glue-line
31 pixels
34,34a, 34b, 34c, 50,60,70 testing cushion
341,342,511,512,513,601,602,701,702,703 testing cushion groups
35 short-circuit rods
36 short-circuit test pads
40 flexible printed circuit boards
41 thin materials
421,422,423,424,425,426 leads
431,432,433,434,435,436 sensor pads
51,61,71 first testing cushion
52,62,72 second testing cushion
90 circuit boards
91 signal input pads
Embodiment
Accompanying drawing in the embodiments of the invention is the synoptic diagram of simplification.This accompanying drawing only shows the assembly relevant with the present invention, the form when its shown assembly is not actual enforcement, and component count, the shape equal proportion during its actual enforcement is an optionally design, and its assembly layout form may be more complicated.
Embodiment one, please refer to Fig. 3, is a display panels 20 rough schematics of the present invention.It has a colored optical filtering substrates 21, a thin film transistor base plate 22 and a liquid crystal layer 23.Wherein, liquid crystal layer 23 between colored optical filtering substrates 21 and thin film transistor base plate 22 and the outside of liquid crystal layer 23 have one and end glue-line 24.The structure of thin film transistor base plate 22 please refer to Fig. 4 in the present embodiment, is thin film transistor base plate 22 synoptic diagram of a kind of display panels 20 of the present invention.This thin film transistor base plate 22 has a viewing area 221 and a periphery circuit district 222, and this viewing area 221 is corresponding to as shown in Figure 3 a colored optical filtering substrates 21, and this periphery circuit district 222 is positioned at around this viewing area 221.In the viewing area 221 of thin film transistor base plate 22, form several pixels 31.Having many data lines 32 that can be used as signal wire in addition is electrically connected in the pixel 31 with gate line 33.
Then, please refer to Fig. 5 A, for display panels 20 vertical views of Fig. 3 and be thin film transistor base plate 22 periphery circuit districts 222 enlarged diagrams.With the 2D2G structure is example, in the periphery circuit district 222 of thin film transistor base plate 22, has a plurality of testing cushion 34 and correspondence and is electrically connected to this signal wire, be i.e. data line 32 or gate line 33.The modes that 34 of this testing cushion are arranged with dislocation in twos form, and can be divided into 2 groups of testing cushion groups 341,342, the testing cushion 34a that each testing cushion group is 341,342, the 34b configuration that is arranged in parallel.34 modes of arranging with dislocation in twos of this kind testing cushion can be used short-circuit rods 35 earlier, promptly test in the line test mode of 2D2G (the promptly corresponding respectively data line 32 and gate line 33 that is connected to as shown in Figure 4) through short-circuit test pad 36, shown in Fig. 5 A with the short-circuit rods 35 that signal wire connects.After testing, the signal wire that will be connected with short-circuit rods 35 is to rub or to cut off in the mode of laser, shown in Fig. 5 B.After this, in the follow-up making flow process of making LCD, this test mode can not tested at display panels 20 again.
In addition, also provide a kind of test probe of testing this kind display panels in the present embodiment.This probe is a flexible printed circuit board 40 in the present embodiment, also can use film probe.Please refer to Fig. 6, be the electric connection synoptic diagram of flexible printed circuit board in the present embodiment 40 with display panels 20.Flexible printed circuit board 40 is amplified with the zone that periphery circuit district 222 contacts, and this flexible printed circuit board 40 contacts with the periphery circuit district 222 of the thin film transistor base plate 22 of display panels 20.Probe about present embodiment please refer to Fig. 7, and it comprises at least: thin material 41, a plurality of lead 421,422,423 and a plurality of sensor pad 431,432,433.This lead 421,422,423 is positioned at the thin material 41 or the surface of thin material 41, and 421,422,423 in lead do not electrically connect, and these leads 421,422,423 are electrically connected to a test driving circuit (not shown).431,432,433 of sensor pads are positioned at a side of thin material 41 and electrically connect lead 421,422,423 respectively, refer again to Fig. 6, the corresponding respectively testing cushion group 341,342 who is electrically connected to display panels 20 of this sensor pad 431,432.
Present embodiment as shown in Figure 7 lead 421 and its sensor pad 431 present one "T"-shaped, its with present embodiment in testing cushion group's 341 electric connections of arranging of the odd number of display panels 20.The lead 422 that presents one " L " shape with sensor pad 432 then electrically connects with even number testing cushion group 342.The lead 423 that presents one " one " font with sensor pad 433 then electrically connects with a testing cushion 34 wherein, and this testing cushion 34c then is electrically connected to the signal wire in the display panels 20.Have, this signal wire is the common electrode lines (not shown) in the display panels 20 again, and this common electrode lines connects thin film transistor base plate 22 and colored optical filtering substrates 21.Therefore, from the above, whether the present embodiment thin film transistor (TFT) of probe in detecting display panels 20 according to this has the phenomenon of short circuit.
Have, please refer to Fig. 8, probe is done the test of a kind of 2D2G according to this.The other end with test drive unit electrically connect test probe, with circuit board 90 is example, X-direction at circuit board 90, the lead 421 that has comprised the testing cushion group 341 of the odd number arrangement in periphery circuit district 222 in the connection thin film transistor base plate 22 as shown in Figure 6, article one, connect the testing cushion group's 342 that the even number in periphery circuit district 222 in the thin film transistor base plate 22 arranges lead 422 and one and the lead 423 that is connected to the testing cushion 34c of common electrode lines in the display panels 20, then be electrically connected to the data line 32 (as shown in Figure 4) or the common electrode lines (not shown) of thin film transistor base plate 22 in the testing cushion 34 of X-direction.Same, then comprised the testing cushion group's 341 that an odd number that connects periphery circuit district 222 in the thin film transistor base plate 22 is arranged lead 421 and the testing cushion group's 342 that even number that connects periphery circuit district 222 in the thin film transistor base plate 22 is arranged lead 422 in the Y direction of circuit board.At this moment, 34 of the testing cushion of Y direction are electrically connected to the gate line 33 (as shown in Figure 4) of thin film transistor base plate 22, and the lead in the probe 421,422 can form two " L " shapes with its sensor pad 431,432.At last, input to signal input pad 91 in the circuit board 90, can test out the whether short circuit of thin film transistor (TFT) in the display panels through signal.
In the present embodiment,, can on the testing cushion 34 in the periphery circuit district 222 in the thin film transistor base plate 22, be connected, continue follow-up making flow process again, to finish the assembling of LCD with a plurality of semi-conductor chips through after the test of probe.
Embodiment two, present embodiment is identical haply with embodiment one, but different is, please refer to Fig. 9 A, itself can be divided into first testing cushion 51 and second testing cushion 52 in this testing cushion 50, the mode that first testing cushion 51 is arranged with dislocation forms, and with 3 first testing cushion, 51 works, one cycle arrangement, be divided into 3 groups of testing cushion groups, just with the 1st, 4, testing cushion such as 7 are as first group of testing cushion group 511, with the 2nd, 5, testing cushion such as 8 are as second group of testing cushion group 512, with the 3rd, 6, testing cushion such as 9 are as the 3rd group of testing cushion group 513, the configuration that is arranged in parallel of each testing cushion group's testing cushion 51.In addition, this testing cushion group of three groups (first group of testing cushion group 511, second group of testing cushion group 512 and the 3rd group of testing cushion group 513) can test the basic primary colors of colored optical filtering substrates 21 as shown in Figure 3, promptly red (R), green (G), blue (B) respectively.52 of second testing cushion in the testing cushion 50 are intermeshing in twos and are arranging.
Arrangement difference along with the testing cushion on the thin film transistor base plate 22 50, refer again to Fig. 9 B, the probe material of present embodiment is identical with the material of embodiment one, the present embodiment middle probe, promptly lead 423,424,425,426 and sensor pad 433,434,435,436 shapes that presented also change thereupon in the flexible printed circuit board 40 (or film probe).In the present embodiment with thin film transistor base plate 22 in first group of testing cushion group 511 in first testing cushion 51 lead 424 and the sensor pad 434 thereof that electrically connect present "T"-shaped shape, it can test blueness (B).The shape that lead 425 that electrically connects with second group of testing cushion group 511 in first testing cushion 51 in the thin film transistor base plate 22 and sensor pad 435 thereof present " L " shape, it can test green (G).In addition, the shape that lead 426 that electrically connects with the 3rd group of testing cushion group 513 in first testing cushion 51 in the thin film transistor base plate 22 and sensor pad 436 thereof also can present " L " shape, it can test redness (R).Have, lead 423 and the sensor pad 433 thereof identical with embodiment one can present " one " font again, and this form is electrically connected to the signal wire of one in the display panels as common electrode lines.
Present embodiment is same identical with embodiment one, utilize circuit board to test, please also refer to Fig. 9 A, Fig. 9 B and Figure 10, for doing the test mode of a kind of 3D2G, in the X-direction of circuit board 90, comprised a lead 424 that connects first group of testing cushion group 511 of first testing cushion 51 in periphery circuit district 222 in the thin film transistor base plate 22, article one, the lead 425 that connects second group of testing cushion group 512 of first testing cushion 51 in periphery circuit district 222 in the thin film transistor base plate 22, article one, the lead 423 that connects the lead 426 of the 3rd group of testing cushion group 513 of first testing cushion 51 in periphery circuit district 222 in the thin film transistor base plate 22 and and the testing cushion 50 that is connected to common electrode lines in the display panels 20.Present embodiment is then identical with embodiment one in the Y direction of circuit board 90.Present embodiment inputs to signal input pad 91 in the circuit board 90 by signal, can test out the whether short circuit of thin film transistor (TFT) in the display panels.Remainder is then identical with embodiment one.
Present embodiment is identical haply with embodiment one, but different is, please refer to Figure 11 A, and the mode that the testing cushion 60 of present embodiment is arranged with dislocation in twos forms, and can be divided into 2 groups of testing cushion groups 601,602.And testing cushion 60 itself can be divided into that mode that first testing cushion 61 and second testing cushion, 62, the first testing cushion 61 arrange with dislocation forms and each testing cushion group 601,602 in the configuration that is arranged in parallel of first testing cushion 61.62 arrangements parallel to each other of second testing cushion among each testing cushion group 601,602.
Test the probe (shown in Figure 11 B) of display panels in the present embodiment and utilize circuit board that the mode of signal input is identical with embodiment 1.In addition, the testing cushion 60 after testing can be connected with a film, continues follow-up making flow process again, to finish the assembling of LCD.
Embodiment 4, present embodiment and embodiment two are roughly the same, but different be to please refer to Figure 12, the testing cushion 70 of present embodiment, first testing cushion 71 in itself is arranged in the same way with embodiment two, the arrangement then all parallel to each other of each second testing cushion 72, in short, the testing cushion of present embodiment is made a cycle arrangement with 3 first testing cushion groups 71, can be divided into 3 groups of testing cushion groups 701,702,703.
In addition, its arrangement mode of the probe of test fluid LCD panel can be identical with embodiment two in the present embodiment, and the circuit board that connects with probe is also identical with embodiment two.
Embodiment 5 to 10, can be according to the arrangement mode of the testing cushion among the embodiment 1 to 4, and produce as shown in FIG. 13A 2D4G (embodiment 5), the 3D4G shown in Figure 13 B (embodiment 6), the 4D2G shown in Figure 13 C (embodiment 7), the 4D4G shown in Figure 13 D (embodiment 8), the 6D2G shown in Figure 13 E (embodiment 9) and the tests such as (embodiment 10) of the 6D4G shown in Figure 13 F.Be familiar with the personnel of correlation technique, can not limit embodiments of the present invention according to the variation and the amplification of above-mentioned do equivalence with this.
In sum, display panels provided by the present invention and the probe of testing this kind display panels have reduced testing cost.And, can be arranged on substrate, circuit board and the flexible circuit board at the circuit on the display panels, replaced the circuit on the known original panel.In addition, the present invention has also improved the quality of LCD.
Certainly; the present invention also can have other various embodiments; under the situation that does not deviate from spirit of the present invention and essence thereof; those of ordinary skill in the art can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.
Claims (20)
1, a kind of display panels is characterized in that, comprising:
One first substrate;
One second substrate, it has a viewing area and a periphery circuit district, and this viewing area is corresponding to this first substrate, and this periphery circuit district is positioned at around this viewing area;
One liquid crystal layer is between this first substrate and this second substrate;
A plurality of pixels are formed in this viewing area of this second substrate;
Many signal line are electrically connected to this pixel; And
A plurality of testing cushion, be formed in this periphery circuit district of this second substrate and correspondence is electrically connected to this signal wire, the mode of arranging with dislocation between this testing cushion forms, and make a cycle arrangement with n testing cushion, be divided into n testing cushion group, the configuration that is arranged in parallel of this testing cushion of each testing cushion group, wherein, n is the positive integer more than or equal to 2, this testing cushion contacts with a proving installation, and this proving installation comprises a plurality of sensor pads, corresponding respectively this testing cushion of test group, testing this display panels, this sensor pad is arranged in a side of the thin material that this proving installation comprises and electrically connects a plurality of leads of this proving installation.
2, display panels according to claim 1 is characterized in that, this n testing cushion is made cycle arrangement along the vertical direction of this signal wire.
3, display panels according to claim 1 is characterized in that, this signal wire comprises many data lines.
4, display panels according to claim 1 is characterized in that, this signal wire comprises many gate lines.
5, display panels according to claim 1 is characterized in that, this testing cushion is a cycle arrangement with n=2.
6, display panels according to claim 1 is characterized in that, this testing cushion comprises that with n=3 be a cycle arrangement.
7, display panels according to claim 1 is characterized in that, this second substrate also comprises the community electrode line.
8, display panels according to claim 3 is characterized in that, this testing cushion is electrically connected to this data line, and correspondence is electrically connected to this pixel.
9, display panels according to claim 1 is characterized in that, this testing cushion is made of conductive material.
10, display panels according to claim 1 is characterized in that, this first substrate comprises a colored optical filtering substrates.
11, display panels according to claim 1 is characterized in that, this second substrate comprises a thin film transistor base plate.
12, display panels according to claim 1 is characterized in that, this proving installation comprises a film probe or a flexible printed circuit board.
13, display panels according to claim 1 is characterized in that, the other end of this proving installation electrically connects a test drive unit.
14, display panels according to claim 13 is characterized in that, this test drive unit comprises a circuit board.
15, a kind of test probe of test fluid LCD panel is used to test a display panels, and this display panels has a plurality of testing cushion groups, it is characterized in that, this test probe comprises at least:
One thin material;
A plurality of leads are positioned at the surface of this thin material or this thin material, and do not electrically connect between this lead, and this lead is electrically connected to a test driving circuit; And
A plurality of sensor pads are positioned at a side of this thin material and electrically connect this lead, and corresponding respectively this testing cushion group who is electrically connected to this display panels of this sensor pad.
16, test probe according to claim 15 is characterized in that, this lead and its sensor pad of part present one " L " shape.
17, test probe according to claim 15 is characterized in that, this lead of part and its sensor pad present one "T"-shaped.
18, test probe according to claim 15 is characterized in that, the lead in these leads and its sensor pad present one " one " font.
19, test probe according to claim 15 is characterized in that, the other end of this test probe is electrically connected to a test drive unit.
20, test probe according to claim 19 is characterized in that, this test drive unit comprises a circuit board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006101498240A CN100428003C (en) | 2006-10-25 | 2006-10-25 | Liquid crystal display panel and its probe for detection |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006101498240A CN100428003C (en) | 2006-10-25 | 2006-10-25 | Liquid crystal display panel and its probe for detection |
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| CN1945386A CN1945386A (en) | 2007-04-11 |
| CN100428003C true CN100428003C (en) | 2008-10-22 |
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| JP2009115585A (en) * | 2007-11-06 | 2009-05-28 | Micronics Japan Co Ltd | Probe assembly and test device |
| KR101152182B1 (en) * | 2010-05-04 | 2012-06-15 | 주식회사디아이 | Probe film used probe block and method for manufacturing thereof |
| CN102819126B (en) * | 2012-08-06 | 2015-05-20 | 深圳市华星光电技术有限公司 | Testing device and testing method |
| CN102967954B (en) * | 2012-11-20 | 2015-11-25 | 深圳市华星光电技术有限公司 | The proving installation of liquid crystal panel and method |
| US20140139256A1 (en) * | 2012-11-20 | 2014-05-22 | Shenzhen China Star Optoelectronics Technology Co. Ltd. | Detecting device and method for liquid crystal panel |
| CN105632382B (en) * | 2016-01-04 | 2018-05-18 | 京东方科技集团股份有限公司 | The method of display device and its detection binding region binding situation |
| CN105759139A (en) * | 2016-02-04 | 2016-07-13 | 深圳精智达技术股份有限公司 | Touch screen test device and test method |
| CN106601161B (en) * | 2016-12-22 | 2019-11-19 | 昆山龙腾光电有限公司 | Liquid crystal display panel and its detection method |
| CN107154232A (en) * | 2017-05-27 | 2017-09-12 | 厦门天马微电子有限公司 | The method of testing of array base palte, display panel and display panel |
| CN107942547B (en) * | 2017-11-21 | 2020-06-30 | 深圳市华星光电半导体显示技术有限公司 | Lighting and back lighting fixture and method for detecting panel |
| CN110767131B (en) * | 2019-10-15 | 2023-03-24 | Tcl华星光电技术有限公司 | Lighting detection method and lighting fixture for liquid crystal display panel |
| TWI747303B (en) * | 2020-05-29 | 2021-11-21 | 友達光電股份有限公司 | Test electrode set and test system |
| CN114185202A (en) * | 2021-12-13 | 2022-03-15 | 苏州华星光电技术有限公司 | Alignment circuit and liquid crystal display substrate |
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| JPH08201843A (en) * | 1995-01-26 | 1996-08-09 | Casio Comput Co Ltd | Matrix type color liquid crystal display element and its lighting inspecting method |
| JPH08240627A (en) * | 1995-03-02 | 1996-09-17 | Sharp Corp | Signal applying device for inspection of display panel |
| JP2004177870A (en) * | 2002-11-29 | 2004-06-24 | Kyocera Corp | Liquid crystal display and short circuit measuring probe member used for liquid crystal display |
| CN1734322A (en) * | 2004-08-13 | 2006-02-15 | 三星电子株式会社 | Array base palte and have the main substrate and the liquid crystal indicator of described array base palte |
| CN1815311A (en) * | 2005-02-04 | 2006-08-09 | 三洋爱普生映像元器件有限公司 | Liquid crystal display panel |
| CN1710480A (en) * | 2005-07-05 | 2005-12-21 | 友达光电股份有限公司 | Test circuit of liquid crystal display and test method |
| CN1828396A (en) * | 2006-04-14 | 2006-09-06 | 友达光电股份有限公司 | LCD subassembly and thin film transistor substrate and testing method |
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|---|---|
| CN1945386A (en) | 2007-04-11 |
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