CN105759139A - Touch screen test device and test method - Google Patents
Touch screen test device and test method Download PDFInfo
- Publication number
- CN105759139A CN105759139A CN201610079674.4A CN201610079674A CN105759139A CN 105759139 A CN105759139 A CN 105759139A CN 201610079674 A CN201610079674 A CN 201610079674A CN 105759139 A CN105759139 A CN 105759139A
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- touch screen
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- node capacitor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
The invention discloses a touch screen test device and method. The touch screen test device comprises a control unit, a measurement unit, a controller and a test substrate. Multiple electrodes are distributed on the test substrate. Each electrode is connected with the measurement unit. The controller is used for outputting test signals to the driving end of a sensor. The measurement unit is used for measuring the waveform and the waveform and the time sequence of current outputted by a node capacitor. The control unit is used for controlling the controller to output the test signals and processing the waveform and the time sequence of current measured by the measurement unit so as to obtain the capacitance value of the node capacitor. According to the technical scheme, the self-capacitance scheme sensor is tested by adopting a mutual capacitance test scheme so that test efficiency is enhanced.
Description
Technical field
The present invention relates to touch screen technology field, particularly to a kind of testing device for touch screens and method.
Background technology
The sensor of capacitance type touch control screen common are double-deck mutual tolerance scheme, monolayer multiple spot mutual tolerance scheme and from appearance scheme, generally has triangle from appearance scheme etc. from appearance scheme.
Double-deck mutual tolerance and monolayer multiple spot belong to the scheme of mutual capacitance type, due to itself ITO (Indiumtinoxide, tin indium oxide) inductive layer has substantial amounts of mutual area and is distributed mainly on working sensor node, it is formed with node capacitor, mutual capacitance type test can be carried out, it is possible to ratio more fully measures sensor touch-control performance by the capacity measurement instrument of specialty.
And triangular approach belongs to the scheme of self-tolerant, the one of its mutual tolerance node generation extremely ITO, another extremely touches finger, and sensor itself does not form mutual tolerance node.Thus mutual capacitance type test can not be carried out.So triangular approach is tested typically via artificial line, but sensor can not intactly be tested by this method, for instance the fracture of triangle transducer tip can not test out (as shown in Figure 1), there is the problem that testing efficiency is low simultaneously.
Summary of the invention
The main purpose of the present invention is to provide the method for testing of a kind of sensor, it is intended to improve the integrity of the test of self-tolerant sensor and the efficiency of test.
For achieving the above object, the present invention proposes the test device of a kind of touch screen, and described touch screen is provided with sensor, and the test device of described touch screen includes controller and the test substrate electrically connected with described controller；Wherein,
Described test substrate is provided with multiple electrode for forming node capacitor with the sensor of touch screen；
Described controller also electrically connects with described touch screen, and described controller output test signal to the drive end of described sensor measures the actual capacitance value of described node capacitor, and judges that the difference of described actual capacitance value and reference capacitance value is whether in predetermined threshold value.
Preferably, described test substrate is flexible PCB.
Preferably, described test substrate is provided with steam vent.
Preferably, described test substrate is additionally provided with cushion with the side of touch screen laminating.
Preferably, ramp signal or the sinusoidal ac signal that test signal is fixed slope of described controller output.
Preferably, described test substrate and touch screen are equipped with telltale mark.
Preferably, described electrode be strip and described electrode width can according to measure precision and be adjusted.
Preferably, described controller, by measuring waveform and the sequential of node capacitor output electric current, obtains the capacitance of node capacitor after controller processes and calculates.
The present invention also proposes a kind of sensor testing method, applies the test device of described touch screen, and the method for testing of described sensor comprises the following steps:
Touch screen to be measured is positioned over test substrate and is provided with the surface of electrode, make to form described node capacitor between described touch screen and test substrate；
Described node capacitor actual capacitance value under test signal measured by described controller, and judges that the difference of described actual capacitance value and reference capacitance value is whether in predetermined threshold value.
Preferably, described controller, by measuring waveform and the sequential of node capacitor output electric current, obtains the capacitance of node capacitor after controller processes and calculates.
Technical solution of the present invention is by arranging test substrate, test substrate is provided with electrode, wherein electrode and sensor are formed with mutual area, thus forming node capacitor, again through the capacitance of test node electric capacity and compare with reference capacitance value, can realizing mutual capacitance type test, the disposable touch-control performance to touch screen is completely tested, without carrying out artificial setting-out test again, thus improve testing efficiency.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, the accompanying drawing used required in embodiment or description of the prior art will be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the premise not paying creative work, it is also possible to the structure according to these accompanying drawings obtains other accompanying drawing.
Fig. 1 is touch screen triangle sensor schematic diagram；
Fig. 2 is that sensor coordinates schematic diagram with electrode；
Fig. 3 is that sensor coordinates schematic diagram with test substrate；
Drawing reference numeral illustrates:
| Label | Title | Label | Title |
| 10 | Test substrate | 21 | Sensor |
| 11 | Electrode | 30 | Steam vent |
| 20 | Touch screen | 40 | Cushion |
The realization of the object of the invention, functional characteristics and advantage will in conjunction with the embodiments, are described further with reference to accompanying drawing.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only a part of embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of protection of the invention.
Need explanation, directional instruction in the embodiment of the present invention (such as up, down, left, right, before and after ...) is only for explaining relative position relation between each parts, motion conditions etc. under a certain particular pose (as shown in drawings), if this particular pose changes, then directionality instruction also correspondingly changes therewith.
Additionally; technical scheme between each embodiment can be combined with each other; but must be based on those of ordinary skill in the art are capable of; when technical scheme combination occur conflicting maybe cannot realize time people should think that the combination of this technical scheme is absent from, also not within the protection domain of application claims.
The present invention proposes the test device of a kind of touch screen.
With reference to Fig. 2 to Fig. 3, in embodiments of the present invention, the test device of described touch screen is for testing touch screen 20, described touch screen is provided with sensor 21, and the test device of described touch screen includes controller (not shown) and the test substrate 11 electrically connected with described controller；Wherein,
Described test substrate 11 is provided with multiple electrode 11 for forming node capacitor with the sensor 21 of touch screen 20；
Described controller also electrically connects with described touch screen 20, and described controller output test signal to the drive end of described sensor measures the actual capacitance value of described node capacitor, and judges that the difference of described actual capacitance value and reference capacitance value is whether in predetermined threshold value.
It should be noted that the test device of sensor provided by the invention is the touch screen for self-tolerant scheme, the single-layer semi-finished products of mutual capacitance type sensor also can adopt the test device of this sensor.
In the present embodiment, described controller adopts conventional chip microcontroller, and single-chip microcomputer is preset with test program, to control the carrying out of test.During test, described electrode 11 output test signal is tested by this single-chip microcomputer, and calculate to obtain actual node capacitance, and default reference capacitance value compares with in single-chip microcomputer, when the difference of actual capacitance value and reference capacitance value is in predetermined threshold value, judge that described touch screen 20 is qualified, and single-chip microcomputer test result is shown on the display screen that the test device with this touch screen is connected.It should be understood that when the difference of actual capacitance value and reference capacitance value is not in default threshold value, then judge that described touch screen 20 is defective.
In the present embodiment, what the sensor 21 of the touch screen 20 tested adopted is that triangle is from appearance scheme.Whole touch screen includes the sensor array of multiple identical triangle, and one end of each sensor is connected with controller.When testing, touch screen 20 is fitted tightly on test substrate 10, test substrate 10 is provided with multiple electrode 11, in the present embodiment, test substrate 10 is provided with four electrodes 11, four electrodes 11 are arranged in parallel on test substrate 10, and four electrodes 11 are formed with identical mutual area with each sensor 21, and the part that electrode 11 and sensor 21 interact forms node capacitor.Each electrode 11 is electrically connected with controller.During test, the drive end output test signal of each sensor 21 given by controller, tests with the sensor 21 to touch screen 20.
It should be noted that, for triangle from the touch panel sensor holding scheme in the present embodiment, in actual test process, the sensor of touch screen monolayer multipoint configuration can also be tested, corresponding adjusts the shape of electrode on test substrate, to form mutual tolerance node, thus sensor is tested.
Controller output test signal, in the present embodiment, this test is current signal；Electrode 11 is exported the relevant parameter measurement of electric current by controller, and via controller carries out obtaining after process calculates the capacitance of this node capacitor, this capacitance and reference capacitance value is compared, namely can determine whether that whether this touch screen 20 is qualified.
It should be noted that according to formula C=ε S/d, wherein ε represents dielectric constant, S represents the mutual area of electrode 11 and sensor 21, and d represents the sensor 21 of electrode 11 and touch screen 20 and forms the distance between the surface of node capacitor.Sensor 21 is under normal circumstances, the node capacitor formed is also normal, assume that mutual area is 1, the capacitance result tested is a, when exception occurs in sensor 21, for instance when triangle transducer tip ruptures, node interaction face is manufactured into about 0.15 when affecting, its node capacitor also respective change about 15%, namely the capacitance of the corresponding node capacitor measured compares the capacitance minimizing about 15% of reference capacitance, thus testing out underproof product.
Technical solution of the present invention is by arranging test substrate 10, test substrate 10 is provided with electrode 11, wherein electrode 11 and sensor 21 are formed with mutual area, thus forming node capacitor, again through the capacitance of test node electric capacity and compare with reference capacitance value, can realizing mutual capacitance type test, the disposable touch-control performance to touch screen 20 is completely tested, without carrying out artificial setting-out test again, thus improve testing efficiency.
In the present embodiment, fitting closely for realizing test substrate 10 with touch screen 20, described test substrate 10 adopts flexible PCB.
Further, described test substrate 10 is provided with steam vent 30 between two adjacent electrodes 11.In the present embodiment, between electrode 11 adjacent on test substrate 10, it is provided with steam vent 30, to prevent from existing between test substrate 10 and touch screen 20 bubble, impact test.
Further, described test substrate 10 is additionally provided with cushion 40 with the side of touch screen 20 laminating.This cushion 40 contributes to touch screen 20 and more fits tightly with test substrate 10.
Further, ramp signal or the sinusoidal ac signal that test signal is fixed slope of described controller output.
Further, described test substrate 10 and touch screen 20 are equipped with telltale mark.
It should be noted that test process needs ensure that the mutual area that electrode 11 is formed with corresponding sensor 21 keeps equal, so when being positioned over by touch screen 20 on test substrate 10, need to ensure that each placement location of product is constant by telltale mark.
Further, described electrode 11 in strip and the width of described electrode 11 can be adjusted according to the precision measured.
In the present embodiment, described electrode 11 is in strip.In actual test process, can according to the shape of sensor 21 corresponding electrode 11 shape is set；Meanwhile, according to test exact requirements, the width of electrode 11 can be set.
Further, described controller, by measuring waveform and the sequential of node capacitor output electric current, obtains the capacitance of node capacitor after controller processes and calculates.
It should be noted that, the waveform of the electric current of node capacitor output is corresponding with the quantity of electric charge of node capacitor with sequential, thus the quantity of electric charge of node capacitor can be recorded, namely the capacitance of node capacitor is can be regarded as to obtain by formula Q=UC, wherein Q is the quantity of electric charge, and U is the voltage of node capacitor, in the present embodiment, supply voltage is constant, and C is the capacitance of node capacitor.
Technical solution of the present invention is by arranging test substrate 10, node capacitor is formed with sensor 21 by the electrode 11 on substrate, again through the capacitance of test node electric capacity and compare with reference capacitance value, namely mutual capacitance type test is achieved, thus than the touch-control performance more completely testing out touch screen, can effectively improve the testing efficiency of sensor 21, reduce testing cost.
The present invention also proposes the method for testing of a kind of sensor 21, applies the test device of described touch screen, and the method for testing of described sensor 21 comprises the following steps:
Touch screen to be measured is positioned over test substrate and is provided with the surface of electrode, make to form described node capacitor between described touch screen and test substrate；
Described node capacitor actual capacitance value under test signal measured by described controller, and judges that the difference of described actual capacitance value and reference capacitance value is whether in predetermined threshold value.
Described controller output test signal is to sensor 21 drive end, by measuring the actual capacitance value of node capacitor and itself and reference capacitance value being compared, if when the difference of described actual capacitance value and reference capacitance value is in predetermined threshold value, it is determined that described sensor 21 is qualified.It should be understood that when the difference of actual capacitance value and reference capacitance value is not in default threshold value, then judge that described touch screen 20 is defective.Described test substrate 10 adopts flexible PCB.The side that described test substrate 10 and touch screen 20 are fitted is additionally provided with cushion 40.
In the present embodiment, ramp signal or the sinusoidal ac signal that test signal is fixed slope of described controller output.
Described test substrate 10 and touch screen 20 are equipped with telltale mark.It should be noted that test process needs ensure that the mutual area that electrode 11 is formed with corresponding sensor 21 keeps equal, so when being positioned over by touch screen 20 on test substrate 10, need to ensure that each placement location of product is constant by telltale mark.
In the present embodiment, described electrode 11 is in strip.In actual test process, can according to the shape of sensor 21 corresponding electrode 11 shape is set；Meanwhile, according to test exact requirements, electrode 11 width can be set.
It should be noted that the waveform of the electric current of node capacitor output is corresponding with the quantity of electric charge of node capacitor with sequential, thus the quantity of electric charge of node capacitor can be recorded；Namely can be regarded as to obtain the capacitance of node capacitor by formula Q=UC, wherein Q is the quantity of electric charge, and U is the voltage of node capacitor, and in the present embodiment, supply voltage is constant, and C is the capacitance of node capacitor.
Technical solution of the present invention, by have employed the whole technical scheme of test device of the sensor, therefore at least has all beneficial effects that above-described embodiment scheme is brought, again no longer repeats one by one.
The foregoing is only the preferred embodiments of the present invention; not thereby the scope of the claims of the present invention is limited; every under the inventive concept of the present invention; utilize the equivalent structure transformation that description of the present invention and accompanying drawing content are made, or directly/be indirectly used in other relevant technical fields and be included in the scope of patent protection of the present invention.
Claims (10)
1. a test device for touch screen, for touch screen is tested, described touch screen is provided with sensor, it is characterised in that the test device of described touch screen includes controller and the test substrate electrically connected with described controller；Wherein,
Described test substrate is provided with multiple electrode for forming node capacitor with the sensor of touch screen；
Described controller also electrically connects with described touch screen, and described controller output test signal to the drive end of described sensor measures the actual capacitance value of described node capacitor, and judges that the difference of described actual capacitance value and reference capacitance value is whether in predetermined threshold value.
2. the test device of touch screen as claimed in claim 1, it is characterised in that described test substrate is flexible PCB.
3. the test device of touch screen as claimed in claim 2, it is characterised in that described test substrate is provided with steam vent.
4. the test device of touch screen as described in claim 3, it is characterised in that the side that described test substrate is fitted with touch screen is provided with cushion.
5. the test device of touch screen as described in claim 3, it is characterised in that ramp signal or the sinusoidal ac signal that test signal is fixed slope of described controller output.
6. the test device of touch screen as described in claim 1, it is characterised in that be equipped with telltale mark on described test substrate and touch screen.
7. the test device of touch screen as described in claim 1, it is characterised in that described electrode is strip.
8. the test device of touch screen as described in claim 1, it is characterised in that described controller, by measuring waveform and the sequential of node capacitor output electric current, processes, through controller, the capacitance obtaining node capacitor after calculating.
9. the method for testing of the touch screen of the test device of the touch screen applied described in any one of claim 1-8, it is characterised in that the method for testing of described touch screen comprises the following steps:
Touch screen to be measured is positioned over test substrate and is provided with the surface of electrode, make to form described node capacitor between described touch screen and test substrate；
Described node capacitor actual capacitance value under test signal measured by described controller, and judges that the difference of described actual capacitance value and reference capacitance value is whether in predetermined threshold value.
10. sensor testing method as described in claim 9, it is characterised in that described controller, by measuring waveform and the sequential of node capacitor output electric current, processes, through controller, the capacitance obtaining node capacitor after calculating.
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| CN201610079674.4A CN105759139A (en) | 2016-02-04 | 2016-02-04 | Touch screen test device and test method |
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| CN201610079674.4A CN105759139A (en) | 2016-02-04 | 2016-02-04 | Touch screen test device and test method |
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