CN106680643B - Incell self-contained module panel detection method - Google Patents
Incell self-contained module panel detection method Download PDFInfo
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- CN106680643B CN106680643B CN201611260152.0A CN201611260152A CN106680643B CN 106680643 B CN106680643 B CN 106680643B CN 201611260152 A CN201611260152 A CN 201611260152A CN 106680643 B CN106680643 B CN 106680643B
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- module panel
- contained module
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
Abstract
The invention provides a detection method of an Incell self-contained module panel. The detection method comprises the following steps: a transparent conducting layer is arranged above the Incell self-contained module panel comprising a plurality of touch electrodes, so that the transparent conducting layer covers and is close to an effective area of the whole Incell self-contained module panel, wherein the transparent conducting layer is arranged on transparent carrier glass, so that the transparent conducting layer can be detachably arranged on the Incell self-contained module panel; a circuit connection step of electrically connecting the transparent conductive layer to ground and connecting a detection circuit between the transparent conductive layer and ground; and a detection step, namely controlling the integrated circuit to sequentially input a test signal to each touch electrode of the Incell self-contained module panel, and determining the abnormal state of the Incell self-contained module panel through the current detected by the detection circuit.
Description
Technical Field
The invention relates to the field of touch display, in particular to a performance detection method of an Incell self-capacitance panel.
Background
With the rapid development of display technology, the application of touch screens has become very popular. Wherein, the touch-control electrode of Incell (embedded) touch-sensitive screen is embedded inside liquid crystal display, thickness, the reduction cost of manufacture that can the attenuate module receive consumer and panel manufacturer's favor. The Incell touch screen detects the position touched by a finger by using a principle of self capacitance or mutual capacitance, wherein the Incell self capacitance (called Incell self capacitance for short) touch screen is widely applied due to high touch sensing accuracy and high signal-to-noise ratio. The working principle of the Incell self-contained touch screen is as follows: the touch screen is provided with a plurality of self-capacitance electrodes which are arranged on the same layer and are mutually independent, each self-capacitance electrode is connected with the touch detection chip through an independent outgoing line, and when a human body does not touch the screen, the capacitance born by each self-capacitance electrode is a fixed value; when a human body touches the screen, the capacitance borne by the self-capacitance electrodes corresponding to the touch positions is a fixed value and is superposed with the human body capacitance, and the touch detection position can be judged by the touch detection chip through detecting the change of the capacitance value of each self-capacitance electrode.
The Incell self-contained touch screen goes through a molding stage before being covered with decorative cover glass (cover glass). The currently developed inc ell self-contained module panel divides a common electrode (Com electrode) located in an Active Area (AA Area) into a plurality of independent and separated blocks as touch electrodes in a module stage (as shown in fig. 1A), each touch electrode (e.g., 110) is electrically connected to only one Rx signal line (e.g., a receiving line, a metal wire, etc.) and is connected to a pin (pin) (not shown) of an output terminal of an Integrated Circuit (IC) through the Rx signal line, and when a common voltage is applied to the corresponding touch electrode through each Rx signal line, an image can be displayed. However, each Rx signal line connected to each touch electrode runs through the whole AA area, and the Rx signal line and the non-corresponding touch electrode are shorted during the manufacturing process, that is, one Rx signal line is connected to a plurality of touch electrodes.
At present, in order to avoid the outflow of bad products, an electrical signal is provided through an IC and an optical element is provided to detect the display performance of the Incell self-contained module panel at the module stage, but the detection of the touch performance cannot be performed because the coverglass for touch is not covered (in the prior art, the detection of the touch performance is performed by touching the coverglass with a hand or a finger is simulated after the coverglass is covered), so that a sample with poor touch performance may be leaked during the module detection, and the problems of reduction of yield and subsequent rework are caused.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides the detection method of the Incell (embedded) self-contained module panel, and the module detection element and the detection circuit are added to the Incell self-contained module panel, so that the display performance of the Incell self-contained module panel can be detected during module, and the touch performance of the Incell self-contained module panel can also be detected, thereby avoiding the outflow of bad products and improving the yield of the products.
According to an aspect of an exemplary embodiment of the present invention, there is provided a detection method of an Incell self-contained module panel, the detection method including the steps of: a transparent conducting layer is arranged above the Incell self-contained module panel comprising a plurality of touch electrodes, so that the transparent conducting layer covers and is close to an effective area of the whole Incell self-contained module panel, wherein the transparent conducting layer is arranged on transparent carrier glass, so that the transparent conducting layer can be detachably arranged on the Incell self-contained module panel; a circuit connection step of electrically connecting the transparent conductive layer to ground and connecting a detection circuit between the transparent conductive layer and ground; and a detection step, namely controlling the integrated circuit to sequentially input a test signal to each touch electrode of the Incell self-contained module panel, and determining the abnormal state of the Incell self-contained module panel through the current detected by the detection circuit.
The plurality of touch electrodes are independent and separated from each other and are positioned on the same layer to form a touch electrode layer.
In the setting step, the area of the transparent conductive layer is larger than or equal to the area of an active area of the Incell self-contained module panel.
The detecting step further comprises: and when the current value detected by the detection circuit is greater than or less than a preset current value, determining that the Incell self-contained module panel is in an abnormal state.
The detection method further comprises a removing step of removing the transparent conductive layer after the detection step is completed.
The effective area of the Incell self-contained module panel further comprises a TFT glass layer, a liquid crystal material and a color filter layer, wherein the touch electrode layer is arranged on the TFT glass layer, the color filter layer is arranged above the touch electrode layer, and the liquid crystal material is arranged between the touch electrode and the color filter.
In the disposing step, the transparent conductive layer directly contacts the Incell self-contained module panel.
The transparent conductive layer is made of indium tin oxide.
Drawings
The above and/or other objects and advantages of the present invention will become more apparent from the following description of the embodiments taken in conjunction with the accompanying drawings, in which:
fig. 1A is a top view structural diagram illustrating an Incell self-contained module panel in the prior art;
FIG. 1B is an enlarged view showing one touch electrode area shown in a dashed box in FIG. 1A;
fig. 2 is a block diagram illustrating a method and structure for module inspection of an Incell self-contained module panel 100 according to an exemplary embodiment of the present invention;
fig. 3 is a sectional view taken along line I-I' in fig. 2.
Detailed Description
Reference will now be made in detail to the exemplary embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the like parts. The embodiments are described below in order to explain the present invention by referring to the figures.
Fig. 1A is a top view structural diagram illustrating an incorporated cell module panel in the prior art. Fig. 1B is an enlarged view illustrating one touch electrode region 110 shown in a dotted frame in fig. 1A.
The Incell self-contained module panel 100 includes an active area (AA area) and a peripheral area surrounding the AA area, in which connection traces 120, an Integrated Circuit (IC), and the like are disposed. The AA area is provided with a common electrode and a plurality of Rx signal lines (e.g., 130, 131 … …, etc.) disposed above the common electrode. The plurality of Rx signal lines may be conductive lines (e.g., receiving lines, metal lines, etc.) that function as electrical connections and receive/transmit signals, are arranged in parallel in the vertical direction in the AA region, and are each located on a different layer from the common electrode. In the AA area, the common electrode is divided into a plurality of blocks each independent and separated from each other, each block serving as one touch electrode, each touch electrode being connected to the IC through only one Rx signal line.
For example, the touch electrode 110 is connected to the Rx signal line 130 through a connection member 140 (e.g., a connection wire, a metal hole, etc.), and the other end of the Rx signal line 130 is connected to one IC output pin (not shown) and to one IC output pad (not shown) through one of the connection traces 120, thereby achieving connection of the touch electrode 110 to the IC board. Similarly, each of the touch electrodes corresponds to each of the Rx signal lines one to one and is electrically connected through a connection member, thereby connecting each of the touch electrodes to the IC board.
However, each Rx signal line connected to each touch electrode runs through the whole AA area, and the Rx signal line and the non-corresponding touch electrode are shorted during the manufacturing process, that is, one Rx signal line is connected to a plurality of touch electrodes.
In order to avoid outflow of bad products, the detection method provided by the embodiment of the invention can detect the display performance of the Incell self-contained module panel and can also detect the touch performance of the Incell self-contained module panel.
Fig. 2 is a block diagram illustrating a method and structure for module inspection of the Incell self-contained module panel 100 according to an exemplary embodiment of the present invention.
Referring to fig. 2, the method for detecting the modules of the Incell self-contained module panel 100 includes: first, the transparent conductive layer 210 is disposed above the Incell self-contained module panel 100, such that the transparent conductive layer 210 covers and is close to the AA area of the entire Incell self-contained module panel 100, wherein the area of the transparent conductive layer 210 may be greater than or equal to the AA area of the Incell self-contained module panel 100, and the transparent conductive layer 210 may be made of indium tin oxide, but is not limited thereto. Then, the transparent conductive layer 210 is electrically connected to the ground, and a detection circuit 220 is connected between the transparent conductive layer 210 and the ground, and the detection circuit 220 may be a circuit structure that realizes a function of detecting a current, but is not limited thereto, and may be any type of circuit structure that realizes a function of detecting other circuit (for example, voltage, etc.). And then, a control Integrated Circuit (IC) inputs a test square wave to each touch electrode of the Incell self-contained module panel in sequence, under a normal condition, a current flows between the transparent electrode and the ground, the detection circuit 220 is used for detecting the current, and whether the touch performance of the Incell self-contained module panel is in an abnormal state or not can be determined according to the detected current. Hereinafter, the principle of the detection method will be specifically described with reference to fig. 3.
Fig. 3 is a sectional view taken along line I-I' in fig. 2.
As shown in fig. 3, the AA region of the Incell self-contained module panel 100 includes, but is not limited to, a TFT glass layer 310, a touch electrode layer 320, a liquid crystal material (not shown), and a color filter layer 330. The TFT glass layer 310 is a substrate glass layer provided with an electrode pattern and having a Thin Film Transistor (TFT) function. The touch electrode layer 320 is disposed on the TFT glass layer 310 and includes a plurality of touch electrodes independent and separated from each other, each of which may be a block shape, but is not limited thereto, and each of which may also be a circular or other shaped electrode. The color filter layer 330 is disposed above the touch electrode layer 320, and can precisely select a small-range wavelength band light wave desired to pass through, and reflect other undesired wavelength bands. A liquid crystal material (not shown) is disposed in a space between the touch electrode layer 320 and the color filter layer 330, and the liquid crystal material exhibits different optical characteristics under different voltages.
The transparent conductive layer 210 may be disposed on, but not limited to, a transparent carrier glass 350 to form a transparent conductive layer member. The transparent conductive layer member is detachably disposed above the Incell self-contained module panel 100, for example, the transparent conductive layer 210 may be brought close to or directly contact with the upper surface of the Incell self-contained module panel 100, and when an electrical signal is provided to one of the touch electrode layers 320, the transparent conductive layer 210 may form a capacitance with the touch electrode of the touch electrode layer 320 to which the electrical signal is provided.
With reference to fig. 2 and fig. 3, during the module detection, the control IC sequentially provides a test square wave to each Rx signal line, that is, the control IC sequentially inputs the test square wave to each touch electrode, under a normal condition, a touch electrode to which the test square wave is input separately forms a capacitor with a predetermined capacitance value with the transparent conductive layer 210, at this time, the transparent conductive layer 210 is formed as a transparent electrode and a current flows through the transparent electrode and the transparent conductive layer 210 and the ground, the current can be detected by the detection circuit 220, and the current detected under a normal condition can have a predetermined current value.
For example, first, the control IC inputs a test square wave to the touch electrode 110 through one Rx signal line 130, and does not provide an electrical signal to other Rx signal lines, and if the Rx signal line 130 is connected to only the touch electrode 110 but not to other touch electrodes, the control IC is in a normal operating state; in a normal operation state, the touch electrode 110 and the transparent conductive layer 210 form a capacitor with a predetermined value, and at this time, the transparent conductive layer 210 is formed as a transparent electrode and a current flows between the transparent electrode and the ground, and the detection circuit 220 can detect the current with a predetermined current value. Similarly, each Rx signal line and the corresponding touch electrode are sequentially provided with a test square wave, and the current value is detected by the detection current 220 to determine whether the current value is a predetermined current value until all the touch electrodes are detected.
However, if the Incell self-contained module panel has an abnormality, the detection circuit may detect a current greater than or less than a predetermined current value. Specifically, if one Rx signal line is connected to two or more touch electrodes (i.e., the Rx signal line is short-circuited), when a test square wave is provided to the Rx signal line, the touch electrodes connected thereto are all provided with electrical signals to form a capacitor with a capacitance greater than a predetermined capacitance value with the transparent conductive layer 210, and at this time, a current still flows between the transparent conductive layer 210 and the ground, but the detection circuit detects a current greater than a predetermined current value. If one Rx signal line is not connected to its corresponding touch electrode (or the connection is disconnected) nor connected to other touch electrodes, when a test square wave is supplied to the Rx signal line, all the touch electrodes do not receive an electric signal, no current flows between the transparent electrode and the ground, and the current detected by the detection circuit may be 0 (less than a predetermined current value). Therefore, if the detection circuit detects a current which is larger than or smaller than a preset current value, the Incell self-contained module panel is abnormal.
In summary, the control IC sequentially provides the test square wave to each Rx signal line (i.e., sequentially provides the test square wave to each touch electrode), so as to sequentially test the touch performance of each touch electrode, sequentially detects the flowing current value through the detection circuit 220 until the test of all touch electrodes is completed, and when all current values detected by the detection circuit 220 are the predetermined current values (or within the tolerance range of the predetermined current values), it indicates that the Incell self-contained module panel is in a normal state, and the touch performance is good and is good; however, when the current significantly greater than or less than the predetermined current value exists in all the current values detected by the detection circuit, it indicates that the Incell self-contained module panel is in an abnormal state, and the touch performance of the Incell self-contained module panel is problematic and is a poor product.
In addition, since the transparent conductive layer member is detachably disposed on the Incell self-contained module panel, the transparent conductive layer member can be removed after the completion of the inspection, so that the transparent conductive layer member can be used for the inspection of other module panels, thereby simplifying the inspection step, and not affecting the subsequent manufacturing process (for example, covering a decorative cover glass, etc.).
Therefore, according to the module detection method provided by the invention, the display performance of the Incell self-contained module panel can be detected, and the touch performance of the Incell self-contained module panel can also be detected, so that the outflow of bad products is avoided, and the yield of the products is improved.
While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present invention as defined by the following claims.
Claims (9)
1. A detection method of an Incell self-contained module panel comprises the following steps:
a transparent conducting layer is arranged above the Incell self-contained module panel comprising a plurality of touch electrodes, so that the transparent conducting layer covers and is close to an effective area of the whole Incell self-contained module panel, wherein the transparent conducting layer is arranged on transparent carrier glass, and the transparent conducting layer is detachably arranged above the Incell self-contained module panel and is positioned between the Incell self-contained module panel and the transparent carrier glass;
a circuit connection step of electrically connecting the transparent conductive layer to ground and connecting a detection circuit between the transparent conductive layer and ground; and
and a detection step, namely inputting a test signal to each touch electrode of the Incell self-contained module panel sequentially through each Rx signal line, and determining the abnormal state of the Incell self-contained module panel through the current detected by a detection circuit.
2. The method for detecting the Incell self-contained module panel according to claim 1, wherein the touch electrodes are independent and separated from each other, and are located on the same layer to form a touch electrode layer.
3. The method for inspecting the Incell self-contained modular panel according to claim 1, wherein in the disposing step, the area of the transparent conductive layer is greater than or equal to that of an active area of the Incell self-contained modular panel.
4. The method for inspecting an Incell self-contained modular panel according to claim 2, wherein the inspecting step further comprises:
and when the current value detected by the detection circuit is greater than or less than a preset current value, determining that the Incell self-contained module panel is in an abnormal state.
5. The inspection method of the Incell self-contained modular panel according to claim 2, further comprising a removing step of removing the transparent conductive layer after the inspection step is completed.
6. The Incell self-contained module panel detection method according to claim 2, wherein the active area of the Incell self-contained module panel further comprises a TFT glass layer, a liquid crystal material and a color filter layer, wherein the touch electrode layer is arranged on the TFT glass layer, the color filter layer is arranged above the touch electrode layer, the liquid crystal material is arranged between the touch electrode layer and the color filter layer,
wherein in the disposing step, the transparent conductive layer is disposed over the color filter layer so as to be close to or in direct contact with the color filter layer.
7. The method of inspecting the Incell self-contained modular panel of claim 1, wherein in the disposing step, a transparent conductive layer directly contacts the Incell self-contained modular panel.
8. The Incell self-contained modular panel detection method according to any one of claims 1 to 7, wherein the transparent conductive layer is made of indium tin oxide.
9. A transparent conductive layer component for detecting an Incell self-contained module panel, which comprises carrier glass and a transparent conductive layer arranged on the carrier glass, wherein the transparent conductive layer is detachably arranged above the Incell self-contained module panel to detect the abnormal state of the Incell self-contained module panel, the material of the transparent conductive layer is indium tin oxide,
the transparent conductive layer covers the active area of the whole Incell self-contained module panel,
a capacitor is formed between the transparent conductive layer and a touch electrode of the touch electrode layer to which a test signal is supplied through an Rx signal line,
each touch electrode is sequentially provided with a test square wave through a corresponding signal line by a control IC, a detection circuit sequentially detects the flowing current value, and when all the current values detected by the detection circuit are preset current values, the Incell self-contained module panel is judged to be normal; and when the current which is obviously larger than or smaller than the preset current value exists in all the current values detected by the detection circuit, judging that the Incell self-contained module panel is abnormal.
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| CN110678766B (en) * | 2018-03-14 | 2021-10-26 | 深圳市汇顶科技股份有限公司 | Detection method of induction module, touch chip, touch screen and assembly method of touch screen |
| CN112363083B (en) * | 2020-11-25 | 2022-04-29 | 烟台正海科技股份有限公司 | Capacitive touch screen sensor circuit detection board and detection method thereof |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102681711A (en) * | 2011-03-15 | 2012-09-19 | 群康科技(深圳)有限公司 | Touch panel and multi-point detection method thereof |
| CN103870048A (en) * | 2012-12-07 | 2014-06-18 | 义隆电子股份有限公司 | Detection method of touch device |
| CN104063097A (en) * | 2013-03-21 | 2014-09-24 | 联咏科技股份有限公司 | Touch-control device and touch-control detecting method thereof |
| CN104459400A (en) * | 2014-12-08 | 2015-03-25 | 深圳市华星光电技术有限公司 | Detection circuit and detection method used for self-contained touch screen |
| CN104516599A (en) * | 2013-10-02 | 2015-04-15 | 联咏科技股份有限公司 | touch detection device and touch detection method |
| CN204360354U (en) * | 2014-09-29 | 2015-05-27 | 南京华睿川电子科技有限公司 | A kind of self-tolerant touch screen detection device |
| CN105159511A (en) * | 2015-09-01 | 2015-12-16 | 武汉华星光电技术有限公司 | Self-contained embedded touch panel and detection method |
| CN105183254A (en) * | 2015-08-18 | 2015-12-23 | 南京触宏微电子有限公司 | Touch detection method and apparatus for touch screen and touch screen |
| CN105629121A (en) * | 2014-11-21 | 2016-06-01 | 意法半导体亚太私人有限公司 | Short circuit detection module |
| CN105759139A (en) * | 2016-02-04 | 2016-07-13 | 深圳精智达技术股份有限公司 | Touch screen test device and test method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101334435B (en) * | 2007-06-29 | 2010-08-18 | 宸鸿光电科技股份有限公司 | Non-contact type touch control plate detection method and apparatus |
| US8692777B2 (en) * | 2008-02-08 | 2014-04-08 | Apple Inc. | Method for rapidly testing capacitance sensing array fault conditions using a floating conductor |
| CN103675489B (en) * | 2012-08-31 | 2017-09-29 | 晨星软件研发(深圳)有限公司 | Test system and method for testing applied to contactor control device |
-
2016
- 2016-12-30 CN CN201611260152.0A patent/CN106680643B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102681711A (en) * | 2011-03-15 | 2012-09-19 | 群康科技(深圳)有限公司 | Touch panel and multi-point detection method thereof |
| CN103870048A (en) * | 2012-12-07 | 2014-06-18 | 义隆电子股份有限公司 | Detection method of touch device |
| CN104063097A (en) * | 2013-03-21 | 2014-09-24 | 联咏科技股份有限公司 | Touch-control device and touch-control detecting method thereof |
| CN104516599A (en) * | 2013-10-02 | 2015-04-15 | 联咏科技股份有限公司 | touch detection device and touch detection method |
| CN204360354U (en) * | 2014-09-29 | 2015-05-27 | 南京华睿川电子科技有限公司 | A kind of self-tolerant touch screen detection device |
| CN105629121A (en) * | 2014-11-21 | 2016-06-01 | 意法半导体亚太私人有限公司 | Short circuit detection module |
| CN104459400A (en) * | 2014-12-08 | 2015-03-25 | 深圳市华星光电技术有限公司 | Detection circuit and detection method used for self-contained touch screen |
| CN105183254A (en) * | 2015-08-18 | 2015-12-23 | 南京触宏微电子有限公司 | Touch detection method and apparatus for touch screen and touch screen |
| CN105159511A (en) * | 2015-09-01 | 2015-12-16 | 武汉华星光电技术有限公司 | Self-contained embedded touch panel and detection method |
| CN105759139A (en) * | 2016-02-04 | 2016-07-13 | 深圳精智达技术股份有限公司 | Touch screen test device and test method |
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