TW201032305A - Circuit board and chip package structure - Google Patents

Circuit board and chip package structure Download PDF

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Publication number
TW201032305A
TW201032305A TW098105656A TW98105656A TW201032305A TW 201032305 A TW201032305 A TW 201032305A TW 098105656 A TW098105656 A TW 098105656A TW 98105656 A TW98105656 A TW 98105656A TW 201032305 A TW201032305 A TW 201032305A
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TW
Taiwan
Prior art keywords
pad
trace
adjacent
circuit board
fixed
Prior art date
Application number
TW098105656A
Other languages
English (en)
Other versions
TWI488272B (zh
Inventor
Ko-Wei Lin
Original Assignee
Advanced Semiconductor Eng
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Publication date
Application filed by Advanced Semiconductor Eng filed Critical Advanced Semiconductor Eng
Priority to TW098105656A priority Critical patent/TWI488272B/zh
Priority to US12/554,340 priority patent/US8389869B2/en
Publication of TW201032305A publication Critical patent/TW201032305A/zh
Application granted granted Critical
Publication of TWI488272B publication Critical patent/TWI488272B/zh

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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • H05K1/111Pads for surface mounting, e.g. lay-out
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/563Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3121Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
    • H01L23/3128Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49838Geometry or layout
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09209Shape and layout details of conductors
    • H05K2201/09654Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
    • H05K2201/09781Dummy conductors, i.e. not used for normal transport of current; Dummy electrodes of components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09818Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
    • H05K2201/0989Coating free areas, e.g. areas other than pads or lands free of solder resist
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10734Ball grid array [BGA]; Bump grid array
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3452Solder masks
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Description

4-NEW-FINAL-TW-20090223 201032305 六、發明說明: 【發明所屬之技術領域】 本發明是有關於一種線路板及晶片封裝結構,且特別 是有關於一種具有非焊罩定義型之接塾的線路板及晶片封 裝結構。 【先前技術】 覆晶接合技術(Flip Chip Bonding Technology)'主要 是以面陣列(areaarray)的排列方式,將多個晶片墊(die pad)配置於晶片(die)之主動表面(active surface),並 在這些晶片塾上分別形成多個凸塊(bump),接著,將晶 片翻面(flip),然後’使晶片上的凸塊分別電性(electrically) 及機械性(mechanically)連接至一晶片載板上的多個接墊 (bonding pad ) ° 晶片載板上的接墊型態可依照焊罩層(Solder Mask) 疋否覆蓋接塾而大致區分為「焊罩定義(Solder Mask
Defined ’ SMD )」及「非焊罩定義(Non_s〇lder Mask Defined ’ NSMD)」兩種類型,其中NSMD又可稱為接墊 定義(PadDefined)。就非焊罩定義型的接墊而言,由於 焊罩層的開口會完全暴露出接墊,所以無法藉由焊罩層將 接墊固定在晶片載板的基板上,以致於接塾容易剝離。 【發明内容】 本發明提供一種線路板,其非焊罩定義型之接墊不易 3 201032305 ι ^h-NEW-FINAL-TW-20090223 剝離。 本發明提供一種晶片封裝結構,其晶片與線路板的接 點密度較高。 本發明提出一種線路板包括一基板、一導電圖案與一 焊罩層。導電圖案配置於基板上,導電圖案包括一第一接 墊、一第一固定跡線與一第一訊號跡線。第一固定跡線與 第一接墊的邊緣相連。第一訊號跡線與第一接墊的邊緣相 連,且第一訊號跡線之鄰近第一接墊的部分與第一固定跡 線之間形成一夾角’夾角大於〇度並小於18〇度。焊罩層 配置於基板上並覆蓋部分導電圖案,焊罩層具有一第一開 口 ’第一開口完全暴露出第一接墊。 在本發明之一實施例中,夾角大於等於135度並小於 180 度。 在本發明之一實施例中,第一開口暴露出第一訊號跡 線之鄰近弟一接塾的部分以及第一固定跡線之鄰近第一接 墊的部分。 在本發明之一實施例中,導電圖案更包括一第二接 塾、一第一固疋跡線與一第二訊號跡線,其中第二固定跡 線與第二接墊的邊緣相連,第二訊號跡線與第二接塾的邊 緣相連,且第二訊號跡線之鄰近第二接墊的部分與第二固 定跡線之間的夾角為180度。焊罩層更具有—第^開口’ 第二開口完全暴露出第二接墊。 在本發明之-實施例中,第二開口暴露出第二訊號跡 線之鄰近第二接塾的部分以及第二固定跡線之鄰近第二接 201032305 i ^4-NEW-FINAL-TW-20090223 塾的部分。 本發明提出一種晶片封裝結構包括一線路板、一晶 片、一第一導電凸塊與一封裝膠體。線路板包括一基板、 一導電圖案與一焊罩層。導電圖案配置於基板上,導電圖 案包括一第一接墊、一第一固定跡線與—第一訊號跡線。 第一固疋跡線與第一接墊的邊緣相連。第一訊號跡線與第 一接墊的邊緣相連,且第一訊號跡線之鄰近第一接塾的部 φ 分與第一固定跡線之間形成一夾角,夹角大於〇度並小於 180度。焊罩層配置於基板上並覆蓋部分導電圖案,焊罩 層具有一第一開口,第一開口完全暴露出第一接墊。第一 導電凸塊配置於晶片與第一接墊之間。封裝膠體包覆晶片 與第一導電凸塊。 在本發明之一實施例中,夾角大於等於135度並小於 180 度。 ' 在本發明之一實施例中,第一開口暴露出第一訊號跡 線之鄰近第一接墊的部分以及第一固定跡線之鄰近第一接 墊的部分。 在本發明之一實施例中,晶片封裝結構更包括一第二 導電凸塊’其中導電圖案更包括一第二接墊、一第二固定 跡線與一第二訊號跡線,其中第二固定跡線與第二接塾的 邊緣相連’第一訊说跡線與弟一接塾的邊緣相連,且第一 訊號跡線之鄰近第二接墊的部分與第二固定跡線之間的失 角為180度。焊罩層更具有一第二開口,第二開口完全暴 露出第二接墊。第二導電凸塊配置於第二接塾與晶片之 201032305 —----t-NEW-FINAL-TW-20090223 間’且封裝膠體更包覆第二導電凸塊。 在本發明之一實施例_,第二開口 線之鄰近第二接墊的部分以及第二固定跡線:3號: 墊的部分。 ^心砷近第二接 在本發明之-實施例中,封裝膠 側壁實質上切齊。 j壁與線路板的 在本發明之—實施财,晶U裝 鲁 ❿ 膠,其填滿於晶片與線路板之間,並包覆第底 在本發明之-實施例中,第__ 或一焊料凸塊。 匕彷銅凸塊 基於上述’本發明與接墊相連且焊罩層所部分覆蓋的 固定跡線有助於使接墊固定在基板上。再者,由於訊 線之鄰近接墊的部分與固定跡線之間可形成—大於°〇产°並 小於⑽度的夾角’所簡定跡線可任意地配置於相^的 接墊與訊號跡線之間,進而可提升線路板之線路佈局的自 由度及接墊的密度。 為讓本發明之上述特徵和優點能更明顯易懂,下文特 舉實施例,並配合所附圖式作詳細說明如下。 【實施方式】 圖1Α繪示本發明一實施例之線路板的局部俯視圖, 圖1Β緣示圖1Α之線路板沿ι_ι線的剖面圖。請參照圖1Α 及圖1Β,本實施例之線路板包括一基板11〇、一導電圖案 120與一焊罩層130。導電圖案12〇配置於基板u〇上,導 6 201032305 wNEW-FINAL-TW-20090223 電圖案120包括多個接墊122a、多個固定跡線122b與多 個訊號跡線122c。固定跡線122b連接至接墊122a的邊 緣。訊號跡線122c連接至接墊122a的邊緣,且訊號跡線 122c之鄰近接墊122a的部分與固定跡線122b之間形成一 夾角<9 1,夾角θ 1大於0度並小於180度。夾角θ 1例如 是大於等於135度並小於180度。 此外,在本實施例中,導電圖案120還可選擇性地包 括多個接墊124a、多個固定跡線124b與多個訊號跡線 ® 124c。固定跡線124b連接至接墊124a的邊緣,訊號跡線 124c連接至接墊124a的邊緣。訊號跡線124c之鄰近接墊 124a的部分與固定跡線124b之間的夾角0 2為180度,換 言之,訊號跡線124c之鄰近接墊124a的部分與固定跡線 124b可位於同一直線上。 焊罩層130配置於基板11〇上並覆蓋部分導電圊案 120。具體而言’焊罩層130具有多個開口 132與多個開口 134,其中開口 132完全暴露出接墊122a,而開口 134完 φ 全暴露出接墊124a。詳細而言,在本實施例中,開口 132 還暴露出訊號跡線122c之鄰近接墊122a的部分、固定跡 線122b之鄰近接墊122a的部分以及基板110之位於接墊 122a周邊的部分。此外,開口 134還暴露出訊號跡線124c 之鄰近接墊124a的部分、固定跡線124b之鄰近接墊124a 的部分以及基板110之位於接墊124a周邊的部分。 值得注意的是,由於本實施例的固定跡線122b、124b 與接墊122a、124a相連且焊罩層130部分覆蓋固定跡線 201032305 rvou-jcv-t 174-NEW-FINAL-TW-20090223 122b、124b,所以固定跡線122b、124b有助於使接塾122a、 124a固定在基板110上。再者,由於訊號跡線丨22c之鄰 近接墊122a的部分與固定跡線122b之間可形成一大於〇 度並小於180度的夾角0 1,因此固定跡線122b可任意地 配置於相鄭的接墊122a與訊號跡線122c之間,而不會妨 礙接墊122a與訊號跡線122c的配置,進而可提升線路佈 局的自由度以及接墊122a的密度。 圖2繪示本發明一實施例之晶片封裝結構的剖面圖。 請參照圖2 ’本實施例之晶片封裝結構200包括一線路板 100、一晶片210、多個導電凸塊220與一封裝膠體230。 值得注意的是,本實施例之線路板100相同於圖1A之線 路板100,故於此不再贅述。 導電凸塊220配置於晶片210與接塾]_22a之間,以電 性連接晶片210與線路板100.。此外,在本實施例中,還 可在接墊124a與晶片210之間配置一導電凸塊24〇。導電 凸塊220、240例如為銅凸塊或焊料凸塊。在本實施例中, 為保護導電凸塊220、240,可在晶片210與線路板100之 間填入一底膠250,以包覆導電凸塊220、240。 封裝膠體230包覆晶片210與導電凸塊22〇、24〇,以 保護晶片210與導電凸塊220、240免於受到外界環境的污 染或者是濕氣的影響。在本實施例中,封裝膠體23〇的侧 壁332與線路板1〇〇的側壁140實質上切齊。 值得注意的是,由於線路板100具有較高的接整密 度’所以晶片210的搔墊密度亦可隨之增加,以縮小晶片 8 l-NEW-FINAL-TW-20090223 201032305 210的尺寸,進而降低製作成本。 综上所述,本發明與接墊相連且焊罩層所部分覆蓋的 固定跡線有助於使接墊固定在基板上。再者,由於訊號跡 線之鄰近接塾的部分與固定跡線之間可形成一大於〇度並 小於180度的夾肖’所㈣定跡線可任意地配置於相鄰的 接墊與訊號跡線之間,進而可提升線路板之線路佈局的自 由度及接墊的役度。此外,由於本發明之線路板具有較高 的接墊密度,所以覆晶接合至線路板上的晶片的接墊密度 亦可隨之增加’以縮小晶片的尺寸,進而降低製作成本。 雖然本發明已以實施例揭露如上,然其並非用以限定 本發明’任何所屬技術領域中具有通常知識者,在不脫離 本發明之精神和範圍内’當可作些許之更動與潤飾,故本 發明之保護範圍當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 圖1A繪示本發明一實施例之線路板的局部俯視圖。 圖1B繪示圖1A之線路板沿I-Ι線的剖面圖。 圖2繪示本發明一實施例之晶片封裝結構的剖面圖。 【主要元件符號說明】 100 :線路板 110 :基板 120 :導電圖案 122a :接墊 9 -NEW-FINAL-TW-20090223 201032305 122b :固定跡線 122c :訊號跡線 124a :接墊 124b :固定跡線 124c :訊號跡線 130 :焊罩層 132 :開口 134 :開口 ® 140 :側壁 200:晶片封裝結構 210 .晶片 220 :導電凸塊 230 :封裝膠體 240 :導電凸塊 250 :底膠 01 :夾角 φ 02 :夾角

Claims (1)

  1. 201032305 ^NEW-FINAL-TW-20090223 七、申請專利範園: L —種線路板,包括: 一基板; 一導電圖案,配置於該基板上,該導電圖案包括: —第一接墊* ; —第一固定跡線,與該第一接墊的邊緣相連; 一第一訊號跡線’與該第一接墊的邊緣相連,且 φ 該第一訊號跡線之鄰近該第一接墊的部分與該第一 固定跡線之間形成一夾角,該夾角大於〇度並小於18〇 度;以及 一焊罩層,配置於該基板上並覆蓋部分該導電圖案, 該焊罩層具有一第一開口,該第一開口完全暴露出該第一 接塾。 2.如申請專利範圍第1項所述之線路板,其中該夾 角大於等於135度並小於18〇度。 _ 3·如申請專利範圍第1項所述之線路板,其中該第 —開口暴露出該第一訊號跡線之鄰近該第一接墊的部分以 及該第一固定跡線之鄰近該第一接塾的部分。 4.如申请專利範圍第1項所述之線路板,其中該導 電圖案更包括: 一第二接墊; 一第二固定跡線,與該第二接墊的邊緣相連;以及 一第二訊號跡線,與該第二接墊的邊緣相連,且該第 二訊號跡線之鄰近該第二接墊的部分與該第二固定跡線之 11 201032305 -^EW-FrNAL-TW-20090223 間的夹角為180度, 其中,該焊罩層更具有一第二開口,該第二開口完全 暴露出該第二接墊。 5· 如申請專利範圍第4項所述之線路板,其中該第 二開口暴露出該第二訊號跡線之鄰近該第二接墊的部分以 及該第二固定跡線之鄰近該第二接墊的部分。 6. 一種晶片封裝結構,包括: 一線路板,該線路板包括: Φ 一基板; 一導電圖案,配置於該基板上,該導電圖案包括: 一第一接墊; 一第一固定跡線,與該第一接墊的邊緣相 連; 一第一訊號跡線,與該第一接墊的邊緣相 連,且該第一訊號跡線之鄰近該第一接墊的部分 與該第一固定跡線之間形成一夾角,該夾角大於 φ 0度並小於180度; ' -焊罩層,配置於該基板上並鼓部分該導電圖 案,該焊罩層具有-第一開口,該第—開口完全暴露 出該第一接墊; 一晶片, -第-導電凸塊,配置於該晶片與該第—接塾之間; 以及 一封裝膠體,包覆該晶片與該第一導電凸塊。 12 —jSfEW-FINAL-TW-20090223 201032305 7.如申請專利範圍第6項所述之晶片封裝結構,其 中該夹角大於等於135度並小於180度。 8·如申請專利範圍第6項所述之晶片封裝結構,其 中該第一開口暴露出該第一訊號跡線之鄰近該第一接墊的 部分以及該第一固定跡線之鄰近該第一接墊的部分。 9·如申請專利範圍第6項所述之晶片封裝結構,更 包括: 一第二導電凸塊, β 其中該導電圖案更包括: 一第二接墊; 一第二固定跡線,與該第二接墊的邊緣相連;以及 一第二訊號跡線’與該第二接墊的邊緣相連,且該第 二訊號跡線之鄰近該第二接墊的部分與該第二固定跡線之 間的夾角為180度, 其中,該焊罩層更具有一第二開口,該第二開口完全 暴露出該第二接墊,該第二導電凸塊配置於該第二接墊與 φ 該晶片之間,且該封裝膠體更包覆該第二導電凸塊。 10. 如申請專利範圍第9項所述之晶片封裝結構,其 中該第二開口暴露出該第二訊號跡線之鄰近該第二接墊的 部分以及該第二固定跡線之鄰近該第二接墊的部分。 11. 如申請專利範圍第6項所述之晶片封裝結構,其 中該封裝膠體的側壁與讓線路板的侧壁實質上切齊。 12. 如申請專利範圍第6項所述之晶片封裝結構,更 包括: 13 i-NEW-FINAL-TW-20090223 201032305 一底膠,填滿於該晶片與該線路板之間,並包覆該第 一導電凸塊。 13.如申請專利範圍第6項所述之晶片封裝結構,其 中該第一導電凸塊包括一銅凸塊或一焊料凸塊。
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