TW201007188A - Chip testing and sorting machine capable of simulating a system test - Google Patents

Chip testing and sorting machine capable of simulating a system test Download PDF

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Publication number
TW201007188A
TW201007188A TW97130934A TW97130934A TW201007188A TW 201007188 A TW201007188 A TW 201007188A TW 97130934 A TW97130934 A TW 97130934A TW 97130934 A TW97130934 A TW 97130934A TW 201007188 A TW201007188 A TW 201007188A
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TW
Taiwan
Prior art keywords
test
wafer
temperature
temperature control
controlled room
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Application number
TW97130934A
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English (en)
Chinese (zh)
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TWI362498B (enrdf_load_stackoverflow
Inventor
Yuan-Ji Lin
zhi-hong Xie
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King Yuan Electronics Co Ltd
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Priority to TW97130934A priority Critical patent/TW201007188A/zh
Publication of TW201007188A publication Critical patent/TW201007188A/zh
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Publication of TWI362498B publication Critical patent/TWI362498B/zh

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW97130934A 2008-08-14 2008-08-14 Chip testing and sorting machine capable of simulating a system test TW201007188A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97130934A TW201007188A (en) 2008-08-14 2008-08-14 Chip testing and sorting machine capable of simulating a system test

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Application Number Priority Date Filing Date Title
TW97130934A TW201007188A (en) 2008-08-14 2008-08-14 Chip testing and sorting machine capable of simulating a system test

Publications (2)

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TW201007188A true TW201007188A (en) 2010-02-16
TWI362498B TWI362498B (enrdf_load_stackoverflow) 2012-04-21

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TW97130934A TW201007188A (en) 2008-08-14 2008-08-14 Chip testing and sorting machine capable of simulating a system test

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104181456A (zh) * 2013-05-27 2014-12-03 海洋王（东莞）照明科技有限公司 印刷电路板测试方法
US9519024B2 (en) 2014-02-10 2016-12-13 Chroma Ate Inc. Apparatus for testing package-on-package semiconductor device and method for testing the same
CN106405376A (zh) * 2016-09-08 2017-02-15 深圳市燕麦科技股份有限公司 柔性电路板测试装置
CN107300668A (zh) * 2016-04-14 2017-10-27 深圳市三联光智能设备股份有限公司 贴片轻触开关测试机构和贴片轻触开关编带机
CN109283405A (zh) * 2017-07-20 2019-01-29 泰克元有限公司 用于测试电子部件的分选机
CN112485645A (zh) * 2020-11-30 2021-03-12 海光信息技术股份有限公司 芯片测试温度控制方法、控制系统、温控板卡及测试系统
CN112649692A (zh) * 2017-07-20 2021-04-13 泰克元有限公司 用于测试电子部件的分选机
CN114690024A (zh) * 2022-05-31 2022-07-01 广东东博自动化设备有限公司 一种全自动芯片测试机

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI626446B (zh) * 2017-01-13 2018-06-11 崇碁科技股份有限公司 晶片燒錄測試設備及方法

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104181456A (zh) * 2013-05-27 2014-12-03 海洋王（东莞）照明科技有限公司 印刷电路板测试方法
US9519024B2 (en) 2014-02-10 2016-12-13 Chroma Ate Inc. Apparatus for testing package-on-package semiconductor device and method for testing the same
CN107300668A (zh) * 2016-04-14 2017-10-27 深圳市三联光智能设备股份有限公司 贴片轻触开关测试机构和贴片轻触开关编带机
CN106405376A (zh) * 2016-09-08 2017-02-15 深圳市燕麦科技股份有限公司 柔性电路板测试装置
CN109283405A (zh) * 2017-07-20 2019-01-29 泰克元有限公司 用于测试电子部件的分选机
CN109283405B (zh) * 2017-07-20 2021-01-29 泰克元有限公司 用于测试电子部件的分选机
CN112649692A (zh) * 2017-07-20 2021-04-13 泰克元有限公司 用于测试电子部件的分选机
CN112649692B (zh) * 2017-07-20 2024-05-28 泰克元有限公司 用于测试电子部件的分选机
CN112485645A (zh) * 2020-11-30 2021-03-12 海光信息技术股份有限公司 芯片测试温度控制方法、控制系统、温控板卡及测试系统
CN114690024A (zh) * 2022-05-31 2022-07-01 广东东博自动化设备有限公司 一种全自动芯片测试机

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Publication number Publication date
TWI362498B (enrdf_load_stackoverflow) 2012-04-21

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