TW201000380A - Electronic component handling apparatus, electronic component test apparatus and electronic component holding tray - Google Patents

Electronic component handling apparatus, electronic component test apparatus and electronic component holding tray Download PDF

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Publication number
TW201000380A
TW201000380A TW098114005A TW98114005A TW201000380A TW 201000380 A TW201000380 A TW 201000380A TW 098114005 A TW098114005 A TW 098114005A TW 98114005 A TW98114005 A TW 98114005A TW 201000380 A TW201000380 A TW 201000380A
Authority
TW
Taiwan
Prior art keywords
electronic component
holding
tray
interval
test
Prior art date
Application number
TW098114005A
Other languages
English (en)
Chinese (zh)
Other versions
TWI359777B (https=
Inventor
Akihiko Ito
Mitsunori Aizawa
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW201000380A publication Critical patent/TW201000380A/zh
Application granted granted Critical
Publication of TWI359777B publication Critical patent/TWI359777B/zh

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW098114005A 2008-05-28 2009-04-28 Electronic component handling apparatus, electronic component test apparatus and electronic component holding tray TW201000380A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2008/059829 WO2009144790A1 (ja) 2008-05-28 2008-05-28 電子部品ハンドリング装置、電子部品試験装置および電子部品保持トレイ

Publications (2)

Publication Number Publication Date
TW201000380A true TW201000380A (en) 2010-01-01
TWI359777B TWI359777B (https=) 2012-03-11

Family

ID=41376690

Family Applications (1)

Application Number Title Priority Date Filing Date
TW098114005A TW201000380A (en) 2008-05-28 2009-04-28 Electronic component handling apparatus, electronic component test apparatus and electronic component holding tray

Country Status (2)

Country Link
TW (1) TW201000380A (https=)
WO (1) WO2009144790A1 (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI416137B (zh) * 2010-10-15 2013-11-21 Well Handle Technology Co Ltd 電子零件之轉接式測試設備
CN104678285A (zh) * 2011-12-28 2015-06-03 株式会社爱德万测试 搬送载体及器件搬送装置
CN114148712A (zh) * 2021-11-05 2022-03-08 扬州京柏自动化科技有限公司 用于电池触摸板的自动摆盘机

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6039425B2 (ja) * 2010-12-22 2016-12-07 日本発條株式会社 検査システム
KR101968984B1 (ko) * 2012-03-16 2019-08-26 (주)테크윙 사이드도킹식 테스트핸들러
JP5926403B2 (ja) 2012-12-25 2016-05-25 平田機工株式会社 搬送システム
KR102072390B1 (ko) * 2013-06-18 2020-02-04 (주)테크윙 테스트핸들러
JP5961286B2 (ja) * 2015-01-06 2016-08-02 株式会社アドバンテスト 電子部品移載装置、電子部品ハンドリング装置、及び電子部品試験装置
KR102799834B1 (ko) * 2017-01-11 2025-04-28 (주)테크윙 테스트핸들러용 가압장치
CN114955541B (zh) * 2022-06-30 2024-04-09 歌尔科技有限公司 电池测试设备

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3398876B2 (ja) * 1994-05-27 2003-04-21 株式会社アドバンテスト Icキャリア及びその自動調整機構
JP2002174658A (ja) * 2000-12-05 2002-06-21 Advantest Corp ハンドラおよび電子部品試験装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI416137B (zh) * 2010-10-15 2013-11-21 Well Handle Technology Co Ltd 電子零件之轉接式測試設備
CN104678285A (zh) * 2011-12-28 2015-06-03 株式会社爱德万测试 搬送载体及器件搬送装置
TWI583970B (zh) * 2011-12-28 2017-05-21 阿德潘鐵斯特股份有限公司 A handling device, and an electronic component transfer device
CN114148712A (zh) * 2021-11-05 2022-03-08 扬州京柏自动化科技有限公司 用于电池触摸板的自动摆盘机

Also Published As

Publication number Publication date
TWI359777B (https=) 2012-03-11
WO2009144790A1 (ja) 2009-12-03

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